WinCal XE™ The Microwave Tool- The Microwave Tool

Leonard HaydenCascade Microtech, Inc.

Presentation OutlineWinCal XETM

– Software application for vector network analyzer bi d tprobing and measurement

Overview of WinCal XE featuresC lib ti– Calibration

– Validation– Measurement– Analysis

Case studies– Characterization of inductors– Modeling of Gate-Oxide

Capacitor– Differential amplifier testing

Features Overview – VNA Calibration

System setup captured at device l llevel– Probe location and orientation

matter– Standard orientation must be

compatible as well– E.g., ISS rotation

Features Overview – VNA Calibration

Library of Probes and Impedance StandardLibrary of Probes and Impedance Standard Substrates– Internal tables of electrical behavior– Visual user interface with images of standards

Features Overview – VNA CalibrationLibrary of calibration methods– Solid core set –

usual SOL based including unknown thru (SOLR)

– Notable advancesMulti-line TRL (NIST refcal)Enhanced LRRM™(eLRRM ™)16 term SVD calHybrid 4-port cals

DUT

Hybrid 4 port cals– Pluggable - simplifies future

extensions DUT

Features Overview – VNA Calibration

Complete support of 2nd Tier Calibration– Cals calculate error

boxes between ref planes 2nd Tier on

Any subset of ports– Send to VNA augments

the first-tier cal with the 2nd tier

Useful in mixed interface– E.g., Port 1 is probe tip,E.g., Port 1 is probe tip,

port 2 is coax connector– Coax cal 1st tier, SOL

probe tip 2nd tier cal on p obe t p t e ca oport 1

Features Overview – Cal ValidationDo I have a good calibration?Simple validation strategy:

M dditi l l t t d f– Measure additional element not used for calibration

– Vector comparison:t t d b h imeasurement vs. expected behavior

– All ports testedSupports:– Open verification after LRRM – Golden die – compare with prior reference

result– Vector comparison is very sensitive

Good cal can be better than known (LRRM vs Copen)(LRRM vs Copen)Excellent for improving consistency

Features Overview: Measurement

Multiple page document– Up to 4 graphs per pageUp to 4 graphs per page

– polar, Smith, x-y– Dynamically select

active data itemsactive data items– Library of data reduction

methods to create tracesLive new traces– Live new traces appear as new data comes inTemplates with views– Templates with views, no data

Features Overview: Analysis

Post processing of data– Create new data items from old in

scratch pad– Library of primitives and functions– Functions are provided but can also

be easily created by user

Features Overview: Analysis

Example: Inductor QLocal Data Reduction and Viewing

XE converts S-parameters to Z-parameters, extracts imaginary part and divides by real

View device data for sanity checkDevice or data analysis & exploration

Test development & refinementQuick verification of cal or setupDevice or data analysis & exploration Quick verification of cal or setup

Case Study: Inductor Measurement

Measured on-waferMeasured on-wafer inductor as 2-port

Measured open and shorted pads

Calculated intrinsic inductor (de-embed pads)

Displayed differential

Calculated differential inductor

Displayed differential inductance, resistance, and Q

Case Study: Gate Capacitor ModelingCustom toolbar with model values

Comparison graphs including EVM –Error Vector M it dMagnitude

RESPORT RES

R=ID=

4.18 OhmRi

RES

R=ID=

11.7 OhmRint

CAP

C=ID=

4.98e4 fFCint

CAP

C=ID=

271 fFC1

PORT

Z=P=

50 Ohm1

Scratchpad to calculate the model behavior

CAP

C=ID=

1.28e4 fFCox

IND

L=ID=

8.9 pHL1

Case Study: Differential Amplifier

1st tier coaxial ref plane

1st tier coaxial ref plane

2nd tier differential probe-tip ref plane

2nd tier single-ended probe-tip ref plane

Port 1 Port 2

No possible Thru, so how do we calibrate to the probe tips?No possible Thru, so how do we calibrate to the probe tips?

Answer:1st tier 2-port coaxial calibration2nd tier differential probe-tip 1-port cal (port 1)2 tier differential probe tip 1 port cal (port 1)2nd tier single-ended 1-port cal (port 2)

WinCal XE is the Microwave Tool

Visit www.cascademicrotech.com/wincal for more information

FREE DEMO VERSION• Unlimited data viewing, manipulation and display

FREE TRIAL VERSION • Fully functional for 30 days

Academic discount available

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