iec 60603-7-7-2006 connectors for electronic equipment

INTERNATIONAL STANDARD

IEC60603-7-7

Second edition2006-06

Connectors for electronic equipment –

Part 7-7: Detail specification for 8-way, shielded, free and fixed connectors, for data transmissions with frequencies up to 600 MHz

Reference number IEC 60603-7-7:2006(E)

Copyright International Electrotechnical Commission Provided by IHS under license with IEC

Not for ResaleNo reproduction or networking permitted without license from IHS

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Publication numbering

As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1.

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INTERNATIONAL STANDARD

IEC60603-7-7

Second edition2006-06

Connectors for electronic equipment –


IEC 2006 Copyright - all rights reserved

No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher.

International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: [email protected] Web: www.iec.ch

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Commission Electrotechnique InternationaleInternational Electrotechnical CommissionМеждународная Электротехническая Комиссия



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– 2 – 60603-7-7 IEC:2006(E)

CONTENTS

FOREWORD...........................................................................................................................6 INTRODUCTION.....................................................................................................................8 1 General .......................................................................................................................... 10

1.1 Scope.................................................................................................................... 10 1.2 Normative references ............................................................................................ 10

2 Technical information...................................................................................................... 11 2.1 Terms and definitions ............................................................................................ 11 2.2 Information on application ...................................................................................... 11

2.2.1 Transmission performance categories ........................................................ 12 2.2.2 Complete connectors (pairs) ...................................................................... 12 2.2.3 Interchangeability level............................................................................... 12 2.2.4 Shielding/grounding ................................................................................... 13 2.2.5 Terminations.............................................................................................. 13

2.3 IEC type designation.............................................................................................. 13 3 Dimensional information ................................................................................................. 15

3.1 General ................................................................................................................. 15 3.2 Isometric view ....................................................................................................... 15 3.3 Common features .................................................................................................. 16 3.4 Engagement (mating) information .......................................................................... 16 3.5 Fixed connectors ................................................................................................... 18 3.6 Free connectors .................................................................................................... 21

4 Terminations...................................................................................................................23 4.1 Referenced termination types ................................................................................ 23

4.1.1 Insulation displacement terminations.......................................................... 23 4.1.2 Crimp terminations..................................................................................... 23 4.1.3 Insulation piercing terminations .................................................................. 23 4.1.4 Compliant pin (press-in) ............................................................................. 23 4.1.5 Spring clamp terminations.......................................................................... 23 4.1.6 Non-referenced termination types .............................................................. 23 4.1.7 Solder terminations .................................................................................... 24

4.2 Switch function ...................................................................................................... 24 4.2.1 Basic switch function ................................................................................. 24 4.2.2 Additional switch function ........................................................................... 24

4.3 Accessories ........................................................................................................... 24 4.4 Mounting information for fixed connectors .............................................................. 24

4.4.1 Hole pattern on printed boards ................................................................... 24 4.4.2 Mounting on panels.................................................................................... 24

4.5 Mounting information for free connectors ............................................................... 24 5 Gauges........................................................................................................................... 24

5.1 Fixed connectors ................................................................................................... 24 5.2 Free connectors .................................................................................................... 29 5.3 Probes................................................................................................................... 33 5.4 Contact resistance gauge ...................................................................................... 33 5.5 Test panel (for voltage proof test) .......................................................................... 33



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60603-7-7 IEC:2006(E) – 3 –

6 Characteristics................................................................................................................33 6.1 General ................................................................................................................. 33 6.2 Pin and pair grouping assignment .......................................................................... 34 6.3 Climatic category ................................................................................................... 35 6.4 Electrical characteristics ........................................................................................ 35

6.4.1 Creepage and clearance distance .............................................................. 35 6.4.2 Voltage proof ............................................................................................. 36 6.4.3 Current-carrying capacity ........................................................................... 36 6.4.4 Initial contact resistance ............................................................................ 37 6.4.5 Input to output d.c. resistance .................................................................... 37 6.4.6 Input to output d.c. resistance unbalance ................................................... 37 6.4.7 Insulation resistance .................................................................................. 37 6.4.8 Transfer impedance ................................................................................... 38

6.5 Transmission characteristics.................................................................................. 38 6.5.1 Insertion loss ............................................................................................. 38 6.5.2 Return loss ................................................................................................ 38 6.5.3 Propagation delay ...................................................................................... 39 6.5.4 Delay skew ................................................................................................ 39 6.5.5 NEXT loss ................................................................................................. 39 6.5.6 Power sum NEXT loss (for information only) .............................................. 39 6.5.7 FEXT loss.................................................................................................. 39 6.5.8 Power sum FEXT loss (for information only) ............................................... 39 6.5.9 Transverse conversion loss........................................................................ 40 6.5.10 Transverse conversion transfer loss ........................................................... 40 6.5.11 Coupling attenuation .................................................................................. 40

6.6 Mechanical characteristics ..................................................................................... 40 6.6.1 Mechanical operation ................................................................................. 40 6.6.2 Effectiveness of connector coupling devices............................................... 41 6.6.3 Insertion and withdrawal forces .................................................................. 41

7 Tests and test schedule .................................................................................................. 41 7.1 General ................................................................................................................. 41 7.2 Test procedures and measuring methods............................................................... 41 7.3 Preconditioning...................................................................................................... 41 7.4 Wiring and mounting of specimens ........................................................................ 42

7.4.1 Wiring........................................................................................................ 42 7.4.2 Mounting.................................................................................................... 42

7.5 Contact resistance measurement arrangement and procedure ............................... 42 7.5.1 Arrangement for contact resistance measurement ...................................... 42 7.5.2 Test procedure for contact resistance measurement .................................. 43

7.6 Arrangement for dynamic stress tests (test phase CP1) ......................................... 43 7.7 Test schedules ...................................................................................................... 43

7.7.1 Basic (minimum) test schedule................................................................... 44 7.7.2 Full test schedule....................................................................................... 44

Annex A (normative) Gauging continuity procedure............................................................... 53 Annex B (normative) Locking device mechanical operation – Test procedure and requirements......................................................................................................................... 56 Annex C (normative) High frequency (category 7) transmission interoperability testing .......... 57



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– 4 – 60603-7-7 IEC:2006(E)

Annex D (normative) General requirements for the measurement set-up............................... 59 Annex E (normative) Insertion loss ....................................................................................... 64 Annex F (normative) Return loss .......................................................................................... 66 Annex G (normative) Near end cross talk (NEXT) ................................................................. 68 Annex H (normative) Far end cross talk (FEXT).................................................................... 70 Annex I (normative) Transfer impedance .............................................................................. 72 Annex J (normative) Transverse conversion loss (TCL) and transverse conversion transfer loss (TCTL) .............................................................................................................. 78 Annex K (normative) Termination of balun ............................................................................ 81 Annex L (normative) Gauging requirements .......................................................................... 82 Figure 1 – Isometric view, example fixed and free connector, free connector shown with both switch positions ............................................................................................................. 15 Figure 2 – Contact interface dimensions with terminated free connector ................................ 16 Figure 3 – Physical interface, fixed connector, front view ....................................................... 18 Figure 4 – Physical interface, fixed connector, side view........................................................ 19 Figure 5 – Physical interface, free connector ......................................................................... 21 Figure 6 – “Go” gauge ........................................................................................................... 25 Figure 7 – Fixed connector additional go gauge ..................................................................... 25 Figure 8 – “No-go” gauge width ............................................................................................. 26 Figure 9 – “No-go” gauge height ............................................................................................ 26 Figure 10 – Fixed connector additional no-go gauges ............................................................ 27 Figure 11 – “No-go” gauges................................................................................................... 29 Figure 12 – Free connector additional no-go gauges.............................................................. 30 Figure 13 – “Go” gauge .........................................................................................................31 Figure 14 – Free connector additional go gauges................................................................... 32 Figure 15 – Fixed connector pin and pair grouping assignment (front view of connector) ........ 34 Figure 16 – Basic switch function .......................................................................................... 34 Figure 17 – Additional switch function.................................................................................... 35 Figure 18 – Connector de-rating curve................................................................................... 36 Figure 19 – Arrangement for contact resistance measurement ............................................... 42 Figure 20 – Arrangement for dynamic stress tests ................................................................. 43 Figure A.1 – Gauge ............................................................................................................... 54 Figure A.2 – Gauge insertion ................................................................................................. 55 Figure C.1 – Free connector precision test fixture .................................................................. 57 Figure C.2 – Fixed connector precision test fixture ................................................................ 58 Figure D.1 – 180° hybrid used as a balun .............................................................................. 60 Figure D.2 – Calibration of reference loads............................................................................ 61 Figure D.3 – Resistor load.....................................................................................................62 Figure D.4 – Screened pyramid ............................................................................................. 63 Figure D.5 – Definition of reference planes ............................................................................ 63 Figure E.1 – Calibration......................................................................................................... 64 Figure E.2 – Measuring set-up............................................................................................... 65



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60603-7-7 IEC:2006(E) – 5 –

Figure G.1 – NEXT measurement differential and common mode terminations....................... 68 Figure H.1 – FEXT measurement differential and common mode terminations ....................... 70 Figure I.1 – Preparation of test specimen .............................................................................. 73 Figure I.2 – Triaxial test set-up ..............................................................................................74 Figure I.3 – Impedance matching for R1 < 50 Ω ..................................................................... 75 Figure I.4 – Impedance matching for R1 >50 Ω ...................................................................... 76 Figure J.1 – TCL measurement ............................................................................................. 78 Figure J.2 – TCTL measurement ........................................................................................... 79 Figure K.1 – Balanced attenuator for balun centre tap grounded ............................................ 81 Figure K.2 – Balanced attenuator for balun centre tap open ................................................... 81 Table 1 – Physical interface, contacts interface ..................................................................... 17 Table 2 – Fixed connector common dimensions..................................................................... 20 Table 3 – Common dimensions – free connector ................................................................... 22 Table 4 – Fixed connector gauge dimensions ........................................................................ 28 Table 5 – Fixed connector, additional, gauge dimensions ...................................................... 28 Table 6 – Free connector NO-GO gauge dimensions ............................................................. 31 Table 7 – Free connector GO gauges dimensions.................................................................. 32 Table 8 – Free connector additional gauges dimensions ........................................................ 33 Table 9 – Climatic categories – selected values..................................................................... 35 Table 10 – Minimum distances .............................................................................................. 36 Table 11 – Test group P ........................................................................................................44 Table 12 – Test group AP...................................................................................................... 45 Table 13 – Test group BP...................................................................................................... 47 Table 14 – Test group CP ..................................................................................................... 48 Table 15 – Test group DP ..................................................................................................... 49 Table 16 – Test group EP...................................................................................................... 50 Table 17 – Test group FP...................................................................................................... 51 Table 18 – Test group GP ..................................................................................................... 52 Table A.1 – Continuity gauge dimensions .............................................................................. 55 Table D.1 – Test balun performance characteristics .............................................................. 61 Table F.1 – Uncertainty band of return loss measurement at frequencies below 100 MHz ...... 67 Table F.2 – Uncertainty band of return loss measurement at frequencies above 100 MHz ............................................................................................................................... 67



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INTERNATIONAL ELECTROTECHNICAL COMMISSION

––––––––––––

CONNECTORS FOR ELECTRONIC EQUIPMENT –


FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.

5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication.

The International Electrotechnical Commission (IEC) draws attention to the fact that it is claimed that compliance with this document may involve the use of a patent concerning the switch given in 2.2.2.

The IEC takes no position concerning the evidence, validity and scope of this patent right.

The holder of this patent right has assured the IEC that he/she is willing to negotiate licences under reasonable and non-discriminatory terms and conditions with applicants throughout the world. In this respect, the statement of the holder of this patent right is registered with IEC. Information may be obtained from:

Nexans 16, rue de Monceau

75008 Paris France

Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights other than those identified above. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 60603-7-7 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment.

This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision.



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60603-7-7 IEC:2006(E) – 7 –

The following changes to the first edition have been made in this second edition:

• Many minor detail changes concerning the harmonization of this document, its specifications and its test procedures with those contained in the other IEC 60603-7 series standards.

• Significant performance improvements have been made to insertion loss and return loss, now specified to 1 000 MHz, for special applications (ISO/IEC 15018).

The text of this standard is based on the following documents:

FDIS Report on voting

48B/1664/FDIS 48B/1691/RVD

Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

A list of all parts of IEC 60603 series, under the general title Connectors for frequencies below 3 MHz for use with printed boards, can be found on the IEC website.

The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to the specific publication. At this date, the publication will be

• reconfirmed; • withdrawn; • replaced by a revised edition, or • amended.

A bilingual version of this publication may be issued at a later date.



