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76 2012 IEEE International Solid-State Circuits Conference ISSCC 2012 / SESSION 4 / RF TECHNIQUES / 4.2 4.2 8-Path Tunable RF Notch Filters for Blocker Suppression Amir Ghaffari, Eric Klumperink, Bram Nauta University of Twente, Enschede, The Netherlands The huge growth of the number of wireless devices makes wireless coexistence an increasingly relevant issue. If radios operate in close proximity, blockers as strong as 0dBm may occur, driving almost any receiver in compression (note that 0dBm in 50Ω corresponds to a peak-to-peak voltage of half a 1.2V supply). Thus RF blocker filtering is highly wanted. However, fixed filters are undesired when aiming for multiband, software-defined or cognitive radio transceivers. Passive LC filters show limited Q and tunability. Recently frequency translated filtering has been proposed as a potential solution direction for high-Q filtering [1-5]. In [1,2] we showed that by applying the “N-path concept” [6], more than a decade of center frequency range with good linearity, compression point (P 1dB >0dBm, IIP3 >14dBm) and low noise is feasible for a bandpass (BP) filter. In [3] a notch filter with a combination of active and passive mixers is applied in a feedforward path realizing a BP filter. Moreover in [5] the low input impedance of a transimpedance amplifier with feedback is upconverted to create a notch fil- ter at low frequencies (80MHz) suppressing TX leakage in an FDD system. In this work we explore the possibility to realize a notch filter applying the N-path con- cept at RF frequencies and in a completely passive way. A single-ended (SE) and a differential 8-path notch filter with passive frequency mixing are presented. The filters are power-matched in the input and output in the passband and pro- vide a low insertion loss, high compression point and also low noise property, thus they can be utilized in front of a receiver to provide rejection of high-power blockers with a large frequency tuning range. A block diagram of an N-path notch filter is illustrated in Fig. 4.2.1. The input sig- nal is downconverted, high-pass filtered and then upconverted to the same fre- quency band as the input experiencing a notch filter at the LO frequency. A sim- ple form of an SE notch filter is illustrated in Fig. 4.2.1. Mixers are realized by switches driven by N multiphase clocks with a duty cycle of 1/N and the high- pass filter with a simple RC network. The resistance in the high-pass filters is shared as R L . Moreover the upconverting mixer is simply implemented with the wired-OR connection at the output node. A typical transfer curve of the notch fil- ter is also illustrated in Fig. 4.2.1 representing the rejection at the switching fre- quency (f s ) and its harmonics. As we showed in [2] the multipath switched capacitor in Fig. 4.2.1 for the frequencies close to f s can be modeled as a paral- lel RLC tank circuit with a resonance at f s . In Fig. 4.2.1, R p and C p values are con- stant for a given number of paths but the inductor varies with f s . Note that a fixed RC value in a tank circuit implies a constant notch bandwidth. According to the expression of R P in Fig. 4.2.1, increasing N will increase R P , and for an 8-path notch filter it reduces to: R p 19(R s +R L ) rendering 26dB rejection at f s if R s =R L . Thus the amount of rejection is solely defined by N in an ideal N-path notch fil- ter. The insertion loss in the passband is a function of the conversion gain of the mixers and increasing the number of paths will reduce it (0.1dB for N=8). Still the switch resistance and parasitic capacitances might degrade the insertion loss in a real implementation. Similar to the N-path BP filter in [2] harmonic mix- ing might happen with (N-1) th and (N+1) th harmonics of f s . Therefore increasing the number of paths not only increases the amount of rejection at f s but also moves the folding-back components further away. To avoid harmful compo- nents, a time-invariant prefilter may be required as for all N-path filters. A prototype including an SE and a differential notch filter is implemented in 65nm CMOS technology (see Fig. 4.2.2 and 4.2.7). The circuit operates directly in a 50Ω system. In the differential architecture the notch is suppressed at the even harmonics of f s resulting in a wider passband. The second mixer in Fig. 4.2.1 (top left) is implemented by the second set of switches in the differential filter, exploiting the differential nature of the signals. Therefore 32 switches are required for an 8-path architecture. The harmonic folding characteristic and the amount of rejection in an ideal differential notch filter are expected to be similar to the SE version. The switches are realized by low-threshold NMOS transistors and the capacitors with