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Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 1 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
CHEMICAL TESTING
LOCATION 1
I. TEXTILE
1. Textile Materials/Accessories
Tensile Strength-Strip test
BS EN ISO 13934-1:2013EN ISO 13934-1:2013ISO 13934-1:2013ASTM D5035:2015
Tensile Strength-Grab test BS EN ISO 13934-2:2014EN ISO 13934-2:2014ISO 13934-2:2014ASTM D5034-2017
Tear strength-By Elmendorf Apparatus
BS EN ISO 13937-1:2000EN ISO 13937-1:2000ISO 13937-1:2000ASTM D 1424:09 (2013)
Tear Strength-Single Rip (Single tear)
BS EN ISO 13937-2:2000ISO 13937-2:2000ASTM D2261:2017
Seam Strength BS EN ISO 13935-2:2014ASTM D 1683::2018
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 2 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Resistance to Seam Slippage BS EN ISO 13936-1:2004BS EN ISO 13936-2:2004 ASTM D 434-95BS 3320:1988
Determination of Elasticity of the fabrics
BS 4952:1992 straight specimens(2.1 to 2.4)BS EN 14704-1:2005
Mass per unit area (Weight) ISO 3801:(1977)BS EN 12127:1998EN 12127:(1998)ASTM D3776:09a (2017)
Yarn Number(Based on short length the specimens)
IHTM PHY01(Issue no-1/27.07.2016)
Warp & Filling/Count-Woven fabric-Knitted fabric
ASTM D3775:(2017)EN 1049-2:(1994)BS EN 1049-2:(1994)ASTM D3887:2008BS 5441 (1988)
Fabric Width ASTM D 3774-1996 (Reapproved 2016)
Water Absorbency AATCC 79:2014Determination of the abrasion resistance of fabrics by the
BS EN ISO 12947-2:2016EN ISO 12947-3:2016
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 3 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Martindale method ISO 12947-4:2016ASTMD496612(REAPPROVED2016)
Determination of fabricpropensity to surfacefuzzing and to pilling
BS EN ISO 12945-2:(2000)EN ISO 12945-2:(2000)ISO 12945-2:(2000)ASTM D4970-2010BS EN ISO 12945-1:(2001)EN ISO 12945-1:(2000)ISO 12945-1:(2000)
Bursting Strength BS EN ISO 13938-2:1999EN ISO 13938-2:1999ISO 13938-2:1999ASTM D3786:2018
Determination of sharp points ( under a force of 4.45N(1 pound)
ASTM F 963:2011Section 4.9 16 CFR 1500.48EN 71-1:2011, Amd 3:2014(Sec 8.12)
Determination of sharp edges (under a force of 8.90 N(2 pound)
ASTM F 963:2011Section 4.7 16 CFR 1500.49EN 71-1:2011, Amd 3:2014(Sec 8.11)
Determination of small parts torque test up to 9kg-cm (up to
ASTM F 963:2011Section 8.8/16 CFR 1500.51-53/EN
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 4 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
7.8 inch pounds) 71-1:2011, Amd 3:2014 (Sec 8.3)Determination of small parts tension test
ASTM F 963:2011Section 8.9 16 CFR 1500.51-53EN 71-1:2011, Amd 3:2014 (Sec 8.4)
Small parts-choking hazard test (small part cylinder of 31.7 mm inner diameter)
ASTM F 963:2011Section 4.6 16 CFR 1501EN 71-1:2011, Amd 3:2014 (Sec 8.2)
Color Fastness to Washing with soap or soap soda
BS EN ISO 105-C10:2007EN ISO 105 C10:2007ISO 105-C10:2006
Color Fastness to Laundering:Accelerated
AATCC 61:2013
Color Fastness to domestic and commercial laundering using non Phosphate reference actual def. in corpora ting a low Temperature wash
BS ISO 105-C08:2010EN ISO 105 C08:2010ISO 105 C08:2010
Color Fastness to domestic and commercial laundering oxidative bleach response using a non-phosphate reference def. in corpora ting a low temperature bleach activator
BS ISO 105-C09:2003
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 5 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Color fastness to domestic and commercial laundering
BS EN ISO 105-C06:2010EN ISO 105-CO6:2010ISO 105-CO6:2010
Color Fastness to Dry cleaning BSEN ISO 105-D01:2010EN ISO 105 D01:2010ISO105 D01:2010AATCC 132:2013
Color Fastness to Water BS EN ISO 105-E01:2013EN ISO 105-E01:2013ISO 105-E01:2013AATCC 107:2013/GB/T 5713:1997
Color Fastness to Sea water BS EN ISO 105-E02:2013EN ISO 105-E02:2013ISO 105-E02:2013AATCC 106:2013
Color Fastness to Chlorinated water(Swimming-Pool Water)
BS EN ISO 105-E03:2010EN ISO 105-E03:2010ISO 105-E03:2010AATCC 162:2013
Color Fastness to Perspiration BS EN ISO 105-E04:2013EN ISO 105-E04:2013ISO 105-E04:2013AATCC 15:2013GB/T 3922:1995
Color Fastness to Water spotting BS EN ISO 105-E07:2010
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 6 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
EN ISO 105 E07:2010ISO 105 E07:2010AATCC 104:2014
Color Fastness to Bleaching:Hypo Chlorite
ISO 105 N01:1993
Color Fastness to PowderedNon-Chlorine Bleach in home laundering
AATCC 172:2016
Color Fastness to Organic solvents
BS EN ISO 105-X05:1997EN ISO 105-X05:1997ISO 105 X05:1994
Color Fastness to Crocking/Rubbing
BS EN ISO 105:X12:2002ISO 105:X12:2016AATCC 8:2013GB/T 3920:2008
Color Fastness to Saliva DIN 53160-1:2010DIN 53160-2:2010LMBG 82.10-1:1985GB/T 18886:2002
Dye transfer in storage; fabric to fabric
AATCC 163-2013
Color Fastness to Sodium hypochlorite bleach in home laundering
AATCC 188-2010
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 7 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Dimensional stability to domestic washed and drying
BS EN 26330:1994EN 26330:1993BS EN ISO 6330:2012EN ISO 6330:2012ISO 6330:2012
Determination of dimensional change in washing and drying
BS EN ISO 5077:2008EN 25077:2008ISO 5077:2007
Preparation, marking and measuring of fabric specimens and garment in test for determination of dimensional change
BS EN ISO 3759:2011EN ISO 3759:2011ISO 3759:2011
Dimensional change of fabric after home laundering
AATCC 135:2015
Dimensional change of garment after home laundering
AATCC 150:2018
Determination of spirality after laundering Percentage of wales spirality change in knitted garment
ISO 16322-1:2005
Determination of spirality after laundering Woven and knitted fabric
ISO 16322-2:2005
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 8 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Determination of spirality after laundering Woven and knitted fabric
ISO 16322-3:2005
Determination of Skewness change in fabric and garment twist resulting from automatic home laundering
AATCC 179:2012
Determination of pH Value AATCC 81:2016ISO 3071:2005
Determination of free and hydrolyzed Formaldehyde (UV Spectrophotometer)
JIS L 1041:2005BS EN ISO 14184-I:2011
Determination of released Formaldehyde(UV Spectrophotometer)
AATCC 112:2014BS EN ISO 14184-2:201135 LMBG 82.02.1-1985
Determination of 4-aminoazobenzene
64 LFGB 82.02.9-2006 GB/T 23344-2009
Determination of Fiber Analysis-Qualitative
AATCC 20:2013
Determination of Fiber Analysis-Quantitative
AATCC 20 A:2014
Determination of Binary Fiber Mixture-Quantitative
ISO 1833-1:2006 + Cor 1:2009ISO 1833-3, 4, 6 to 16:2006
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 9 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
BSEN ISO 1833-1:2011Determination of Ternary Fiber Mixture-Quantitative
ISO 1833-2:2006BSEN ISO 1833-2:2011
Determination of Azo dye on Textile 1. 4-aminodiphenyl/Biphenyl-4-ylamine2. Benzidine3. 4-chlor-o-toluidine4. 2-naphthylamine5.o-aminoazotoluene/4-o-tolylazo-o-toluidine/4-amino-2',3-di methylazobenzene6. 2-amino-4-nitrotoluol/5-nitro-o-toluidine7. p-chloranilin/4-chloroaniline8.2,4-diaminoanisol/4-methoxy-m-phenylenediamine9.4,4'-diaminodiphenylmethane/4,4-methylenedianiline10. 3,3'-dichlorobenzidine/3,3'dichlorobiphenyl-4,4'-ylenediamine11. 3,3'-dimethoxybenzidine/o-dianisidine
BS EN 14362-I:201235 LMBG 82.02-2:199835 LMBG B82.02-4:1:1998EN 14362-I:2012 EN 14362-3:2012 GB/T17592:2011
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 10 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
12. 3,3'-dimethybenzidine/4,4'-bi-o-Toluidine13. 3,3'-dimethyl-4,4'-diaminodipenylmethane/4,4'-methylenedi-o-toluidine14. p-cresidin/6-methoxy-m-toluidine15. 4,4'-methylen-bis-(2-chloro-aniline)/2,2'-dichloro-4,4'methyl ene-dianiline16. 4,4'-oxydianiline17. 4,4'-thiodianiline18. o-toluidine/2-aminotoluene19. 2,4-toluylendiamine/4-methyl-m-phenylenediamine20. 2,4,5-trimethylaniline21. 4-aminoazobenzene22. o-anisidine/2-methoxyaniline23. 2,4-Xylidine24. 2,6-XylidineMigration of Certain Elements EN 71 Part-3:2013+Amd 1:2014Lead(pb),. Aluminum(Al), Manganese, Strontium, ZincCadmium(Cd), Antimony, cobalt, Mercury, Selenium, Tin, Copper
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 11 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Arsenic, Barium, Boron, Chromium( Combined)NickelDetermination of PCP LMBG 82.02-08:2001 Determination of OPP/TeCP/TCP In house 12-LO-S0865
Based on LMBG 82.02-08:2001(Issue no-1/ 25.07.16)
Determination of nickel content by flame atomic absorption spectrophotometry
EN 1810:1998 BSEN 1810:1998
Nickel release from products intended to come into direct and Prolonged contact
BSEN 1811:2011
Detection of PVC (Poly Vinyl chloride)
IHTM-CHEM-01 (Issue no-1/01.08.2016)
Screening test for nickel release PDCR 12471:2002 Phthalates in Toys and Childcare Articles1.Dibutyl phthalate (DBP)2.Benzyl Butyl phthalate (BBP)3.Bis 2 ethyl hexyl phthalate(DEHP)4.Di n-octyl phthalate (DNOP)5.Diiso nonyl phthalate (DINP)
(CPSC-CH-C1001-09.3 April 1, 2010)(CPSIA Title 1 Section108(CPSC-CH-C1001-09.3 April 1, 2010) BSEN 14372:2004:Clause 6.3.2BSEN 15777:2009BSEN ISO 14389:2014
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 12 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
6.Diiso decyl phthalate (DIDP)7.Diiso butyl phthalate (DIBP)8.Dicyclohexyl phthalate(DCHP)9.Dimethyl phthalate(DMP)10.Diethyl phthalate(DEP)11.Di iso heptyl pthalate(DIHP)12.Bis 2methoxyethyl pthalate(DMEP)13.Di n hexyl pthalate(DnHP)14.Di un decyl pthalate(DUP)15.Diheptyl Phthalate16.Diisopentylphthalate(DIPP)17.Di n pentylphthalate(DNPP)18.n-pentyl-isopentyl phthalate(nPIPP)Determination of Chlorinated Organic Carriers1) 2-Chlorotoluene2) 3-Chlorotoluene3) 4-Chlorotoluene4) 2,3-Dichlorotoluene5) 2,4-Dichlorotoluene6) 2,5-Dichlorotoluene7) 2,6-Dichlorotoluene8) 3,4-Dichlorotoluene
DIN 54232:2010
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 13 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
9) 2,3,6-Trichlorotoluene10) 2,4,5-Trichlorotoluene11) Pentachlorotoluene12) 1,2-Dichlorobenzene13) 1,3-Dichlorobenzene14) 1,4-Dichlorobenzene15) 1,2,3-Trichlorobenzene16) 1,2,4-Trichlorobenzene17) 1,3,5-Trichlorobenzene18) 1,2,3,4-Tetrachlorobenzene19) 1,2,3,5-Tetrachlorobenzene20) 1,2,4,5-Tetrachlorobenzene21) Pentachlorobenzene22) HexachlorobenzeneTotal Lead content in Substrate for metal children’s products including children’s metal jewelry
ASTM E1645-2001ASTM E1613-2012CPSC-CH-E1001-08.3 2012Health Canada Method C-02.4:2011
Total Lead content in Substrate for Non metal children’s products including children’s metal jewelry
ASTM E1645-2001ASTM E1613-2012CPSC-CH-E1002-08.3 2012Health Canada Method C-02.3:2011
Total Lead content in Paint and other Similar Surface coatings including children’s metal jeweler
ASTM E1645-2001ASTM E1613-2012CPSC-CH-E1003-09.1 2011 Health
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 14 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Canada Method C-02.2:2011Determination of Dimethyl Formamide (DMFo)
CEN/ISO/TS/16189:2013
Polycyclic Aromatic Hydrocarbons (PAHs)
AfPS GS 2014:01 PAKISO/TS 16190:2013ZEK 01.2-2008
Organo Tin CompoundsTributyltin (TBT)Dibutyltin (DBT)Monobutyl tin (MBT)Tetrabutyl tin (TeBT)Triphenyl tin (TPhT)Mono n-octyl tin (MOT)Di-n-octyl tin (DOT)Tri-cyclohexyl tin (TCyHT)Tri octyl tin (TOT)Tri-n-propyl tin (TPrT)Mono Phenyl tin (MPhT)Di Phenyl tin (DPhT)Methyl tinDi-n-propyl tin (DPrT)Di Heptyl tinDi Methyl tinTri Methyl tin
ISO/TS 16179:2012
Color Fastness to Artificial Light BS EN ISO 105-B02:2014
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 15 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Xenon Arc) EN ISO 105-B02:2014ISO 105-B02:2014AATCC 16.3:2014
Color Fastness to Phenolic yellowing
BS EN ISO 105-X 18:2007
II. LEATHERS & LEATHER PRODUCT
1. Leathers & Leathers Accessories
Cadmium Extractability from children’s metal Jewelry
CPSC-CH-E1004-11 February 03, 2011
Determination of Dimethyl Fumarate in Textiles
CEN ISO/TS 16186:2012, EEC Directive 2009/251/EC:2009
Determination of cadmium wet decomposition methods for Plastics
EN 1122:2001
Determination of Dimethyl Formamide (DMFo)
CEN/ISO/TS/16189:2013
Determination of Heavy metalsPb, Cd, Sb, Ba, Cr, Se, Hg
EN 71 Part-3:2013+Amd 1:2014ASTME1613:(2012)BS EN ISO 17072-1:2011EN 71 Part-3:2013+Amd 1:2014 With reference to(PDCR 13695-1:2000PDCR 13695-2:2004
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 16 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
BS EN ISO 17072-2:2011ASTM F963-2011)CPSC-CH-E1001-08.3 2012/CPSC-CH-E1002-08.3 2012/CPSC-CH-E1003-09.1 2011
Determination of pH Value BSEN ISO 4045:2008ASTM D2810-2013
Determination of Formaldehyde ISO 17226-2:2008
Determination of Azo dye in Leather1. 4-aminodipheny/Biphenyl-4-ylamine2. Benzidine3. 4-chlor-o-toluidine4. 2-naphthylamine5. o-aminoazotoluene/4-o-tolylazo-o-toluidine/4-amino-2',3-di methylazobenzene6. 2-amino-4-nitrotoluol/5-nitro-o-toluidine7. p-chloranilin/4-chloroaniline8. 2,4-diaminoanisol/4-methoxy-m-phenylenediamine9.
