irf7807vd2

9
Parameter Max. Units Maximum Junction-to-AmbientS R θJA 50 °C/W Maximum Junction-to-Lead R θJL 20 °C/W Thermal Resistance IRF7807VD2 03/05/01 IRF7807VD2 R DS(on) 17mQ G 9.5nC Q sw 3.4nC Q oss 12nC DEVICE CHARACTERISTICSU SO-8 FETKYMOSFET / SCHOTTKY DIODE Top View 8 1 2 3 4 5 6 7 A/S A/S A/S G K/D K/D D K/D K/D Co-Pack N-channel HEXFET Power MOSFET and Schottky Diode Ideal for Synchronous Rectifiers in DC-DC Converters Up to 5A Output Low Conduction Losses Low Switching Losses Low Vf Schottky Rectifier Description The FETKY family of Co-Pack HEXFET MOSFETs and Schottky diodes offers the designer an innovative, board space saving solution for switching regulator and power management applications. HEXFET power MOSFETs utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. Combining this technology with International Rectifier’s low forward drop Schottky rectifiers results in an extremely efficient device suitable for use in a wide variety of portable electronics applications. The SO-8 has been modified through a customized leadframe for enhanced thermal characteristics. The SO- 8 package is designed for vapor phase, infrared or wave soldering techniques. Parameter Symbol Max. Units Drain-Source Voltage V DS 30 Gate-Source Voltage V GS ±20 Continuous Drain or Source 25°C I D 8.3 Current (V GS 4.5V) 70°C 6.6 A Pulsed Drain CurrentQ I DM 66 Power DissipationS 25°C P D 2.5 70°C 1.6 Schottky and Body Diode 25°C I F (AV) 3.7 A Average ForwardCurrentT 70°C 2.3 Junction & Storage Temperature Range T J , T STG –55 to 150 °C Absolute Maximum Ratings V W www.irf.com 1 PD-94079

Upload: martin-torres

Post on 17-Jul-2016

213 views

Category:

Documents


0 download

DESCRIPTION

mosfet

TRANSCRIPT

Page 1: irf7807vd2

Parameter Max. UnitsMaximum Junction-to-Ambient RθJA

50 °C/W

Maximum Junction-to-Lead RθJL20 °C/W

Thermal Resistance

IRF7807VD2

03/05/01

IRF7807VD2

RDS(on) 17mΩ

QG

9.5nC

Qsw

3.4nC

Qoss

12nC

DEVICE CHARACTERISTICS

SO-8

FETKY™ MOSFET / SCHOTTKY DIODE

Top View

81

2

3

4 5

6

7

A/S

A/S

A/S

G

K/D

K/DD

K/D

K/D

• Co-Pack N-channel HEXFET Power MOSFETand Schottky Diode

• Ideal for Synchronous Rectifiers in DC-DCConverters Up to 5A Output

• Low Conduction Losses• Low Switching Losses• Low Vf Schottky Rectifier

DescriptionThe FETKY™ family of Co-Pack HEXFET MOSFETs andSchottky diodes offers the designer an innovative, boardspace saving solution for switching regulator and powermanagement applications. HEXFET power MOSFETsutilize advanced processing techniques to achieveextremely low on-resistance per silicon area. Combiningthis technology with International Rectifier’s low forwarddrop Schottky rectifiers results in an extremely efficientdevice suitable for use in a wide variety of portableelectronics applications.

The SO-8 has been modified through a customizedleadframe for enhanced thermal characteristics. The SO-8 package is designed for vapor phase, infrared or wavesoldering techniques.

