need to test 40 gb/s? - carleton universitynagui/appnotes/agilent/lightwavemeas/598… ·...

Need to test 40 Gb/s?

Solutions to accelerate the next generation optical internet

Need to test 40 Gb/s?

www.agilent.com/comms/40G

Working at the forefront of technologyplaces demands on you and your test equipment. With exceptionalperformance expected while facingthe pressures of reduced time tomarket, trust in your measurementresults is vital. Whether you are developing leading edge fiber-optic

NetworkElements& Systems

Components& Modules

Line Cards

Tools to Get The Job Done

2

components or verifying system performance during installation or trialing, Agilent Technologies provides solutions that enable you to see the whole picture.

Page 7Element and System:Tributary Loading and Test

Page 9Backplane MeasurementsWith TDR

Page 9RZ Waveform Test

Page 5 & 6Active Opto-ElectronicComponent Test

Page 4 & 5Electrical Component Test

Page 4Design & Simulation


The telecommunications industry is undergoing the most significantseries of changes since its inception,and this will require testing that is above and beyond the usual. Youknow Agilent has always appliedrelentless innovation to help youmeet your design challenges, but did you know about our 40 Gb/ssolutions? Here we take a look atsome of the measurements you arefaced with and the breadth ofAgilent’s test solutions available to make them. In each case, morespecific information on how theymight be tailored to meet your needsis available by either contacting us,or ordering additional literature.(See back pages).

3

Agilent Technologies – providing greater certainty.

Page 10 & 11Gain Module Testing

Page 12Passive OpticalComponent Measurements:Spectral Loss and AllDispersion Parameters

Page 12Passive OpticalComponent Measurements:Chromatic Dispersion andPolarization Mode Dispersion

Grating

Grating

EDFA

EDFA

www.agilent.com/comms/40G4

Optical Wireline and HighSpeed Digital DesignAs parametric challenges increasewith frequency for 10 Gb/s and 40 Gb/s systems, it pays to run comprehensive simulation and circuit optimization before ever committing designs to a tapeout orprototype. This saves time, effort and money as design wrinkles areironed out and “what if” scenariosare used to predict eventual performance under all conditions.

The Advanced Design System can simulate at the IC, DUT board,module, and board level. Incorporateeffects of distributed componentssuch as LVDS and multi-layer onchip transmission lines, packagesand bond wires. Simulate phasenoise and jitter in clock generationand PLL clock recovery circuits.Simulate additive jitter in muxes,amps, etc. Display eye diagram and

Frequency Domain MicrowaveTestingWhether breadboarding duringdesign or maximizing throughput in manufacturing, quick and accurate measurements that can be relied upon are essential. Vectornetwork analyzers such as theE8361A (67 GHz), 8722ES (40 GHz)and 8510XF (110 GHz) provideresults you can trust. Giving quickaccess to S-parameters, these analyzers provide transmission andreflection performance of 40 Gb/scomponents such as amplifiers, drivers and clock recovery circuits.

The optional capability of timedomain takes the S-parameter information and transforms it to a TDR-like view that might be seenon an oscilloscope – making it easyto see the reflection contributioncoming from connectors and other circuit discontinuities.

Design and Simulation

Electrical Component Test – RF and Microwave

measure eye closure. IncorporatedE/E and E/O measurements of transimpedance amplifiers, lasermodulator drivers, and detectors.Create behavioral models of components and provide encodedvirtual prototypes for more socket wins.

Agilent IC-CAP semiconductorparameter extraction and modelingsystems improve your simulationaccuracy by providing the best highfrequency models of transistors.

16:1 MUX simulated in Advanced Design System

Measure eye closure

Frequency response and impulseresponse of discontinuity

Time domain view of 16:1 MUX performance

www.agilent.com/comms/40G 5

Complete Characterization ofBER Performance

Bit error ratio (BER) is the fundamental measurement to determine the performance of a digital component. Ultimately, theperformance of the component and the system that it goes into will be judged by whether it passesbits correctly.

Multiplexers and demultiplexersneed to be stimulated on high speed and low speed sides to fully assess performance. Serial components such as modulator drivers, transimpedance amplifiers,limiting amplifiers and receiversneed to be characterized at the full 40 Gb/s line rate to verify they will function correctly under all conditions.

