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Laser Lab Instruments 966 www.thorlabs.com Detectors Power Meters CCD Camera Optical Chopper Beam Profiler Spectrometer Fabry-Perot Temperature Controller& Shutter Filter Wheels MODEL BP104-UV BP104-VIS BP104-IR BP109-UV BP109-VIS BP109-IR Wavelength Range (nm) 200-1100 400-1100 700-1800 200-1100 400-1100 700-1800 Detector Type Si* Si Ge Si* Si Ge Aperture Diameter 4mm 9mm Slit Size 2.5μm 5μm Minimum Beam Diameter 10μm 20μm Maximum Beam Diameter 4mm 9mm Scan Rate 1.0-20.0Hz (Continuously Variable) Sampling Resolution 0.5-38μm (Depending on Scan Rate) 1.1-38μm (Depending on Scan Rate) Power Range** 10nW to 10W (Depending on Beam Diameter) Amplifier Bandwidth 10, 20, or 150kHz (-1dB) Sample Frequency 0.0625-1.0MHz Dynamic Range 72dB (Amplifier Switchable) Signal Digitization 16 bit Head Size Ø80mm x 60mm (Including Rotation Mount) Laser Beam Profiler BP100 Family Specifications Thorlabs’ BP100 Beam Profiler Series is a full-featured, high-precision instrument used to analyze the power distribution of laser beams with diameters from 10μm to 9mm and a dynamic range of 72dB. It is available with a Si or Ge sensor and covers a spectral range of 200- 1800nm. Designed as a single measurement head with a USB 2.0 interface, operation is easy and intuitive, and includes a graphical-user interface and drivers. With the new BP1M2 Series Extension Set, the beam profiler can be extended easily into an automatic M 2 beam quality analysis system. Functionality A narrow slit scans the beam at two defined orthogonal directions. To determine the beam's quality and spatial characteristics, the passing light is integrated by the detector and sampled. This method allows a wide range of power and beam diameters to be analyzed without the need for attenuators or lenses. From the resulting power distributions for the X and Y directions, all analyzed beam parameters are calculated such as diameter, ellipticity, location, centroid, pseudo-3D profile, and the beam power. A Gaussian fit of the scanned profiles is displayed together with the 2D and 3D plots. The direction of X and Y is set manually by a rotation mount that allows for rotating the complete measuring system in the housing by ±60°. A variable average function provides adjustable noise reduction and increases the measurement accuracy. The maxima-hold function allows analysis of pulsed laser sources, and the automatic or manual gain control enables the user to adapt to different beam powers. The power meter readouts in mW or dBm can be calibrated by the user with the external power meter. The GUI shows all parameters as digital or bar graph readouts, and parameter drifts can be visualized by a trend indicator. Data can be exported as text or spreadsheet files for external processing. BP100 SERIES (Base & Post Not Included) ITEM# $ £ € RMB DESCRIPTION BP104-UV $ 3,840.00 £ 2,419.20 € 3.571,20 ¥ 36,672.00 Slit Scanning Beam Profiler, 200-1100nm, 4mm Aperture BP104-VIS $ 3,600.00 £ 2,268.00 € 3.348,00 ¥ 34,380.00 Slit Scanning Beam Profiler, 400-1100nm, 4mm Aperture BP104-IR $ 4,140.00 £ 2,608.20 € 3.850,20 ¥ 39,537.00 Slit Scanning Beam Profiler, 700-1800nm, 4mm Aperture BP109-UV $ 4,200.00 £ 2,646.00 € 3.906,00 ¥ 40,110.00 Slit Scanning Beam Profiler, 200-1100nm, 9mm Aperture BP109-VIS $ 3,960.00 £ 2,494.80 € 3.682,80 ¥ 37,818.00 Slit Scanning Beam Profiler, 400-1100nm, 9mm Aperture BP109-IR $ 4,500.00 £ 2,835.00 € 4.185,00 ¥ 42,975.00 Slit Scanning Beam Profiler, 700-1800nm, 9mm Aperture *Si-UV Enhanced **Power levels between 1W and 10W should only be used with short exposure times (<30 seconds). NEW UV VERSIONS NEW UV VERSIONS User software showing pseudo 3D beam profile BP100 Series Features ■ Wavelength Ranges: 200-1100nm (UV) 400-1100nm (VIS) 700-1800nm (IR) ■ Two Aperture and Slit Sizes: Ø4mm with 2.5μm Slit or Ø9mm with 5μm Slit ■ Beam Diameter Range: (1/e 2 ) 10μm to 4mm (BP104) or 20μm to 9mm (BP109) ■ High-Precision Analysis of Beam Quality and Spatial Power Distribution ■ Integrated Power Meter ■ Continuous and Pulsed Sources 10Hz* ■ Variable Scanning Speed up to ≥10Hz ■ High Dynamic Range ■ Low-Noise Amplifier ■ Automatic and Manual Gain Control (Switchable) ■ Powerful GUI: - 2D and Pseudo-3D Profiles, - Bar Graph and Trend Indicators ■ Gauss Fitting ■ USB Cable Included ■ Average and Maxima-Hold Functions ■ LabVIEW™/ LabWindows™ and C/C++ Drivers Included *In combination with the BP1M2 Extension the repetition rate must be set to 300kHz. Beam Width (µm) Power (W)