35 LMBG 82.02-3:1998ISO 17234-1:2010BSEN ISO 17234-1:2010BSEN ISO 17234-2:2011
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 17 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
4,4'-diaminodiphenylmethane/4,4-methylenedianiline10. 3,3'-dichlorobenzidine/3,3'dichlorobiphenyl-4,4'-ylenediamine11. 3,3'-dimethoxybenzidine/o-dianisidine12. 3,3'-dimethybenzidine/4,4'-bi-o-Toluidine13. 3,3'-dimethyl-4,4'-diaminodipenylmethane/4,4'-methylenedi-o-toluidine14. p-cresidin/6-methoxy-m-toluidine15. 4,4'-methylen-bis-(2-chloro-aniline)/2,2'-dichloro-4,4'methyl ene-dianiline16. 4,4'-oxydianiline17. 4,4'-thiodianiline18. o-toluidine/2-aminotoluene19. 2,4-toluylendiamine/4-methyl-m-phenylenediamine20. 2,4,5-trimethylaniline21. 4-aminoazobenzene22. o-anisidine/2-methoxyaniline
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 18 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
23. 2,4-Xylidine24. 2,6-XylidineDetermination of PCP/ TeCP DIN 53313:1996Determination of PCP TeCP/TCP
ISO 17070:2015
Determination of PCP LMBG 82.02-08:2001Determination of OPP In house 12-LO-S0865
Based on LMBG 82.02-08:2001 (Issue no-1/ 25.07.2016)
Determination of Chrome VI ISO 17075:2007Color fastness to crocking AATCC 8:2013Polycyclic Aromatic Hydrocarbons (PAHs)
AfPS GS 2014:01 PAKISO/TS 16190:2013/ZEK 01.2-2008
Organo Tin CompoundsTributyltin (TBT)Dibutyltin (DBT)Monobutyl tin (MBT)Tetrabutyl tin (TeBT)Triphenyl tin (TPhT)Mono n-octyl tin (MOT)Di-n-octyl tin (DOT)Tri-cyclohexyl tin (TCyHT)Tri octyl tin (TOT)Tri-n-propyl tin (TPrT)
ISO/TS 16179:2012
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 19 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Mono Phenyl tin (MPhT)Di Phenyl tin (DPhT)Methyl tinDi-n-propyl tin (DPrT)Di Heptyl tinDi Methyl tinTri Methyl tin
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 20 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
ELECTRICAL TESTING
LOCATION 1
I. SAFETY TEST FACILITY
1. Safety requirements for electrical equipment for measurement, control, and laboratory use-particular requirements for control equipment
Impact test IEC 61010-2-201, Editon 2.0 2017/03 Clause 8.2.2
Overload test IEC 61010-2-201, Editon 2.0, 2017/03 Clause 4.4.2.101.2
Endurance test IEC 61010-2-201, Editon 2.0, 2017/03 Clause 4.4.2.101.1
II. DOMESTIC ELECTRICAL APPLIANCES
1. Microwave Oven, Blenders, Food mixers, food processors, Mincers appliances
Marking test IEC 60335-1 (Edition 5.2):2016-05, Clause. 7IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 7IS 302-1:2008, Clause. 7IS 302-2-25:2014, Clause. 7
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 21 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Protection against electric shock IEC 60335-1 (Edition 5.2):2016-05, Clause. 8IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 8IS 302-1:2008, Clause. 8IS 302-2-25:2014, Clause. 8
Power Input and current IEC 60335-1 (Edition 5.2):2016-05, Clause. 10IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 10IS 302-1:2008, Clause. 10IS 302-2-25:2014, Clause. 10
Heating test/Temperature rise IEC 60335-1 (Edition 5.2):2016-05, Clause. 11IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 11IS 302-1:2008, Clause. 11IS 302-2-25:2014, Clause. 11
Leakage Current (At operating Temperature)
IEC 60335-1 (Edition 5.2):2016-05, Clause. 13IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 13IS 302-1:2008, Clause. 13
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 22 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS 302-2-25:2014, Clause. 13
Electric Strength (At operating temperature)
IEC 60335-1 (Edition 5.2):2016-05, Clause. 13IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 13IS 302-1:2008, Clause. 13IS 302-2-25:2014, Clause. 13
Moisture resistance IEC 60335-1 (Edition 5.2):2016-05, Clause. 15IEC 60335-2-25 (Edition 6.2): 2015-11, Clause. 15IS 302-1:2008, Clause. 15IS 302-2-25:2014,Clause.15
Leakage current (After Humidity test)
IEC 60335-1 (Edition 5.2):2016-05, Clause. 16IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 16IS 302-1:2008, Clause. 16IS 302-2-25:2014, Clause. 16
Electrical strength (After Humidity Test)
IEC 60335-1 (Edition 5.2):2016-05, Clause. 16
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 23 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 16IS 302-1:2008, Clause. 16IS 302-2-25:2014, Clause. 16
Overload protection test IEC 60335-1 (Edition 5.2):2016-05, Clause. 17IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 17IS 302-1:2008, Clause. 17IS 302-2-25:2014, Clause. 17
Endurance test IEC 60335-1 (Edition 5.2):2016-05, Clause. 18IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 18IS 302-1:2008, Clause. 18IS 302-2-25:2014, Clause. 18
Abnormal operation Test IEC 60335-1 (Edition 5.2):2016-05, Clause. 19IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 19IS 302-1:2008, Clause. 19
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 24 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS 302-2-25:2014, Clause. 19Stability and Mechanical hazards IEC 60335-1 (Edition 5.2):2016-05,
Clause. 20IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 20IS 302-1:2008, Clause. 20IS 302-2-25:2014, Clause. 20
Mechanical Strength IEC 60335-1 (Edition 5.2):2016-05, Clause. 21.1IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 21.1IS 302-1:2008, Clause. 21.1IS 302-2-25:2014, Clause. 21.1
Construction (tests) IEC 60335-1 (Edition 5.2):2016-05, Clause. 22IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 22IS 302-1:2008, Clause. 22IS 302-2-25:2014, Clause. 22
Internal Wiring (Flexing Test) IEC 60335-1 (Edition 5.2):2016-05, Clause. 23IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 23
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 25 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS 302-1:2008, Clause. 23IS 302-2-25:2014, Clause. 23
Cord grip IEC 60335-1 (Edition 5.2):2016-05, Clause. 25.15IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 25.15IS 302-1:2008, Clause. 25.15IS 302-2-25:2014, Clause. 25.15
Terminal for external conductors IEC 60335-1 (Edition 5.2):2016-05, Clause. 26IEC 60335-2-25 (Edition 6.0):2010-09IS 302-1:2008, Clause. 26IS 302-2-25:2014, Clause. 26
Provision for earthing IEC 60335-1 (Edition 5.2):2016-05, Clause. 27IEC 60335-2-25 (Edition 6.2):2015-11IS 302-1:2008, Clause. 27IS 302-2-25:2014, Clause. 27
Screws and Connections IEC 60335-1 (Edition 5.2):2016-05, Clause. 28IEC 60335-2-25 (Edition 6.2):2015-11,IS 302-1:2008, Clause. 28IS 302-2-25:2014, Clause. 28
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 26 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Creepage distances and clearances
IEC 60335-1 (Edition 5.2):2016-05, Clause. 29IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 29IS 302-1:2008, Clause. 29IS 302-2-25:2014, Clause. 29
Resistance to Heat, Fire and Tracking (Glow wire Test)
IEC 60335-1 (Edition 5.2):2016-05, Clause. 30IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 30IS 302-1:2008, Clause. 30IS 302-2-25:2014, Clause. 30
Resistance to Heat, Fire and Tracking (Needle flame Test)
IEC 60335-1 (Edition 5.2):2016-05, Clause. 30IEC 60335-2-25 (Edition 6.2):2015-11, Clause. 30IS 302-1:2008, Clause. 30IS 302-2-25:2014, Clause. 30
Resistance to Heat, Fire and Tracking (Ball pressure test)
IEC 60335-1 (Edition 5.2):2016-05, Clause. 30IEC 60335-2-25 (Edition 6.2):2015-11IS 302-1:2008, Clause. 30IS 302-2-25:2014, Clause. 30
Resistance to Rusting IEC 60335-2-25 (Edition 6.2):2015-11
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 27 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS 302-1:2008, Clause. 31IS 302-2-25:2014, Clause. 31
Radiation hazards IEC 60335-1 (Edition 5.2):2016-05, Clause. 32IEC 60335-2-25 (Edition 6.0):2010-09IS 302-1:2008, Clause. 32IS 302-2-25:2014, Clause. 32
III. TRANSMISSION LINE EQUIPMENT AND ACCESSORIES
1. LV Switchgear and Control Gear Assembly
Dielectric Properties IEC 61439-1 (Edition 2.0)2011-08 EN 61439-1:2011Clause. 10.9,10.9.2,10.9.3
Temperature Rise limit Clause. 10.10Short circuit withstand strength of protective devices
Clause. 10.5.3
Short circuit withstand strength Clause 10.11Resistance to corrosion (Damp Heat and Salt mist for enclosures and metallic parts)
Clause. 10.2.2
Thermal Stability Clause. 10.2.3.1Resistance to abnormal heat and Clause 10.2.3.2
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 28 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
fire due to internal electric effectMechanical impact Clause 10.2.6Marking Clause 10.2.7Degree of protection of enclosure Clause 10.3Clearances and Creepage distance
Clause 10.4
Protection against electric shock and integrity of protective circuit
Clause 10.5
Effective continuity between the exposed conductive parts of the assembly and the protective circuit
Clause 10.5.2
Mechanical Operations Clause. 10.132. Low-Voltage Switchgear
and Control Gear Assemblies-Power Switchgear and Control Gear Assemblies
Dielectric Properties IEC 61439-2 (Edition 2.0):2011-08IEC 61439-1 (Edition 2.02011-08 EN 61439-2:2011EN 61439-1:2011Clause. 10.9,10.9.2,10.9.3
Temperature Rise limit Clause. 10.10Short circuit withstand strength of protective devices
Clause. 10.5.3
Short circuit withstand strength Clause 10.11Resistance to corrosion (Damp Clause. 10.2.2
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 29 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Heat and Salt mist for enclosures and metallic parts)Thermal Stability Clause. 10.2.3.1 Resistance to abnormal heat and fire due to internal electric effect
Clause. 10.2.3.2
Mechanical impact Clause. 10.2.6Degree of protection of enclosures
Clause. 10.3
Marking Clause. 10.2.7Clearances and Creepage Distances
Clause. 10.4
Protection against electric shock and integrity of protective circuit
Clause 10.5
Effective continuity between the exposed conductive parts of the assembly and the protective circuit
Clause 10.5.2
Mechanical Operations Clause. 10.133. Low-Voltage Switchgear
and Control Gear Assemblies-Busbar Trunking Systems (Busways)
Dielectric Properties IEC 61439-1 (Edition 2.0)2011-08 IEC 61439-6 (Edition 1.0): 2012-05 EN 61439-1:2011EN 61439-6:2012
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 30 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Clause. 10.9Temperature Rise limit Clause. 10.10Short circuit withstand strength of protective device
Clause. 10.5.3
Short circuit withstand strength Clause 10.11Resistance to corrosion (Damp Heat and Salt mist for enclosures & metallic part)
Clause. 10.2.2
Thermal Stability Clause. 10.2.3.1 Resistance to abnormal heat and fire due to internal electric effect
Clause. 10.2.3.2
Mechanical impact Clause. 10.2.6Marking Clause 10.2.7Degree of protection of enclosures
Clause. 10.3
Ability to withstand mechanical loads
Clause. 10.2.101
Resistance of the enclosure to crushing
Clause. 10.2.101.3
Thermal cycling test Clause. 10.2.102Clearances and Creepage Distances
Clause. 10.4
Protection against electric shock and integrity of protective circuit
Clause 10.5
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 31 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Effective continuity between the exposed conductive parts of the assembly and the protective circuit
Clause 10.5.2
Mechanical Operations Clause. 10.134. Compression and
Mechanical ConnectorsHeat Cycle test IEC 61238-1, (Edition 2):
2003-05 Clause. 6.3Electrical Resistance Measurement
Clause. 6.2.1
Short Circuit test Clause. 6.3.4Tensile Force-Mechanical Tests Clause. 7
5. Rewirable Type Electric Fuses
Visual examination IS 2086:1993(RA 2009) Clause. 9.1Test for dimensions Clause. 9.2Test for mechanical endurance Clause. 9.3Test for Mechanical Strength Clause. 9.4Test for withdrawal force Clause. 9.5Test for temperature-rise Clause. 9.6Insulation resistance Clause. 9.7High Voltage Test Clause. 9.8Test for breaking capacity Clause. 9.9Test for water absorption Clause. 9.10Temperature cycle test (for ceramic material)
Clause. 9.11.1
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 32 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IV. SWITCHGEAR EQUIPMENT
1. Circuit Breakers Input test IEC 60947-1 (5.2 Edition):2014-09EN 60947-1-2007/A2:2011/A2:014
Temperature test IEC 60947-1 (5.2Edition):2014-09Clause 4.2.2
Overload test IEC 60947-1(5.2 Edition):2014-09
Endurance test IEC 60947-1(5.2 Edition):2014-09
Dielectric voltage withstand test IEC 60947-1(5.2 Edition):2014-09 Clause. 7.2.3
Crossover potential test I IEC 60947-1(5.2 Edition):2014-09
Under/over voltage test IEC 60947-1(5.2 Edition):2014-09
Crossover potential test II IEC 60947-1(5th Edition):2007-06
Tripping limits and characteristics IEC 60947-2 (Edition 5): 2016-06/IEC 60947-1:2007/ AMD1:2010EN 60947-2:2017IS/IEC 60947-2:2003Clause. 8.3.3.2
Dielectric properties Clause. 8.3.3.3
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 33 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Marking Clause 5.2Constructional requirement Clause 7.1Mechanical operation and operational performance capability
Clause. 8.3.3.4
Overload performance (where applicable)
Clause. 8.3.3.5
Verification of dielectric withstand Clause. 8.3.3.6 Verification of temperature-rise Clause. 8.3.3.7Verification of overload releases Clause. 8.3.3.8Verification of under voltage and shunt releases (if applicable)
Clause. 8.3.3.9
Verification of main contact position (for circuit breakerssuitable for isolation)
Clause. 8.3.3.10
Rated service short-circuit breaking capacity
Clause. 8.3.4.2 and 8.3.8.4
Verification of Operational performance capability
Clause. 8.3.4.3 and 8.3.8.5
Rated ultimate short circuit breaking capacity
Clause. 8.3.5.3
Rated short-time withstand current
Clause. 8.3.8.3
2. Switches, Temperature-rise IEC 60947-
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 34 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Disconnectors, Switch-Disconnectors and Fuse-Combination Units
3:2008+AMD1:2012+AMD2:2015 (Edition 3.2) 2015-07IEC 60947-1:2007+ AMD1:2010+AMD2:2014 EN 60947-3:2009/ A1:2012/A2:2015IS/IEC 60947-3:1999IS/IEC 60947-1, Clause. 8.3.3.1
Temperature-rise Verification Clause. 8.3.3.6, 8.3.4.4, 8.3.5.5Dielectric properties Clause. 8.3.3.2, 8.3.4.2Leakage current Clause. 8.3.3.5, 8.3.4.3, 8.3.5.4Rated making and breaking capacities (overload)
Clause. 8.3.3.3
Dielectric verification Clause 8.3.3.4, 8.3.5.3Operational performance Clause. 8.3.4.1Rated short-time withstand current
Clause. 8.3.5.1
Rated short-circuit making capacity
Clause. 8.3.5.2
Rated conditional short-circuit current
Clause. 4.3.6.4
Strength of actuator Mechanism Clause. 8.3.3.7Fuse protectedshort-circuitwithstand
Clause 8.3.6.2.1a)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 35 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Fuse protectedshort-circuit making
Clause 8.3.6.2.1 b)
Overload test Clause. 8.3.7.1Mechanical operation test Clause. 8.1.3.2
3. Contactors and Auxiliary Contacts
Verification of temperature rise IEC 60947-4-1:2009+AMD1:2012 (Edition:3.1) 2012-07IEC 60947-1EN 60947-4-1:2010/A1:2012IS 60947 (Part 4/Sec I):2000 Clause. 9.3.3.3
Temperature Test
Verification of operation and operating limits
IEC 60947-4-1:2009+AMD1:2012 (Edition:3.1) 2012-07EN 60947-4-1:2010/A1:2012IS/IEC 60947-4-1:2000Clause. 9.3.3.1 and 9.3.3.2
Overvoltage and under voltage test
Normal load and overload performance requirements
IEC 60947-4-1:2009+AMD1:2012 (Edition:3.1) 2012-07EN 60947-4-1:2010/A1:2012IS/IEC 60947-4-1:2000Clause. 8.2.4
Verification of degrees of protection of enclosed contactors and starters
IS 60947 (Part 4/Sec I):2000 IEC 60947-1 Annexure C
Verification of dielectric IS 60947 (Part 4/Sec I):2000
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 36 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
properties IEC 60947-4-1:2009+AMD1:2012 (Edition:3.1) 2012-07EN 60947-4-1:2010/A1:2012Clause. 9.3.3.4
Dielectric Voltage-Withstand Test
Overload withstand capability of contactors.
