issue 01, 01/2007 - service to the ndt industry · krautkramer usm 33 issue 01, 01/2007 1-5...

Issue 01, 01/2007Krautkramer USM 33

Issue 01, 01/2007

Introduction 1

Krautkramer USM 33 1-1Issue 01, 01/2007

1.1 Safety Information

Introduction Safety inforfation

Krautkramer USM 331-2 Issue 01, 01/2007

The USM 33 has been designed and tested accordingto DIN EN 61 010 Part 1, 2002, Safety requirements forelectrical measuring, control and lab equipment, andwas technically in perfectly safe and faultless conditionwhen leaving the manufacturig works.

In order to maintain this condition and to ensure a safeoperation, you should urgently read the following safetyinformation before putting the instrument into operation.

The USM 33 is an instrument for materials testing.Any use for medical applications or other purposesis not allowed!

The USM 33 may only be used in industrial enviro-nments!

The USM 33 is waterproof according to IP 54. TheUSM 33 can be operated with batteries or a powersupply unit.

The power supply unit has the electrical safety class II.

For the battery operation of the USM 33, we recommend the use of a lithium-ion battery. You should only use the productsrecommended by us for the battery operation.

You can charge the lithium-ion battery withi n the instrument itself or in an external battery charger.

As soon as you connect the power supply unit to the USM 33, the battery power supply is interrupted. If a lithium-ion battery is inserted, the charging process starts automatically when you connect the instrument to the mains supply. Please refer to chapter 3.1 on power supply, and to chapter 7 on howto handle batteries.

SoftwareAccording to the current state of the art, software isnever completely free from errors. Before using anysoftware controlled test equipment, please make sure that the required functions operate perfectly in the intended combination.

Attention:!

Batteries

Defects/errors and exceptional stresses 1.2 Important information on ultrasonic testing


IntroductionSafety information

If you have reason to believe that a safe operation ofyour USM 33 is no longer possible, you have to disc-onnect the instrument and secure it against unintentionalreconnection. Remove the batteries if necessary.

A safe operation is e.g. no longer possible :

if the instrument shows visible damages,if the instrument no longer operates perfectly,after prolonged storage under adverse conditions(e.g. exceptional temperatures and/or especially highair humidity, or corrosive environmental conditions),

after being subjected to heavy stresses during trans-portation.

Please read the following information before using yourUSM 33. It is important that you understand and observethis information to avoid any operator errors that might lead to false test results. This could result in personalinjuries or damage to property.

Preconditions for testing with ultrasonic testequipmentThis operating manual contains essential information onhow to operate your test equipment. In addition, thereare a number of factors which affect the test results. Adescription of these factors would go beyond the scopeof an operating manual. The following list therefore onlymentions the three most important conditions for a safeand reliable ultrasonic inspection:

A safe operation is e.g. no longer possible

• the operator training;• the knowledge of special technical test requirementsand limits;

• the choice of appropriate test equipment.

Operator training

Introduction Important information on ultrasonic testing


Technical test requirementsThe operation of an ultrasonic test device requires a proper training in ultrasonic test methods.

Proper training comprises for example adequateknowledge of:

• the theory of sound propagation;• the effects of sound velocity in the test material;• the behavior of the sound wave at interfaces betweendifferent materials;

• the propagation of the sound beam;• the influence of sound attenuation in the test objectand the influence of surface quality of the test object.

Lack of such knowledge could lead to false test resultswith unforeseeable consequences. You can contact forexample NDT societies or organizations in your country(DGZfP in Germany; ASNT in the USA), or also GEInspection Technologies, for information concerningexisting possibilities for the training of ultrasonic inspectors as well as on the qualifications and certifi-cates that can finally be obtained.

Every ultrasonic test is subject to specific technical test requirements.

The most important ones are:

• the definition of the scope of inspection choice of the appropriate test method;• the consideration of material properties;• the determination of limits for recording and evaluation.

It is the task of those with overall responsibility for testingto ensure that the inspector is fully informed about these requirements. The best basis for such information is experience with identical test objects. It is also essentialthat the relevant test specifications be clearly and completelyunderstood by the inspector.

GE Inspection Technologies regularly holds specializedtraining courses in the field of ultrasonic testing. Thescheduled dates for these courses will be given to youon request.


IntroductionImportant information on ultrasonic testing

Limits of testingThe information obtained from ultrasonic tests onlyrefers to those parts of the test object which arecovered by the sound beam of the probe used. Any conclusions from the tested parts to be applied to the untested parts of the test object should be madewith extreme caution.

Such conclusions are generally only possible in caseswhere extensive experience and proven methods ofstatistical data acquisition are available.

The sound beam can be completely reflected fromboundary surfaces within the test object so that flawsand reflection points lying deeper remain undetected. Itis therefore important to make sure that all areas to betested in the test object are covered by the sound beam.

constituents, this condition is mostly fulfilled. The variation in sound velocity is so slight that it is only of importance for high-precision measurements. In other materials, e.g. nonferrous metals or plastics, the sound velocity variationsmay be even larger and thus affect the measuring accuracy.

.

Ultrasonic wall thickness measurementAll ultrasonic wall thickness measurements are basedon a time-of-flight measurement. Accurate measurementresults require a constant sound velocity in the test object. In test objects made of steel, even with varying alloying

Effect of the test object’s materialIf the test object’s material is not homogeneous, thesound may propagate at different sound velocities indifferent parts of the test objects. An average soundvelocity should then be taken into account for the rangecalibration. This is achieved by means of a referenceblock whose sound velocity corresponds to the averagesound velocity of the test object.

If substantial sound velocity variations are to be expected,then the instrument calibration should be readjusted to the actual sound velocity values at shorter time intervals. Failure to do so may lead to false thickness readings.

Introduction Important information on ultrasonic testing


Effect of temperature variationsThe sound velocity within the test object also varies asa function of the material’s temperature. This can causeappreciable errors in measurements if the instrumenthas been calibrated on a cold reference block and isthen used on a warm or hot test object. Such measure-ment errors can be avoided either by warming the reference block to the same temperature before cali-brating, or by using a correction factor obtained from tables.

In present-day test practice, there are basically twodifferent methods of flaw evaluation:

If the diameter of the sound beam is smaller than theextent of the flaw, then the beam can be used to explorethe boundaries of the flaw and thus determine its area.

If, however, the diameter of the sound beam is largerthan the size of the flaw, the maximum echo responsefrom the flaw must be compared with the maximumecho response from an artificial flaw provided for com-parison purposes.

Measurement of remaining wall thicknessThe measurement of the remaining wall thickness onplant components, e.g. pipes, tanks and reaction vesselsof all types which are corroded or eroded from theinside, requires a perfectly suitable gauge and specialcare in handling the probe.

The inspectors should always be informed about thecorresponding nominal wall thicknesses and the likelyamount of wall thickness losses.

Flaw boundary methodThe smaller the diameter of the probe’s sound beam,the more accurately the boundaries (and therefore theflaw area) can be determined by the flaw boundarymethod. If, however, the sound beam is relativelybroad, the flaw area determined can substantially differfrom the actual flaw area. Care should therefore betaken to select a probe which will give a sufficientlynarrow beam at the position of the flaw.


IntroductionImportant information on ultrasonic testing

Echo display comparison method

The echo from a small, natural flaw is usually smallerthan the echo from an artificial comparison flaw, e.g.circular disc flaw of the same size. This is due, for instance, to the roughness of the surface of a naturalflaw, or to the fact that the beam does not impinge on it at right angles.

If this fact is not taken into account when evaluatingnatural flaws, there is a danger of underestimating theirmagnitude.

In the case of very jagged or fissured flaws, e.g. shrinkholes in castings, it may be that the sound scatteringoccurring at the boundary surface of the flaw is sostrong that no echo at all is produced. In such cases, adifferent evaluation method should be chosen, e.g. useof the backwall echo attenuation in the evaluation.

The distance sensitivity of the flaw echo plays an im-portant part when testing large components. Attentionshould be paid here to choosing artificial comparisonflaws which are as far as possible governed by the same”distance laws” as the natural flaws to be evaluated.

The ultrasonic wave is attenuated in any material. Thissound attenuation is very low, e.g. in parts made of fine-grained steel, likewise in many small parts made ofother materials. However, if the sound wave travelslarger distances through the material, a high cumulativesound attenuation can result even with small attenuationcoefficients. There is then a danger that echoes from natural flaws appear too small. For this reason, an esti-mate must always be made of the effects of attenuation onthe evaluation result and taken into account if applicable.

If the test object has a rough surface, part of the incidentsound energy will be scattered at its surface and is not available for the test. The larger this initial scattering,the smaller the flaw echoes appear, and the more errors occur in the evaluation result.

It is therefore important to take the effect of the test object’s surfaces on the height of the echo into account(transfer correction).

A R DA R D

Introduction USM 33 family


1.3 USM 33 family

USM 33 is a lightweight and compact ultrasonic flaw detector especially suitable for

• locating and evaluating material defects;• measuring wall thicknesses;• saving and documenting test results.

With its frequency range from 0.5 to 20 MHz and amaximum calibration range of 10 m (steel), USM 33is designed for use on large workpieces and in high resolution measurements.

