march 2007pommerenke, zhang 1 emc consortium university missouri rolla

70
March 2007 Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

Upload: john-parker

Post on 27-Mar-2015

219 views

Category:

Documents


1 download

TRANSCRIPT

Page 1: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 1

EMC Consortium

University Missouri Rolla

Page 2: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 2

UMR EMC Consortium

IntelSony

LG-Electronics

Apple, Altera

HuaWei

IBM

NEC

NCR

Hitachi

Zuken

TI

5 faculty

20+ grad. students

UMR EMC Consortium - Structure

CISCO

Focused research areas

Methodology results are shared

Freescale

GTL

Page 3: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 3

UMR EMC Consortium - Research

Classical EMC (Shielding, gaskets, etc.)

EMC Expert system

EMC test methods

IC related EMC (SSN, Current paths, Immunity)

Power Distribution - PCB level

Power Distribution - IC level

Signal Integrity: Link path analysis

ESD

Application of numerical methods

Design of numerical methods

Design of test instruments

Page 4: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 4

Immunity scanning results, identifying sensitive traces and comparing two “identical” ICs.

Performed for ESD like pulses coupling into a PC motherboard.

Color indicates sensitivity.

Page 5: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

5

UUMMRR EEMMCC LLaabboorraattoorryy

Jitter

Jianmin Zhang, David J. Pommerenke

Page 6: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 6

References

● Agilent Technologies, numerous application notes, see http://www.home.agilent.com/agilent/facet.jspx?to=80030.k.1&co=153297.i.1&cc=US&lc=eng&sm=g&k=jitter

● LeCroy, Tektronix, Bertscope● J. Hancock, “Jitter—understanding it, measuring it,

eliminating it Part 1-3”, From 2004 High Frequency Electronics

● A. Kuo etc. “Jitter models and measurement methods for high-speed serial interconnects”

● S. Tabatabaei etc, “Jitter generation and measurement for test of multi-GBPS serial IO”

● Altera Web Site, Le Croy Web site

Page 7: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 7

Introduction Eye diagram What is jitter? Phase noise, spectrum vs. jitter Why is jitter important? What causes jitter?

Jitter fundamentals Jitter components Jitter measurement views

Jitter measurement and analysis Real-time jitter analysis Techniques to isolate jitter components

Questions and answers

Outline

Page 8: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 8

Eye pattern

● A very effective method of measuring time distortion thru a data transmission system is based on the eye pattern, displayed on an oscilloscope.

● The eye pattern is simply the superposition - over one unit interval – of all the Zero–to–One and One–to-Zero transitions, each preceded and followed by various combinations of One and Zero, and also constant One and Zero levels.

● The data sequence can be generated by a pseudo-random sequence generator (PRSG), which is a digital shift register with feedback connected to produce a max length sequence.

Page 9: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 9

Process of creating an Eye-diagram

Page 10: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 10

Page 11: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 11

Ideal sampling position Timing skew Jitter

Ideal reference point

Voltage offset

Voltage Noise and required comparatorinput

Page 12: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 12

Logic-Based Measurement

● E.g., BERT

● Bit errors caused by jitter

● Data measured at sampling point has BER

● Sweeping the sampling point creates bathtub curve

0 1

Sampling Point

BER

Page 13: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 13

Time

BER

Time

BER

Eye diagram

Bit error curve as a function of sampling moment

How long would it take if we like to get down to 10e-12 Bit Error Rate?

Page 14: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 14

What Is Jitter?

Jitter: The deviation of the significant instances of a signal from their ideal location in time.

Or simply, Jitter is how early or late a signal transition is with reference to when it should transition.

The significant instances are the transition (crossover) points in a digital signal.

S(t) = P 2π f t + φ(t)d

Jitter is closely related to phase modulation.

P is a wave shape function, e.g., sin or square wave.

Page 15: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 15

It can be understood as

- phase variation (phase noise)

- timing variation (time shift of edges) [seconds] mostly used, intuitive system description, independent of data rate.

- fractions of the period (unit less) [%] Good for directly seeing how many percent of the eye is open

1

2 d

tf

( )t

t

T

Phase noise can be analyzed from many points of view:

What Is Jitter?

Page 16: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 16

Why Jitter Is Important?

● Jitter causes transmission errors or in another wording: Jitter limits the transmission speed.● Satisfy jitter budget BER (bit error rate) target● Identify jitter components diminish/decrease deleterious

effects on circuit performance from jitter

● Jitter limits the ability of A/D converters!

Note: Bit errors can also be caused by voltage noise: If the momentary noise voltage exceeds the noise margin, a wrong value can be sampled even if the sampling takes place at the correct moment in time.

