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not measurement;SENSITIVE I

MIL-STD-1Q5E

10 MAY 1989

SUPERSEDINGMIL-STD-1G5D

29 APRIL 1963

MILITARY STANDARD

SAMPLING PROCEDURES AND TABLESFOR INSPECTION BY ATTRIBUTES

AMSC N/A AREA QCIC

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.

MEL-STD-105E

DEPAKIfrENT OF DEFENSEWashington, DC 20301

SAILING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES

1. This military standard is approved for use by all Departments and Agencies

of the Department of Defense,

2. Beneficial comments (reccnmendations, additions, deletions) and any

pertinent data which may be of use in iirprcrving this document should be

addressed to:

CcmnanderU.S. Army Armament Research, Development and

Engineering CenterATTN: SMCAR-BAC-S/Blcig. 6

Picatinny Arsenal, NJ 07806-5000

by using the self-addressed Standardization Document Inprovement Proposal

(DD Form 1426) appearing at the end of this ctocument or letter.

li

MIL-STD-IOSE

FOREWORD

This publication provides sampling procedures and reference tables for use in

planning and conducting inspection by attributes- The sanpling concept is basedon the probabilistic recurrence of events when a series of lots or batches are

produced in a stable environment

.

This publication should be used to guide the user in the development of an

inspection strategy that provides a cost effective approach to attainingconfidence in product ccnpliance with contractual technical requirements . The

user is warned of the assumed risks relative to the chosen sairple size andAQL.

Military specifications should not contain requirements for use of specificsanpling plans, nor should they provide AQL's or LTPD's as a requirement.

Sanpling plans for continuous, rather than lot inspection, are contained in

MIL-STD-1235, "Single and Multi-Level Continuous Sanpling Procedures and Tables

for Inspection by Attributes".

111

MIL-STD-105E

Paragraph

CONTENTSPage

1 . SCOPE . .1

1 . 1 Purpose . . . *

1.2 Application • 1

2. REEERENCED DOOMENTS 1

2.1 Not applicable 1

3. DEFINITIONS • • 1

3.1 Acceptable Quality Level (AQL) 2

3.2 Average Outgoing Quality (AOQ) 2

3.3 Average Outgoing Quality Limit (AOQL) 2

3.4 Classification of Defects 2

3.5 Critical Defect 2

3.6 Critical Defective • 2

3.7 Defect. 2

3.8 Defeetive 3

3.9 * Defects Per Hundred Units 3

3 . 10 Inspection. . . .

.

3

3.11 Inspection by Attributes 3

3.12 Lot or Batch 3

3.13 Lot or Batch Size 3

3.14 Major Defect 3

3.15 Major Defective. - • 3

3.16 Minor Defect 3

3.17 Minor Defective .3

3

.

18 Percent Defective 4

3 .19 Process Average 4

3.20 Sarrple 4

3.21 Sairple Size Code Letter 4

3.22 Sairpling Plan 4

3.23 Unit of Product 4

4. GENEK^.PEQUIREMENTS 4

4 .

1

Written Procedures. 4

4.2 Nonconformance 4

4.3 Formation and Identification of Lots or Batches... 5

4.4 AQL 5

4.4.1 AQL Use 5

4.4.2. Limitation 5

4.4.3 Choosing AQLs 5

IV

MIL--STD-105E

Paragraph

Table

CONTENTS - Continued.Page

4.5 Sampling 5

4.5.1 Representative Sampling 5

4.5.2 Time of Sanpling. .. 5

4.5.3 Double or Multiple Sanpling 5

4 .

6

Inspection Procedures. 6

4 .

7

Switching Procedures 6

4.7.1 Normal to Tightened 6

4.7.2 Tightened to Normal 6

4.7.3 Normal to Reduced... 6

4.7.4 Reduced to Normal 6

4 .

8

Discontinuation of Inspection 7

4 .

