metrology products that support interface standards save time save money, and

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METROLOGY PRODUCTS THAT SUPPORT INTERFACE STANDARDS Save Time Save Money, and • Eliminate reprogramming • Reduce measurement error • Allow freedom to select components • Lessen training burden • Allow interchangeability of components rippey: Put a background picture in this poster? Other scenarios - no line/product line launch delay No need to support 18 programming/i nspection packages

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rippey: Put a background picture in this poster? Other scenarios - no line/product line launch delay No need to support 18 programming/inspection packages. METROLOGY PRODUCTS THAT SUPPORT INTERFACE STANDARDS Save Time Save Money, and Eliminate reprogramming Reduce measurement error - PowerPoint PPT Presentation

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Page 1: METROLOGY PRODUCTS  THAT SUPPORT INTERFACE STANDARDS Save Time   Save  Money,  and

METROLOGY PRODUCTS THAT SUPPORT

INTERFACE STANDARDS

Save Time

Save Money, and• Eliminate reprogramming

• Reduce measurement error

• Allow freedom to select components

• Lessen training burden

• Allow interchangeability of components

rippey:

Put a background picture in this poster?

Other scenarios - no line/product line launch delay

No need to support 18 programming/inspection packages

rippey:

Put a background picture in this poster?

Other scenarios - no line/product line launch delay

No need to support 18 programming/inspection packages

Page 2: METROLOGY PRODUCTS  THAT SUPPORT INTERFACE STANDARDS Save Time   Save  Money,  and

Inspection Execution Software

CAD Software

Geometry and Feature

Tolerance Information:STEP APs

MeasurementResults: DML

Inspection Process Information: DMIS

Off-line InspectionProcess Planning

Software

Reporting & AnalysisSoftware

Coordinate Measuring

Machines (CMMs)

CMM control commands and responses: I++ DME

STANDARDS LANDSCAPE

Page 3: METROLOGY PRODUCTS  THAT SUPPORT INTERFACE STANDARDS Save Time   Save  Money,  and

Metrology Project Team •Reduce product development cycle time and manufacturing costs

•Achieve interoperability of software and hardware

in automated metrology