introduction to elemental analysis by...
TRANSCRIPT
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Introduction to Elemental Analysis by
ED-XRF
Justin Masone
Product Specialist
3 June 2015
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Established in 1875. Headquartered in Kyoto, Japan
Ranked Top 5 Instrument Providers in the world by Chemical and
Engineering News
Offer broad range of analytical solutions and technologies
Shimadzu Corporation
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Chromatography
• HPLC & UHPLC • GPC • GC
Mass Spectrometry
• LCMS • GCMS • MALDI
Environmental Analyzers
• Total Organic Carbon • Total Nitrogen • Total Phosphorus
Spectroscopy
• UV-Vis-NIR • FTIR • Fluorescence • AA • ICP
TQ GCMS-8030
TQ LCMS-8050
MALDI-TOF/TOF
Nexera UHPLC
Shimadzu Corporation
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Physical Measurement
• Tensile/Universal • Hydraulic • Concrete • Fatigue • Hardness • Static/Dynamic Jack • Impact • Particle Size Analyzers • Thermal Analyzers • High-Speed Video Camera
X-ray
• XRD • XRF • EDX
Balances & Scales
DSC
Analytical Balance
Hardness
Shimadzu Corporation
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What is XRF?
• Analytical method to determine the elemental
composition of many types of materials
• Fast, accurate, non-destructive
• Requires minimal sample prep
• Samples can be in solid, liquid, powder, or filtered
form
• Can be used to determine the
thickness and composition of
layers, coatings, and platings.
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What is ED-XRF?
Energy-Dispersive X-Ray Fluorescence
Energy-dispersive: Ability to discern the energies of x-rays
X-Ray: Form of energy; source of ionizing radiation
Fluorescence: Phenomenon of absorbing energy (short λ)
and subsequently emitting energy (longer λ)
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Basis of EDX
Fluorescent
X-rays
1
2 3
4
5
6
Data Processing Unit
Pre-amp/DPP
Irradiating
X-rays
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What are X-Rays?
X-rays are a kind of electromagnetic energy:
0.01 – 10 nm
0.125 – 125 keV
“Hard” X-rays: >10 keV
“Soft” X-rays: <10 keV
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How Do X-Rays Interact with Matter?
When X-rays strike matter, some of them are absorbed and some
pass through
Absorption and penetration depend on the elemental composition,
density, and thickness of matter.
A consequence of absorption is that secondary X-rays are
generated, which are characteristic of that matter:
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How Do X-Rays Interact with Matter?
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How Do X-Rays Interact with Matter?
Degree of fluorescence
depends on:
• Thickness
• Density
• Sample material
X-ray penetration depth (Rh-Kα; ~20 keV):
Pb 25 μm
Fe 200 μm
H2O 3 cm
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How Do X-Rays Interact with Atoms?
+ + + + + +
-
-
-
-
- -
-
-
+ +
-
-
-
-
-
- Irradiating
X-ray
Ejected
Electron
Fluorescent
X-ray
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Types of Transitions
These are “Characteristic X-rays”
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Energy of X-Rays: Example
+ + + + + +
-
-
-
-
- -
-
-
+ + -
Fe atom
Kα
𝐸 =ℎ𝑐
𝜆
=
(4.14 × 10−18𝑘𝑒𝑉 ∙ 𝑠) ×
(3.00 × 1017𝑛𝑚 ∙ 𝑠)
0.194 𝑛𝑚
= 6.40 𝑘𝑒𝑉
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Energy of X-Rays: Example
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EDX Spectrum
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EDX Data Output
List of elements
present, including
carbon as a balance
Amount present in
sample; can be
reported in various
units Type of analysis
Transition used for
quantitative
calculation
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Analytical Range
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EDX System
X-ray tube
Filters
Collimator
C-MOS
camera
Detector
(SDD)
Sample
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Why use EDX?
• Elemental analysis is traditionally done by AA/ICP
• This requires significant sample prep and cost of analysis is high
• With EDX, there is:
• Minimal to no sample prep (solvents, TDS, etc. are not a concern)
• Detection limits for heavy (high Z) elements ≤ 0.1 ppm
• Low cost of analysis in terms of both time and money
• No gas requirements
• No exhaust
• No sample waste
• Uses less bench space
• Easy to use
![Page 21: Introduction to Elemental Analysis by ED-XRFmrl.illinois.edu/sites/default/files/pdfs/ED-XRD-Shimadzu.pdf · Why use EDX? • Elemental analysis is traditionally done by AA/ICP •](https://reader034.vdocument.in/reader034/viewer/2022042807/5f80a1d4911587449f49d65d/html5/thumbnails/21.jpg)
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Example Applications
Electrical/electronic materials RoHS and halogen screening
Thin-film analysis for semiconductors, discs,
liquid crystals, and solar cells
Automobiles and machinery ELV hazardous element screening
Composition analysis, plating thickness
measurement, and chemical conversion
coating film weight measurement for
machine parts
Ferrous/non-ferrous metals Main component analysis and impurity
analysis of raw materials, alloys, solder, and
precious metals
Composition analysis of slag
Mining Grade analysis for mineral processing
Ceramics Analysis of ceramics, cement, glass, bricks,
and clay
Oil and petrochemicals Analysis of sulfur in oil Analysis of additive elements and mixed elements
in lubricating oil Chemicals Analysis of products and organic/inorganic raw
materials Analysis of catalysts, pigments, paints, rubber, and
plastics Environment Analysis of soil, effluent, combustion ash, filters,
and fine particulate matter Pharmaceuticals Analysis of residual catalyst during synthesis Analysis of impurities and foreign matter in active
pharmaceutical ingredients Agriculture and foods Analysis of soil, fertilizer, and plants Analysis of raw ingredients, control of added
elements, and analysis of foreign matter in foods Others Composition analysis of archeological samples and
precious stones, analysis of toxic heavy metals in toys and everyday goods
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Quantitative Analysis Results for Foreign
Matter by FP Method
(Ti and Zn are excluded from the
quantitative calculations.)
