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Of NAIALFAST ELECTRICAL AND OPTICAL DIAGNOSTIC PRINCIPLESAND TECHNIQUES: A NATO ADVANCED STUDY INSTITUTE

IESFAICI M. FRANK ROSENAVAL SURFACE WEAPONS CENTER

BRANCH 21 November 1983

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C-18-83 04Z13 T ;4. TITLE (and Subtitle) S. TYPE OF REPORT & PERIOD COVEREO

Fast Electrical and Optical Diagnostic ConferencePrinciples and Techniques: A NATO s. PERFORMING ORG. REPORT NUMBER

Advanced Study Institute.7. AUTi4OR(e) 1. CONTRACT OR GRANT NUMBER(o)

H. Frank RoseNaval Surface Weapons Center

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it. PRFORING RGANZATINARAA a&4 WORK UNIT NUMBERSUS Office of Naval Research Branch Office LondonBox 39FPO NY 09510

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21 November 19831S. NUMBER OF PAGES 22

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Electrical diagnostic principles Shielding Spectroscopy

Optical diagnostic principles Fast photography Active optical

Voltage Refractive index techniquesCurrent

measurements

Grounding X-ray diagnostics20. ABSTRACT (Continue on reveree aids It noec a.¢, and identh by block number)

The institute was diviced :.nto the following major sections: (1)overview of applications and needs, (') voltage and current measurements,(3) data acquisition, (4) groundinj: ana shielding, (5) fast photography, (6)refractive index measurements, (7) X-ray diagnostics, (8) spectroscopy, and(9) active optical techniques. The report examines these topics and pro-vides tables comparing various nanosezond instrumentation techniques.

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PAST ELECTRICAL AND OPTICAL DIAGNOSTIC tive index measurements, (7) X-rayPRINCIPLES AND TECHNIQUES: A NATO diagnostics, (8) spectroscopy, and (9)ADVANCED STUDY INSTITUTE active optical techniques. In addition,

three sessions were made up of papersBecause many natural processes of contributed by the participants. These

practical interest are governed by papers were summaries of researchfundamental phenomena which occur on the programs employing high-speed diagnost-nanosecond time scale, there is growing ics. Several companies also displayedinterest in the techniques for obtain- and demonstrated high-speed diagnosticing, recording, and analyzing fast equipment and participated in thetemporal data. These phenomena are technical lectures. The ASI proceedings

S- important in areas such as breakdown and will be published by Martinus Nijhoff as' conduction processes in various media, part of their applied sciences series;, electromagnetic radiation production and the book should be available in the fall

propagation, particle beam accelerators, of 1984. These proceedings should. pulsed power technology, inertial and provide a working textbook in instrumen-

magnetic confinement fusion, and elec- tation techniques applicable to a widetric discharge lasers, range of phenomena of major importance

These technologies, by their very to Navy applications.5'. nature, present a harsh, "noisy" envir-

onment in which instruments must func- Overview of Applications and Needstion. Often, because of the time scale This section was headed by theand the sheer magnitude of the paramet- author and Professor N. Kristianseners involved, there are difficulties (Texas Tech University). In our lec-with standards and calibration tech- tures, we discussed the factors whichniques. Therefore, the measurement and are determining the needs for high-speedanalysis of fast physical events require instrumentation. While many industrialan understanding of the basic principles processes and applications requireunderlying the diagnostics, their high-speed diagnostics, practicallimitations, and the practical tech- considerations by the military have beenniques which must be used to obtain a major driving force. Detonationreliable and repeatable data. physics, weapons effects (both conven-

A 2-week NATO Advanced Study tional and nuclear), and inertialInstitute (ASI) on Fast Electrical and confinement fusion have accelerated theOptical Diagnostic Principles and development of fast optical techniquesTechniques was held at Castelvecchio capable of nanosecond time resolution.Pascoli, Italy, from 10 through 24 July X-ray diagnostics were developed to1983. The ASI was organized by Mr. L. allow imaging though obscuring media andLuessen, Naval Surface Weapons Center, to investigate the collapse of fuelas the Administrative Director, and pellets for fusion events.Professor J.E. Thompson, University of Weapons effect simulation, inertialSouth Carolina, as the Technical Direc- confinement fusion, and directed energytor. The institute was attended by 107 technology have stimulated the develop-participants representing the US, West ment of large electrical machines whichGermany, the UK, Switzerland, Norway, produce terawatts of power on the micro-The Netherlands, Italy, and France. second time scale. The power flow must(See the appendix for a list of the be controlled with great precision, andparticipants.) often the machines have size and weight

The institute was divided into the constraints which necessitate theirfollowing major sections: (1) overview operation near the limits imposed byof applications and needs, (2) voltage catastrophic failure. Often the powerand current measurements, (3) data train is controlled by many switchesacquisition, (4) grounding and shield- which must function with nanoseconding, (5) fast photography, (6) refrac- precision.

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Since the terawatts of power imply Voltage and Current Measurementsmegavolts and megaampere currents, there This section of the ASI was headedis a continuing need to develop new by J. Chang (Diagnostics Division,methods to measure these quantities, Sandia National Laboratories). (Cenerat-particularly new techniques which are ly included under this heading werenonintrusive. The factors limiting the measurements of voltage, current, elec-performance of these machines are also tric and magnetic fields, and their timeof interest to the industrial community. derivatives. The techniques discussedThe most prominent limitations are can be catagorized as conventional andelectrical breakdown and subsequent passive/nonintrusive. The conventionalrecovery, plasma chemistry, and electri- techniques usually make measurements bycal conductivity and its evolution as a physically intruding into the systemfunction of time. These phenomena are with components such as resistors,of considerable interest in themselves capacitors, and connectors, and formand are the subject of major research possible breakdown paths. The passive/efforts in industry and university nonintrusive techniques use electro- orlaboratories, magneto-optic effects, such as the Kerr

From these studies, on the subnano- or Faraday effects, to produce a minimalsecond time scale, scientists are begin- perturbation in the system.ning to understand the intricate and C. Baum (Air Force Weapons Labora-complex processes which determine the tory) presented several theoretical lec-late-time behavior of many devices. tures on the basics of electromagneticPicosecond time resolution allows essen- measurements. These lectures began withtially instantaneous measurement of field equations and finished with de-plasma parameters such as ion/neutral tailed mathematical descriptions of thedensities, ion/neutral temperatures, factors which influence the design andelectron distribution functions, excited limits of particular sensors' techniquesstate identification, electron density, for measuring E, H, 1, V, and their timeand electron temperature. A strong bas- derivatives. The effects of source cur-ic understanding of these phenomena is rents and conductivities were also in-critical to the development of devices cluded insofar as they introduce noisewhich depend on them either to produce and ambiguity into the measurement.an effect or to provide a catastrophic The sensor output must always belimit. connected to a recording device that is

* In closing this section, Professor often remote from the sensor. Cabling,A. Hyder (Auburn University) proposed symmetry/topology, and other factors maythat the ASI participants collectively affect the response. The importatce ofrank the various diagnostic techniques these factors in the overall instrumen-using factors such as time resolution, tation scheme was considered, and guide-range of parameter to be measured, ease lines for factors such as cable disper-of use, cost, and accuracy. The result- sion and recording bandwidth were estab-ing charts (lables I through 8 in this lished.