Electrical & Optoelectronic Component Test – Bit Error Ratio

45 Gb/s Electrical & OpticalBERT SystemParBERT is a modular, flexible VXI-based BER test system that is able to test multiple parallel channels at rates up to 10.8 Gb/s.The system offers electrical and opticalcapabilities at 45 Gb/s.

With ParBERT 81250 it is possible to test 16:1 and 4:1 multiplexers anddemultiplexers as well as serial 40 Gb/s components and modules.On the low speed side, they can operate with 16 channels of 2.7 Gb/sor 3.35 Gb/s or 4 channels of 10.8 Gb/s. It is also possible to have17 or more low speed channels tomeet SFI-5 testing requirements. Thehigh speed side operates at ratesbetween 38 and 45 Gb/s.

For component testing, the commonPRBS patterns are built in. For BERtest of modules and systems, RAMcan be used load SONET and G.709static frames.

For complete design verification of multiplexers, testing can revealwhich channel of the parallel side is the weakest and prone to causeerrors first. This can be achieved by measuring setup and hold times,and moving the stimulus to individualchannels in time until errors occur.Through methods such as this, it is possible to identify opportunitiesfor signal routing optimization during the design phase.

ParBERT offers flexibility in configuration and operation to meetyour needs and protect your investment now and in the future.


86030A 50 GHz Lightwave Component Analyzer

71400C Lightwave Signal Analyzer

83453A High-ResolutionSpectrometer (HRS)

Verify Laser Performance Accurate characterization of the lasersource is critical for any high-speedsystem. To characterize a source, themeasurement of average power, noise,linewidth, and modulation is required.

Long recognized within the industry,the Agilent 71400C is designed to characterize laser and lightwave signals.This analyzer has automated routinesfor enhanced and simplified measure-ments of relative intensity noise(RIN), average power, modulationpercentage, and modulation analysisup to 22 GHz. The 71400C can also

Accurate Characterization of40 Gb/s Optical ComponentsModern transmission systemsrequire accurate characterization oftheir optical and electrical componentsto guarantee high-speed performance.The Agilent 86030A 50 GHz lightwavecomponent analyzer improves thedesign and specification of lightwavecomponents by accurately measuringtheir bandwidth and reflection characteristics.

For manufacturers building 40 Gb/soptoelectronic, components used inhigh-speed OC-768 lightwave systems,the 86030A can completely characterizethese components at modulation

Frequency Domain Test of Active Components

• Lasers• Receivers• Photodiodes• Modulators

provide linewidth and chirp character-ization with the addition of the11980A Fiber-optic interferometer.

Modulation, distortion, and DWDMrequire high spectral resolutionThe growing need for higher bandwidth drives the demand forincreased characterization andanalysis of lightwave signals. CloseDWDM channel spacing require tight control of laser spectral characteristics such as crosstalk,sidebands, and linewidth. Higherbandwidths and alternative modulationformats, such as suppressed carrier,single-sideband, and sub-carriermodulation, require greater spectralresolution and accuracy.

Using heterodyne techniques, theAgilent 83453A high-resolution spectrometer (HRS) provides spectralmeasurements with sub-picometer(< 10 MHz) spectral resolution ontunable lasers, transmitters, and network systems.

frequencies up to 50 GHz.Components such as photodiodereceivers, optical modulators, andother optical and electrical components used in 40 Gb/s lightwavesystems can be characterized ineither an R&D or manufacturingenvironment.


With any new system design, manycomplex elements have to cometogether and work flawlessly, fromcircuit boards to complex protocolstacks and firmware. The real test ofwhether your customers are satisfiedis when the system is loaded withtraffic and stressed to its limits.