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INTRODUCTION

This detail specification describes connectors according to IEC 60603-7 series connectors requirements.

This detail specification describes connectors that are similar to and backward compatible with IEC 60603-7 series connectors. Backward compatibility definition and requirements are given in 2.2.

The complete requirements for the connectors described herein correspond to this detail specification and the current issues of IEC 60603-7 series, which are referenced herein accordingly.



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60603-7-7 IEC:2006(E) – 9 –

CONNECTORS FOR ELECTRONIC EQUIPMENT –


IEC SC 48B: LF connectors

Specification available from:

IEC Central Office or the addresses shown on the inside cover.

IEC 60603-7-7

Detail specification for two-part cable to cable connector used in:

- high speed communications applications up to 600 MHz

- 4 balanced contact pairs (8 contacts)

- compatible with IEC 60603-7 series connectors

- intended for inside-building cabling systems

Typical construction is for cable mount for use in communication cabling systems Performance level(s): 1, 2

Assessment level(s): not applicable

IEC 1068/06

Reference data: not applicable

Information on the availability of components qualified to this detail specification is not covered.



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– 10 – 60603-7-7 IEC:2006(E)

1 General

1.1 Scope

This part of IEC 60603, which is part of the IEC 60603-7 series, covers 8 way connectors, up to 4 pairs, and specifies mechanical and environmental requirements, and electrical transmission requirements for frequencies up to 600 MHz. These connectors are typically used as category 7 connectors in class F cabling systems specified in IS0/IEC 11801:2002.1

The connectors are intermateable with IEC 60603-7-X series connectors.2

The connectors are interoperable with IEC 60603-7-X series connectors.3

The connectors are backward compatible with IEC 60603-7-X series connectors.4

1.2 Normative references

The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.

IEC 60050(581), International Electrotechnical Vocabulary (IEV) – Chapter 581: Electro-mechanical components for electronic equipment

IEC 60068-1, Environmental testing – Part 1: General and guidance

IEC 60068-2-38, Environmental testing – Part 2: Tests – Test Z/AD: Composite temperature/ humidity cyclic test

IEC 60169-16, Radio-frequency connectors – Part 16: R.F. coaxial connectors with inner diameter of outer conductor 7 mm (0.276 in) with screw coupling – Characteristic impedance 50 ohms (75 ohms) (Type N)

IEC 60352-2, Solderless connections – Part 2: Solderless crimped connections – General requirements, test methods and practical guidance

IEC 60352-3, Solderless connections – Part 3: Solderless accessible insulation displacement connections – General requirements, test methods and practical guidance

IEC 60352-4, Solderless connections – Part 4: Solderless non-accessible insulation displace-ment connections – General requirements, test methods and practical guidance

IEC 60352-5, Solderless connections – Part 5: Press-in connections – General requirements, test methods and practical guidance

IEC 60352-6, Solderless connections – Part 6: Insulation piercing connections – General requirements, test methods and practical guidance

IEC 60352-7, Solderless connections – Part 7: Spring clamp connections – General requirements, test methods and practical guidance

IEC 60512 (all parts), Connectors for electronic equipment – Tests and measurements

___________ 1 ISO/IEC 11801 contains various ‘category’ designations corresponding to various frequency ranges.

2 Intermateability definition and requirements are given in 2.2.

3 Interoperability definition and requirements are given in 2.2.

4 Backward compatibility definition and requirements are given in 2.2.



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60603-7-7 IEC:2006(E) – 11 –

IEC 60512-1-100, Connectors for electronic equipment – Tests and measurements – Part 1-100: General – Applicable publications

IEC 60603-1, Connectors for frequencies below 3 MHz for use with printed boards – Part 1: Generic specification – General requirements and guide for the preparation of detail specifications, with assessed quality

IEC 60603-7, Connectors for frequencies below 3 MHz for use with printed boards – Part 7: Detail specification for connectors, 8-way, including fixed and free connectors with common mating features

IEC 60603-7-5, Connectors for electronic equipment – Part 7-5: Detail specification for 8-way, shielded, free and fixed connectors, for data transmissions with frequencies up to 250 MHz 5

IEC 60664-1, Insulation coordination for equipment within low-voltage systems – Part 1: Principles, requirements and tests

IEC 61076-1, Connectors for electronic equipment – Product requirements – Part 1: Generic specification

IEC 61156 (all parts), Multicore and symmetrical pair/quad cables for digital communications

ISO/IEC 11801:2002, Information technology – Generic cabling for customer premises

ISO 1302, Geometrical Product Specifications (GPS) – Indication of surface texture in technical product documentation

ITU-T G.117, Transmission aspects of unbalance about earth

ITU-T K.20, Resistibility of telecommunication equipment installed in a telecommunications centre to overvoltages and overcurrents

ITU-T K.44, Resistibility tests for telecommunication equipment exposed to overvoltages and overcurrents – Basic recommendation

ITU-T O.9, Measuring arrangements to assess the degree of unbalance about earth

EN 50289-1-14, Communication Cables – Specifications for Test Methods – Part 1-14: Electrical Test Methods – Coupling attenuation or screening attenuation of connecting hardware

2 Technical information

This detail specification covers connectors intended for use in inside-building communication cabling systems.

2.1 Terms and definitions

For the purposes of this part of IEC 60603, the terms and definitions given in 2.1 of IEC 61076-1 and IEC 60050(581) apply. Some applicable terms are also covered in IEC 60512-1.

2.2 Information on application

These connectors are interoperable with lower frequency or “category” IEC 60603-7 series connectors.

___________ 5 To be published.



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2.2.1 Transmission performance categories

In this detail specification, the term “category”, when used in reference to transmission performance, refers to those categories defined by ISO/IEC 11801:2002.

2.2.2 Complete connectors (pairs)

The complete connectors engage a total of 8 contacts.

The IEC 60603-7-7 connector includes the 8 contacts (1,2,3,4,5,6,7,8) of a standard IEC 60603-7 series connector. In addition, the IEC 60603-7-7 connector includes 4 alternative contacts (6’,3’,4’,5’) located on the opposite side to the original contacts of a basic IEC 60603-7 series connector.

A switch is employed within the connectors to engage transmission paths between 4 pairs of terminations and the respective 4 out of 6 pairs of contacts, which operate above or below 250 MHz, see 4.2.

Switch operation is implemented by means of moving switch actuator protrusions on the free connector (see 2.2.2.1 and 2.2.2.2).

2.2.2.1 Fixed connectors

IEC 60603-7-7 fixed connectors include a rear switch actuator and side channels.

These features accommodate the switch actuator protrusions on IEC 60603-7-7 free connectors.

The fixed connector (rear) switch actuator is operated by the free connector front switch actuator protrusion placed in the extended position.

2.2.2.2 Free connectors

IEC 60603-7-7 free connectors include front and side switch actuator protrusions.

The free connector front switch actuator protrusion, when placed in the extended position, operates the fixed connector switch actuator.

The free connector side switch actuator protrusions operate the free connector switch. The absence of fixed connector side channels (as in lower frequency or “category” IEC 60603-7-X series fixed connectors) cause the extended free connector switch actuator protrusions to move into the retracted position upon insertion.

NOTE A free connector with fixed protrusions, which is not backward compatible with IEC 60603-7 series connectors, but is intermateable and interoperable with IEC 60603-7-7 fixed connectors, is specified in IEC 61076-3-1106.

2.2.3 Interchangeability level

These connectors are intermateable, interoperable and backward compatible with IEC 60603-7 series connectors.

Interoperability of a IEC 60603-7-7 connector with a lower frequency IEC 60603-7 series connector is assured by compliance with all transmission requirements of the lower frequency IEC 60603-7 series connector when the fixed connector is mated with a full range of “test” free connectors, or “test plugs”, as described in the lower frequency IEC 60603-7 series connector.

___________ 6 Under consideration.



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60603-7-7 IEC:2006(E) – 13 –

2.2.3.1 Intermateability

Intermateability is ensured by applying the “GO” and “NO-GO” gauge requirements herein, and adherence to dimensional requirements herein.

2.2.3.2 Interoperability

Interoperability of different IEC 60603-7-7 connectors is assured by compliance with all transmission requirements when the connector is mated with the respective “test” connector as described in Annex C.

Interoperability of a IEC 60603-7-7 connector with a lower frequency IEC 60603-7 series connector is assured by compliance with all transmission requirements of the lower frequency IEC 60603-7 series connector when the fixed connector is mated with a full range of “test” free connectors, or “test plugs”, as described in the lower frequency IEC 60603-7 series connector.

2.2.3.3 Backward Compatibility

The backward compatibility requirement ensures that a plug or jack which is in compliance with this detail specification, mated with a jack or plug in compliance with any lower frequency IEC 60603-7 series connector, shall fully comply with the requirements of the lower frequency IEC 60603-7 series connector.

2.2.4 Shielding/grounding

Shielding features form an integral part of these connectors and they are specified herein.

2.2.5 Terminations

These cable connectors are terminated to the signal line and screen of the cable with specified terminations.

Fixed and free connector terminations are specified in Clause 4 and shall conform to the requirements of Clause 6.

Screen terminations shall conform to the requirements of Clause 6.

2.3 IEC type designation

Connectors, connector bodies and connectors with pre-inserted contacts according to this detail specification shall be designated by the following system:



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IEC 60603-7-7 L

Reference to this standard

N L L N N N L

Letter denoting the connector type

Fixed version A

Free version C

Number of contacts

Letter denoting type of contact

Female F

Male M

Letter denoting type of termination

Crimp C

Accessible insulation displacement (IDC)

M

Letter denoting type of conductor accomodation, or cable

Stranded wire B

Solid wire C

Number denoting variant

Variant 1 1

Number denoting contact finish

Gold, gold-alloy 1

Palladium/nickel 2

Number denoting performance level (PL)

750 operations 1

2500 operations 2

Non-accessible insulation displacement (IDC)

N

Insulation piercing (IPC) P

Solder S

Spring Clamp B

Press-in connection T

Screw terminal A

Stranded or solid wire E

Customer specific requirements for cables

X

Board mounted G

Tinsel wire A

Tinsel or stranded wire D

Tinsel, stranded, or solid wire F

Eight 8

NOTE “L” stands for letter. “N” stands for number.

Example: IEC 60603-7-7 A8FM-E111: Fixed shielded connector, having 8 female contacts with accessible IDC contacts, for stranded or solid wires, gold plated, meeting performance level 1.



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60603-7-7 IEC:2006(E) – 15 –

3 Dimensional information

Common characteristics are given herein for fixed connectors and free connectors.

3.1 General

The shape of the connectors may deviate from those given in the following drawings as long as the specified dimensions are not influenced.

Dimensions are given in millimetres.

Drawings are shown in first angle projection unless specifically stated otherwise in the figure.

3.2 Isometric view

See Figure 1.

IEC 1069/06

NOTE The free connector protrusions move together, between the extended position and the retracted position, to activate the switch within the free connector, see 2.2.

Figure 1 – Isometric view, example fixed and free connector, free connector shown with both switch positions



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3.3 Common features

These connectors have common features concerning the arrangement of the contacts, mating information, and the coupling device.

These connectors have the same common features as the IEC 60603-7 series connectors.

Mating alignment is controlled by a vertical and horizontal reference position and the centering of the coupling device (latch).

3.4 Engagement (mating) information

Common dimensions are given in Figure 2 and in Table 1.

Care shall be taken that contacts avoid interference with the plastic of the free connector.

The mating information shown can only be achieved with a free connector with a cable attached.

C

D

C

P1

N2

B2 D

D D

0,15 mm

0,006 in

D D

0,15 mm

0,006 in

P3

N2

B2 D D

J2

A2C2

D2

E2A

G2

M2

K2

R2

CK

2 C

R2

P2

B

G2

H2

IEC 1070/06

NOTE View D: preferred contact interface detail.

Figure 2 – Contact interface dimensions with terminated free connector



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60603-7-7 IEC:2006(E) – 17 –

Table 1 – Physical interface, contacts interface

Maximum Minimum Letter

mm mm

A2 1,45 0,89

B2 0,61 0,51

C2 0,46 0,03

D2 2,79

E2 4,11

F2 6,22

H2c 0,38

J2 0,64 0,38

K2 6,15 5,89

M2d 0,30

N2 0,28

P1a 0,50 0,45

P3b 0,50 0,36

R2 4,83

CK2 0,60 0,50

CR2 1,70

G2 (Angle) 10o

a P1: preferred fixed connector contact configuration. b P3: optional fixed connector contact configuration. c H2: Burrs shall not project above top of contact in this area, since it may be a contact area. d M2: Minimum preferred contact configuration.



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– 18 – 60603-7-7 IEC:2006(E)

3.5 Fixed connectors

Common dimensions are given in Figure 3 and Figure 4 and in Table 2.