S.: report) represent a concise summary of The first experimental techniqutcsthe ASI and were much in demand by the to be described were the passive, iso-participants. To my knowledge, this is lating electro-optIcal and magneto-opti-the first time a comparison has been cal schemes. These techniques depend onmade of the various nanosecond instru- the effect of electric and magneticmentation techniques. Because of the fields on the index of refraction ofnumber of factors involved in a given suitable media. The affected media areexperiment, the tables should be used built into one arm of an interferometer,only as a guide, but are useful in and a counting scheme Is used to regis-describing the relative merits of one ter the number of interference fringestechnique over another, produced when the field is applied.

2

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There were f ive lectures in this area. dividers, and inductive coupled devicesThe first, by R. Hebner (National Bureau such as current transformers and Rogow-of Standards), was introductory and ski coils. Auxiliary devices such astended to define in broad terms some of integrators and recorders were alsothe advantages and disadvantages of discussed. Table 2 summarizes the tech-optical techniques. Then specific niques discussed by these lecturers asapplications, some capable of picosecond well as others from contributed papers.time resolution, were described by Pro- Several other measurements can befessor G. Mourou (University of Roches- used to deduce fields or potentials butter), M. Hugenschmidt (Deutsch-Franzo- are not as simple to categorize. Forsisches Forchungsinstitut), G. Chandler example, the measurement of free fields(Los Alamos National Laboratories), and of the type associated with nuclearChang. The electro-optic techniques can weapons effects must be done by antennabe based on both the Kerr effect and the systems. These sensors measure the timePockels effect. The Kerr effect sensor dependence of the electrical displace-is limited to liquid media which aresuitably birefringent. The Pockels de- ment D and the time dependence of the

vices are solids and can be built into magnetic induction B. They were consid-optical fibers which intrude passively ered in some detail by C. Baum in hisinto the system. Table I summarizes the theoretical lectures. These devices areelectro-optical and magneto-optical loop or stub antennas and require atechniques as presented by these lectur- primary standard for calibration.ers. A second class of unique voltage/

Voltage and current can also be current measurements is associated withmeasured by intrusive techniques which nuclear effects and charged particleinvolve resistive, capacitive, or induc- beams. A lecture by R. Leeper (Sandiative coupling to the system under seas- National Laboratories), entitled "Nucle-urement. In addition to the theoretical ar and Particle Voltage and Currenttreatments of Baum, there were two major Measurements," introduced techniques forlectures dealing with these techniques. measuring currents and voltages (energy)

The first, given by W. Pfeiffer by nuclear activation processes. The(Technische Hochechule Darmstadt), was reactions used were 12C(PY)13N,entitled "Ultrafast Electrical Voltage 8 16and Current Monitors." Pfeiffer indi- 7Li(P,y) Be and 19F (P,ay)10. Bycated that special installations--paying counting the gamma rays emitted whengreat attention to factors such as geo- thin foils are bombarded by protons, onemetry--could produce probes capable oftime resolution in the 50- to 100-ps can use all these reactions to measureregime. These techniques are simple in proton beam cprer Reoutin ispriniple bu shot tie rsoluion limited by recorder and counting tech-e principle, but short time resolution n q e . T b e 3 l s s a g o p o

- demands a great deal of experimental ntechnique and must be custom-designed miscellaneous techniques for measuringfor the experiment under question. current and voltage or parameters

In the second lecture, M. DlCapua closely related.(Physics International) presented a more Data Acquisitiongeneral approach to the measurement of Central to the measurement ofvoltage and current by conventional electrical parameters are the techniquestechniques. Building upon earlier theo- used in data acquisition and storage.retical treatments, he discussed the This section was chaired by Hebner;design of diagnostic devices; he empha- there were nine lectures. The initialsized calibration, simplicity, mechani- lecture by N. Camarcat (Commissariat acal design, and ease of use. He consid- l'Energie Atomlque) dealt with modelingered simple resistive dividers, current- of large electrical systems as aviewing resistors/shunts, capacitive qualitative aid in understanding

3

NAN o...

measurements. The computer codes at Sandia and the CAMAC data acquisitionessentially predict voltage time, system at Physics International. Thecurrent time, and power flow in large session closed with lectures on "Waveterawatt-class electrical machines. To Form Recorder Applications" by S.test the model, predicted parameters Streiff (Nicolet Oscill-scope Division)were compared with test results from and "Review of ADC Technologies for themachines such as OWL II and SIDONEX I, Digitization of Fast Signals" by C.which are used in simulating the effects Flatau (Tektronix Europe B.V.). Theseof nuclear weapons. The results were techniques represent the state of thegenerally good and, while these codes art and are discussed In the literaturewere written for large machines, the of the respective companies.same general approach is applicable overa wide range of parameters and produces Grounding and Shieldinga result similar to the nonlinear-cir- The group leader for this sessioncuit codes use in the US, such as NET II was J. Wiesinger (Hochschule der Bundes-and SEPTRE. wehr Munchen). He and Baum gave intro-

It is often tempting to correct ductory lectures on the basic principlespoor experimental practice by using to be applied in grounding and shield-software to adjust for factors such as ing. Shielding can be implemented atnoise and system response. N. Nahman the sensor/component level, the system(National Bureau of Standards, Boulder, level, and the enclosure level. All ofCO) discussed in detail these tech- these afford a certain degree of elec-niques. He pointed out that one needs trical isolation; in concert they canto have a pretty good idea of what the reduce total interference by almost ansignal looks like in order to use, arbitrary amount--but not w-thout penal-effectively and reliably, signal corre- ties in, for example, the signal-to-lation and filtering techniques. This noise ratio or sensitivity. For analy-practice is becoming more and more sis, the overall scheme proposed abovepopular as minicomputers are being is divided into the source signal, theinterfaced to experimental assemblies, connectors, the cables, and the record-It is then an easy matter to have ing devices which are located in amachine smoothing as an integral part of shielded room. Each of these aspectsthe data-handling package. was covered in some detail by W. Graf

Mourou, Chandler, and DiCapua (Stanford Research Institute), whosedescribed various aspects of data paper was entitled "System Design andtransmission. The most interesting and Practical Shielding and Grounding Tech-useful would appear to be fiber-optic niques Based Upon Electromagnetic Topol-links which readily isolate, electri- ogy," and by I.L. Hoeft (IBM Corpora-cally, the measuring sensor from the tion) in his lectures entitled "Shield-recording device. With broadband ing of Cables and Cable Trays" andoptical isolators, analog-to-digital "Shielding of Enclosures." These lec-converters, and transient digitizers, it tures developed, within the framework ofis easy to make reliable measurements in shielding practice, the concepts of skinsevere environments and transmit the depth, apertures, coupling, and transferdata optically to remote recording impedance. and applied them to cablefacilities. This approach is becoming connectors, various types of cables, andan accepted practice in much of pulsed shielded enclosures. These applicationspower technology. Large-scale instru- were illustrated with measured resultsmentation schemes using fiber optics used to categorize shielding schemes.were described by Chang and DiCapua. In general, one Is able to achieve cx--The technical applications described celient electrical shielding and isola-involved multisensor systems used on the tion in a laboratory environment, butparticle beam fusion accelerators (PBFA) such results are more difficult to