Parameter Symbol Max. Units

Drain-Source Voltage VDS

30

Gate-Source Voltage VGS ±20

Continuous Drain or Source 25°C ID 8.3

Current (VGS

≥ 4.5V) 70°C 6.6 A

Pulsed Drain Current IDM 66

Power Dissipation 25°C PD 2.5

70°C 1.6

Schottky and Body Diode 25°C IF (AV) 3.7 A

Average ForwardCurrent 70°C 2.3

Junction & Storage Temperature Range TJ, T

STG–55 to 150 °C

Absolute Maximum Ratings

V

W

www.irf.com 1

PD-94079

Page 2: irf7807vd2

IRF7807VD2

2 www.irf.com

Parameter Min Typ Max Units Conditions

Drain-to-Source BVDSS 30 – – V VGS = 0V, ID = 250µABreakdown Voltage

Static Drain-Source RDS(on) 17 25 mΩ VGS = 4.5V, ID = 7.0Aon Resistance

Gate Threshold Voltage VGS(th) 1.0 V VDS = VGS,ID = 250µA

Drain-Source Leakage IDSS 50 µA VDS = 24V, VGS = 0

Current* 6.0 mA VDS = 24V, VGS = 0,

Tj = 100°C

Gate-Source Leakage IGSS ±100 nA VGS = ±20VCurrent*

Total Gate Charge* QG 9.5 14 VGS=4.5V, ID=7.0A

Pre-Vth QGS1 2.3Gate-Source Charge VDS = 16V

Post-Vth QGS2 1.0 nCGate-Source Charge

Gate to Drain Charge QGD 2.4

Switch Chg(Qgs2 + Qgd) Qsw 3.4 5.2

Output Charge* Qoss 12 16.8 VDS = 16V, VGS = 0

Gate Resistance RG 2.0 Ω

Turn-on Delay Time td (on) 6.3 VDD = 16V, ID = 7.0A

Rise Time tr 1.2 ns VGS = 5V, RG= 2ΩTurn-off Delay Time td (off) 11 Resistive Load

Fall Time tf 2.2

Electrical Characteristics

Current

Notes: Repetitive rating; pulse width limited by max. junction temperature. Pulse width ≤ 400 µs; duty cycle ≤ 2%. When mounted on 1 inch square copper board 50% Duty Cycle, RectangularTypical values of RDS(on) measured at V

GS = 4.5V, Q

G, Q

SW and Q

OSS measured at V

GS = 5.0V, I

F = 7.0A.

* Device are 100% tested to these parameters.

Schottky Diode & Body Diode Ratings and Characteristics

Parameter Min Typ Max Units ConditionsDiode Forward Voltage VSD 0.54 V Tj = 25°C, Is = 3.0A, VGS =0V

0.43 Tj = 125°C, Is = 3.0A, VGS =0VReverse Recovery Time trr 36 ns T

j = 25°C, I

s = 7.0A, V

DS = 16V

Reverse Recovery Charge Qrr 41 nC di/dt = 100A/µsForward Turn-On Time ton Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)

Page 3: irf7807vd2

IRF7807VD2

www.irf.com 3

Control FET

Special attention has been given to the power lossesin the switching elements of the circuit - Q1 and Q2.Power losses in the high side switch Q1, also calledthe Control FET, are impacted by the Rds(on) of theMOSFET, but these conduction losses are only aboutone half of the total losses.

Power losses in the control switch Q1 are givenby;

Ploss

= Pconduction

+ Pswitching

+ Pdrive

+ Poutput

This can be expanded and approximated by;

Ploss = Irms2 × Rds(on )( )

+ I ×Qgd

ig

× Vin × f

+ I ×

Qgs2

ig× Vin × f

+ Qg × Vg × f( ) + Qoss

2×Vin × f

This simplified loss equation includes the terms Qgs2

and Qoss which are new to Power MOSFET data sheets.Qgs2 is a sub element of traditional gate-source

charge that is included in all MOSFET data sheets.The importance of splitting this gate-source chargeinto two sub elements, Qgs1 and Qgs2, can be seen fromFig 1.

Qgs2 indicates the charge that must be supplied bythe gate driver between the time that the thresholdvoltage has been reached (t1) and the time the draincurrent rises to Idmax (t2) at which time the drain volt-age begins to change. Minimizing Qgs2 is a critical fac-tor in reducing switching losses in Q1.

Qoss is the charge that must be supplied to the out-put capacitance of the MOSFET during every switch-ing cycle. Figure 2 shows how Qoss is formed by theparallel combination of the voltage dependant (non-linear) capacitance’s Cds and Cdg when multiplied bythe power supply input buss voltage.

Figure 1: Typical MOSFET switching waveform

Synchronous FET

The power loss equation for Q2 is approximatedby;

Ploss = Pconduction + Pdrive + Poutput*

Ploss = Irms

2× Rds(on)( )

+ Qg × Vg × f( ) + Qoss

2×Vin × f

+ Qrr × Vin × f( )

*dissipated primarily in Q1.