All internal corners in the connector cavity shall have a maximum radius of 0,38 mm unless otherwise specified.

Contacts are shown at rest. Contacts shall always be contained inside guide slots. Contacts shall move freely within their guide slots.

AD1

AH1

B1

7× AH1

CA

1

AB1

CQ1

AH1

T1

W1

CS1

S1

CT1

C

CK

1

CP

1 C

N1

K1 B

C

C

X

X

0,05 mm

0,002 in

0,05 mm

0,002 in

0,15 maximum taper

C

C

0,25 mm

0,010 in

C

C

0,25 mm

0,010 in

IEC 1071/06

Figure 3 – Physical interface, fixed connector, front view



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60603-7-7 IEC:2006(E) – 19 –

SE1

SA1

SG1

AL1

CB1

X1 A1

A

B

Y1

CG

1

AA

1

AK

1 AC

1

SD

1

SB

1

AP

1 AJ1

IEC 1072/06

Figure 4 – Physical interface, fixed connector, side view



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– 20 – 60603-7-7 IEC:2006(E)

Table 2 – Fixed connector common dimensions

Maximum Minimum Nominal Letter

mm mm mm A1 1,47 B1 0,71 K1a 5,84 S1 12,04 11,84 11,94 T1 4,19 3,94 W1 6,38 6,22 X1 6,86 6,68 Y1 2,34

AA1b 1,24 AB1 0,38 AC1 6,96 6,76 6,86 AD1 0,13 AH1h 1,02 AK1 8,66 8,38 AL1c 1,40 AP1g 1,27 CA1 2,30 2,20 CB1 3,95 CG1 0,10 CK1a 0,65 CN1 1,40 1,30 CP1 5,05 4,95 CQ1 6,00 5,80 CS1 7,66 CT1 13,0 12,9 SA1 5,31 SB1 2,16 SD1 4,90 SE1d 5,80

SG1e, f 5,80 Letter

AJ1 angle 15° a K1, CK1: Contact zone. Contacts shall be completely within their individual contact zone in the area indicated. b AA1: Preferred male free connector stop. c AL1: Front surface need not be planar or coincident with the surface below the locking device as long as

insertion, latching and unlatching of free connectors is not inhibited. Projections beyond AL1 dimension shall not prevent finger access to the free connector locking (coupling) device.

d SE1: Maximum forward extension of contacts below surface AC1, to avoid contact with shields of free connectors. Applies in the mated state.

e SG1: Maximum forward extension of contacts above surface reference plane B, to avoid contact with shields of free connectors. Applies in the mated state.

f SG1: When this dimension is greater than 2,5 mm, and the fixed connector is mated with a lower frequency IEC 60603-7 series free connector, then “additional switch function” (see 4.2) should be utilised, The clearance requirement between signal conductors 6’,3’,4’,5’ of the fixed connector and the screen of a lower frequency IEC 60603-7 series free connector are maintained when this dimension is 2,5 mm or less while the “basic switch function” (see 4.2) is utilised. SG1 is typically 0,0 mm in the mated state with a IEC 60603-7-1,2,3,4,5 free connector.

g AP1: Flat surface. h AH1: True position.

NOTE 1 Care should be taken that all screen contacts of the fixed connector always make contact with the screen contacts of the free connector in worst case condition to ensure reliable performance.

NOTE 2 All internal corners in the connector cavity should be 0,38 mm radius maximum unless otherwise specified.



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60603-7-7 IEC:2006(E) – 21 –

3.6 Free connectors

Common dimensions are given in Figure 5 and in Table 3.

Full radius permitted on all contact slots.

SG2

CQ2 0,15C

CS2 0,15C

AH

2

CB2 SA2BC2

X2 A2

BM2

BP2 BA2

BB2

7× AH2 0,15C

AH

2

SE2

A

CG

2 C

A2

AX

2

AY

2

BL2

SD

2 S

B2

BF2

W2 0,15C

T2 0,15C

B2CP

2 C

N2

CT2 0,15C

AB2

AA

2 A

C2

BN

2

B2 B

AD2

S2

IEC 1073/06

Figure 5 – Physical interface, free connector



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– 22 – 60603-7-7 IEC:2006(E)

Table 3 – Common dimensions – free connector

Maximum Minimum Nominal Letter

mm mm mm A2 1,45 0,89 1,17 B2 0,61 0,51 0,56 S2 11,79 11,58 11,68 T2 3,38 3,12 W2 6,17 6,02 X2 6,51 6,36

AA2 1,24 AB2 0,64 0,38 AC2 6,71 6,50 6,60 AD2 0,64 0,13 AH2a 1,02 AX2 1,32 AY2 2,87 2,67 BA2 12,32 BB2 1,14 0,38 BC2 1,02 0,51 BF2 0,64 BL2b 8,36 BM2 15,88 14,61 BN2 9,24 BP2 23,11 CA2 2,20 2,00 CB2 3,95 3,75 CG2 0,22 0,12 CN2 1,30 1,20 CP2 5,05 4,95 CQ2 5,70 5,50 CS2a 7,66 CT2 12,85 12,75 SA2 4,22 SB2 2,11 SD2 4,95 SE2 6,85 SG2 6,85

a AH2, CS2: These dimensions apply to the locations of the contact slots. b BL2: Applies with locking device depressed. NOTE Full radius permitted on all slots.



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60603-7-7 IEC:2006(E) – 23 –

4 Terminations

A connector may include multiple terminations between the cable termination and the separable contact interface. These may include press-in (compliant pin) connections of jack springs into PCBs, for example. All terminations shall meet the relevant termination requirements.

In the case where a type of solderless termination is used which is not covered by any IEC standard and the supplier cannot demonstrate similar level of performance or there is no applicable IEC 60352 standard to be used as a reference, the supplier shall show conformance with the full test schedule in 7.7 for all possible variations of terminations, for example each cable construction type (screen construction types, wire construction (solid, flexible)) the connector is intended to be used for.

Free connectors are intended to be terminated to cable to provide connector and cable assemblies. The connector type designation provides basic terminations concerning the type of conductor (tinsel, stranded, solid) to which the conductor may be applied, and the type of connection used (solder, insulation displacement, etc.). Specific details concerning wire gauge size, type and thickness of conductor insulation, size and shape of cordage or cable jacket, etc., are not intended to be part of this specification. Minor variations in a free connector’s interior details to accommodate differing wire gauge sizes, outer jackets, etc., do not require the generation of new free connector specifications.

If the connector is able to be used with multiple cable types, the manufacturer shall assure that all terminations comply with the relevant IEC standards with each of the cable types.

4.1 Referenced termination types

If a type of solderless termination which is covered by a IEC 60352 series specification is used, the supplier shall assure its reliability by performing tests and demonstrating a level of performance, according to IEC 60352 specifications.

4.1.1 Insulation displacement terminations

Shall conform to IEC 60352-3 or IEC 60352-4.

4.1.2 Crimp terminations

Shall conform to IEC 60352-2.

4.1.3 Insulation piercing terminations


4.1.4 Compliant pin (press-in)


4.1.5 Spring clamp terminations


4.1.6 Non-referenced termination types

If a type of termination is used, which is not covered by any IEC 60352 series specification, the supplier shall assure its reliability by performing similar tests, and demonstrating a similar level of performance, to those covered by IEC 60352 series.



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– 24 – 60603-7-7 IEC:2006(E)

4.1.7 Solder terminations

Solder terminations are not covered in IEC 60352 series and are allowed.

4.2 Switch function

Minimum switch function requirements are given and are identified as “basic switch function”.

Additional switch functions are given and are identified as “additional switch function”.

Switch functions are illustrated in 6.2 and Figure 16 and Figure 17.

4.2.1 Basic switch function

The basic switch function uses a single pole switch for each alternate contact to connect the respective standard contact to either the screen or the alternate contact. The alternate contact is permanently connected to the termination.

4.2.2 Additional switch function

The additional switch function uses a double pole switch for each alternate contact to connect the respective standard contact to either the screen or the termination while the alternate contact is respectively connected to the termination or the screen. Neither the alternate contact nor the respective standard contact is permanently connected to the termination.

4.3 Accessories

Accessories are not specified.

4.4 Mounting information for fixed connectors

Fixed connector mounting information is not specified.

4.4.1 Hole pattern on printed boards

Fixed connector printed board mounting is not specified.

4.4.2 Mounting on panels

Fixed connector mounting on panels is not specified.

4.5 Mounting information for free connectors

Mounting information for free connectors onto cables is not specified.

5 Gauges

5.1 Fixed connectors

Gauges shall be made according to the following requirements: Material: tool steel, hardened. v = Surface roughness, according to ISO 1302. Ra = 0,25 µm maximum A 0,01 mm wear tolerance shall be applied. Clearance shall be provided for signal contacts and screen contacts (not shown on drawings).



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60603-7-7 IEC:2006(E) – 25 –

BC1

S3

AK3

AB3

W3

AC3

-C- X3

BC1

0,05 mm C

1

2 3

IEC 091/05

NOTE 1 Four places.

NOTE 2 Six places.

NOTE 3 All around.

Figure 6 – “Go” gauge

CT3

CQ3 CB3

CA

3

IEC 1074/06

Figure 7 – Fixed connector additional go gauge



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– 26 – 60603-7-7 IEC:2006(E)

BC1

S5

AK5

AB3

W5

AC5

-C- X3

BC1

0,05 mm C

1

2 3

IEC 092/05 NOTE 1 Four places.

NOTE 2 Six places.

NOTE 3 All around.

Figure 8 – “No-go” gauge width

BC1

S7

AK7

AB3

W7

AC7

-C- X3

BC1

0,05 mm C

1

2 3

IEC 093/05

NOTE 1 Four places

NOTE 2 Six places

NOTE 3 All around.

Figure 9 – “No-go” gauge height



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60603-7-7 IEC:2006(E) – 27 –

CT5

CQ5

CT7

CQ7

CT9

CQ9

CA

9 C

A7

CA

5

Width gauge

Height gauge

Depth gauge

IEC 1075/06

IEC 1076/06

IEC 1077/06

Figure 10 – Fixed connector additional no-go gauges



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– 28 – 60603-7-7 IEC:2006(E)

Table 4 – Fixed connector gauge dimensions

Maximum Minimum Nominal (ref) Letter

mm mm mm

S3 11,796 11,786

S5 12,050 12,040

S7 11,68 11,58

X3 10,16

AB3 0,51 0,389 0,450

AC3 6,716 6,706

AC5 6,45 6,35

AC7 6,970 6,96

BC1 0,89 0,64 0,76

W3 6,12 6,109

W5 6,38 6,365

W7 5,97 5,89

AK3 8,357 8,346

AK5 8,13 8,05

AK7 8,672 8,66

Table 5 – Fixed connector, additional, gauge dimensions

Maximum Minimum Letter mm mm

CA3 2,17 2,03 CA5 2,17 2,03 CA7 2,31 2,3 CA9 2,17 2,03 CB3 2,27 2,08 CQ3 5,7 5,55 CQ5 5,7 5,55 CQ7 5,7 5,55 CQ9 6,01 6,0 CT3 12,87 12,81 CT5 13,01 13,0 CT7 12,87 12,81 CT9 12,87 12,81



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60603-7-7 IEC:2006(E) – 29 –

5.2 Free connectors

Gauges shall be made according to the following requirements: Material: tool steel, hardened. v = Surface roughness, according to ISO 1302 Ra = 0,25 µm maximum A 0,01 mm wear tolerance shall be applied.

AD4

View B-B

S6

W6

AT2

View A-A

W4 AB4

AC4

AD4

AK4

-C-

AB4 0,1 mm

S4

A AT2

AC6AK4

AB4

0,1 mm C

AD4

B

AX2

A B

AX2

2

C

-C-

3

1 1

IEC 094/05

NOTE 1 All around.

NOTE 2 Width gauge.

NOTE 3 Height gauge.

Figure 11 – “No-go” gauges



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– 30 – 60603-7-7 IEC:2006(E)

CT4

CQ4C

A4

CT6

CQ6

CA

6

CT8

CQ8

CA

8

Width gauge

Width gauge

Height gauge

IEC 1078/06

IEC 1079/06

IEC 1080/06

Figure 12 – Free connector additional no-go gauges



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60603-7-7 IEC:2006(E) – 31 –

Table 6 – Free connector NO-GO gauge dimensions


mm mm

S4 11,593 11,582

S6 11,989 11,887

W4 6,02 6,010

W6 6,40 6,30

AB4 0,38 0,0

AC4 6,91 6,81

AC6 6,512 6,502

AD4 0,127 0,0

AK4 9,42 9,32

AT2 15,29 15,19

AX2 0,635 0,38

AX2A4

Z4

AY2

-B-

X4

Y4

-A-

AW2 AK8 AC8

AJ2

A

A

AD6

AB6

T4

W6

S8

0,05 mm C

0,05 mm C

Section A-A

AZ2

AA4

AD6

AC6

-C-

1

IEC 095/05

NOTE 1 All around.