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Laser Lab Instruments

966 www.thorlabs.com

Detectors

Power Meters

CCD Camera

Optical Chopper

Beam Profiler

Spectrometer

Fabry-Perot

TemperatureController& Shutter

Filter Wheels

MODEL BP104-UV BP104-VIS BP104-IR BP109-UV BP109-VIS BP109-IR

Wavelength Range (nm) 200-1100 400-1100 700-1800 200-1100 400-1100 700-1800

Detector Type Si* Si Ge Si* Si Ge

Aperture Diameter 4mm 9mmSlit Size 2.5µm 5µmMinimum Beam Diameter 10µm 20µm

Maximum Beam Diameter 4mm 9mmScan Rate 1.0-20.0Hz (Continuously Variable)Sampling Resolution 0.5-38µm (Depending on Scan Rate) 1.1-38µm (Depending on Scan Rate)

Power Range** 10nW to 10W (Depending on Beam Diameter)Amplifier Bandwidth 10, 20, or 150kHz (-1dB)

Sample Frequency 0.0625-1.0MHzDynamic Range 72dB (Amplifier Switchable)Signal Digitization 16 bit

Head Size Ø80mm x 60mm (Including Rotation Mount)

Laser Beam Profiler

BP100 Family Specifications

Thorlabs’ BP100 Beam Profiler Series is a full-featured, high-precision instrumentused to analyze the power distribution of laser beams with diameters from 10µm to 9mm and adynamic range of 72dB. It is available with a Si or Ge sensor and covers a spectral range of 200-1800nm. Designed as a single measurement head with a USB 2.0 interface, operation is easy andintuitive, and includes a graphical-user interface and drivers. With the new BP1M2 Series Extension Set,the beam profiler can be extended easily into an automatic M2 beam quality analysis system.

Functionality

A narrow slit scans the beam at two defined orthogonal directions. To determine the beam's quality andspatial characteristics, the passing light is integrated by the detector and sampled. This method allows awide range of power and beam diameters to be analyzed without the need for attenuators or lenses. Fromthe resulting power distributions for the X and Y directions, all analyzed beam parameters are calculatedsuch as diameter, ellipticity, location, centroid, pseudo-3D profile, and the beam power. A Gaussian fit ofthe scanned profiles is displayed together with the 2D and 3D plots. The direction of X and Y is setmanually by a rotation mount that allows for rotating the complete measuring system in the housing by ±60°.

A variable average function provides adjustable noise reduction and increases the measurement accuracy. The maxima-hold function allowsanalysis of pulsed laser sources, and the automatic or manual gain control enables the user to adapt to different beam powers. The powermeter readouts in mW or dBm can be calibrated by the user with the external power meter. The GUI shows all parameters as digital orbar graph readouts, and parameter drifts can be visualized by a trend indicator. Data can be exported as text or spreadsheet files forexternal processing.

BP100 SERIES (Base & Post Not Included)

ITEM# $ £ € RMB DESCRIPTION

BP104-UV $ 3,840.00 £ 2,419.20 € 3.571,20 ¥ 36,672.00 Slit Scanning Beam Profiler, 200-1100nm, 4mm ApertureBP104-VIS $ 3,600.00 £ 2,268.00 € 3.348,00 ¥ 34,380.00 Slit Scanning Beam Profiler, 400-1100nm, 4mm ApertureBP104-IR $ 4,140.00 £ 2,608.20 € 3.850,20 ¥ 39,537.00 Slit Scanning Beam Profiler, 700-1800nm, 4mm ApertureBP109-UV $ 4,200.00 £ 2,646.00 € 3.906,00 ¥ 40,110.00 Slit Scanning Beam Profiler, 200-1100nm, 9mm ApertureBP109-VIS $ 3,960.00 £ 2,494.80 € 3.682,80 ¥ 37,818.00 Slit Scanning Beam Profiler, 400-1100nm, 9mm ApertureBP109-IR $ 4,500.00 £ 2,835.00 € 4.185,00 ¥ 42,975.00 Slit Scanning Beam Profiler, 700-1800nm, 9mm Aperture

*Si-UV Enhanced **Power levels between 1W and 10W should only be used with short exposure times (