Different instrument versionsUSM 33 is available in several versions, designed for different applications:

• USM 33 LemoStandard version for probe connectors of Lemo type ;

• USM 33 BNCStandard version for probe connectors of BNC type;


IntroductionUSM 33 Family

Special features

• Low weight (1.8 kg including lithium-ion battery) and compact size;

• Waterproof instrument case with protection class IP 54;

• Long operating time (> 8 hours) by means of lithium -ion battery with internal and external charging possibility;

• Handy – equipped with a non-slip, ratcheting prop-up stand, also used as handle;

• Two independant gates for accurate wall thickness measurements from the workpiece surface up to the first echo, or between two backwall echoes, including measurement on coated workpieces with a resolution of 0.01 mm (up to 100 mm), referred to steel;

• Magnify gate: spreading of the gate range over the entire screen width;

• 5.7", 1/4 VGA-TFT color display to display the digitized signals (320 × 240 pixels, 115 × 86 mm );

• Color display of gates for an easier distinction;

• Easily recognizable reflection geometry when using angle-beam probes by the variation of A-scan or background color at every deflection point;

• Data memory: 200 data sets, and documentation possibility via a printer;

• Increased calibration range: up to 9999 mm (steel), depending on the frequency range;

• Semiautomatic two point calibration;

• Pulse repetition frequency variable in ten steps to avoid phantom echoes when testing large workpieces;

• Signal display mode: full-wave rectification, positive half-wave or negative halv-wave and radio frequency;

• Display of 4 readings plus 1 reading zoomed in the A-scan, user-configurable;

Introduction How to use this manual


1.4 How to use this manual

The present operating manual applies to all instrumentversions of the USM 33. Differences in the functionsor setting values are always marked.

Before operating the USM 33 for the first time, it isabsolutely necessary that you read the chapters 1, 3and 4 of this manual. They will inform you about thenecessary preparations of the instrument, give you adescription of all keys and screen displays, and explainthe operating principle.

In doing this, you will avoid any errors or failures of theinstrument and be able to use the full range of instrumentfunctions.

You will find the latest changes to this operating manualin chapter 10 Changes. It describes corrections thathave become necessary at short notice and have notyet been included in the general manual. If no correctionshave become necessary, this chapter is empty.

The specifications/Technical Specifications accordingto EN 12668-1 for the USM 33 family can be found inthe attachment at the end of this operating manual.

1.5 Layout and presentation inthis manual Listings are presented in the following form:

• Variant A• Variant B• ...


IntroductionLayout and presentation in this manual

To make it easier for you to use this manual, all operat-ing steps, notes, etc., are always presented in the same way. This will help you find individual pieces of informa-tion quickly.

Attention and Note symbols

The Attention symbol indicates peculiarities and specialaspects in the operation which could affect the accuracy of the results.

Note contains e.g. references to other chapters or special recommendations for a function.

Listings

Operating stepsOperating steps appear as shown in the following example:– Loosen the two screws at the bottom.– Remove the cover.– ...

Note:

Attention:!


Standard package and accessories 2

Standard package and accessories


This chapter informs you about the standard packageand the accessories available for the USM 33.

It describes

• accessories included in the standard package,

• recommended accessories.

Product code Description Order number

2.1 Standard package

USM33 Lemo Packages

EXA24

Compact Ultrasonic Flaw Detector, basic version 1007137 with Lemo-1-TRIAX connectors,

consisting of

USM 33 Lemo 1005962 Transport case 1003061 AC Power supplier/battery charger 1005922 Li-Ion battery 1003022 Shoulder bag 1003025 Manufacturer’s certifcate 1007141 User manual in English 1007127


Standard package and accessoriesStandard package



Standard package


USM33 BNC Packages

EXAZZ

Compact Ultrasonic Flaw Detector, basic version 1007138 with BNC connectors,

consisting of

USM 33 BNC 1005908 Transport case 1003061 AC Power supplier/battery charger 1005922 Li-Ion battery 1003022 Shoulder bag 1003025 Manufacturer’s certifcate 1007141 User manual in English 1007127



Standard package and accessoriesStandard package

EXA24 USM33 Lemo 1005962

EXAZZ USM33 BNC 1005908EXQCH Transport case 1003061EXQDK AC Power supplier/battery charger 1005922 or 150077EXQEM Li-Lion Battery 1003022EXQFO Shoulder Bag 1003025

Manufacturer’s certifcate 1007141 User manual in Chinese 1007126 User manual in English 1007127 Probe SAC 60-4 1008446



Standard package

Probe SAC 70-4 1008448 Remove the Probe SAC 45-4 etc 1006670


Probe SAC 60-2 1008447 Probe SAC 70-2 1008449 Probe cable(BNC to Lemo-00) 1006696 Probe cable(Lemo-1 to Lemo-00) 1006695

2.2 Recommended accessories


Standard package and accessoriesRecommended accessories


EXQDK AC Power supplier/battery charger 1005922 or 150077EXQEM Li-Lion Battery 1003022EXQFO Shoulder Bag 1003025UD 20 PC cable, 25-pin (PC), 9-pin (instrument) 32 291 UD 31 PC cable, 9-pin (PC), 9-pin (instrument) 34 943UD 30 Seiko Printer cable, 9-pin (instrument)/9-pin (printer) 18 495UD 32 Epson Printer cable, 9-pin (instrument)/25-pin (printer) 34 944 Adapter 25/9-pin for printer cable UD 19-1 on USM 35X 16 121 Serial-to-parallel printer cable (Patton Model 2029) 101 761 UM 200 W UltraDOC data communication software for USM 35 024U 100 W UltraDOC 33 829PZ-USM Calibration certificate according to EN 12668-1 35 263Epson LX Matrix printer for mains operation, single sheet and 17 995 continuous stationary Seiko DPU Thermal printer for mains and battery operation 17 993

Please refer to separately published probe catalog of GE Inspection Technologies for probe selection.

Note:


Initial start-up 3

A R DA R D

3.1 Power supply

Initial start-up Power supply


The USM 33 can be operated with an external powerpack adaptor or with batteries.

You can connect the USM 33 to the mains supplysystem even if it carries batteries. The battery power isthen automatically interrupted.

Operation using the power supply unitMains connectionThe power supply unit is delivered with two differentpower cables – for Euro and USA standard.

Connecting the instrument

– Connect the USM 33 to the mains socket-outlet usingthe corresponding power supply unit. The plug receptacleis at the top left of the USM 33.

– Push the Lemo plug of the power supply unit into theplug receptacle until it snaps into place with a clearlyaudible click.


Initial start-upPower supply

– When pulling off the Lemo plug, withdraw the metalbushing on the plug first in order to release the lock.

The power supply unit is automatically set to any nom-inal voltage between 90 VAC and 240 VAC.

Operation using batteriesUse only a lithium battery. It has a high capacity and consequently ensures a longer operating time of the instrument.

Inserting batteries

The battery compartment is situated at the instrumentback; the lid is fastened with 2 attachment screws.

– Loosen the two attachment screws of the batterycompartment;

– Lift the lid off upward;

– Insert the battery into the battery compartment;

– Close the battery compartment and fasten theattachment screws.



Checking the battery charger of lithium-ion batteries

The lithium-ion battery is equipped with a battery chargeindicator. The battery charge indicator is situated at the front right of the battery. Four LEDs indicate the charge level of battery. Check the battery charge before insert-ing the battery into the instrument.

The number of LEDs that are on has the followingmeaning:

• 4 LED’s – battery charge 100 76%• 3 LED’s – battery charge 75 51%• 2 LED’s – battery charge 50 26%• 1 LED – battery charge 25 10%• 1 LED flashing – battery charge <10%

You can also check the battery charge even if the batteryis located in the battery compartment of the instrument.

Battery charge indicatorIn the measurement line of the USM 33, a appears if the battery charge is low.

If the icon for low battery charge appears, you shouldurgently close your test job and exchange the batteries.You should take replacement batteries with you if youaim to carry out measurements on site.

Note:

Note:


Initial start-upPower supply

Charging the batteriesYou can charge the lithium-ion battery either directly inthe instrument or by means of an external batterycharger.

Internal charging

If a battery is located in the instrument, the chargingprocess is started automatically when you connect theplug-in power supply unit. You can carry out ultrasonicinspections and charge a battery at the same time.

The charging time is 10 hours with a simultaneous ultra-sonic inspection. If the instrument is not being usedfor ultrasonic inspections, the charging time is 8 hours.This charging time applies to ambient temperaturesfrom 25 to 30 °C. Please take into consideration thatthe batteries are not charged to their full capacity athigher temperatures.

The LED display on the plug-in power supply unit indi-cates the status of the charging process.

Requirement:• Lithium-ion battery, order number 1003022• Power supply/charger unit, order number 1005922or 150077

green LED yellow LED red LED Status



off flashing off no battery detected

off flashing dark/bright flashing bright/dark charging at low power

off on off quick charging phase 1

flashing dark/bright flashing bright/dark off quick charging phase 2

on off off battery charged

off off flashing bright/dark temperature error, auto-reversible

off off on charging error, permanent

A R DA R D

3.2 Connecting a probe

Receiver Transducer


Initial start-upConnecting a probe

To prepare the USM 33 for operation, you have to con-nect a probe to it. Any Krautkramer probe can be usedfor the USM 33, provided the appropriate cable is avai-lable and the operating frequency is within an adequaterange.

The USM 33 is available with the probe connectorsLEMO-1-TRIAX or BNC.

The probe is connected to the sockets at the top righton the instrument casing. Both connector sockets areequally suitable (connected in parallel) for connectingprobes equipped with only one ultrasonic element (ultra-sonic transducer) so that it does not matter which oneof the two sockets is used.

When connecting a dual-element (TR) probe (havingone transmitter element and one receiver element), ortwo probes (of which one is transmitting and the otherone receiving), attention should be paid to connectingthe transmitter element to the right-hand socket (trans-mitter, marked with black circle at the rear of the instr-umentcase) and the receiver element to the left-hand socket (receiver, marked with red circle).

If this is not taken into account, the consequence would be a mismatching which may lead to considerable powerlosses or even to echo waveform distortions.

Attention:!

3.3 Starting the USM 33

Initial start-up Starting the USM33


Switching onTo start the USM 33, press the switch-on key .

The start display of the USM 33 appears; here you willalso see the current software version of the instrument.The instrument carries out a self-check and then switchesover to stand-by mode.

The settings of all function values and the basic settings(language and units) are the same as when the instr-ument was last switched off.

Reset

Information lines in the startup screen

If any functions can no longer be operated after a warmstart, or if you want to reset the instrument to the basicsetup, then you should carry out a cold start by simulta-neously pressing the and one of the keys(gain setting key which lies to the top-left of the screen).