Page 17: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 17

Jitter Tolerance of ADCs at Nyquist frequency (ps rms)

Page 18: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 18

Jitter applications

Signal jitter: Timing of a

signal (topic of this presentation)

Jitter tolerance: How much jitter, as a function of the jitter frequency, can be tolerated by a system

Jitter transfer: How strong, as a function of the jitter frequency, a

jitter at an input is transmitted to

an output in e.g., by a clock

recovery circuit

Page 19: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 19

Signal jitter: Why Jitter Is Used?

● Jitter is not a main system property, but Bit Error Rate (BER) is.

● Why not measuring BER directly?– BER measurement might take hours or days. – BER gives little information about the mechanism that cause errors,

but jitter does.

Transmittedwaveform

Receivedwaveform

Interpretedwaveform

Is this error caused by jitter?

Page 20: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 20

Signal

Ideal clock 1101001

Noisy clock 1101101

Degraded Degraded

Bit errors can also be caused by voltage noise: If the momentary noise voltage exceeds the noise margin, a wrong value can be sampled even if the sampling takes place at the correct moment in time.

Page 21: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 21

What Causes Jitter

Page 22: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 22

Main types of Jitter

DeterministicJitter (DJ)

RandomJitter (RJ)

Data Dependent Jitter (DDJ)

Inter-symbol Interference

(ISI)

Duty Cycle Distortion

(DCD)

Periodic Jitter PJ

Data-Correlated Data-Uncorrelated Total

Jitter (TJ)

Note shown: Sub rate Jitter (SRJ)

Page 23: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 23

Types of Jitter

Jitter can be random or deterministic. In most cases, both types occur.

PJ: Periodic Jitter (deterministic).

Is a periodic variation in the phase. Causes: External coupling into the circuit, power supply noise, PLL comparator frequency feed-through

RJ: Random Jitter

Random changes in the phase. It is often assumed to be of Gaussian distribution. Causes: Thermal Noise, Shot Noise

Let’s look at some examples

Page 24: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 24

Types of Jitter

Jitter can be random or deterministic. In most cases, both types occur.

DCD: Duty Cycle Distortion (deterministic).

Is the difference in the mean pulse width between positive and negative pulses in a clock. Causes: Amplitude offset, turn-on delay, saturation.

ISI: Inter-Symbol Interference (deterministic)

Previous signals have not rang down, before new data arrives. Causes: Impulse response is longer than a data bit.

Page 25: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 25

Phase Modulation - Jitter: The same

[sin(2 )]P ft

[0.04 sin(0.2 ) / 3]P ft

Phase modulated clock

Ideal clock

Sine Modulation term

[sin(2 ) 0.04

sin(0.2 ) / 3]

P ft

ft

f=1 GHz

Page 26: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 26

How does the Spectra look like?

Square wave

Phase modulated

0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8

0

10

20

30

40

50

60

70

80

90

Frequency (GHz)

0.6 0.8 1 1.2 1.4 1.6

0

20

40

60

80

Frequency (GHz)

Page 27: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 27

How Does the Eye-Diagram Look Like?

Page 28: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 28

How Does the Eye-Diagram Look Like?

How about using a square wave as phase modulator?

Page 29: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 29

How Does the Eye-Diagram Look Like?

How about using a Gaussian noise as phase modulator?

Page 30: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 30

Effect of data length:

Few hundred bits:

Billion bits:

What is the consequence for the eye opening, expressed in ps?

Page 31: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 31

Gaussian noise as modulator

Page 32: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 32

What is the difference in the histograms?

Page 33: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 33

Jitter Measurement—Bathtub Plot

Page 34: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 34

TJ Estimation

TJp-p = N x σrms + DJ

If the trigger point is 7 sigma away from the mean event, only 1 in 10e12 crossings will occur even beyond the trigger point.

Page 35: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 35

Real Zero Crossings vs. Ideal Ones

Page 36: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 36

Time interval error and jitter trend (integral of time interval error)

What does it mean if the jitter trend is continuously increasing over time?

Page 37: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 37

Histogram in A Square Wave Time interval error and jitter trend (integral of time interval error)

Page 38: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 38

Channel Characteristics

Frequency dependent

lossy channel

Discontinuities within the channel

Mismatched terminations

of the channel

Bandwidth limitation

Multi-reflections

Page 39: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 39

Channel Characteristics

Loss, reflections, cross talk, added white noise, time variations

frequency

S21

Frequency

Power

Page 40: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 40

Tx symbol

…000010000000…

In Out

Pulse response

Page 41: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 41

LTI property: Superposition of symbols

Tx symbol

…000010011100…

In Out

Response to pattern 100111

Page 42: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 42

Channel loss effect: Eye closure and DCD (single ended)

Page 43: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 43

Eye of a loss dominated differential channel

Page 44: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 44

Effect of reflections: Duty cycle distortion

Page 45: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 45

What Can You Tell?

Which jitter componentsdo you see?

What might cause them?

