mems force microactuator with displacement sensing for ... · mems driver, cdr sensor, csr s vdr...
TRANSCRIPT
MEMS force microactuator with displacement
sensing for mechanobiology experiments
F. Cerini, M. Ferrari, V. Ferrari
Department of Information Engineering
University of Brescia
Brescia, Italy
A. Russo, M. Azpeitia Urquia
STMicroelectronics
Italy
R. Ardito, B. De Masi
Department of Civil and Environmental Engineering
Politecnico di Milano
Milano, Italy
M. Serzanti, P. Dell’Era
Department of Molecular and Translational Medicine
University of Brescia
Brescia, Italy
Abstract—This paper presents a Micro Electro-Mechanical
System (MEMS) that performs electrostatic force actuation and
capacitive microdisplacement sensing in the same chip. By
driving the actuator with a given voltage, a known force can be
applied to a microsample under test by using a silicon probe tip,
while the obtained displacement is measured. This allows to
extract the mechanical properties of the microsample entirely on
chip, and to derive its force-displacement curve without external
equipment. The proposed device is intended for mechanobiology
experiments, where the microsample is made of biological tissues
or cells. The device generates a force in the order of few
micronewtons and a maximum displacement of 1.8 µm can be
measured.
Keywords—MEMS, electrostatic force actuator, capacitive
displacement sensing, mechanobiology.
I. INTRODUCTION
The use of micro electro-mechanical systems (MEMS) to
test mechanical properties of materials at the microscale is
especially promising for probing microbiological samples in
in-vitro mechanobiology experiments [1]. Mechanical
properties of cells are important factors to define their
functionality, to differentiate them, and play a role in tissue
formation. Moreover, changes in elasticity of the cells can be used as a marker to identify cell abnormalities that can be possibly correlated with various human diseases [2].
In order to measure the mechanical properties of microbiological samples, MEMS force actuators and sensors
have been proposed in the last years, employing different
actuation methods such as the electrothermal [3, 4] and
electrostatic [5] principles. Flexible-beam optical [6-8] and
capacitive [9, 10] force sensors have been also reported for
cellular force measurement and for mechanical
characterization of biomembranes [11]. Typically, the reported
configurations require external equipment to apply either the
force or displacement, while the complementary quantity is
measured by the microsystem.
In this context, the approach of this work is to integrate
both force actuation and displacement sensing on the same
chip that only has a pair of electrical input and output ports,
therefore enabling the measurement of the microsample
mechanical properties entirely on chip. Quantitative
biomechanics studies on single molecules or cells are expected
to be possible. The paper presents early results that validate
the principle.
The device description, operating principle and proposed
electro-mechanical model are illustrated in Section II,
experimental results are presented in Section III, and
conclusions are given in Section IV.
II. DEVICE DESCRIPTION, OPERATING PRINCIPLE AND
MODELLING
Fig. 1 shows the layout, relevant measured dimensions and
SEM images of the MEMS device.
The device has been designed and fabricated by using the
ThELMA process (Thick Epipoly Layer for Microactuators
and Accelerometers), developed by STMicroelectronics for
inertial sensors and actuators based on heavily doped
poly-silicon [12].
The mechanical microstructure consists of a central rigid
movable shuttle (denoted as R), which is supported and
anchored to the substrate by four folded-beam springs, as
shown in Fig. 1. Interleaved comb structures extending
laterally from the shuttle form variable-gap parallel-plate
comb-finger capacitors with similar structures on the stator
(denoted as S) solidly linked to the fixed frame.The resulting
configuration denoted as transverse combs has a capacitance
. The device also contains four variable-area comb-finger
capacitors between driver armatures (denoted as D) on the
frame and corresponding armatures on the shuttle R. The
resulting configuration denoted as lateral combs has a
capacitance .
Figure 2: Monodimensional equivalent mechanical model of the device with the electrical setup (a) and equivalent electro-mechanical lumped-element circuit (b).
Figure 1: Layout, measured geometrical dimensions and SEM images of the investigated MEMS device with enlarged views of drivers and spring (a), a set of
parallel-plate combs of the displacement sensor (b) and the probe tip (c).
The presence of both lateral combs (D-R) and transverse
combs (S-R) configurations offers a double possibility of
actuation of the movable shuttle together with the flexibility to
set different values of electrostatic force between fixed and
movable parts, independently of the parallel-plate distance.
