low power designs in memories

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Low Power designs in Memories Dr Elwin Chandra Monie

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Low Power designs in Memories. Dr Elwin Chandra Monie. 4T & 6T SRAM cell Implementation. 4T Bistable Latch. __ BIT/BIT : Data line WORD : RD/WT. 6T Bistable Latch. Reading a Cell. I cell. D V = I cell * t ----- C b. Sense Amplifier. 1 -> 0. 0 -> 1. Writing a Cell. - PowerPoint PPT Presentation

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Page 1: Low Power designs in Memories

Low Power designs in Memories

Dr Elwin Chandra Monie

Page 2: Low Power designs in Memories

2

4T & 6T SRAM cell Implementation

6T Bistable Latch

4T Bistable Latch

__BIT/BIT : Data lineWORD : RD/WT

Page 3: Low Power designs in Memories

3

Reading a Cell

Icell

DV = Icell * t

----- CbSense Amplifier

Page 4: Low Power designs in Memories

4

Writing a Cell

1 -> 00 -> 1

Page 5: Low Power designs in Memories

SRAM cell

Precharge

Column Decode

Page 6: Low Power designs in Memories

6

SRAM, Putting it all together

2n rows, 2m * k columns

n + m address lines, k bits data width

Page 7: Low Power designs in Memories

7

SRAM Partitioning

Page 8: Low Power designs in Memories

8

SRAM Partitioning Divided Wordline Architecture

Page 9: Low Power designs in Memories

Memory Subsystems Organization (1)

Two or more memory chips can be combined to create memory with more bits per location (two 8X2 chips can create a 8X4 memory)

Page 10: Low Power designs in Memories

Memory Subsystems Organization (2)

Two or more memory chips can be combined to create more locations (two 8X2 chips can create 16X2 memory)

Page 11: Low Power designs in Memories

11

Partioning summaryPartitioning reduces switched

capacitancePartioning involves a trade off between

area, power and speedFor high speed designs, use short

blocks(e.g 64 rows x 128 columns )◦Keep local bitline heights small

For low power designs use tall narrow blocks (e.g 256 rows x 64 columns)◦Keep the number of columns same as the

access width to minimize wasted power

Page 12: Low Power designs in Memories

Pulsed Word LinePulsed WORD line to

limit the duration of reading so that the BIT line has lesser swing

Page 13: Low Power designs in Memories

Pulsed Word Line

Q

R S

Reset from dummy sense-amp Word enable

SA Sense Amplifiers

Memory Core

Accessed Row

Dum

my

Col

umn

Wor

d D

river

Wor

d D

ecod

er

Page 14: Low Power designs in Memories

Bit Line Isolation Main idea: Isolate sense amplifiers from bit line after

sensing, to prevent from having large voltage swings

Page 15: Low Power designs in Memories

Pulsed sense amplifier

Page 16: Low Power designs in Memories

Reducing power in decode circuit

Two stage decoder

Page 17: Low Power designs in Memories

17

Differential Sensing - SRAM

Diff.SenseAmp

BLBL

SRAM cell i

x xy yD D

VDDVDD

WLi

PC

EQ

VDD

x x

y

SE

V DD

x x

y

SE

(b) Doubled-ended Current Mirror Amplifier

y

(a) SRAM sensing scheme.(c) Cross-Coupled Amplifier

M1 M2

M4M3

M5

Page 18: Low Power designs in Memories

18

Latch-Based Sense Amplifier

VDD

BL

SE

SE

BLEQ

Initialized in its meta-stable point with EQOnce adequate voltage gap created, sense amp enabled with SEPositive feedback quickly forces output to a stable operating point.

Page 19: Low Power designs in Memories

20

Bit Line Precharging

equalization transistor - speeds up equalization of the two bit lines by allowing the capacitance and pull-up device of the nondischarged bit line to assist in precharging the discharged line

Static Pull-up Precharge

BL !BL

clock

Clocked Precharge

!BLBL