45'i

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achieve in the field and on devices with changes in the index of ref rac-subjected to repeated maintenance. tion--and spectrographic techniques,

Generally, heavy braid and solid which measure state functions of multi-

pipe are the most cost-effective shields component systems. Typical measurements.:ar elctonio denity eletro moteomefe-ieshefor cables. Using multiple layers of are electron/ion density, electron tem-'"perature, and energy distributionshielding is better than trying to elim-inate problems with one "supershield," functions.

and joints and apertures are the most Fast Photographycommon problems to be dealt with at the The frt sso ft enThe first session of the secondenclosure level. The enclosure topology week was entitled "Fast Photography" andshould be kept as simple as possible, was headed by Hugenschmidt, who isand particular care must be exercised at actively using optical techniques tojoints. These should be plated and may study a variety of fast transient pheno-or may not require finger stock or gas- mena. The introductory address for thisketing. At any rate, the transfer im- session was given by J.S. Courtney-Prattpedance, giving the amount of radiation (eicn Bel Inc. an uatntitledx" tansitte asa fnctin o tha Inl- American Bell, Inc.) and was entitledtransmitted as a function of that ici- "Research Trends in Fast Photography."

-" dent upon the system, is a good measureto adopt in describing shielding tech- field of high-speed photography, and inniques. Penetrations must be rigidly his lecture he described the variety,controlled through triaxial connectionsor oher ultale mansrange, and precision of the many methodsor other suitable means. available for photographically recording

The final lectures in this session fast phenomena.dealt with the specific pulsed machines; The fast cameras are basically ofboth lectures were entitled "Grounding two types: (1) those which record aand Shielding of Pulsed Power Machines" faithful image of the event, usuallyand were given by Chandler and DiCapua. with multiple frames, and (2) thoseThese discussions of grounding and which give a "streaked" record. Theshielding practice provided excellent latter record the time evolution of someexamples of the application of the luminescent event such as a spark dis-practical principles described in the charge or explosive detonations. Theprevious lectures. The machines des- imaging cameras can be rotating drums,cribed were in the terawatt class, a using conventional optics, or of theparticularly difficult region in which image conversion type, which use so-to provide adequate shielding. These phisticated photomultiplier schemes tosystems tend to produce broadband produce images from very faint light"switch noise," enormous electrical sources. Courtney-Pratt pointed outfields, and sometimes hard X-rays. The that single-frame image cameras were

. effects of these "unwanted transients" -14capable of recording images in 3xli 1a.. must be eliminated if the diagnostic c e o f recoring iages in 3llu

sptseconds using suitable lasers for illu-sysem sltoa mination. More typically, rotating drumrscameras are capable of "50-ns resolutionUp to this point, the ASI dealt in framing modes and about I ns in

with electrical/electromagnetic measure--'. streak modes. The use of image convert-ments as a diagnostic technique. Ofequal importance are diagnostics which er cameras has pushed these levels toenoabout I ns for multiframe image systemsmeasure shape, size, state variables,and optical parameters. The second week and perhaps as low as 5x10 -4 ns forof the ASI concentrated primarily on streak records.these techniques. It is convenient to The following lectures in this ses-divide them into optical/X-ray tech- sion built upon the overview of Court-niques--which measure geometry, topolo- ney-Pratt. "Recent Techniques of High-gy, velocity, and parameters associated Speed Photography and Low-Level Image

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Recording" by Pfeiffer, and "Electronic Holographic interferometry, while a more

" Ultra High-Speed Framing and Streak Cam- difficult technique, measures all the

eras" by R.H. Price (Lawrence Livermore parameters mentioned above. This series

National Laboratory) provided details of five lectures on various aspects of

about the state of the art in imaging the optical technique was chaired by J.

converter cameras and their application Stamper (Naval Research Laboratory). In

to specialized problems. Pfeiffer an introductory lecture, "Concepts and

pointed out that the field of high-speed Illustration of Optical Probing Diag-

photography is currently dominated by nostics for Laser-Produced Plasmas,"

* streak or framing cameras which use Stamper covered the fundamentals of the

image tubes with shutter or deflection techniques, various interferometer ar-electrodes. These systems are not suit- rangements, polarizatioti effects, and

able for applications where high dynam- the importance of adequate characteriza-ics, high resolution, and low distortion tion of the laser beam used to probe the

are required. Pfeiffer has used proxim- media under study.ity focus image intensifiers with and Lectures by C. Popovics (Ecole

without microchannel plates to produce Polytechnique), "Laser Interferometry,high resolution and short exposure times Streaked Photography, and Schlieren

(less than I ns). Price discussed the Imaging," and P. Forman (Los Alamos

- basic concepts of image converter de- National Laboratories), "Noise Suppres-vices, pointing out the ultimate limita- sion and Sensitivity Modification in

tions and tradeoffs to be made between Index of Refraction Measurement," con-exposure time, resolution, simplicity, sidered problems such as noise suppres-and cost. sion and changes in sensitivity of these

The session was closed with two techniques as applied to specific prob-

lectures on applications of microchannel lems. For example, Popovics used inter-

plates in nanosecond X-ray imaging by ferometry to measure the change in the

Chang and "Laser Photographic and density gradient produced by the probingCinematographic Applications to the laser, streaked shadowgraphy to measure

Investigation of Transient Phenomena" by velocity and acceleration of plates, and

Hugenschmidt. Table 4 summarizes the streaked Schlieren imaging to measuretechniques discussed in this section. the time evolution of a density gradient

in the plasma. These examples tend toRefractive Index Measurements illustrate the versatility of the tech-

Optical diagnostics are used exten- nique and illustrate a few of the nan.

sively to probe plasmas and flowing sys- applications for index measurements.tems because, to a first approximation, Holographic interferometry is o,

they do not disturb the medium. The more powerful tool and, while more dif-

4. measurement of index of refraction and ficult experimentally, contains in theits derivative gives direct access to recorded phase information all the datathe electronic density, its gradients, obtained from the individual techniques

and the hydrodynamics of the system un- described above. There were two lec-der investigation. These measurements tures describing holographic techrique.are usually made using ultra-short laser The first was by Chang, "Four Framepulses or in conjunction with a streak Holography and Thompson Scattering in a

camera if time resolution is a primary Pulse Power Environment." lie illustrated

concern, application of the technique in the veryThe basic techniques are pulsed demanding environment associated with

* laser Interferometry, which measures the large pulsed machines. The secondindex of refraction; Schlieren photo- lecture was by C. Busch (KMS Fusion,

• graphy, which measures the gradient in Inc.), "Twenty Picoseconds Pulsed 1UVthe index of refraction; and the shadow- Holographic Interferometry of Laser-gram, which measures the second spatial Induced Plasmas: State of the Art." lie

derivative of the index of refraction. discussed the statte of the art in a

6

.41

laboratory environment and clearly shock waves with amplitudes greater thanillustrated the excellent time resolu- 100 kb, the density chance can be astion and spectral versatility of the high as 20 percent. On an atomic level,technique. Table 5 summarizes the this results in a corresponding change

S.techniques used to measure index of in the lattice parameter which affectsrefraction and its derivatives, the diffraction angle as given by the

Bragg equation. This technique wasX-ray Diagnostics applied to the study of sodium chloride.