RouterTester 900The Agilent RouterTester providesmulti-port traffic generation at speedsup to 10 Gb/s as well as framed BER

Testing Gigabit and Terabit RoutersTo truly prove the performance of a40 Gb/s router, it is necessary to loadmultiple ports with real-world trafficlevels and beyond. With internetinstability and fluctuations in networktopology impacting router performance,it is essential that any new product

Structured SONET/SDH andOTN test to 43 Gb/sThe OmniBER OTN 40 Gb/s commu-nications performance analyzer isthe industry’s first fully-integratedmultirate SONET/SDH and OTN testset. Equipped with all line rates from52 Mb/s through to 40 Gb/s, plus10.71/43 Gb/s optical channel (OTU-2/OTU-3), the OmniBER OTN 40 Gb/sanalyzer offers unparalleled flexibilityfor design and verification applications.

RouterTester 900 OC-768 Forward TestIn order to test OC-768, 8 X OC-192ctest modules can be muxed/demuxedusing a SONET mux.

testing, protocol conformance, stresstesting and performance analysis ofnetworking devices. It can be used toverify the BER of multiple 10 Gb/sSONET/SDH tributaries to a 40 Gb/stransport signal in a single integrated test.

The system is ideal for network equip-ment manufacturers wishing to perform:

• Software/control plane research and development

• Hardware/data plane research anddevelopment

• Full system integration• Manufacturing/production testing

The system can also give serviceproviders the ability to perform newservice deployment tests, performanceverification of devices prior todeployment, performance benchmarking,network performance tests, qualityof service tests, service level agreementcertification and network upgrade tests.

Tributary Loading and Test

7

• Network Elements• Line Cards• Systems

40 Gb/s with

SONET/SDHPayload

43 Gb/s OTN with

SONET/SDHPayload Optical

Translator Unit

AddErrors

CheckFor NoErrors

conforms to the relevant protocolstandards, and performs under eventhe most stressful conditions.

Its ability to generate structuredSONET/SDH and OTN signals andapply these to aggregation devicesensures you quickly validate deviceoperation for conformance to bothdesign criteria and Telcordia/ITU-Tstandards. Its extensive SONET/SDHand OTN test capability includes all-channel measurements down to STS-1/AU-4 granularity for fast designconfirmation and confidence in theperformance of your device. You cangenerate unframed signals up to OC-768/STM-256. And with directaccess to overhead bytes, you can

stress-test your devices in terminationand thru-mode to verify interoper-ability between network elements.

In addition, the OmniBER OTN 40 Gb/sanalyzer is the only test set availablethat has the capability to ensureconformance of your device to bothITU-T G.707 and G.709 standards.The analyzer’s test capability alsoextends to exercising and monitoringthe ITU-T-defined FEC algorithm andthe OTN overhead giving you confi-dence that your design implementationis fully functional and compliant tointernational standards.


• Lasers & Receivers• Network Elements• Systems

Low jitter, wide bandwidth, and well-behaved frequency response yieldhigh-fidelity waveforms.

Whether it’s research, developmentor manufacturing, the ability to seeyour waveforms will always beimportant. At 40 Gb/s, the bit periodis only 25 picoseconds. Pulsewidthsare extremely narrow and return-to-zero (RZ) modulation reducespulsewidths even further. At thesespeeds, it can be difficult to knowwhether the waveform you observe isa faithful representation of your signal and has not been altered dueto limitations of the oscilloscope.

Several improvements have been madeon the Agilent 86100B Infiniium DCAspecifically for 40 Gb/s waveformanalysis. Among these are developmentswhich represent dramatic breakthroughsin measurement technology.

Waveform fidelity and accuracy from the 86100B

The new 86107A precision timebasemodule represents one of the mostsignificant improvements in wide-bandwidth sampling oscilloscopes inover a decade. Jitter performancehas been reduced almost an order ofmagnitude and is now below the 200 fslevel. Oscilloscope jitter is virtuallyeliminated! Timebase resolution hasadvanced from 10 ps/division to 200 fs/division, a 50 times improvement.

40 Gb/s Waveform Testing

Several plug-in modules are availablefor both electrical and optical analysis.

The new 86118A provides two 70+ GHzelectrical channels. Trying to measuresignals with this range of frequencycontent becomes difficult as evenvery short lengths of cabling can produce noticeable changes in waveshapes. To eliminate this problem,the key electronics of the measurementchannels are built into lightweight,compact housings (roughly the sizeof a thick credit card) that can beplaced up to two meters from theoscilloscope mainframe to keep cablelengths at a minimum. The 86117Aand B offer 50 and 65 GHz bandwidthrespectively in the traditional 86100plug-in architecture (including con-venient knobs for vertical scale andoffset adjustment). Coupled with thelow jitter discussed above, these represents the premier solution for40 Gb/s electrical waveform test.

