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National Instruments Scientific Imaging Symposium National Instruments Scientific Imaging Symposium Particle Detection and Counting by Interfacing a Microscope to a DVC Camera Using NI tools

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Page 1: National Instruments Instruments Scientific Imaging Symposium National Instruments Scientific Imaging Symposium Particle Detection and Counting by Interfacing a Microscope to a

National InstrumentsScientific Imaging SymposiumNational Instruments

Scientific Imaging Symposium

Particle Detection and Counting by Interfacing a Microscope to a DVC Camera

Using NI tools

Page 2: National Instruments Instruments Scientific Imaging Symposium National Instruments Scientific Imaging Symposium Particle Detection and Counting by Interfacing a Microscope to a

AgendaAgenda

• Introduction– Erik Goethert, New England Manager, Viewpoint

Systems

• Camera and Sensor Discussion– William Buser, Eastern Regional Sales Manager, DVC

• Microscopy and Imaging– David Claypool, Digital Imaging Manager, MVI

• Systems Integration using NI Tools– Erik Goethert

Page 3: National Instruments Instruments Scientific Imaging Symposium National Instruments Scientific Imaging Symposium Particle Detection and Counting by Interfacing a Microscope to a

IntroductionIntroduction

William Buser, the Eastern Regional Sales Manager from DVC, will go over the differences between the various cameras and sensors.

DVC Company manufactures digital cameras for scientific imaging applications www.DVCCO.com

Page 4: National Instruments Instruments Scientific Imaging Symposium National Instruments Scientific Imaging Symposium Particle Detection and Counting by Interfacing a Microscope to a

IntroductionIntroduction

David Claypool, the Digital Imaging Manager from MVI, will discuss the various Nikon microscope options and how they relate to the camera and the image.

Micro Video Instruments, Inc. (MVI) is a distributor of the Finest Clinical, Research, and Industrial Microscopes and Custom Manufacturer of Components for Microscopy. www.MVI-Inc.com

Page 5: National Instruments Instruments Scientific Imaging Symposium National Instruments Scientific Imaging Symposium Particle Detection and Counting by Interfacing a Microscope to a

IntroductionIntroduction

Erik Goethert, the New England Manager of Viewpoint Systems, will show how to integrate a microscope and a camera into a system using National Instrument’s tools.

Viewpoint Systems is a leading systems integrator in the test and measurement industry with offices located in Boston, MA and Rochester, NY. Viewpoint is a Select Integrator with National Instruments. www.ViewpointUSA.com

Page 6: National Instruments Instruments Scientific Imaging Symposium National Instruments Scientific Imaging Symposium Particle Detection and Counting by Interfacing a Microscope to a

DVCDVC

Page 7: National Instruments Instruments Scientific Imaging Symposium National Instruments Scientific Imaging Symposium Particle Detection and Counting by Interfacing a Microscope to a

MVIMVI

Page 8: National Instruments Instruments Scientific Imaging Symposium National Instruments Scientific Imaging Symposium Particle Detection and Counting by Interfacing a Microscope to a

Systems IntegrationSystems Integration

SCXI

1140

SCX I

1140

SC XI

1140

SC XI

1140

SCXI-1001

MAIN FRAME

SCXI

SCXI1100

Control Panel

Flow

Pressure Alarm Conditions

STOP

Temperature

LaboratoryAutomation

Page 9: National Instruments Instruments Scientific Imaging Symposium National Instruments Scientific Imaging Symposium Particle Detection and Counting by Interfacing a Microscope to a

System ComponentsSystem Components

• Typical Requirements:– Hardware

• Imaging components.• Data acquisition components.• Motion.

– Software• Drivers for hardware.• Application development tools

Page 10: National Instruments Instruments Scientific Imaging Symposium National Instruments Scientific Imaging Symposium Particle Detection and Counting by Interfacing a Microscope to a

Imaging HardwareImaging Hardware

• Frame grabber-NI• Camera-DVC• Microscope, Lens-MVI• Cabling• Lighting-Advanced Illumination (Signal

Conditioning for Image Data)

Page 11: National Instruments Instruments Scientific Imaging Symposium National Instruments Scientific Imaging Symposium Particle Detection and Counting by Interfacing a Microscope to a

Typical Analysis OperationsTypical Analysis Operations

• Intensity Statistics

• Particle Statistics

• Gauging & Caliper

Page 12: National Instruments Instruments Scientific Imaging Symposium National Instruments Scientific Imaging Symposium Particle Detection and Counting by Interfacing a Microscope to a

Application ExamplesApplication Examples

• Capillary and Well Plate Control

• Blood Particle Counting and Inspection

Page 13: National Instruments Instruments Scientific Imaging Symposium National Instruments Scientific Imaging Symposium Particle Detection and Counting by Interfacing a Microscope to a

Questions?Questions?

[email protected]

126A Main St . 800 West Metro ParkwayWatertown, MA 02472 Rochester, NY 14623617-926-9064 585-475-9555617-924-3402 fx 585-475-9645 fx