The cold start message “Basic Initialization” is displayed.The instrument is initialized and reset to its basic setup (dialog language: English, for more details on how to select the language, please refer to chapter 4).

All saved data are deleted.

You can enter two lines (each with up to 39 characters)for information purposes in the startup screen. For thisuse the remote function (codes I1 and I2, refer to chapter 8).

Attention:!


Principles of operation 4

4 .1 Operator’s controls

A R DA R D

Keys for selecting a function group

A: Gate alarmR: Reserved (for future use)D: Dual on Keys for selecting

a function

On/Off keyKey for changingthe operation level

Direct gain settingGain step setting

Principles of operation Operator’s controls


4.2 Screen display


Principles of operationScreen Display

The USM 33 has a digital screen for the display of

• A-scan in the normal mode

• A-scan in the zoom mode

The zoom mode is activated in the 5th menu line (TestMenu) that can be accessed with a long press on theMenu Change key.

The screen display always shows the gain and the ad-justed dB step value. All other functions are locked inzoom mode.

A press on any key below the screen (function group selection) will unzoom the screen.

Note:

SKIPCLR ZOOM COPY FREZ

Principles of operation Screen display


Functions on the displayThe names of the five function groups are displayed atthe bottom of the screen. The currently selected functiongroup is highlighted.

Indicated at the right of the display, next to the A-scan,are the functions of the corresponding function group.The display of the functions disappears in the zoommode.

Other displaysThe measurement line below the screen display showsvalues of settings, measured values, and status indica-tions. As an alternative, a scale can be shown here,giving an overview of the echo positions.

Every measurement value can also be shown in anenlarged display at the top right corner of the A-scan(setting in the function group MEAS, function S-DISP).

You can configure the four positions of the measurementline for set and measured values as required(function group MSEL).

A GateAmplitude height(%)

A GateSound path

B GateSound path

Freeze

BatteryCapacity

B GateAmplitude height(%)


Principles of operationScreen Display

Note:

Note:

4 .3 Keys

Gain setting or gain step setting. Press left and right arrow simultaneously to toggle.

Principles of operation Keys


For changing between operation levels

A R DA R DFor selection of the function groups

Left

Right

Power on/off

Function parameter setting. Press left and right arrow simultaneously to toggle coarse and fine adjustment.

4.4 Operating concept


Principles of operationOperating concept

USM 33 is an easy-to-use instrument. It has five operating levels, and you can change between them by pressingkey.

First operating level

Second operating level

Third operating level

Fourth operating level

Fifth operating level

You will recognize your currently active operating levelby the number on the separation line between the first and the second function group.

Long pressing key will change to the fifth level.

Note:

FREZbGATaGATPULSBASE FREbGATaGATPULSBASE

FREZDACTRIGMEM FREZTRIGMEM CAL

FREZLCD FREZMEAS MSEL LOG1 LOG2

FREZMEM FREZLCD CFG1 CFG2

FREZCOPYSKIPCLR FREZCOPYZOOMCLR

Principles of operation Operating concept


Setting the functions The following functions offer a choice between coarseand fine adjustment:

Shown below the A-scan are five function groups thatyou can directly select using the corresponding key.

The selected function group is highlighted and the cor-responding four functions are displayed next to the A-scan on the right.

You can likewise directly select the individual functions using the corresponding keys.

Functions with double assignments

Coarse and fine adjustment of functions

Some functions have double assignments. You will re-cognize the functions with double assignments by anarrow (icon >) after the function name.

You can choose between coarse and fine adjustmentfor some functions. You can toggle between these twoadjustment modes by pressing the left and right arrow of corresponding key. The fine adjustment is identifiedby an asterisk preceding the function value.

Function Function GroupRANGE BASEMTLVEL BASED-DELAY BASEaSTART aGATaWIDTH aGATbWIDTH bGATS-REF1 CALS-REF2 CALANGLE TRIGTHICKNE TRIGDIAMET TRIG


Principles of operationImportant basic settings

4.5 Important basic settings

Selecting the languageSelect the language in which the function names shouldbe displayed on the screen in the function DIALOG(Function group CFG1). English and Chinese languages are available.

Selecting unitsIn the function UNIT (function group CFG1) you canchoose your favorite units between mm or inch.

Select your units immediately when you start working with the USM 33 because if you change the unit, all the current settings are deleted, and the basic setup is loaded again.

In order not to delete anything by accident, a safetyprompt is displayed in the measurement line.

– If you are sure that you want to change the unit, press the key belonging to the function UNIT one more time.The unit is now changed, the current data are deleted.

– If you want to abort the process, press any other key. The previous setting is kept in that case.

Setting the dateThe date is saved together with the test results. Youcan set it in the function DATE (function group CFG2).Select right keys to select Year/Month/Date, whileselect left keys to adjust related value.

Please take into account that the USM 33 only indicatesthe year with two digits.

Setting the timeThe function TIME (function group CFG2) serves forsetting the current hour of time. It is saved together with the test results. Select right keys to select Hour/Minute/Second, while select left keys to adjust rela-ted value.

You should always make sure that you are using thecorrect time settings. Test results may otherwise befalsified.

Attention:!

Attention:!

Attention:!

Principles of operation Basic settings of the display


4.6 Basic settings of the display

The equipment of the USM 33 includes a high-resolutioncolor display. You can optimize the display settings to your individual viewing habits and to the operational environment.

Selecting the color schemeYou can use the function SCHEME (function group LCD)to choose one of four color schemes. The color scheme determines the color of all displays and that of the back-ground. You cannot vary the colors of gates because they are fixed as follows:

• Gate A – red• Gate B – green

All color schemes are suitable for indoor use. For out-door use, we recommend the color schemes 3 and 4.

Setting the lighting

Use the function LIGHT (function group LCD) to set thedisplay lighting. You can choose between the defaultlighting max. and a lighting in the economy mode min..

Note:

The economy mode reduces the current consumptionand consequently increases the operating time in batteryoperation.

Note:

Krautkramer USM33 Issue 01,01/2007 5-1

Operation 5

Krautkramer USM 33Issue 01, 01/2007

Operation Overview of the functions

5.1 Overview of the functions

The functions of the USM 33 are combined to formfunction groups on five operating levels. There is an additional fifth operation level for the Data Logger.

– Press the key to change between the operating level 1~4;– Press the key longer for operating level 5;– Press the key to select the function group shown above it;– Press the key on the right side to select the function shown next to it;–The Gain function is always directly available via left key;

You will also find an overview of the function groupsand their functions on the fold-out page.

Each operating level contains five function groups.

You will recognize your currently active operatinglevel by the number on the separation line betweenthe first and the second function group.

First operating level

FREZbGATaGATPULSBASE FREZbGATaGATPULSBASE

Second operating level

FREZDACTRIGMEM FREZTRIGMEM

Third operating level

FREZLCD FREZMEAS

Fifth operating level

FREZCOPYSKIPCLR FREZCOPY

Fourth operating level

FREZMEM FREZ

2

3

4

5

1

MSEL LOG1 LOG2

LCD CFG1 CFG2

ZOOM

CFG2

CLR

5-2

Overview of the functions Operation

Function groups first operating levelBASE The functions that find here are required for the basic adjustment of the screen displays.

PULS Combined in this group are the functions that serve for the adjustment of pulser and receiver.

aGAT All functions for setting the gate A can be found in this group.

bGAT All functions for setting the gate B can be found in this group.

FREZ Whenever you select this function, the display automatically freezes.(Also available in function groups 2~5)

Function groups second operating levelMEM These functions serve for storing, loading and deleting of data sets.

CAL This function group makes functions for the semi-automatic calibration available to you.

TRIG Combined in this group are the functions required for angle beaming using angle beam probes for the display of a (reduced) projection distance and depth position of a reflector (for plane-parallel and circular curved test components).

DAC This is the function group where you can set the functions for the DAC.



Operation Overview of the functions

Function groups third operating levelMEAS In this group, you can define the measuring point, select a parameter for the zoomed m- easured value display in the A-scan as well as for the setting of the Magnify function, and you can select different settings for the A-scan.

MSEL This is where you configure your measurement line. You can choose one display for each of the four positions.

LOG1 These functions serve for setting the data logger.

LOG2 These functions serve for creating or deleting data logger data.

Function groups fourth operating levelLCD This is the function group where you can set the LCD contrast, color scheme, backlight and measurement line values.

CFG1 Functions for the configuration: dialog language, printer driver and assignment of the copy mode.

CFG2 Functions for the configuration: date, time, alarm horn and unit.

5-4

Overview of the functions Operation

Function groups fifth operating level


CLR The measurement value will be deleted at the actual location which is defined with

ROW and COLUMN.

SKIP The measurement value will be marked as skipped at the actual location which is defined with ROW and COLUMN.

ZOOM The A-scan display can be zoomed in full screen.

COPY The measurement value will be stored at the actual location which is defined with ROW and COLUMN.

You can use the left-hand to select a specfic in-crement for setting the gain. (For steps setting press the simultaneously, then adjust as required.)

You have a choice between 6 steps:

• 0.0 dB (locked)• 0.5 dB• 1.0 dB• 2.0 dB• 6.0 dB• 12 dB

5.2 Setting the gain

This function, operated via the left-hand ,en-ables you to quickly and directly set the gain.

You can use the gain to adjust the required sensitivityin order to control the echo amplitudes.

– Press left-hand to set the gain. The currentgain is indicated in the top left corner of the screen.


Operation Setting the gain

Defining the dB incrementation for gain

The setting 0.0 dB locks the gain in this way preventingany accidental change of setting.

5-6

Note:

Adjusting the display range(function group BASE) Operation

(function group BASE)

The function group BASE enables you to make thebasic adjustment of the display range.

The display on the screen must be adjusted for thematerial to be tested (function MTLVEL) and for theprobe used (function P-DELAY).