The 86109B, 86116A and 86116Bmodules have been developed specifically for 40 Gb/s test, eachwith an integrated optical channeland high-speed electrical channel. Inboth modules, the optical channelhas been carefully designed to providea balanced combination of speed,sensitivity, and waveform fidelity.With up to 65 GHz optical and 80 GHzelectrical bandwidth, ultra-fast communications signals are accuratelyviewed. For the ultimate in high-speed optical waveform analysis, the86119A optical sampling system is atest set that is added to the 86100Aor B mainframe to provide almost 1 THz of measurement bandwidth!40, 160, even 320 Gb/s waveformsare seen without instrumentationspeed limitations. You can build thepremier solution for 40 Gb/s waveformtest solution around the 86100A orB mainframe you already own.

86118A Dual 70+ GHz ElectricalRemote Head


• Backplanes• Circuit Boards• Packages

RZ PulseMeasurement on the 86100B

Interconnect and Backplane Testing

Designing backplanes, microstripstructures and interconnects for 40 Gb/ssystems can be a challenging signalintegrity task. While simulation toolscan be helpful predicting eventualperformance, real confidence onlycomes from using measurement toolsthat can accurately verify the real-world response to fast edge speeds.

Time domain reflectometry (TDR) isone of the tools used most frequentlyby digital design engineers to relatephysical interconnect structures tosuch parameters as characteristic impedance, reflection coefficient,propagation velocity and edge effects.

TDR Normalization removestest fixture errors

Performing Return-to-ZeroWaveform MeasurementsA return-to-zero (RZ) signaling schemecan provide an attractive method toovercome some of the performancebarriers encountered when usingoptical fiber. Many designers will takeadvantage of an RZ modulation formatas the work begins to develop 40 Gb/ssystems. Some ultra-long distancetransmission systems operating at ratesbelow 40 Gb/s are also RZ format based.

In the development and productionof RZ communication systems, it will be essential to accuratelymeasure waveforms. Many of themeasurements commonly used tocharacterize an NRZ eye can also be applied to RZ eyes. These includerise and fall times, eye height andwidth, and ‘1’ and ‘0’ levels. Thereare unique characteristics of an RZsignal for which new measurementsneed to be created. Contrast ratio is a measure of how well ‘1’ pulsesactually return to a zero level. The definition for extinction ratio is modified to account for 1 pulsesstarting from and returning to zero.

Thus the 86100B Infiniium DCA nowincludes an extensive measurementset designed specifically for RZ pulses. These measurements include:

•RMS Jitter •Extinction ratio•Fall time •Zero level•Eye height •Signal-to-noise ratio•Eye width •Peak-to peak jitter•Bit rate •Rise time•One level •Eye amplitude•Pulse width •Eye opening factor•Duty cycle •Contrast ratio

Simply configure the oscilloscope forRZ measurements and start testing.

For improved accuracy, TDR normalization sets the measurementreference plane precisely at the deviceunder test, taking out the effects ofthe test fixture. This technique uses atwo-port calibration with a precision50-Ohm load and a short. The processingpower of the 86100B builds a digitalfilter that corrects for test fixtureerrors in the frequency domain.

Now, use differential TDR normalizationfor all of differential circuit analysis.

Increased resolution TDR test setup using the 86100B to measure 10 ps risetime pulses

PicoSecond PulseLabs 4015C PulseGenerator*

*PicoSecond Pulse Labs: USA (303) 443-1249;www.picosecond.com

NEW!


Optical amplification is critical to the continued growth of 40 Gb/s opticalfiber telecommunications. Increased transmission capacity through higherchannel density and wider optical bandwidth per fiber has placed stringentperformance requirements on optical amplifiers. Additional requirementsare imposed by configurable transparent networks where channels aredynamically added and dropped. Raman amplification is increasingly beingconsidered to extend the wavelength range for a transmission system or toextend the distance between repeaters.

