march 15 - 18, 2015 hilton phoenix / mesa hotel mesa, arizona … · 2015. 3. 30. · bits 2015...
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BiTS 2015
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Proceedings
Archive – Session 8
March 15 - 18, 2015
Hilton Phoenix / Mesa Hotel
Mesa, Arizona
© 2015 BiTS Workshop – Image: BCFC/iStock
BiTS 2015
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
ProceedingsBiTS Workshop 2015 Schedule
Session
Session Chair
Solutions DayWednesday March 18 10:30 am
Looking For That Four Leaf Clover
"A Test-Cell-Solution for 81GHz Automotive Radar ICs"Jason Mroczkowski, Peter Cockburn, & John Shelley - Xcerra Corporation
"Universal Device Interface DUT Solutions for ATE Test"Bob Bartlett- Advantest Corporation
"Where No Tester Has Gone Before"Roger Sinsheimer -Teradyne Inc.
8Morten Jensen
BiTS 2015
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Proceedings
Copyright Notice
The presentation(s)/paper(s) in this publication comprise the Proceedings of the 2015 BiTS Workshop. The content reflects the opinion of the authors and their respective companies. They are reproduced here as they were presented at the 2015 BiTS Workshop. This version of the papers may differ from the version that was distributed in hardcopy & softcopy form at the 2015 BiTS Workshop. The inclusion of the presentations/papers in this publication does not constitute an endorsement by BiTS Workshop or the workshop’s sponsors.
There is NO copyright protection claimed on the presentation content by BiTS Workshop. However, each presentation is the work of the authors and their respective companies: as such, it is strongly encouraged that any use reflect proper acknowledgement to the appropriate source. Any questions regarding the use of any materials presented should be directed to the author(s) or their companies.
The BiTS logo and ‘Burn-in & Test Strategies Workshop’ are trademarks of BiTS Workshop. All rights reserved.
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Universal Device Interface DUT
Solutions for ATE
Bob Bartlett
Advantest Corporation
2015 BiTS Workshop
March 15 - 18, 2015Conference Ready
mm/dd/2014
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Agenda
• Universal Device Interface (UDI) introduction
• UDI concepts
• Use Cases
– Tester Characterization
– Interfacing to Reference Boards
– Extending HSIO performance
– RFPA
• 18GHz extension module
• Harmonic measurement module
• Summary
Universal Device Interface DUT Solutions for ATE 2
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Universal Device Interface (UDI)
Introduction
• UDI components are engineered to be shared
across different applications
• Standardized interface to provide same tester
look and feel to users
• We leverage development efforts through R&D
across Advantest’s installed base
• Extends the DUT interface in the Z axis with
compatible docking and electrical interfaces
• Standard cable assemblies for fast interfacing
• Lower DUT fixture costs for RF applications
3Universal Device Interface DUT Solutions for ATE
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
UDI concepts: Hybrid Stiffener
• The hybrid stiffener is fully compatible with standard V93K load boards
• The PCB mounting holes can be used for the assembly of evaluation
boards
• Docking hardware, inlays and pickup points same as standard V93K
stiffeners
4Universal Device Interface DUT Solutions for ATE
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
UDI concepts:
Standard Channel Anti-Pogo
5Universal Device Interface DUT Solutions for ATE
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
UDI concepts:
High Speed Anti-Pogo
• Requires the hybrid stiffener
• Can be connected to any pogo channel
location
• For high performance ATE channels
• PS9G, PS-SL
• Assembly length and connector type can
be customized
• SMA, SMP, custom
6Universal Device Interface DUT Solutions for ATE
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Measurement of V93000 HSIO Channels
7Universal Device Interface DUT Solutions for ATE
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Fast Interconnect to PCB’s & Reference Boards
8Universal Device Interface DUT Solutions for ATE
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Development of Active Test Fixtures
9Universal Device Interface DUT Solutions for ATE
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
Extending HSIO Signal Performance
10
32 Gbps
40 Gbps
32 Gbps
40 Gbps
• Extends standard PS-SL
performance beyond
16Gbps
• Performance to 51Gbps
• Typical signal
performance
- 700 fs rms jitter
- <10 ps transition times
(20%-80%)
Universal Device Interface DUT Solutions for ATE
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
11
UDI Board for RFPA Fixtures
• UDI Stiffener used with PA evaluation boards in an engineering environment for fast bring-up of manufacturers reference boards
• UDI production solution for HVM shortens TTM and lowers fixture costs
UDI in Engineering
UDI in Production
Universal Device Interface DUT Solutions for ATE
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
12
18GHz Solution: Overview
• A compact external synthesizer is used as an LO to bring signals up to 18GHz down to a frequency range that is measureable by the native V93000 PSRF tester
• With FE24 card and PSRF 8GHz measurement solution this 18GHz module extends measurements to 18GHz
– We can measure CW or modulated signals to 18GHz
– Our prototype was validated with connectorized components
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
13
18GHz Solution: Synthesizer
• Foundation of this solution is Hittite HMC-C070 synthesizer
• Typical output power of +21dBm
• Capable of driving two mixers with a 2-way power splitter (6dB loss).