– If required, go to the first operating level via .

– Select the function group BASE.

In order to accurately adjust the material velocity andthe probe delay, please read the section “Calibratingthe USM 33”, chapter 5.7, beforehand.

You can adjust the range for your measurement inRANGE.

• Coarse adjustment: from 0.5 mm ... 1400 (9999) mm in even steps

• Fine adjustment: up to 9.99 mm in steps of 0.01 mm up to 99.9 mm in steps of 0.1 mm up to 999 mm in steps of 1 mm up to 9999mm in steps of 10 mm

RANGE (Display range)


5.3 Adjusting the display range Note:

Always ensure that the function MTLVEL is correctlyset. The USM 33 calculates all range and distanceindications on the basis of the value adjusted here.

– Select the function MTLVEL.– If required, toggle between coarse and fine adjust-ment.– Adjust the required value by means of the right-hand .

D-DELAY (Display starting point)

Use MTLVEL to set the sound velocity within the test object. You can use sound velocities between1000 and 15000 m/s.

• Coarse adjustment, in steps as follows (m/s): 15000 7000 3000 14000 6320 2730 13000 6000 2000 12000 5920 1600 11000 5000 1450 10000 4000 1000 9000 3250 8000 3130

• Fine adjustment: press beside MTLVEL simultaneously: 1000 ... 15000 in steps of 1 m/s

– If required, press the next to it simultaneously to adjust between coarse and fine adjustment.

– Adjust the required value by means of key next to it.


Operation Adjusting the display range(function group BASE)

MTLVEL (Sound velocity)

5-8

Here you can choose whether to display the adjustedrange (for example 250 mm) starting from the surfaceof the test object, or in a section of the test objectstarting at a later point. This allows you to shift thecomplete screen display and consequently also thedisplay starting point.

Attention:!

Adjusting the display range(function group BASE) Operation

If the display should for example start from thesurface of the test object, the value in D-DELAY mustbe set to 0. Every probe has a delay line between the transducer

element and the coupling face. This means that theinitial pulse must firstly pass through this delay line beforethe sound wave can enter the test object. You cancompensate for this influence of the delay line in thefunction P-DELAY.

If the value for P-DELAY is not known, read the section“Calibrating the USM 33”, chapter 5.7, in order to determinethis value.


P-DELAY (Probe delay)

• Coarse adjustment -10 mm ... 1024 mm in even steps

• Fine adjustment up to 99.9 mm/9.999" in steps of 0.01 mm up to 1024 mm/10" in steps of 0.1 mm

– Select the function D-DELAY.– If required, toggle between coarse and fine adjustment.

– Adjust the value for the display starting point by pressing next to it.

– Select the function P-DELAY.

– Adjust the value for the probe delay by pressing next to it.

Note:

– Select the function DAMPING.– Set the required value by means of the right-hand .

This function serves for matching the probe. You canuse it to adjust the damping of the probe’s oscillatingcircuit and to consequently change the height, widthand resolution of the echo display.


Operation Adjusting the pulser(function group PULS)

You will find all functions for the adjustment of thepulser in the function group PULS.

5.4 Adjusting the pulser (function group PULS)

RECTIFY

full-w

DUALoff

POWER

low

DAMPINGlow

RECTIFY

full-w

DUALoff

POWER

low

DAMPINGlow

DAMPING (Probe matching)

5-10

• low This setting has a lower damping effect and produces higher and broader echoes.

• high This setting reduces the echo height but mostly also produces narrow echoes with higher resolution.

– If required, go to the first operating level.

– Select the function group PULS.

– Select the function POWER.– Set the required value by means of the right hand

.

You can use the function DUAL to activate the pulserreceiver separation.

• off Single-element operation; the probe connection sockets are connected in parallel.

• onDual mode for the use with dual-element (TR) probes;

the left-hand socket (red) is connected with the amplifier input whereas the initial pulse is available at

the right-hand socket (black).

– Select the function DUAL.

– Set the required value by means of the right hand .

If the DUAL function is active, the LED D (dual) is on.

Adjusting the pulser(function group PULS) Operation

Use the function POWER to set the pulser voltage. Youcan choose between two settings:

The setting high is recommended for all inspectionsinwhich maximum sensitivity is important, e.g. for thedetection of small flaws. Choose the setting low forbroadband probes or if narrow echoes are required(better lateral resolution).

POWER (Intensity) DUAL (Pulser-receiver separation)


• high – high voltage• low – low voltage

You can select the rectification mode of the echopulses according to your application in the function RECTIFY.


Operation Setting the gates(function groups aGAT and bGAT)

All functions for setting the (dual) gate are arrangedin the function group aGAT and bGAT.– If required, go to the first operating level.

– Select the function group aGAT or bGAT via .

5.5 Setting the gates (function groups aGAT and bGAT)

RECTIFY(Rectification)

You have the following options to choose from:

• full-w (= full-wave) All half-waves are displayed above the baseline.

• pos hw (= positive half-wave) Only positive half-waves are displayed.

• neg hw (= negative half-wave) Only negative half-waves are displayed.

• rf (= radio frequency) Only applies to the display range up to 50 mm (steel).

– Select the function RECTIFY.– Set the required value by means of the right hand .

5-12

Operation

Tasks of the gates

• It monitors the range of the test object where youexpect to detect a flaw. If an echo exceeds or fallsbelow the gate, an alarm signal is output via the LED A.

• The gates A and B are independent of one another.

• The gate chooses the echo for the digital time-offflight(TOF) or amplitude measurement. The measured value is indicated in the measurement line(or S-Disp if selected).

Error alarms can be triggered under certain circumstances.These are caused by intermediate conditions in instrumentoperation occurring when the instrument is used, i.e.when function parameters are changed. Possible alarmsoccurring during instrument operation(setting of functions)are to be ignored.

To make the assignment easier, the gates are displayedin different colors. You cannot vary the colors of gatesbecause they are fixed as follows:

Display of gates

aLOGIC/bLOGIC (Evaluation logic of thegates)

• off – Evaluation logic off The alarm and measurement capability are switched off. The gate is not visible.• pos – Coincidence The alarm (LED A) is on if the preset response thresholdof the gate is exceeded within the displayed range(A

signal reaches the gate threshhold).• neg – Anticoincidence The alarm (LED A) is on if the preset response threshold of the gate is not reached within the displayed range(A signal falls below the gate threshhold).


Setting the gates(function groups aGAT and bGAT)

• Gate A – red • Gate B – green

This function allows you to choose the method for trigger-ing the gate alarm.The alarm is output to the LED A on the front panel of the USM 33. There are three setting options available:

Note:

aSTART/bSTART (Starting points of thegates)

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Operation

aWIDTH/bWIDTH (Width of the gates)

aTHRSH/bTHRSH (Response and measur-ement threshold of the gates)

Setting the gates(function groups aGAT and bGAT)

– Select the function aSTART or bSTART.– Set the required value by means of the right hand .

You can fix the starting point of the gates A or B within the adjustment range of 0 ... 9999 mm/250".

You can determine the gate width within the range of0.2 ... 9999 mm/0.008 ... 250".

– Select the function aWIDTH or bWIDTH.– Set the required value by means of the right hand .

You can determine the threshold value of the gateswithin the range of 5% to 90 % screen height for trig-gering the LED alarm if this value is exceeded or notreached, depending on the setting of the aLOGIC/bLOGIC function.

In the RF mode, the threshold can be additionally setfrom –90 % to 90%.

– Select the function aTHRSH or bTHRSH.– Set the required value by means of the right hand .

Operation

5.6 Data saving (function group MEM)

You will find all functions for storing, recalling anddeleting complete data sets in the function groupMEM.

A data set contains all instrument settings as well asthe A-scan. This means that whenever you recall astored data set, your instrument is again set up exactlythe same as it was at the moment when the data setwas stored. This makes each one of your tests repro-ducible.

You will find the following functions:

SET-# selecting number of a data set

RECALL recalling a stored data set

STORE storing a data set

DELETE deleting a data set

The functions are described in the order in which youneed them during your work.


Data saving(function group MEM)

– If required, go to the second operating level.

– Select the function group MEM.

– Select the function SET-#.

– Select the function STORE.– Use the right-hand to set it to on.

You can save your current setup to a data set.

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Operation Data saving(function group MEM)

Note:

Storing a data set

The asterisk (*) before a selected data set numberindicates that this data set is already occupied. It isnot possible to overwrite an occupied data set; selectanother data set which is still empty, or delete theoccupied data set. To avoid loss of data e.g. in caseof a software update you should save the data setsto a PC.

An occupied data set is marked with an asterisk (*)before the data set number. You can delete these datasets if you no longer need them.


Deleting a data set

The USM 33 stores the current data set. When thestorage process is completed, the function STOREis automatically reset to off.

All active entries in the information table are automatically allocated to the data set being stored (see Chapter5.14 Dataset management).

The data set is now deleted; the asterisk precedingthe data set number is no longer there. The functionDELETE is automatically reset to off.

– Use the right-hand to set the number where you would want to store the current data set(1 to 200).

– Use the right-hand to set the number of the data set that you want to delete.– Select the function DELETE.– Use the right-hand to set it to on. The measurement line will then prompt: Delete data set?– Confirm by pressing the corresponding key one more time (all other keys would abort the process).

– Use the right hand to set it to on. The me-asurement line will then prompt: Delete all data sets?

– Confirm by pressing the corresponding key one more time (all other keys would abort the process).

Press the corresponding key repeatedly to togglebetween functions via pressing simultaneously.

Data saving (function group MEM) Operation

You can delete all data sets if you no longer need them.

You can recall a stored data set; your instrument willthen be provided with all the test relevant technicalfeatures that existed at the moment of the setup. Afrozen display of the stored A-scan appears.

If a saved data set is loaded, the current instrumentsetup is lost. If necessary, save the current instrumentsetup to a new data set before loading a saved data set.


Note:Double assignment of the function DELETE/DELALL.