In displacement sensing, transverse combs offer higher
sensitivity compared to the lateral combs configuration,
though the response is nonlinear [5]. For these reasons, in this
work, we use the D-R part for electrostatic force actuation and
the S-R part for capacitive displacement sensing, respectively.
Due to the device geometry, the movement direction of the
shuttle is along the longitudinal axis .
Fig. 2 illustrates the device operating principle by the use
of equivalent models based on the direct electromechanical
analogy (Voltage-Force; Current-Velocity).
The probe tip, visible in the inset of Fig. 1c connected to
the shuttle R, is used to press the microsample under test,
represented by its mechanical impedance , by applying a
known force , which can be set by imposing a proper
driving voltage to the driver capacitor . The sensing
capacitor is used to measure the probe tip displacement .
In the simplified monodimensional lumped-element model
of Fig. 2a, the shuttle is represented by a mass supported
by a spring with mechanical stiffness , accounting for the
a) b)
km d
MEMS
driver, CDR sensor, CSR
D
S
VDR
VSR(t)
LCR meterHP 4274A
H
L
substrate
R
PCGPIB
Data acquisitionand control
s
shuttlex
ZL
FDR m
m
dD
lS
+
-
probetipe
microsample
x'
x0
wkm d
MEMS
driver, CDR sensor, CSR
D
S
VDR
VSR(t)
LCR meterHP 4274A
H
L
substrate
R
PCGPIB
Data acquisitionand control
s
shuttlex
ZL
FDR m
m
dD
lS
+
-
+-
1/km
ẋprobe
tipeVDR FDR
CSR
x∫
microsample
FL ZL
x'
x0
w
a) b)
Drivers D[comb fingers]
shuttle R
Drivers D[comb fingers]
springs
# D1b
# D2b
# D3b
# D4b
# D1a
# D2a
# D3a
# D4a
probe tip
Sensor S[parallel plates]
driver # 1
driver # 2
# 1
# 2
driver # 3
driver # 4
# 3
# 41
.3 m
m
springs
springs
sen
so
r co
mb
s C
SR
sen
so
r co
mb
s C
SR
sh
utt
le R
370 µm
R
9.3
µm
4.2
µm
S
R
spring 300 µm
# 2
# 1drivers
ThELMA process
highly doped poly-silicon
sensor combs CSR
probe
tip
a)
b)
c)
y
x
z
mo
vem
en
t
Device part Length
(µm)
Width
(µm)
Gap
(µm) Number/note
Comb-fingers 13.5a 2.5 1.6 98
Parallel-plates 379 4.2 2.5 202
Flexural springsb 306 3.0 7.5 3-Folded
Central shuttle 1300 34.3 - Holes 6.3x6.3 µm2
Probe tip 169 5.3 - -
Out-of-plane
thickness 23.6 - - -
a. Initial overlapping length
b. Measures for each beam
Figure 5: Theoretical and measured electro-mechanical transduction factor
DR as a function of the applied voltage VDR.
Figure 3: Measured capacitance as a function of the tilt angle for a
driven voltage kept constant to 25 V. In the insets, pictures of device
tilted to -90°, 0° and +120° respect to the y axis.
Figure 4: Experimental values of measured at different levels of .
For each level, tilting angles of , and were applied,
while was kept constant to its no-tilting value ( ° case) by adjusting
. The blue line is the experimental behavior of as a function of
when no-tilting occurs.
14 16 18 20 22 24 26
22
24
26
28
30
32
34
36
VDR
[V]
CS
R [
pF
]
24.5 25 25.5
29
29.2
29.4
29.6
29.8
0° -90°
+90°
0°- behavior
+90° 0° -90°
total elasticity of the four folder beams. The parameters and
represent the spacing between two S-lamellae and the width
of an R-lamella, respectively. The position represents the
initial mechanical equilibrium point of the shuttle without
external electrical sources applied to the electrodes. The
equilibrium point can be influenced by an initial asymmetry due, for example, to a pre-stress of the folded beams, or the
initial offset due to contact of the microsample with the probe
tip before measurement. Consequently, can be expressed
as:
(1)
The quantity , representing the shorter distance between any
R-lamella and the neighboring lamella, and can be defined as:
(2)
The voltage applied between the terminals D and R as
shown in Fig. 2, results in the electrostatic force acting on
the shuttle given by:
(3)
The coefficient , representing the electro-mechanical
transduction factor between the force and the squared
voltage , can be expressed as:
[
(
)] (4)
where and are the dielectric permittivity of vacuum
and the relative dielectric constant of the gaseous medium,
respectively, the total number of R-lamellae faced to
D-lamellae, the gap between D- and R-lamellae, the
out-of-plane thickness lamella, and a parameter
which properly tunes the Palmer’s fringing field effect, as
reported in [13].