IS 60947 (Part 4/Sec I):2000IEC 60947-4-1:2009+AMD1:2012 (Edition:3.1) 2012-07EN 60947-4-1:2010/A1:2012Clause. 9.3.5
Crossover lead di-electric test ICrossover lead di-electric test IICalibration test(Overload relays)Breakdown of component testSecondary circuit testLeakage current testVerification of rated making and breaking capacities,
IS 60947 (Part 4/Sec I): 2000IEC 60947-4-1:2009+AMD1:2012 (Edition:3.1) 2012-07EN 60947-4-1:2010/A1:2012Clause. 9.3.3.5
Change-over ability and reversibility where applicableOverload test Verification of operational performance capability
IEC 60947-4-1:2009+AMD1:2012 (Edition:3.1) 2012-07EN 60947-4-1:2010/A1:2012 IS 60947 (Part 4/Sec I):2000 Clause. 9.3.3.6
Endurance test IEC 60947-4-1:2009+AMD1:2012
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 37 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Performance under short-circuit conditions
(Edition:3.1) 2012-07EN 60947-4-1:2010/A1:2012IS 60947 (Part 4/Sec I):2000 Clause. 9.3.4
4. Auxiliary Contacts, Add on Blocks, Frontle Blocks, Manual Push Buttons
Verification of operation and operating limits
IEC 60947-5-1:2016/COR1:2016 (Edition 4.0) /IEC 60947-5-1 2016-05IEC 60947-1EN 60947-5-1:2004/A1:2009 IS/IEC 60947 (Part 5/Sec I):2003Clause. 8.3.3.1 and 8.3.3.2
Overvoltage and Under voltage Test
Verification of temperature rise IEC 60947-5-1:2016/COR1:2016 (Edition 4.0) IEC 60947-5-1 2016-05EN 60947-5-1:2004/ A1:2009IS/IEC 60947 (Part 5/Sec I): 2003
Temperature Test Clause 8.3.3.3Verification of dielectric properties EC 60947-5-1:2016/COR1:2016
(Edition 4.0) IEC 60947-5-12016-05EN 60947-5-1:2004/A1:2009IS/IEC 60947 (Part 5/Sec I):2003Clause. 8.3.3.4
Dielectric Voltage-Withstand Test
Verification of rated making and breaking capacities under normal conditions
IEC 60947-5-1:2016/COR1:2016 (Edition 4.0) IEC 60947-5-12016-05EN 60947-5-1:2004/A1:2009IS/IEC 60947 (Part 5/Sec I):2003Clause. 8.3.3.5.3
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 38 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Verification of mechanical properties of terminals
IEC 60947-5-1:2016/COR1:2016 (Edition 4.0) IEC 60947-5-12016-05EN 60947-5-1:2004/A1:2009IS/IEC 60947 (Part 5/Sec I):2003IEC 60947-1 Clause. 8.2.4
Secureness and Pullout Test (Mechanical sequence )
Verification of the performance of terminal assemblies
IEC 60947-1 Clause. 8.2.4
Measurement of clearances and creepage distances
IEC 60947-5-1:2016/COR1:2016 (Edition 4.0) IEC 60947-5-1 2016-05EN 60947-5-1:2004/A1:2009IS/IEC 60947 (Part 5/Sec I):2003Clause. 7.1.4
Spacings
Verification of limitation of rotation of a rotary switch
IEC 60947-5-1:2016/COR1:2016 (Edition 4.0) IEC 60947-5-12016-05EN 60947-5-1:2004/A1:2009IS/IEC 60947 (Part 5/Sec I):2003 Clause. 8.2.6
Verification of degrees of protection of enclosed contactors and starters
IEC 60947-5-1:2016/COR1:2016 (Edition 4.0) IEC 60947-5-1 2016-05EN 60947-5-1:2004/ A1:2009IS/IEC 60947 (Part 5/Sec I): 2003Annex C of IEC 60947-1 Clause 4.1.12
Verification of actuation force or moment
IEC 60947-5-1:2016/COR1:2016 (Edition 4.0) IEC 60947-5-12016-05EN 60947-5-1:2004/A1:2009Overload and Endurance, Pilot
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 39 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
duty IS/IEC 60947 (Part 5/Sec I):2003 Clause. 8.2.5
Verification of rated making and breaking capacities under abnormal conditions:Overload and endurance tests (Auxiliary devices)
IEC 60947-5-1:2016/COR1:2016 (Edition 4.0) IEC 60947-5-12016-05EN 60947-5-1:2004/A1:2009IS/IEC 60947 (Part 5/Sec I):2003Clause. 8.3.3.5.4
Breakdown of component testPerformance under conditional short-circuit current
IEC 60947-5-1:2016/COR1:2016 (Edition 4.0) IEC 60947-5-1 2016-05EN 60947-5-1:2004/ A1: 2009IS/IEC 60947 (Part 5/Sec I): 2003 Clause. 8.3.4
5. Electrical Connector, Terminal Blocks for Copper Conductors, Fuse Terminal Blocks
Dielectric Tests IEC 60947-7-1:2009 (Edition 3.0) 2009-04IEC 60947-1EN 60947-7-1:2009Clause. 8.4.3
Dielectric Voltage-Withstand Test Verification of Voltage drop IEC 60947-7-1:2009 (Edition 3.0)
2009-04EN 60947-7-1:2009Clause. 7.2.4, 8.4.4
Voltage drop test
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 40 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Temperature rise IEC 60947-7-1:2009 (Edition 3.0) 2009-04EN 60947-7-1:2009Clause. 7.2.1, 8.4.5
Temperature test(It is same as temperature rise test) Verification of mechanical Characteristics
IEC 60947-7-1:2009 (Edition 3.0) 2009-04EN 60947-7-1:2009Clause. 8.3.3
Secureness and Pullout Test (Mechanical sequence ) Verification of the performance of terminal assemblies Verification of creepage and clearances
Clause. 8.4.2
SpacingsSolid wire tightening testTab pull testMold stress relief test Verification of thermal Characteristics
IEC 60947-7-1:2009 (Edition 3.0) 2009-04EN 60947-7-1:2009 Clause. 8.5Short time current sequence test
Aging test (for screwless-type terminal blocks only)
IEC 60947-7-1:2009 (Edition 3.0) 2009-04EN 60947-7-1:2009Clause 8.4.7
Heat cycling test (Spring force type terminal block) Verification of thermal IEC 60947-7-1:2009 (Edition 3.0)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 41 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Characteristics 2009-04EN 60947-7-1:2009Clause. 8.5
Conditioning test (Spring force type terminal block)
6. Low-Voltage Switchgear and Control gear-Part 7-2:Ancillary Equipment-Protective Conductor Terminal Blocks for Copper Conductors
Dielectric Tests IEC 60947-7-2 (Edition 3.0):2009EN 60947-7-2:2009Clause. 7.2.2, 8.4.3
Temperature rise Clause. 7.2.1, 8.4.5 Verification of Voltage Drop Clause. 7.2.4, 8.4.4Short-time withstand current Clause. 4.3.2, 8.4.6Verification of mechanical characteristics
Clause. 8.3.1
Verification of mechanical characteristics
IEC 60947-7-3 (Edition 2.0):2009 EN 60947-7-3:2009Clause. 8.3.3
Attachment of the fuse terminal block on its support
Clause. 8.3.3
Mechanical properties of clamping units of a fuse terminal block
Clause. 8.3.3
Testing for damage to and accidental loosening of conductors of a fuse terminal block (flexion test)
Clause. 8.3.3
Pull-out test IEC 60947-1 Clause. 8.3.4.4Verification of rated cross-section Clause. 8.3.3.4
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 42 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
and rated connecting capacity 7. MCB Marking Clause 6
General Clause 8.1.1Mechanism IS/IEC 60898-1:2002
IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11IS/IEC 60898-1 2015EN 60898-1:2003/A1:2004/A11:2005/A13:2012Clause. 8.1.2
Clearances and creepage distances
IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11IS/IEC60898-1 2015EN 60898-1:2003/A1:2004/A11:2005/A13:2012 Clause. 8.1.3
Non-interchangeability IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11IS/IEC 60898-1 2015EN 60898-1: 2003/ A1:2004/ A11: 2005/A13:2012 Clause. 8.1.6
Test of dielectric properties IS/IEC 60898-1:2002
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 43 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11IS/IECEN 60898-1:2003/A1:2004/ A11: 2005/A13:2012Clause. 9.7
Dielectric voltage-Withstand
Indelibility of marking IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11IS/IEC 60898-1 2015EN 60898-1:2003/ A1:2004/A11:2005/ A13:2012Clause. 9.3
Test of reliability of screws, current-carrying parts and connections
IS/IEC 60898-1:2002IEC 60898-1:2015/ COR1:2015, (Edition 2.0) 2015-11IS/IEC 60898-1 2015EN 60898-1:2003/ A1:2004/A11:2005/A13: 2012 Clause. 9.4
Test of reliability of terminals for external conductors
IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11IS/IEC 60898-1 2015EN 60898-1:2003/A1:2004/A11:
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 44 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
2005/A13:2012Clause. 9.5
Test of protection against electric shock
IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11IS/IEC 60898-1 2015EN 60898-1:2003/A1:2004/A11:2005/ A13:2012Clause 9.6
Resistance to mechanical stresses and impact
IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11IS/IEC 60898-1 2015EN 60898-1:2003/A1:2004/A11:2005/ A13:2012 Clause. 9.13.2
Test of resistance to heat IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11EN 60898-1:2003/A1:2004/A11:2005/ A13:2012 Clause. 9.14
Test of temperature-rise IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11EN 60898-1:2003/A1:2004/A11:2005/ A13:2012 Clause 9.8
Temperature Test
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 45 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Resistance to abnormal heat and to fire
IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11IS/IEC 60898-1 2015EN 60898-1:2003/A1:2004/A11:2005/ A13:2012 Clause 9.15
Resistance to rusting IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11IS/IEC 60898-1 2015EN 60898-1:2003/A1:2004/A11:2005/A13:2012 Clause. 9.16
Resistance to mechanical shock IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11EN 60898-1:2003/A1:2004/A11:2005/ A13:2012 Clause. 9.13
28 day test AC Clause. 9.9Test of tripping characteristic Clause. 9.10Test of mechanical and electrical endurance
IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11IS/IEC 60898-1:2015EN 60898-1:2003/A1:2004/A11:2005/
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 46 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
A13:2012 Clause. 9.11Performance at reduced short-circuit currents
IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11IS/IEC 60898-1 2015EN 60898-1:2003/A1:2004/A11:2005/ A13:2012 Clause. 9.12.11.2.1
Short circuit performance at 1500 A
IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11IS/IEC 60898-1 2015EN 60898-1:2003/A1:2004/A11:2005/ A13:2012 Clause. 9.12.11.3
Short-circuit test on circuit-breakers rated 230 V, or 240 V or 230/400 V for verifying their suitability for use in IT systems
Clause 9.12.11.2.2
Service short-circuit capacity (ics) IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015, (Edition 2.0) 2015-11IS/IEC 60898-1 2015EN 60898-1:2003/A1:2004/A11:2005/ A13:2012 Clause. 9.12.11.4.2
Performance at rated short-circuit capacity (icn)
IS/IEC 60898-1:2002IEC 60898-1:2015/COR1:2015,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 47 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Edition 2.0) 2015-11IS/IEC 60898-1 2015EN 60898-1:2003/A1:2004/A11:2005/ A13:2012 Clause 9.12.11.4.3
Test at the making and breaking capacity on an individual pole (Icn1) of multipole circuit-breakers
Clause 9.12.11.4.4
8. RCCB Marking Clause. 6IEC 61008-1:2010+A1:2012+A2:2013, (Edition 3.2) 2013-09IS 12640 (Part 1):2016IS 12640:1 2008EN 61008-1:2012/A1:2014/A11:2015
General Clause 8.1.1Mechanism Clause. 8.1.2Clearance and creepage distances
Clause. 8.1.3
Indelibility of marking Clause. 9.3Test of reliability of screws, current-carrying parts and connections
Clause. 9.4
Test of reliability of terminals for external conductors
Clause 9.5
Test of protection against electric Clause. 9.6
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 48 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
shockVerification of resistance to Mechanical shocks and impact
Clause. 9.12
Test of resistance to heat Clause. 9.13Test of Dielectric properties Clause. 9.7Test of temperature-rise Clause. 9.8Residual Operating Characteristics
Clause. 9.9
Mechanical and Electrical endurance
Clause. 9.10
Performance at Iδm Clause. 9.11.2.3a bVerification of the suitability of RCCBs for use in IT-systems
Clause. 9.11.2.3c)
Coordination at Inc Clause. 9.11.2.4aPerformance at Im Clause. 9.11.2.4cCoordination at Im Clause. 9.11.2.4bCoordination at Iδc Clause. 9.11.2.2Resistance to abnormal heat and to fire
Clause. 9.14
Verification of trip-free mechanism Clause. 9.15Verification of the operation of the test device at the limits of rated voltage
Clause. 9.16
Verification of the behavior of Clause. 9.17
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 49 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
RCCBs functionally dependent on line voltageNon-Operating current under over current conditions
Clause 9.18
Verification of behavior of RCCBs in case of current surges caused by impulse voltages
Clause. 9.19
Resistance to Rusting Clause 9.25 Verification of the correct operation at residual currents with d.c. components
Clause. 9.21
Verification of reliability Clause. 9.22Climatic test Clause. 9.22.1Test for Reliability at 40 °C Clause. 9.22.2 Verification of ageing of electronic components
Clause. 9.23
9. RCBO Marking IEC 61009-1:2010+A1:2012+A2:2013 (Edition 3.2) 2013-09IS 12640 (Part 2) 2016IS 12640-2 2008EN 61009-1:2012/ A1:2014/A11:2015/A2:2016Clause. 6
Mechanism Clause. 8.1.2
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 50 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Clearance and creepage distances
Clause. 8.1.3
Non-interchangeability Clause. 8.1.6Indelibility of marking Clause. 9.3Test of reliability of screws, current-carrying parts and connections
Clause. 9.4
Test of reliability of terminals for external conductors
Clause. 9.5
Test of protection against electric shock
Clause. 9.6
Resistance to Mechanical Shock and impact
Clause. 9.13
Test of resistance to heat Clause. 9.14Dielectric properties Clause. 9.7Test of temperature-rise Clause. 9.8Operating characteristics under residual current conditions
Clause. 9.9
Verification of mechanical and electrical endurance
Clause. 9.10
Resistance to abnormal heat and to fire
Clause. 9.15
Verification of trip-free mechanism
Clause. 9.11
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 51 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Verification of the operation of the test device at the limits of rated voltage
Clause. 9.16
Verification of the behavior of RCBOs functionally dependent on line voltage
Clause. 9.17
Verification of behaviour of RCBOs in case of current surges caused by impulse voltages
Clause. 9.19
Verification of reliability Clause. 9.22Resistance to Rusting Clause 9.25Climatic test Clause. 9.22.1Test for reliability at 40 °C Clause. 9.22.2ageing of electronic components Clause. 9.23Performance at reduced short-circuit currents
Clause.9.12.11.2.1
Short-circuit test for verifying the suitability of RCBOs for use in IT systems
Clause.9.12.11.2.2
Test at 1500 A Clause 9.12.11.3Performance at service short-circuit capacity (ICS)
Clause. 9.12.11.4 b
Verification of the Coordination at the rated Conditional short-circuit
Clause. 9.12.11.4 c
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 52 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
current (Inc)Verification of the rated Residual making and breaking capacity (IM)
Clause. 9.12.13
10. Electronic Air Break Switches
Electric strength test AS/ NZS 3133:2013+Amd. 1 Clause. 13.4+A2 Clause. 13.4
Insulation resistance test AS/ NZS 3133:2013+ Amd. 1+A2Clause. 13.3
Endurance test AS/ NZS 3133:2013+ Amd. 1+A2Clause. 13.5
Heating test/Temperature rise AS/ NZS 3133:2013+ Amd. 1+A2Clause. 13.2
Humidity test AS/ NZS 3133:2013+ Amd. 1+A2Clause. 13.1.10
Leakage current AS/ NZS 3133:2013+ Amd. 1+A2Clause. A4.2
Impulse test AS/ NZS 3133:2013+ Amd. 1+A2Clause. A4.3
Degree of protection of assemblies
AS/ NZS 3133:2013+ Amd. 1+A2Clause. 13.12
Mechanical strength of actuating member
AS/ NZS 3133:2013+ Amd. 1+A2Clause. A4.4
11. Residual Current device Insulation resistance test AS/ NZS 3190:2016Clause. 8.2
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 53 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Electric strength test AS/ NZS 3190:2016Clause. 8.3
Impulse test AS/ NZS 3190:2016/Clause. 8.5Current surge test AS/ NZS 3190:2016
Clause. 8.6Earthing connection AS/ NZS 3190:2016 AS/ NZS
3100:2017, Clause. 8.5Cord anchorage AS/ NZS 3190:2016
AS/ NZS 3100:2017, Clause. 8.6
Screw thread and fixings AS/ NZS 3190:2016AS/ NZS 3100:2017, Clause. 8.7
Heating test AS/ NZS 3190:2016Clause. 8.7
Tripping test AS/ NZS 3190:2016Clause. 8.8
Endurance test AS/ NZS 3190:2016Clause. 8.14
Short-time through-current withstand test
AS/ NZS 3190:2016Clause. 8.15
Climatic test AS/ NZS 3190:2016Clause. A2
Verification of ageing of electronic AS/ NZS 3190:2016
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 54 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
components Clause. 8.19Reliability AS/ NZS 3190:2016
Clause. 8.1812. Residual Current Device Insulation resistance test IEC 60669-1 I NT 1:2012
(Edition 3.2)IEC 60669-1:2007(Edition 3.2)IEC 60669-2-1:2002+ AMD1:2008+AMD2:2015 CSV (Edition 4.2)IEC 60669-2-3:2006(Edition.0)IEC 60669-2-4:2004(Edition 1.0)IEC 60669-2-5:2013(Edition 1.0)IEC 60669-2-6:2012(Edition 1.0) Clause. 16
Electric strength test Clause. 16Impulse test Clause. 26.1.2Current surge test Clause. 26.1.2Earthing connection Clause. 11Cord anchorage Clause. 11screw thread and fixings Clause. 22
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 55 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Heating test Clause. 17Endurance test Clause. 18Short-time through-current withstand test
Clause. 101
Touch current test Clause. 10.202Marking test Clause. 8Protection against access live parts
Clause. 10
V. ELECTRICAL MEASURING INSTRUMENTS
1. ELECTRICAL MEASURING INSTRUMENTS (Energy Meters)Electrical and Electronic (Static) Energy Meters/Prepayment Meters(Energy Meter)
Test of Insulation PropertiesImpulse Voltage Test As per Standard:
IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Clause. 12.7.6.2IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.7.6.2 CBIP 325:2015, Clause. 5.4.6.2IEC 62052-11:2003+A1:2016 Cl.7.3IS 15884:2010; Cl. 5.4.6.2IEC 62055-31 (1st Edition):2005-09
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 56 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Clause. 7.7 IS16444:2015 Cl.6.10.6
AC High Voltage test As per Standard:IS 13779:1999 (RA 2014), with amd. 1,2,3 4, 5, Clause. 12.7.6.3IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.7.6.3 CBIP 325:2015, Clause. 5.4.6.2IEC 62052-11:2003+A1:2016Clause. 7.3.3IEC 62053-21:2003+A1:2016 Clause. 7.4IEC 62053-22:2003+A1:2016Clause. 7.4 IS 15884:2010Cl. 5.4.6.3IEC 62055-31 (1st Edition):2005-09 Clause. 7.7 IS16444:2015 Cl.6.10.6
Insulation Resistance test As per Standard:IS 13779:1999 (RA 2014), with Amd.