9

Sanpling Plans . 7

4.9.1 Inspection Level 7

4.9.2 Code Letters -—• 7

4.9.3 Ctotaining Sanpling Plan 7

4.9.4 Types of Sanpling Plans 8

4 . 10 Determination of Acceptability 8

4.10.1 Percent Defective Inspection 8

4.10.1.1 Single Sampling Plan.. 8

4.10.1.2 Double Sanpling Plan 8

4.10.1-3 Multiple Sanpling Plan 8

4.10.1.4 Special Procedure for Reduced Inspection 8

4 . 10 .2 Defects Per Hundred Units Inspection 9

4

.

11 Limiting Quality Protection 9

4.12 Curves. 9

4.12.1 Operating Characteristic Curves 9

4.12.2 Average Sample Size Curves. 9

5. TABLES 11

I . Sample Size Code Letters 13

II-A. Single Sanpling Plans for NormalInspection (Master table) 14

II-B. Single Sampling Plans for TightenedInspection (Master table) 15

II-C. Single Sampling Plans for ReducedInspection (Master table) 16

III-A. Double Sanpling Plans for NormalInspection (Master table) 17

III-B. Double Sampling Plans for TightenedInspection (Master table) 18

III-C. Double Sanpling Plans for ReducedInspection (Master table) 19

v

MTL-STD-1Q5E

CONTENTS - Continued.

Page

TableIV-A. Multiple Sanpling Plans for Normal

Inspection (Master table) 20

IV-B. Multiple Sampling Plans for Tightened

Inspection (Master table) 22

IV-C. Multiple Sanpling Plans for ReducedInspection (Master table) 24

V-A. Average Outgoing Quality Limit Factors for

Normal Inspection (Single Sanpling) 26

V-B. Average Outgoing Quality Limit Factors for

Tightened Inspection (Single Sanpling) 27

VI-A. Limiting Quality (in Percent Defective) for

which a Pa = 10% (for Normal Inspection,

Single Sanpling) 28

VI-B. Limiting Quality (in Defects per Hundred

Units) for which the Pa = 10% (for Normal

Inspection, Single Sairpling) 29

VII-A. Limiting Quality (in Percent Defective) for

which the Pa - 5% (for Normal Inspection,

Single Sanpling) 30

VII-B. Limiting Quality (in Defects per Hundred

Units) for which the Pa « 5% (for Normal

Inspection, Single Sanpling) 31

VIII. Limit Nuntoers for Reduced Inspection 32

IX. Average Sanple Size Curves for Double and

Multiple Sanpling 33

Sanpling Plans and Operating CharacteristicCurves (and Data) for:

X-A. Sanple Size Code Letter A 34

X-B. Sanple Size Code Letter B 36

X-C. Sanple Size Code Letter C 38

X-D. Sanple Size Code Letter D 40

X-E. Sanple Size Code Letter E 42

X-F. Sanple Size Code Letter F 44

X-G. Sanple Size Code Letter G 46

X-H. Sanple Size Code Letter H - 48

X-J. Sanple Size Code Letter J 50

X-K. Sanple Size Code Letter K 52

X-L. Sanple Size Code Letter L . .

.

54

X-M. Sanple Size Code Letter M 56

X-N. Sanple Size Code Letter N 58

X-P. Sanple Size Code Letter P 60

X-Q. Sanple Size Code Letter Q. 62

X-R. Sanple Size Code Letter R •• 64

vi

MIL-STD-105E

CONTENTS - Continued.

Page

X-S. Sairple Size Code Letter S 66

Paragraph6. NOTES 67

6 .

