ieee 1149.7 aka advanced jtag - max planck society
TRANSCRIPT
IEEE 1149.7 aka Advanced JTAG
Dima Levit
Physik Department E18 - Technische Universität München
Internal ASICs ReviewApril 16th, 2015. HLL
supported by:Maier-Leibnitz-Labor der TU und LMU München,
Cluster of Excellence: Origin and Structure of the Universe,
BMBF
Belle
IEEE 1149.1, Daisy Chain
TCKTMS
TDO
TDI 1
2
3
Figure : Daisy chain topology
TCK and TMS connected inparallelTDI and TDO connected in daisychainASIC 3 accessible only if 2 and 1are not broken
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Complications with Daisy Chain
Figure : EMCM3 W17-3 with Switcher 5 broken
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IEEE 1149.7 Architecture
Figure : IEEE 1149.7 architecture
1149.7
Adapter
1149.1Core
TCK(C)
TMS(C)
TDI
TDO
TCK
TMS
TDI
TDO
Figure : IEEE 1149.7 integration with olderdesigns
Backwards compatible with IEEE 1149.1standardImplements 6 additional classes foradvanced featuresValid IEEE 1149.1 control sequence(Zero-Bit-Scan) as escape sequenceAdapter cores available
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IEEE 1149.7 Architecture
TEST LOGIC RESET
RUN-TEST/IDLE SELECT-DR-SCAN SELECT-IR-SCAN
CAPTURE-DR CAPTURE-IR
SHIFT-DR SHIFT-IR
EXIT1-DR EXIT1-IR
PAUSE-DR PAUSE-IR
EXIT2-DR EXIT2-IR
UPDATE-DR UPDATE-IR
1
1 1 1
1 1
1 1
1 1
1 1
1 1
1 1
0
0
0 0
0 0
0 0
0 0
0 0
0 0
0 0
Figure : Zero-Bit-Scan as escape sequence
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IEEE 1149.7 Star Topology
TCKTMSTDO
TDI
Figure : Star-4 topology, TAP3
TCKCTMSC
Figure : Star-2 topology, TAP4
TAP3: parallel TCK, TMS, TDI, TDOuni-directional signalsTAP4: parallel TCKC: uni-directional,TMSC: bi-directionalDirect addressability with mandatoryTAP.7 Controller Address (TCA)Node ID[7:0] Device ID[27:12]
Part NumberDevice ID[11:0]
Manufacturer34 27 26 11 10 0
4 bit Controller ID allocated by masterbased on the TCA
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TAP4 Serialization
Time division multiplexing
nTDI TMS TDO nTDI
TCKC
TMSC
Figure : TAP4 OScan1 format
nTDI nTDI
TCKC
TMSC nTDI nTDI
Figure : TAP4 Oscan7 format
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IEEE 1149.7 Design Requirements
Advantages:Star topology
resistance against ASIC failure
Reduced pin count (?)
Work packages:Implementation in ASICs
DHPT/Switcher mandatoryDCD optionally
FPGA support / SoftwaresupportChanges in module layout
Star topologyNode ID encoding
TCKC
TMSC
SW
SW
SW
SW
SW
SW
To/From DHE
DCD DCD DCD DCD
DHPT DHPT DHPT DHPT1149.7 Adapter
1149.7 Adapter
1149.7 Adapter
1149.7 Adapter
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Literature
Doing more with less - An IEEE 1149.7 embedded tutorial : Standardfor reduced-pin and enhanced-functionality test access port andboundary-scan architecturehttp://dx.doi.org/10.1109/TEST.2009.5355572
Talk: http://btw.tttc-events.org/material/BTW10/Presentations/Session%203.2.pptx
Neal Stollon, On-Chip Instrumentation: Design and Debug for Systemson Chip (Springer US, 2011),http://www.myilibrary.com?ID=308357
1149.7-2009 - IEEE Standard for Reduced-Pin andEnhanced-Functionality Test Access Port and Boundary-ScanArchitecture,http://dx.doi.org/10.1109/IEEESTD.2010.5412866
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Thank you for your attention!Questions?
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Back Up
Back up slides
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Back Up
Outer ForwardOuter Backward
DCD1 DCD2 DCD3 DCD4
DHP1 DHP2 DHP3 DHP4
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