Deleting all data set

Recalling a stored data set– Select the function DELETE.


All data sets are now deleted. The function DELETE isautomatically reset to off.

Attention:!

– Use the right-hand to set the number of the data set that you want to recall.

– Select the function RECALL.

– Use the right-hand to set it to on. The measurement line will then prompt: Recall data set?

18-5 Krautkramer USM 33Issue 01, 01/2007

Operation Data saving (function group MEM)

The gate for surveying the echo can be moved in therecalled A-scan. However, as the evaluation is madein the frozen A-scan, the measurement resolution isonly 0.5 % of the adjusted calibration range.

– Confirm by pressing the corresponding key one more time (all other keys would abort the process).

The data set is now loaded and the current setup isoverwritten. When the loading process is completed, the function RECALL is automatically reset to off.

Note:

Operation

Calibrating the display range

Before working with the USM 33, you have to calibratethe instrument: you have to adjust the material velocityand display range and allow for the probe delay depe-nding on the material and dimensions of the test object.

The sound path measurement in the calibration processor in the subsequent echo evaluation process depends on the choice of the measuring point which can be seteither to flank, or to peak in the USM 33.

In principle, the peak measurement should be preferredbecause the measured distances do not depend on theecho height in that case. However, there are applica-tion cases in which the flank measurement is either specified,or it must be applied for technical reasons,e.g. in many tests using dual-element (TR) probes.

Choosing the measuring point

In any case, the setting of the measuring point mustalways be identical for the calibration and for thesubsequent test application. Otherwise measurementerrors might occur.


Calibrating the USM 33

5.7 Calibrating the USM 33

To ensure a safe and proper operation of the USM33, it is necessary that the operator be adequately trained in the field of ultrasonic testing technology.

Below you will find some examples of common calibr-ation methods for certain test tasks. In addition, theUSM 33 has a semi-automatic calibration function whichis described as Case B: With unknown material velocity.

Attention:!


Calibration with straight- and angle-beam probes

Case A: With known material velocityCalibration process

You are carrying out the calibration for the calibrationrange of 100 mm/5" via the function group BASEusing the calibration block V1 (thickness 25 mm/1")which is laid flatwise.

Example:

Operation Calibrating the USM 33

– Set the known material velocity in MTLVEL (function group BASE).– Couple the probe to the calibration block.

– Set the required display range in RANGE (functiongroup BASE). The calibration echo must be disp-layed on the screen.

– Position the gate on one of the calibration echoes until the sound path of the echo is indicated in the measurement line.

– After this, change the adjustment of the function P-DELAY (function group BASE) until the correct sound path for the selected calibration echo is indicated in the measurement line.

– Set the known material velocity of 5920 m/s(233"/ms) in MTLVEL.

– Set the gate so that it is positioned on the first calibration echo (from 25 mm/1").

– Read the sound path in the measurement line. If this value is not equal to 25 mm/1", change the adjustment for the function P-DELAY until it is at 25 mm/1".

– Set RANGE to 100 mm/5".

This completes the calibration of the USM 33 to the material velocity of 5920 m/s (233 "/ms) with a calibration range of 100 mm/5" for the probe used.

Dual-element (TR) probes are especially used for wallthickness measurement. The following peculiaritiesmust be taken into account when using these probes:

Echo flank

Most dual-element (TR) probes have a roof angle(transducer elements with inclined orientation towardthe test surface). This causes mode conversions bothat beam index (sound entry into the material) and atthe reflection from the backwall, which can result invery jagged echoes.

V-path error

Dual-element (TR) probes produce a v-shaped soundpath from the pulser via the reflection from the backwallto the receiver element. This so-called “V-path error”affects the measuring accuracy. You should thereforechoose two wall thicknesses that cover the expectedthickness measurement range for the calibration. Inthis way, the V-path error can be corrected to the greatestpossible extent.

Calibration with dual-element (TR) probesDue to the V-path error, a higher material velocity thanthat of the test material is given during calibration, especially with small thicknesses. This is typical of dualelement (TR) probes and serves for compensation ofthe V-path error.

With small wall thicknesses, the above-described effectleads to an echo amplitude drop which has to beespecially taken into account with thicknesses lessthan 2 mm/0.08".

A stepped reference block having different wallthicknesses is required for calibration. The wallthicknesses must be selected so that they cover theexpected readings.

Calibration process:

We recommend to use the semiautomatic calibrationfunction for the calibration with T/R probes.

– Set the required test range.


Higher material velocity


– Increase the probe delay (P-DELAY) until the two calibration lines are displayed within the range.


Example:

– Enter the distances (thicknesses) of the two calib-ration lines S-REF1 (20 mm) and S-REF2 (40 mm).

– Press to record the first calibration echo.

– Position the gate on the second calibration echo:

– Press to record the second calibration echo.

The second echo is stored, the calibration is carriedout, and the CAL function is reset to 0. The valid


– Position the gate on the first calibration echo.calibration is briefly confirmed and carried out.

If you select the function group BASE, you can readthe material velocity and probe delay.

– Set the pulser and receiver functions according to the probe used and the test application.– Set the function TOF (function group MEAS) to flank.– Vary the gain so that the highest echo reaches appr-

oximately the full screen height.– Set the gate threshold to the required height for measuring the sound paths at the echo flanks. – Select the function group CAL.

– Enter the distances of the two calibration echoes inS-REF1 and S-REF2.

– Position the gate (function aSTART) on the first calibration echo.

– Press to record the first calibration echo.

– Couple the probe to the calibration block containing the second calibration line, and set the height so that it’s about as high as the first calibration echo.

– Move the gate to the second calibration echo.

– Press to record the second calibration echo. Thecorrect calibration is confirmed by the message“Calibration is done”. The material velocity and

probe delay are set. The value of the CAL function goes back to 0.

– If necessary, check the calibration on one or several known calibration lines, e.g. using the stepped reference block VW.

Always keep in mind that the measured value is det-ermined at the intersection point of gate and echoflank when the function TOF was set to flank.

A correct setting of the echo height and gate threshold is therefore decisive for accurate calibration and meas-urement!

Calibrations or measurements in the peak mode are mostly not possible when using dual-element (TR) pr-obes. As the echoes are often very broad and jagged,a clear echo peak cannot always be found in these cases.



Note:


5.8 Measuring

General notesPlease pay attention to the following notes whenmeasuring with the USM 33.

• Condition for measurements is the correct instrument calibration (sound velocity, probe delay). • All amplitude measurements are carried out at the highest or the first signal in the gate.

• All distance measurements are carried out at the intersection point of gate and the first echo flank (TOF = flank), or at the peak of the highest echo (TOF = peak).

• If the echo amplitudes do not exceed 5 % screen height all sound path and amplitude measurements will be suppressed. Thus, rapidly changing random measurements caused by the instrument’s background noise are avoided.

The following example shows the dependency ofdistance measurement on the echo waveform, i.e.on the height of the gate threshold and thus on theselection of the intersection point at the signal.

The point of amplitude measurement is marked with asmall upward triangle on the corresponding gate bar.The point of distance measurement is marked with asmall downward triangle.

Gate threshold at 20 %measured sound path: 24.44 mm

Gate threshold at 80 %measured sound path: 24.91

Operation Measuring

The functions in the group TRIG enable to automatical-ly calculate the (reduced) projection distance and the real depth of the flaw in addition to the sound path S, and to digitally display them in the measurement line.

• Projection distance PD: Distance of probe index (sound exit point) from the position of the flaw, projected on the surface

• Reduced projection distance rPD:Distance of the probe’s leading face from the position

of the flaw, projected on the surface

• Depth d: Distance between flaw position and surface

5.9 Calculation of flaw position

In the function group TRIG you will find the functions for setting the flaw position calculation when usingangle beam probes.

Double assignment of the function X-VALU/COLOR.Toggle between the two functions by pressing simultaneously.

(function group TRIG)


Operation Calculation of flaw position

– If required, go to the second operating level.

– Select the function group TRIG.

Note:


When using angle-beam probes, the instrument canadditionally calculate the sound path section or so-called leg L up to the next reflection point. This soundpath section or leg can be displayed as the measuredvalue La, Lb.

The ANGLE function enables you to adjust the angleof incidence of your probe for the material used. Thisvalue is required for the automatic calculation of theflaw position.

Adjustment range: 0° ... 90°

ANGLE (Angle of incidence)

The function X-VALUE enables you to set the X-value(distance between the probe’s leading face and probe index/sound exit point) of the probe used. This value is required for the automatic calculation of the reduced projection distance.

Adjustment range: 0 ... 100 mm/0 ... 40"

– Select the function X-VALUE.– Use right hand to set the required value.

X-VALUE (X-value of the probe)

Operation Calculation of flaw position

– Select the ANGLE function.– Use right hand to set the required value.

You will need the DIAMET function for tests on circularcurved surfaces, for example when testing longitudinallywelded tubes. In order to make the USM 33 carry outthe corresponding correction of (reduced) projectiondistance and depth, you should enter the outsidediameter of your test object in this function.

If you planto carry out the flaw position calculation for plane parallel (flat) test objects, the DIAMET function should be set to flat.

Adjustment range:

• 10 ... 2000 mm/0.4 ... 800"• flat

– Select the DIAMET function.

– Use the to set the required value. Also toggle between coarse and fine adjustment via pressing simultaneously.

During fine adjusting, you can find the symbol in front of the no.

Use the THICKNE function to set the material’s wallthickness. This value is required for the automaticcalculation of the real depth.

Adjustment range: 1 ... 1000 mm/0.05 ... 400“

– Select the THICKNE function.– Use the to set the required value.

To make the orientation easier, the instrument is ableto display the different sound path sections or legs indifferent ways. You can choose between two displaymodes:

• 1 – The A-scan is shown in another color in every leg. – Leg 1 in magenta – Leg 2 in blue• 2 – The legs are shown as background shadings.• off – No legs are displayed.