1

Intended Use • 67

6.2 Subject Term (keyword) Listing 67

6.3 Changes from Previous Issue 67

CONCLUDING MATERIAL 68

Vll

MIL-STD-105E

SAMPLING PROCEDURES AND TABLESFOR INSPECTION BY ATTRIBUTES

1. SCOPE

1.1 Purpose . This publication establishes lot or batch sarrpling plans andprocedures for inspection by attributes. This publication shall not be inter-

preted to supercede or conflict with any contractual requirements. The words

"accept", "acceptance" , "acceptable" f etc f refer only to the contractor's use ofthe sampling plans contained in this standard and do not irrply an agreement bythe Government to accept any product. Determination of acceptability by theGovernment shall be as described in contractual documents . The sampling plansdescribed in this standard are applicable to AQL's of .01 percent or higher andare therefore not suitable for applications where quality levels in the defectiveparts per million range can be realized.

1.2 Application . Sampling plans designated in this publication are applicable

,

but not limited, to inspection of the following:

a. End items.

b. Components and raw materials.

c. Operations or services.

d. Materials in process.

e. Supplies in storage.

f. Maintenance operations.

g. Data or records.

h. Administrative procedures.

These plans are intended primarily to be used for a continuing series of lots

or batches. The plans may also be used for the inspection of isolated lots or

batches, but, in this latter case, the user is cautioned to consult the operatingcharacteristic curves to find a plan which will yield the desired protection(See 4.11)

.

2. REFERENCED DOOJMENTS

2.1 Not applicable.

3

.

DEFINITIONS

MIL-STD-105E

3.1 Acceptable Quality Level (AQL) . When a continuous series of lots is

considered, the AQL is the quality level which, for the purposes of sampling

inspection, is the limit of a satisfactory process average (See 3.19) .

NOTE: A sampling plan and an AQL are chosen in accordance with the risk assumed.

Use of a value of AQL for a certain defect or group of defects indicates that the

sairpling plan will accept the great majority of the lots or batches provided the

process average level of percent defective (or defects per hundred units) in these

lots or batches be no greater than the designated value of AQL. Thus, the AQL is

a designated value of percent defective (or defects per hundred units) for which

lots will be accepted most of the time by the sairpling procedure being used. The

sanpling plans provided herein are so arranged that the probability of acceptance

at the designated AQL value depends upon the sanple size, being generally higher

for large sanples than for small ones, for a given AQL- The AQL alone does not

identify the chances of accepting or rejecting individual lots or batches but more

directly relates to what might be expected from a series of lots or batches,

provided the steps indicated in this publication are taken. It is necessary to

refer to the operating characteristic curve of the plan to determine the relative

risks*

3.2 Average Outgoing Quality (AOQ) . For a particular process average, the AOQ is

the average quality of outgoing product including all accepted lots or batches,

plus all rejected lots or batches after the rejected lots or. batches have been

effectively 100 percent inspected and all defectives replaced by non-defectives.

3.3 Average Outgoing Quality Limit (AOQL) . The AOQL is the maximum AOQ foragiven~acciptance sampling'

1

plaru" Factors for ccnputing AOQL values are given in

Table V-A for each of the single sampling plans for normal inspection and in

Table V-B for each of the single sampling plans for tightened inspection.

3.4 Classification of Defects . A classification of defects is the enumeration of

possible defects of the unit of product classified according to their seriousness.

3.5 Critical Defect . A critical defect is a defect that judgement and experience

indicate would result in hazardous or unsafe conditions for individuals using,

naintaining, or depending upon the product, or a defect that judgement and

experience indicate is likely to prevent performance of the tactical function of a

major end item such as a ship, aircraft, tank, missile, or space vehicle.

3.6 Critical Defective . A critical defective is a unit of product which

contains one "or more critical defects and may also contain major and/or minor

defects

.

3.7 Defect . A defect is any nonconformance of the unit of product with

specified requirements

.

MI.L-STD-105E

3.8 Defective . A defective is a unit of product which contains one or moredefects.

3.9 Defects per Hundred Units. The number of defects per hundred units of anygiven quantity of units of product is one hundred times the nurriber of defectscontained therein (one or more defects being possible in any unit of product)divided by the total number of units of product, i.e.