15 16 17 18 19 20 21 22 23 24 25 26 278.5
8.6
8.7
8.8
8.9
9
9.1
9.2
9.3
9.4
9.5
9.6
9.7
VDR
[V]
D
R [
nN
/V2]
15 16 17 18 19 20 21 22 23 24 25 268.5
8.6
8.7
8.8
8.9
9
9.1
9.2
9.3
9.4
9.5
VDR
[V]
D
R [
nN
/V2]
Experimental
Theoretical
15 16 17 18 19 20 21 22 23 24 25 268.5
8.6
8.7
8.8
8.9
9
9.1
9.2
9.3
9.4
9.5
VDR
[V]
D
R [
nN
/V2]
Experimental
Theoretical
-120 -90 -60 -30 0 30 60 90 12027.5
28
28.5
29
29.5
30
30.5
31
CS
R [
pF
]
Angle [°]
-90°
0°
+120°
y
x z
x y
z
y
x
z
Angle
Ø = 1 µm
MEMS
probe tip
glass
microtip
MEMS
probe tip
fixed cell
10 µm
3-axis micro-manipulator
with micropipet
TEST A TEST B
system
for cell
suction
MEMS chip
Figure 6: Experimental setup for positioning of the microsample with enlarged views of mechanical characterization of a glass bending microtip (Test A) and a
fixed fibroblast cell (Test B).
The total capacitance between the S and the R terminals,
can be expressed as:
(
) (5)
where is the sum of the parasitic capacitances, the
total number of R-lamellae faced to S-lamellae, and the
overlapping length.
From the expression of in Eq. (5), the following
close-form expression of the distance can be derived:
{ √ |
| } (6)
By inserting Eq. (6) into Eq. (2), the value of the displacement
, for a given force caused by an applied voltage , is
obtained.
Assuming that the chip plane is held horizontally and no
microsample is initially present (free conditions), than the
mechanical stiffness , can be derived by:
without microsample
(free conditions) (7)
If a microsample as the load is present, under the
simplifying assumption that it behaves as a spring with
mechanical stiffness , Eq. (7) becomes:
with microsample
as the load (8)
and the total stiffness, which increases up to , can be
determined. By subtracting the known value of , the
estimation of can be obtained.
III. EXPERIMENTAL RESULTS
The characterization tests described in this section were
performed using the experimental setup shown in Fig. 2a. In
order to measure , the LCR meter was set to provide a
sinusoidal signal with amplitude of and
frequency of , i.e. far from the resonant frequency of
the movable part that is around . The results presented in
this work were obtained by using the driver D2 only. The
terminals R, substrate SUB, and the unused driver terminals
D1, D3 and D4 are connected to the low terminal of the
LCR meter in order to avoid parasitic electrostatic phenomena
[14].
Given the geometrical layout, by tilting the device around
the axis, it becomes sensitive to the in-plane component of
Figure 7: Force-displacement characteristics measured in free conditions
(zero load) and with the glass bending microtip as the load. The mechanical
stiffness km of the spring and of the load kL results 3.62 N/m and 1.39 N/m,
respectively. The inset shows the measured capacitance CSR versus VDR .
Figure 8: Measured capacitance CSR as a function of the voltage VDR in free
conditions and with a fixed fibroblast cell on a micropipette as the load.
0 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 3420
22
24
26
28
30
32
34
36
38
VDR
[V]
CS
R [
pF
] with fixed cell
in free conditions
(zero load)
contact loss
between the
fixed cell and
the probe tip
residual position and
orientation changes of
the fixed cell with respect
to the probe tip
TEST A TEST B
the weight force acting onto the shuttle. Under tilting
around the axis of an angle between the axis and the
vertical direction, Eq. (7) can rewritten as:
(9)
where with is the gravitational
acceleration.
