lesson 3: sample preparation and problems

31
Lesson 3 Sample Preparation & Problems Nicola Döbelin RMS Foundation, Bettlach, Switzerland October 16 – 17, 2013, Uppsala, Sweden

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Page 1: Lesson 3: Sample Preparation and Problems

Lesson 3Sample Preparation & Problems

Nicola DöbelinRMS Foundation, Bettlach, Switzerland

October 16 – 17, 2013, Uppsala, Sweden

Page 2: Lesson 3: Sample Preparation and Problems

2

Repetition: Powder XRD Samples

(010)

(100)

(120)

Powder sample

- A fine powder contains particlesin all possible orientations

- The orientation distribution is random,no orientation is preferred

- Powder samples generate continuousdiffraction cones, the projection on thedetector is called «Debye rings»

Page 3: Lesson 3: Sample Preparation and Problems

Repetition: Bragg-Brentano Diffractometer

3

Sample

X-raytube

Detector

Goniometercircle

Divergenceslit

Sollerslit

Sollerslit

Anti-Scatterslit

Beammask

Anti-Scatterslit

Receivingslit

Focusingcircle

Kβ Filter

- Bragg-Brentano diffractometer(Reflective / θ-θ geometry)

- Various optical elements allow tooptimize intensity and resolution

Page 4: Lesson 3: Sample Preparation and Problems

Repetition: Phase Identification

4

- Crystalline phases are identified bycomparing peak positions witha database (Search/Match)

- Qualitative (sometimes semi-quantitative) results

- Databases:

- PDF-2/4 (commercial)

- COD (open-access)

Page 5: Lesson 3: Sample Preparation and Problems

Sample Preparation

5

Sample preparation is ABSOLUTELY CRUCIALfor a good diffraction pattern!

Some others are relatedto sample preparation errors.

Some problems encountered duringRietveld refinement are inherent

to the sample.

These are hard enoughto deal with!

So let’s try tominimize these!

Page 6: Lesson 3: Sample Preparation and Problems

Problems

6

- Graininess

- Micro-absorption

- Texture

- Crystallite size

- Sample height displacement

- Surface roughness

- Sample transparency

Page 7: Lesson 3: Sample Preparation and Problems

Particles & Crystallites

7

Single crystal Polycrystal / Agglomerate

Crystallite = Domain of coherent crystal structure

Crystallite Crystallites

Particle size = Crystallite size Particle size > Crystallite size

Page 8: Lesson 3: Sample Preparation and Problems

Graininess

8

http://people.physics.anu.edu.au/~web107/

Single crystals generatespotty diffracted rays.

Fine powders generatesmooth diffraction rings.

What about coarse powders?

(Large Crystallites)

Page 9: Lesson 3: Sample Preparation and Problems

Graininess

9

Spotty diffraction rings

Very weak peak

Very strong peak

Grainy samples:

- non-reproducible intensities

- «phantom» peaks

- «missing» peaks

The same sample, atthe same 2θ position,but different intensities!

Page 10: Lesson 3: Sample Preparation and Problems

Graininess: Rocks in Dust

10

«Rocks in Dust»:

A few large crystals ina fine matrix

Usually invisible, but ifscanned: Strong peaks

out of nowhere!

http://www.diamond.ac.uk/

Page 11: Lesson 3: Sample Preparation and Problems

Graininess

11

Reducing graininess:

- Grinding / milling

- Adjust divergence slit and beam mask for largest possible irradiated area(= more particles contribute to diffraction pattern)

- Use spinning sample stage(= better randomisation)

Few diffracting crystallites Many diffracting crystallites

Page 12: Lesson 3: Sample Preparation and Problems

Micro-absorption

12

Phase 1: High absorptioncoefficient for X-radiation

Phase 2: Low absorptioncoefficient for X-radiation

X-rays

X-rays

Page 13: Lesson 3: Sample Preparation and Problems

Micro-absorption

13

Weak attenuation by phase 2

� Large volume of interaction

Strong attenuation by phase 1

Large particles absorb significantpart of the radiation.

� Small volume of interaction

Phase quantification biased for phase 2!

Page 14: Lesson 3: Sample Preparation and Problems

Micro-absorption

14

Small particles absorb insignificantpart of the radiation.

� Similar volumes of interactionwith phases 1 & 2

� Correct phase quantification

Page 15: Lesson 3: Sample Preparation and Problems

Micro-absorption

15

Reducing micro-absorption:

- Grinding / milling to reduce particle size

Micro-absorption occurs in samples with…

- … large particles (not crystallites!)

- … phases with large differences in absorption coefficients

Mathematical correction:

- Difficult, but possible to a certain degree(more about «Brindley correction» in the lesson on «Rietveld refinement»)

Page 16: Lesson 3: Sample Preparation and Problems

Texture, Preferred Orientation

16

Smooth, but non-continuousdiffraction rings

Reason:

- Orientation of crystallitesis not random.

- Some orientations areover-represented,others are under-represented.

