Conference Venue ECASIA ’13 will be held at one of the most beautiful places in the Mediterranean sea area, the resort “Forte Village” at the south coast of Sardinia, Italy. Visit the web page www.fortevillageresort.com.

The resort offers lecture rooms, exhibition hall, sport and leisure facilities, restaurants and accommodation in walking distance. See the web-site.

Travel and Accommodation

Cagliari, the capital of Sardinia (Italy), can easily be reached by plane with direct flights from many European cities, from Rome or Milan or by ferry-boats from Civitavecchia (Rome) or Genoa. The Forte Village resort is located about 40km from Cagliari airport. Bus service will be provided from the airport.

Accommodation is not included in the conference fee. It is provided mainly in the “Forte Village” resort (400 rooms are available and part of them are at reduced rate). Accommodation at lower prices and student accommodation is available in locations near the venue. Please contact the conference secretariat.

Conference Fees Early bird After June 15 On site Normal registration 450 € 550 € 600 € Student registration 300 € 400 € 450 € Accompanying person 125 € 150 € 150 €

The conference fees include 21% VAT, conference and exhibition, welcome reception, coffee breaks, conference excursion and conference dinner as well as the book of abstracts and the proceedings. Student registration (with proof of status) does not include conference proceedings. Please, see conference web page for fees for participants from developing countries and cancellations.

15th European Conference on Applications of Surface and Interface Analysis

October 13 – 18, 2013 Forte Village Resort, Cagliari, Sardinia, Italy

2nd Announcement and Call for Papers

unica2.unica.it/ecasia13/

Chair: Prof. Antonella Rossi, Università di Cagliari, Italy

rossi@unica.it

ECASIA ’13 ECASIA’13 is the 15th European Conference on Applications of Surface and Interface Analysis with broad international attendance. The successful concept of the ECASIA conferences is to bring together scientists from industry, academia and government with suppliers of surface analytical equipment and software. The conference lectures and poster sessions will be combined with an instrument exhibition providing an excellent opportunity for the exchange of the latest news in relevant fields and discussions.

Timetable and schedule March 30, 2013 Abstract submission deadline May 30, 2013 Acceptance of papers June 15, 2013 Early registration deadline June 30, 2013 Accommodation at Forte Village (special fee) deadline September 1, 2013 Paper submission October 13, 2013 Welcome reception at Forte Village

Please visit the ECASIA’13 web site for regular updates.

Abstract submission and registration Registration shall be performed on the on-line registration system provided (link on the conference web page). Abstracts can be submitted after (pre) registration on the on-line registration system. Please use the template provided. Abstracts will be included in the conference program only after registration and payment of the conference fee.

Local organizing committee – conference secretariat Davide Atzei, Università di Cagliari; Bernhard Elsener, Università di Cagliari; Marzia Fantauzzi, Università di Cagliari; Maurizio Loi, Università di Cagliari; Emma Angelini, Politecnico di Torino; Saulius Kaciulis, CNR Roma; Maria Pia Casaletto, CNR Palermo; Giacomo Ceccone, European Commission DG JRC, Ispra; Laura E. Depero, Università di Brescia; Gaetano Granozzi, Università di Padova; Giuliano Moretti, Sapienza, Università di Roma; Bruno Pignataro, Università di Palermo; Anna Maria Salvi, Università degli Studi della Basilicata, Potenza; Lia Vanzetti, Fondazione Bruno Kessler, Trento; Anna Maria Venezia, CNR Palermo. Organizing Secretariat: Kassiopea Group Srl, Via Mameli 65 – 09124 Cagliari – phone +39 070651242 fax +39 070656263 – e-mail address ecasia2013@kassiopeagroup.com

Scientific Topics The scientific program will consist of plenary and keynote lectures, oral presentations in parallel sessions, poster contributions and a full state-of-the-art instrument exhibition. The scientific topics include:

● Metals and oxides ● Solid-liquid interface ● Polymers ● Micro- and optoelectronics ● Ceramics and glass ● Catalytic materials ● Biomaterials ● Nanomaterials ● Tribology ● In situ spectroscopy and microscopy ● Corrosion ● Thin films and coatings ● Environment ● Surface functionalization ● Energy frontiers ● Surface analysis in cultural heritage ● Life Science, Medicine ● Geology and Geochemistry ● Pharmaceutical sciences ● Biological surfaces and Biosensors The following scientific topics will be addressed transversally: ● Quantification and Metrology ● Data interpretation ● Imaging / Technique development ● Standardization ● Depth profiling ● Software

Publication A book of abstracts will be provided. Papers submitted to the conference will be published in a special issue of Surface and Interface Analysis (Editor-in-Chief: Prof. John F. Watts). Normal papers will have four printed pages, keynote lectures eight printed pages. Deadline for submission of papers is September 1, 2013.

Scientific Program Committee Micha Asscher, Hebrew University of Israel, Jerusalem (IL); Donald R. Baer, Pacific Northwest Lab, Washington (USA); Albert Carley, University of Cardiff (UK); Toshiyuki Fujimoto, NMIJ/AIST, Higashi Tsukuba (J); Ian Gilmore, NPL and University of Nottingham, Agustin R. González-Elipe, CSIC-Univ. Sevilla (E), Ron Heeren, AMOLF Institute, Amsterdam (NL); Maya Kiskinova, Elettra Synchroton, Trieste (I); Laszlo Kover, Academy of Science, Debrecen (HU); Philippe Marcus, ENSCP, Paris (F), DaeWon Moon, DGIST, Daeju, Korea; Salvatore Pignataro, INSTM, (I), Luigia Sabbatini, Università “Aldo Moro”, Bari (I); Alex G. Shard, NPL, Teddington (UK); Nicholas D. Spencer, ETH Zurich (CH); Sefik Suzer, Bilkent University, Ankara (TR); Sven Tougaard, University of Southern Denmark, Odense (DK); Wolfgang Unger, BAM, Berlin (D); Wolfgang Werner, Vienna University of Technology, Vienna (A), Adriano Zecchina, Università di Torino (I).