measuring substitution patterns in differentiated product industries · jt;k( ) = z tˇ k + u jt;k...
TRANSCRIPT
![Page 1: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/1.jpg)
Measuring Substitution Patterns inDifferentiated Product Industries
Amit GandhiUniversity of Pennsylvania
Jean-Francois HoudeUW-Madison & NBER
April 9, 2019
Measuring Substitution Patterns 1 / 47
![Page 2: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/2.jpg)
Motivation
The Beauty of BLP: Flexible estimation of substitution patternswith many products, aggregate data, and unobserved attributes.
I Workhorse model to study demand for differentiated products in IOI Increasingly used to analyse sorting problems in urban, education,
insurance, etc.
Achieving this flexibility can be difficult in practice...
I Precision: Often rely on external restrictions (e.g. supply, survey, etc.)I Numerical: Multiple solutions and/or poor convergence properties
Measuring Substitution Patterns Introduction 2 / 47
![Page 3: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/3.jpg)
Motivation
The Beauty of BLP: Flexible estimation of substitution patternswith many products, aggregate data, and unobserved attributes.
I Workhorse model to study demand for differentiated products in IOI Increasingly used to analyse sorting problems in urban, education,
insurance, etc.
Achieving this flexibility can be difficult in practice...
I Precision: Often rely on external restrictions (e.g. supply, survey, etc.)I Numerical: Multiple solutions and/or poor convergence properties
Measuring Substitution Patterns Introduction 2 / 47
![Page 4: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/4.jpg)
Motivation
The Beauty of BLP: Flexible estimation of substitution patternswith many products, aggregate data, and unobserved attributes.
I Workhorse model to study demand for differentiated products in IOI Increasingly used to analyse sorting problems in urban, education,
insurance, etc.
Achieving this flexibility can be difficult in practice...
I Precision: Often rely on external restrictions (e.g. supply, survey, etc.)I Numerical: Multiple solutions and/or poor convergence properties
Measuring Substitution Patterns Introduction 2 / 47
![Page 5: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/5.jpg)
What explains the difficulties in practice?
Is the variation in data simply too weak?
Or is it weakness of the instruments (IVs)?I i.e., Are we using the variation in the data in the optimal way?
Our paper argue that many empiricists’ problems are caused byweak IVs
Show how to construct strong IVs using a new representation of thereduced-form of the model.
Measuring Substitution Patterns Introduction 3 / 47
![Page 6: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/6.jpg)
What explains the difficulties in practice?
Is the variation in data simply too weak?
Or is it weakness of the instruments (IVs)?I i.e., Are we using the variation in the data in the optimal way?
Our paper argue that many empiricists’ problems are caused byweak IVs
Show how to construct strong IVs using a new representation of thereduced-form of the model.
Measuring Substitution Patterns Introduction 3 / 47
![Page 7: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/7.jpg)
What explains the difficulties in practice?
Is the variation in data simply too weak?
Or is it weakness of the instruments (IVs)?I i.e., Are we using the variation in the data in the optimal way?
Our paper argue that many empiricists’ problems are caused byweak IVs
Show how to construct strong IVs using a new representation of thereduced-form of the model.
Measuring Substitution Patterns Introduction 3 / 47
![Page 8: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/8.jpg)
What explains the difficulties in practice?
Is the variation in data simply too weak?
Or is it weakness of the instruments (IVs)?I i.e., Are we using the variation in the data in the optimal way?
Our paper argue that many empiricists’ problems are caused byweak IVs
Show how to construct strong IVs using a new representation of thereduced-form of the model.
Measuring Substitution Patterns Introduction 3 / 47
![Page 9: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/9.jpg)
What explains the difficulties in practice?
Is the variation in data simply too weak?
Or is it weakness of the instruments (IVs)?I i.e., Are we using the variation in the data in the optimal way?
Our paper argue that many empiricists’ problems are caused byweak IVs
Show how to construct strong IVs using a new representation of thereduced-form of the model.
Measuring Substitution Patterns Introduction 3 / 47
![Page 10: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/10.jpg)
Key Takeaways
Differentiation IV: Capture the relative position of each product inthe characteristic space
I Approximate optimal IV without requiring initial estimatesI Simple to construct and test
Powerful in practice:
I 10+ improvement in precisionI Fast convergence + Numerically stableI Flexible substitution: Multiple dimensions + Correlated heterogeneity
Related work:
I Weak Identification: BLP (1999), Conlon (2013), Reynaert &Verboven (2013), Metaxoglou and Knittel (2014)
I Differentiation IV: Nested-Logit (e.g. Berry (1994), Verboven (1996),Bresnahan et al. (1997)), and Spatial Differentiation (e.g. Pinkse andSlade (2001), Davis (2006), Thomadsen (2005), Manuszak (2012),Houde (2012))
Measuring Substitution Patterns Introduction 4 / 47
![Page 11: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/11.jpg)
Key Takeaways
Differentiation IV: Capture the relative position of each product inthe characteristic space
I Approximate optimal IV without requiring initial estimatesI Simple to construct and test
Powerful in practice:
I 10+ improvement in precisionI Fast convergence + Numerically stableI Flexible substitution: Multiple dimensions + Correlated heterogeneity
Related work:
I Weak Identification: BLP (1999), Conlon (2013), Reynaert &Verboven (2013), Metaxoglou and Knittel (2014)
I Differentiation IV: Nested-Logit (e.g. Berry (1994), Verboven (1996),Bresnahan et al. (1997)), and Spatial Differentiation (e.g. Pinkse andSlade (2001), Davis (2006), Thomadsen (2005), Manuszak (2012),Houde (2012))
Measuring Substitution Patterns Introduction 4 / 47
![Page 12: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/12.jpg)
Key Takeaways
Differentiation IV: Capture the relative position of each product inthe characteristic space
I Approximate optimal IV without requiring initial estimatesI Simple to construct and test
Powerful in practice:
I 10+ improvement in precisionI Fast convergence + Numerically stableI Flexible substitution: Multiple dimensions + Correlated heterogeneity
Related work:
I Weak Identification: BLP (1999), Conlon (2013), Reynaert &Verboven (2013), Metaxoglou and Knittel (2014)
I Differentiation IV: Nested-Logit (e.g. Berry (1994), Verboven (1996),Bresnahan et al. (1997)), and Spatial Differentiation (e.g. Pinkse andSlade (2001), Davis (2006), Thomadsen (2005), Manuszak (2012),Houde (2012))
Measuring Substitution Patterns Introduction 4 / 47
![Page 13: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/13.jpg)
Key Takeaways
Differentiation IV: Capture the relative position of each product inthe characteristic space
I Approximate optimal IV without requiring initial estimatesI Simple to construct and test
Powerful in practice:
I 10+ improvement in precisionI Fast convergence + Numerically stableI Flexible substitution: Multiple dimensions + Correlated heterogeneity
Related work:
I Weak Identification: BLP (1999), Conlon (2013), Reynaert &Verboven (2013), Metaxoglou and Knittel (2014)
I Differentiation IV: Nested-Logit (e.g. Berry (1994), Verboven (1996),Bresnahan et al. (1997)), and Spatial Differentiation (e.g. Pinkse andSlade (2001), Davis (2006), Thomadsen (2005), Manuszak (2012),Houde (2012))
Measuring Substitution Patterns Introduction 4 / 47
![Page 14: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/14.jpg)
Baseline Model: Exogenous Characteristics
Data: Market shares (sjt) and characteristics (xjt) observed in Tindependent markets.
I Each market includes Jt products + an outside option (x0t = 0).
Demand: Linear random-coefficient with T1EV random utility shocks
σj
(δt , x
(2)t ;λ
)=
∫ exp(δjt + νT
i x(2)jt
)1 +
∑Jtj ′=1 exp
(δj ′t + νT
i x(2)j ′t
)dF (νi |λ)
where δjt = β0 + x(1)jt β1 + x
(2)jt β2 + ξjt .
The residual of the model is obtained from the inverse-demandfunction:
ρj (st , xt ; θ) = σ−1j
(st , x
(2)t ;λ
)− xjtβ, where θ = (β, λ).
Measuring Substitution Patterns The Identification Problem 5 / 47
![Page 15: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/15.jpg)
Baseline Model: Exogenous Characteristics
Data: Market shares (sjt) and characteristics (xjt) observed in Tindependent markets.
I Each market includes Jt products + an outside option (x0t = 0).
Demand: Linear random-coefficient with T1EV random utility shocks
σj
(δt , x
(2)t ;λ
)=
∫ exp(δjt + νT
i x(2)jt
)1 +
∑Jtj ′=1 exp
(δj ′t + νT
i x(2)j ′t
)dF (νi |λ)
where δjt = β0 + x(1)jt β1 + x
(2)jt β2 + ξjt .
The residual of the model is obtained from the inverse-demandfunction:
ρj (st , xt ; θ) = σ−1j
(st , x
(2)t ;λ
)− xjtβ, where θ = (β, λ).