Amplifier Component TestingAmplifiers such as Raman and EDFA are composed of componentsthat have different test needs thanother network components. The components are required to operateat wavelengths out of the usualtelecommunications range, and atpower levels beyond the usual. Thisimposes similar requirements on the measurement systems.

The Agilent 81600B all-band tunable laser source,with it’s broad wavelength range from 1440 nmto 1640 nm, allows testing at the 1480 nm pumpwavelengths as well as testing at the transmissionwavelengths in S-, C- and L- bands.

Gain Module Testing

86142B optical spectrum analyzer with source test application characterizes sources such as pump lasers.

The Agilent 81628B high power optical headwith integrating sphere can measure highoutput power levels of pump sources up to +40 dBm.

Agilent also provides you with the PhotonicFoundation Library (PFL), a comprehensive collection of the most frequently required measurements and analysis functions for optical components.

SolutionsAgilent offers a broad range of solutions for active and passive opticalcomponent testing. For gain modulesthese include tools for characterizingpump sources, through to tunablesources for testing Raman amplifierpassive components in the 1400 nmband.


8166B lightwave multichannel system: ITU-grid DFB lasers, compact tunable lasers,power meters, attenuators and switches are afamily of plug-in modules for Agilent’s modularoptical component test platform.

8614xB optical spectrum analyzers are ideal formeasuring gain, gain flatness and optical noisefigure by using built-in software applications.Using the internal, synchronous modulation ofthe 816x laser sources, the 86146B OSA can perform accurate TDE measurements on erbium-doped amplifiers and waveguide amplifiers.

Module TestEDFA and Raman amplifier gainmodules are complex devices whichneed to be fully characterized. The behavior of such amplifiersvaries depending upon the channelloading, power level and operatingconditions. To verify the operationand performance under real-worldconditions, it is important to load a test device in ways that closelyemulate the way it will be used.

SolutionsAgilent offers a wide range of test solutions for testing opticalamplifiers, from complete turnkeysolutions that offer comprehensivecharacterization of optical and electrical noise, to a complete family of building blocks:

• multichannel wavelength sources • compact tunable laser sources• optical spectrum analyzers with

built-in software applications for gain and noise figure measurements

• optical power meters for high power measurements

• flat wavelength attenuators• optical switches

With our experience on testing optical amplifiers, we can help youbuild the system you need with the flexibility and scalability potentialfor future requirements.

Agilent’s comprehensive turnkey amplifier test system.


86038A Optical Dispersion Analyzer

81910APhotonic All-parameterAnalyzer

Dispersion Testing

12

• Fibers• Optical MUXES & DeMUXES• Isolators• Dispersion Compensators

Grating

Overcoming dispersion is a major barrier in deploying 10 and 40 Gb/s networks.In advanced networks, components and systems must meet stringent specifications of any of the four parameters spectral loss (IL-RTL), polarizationdependent loss (PDL), group delay (GD), and differential group delay (DGD).

The Quick and Accurate Way toCharacterize CD, PMD, IL and PDLThe 86038A optical dispersion analyzer(ODA) from Agilent takes you intothe future of optical dispersionmeasurements. It is designed for thedevelopment of a wide range ofdevices including DWDM opticalcomponents, optical fiber, andamplifiers. With a single connectionthe 86038A performs simultaneousmeasurement of GD, CD, PMD, ILand PDL. The very low noise and highspeed capability of the analyzer allowsit to perform dispersion measurementswith the highest accuracy and speed.The excellent group delay resolutionoffered by the 86038A reveals thetrue details of narrowband devices.The 86038A automatically correctsgroup delay measurements for thevariations produced by PMD.

The 86038A is designed for highthroughput measurements in the entireS-, C- and L-bands (1440-1640 nm). Thetwo ports enable greater equipmentutilization to measuredevices in transmissionor reflection modesand measure a total ofeight traces simultane-ously. The softwareallows fast steppedmeasurements andultra-fast swept modemeasurements. The86038A can perform agroup delay and insertionloss measurement in 10 seconds. Furthermorethe 86038A offers a realtime data update mode(continuous sweep) for fine tuning devices for R&D or manufacturing customers.