As a diagnostic tool, X-ray optics The many advances in the technologyhave been in use since the late 1920s; associated with X-ray diagnostics werehowever, problems associated with described by R. Price (Lawrence Liver-medicine, inertial confinement fusion, more National Laboratory) and R. Dayand weapons research have produced many (Los Alamos National Laboratories).advances in the state of the art, Price's lectures were entitled "X-Rayprimarily in sources and X-ray optics. Optics and Imaging Systems Using Re-Optical elements such as X-ray mirrors, flecting Optics and Coded Apertures" and

- microscopes, telescopes, condenser "X-Ray Streak Cameras and Array Detec-lenses, filters, interferometers, and tors." These papers described advancescoded apertures are among the most in the state of the art which wereimportant developments, motivated by the need to observe the

This section was chaired by N. collapse of pellets in inertial confine-Peacock (Culham Laboratory). The ment fusion experiments. Price discuss-"shutter speed" for X-ray systems is ed the principles of grazing incidencegoverned by the X-ray pulse duration and reflection, geometries for X-ray optics,the intensity of the pulse. Both are X-ray Fresnel lenses and zone plates,source/power problems. In his introduc- multilayer reflection coatings, and thetory lecture, Peacock described X-ray use of these devices in the design andsources and their applications and construction of X-ray microscopes andcharacteristics. In his second and telescopes. These devices can resolvethird lectures, Peacock discussed "X-ray pellet compression on the micron scaleSpectral Dispersion Techniques" and the and are associated with the laser-drivenstate of the art in the search for X-ray inertial confinement fusion program atlasers. He described efforts to produce the Lawrence Livermore National Labora-X-ray lasers and the difficulty of tory.obtaining sufficient "pump power" to Chang described similar develop-produce population inversion. ments and applications of X-ray micro-

Flash radiography has always been scopy at Sandia National Laboratories,used and was primarily developed for where pellet implosion by particle beamsphotographing dense objects in a less- is being studied. The particle beamdense obscuring media. Some of the fusion accelerators present interestingearliest uses were the exploration of geometric constraints which necessitate

-" detonation waves and detonation-produced unique custom designs in the X-rayshock waves in the presence of "smoke" system. In the Sandia machine, threeand detonation products. The technique X-ray sources, of a few nanosecondsis still used for that purpose and was duration, were used to obtain multiex-described by L. Jannet (Institut Franco- posure photographs of the collapseAllemand de Recherches de Saint-Louis) event.in a paper entitled "Flash X-Ray Radio- The last major lecturer in thisgraphy and X-Ray Diffraction Measure- section was Day. His lectures, entitled

A ments of Shock Propagation." The most "Non-Dispersive Low Energy X-Ray Detec-novel aspect of this paper was the use tors and Their Characteristics, Absoluteof flash X-ray beams to determine the Energy and Spectral Dependence" and

6, echange in the atomic lattice parameter "Fiber Optic Technology X-Ray Transduc-6 under dynamic shock conditions. For era," tended to focus on the state of

7

the art in detector and imaging tech- and its Application to Plasma Diagnost-niques. Although of general interest, ics," described a spectroscopic tech-these techniques are applicable specifi- nique applicable to the X-ray region ofcally to telescopes and microscopes used the spectrum. Due to the short wave-to study pellet implosion. Table 6 sum- lengths involved and the time resolutionmarizes the characteristics of X-ray desired, unique experimental techniquesdiagnostics as presented in this section were used to design and construct aof the ASI. spectrograph which could also energy-

discriminate. The time resolution wasaccomplished by coupling the spectro-

Spectroscopy meter to the X-ray streak camera systemPlasmas and plasma phenomena are an previously mentioned.

- integral part of many of the applica- The final lecture--"Spectroscopy oftions of power technology. They are Laser Produced Plasmas," presented by (.

useful in switching, are used as a Tondello (Padova University)--illustrat-lasing medium, and are detrimental when ed the application of emission spectro-they are formed as part of a catastro- scopy to the study of laser-inducedphic failure in electrical breakdown. breakdown plasmas. The primary measure-Plasmas are difficult to probe with ments made were the temperature andmaterial devices without introducing density in the breakdown media. Table 7serious distortion. A much more conven- summarizes the basic techniques ofient technique is time-resolved spectro- emission spectroscopy as a plasmascopy of the emitting plasma. The tech- diagnostic.nique can be applied over a wide rangeof optical wavelengths and can be opti- Active Optical Techniquescally active (laser-induced emission) or An obvious extension of the passive

passive, using the natural plasma emis- spectroscopic technique for studyingsions. Excited atomic and ionized spe- plasmas is to use an active process tocies provide a means of sensing elec- excite a transition via resonant absorp-tron, ion, and neutral atom temperatures tion. This allows "discrete frequency"and density functions. In addition, spectroscopy and can be tuned to reso-local values of electric and magnetic nantly excite a given species w4'ihin thefields can be determined using Zeeman plasma. In this way, a topology map cansplitting and Thompson scattering, be constructed which shows concentra-

Spectroscopy in the time-resolved mode tions of a given species. This lastallows the spatial and temporal charac- session was chaired by S. Davis (Airteristics of the plasma to be deter- Force Weapons Laboratory) and coveredmined. "Laser Induced Fluorescence and Thompson

The last 2 days of the ASI were de- Scattering."voted to these techniques. The first In his introductory lecture, Davissession was chaired by Professor H. described laser-induced fluorescentGreim (University of Maryland). In his procedures. He described the equipmentintroductory lecture, Greim described needed to implement the technique, gavethe multiphoton processes, Coherent examples of experimental arrangements,Anti-Stokes Raman Scattering, and basic and described several applications, suchprinciples of plasma spectroscopy, cov- as radiative lifetime determination,ering the theoretical basis for spectro- quenching cross-section measurements,scopic methods, radiative and collision- energy transfer studies, and flowal processes, and the effect of transi- visualization.ents and spatial gradients on such meas- In an analogous way, lasers can beurements as density, temperature, and used in a two-photon excitation schemefields, to make similar measurements. This