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 57 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
1,2,3 4, 5 Clause. 12.7.6.4IS 14697:1999 (RA 2014), Amd:1, 2, 3 & 4 Clause. 12.7.6.4CBIP 325:2015, Clause. 5.4.6.2IS 15884:2010Cl. 5.4.6.4IS16444:2015 Cl.6.10.6
Test of Accuracy Requirement Test on Limits of error As per Standard:
IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Clause. 11.1IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 11.1CBIP 325:2015, Clause. 5.4.6.2IEC 62053-21, (1st Edition):2016, Clause. 8.1IEC 62053-22 (1st Edition):2016, Clause. 8.1,8.5IEC 62053-23 (1st Edition) 2016, Clause. 8.1, 8.5
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 58 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS 15884:2010 ; Cl. 4.6.1IEC 62055-31 (1st Edition): 2005-09 Clause. 8 IS16444:2015 Cl.6.12
Test of Meter Constant As per Standard:IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Clause. 12.15,11.6IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.14CBIP 325:2015, Clause. 5.6.6IEC 62053-22 (1st Edition):2016, Clause. 8.4IEC 62053-23 (1st Edition):2016, Clause. 8.4IS 15884:2010 ; Cl. 5.6.5IEC 62055-31 (1st Edition):2005-09 Clause. 8 IS16444:2015 Cl.6.12
Interpretation of test results As per Standard:IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Clause. 12.16
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 59 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.15IEC 62053-21 (1st Edition):2016, Clause. 8.6IEC 62053-22 (1st Edition):2016, Clause. 8.6IEC 62053-23 (1st Edition):2016, Clause. 8.6 IS16444:2015 Cl.6.12
Test of Starting Condition As per Standard:IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Clause. 12.14,11.5IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.13CBIP 325:2015, Clause. 5.6.5IEC 62053-21 (1st Edition):2016, Clause. 8.3IEC 62053-22 (1st Edition):2016, Clause. 8.3IEC 62053-23 (1st Edition):2016, Clause. 8.3
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 60 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS 15884:2010Cl. 5.6.4IEC 62055-31 (1st Edition):2005-09 Clause. 8 IS16444:2015 Cl.6.12
Test of No Load Condition As per Standard:IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Clause. 12.13,11.4IS 14697:1999 (RA 2004), Clause. 12.12CBIP 325:2015, Clause. 5.6.4IEC 62053-21 (1st Edition):2016, Clause. 8.3IEC 62053-22 (1st Edition):2016, Clause. 8.3IEC 62053-23 (1st Edition):2016, Clause. 8.3 IS 15884:2010 Cl. 5.6.3IEC 62055-31 (1st Edition): 2005-09 Clause. 8 IS16444:2015 Cl.6.12
Test of Ambient temperature influence
As per Standard:
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 61 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Clause. 12.12,11.3IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.11CBIP 325:2015, Clause. 5.6.3IEC 62053-21 (1st Edition):2016, Clause. 8.2IEC 62053-22 (1st Edition):2016, Clause. 8.2IEC 62053-23 (1st Edition):2016, Clause. 8.2 IS 15884:2010 ; Cl. 4.6.3IEC 62055-31 (1st Edition):2005-09 Clause. 8 IS16444:2015 Cl.6.12
Test of Repeatability of error As per Standard:IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5, Clause. 12.17IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.16CBIP 325:2015, Clause. 5.6.9
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 62 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS 15884:2010 ; Cl. 5.6.7IEC 62055-31 (1st Edition): 2005-09 Clause. 8
Influence Quantities As per Standard: Voltage Variation IS 13779:1999 (RA 2014), with Amd.
1,2,3 4, 5 Clause. 12.11, (Table 17)
Frequency Variation IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.10
Waveform 10 % of third harmonic CBIP 325:2015, Clause. 5.6.2Reverse Phase Sequence IEC 62053-21 (1st Edition):2016,
Clause. 8.2Voltage unbalanceDC component in ac current circuit
IEC 62053-22 (1st Edition):2016, Clause. 8.2
Continuous magnetic induction of external origin Magnetic induction of external orign-0.5 mT
IEC 62053-23 (1st Edition): 2016, Clause. 8.2
Influence Quantities As per Standard:IS 14697:1999, Clause. 12.10 (Table 13)
Auxiliary Voltage IS 15884:2010 ; Cl. 4.6.2(Table 12)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 63 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS16444:2015 Cl.6.12Phase of Auxiliary Supply voltage by 120 °Test of Electrical Requirement Test of Power Consumption As per Standard:
IS 13779:1999, with Amd. 1,2,3 4, 5 Clause. 12.7.1IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.7.1CBIP 325:2015,Clause.5.4.1IEC 62053-21 (1st Edition): 2016Clause. 7.1IEC 62053-22 (1st Edition): 2016, Clause. 7.1IEC 62053-23 (1st Edition): 2016Clause. 7.1 IS 15884:2010 ; Cl. 5.4.1IS16444:2015 Cl.6.10.1IEC 62055-31 (1st Edition): 2005-09 Clause. 7.3
Test of Influence of Supply voltage
As per Standard:
IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 64 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Clause. 12.7.2IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.7.2CBIP 325:2015, Clause. 5.4.2IEC 62052-11:2003+A1: 2016, Clause. 7.1.2IEC 62053-21, (1st Edition):2016,Clause. 8.2IEC 62053-22 (1st Edition):2016, Clause. 8.2IEC 62053-23 (1st Edition):2016Clause. 8.2IS 15884:2010Cl. 4.4.2 & 5.4.2IS16444:2015 Cl.6.10.2IEC 62055-31 (1st Edition): 2005-09 Clause. 7.2.2
Test of Influence Short time Over currents
As per Standard:
IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Clause. 12.7.3IS 14697:1999 (RA 2014),
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 65 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
With amd 1.2.3 & 4Clause. 12.7.3CBIP 325:2015, Clause. 5.4.3IEC 62053-21 (1st Edition): 2016, Clause. 7.2IEC 62053-22 (1st Edition): 2016, Clause. 7.2IEC 62053-23 (1st Edition): 2016, Clause. 7.2IS 15884:2010Cl. 5.4.3 and 4.4.3IS16444:2015 Cl.6.10.3IEC 62055-31 (1st Edition):2005-09 Clause. 7.4
Test of Influence of Self Heating As per Standard:IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Clause. 12.7.4IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.7.4CBIP 325:2015, Clause. 5.4.4IEC 62053-21 (1st Edition):2016, Clause. 7.3
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 66 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 62053-22 (1st Edition):2016, Clause. 7.3IEC 62053-23 (1st Edition):2016, Clause. 7.3IS 15884:2010 Cl. 5.4.4IS16444:2015 Cl.6.10.4IEC 62055-31 (1st Edition):2005-09 Clause. 7.6
Test of Influence of Heating As per Standard:IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Clause. 12.7.5IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.7.5CBIP 325:2015, Clause. 5.4.5IEC 62052-11:2003+ A1:2016 2, Clause. 7.2IS 15884:2010Cl. 5.4.5IS16444:2015 Cl.6.10.5IEC 62055-31 (1st Edition): 2005-09 Clause. 7.5
Test of Immunity to earth fault As per Standard:
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 67 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS 13779:1999 (RA 2002) with Amd. 1, 2, 3 & 4, Clause. 12.8IEC 62052-11:2003+ A1:2016, Clause. 7.4IS 15884:2010 ; Cl. 4.4.2.6IS16444:2015 Cl.6.10.7IEC 62055-31 (1st Edition):2005-09 Clause. 7.2.3
Test for Climatic Influence Dry Heat test As per Standard:
IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5/Clause. 12.6.1IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.6.1CBIP 325:2015, Clause. 5.3.1IEC 62052-11:2003+ A1:2016, Clause. 6.3.1IS 15884:2010/Cl. 5.3.1IS16444:2015 Cl.6.9
Cold test As per Standard:IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Clause. 12.6.2IS 14697:1999 (RA 2014),
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 68 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
With amd 1.2.3 & 4Clause. 12.6.2 CBIP 325:2015 Clause. 5.3.2IEC 62052-11:2003+ A1:2016, Clause. 6.3.2IS 15884:2010Cl. 5.3.2IS16444:2015 Cl.6.9
Damp Heat Cyclic test As per Standard:IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Clause. 12.6.3IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.6.3CBIP 325:2015, Clause. 5.3.3IEC 62052-11:2003+ A1:2016, Clause. 6.3.3IS 15884:2010Cl. 5.3.3IS16444:2015 Cl.6.9IEC 62055-31 (1st Edition): 2005-09 Clause. 7.2.2
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 69 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Test for Mechanical Requirement Spring Hammer test As per Standard:
IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Clause. 12.3.3IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.3.3CBIP 325:2015, Clause. 5.2.1IEC 62052-11:2003+ A1:2016, Clause. 5.2.2.1IS 15884:2010Cl. 5.2.1IS16444:2015 Cl.6.5
Vibration Test IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Cl. 12.3.2IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Cl. 12.3.2 IEC 62052-11:2003+A1:2016, Cl. 5.2.2.3IS 15884:2010Cl. 5.2.3IS 16444:2017 Cl. 6.5
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 70 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Shock Test IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Cl. 12.3.1IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Cl. 12.3.1CBIP Report 304Cl. 5.2.2IEC 62052-11:2003+A1:2016, Cl. 5.2.2.2IS 15884:2010 Cl. 5.2.2IS 16444:2017 CI.6.5
Protection against penetration of dust and water
As per Standard:
IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5/Clause. 12.5IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.5 CBIP 325:2015, Clause. 5.2.5IEC 62052-11:2003+A1:2016, Clause. 5.9.IS 15884:2010Cl. 5.2.5IS16444:2015 Cl.6.5
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 71 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 62055-31 (1st Edition):2005-09 Clause. 5.10
Test of Resistance of Heat and fire
As per Standard:
IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5, Clause. 12.4, 6.8IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 12.4 CBIP 325:2015, Clause. 5.2.4IEC 62052-11:2003+A1:2016, Clause. 5.8IS 15884:2010Cl. 5.2.4IS16444:2015 Cl.6.5IEC 62055-31 (1st Edition):2005-09 Clause. 5.9
Heat Deflection Test As per Standard:IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5/Clause. 6.4IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 6.4 CBIP 325:2015, Clause. 4.2.2.3
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 72 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 62052-11:2003+ A1:2016, Clause. 5.4 IS 15884:2010 Cl. 4.2.4
Clearances and Creepage distances
As per Standard:
IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5 Clause. No.:6.6 IS 14697:1999 (RA 2014), With amd 1.2.3 & 4Clause. 6.6 CBIP 325:2015, Clause. 4.2.2.5IEC 62052-11:2003+ A1:2016, Clause. 5.6IS 15884:2010Cl. 4.2.6IS16444:2015 Cl.6.3IEC 62055-31 (1st Edition): 2005-09 Clause. 5.7
General and Construction requirements
As per Standard:IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5/Clause. 6.0IS 14697:1999 (RA 2014), With amd 1.2.3 & 4/Clause. 6.0
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 73 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
CBIP 325:2015, Clause. 4.2IEC 62052-11:2003+A1:2016, Clause. 5.0
Marking of Meters As per Standard:IS 13779:1999 (RA 2014), with Amd. 1,2,3 4, 5/Clause. 7.0IS 14697:1999 (RA 2014), With amd 1.2.3 & 4/Clause. 7.0CBIP 325:2015, Clause. 4.2.2.11IEC 62052-11:2003+A1:2016, Clause. 5.12 IS 15884:2010/Cl. 4.2.11IS16444:2015 Cl.6.8IEC 62055-31 (1st Edition): 2005-09 Clause. 5.13
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 74 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
ELECTRICAL TESTING
LOCATION 2
I. CELLS & BATTERIES
1. Secondary Nickel System Cells & Batteries
Insulation and wiring IS 16046 (Part 1) : 2018 / IEC 62133-1 : 2017, Clause 5.2
Charging procedure - Discharging IS 16046 (Part 1) : 2018 / IEC 62133-1 : 2017, Clause 7.1
Continuous Low-rate charging IS 16046 (Part 1) : 2018 / IEC 62133-1 : 2017, Clause 7.2, 7.2.1
Vibration IS 16046 (Part 1) : 2018 / IEC 62133-1 : 2017, Clause 7.2, 7.2.2
Case stress at high ambient temperature (Batteries)
IS 16046 (Part 1) : 2018 / IEC 62133-1 : 2017 (Clause 7.2, 7.2.3)
Temperature cycling IS 16046 (Part 1) : 2018 / IEC 62133-1 : 2017 (Clause 7.2, 7.2.4)
External short circuit IS 16046 (Part 1) : 2018 / IEC 62133-1 : 2017 (Clause 7.3, 7.3.2)
Free fall IS 16046 (Part 1) : 2018 / IEC 62133-1 : 2017 (Clause 7.3, 7.3.3)
Mechanical shock (Crash hazard) IS 16046 (Part 1) : 2018 / IEC 62133-