An innovative solution to improve your cost of testThe Agilent 81910A Photonic All-parameter Analyzer is especiallydesigned for wavelength selectiveoptical components. Representing abreakthrough in test instrumentation,it allows for more precise character-ization of all relevant device parametersin equal importance in a single setup.As most passive components areused to route or redirect light, theyexpose steep spectral loss traces,which are often paired with steepdispersion slopes. Test requirementsfor such components are bestdescribed as “high accuracy, highdynamic range, high resolution”—bothfor spectral loss and for dispersion.

Building on the industry standardcombination for precise spectral losstesting, a tunable laser source andpower meters, the 81910A photonic

all-parameter analyzer utilizes aswept homodyne method to accuratelymeasure the dispersion properties of a device. To save setup and testtime, and to reduce test uncertainties,spectral loss, PDL, GD, DGD are all measured simultaneously in transmission and reflection, with a single device connection.

Agilent’s Photonic FoundationLibrary (PFL) included withthe Agilent 81910A, providesyou with an intuitive, easy-to-operate graphical userinterface, and allows for easy integration into your manufac-turing environment.

The 81910A photonic all-parameter analyzer comes asa complete solution. Optionally,you can have your existingtunable laser upgraded andintegrated.

For more information order the following literature:

Agilent Optical Amplifier Test Solutions:5988-5760EN Brochure

8614xB Series Optical Spectrum Analyzers:5988-3657EN Brochure

High Performance Amplifier Test Systems:5968-9856EN Brochure

816xB Lightwave Mainframes:5988-3989EN Brochure

81689B/49A Compact Tunable Laser Sources:5988-4007EN Brochure

81662A/63A DFB Laser Sources:5988-4005EN Brochure

816xx Power Meters:5988-1569EN Technical Specifications

8157xA Optical Attenuators:5988-3988EN Product Overview

8159xA Optical Switches:5988-5071EN Technical Specifications

Product Descriptions – Optical Gain Module Testing

Optical Amplifier Test System

8164B Lightwave Measurement System

81689B/49A Compact Tunable Laser Sources

81662A/63A DBF Laser Sources

8159xA Optical Switches

816xx Power Meter

8166B LightwaveMultichannel System


Advanced Design System• High speed analog/digital IC design• Board level design• Behavioral modeling

RF Design Environment (RFDE)• Integrates ADS simulation technology

into your Cadence design flow• Enable complete high-speed analysis

of designs in the Cadence schematic environment

For more information contact yourlocal Agilent EEsof sales representativeand ask for ADS High Speed AnalogDesigner or RFDE Wireline Pro.

Vector Network Analyzers• Accurate production test• Easy to use• High measurement throughput• 67 GHz (E8361A), 40 GHz (8722ES),

and up to 110 GHz (8510 Series)• Go/No-go testing

For more information order the following literature:

5968-8472E PNA Series, Brochure

5968-5161E 8720 Family, Product Overview

5965-9888E 8510XF, Product Overview

Product Descriptions – RF and Microwave Domain

NEW!

E8361A 67 GHz PNA Series

8510XF 110 GHz Network Analyzer System

8614xB Optical Spectrum Analyzer

8157xA Optical Attenuators


86030A 50 GHz Lightwave Component AnalyzerFully characterize components to 50 GHz in the electrical and opticaldomains. Ideal for modulators, optical and photodiode receivers.

For more information order the following literature:5968-9734E Product Overview

71400C Lightwave Signal AnalyzerAn industry standard for the measurement of RIN and linewidth.

For more information order the following literature:5980-1929E Product Overview

Product Descriptions – Wavelength and Frequency Domains

86038A Optical Dispersion AnalyzerAgilent’s new Optical DispersionAnalyzer (ODA) provides simultaneousmeasurements of CD, PMD, IL andPDL on DWDM components, fiber,amplifiers and systems in the entireS-, C- and L-bands.