Measuring Substitution Patterns The Identification Problem 5 / 47
![Page 16: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/16.jpg)
Baseline Model: Exogenous Characteristics
Data: Market shares (sjt) and characteristics (xjt) observed in Tindependent markets.
I Each market includes Jt products + an outside option (x0t = 0).
Demand: Linear random-coefficient with T1EV random utility shocks
σj
(δt , x
(2)t ;λ
)=
∫ exp(δjt + νT
i x(2)jt
)1 +
∑Jtj ′=1 exp
(δj ′t + νT
i x(2)j ′t
)dF (νi |λ)
where δjt = β0 + x(1)jt β1 + x
(2)jt β2 + ξjt .
The residual of the model is obtained from the inverse-demandfunction:
ρj (st , xt ; θ) = σ−1j
(st , x
(2)t ;λ
)− xjtβ, where θ = (β, λ).
Measuring Substitution Patterns The Identification Problem 5 / 47
![Page 17: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/17.jpg)
Identifying Assumption
Assumption: The unobserved attribute of each product isindependent of the menu, xt , of characteristics available in market t,
E [ξjt |xt ] = 0 (CMR).
In practice, the model is estimated using a finite number (L) ofunconditional moment restrictions, Aj (xt):
E[ρj (st , xt ; θ0) · Aj (xt)
]= 0
↔ E[(σ−1
j
(st , x
(2)t ;λ0
)− xjtβ
)· Aj (xt)
]= 0.
Our question: How to construct relevant instruments to identify λ?I Stock & Wright (2000): Aj (xt) is weak if the moment conditions are
almost satisfied away from the true parameters.
Measuring Substitution Patterns The Identification Problem 6 / 47
![Page 18: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/18.jpg)
Identifying Assumption
Assumption: The unobserved attribute of each product isindependent of the menu, xt , of characteristics available in market t,
E [ξjt |xt ] = 0 (CMR).
In practice, the model is estimated using a finite number (L) ofunconditional moment restrictions, Aj (xt):
E[ρj (st , xt ; θ0) · Aj (xt)
]= 0
↔ E[(σ−1
j
(st , x
(2)t ;λ0
)− xjtβ
)· Aj (xt)
]= 0.
Our question: How to construct relevant instruments to identify λ?I Stock & Wright (2000): Aj (xt) is weak if the moment conditions are
almost satisfied away from the true parameters.
Measuring Substitution Patterns The Identification Problem 6 / 47
![Page 19: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/19.jpg)
Illustration of the Weak IV ProblemTwo detection tests:
1 Testing the wrong model: IIA hypothesis
H0 : E [ρj (st , xt |β, λ = 0) · zjt ] = 0
↔ ln sjt/s0t = xjtβ + γzjt + ξjt
H0 : γ = 0
2 Local identification: Cragg-Donald rank test
rank(E[∂ρj (st , xt ; θ) /∂θT · zjt
])= m
↔ Jjt,k (θ) = ztπk + ujt,k
where πk are the “reduced-form” parameters of the model. This testcan be implemented in STATA (ivreg2 or ranktest).
Monte-Carlo design:I Sample: T = 100 and J = 15I Random utility with (independent) normal random-coefficients (K2)I DGP: (xjt,k , ξjt) ∼ N(0, I ) [homoscedasticity]
Measuring Substitution Patterns Illustration 7 / 47
![Page 20: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/20.jpg)
Illustration of the Weak IV ProblemTwo detection tests:
1 Testing the wrong model: IIA hypothesis
H0 : E [ρj (st , xt |β, λ = 0) · zjt ] = 0
↔ ln sjt/s0t = xjtβ + γzjt + ξjt
H0 : γ = 0
2 Local identification: Cragg-Donald rank test
rank(E[∂ρj (st , xt ; θ) /∂θT · zjt
])= m
↔ Jjt,k (θ) = ztπk + ujt,k
where πk are the “reduced-form” parameters of the model. This testcan be implemented in STATA (ivreg2 or ranktest).
Monte-Carlo design:I Sample: T = 100 and J = 15I Random utility with (independent) normal random-coefficients (K2)I DGP: (xjt,k , ξjt) ∼ N(0, I ) [homoscedasticity]
Measuring Substitution Patterns Illustration 7 / 47
![Page 21: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/21.jpg)
Illustration of the Weak IV ProblemTwo detection tests:
1 Testing the wrong model: IIA hypothesis
H0 : E [ρj (st , xt |β, λ = 0) · zjt ] = 0
↔ ln sjt/s0t = xjtβ + γzjt + ξjt
H0 : γ = 0
2 Local identification: Cragg-Donald rank test
rank(E[∂ρj (st , xt ; θ) /∂θT · zjt
])= m
↔ Jjt,k (θ) = ztπk + ujt,k
where πk are the “reduced-form” parameters of the model. This testcan be implemented in STATA (ivreg2 or ranktest).
Monte-Carlo design:I Sample: T = 100 and J = 15I Random utility with (independent) normal random-coefficients (K2)I DGP: (xjt,k , ξjt) ∼ N(0, I ) [homoscedasticity]
Measuring Substitution Patterns Illustration 7 / 47
![Page 22: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/22.jpg)
Illustration of the Weak IV ProblemTwo detection tests:
1 Testing the wrong model: IIA hypothesis
H0 : E [ρj (st , xt |β, λ = 0) · zjt ] = 0
↔ ln sjt/s0t = xjtβ + γzjt + ξjt
H0 : γ = 0
2 Local identification: Cragg-Donald rank test
rank(E[∂ρj (st , xt ; θ) /∂θT · zjt
])= m
↔ Jjt,k (θ) = ztπk + ujt,k
where πk are the “reduced-form” parameters of the model. This testcan be implemented in STATA (ivreg2 or ranktest).
Monte-Carlo design:I Sample: T = 100 and J = 15I Random utility with (independent) normal random-coefficients (K2)I DGP: (xjt,k , ξjt) ∼ N(0, I ) [homoscedasticity]
Measuring Substitution Patterns Illustration 7 / 47
![Page 23: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/23.jpg)
Weak Identification in a Picture: IIA Test
(A) IV: Sum of rivals’ characteristics
-12 -10 -8 -6 -4 -2 0 2 4 6 8
-3-2
-10
12
34
Regression R2 = 0.0006
Res
idua
l qua
litie
s at
Σ=
0
Sum of rival characteristics
(B) IV: Euclidean distance in x
-2 -1 0 1 2 3 4 5 6 7 8 9 10 11
-3-2
-10
12
34
5
Regression R2 = 0.364
Res
idua
l qua
litie
s at
Σ=
0
Euclidian distance (x)
Takeaway: Independence of ξjt and the distance of rivalcharacteristics rules out the IIA hypothesis, but not the sum of rivalcharacteristics.
Measuring Substitution Patterns Illustration 8 / 47
![Page 24: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/24.jpg)
Weak Identification in a Picture: IIA Test
(A) IV: Sum of rivals’ characteristics
-12 -10 -8 -6 -4 -2 0 2 4 6 8
-3-2
-10
12
34
Regression R2 = 0.0006
Res
idua
l qua
litie
s at
Σ=
0
Sum of rival characteristics
(B) IV: Euclidean distance in x
-2 -1 0 1 2 3 4 5 6 7 8 9 10 11
-3-2
-10
12
34
5
Regression R2 = 0.364
Res
idua
l qua
litie
s at
Σ=
0
Euclidian distance (x)
Takeaway: Independence of ξjt and the distance of rivalcharacteristics rules out the IIA hypothesis, but not the sum of rivalcharacteristics.
Measuring Substitution Patterns Illustration 8 / 47
![Page 25: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/25.jpg)
Weak Identification in a Picture: IIA Test
(A) IV: Sum of rivals’ characteristics
-12 -10 -8 -6 -4 -2 0 2 4 6 8
-3-2
-10
12
34
Regression R2 = 0.0006
Res
idua
l qua
litie
s at
Σ=
0
Sum of rival characteristics
(B) IV: Euclidean distance in x
-2 -1 0 1 2 3 4 5 6 7 8 9 10 11
-3-2
-10
12
34
5
Regression R2 = 0.364
Res
idua
l qua
litie
s at
Σ=
0
Euclidian distance (x)
Takeaway: Independence of ξjt and the distance of rivalcharacteristics rules out the IIA hypothesis, but not the sum of rivalcharacteristics.
Measuring Substitution Patterns Illustration 8 / 47
![Page 26: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/26.jpg)
Weak Identification in a Picture: IIA Test
(A) IV: Sum of rivals’ characteristics
-12 -10 -8 -6 -4 -2 0 2 4 6 8
-3-2
-10
12
34
Regression R2 = 0.0006
Res
idua
l qua
litie
s at
Σ=
0
Sum of rival characteristics
(B) IV: Euclidean distance in x
-2 -1 0 1 2 3 4 5 6 7 8 9 10 11
-3-2
-10
12
34
5
Regression R2 = 0.364
Res
idua
l qua
litie
s at
Σ=
0
Euclidian distance (x)
Takeaway: Independence of ξjt and the distance of rivalcharacteristics rules out the IIA hypothesis, but not the sum of rivalcharacteristics.