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 75 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
1 : 2017 (Clause 7.3, 7.3.4)Overcharge IS 16046 (Part 1) : 2018 / IEC 62133-1
: 2017 (Clause 7.3, 7.3.8)Crushing of cells IS 16046 (Part 1) : 2018 / IEC 62133-1
: 2017 (Clause 7.3, 7.3.6)Incorrect installation IS 16046 (Part 1) : 2018 / IEC 62133-1
: 2017 (Clause 7.3, 7.3.1)Thermal abuse (Cells) IS 16046 (Part 1) : 2018 / IEC 62133-1
: 2017 (Clause 7.3, 7.3.5)Low pressure(cells) IS 16046 (Part 1) : 2018 / IEC 62133-1
: 2017 (Clause 7.3, 7.3.7)Forced discharge(Cell) IS 16046 (Part 1) : 2018 / IEC 62133-1
: 2017 (Clause 7.3, 7.3.9)2. Secondary Lithium
System Cells & Batteries
Insulation and wiring IS 16046 (Part 2) : 2018 / IEC 62133-2 : 2017 (Clause 5.2)
Charging procedure - Discharging IS 16046 (Part 2) : 2018 / IEC 62133-2 : 2017 (Clause 7.1)
Charging Procedures for test purposes- Second Procedure
IS 16046 (Part2) : 2018 / IEC 62133-2 : 2017 (Clause 7.1.2)
Continuous charge IS 16046 (Part2) : 2018 / IEC 62133-2 : 2017 (Clause 7.2.1)
Vibration IS 16046 (Part2) : 2018 / IEC 62133-2 : 2017 (Clause 7.3, 7.3.8, 7.3.8.1)
Case stress at high ambient IS 16046 (Part 2) : 2018 / IEC 62133-2
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 76 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
temperature (Batteries) : 2017 (Clause 7.2.2)
External short circuit IS 16046 (Part 2) : 2018 / IEC 62133-2 :2017 (Clause 7.3, 7.3.1)
External short circuit IS 16046 (Part 2) : 2018 / IEC 62133-2 :2017 (Clause 7.3, 7.3.2)
Free fall IS 16046 (Part 2) : 2018 / IEC 62133-2 :2017 (Clause 7.3, 7.3.3)
Mechanical shock (Crash hazard) IS 16046 (Part 2) : 2018 / IEC 62133-2 : 2017 (Clause 7.3, 7.3.8, 7.3.8.2)
Overcharge IS 16046 (Part 2) : 2018 / IEC 62133-2 :2017 (Clause 7.3, 7.3.6)
Crushing of cells IS 16046 (Part 2) : 2018 / IEC 62133-2 :2017 (Clause 7.3, 7.3.5)
Thermal abuse (Cells) IS 16046 (Part 2) : 2018 / IEC 62133-2 :2017 (Clause 7.3, 7.3.4)
Forced discharge (Cell) IS 16046 (Part 2) : 2018 / IEC 62133-2 :2017 (Clause 7.3, 7.3.7)
Measurement of Internal AC Resistance of Coin Cells
IS 16046 (Part 2) : 2018 / IEC 62133-2 :2017, (Annexure D,D2)
3. Lithium Ion Cells & Batteries, Ni-MH Cells & Batteries
Crush Test IS 16046 : 2015, Rev 1, (Clause 7.3.6, 8.3.5)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 77 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
ELECTRONICS TESTING
LOCATION 1
I. ENVIRONMENTAL TEST FACILITY
1. Environmental Testing of Electronics & Electrical Items
Drop Test QM333 Issue. 2:1998Toppling Test QM333 Issue. 2:1998Fall Test QM333 Issue. 2:1998Cold Test EN/IEC 60068-2-1:2007
IEC 61850-3, Edition 2, 2013-12QM333 Issue. 2:1998
Dry Heat EN/IEC 60068-2-2:2007IEC 61850-3, Edition 2, 2013-12QM333 Issue. 2:1998
Salt Mist Test IEC 60068-2-11, (3rd Edition):1981QM333 Issue. 2:1998
Change of Temperature(Test Na) (2 chamber method)
IEC 60068-2-14 (6th Edition):2009IEC 61850-3, Edition 2, 2013-12QM333 Issue. 2:1998
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 78 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Damp heat, cyclic(Test Db)
IEC 60068-2-30,(3rd Edition):2005-08IEC 61850-3, Edition 2, 2013-12
Test Kb (sodium chloride solution)Dust-IP 1 x to IP 6 x IEC 60529:2013-08,
(Edition 2.2) 1+Corr. 3IEC 61850-3, Edition 2, 2013-12
Degrees of Protection):provided by enclosures
IEC 60068-2-78 (2nd Edition):2012-10
Damp Heat, steady state IEC 61850-3, Edition 2, 2013-122. PV Solar Module Vibration Test QM 3.3: 2010, Issue –Mar 2010, Test
No. 6 (Cl. 3.6.1 to 3.6.7)
II. INFORMATION TECHNOLOGY EQUIPMENT
1. Power adaptors, Mobile Phone, Cash Register, Point of Sale Terminal, Copying Machine, Franking Machine, Passport reader, Computer Systems, Printers Scanners, iris scanner, Optical finger
Input Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 1.6.2)
Thermal requirement IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 4.5.1)
Overload of operator accessible Parts
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 5.3.7)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 79 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
print scanner,USB driven Barcode readers, barcode scanners,Smart watches CCTV Cameras/Equipment for CCTV Cameras. Keyboards, & Automatic Data Processing Machine, Set top Box.
Humidity conditioning IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 2.9.1)
Electric strength Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 5.2.2)
Touch current Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 5.1)
Abnormal operation Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 5.3.1)
Capacitance discharge Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 2.1.1.7)
Limited power source measurement Test
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 2.5)
Working voltage determination IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 2.10.2)
Protective bonding Test II IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 2.6.3.4)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 80 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Limited current circuit measurements
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 2.4.1)
Limitation of touch current to a telecommunication and cable distribution system
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 5.1.8.1)
Requirement of separation between telecommunication network from earth
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 6.1.2)
Steady force Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 4.2.1)
Impact Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 4.2.5)
Strain relief Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 3.2.6)
Cord guard Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 3.2.8)
Hazardous moving Parts Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 4.4.2)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 81 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Stability Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 4.1)
Durability of marking Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 1.7.11)
Stress relief Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 4.2.7)
Drop Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 4.2.6)
2. Mobile Phones Language Input test & Verification IS 16333 (Part 3):2017, Cl 5
3. Automatic Data Processing Machine, Laptop/Notebook/Tablet, Printers, Plotters, Scanners, Set Top Box, Telephone Answering Machines, Visual Display Units, Videos Monitors, Wireless Keyboards, Cash
Direct plug in equipment IS 13252 (Part 1): 2010 +Amd. 1: 2013 +Amd. 2: 2015, (Clause 4.3.6)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 82 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Registers, Copying Machines/Duplicators, Passport Reader, Point Of Sale Terminals, Mail Processing Machines/Postage Machines/Franking Machines, Power Banks For Use In Portable Applications, Smart Card Reader, Mobile Phones, Power Adaptors, CCTV Cameras/ CCTV Recorders, USB Driven Barcode Reader, Barcode Scanners/Iris Scanners/ Optical Fingerprint Scanners, Smart Watches, Computer Systems
III. AUDIO/ VIDEO COMPONENTS AND PRODUCTS
1. Power adaptor, Humidity treatment EN/IEC 60065:2014,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 83 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Televisions, Optical Disc Players, Amplifier, Electronic Musical System
Clause. 10.2 IS 616:2017-Rev 5, Clause. 10.2
IV. MEASURING INSTRUMENTS
1. Electronic Equipment-Digital millimeter, digitalpower meter, clamp meter, digital ammeter,Digital voltmeter, Digital panel power meter.
Protective impedance Test UL 61010-1 (2nd Edition)2005-07-22.CAN/CSA C22.2 No. 61010-1,(2nd Edition):004-07,IEC 61010-1:2010, (3rd Edition)(Clause. 4.4.2.2)IEC 61010-2-030:2010, (1st Edition).(Clause. 101.3.3)
Input Test UL 61010-1 (2nd Edition):2005-07-22.CAN/CSA C22.2 No. 61010-1,(2nd Edition):004-07,IEC 61010-1:2010, (3rd Edition)(Clause. 5.1.3)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 84 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Temperature Test UL 61010-1 (2nd Edition):2005-07-22.CAN/CSA-C22.2 No. 61010-1,(2nd Edition):004-07,IEC 61010-1:2010 (3rd Edition)(Clause. 10.1-10.4)
Humidity conditioning UL 61010-1 (2nd Edition):2005-07-22.CAN/CSA-C22.2 No. 61010-1,(2nd Edition):004-07,IEC 61010-1:2010, (3rd Edition)(Clause. 6.8.2)
Dielectric voltage withstand Test UL 61010-1 (2nd Edition):2005-07-22.CAN/CSA-C22.2 No. 61010-1,(2nd Edition):004-07,IEC 61010-1:2010, (3rd Edition)(Clause. 6.8)
Permissible limits Test UL 61010-1 (2nd Edition):2005-07-22.
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 85 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
CAN/CSA-C22.2 No. 61010-1,(2nd Edition):004-07,IEC 61010-1:2010, (3rd Edition)(Clause. 6.3)
Transformer overload Test UL 61010-1 (2nd Edition):2005-07-22.CAN/CSA-C22.2 No. 61010-1,(2nd Edition):004-07,IEC 61010-1:2010, (3rd Edition)(Clause. 4.4.2.7.3)
Transformer short circuit Test UL 61010-1 (2nd Edition):2005-07-22.CAN/CSA-C22.2 No. 61010-1,(2nd Edition):004-07,IEC 61010-1:2010, (3rd Edition)(Clause. 4.4.2.7.2)
Insulation between circuits UL 61010-1 (2nd Edition):2005-07-22.CAN/CSA-C22.2 No. 61010-1,(2nd Edition):004-07,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 86 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 61010-1:2010, (3rd Edition)(Clause. 4.4.2.12)
Output abnormal Test UL 61010-1 (2nd Edition):2005-07-22.CAN/CSA-C22.2 No. 61010-1,(2nd Edition):004-07,IEC 61010-1:2010, (3rd Edition)(Clause. 4.4.2.8)
Applied force Test UL 61010-1 (2nd Edition):005-07-22.CAN/CSA-C22.2 No. 61010-1,(2nd Edition):004-07IEC 61010-1:2010, (3rd Edition)(Clause. 6.2.2)
Ball pressure Test UL 61010-1 (2nd Edition):005-07-22.CAN/CSA-C22.2 No. 61010-1,(2nd Edition):004-07IEC 61010-1:2010, (3rd Edition)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 87 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Clause. 10.5.3)Static rigidity Test UL 61010-1 (2nd Edition):
005-07-22.CAN/CSA-C22.2 No. 61010-1,(2nd Edition):004-07IEC 61010-1:2010, (3rd Edition)(Clause. 8.2.1)
Strength of Handle Test UL 61010-1 (2nd Edition):2005-07-22.CAN/CSA-C22.2 No. 61010-1(2nd Edition):004-07IEC 61010-1:2010(3rd Edition)(Clause. 7.5)
Mechanical abuse Test UL 61010-1 (2nd Edition):2005-07-22.CAN/CSA-C22.2 No. 61010-1,(2nd Edition):004-07,IEC 61010-1:2010, (3rd Edition)(Clause. 10.5.2)
Current measuring circuit Test IEC 61010-2-030:2010,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 88 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Edition 1.0) (Clause. 14.101)Durability of Marking IEC61010-1,2010, 3rd Edition
(Clause 5.3)Stability Test IEC61010-1,2010, 3rd Edition
(Clause 7.4)Wall Mounting Test IEC61010-1,2010, 3rd Edition
(Clause 7.6)Impact Test IEC61010-1,2010, 3rd Edition
(Clause 8.2.2)Drop Test IEC61010-1,2010, 3rd Edition (Clause
8.3.1,8.3.2)Limited Energy Circuit Determination Test
IEC61010-1,2010, 3rd Edition (Clause 9.4)
Resistance To Heat Of Non-metallic Enclosure Test
Resistance to Heat of Nonmetallic Enclosure Test (Clause 10.5.2)
2. Electrical & Electronics Products (IFM modules, Storages, servers), Cabinets, Racks, Sub racks, Chassis. Printed Circuit Boards. Aerospace Products (Signal
Sine and random vibration Test, Qualitative
IEC 60068-2-6:2007IEC 60068-2-64:2008IEC 60065:2014IEC 62133:2002MIL-STD-810G:2008(Method 514.6C-I)MIL STD 883E:1997 Method 2007.2, 2002 & 2026 MIL STD
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 89 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Trackers,Navigation Sensors,Voice Receivers, Timers) Consumer Products (Amplifier, Mosfet Transistors, Luminaires) Railway Mounted and Railway Transporting Products (AC and Exhaust Fan)
202G:2002 Method 201A (2.4.1-Part 1)IEC 61373:2010
3. Batteries and Cells Sine vibration UN38.3 (Edition 6):2015 (38.3.4.3) 4. Phones, Laptops, Power
BanksPower adaptors, inverters, Energy meters.Signal control receivers Motors, TV’s, laptops, Mobile phones. Aerospace products (signal trackers,Navigation sensors, voice receivers, Timers) Railway mounted and railway
Shock Electro dynamic shaker-Half sine
IEC 60068-2-27:2008MIL-STD-810G:2008, Method 514.6MIL STD 202G:2002 Method 201AIEC 61373:2010Trapezoidal
Final peak saw tooth, Initial saw tooth.