MIM technology. Large switch sizes (W/L=100u/65nm) are used resulting in switch resistance of 6Ω when driven by a swing of 0.9V (the DC voltage on the Source/Drains of the switches is set to 300mV to avoid reliability issues at high input swings). Larger switches would increase the inser- tion loss at high frequencies due to the parasitic capacitance and would require higher digital power drive. In the SE filter C 1 =7pF is chosen in each path target- ing to suppress 6MHz width blockers (e.g. TV channels in the cognitive radio or TV tuner applications). In the differential architecture two capacitors are in series and in order to get the same RC product as the SE version, we have doubled the capacitor value (C 2 =14pF). For each filter, a divide-by-8 ring counter is implemented to provide a proper phase balance. The input frequency range of the clock divider is 0.8 to 9.6GHz. A PLL might be required to generate the input clock for the divider which is pro- vided externally in this design. The generated phases in the divider are buffered and fed to the switches. Measurement results of the SE notch filter are shown in Fig. 4.2.3 for f s at 500MHz. The amount of rejection is limited to 22dB at f s due to the charge injection in the switches. S 21 renders 1.4-to-2.5dB insertion loss in the passband with an S 11 <-10dB. Measured passband NF is 1.2 to 2.8dB which is roughly the same as loss. According to the simulation by applying a blocker of -5dBm at f s , the NF in the passband degrades by 1dB (due to the noise floor of our signal generator we didn’t manage to measure this). The measured IIP3 is better than +18dBm and P 1dB is between 2 and 6dBm. P 1dB in the passband is measured as -3dBm when a blocker with a power of 0dBm is applied at f s . Measurement results for the differential notch filter is presented in Fig. 4.2.4. As we expect there is no rejection in the second harmonic. The increase in noise figure around the second harmonic is due to the leakage of the second harmonic of the clock. The tunability of the filter is illustrated in Fig. 4.2.5, showing S 21 of the SE filter for f s =0.1 to 1.2GHz. The differential filter shows the same behavior. The group delay of the SE filter is measured and shown in Fig. 4.2.5, and compared to the prediction by the RLC model in Fig. 4.2.1. Similar to a passive tank circuit the group delay becomes flat in the pass- band representing a linear phase operation. In order to check the effect of the phase imbalance and mismatch on the performance of the filter we have meas- ured the harmonic mixing effect in 10 samples for 3 switching frequencies in the SE notch filter. Figure 4.2.5 illustrates the worst-case numbers of harmonic mix- ing in the passband. The key measured parameters of both filters are compared with two Q-enhanced notch filters [7,8]. Our method provides a higher dynamic range and is more robust to large blockers and PVT variations than the Q- enhancement technique. Moreover the die area is much smaller, especially at the low-GHz bands, and finally our approach has a much larger relative tuning range, only determined by a clock signal. Acknowledgment: This research is supported by STW. We thank STMicroelectronics for silicon donation and CMP for their assistance. Also thanks go to G. Wienk and H. de Vries. References: [1] A. Ghaffari, E. A. M. Klumperink, B. Nauta, “A Differential 4-Path Highly Linear Widely Tunable On-Chip Band-Pass Filter,” IEEE Radio Frequency Integrated Circuits Symp., pp. 299-302, May 2010. [2] A. Ghaffari, E. Klumperink, M. Soer, and B. Nauta, “Tunable High-Q N-Path Band-Pass Filters: Modeling and Verification,” IEEE J. Solid-State Circuits, vol. 46, no. 5, pp. 998–1010, May 2011. [3] H. Darabi, “A Blocker Filtering Technique for SAW-Less Wireless Receivers,” IEEE J. Solid-State Circuits, vol. 42, no. 12, pp. 2766-2773, Dec. 2007. [4] A. Mirzaei, H. Darabi, and D. Murphy, “A Low-Power Process-Scalable Superheterodyne Receiver with Integrated High-Q Filters,” ISSCC Dig. Tech. Papers, pp. 60–61, Feb. 2011. [5] H. Khatri, P. S. Gudem, L. E. Larson, “An Active Transmitter Leakage Suppression Technique for CMOS SAW-Less CDMA Receivers,” IEEE J. Solid- State Circuits, vol. 45, no. 8, pp. 1590-1601, Aug. 2010. [6] L. E. Franks and I. W. Sandberg, “An Alternative Approach to the Realization of Network Transfer Functions: The N-Path Filters,” Bell Sys. Tech. J., vol. 39, pp. 1321-1350, Sept. 1960. [7] A. Bevilacqua et al., “A 0.13um CMOS LNA with Integrated Balun and Notch Filter for 3-to-5 GHz UWB Receivers,” ISSCC Dig. Tech. Papers, pp. 420–421, Feb. 2007. [8] J. Y. Lin, H. K. Chiou, “ Power –Constrained Third-Order Active Notch Filter Applied in IR-LNA for UWB Standards,” IEEE Trans. Circuits and Systems II, vol. 58, no. 1, pp. 11-15, Jan. 2011. 978-1-4673-0377-4/12/$31.00 ©2012 IEEE