Power MOSFET Selection for DC/DCConverters 4

1

2

Drain Current

Gate Voltage

Drain Voltage

t3t2

t1VGTH

QG

S1

QG

S2

QG

D

t0

Page 4: irf7807vd2

IRF7807VD2

4 www.irf.com

Typical Mobile PC Application

The performance of these new devices has been testedin circuit and correlates well with performance predic-tions generated by the system models. An advantage ofthis new technology platform is that the MOSFETs itproduces are suitable for both control FET and synchro-nous FET applications. This has been demonstrated withthe 3.3V and 5V converters. (Fig 3 and Fig 4). In theseapplications the same MOSFET IRF7807V was used forboth the control FET (Q1) and the synchronous FET(Q2). This provides a highly effective cost/performancesolution.

Figure 3 Figure 4

Figure 2: Qoss Characteristic

For the synchronous MOSFET Q2, Rds(on)

is an im-portant characteristic; however, once again the im-portance of gate charge must not be overlooked sinceit impacts three critical areas. Under light load theMOSFET must still be turned on and off by the con-trol IC so the gate drive losses become much moresignificant. Secondly, the output charge Q

oss and re-

verse recovery charge Qrr both generate losses that

are transfered to Q1 and increase the dissipation inthat device. Thirdly, gate charge will impact theMOSFETs’ susceptibility to Cdv/dt turn on.

The drain of Q2 is connected to the switching nodeof the converter and therefore sees transitions be-tween ground and V

in. As Q1 turns on and off there is

a rate of change of drain voltage dV/dt which is ca-pacitively coupled to the gate of Q2 and can inducea voltage spike on the gate that is sufficient to turn

the MOSFET on, resulting in shoot-through current .The ratio of Q

gd/Q

gs1 must be minimized to reduce the

potential for Cdv/dt turn on.Spice model for IRF7807V can be downloaded in

machine readable format at www.irf.com.

3.3V Supply : Q1=Q2= IRF7807V 5.0V Supply : Q1=Q2= IRF7807V

83

84

85

86

87

88

89

90

91

92

93

1 2 3 4 5Load current (A)

Effi

cien

cy (

%)

Vin=24V

Vin=14V

Vin=10V

86

87

88

89

90

91

92

93

94

95

1 2 3 4 5

Load current (A)

Effi

cien

cy (

%)

Vin=24V

Vin=14V

Vin=10V

Page 5: irf7807vd2

IRF7807VD2

www.irf.com 5

Fig 5. Normalized On-ResistanceVs. Temperature

Fig 7. On-Resistance Vs. Gate Voltage

-60 -40 -20 0 20 40 60 80 100 120 140 1600.0

0.5

1.0

1.5

2.0

T , Junction Temperature ( C)

R

, D

rain

-to-

Sou

rce

On

Res

ista

nce

(Nor

mal

ized

)

J

DS

(on)

°

V =

I =

GS

D

4.5V

7.0A

2.0 4.0 6.0 8.0 10.0 12.0 14.0 16.0

VGS, Gate -to -Source Voltage (V)

0.010

0.015

0.020

0.025

0.030

RD

S(o

n),

Dra

in-t

o -S

ourc

e O

n R

esis

tanc

e ( Ω

)

ID = 7.0A

Fig 8. Typical Reverse Output CharacteristicsFig 7. Typical Reverse Output Characteristics

0 0.2 0.4 0.6 0.8 1

VSD, Source-to-Drain Voltage (V)

0

10

20

30

40

50

60

70

I S, S

ourc

e-to

-Dra

in C

urre

nt (

A)

380µs PULSE WIDTHTj = 25°C

VGSTOP 4.5V 3.5V 3.0V 2.5V 2.0VBOTTOM 0.0V

0.0 V

0 0.2 0.4 0.6 0.8 1

VSD, Source-to-Drain Voltage (V)

0

10

20

30

40

50

60

70

I S, S

ourc

e-to

-Dra

in C

urre

nt (

A)

380µS PULSE WIDTHTj = 150°C

VGSTOP 4.5V 3.5V 3.0V 2.5V 2.0VBOTTOM 0.0V

O.OV

Page 6: irf7807vd2

IRF7807VD2

6 www.irf.com

Figure 9. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient

0.1

1

10

100

0.00001 0.0001 0.001 0.01 0.1 1 10

Notes:1. Duty factor D = t / t2. Peak T = P x Z + T

1 2

J DM thJA A

P

t

t

DM

1

2

t , Rectangular Pulse Duration (sec)

The

rmal

Res

pons

e(Z

)