Page 46: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 46

Summarize Jitter Components

(TJ)Total Jitter

(DJ)Deterministic Jitter

(RJ)Random Jitter

(BUJ)Bounded

Uncorrelated Jitter

(DDJ)Data-Dependent

Jitter

(PJ)Periodic

Jitter

(ISI)Inter-Symbol Interference

(DCD)Duty-Cycle Distortion

Page 47: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 47

Jitter Measurement and Analysis

Page 48: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 48

Sequence of Jitter analysis

Step 1: Measure

- Real time scope

- Equivalent time scope

- Spectrum Analyzer

Step 2: Separate jitter components

- Average

- Change data pattern (PRBS to 01010101)

- TIE

- etc.

Page 49: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 49

Instruments to measure jitter

Real time oscilloscope:

Usually 8 bit, absolute clock, clock re-generation possible, bandwidth up to 20 GHz

Sampling oscilloscope:

11-14 bit, relative to clock, bandwidth up to 1000 GHz

Spectrum Analyzer:

No time resolution (“real time spectrum analyzers” are an exception), very good dynamic range. Bandwidth up to 1000 GHz.

Page 50: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 50

Real Time Jitter Analysis

● Timing Measurements:– Data: Time Interval Error (TIE), also called phase jitter.– Clock: Period, Cycle-to-cycle.

● Views:– Eye diagrams (repetitive volts vs. time)– Trend (time error vs. time)– Histograms (hits vs. time error)– Spectrum (time error vs. frequency)– Phase noise– Bathtub curves (BER vs. eye opening)

Page 51: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 51

Gaussian RJ RJ convoluted in DDJRF convoluted in PJ

Isolate Jitter Components for BER Estimation

Probability density Function (PDF) of jittering edge timing

• As mentioned on slide 11, RJ measurements must be decomposed from DJ components for total jitter estimation.

• Separating jitter components individually to diagnose root causes of jitters for further reducing TJ to meet jitter budget in systems.

TJp-p = N x σrms + DJ

Page 52: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 52

Advanced Instruments for Jitter Analysis

Advanced instruments for jitter analysis such as DCA-J (Digital Communication Analyzer-Jitter ) and BERT (Bit Error Ratio Tester) support:

• Decomposition of jitter into Total Jitter (TJ), Random Jitter (RJ), Deterministic Jitter (DJ), Periodic Jitter (PJ), Data Dependent Jitter (DDJ), Duty Cycle Distortion (DCD), and Jitter induced by Inter symbol Interference (ISI)

• Jitter frequency spectrum

Page 53: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 53

If always the same edge of a bit pattern is observed, then all DDJ is removed. Only non-correlated jitter, RJ and non correlated PJ remains.

If averaging is performed over the pattern (not the bits), then all non-correlated jitter: RJ and PJ is removed.

Page 54: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 54

Jitter Separation: Histogram is the convolution of RJ and PJ

● Single Edge– Histogram for RJPJ– RJ, PJ causes σ– DDJ causes

● Separate RJ, PJ by de-convolution0tt

His

togr

am

Jitter

His

togr

am

Jitter

His

togr

am

Jitter

Idea

l

t0t

0tt

RJ PJ

Page 55: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 55

An entire picture from a Jitter Analyzer (Agilent)

Page 56: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 56

Page 57: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 57

A View of Real-Time Jitter Measurement

Page 58: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 58

Inter-Symbol Interference (ISI): Caused by loss

Page 59: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 59

Inter-Symbol Interference (ISI): Caused by reflection

Page 60: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 60

Spread Spectrum Clock Measurement

Page 61: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 61

Uncorrelated Periodic Jitter Coupling

Page 62: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 62

How about A Gaussian Noise Modulating the Phase?

Bounded and non-bounded jitter?

Page 63: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 63

Bounded Uncorrelated Jitter (BUJ)

Corrupter

Threshold

TIE trend

Page 64: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 64

Duty-Cycle Distortion (DCD)

Page 65: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 65

Inter-Symbol Interference (ISI)

Page 66: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 66

Inter-Symbol Interference (ISI)

Page 67: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 67

Uncorrelated Periodic Jitter Coupling

Page 68: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 68

Overview of Jitter in Systems

Transmitter ReceiverSignal linkpath

· Lossy mediaà ISI· Discontinuitiesà ISI· Crosstalkà BUJ

· Device noise (Shot noise, Thermal noise, and pink noise)à RJ

· Power supply noiseà (RJ, PJ)· Duty-Cycle Distortionà DCD· On-chip couplingà BUJ

· Device noise (Shot noise, Thermal noise, and pink noise)à RJ

· Power supply noiseà (RJ, PJ)· Duty-Cycle Distortionà DCD· On-chip couplingà BUJ· Mismatch terminationsà ISI

Page 69: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 69

Duty-Cycle Distortion (DCD)

Page 70: March 2007Pommerenke, Zhang 1 EMC Consortium University Missouri Rolla

March 2007

Pommerenke, Zhang 70

Duty-Cycle Distortion (DCD)