Page 17: Lesson 3: Sample Preparation and Problems

Texture, Preferred Orientation

17

Images: L. Galea, RMS Foundation

Platelets Needles, Fibers, Whiskers

Random orientation Preferred orientation

Page 18: Lesson 3: Sample Preparation and Problems

Texture, Preferred Orientation

18

Try to avoid orientation at the surface of the sample:

- Press powder without «rubbing» the surface

- Use back-loading sample holder

- Disorder surface with textured stamp

- Various creative solutions can befound on the internet (involvingVaseline, hair spray, …)

PO can be corrected mathematically,but phase quantification will be biased.(more on this in the lesson on «Rietveld refinement»)

Page 19: Lesson 3: Sample Preparation and Problems

Crystallite Size

19

Image: http://www.forbes.com/

More sources in ordered arrangement

=More distinct interference

pattern

Larger domains ofcoherent crystal structure

=More distinct diffraction

pattern

Page 20: Lesson 3: Sample Preparation and Problems

Crystallite Size

20

30.2 30.3 30.4 30.5 30.6 30.70

1000

2000

3000

Inte

nsity

[cou

nts]

Diffraction Angle [°2θ]

10 nm 20 nm 40 nm 100 nm 200 nm 500 nm 1000 nm infinite

10 nm 20 nm 40 nm 100 nm 200 nm 500 nm 1000 nm infinite

10 nm 20 nm 40 nm 100 nm 200 nm 500 nm 1000 nm infinite

10 nm 20 nm 40 nm 100 nm 200 nm 500 nm 1000 nm infinite

10 nm 20 nm 40 nm 100 nm 200 nm 500 nm 1000 nm infinite

10 nm 20 nm 40 nm 100 nm 200 nm 500 nm 1000 nm infinite

10 nm 20 nm 40 nm 100 nm 200 nm 500 nm 1000 nm infinite

10 nm 20 nm 40 nm 100 nm 200 nm 500 nm 1000 nm infinite

10 nm ≈ 25 unit cells (LaB6)

Page 21: Lesson 3: Sample Preparation and Problems

Crystallite Size

21

Small crystallites generate broad peaks

25 26 27 28 29 30 31 32 33 34 35

Inte

nsity

[a.u

.]

Diffraction Angle [°2θ]

1 µm

100 nm

50 nm

20 nm

10 nm

Crystallite size can be calculated from peak broadening

Severe peak broadening:

- Excessive peak overlap

- Unusable diffraction pattern

Page 22: Lesson 3: Sample Preparation and Problems

0 100 200 300 400 500

Average Crystallite Size [nm]

Crystallite Size

22

accurate inaccurate impossible

Calculation of crystallite size

Instrumental broadening

Crystallite broadening

Pea

k F

WH

M [°

2θ]

Page 23: Lesson 3: Sample Preparation and Problems

Anisotropic Crystallites

23

Spherical CrystallitesDiameter 10nm

Needle-shaped CrystallitesDiameter 10nmLength 100nm

10 20 30 40 50 60

Inte

nsity

[a.u

.]

Diffraction Angle [°2θ]

More on the calculation of crystallitesizes in the lesson on «Rietveld refinement»

Page 24: Lesson 3: Sample Preparation and Problems

Summary: Ideal Particle Size

24

- Ideal particle and crystallite size: 1–5 µm

- Larger particles: Micro-absorption

- Larger crystallites: Grainy sample

- Caution: High-energy milling (e.g. planetary mill)generates:

- Lattice defects and strain in the crystal structure

- Peak broadening due to reduction of crystallite size

- Amorphous fraction (invisible to XRD)

- Manual milling in agate mortar is usuallyrecommended

Page 25: Lesson 3: Sample Preparation and Problems

Automatic mill for XRD

25

«Industry standard» for automatic XRD sample milling:

McCrone Micronizing Mill

http://www.powderbulksolids.com

Page 26: Lesson 3: Sample Preparation and Problems

Sample Height Displacement

26

Sample

X-raytube

Detector

Goniometercircle

Focusingcircle

Sample surfaceis too low / high

- Focus of diffracted beam is displaced

- Receiving slit / 1D / 2D detector out of focus

- Diffracted beam blocked by optical elements

Results:

- 2θ shift of peaks

- Diffuse / broad peaks

- Loss of intensity

- «Funny» peak profiles(beam partially blocked)

Page 27: Lesson 3: Sample Preparation and Problems

Rough Sample Surface

27

Sample

X-raytube

Detector

Goniometercircle

Rough samplesurface

- Diffraction signals from different surface levels

- Focus of diffracted beam is partially displaced

- Receiving slit / 1D / 2D detector out of focus

Results:

- 2θ shift of peaks

- Diffuse / broad peaks

- «Funny» peak profiles(beam partially blocked)

Page 28: Lesson 3: Sample Preparation and Problems

Sample Transparency

28

Sample

X-raytube

Detector

Goniometercircle

Deep penetrationinto the sample

- Diffraction signals from different surface levels

- Focus of diffracted beam is partially displaced

- Receiving slit / 1D / 2D detector out of focus

Results:

- 2θ shift of peaks

- Diffuse / broad peaks

- «Funny» peak profiles

Page 29: Lesson 3: Sample Preparation and Problems

Sample Transparency

29

X-raytube

Detector

Goniometercircle

Possible solutions:

- Use very thin sample, allow theprimary beam to shine through(needs correction for Rietveld refinement)

- Use a transmission / Debye-Scherrerinstrument with capillaries (insteadof reflection / Bragg-Brentano geometry)

Page 30: Lesson 3: Sample Preparation and Problems

Summary: The Perfect Sample

30

The perfect sample for Bragg-Brentano diffractometers:

- Crystallites and particles of 1-5 µm size

- Perfectly random orientation

- Perfectly flat surface

- Surface precisely centered in the goniometer

- Short penetration depth

Page 31: Lesson 3: Sample Preparation and Problems

Software Download

31

For tomorrow:

Download software from:

http://www.doebelin.org/nic/tools/profex/