:

Defects per = Number of defects x 100

hundred units Number of units inspected

3.10 Inspection . Inspection is the process of measuring/ examining,or otherwise comparing the unit of product with the requirements.

testing,

3.11 Inpection by Attributes

.

Inspection by attributes is inspection wherebyeither the unit of product is classified siirply as defective or non-defective, orthe. number of defects in the unit of product is counted, with respect to a givenrequirement or set or requirements.

3.12 Lot or Batch . The term lot or batch shall mean "inspection lot" or"inspection batch", i.e., a collection of units of product from which a sampleis to be drawn and inspected and may differ from a collection of units designatedas a lot or batch for other purposes (e.g., production, shipment, etc.) .

3 . 13 Lot or Batch Size . The lot or batch size is the number of units of productin a lot or batch.

3.14 Major Defect . A major defect is a defect, other than critical, that islikely to result in failure, or to reduce materially the usability of the unitof product for its intended purpose.

3 . 15 Major Defective . A major defective is a unit of product which contains oneor more major defects, and may also contain minor defects but contains no criticaldefect

.

3.16 Minor Defect . A minor defect is a defect that is not likely to reducematerially the usability of the unit of product for its intended purpose, or is a

departure from established standards having little bearing on the effective use oroperation of the unit.

3.17 Minor Defective . A minor defective is a unit of product which contains oneor more minor defects but contains no critical or major defect.

MIL-SID-IOSE

3.18 Percent Defective . The percent defective of any given quantity of units

of product is one hundred tines the number of defective units of product contained

therein divided by the total number of units of product, i.e.:

Percent Defective * Number of defectives x 100

Number of units inspected

3.19 process Average . The process average is the average percent defective or

average number of defects per hundred units (whichever is applicable) of product

submitted by the supplier for original inspection. Original inspection is the

first inspection of a particular quantity of product as distinguished from the

inspection of product which has been resubmitted after prior rejection.

3.20 Sample . A sairple consists of one or more units of product drawn from a lot

or batch, the units of the sairple being selected at random without regard to their

quality. The number of units of product in the sairple is the sairple size.

3.21 Sample Size Code Letter . The sample size code letter is a device used

along with the AQL for locating a sampling plan on a table of sampling plans.

3.22 Sanpling Plan , A sampling plan indicates the number of units of product

from each lot or batch which are to be inspected (sanple size or series of

sanple sizes) and the criteria for determining the acceptability of the lot or

batch (acceptance and rejection numbers)

.

3.23 Unit of Product . The unit of product is the "thing inspected in order to

determine its classification as defective or non-defective or to count the number

of defects. It may be a single article, a pair, a set, a length, an area, an

operation, a volume, a conponent of an end product, or the end product itself.

The unit of product may or may not be the same as the unit of purchase, supply,

production, or shipment.

4. GENERAL REQUIREMENTS

4.1 Written Procedures . Written procedures are ordinarily developed and made

available for the Government representative's review, upon request. When the

written procedures indicate use of this standard, they shall cortply with the

requirements of this standard and reference appropriate parts as necessary.

4.2 Nonconformance . The extent of nonconformance of ' product shall be expressed

either in terms of percent defective or in terms of defects per hundred units.

MIL-STD-105E

4.3 Formation and Identification of Lots or Batches. The product shall be

assembled into identifiable lots, sublets, batches, or in such other manner as

may be prescribed. Each lot or batch shall, as far as is practicable, consist

of units of product of a single type, grade, class, size, and composition,

manufactured under essentially the same conditions, and at essentially the same

time. The lots or batches shall be identified by the contractor and shall be kept

intact in adequate and suitable storage space.

4.4 AQL .

4.4.1 AQL Use . The AQL, together with the Sample Size Code Letter, is used for

indexing the sampling plans provided herein.

4.4.2 Limitation . The selection or use of an AQL shall not iirply that the

contractor has the right to simply any defective unit of product.