Measuring Substitution Patterns Illustration 8 / 47
![Page 27: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/27.jpg)
Distribution of σ2 with weak IVs
0.0
5.1
.15
.2Fraction
0 5 10 15 20 25Parameter estimates (exp)
Shapiro-Wilk test for normality: 15.71 (0). Width = 1.
Measuring Substitution Patterns Illustration 9 / 47
![Page 28: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/28.jpg)
GMM Estimates with Weak IVs
K2 = 1 K2 = 2 K2 = 3 K2 = 4bias rmse bias rmse bias rmse bias rmse
log σ1 -11.29 95.93 -5.43 74.95 -1.15 5.50 -8.40 229.67log σ2 -4.69 58.31 -1.36 6.26 -1.10 6.17log σ3 -1.41 9.20 -4.66 112.64log σ4 -0.93 4.02σ1 0.14 2.64 -0.01 2.49 -0.03 2.19 0.22 2.35σ2 0.12 2.42 -0.01 2.27 0.10 2.30σ3 0.18 2.38 0.11 2.38σ4 0.08 2.211(Local-min) 0.19 0.51 0.59 0.66Range(J) 0.74 1.15 1.64 1.51Range(pv) 0.17 0.19 0.21 0.21Range(log σ) 11.74 6.64 6.58 4.86Rank-test 1.26 0.46 0.26 0.18p-value 0.62 0.81 0.89 0.92IIA-test 1.33 1.30 1.49 1.94p-value 0.43 0.42 0.36 0.24
Measuring Substitution Patterns Illustration 10 / 47
![Page 29: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/29.jpg)
GMM Estimates with Weak IVs
K2 = 1 K2 = 2 K2 = 3 K2 = 4bias rmse bias rmse bias rmse bias rmse
log σ1 -11.29 95.93 -5.43 74.95 -1.15 5.50 -8.40 229.67log σ2 -4.69 58.31 -1.36 6.26 -1.10 6.17log σ3 -1.41 9.20 -4.66 112.64log σ4 -0.93 4.02σ1 0.14 2.64 -0.01 2.49 -0.03 2.19 0.22 2.35σ2 0.12 2.42 -0.01 2.27 0.10 2.30σ3 0.18 2.38 0.11 2.38σ4 0.08 2.211(Local-min) 0.19 0.51 0.59 0.66Range(J) 0.74 1.15 1.64 1.51Range(pv) 0.17 0.19 0.21 0.21Range(log σ) 11.74 6.64 6.58 4.86Rank-test 1.26 0.46 0.26 0.18p-value 0.62 0.81 0.89 0.92IIA-test 1.33 1.30 1.49 1.94p-value 0.43 0.42 0.36 0.24
Measuring Substitution Patterns Illustration 11 / 47
![Page 30: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/30.jpg)
GMM Estimates with Weak IVs
K2 = 1 K2 = 2 K2 = 3 K2 = 4bias rmse bias rmse bias rmse bias rmse
log σ1 -11.29 95.93 -5.43 74.95 -1.15 5.50 -8.40 229.67log σ2 -4.69 58.31 -1.36 6.26 -1.10 6.17log σ3 -1.41 9.20 -4.66 112.64log σ4 -0.93 4.02σ1 0.14 2.64 -0.01 2.49 -0.03 2.19 0.22 2.35σ2 0.12 2.42 -0.01 2.27 0.10 2.30σ3 0.18 2.38 0.11 2.38σ4 0.08 2.211(Local-min) 0.19 0.51 0.59 0.66Range(J) 0.74 1.15 1.64 1.51Range(pv) 0.17 0.19 0.21 0.21Range(log σ) 11.74 6.64 6.58 4.86Rank-test 1.26 0.46 0.26 0.18p-value 0.62 0.81 0.89 0.92IIA-test 1.33 1.30 1.49 1.94p-value 0.43 0.42 0.36 0.24
Measuring Substitution Patterns Illustration 12 / 47
![Page 31: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/31.jpg)
Identification problem
Simultaneous equation: Reduced-form vs structural equation
ρj (st , xt ; θ) = σ−1j
(st , x
(2)t ;λ0
)︸ ︷︷ ︸
Structural equation
−xjtβ
E [ρj (st , xt ; θ)|xt ] = 0, iff θ = θ0
⇔ E[σ−1
j
(st , x
(2)t ;λ0
)|xt
]︸ ︷︷ ︸
Reduced-form: gj (xt )
−β0 − x(1)jt β1 − x
(2)jt β2 = 0
Example: Quasi-linear utility with exogenous prices
uijt = xjtbi − pjt + ξjt + εijt ; bi = β + ληi
→ pjt = xjtβ + σ−1j (st , x
(2);λ) + ξjt = Non-linear IV regression
Insight from Berry & Haile: The presence of a special regressor
x(1)jt implies that x
(1)−j ,t can be used as excluded instruments for the
endogenous shares.
Measuring Substitution Patterns Identification 13 / 47
![Page 32: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/32.jpg)
Identification problem
Simultaneous equation: Reduced-form vs structural equation
ρj (st , xt ; θ) = σ−1j
(st , x
(2)t ;λ0
)︸ ︷︷ ︸
Structural equation
−xjtβ
E [ρj (st , xt ; θ)|xt ] = 0, iff θ = θ0
⇔ E[σ−1
j
(st , x
(2)t ;λ0
)|xt
]︸ ︷︷ ︸
Reduced-form: gj (xt )
−β0 − x(1)jt β1 − x
(2)jt β2 = 0
Example: Quasi-linear utility with exogenous prices
uijt = xjtbi − pjt + ξjt + εijt ; bi = β + ληi
→ pjt = xjtβ + σ−1j (st , x
(2);λ) + ξjt = Non-linear IV regression
Insight from Berry & Haile: The presence of a special regressor
x(1)jt implies that x
(1)−j ,t can be used as excluded instruments for the
endogenous shares.
Measuring Substitution Patterns Identification 13 / 47
![Page 33: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/33.jpg)
Identification problem
Simultaneous equation: Reduced-form vs structural equation
ρj (st , xt ; θ) = σ−1j
(st , x
(2)t ;λ0
)︸ ︷︷ ︸
Structural equation
−xjtβ
E [ρj (st , xt ; θ)|xt ] = 0, iff θ = θ0
⇔ E[σ−1
j
(st , x
(2)t ;λ0
)|xt
]︸ ︷︷ ︸
Reduced-form: gj (xt )
−β0 − x(1)jt β1 − x
(2)jt β2 = 0
Example: Quasi-linear utility with exogenous prices
uijt = xjtbi − pjt + ξjt + εijt ; bi = β + ληi
→ pjt = xjtβ + σ−1j (st , x
(2);λ) + ξjt = Non-linear IV regression
Insight from Berry & Haile: The presence of a special regressor
x(1)jt implies that x
(1)−j ,t can be used as excluded instruments for the
endogenous shares.
Measuring Substitution Patterns Identification 13 / 47
![Page 34: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/34.jpg)
How to construct relevant instrument?
Since dim(xt) >> dim(λ) = m, any transformation ofxt = {x1t , . . . , xJt ,t} can be used to construct valid moments.
Definition: An “efficient” instrument is a (basis) function AL(xt) ofdimension L, that can approximate the reduced-form of the modelarbitrarily well:
E[σ−1
j
(st , x
(2)t ;λ0
)|xt
]− AL
j (xt)γL → 0, as L and n get large.
I Where γL are OLS coefficients obtained by projecting σ−1 onto ALj (xt).
The same basis functions can be used to construct Chamberlain(1987)’s optimal instruments. See Newey (1990).
Measuring Substitution Patterns Identification 14 / 47
![Page 35: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/35.jpg)
How to construct relevant instrument?
Since dim(xt) >> dim(λ) = m, any transformation ofxt = {x1t , . . . , xJt ,t} can be used to construct valid moments.
Definition: An “efficient” instrument is a (basis) function AL(xt) ofdimension L, that can approximate the reduced-form of the modelarbitrarily well:
E[σ−1
j
(st , x
(2)t ;λ0
)|xt
]− AL
j (xt)γL → 0, as L and n get large.
I Where γL are OLS coefficients obtained by projecting σ−1 onto ALj (xt).
The same basis functions can be used to construct Chamberlain(1987)’s optimal instruments. See Newey (1990).
Measuring Substitution Patterns Identification 14 / 47
![Page 36: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/36.jpg)
How to construct relevant instrument?
Since dim(xt) >> dim(λ) = m, any transformation ofxt = {x1t , . . . , xJt ,t} can be used to construct valid moments.
Definition: An “efficient” instrument is a (basis) function AL(xt) ofdimension L, that can approximate the reduced-form of the modelarbitrarily well:
E[σ−1
j
(st , x
(2)t ;λ0
)|xt
]− AL
j (xt)γL → 0, as L and n get large.
I Where γL are OLS coefficients obtained by projecting σ−1 onto ALj (xt).
The same basis functions can be used to construct Chamberlain(1987)’s optimal instruments. See Newey (1990).
