over 20% efficient n-type bifacial solar cell by industrial
TRANSCRIPT
Cu-plated electrodes with green ns laser opening on
n-type silicon solar cells
Kuang-Chieh Lai, Shu-Yen Liu, Yueh-Lin Lee, Ming-Shiou Lin, Yun-Kuo Tsao, Chia-Chih Chuang, Chi-Chun Li and Chien-Chun Wang
Advance Technology Development Department
Motech Industries, Inc.
CC Li, Metallization Workshop, May 2, 2016
CC Li, Metallization Workshop, May 2, 2016 2
Motech Industries, Inc.
Delaware, US Jiangsu, China
Hokkaido, Japan
Tainan, Taiwan
Motech Americas Itogumi Motech
Fab. I Fab II Fab. V Fab. VI ITC
SNE
TY Fab Taoyuan, Taiwan
Founded in 1983 Established Solar BU in 1997
3 CC Li, Metallization Workshop, May 2, 2016
A Leading Solar Cell Manufacturer
Capacity (MW)
Source: HIS, PV Suppliers Tracker 2015Q3
0
500
1000
1500
2000
2500
3000
3500
4000
HanwhaQ-cells
Trina JA Yingli NSP Jinko Gintech CSI SuntechMOTECH
3.2GW cell production capacity in 2015 No.5 in the world
Smaller capacity of ingot growth, wafer slicing, module
4
Motivation
Experimental Setup
Results & Discussion
Conclusion
CC Li, Metallization Workshop, May 2, 2016
Outline
5
Reference: ITRPV 2016
CC Li, Metallization Workshop, May 2, 2016
Cell Efficiency; Market Share
N-type cells provide higher efficiency Projected growth of market share for N-type cells Cost needs to be controlled
6
p-PERC HJT
IBC n-PERT
Boron emitter Phosphorous BSF
Passivation layer
Plated seed/Cu electrodes
Plated seed/Cu electrodes
Cu plating applicable to all types Si solar cells; more beneficial for n-type
CC Li, Metallization Workshop, May 2, 2016
Plating Application on Solar Cells
7
Motivation
Experimental Setup
Results & Discussion
Conclusion
CC Li, Metallization Workshop, May 2, 2016
Outline
8
Ag
Cell process flow
Schematic cross-section of the solar cell
Cu
Ni
n-type cell
P+
N+
Passivation
Sn Texture
Phosphorus doping (BSF)
Boron doping (emitter)
Front and rear passivation/ capping
Rear-side Ag printing and sintering
Front side laser opening
Plating Ni/Cu/Sn
CC Li, Metallization Workshop, May 2, 2016
Cell Structure and Process Flow
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Ag
Cu
Ni
n-t
ype
P
+
N+
Pas
siva
tio
n
Met
al s
ou
rce
― +
+
+
+
+
+
+
+
Applying a negative voltage to the rear contact of the cell, relative to the anode, making the cell in forward bias
Both Ni and Cu deposited using FBP -
- -
- -
CC Li, Metallization Workshop, May 2, 2016
Forward Bias Plating (FBP)
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Simple homemade equipment used for FBP and electroplating
Separate tanks for Ni, Cu, Sn
CC Li, Metallization Workshop, May 2, 2016
Lab Plating Equipment
11
Motivation
Experimental Setup
Results & Discussion
Conclusion
CC Li, Metallization Workshop, May 2, 2016
Outline
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Tuning 532nm ns laser to achieve Removal of SiNx Thin line; uniform width Usable emitter
CC Li, Metallization Workshop, May 2, 2016
Tuning of Laser Process
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Ablation of SiNx
Elements Atomic%
Si 100.00
Elements Atomic%
Si 92.61
N 7.39
EDS used to verify the removal of SiNx
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Dielectric Layers Opening Width
Finger 1-5
Width (μm) 15.63 16.00 15.53 15.63 15.90
Ave. (μm) 15.74
Std. (μm) 0.20
Uniformity 1.49%
1 2
3 4
5 Contact opening width can be as low as 15um by 532nm ns laser
CC Li, Metallization Workshop, May 2, 2016
Contact Opening Width
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Finger Width after Plating processes
Finger 1-5
Width (μm) 45.80 46.37 45.90 46.50 46.13
Ave. (μm) 46.14
Std. (μm) 0.30
Uniformity 0.76%
1 2
3 4
5 Achieved <50um finger width for plated electrodes
CC Li, Metallization Workshop, May 2, 2016
FBP Metal Finger Width
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FBP Finger Shape
Isotropic deposition Overgrowth at the edges Finger aspect ratio depends opening and thickness
(a) laser (b) Ni
(c) Cu
~46μm
~20μm
~12μm
(d) Cu
~22μm
1kx 1.5kx
1kx 1kx
(e) Sn
~48μm
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R-line measurement showed Cu fingers much more conductive
CC Li, Metallization Workshop, May 2, 2016
Highly Conductive Cu Fingers
R-line (Ω/cm) r
(μΩ.cm) Finger 1 Finger 2 Finger 3 Finger 4 Finger 5 Avg.
