interference of light
DESCRIPTION
Interference of Light. Refraction (a review). Character of the wave in different (transparent) media wave travels slower Index of refraction n = c/v frequency is constant (wavelength changes) Law of Refraction (Snell’s Law) n 1 sin q 1 = n 2 sin q 2. Huygens Principle. - PowerPoint PPT PresentationTRANSCRIPT
Interference of LightInterference of Light
Refraction (a review)Refraction (a review)• Character of the wave Character of the wave
in different in different (transparent) media(transparent) media– wave travels slowerwave travels slower– Index of refraction Index of refraction
n = c/vn = c/v– frequency is constant frequency is constant
(wavelength changes)(wavelength changes)• Law of Refraction Law of Refraction
(Snell’s Law)(Snell’s Law)nn11 sin sin = n = n22 sin sin
Huygens Principle
• Propagation of plane wave by Huygen’s principle
Snell’s Law• Refraction • Similar triangles
2
2
1
1
sinsin
2211 sinsin nn
2
2
1
1
vt
vt
refraction ofIndex
vcn
Young’s Double SlitYoung’s Double Slit
Young’s Double Slit 1801Young’s Double Slit 1801• Conditions for interferenceConditions for interference
sin12 drrL
yL
Ly
tansinLyd
Young’s Double SlitYoung’s Double Slit
Constructive interference phase difference to Constructive interference phase difference to be an integral number of wavelengthsbe an integral number of wavelengths
,......2,1,0 wheresin
mmdL
Lydm sin
Destructive Interference Destructive Interference ConditionCondition
Destructive interference Destructive interference (minima)(minima)
Lyd
2
1m
Lyddm
sin
21
Young’s Double SlitYoung’s Double SlitIntensity behaviorIntensity behavior
tEEtEE
02
01
sinsin
tEtEE 00P sinsin
Young’s Double SlitYoung’s Double SlitIntensity behavior algebraic approachIntensity behavior algebraic approach
tEtEEP sinsin 00
2sin
2cos2 0
tEEP
2
cos2
sin2sinsin BABABA
2cos4
2cos
24
2sin
2cos4
20
220
2220
2
I
E
tEEIavep
Intensity by Phasor Method
180)180(2
2cos4
2cos
24
2
2cos4
2cos2
cos2
20
220
2
220
2
0
0
II
EEI
EE
E
EE
Young’s Double SlitYoung’s Double SlitIntensity behavior averaged over one Intensity behavior averaged over one
periodperiod
sind222II 2
0av
cos
sincos2
0 dIIav
yDdIIav
20 cos
Interference upon ReflectionInterference upon Reflection
• Thin FilmThin Film– in airin air– coatingscoatings
Phase changes upon Phase changes upon ReflectionReflection
Dense to less dense
n1 > n2
Less dense to more dense
n1 < n2
Thin Film in Air (Soap Film)Thin Film in Air (Soap Film)
• Near normalNear normal incidenceincidence
• Conditions for Conditions for reflected light reflected light interferenceinterference
Condition for there to be Condition for there to be constructive interferenceconstructive interference
2
2
)21(
,.....1,0 )21(2
nm
mmL n
Assume
21 nn
Michelson InterferometerMichelson Interferometer
1 22 L L
1 22 L LN