4.4.3 Choosing AQLs . Different AQLs may be chosen for groups of defects

considered collectively, or for individual defects. An AQL for a group of defects

may be chosen in addition to AQLs for individual defects, or subgroups, within

that group. AQL values of 10.0 or less may be expressed either in percent

defective or in defects per hundred units; those over 10.0 shall be expressed in

defects per hundred units only.

4.5 Sampling .

4.5.1 Representative (Stratified) Sampling . When appropriate, the number of

units in the sample shall be selected in proportion to the size of sublots or

sub-batches, or parts of the lot or batch, identified by sane rational criterion.

When representative sampling is used, the units from each sublet, sub-batch or

part of the lot or batch shall be selected at randan.

4.5.2 Ting of Sampling . A sanple may be drawn after all the units comprising

the lot or batch have been assembled, or sample units may be drawn during assembly

of the lot or batch, ijn which case the size of the lot or batch will be determined

before any sanple units are drawn. If the sanple units are drawn during assembly

of the lot or batch, and if the rejection number is reached before the lot is

completed, that portion of the lot already completed shall be rejected. The cause

of the defective product shall be cteterndned and corrective action taken, after

which a new lot or batch shall be begun.

4.5.3 Double or Multiple Sampling . When double or multiple sampling is to be

used, each sanple shall be selected over the entire lot or batch.

MIL-STD-105E

4.6 Inspection Procedures . Normal inspection will be used at the start of

inspection. Normal, tightened or reduced inspection shall continue unchanged for

each class of defects or defectives on successive lots or batches except where the

switching procedures given below require change. The switching procedures shall

be applied to each class of ctefects or defectives independently.

4.7 Switching Procedures .

4.7.1 Normal to Tightened . When normal inspection is in effect, tightened

inspection shall be instituted when 2 out of 2, 3, 4, or 5 consecutive lots or

batches have been rejected on original inspection (i.e., ignoring resubmitted lots

or batches for this procedure)

.

4.7.2 Tightened to Normal . When tightened inspection is in effect, normal

inspection shall be instituted when 5 consecutive lots or batches have been

considered acceptable on original inspection.

4.7.3 Normal to Reduced . When normal inspection is in effect, reduced inspection

shall be instituted provided that all of the following conditions are satisfied:

a. The preceding 10 lots or batches (or more, as indicated by the note to

Table VIII) have been on normal inspection and all have been accepted on original

inspection; and

b. The total number of defectives (or defects) in the sanples from the

preceding 10 lots or batches (or such other number as was used for condition "a"

above) is equal to or less than the applicable number given in Table VIII. If

double or multiple sairpling is in use, all samples inspected should be included,

not "first ,f sanples only; and

c. Production is at a steady rate; and

d. Reduced inspection is considered desirable.

4.7.4 Reduced to Normal . When reduced inspection is in effect, normal inspection

shall be instituted if any of the following occur on original inspection:

a. A lot or batch is rejected; or

b. A lot or batch is considered acceptable under the procedures of

4.10.1.4, or

c. Production becomes irregular or delayed; or

d. Other conditions warrant that normal inspection shall be instituted.

MIL-STD-105E

4.8 Discontinuation of Inspection , If the currenulative number of lots notaccepted in a sequence of consecutive lots on original tightened inspectionreaches five, the acceptance procedures of this standard shall be discontinued.Inspection under the provisions of this standard shall not be resumed untilcorrective action has been taken. Tigthened inspection shall then be used as if4.7.1 had been invoked.

4.9 Sampling Plans .

4.9.1 Inspection Level . The inspection level determines the relationship betweenthe lot or batch size and the sample size. The inspection level to be used forany particular requironent will be as prescri±)ed by the contractor's writtenprocedures. Three inspection levels: I, II, and III, are given in Table I forgeneral use (see 4.1) . Normally, Inspection Level II is used. However,Inspection Level I may be used when less discrimination is needed, or Level IIImay be used for greater discrimination. Four additional special levels:S-l, S-2, S-3, and S-4, are given in the same table and may be used whererelatively small sample sizes are necessary and large sampling risks can or mustbe tolerated.