Measuring Substitution Patterns Identification 14 / 47
![Page 37: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/37.jpg)
Curse of Dimensionality Problem
Curse of Dimensionality: The reduced-form is a product-specificfunction of the entire menu of product characteristics.
I As J ↑, both the number of arguments and the number of functions toapproximate increase.
Without further restrictions, we cannot directly use the insights of BHto construct relevant IVs
Measuring Substitution Patterns Identification 15 / 47
![Page 38: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/38.jpg)
What does the characteristic structure imply about thereduced-form of the model?
Market-structure facing product j (dropping t):
(w j ,w−j ) ≡((δj , x
(2)j
),(δ−j , x
(2)−j
))Properties of the linear-in-characteristics model:
I Symmetry:σj (w j ,w−j ) = σk (w j ,w−j ) ∀k 6= j
I Anonymity:σ (w j ,w−j ) = σ
(w j ,wρ(−j)
)∀ρ
I Translation invariant: for any c ∈ RK
σ (w j + (0, c) ,w−j + (0, c)) = σ (w j ,w−j )
Measuring Substitution Patterns Identification 16 / 47
![Page 39: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/39.jpg)
What does the characteristic structure imply about thereduced-form of the model?
Market-structure facing product j (dropping t):
(w j ,w−j ) ≡((δj , x
(2)j
),(δ−j , x
(2)−j
))
Properties of the linear-in-characteristics model:
I Symmetry:σj (w j ,w−j ) = σk (w j ,w−j ) ∀k 6= j
I Anonymity:σ (w j ,w−j ) = σ
(w j ,wρ(−j)
)∀ρ
I Translation invariant: for any c ∈ RK
σ (w j + (0, c) ,w−j + (0, c)) = σ (w j ,w−j )
Measuring Substitution Patterns Identification 16 / 47
![Page 40: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/40.jpg)
What does the characteristic structure imply about thereduced-form of the model?
Market-structure facing product j (dropping t):
(w j ,w−j ) ≡((δj , x
(2)j
),(δ−j , x
(2)−j
))Properties of the linear-in-characteristics model:
I Symmetry:σj (w j ,w−j ) = σk (w j ,w−j ) ∀k 6= j
I Anonymity:σ (w j ,w−j ) = σ
(w j ,wρ(−j)
)∀ρ
I Translation invariant: for any c ∈ RK
σ (w j + (0, c) ,w−j + (0, c)) = σ (w j ,w−j )
Measuring Substitution Patterns Identification 16 / 47
![Page 41: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/41.jpg)
What does the characteristic structure imply about thereduced-form of the model?
Market-structure facing product j (dropping t):
(w j ,w−j ) ≡((δj , x
(2)j
),(δ−j , x
(2)−j
))Properties of the linear-in-characteristics model:
I Symmetry:σj (w j ,w−j ) = σk (w j ,w−j ) ∀k 6= j
I Anonymity:σ (w j ,w−j ) = σ
(w j ,wρ(−j)
)∀ρ
I Translation invariant: for any c ∈ RK
σ (w j + (0, c) ,w−j + (0, c)) = σ (w j ,w−j )
Measuring Substitution Patterns Identification 16 / 47
![Page 42: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/42.jpg)
What does the characteristic structure imply about thereduced-form of the model?
Market-structure facing product j (dropping t):
(w j ,w−j ) ≡((δj , x
(2)j
),(δ−j , x
(2)−j
))Properties of the linear-in-characteristics model:
I Symmetry:σj (w j ,w−j ) = σk (w j ,w−j ) ∀k 6= j
I Anonymity:σ (w j ,w−j ) = σ
(w j ,wρ(−j)
)∀ρ
I Translation invariant: for any c ∈ RK
σ (w j + (0, c) ,w−j + (0, c)) = σ (w j ,w−j )
Measuring Substitution Patterns Identification 16 / 47
![Page 43: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/43.jpg)
Re-Express the Demand System
Express the “state” of the market in differences relative to j and treatthe outside option just like any other product.
I Characteristic differences:
d (2)j,k = x (2)
k − x (2)j
I New normalization:
τj =exp(δj )
1 +∑
j′ exp(δj′),∀j = 0, . . . , n.
I Product k attributes: ωj,k =(τk ,d
(2)jt,k
)Demand for product j is a fully exchangeable function of ωj :
σ (w j ,w−j ) = D(ωj )
where ωj = {ωj ,0, . . . , ωj ,j−1, ωj ,j+1, . . . , ωj ,n}.
Measuring Substitution Patterns Identification 17 / 47
![Page 44: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/44.jpg)
Re-Express the Demand System
Express the “state” of the market in differences relative to j and treatthe outside option just like any other product.
I Characteristic differences:
d (2)j,k = x (2)
k − x (2)j
I New normalization:
τj =exp(δj )
1 +∑
j′ exp(δj′),∀j = 0, . . . , n.
I Product k attributes: ωj,k =(τk ,d
(2)jt,k
)
Demand for product j is a fully exchangeable function of ωj :
σ (w j ,w−j ) = D(ωj )
where ωj = {ωj ,0, . . . , ωj ,j−1, ωj ,j+1, . . . , ωj ,n}.
Measuring Substitution Patterns Identification 17 / 47
![Page 45: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/45.jpg)
Re-Express the Demand System
Express the “state” of the market in differences relative to j and treatthe outside option just like any other product.
I Characteristic differences:
d (2)j,k = x (2)
k − x (2)j
I New normalization:
τj =exp(δj )
1 +∑
j′ exp(δj′),∀j = 0, . . . , n.
I Product k attributes: ωj,k =(τk ,d
(2)jt,k
)Demand for product j is a fully exchangeable function of ωj :
σ (w j ,w−j ) = D(ωj )
where ωj = {ωj ,0, . . . , ωj ,j−1, ωj ,j+1, . . . , ωj ,n}.
Measuring Substitution Patterns Identification 17 / 47
![Page 46: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/46.jpg)
Main Theory Result
Define the exogenous state of the market facing product j :
d j ,k = xk − x j
d j = (d j ,0, . . . ,d j ,j−1,d j ,j+1, . . . ,d j ,n)
Theorem
If the distribution of {ξj}j=1,...,n is exchangeable (conditional on xjt), thenthe reduced form becomes
E[σ−1
j
(s, x (2);λ0
)|x]
= g (d j )
where g is a symmetric function of the state vector.
Implication: g is a vector symmetric function (see Briand 2009)
Measuring Substitution Patterns Identification 18 / 47
![Page 47: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/47.jpg)
Main Theory Result
Define the exogenous state of the market facing product j :
d j ,k = xk − x j
d j = (d j ,0, . . . ,d j ,j−1,d j ,j+1, . . . ,d j ,n)
Theorem
If the distribution of {ξj}j=1,...,n is exchangeable (conditional on xjt), thenthe reduced form becomes
E[σ−1
j
(s, x (2);λ0
)|x]
= g (d j )
where g is a symmetric function of the state vector.
Implication: g is a vector symmetric function (see Briand 2009)
Measuring Substitution Patterns Identification 18 / 47
![Page 48: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/48.jpg)
Main Theory Result
Define the exogenous state of the market facing product j :
d j ,k = xk − x j
d j = (d j ,0, . . . ,d j ,j−1,d j ,j+1, . . . ,d j ,n)
Theorem
If the distribution of {ξj}j=1,...,n is exchangeable (conditional on xjt), thenthe reduced form becomes
E[σ−1
j
(s, x (2);λ0
)|x]
= g (d j )
where g is a symmetric function of the state vector.
Implication: g is a vector symmetric function (see Briand 2009)
Measuring Substitution Patterns Identification 18 / 47
![Page 49: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/49.jpg)
Why is it useful?1 Curse of dimensionality: The number of basis functions necessary
to approximate the reduced-form is independent of the number ofproducts and markets (Pakes (1994), Altonji and Matzkin (2005)).
2 Example: Single dimension djt = {x1t − xjt , x2t − xjt , . . . , xJt ,t − xjt}I First-order approximation of g(d):
g(djt) ≈∑
j′
γ1j′djt,j′ = γ1
∑j′
djt,j′
I Second-order approximation of g(d):
g(djt) ≈∑
j′
γ1j′djt,j′ +
∑j′
γ2j′(djt,j′)
2 + γ3
∑j′
djt,j′
2
= γ1
∑j′
djt,j′
+ γ2
∑j′
(djt,j′)2
+ γ3
∑j′
djt,j′
2
Measuring Substitution Patterns Identification 19 / 47
![Page 50: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/50.jpg)
Why is it useful?1 Curse of dimensionality: The number of basis functions necessary
to approximate the reduced-form is independent of the number ofproducts and markets (Pakes (1994), Altonji and Matzkin (2005)).