Price, in a lecture entitled "Time technique was described by W.K. BischelResolved Spectroscopic Instrumentation (Stanford Research Tnstitute). lle

pointed out that the two-photon process molecular beams. He described selectioncould give higher optical gain and rules which govern the mixing, factorssensitivity, although the experimental which determine the sensitivity, spec-technique is more complex. Table 8 tral line shape, and special techniquesdescribes the active optical techniques. for reducing noise and undesirablei' background effects.Coherent Anti-Stokes Raman Scattering backrou , e ec oe

Coherent Anti-Stokes Raman Scatter- Finally, Peacock described theing (CARS) is a relatively new spectro- fundamentals of diagnostics based on

scopy technique which has extended the Thompson scattering. Briefly, monochro-

range of Raman spectroscopy in physical matic electromagnetic radiation isscattered from free electrons in thesciences. The technique is based on

%multiwave mixing of electric fields in a system being diagnosed. In the scatter-lesuitable medium. The mixing is coherent ing process, the laser photons are

and is related to the sum and differ- Doppler shifted in proportion to the

ences of the individual frequencies used velocities of the scattering electrons,in the process. Usually, three laser resulting in scattered photons with thebeams are employed. The mixing frequen- same distribution in wavelength space ascy W0 is related to the other laser beam the electrons' distribution in velocity

space. By collecting the scatteredfrequencies--W I, W.;. W3--by the relation light, one can use the wavelength

W0 -W +WwhereW > 2 hen distribution function to calculate Te,1 2 3 1 2* the electron temperature, from the

Wi is associated with a Raman Doppler-broadened width of the spectrum;

transition, nonlinear mixing is greatly Net the electron density, from theenhanced. These Raman resonances wavelength-integrated amplitude of theconstitute a CARS spectrum which can be waelth-interated apitdeloithe

*.scanned by varying WI, or W2, or both, spectrum; and the fluid drift velocity,scne"y ayn 1 rW2"o oh Vd from the entire shift of the spec-

and detected by the coherently generated d fsglaW W WRtrum away from the wavelength of the-. signal at W0 = W3 + W .

0 3 - incident laser radiation., J.J. Valentine (Los Alamos National Several factors influence these

Laboratories), in a paper entitled measurements. The environment is"Coherent Anti-Stokes Raman Scattering usually harsh, consisting of X-rays andTechniques," described the basic theory radio-frequency noise, which can drasti-and practical methods for applying the cally influence the response of thetechnique to the study of fast combus- associated electronic systems. Thompsontion processes, plasma diagnostics, time scattering is very powerful and is oftenresolved spectroscopy in the biological used to diagnose intense electronsciences, and other areas--such as relativistic beams.

1.+

9

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7 1 .

*Table I

Electro-Optical and Magneto-Optical Measurements-'Characteristic

Diagnostic Time Applicability Range Cost Versatility Comments

Larr Effect a Trade-off between time responseand sensitivity

- <I na i0 kV/cm-l00 kV/cm Moderate Excellent a Can extrapolate over a wide

rangea An quadratic in E

V 41 no 5 kV-I0 4V Moderate Excellent 9 Provides electrical isolationa Limited to reasonably hire-

fringent liquids

e Solutions are usually good sol-vents

a Uncertainty less than Il butrecording technique may he 52or greater

a Somewhat sensitive to field, geography

Pookela Effect a Solid media rather than liquida Intrusive but electrically iso-

" 0.001-0.1 na I mV/cm-l00 kV/cm Expensive Excellent lated9 An linear in

V 0.001-0.1 nc 50 V-I MV Expensive Excellent a Materials generally piezoelec-tric and sensitive to shock

a Two linear regions of sensitiv-Ity

a Long devices are sensitive but

slow due to transient timesa Fastest devices are special in-

stallationsa Uncertainty in measurement dom-

Inated by recording system

Far-ay Effect a Linear effects Electrical isolation

14 0.1 tc no 1G-5 MG Expensive Excellent a Small T dependence for diamag-netic materials, larger for

0.1 n 50 A-IO MA Expensive Excellent paramagnetica Trade-off between time resolu-

% tion and sensitivitya Sensitive to shock

-2is-

55,55

#10

Table 2

Conventional Measurement Techniques for Voltage and Current

Characteristic

Diagnostic Time Applicability Range Cost Versatility Comenta

VoItage

Resistive %!00 ps 10 k Cheap Lilted a IO0-ps measurement requiresdividers %I no '500 kV Cheap Excellent TEMO0 mode and considerable ex-

%!0 n -500 kV Cheap Excellent perimental techniquesa Connections to system grounda Rise time geometry dependenta Intrusive• Usually requires secondary

dividera Calibration not slways at test

conditions0 Uncertainty on order of A

I Capacitive %I no >! MV Cheap Excellent 9 Intrusive measurementdividers %50 ps >100 kV Moderate Limited a Usually custom made

a Calibration difficult

0 Low frequency cutoff % RC

C.krrentCVR/shunt 50 ps 10 kA Moderate Good a Energy limited

>500 pa 50 kA Moderate Good a Thermal sensitive10 noa I MA Moderate Good a DC coupled

a Noise sourceF a Skin depth factors

R Rogowski coil 0.5-1 ns I A-5 MA Cheap Excellent a Leaks in strong B fielda Intrusivea Requires integratora Difficult to obtain current

standard for calibrationa Position independenta Uncertainty on order of 5%

Current 10 ns 1 A-S MA Moderate Excellent a Does not require integratortransformers a Volt-sec core limit

a Intrusive

% a Uncertainty on order of 5%

Stripline coil 10 ps ' 101 2

A/s Moderate Medium e Intrusivedi/dt a Can average azimuthal nonuni-

• ; tormities•a"Uncertainty on order of 52

V.

'*. . o* ' -.- ' >.' .s . ... ~, 5 s *. , .. . .- ,...

Table 3

J. Miscellaneous Measurement Techniques

CharacteristicDianostic Time Applicability Reuse Cost Versatility Comments

FieZdpD-Dot probe %100 Ps Limited to modest Expensive Moderate * Rise time related to sensor

fields 50-100 kV/c sizea Free field measurement• Geometry sensitivea TENCO mode for fast risea Uncertainty 10E or greatera Requires primary standard

B 3-Dbt sensor 41 as Cheap Medium * Speed related to slze* Position dependent/calibrate It

* Can average azimuthal nonuni-

foreities* Requires primary standard

Current0 probe 41 na 1-10 At, Cheap Medium * Low frequency cutoff ' L/R

Faraday cup 5 no 0.1-2.5 kA/cm Moderate Limited * Susceptible to background plas-ma

a Calibration is a function ofcurrent density

a Requires experimental finesse

Table 4

Summary of Optical Techniques for Measuring Geometry/Velocity

CharacteristicDiagnostic Time Applicability Range Cost Versatility Comments

:sMging a Calibrated using standard reso-Camue a lut ion chart

a Extremely short time resolution

Single frame 3-10e-5 na Extensive Expensive Excellent demands trade-off with compexi-

Rotating mirror 50 no Extensive Expensive Excellent ty and accuracy

(. (eultiframe) 9 Velocity measurement require.lmege converter '1 na Extensive Expensive Excellent metric In Imege

(malt frame) 9 Multiframe system complexSpeckle 41 ne Limited Modest Limited • May require Intense light

sourcea 1.6-ne frame rate commercially

availablea Used to measure changes in sur-

face tomology

Streak Caoz~as

Single mirror I no Extensive Expensive Excellent a Opticall passiveMultimirror 0.1 ns Extensive. Expensive Limited e Need intense light source

Image converter 5e10"

no Extensive Expensive Excellent * Can be used to measure relativeoptical Intensity

a Interpretation sometimes diffi-cult

L 12r-U* 90 * . * , *

*i ; .5 - -- '' . -.. . - " - -~J

-- % ji--77

.