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Page 1: [IEEE 2012 IEEE International Solid- State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2012.02.19-2012.02.23)] 2012 IEEE International Solid-State Circuits Conference -

76 • 2012 IEEE International Solid-State Circuits Conference

ISSCC 2012 / SESSION 4 / RF TECHNIQUES / 4.2

4.2 8-Path Tunable RF Notch Filters for Blocker Suppression

Amir Ghaffari, Eric Klumperink, Bram Nauta

University of Twente, Enschede, The Netherlands

The huge growth of the number of wireless devices makes wireless coexistencean increasingly relevant issue. If radios operate in close proximity, blockers asstrong as 0dBm may occur, driving almost any receiver in compression (notethat 0dBm in 50Ω corresponds to a peak-to-peak voltage of half a 1.2V supply).Thus RF blocker filtering is highly wanted. However, fixed filters are undesiredwhen aiming for multiband, software-defined or cognitive radio transceivers.Passive LC filters show limited Q and tunability. Recently frequency translatedfiltering has been proposed as a potential solution direction for high-Q filtering[1-5]. In [1,2] we showed that by applying the “N-path concept” [6], more thana decade of center frequency range with good linearity, compression point(P1dB>0dBm, IIP3 >14dBm) and low noise is feasible for a bandpass (BP) filter.In [3] a notch filter with a combination of active and passive mixers is applied ina feedforward path realizing a BP filter. Moreover in [5] the low input impedanceof a transimpedance amplifier with feedback is upconverted to create a notch fil-ter at low frequencies (80MHz) suppressing TX leakage in an FDD system. In thiswork we explore the possibility to realize a notch filter applying the N-path con-cept at RF frequencies and in a completely passive way. A single-ended (SE) anda differential 8-path notch filter with passive frequency mixing are presented.The filters are power-matched in the input and output in the passband and pro-vide a low insertion loss, high compression point and also low noise property,thus they can be utilized in front of a receiver to provide rejection of high-powerblockers with a large frequency tuning range.