Ag/Al paste
0.389 0.409 0.398 0.378 0.331 0.381 ~2.7
Cu plating
0.253 0.255 0.259 0.258 0.223 0.250 ~1.9
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Emitter Modification by Laser
1.0E+18
1.0E+19
1.0E+20
0 0.2 0.4 0.6 0.8
Bo
ron
co
nce
ntr
atio
n (
cm-3
)
Depth (m)
Laser process significantly changed emitter profile
Before laser 75 /sq
After laser 95 /sq
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Emitter Experiments
Various emitters tested for cell performance
shallow deep
heavy
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rc of printed Ag contact is generally 1~3 mΩ.cm2.
rc of NiSi silicide contact can achieve 0.1~0.001 mΩ.cm2 level with 1E19~5E19 cm-3 surface doping concentration
rc of NiSi silicide contacts Ref: Energy Procedia 38 ( 2013 ) 321 – 328
CC Li, Metallization Workshop, May 2, 2016
Contact Resistivity
TLM data of Motech plated cell
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Plated Cu Printed Ag/Al Paste
CC Li, Metallization Workshop, May 2, 2016
Plated vs. Printed
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I-V curve of Motech plated n-PERT solar cell
Best cell efficiency with different metallization
Conditions Eff. (%) FF Voc (mV) Jsc (mA/cm²)
Ag/Al paste 20.90 0.801 655 39.84
Ni/Cu/Sn 21.31 0.798 654 40.80
CC Li, Metallization Workshop, May 2, 2016
>21% Cell Efficiency
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18.50
19.00
19.50
20.00
20.50
21.00
21.50
7/15 9/3 10/23 12/12 1/31
Eff.(%)
0.638
0.640
0.642
0.644
0.646
0.648
0.650
0.652
0.654
0.656
0.658
7/15 9/3 10/23 12/12 1/31
Voc(V)
38.50
39.00
39.50
40.00
40.50
41.00
7/15 9/3 10/23 12/12 1/31
Jsc(mA/cm²)
0.750
0.760
0.770
0.780
0.790
0.800
0.810
0.820
7/15 9/3 10/23 12/12 1/31
FF
Acknowledgement: one-year grant from Ministry of Economic Affairs
CC Li, Metallization Workshop, May 2, 2016
Trend Chart of Cell Performance
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Motivation
Experimental Setup
Results & Discussion
Conclusion
CC Li, Metallization Workshop, May 2, 2016
Outline
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Demonstrated forward bias plating of Ni/Cu with 532nm ns-laser contact opening process
6” plated n-PERT solar cell reached efficiency 21.31%
Fine line capability
Highly conductive fingers
Continued development for
Contact performance
Adhesion
Reliability
CC Li, Metallization Workshop, May 2, 2016
Conclusion
26
Thank You for Your Attention
CC Li, Metallization Workshop, May 2, 2016