logic and-or gate vlsi design

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    LABORATORY REPORT 2

    LOGIC GATE AND-OR

    ECE 135

    Gerfel Philip C. Gonzle!

    "EBR#ARY$ 2%15

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    O&'e()i*e: Layout a LOGIC GATE with the given specifcations

    +pe(i,()ion!

     This are the specifcations given. I made the logic gate with only this specifcationsut the presimulation was etter than the postsimulation. Thus! the layout was not goodenough. There"ore! I made another logic gate with using # multiples on the inverter.

    In*er)er +(he)i( Di/r n0 +&ol

    NOR G)e +(he)i( Di/r n0 +&ol

     

    NAND G)e +(he)i( Di/r n0 +&ol

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    AND-OR +(he)i( Di/r

    AND-OR Lo)

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    De!i/n Rle Che( Lo) 4er!! +(he)i(

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    Lo) Pr!i)i( E)r()ion

    Te!)&en(h

    6*efor Re!l)

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    $hown aove are the wave"orms output O%T&%T! input A! input '! and input C.

    Tr)h T&le

    A B C O#TP#T

    % % % %% % 1 1% 1 % %% 1 1 11 % % %1 % 1 11 1 % 11 1 1 1

    $hown aove is the computed truth tale o" the logic gate A()*O+.

    "ro )he 7*efor !ho7n &o*e n0 )he )r)h )&le$ )herefore$ )he,ni!he0 lo) of )he lo/i( /)e AND-OR i! (orre().

    Copri!on

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    $hown aove is are the wave"orms o" the presimulation and postsimulation. Also!

    the rise time and "all time are measured. The postsimulation has lesser rise time and "all

    time than the presimulation. Thus! clearly! the layout is etter than the r",-l.

    /oomed on the +ising Edge

    &resimulation

    &ostsimulation

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    PRE+I8#LATION PO+T+I8#LATION

    RI+E TI8E   10.4ns   3.77ns

    "ALL TI8E  4.46

    ns  4

    ns+LE6 RATE RI+E

    TI8E  SW =

      1.8V 

    (10.4ns ) (1 x106 )

    ¿173.08V  / μs

    SW =  1.8V 

    (3.77ns ) (1 x106 )

    ¿477.45V  / μs

    +LE6 RATE

    "ALL TI8E  SW =

      1.8V 

    (4.46ns ) (1 x106 )

    ¿403.59V / μs

    SW =  1.8V 

    (4 ns) (1 x 106 )

    ¿450.00V / μs

    Con(l!ion

     The specifcation that was assigned has - multipliers. I made the logic gate with

    only this specifcations ut the presimulation was etter than the postsimulation indicating

    that the layout was not good. There"ore! I made another logic gate using # multiples on

    the inverter. The result was astonisihing. &ostsimulation got etter.

     The per"ormace o" a logic gate is measured y the slew rate or the rise time and "all

    time o" the signal output. The greater the slew rate! the etter the device. $lew rate is the

    ma0imum rate o" change o" the output amplitude per unit time. The lessser the rise time

    or "all time! the etter the device.

    As shown in the tale o" comparison aove! clearly! the postsimulation o" the logic

    gate has greater slew rate than the presimulation. Also! the rise time and "all time o" the

    postsimulation are lesser than the presimulation. There"ore! with the data gathered! the

    postsimulation or the layouted logic A()*O+ Gate is etter than the presimulation.

    I also made another conclusion! the more the multiplier! the etter is the transistor.