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 90 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
transportingProducts (AC and exhaust fan)
5. PCB mounted Electrical & electronics Products(Energy meters,Control receivers Mobile phones, Battery chargers)Batteries and Cells Spares & Assemblies mounted in Defense/ Military/ Aerospace (signal trackers, Navigation sensors, voice receivers, Timers) Railway mounted and railway transportingProducts
Mechanical Shock Machine-Half sine Trapezoidal, saw tooth
IEC 60068-2-27:2008UN38.3(Edition 6):2015MIL-STD-810G:2008, Method 516.6MIL STD 883E:1997 Method 2002.3MIL STD 202G:2002 Method 213 BIEC 61373:2010
6. Batteries & Cells,Spares and assemblies in aircraft (signal trackers, Navigation sensors, voice
Altitude Test IEC 60068-2-13-1994IEC 60721-1:2002 (1.3)IEC 62133:2002
Combined cold/low air pressure Tests-
IEC 60068-2-40-1983MIL-STD-810G:2008
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 91 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
receivers, Timers). Helicopters and manned aerospace vehicles (Amplifier Mosfet Transistors, Luminaires)
Method 500.5-1MIL-STD-810G:2008 Method 520.3
V. MISCELLANEOUS PRODUCTS: PHOTOVOLTAIC EQUIPMENT
1. Thin-film terrestrial photovoltaic (PV) modules-Design qualification and type approval
Visual inspection IEC 61646 (2nd Edition):2008-05, Clause. 10.1IS 16077:2013 Clause 10.1
Maximum power determination IEC 61646 (2nd Edition):2008-05. Clause. 10.2IEC 60904-9, IEC 60904-6, IEC 60904-1, IEC 60891IS 16077:2013, Clause 10.2
Insulation Test IEC 61646 (2nd Edition):2008-05. Clause. 10.3IS 16077:2013, Clause 10.2
Wet leakage current Test IEC 61646 (2nd Edition):2008-05. Clause. 10.15IS 16077:2013, Clause 10.15
Measurement of temperature coefficients
IEC 61646 (2nd Edition):2008-05. Clause. 10.4
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 92 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 60904-10, IEC 60904-9, IEC 60904-1.IS 16077:2013, Clause 10.4
Measurement of nominal operating cell temperature (NOCT)
IEC 61646 (2nd Edition):2008-05. Clause. 10.5IS 16077:2013, Clause 10.5
Performance at STC and NOCT IEC 61646 (2ndEdition):2008-05. Clause. 10.6IEC 60904-9, IEC 60904-1.IS 16077:2013, Clause 10.6
Performance at low irradiance IEC 61646 (2nd Edition):2008-05. Clause. 10.7IEC 60904-9, IEC 60904-1IS 16077:2013, Clause 10.7
Outdoor exposure Test IEC 61646 (2nd Edition):2008-05. Clause. 10.8IEC 60721-2-1.IS 16077:2013, Clause 10.8
Hot-spot endurance Test IEC 61646 (2nd Edition):2008-05. Clause. 10.9IEC 60904-9, IEC 60904-1.IS 16077:2013, Clause 10.9
UV preconditioning Test IEC 61646 (2nd Edition):
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 93 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
2008-05. Clause. 10.10IS 16077:2013, Clause 10.10
Thermal cycling Test IEC 61646 (2nd Edition):2008-05. Clause. 10.11IS 16077:2013, Clause 10.11
Humidity-freeze Test IEC 61646 (2nd Edition):2008-05. Clause. 10.12IS 16077:2013, Clause 10.12
Damp heat Test IEC 61646 (2nd Edition):2008-05. Clause. 10.13IS 16077:2013, Clause 10.13
Robustness of terminations Test IEC 61646 (2nd Edition):2008-05. Clause. 10.14IS 16077:2013,Clause 10.14
Mechanical load Test IEC 61646 (2nd Edition):2008-05. Clause. 10.16IS 16077:2013, Clause 10.16
Hail Test IEC 61646 (2nd Edition):2008-05. Clause. 10.17IS 16077:2013, Clause 10.17
Bypass diode thermal Test IEC 61646 (2nd Edition):2008-05. Clause. 10.18IS 16077:2013, Clause 10.18
Light Soaking IEC 61646 (2nd Edition):
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 94 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
2008-05. Clause. 10.19IS 16077:2013, Clause 10.19
2. Crystalline silicon terrestrial photovoltaic (PV) modules-Design qualification and type approval
Preconditioning IEC 61215 (2nd Edition):2005-04 IS 14286:2010
Visual inspection IEC 61215 (2nd Edition):2005-04 (Clause. 10.1)IS 14286:2010 (Clause. 10.1)IEC-2 (1st Edition) 2004-10, MST01IS/IEC 61730-2:2004 (MST01)(Clause. 10.1)/EN 61730-2
Maximum power determination / Voltage, current and power measurements Test
IEC 61215 (2nd Edition):2005-04 (Clause. 10.2) (Clause. 10.2)UL 1703 (3rd Edition):2002-15 (Clause. 20)IS 14286:2010, (Clause. 10.2) (Clause. 10.2)
Insulation Test IEC 61215 (2nd Edition):2005-04 (Clause. 10.3)IS 14286:2010 (Clause. 10.3)
Dielectric withstand test IEC 61730-2 (1st edition):2004-10, MST 16IS/IEC 61730-2:2004, MST 16 EN 61730-2
Wet leakage current Test IEC 61215 (2nd Edition): 2005-04 (Clause. 10.15)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 95 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 61730-2 (1st Edition):2004-10, (MST 17)IS 14286:2010, Clause 10.15IS/IEC 61730-2:2004, MST 17 EN 61730-2
Measurement of temperature coefficients
IEC 61215 (2nd Edition):2005-04 (Clause. 10.4)IS 14286:2010(Clause. 10.4)
Measurement of nominal operating cell temperature (NOCT)
IEC 61215 (2nd Edition):2005-04 (Clause. 10.5)IS 14286:2010, Clause 10.5
Performance at STC and NOCT IEC 61215 (2nd Edition):2005-04 (Clause. 10.6)IS 14286:2010,(Clause. 10.6)
Performance at low irradiance IEC 61215 (2nd Edition):2005-04 (Clause. 10.7)IS 14286:2010(Clause. 10.7)
Outdoor exposure Test IEC 61215 (2nd Edition):2005-04, (Clause. 10.8)IS 14286:2010,(Clause. 10.8)
Hot-spot endurance Test IEC 61215 (2nd Edition):2005-04,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 96 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Clause. 10.9)IS 14286:2010, (Clause. 10.9)IEC 61730-2 (1st Edition) + (Amendment 1:2011-11, MST 22IS/IEC 61730-2:2004, MST 22 EN 61730-2
Thermal cycling Test IEC 61215 (2nd Edition):2005-04, (Clause. 10.11) IEC 61730-2 (1st Edition):2004-10, MST 51a, MST 51bIS 14286:2010, (Clause. 10.11)UL 1703 (3rd Edition):2002-03 (Clause. 35)IS/IEC 61730-2:2004, MST 51a, MST 51bEN 61730-2
Humidity-freeze Test IEC 61215 (2nd Edition):2005-04, (Clause. 10.12)IS 14286:2010, (Clause. 10.12)IEC 61730-2 (1st Edition):2004-10, MST 52IS/IEC 61730-2:2004, MST 52/UL 1703 (3rd Edition): 2002-03 (Clause. 36) EN 61730-2
Damp heat Test IEC 61215 (2nd Edition):2005-04 (Clause. 10.13) IEC 61730-2 (1st
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 97 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Edition):2004-10 MST 53IS 14286:2010, (Clause. 10.13)IS/IEC 61730-2:2004, MST 53 EN 61730-2
UV preconditioning Test IEC 61215 (2nd Edition):2005-04 (Clause. 10.10) IEC 61730-2 (1st Edition):2004-10, MST 54IS 14286:2010, (Clause. 10.10)IS/IEC 61730-2:2004, MST 54 EN 61730-2
Bypass diode thermal Test IEC 61215 (2nd Edition): 2005-04, (Clause. 10.18)IS 14286:2010, (Clause. 10.18) IEC 61730-2 (1st Edition):2004-10, MST 25IS/IEC 61730-2:2004, MST 25 EN 61730-2
Partial discharge Test IEC 61730-2 (1st Edition):2004-10, Clause. 11.1 MST 15IS/IEC 61730-2:2014, MST 15 EN 61730-2
Impulse voltage Test IEC 61730-2 (1st Edition):2004-10, (MST 14)IS/IEC 61730-2:2004, MST 14 EN 61730-2
Accessibility Test IEC 61730-2 (1st Edition):2004-10,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 98 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Clause. 10.2 MST 11)IS/IEC 61730-2:2004, MST 11 EN 61730-2
Cut susceptibility Test IEC 61730-2 (1st Edition):2004-10, (Clause. 10.3 MST 12), Amendment 1:2011-11IS/IEC 61730-2:2004 MST 12 EN 61730-2
Temperature Test IEC 61730 (1st Edition):2004-10, (Clause. 10.7 MST 21)IS/IEC 61730-2:2004 MST 21UL 1703 (3rd Edition):2002-03 (Clause. 19)EN 61730-2
Leakage Current Test UL 1703 (3rd Edition):2002-03 (Clause. 21)
Cut Test UL 1703 (3rd Edition):2002-03 (Clause. 24)
Bonding Path resistance Test / Ground continuity Test
IEC 61730-2 (1st Edition):2011-11, (Clause. 10.4) MST 13IS/IEC 61730-2:2004 MST13UL 1703 (3rd Edition):2002-03 (Clause. 25)EN 61730-2
Dielectric Withstand Test UL 1703 (3rd Edition):2002-03
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 99 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Clause. 26)IEC 61730-2 (1st Edition):2011-11, (Clause. 10.6) MST 16IS/IEC 61730-2:2004EN 61730-2
Wet Insulation-Resistance Test UL 1703 (3rd Edition):2002-03 (Clause. 27)
Reverse Current Overload Test UL 1703 (3rd Edition):2002-03 (Clause. 28)IEC 61730 (Edition 1.1):2011-11, (Clause. 10.9) MST 26IS/IEC 61730-2:2004, MST 26 EN 61730-2
Hot-Spot Endurance Test UL 1703 (3rd Edition):2002-03 (Clause. 39)
Mechanical load Test IEC 61215 (2nd Edition):2005-04, (Clause. 10.16) IEC 61730-2 (1st Edition):2004-10, (Clause. 10.16) MST 34IS 14286:2010, (Clause. 10.16)IS/IEC 61730-2:2004, MST 34 EN 61730-2
Hail Test IEC 61215 (2nd Edition):2005-04, (Clause. 10.17)IS 14286:2010, (Clause. 10.17)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 100 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Clause. 21)Module breakage Test IEC 61730-2 (1st Edition):2004-10,
MST 32IS/IEC 61730-2:2004 MST 32 (Clause. MST 32)EN 61730-2
Strain Relief Test UL 1703 (3rd Edition):2002-03 (Clause. 22)
Push Test UL 1703 (3rd Edition):2002-03 (Clause. 23)
Terminal Torque Test UL 1703 (3rd Edition):2002-03 (Clause. 29)
Impact Test UL 1703 (3rd Edition):2002-03 (Clause. 30)
Water Spray Test UL 1703 (3rd Edition):2002-03 (Clause. 33)
Robustness of terminations Test IEC 61215 (2nd Edition):2005-04. Clause. 10.14IS 14286:2010, Clause 10.14 IEC 61730-2, (1st edition), MST 42 IS/IEC 61730-2, (1st edition), MST 42/EN 61730-2
3. Solar Photovoltaic modules, power
Salt Mist Test IEC 61701 (1st Edition): 1995-03 (Clause. 4)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 101 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
conversion units and equipment which are intended for Corrosive environment
IEC 61701 (2nd Edition):2011-12IEC 60068-2-52 (2nd Edition):1996IEC 60068-2-11 (3rd Edition):1981 (Clause. 4)
4. Photovoltaic Systems-Power Conditioners-Procedure for measuring Efficiency (Stand Alone Inverter & Grid Tie Inverter)
Efficiency IEC 61683 (1st edition):1999-11IS/IEC 61683:1999
5. Utility-Interconnected Photovoltaic Inverters-Test Procedure of Islanding Prevention Measures (Grid Tie Inverter)
Test procedure to evaluate the Performance of Islanding Prevention Measures used with Utility-Interconnected PV systems / Un-intentional Islanding Test
IEC 62116 (Edition 2.0): 2014IEEE 1547.1:2005, Clause. 5.7IS 16169:2014
6. Test Procedure for Equipment Interconnecting Distributed Resources with Electric Power Systems
Temperature stability IEEE 1547.1:2005, Sec 5.1Over/Under Voltage Test for Response to Abnormal Voltage Conditions
IEC 61727 (2ndEdition): 2004, Clause:-5.2 IEEE 1547.1:2005, Sec 5.2
Over/Under frequency Response to abnormal frequency conditions
IEC 61727 (2nd Edition):2004, Clause. 5.2IEEE 1547:2005 Sec 5.3
Synchronization IEEE 1547.1:2005 Sec 5.4
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 102 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Limitation of dc Injection for Inverters without Interconnection transformers/dc Injection
IEEE 1547.1:2005, Sec 5.6, IEC 61727 (2nd Edition): 2004Clause. 4.4
Reconnect following abnormal condition disconnect or Response to Utility Recovery
IEEE 1547.1:2005, Clause. 5.10 IEC 61727 (2nd Edition):2004, Clause. 5.4
Harmonics &Waveform Distortion IEC 61727 (2nd Edition):2004-12, Clause:4.6IEEE 1547.1-2005, Sec 5.11
Flicker IEC 61727 (2nd Edition):2004, Clause:4.3 IEEE 1547.1:2005, Sec 5.12
Dielectric Test for Paralleling device
IEEE 1547.1:2005, Sec 5.5.3
7. Balance-of-Systems Components for Photovoltaic Systems-Design Qualification Natural Environments (Solar Photovoltaic Charge Controller)
Visual Inspection As per MNRE Guidelines for Solar Charge Controller Testing with reference to clauses from IEC 62093:2005, (Clause. 11)IS 16229:2015
Functioning TestsVoltage Drop TestInsulation TestProtection Against Mechanical Impact(IK-code)Determination of End of Charge VoltagesDetermination of Low Charge disconnect and Reconnect
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 103 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
VoltagesTemperature Compensation for Thresholds
8. Photovoltaic (PV) module safety qualification-Part-1:Requirements for construction
Polymeric materials IEC 61730-1 Edition 1.2 2013-03 (Clause 5)IS/IEC 61730-1: 2004 (Clause 5) EN 61730-1
UV Resistance test IEC 61730-1 Edition 1.2 2013-03 (Clause 5)IS/IEC 61730-1:2004 (Clause 5) EN 61730-1
Temperature test IEC 61730-1 Edition 1.2 2013-03 (Clause 5)IS/IEC 61730-1:2004 (Clause 5) EN 61730-1
Partial Discharge test IEC 61730-1 Edition 1.2 2013-03 (Clause 5)IS/IEC 61730-1:2004 (Clause 5) EN 61730-1
Internal Wiring and current carrying parts
IEC 61730-1 Edition 1.2 2013-03 (Clause 6)IS/IEC 61730-1:2004 (Clause 6) EN 61730-1
Connections Accessibility test IEC 61730-1 Edition 1.2 2013-03
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 104 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Clause 7)IS/IEC 61730-1:2004 (Clause 7)
Bonding and grounding IEC 61730-1 Edition 1.2 2013-03 (Clause 8)IS/IEC 61730-1:2004 (Clause 8) EN 61730-1
Creepage and clearance distances
IEC 61730-1 Edition 1.2 2013-03 (Clause 9)IS/IEC 61730-1:2004 (Clause 9) EN 61730-1
Field wiring compartments with covers
IEC 61730-1 Edition 1.2 2013-03 (Clause 10)IS/IEC 61730-1:2004 (Clause 10) EN 61730-1
9. Power Converters for Use in Photovoltaic Power Systems
Thermal Testing IEC 62109-1 1st Edition, 2010-04, Clause 4.3.2.1IS 16221 (Part 1):2016, Clause 4.3.2.1
Touch temperaturesTemperature limits for mounting surfaces
IEC 62109-1 1st Edition, 2010-04, Clause 4.3.2.2IS 16221 (Part 1): 2016, Clause 4.3.2.2
Testing in single fault condition IEC 62109-1 1st Edition, 2010-04, Clause 4.4IS 16221 (Part 1): 2016, Clause 4.4
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 105 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Humidity preconditioning IEC 62109-1 1st Edition, 2010-04, Clause 4.5IS 16221 (Part 1): 2016, Clause 4.5
Back-feed voltage protection IEC 62109-1 1st Edition, 2010-04, Clause 4.6IS 16221 (Part 1): 2016, Clause 4.6
Electrical ratings tests IEC 62109-1 1st Edition, 2010-04, Clause 4.7IS 16221 (Part 1): 2016, Clause 4.7
Durability of markings IEC 62109-1 1st Edition, 2010-04, Clause 5.1.2IS 16221 (Part 1): 2016, Clause 5.1.2