Table 5

Refractive Index Measurements

CharacteristicDialostic Time Avelicabillty lanse Cast Versatility Comments

Index of re- e Nonperturbingfrztio 5 * Accuracy depends upon symmetry

n Uncertainty MiOEPulsed laser (0.1 s Can be employed over Moderate Excellent & Interpretation sometimes diffi-interforometer a wide roae of cult

parameters • Sensitivity limits

Cradient V -0. 1 as Can be employed over Moderate Moderate a NoaperturbingJ Seblieren a wide range of e Qualitative

parameters e LAW accuracy in messursenta "Streaked" to obtain velocity

.a Interpretation

a Sensitivity limits

Second derive- 40.1 as Moderate Moderate 9 Noperturbingtive of N 0 Difficult to obtain quantita-

tive resultsShadowgram 0 Interpretation

a Sensitivity limits

W. dM/dx '0.1 na Can be employed over Moderate Excellent e Nonperturbingd2N/dx

2 a wide range of a Multiphenomena recorded on a

holographic paramters single plateinterferometry a Highly stable and after the

fast focusinga Interpretation sometimes diffi-

cult

*"

4, Table 6

X-ray Techniques for Fast Diagnostics

Characteristic* Diagnostic Time Applicability lango Coet Versatility Comments

Flash X-ray:all imegia 2 as Limited Expensive Limited a Basic technique is simple. x-techniques-- perimental arrangaent/applica-telescopes/ tio may lead to complex custommicroscopes designs

o Usually used to measure "shape"or "velocity" in an obscuringmedia

a Limited to a few framesn Fran rate and number pulser

dependent• Frame rated up to 1O9s/a Must use I pulser/frame at high

rates

X-ray streak 0.02 ts Limited Expensive Limited e Custom designa Used as a diagnostic in fusion

pellet compression experiments

13

V

* - -. - -. K-

Table 7

Emission Spectroscopy Diagnostics

CharacteristicbDiatostic Ti04 Applicabillty RangI (Co t verstlitv (onaent v

6tct :de:.pEcOptical regio. C| na 'I part in I]'/cc Ine:pensiv, Excellent 0 rleej~t

SStardard tech iquia Larpe uncertaint" in measure-

X-ray reion 15 ps I part in IC Expensive --- e Large uncertaintv In seaurp-mentF:

* , lcxl|,le techniqu,e Cuftou designt

Optical region 10 ne1012-101icc Inexpensive Good e Must understand theoreticalbasis for multicomponent synteefay analysis

X Large uncertaintyX-ray region 1 ps 10

15-I"0 /cc Moderate Excellent e Total population inferred fror

excited population

* Needs good spectral resolution

Optical ralios 10 us 0.2-10 *V Inexpensive Limited e Complicated by line broadelngby competing processes

a Uncertainty on order of 201X-ray region 15 ps 100 eV-I k#V Moderate Limited a Line broadening bV compe'sn F

processesa ncertainty greater than 201

EZect. ter1g4 Diet. Pen. Is

-ray reions 15 ps %101 Moderate Limited e Complicated analysis

a Inaccurate

Needs automatic data processing

Optical reglon I as 0.1-100 .V Inexpensive Good a Complicated analysis, a Needs automatic data processing

techniquesX-ray retios 15 ps 1O0 @V-100 keV Moderate Good a Uncertaintv no greater than 10!

a Sorhisticated technique

speaOieE dent.Optical region I as I part in 10 Moderate Limited a Cannot detect ground state

a Pequires bright scurcea Time frae rlasms derendenta lated to yadiative lifetlve

X-ray region 15 pa I part In 10 Expensive Limited ,LSited to bright sourcese Tisme/brightness trade-off

a Limited life streak cameraa Difficult belo kIe

"p

o14

'p

1

4%

14C

Table 8

Su mary of Active Optical Techniques

CharecteristicDiagnostic TIme Applicability ftne• Cost eraMtilit Comments

* Requlres good experment.17e'.et technologyLaser-Induced %l ps iolO-10l

9/cc Expensive Good 9 Signal averaging

fluorescence 0 Complex(LIT) a Large uncertainty in measure-

mert.Coherent Anti- NI paStokes RonanScattering(CARS)

F:set. TepnwtureThompson on ns I-S key oderate Excellent a Use'ul in harsh environmentSeattering a Versatile technique

a Adaptable to many geometriesa Nonintrusive

Specofae Iient. 1LIP I pa 10 1-10 i/cc Expensive Excellent * Signal averaging needed

0 Nonrntrusivea Difficult experimentally

12 Laser limitedCABS I pa >lo/cc 100 ppm Moderate Excellent e Excellent for time dependence

environment

e Excellent in hostile environ-ment

0 Useful for a vide range oftransients

I Laser limitedNultiphomen 1 p Only for mekiy m- Expenaive Moderate a Neutral detection I part to 109

ised. loa m I " Absolute accuracy difficult

(I Part In 10) 0 All ston and moleculese Laser limited

State Zdant.

CARS 1 pa l0 12/cc2l00 ppm Noderate to Excellent a Good spatial resolutionexpensive a All species

a 11inensitive to stray fieldsa Atomic or molecular

* Laser limitedLIT I p. blO

1 0 ICClg0 ppm Expensive Moderate e Limited by proper laser choice

a Atomic or molecularultiphoton I pa Expensive Noderste a Single state sensitive

to good a All speciesa Neutrals

Fields(LIT) I a EI ke/ho "oderate Poor a Large uncertaintydE./er & Difficult experimentally

a Sensitive to f not

J I s- Cheap Poor & Analysis difficult

Zem" splittim .