1

thJA

0.01

0.02

0.05

0.10

0.20

D = 0.50

SINGLE PULSE(THERMAL RESPONSE)

0 2 4 6 8 10 120

1

2

3

4

5

Q , Total Gate Charge (nC)

V

, G

ate-

to-S

ourc

e V

olta

ge (

V)

G

GS

I =D 7.0A

V = 16VDS

Fig 10. Typical Gate Charge Vs.Gate-to-Source Voltage

Page 7: irf7807vd2

IRF7807VD2

www.irf.com 7

MOSFET , Body Diode & Schottky Diode Characteristics

Fig. 12 - Typical Values ofReverse Current Vs. Reverse Voltage

Fig. 11 - Typical Forward Voltage DropCharacteristics

0.0 0.2 0.4 0.6 0.8 1.0 1.2

Forward Voltage Drop - V SD ( V )

0.1

1

10

100

Inst

anta

neou

s F

orw

ard

Cur

rent

- I

F (

A )

Tj = 125°C

Tj = 25°C

0 5 10 15 20 25 30

Reverse Voltage - V R (V)

0.001

0.01

0.1

1

10

100

Rev

erse

Cur

rent

- I

R (

mA

)

125°C

100°C

Tj = 150°C

75°C

50°C

25°C

Page 8: irf7807vd2

IRF7807VD2

8 www.irf.com

SO-8 Package Details

K x 45 °

C8X

L8X

θ

H

0.25 (.010) M A M

A

0.10 (.004)

B 8X

0 .25 (.010) M C A S B S

- C -

6Xe

- B -D

E- A -

8 7 6 5

1 2 3 4

5

6

5

R E COM ME ND E D F OOTP R IN T

0.72 (.028 )8X

1 .78 (.070) 8X

6 .46 ( .255 )

1.27 ( .050 ) 3X

D IM IN C H ES M IL LIM ET ER S

M IN M A X M IN M AX

A .0532 .0688 1 .35 1 .75

A1 .0040 .0098 0 .10 0 .25

B .014 .018 0 .36 0 .46

C .0 075 .0 098 0 .19 0 .25

D .1 89 .1 96 4 .80 4 .98

E .150 .157 3 .81 3 .99

e .050 BA SIC 1 .2 7 B ASIC

e1 .025 BA SIC 0 .6 35 B AS IC

H .2 284 .2 440 5 .80 6 .20

K .011 .019 0 .28 0 .48

L 0 .16 .050 0 .41 1 .27

θ 0° 8° 0 ° 8°

N OTE S :

1 . D IM EN SION IN G AN D TOLER A NC IN G P ER AN S I Y14.5M-1982.

2 . C ON TROLLIN G D IM EN SION : IN C H .

3 . D IM EN SION S A RE SH OW N IN MILLIME TE R S (IN C HE S).

4 . OU TLIN E CON F ORM S TO JED E C OU TLINE MS -012AA .

D IME NS ION D OES N OT IN C LU D E M OLD PR OTR US ION S

MOLD P R OTR U SIONS N OT TO EXCE ED 0 .25 (.006).

D IME NS ION S IS TH E LE N GTH OF LEA D FOR SOLDE R IN G TO A SU B STRA TE..

5

6

A 1

e1θ

SO-8 Part Marking

Page 9: irf7807vd2

IRF7807VD2

www.irf.com 9

330.00( 12 .992) M A X.

14.40 ( .566 )12.40 ( .488 )

N O TES :1 . CO N TR O LLIN G DIM EN SIO N : M ILL IME TER .2 . O UTLIN E C O N FO R M S T O EIA -481 & E IA-541 .

FE ED D IREC TIO N

TER M IN AL N UM BER 1

12 .3 ( .484 )11 .7 ( .461 )

8 .1 ( .318 )7 .9 ( .312 )

N O T E S :1 . C O N T R O L L IN G D IM E N S IO N : M IL L IM E T E R .2 . A L L D IM E N S IO N S A R E S H O W N IN M IL L IM E TE R S (IN C H E S ) .3 . O U T L IN E C O N FO R M S TO E IA -4 8 1 & E IA -5 4 1 .

SO-8 Tape and Reel

This product has been designed and qualified for the commercial market. Qualification Standards can be found on IR’s Web site.

IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105TAC Fax: (310) 252-7903

Visit us at www.irf.com for sales contact information. Data and specifications subject to change without notice. 03/01