NOTE: In the selection of inspection levels S-l to S-4, care must be exercised toavoid AQLs inconsistent with these inspection levels. In other words, the purposeof the special inspection levels is to keep sanples small when necessary. Forinstance, the code letters under S-l go no further than D, equivalent to a singlesample of size 8, but it is of no use to choose S-l if the AQL is 0.10 percent forwhich the minimum sample is 125.

4.9.2 Code letters . Sairple sizes are designated by code letters. Table I shallbe used to find the applicable code letter for the particular lot or batch sizeand the prescribed inspection level.

4.9.3 Obtaining Sampling Plan . The AQL and the code letter shall be used toobtain the sampling plan from Tables II, III, or IV. When no sampling, plan isavailable for a given combination of AQL and code letter, the tables direct theuser to a different letter. The sample size to be used is given by the new codeletter, not by the original letters If this procedure leads to different samplesizes for different classes of defects, the code letter corresponding to thelargest .sample size derived may be used for all classes of defects . As analternative to a single sampling plan with an acceptance number of 0, the planwith an acceptance number of 1 with its correspondingly larger sample size for adesignated AQL (where available) , may be used.

MIL-STD-105E

4 9 4 Tvpes of Sampling Plans . Three types of sampling plans: Single, Double,

andWtiple, are given in Tables II, III, and IV, respectively. When several

types of plans are available for a given AQL and code letter, any one may be used.

A decision as to type of plan, either single, double, or multiple, when available

for a given AOL and code letter, will usually be based upon the comparison between

the administrative difficulty and the average sample sizes of the available plans.

The average sample size of multiple plans is less than for double (except in the

case corresponding to single acceptance number 1) and both of these are always

less than a single sample size (see Table IX) . Usually the administrative

difficulty for single sampling and the cost per unit of the sample are less than

for double or multiple.

4.10 Determination of Acceptability .

4 10 l percent Defective Inspection . To determine acceptability of a lot or

batch under percent defective inspection, the applicable sampling plan shall be

used in accordance with 4.10.1.1, 4.10.1.2, 4.10.1.3, and 4.10.1.4.

4.10.1.1 Single Sampling Plan . The number of sample units inspected shall be_

equal to the sample size given by the plan. If the number of defectives found in

the sample is equal to or less than the acceptance number, the lot or batch shall

be considered acceptable. If the number of defectives is equal to or greater than

the rejection number, the lot or batch shall be rejected.

4.10.1.2 Double Sampling Plan . A number of sample units equal to the first

sample size given by the plan shall be inspected. If the number of defectives

found in the first sample is 'equal to or less than the first acceptance number,

the lot or batch shall be considered acceptable. If the number of defectives

found in the first sample is equal to or greater than the first rejection number,

the lot or batch shall be rejected. If the number of defectives found in the

first sample is between the first acceptance and rejection numbers, a second

sample of the same size shall be inspected. The number of defectives found in

the first and second samples shall be accumulated. If the cumulative number of

defectives is equal to or less than the second acceptance number, the lot or batch

shall be considered acceptable. If, the cumulative number of defectives is equal

to or greater than the second rejection number, the lot or batch shall be

rejected.

4.10.1.3 Multiple Sample Plan . Under multiple sampling, the procedure shall be

similar to that specified in 4.10.1.2, except that the number of successive

samples required to reach a decision may be as many as seven.

4.10.1.4 Special Procedure for Reduced Inspection . Under reduced inspection, the

sampling procedure may terminate without either acceptance or rejection ^ criteria

having been met. In these circumstances, the lot or batch will be considered

acceptable, but normal inspection will be reinstated starting with the next lot or

batch (see 4.7.4.b) .