Figure 13 – “Go” gauge



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– 32 – 60603-7-7 IEC:2006(E)

CT2

CQ2

CA

2

IEC 1081/06 Figure 14 – Free connector additional go gauges

Table 7 – Free connector GO gauges dimensions


mm mm

A4 1,448 1,438

S8 11,847 11,836

T4 4,115 4,013

W6 6,198 6,187

X4 6,604 6,594

Y4 2,39 2,34

Z4 2,39 2,29

AA4 1,255 1,245

AB6 0,38 0,0

AC8 6,767 6,756

AD6 0,13 0,0

AK8 8,357 8,346

AW2 9,42 9,32

AX2 0,64 0,38

AY2 0,305 0,295

AZ2 11,91 11,81

AJ2 16 14



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60603-7-7 IEC:2006(E) – 33 –

Table 8 – Free connector additional gauges dimensions


mm mm

CA2 2,22 2,21

CA4 2,22 2,21

CA6 2,22 2,21

CA8 2,0 1,99

CQ2 5,81 5,71

CQ4 5,81 5,71

CQ6 5,7 5,69

CQ8 5,81 5,71

CT2 12,96 12,86

CT4 12,85 12,84

CT6 12,96 12,86

CT8 12,96 12,86

5.3 Probes

Probe damage testing is not specified.

5.4 Contact resistance gauge

Contact resistance is only specified for mated connectors.

5.5 Test panel (for voltage proof test)

These connectors are screened. The connector shield forms the ground conductor for voltage proof testing.

6 Characteristics

All the requirements and test schedules apply to the entire mated connectors including the switch unless otherwise specified.

6.1 General

Compliance to the test schedules is intended to ensure the reliability of all performance parameters, including transmission parameters, over the range of operating climatic conditions. Stable and compliant contact resistance is a good indication of the stability of transmission performance.

The characteristics given within this specification are those that are specific to IEC 60603-7-7. The other relevant characteristics are given in the series IEC 60603-7-X. A connector complying with IEC 60603-7-7 also complies with the other lower levels of IEC 60603-7-X.



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– 34 – 60603-7-7 IEC:2006(E)

6.2 Pin and pair grouping assignment

For those specifications for which pin and pair groupings are relevant, unless otherwise specified, the pin and pair grouping assignments shall be as shown in Figure 15.

1 2

4’6’ 3’ 5’

7 86543

IEC 1082/06

Figure 15 – Fixed connector pin and pair grouping assignment (front view of connector)

White-orange

Orange

White-green

Blue Blue

White-blue

Green

White-brown

Brown

1

2

3

3′

4

4′

5

5′

6

6′

7

8

IEC 1083/06

Figure 16 – Basic switch function



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60603-7-7 IEC:2006(E) – 35 –

White-orange

Orange

White-green

Blue

White-blue

Green

White-brown

Brown

1

2

3a

3

4a

4

5a

5

6a

6

7

8

IEC 1084/06

Figure 17 – Additional switch function

6.3 Climatic category

The lowest and highest temperatures and the duration of the damp heat, steady state test should be selected from the preferred values stated in IEC 61076-1. The connectors are classified into climatic categories in accordance with the general rules given in IEC 60068-1. The following preferred temperature range and severity of the damp heat steady state test have been selected to comply with IEC 61156 series cables (for cables used with these connectors).

Table 9 – Climatic categories – selected values

Climatic category Temperature range °C

Damp heat steady state days

40/070/21 –40 to +70 21

6.4 Electrical characteristics

6.4.1 Creepage and clearance distance

The permissible operating voltages depend on the application and on the applicable or specified safety requirements.

Insulation co-ordination is not required for this connector; therefore, the creepage and clearance distances in IEC 60664-1 are reduced and covered by overall performance requirements.

Therefore, the creepage and clearance distances are given as operating characteristics of mated connectors.



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– 36 – 60603-7-7 IEC:2006(E)

In practice, reductions in creepage or clearance distances may occur due to the conductive pattern of the printed board or the wiring used, and shall duly be taken into account.

Table 10 – Minimum distances

Minimum distance between contacts and chassis

Minimum distance between adjacent contacts

Creepage Clearance Creepage Clearance Type

mm mm mm mm

A, C 1,40 0,51 0,36 0,36

6.4.2 Voltage proof

Conditions: IEC 60512, test 4a, Method A.

Standard atmospheric conditions.

Mated connectors:

1 000 V d.c. or a.c. peak, contact-to-contact,

1 500 V d.c. or a.c. peak, contact-to-test panel or contact-to-shield.

6.4.3 Current-carrying capacity

Conditions: IEC 60512, test 5b.

All contacts, connected in series.

The current carrying capacity of connectors in accordance with the requirements of IEC 61076-1 shall comply with the de-rating curve given in Figure 18.

2,5

2,0

1,5

1,0

0,5

0 0 10 20 30 40 50 60 70 80

Ambient temperature of connector °C

Cur

rent

-car

ryin

g ca

paci

ty

A

IEC 097/05

Figure 18 – Connector de-rating curve

30 °C maximum temperature rise when applying 0,75 A at 60° C.



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60603-7-7 IEC:2006(E) – 37 –

6.4.4 Initial contact resistance

Conditions: IEC 60512, test 2a.

Mated connectors. Arranged according to 7.5.

Connection points: as specified in Figure 19.

Signal contacts: 20 mΩ maximum.

Screen contact: 20 mΩ maximum.

Switch contact: 20 mΩ maximum.

6.4.5 Input to output d.c. resistance


Mated connectors.

Connection points: cable termination to cable termination.

Signal contacts: 200 mΩ maximum.

Screen: 100 mΩ maximum.

6.4.6 Input to output d.c. resistance unbalance


Mated connectors.

Connection points: cable termination to cable termination.

Among all signal and switch conductors, maximum difference between maximum and minimum:

50 mΩ maximum.

6.4.7 Insulation resistance

Conditions: IEC 60512, test 3a, Method C.

Method A.

Mated connectors.

Test voltage: 100 V d.c..

Each contact and screen to all others: 500 MΩ minimum.



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– 38 – 60603-7-7 IEC:2006(E)

6.4.8 Transfer impedance

Conditions:

Annex I, transfer impedance test method.

Mated connectors, terminated with each cable construction intended to be allowed for these connectors.

All types:

0,05(f 0,3) Ω from 1 to 10 MHz.

0,01(f) Ω from 10 to 80 MHz.

NOTE f is the frequency expressed in MHz.

6.5 Transmission characteristics

Category 7 performance level, respective to transmission characteristics, is determined according to specific test methods described in test group E.

Category 7 transmission performance interoperability of independent fixed or free connectors is determined by tests conducted when they are mated with precision test fixtures given in Annex C.

Transmission performance backward compatibility shall be demonstrated by testing the fixed connectors with the full range of free connectors or “test plugs” described in IEC 60603-7-5. Interoperability and backward compatibility of free connectors shall be demonstrated by testing them against the limits in IEC 60603-7-5, Annex C.

All transmission performance requirements apply between the reference planes specified in Clause D.8.

All transmission performance requirements apply for the range of frequency from 1 MHz to 600 MHz unless stated otherwise.

NOTE f is the frequency expressed in MHz.

6.5.1 Insertion loss

Conditions: Annex E, insertion loss.

Mated connectors.

All types: ≤ f02,0 dB up to 1 000 MHz.

Whenever the formula results in a value less than 0,1 dB, the requirement shall revert to 0,1 dB.

6.5.2 Return loss

Conditions: Annex F, return loss.

Mated connectors.

All types: 68 – 20log(f) dB up to 1 000 MHz.



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60603-7-7 IEC:2006(E) – 39 –

Whenever the formula results in a value greater than 30 dB, the requirement shall revert to 30 dB.

6.5.3 Propagation delay

All types: ≤2,5 ns.

NOTE Propagation delay test does not need to be performed, since it is assumed that connectors comply by design.

6.5.4 Delay skew

All types: <1,25 ns.

NOTE Delay skew test does not need to be performed, since it is assumed that connectors comply by design.

6.5.5 NEXT loss

Conditions: Annex G, NEXT loss, pair to pair.

Mated connectors, between all combinations of 2 pairs of contacts.

All types: 102,4 – 15log(f) dB.


6.5.6 Power sum NEXT loss (for information only)

Conditions:

Mated connectors, between each pair and all other pairs combined.

All types: 99,4 – 15log (f) dB.

NOTE This characteristic is achieved by compliance to pair-to-pair NEXT (6.5.5) and there is no necessity to test it.

6.5.7 FEXT loss

Conditions: Annex H, FEXT loss, pair-to-pair.

Mated connectors, between all combinations of 2 pairs of contacts.

All types: 90 – 15log(f) dB.


6.5.8 Power sum FEXT loss (for information only)

Conditions:

Mated connectors, between each pair and all other pairs combined.


NOTE This characteristic is achieved by compliance to PP FEXT (6.5.7) and there is no necessity to test it.



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– 40 – 60603-7-7 IEC:2006(E)

6.5.9 Transverse conversion loss

Conditions: Annex J, transverse conversion loss.

Mated connectors.



NOTE This requirement applies up to 100 MHz. Test methods for frequencies above 100 MHz are not yet fully stabilized.

6.5.10 Transverse conversion transfer loss

Conditions: Annex J, transverse conversion transfer loss.

Mated connectors.



NOTE This requirement applies up to 100 MHz. Test methods for frequencies above 100 MHz are not yet fully stabilized.

6.5.11 Coupling attenuation

Conditions: According to EN 50289-1-14, coupling attenuation test method.

Mated connectors.

All types ≥ 85 dB, 30 MHz ≤ f ≤ 100 MHz

≥ 85 – 20 log (f/100) dB, 100 MHz < f ≤ 1 000 MHz

NOTE The coupling attenuation requirement is assumed to be fulfilled when the transfer impedance and unbalance attenuation (transverse conversion loss and transverse conversion transfer loss) requirements are met on the full bandwidth.

6.6 Mechanical characteristics

6.6.1 Mechanical operation


Speed: 10 mm/s maximum.

Rest: 1 s minimum (mated and unmated).

PL1: 750 operations.

PL2: 2 500 operations.

NOTE PL1 and PL2 are defined in 2.3.



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60603-7-7 IEC:2006(E) – 41 –

6.6.2 Effectiveness of connector coupling devices

Conditions: IEC 60512, test 15f, and Annex B.

Mated connectors.

All types: 50 N for 60 s ± 5 s.

6.6.3 Insertion and withdrawal forces

Conditions: IEC 60512, test 13b, and Annex L.

Speed: 10 mm/s maximum.

All types, insertion and withdrawal: 30 N maximum.

7 Tests and test schedule

7.1 General

See IEC 61076-1.

All the requirements and test schedules apply to the entire mated connectors including the switch unless otherwise specified.

This detail specification states the test sequence (in accordance with this standard), and the number of specimens for each test sequence.

Individual variants may be submitted to type tests for approval of those particular variants.

It is permissible to limit the number of variants tested to a selection representative of the whole range for which approval is required (which may be less than the range covered by the detail specification), but each feature and characteristic shall be proved.

The connectors shall have been processed in a careful and workmanlike manner, in accordance with good current practice.

Unless otherwise specified, mated sets of connectors shall be tested. For contact resistance measurements, care shall be taken to keep a particular combination of connectors together during the complete test sequence, that is, when unmating is necessary for a certain test, the same connectors shall be mated for subsequent tests.

7.2 Test procedures and measuring methods

The test methods specified and given in the relevant standards are the preferred methods but are not necessarily the only ones that can be used. In case of dispute, however, the specified method shall be the reference method.

Unless otherwise specified, all tests shall be carried out under standard atmospheric conditions for testing as specified in IEC 60068-1.

Where approval procedures are involved and alternative methods are employed, it is the responsibility of the manufacturer to satisfy the authority granting approval that any alternative methods which he may use gives results equivalent to those obtained by the methods specified.

7.3 Preconditioning

Before the tests are made, the connectors shall be preconditioned under standard atmospheric conditions for testing as specified in IEC 60068-1 for a period of 24 hours unless otherwise specified by the detail specification.



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– 42 – 60603-7-7 IEC:2006(E)

7.4 Wiring and mounting of specimens

7.4.1 Wiring

Wiring of these connectors shall take into account the wire diameter of the cables defined in IEC 61156 parts 2, 3, 4, 5 and 6 as applicable. Where wiring and/or shielding of test specimens is required, the detail specification shall contain information suitable to comply with the selected methods of test.