– Select the function COLOR.– Use the to set the required mode.

COLOR

THICKNE (Material thickness)

DIAMET (Outside diameter of the test object)


OperationCalculation of flaw position


Besides the default settings for the instrument operation,you have to configure the USM 33 for calibration and test tasks. You will find the corresponding functions in the function groups MEAS, MSEL ,LOG1, LOG2 and FREZ.

In addition, you have to check the current time anddate, and set them if required, so that they arecorrectly stored together with the test results. Pleaselook up the function groups CFG1 and CFG2 for morefunctions for the general instrument setup.

– If required, go to the third operating level.

– Select the function group MEAS.

5.10 Configuring the USM 33 for a test application

TOF (Selecting the measuring point)The sound path measurement in the calibration processor in the subsequent echo evaluation process dependson the selected measuring point which can be adjustedeither to flank, to peak in the USM33.

The point of amplitude measurement is marked by asmall upward triangle on the corresponding gate bar.The point of distance measurement is marked by asmall downward triangle.

While DAC is active you can change the TOF modefrom peak to flank.

Operation Configuring the USM 33 for a test application

Note:

When adjusted to flank the sound path measurementis made at the point of intersection of the monitor gatewith the rising flank of the highest echo in the gate.

measured sound path: 19,44 mmamplitude: 94 %

The highest echo in the gate does not have to be theecho for which the sound path has been measured.This may lead to false echo evaluation!

In order to identify the points of measurement and toavoid misinterpretation two indicators were introducedper gate: The first triangle pointing downwards indicatesthe position of the measured sound path (distance), whereas the triangle pointing upwards marks the positionof the measured amplitude.

In TOF mode peak the sound path and amplitudemeasurement is made at the maximum of the highestecho in the gate.

measured sound path: 19,65 mmamplitude: 95 %


OperationConfiguring the USM 33 for a test application

Attention:!

In any case, the adjustment of the measuring pointfor calibration and for the subsequent test use mustalways be identical. Otherwise measurement errorsmay occur.

– Select the TOF function.

– Use the to select the required setting.


In principle, the peak measurement should be prefe-rred because the measured distances do not dependon the echo height in that case. However, there areapplication cases in which the flank measurement iseither specified, or it must be applied for technicalreasons, e.g. in many tests using dual-element (TR)probes.

You can have a selected reading zoomed in the A-scan display. The following readings can be selectedfor the zoomed display (in the second column theindication of the readings in the measurement line):

S-DISP (Zoomed display of reading)

Sa Sa Sound path for gate ASb Sb Sound path for gate BSb-a ba Difference of single measurements for sound path gate B – gate AHa % Ha Echo height gate A in % screen heightHb % Hb Echo height gate B in % screen heightHa dB ha Echo height gate A in dBHb dB hb Echo height gate B in dBR-start Rs Range startR-end Re Range endLa La Number of legs in gate ALb Lb Number of legs in gate B


5-30

Attention:!

Da Da Depth for gate ADb Db Depth for gate BPa Pa Projection distance for gate APb Pb Projection distance for gate BRa Ra Reduced projection distance for gate ARb Rb Reduced projection distance for gate B

Only for flaw position calculation:

If the selected Ha db Hb db does not display, the TOFmust be PEAK.

A-Scan (Setting the A-scan)This function offers you several options for setting your A-scan.

• stndardNormal A-scan setting. The key effects a static freeze.

• envelop (echo dynamics) The echo envelope is shown as a dotted line additio-nally to the A-scan.



Only for DAC:

Ha %crv Ca Echo height gate A in % referred to curveHb %crv Cb Echo height gate B in % referred to curveDAC dB dB dB-value by which the DAC gain has been changed related to the reference gain(=instrument gain for the DAC echo on 80% screen height)

- Selection the function S-DISP.- Use the right hand to select the required value for the zoomed display.

MAGNIFY (Gate spreading)The setting of the MAGNIFY function causes a spr-eading of the gate over the entire display width. You can choose the gate to be used for the magnify fun-ction.- Select the function NIFY.- Use the right hand to set the function to aGATE or bGATE if you want to spread the range of gate A or B over the entire display range.

Note:


The configuration of your measurement line is carriedout in the function group MSEL , this means that youcan choose the reading for one of the four possiblepositions of the measurement line for active measuredvalues to be displayed during the test.

– If required, go to the third operating level.

– Select the function group MSEL.

Configuring the measurement line

Functions of the function group MSEL:

MEAS-P1 MEAS-P2 MEAS-P3 MEAS-P4Measured values at positions 1 to 4

Setting the display

In the function group LCD, you will find setting optionsfor the display screen itself and for the echo display.

– If required, go to the fourth operating level.

– Select the function group LCD.


The economy mode reduces the current consumptionand consequently increases the operating time in battery operation.

– Select the function LIGHT.– Use the right hand to set the required lighting.

The function FILLED toggles between the filled andthe normal echo display mode. The filled echo displaymode improves the echo perceptibility due to the strongcontrast, especially in cases where work pieces arescanned more quickly.

– Select the function FILLED.– Use the right hand to set the function to on or off.

SCHEMEYou have a choice between four color schemes. Thecolor scheme determines the color of all displays andthat of the background. You cannot vary the colors ofgates because they are fixed as follows:

• Gate A – red• Gate B – green

– Select the function SCHEME.– Use the to choose the required color scheme.

FILLED (Echo display mode)

All color schemes are suitable for indoor use. For out-door use, we recommend the color schemes 3 and 4.

Y ou can choose between a lighting in the economy mode eco. and a brighter lighting full. for the displaylighting. The economy mode is the default setting.

LIGHT (LCD backlight)

As an alternative to the measured values, the USM 33enables to display a scale in the measurement line. The scale gives you an overview of the position ofechoes.Y ou have a c hoice between a dimensionless

ten-division scale and a scale showing the real positionof the echoes.

SCALE (Configuring the measurement line)


OperationConfiguring the USM 33 for a test application

Note:

Note:


The following settings are possible:• measval Display of measured values• snd-pth Display of sound path scale• div. Display of a dimensionless scale– Select the function SCALE.– Use the right hand to set the required display mode.

More functions for the basic configuration of the USM 33 may be found in the function groups CFG1 and CFG2.

– If required, go to the fourth operating level.– Select the function group CFG1 or CFG2.

Functions of

5.11 General configuration

CFG1 CFG2:Dialog language DateBaud rate Analog output TimePrinter selection HornEvaluation mode Unit

In this function you can select the language for displ-aying the function names on the screen and for thetest report.

The following languages are available:

• Chinese• English (default setting)

– Select the function DIALOG. – Use the right hand to select the required language.

In this function you can select the baud rate for theserial port transmission. You have a choice between0,300, 600, 1200, 2400, 4800, 9600, 19200, 38400,and 57600 Baud.

– Select the function BAUD-R.

– Use the right hand to select the required baud rate.

BAUD-R (Baud rate for transmission)

DIALOG (Selecting the language)

Operation General configuration

• hardcpy Hardcopy of the screen contents

• reportTest report with A-scan, all relevant settings for theinspection and space for hand-written remarks

• meas P5The magnified value given at the right upper cornerof the A-scan.

• pardumpAll instrument functions with the current settings

• datalog (only with Data Logger option)The selected job is printed out as a report includingall measured values.

• offThe key is deactivated.

– Select the function COPYMOD.– Use the right hand to set the required assignment for the key.

For more details on the how to print out a test report, please refer to chapter 6 Documentation.

– Select the function PRINTER.– Use the right hand to select the required printer.r.

PRINTER (Printer for test report)

In this function you can select the connected printer forprinting out your test report.

You have a choice between the following printer types:

• Epson• DPU-41X• DJ-1200

When the key is pressed, data are output to the RS232interface and transferred to a printer or a PC. You canuse the function COPYMOD to choose the data to betransferred when the key is pressed. You have thefollowing setting options:

COPYMOD (Assignment of copy mode)


OperationGeneral configurations

Note:

– Use the right-hand to select the value thatyou want to vary, e.g. the day.

– Use the left hand to vary the selected value.– Use the right-hand to confirm.


DATE (Setting the DD,MM,YY)The date is saved together with the test results. Youcan set it in the function DATE (function groupCFG2).

Please take into account that the USM 33 onlyindicates the year with two digits.You should always make sure that you use correctlyset values of date. Test results may otherwise befalsified.

– If necessary, change to the fourth operation level.– Select the function DATE in the function group CFG2.

Setting the timeThe function TIME (function group CFG2) serves forsetting the current hour of time. It is saved togetherwith the test results.

You should always make sure that you are using thecorrect time settings. Test results may otherwise befalsified.Don’t forget to manually set the time when changingfrom winter to summer time.The setting method can be referenced as date.

Operation General configurations

Attention:!

Attention:!

You should always make your decision on the units immediately when starting to work with the USM 33. If you change the unit, all current settings are deleted, and the basic setup is loaded.

– Select the function UNIT.– Use the right hand to select the required unit.

To avoid any accidental deleting of values, the measurement line will display a safety prompt:

– If you are sure that you want to change the unit of measurement, press the corresponding key of the function UNIT . And the key would abort theprocess. The unit of measurement is now changed;the current data are deleted.

In this function, you can decide whether or not an acc- oustic alarm should be given in addition to the visual alarm (LED A) .

– Select the function HORN.– Use the right hand to set the horn to on or off.

Krautkramer USM 33 5-37 Issue 01, 01/2007

HORN

Error alarms can be triggered under certain circumst-ances.These are caused by intermediate conditions in instrument operation occurring when the instrument is used, i.e. when function parameters are changed.Possible alarms occurring during instrument operation(setting of functions) are to be ignored.

UNIT (Selecting units of measurement)You can choose the required units between mm orinch in the function UNIT.

Change unit?

OperationGeneral configurations

Note:

Attention:!