2 Example: Single dimension djt = {x1t − xjt , x2t − xjt , . . . , xJt ,t − xjt}I First-order approximation of g(d):
g(djt) ≈∑
j′
γ1j′djt,j′ = γ1
∑j′
djt,j′
I Second-order approximation of g(d):
g(djt) ≈∑
j′
γ1j′djt,j′ +
∑j′
γ2j′(djt,j′)
2 + γ3
∑j′
djt,j′
2
= γ1
∑j′
djt,j′
+ γ2
∑j′
(djt,j′)2
+ γ3
∑j′
djt,j′
2
Measuring Substitution Patterns Identification 19 / 47
![Page 51: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/51.jpg)
Closing the loop: What is a relevant IV?
Let Aj (x t) be an L vector of basis functions summarizing theempirical distribution of characteristic differences: {d jt,k}k=0,...,Jt .
Differentiation IV: These functions are moments describing therelative isolation of each product in characteristic space.
Donald, Imbens, and Newey (2003): Using basis functions directlyas IVs, is asymptotically equivalent to approximating the optimal IV.
I Recommended practice is to use low-order basis functions (Donald,Imbens, and Newey 2008).
Measuring Substitution Patterns Differentiation IVs 20 / 47
![Page 52: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/52.jpg)
Closing the loop: What is a relevant IV?
Let Aj (x t) be an L vector of basis functions summarizing theempirical distribution of characteristic differences: {d jt,k}k=0,...,Jt .
Differentiation IV: These functions are moments describing therelative isolation of each product in characteristic space.
Donald, Imbens, and Newey (2003): Using basis functions directlyas IVs, is asymptotically equivalent to approximating the optimal IV.
I Recommended practice is to use low-order basis functions (Donald,Imbens, and Newey 2008).
Measuring Substitution Patterns Differentiation IVs 20 / 47
![Page 53: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/53.jpg)
Closing the loop: What is a relevant IV?
Let Aj (x t) be an L vector of basis functions summarizing theempirical distribution of characteristic differences: {d jt,k}k=0,...,Jt .
Differentiation IV: These functions are moments describing therelative isolation of each product in characteristic space.
Donald, Imbens, and Newey (2003): Using basis functions directlyas IVs, is asymptotically equivalent to approximating the optimal IV.
I Recommended practice is to use low-order basis functions (Donald,Imbens, and Newey 2008).
Measuring Substitution Patterns Differentiation IVs 20 / 47
![Page 54: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/54.jpg)
Suggestion 1: Polynomial Basis
Single dimension measures of differentiation
Quadratic: Aj (xt) =∑
j ′
(dk
jt,j ′
)2
Note:√zjt,k is the Euclidian distance between product j and its rivals
in market t along dimension k .
Adding interaction terms:
Covariance: Aj (xt) =∑
j ′
dkjt,j ′ × d l
jt,j ′
Note: In general, the first-order basis is weak because it does notvary across products within markets (i.e. sum of rival characteristics).
Measuring Substitution Patterns Differentiation IVs 21 / 47
![Page 55: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/55.jpg)
Suggestion 1: Polynomial Basis
Single dimension measures of differentiation
Quadratic: Aj (xt) =∑
j ′
(dk
jt,j ′
)2
Note:√zjt,k is the Euclidian distance between product j and its rivals
in market t along dimension k .
Adding interaction terms:
Covariance: Aj (xt) =∑
j ′
dkjt,j ′ × d l
jt,j ′
Note: In general, the first-order basis is weak because it does notvary across products within markets (i.e. sum of rival characteristics).
Measuring Substitution Patterns Differentiation IVs 21 / 47
![Page 56: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/56.jpg)
Suggestion 2: Histogram Basis
Single dimension measure of differentiation = Number of rivals indiscrete bins
Aj (xt) =
∑j ′
1(dk
jt,j ′ < κl
)l=1,...,L
Multi-dimension measure of differentiation:
Aj (xt) =
∑j ′
1(dk
jt,j ′ < κl
)1(dk ′
jt,j ′ < κl ′
)l=1,...,L,l ′=1,...,L
Note: This approach is advisable only in very large samples (+largechoice-sets), and when the goal is to estimate a flexible distribution ofRCs (e.g. correlation terms)
Measuring Substitution Patterns Differentiation IVs 22 / 47
![Page 57: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/57.jpg)
Suggestion 2: Histogram Basis
Single dimension measure of differentiation = Number of rivals indiscrete bins
Aj (xt) =
∑j ′
1(dk
jt,j ′ < κl
)l=1,...,L
Multi-dimension measure of differentiation:
Aj (xt) =
∑j ′
1(dk
jt,j ′ < κl
)1(dk ′
jt,j ′ < κl ′
)l=1,...,L,l ′=1,...,L
Note: This approach is advisable only in very large samples (+largechoice-sets), and when the goal is to estimate a flexible distribution ofRCs (e.g. correlation terms)
Measuring Substitution Patterns Differentiation IVs 22 / 47
![Page 58: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/58.jpg)
Suggestion 3: Local Basis
In most parametric models, the inverse demand is function ofcharacteristics of close-by rivals. Therefore, the characteristics of“nearby” rivals should more relevant.
Single dimension measure of differentiation = Number of nearby rivalsalong each dimension
Aj (xt) =∑
j ′
1(|dk
jt,j ′ | < κk
), e.g. κk = sd(xjt,k)
Multi-dimension measure of differentiation:
Aj (xt) =∑
j ′
1(|dk
jt,j ′ | < κk
)× djt,l , e.g. κk = sd(xjt,k)
When xjt,k is discrete, this basis function boils down to the familiarNested-logit IVs (e.g. Berry (1994), Bresnahan et al. (1997)).
Measuring Substitution Patterns Differentiation IVs 23 / 47
![Page 59: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/59.jpg)
Suggestion 3: Local Basis
In most parametric models, the inverse demand is function ofcharacteristics of close-by rivals. Therefore, the characteristics of“nearby” rivals should more relevant.
Single dimension measure of differentiation = Number of nearby rivalsalong each dimension
Aj (xt) =∑
j ′
1(|dk
jt,j ′ | < κk
), e.g. κk = sd(xjt,k )
Multi-dimension measure of differentiation:
Aj (xt) =∑
j ′
1(|dk
jt,j ′ | < κk
)× djt,l , e.g. κk = sd(xjt,k )
When xjt,k is discrete, this basis function boils down to the familiarNested-logit IVs (e.g. Berry (1994), Bresnahan et al. (1997)).
Measuring Substitution Patterns Differentiation IVs 23 / 47
![Page 60: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/60.jpg)
Suggestion 4: Demographics
In many settings, product characteristics are fixed across markets, butthe distribution of consumer types vary (e.g. Nevo 2001).
To fix ideas, focus on a single non-linear characteristics x(2)j
Consumer valuation for x(2)j is
βit = zitπ + νi
where νi ∼ N(0, σ2x ).
Assumption: The distribution of demographics across markets isknown, and can be decomposed as follows: zit = µt + sdteit , whereeit ∼ F (·) and F (·) is common across markets.
I Example: BLP95 assume that the income distribution is log-normalwith market-specific mean/variance.
Measuring Substitution Patterns Differentiation IVs 24 / 47
![Page 61: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/61.jpg)
Suggestion 4: Demographics
Demand function:
σjt(δt , x(2)|π, σx ) =
=
∫ ∫ exp(δjt + zitπx
(2)j + νix
(2)j
)1 +
∑j′ exp
(δj′t + zitπx
(2)j′ + νix
(2)j′
)dFt(zit)φ(νi ;λ)
=
∫ ∫ exp(δjt + πeitσtx
(2)j + πµtx
(2) + νix(2)j
)1 +
∑j′ exp
(δj′t + πeitσtx
(2)j′ + πµtx
(2)j′ + νix
(2)j′
)dF (eit)φ(νi ;λ)
= σj (δj , x(2), σtx
(2), µtx(2)︸ ︷︷ ︸
new characteristics
|π, σx )
= D(ωt , d(2), σtd
(2), µtd(2)|θ): Symmetric function!
The reduced-form of this transformed model can therefore be written:
E[σ−1
jt (st , x(2)|π, σx )|xt , µt , σt
]= g(dt , µtd
(2), σtd(2))
Measuring Substitution Patterns Differentiation IVs 25 / 47
![Page 62: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/62.jpg)
Suggestion 4: Demographics
Differentiation IVs with demographics:
At(xt , µt , σt) =∑
j ′
1(|dk
jt,j ′ | < κk
)× µt
At(xt , µt , σt) =∑
j ′
1(|dk
jt,j ′ | < κk
)× σt
At(xt , µt , σt) =∑
j ′
1(|dk
jt,j ′ | < κk
)× σt × d l
jt,j ′
When the distribution of demographics can be “standardized” acrossmarkets, this characterization is exact.
I Differentiation IVs should be interacted with moments of thedistribution of consumer characteristics to separately identify the twosources of heterogeneity.
Example: Miravete, Seim, and Thurk (2017)I Combine nested-logit ‘type’ instruments, with moments of the
distribution of demographics across stores.