A block diagram of an N-path notch filter is illustrated in Fig. 4.2.1. The input sig-nal is downconverted, high-pass filtered and then upconverted to the same fre-quency band as the input experiencing a notch filter at the LO frequency. A sim-ple form of an SE notch filter is illustrated in Fig. 4.2.1. Mixers are realized byswitches driven by N multiphase clocks with a duty cycle of 1/N and the high-pass filter with a simple RC network. The resistance in the high-pass filters isshared as RL. Moreover the upconverting mixer is simply implemented with thewired-OR connection at the output node. A typical transfer curve of the notch fil-ter is also illustrated in Fig. 4.2.1 representing the rejection at the switching fre-quency (fs) and its harmonics. As we showed in [2] the multipath switchedcapacitor in Fig. 4.2.1 for the frequencies close to fs can be modeled as a paral-lel RLC tank circuit with a resonance at fs. In Fig. 4.2.1, Rp and Cp values are con-stant for a given number of paths but the inductor varies with fs. Note that a fixedRC value in a tank circuit implies a constant notch bandwidth. According to theexpression of RP in Fig. 4.2.1, increasing N will increase RP, and for an 8-pathnotch filter it reduces to: Rp≈19(Rs+RL) rendering 26dB rejection at fs if Rs=RL.Thus the amount of rejection is solely defined by N in an ideal N-path notch fil-ter. The insertion loss in the passband is a function of the conversion gain of themixers and increasing the number of paths will reduce it (≈0.1dB for N=8). Stillthe switch resistance and parasitic capacitances might degrade the insertionloss in a real implementation. Similar to the N-path BP filter in [2] harmonic mix-ing might happen with (N-1)th and (N+1)th harmonics of fs. Therefore increasingthe number of paths not only increases the amount of rejection at fs but alsomoves the folding-back components further away. To avoid harmful compo-nents, a time-invariant prefilter may be required as for all N-path filters.

A prototype including an SE and a differential notch filter is implemented in65nm CMOS technology (see Fig. 4.2.2 and 4.2.7). The circuit operates directlyin a 50Ω system. In the differential architecture the notch is suppressed at theeven harmonics of fs resulting in a wider passband. The second mixer in Fig.4.2.1 (top left) is implemented by the second set of switches in the differentialfilter, exploiting the differential nature of the signals. Therefore 32 switches arerequired for an 8-path architecture. The harmonic folding characteristic and theamount of rejection in an ideal differential notch filter are expected to be similarto the SE version. The switches are realized by low-threshold NMOS transistorsand the capacitors with MIM technology. Large switch sizes (W/L=100u/65nm)are used resulting in switch resistance of 6Ω when driven by a swing of 0.9V(the DC voltage on the Source/Drains of the switches is set to 300mV to avoidreliability issues at high input swings). Larger switches would increase the inser-

tion loss at high frequencies due to the parasitic capacitance and would requirehigher digital power drive. In the SE filter C1=7pF is chosen in each path target-ing to suppress 6MHz width blockers (e.g. TV channels in the cognitive radio orTV tuner applications). In the differential architecture two capacitors are in seriesand in order to get the same RC product as the SE version, we have doubled thecapacitor value (C2=14pF).

For each filter, a divide-by-8 ring counter is implemented to provide a properphase balance. The input frequency range of the clock divider is 0.8 to 9.6GHz.A PLL might be required to generate the input clock for the divider which is pro-vided externally in this design. The generated phases in the divider are bufferedand fed to the switches. Measurement results of the SE notch filter are shown inFig. 4.2.3 for fs at 500MHz. The amount of rejection is limited to 22dB at fs dueto the charge injection in the switches. S21 renders 1.4-to-2.5dB insertion lossin the passband with an S11 <-10dB. Measured passband NF is 1.2 to 2.8dBwhich is roughly the same as loss. According to the simulation by applying ablocker of -5dBm at fs, the NF in the passband degrades by 1dB (due to the noisefloor of our signal generator we didn’t manage to measure this).

The measured IIP3 is better than +18dBm and P1dB is between 2 and 6dBm. P1dBin the passband is measured as -3dBm when a blocker with a power of 0dBm isapplied at fs. Measurement results for the differential notch filter is presented inFig. 4.2.4. As we expect there is no rejection in the second harmonic. Theincrease in noise figure around the second harmonic is due to the leakage of thesecond harmonic of the clock. The tunability of the filter is illustrated in Fig.4.2.5, showing S21 of the SE filter for fs=0.1 to 1.2GHz. The differential filtershows the same behavior. The group delay of the SE filter is measured andshown in Fig. 4.2.5, and compared to the prediction by the RLC model in Fig.4.2.1. Similar to a passive tank circuit the group delay becomes flat in the pass-band representing a linear phase operation. In order to check the effect of thephase imbalance and mismatch on the performance of the filter we have meas-ured the harmonic mixing effect in 10 samples for 3 switching frequencies in theSE notch filter. Figure 4.2.5 illustrates the worst-case numbers of harmonic mix-ing in the passband. The key measured parameters of both filters are comparedwith two Q-enhanced notch filters [7,8]. Our method provides a higher dynamicrange and is more robust to large blockers and PVT variations than the Q-enhancement technique. Moreover the die area is much smaller, especially at thelow-GHz bands, and finally our approach has a much larger relative tuning range,only determined by a clock signal.