7.4.2 Mounting

When mounting is required in a test, unless otherwise specified, the connectors shall be rigidly mounted on a metal plate or to specified accessories, whichever is applicable, using the specified connection methods, fixing devices and panel cut-outs.

7.5 Contact resistance measurement arrangement and procedure

Arrangement and procedure for contact resistance measurement are given herein.

7.5.1 Arrangement for contact resistance measurement

For the measurement of contact resistance, the points of connection shall be as shown in Figure 19.

4

3

1

2

5

8

7

6

IEC 098/05

NOTE 1 Fixed connector. NOTE 2 Point B. NOTE 3 Point A. NOTE 4 As short as practical (except for vibration test CP1 see 7.3). NOTE 5 Free connector. NOTE 6 As short as practical (except for vibration test CP1 see 7.3). NOTE 7 Point C. NOTE 8 Contact resistance measurement points.

Figure 19 – Arrangement for contact resistance measurement



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60603-7-7 IEC:2006(E) – 43 –

7.5.2 Test procedure for contact resistance measurement

a) Determine the bulk resistance of the fixed connector between points A and B of Figure 19 by calculation or by measurement. This resistance is noted RAB.

b) Determine the bulk resistance of the free connector between points B and C of Figure 19 by calculation or by measurement. This resistance is noted RBC.

c) Measure the total mated connector resistance between points A and C, following the requirements and procedures of IEC 60512, test 2a. This resistance is noted RAC.

d) Calculate the contact resistance by subtracting the sum of the bulk resistance of the fixed and free connectors from the total mated connector resistance.

Contact resistance = RAC − (RABI + RBCI)

where I indicates initial value.

7.6 Arrangement for dynamic stress tests (test phase CP1)

≥203,2

3

6

2

1

5

4

7

8

≥203,2

IEC 099/05

NOTE 1 Fixed connector vibration feature.

NOTE 2 Point B.

NOTE 3 Point A. Secure to the non-vibrating member.

NOTE 4 Point C. Secure to the non-vibrating member.

NOTE 5 Free connector.

NOTE 6 Fixed connector rigidly fixed to the mounting plate.

NOTE 7 Mounting plate.

NOTE 8 Contact resistance measurement point.

Figure 20 – Arrangement for dynamic stress tests

7.7 Test schedules

The test parameters required shall not be less than those listed in Clause 6.



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– 44 – 60603-7-7 IEC:2006(E)

7.7.1 Basic (minimum) test schedule

Not applicable.

7.7.2 Full test schedule

The following tests specify the characteristics to be checked and the requirements to be fulfilled.

For a complete test sequence, a minimum of 52 + N specimens are needed. This equals 5 groups of 10, 1 group of 2 and N groups of 1. The 5 groups of 10 shall be for test group A, B, C, D, and F. The group of 2 shall be for the transmission performance testing, group E. The N groups of 1 shall be for the screen performance testing, group F. The N stands for each cable screen construction type the connectors are intended to be used for.

Where not otherwise stated, contact resistance tests, including screen contacts, apply only to the interface between plug and jack (see 7.5).

7.7.2.1 Test group P – preliminary tests

All specimens shall be subjected to the following tests. All the test group specimens shall be subjected to the preliminary group P tests in the following sequence.

The specimens shall then be divided into the appropriate number of groups. All connectors in each group shall undergo the following tests as described in the sequence given, with required alteration of the sequence of tests or adding of new tests to verify additional connector characteristics.

Table 11 – Test group P

Test Measurement to be performed Test phase

Title IEC 60512 test no.

Severity or condition of test


Requirements

P 1 General examination

1 Visual examination

1a There shall be no defects that would impair normal operation

Examination of dimensions and mass

1b The dimensions shall comply with those specified in the detail specification

P 2 Polarization not applicable

P 3 Contact resistance

Measurement points as in Figure 19

All signal contacts/specimens

Millivolt level method or contact resistance – specified test current method

2a Contact resistance = 20 mΩ maximum

P 4

Test voltage 100 V + 15 V d.c. Method C Mated connectors

Insulation resistance

3a 500 MΩ minimum

P 5

Contact/contact Method A Mated connectors

Voltage proof 4a 1 000 V d.c. or a.c. peak

All contacts to screen Method A Mated connectors

1 500 V d.c. or a.c. peak



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60603-7-7 IEC:2006(E) – 45 –

7.7.2.2 Test group AP

Table 12 – Test group AP

Test Measurement to be performed Test phase Title Test Severity or

condition of test Title IEC 60512

Test no. Requirements

AP 1 Insertion and withdrawal forces

IEC 60512, 13b

Connector locking device depressed

Insertion force 20 N maximum Withdrawal force 20 N maximum

AP 2 Effectiveness of connector coupling device

IEC 60512, 15f

Rate of load application 44,5 N/s maximum

50 N for 60 s + 5 s

AP 3 Rapid change of temperature

IEC 60512, 11d

–40 °C to 70 °C Mated connectors 25 cycles ι = 30 min Recovery time 2 h

AP 4 Test voltage 100 V + 15 V d.c. Method C Mated connectors


3a 500 MΩ minimum

AP 5 Measurement points as in Figure 19 All contacts/specimens

Contact resistance

2a 20 mΩ maximum change from initial

AP 6 Contact/contact: Method A Mated connectors

Voltage proof

4a 1 000 V d.c. or a.c. peak

All contacts to screen: Method A Mated connectors


AP 7

Unmated connectors Visual examination


AP 8 Cyclic damp heat

IEC 60068-2-38

21 cycles low temperature 25 °C High temperature 65 °C cold subcycle –10 °C Humidity 93 % Half of the samples in mated state Half of the samples in unmated state

AP 9 Measurement points as in Figure 19 All contacts/specimens

Contact resistance

2a 20 mΩ maximum change from initial for signal contacts 100 mΩ maximum input to output resistance for screen

AP 10 Insertion and withdrawal forces

IEC 60512, 13b

Connector locking device depressed

Insertion force 30 N maximum Withdrawal force 30 N maximum

AP 11 Effectiveness of connector coupling device

IEC 60512, 15f

Rate of load application 44,5 N/s maximum

50 N for 60 s + 5 s

AP 12 Unmated connectors Visual examination

1a There shall be not defects that would impair normal operation

AP 13 Solderability As applicable

AP 14 Resistance to soldering heat

As applicable



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– 46 – 60603-7-7 IEC:2006(E)

Test Measurement to be performed Test phase Title Test Severity or

condition of test Title IEC 60512

Test no. Requirements

AP 15 See Note

Contact/contact: Method A Mated connectors

Voltage proof




NOTE Do not perform step AP 15 if solderability and resistance to soldering heat is not performed.



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60603-7-7 IEC:2006(E) – 47 –

7.7.2.3 Test group BP

Table 13 – Test group BP

Test Measurement to be performed Test phase Title IEC 60512

test no. Severity or condition of

test Title IEC 60512

test no. Requirements

BP 1 Locking device mechanical operations

2 N operations – see mechanical operations

See Annex B

BP 2 Mechanical operations

9a N/2 operations – see mechanical operations Speed 10 mm/s Rest 1 s (when mated and unmated) Locking device inoperative

PL 1(N) = 750 PL 2(N) = 2 500

BP 3 Flowing mixed gas corrosion

11g

4 days Half of the samples in mated state Half of the samples in unmated state

11g

BP 4 Measurement points as in Figure 19 All contacts/specimens

Contact resistance


BP 5 Mechanical operations

9a N/2 operations – see mechanical operations Speed 10 mm/s Rest 1 s (when mated and unmated) Locking device inoperative

BP 6 Measurement points as in Figure 19 All contacts/specimen

Contact resistance


BP 7 100 V + 15 V d.c. Method C Mated connectors


3a 500 MΩ minimum

BP 8 Contact/contact: Method A Mated connectors

Voltage proof




BP 9 Visual examination




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– 48 – 60603-7-7 IEC:2006(E)

7.7.2.4 Test group CP

Table 14 – Test group CP

Test Measurement to be performed Test phase


Severity or condition of test


Requirements

CP 1 Vibration 6d F = 10-500 Hz Ampl. = 0,35 mm Accel. = 50 m/s 10 sweeps / axis Measurement points as in Figure 20

Contact disturbance

2e 10 µs maximum

CP 2 Measurement points as in Figure 19

All signal contacts and screen / specimens

Contact resistance

2a No disturbance of plug and jack between vibration test and measurement 20 mΩ maximum change from initial for signal contacts 100 mW maximum input to output resistance for screen

CP 3 Test voltage 100 V d.c. Method C Mated connectors


3a 500 MΩ minimum

CP 4 Unmated connectors Visual examination




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60603-7-7 IEC:2006(E) – 49 –

7.7.2.5 Test group DP

Table 15 – Test group DP

Test Measurement to be performed Test

phase Title Test Severity or condition of test Title Test Requirements

DP 1 Electrical load and temperature

IEC 60512, 9b

5 connectors

500 h 70 °C Recovery period 2 h

0,5 A 5 connectors

No current: 5 connectors

DP 2 Test voltage: 100 V d.c. Method C Mated connectors


IEC 60512, 3a

500 MΩ minimum

DP 3 Contact/contact: Method A Mated connectors

Voltage proof

IEC 60512, 4a




DP 4 Unmated connectors Visual examination

IEC 60512, 1a

There shall be no defects that would impair normal operation

DP 5 Measurement points as in Figure 19

All signal contacts and screen / specimens

Contact resistance

IEC 60512, 2a

20 mΩ maximum change from initial for signal contacts.

100 mΩ maximum input to output resistance for screen.

DP 6 Mechanical gauging

Annex L Both, free and fixed connector

Annex L Passing go/no go test

DP 7 Gauging continuity

Annex A All signal contacts and screen / specimens

Contact disturbance

IEC 60512, 2e

10 µs maximum



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– 50 – 60603-7-7 IEC:2006(E)

7.7.2.6 Test group EP

Table 16 – Test group EP


phase Title IEC 60512 test

no.

Severity or condition of test Title Test Requirements

EP1 Insertion loss

IEC 60512, test 25b and Annex E

Per 6.5.1

EP 2 All pairs, both directions, (pair to pair)

NEXT loss IEC 60512, test 25a and Annex G

Per 6.5.5

EP 3 All pairs, both directions Return loss IEC 60512, test 25e and Annex F

Per 6.5.2

EP 4 All pairs, both directions, (pair to pair)

FEXT loss IEC 60512, test 25a and Annex H

Per 6.5.7

EP 5 Transverse conversion loss

Annex J Per 6.5.9

EP 6 Transverse conversion transfer loss

Annex J Per 6.5.10

EP 7 Input to output resistance

Measurement points as defined in 6.4.5

All signal contacts, switch contacts and screen / specimens

Millivolt level method

IEC 60512, test 2a

Signal contact resistance = 200 mΩ maximum

Screen resistance = 100 mΩ maximum

EP 8 Resistance unbalance

Measurement points as defined in 6.4.6

All signal contacts and switch contacts / specimens

Millivolt level method

IEC 60512, test 2a

Unbalance resistance = 50 mΩ maximum

NOTE All measurements to be performed on mated connectors.



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60603-7-7 IEC:2006(E) – 51 –

7.7.2.7 Test group FP

Table 17 – Test group FP


phase Title Test

Severity or condition of test Title IEC 60512

Test No. Requirements

FP 1 Surge test ITU-T

K.20

Mated connectors, Table 2a /2b, Basic test level Tests 2.1.1a, 2.1.1b, 2.1.3, 2.2.1a and 2.3.1a

Test 2.1 and 2.2: Acceptance criteria A per ITU-T K.44, Clause 9, Test 2.3: Acceptance criteria B per ITU-T K.44, Clause 9,

FP 2 100 V + 15 V d.c. Method C Mated connectors


3a 500 MΩ minimum

FP 3 Unmated connectors Visual examination




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– 52 – 60603-7-7 IEC:2006(E)

7.7.2.8 Test group GP

Table 18 – Test group GP


phase Title Test Severity or condition of test Title Test Requirements

GP 1 High temperature

IEC 60512, 9b

500 h 70 °C Recovery period 2 h

GP 2 Cyclic damp heat

IEC 60068-2-38

21 cycles. Low temp 25 °C High temp 65 °C Cold subcycle –10 °C Humidity 93 % Half of the samples in mated state Half of the samples in unmated state

GP 3 Additional tests are for further study

GP 4 Transfer impedance

Annex I Per 6.4.8

GP 5 Coupling attenuation

EN 50289-1-14

Per 6.5.11



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60603-7-7 IEC:2006(E) – 53 –

Annex A (normative)

Gauging continuity procedure

A.1 Object

The object of this test is to check whether in the worst case conditions for the free connector the electrical continuity is guaranteed for signal contacts and screen.