5.12 Status symbols and LEDsStatus symbols can be displayed in the line belowthe screen display to inform about certain settingsand conditions of the USM 33. The LEDs above thedisplay give you further information.

Status symbols

Symbol Description

LEDs

Symbol Description

* Display is frozen, press again for active.

! Data transfer active, (printing or remote control).

Low battery charge

A Gate alarmR (Reserved for future use)D Function DUAL (pulser-receiver

separation) is active.

Operation Status symbols and LEDs

Batteries must be charged

Battery indicator Full battery charge

5.13 Distance-amplitude curve (DAC)The DAC function is available as a fixed function in the

in the material the echo height of reflectors of equal size depends on the distance to the probe.

A distance-amplitude curve, which is recorded with defined reference reflectors, graphically displays these

If you use a reference block having artificial flaws whenrecording a DAC you will be able to apply these echoamplitudes for the evaluation of discontinuities withoutany further correction. The reference block should bemade of the same material as the test object.

You will find the functions for the distance-amplitude curve in the function group DAC.

– If required, go to the second operating level. – Select the function group DAC.

Y ou can use this function to activate the DAC. The following settings are available:

• offNo DAC is active.

• Record A new DAC is recorded.

• DACThe already saved distance-amplitude curve is displ-ayed on the screen.

DACMOD (Activating DAC)


Operation Distance-amplitude curve(DAC)

second operating level on the USM33. Due to the angle of the sound beam spread and to the sound attenuation

influences.

The moment a new curve is recorded, a possibly alr-eady existing curve must be deleted. If necessary,make sure that the old curve has been stored in a freedata set before starting to record a new curve!

– Select the function DACMOD.– Use the right hand to set the function to DAC. The function DACECHO is set to 0 since there is no previously recorded echo.

– Couple the probe to the reference block, and peak the first reference echo. Use the left hand to bring the echo to an amplitude about 80% screen height.

– Select the function aSTART, and then move thegate so that the selected echo is the highest of theecho sequence within the gate range.

– Press DACECHO to record the first referenceecho. The instrument gain will automatically changeuntil the DAC echo in gate A reaches 80% screenheight (+/–0,3 dB). The function DACECHO is set to1 to indicate that the first reference echo has been successfully recorded.


– Select the function DACMOD.– Use the right-hand to select the DAC setting.

DACECHO (Recording or deleting DAC curve)

Before starting to record a DAC curve, the instrumentmust be correctly calibrated (ref. Section 5.7 Calibr-ating the USM 33).

Operation Distance-amplitude curve(DAC)

– Peak the next reference echo, and repeat the recordingding process for other curve points. The number in thefunction DACECHO is increased by 1 with each re-cording.

Attention:!

It has two functions at this moment. One is for gate A start position and another is for Auto80 after pressing at same time then for ON or OFF through adjustment.

If the message “Echo is not valid” appears, the referencepoint could not be recorded. Check the gate position as well as the height of the reference echo and repeat the recording.

As soon as you have recorded at least two curve reference points. Y our DAC is already active (please see previous section. You can record a maximum of 10 curve reference points.

Deleting reference points or the complete DACYou can delete the reference point which was recordedlast in each case, or the complete DAC.

– Select the function DACECHO.– Press the beside DACECHO. The message

“Do you want to delete the DAC echo?” appears in the measurement line.

– Press the key in order to delete the last echo, orpress another key in order to cancel the process ofdeleting. In this way, you can record one or several newreference points.

aSTART>

OFFSET (Distance of multiple DAC)You can activate a multiple DAC and at the same time determine the distance from the registration curve. Thedefault setting 6.0 dB generates four other curves at -12 dB, -6 dB, +6 dB, and +12 dB from the registration curve. The setting 0 generates only the registration curve.Any setting different from 0 generates four other curvesat a set distance from the original curve. For a better distinction in multiple DACs the registration curve is displayed as a bold line.


OperationDistance-amplitude curve (DAC)

Adjustment range: 0 dB ... 14 dB in steps of 0.5dB

– Select the function OFFSET.– Use the right hand to select the required setting.

Note:


OFFSET> has two functions. One is to set datadirectly. Another is to press at same time to to define different data for each curves.

Adjustment range: -24 dB~24 dB in steps of 0.5 dB.

5.14 Data management (LOG1, LOG2)

The USM 33 onboard datalagger can register morethan 20 000 thickness reading in its memory.

The memory can be set in 20 individual “jobs”.Each job consists in a grid from 1 to 40 rows and fromA to Z columns.

Job’s grid has to be set in LOG 1 menu:

DAT-LOG has to be set to “Off”.

Operation Data management(LOG1, LOG2)

Note:

Once the job is defined, the memory has to be alloated.Just move to LOG 2 menu and use the CREATE function.

Your Job is now ready for use, and LOG1 menu showsJOB number with ready at Position ROW1 and COLUMN A.

row if you wish to record data first in vertical direction.column if you wish to record data first in horizontal direction.

The datalogge r ’ s position is indicated in the function group on the right side of the screen ROW andCOLUMN data are pointing the active cell of the job.

Navigation in the job is possible via the keys controllingthese two parameters.

Take a long key press and the instrument willswitch to the test menu as below.

CLR

SKIP


OperationData management(LOG1, LOG2)

In order to start recording, set DAT-LOG to:

Pressing on the key below CLR will remove an alreadyrecorded reading in the active location.

Pressing on the key below SKIP will save obstr at the pointer location. This function has to be used to differe-ntiate a forgotten location where the UT measurementcannot be conducted due to access problem.

COPYPressing on the key below COPY will save S-DISP rea-ding at the pointer location and increment location in theDAT-LOG direction first.

CLR SKIP ZOOM COPY FREZ


Once you arrive at the first limit of the first direction,the instrument will automatically increase the otherdirection.

Example:You have set Job 1 with 5 rows and Column up to C. If DAT-LOG is set to “Column” the instrument willask for:

Operation Data management(LOG1, LOG2)

Location number Row Column Comment

1

2

3

4

15

1

1

1

2

5

A

B

C

A

C

The instrument willautomatically increment Row and restart with the first column.

--- --- ---

1-6Issue 01, 01/2007Krautkramer USM 33

Documentation 6

2-6

Direct printing of the following data via the RS232 inter-face is possible using the USM33:

6.1 Printing data

Documentation Printing data

- Connect USM33 to printer with serial cable;

- Select the fourth operating level;

- Select the CFG1 function;

- Then set Baud rate and printer type;

- Select the setting: hardcpy, report, meas P1 (meas-ured value at position 1), pardump (function list), datalog (Data Logger job including measured values), special

(several A-scans on one page) under COPYMOD.

- Long press to the fifth operating level;

- Select COPY to start print. Symbol “!” will be shown at the right-bottom of the screen to indicate correct printing.


• Test report containing the A-scan and the adjustment data• A-scan• Single reading(position 1 of the measurement line)• Function list(including all current settings)• Data LoggerTo do this, you need

• a printer with serial interface RS 232• a printer cable

Preparing the printerThe transfer parameter settings are fixed in the USM 33and cannot be changed.

• Baud 9600• Word length 8 data bits• Parity none

Printing

Before printing, go to LOG1 under the third operation level and set DAT-LOG to OFF.

Note:


Maintenance and care 7

Care of the instrument

Maintenance and care Care of the instrument


7.1

Clean the instrument and its accessories using a moistcloth. Only use the following recommended instrumentcleaners:

• water,• a mild household cleaner or• alcohol (no methyl alcohol).

Do not use any methyl alcohol, solvents, or dye pene-trant cleaners!

The plastic parts can be damaged or embrittled by this.

Note:


Maintenance and careCare of the batteries

7.2 Care of the batteries

Care of the batteriesCapacity and life of batteries mainly depend on thecorrect handling. Please therefore observe the tips be-low.

You should charge the batteries in the following cases:

• before the initial startup• after a storage time of 3 months or longer• after frequent partial discharge

Charging the batteriesYou can charge the lithium-ion battery either directly inthe instrument or by means of the external batterycharger (order number 1005922 or 150077) recomme-nded by us.

In this regard, please pay attention to the information on the operation of the battery charger.

You should only use the batteries recommended by usand the corresponding battery charger. An improperhandling of the batteries and of the battery charger maycause explosion hazard.

Used batteries are special waste and have to be disp-osed of according to legal requirements!

Note:

Attention:!

7.3 Maintenance

Maintenance and care Maintenance


The USM 33 requires basically no maintenance.

Repair work may only be carried out by members ofauthorized Service staff of GE Inspection Technologies.

Attention:!


Maintenance and careRecycling

7.4 RecyclingGeneral view of the deviceIn the following you find an instrument overview as well as guidelines and notes for recycling and waste disposal ofthe components.

1

6

5

4

7

82

3

No. Material Description

1 Lithium-ion battery Battery inside the battery compartment at the bottom of the instrument. In order to open the compartment the quick acting closures have to be actuated.

2 LCD - display Fluorescent lamps of the LCD display contain trance amounts (0 – 0.5 mg) of Mercury (Hg)

3 >PC< / Brass Upper equipment cover Polycarbonat >PC< with pressed in brass thread insert.

4 Stainless steel Handle complete

5 >PC< Holder for handle

6 Stainless steel Ratchet disk

7 >PC< / TPU rubber Housing lower part

8 Aluminium Front panel

Maintenance and care Recycling


Materials for separate disposal

2

3

1

4



In the following you find guidelines and notes for removing materials/components, which must be removed andtreated separately.


1 In order to remove the LCD display the upper housing has to be withdrawn first. After loosening six screws on the bottom side and one further in batterycompartment, the complete upper housing can be taken away.

2 In order to open the compartment at the bottom of the equipment, the quick acting closures have to be actuated.

3 Lithium-ion battery Inside the battery compartment. Can easily be removed after opening the battery cover.

4 LCD - display Fluorescent lamps of the LCD display contain trance amounts (0 – 0.5 mg) of Mercury (Hg).



Further materials and components

In the following you find notes for dismantling materials/components, which can disturb several recycling processes,and materials/components for which benefits can normally be achieved.