Matching Results
Analysis Example: Foreign Matter Adhering to a Plastic Extruded Part
— F
e K
b
— N
i K
a
— C
r K
a
— C
r K
a M
n K
b
— T
i K
a
— T
i K
b
— N
i K
b
— Z
n K
a
— Z
n K
b
— M
o K
a
Foreign matter
Clean area
— F
e K
a
Sample
Appearance
Red circle: Foreign matter
Blue circle: Clean area
Application: Foreign Matter Identification
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Application: Hazardous Substances
in Products
Sample Appearance
PE Resin Standard Samples
Containing the 8 Controlled
Elements in Toys
Cr
Ka
Pb
La
Br
Ka
Pb
Lb
1
Sb
Ka
Sb
Kb
Ba
Ka
Plastic base
material
Overall
(Paint + plastic
base material)
Scraped paint
Analysis Example: Screening Analysis for 8 Controlled Elements in Toys
Overlaid Profiles of Measured Areas
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Application: Thin Films
Peak Profiles of Ni, P, and Pb
Quantitative Analysis Results by Film FP Method
Analysis Example: Film Thickness and Composition Measurements of Electro-less
Nickel Plating
Cu substrate
Ni, P, Pb
Primary
X-ray
Fluorescent
X-ray
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Application: Cement
Analysis Example: Qualitative Analysis of Cement
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Application: Cement
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Application: Cement
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Application: Cement
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Application: Polymer Film
Shimadzu’s newly-developed “Background FP” method (BG-FP)
incorporates X-ray scattering theory into the standard FP calculation
Uses Compton scattering to determine thickness of a polymer film while
simultaneously determining its constituent elements
Analysis Example: Determination of Thickness and Concentration
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Scattered Radiation
Some of the X-rays from the tube do not generate fluorescent X-
rays when they strike the sample. Instead, they are scattered
within the sample. There are two types scattering radiation:
Compton Scattering: When the source characteristic X-rays (Rh) that strike the
material suffer from some energy loss (inelastic scattering)
Rayleigh Scattering: When the source characteristic X-rays (Rh) strike the sample
without any change in energy (elastic scattering)
Application: Polymer Film
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Rayleigh
scattering
Compton
scattering
The intensity of the Compton scattering is
influenced by the material/density of the sample
Application: Polymer Film
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• Samples with light elements give rise to high Compton scatter and low Rayleigh
scatter
• This is because they have more loosely bound electrons
• With very heavy elements, the Compton scattering disappears completely
Application: Polymer Film
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Application: Polymer Film
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Application: Polymer Film
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Application: Polymer Film
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Application: Polymer Film
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Application Notes
Screening Analysis with EDX-7000 Navi Software
Quantitative Analysis of Elements in Small Quantity of
Organic Matter by EDXRF
- New Feature of Background FP Method -
Quantitative Analysis of Cement by EDX-8000
Quantitative Analysis of Waste Oil by EDX-7000
TC Measurement and Elemental Composition Analysis
of Fly Ash
- Quantitation by TOC and XRF -
Quantitative Analysis of Tin (Sn) in Plastics by EDXRF
Analysis of Aqueous Solution by EDX-LE
- Performance in Air Atmosphere -
Quantitative Analysis of Fluorine (9F) by EDXRF
Quantitative Analysis of Antimony (Sb) in Plastics by
EDXRF
Qualitative and Quantitative Analysis of Seafood by
EDXRF
EDXRF Analysis of Arsenic and Lead in Dietary
Supplement
QC Analysis of Magnesium Alloy Die Castings by
EDXRF
EDXRF Analysis of PM2.5 (Particle Matter)
EDXRF Analysis of Sulfur and Other Elements in Oil
EDXRF Analysis of Lead, Cadmium, Silver, Copper in
Lead-Free Solder Materials
Determination of Arsenic and Lead in Earth and Sand
Using EDXRF [JIS K 0470]
Comparison of Calibration Curves of Lead, Cadmium
and Chromium in Zinc Alloy and Copper Alloy
EDXRF Analysis of Lead, Cadmium, Mercury and
Chromium in Zinc Alloy
EDXRF Analysis of Chlorine in Irregularly Shaped
Plastic Samples
Analysis of Foreign Matter in Food Using EDX
EDXRF Analysis of Heavy Elements in a Toy and a Cup
EDXRF Analysis of Chlorine in Plastic (PE) Materials
Analysis of Sulfur in Oil Using Energy Dispersive X-Ray
Fluorescence Spectrometer
Analysis of Foreign Matter Using CCD
EDXRF Analysis of Arsenic in Foods
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Additional Information
Additional Information:
http://www.ssi.shimadzu.com
http://www.shimadzu.com