Acknowledgment:This research is supported by STW. We thank STMicroelectronics for silicondonation and CMP for their assistance. Also thanks go to G. Wienk and H. deVries.

References:[1] A. Ghaffari, E. A. M. Klumperink, B. Nauta, “A Differential 4-Path HighlyLinear Widely Tunable On-Chip Band-Pass Filter,” IEEE Radio FrequencyIntegrated Circuits Symp., pp. 299-302, May 2010.[2] A. Ghaffari, E. Klumperink, M. Soer, and B. Nauta, “Tunable High-Q N-PathBand-Pass Filters: Modeling and Verification,” IEEE J. Solid-State Circuits, vol.46, no. 5, pp. 998–1010, May 2011.[3] H. Darabi, “A Blocker Filtering Technique for SAW-Less Wireless Receivers,”IEEE J. Solid-State Circuits, vol. 42, no. 12, pp. 2766-2773, Dec. 2007. [4] A. Mirzaei, H. Darabi, and D. Murphy, “A Low-Power Process-ScalableSuperheterodyne Receiver with Integrated High-Q Filters,” ISSCC Dig. Tech.Papers, pp. 60–61, Feb. 2011.[5] H. Khatri, P. S. Gudem, L. E. Larson, “An Active Transmitter LeakageSuppression Technique for CMOS SAW-Less CDMA Receivers,” IEEE J. Solid-State Circuits, vol. 45, no. 8, pp. 1590-1601, Aug. 2010.[6] L. E. Franks and I. W. Sandberg, “An Alternative Approach to the Realizationof Network Transfer Functions: The N-Path Filters,” Bell Sys. Tech. J., vol. 39, pp.1321-1350, Sept. 1960.[7] A. Bevilacqua et al., “A 0.13um CMOS LNA with Integrated Balun and NotchFilter for 3-to-5 GHz UWB Receivers,” ISSCC Dig. Tech. Papers, pp. 420–421,Feb. 2007.[8] J. Y. Lin, H. K. Chiou, “ Power –Constrained Third-Order Active Notch FilterApplied in IR-LNA for UWB Standards,” IEEE Trans. Circuits and Systems II, vol.58, no. 1, pp. 11-15, Jan. 2011.

978-1-4673-0377-4/12/$31.00 ©2012 IEEE

Page 2: [IEEE 2012 IEEE International Solid- State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2012.02.19-2012.02.23)] 2012 IEEE International Solid-State Circuits Conference -

77DIGEST OF TECHNICAL PAPERS •

ISSCC 2012 / February 20, 2012 / 2:00 PM

Figure 4.2.1: N-path notch filter modeled as an RLC resonator.Figure 4.2.2: Schematics of the implemented differential and single-endednotch filters.

Figure 4.2.3: S21, S11, NF, P1dB and IIP3 versus frequency in the single-endednotch filter at the switching frequency of fs=500MHz.

Figure 4.2.5: S21, group delay and harmonic mixing characteristic of the single-ended filter. Figure 4.2.6: Summary of the measured parameters and comparison.

Figure 4.2.4: S21, S11, NF, P1dB and IIP3 versus frequency in the differentialnotch filter at the switching frequency of fs=500MHz.

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Page 3: [IEEE 2012 IEEE International Solid- State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2012.02.19-2012.02.23)] 2012 IEEE International Solid-State Circuits Conference -

• 2012 IEEE International Solid-State Circuits Conference 978-1-4673-0377-4/12/$31.00 ©2012 IEEE

ISSCC 2012 PAPER CONTINUATIONS

Figure 4.2.7: Micrograph of the fabricated chip in 65nm CMOS technology.