Measuring Substitution Patterns Differentiation IVs 26 / 47
![Page 63: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/63.jpg)
Monte-Carlo Simulations
1 Independent random coefficients
2 Correlated random coefficients
3 Endogenous prices
4 Natural experiments
5 Optimal IV approximation: Comparison with Berry et al. (1999) andReynaert and Verboven (2013).
Measuring Substitution Patterns Monte-Carlo Simulations 27 / 47
![Page 64: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/64.jpg)
Experiment 1: Independent Random Coefficients
Random coefficient model:
uijt = δjt +K∑
k=1
vikx(2)jt,k + εijt , vi ∼ N(0, σ2
x I ).
Data:I Panel structure: 100 markets × 15 productsI Characteristics: (ξjt , x jt) ∼ N(0, I).I Dimension: |x jt | = K + 1I Monte-Carlo replications = 1,000
Differentiation IVs (K + 1):
I Quadratic: Aj (x t) =∑Jt
j′=1
(dk
jt,j′
)2,∀k = 1, . . . ,K
Measuring Substitution Patterns Monte-Carlo Simulations 28 / 47
![Page 65: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/65.jpg)
Experiment 1: Independent Random Coefficients
Random coefficient model:
uijt = δjt +K∑
k=1
vikx(2)jt,k + εijt , vi ∼ N(0, σ2
x I ).
Data:I Panel structure: 100 markets × 15 productsI Characteristics: (ξjt , x jt) ∼ N(0, I).I Dimension: |x jt | = K + 1I Monte-Carlo replications = 1,000
Differentiation IVs (K + 1):
I Quadratic: Aj (x t) =∑Jt
j′=1
(dk
jt,j′
)2,∀k = 1, . . . ,K
Measuring Substitution Patterns Monte-Carlo Simulations 28 / 47
![Page 66: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/66.jpg)
Simulation Results: Quadratic Differentiation IVs
K2 = 1 K2 = 2 K3 = 3 K3 = 4bias rmse bias rmse bias rmse bias rmse
log σ1 0.00 0.03 -0.00 0.03 -0.00 0.03 -0.00 0.04log σ2 -0.00 0.03 0.00 0.03 -0.00 0.04log σ3 -0.00 0.03 -0.00 0.03log σ4 -0.00 0.04
σ1 0.00 0.12 0.00 0.13 -0.00 0.13 -0.00 0.14σ2 -0.00 0.13 0.00 0.13 -0.00 0.14σ3 0.00 0.13 -0.00 0.14σ4 -0.00 0.15
1(Local) 0.00 0.00 0.00 0.00Rank-test 1202.10 564.03 330.40 206.42
pv 0.00 0.00 0.00 0.00IIA-test 359.41 363.22 321.73 276.13
pv 0.00 0.00 0.00 0.00
Measuring Substitution Patterns Monte-Carlo Simulations 29 / 47
![Page 67: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/67.jpg)
Experiment 2: Correlated Random Coefficients
Consumer heterogeneity:
β(2)i ∼ N(β(2),λ)
4 dimensions ⇒ 10 non-linear parameters (choleski)
Panel structure:100 markets × 50 products
Differentiation IVs: Second-order polynomials (with interactions):
Aj (xt) =Jt∑
j ′=1
(dk
jt,j ′ × d ljt,j ′
)for all characteristics k <= l .
Measuring Substitution Patterns Monte-Carlo Simulations 30 / 47
![Page 68: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/68.jpg)
Experiment 2: Correlated Random Coefficients
Consumer heterogeneity:
β(2)i ∼ N(β(2),λ)
4 dimensions ⇒ 10 non-linear parameters (choleski)
Panel structure:100 markets × 50 products
Differentiation IVs: Second-order polynomials (with interactions):
Aj (xt) =Jt∑
j ′=1
(dk
jt,j ′ × d ljt,j ′
)for all characteristics k <= l .
Measuring Substitution Patterns Monte-Carlo Simulations 30 / 47
![Page 69: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/69.jpg)
Simulation Results: Correlated Random-Coefficients
Σ·,1 Σ·,2 Σ·,3 Σ·,4
Bias
Σ1,· 0.003 0.003 -0.003 0.010Σ2,· 0.003 0.000 0.004 -0.000Σ3,· -0.003 0.004 -0.009 0.006Σ4,· 0.010 -0.000 0.006 0.010
RMSE
Σ1,· 0.228 0.132 0.156 0.156Σ2,· 0.132 0.232 0.145 0.143Σ3,· 0.156 0.145 0.217 0.154Σ4,· 0.156 0.143 0.154 0.217
IIA test (F) 157.637Rank test 474.053Nb endo. 10.000Nb IVs 15.000
Σ1,· 4Σ2,· -2 4Σ3,· 2 -2 4Σ4,· 2 -2 2 4
Note: The vector of non-linear parameters correspond to the lower-diagonal
elements of the choleski matrix of Σ (10).
Measuring Substitution Patterns Monte-Carlo Simulations 31 / 47
![Page 70: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/70.jpg)
How to account for endogenous characteristics?
Two cases:I Linear characteristics: Replace xjt with instrument wjt when defining
moment conditions (standard solution).I Non-linear characteristics: More difficult problem...
Two approaches:1 Heuristic approximation to optimal IVs similar to BLP-19952 Natural experiment-type variation (i.e. fixed-effects)
Measuring Substitution Patterns Endogenous characteristics 32 / 47
![Page 71: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/71.jpg)
Example 1: Instruments for non-linear attributes
Payoff function: Quality ladder
uijt = δjt − αipjt + εijt
where αi = σpy−1i , and log(yi ) ∼ N(µy , σy ) (known).
BLP (1995): Prices and ξjt are simultaneously determined
E[σ−1
j
(st , x t ,pt |σ0
p
)|x t ,w t
]6= E
[σ−1
j
(st , x t ,pt |σ0
p
)|x t ,pt
]where w t = {wjt}j=1,...,Jt is a vector of excluded price instruments.
Curse of dimensionality: Except in ‘very’ special cases (e.g.single-product Bertrand), the conditional distribution of prices is not asymmetric function of (x t ,w t).
E[σ−1
j
(st , x t ,pt |σ0
p
)|x t ,w t
]6= g(dx
t ,dwt )
Measuring Substitution Patterns Endogenous characteristics 33 / 47
![Page 72: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/72.jpg)
Example 1: Instruments for non-linear attributes
Payoff function: Quality ladder
uijt = δjt − αipjt + εijt
where αi = σpy−1i , and log(yi ) ∼ N(µy , σy ) (known).
BLP (1995): Prices and ξjt are simultaneously determined
E[σ−1
j
(st , x t ,pt |σ0
p
)|x t ,w t
]6= E
[σ−1
j
(st , x t ,pt |σ0
p
)|x t ,pt
]where w t = {wjt}j=1,...,Jt is a vector of excluded price instruments.
Curse of dimensionality: Except in ‘very’ special cases (e.g.single-product Bertrand), the conditional distribution of prices is not asymmetric function of (x t ,w t).
E[σ−1
j
(st , x t ,pt |σ0
p
)|x t ,w t
]6= g(dx
t ,dwt )
Measuring Substitution Patterns Endogenous characteristics 33 / 47
![Page 73: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/73.jpg)
Example 1: Instruments for non-linear attributes
Payoff function: Quality ladder
uijt = δjt − αipjt + εijt
where αi = σpy−1i , and log(yi ) ∼ N(µy , σy ) (known).
BLP (1995): Prices and ξjt are simultaneously determined
E[σ−1
j
(st , x t ,pt |σ0
p
)|x t ,w t
]6= E
[σ−1
j
(st , x t ,pt |σ0
p
)|x t ,pt
]where w t = {wjt}j=1,...,Jt is a vector of excluded price instruments.
Curse of dimensionality: Except in ‘very’ special cases (e.g.single-product Bertrand), the conditional distribution of prices is not asymmetric function of (x t ,w t).
E[σ−1
j
(st , x t ,pt |σ0
p
)|x t ,w t
]6= g(dx
t ,dwt )
Measuring Substitution Patterns Endogenous characteristics 33 / 47
![Page 74: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/74.jpg)
How to account for heterogenous price coefficient?
Heuristic solution: Distribute the expectation for price inside of theinverse-demand function (Berry et al. 1999):
E[σ−1
j (st ,pt , x(2)t ;λ)|x t ,w t
]≈ E
[σ−1
j (st , pt , x(2)t ;λ)|x t , pt
]= g(d x
jt ,dpjt)
where dpjt,k = E (pkt |wkt)− E (pjt |w jt).
pjt = E (pjt |wkt) is the ‘first-stage’ predicted price.
Measuring Substitution Patterns Endogenous characteristics 34 / 47
![Page 75: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/75.jpg)
Experiment 3: Differentiation IVs with Endogenous PricesExample with cost shifter
1 Exogenous price index (OLS):
pjt = π0 + π1xjt + π2ωjt
2 Differentiation IV: Quadratic∑j ′
(d p
jt,j ′
)2and
∑j ′
(d p
jt,j ′
)2· d jt,j ′
where d jt,j ′ = (dxjt,j ′ , d
pjt,j ′).