Fig. 3 shows the measured capacitance (in free
conditions) as a function of the tilt angle for an applied
kept constant to . As expected, the behaviour is
sinusoidal. In accordance with Eq. (9), the minimum and
maximum values of are reached for and
, respectively. In particular, when the
sign of is the same of the spring force and it is
opposite to , and vice-versa when . To calibrate the applied force as a function of the
voltage , an experimental calibration procedure by using
as reference has been adopted. During the tilting of the
device to and - , the displacement has been kept
unaltered by adjusting the voltage to the required level in
order to maintain constant. In this way, the mechanical
stiffness of the spring has no effect on the calibration.
Fig. 4 shows as the experimental values of measured at
different levels of . For each level, tilting angles of
, and were applied, while was kept constant
to its no-tilting value ( case) by adjusting . Each
value represented by a circle is the average of 30 consecutive
acquisitions with the error bars representing the interval
where is the standard deviation. The blue line shows the
experimental behavior of (in free conditions) versus
for . Under the condition of unaltered displacement , Eq. (9) can
be evaluated for and , and combined
with Eq. (3) to obtain the close-form expression of given
by:
(10)
where and are the values for
and , respectively.
Fig. 5 shows the experimental values of derived by
using Eq. (10) for different applied voltages VDR. The mass
, estimated from a SEM geometry analysis with a
poly-silicon density of , results to be of 24 µg. The
value of constant with
is in agreement with the theoretical value of Eq. (4)
within few percents.
When reaches the minimum value of for
, the shuttle is at the distance (i.e. in
condition of geometrical symmetry), and the total parasitic
capacitances estimated from Eq. (5) results to be
.
Fig. 6 shows the experimental setup adopted for testing the
microsystem and for the positioning of the microsample into
the device. The enlarged views show the glass bending
microtip and a fixed fibroblast cell used during the experiment
as two types of load under test.
-0.5 -0.2 0.1 0.4 0.7 1 1.3 1.6 1.9
0
2
4
6
8
10
x [m]
F [N
]
glass microtip
free conditions
(zero load)
0 5 10 15 20 25 3020
25
30
35
VDR
[V]
CS
R [pF
]
eq. FDR = 3.62 x + 0.16
eq. FDR = 5.01 x + 0.67
km + kL
km x' = 134 nm
x' = 45 nm
FL
FD
R
0 0.1
Fig. 7 shows the results of test A in which the
force-displacement characteristics of the device have been
measured in free conditions (zero load) and with a glass
bending microtip as the load . In free conditions, the
stiffness of results, constant throughout the
displacement range since no electrostatic effect on stiffness is
produced due to the variable-area configuration of the comb
actuator. With the bending microtip as the load, the stiffness
increases to and a change in the slope of the
force-displacement characteristic occurs. From the intercept at
, it is possible to extract the estimation of the initial
asymmetry of and in free conditions and
with the glass bending microtip as the load, respectively.
Fig. 8 shows the results of test B in which a single cell
(fibroblast) fixed for min in PFA (paraformaldehyde)
on a rigid micropipette has been used as the load . It can be
observed that the plot of versus clearly evidences a
specific behaviour when the cell is present. During the
measurement, some residual position and orientation changes
of the fixed cell with respect to the probe tip are visible, and
for higher than the contact between the cell and the
probe tip it is lost.
IV. CONCLUSIONS
A MEMS that performs electrostatic force actuation and
capacitive microdisplacement sensing on the same chip is
presented.
A monodimensional equivalent mechanical model of the
device and an equivalent electro-mechanical lumped-element
circuit based on the direct electromechanical analogy have
been proposed and validated in order to illustrate the device
operating principle.
An experimental calibration procedure by using the weight
force as reference has been adopted to estimate the value of
the electro-mechanical transduction factor . In this way, a
known force can be applied to a microsample under test by
using a silicon probe tip, while the obtained displacement is
measured from the measured capacitance .
The device has been used to measure the force-displacement
characteristics in free conditions (zero load) and with a glass
bending microtip as the load, resulting in mechanical stiffness
of and , respectively.
Measurements of the capacitance CSR as a function of the
voltage have been performed with a single fibroblast fixed
for min in PFA (paraformaldehyde), evidencing a
specific behaviour when the cell is present. This allows to
extract the mechanical properties of the microsample entirely
on chip, and to derive its force-displacement curve without
external equipment.
The proposed device allows to measure in both static and
dynamic regimes, therefore it can derive the complete
viscoelastic behavior of the microsample in mechanobiology
experiments.
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