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\J\rvvv . rrst tE;J TilIf f f fl5t ffllgflf lllE:l,DElemental Limits of Detection in 5iO, and SRM Matrices Using Mining Analysis

The Niton6) XL3r GOt.l.ill+ Scrics x-ray fluor:escencc {XRF)anall.zcris the utrtirnate choice in features ar-rd perfornrance. l['he chart belowdetails the sensitivity, or LODsr, of the Niton XI-3r GOLDD+ Serics

using mining analysis for an Sit), rnatrix, a typical soil rnatrix iSiO,

t;\ s''

*,'*-s.Y

"i"l".. i"l .'*.

,1- I

\ tt

€zisiq Thertt Fishet

Scientt{tt irc.

A;i tights ftseivaf.

Ai! Iadaaarts arc lheyapeftr if -f!,e;ftio

Fisfier

Sr,tr;lfc l+r affd il:st;hsidiarlx.

Spd4siiE\s, |erns atidpritiig tre subi5t io eh1flJe.

Not ai! praiiucts ere avaliahle

ii all L.aililtiffi. Please con$u{t

yo$ !6al ffles rearresffitatire

fsr details.

*t{44ez;.orlzgro

Limits ol detecfian {L0Ds} are

dependenl on th* fcllawing facfars:

" Testing time. inrerierenceslmalrrx. Levei nf st:tistical rantid*nr;c

LCDs are c:leulated as lhree standard

deviaticns {99.7!;" confid ence intervalJ

for each element. using 60-sacond

analysis times per irlter.

Please Nate:

0ngcing researclr arrti aCvancene*ls

rn our Niton XLSI fi0LDD+ Series

anelyzers will lead to rontinuai

!mpr*vement in many oithe values

detaried in this chan. Contact a

Therna Fishr:r Scienti{ir r:ffice or your

local representative {or the latest

periormance spectliratir:ns,

Acir:ai analysis tjme is based on

your requirements, antj, in mast

cases, shorter times wili give you

the detection iimits you require.

Fnr example, if analysis time lvas

red Lr c ed iron,. 60 sccorrrls/iilter to

l5 secondslfrlel tl el lhe detecticn

lim;ts oi:tained wculd be twice the

values shown in the chart. Similarly,

increasing the anslysis tir*€ wiil

redlce the detection limits by the

sqilare fcot of the increased time.

fuS . Appficaticri-steri{ir

N/A = Not applicabie

1. freititi:n ar,l ?rr,cs.jlre isr t,ls I'jetrillinatirilcl tlie llethad *! iletertjon ljrx,t 4S CFR,

Parr 136, Appendi;< B. Revisirn 1.'i1. U.S.

Environrnental Protectirn Agency. U.S.

Governmenl Prinlirg 0llice: W{rh;ngtOn,itc,1ss5.

Element fist slraurn is no1 exhaustive. Fnr limits o1

contact a Therms Fisher Scientific office or ylur

"L0Ds drsplayed with the use of helium.

Jstection for elements nnt shown, please

local representattve.

with Ca/Fe). and SRh,l nlxtrix"

q

u

Tipe

Matrix

Ba

sb

$n

cd

Pd

Ag

Mc

Nb

Zr

$r

fib

8i

As

5e

Au

Pb

W

Zn

Cu

Iili

Co

Fe

Mn

Gr

1'

Ti

Ca

K

cl

s

P

si

AI

Mg

si0,

35

12

tc

I5

PVS

3

J

3

3

3

t6

E

10

I12

25

?fl

60

2A

10

10

50

40

I60 | 50*I

afr I nr+IV I JJ

I

l^^^*r3u I tua'I

NIA I N1A*I

I

500 | 220"II

3500 | 750"

60s per filter wlout He

i sio,nr**cu Il+sltl

| 'u I|"iI'oliullA/sll:li'llulttI'ilult5lttItlJlllIrslltl10 lionit--lI rs Itt| 15 |tll:olitI rsn ItllNiAllasltt130 Ii'olI'oiI rllA Itl

I rrrra I

I ro luu-lttt{ gCI 175*lI ooo i ,ro. Ittljvn|ru'a"I| 1000 | 500"

I| 6000 | 1500" I

SRM

45

1ri

2A

t0

ais

J

3

5

5

3

5

5

3

20

10

60

15

3il

100

N/A

85

?q

35

s0

N/A

NIAI75 ! S5"I

175 I 90tI

300 | 230*I

N/A I NiA*I

2500 | 1000.I

$500 | 2000"

te i,"q;

t{*igh; "

Limits of detection {l0Ds} are

depefident on the follcwing factors:. Testrng tim e

. lnterf erenc esr'natlix

. Levei oistatistital coniirience

L0Ds are calculaled as ihree siandarri

devrattcns 199.7% cnn{idencc intcrvell

for each element, using 60,second

analysis times per fiite r.

