nist - colorado seongshik oh raymond simmonds katarina cicak kevin osborn john m. martinis ken...
TRANSCRIPT
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NIST - Colorado
Seongshik OhRaymond SimmondsKatarina CicakKevin Osborn
John M. Martinis Ken Cooper Matthias SteffenRobert McDermott
University of California - Santa Barbara
David P. Pappas
Epitaxial superconducting refractory
metals for quantum computing
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1) Need longer T1
– identify dominant loss mechanisms• Substrate & insulator– SiO2?
– Kevin Osborn– John Martinis
» Next session
2 ) Need higher measurement fidelity– Identify, eliminate intrinsic resonances
– Junction dielectric?
Challenges in solid state qubits
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What we want:
Crystalline barrier-Al2O3
Interfaces: Smooth Stable No dangling bonds
Poly - Al
Poly- Al
What we have:
Amorphous tunnel barrier a -AlOx-OH Rough interfaces Unstable at room temp. Dangling bonds
No spurious resonatorsStable barrier
Spurious resonators in junctionsFluctuations in barrier
Silicon
amorphous SiO2
dangling bonds at interface
Low loss substrate
Design of tunnel junctions
SC bottom electrode
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Q: Can we prepare crystalline Al2O3 on Al?
Binding energy of Al AES peak in oxide60
59
58
57
56
55
54
900800700600500400300Annealing Temp (K)
AE
S E
nerg
y of
Rea
cted
Al (
eV)
Al in sapphire Al203
Metallic aluminum
Aluminum Melts
68
10 Å AlOx on Al (300 K + anneal) 10 Å AlOx on Al (exposed at elevated temp.)
Anneal the natural oxides Oxidize at elevated temp.
A: No
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Chose bottom superconducting electrode to stabilize crystalline Al2O3 tunnel barrier
Elements with high melting temperature
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Elements with TC > 1K
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Elements that lattice match sapphire (Al203)
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Elements that form weaker bond with oxygen than Al
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Elements that are not radioactive
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LEED, RHEED, AESRe
Sputtering
LoadLock
STM
• Pbase< 5x10-10 Torr
• Sapphire c-axis substrates
• Sputter deposit Re
UHV growth system
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Morphology of Re/sapphire Room temperature growth
100 nm Re
• 3 nm RMS roughness• Mixed growth planes
– c-plane– a-plane
• Needs to be heated
for barrier growth
0.5x0.5 um
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100 nm Re, room temperature deposition + 750 C anneal
• 1 nm RMS roughness• Re surface begins to
crystallize between 550–650C• Need higher temperature to
crystallize Al2O3
0.5x0.5 um
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Sapphire substrate epi-Re on Sapphire
Growth of epitaxial Re(0001) at high temperature
RHEED diffraction images
+ 100 nm Re @ 850 C
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High temperature growth – 100 nm Re @ 850 C
• 1.5 nm RMS roughness• 2 atomic layer steps• Screw dislocations on mesas• Stranski-Krastanov growth
– Initial wetting of substrate– Formation of 3-d islands– Islands fill in gradually
• Evidence of step bunching
=> some very large steps
500 x 500 nm
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100 nm Re, 850 C deposition – zoom in
• Step bunching on corners• Sharp dropoffs where
multiple steps come together
• ~100 nm wide mesas
200 x 200 nm
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100 nm Re, 850 C deposition, 1200 C anneal
• Much large mesas
~ 200 nm diameter• Still find step bunching• Temperatures very high
500 x 500 nm
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Grow thin film at low T, anneal=> add thick film with homoepitaxy @ high T
2 nm Re, R.T. + 850 C anneal
500 x 500 nm
+ 100 nm Re @ 850
=> 200 nm terraces, comparable to 1200 C anneal
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Conclusions• Need bottom electrodes that are stable at high T
T > 700 C
• Demonstrated Re growth with large terraces
• Films need to be annealed to > 800 C to stabilize surface
• Large mesas with wide terraces can be obtained 3 ways:– High temperature growth ~850 C => 100 nm mesas– Anneal to very high temperature, ~ 1200 C => 200 nm– Low T buffer, anneal to 850, then 850 C film => 200 nm
• Need to grow epitaxial Al2O3 on these surfaces
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(1) Element with high melting temperature
(2) TC > 1K
(3) Epitaxial match to Al2O3 – hcp, 2.77 Å
Re - hcp (0001) < 1% lattice mismatch
(4) Re - smaller oxidation energy (sharp interface)
Chose bottom superconducting electrode to stabilize crystalline Al2O3 tunnel barrier