• Group delay (GD)• Polarization mode dispersion (PMD)• Chromatic dispersion (CD)• Insertion loss (IL)• Polarization dependent loss (PDL)

For more information order the following literature:5988-7200EN Brochure

81910A Photonic All-Parameter AnalyzerThe 81910A is a fully equipped passivecomponent test solution — thoroughlymeasuring spectral loss, PDL, GDand DGD simultaneously. The solutionadvances and integrates the industryleading solution for loss measurementinto an all-parameter test solution.

For more information order the following literature:5988-5818EN Brochure

83453A High-Resolution SpectrometerSpectrum analysis with sub-picometerresolution

• 1-MHz (0.008pm) Resolution • Sensitivity - 65 dBm • Operating over 1510 - 1640 nm• Max operating power - +23 dBm

For more information order the following literature:5988-5309EN Product Overview

Variable Optical Attenuators• Set power levels accurately in BER

measurements for receivers, modulesand linecards, such as receiver sensitivity testing

• Modular design for Agilent’slightwave multichannel system

• Optional integrated power control• Comprehensive software functions

for easy and fast calibration of themeasurement system


40 Gb/s Optical and Electrical BERT Systems• Testing to 45 Gb/s• Subrates available to 2.7 Gb/s,

3.35 Gb/s and 10.8 Gb/s• Flexible and modular• Generates and analyzes pseudo-

random word sequences (PRWS)and standard PRBS on parallel linesup to 231-1

• Electrical and electrical/opticalsystems available

For more information order the following literature:5988-5892EN Product Overview5988-3020EN Product Overview

OmniBER OTN 40GThe industry’s first fully-integratedmultirate SONET/SDH and OTN testset - with all line rates from 52 Mb/s to40 Gb/s, plus 10.71/43 Gb/s opticalchannel (OTU-2/OTU-3). Unparalleledflexibility for R&D and verificationapplications

• Simulates realistic network conditions using structured SONET/SDH and OTN signals

• Offers ITU-T G.709 compliant OTU-2/OTU-3 testing with powerfulin-depth FEC analysis

• Ensures DUT conformance to both ITU-T G.707 and G.709 standards with a single instrument

For more information order the following literature: 5988-6646EN Product Overview

Product Descriptions – Error Domain and Functional Testing


NEW!

8166B

8156xA

RouterTester 900• Multiport tributary testing of

SONET/SDH, router and packet interfaces

• Framed BER testing• 10 Gb/s POS analysis• 10 Gb/s Ethernet analysis • Scaleable routing and MPLS packet

and protocol testing


86100B Infiniium DCA Wide-Bandwidth Oscilloscope

View electrical waveforms with over 80 GHz bandwidth and opticalwaveforms with over 65 GHz bandwidth.Modular configurations to matchyour needs. Add a test set for almost1 THz bandwidth. Built-in measurementsfor high-speed digital communications.

For more information order the following literature:5988-5311EN Technical Specifications5988-5235EN Brochure

Agilent Lightwave Catalog5988-4183EN

General Purpose Test Instruments Catalog5988-5109ENUS

By internet, phone, or fax, get assistance withall your test & measurement needs.

Online assistance:www.agilent.com/comms/lightwave

www.agilent.com/find/emailupdatesGet the latest information on the products and applications you select.

Phone or FaxUnited States:(tel) 1 800 452 4844

Canada:(tel) 1 877 894 4414(fax) (905) 282 6495

China:(tel) 800-810-0189(fax) 1-0800-650-0121

Europe:(tel) (31 20) 547 2323(fax) (31 20) 547 2390

Japan:(tel) (81) 426 56 7832(fax) (81) 426 56 7840

Korea:(tel) (82-2) 2004-5004(fax)(82-2) 2004-5115

Latin America:(tel) (305) 269 7500(fax) (305) 269 7599

Taiwan:(tel) 080-004-7866(fax) (886-2) 2545-6723

Other Asia Pacific Countries:(tel) (65) 375-8100(fax) (65) 836-0252Email: [email protected]

Product specifications and descriptions in this document subject to change without notice.

© 2001, 2002 Agilent Technologies, Inc.Printed in USA August 23, 20025988-3877EN

Product Descriptions – Time Domain

need to test 40 gb/s? - carleton universitynagui/appnotes/agilent/lightwavemeas/598… ·...

Documents