Please Note:

0ngoing research and advancemenrs

in our instrument technology will lead

to contiflual improvement in many

ofthe values deiailed in this chart

Contait youf local Thermo Scientrfic

p0rta bie xRF analyzer representative

for the latest performance

specilicaiians.

Your detecticn limit requirements willdrctate the actual analysts time. For

exarrple, rf analysis time was reduced

from 60 secondslfiiter to 1 5 seconds/

filter, then the detection limits obtained

fl/ould be twrce the values shown rn

the chart. Simiiarly, incrsasing the

analysis iime wjil reduce the detection

limits bv the sq uare ioot of the

increased time.

NA -- Not applicable

i Deiitiiitn a;:,1 iratliitte lo !h! teletniind!!ot:il ihe

^t1etitj{i ile,-"rtipt) Litnit,40 CFfi. Fart 1 3E,

AppenrJix B. Revisi0r 1.11. tJ.S. EitvirollentalProtectron Ageitcy. US. Govenrferil Pftnlirg0fticer \ry:shington. i:, 1 gg:.

@2012 ftHno fisher

: Saaottfulnt

,4!l ftShrs EffivAl,

A{I.xlsna*s are thepropary tf fhvno fisher

SciBntifrt ht. and itssirbs?lsres

: .9ttn:fiuticns, ierns anipiiti,

-v {e skbjpat to e lrJ,ge.

f\hi s!! sretiutis *e available

il1 a!! mEb 6. Pkase cffiultyLnrlgrat sles r4l.wtat;re

': fsdetals.

:: I ', AN4a&5 W?01,?

Thermo Scientific Portahte XRF Analyzers for Rare Earth ElementsElemental Limits of Detection in sio, and sRM Matriies using MiningAnalysis

Thcrmo screnrific prrtalrle XRF analyzer:s are availalllc lvith 1,1;'1choic:e rf cxciratior optio's, providi*g the oprimai e ,lnfig'rflti,,n f'rvour ana11'1ical needs. l'hc correlation cocfiir icnrs anti rr.pe arahilirydata for the key elernenrs in rare earth eremenr (REE) cre analysi.sdemonstrate .the excellent accuracy a'd precision ,f borh rheirandhcld rhcrmo seicntific ;r-iro' XLp ,iz2lt and thc Nirono XI-.]r(l{)l.Di)+ r-ra}- fluorescence {xRF) anah.zrrs. Th.- ch:rrr belou,derails the sensitivity. or LOI)si, rf rhe Niron XL3t coLDIJ+ andthe Niton XLp -522K using nrining analvsis for an SiO, matrix,These are oprimal values and rvrll deg'ade srighdv rvirh real worldmaterials, depending on the rlrher elernents present iir the sample.

Flements

Yttrium (Yl*

Lanthanum {La}*

Cerium {Ge}*

Praseodymium {Pr}*

Neodymium {ltldl*

Samarium {$m}

Europium (Eul

Gadolinium {Gd}

Te*ium {Tbl

Dysprosium {Dy}

60s per {ilter dcut He

Niton XLI G0LDD+ | Uiton Xtp 52ZK

5 | 1r

50 25

60 40

30

qn,5U

NA 4U

NA 40

NA 60

NA 40

NA 80

Element lrst shown is not exhaustive- For limits of deteciron tor elements not shouln, pleaserontact your local Titermo Suientjfj! pcrtable XRF analyzer rslrreseiltaltvc.

High Y concentration may suggest the presence of high concentrations of healy RFE, such asGd. Tb, and Dy.

n0ptional elenents avatlable on a Niton XL3r G0LDD+ analyzer.

.Mslhe'-d$ emiic.Ni@nlton'