3 Differentiation IV: Local∑j ′
(|d p
jt,j ′ | < sd(pjt))
and∑
j ′
(|d p
jt,j ′ | < sd(pjt))· d jt,j ′
Measuring Substitution Patterns Endogenous characteristics 35 / 47
![Page 76: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/76.jpg)
Experiment 3: Differentiation IVs with Endogenous PricesExample with cost shifter
1 Exogenous price index (OLS):
pjt = π0 + π1xjt + π2ωjt
2 Differentiation IV: Quadratic∑j ′
(d p
jt,j ′
)2and
∑j ′
(d p
jt,j ′
)2· d jt,j ′
where d jt,j ′ = (dxjt,j ′ , d
pjt,j ′).
3 Differentiation IV: Local∑j ′
(|d p
jt,j ′ | < sd(pjt))
and∑
j ′
(|d p
jt,j ′ | < sd(pjt))· d jt,j ′
Measuring Substitution Patterns Endogenous characteristics 35 / 47
![Page 77: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/77.jpg)
Experiment 3: Differentiation IVs with Endogenous PricesExample with cost shifter
1 Exogenous price index (OLS):
pjt = π0 + π1xjt + π2ωjt
2 Differentiation IV: Quadratic∑j ′
(d p
jt,j ′
)2and
∑j ′
(d p
jt,j ′
)2· d jt,j ′
where d jt,j ′ = (dxjt,j ′ , d
pjt,j ′).
3 Differentiation IV: Local∑j ′
(|d p
jt,j ′ | < sd(pjt))
and∑
j ′
(|d p
jt,j ′ | < sd(pjt))· d jt,j ′
Measuring Substitution Patterns Endogenous characteristics 35 / 47
![Page 78: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/78.jpg)
Distribution of σp with weak and strong IVs
0.5
11.
5Ke
rnel
den
sity
0.0
5.1
.15
Frac
tion
-15 -10 -5 0Random coefficient parameter (Price)
IV: Sum IV: Local IV: QuadraticDash vertical line = True parameter value
Measuring Substitution Patterns Endogenous characteristics 36 / 47
![Page 79: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/79.jpg)
GMM estimates with endogenous prices
(1) (2) (3) (4)True Diff. IV = Local Diff. IV = Quadratic Diff. IV = Sum
bias se rmse bias se rmse bias se rmse
λp -4.00 0.02 0.27 0.28 0.02 0.53 0.55 1.03 158.25 2.10βp -0.20 0.01 0.37 0.37 0.01 0.31 0.32 -0.67 201.29 1.38β0 50.00 -0.26 3.92 3.92 -0.28 7.36 7.45 -9.82 26.41 20.65βx 2.00 -0.02 0.46 0.45 -0.02 0.47 0.47 0.34 1.11 0.83
Measuring Substitution Patterns Endogenous characteristics 37 / 47
![Page 80: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/80.jpg)
GMM estimates with endogenous prices
(1) (2) (3)IV = Local IV=Quadratic IV = Sum
Frequency conv. 1 1 0.94IIA-test 109.48 53.90 1.88
p-value 0 0 0.341st-stage F-test: Price 191.80 442.10 138.941st-stage F-test: Jacobian 214.60 58.40 27.85Cond. 1st-stage F-test: Price 252.23 479.96 7.92Cond. 1st-stage F-test: Jacobian 280.31 82.44 6.19Cragg-Donald statistics 170.19 54.45 4.09
Stock-Yogo size CV (10%) 16.87 13.43 13.43Nb. endogenous variables 2 2 2Nb. IVs 4 3 3
The Conditional 1st-stage F-test statistic is the Weak IV test proposed by Angristand Pischke for multiple endogenous variables.
The IIA test is testing the exclusion restriction, H0 : γ = 0 from the followinglinear IV regression:
ln sjt/s0t = xjtβ + αpjt + γIV diffjt + ujt
where (β, α, γ) are estimated by GMM using the cost-shifter (ωjt) as excludedinstrument.
Measuring Substitution Patterns Endogenous characteristics 38 / 47
![Page 81: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/81.jpg)
Example 2: Natural Experiments
An alternative solution is to exploit natural experiments that vary thechoice-set over time or across markets.
Example: Three-way panel, product j , market m, and time (t = 0, 1).
Simultaneity problem: E [ξjmt |xmt] 6= 0
Decomposition: ξjmt = µjm + τt + ∆ξmt
Assumption: Quasi-experimental design
E [∆ξjmt |ξm, τt , xmt] = 0
Measuring Substitution Patterns Endogenous characteristics 39 / 47
![Page 82: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/82.jpg)
Example 2: Natural Experiments
An alternative solution is to exploit natural experiments that vary thechoice-set over time or across markets.
Example: Three-way panel, product j , market m, and time (t = 0, 1).
Simultaneity problem: E [ξjmt |xmt] 6= 0
Decomposition: ξjmt = µjm + τt + ∆ξmt
Assumption: Quasi-experimental design
E [∆ξjmt |ξm, τt , xmt] = 0
Measuring Substitution Patterns Endogenous characteristics 39 / 47
![Page 83: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/83.jpg)
Experiment 4: Random Entry in Hotelling
Hotelling example: Exogenous entry of a new product (x ′ = 5)
uijmt = δjmt − λ|νi − xjmt |+ εijmt
Treatment variable:
Djm = 1 (|xjm − 5| < Cutoff)
Reduced-form: Difference-in-difference regression
σ−1j (st , xt |θ0) = µjm + τt + γDjm × 1(t = 1) + ξjmt
GMM: DiD IVsI Linear characteristics: x
(1)jmt = Market/Product FE + After Dummy
I Differentiation IV: zjmt = Djm × 1(t = 1)I θgmm is identified from the DiD variation in zjmt .
Measuring Substitution Patterns Endogenous characteristics 40 / 47
![Page 84: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/84.jpg)
Experiment 4: Random Entry in Hotelling
Hotelling example: Exogenous entry of a new product (x ′ = 5)
uijmt = δjmt − λ|νi − xjmt |+ εijmt
Treatment variable:
Djm = 1 (|xjm − 5| < Cutoff)
Reduced-form: Difference-in-difference regression
σ−1j (st , xt |θ0) = µjm + τt + γDjm × 1(t = 1) + ξjmt
GMM: DiD IVsI Linear characteristics: x
(1)jmt = Market/Product FE + After Dummy
I Differentiation IV: zjmt = Djm × 1(t = 1)I θgmm is identified from the DiD variation in zjmt .
Measuring Substitution Patterns Endogenous characteristics 40 / 47
![Page 85: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/85.jpg)
Experiment 4: Random Entry in Hotelling
Hotelling example: Exogenous entry of a new product (x ′ = 5)
uijmt = δjmt − λ|νi − xjmt |+ εijmt
Treatment variable:
Djm = 1 (|xjm − 5| < Cutoff)
Reduced-form: Difference-in-difference regression
σ−1j (st , xt |θ0) = µjm + τt + γDjm × 1(t = 1) + ξjmt
GMM: DiD IVsI Linear characteristics: x
(1)jmt = Market/Product FE + After Dummy
I Differentiation IV: zjmt = Djm × 1(t = 1)I θgmm is identified from the DiD variation in zjmt .
Measuring Substitution Patterns Endogenous characteristics 40 / 47
![Page 86: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/86.jpg)
Experiment 4: Random Entry in Hotelling
Hotelling example: Exogenous entry of a new product (x ′ = 5)
uijmt = δjmt − λ|νi − xjmt |+ εijmt
Treatment variable:
Djm = 1 (|xjm − 5| < Cutoff)
Reduced-form: Difference-in-difference regression
σ−1j (st , xt |θ0) = µjm + τt + γDjm × 1(t = 1) + ξjmt
GMM: DiD IVsI Linear characteristics: x
(1)jmt = Market/Product FE + After Dummy
I Differentiation IV: zjmt = Djm × 1(t = 1)I θgmm is identified from the DiD variation in zjmt .
Measuring Substitution Patterns Endogenous characteristics 40 / 47
![Page 87: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/87.jpg)
Natural Experiment: Hotelling ExampleDGP: δjmt = ξjm + τt + ∆ξjmt , where E (ξjm|xm) 6= 0
Difference-in-Difference Moments
0.2
.4.6
.81
Den
sity
1 2 3 4 5Parameter estimates
Kernel density estimate Normal density
Average bias = .027. RMSE = .406. Standard-deviation = .405.
Differentiation IVs w/o FEs
0.5
11.
52
Den
sity
1 2 3 4 5Parameter estimates
Kernel density estimate Normal density
Average bias = -2.113. RMSE = 2.123. Standard-deviation = .206.
“Diff-in-Diff” specification:
z jmt = {Product/Market FEjm, 1(t = 1), 1(|xjm − 5| < 1)1(t = 1)}
Measuring Substitution Patterns Endogenous characteristics 41 / 47
![Page 88: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/88.jpg)
Natural Experiment: Hotelling ExampleDGP: δjmt = ξjm + τt + ∆ξjmt , where E (ξjm|xm) 6= 0
Difference-in-Difference Moments
0.2
.4.6
.81
Den
sity
1 2 3 4 5Parameter estimates
Kernel density estimate Normal density
Average bias = .027. RMSE = .406. Standard-deviation = .405.