A.2 Preparation of the specimens

A gauge according to Figure A.1 should be applied to test the fixed connector specimen.

A.3 Test method

Apply to the test specimen and to the gauge a circuit according to IEC 60512, test 2e. For each individual contact of the fixed connector and the screen, the test shall be repeated.

For the test of the signal contacts, the gauge shall be fully inserted and then be moved upwards until it stops against the plastic wall of the fixed connector (see Figure A.2).

For the test of the screen contact, the gauge shall be fully inserted and then be moved to both sides of the connector until it stops against the plastic wall of the fixed connector. This movement shall be repeated 3 times.

During this movement, a forwards force of 20 N minimum shall be applied as indicated by the arrow in Figure A.2.

A.4 Final measurements

The fixed connector specimen will meet the requirements, if no discontinuity > 10 µs is monitored for each individual contact and the screen during movement and in end position.

A.5 Description of continuity gauge

The gauge shall be made according to the following specification:

Material: tool steel, hardened with suitable plating finish. Surface roughness: according to ISO 1302, Ra: 0,25 µm maximum.



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– 54 – 60603-7-7 IEC:2006(E)

2

A1

C1 D1

3

E1

F1

H1

J1

K1

T1R1

P1N1

S1

B1

Y1

X1

3

4 L1

IEC 100/05

1

NOTE 1 Sharp edge.

NOTE 2 Insulation part.

NOTE 3 Edge of insulation part may not extend beyond radius of steel part.

NOTE 4 Dimension to edge of insulation part.

Figure A.1 – Gauge



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60603-7-7 IEC:2006(E) – 55 –

Table A.1 – Continuity gauge dimensions

Maximum Minimum Letter mm mm

A1 11,59 11,57

B1 4,90

C1 0,8 0,6

D1 4,12 4,10

E1 15,0

F1 0,89 0,79

H1 0,47 0,45

J1 0,69 0,59

L1 6,72 6,70

N1 5,90 5,88

P1 4,7 4,3

R1 1,6 1,4

S1 1,46 1,44

T1 0,1

X1 0,6 0,4

Y1 5,0

K1 30 24

Figure A.2 – Gauge insertion

IEC 1085/06



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– 56 – 60603-7-7 IEC:2006(E)

Annex B (normative)

Locking device mechanical operation – Test procedure and requirements

B.1 Object

The object of this mechanical endurance test is to assess the operational limits of the locking device on free connectors.

B.2 Preparation of the specimens

The specimen shall be prepared and mounted so that the locking device is readily accessible for application of the test. No other movement of the free connector shall be allowed.

B.3 Test method

The specimen shall be subjected to mechanical operational endurance tests of the number of cycles, as specified in test BP2 of Table 13.

The speed of the operation of the applied force to the locking device shall not exceed 20 cycles per minute.

The specimen shall be operated in the normal manner, and the locking device shall be depressed until it contacts the body of the free connector.

Mechanical aids which simulate normal operations may be used, provided that they do not introduce abnormal stresses.

B.4 Final measurements

After the specified number of operations, the specimens shall show no visual indication of fatigue or stress cracking of the locking device.



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60603-7-7 IEC:2006(E) – 57 –

Annex C (normative)

High frequency (category 7)

transmission interoperability testing

C.1 Object

Mated pairs of connectors are required to meet the transmission performance specifications of this annex. To evaluate the performance of individual connectors, a means is provided to connect the interface side of the connector directly to the port of the network analyser equipment. The termination side of the connector is connected to the other port of the network analyser equipment.

C.2 Test equipment

The equipment used shall be as described in Annex D.

C.3 Free connector precision test fixture construction

Interoperability testing of free connectors is conducted by terminating the free connector interface to a precision test fixture.

There is no crosstalk compensation implementation within the test fixture.

A fixed board mount type connector is used with a board to make connections to the network analyser, see Figure C.1. Only the 4 pairs (8 contacts) of the connector used for high frequency transmission are terminated to leads on the board for connection to the network analyser interface. The other 2 pairs (4 contacts) of the connector are terminated to the measurement ground plane.

50 Ω strip line leads are used to facilitate either 100 Ω differential mode stimulus and detection using baluns or coupled transmission mode stimulus and detection using direct connections to network analyser equipment. Strip lines terminate each connector lead to female SMA terminations.

Figure C.1 – Free connector precision test fixture

IEC 924/02



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– 58 – 60603-7-7 IEC:2006(E)

C.4 Fixed connector precision test fixture construction

Interoperability testing of fixed connectors is conducted by terminating the fixed connector interface to a precision test fixture.

A free connector (variant 02) is used with a board to make connections to the network analyser, see Figure C.2. Only the 4 pairs (8 contacts) of the connector used for high frequency transmission are terminated to leads on the board for connection to the network analyser interface. The other 2 pairs (4 contacts) of the connector are terminated to the measurement ground plane.

50 Ω strip line leads are used to facilitate either 100 Ω differential mode stimulus and detection using baluns or coupled transmission mode stimulus and detection using direct connections to network analyser equipment. Strip lines terminate each connector lead to female SMA terminations.

Figure C.2 – Fixed connector precision test fixture

C.5 Alternate fixed or free connector test fixture

The fixture consists of a fixed or free connector with a cover over the termination area that completely isolates the pairs. The cover portion may vary from manufacturer to manufacturer. The “cover” shall be used to shield the terminations on the far side of the connector under test.

C.6 Test fixture requirements

The performance of the precision test fixture, fixed and free, are verified together to have return loss, NEXT and FEXT performance that are a minimum of 6 dB superior to the standard category 7 requirements.

C.7 Test procedure

With the connector mated to the appropriate test fixture, measure the NEXT and FEXT performance for each pair combination as outlined in Annexes G and H respectively.

IEC 925/02



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60603-7-7 IEC:2006(E) – 59 –

Annex D (normative)

General requirements for the measurement set-up

D.1 Test instrumentation

These electrical test procedures require the use of a vector network analyser. The analyser should be capable of full two port calibrations. The analyser shall cover the frequency range of 1 MHz to 1 GHz at least.

At least 2 test baluns are required in order to perform measurements with balanced symmetrical signals. The requirements for the baluns are given in g) of Clause D.3.

Reference loads and cables are needed for the calibration of the set-up. Requirements for the reference components are given in D.5.1 and D.5.2 respectively.

Termination loads are needed for the termination of pairs, used and unused, which are not terminated by the test baluns. Requirements for the termination loads are given in Clause D.6.

A test adapter (triaxial test set) is needed for the transfer impedance measurements. References to requirements for this set-up are given in Annex I.

An absorbing clamp and ferrite absorbers are needed for the coupling attenuation measurements. The requirements for these items are given in EN 50289-1-14, coupling attenuation test method.

D.2 Coaxial cables and test leads for network analysers

Coaxial cable assemblies between network analyser and baluns should be as short as possible. (It is recommended that they do not exceed 60 cm each).

The baluns shall be electrically bonded to a common ground plane. For crosstalk measurements, a test fixture may be used, in order to reduce residual crosstalk (see Annex G).

Balanced test leads and associated connecting hardware to connect between the test equipment and the connector under test shall be taken from components that meet or exceed the requirements for the relevant category. Balanced test leads shall be limited to a maximum of 7 cm between each balun and the reference plane of the connector under test. Pairs shall remain twisted from the baluns to where connections are made. The impedance of the test leads from the DUT to the baluns shall be managed, both differential and common modes, as far as possible.



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– 60 – 60603-7-7 IEC:2006(E)

D.3 Measurement precautions

To assure a high degree of reliability for transmission measurements, the following precautions are required:

a) Consistent and stable balun and resistor loads shall be used for each pair throughout the test sequence.

b) Cable and adapter discontinuities, as introduced by physical flexing, sharp bends and restraints shall be avoided before, during and after the tests.

c) Consistent test methodology and terminations (baluns or resistors) shall be used at all stages of transmission performance qualifications.

d) The relative spacing of conductors in the pairs shall be preserved throughout the tests to the greatest extent possible.

e) The balance of the cables is maintained to the greatest extent possible by consistent conductor lengths and pair twisting to the point of load.

f) The sensitivity to set-up variations for these measurements at high frequencies demands attention to detail for both the measurement equipment and the procedures.

g) All common mode terminations and the housing of the baluns shall be terminated to one common ground plane.

D.4 Balun requirements

The baluns may be balun transformers or 180° hybrids with attenuators to improve matching if needed (see Figure D.1).

Test port

Attenuator

To network analyzer

Attenuator

180° hybrid

IEC 117/05

Figure D.1 – 180° hybrid used as a balun

The specifications for the baluns apply for the whole frequency range for which they are used. Baluns shall be RFI shielded and shall comply with the specifications listed in Table D.1.



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60603-7-7 IEC:2006(E) – 61 –

Table D.1 – Test balun performance characteristics

Parameter Requirement at test frequencies up to 250 MHz

Requirement at test frequencies above 250 MHz

Impedance, primary Matched to applied network analyser

Impedance, secondary 100 Ω

Insertion loss

Return loss secondary

Return loss – common mode

with common mode termination1

10 dB maximum

14 dB minimum

10 dB minimum

Return loss – common mode

without common mode termination1

1 dB maximum Not applicable

Longitudinal balance2 50 dB Not applicable

Common mode rejection3 50 dB 40 dB

Output signal balance3 50 dB 40 dB

Power rating 0,1 W 1 Measured by connecting the balanced output terminals together and measuring the return loss. The nominal primary impedance shall terminate the primary input terminal. 2 Applicable for baluns which are used for balance measurements. Measured from primary input terminal to common mode terminal when secondary balanced terminal is terminated with 100 Ω. 3 Measured according to ITU-T G.117 and ITU-T O.9.

D.5 Reference components for calibration

D.5.1 Reference loads for calibration

To perform a one or two-port calibration of the test equipment, a short circuit, an open circuit and a reference load are required. These devices shall be used to obtain a calibration at the reference plane.

The reference load shall be calibrated against a calibration reference, which shall be a 50 Ω load, traceable to an international reference standard. Two 100 Ω reference loads in parallel shall be calibrated against the calibration reference. The reference loads for calibration shall be placed in a N type connector according to IEC 60169-16, meant for panel mounting, which is machined flat on the back side (see Figure D.2). The loads shall be fixed to the flat side of the connector, distributed evenly around the centre conductor. A network analyser shall be calibrated, one port full calibration, with the calibration reference. Thereafter, the return loss of the reference loads for calibration shall be measured. The verified return loss shall be >46 dB at frequencies up to 100 MHz and >40 dB at frequencies above 100 MHz and up to the limit for which the measurements are to be carried out.

N type connector

Loads for calibration

Machined flat

IEC 118/05

Figure D.2 – Calibration of reference loads



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– 62 – 60603-7-7 IEC:2006(E)

D.5.2 Reference cables for calibration

As a minimum, the reference cable that is used to perform calibration of the test set-up shall satisfy the requirement of the same category according to IEC 61156-5 as the category of the connector. The reference cable shall be a length of horizontal cable for which the sheath is preserved. One of the pairs of the reference cable is used for the calibrations. The total length of reference cable shall be according to the length of the measurement cables as outlined in the calibration procedures for the various tests. Both ends of the reference cable shall be well prepared, so that the twisting is maintained up to the test ports

D.6 Termination loads for termination of conductor pairs

During measurement, conductor pairs of the measurement cables for the connector under test shall be terminated according to the specified test set-up with impedance matching loads. For pairs under test, this is provided by the test instrumentation at one or both ends. For pairs not under test or not connected to test instrumentation, resistor loads or terminated baluns shall be applied. For differential mode only terminations, only resistor loads are allowed7.

The nominal differential mode impedance of the termination shall be 100 Ω. The nominal common mode impedance shall be 50 Ω ± 25 Ω.

NOTE The exact value of the common mode impedance is not critical for most measurements. Normally, a value of 75 Ω is used for unscreened connectors, while a value of 25 Ω is used for screened connectors.

Resistor loads shall use resistors specified for ±1 % accuracy in d.c. and have a return loss greater than 40 – 10 log(f) where f is the frequency in MHz8. For pairs connected to a balun, common mode load is implemented by applying a load at the common mode terminal (centre tap) of the balun. The impedance of the load is equal to the common mode impedance. For a balun without a common mode terminal (centre tap is not accessible), the requirement for common mode return loss shall be complied with by inserting a balanced attenuator between the balun and the connector pair. Guidance on how this is done is shown Annex K. For pairs connected to resistor loads, common mode load is implemented by the Y configuration shown in Figure D.3.