Ingress protection IEC 62109-1 1st Edition, 2010-04, Clause 6.3IS 16221 (Part 1):2016, Clause 6.3
Working voltage and DVC IEC 62109-1 1st Edition, 2010-04, Clause 7.3.2.6IS 16221 (Part 1): 2016, Clause 7.3.2.6
Limitation of discharging energy through protective impedance
IEC 62109-1 1st Edition, 2010-04, Clause 7.3.5.3.2IS 16221 (Part 1):2016, Clause 7.3.5.3.2
Protection by means of limited IEC 62109-1 1st Edition, 2010-04,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 106 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
voltages Clause 7.3.5.4IS 16221 (Part 1):2016, Clause 7.3.5.4
Protection against indirect contact
IEC 62109-1 1st Edition, 2010-04, Clause 7.3.6IS 16221 (Part 1):2016, Clause 7.3.6
Insulation including clearance and creepage distances
IEC 62109-1 1st Edition, 2010-04, Clause 7.3.7IS 16221 (Part 1):2016, Clause 7.3.7
Residual Current Detection (RCD) or Monitoring (RCM) device compatibility
IEC 62109-1 1st Edition, 2010-04, Clause 7.3.8IS 16221 (Part 1):2016, Clause 7.3.8
Protection against shock hazard due to stored energy
IEC 62109-1 1st Edition, 2010-04, Clause 7.3.9IS 16221 (Part 1):2016, Clause 7.3.9
Protection against energy hazards IEC 62109-1 1st Edition, 2010-04, Clause 7.4IS 16221 (Part 1):2016, Clause 7.4
Electrical tests related to shock hazard
IEC 62109-1 1st Edition, 2010-04, Clause 7.5IS 16221 (Part 1):2016, Clause 7.5
Protection against mechanical hazards
IEC 62109-1 1st Edition, 2010-04, Clause 8IS 16221 (Part 1):2016, Clause 8
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 107 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Stability, Provisions for lifting and carrying, Wall mounting)
Cl.8.3Cl.8.4Cl.8.5
Limited power sources IEC 62109-1 1st Edition, 2010-04, Clause 9.2 and 9.3IS 16221 (Part 1):2016, Clause 9.2 and 9.3
Protection against sonic pressure hazards
IEC 62109-1 1st Edition, 2010-04, Clause 10IS 16221 (Part 1):2016, Clause 10
Physical requirements- Handles and manual controls, Cord anchorages and strain relief, Stress Relief test, Mechanical resistance to deflection, impact or drop
IEC 62109-1 1st Edition, 2010-04, Clause 13IS 16221 (Part 1):2016, Clause 13Cl.13.1Cl.13.3.2.5Cl.13.6.2.1/Cl.13.7
Components IEC 62109-1 1st Edition, 2010-04, Clause 14IS 16221 (Part 1):2016, Clause 14
10. Safety of power converters for use in photovoltaic power systems-Part 2:Particular requirements for
Array insulation resistance detection for inverters for ungrounded arrays
IEC 62109-2 1st Edition, 2011-06, Clause 4.8.2.1IS 16221 (Part 2):2015, Clause 4.8.2.1
Array insulation resistance detection for inverters for
IEC 62109-2 1st Edition, 2011-06, Clause 4.8.2.1
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 108 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Inverters functionally groundedArrays
IS 16221 (Part 2):2015, Clause 4.8.2.1
30 mA touch current type test for isolated inverters
IEC 62109-2 1st Edition, 2011-06, Clause 4.8.3.2IS 16221 (Part 2):2015, Clause 4.8.3.2
Fire hazard residual current type test for isolated inverters
IEC 62109-2 1st Edition, 2011-06, Clause 4.8.3.3IS 16221 (Part 2):2015, Clause 4.8.3.3
Protection By application of RCD’s
IEC 62109-2 1st Edition, 2011-06, Clause 4.8.3.4IS 16221 (Part 2):2015, Clause 4.8.3.4
11. Photovoltaic (PV) module performance testing and energy rating-Part-1:Irradiance and temperature performance measurements and powerrating
Power and rating conditions Clause 7 (Sub clause. No. 7.2, 7.3, 7.4, 7.5, 7.6)
IEC 61853-1, Edition 1.0, 2011-01IS 16170 (Part 1):2014
Procedure for irradiance and temperature performance measurements Clause 8 (Sub clause. No. 8.2, 8.3, 8.4, 8.5)
IEC 61853-1, Edition 1.0, 2011-01IS 16170 (Part 1):2014
Rating of power/Power rating Clause 9 (Sub clause No. 9.1 and 9.2)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 109 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
12. Photovoltaic (PV) module safety qualification-Part2: requirement for testing a) Thin-film terrestrial photovoltaic (PV) modules & b) Crystalline silicon terrestrial photovoltaic (PV) modules
Fire Test MST 23 (Annex A)
A.3 Spread of flame test
A.4 Burning brand test
IEC 61730-2 (Edition 1.1) : 2012-11, MST 23
IEC 61730-2 (Edition 1) 2004-10, Clause 10.8, MST 23
IS/IEC 61730-2, 2004, MST 23
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 110 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
ELECTRONICS TESTING
LOCATION 2
I. EMC TEST FACILITY
1. EMI/EMC and ESD TestingEMI-EMC Testing: Electrical and Electronic Instrument
Conducted Emission Test (CE) IEC 60601-1-2 (Edition 3.0):(2007-03)IEC 60601-1-2 (Edition 4.0) (2014-04)IEC 61000-6-3 (Edition 2.1) Consol. with Amd. 1 (2011-02)IEC 61000-6-4 (Edition 2.1 Consol. with Amd. 1 (2011-02)IEC 61000-6-4 (Ed 3.0)2018-02IEC 61326-1 (2nd Edition)-0 (2012-07)IEC 62040-2 (Edition 3.0) (2016-11)IEC 62052-11:2003+AMD1:2016 (Edition 1.1)IEC 60034-1 (Edition 12.0):(2010-02) IEC 60034-1 (Edition 13.0):(2017-05)IEC 60974-10:2014/AMD1:2015CISPR 11 (Edition 6.1) 2015+AMD1:2016-06
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 111 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
CISPR 14-1 (Edition 6.0) (2016-08)CISPR 15:2013/AMD1 (2015-03) (Edition 8.1)CISPR 15:(2018-05) (Edition 9.0)CISPR 22 (Edition 6.0):(2008-09)CISPR 32:2015/COR1:2016 (Edition 2.0)EN 55011:2010EN 55011:2016+A1:2017EN 50121-3-2:2015EN 50121-3-2:2017EN 55014-1:2006+Amd. 2:2011EN 55014-1:2017EN 55015:2006+Amd. 2:2009EN 55015:2013EN 55022:2010/AC 2011EN 55032:2015EN 60601-1-2:2007/AC:2010EN 60601-1-2:2007/AC:2015EN 61000-6-3:2007/A1:2011EN 61000-6-4:2007/A1:2011EN 61326-1:2013
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 112 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
EN 62040-2:2006EN 62052-11:2003EN 50121-4:2006EN 50121-4:2016EN 50121-3-2:2017CFR 2010 Title 47 Vol.1 (Part 15)CFR 2010 Title 47 Vol.1 (Part 18)IS 16102-2, Clause. 16.1IS 6873-5IS 13779:1999 (RA 2009)IS 6842:1997IS 14697:1999, (RA 2009)TEC/EMI/TEL-001/01/FEB-09/TEC/SD/DD/EMC-221/05/OCT-16
Radiated Electromagnetic Disturbances
CISPR 15 (Edition 7.2):(2009-01)Clause. 4.4.1EN 55015:2006+ Amd. 2:2009Clause. 4.4.1IS 16102-2, Clause. 16.1IS 6873-5
Harmonic Current Emission Test IEC 61000-3-2 (Edition 4):(2014-05)IEC 60601-1-2 (Edition 3.0):(2007-03)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 113 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 60601-1-2 (Edition 4.0):(2014-02)IEC 61000-6-3 (Edition 2.1):(2011-02)IEC 61326-1 (Edition 2.0):(2012-07)EN 60601-1-2:2007/AC:2010 EN 60601-1-2:2007/AC:2015EN 61000-3-2:2014IEC 61000-3-2 (Edition 4.0) (2014-05)EN 61000-6-3:2007 Amd. 1:2011EN 61326-1:2013IEC 60974-10:2014/AMD1:2015IS 14700 (Part 3/ Sec 2): 2008
Voltage Fluctuation & Flicker Test IEC 61000-3-3 (Edition 3.0):(2013-05)IEC 60601-1-2 (Edition 3.0):(2007-03)IEC 60601-1-2 (Edition 4.0):(2014-02)IEC 61000-6-3 (Edition 2.1):(2011-02)IEC 61326-1 (Edition 2.0):(2012-07)IEC 60974-10:2014/AMD1:2015EN 60601-1-2:2007/AC:2010EN 60601-1-2:2007/AC:2015EN 61000-3-3:2008EN 61000-3-3:2013EN 61000-6-3:2007, Amd. 1:2011EN 61326-1:2013
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 114 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Electrostatic Discharge Immunity Test
IEC 61000-4-2 (Edition 2.0):(2008-12)IEC 60601-1-2 (Edition 3.0):(2007-03)IEC 60601-1-2 (Edition 4.0):(2014-02)IEC 61000-6-1 (2nd Edition)-0 (2005-03)IEC 61000-6-1 (3nd Edition) (2016-08)IEC 61000-6-2 (Edition 2.0) (2005-01)IEC 61000-6-2 (3nd Edition)(2016-08)IEC 61326-1 (2nd Edition)-0 (2012-07)IEC 62040-2 (2nd Edition)-0 (2005-10)IEC 62052-11 (Edition 1.0):(2003-02)IEC 61547 (Edition 2.0):2009-06IEC 61850-3 (Edition 2.0) 2013-12IEC 60974-10:2014/AMD1:2015IEEE Std 1613.1 2013CISPR 14-2(Edition 2.0):2015 RLVCISPR 24 (Edition 2.0):(2010-08)CISPR 24 (Edition 2.1):(2015-04)CISPR 35 (Edition 1.0) (2016-08)EN 61000-4-2:2009EN 50121-3-2:2015EN 50121-3-2:2017
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 115 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
EN 50121-4:2006 EN 50121-4:2016EN 55014-2:1997/Amd. 2:2008EN 55014-2:2015EN 55024:2010EN 60601-1-2:2007/AC:2010EN 60601-1-2:2007/AC:2015EN 61000-6-1:2007EN 61000-6-2:2005EN 61326-1:2013EN 62040-2:2006EN 62052-11:2003EN 61547:2009IS 13779:1999 (RA 2009)IS 14697:1999 (RA 2014)TEC/EMI/TEL-001/01/FEB-09TEC/SD/DD/EMC-221/05/OCT-16
Electrical Fast Transient (EFT) / Burst Immunity Test
IEC 61000-4-4 (Edition 3.0):(2012-04)IEC 60601-1-2 (Edition 3.0):(2007-03)IEC 60601-1-2 (Edition 4.0):(2014-02)IEC 61000-6-1 (2nd Edition):(2005-03)IEC 61000-6-1 (3nd Edition) (2016-08)IEC 61000-6-2 (2nd Edition):(2005-01)IEC 61000-6-2 (3nd Edition)(2016-08)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 116 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 61326-1 (2nd Edition):(2012-07)IEC 62040-2 (2nd Edition):(2005-10)IEC 62052-11 (Edition 1.0):(2003-02)IEC 61547:2009IEC 61850-3 (Edition 2.0) 2013-12IEC 60974-10:2014/AMD1:2015CISPR 14-2(Edition 2.0):2015 RLVCISPR 24 (2nd Edition):(2010-08) CISPR 24 (Edition 2.1):(2015-04)CISPR 35 (Edition 1.0) (2016-08)EN 61000-4-4:2012EN 55014-2:1997/Amd. 2:2008EN 55014-2:2015EN 55024:2010EN 60601-1-2:2007/AC 2010 EN 60601-1-2:2007/AC:2015EN 61000-6-1:2007EN 61000-6-2:2005EN 50121-3-2:2015EN 50121-3-2:2017EN 50121-4:2006EN 50121-4:2016
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 117 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
EN 61326-1:2013EN 62040-2:2006EN 62052-11:2003EN 61547:2009IS 13779:1999 (RA 2009)IS 14697:1999 (RA 2014)TEC/EMI/TEL-001/01/FEB-09TEC/SD/DD/EMC-221/05/OCT-16
Surge Immunity Test IEC 61000-4-5 (Edition 3.0):(2014-05)IEC 61000-4-5:2014/AMD1:2017 (Ed 3.1)IEC 60601-1-2 (Edition 3.0):(2007-03)IEC 60601-1-2 (Edition 4.0):(2014-02)IEC 61000-6-1 (2nd Edition):(2005-03)IEC 61000-6-1 (3nd Edition) (2016-08)IEC 61000-6-2 (2nd Edition):(2005-01)IEC 61000-6-2 (3nd Edition)(2016-08)IEC 61326-1 (2nd Edition):(2012-07)IEC 62040-2 (2nd Edition):(2005-10)IEC 62052-11 (Edition 1.0):(2003-02)IEC 61547:2009IEC 61850-3 (Edition 2.0) 2013-12IEC 60974-10:2014/AMD1:2015CISPR 14-2(Edition 2.0): 2015 RLV
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 118 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
CISPR 24 (2nd Edition):(2010-08) CISPR 24 (Edition 2.1):(2015-04)CISPR 35 (Edition 1.0) (2016-08)IEEE Std 1613.1 2013EN 61000-4-5:2006EN 61000-4-5:2014EN 55014-2:1997/Amd. 2:2008EN 55014-2:2015EN 55024:2010EN 60601-1-2:2007/AC 2010EN 60601-1-2:2007/AC:2015EN 61000-6-1:2007EN 61000-6-2:2005EN 50121-3-2:2015EN 50121-4:2006EN 50121-4:2016EN 61326-1:2013EN 62040-2:2006EN 62052-11:2003EN 61547:2009TEC/EMI/TEL-001/01/FEB-09TEC/SD/DD/EMC-221/05/OCT-16
Conducted RF Immunity Test IEC 61000-4-6 (Edition 4.0):(2013-10)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 119 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 60601-1-2 (Edition 3.0):(2007-03)IEC 60601-1-2 (Edition 4.0):(2014-02)IEC 61000-6-1 (2nd Edition):(2005-03)IEC 61000-6-1 (3nd Edition) (2016-08)IEC 61000-6-2 (2nd Edition):(2005-01)IEC 61000-6-2 (3nd Edition)(2016-08)IEC 61326-1 (2nd Edition):(2012-07)IEC 62040-2 (2nd Edition):(2005-10)IEC 62052-11 (Edition 1.0):(2003-02)IEC 61547:2009IEC 61850-3 (Edition 2.0) 2013-12IEC 60974-10:2014/AMD1:2015IEEE Std 1613.1 2013CISPR 14-2(Edition 2.0): 2015 RLVCISPR 24 (2nd Edition):(2010-08)CISPR 24 (Edition 2.1):(2015-04)CISPR 35 (Edition 1.0) (2016-08)EN 61000-4-6:2009EN 61000-4-6:2014EN 50121-3-2:2015EN 50121-3-2:2017EN 50121-4:2006
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 120 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
EN 50121-4:2016EN 55014-2:1997/Amd. 2:2008EN 55014-2:2015EN 55024:2010EN 60601-1-2:2007/AC 2010EN 60601-1-2:2007/AC:2015EN 61000-6-1:2007EN 61000-6-2:2005EN 61326-1:2013EN 62040-2:2006EN 62052-11:2003EN 61547:2009TEC/EMI/TEL-001/01/FEB-09TEC/SD/DD/EMC-221/05/OCT-16
Power Frequency Magnetic Field Immunity Test
IEC 61000-4-8 (2nd Edition):(2009-09)IEC 60601-1-2 (Edition 3.0):(2007-03)IEC 60601-1-2 (Edition 4.0):(2014-02)IEC 61000-6-1 (2nd Edition):(2005-03)IEC 61000-6-1 (3nd Edition) (2016-08)IEC 61000-6-2 (2nd Edition):(2005-01)IEC 61000-6-2 (3nd Edition)(2016-08)IEC 61326-1 (2nd Edition):(2012-07)IEC 62040-2 (2nd Edition):(2005-10)IEC 61547 2009
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 121 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 61850-3 (Edition 2.0) 2013-12CISPR 24 (2nd Edition):(2010-08)CISPR 24 (Edition 2.1):(2015-04)IEEE Std 1613.1 2013CISPR 35 (Edition 1.0) (2016-08)EN 61000-4-8:2010EN 55024:2010EN 60601-1-2:2007/AC 2010EN 60601-1-2:2007/AC:2015EN 61000-6-1:2007EN 61000-6-2:2005EN 61326-1:2013EN 62040-2:2006EN 61547:2009
Voltage Dips, Short Interruption & Voltage variations Immunity Test
IEC 61000-4-11 (2nd Edition):(2004-03)IEC 61000-4-11 (2.1 Edition):(2017-05)IEC 60601-1-2 (Edition 3.0):(2007-03)IEC 60601-1-2 (Edition 4.0) (2014-02)IEC 61000-6-1 (2nd Edition):(2005-03)IEC 61000-6-1 (3nd Edition) (2016-08)IEC 61000-6-2 (2nd Edition):(2005-01)IEC 61000-6-2 (3nd Edition)(2016-08)IEC 61326-1 (2nd Edition):(2012-07)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 122 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 62052-11 (Edition 1.0):(2003-02)IEC 61547:2009IEC 61850-3 (Edition 2.0) 2013-12IEC 60974-10:2014/AMD1:2015CISPR 14-2(Edition 2.0): 2015 RlvCISPR 24 (2nd Edition):(2010-08) CISPR 24 (Edition 2.1):(2015-04)CISPR 35 (Edition 1.0) (2016-08)EN 61000-4-11:2004EN 55014-2:1997 Amd. 2:2008EN 55014-2:2015EN 55024:2010EN 60601-1-2:2007/AC. 2010EN 60601-1-2:2007/AC:2015EN 61000-6-1:2007EN 61000-6-2:2005EN 61326-1:2013EN 62040-2:2006TEC/EMI/TEL-001/01/FEB-09TEC/SD/DD/EMC-221/05/OCT-16
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 123 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
EN 62052-11:2003/EN 61547:2009 Ring wave Immunity Test IEC 61000-4-12:2006
IEC 61000-4-12:( Ed 3.0) 2017-07EN 61000-4-12:2006
II. INFORMATION TECHNOLOGY EQUIPMENT
1. Power adaptors, Mobile Phone, Cash Register, Point of Sale Terminal, Copying Machine, Franking Machine, Passport reader, Computer Systems, Printers Scanners, iris scanner, Optical finger print scanner, USB driven Barcode readers, barcode scanners,Smart watches CCTV Cameras/Equipment for CCTV Cameras .