Temperature

LI s- Expesive moderate

Feat. EnFV

Thompson as 13 Expensive Limited 0 Difficult measurementscattering e Automatic data processing help-

ful0 Small t,

Thompson ps - mas 1012-10

19/cc Expensive Limited a Trouble In weakly anled

rcttering plasmas

a Small a* Resolution related tV 1A'er

power* Laser limited

15

- S- 4- . ?7 4' - 4.7 7. ' ** . '

APPENDIX: ASI PARTICIPANTS

Jean Jacques Aliff Dr. William K. BischelSwiss Federal Institute of Technology Stanford Research InstituteHigh Voltage Laboratory Molecular Physics LaboratoryPhysikstrasse 3 MS-PN-027

- 8092 Zurich 333 Ravenswood AvenueSwitzerland Menlo Park, CA 94025

Dr. G. Baldo Dr. Laird P. BradleyPadova University Lawrence Livermore National Lab., L-4906/A radenigo P.O. Box 55083S1 Padova Livermore, CA 94550

. ItalyDr. Alexander Brandelik

Kernforschungszentrum Cmbh

Dr. Walter Bauer Postfach 3640Kernforschungszentrum D-7500 KarlsruheKarlsruhe, IK Federal Republic of GermanyPostfach 3640D-7500 Karlsruhe Garland E. BuschFederal Republic of Germany KMS Fusion, Inc.

P.O. Box 1567

Dr. Carl Baum Ann Arbor, MI 48106

NTATTKirtland AFB, NM 87117 Noel Camarcat

Commissariat a l'Energie AtomiqueCentre d'Etudes de Valduc

Dr. David M. Benenson B.P. 14-21/IS SUR TILLE

State University of New York-Buffalo France

Dept. of Electrical and Computer Engr.4232 Ridge Lea Road Dr. Christos CapellosAmherst, NY 14226 Energetic Materials Division

LCWSL, AARADCOM, EMDBldg. 3022, DRDAR-LCE-D

Arnaldo Bertazzi Dover, NJ 07801CESIVia Rubattino, 54 George Chandler20134 Milno Los Alamos National LaboratoryItaly MS-F639

P.O. Box 1663SH rLos Alamos, NM 87545'.' Hubert Biero

CEACentre de Vaujours Dr. Jim ChangBP7 Sandia National Laboratories93270 Sevran Diagnostics Division 1234France Albuquerque, NM 87185

16

• em , . " *;.* ' . - '.,-- '. ;i i '= ' ,-'.- . ' ' ' ' '--, - -

'

Dr. Paul Chatterton Dr. D.A. Eastham. University of Liverpool Daresbury Laboratory

Department of Electrical Engineering and Daresbury, NRElectronics Warrington WA4 4AD

Liverpool L69 3BX CheshireUnited Kingdom United Kingdom

Dr. Jerome R. Clifford Mario Favre

Advanced Technology Division Imperial College

,-'5 Air Force Weapons Laboratory Physics DepartmentAFWL/NTY London SW7 2BZ

Kirtland AFB, NM 87117 United Kingdom

Dr. David B. FennemanDr. Chathan H. Cooke Code F12Massachusetts Institute of Technology Naval Surface Weapons CenterHigh Voltage Research Laboratory Dahlgren, VA 22448155 Massachusetts Avenue

Cambridge, MA 02139. Dr. Ralph Fiorito

9., Code R41Dr. Jeofry Stuart Courtney-Pratt Naval Surface Weapons Center/White OakAmerican Bell, Inc. Silver Spring, MD 20910Crawfords Corner RoadNolmdel, NJ 07733

C. FlatauTektronix Europe B.V.

Dr. Steve Davis P.O. Box 8272280AVAFWL/ARAP AmstelveenKirtland AFB, NM 87117 The Netherlands

Dr. Robert H. Day Dr. Peter R. FormanLos Alamos National Laboratory CTR-8, MS-F369MS-D410 Los Alamos National LaboratoryP.O. Box 1663 P.O. Box 1663Los Alamos, NM 87545 Los Alamos, NM 87545

David L. Demske Dr. Rudolf Germer

SD t yTechnical University of BerlinDetonation Physics Branch

Energetic Materials Division Zieten Str. 2

Naval Surface Weapons Center/White Oak D Berlin 30%- Silver Spring, MD 20910 Federal Republic of Germany9.

Dr. Werner GratDr. Marco DiCapua SRI InternationalPhysics International Location 404772700 Merced Street 333 Ravensvood Avenue

9. San Leandro, CA 94577 Menlo Park, CA 94025

17

C ... 5 . 5 ~ -*- ..-...-.. ,.. -, ... . . . . ,

Dr. Hans Griem Dr. M. HugenschmidtDepartment of Physics Deutsch-Franzosisches ForchungsinstitutUniversity of Maryland 12, rue de l'IndustrieCollege Park, MD 20742 68003 Saint Louis

Haut-RhinFrance

Dr. Ronald J. GripshoverCode F12Naval Surface Weapons Center Dr. Stanley Humphries, Jr.Dahlgren, VA 22448 Dept. of Chemical and Nuclear Engr.

Farris Engineering CenterDr l-unhrUniversity of New MexicoDr. A.H. Guenther Albuquerque, NM 87131Chief ScientistAir Force Weapons Laboratory/CAKirtland AFB, NM 87117 Dr. Anthony K. Hyder, Jr.

Auburn University202 Samford Hall

Dr. Martin A. Gundersen Auburn, AL 36849Department of Electrical EngineeringUniversity of Southern CaliforniaSSC 420, MC-0484 F. JametUniversity Park Institute Franco-Allemand de RecherchesLos Angeles, CA 90089 de Saint-Louis

Boite Postale No. 30168301 St. Louis, Cedex

Norman E. Hansen FranceLawrence Livermore National LaboratoryMS L-45P.O. Box 808 Dr. C.A. KapetanakosLivermore, CA 94550 Code 4704

Naval Research LaboratoryDepartment of the Navy

Dr. Robert Hebner Washington, DC 20375Building 220, Room B-344National Bureau of StandardsWashington, DC 20234 Dr. Helmut A. Koehler

Lawrence Livermore National Lab., L-43University of California

Dr. Lother Hoeft P.O. Box 808BDM Corporation Livermore, CA 945501801 Randolf Road, SEAlbuquerque, NM 87131

Dr. Peter KrehlErnst Mach Institut

Walter Wayne Hofer Fraunhofer Institut fur KurzzeitdynamikLawrence Livermore National Laboratory Eckerstasse 4P.O. Box 808 D-7800 FreiburgLivermore, CA 94550 Federal Republic of Germany

18

,. A ....

: -. ,. , ... , . ., -Z- . .-. . . . - :. - . V V .- . V . -- '- .- - , . " . J.