MEL-STD-105E

4.10.2 Defects per Hundred Ooits Inspection . To determine the acceptability of a

lot or batch under defects per hundred units inspection, the procedure specified

for percent defective inspection above shall be used, except that the word

"defects" shall be substituted for "defect ives".

4.11 T.4TTi-n--!og o«iHty Protection . The sampling plans and associated procedures

given in this publication were designed for use where the units of product are

produced in a continuing series of lots or batches over a period of time. However,

if the lot or batch is of an isolated nature, it is desirable to limit the

selection of sampling plans to those, associated with a designated AOL value, that

provide not less than a specified limiting quality protection. Sampling plans for

this purpose can be selected by choosing a Limiting Quality (LQ) and a consumer'

s

risk to be associated with it. Tables VT and VTI give values of LQ for the

the commonly used consumer's risks of 10 percent and 5 percent respectively. If a

different value of consumer's risk is required, the O.C. curves and their tabu-

lated values may be used. The concept of LQ may also be useful in specifying the

AQL and Inspection Levels for a series of lots or batches, thus fixing minimum

sample size where there is some reason for avoiding (with more than a given

consumer' s risk) more than a limiting proportion of defectives (or defects) in any

single lot or batch.

4.12 Curves .

4.12.1 Operating Characteristic Curves . The operating characteristic curves for

normal inspection, shown in Table X, indicate the percentage of lots or batches

which may be expected to be accepted under the various sampling plans for a given

process quality. The curves shown are for single sampling; curves for double and

multiple sampling are matched as closely as practicable. The O.C. curves shown

for AQLs greater than 10.0 are based on the Poisson distribution and are appli-

cable for defects per hundred units inspection; those for AQLs of 10.0 or less and

sample sizes of 80 or less are based on the binomial distribution and are

applicable for percent defective inspection; those for .AQLs of 10.0 or less and

sample sizes larger than 80 are based the Poisson distribution and are applicable

either for defects per hundred units inspection, or for percent defective

inspection (the Poisson distribution being an adequate approximation to the

binrmial distribution under these conditions) . Tabulated values, corresponding to

selected values or probabilities of acceptance (Pa, in percent) are given for each

of the curves shown, and, in addition, for tightened inspection, and for defects

per hundred units for AQLs of 10.0 or less and sample sizes of 80 or less.

4.12.2 Average Sample Size Curves . Average sample size curves for double and

multiple sampling are in Table IX. These show the average sample sizes which may

be expected to occur under the various sampling plans for given levels of process

quality. The curves assume no curtailment of inspection and are approximate to

the extent that they are based upon the Poisson distribution, and that the sample

sizes for double and multiple sampling are assumed to be 0.631n and 0.25n

respectively, where n is the equivalent sample size.

MH-STD-105E

SECTION 5

TABLES AND CURVES

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MIL-STD-105E

6. NOTES

6.1 Intended Use . Sampling procedures and tables for inspection by

attributes are intended to be used in the acquisition of Defense material.

6.2 Subject Term (Key Word) Listing ,

Acceptable Quality Level (AQL)

Average Outgoing Quality (AOQ)

Defect

Defective

Lot or Batch

Process Average

Sanple

Sampling Plan

Unit of Product

6.3 Changes from Previous Issue . Vertical lines or asterisks are not used in

this revision to identify ' changes with respect to the previous issue due to

the extensiveness of the changes.

67

MIL-STD-105E

CONCLUDING MATERIAL

CXistodians

:

Army - ARNavy - OSAir Force - 23

Preparing Activity:Army - AR

Review Activities:Army - MI, EA, TE, AV, ERNavy - AS, EC, IVC, CM, SA,

SH, ID, YDDLA - ES, GS, SSOSD - IP, SO

User Activities:Army - MEDLA - ES, SS

(Project QCIC-0085)

68

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