• Connects to 10MHz BNC on test head
• Controlled by SPI commands from standard SmarTest UTM
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
14
18GHz Solution: Block Diagram
• The 18 GHz solution is an external module (load board solution)
• To reduce cost, one synthesizer is shared between two sites
Mixer - Hittite HMC773
Hittite HMC-C070
Integrated Synthesizer
5.5GHz – 10.5GHz, +21dBm
0.01-8GHz to PSRF IF RF
LO
8-18GHz
from DUT
Mixer - Hittite HMC773
0.01-8GHz to PSRF IF RF
LO
8-18GHz
from DUT
Site 1
Site 2
10MHz Reference
from Tester
LPF
LPF
1:2
6 dB
DC to DC
SBI (3)
UP5V
3.6V 6V 20V
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
15
18GHz Solution: Performance
• Synth set to 10.5GHz, RF signal power (from Agilent E8257D sig gen) varied with freq. and power (top axis)
• Very linear over power range -30dBm to -90dBm• Measurable to -90dBm with very good linearity
-110
-100
-90
-80
-70
-60
-50
-40
-30
-90 -80 -70 -60 -50 -40 -30
7 GHz
8 GHz
9 GHz
10 GHz
11 GHz
12 GHz
13 GHz
14 GHz
15 GHz
16 GHz
Applied RF Signal vs. Measured RF Power
Direct
Path
LNA
Path
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
16
• Transfer Curves
• Top Axis: Applied Power (dBm)
• Blue: Measured Power (dBm)
• Red: Conversion Loss (dB)
18GHz Solution: Performance
12 GHz
7 GHz
16 GHz
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
17
18GHz Solution: Calibration
• Advantest will build these as hermetically sealed modules with factory calibration on an EEPROM with no further calibration needed
• Reduce burden of calibration for the end user
• Has slightly reduced accuracy compared to user-based calibration
• Eliminates need to have power meters and rack equipment on test floor
• Performance results indicate that calibration will be relatively easy to implement due to linearity of conversion loss
• The power supply and RF module are built to attach as a UDI anti-pogo assembly on one standard tester utility block
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
18
18GHz Solution: DC Supply Overview
• The V93000 5V Utility supply is used to generate three (3) separate voltages to power the synthesizer used with the 18GHz measurement module
• To keep tester costs down, we want to avoid using DPS resources
• Required power• Synthesizer pin VD1, 3.6V@125mA
• Synthesizer pin VD2, 20V@25mA
• Synthesizer pin VD3, 6.5V@375mA
• This is accomplished with 3 circuits
• All connected to the V93000 UP5V supplies• UP5V powers up when DUT board is docked
• All on same power supply UDI module
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
19
18GHz Solution: DC Supply Block Diagram
UP5V
UGNDGND
+20V@100mA
to VD2
of HMC-C070
Murata
BNX016-01
EMI Filter RR
TI
LMR62014 DC
Boost Switcher
+5V SW
GND
SHDNFB
R
C
UP5V
UGNDGND
Murata
BNX016-01
EMI Filter RR
TI
LMR10510 DC
Buck Switcher
+5V SW
GND
SHDNFB
RC
C
UP5V
UGNDGND
Murata
BNX016-01
EMI Filter RR
TI
LMR62421 DC
Boost Switcher
+5V SW
GND
SHDNFB
RC
+3.6V@125mA
to VD1
of HMC-C070
+6.5V@375mA
to VD3
of HMC-C070
C
C
C
UGND GND
UGND GND
UGND GND
C
C
L
L
L
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
20
Isolation of 10MHz Reference
DC Block
Transformer
10MHz Reference Output
from Tester(BNC Connector)
1 5
4 8
10MHz Reference To Synthesizer
Without DC block/transformer With DC block/transformer
Synthesizer output at 9GHz
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
21
18GHz Solution: DC Supply Learnings
• HMC-C070 contains LT1764 LDOs on 3.6V and 6.5V inputs
– Hittite did this allow the user to apply a simple 12V to both inputs
– Problem is that this would lead to additional heat dissipation
– HMC-C070 already generates a lot of heat
– Approach we took was to have regulation and conversion on the separate DC supply board and supply exactly the required voltages to the HMC-C070
• Grounding– Multiple signal and power grounds: UGND, RF-GND, D-GND, PS-GND,
10MHz REFOUT BNC shield (tester chassis GND)
– RF-GND, D-GND and PS-GND’s are connected at HMC-C070
– 10MHz REFOUT is isolated from the rest with DC block transformer
• We can produce a UDI power supply and 18GHz extension module for less than $3k
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
RF Harmonic Measurement (HM) Module
•RFPA Harmonic Filtering
•Built for dual site LTE/CDMA high and low band
•RFPA Applications Target•LTE, CDMA, 802.11ac
•Up to 18GHz
22
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
RFPA HM Low Band
Universal Device Interface DUT Solutions for ATE 23
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
LTE RFPA UDI and HM Module
Universal Device Interface DUT Solutions for ATE 24
Looking For That Four Leaf Clover - Test Cell IntegrationBiTS 2015Session 8 Presentation 2
March 15-18, 2015Burn-in & Test Strategies Workshop www.bitsworkshop.org
All Rights Reserved - ADVANTEST CORPORATION 25
• UDI
– Lowers cost of DUT fixtures
– Extends performance of standard ATE instruments
– UDI allows rapid prototyping and fast bring up for HSIO, RF and complex MX
reference boards
– Compatible with our standard docking and electrical interfaces
• 18GHz RF Solution– Available in 2015 as a packaged UDI module solution
• We also do a DUT board based connectorized version
– Key learnings from building the DC supply for the 18GHz solution• Base for RF module, EEPROM calibration support, ground management, UDI base
– Results indicate that calibration will be relatively easy to implement due to linearity of conversion loss
• Harmonic Measurement (HM) module– One board eliminates four (4) wideband directional couplers
– HM has same performance at <10% of the cost of traditional couplers
– Working on UDI anti-pogo version for 4 sites
– Evaluating higher frequency versions for additional applications• Higher power, modulated signals, fast signal switching
Summary