Differentiation IVs w/o FEs
0.5
11.
52
Den
sity
1 2 3 4 5Parameter estimates
Kernel density estimate Normal density
Average bias = -2.113. RMSE = 2.123. Standard-deviation = .206.
“Diff-in-Diff” specification:
z jmt = {Product/Market FEjm, 1(t = 1), 1(|xjm − 5| < 1)1(t = 1)}
Measuring Substitution Patterns Endogenous characteristics 41 / 47
![Page 89: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/89.jpg)
Optimal IV Approximation
Abstracting from heteroscedasticity concerns, the “Optimal IV” takesthe following form:
A∗j (x t) = E
[∂ρj (st , x t ;θ)
∂θ
∣∣∣x t
]=
{−x jt ,E
[∂σ−1
j (st , x(2)t ;θ)
∂λ
∣∣∣x t
]}
Instead of using non-parametric regressions to approximate A∗j (x t),Berry et al. (1999) propose the following heuristic:
Aj (x t |θ) =∂σ−1
j (st ,pt , x(2)t ;θ)
∂λ
∣∣∣∣pjt =pjt ,ξjt =0,∀j ,t
where pjt ≈ E (pjt |x t ,w t) is a “reduced-form” model for pricesindependent of ξjt .
This leads to a two-step estimator:I Obtain initial estimate θ1 using instrument vector Aj (x t)
I Compute Aj
(x t |θ
1)
, and re-estimate the model (just-identified).
Measuring Substitution Patterns Optimal IV Approximation 42 / 47
![Page 90: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/90.jpg)
Optimal IV Approximation
Reynaert and Verboven (2013) show that this procedure improvessubstantially the weak IV problems.
Alternative approach: Exploit the property that the optimal IV is asymmetric function of the vector of characteristics differences.
I Use Differentiation IVs to obtain θ1
I Approximate the optimal IV directly by projecting the Jacobian onAj (x t) (Newey 1990)
Questions:I How important is it to use consistent first-stage estimates to construct
a valid Optimal IV approximation?I What is the efficiency gain of using optimal IV heuristic, relative to
using differentiation IVs directly?
Measuring Substitution Patterns Optimal IV Approximation 43 / 47
![Page 91: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/91.jpg)
Optimal IV approximation with alternative initialparameter values
Normal RC Hotellingλ1 bias rmse λ1 bias rmse
Optimal IV approx.:(1) 0.5 0.001 0.027 4 -0.003 0.140(2) 1.5 0.001 0.026 2 -0.004 0.126(3) 2 0.001 0.026 0 -0.079 0.509(3) 2.5 0.001 0.026 -1 -0.344 1.687(4) 3 0.002 0.028 -2 -0.282 1.254
Differentiation IV — 0.001 0.031 — 0.017 0.310
Takeaway 1: With IID RC, inconsistent first-stage does not lead to biasedor noisy estimates. The optimal IV approximation is “strong” for all λ1!
Takeaway 2: With the hotelling model, inconsistent first-stage leads tobiased estimates and weak instruments.
Why? The magnitude of λ does not determine “who competes with who”.Only the magnitude of diversions.
Measuring Substitution Patterns Optimal IV Approximation 44 / 47
![Page 92: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/92.jpg)
Example 2: Correlated Random Coefficients
Choleski Opt. IV: θ1 ∼ N(0, 1) Opt. IV: θ1 ∼ N(0, 4) Diff. IV: Quad.matrix True bias rmse se bias rmse se bias rmse se
(1) (2) (3) (4) (4) (5) (6) (7) (8) (9)log c11 0.69 0.00 0.22 5.42 0.01 1.22 11.92 -0.00 0.03 0.03log c22 0.55 -0.01 0.19 2.50 -0.16 2.36 192.70 -0.00 0.04 0.04log c33 0.49 -0.02 0.15 0.46 -0.44 2.69 ++ -0.00 0.04 0.04log c44 0.46 -0.22 1.83 ++ -1.78 5.57 ++ -0.00 0.04 0.04c21 -1.00 0.01 0.47 4.51 0.03 0.77 781.85 0.00 0.06 0.06c31 1.00 0.00 0.33 0.86 -0.02 0.63 23.48 -0.00 0.07 0.07c32 -0.58 0.02 0.27 2.69 0.03 0.56 285.80 0.00 0.07 0.08c41 1.00 0.00 0.23 1.37 0.00 0.58 333.93 0.00 0.07 0.07c42 -0.58 0.01 0.23 2.69 0.04 0.50 484.88 0.00 0.08 0.08c43 0.41 0.00 0.23 1.59 0.03 0.52 ++ 0.00 0.08 0.08
Measuring Substitution Patterns Optimal IV Approximation 45 / 47
![Page 93: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/93.jpg)
Example 3: Efficiency gainsQuality ladder model
Diff. IV = Local Diff. IV = Quadratic Diff. IV = SumTrue bias se rmse bias se rmse bias se rmse
1st
-sta
ge λp -4 0.02 0.27 0.28 0.02 0.53 0.55 1.01 2.66 2.09
β0 50 -0.26 3.92 3.92 -0.28 7.36 7.45 -9.63 26.48 20.46βx 2 -0.02 0.46 0.45 -0.02 0.47 0.47 0.34 1.11 0.83βp -0.2 0.01 0.37 0.37 0.01 0.31 0.32 -0.66 1.76 1.37
2n
d-s
tag
e λp -4 0.00 0.24 0.23 0.00 0.24 0.23 0.01 0.26 0.31β0 50 -0.07 3.99 3.84 -0.06 3.72 3.65 0.05 4.32 4.61βx 2 -0.01 0.48 0.47 -0.01 0.41 0.41 0.03 0.52 0.51βp -0.2 0.01 0.36 0.36 0.00 0.31 0.32 -0.03 0.40 0.40
Measuring Substitution Patterns Optimal IV Approximation 46 / 47
![Page 94: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/94.jpg)
Conclusion
What did we do:I Show how that the characteristic model can be used to construct
relevant instruments to identify substitution patternsI And, eliminate the weak IV problem that is present in applied workI Differentiation IV’s: Capture the relative position of each product in
the characteristic space.
Extensions:I Optimal IV approximation (Reynaert and Verboven (2013))I Natural experimentsI Demographic variationI Weak IV tests
What’s next?I Higher-order basis: LassoI Conduct testsI Non-parametric estimation
Measuring Substitution Patterns Conclusion 47 / 47
![Page 95: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/95.jpg)
Conclusion
What did we do:I Show how that the characteristic model can be used to construct
relevant instruments to identify substitution patternsI And, eliminate the weak IV problem that is present in applied workI Differentiation IV’s: Capture the relative position of each product in
the characteristic space.
Extensions:I Optimal IV approximation (Reynaert and Verboven (2013))I Natural experimentsI Demographic variationI Weak IV tests
What’s next?I Higher-order basis: LassoI Conduct testsI Non-parametric estimation
Measuring Substitution Patterns Conclusion 47 / 47
![Page 96: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/96.jpg)
Conclusion
What did we do:I Show how that the characteristic model can be used to construct
relevant instruments to identify substitution patternsI And, eliminate the weak IV problem that is present in applied workI Differentiation IV’s: Capture the relative position of each product in
the characteristic space.
Extensions:I Optimal IV approximation (Reynaert and Verboven (2013))I Natural experimentsI Demographic variationI Weak IV tests
What’s next?I Higher-order basis: LassoI Conduct testsI Non-parametric estimation
Measuring Substitution Patterns Conclusion 47 / 47
![Page 97: Measuring Substitution Patterns in Differentiated Product Industries · jt;k( ) = z tˇ k + u jt;k where ˇk are the \reduced-form" parameters of the model. This test can be implemented](https://reader033.vdocument.in/reader033/viewer/2022050202/5f562a2562be67056d07c9ad/html5/thumbnails/97.jpg)
Berry, S. (1994).Estimating discrete choice models of product differentiation.Rand Journal of Economics 25, 242–262.
Berry, S., J. Levinsohn, and A. Pakes (1999).Voluntary export restraints on automobiles: Evaluating a trade policy.American Economic Review 89(3), 400–430.
Bresnahan, T., S. Stern, and M. Trajtenberg (1997).Market segmentation and the sources of rents from innovation: Personal computers in the late 1980s.The RAND Journal of Economics 28, s17–s44.
Chamberlain, G. (1987).Asymptotic efficiency in estimation with conditional moment restrictions.Journal of Econometrics 34(305—334).
Miravete, E., K. Seim, and J. Thurk (2017, September).Market power and the laffer curve.working paper, UT Austin.
Newey, W. K. (1990).Efficient instrumental variables estimation of nonlinear models.Econometrica 58(809-837).
Reynaert, M. and F. Verboven (2013).Improving the performance of random coefficients demand models: The role of optimal instruments.Journal of Econometrics 179(1), 83–98.
Measuring Substitution Patterns Conclusion 47 / 47