R1

R1

R2

IEC 119/05

Figure D.3 – Resistor load

where

2dif

1R

R =

and

4dif

com2R

RR −=

where

Rdif is the differential mode impedance (Ω);

Rcom is the common mode impedance (Ω).

___________ 7 Unpredictable stray capacitances in baluns cause resonances at high frequencies, if they are used as

terminations, when the common mode terminal is open.

8 Return loss of terminations are measured with a network analyzer connected to one balun, which is calibrated (full one port calibration) using the reference loads (D.5.1).



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60603-7-7 IEC:2006(E) – 63 –

The two resistors R1 shall be matched to within 0,5 %. The termination shall be implemented at a small printed circuit board with surface mount resistors. The layout for the resistors R1 shall be symmetrical.

The common mode termination points for all pairs shall be connected to the ground plane.

D.7 Termination of screens

For screened connectors, screened measurement cables shall be used. Individually screened twisted pairs (STP) are recommended.

The screen of the connector shall be terminated to the screens of the measurement cables. The screen or screens of these cables shall be fixed to the ground plane as close as possible to the measurement baluns.

If a pyramid test setup is used, the screen of each pair shall be in contact with the grooves of the pyramid (Figure D.4) and guided as close as possible to the baluns on the mounting plate.

Figure D.4 – Screened pyramid

Care shall be taken to maintain a tight fit of the individual pair foil, if present, around the twisted pairs.

D.8 Test specimen and reference planes

The test specimen is a mated pair of relevant connectors. The electrical reference plane for the test specimen is the point at which the cable sheath enters the connector (the back end of the connector), or the point, at which the internal geometry of the cable is no longer maintained, whichever is farther from the connector (see Figure D.5). This definition applies to both ends of the test specimen.

Connector reference planes

Plug side Socket side

IEC 120/05 Figure D.5 – Definition of reference planes

IEC 1086/06



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– 64 – 60603-7-7 IEC:2006(E)

Annex E (normative)

Insertion loss9

E.1 Object

The object of this test is to measure the insertion loss, which is defined as the additional attenuation that is provided by a pair of mated connectors inserted in a communication cable.

E.2 Test method

Insertion loss is evaluated by measuring the scattering parameters, S21, of all the conductor pairs.

E.3 Test set up

The test set-up consists of a network analyser and two baluns as defined in Annex D.

It is not necessary to terminate the unused pairs.

E.4 Procedure

E.4.1 Calibration

A full 2-port calibration shall be performed at the reference plane. This is performed by applying a reference cable of 14 cm maximum length between the terminals of the baluns and performing the transmission calibration measurement. A reference cable of 7 cm maximum length is then connected to the terminals of the two baluns (see Figure E.1). The total length of these cables shall be equal to the length of the reference cable used for transmission calibrations. At the end of these reference cables, the reflection calibrations are performed by applying open, short and load terminations.

Balun

Reference cable

Balun Balun

Balun

Transmission calibrations

Reflection calibrations

Open, short and load terminations

NA Port 1

NA Port 1 NA

Port 2

NAPort 2

IEC 121/05

Figure E.1 – Calibration

___________ 9 Often referred to as attenuation.



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60603-7-7 IEC:2006(E) – 65 –

E.4.2 Measurement

The test specimen shall be terminated with measurement cables at both ends. The length of the measurement cables shall be equal to the length of the reference cables used for reflection calibrations. The measurement cables shall be the cable types for which the connector is intended. A S21 measurement shall be performed.

NA Port 1

NA Port 2

CUT

Measurement cables

Screen (if any)

Ground plane


50 Ω 50 Ω

IEC 122/05

Figure E.2 – Measuring set-up

E.5 Test report

The measured results shall be reported in graphical or table format with the specification limits shown on the graphs or in the table at the same frequencies as specified in the relevant detail specification. Results for all pairs shall be reported. It shall be explicitly noted if the measured results exceed the test limits.

E.6 Accuracy

The accuracy shall be within ±0,05 dB.



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– 66 – 60603-7-7 IEC:2006(E)

Annex F (normative)

Return loss

F.1 Object

The object of this test is to measure the Return Loss (RL) of a mated connector pair at the two reference planes.

F.2 Test method

Return loss is measured by measuring the scattering parameters, S11 and S22 of all the conductor pairs.

NOTE As a connector is a low loss device, the return loss of the two sides are nearly equal.

F.3 Test set-up

The test set-up is as described in Annex E.

A resistor network as per D.6 may be substituted for the balun at the far end.

F.4 Procedure

F.4.1 Calibration

Calibration shall be performed as described in Annex E.

F.4.2 Measurement

The test specimen shall be terminated with measurement cables at both ends. The length of measurement cables shall be equal to the length of the reference cables used for reflection calibrations. The measurement cables shall be the cable types for which the connector is intended. S11 and S22 measurements shall be carried out for each of the pairs.

F.5 Test report


F.6 Accuracy

The return loss of the load for calibration is verified to be greater than 46 dB up to 100 MHz and greater than 40 dB at higher frequencies. The uncertainty of the connection between the connector under test and the baluns are expected to deteriorate the return loss of the set-up (the directional bridge implemented by the test set-up) by 6 dB. The accuracy of the return loss measurements is then equivalent with measurements performed by a directional bridge, with a directivity of 40 dB and 34 dB. The accuracy (uncertainty band) is given in Table F.1.



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60603-7-7 IEC:2006(E) – 67 –

Table F.1 – Uncertainty band of return loss measurement at frequencies below 100 MHz

Measured RL 10 12 15 18 20 22 25 28 30

Lower uncertainty limit –0,3 –0,3 –0,5 –0,7 –0,8 –1,0 –1,4 –1,9 –2,4

Higher uncertainty limit +0,3 +0,4 +0,5 +0,7 +0,9 +1,2 +1,7 +2,5 +3,3

Table F.2 – Uncertainty band of return loss measurement at frequencies above 100 MHz

Measured RL 10 12 15 18 20 22 25 28 30

Lower uncertainty limit –0,5 –0,7 –0,9 –1,3 –1,6 –1,9 –2,6 –3,5 –4,2

Higher uncertainty limit +0,6 +0,7 +1,0 +1,3 +1,9 +2,5 +3,8 +6,0 +8,7

Example – Let the measured RL be 20 dB. The true RL then lies in the band of 18,4 to 21,9 dB at frequencies above 100 MHz.



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– 68 – 60603-7-7 IEC:2006(E)

Annex G (normative)

Near end cross talk (NEXT)

G.1 Object

The object of this test procedure is to measure the magnitude of the electric and magnetic coupling between driven (disturbing) and quiet (disturbed) pairs of a mated connector pair.

G.2 Test method

Near end crosstalk is evaluated by measuring the scattering parameters, S21, of the possible conductor pair combinations at one end of the mated connector, while the other end of the pairs are terminated.

G.3 Test set-up

The test set-up consists of two baluns and a network analyser as defined in Annex D. A figure of the set-up, which also shows the termination principles, is shown in Figure G.1.

NA Port 1

NA Port 2

CUT

Measurement cables Screen (if any)

Ground plane


50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

25 Ω

25 Ω

25 Ω

25 Ω

IEC 123/05

Figure G.1 – NEXT measurement differential and common mode terminations

(Passive terminations may be either balun or resistor terminations)



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60603-7-7 IEC:2006(E) – 69 –

G.4 Procedure

G.4.1 Calibration

A through calibration shall be applied as a minimum. Full two port calibrations are recom-mended in order to enhance the measurement accuracy.

G.4.2 Establishment of noise floor

The noise floor of the set up shall be measured. The level of the noise floor is determined by white noise, which may be reduced by increasing the test power and by reducing the bandwidth of the network analyser, and by residual crosstalk between the test baluns. The noise floor shall be measured by terminating the baluns with resistors and perform a S21 measurement. The noise floor shall be 20 dB lower than any specified limit for the crosstalk. If the measured value is closer to the noise floor than 10 dB, this shall be reported.

NOTE For high crosstalk values, it may be necessary to screen the terminating resistors.

G.4.3 Measurement

Connect the disturbing pair of the CUT (Connector Under Test) to the signal source and the disturbed pair to the receiver port. Terminate according to Figure G.1. It is recommended that the socket be terminated with short separated pairs without jacket. Test all possible pair combinations10 and record the results.

The CUT shall be tested in the following configuration:

With differential and common mode terminations.

The measurements shall be performed from both ends of the mated connector. As a connector is a low loss device, near end cross talk values from the two ends are nearly equal.

Differential and common mode terminations shall be provided on at least one end of each pair, including the unused pairs. This may be the near or far end. Differential terminations shall be provided at both ends. Optionally, differential and common mode terminations may be provided at both ends of all pairs, as shown in Figure G.1.

G.5 Test report


G.6 Accuracy

The accuracy shall be better than ±1 dB at measurements up to 60 dB and ±2 dB at measure-ments up to 85 dB.

___________ 10 There are 6 different combinations of near end crosstalk in a 4 pair connector from each side, which gives a

total of 12 measurements for each kind of termination method. Because of reciprocity, only 6 unique non-reciprocal combinations from each side need to be tested.



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– 70 – 60603-7-7 IEC:2006(E)

Annex H (normative)

Far end cross talk (FEXT)

H.1 Object

The object of this test procedure is to measure the magnitude of the electric and magnetic coupling between driven (disturbing) and quiet (disturbed) pairs of a mated connector pair.

H.2 Test method

Far end crosstalk is evaluated by measuring the scattering parameters, S21, of the possible conductor pair combinations at one end of the mated connector, to the other end.

H.3 Test set-up

The test set-up consists of two baluns and a network analyser as defined in Annex D. A Figure of the set-up, which also shows the termination principles, is shown in Figure H.1.

NA Port 1

NAPort 2

CUT


Ground plane


50 Ω

25 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

25 Ω

25 Ω

IEC 124/05

Figure H.1 – FEXT measurement differential and common mode terminations

(passive terminations may be either balun or resistor terminations)



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60603-7-7 IEC:2006(E) – 71 –

H.4 Procedure

H.4.1 Calibration

Calibration is performed as shown in G.4.1.

H.4.2 Establishment of noise floor

The noise floor of the set up is established as shown in G.4.2.

H.4.3 Measurement

Connect the disturbing pair of the CUT to the signal source and the disturbed pair to the receiver port. Terminate according to Figure H.1. It is recommended that the socket be terminated with short separated pairs without jacket. Test all possible pair combinations11 and record the results.

The CUT shall be tested in the following configuration:

With differential and common mode terminations.

Differential and common mode terminations shall be provided on at least one end of each pair, including the unused pairs. This may be the near or far end. Differential terminations shall be provided at both ends. Optionally, differential and common mode terminations may be provided at both ends of all pairs, as shown in Figure H.1.

H.5 Test report


H.6 Accuracy

The accuracy shall be better than ±1 dB at measurements up to 60 dB and ±2 dB at measurements up to 85 dB.

___________ 11 There are 12 different combinations for far end crosstalk in a four pair connector, which gives a total of 12

measurements for each termination method.



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– 72 – 60603-7-7 IEC:2006(E)

Annex I (normative)

Transfer impedance12

I.1 Object

The object of this test is to measure the transfer impedance of the test specimen. The transfer impedance, ZT [Ω] of an electrically short uniform connector is defined as the quotient of the longitudinal voltage in the outer system to the current in the inner system.

I.2 Test method

The test determines the transfer impedance of the screened connector by measuring the connector in a triaxial test set-up. This set-up is also used for measurement of transfer impedance for cables.

I.3 Definitions

I.3.1 Inner and outer circuit

The inner circuit consists of the screens and the conductors of the test specimen. The voltages and currents of the inner circuit are indicated by a subscript 1. The outer circuit consists of the outer screen surface and the inner surface of the test (triaxial) tube. The voltages and currents of the outer circuit are indicated by a subscript 2.

I.3.2 Coupling length

Two cables in the test set-up terminate to the connector under test. The combined length of connector and cable, which is inside the triaxial tube is called the coupling length. The maximum allowed coupling length depends on the highest frequency to be measured:

max1

6

maxc,1050f

Lr ×

×≤ε

where Lc,max maximum coupling length; fmax highest frequency;

εr1 resulting relative permittivity of the dielectric of the connecting cable. The condition means that the phase constant of the cable multiplied by the length is less than 1.

___________ 12 This test measures the magnetic component of the transfer impedance. A test, which measures the effective

transfer impedance is under consideration. If experience shows that the test under consideration can replace the test proposed here, reference to the other test will be made and the current proposal withdrawn. Note: Effective transfer impedance is the vector summation of magnetically and electrically coupled transfer impedance. It is expected that the current requirements for transfer impedance of connectors have to be revised if effective transfer impedance is measured.