".4

Dr. M. Kristiansen Dr. Howard Thomas MilesDepartment of Electrical Engineering Department of PhysicsTexas Tech University University College of SwanseaLubbock, TX 79409 Singleton Park

Swansea, SA2 8PP~United Kingdom

Dr. Herman G. Krompholz

Department of Electrical Engineering,-. Texas Tech University Dr G. Marshall Molen

ubP.O. Box 4 9 Department of Electrical EngineeringLbcX70Old Dominion University

Norfolk, VA 23508

Dr. Erich E. KunhardtIonized Gas Laboratory Gerard MoutonDepartment of Electrical Engineering verd MofRo cTexas Tech University Laboratory for Laser EnergeticsLubbock, TX 79409 250 East River Road

Rochester, NY 14623

Gerd F. KuscherErnst Mach Institute of the FraunhoferCompany Dr. Norris S. Nahman

Eckerstr. 4 Fields Characterization Group, 723.037800 Freiburg EM Fields DivisionFederal Republic of Germany National Bureau of Standards

325 BroadwayBoulder, CO 80303

Dr. Javaid R. LaghariDept. of Electrical and Computer Engr.State University of New York-Buffalo Andre Nicholas4232 Ridge Lea Road Comissariat a l'Energie, AtomiqueAmherst, NY 14226 B.P. 14hr N 421120 IS SUR TILLE

* FranceRamon LeeperDiagnostics Division 1234Sandia National Laboratories Dr. Lutz NiemeyerAlbuquerque, NM 87185 Brown Boveri Research Center

CH 5405 Baden

Lawrence H. Luessen Switzerland

Head, Directed Energy Branch (F12)Naval Surface Weapons Center .E .N.i... .. .... Dr. Eugene E. Noltinguanlsreu, VA 22448Sagn ANaval Surface Weapons Center/White Oak

-sl Silver Spring, MD 20910

Dr. Michael MentzoniUniversity of OsloInstitute of Physics Aron NudelmanBox 1038 Princeton Plasma Physics LaboratoryBlindern Oslo 3 P.O. Box 451, Building I-N

X Norway Princeton, NJ 08544

19

Dr. Nicol J. Peacock Dr. Michael Raleigh* Culham Laboratory Code 4763

Division B UKAEA Naval Research LaboratoryAbingdon, Oxfordshire OS14 3DB Washington, DC 20375United Kingdom

Cuiseppe Rizzi- CESI

R.A.C. Perryman Via Rubattino, 54The Welding Institute 20104 - MilanoAbington Hall ItalyAbington, Cambridge CBl 6AL

* United Kingdom

Dr. Frank RoseScience Advisor

Dr. W. Pfeiffer Code F04Fachgebiet Elektrische Naval Surface Weapons CenterMesztechnik, Fachbereich 17 Dahlgren, VA 22448Technische Hochschule DarmstadtScholszgraben 16100 Darmstadt Dr. Wijnand R. RutgersFederal Republic of Germany N.V. KEMA

P.O. Box 9035~6800 ET Arnhem

Mrs. Claude Popovics The EThem

Laboratoire de Physique des Milieux The Netherlands

IonisesEcole Polytechnique Dr. Karl H. Schoenbach91128 Palaiseau Cedx Department of Electrical EngineeringFrance Texas Tech University

P.O. Box 4439' Lubbock, TX 79409

Dr. Robert H. Price

Lawrence Livermore National Lab., L-473P.O. Box 5508 Dr. Klaus SchonLivermore, CA 94550 Physikalisch Technishe Bundesanstalt

- Bundesalle 100D-3300 Braunschweig

Dr. Joseph . Proud Federal Republic of GermanyGTE Laboratories

40 Sylvan RoadWaltham, MA 02254 Dr. Adolf J. Schwab

High Voltage Research Laboratory

Dr. Henry L. Pugh, Jr. University of Karlsruhe

Air Force Office for Scientific Research KarlsruheFederal Republic of Germany* Building 410

Bolling AFB, DC 20332~Daniel L,. Schweickart

Air Force Wright Aeronautical LabsDr. A. Haq Quershi Aero Propulsion Laboratory

Electrical and Computer Engineering AFWAL/POOS-2/Building 450Wayne State University Wright-Patterson AFBDetroit, MI 48202 Dayton, OH 45433

20

" " ""~* "" "*****j*** "" '~ .'. * . ' t.'." f .. e' . *''..' . *. . ;. . .' . ..' . -. .* * -.. ',# .* * " .. ,.*.. ...rf ' ' *" # ' " "" " ",,-.,.,, ,;' - " .. .*..-.-* . %.-. -' - - . - - -

'2€2

* Dr. Fred Schvirzke Dr. James E. Thompson

Department of Physics Electrical Engineering Department

Naval Postgraduate School University of Texas - ArlingtonMonterey, CA 93940 Arlington, TX 76019

Dr. Robert SeeboeckCERN, European Organization for Padova University

Nuclear Research 6/A GradenigoPS Division 3SAG PadovaCH-1211 Geneva 23 ItalySwitzerland

Dr. John D. Sethian Dr. David TumaCode 4762 Electrical Engineering DepartmentNaval Research Laboratory Carnegie-Mellon UniversityWashington, DC 20375 Schenley Park

Pittsburgh, PA 15213

Dr. Timothy L. Ksvarenina*a Dr. James J. Valentini

Air Force Institute of Technology Los Alamos National LaboratoryWright-Patterson AFB P.O. Box 1663Dayton, 0R 45433 Los Alamos, NM 87545

*Dr. John StamperCode 4771 Dr. Ihor VitkovitskyNaval Research Laboratory Head, Plasma Technology BranchWashington, DC 20375 Code 6670

Naval Research LaboratoryWashington, DC 20375

S. Streiff* 4.Nicolet Oscilloscope Division

5225 Verona RoadP..Bx 28E.B. VossenbergMadison, WI 53711 CERN, European Organization for

Nuclear Research

CH-1211, Geneva 23

Dr. Tangali S. Sudarshan Switzerland

Electrical and Computer EngineeringUniversity of South CarolinaColumbia, SC 29208 F. Thomas Warren, Jr.

831 Statler RoadColumbia, SC 29210

Dr. Timm H. TeichFG HochapannungFederal Institute of Technology Dr. D. John WiesingerETHZ Hochschule der Bundeswehr, MunchenPhysikstrasse ET/WE 7 El Engergieversorgung3 CH 8092 Zurich D-8014 Neubiberg

Switzerland Federal Republic of Germany

21

-. .•. .-" . .. .. . . * * *.' *~~* *%*~ ,~' .. . ' 6

Dr. Frazer Williams Dr. R. SeebockDepartment of Electrical Engineering Siemens AG ErlaugeuTexas Tech University ZFE TPH 3

, Lubbock, TX 79409 Gunther-Scharowsky - Str.D-8520 Erlangen

• .Federal Republic of GermanyDr. G.G. Wolzak

* Eindhoven University of Technology Professor Dr. F. ChristiauseuP.O. Box 513PresoD.F.hisase5600 MB Eindhoven Physikalisches Institut der UniversitafSThe Netherlands Taudeurlabore NErwin-Rommel

Str. ID-8520 Erlangen

' Dr. Markus Zahn Federal Republic of Germany

High Voltage Research LaboratoryBuilding N-10 Dr. J.A. StamperDept. of Electrical Engineering and de 4732' ~Computer ScienceCoe42

-C Naval Research LaboratoryMassachusetts Institute of Technology Washington, DC 20375Cambridge, MA 02139

"* Dr. Roger DougalJeffrey W. Warren Electrical and Computer Engineering9505 Puritan Road University of South CarolinaColumbia, SC 29209 Columbia, SC 29208

n 2

.4

% a. . , * - . . . . - , . . . , . - . , . . .

lINT