1

4

2

5

3




1 >PC< / Brass Upper equipment cover Polycarbonat with pressed in brass thread insert.

2 Circuit boards Circuit board in upper housing, under it battery-PCB

3 Stainless steel Handle, rubber tube can be removed

4 >PC</Rubber Lower housing

5 >PC< Battery cover



Material Weight Description

LCD display 0.22 Fluorescent lamps of the LCD display contain trance amounts (0 – 0.5 mg) of Mercury (Hg)Lithium-ion battery 0.31 Located inside the battery compartmentSubtotal 0.53 Materials/components, which can disturb certain recycling processes>PC</brass 0.17 Upper equipment cover Polycarbonat >PC< with pressed in brass thread insert.PCB 0.33 Main PCB in the upper housing; battery PCB in the lower housing>PC</rubber 0.21 Lower housing and battery coverSubtotal 0.71 Materials/components, through which benefits can normally be achieved:Stainless steel 0.15 Handle Aluminium 0.15 Front panelRubber 0.05 O-ring handle cover keypad sealingSubtotal 0.35

Recycling data of master device

Materials/components, which must be removed and treated separately



approx(Kg)

Material Weight Description

Composite materials*:Keypad 0.20 Foil/aluminium/glass/spring steel/stainless steel Subtotal 0.20 Total 1.79(including battery)

* Materials/components, which cannot be separated into mono materials by destructive mechanical processes.



approx(Kg)


Interfaces and peripherals 8

8.1 Interfaces

Interfaces and peripherals Interfaces


The USM 33 presents different interfaces for the connection of external units and for the data exchange. All interfaces are located at the instrument front. The following figure gives an overview of the position of interfaces.


Interfaces and peripheralsInterfaces

1 BNC or LEMO-1-TRIAX socket for the connection of the transmitter probe (black ring)

2 BNC or LEMO-1-TRIAX socket for the connection of the receiver probe (red ring)

3 RS 232, serial interface, 9-way Sub-D socket

4 12V DC Mains connection socket, 4-way LEMO-0-B socket

8.2 RS 232 interface

Contact Designation Signal direction Level

1 unassigned – –2 RXD input RS 2323 TXD output RS 2324 DTR output RS 2325 ground – RS 2326 DSR input RS 2327 RTS output RS 2328 CTS input RS 2329 unassigned – –

Switch off the instrument before connecting a cable tothe RS 232 socket or before withdrawing any plugs.

View of the 9-way Sub-D socket

Interfaces and peripherals RS 232 Interface


The USM 33 has a RS 232 interface for remote controland documentation (report printout).

Contact assignment of the Sub-D socket

Note:

8.3 Data exchange Activation of serial communication


Interfaces and peripheralsData exchange

The USM 33 is equipped with the serial interfaceRS 232 for bi-directional data communication with a PC.When you connect the instrument with a PC you can:

• remote control the instrument via the PC,• transfer A-scans for documentation,• transfer instrument settings in ASCII format,• transfer reports from stored datasets,• read and write datasets in binary format.

Connecting a printer or a PCYou can connect the USM 33 to a printer or a PC using the special Krautkramer cables:

PC: UD 20 (25-way) or UD 31 (9-way)Printer: UD 31 (Seiko DPU) or UD 32 (Epson)

Please refer to chapter 2 .

After connecting the instrument to the PC you must run a software that opens the serial port. This can eitherbe a commercial terminal program (e.g. Microsoft Hyper Terminal) or a customised program like UltraDOC. Make sure that the serial communication parameters on the PC are identical to those of the instrument.

The data transmission parameters are as follows:

Baud rate: 0 (no transmission), 300, 600, 1200, 2400, 4800, 9600 (default), 19200, 38400, and 57600Word length: 8 data bits (fixed)Parity: none (fixed)Stop bits: 2 (fixed)

The settings on the USM 33 apply to most of the print-ers and PCs. To ensure a perfect communication, pleasecheck the settings of the connected peripherals and adjust them to the parameters of the USM 33.

Printing dataThe USM 33 enables a direct printout of data, forexample a report including the echo display and theinstrument settings. Please refer to chapter 6.


Appendix 9

Level Function Description

1 BASE

RANGE Setting of the range in which the

measurement is made.

MTLVEL Setting of the material sound velocity

D-DELAY Setting of the display start

P-DELAY Compensating for the probe

delay line

PULS

DAMPING Damping of the probe’s

oscillating circuit

POWER Setting the power of the initial pulse

DUAL Separation of pulser and receiver

PRF-MOD Setting the pulse repetition frequency

aGAT

aLOGIC Evaluation logic of the gate A

aSTART Starting point of the gate A

9.1 Function directory

bGAT

bLogic Evaluation logic of the gate A

bSTART Starting point of the gate B

bWIDTH Width of the gate B

bTHRSH Starting point of the gate B

2 MEM

SET-# Number of the data set

RECALL Retrieving a stored data set

STORE Saving the data set

DELETE Deleting a stored data set

CAL

S-REF1 Reference echo 1 for calibration

S-REF2 Reference echo 1 for calibration



Appendix Function display


Functiongroup

Functiongroup

aWIDTH Width of the gate A

aTHRSH Threshold of the gate A



AppendixFunction display

CAL Semiautomatic calibration

TRIG

ANGLE Entry of the angle for calculating the

projection distance (angle-beam probes)

X-VALUE Entry of the distance between

probe index (sound exit point)

and leading face of the

angle-beam probe

THICKNE Entry of workpiece thickness

DIAMET Change between planar and circular

testing components

DAC

DACMODE Activating/Deactivating the DAC

DACECHO Recording of a reference echo


OFFSET Offset for multiple DAC

3 MEAS

TOF Selection of gate’s measuring point

S-DISP Zoomed display of a selected parameter

Functiongroup

MSEL

MEAS-P1 MEAS-P2 MEAS-P3 MEAS-P4

LOG1

JOB-# Select a job number

ROW Set the number for row

COLUMN Set the number for column

DAT-LOG Select the Data Logger mode

LOG2

JOB-# Select a job number for creating or

deleting

CREATE Create the job

DELETE Delete selected job

DEL-ALL Delete all jobs

Level Function DescriptionFunctiongroup

Selection of measured valuesat four positions of themeasurment line

MAGNIFY Gate spreading

A-SCAN Settings of the A-scan

4-9

4 LCD

FILLED Selecting the echo display mode

SCHEME Choice of a color scheme for the screen

display

LIGHT Choice of lightning for the display

SCALE Choice of display mode for the

measurement line

CFG1

DIALOG Selecting the language

BAUDE Baud rate for serial port transmission

PRINTER Selecting the printer for the test report

COPYMOD Selection of print mode

CFG2

DATE Current date

TIME Current time

HORN Switching the acoustic alarm signal on/off

UNIT Selecting the unit of measurement mm or inch

Appendix Function directory


Issue 01, 01/2007

Functiongroup

5 CLR Delete measured value of selected job

SKIP Skip measured value of selected job

ZOOM Zoom the display in full screen

COPY Store measurement value at defined job

FREZ Freeze the displayed image on the screen

Level Function DescriptionFunctiongroup

Krautkramer USM 33

9.2 EC declaration of conformity


AppendixEC declaration of conformity

We declare that the USM 33 conforms to the followingEuropean directives:

• 89/336EEC (Electromagnetic compatibility)

The conformity of the above-mentioned product with theregulations of the directive 89/336EEC is proven by theobservance of the standard specifications

• EN 55011: 1998 Class A, Group 2 and• EN 61000-6-2: 1997• EN 61000-6-4: 1997.

The conformity of the above-mentioned product with theregulations of the directive 73/23/EEC, amended by thedirective 93/68/EEC, is proven by the observance ofthe standard specification

• EN 61010-1: 2001.

9.3 Manufacturer/ Service addresses

USM 33 Ultrasonic Portable Flaw Detector is manufactured by

GE Inspection Technologies(Shanghai) Co.Ltd.

Address 421 Hongcao Road, Shanghai, ChinaPost Code 200233

Phone: 0086-21-3414 4620Fax: 0086-21-6485 5170Free Hotline: 0086-800 820 1876

Website www.GEInspectionTechnologies.com

6-9

Appendix Manufacturer/Service addresses

Issue 01, 01/2007

The USM 33 is manufactured according to state-of-the-art methods using high-quality components.Thorough in-process inspections or intermediate tests and a quality management system certified to ISO 9001 ensure an optimum quality of confor-mance of the instrument.

Should you nevertheless detect an error on yourinstrument, switch the instrument off and remove the batteries. Inform your local GE InspectionTechnologies Service indicating the error and describing it. Keep the shipping container for any repairs possibly required which cannot be made on the spot.

If there is anything special that you would like to know about the use, handling, operation and sp-ecifications of the instruments, please contact your nearest GE Inspection Technologies repre-sentative or directly.

Krautkramer USM 33

7-9Issue 01, 01/2007

Appendix

9.4 Spare part lists

Spare part lists

Krautkramer USM 33

8-9 Issue 01, 01/2007

Appendix Spare part lists

Krautkramer USM 33

9-9Issue 01, 01/2007

AppendixSpare part lists

Krautkramer USM 33

Num

bers

Par

t Nam

eP

art N

umbe

r1

1U

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1002

756

21

Low

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768

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963

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1003

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927

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4621

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923

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1005

952

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mou

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3187

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10-9 Issue 01, 01/2007

Appendix Spare part lists

Krautkramer USM 33

Issue 01, 01/2007 1-10

Changes 10

Krautkramer USM 33

2-10 Issue 01, 01/2007

Changes

This chapter contains information about changes andadditions made at short notice and not yet included inthe operating manual.

If none exist, the chapter remains blank.

Krautkramer USM 33

issue 01, 01/2007 - service to the ndt industry · krautkramer usm 33 issue 01, 01/2007 1-5...

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