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60603-7-7 IEC:2006(E) – 73 –

I.4 Test set-up

I.4.1 Preparation of test specimen

The principle for preparation of the test specimen is shown in Figure I.1.

Connector Connector under test

Measurement cable Measurement cable

Screened load resistor R1

IEC 1087/06

Figure I.1 – Preparation of test specimen

Category 6 or category 7 measurement cables as prescribed by the manufacturer shall terminate the test specimen.

The length of the measurement cable shall be 7 cm. The length of the tube determines the length of the other measurement cable. The signal conductors of the measurement cables shall be connected together in both ends. The short measurement cable shall be terminated by R1, (see I.4.3) which shall be connected between the inner conductors and the cable screens. R1 shall be screened by a metallic screen, which is bonded to the screens of the measurement cable.

I.4.2 Triaxial set-up

The test set-up consists of a network analyser and a triaxial test set-up for measuring transfer impedance. The triaxial test set-up consists of a metallic (e.g. brass) tube, resistors and impedance matching networks.

The metallic tube is closed at both ends with metallic endplates with provisions for cable feed through. The diameter of the tube shall be large enough to be able to accommodate the test specimen. The length of the tube should preferably be equal to or less than 30 cm. The directions given in I.3.2 shall be used to determine the maximum frequency for valid measurements.

The resistors are terminating resistors. R1 terminates the inner circuit. This resistor shall have a value close to the impedance of the inner circuit (see I.4.3). The other, R2, terminates the outer circuit. This resistor shall have a value close to

50log604,1c

o22 −××≈dd

R

where do inner diameter of tube;

dc outer diameter of the measurement cable screen.

The test specimen shall be mounted in the centre of the tube. (It may be supported by plastic foam.)



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– 74 – 60603-7-7 IEC:2006(E)

The test set-up shall be connected to the network analyser through the impedance matching network. The impedance matching network is a minimum loss two resistor network, which matches the inner circuit to the impedance of the network analyser port (see I.4.4).

In Figure I.2, the complete triaxial set-up is shown.

R1

Screens short-circuited to end-piece of tube

R2

Coupling length

Matching circuit

km

From NA port 1 To NA port 2

U1 UG

I1

U2 UR

IEC 1088/0

Figure I.2 – Triaxial test set-up

I.4.3 Impedance of the inner circuit

If the impedance Z1 of the inner circuit is not known, it may be determined by using the following method:

One end of the prepared sample is connected to a network analyser, which is calibrated for impedance measurements at the sample reference plane. The test frequency shall be the approximate frequency for which the length of the sample is 1/8 λ , where λ is the wavelength.

sampletest 8 5,1 L

cf

×≈

where ftest test frequency,

c speed of light,

Lsample length of sample.

The sample is short-circuited at the far end. The impedance Zshort is measured.

The sample is left open at the same point where it was shorted. The impedance Zopen is measured.

Z1 is calculated as:

openshort1 ZZZ ×=

R1 is chosen as a standard value resistor, whose resistance is close (< 20 %) to Z1.



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60603-7-7 IEC:2006(E) – 75 –

I.4.4 Impedance matching networks

I.4.4.1 Configuration

If R1 is not 50 Ω13 then an impedance matching circuit is needed. It shall be implemented as a two resistor circuit with one series resistor, Rs and one parallel resistor Rp. The value of the resistors and the configurations are shown in I.4.4.2 and I.4.4.3. The voltage gain, km is also shown for each configuration.

I.4.4.2 R1 < 50 Ω

If the impedance of the inner system, and subsequently R1 is less than 50 Ω the formulas below are used.

50150 1

sR

R −=

501 1

1p

R

RR

−

=

The configuration is depicted in Figure I.3:

Rs

50 Ω side R1 side Rp

IEC 1089/06

Figure I.3 – Impedance matching for R1 < 50 Ω

The voltage gain, km of the circuit is:

s1spp1

p1m RRRRRR

RRk

++=

I.4.4.3 R1 > 50 Ω

If the impedance of the inner system, and subsequently R1 is greater than 50 Ω, the formulas below are used.

11s

501R

RR −=

1

p501

50

R

R−

=

___________ 13 For 40 < Z1 < 60, no impedance matching circuit is needed. In that case R1 is set to 50 Ω.



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– 76 – 60603-7-7 IEC:2006(E)

The configuration is depicted in Figure I.4:

Rs

50 Ω side R1 side Rp

IEC 1090/06

Figure I.4 – Impedance matching for R1 >50 Ω

The voltage gain, km of the circuit is:

1s

1m RR

Rk

+=

I.5 Procedure

I.5.1 Calibration

The two coaxial measurement cables, which connect the triaxial test set-up with the network analyser are connected together and a through calibration is performed.

I.5.2 Measurement

The insertion loss of the triaxial test set-up is measured from the lowest frequency for which the network analyser operates to the highest specification frequency of the relevant detail specification.

I.5.3 Evaluation of test results

I.5.3.1 General

The test measures the transfer impedance of the complete test sample including the parts of the terminating cable or cables, which are exposed in the tube. If the transfer impedances of the terminating cable or cables are not negligible, these impedances shall be subtracted from the result (see I.5.3.3).

I.5.3.2 Calculation of transfer impedance

According to the definition:

1

2T I

UZ =

where U2 voltage in the outer system;

I1 current in the inner system.

With reference to Figure I.2:

22

R 5050 UR

U ×+

=

or R2

2 5050

UR

U ×+

=



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60603-7-7 IEC:2006(E) – 77 –

1

Gm

1

11

RUk

RU

I×

==

for 1RZT <<

G

R

m

21

1

2T

50)50( UU

kRR

IU

Z ×+×

==

( )

−−+×

= 20

m

21T

calmeas

1050

50 aa

kRR

Z

where ZT transfer impedance;

ameas attenuation measured at measuring procedure;

R1 terminating resistor in inner system;

R2 terminating resistor in outer system;

km voltage gain of the matching circuit (see I.4.4).

I.5.3.3 Correction for transfer impedance of measurement cables

If the transfer impedance of the measurement cables is not negligible, the transfer impedance of the exposed length of the measurement cable shall be subtracted from the result.

The transfer impedance of the cable shall be measured in the same set-up as used for measuring the test sample. The calculated transfer impedance shall be corrected for the coupling length of the tested cable sample by dividing the result by the coupling length, Lc. The calculated transfer impedance of the cable is expressed using the dimension of Ω/m. The correction, which shall be subtracted from the measured ZT is then the transfer impedance of the length of terminating cable or cables, which is exposed in the test sample. That is:

where ZT_con transfer impedance of connector under test;

ZT transfer impedance of test sample;

ZT_cable1 transfer impedance of measurement cable 1;

L1 length of measurement cable 1;

ZT_cable2 transfer impedance of measurement cable 2 if applicable;

L2 length of measurement cable 2.

I.6 Test report

The test report shall record the test results in a table or as a graph, according to the relevant detail specification, showing ZT as a function of frequency. The report shall conclude if requirements of the relevant connector specification are met.

I.7 Accuracy

The accuracy shall be shown to be better than ±10 mΩ.

2T_cable21T_cable1TT_con LZLZZZ ×−×−=



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– 78 – 60603-7-7 IEC:2006(E)

Annex J (normative)

Transverse conversion loss (TCL) and

transverse conversion transfer loss (TCTL)

J.1 Object

The object of this test is to measure the mode conversion (differential to common mode) of a signal in the conductor pairs of the CUT. This is also called unbalance attenuation or longitudinal conversion loss, LCL.

J.2 Test method

Balance is evaluated by measuring the common mode part of a differential mode signal, which is launched in one of the conductor pairs of the CUT.

J.3 Test set-up

The test set-up consists of a network analyser and a balun with a differential and common mode test port. Illustrations of the set-ups, which also show the termination principles, are given in Figure J.1 and Figure J.2.

NA Port 1

CUT


Ground plane


25 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

25 Ω

25 Ω

25 Ω 50 Ω

50 Ω

NA Port 2

IEC 125/05 Figure J.1 – TCL measurement




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60603-7-7 IEC:2006(E) – 79 –

NA Port 1

CUT


Ground plane


50 Ω

25 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

50 Ω

NAPort 2

50 Ω

25 Ω

25 Ω

IEC 126/05

Figure J.2 – TCTL measurement


J.4 Procedure

J.4.1 Calibration

Calibration is performed in three steps:

a) The attenuation of the coaxial test leads to the network analyser is calibrated out by performing a through calibration with these test leads connected together.

b) The attenuation of differential signals of the test balun, abal,DM is measured by connecting two identical baluns back to back. The insertion loss of these baluns is measured, and half of this loss is the insertion loss of the balun for a differential signal.

c) The attenuation of common mode signals of the test balun, abal,CM is measured by measuring the insertion loss from the common mode test port of the balun to the differential output terminals. The two differential output terminals shall be short-circuited and connected to the inner conductor of the coaxial test lead to the network analyser.

J.4.2 Noise floor

The noise floor of the set-up shall be measured. The level of the noise floor is determined by white noise, which may be reduced by increasing the test power and by reducing the bandwidth of the network analyser, and by the longitudinal balance, see Table D.1, of the test balun.



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– 80 – 60603-7-7 IEC:2006(E)

The noise floor, anoise,m shall be measured by terminating the differential output of the balun with a 100 Ω resistor and perform a S21 measurement between the differential mode and common mode test port of the balun. anoise is calculated as:

21mnoise, log20 Sa −=

CMbal,DMbal,mnoise,noise aaaa −−=

The noise floor shall be 20 dB lower than any specified limit for balance. If the measured value is closer to the noise floor than 10 dB, this shall be reported.

J.4.2 Measurement

Connect the measured pair of the CUT to the differential output of the test balun. Terminate the CUT according to Clause J.3. Perform a S21 measurement between the differential mode and common mode test port of the balun. The balance, TCL is calculated as:

21meas log20 Sa −=

CMbal,DMbal,meas aaaTCL −−=

J.5 Test report


J.6 Accuracy

The accuracy shall be better than ±1 dB at the specification limit.



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60603-7-7 IEC:2006(E) – 81 –

Annex K (normative)

Termination of balun

K.1 Termination of balun with low return loss for common mode

If the available balun does not provide common mode termination (centre tap is either connected to ground or open), a balanced resistor attenuator shall be applied in order to provide the required return loss. The attenuator shall be implemented at a small printed circuit board mounted with SMD resistors. There are two cases: one for the centre tap connected to ground and one for the centre tap open.

K.2 Centre tap connected to ground

A diagram of the attenuator is shown in Figure K.1. The nominal attenuation is 10 dB and the calculated common mode impedance is 26 Ω.

R1 R1

R1 R1

R2

IEC 127/05 where

R1 = 26 Ω; R2 = 70 Ω.

Figure K.1 – Balanced attenuator for balun centre tap grounded

K.3 Centre tap open

A diagram of the attenuator is shown in Figure K.2. The nominal attenuation is 5 dB and the calculated common mode impedance is 48 Ω.

R3 R3

R4

R4

R3 R3

IEC 128/05 where

R3 = 14 Ω; R4= 82 Ω. NOTE Resistor values are nominal. The nearest standard values may be chosen.

Figure K.2 – Balanced attenuator for balun centre tap open



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– 82 – 60603-7-7 IEC:2006(E)

Annex L (normative)

Gauging requirements

L.1 Fixed connectors

The go gauge specified in 5.1 shall be capable of being inserted and removed with a force of 8,9 N maximum.

The no-go gauges specified in 5.1 shall not be capable of entering the fixed connector more than 1,78 mm with an 8,9 N insertion force.

L.2 Free connectors

The connector shall be capable of insertion and latching into the go gauge specified in 5.2 with a 30 N or less insertion force with the latch bar depressed.

After insertion and latching, the connector shall be capable of removal, with the latch depressed, with a removal force of 30 N or less applied at an advantageous angle.

The free connectors shall not be capable of entering the no-go gauges specified in 5.2 more than 1,78 mm with an 8,9 N insertion force.

___________



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I made the wrong choice R

other ....................................................

Q7 Please assess the standard in thefollowing categories, usingthe numbers:(1) unacceptable,(2) below average,(3) average,(4) above average,(5) exceptional,(6) not applicable

timeliness .............................................quality of writing....................................technical contents.................................logic of arrangement of contents ..........tables, charts, graphs, figures ...............other ....................................................

Q8 I read/use the: (tick one)

French text only R

English text only R

both English and French texts R

Q9 Please share any comment on anyaspect of the IEC that you would likeus to know:

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ISBN 2-8318-8697-X

-:HSMINB=]][^\]:ICS 31.220.10

Typeset and printed by the IEC Central Office GENEVA, SWITZERLAND



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iec 60603-7-7-2006 connectors for electronic equipment

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