Input Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 1.6.2)
Thermal requirement IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 4.5.1)
Overload of operator accessible Parts
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 5.3.7)
Humidity conditioning IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 2.9.1)
Electric strength Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 5.2.2)
Touch current Test IS 13252 (Part 1):2010 +
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 124 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Keyboards, Automatic Data Processing Machine, Set top Box.
Amd. 1:2013 +Amd. 2:2015 (Clause. 5.1)
Abnormal operation Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 5.3.1)
Capacitance discharge Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 2.1.1.7)
Limited power source measurement Test
IS 13252 (Part 1):2010 + Amd. 1: 2013 +Amd. 2:2015 (Clause. 2.5)
Working voltage determination IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 2.10.2)
Protective bonding Test II IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 2.6.3.4)
Limited current circuit measurement
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 2.4.1)
Limitation of touch current to a telecommunication and cable distribution system
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 5.1.8.1)
Requirement of separation between telecommunication
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause.
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 125 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
network from earth 6.1.2)Steady force Test IS 13252 (Part 1):2010 +
Amd. 1:2013 +Amd. 2:2015 (Clause. 4.2.1)
Impact Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 4.2.5)
Strain relief Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 3.2.6)
Cord guard Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 3.2.8)
Hazardous moving Parts Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 4.4.2)
Stability Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 4.1)
Durability of marking Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 1.7.11)
Stress relief Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 4.2.7)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 126 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Drop Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 (Clause. 4.2.6)
2. Power adaptors, Mobile Phone, Cash Register, Point of Sale Terminal, Copying Machine, Franking Machine, Passport reader,Computer Systems, Printers Scanners, Keyboards, & Automatic Data Processing Machine, Set top Box
Input Test UL 60950-1 (2nd Edition):2007 CSA C22.2 No. 60950-1 (2nd Edition):Date. 2007/03/27 IEC 60950-1 ( (2nd Edition):2005+ Amd. 1 Date. 2009-12-01 (Clause. 1.6.2) UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1:2001 (1st Edition) (Clause. 1.6.2)
Thermal requirement UL 60950-1 (2nd Edition):2007 CSA C22.2 No.60950-12nd Edition):Date. 2007/03/27IEC 60950-1 (2nd Edition):2005-12-01 + Amd.1 Date. 2009-12-01(Clause. 4.5.1) UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/IEC 60950-1(1st Edition): 2001 (Clause. 4.5.1)
Output overload Test UL 60950-1 (2nd Edition):2007/03/27
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 127 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
CSA C22.2 No.60950-1(2nd Edition):Date. 2007/03/27IEC 60950-1 (2nd Edition):2005/12/01+ Amd. 1 Date. 2009-12-01 (Clause. 5.3.7) UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1 (1st Edition):2001
Dielectric strength Test UL 60950-1 (2nd Edition):2007/03/27CSA C22.2 No.60950-1(2nd Edition) Date. 2007/03/27IEC 60950-1 (2nd Edition):2005/12/01 + Amd.1 Date. 2009-12-01 (Clause. 5.2.2)UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/IEC 60950-1(1st Edition):2001(Clause. 5.2)
Touch current Test UL 60950-1 (2nd Edition): 2007CSA C22.2 No.60950-1(2nd Edition):Date. 2007/03/27IEC 60950-1 (2nd Edition):2005 + Amd.
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 128 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
1 Date. 2009-12-01 (Clause. 5.1)UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/IEC 60950-1 (1st Edition):2001(Clause. 5.1)
Output short circuit Test UL 60950-1 (2nd Edition):2007/03/27CSA C22.2 No.60950-1(2nd Edition):Date. 2007/03/27IEC 60950-1 (2nd Edition):2005/12/01 + Amd. 1 Date. 2009-12-01 (Clause. 5.3.7)UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1 (1st Edition):2001(Clause. 5.3.7)
Abnormal operation Test UL 60950-1 (2nd Edition):2007/03/27CSA C22.2 No.60950-1 (2nd Edition):Date. 2007/03/27 IEC 60950-1 (2nd Edition):2005 + Amd. 1 Date. 2009-12-01 (Clause. 5.3.3) UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1(1st Edition):2001 (Clause.
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 129 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
5.3.1) Component failure Test UL 60950-1 (2nd Edition):2007/03/27
CSA C22.2 No.60950-1(2nd Edition):Date. 2007/03/27IEC 60950-1 (2nd Edition):2005/12/01 + Amd. 1 Date. 2009-12-01 (Clause. 5.3.1)UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1 (1st Edition):2001(Clause. 5.3.1)
SELV reliability Test UL 60950-1 (2nd Edition):2007/03/27 CSA C22.2 No.60950-1(2nd Edition):Date. 2007/03/27IEC 60950-1 (2nd Edition):2005/12/01 + Amd. 1 Date. 2009-12-01 (Clause. 2.2.2)UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/IEC 60950-1 (1st Edition):2001(Clause. 2.2.2)
Max. V, VA, A measurement Test UL 60950-1 (2nd Edition):2007/03/27 CSA C22.2 No.60950-1(2nd Edition):Date. 2007/03/27
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 130 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 60950-1:(2nd Edition):2005-12-01+ Amd.1 Date. 2009-12-01 (Clause. 1.2.2.1)UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1:2001 (1st Edition)(Clause. 1.2.2.1)
Capacitance discharge Test UL 60950-1 (2nd Edition):2007 CSA C22.2 No.60950-1(2nd Edition):Date. 2007/03/27IEC 60950-1 (2nd Edition):2005 + Amd.1 Date. 2009-12-01 (Clause. 2.1.1.7)UL 60950-1 (1st Edition):2006/ CSA C22.2 No.60950-1-03/ IEC 60950-1 (1st Edition):2001 (Clause. 2.1.1.7)
Energy hazard measurement Test UL 60950-1 (2nd Edition):2007/03/27 CSA C22.2 No.60950-1(2nd Edition):Date. 2007/03/27IEC 60950-1 (2nd Edition):2005/12/01 + Amd.1 Date. 2009-12-01
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 131 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Clause. 2.1.1.8)UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1:2001 (1st Edition):(Clause. 2.1.1.8)
Limited power source measurement Test
UL 60950-1 (2nd Edition):2007/03/27
CSA C22.2 No.60950-1 (2nd Edition):Date. 2007/03/27IEC 60950-1 (2nd Edition):2005/12/01 + Amd.1 Date. 2009-12-01 (Clause. 2.5)UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1 (1st Edition):2001 (Clause. 2.5)
Working voltage measurement Test
UL 60950-1 (2nd Edition):2007/03/27CSA C22.2 No.60950-1(2nd Edition):Date. 2007/03/27IEC 60950-1 (2nd Edition):2005-12-01+ Amd.1 Date. 2009-12-01 (Clause. 2.10.2)UL 60950-1 (1st Edition):2006/07/07
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 132 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
CSA C22.2 No.60950-1-03/ IEC 60950-1:2001 (1st Edition):(Clause. 2.10.2)
Transformer and wire insulation electric strength Test
UL 60950-1 (2nd Edition):2007CSA C22.2 No.60950-1 (2nd Edition): Date. 2007/03/27 IEC 60950-1 (2nd Edition):2005/12/01 + Amd.1 Date. 2009-12-01 (Clause. 2.10.5.13) UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1:2001 (1st Edition):(Clause. 2.10.5.13)
Steady force Test UL 60950-1 (2nd Edition):2007CSA C22.2 No.60950-1(2nd Edition):Date. 2007/03/27 IEC 60950-1 (2nd Edition):2005/12/01+ Amd.1 Date. 2009-12-01 (Clause. 4.2.1)UL 60950-1 (1st Edition): 2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1 (1st Edition):2001 (Clause. 4.2.1)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 133 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Impact Test UL 60950-1 (2nd Edition):2007CSA C22.2 No.60950-1 (2nd Edition):Date. 2007/03/27 IEC 60950-1 (2nd Edition):2005/12/01 + Amd.1 Date. 2009-12-01 (Clause. 4.2.5)UL 60950-1 (1st Edition):2006/07/07 CSA C 22.2 No.60950-1-03/ IEC 60950-1 (1st Edition):2001(Clause. 4.2.5)
Stress relief Test UL 60950-1 (2nd Edition):2007CSA C22.2 No.60950-1(2nd Edition)Date. 2007/03/27IEC 60950-1 (2nd Edition):2005/12/01 + Amd.1 Date. 2009-12-01 (Clause. 4.2.7)UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1(1st Edition):2001 (Clause. 4.2.7)
3. Power adaptors, Mobile Ball pressure Test UL 60950-1 (2nd Edition):2007 CSA
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 134 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Phone, Cash Register, Point of Sale Terminal, Copying Machine, Franking Machine, Passport reader,Computer Systems, Printers Scanners, Keyboards, Automatic Data Processing Machine, Set top Box (Thermoplastic, Thermoset,Composite Material)
C22.2 No.60950-1 (2nd Edition):Date. 2007/03/27IEC 60950-1 (2nd Edition):2005/12/01+ Amd.1 Date. 2009-12-01(Clause. 4.5.5) UL 60950-1 (1st Edition):2006 /CSA C22.2 No.60950-1-03/IEC 60950-1(1st Edition):2001 (Clause. 4.5.5)
Accessible connector overload Test
UL 60950-1 (2nd Edition):2007 CSA C22.2 No.60950-1(2nd Edition):Date. 2007/03/27 IEC 60950-1 (2nd Edition): 2005/12/01 + Amd.1 Date. 2009-12-01(Clause. 5.3.7)UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1 (1st Edition):2001 (Clause. 5.3.7)
Earthing Test UL 60950-1 (2nd Edition):2007CSA C22.2 No.60950-1
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 135 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(2nd Edition):Date. 2007/03/27IEC 60950-1 (2nd Edition):2005/12/01 + Amd.1 Date. 2009-12-01(Clause. 2.6.3.4)UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1 (1st Edition):2001 (Clause. 2.6.3.4)
Limited power source measurement Test
UL 60950-1 (2nd Edition):2007 CSA C22.2 No.60950-1(2nd Edition):Date. 2007/03/27 IEC 60950-1 (2nd Edition): 2005/12/01+ Amd.1 Date. 2009-12-01 (Clause. 2.5)UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1 (1st Edition):2001 (Clause. 2.5)
Stability Test UL 60950-1 (2nd Edition):2007 CSA C22.2 No.60950-1(2nd Edition): Date. 2007/03/27 IEC 60950-1 (2nd Edition):2005/12/01 + Amd.1
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 136 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Date. 2009-12-01 (Clause. 4.1)UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/IEC 60950-1 (1st Edition):2001(Clause. 4.1)
Component failure Test UL 60950-1 (2nd Edition):2007 CSA C22.2 No.60950-1(2nd Edition):Date. 2007/03/27 IEC 60950-1 (2nd Edition):2005/12/01 + Amd.1 Date. 2009-12-01 (Clause. 5.3.1)UL 60950-1 (1st Edition):2006/07/07 CSA C22.2 No.60950-1-03/ IEC 60950-1 (1st Edition):2001 (Clause. 5.3.1)
4. Desktop Computer, Notebook computers, Tablets, Small-scale servers, Thin Client, Workstations and Monitors
Off mode ENERGY STAR Computer Test Method, Version 6.1 UUT preparation shall be performed according to IEC 62623 (Edition 1.0):2012-10, Section 5.2:Test Setup
Sleep Mode ENERGY STAR Computer Test Method, Sleep Mode power shall be measured
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 137 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
according to IEC 62623 (Edition 1.0):201210, Section 5.3.3:Measuring Sleep Mode
Idle StateENERGY STAR Computer Test Method, Long Idle Mode power shall be measured according to IEC 62623 (Edition 1.0):2012-10, (Section 5.3.4):Measuring Long Idle Mode
Active State ENERGY STAR Computer Test Method, Short Idle Mode power shall be measured according to IEC 62623 (Edition 1.0):2012-10, (Section 5.3.5):Measuring Short Idle Mode
Idle State ENERGY STAR Test Method for Computer Servers,Off Mode power shall be measured according to IEC 62623 (Edition 1.0):2012-10, (Section 5.3.2):Measuring Off Mode
Full Load ENERGY STAR Test Method for Computer Servers, ENERGY STAR Program Requirements Product Specification for
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 138 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Computer Servers, Version 1.1, Appendix A
5. Energy efficiency of Internal/External AC-DC and DC-DC Power supplies
Active Mode power consumption):for single Output power supply
Generalized Test Protocol for calculating the Energy Efficiency of Internal AC-DC and DC-DC Power supplies:Revision 6.4.2, 22nd October 2008 & Revision 6.5, July 07, 2010. according to IEC 62623 (Edition 1.0):2012-10Test Method for Calculating the Energy Efficiency of Single-Voltage External Ac-Dc and AC-AC Power Supplies August 11, 2004.
Active Mode power consumption for multiple Output power supply
Generalized Test Protocol for calculating the Energy Efficiency of Internal AC-DC and DC-DC Power supplies:Revision 6.4.2, 22nd October 2008 & Revision 6.5, July 07, 2010.According to IEC 62623 (Edition 1.0): 2012-10Test Method for Calculating the Energy Efficiency of Single-Voltage External AC-DC and AC-AC Power Supplies August 11, 2004
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 139 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Standby Mode Power consumption
Generalized Test Protocol for calculating the Energy Efficiency of Internal AC-DC and DC-DC Power supplies:Revision 6.4.2, 22nd October 2008 & Revision 6.5, July 07, 2010.according to IEC 62623 (Edition 1.0):2012-10Test Method for Calculating the Energy Efficiency of Single-Voltage External AC-DC and AC-AC Power Supplies August 11, 2004.
6. Cash Register, Point of Sale Terminal, Copying Machine, Franking Machine, Passport reader, Computer Systems, Printers Scanners, Telephones & Automatic Data Processing Machine
TNV Circuits, Limits IS 13252 (Part 1):2010 +Amd. 1:2013 +Amd. 2:2015Cl. 2.3, 2.3.1
Separation of TNV Ckts from other ckts & from accessible parts Protection by basic Insulation, Protection by Earthing, protection by other constructions
IS 13252 (Part 1):2010 +Amd. 1:2013 +Amd. 2:2015Cl 2.3.2, 2.3.2.1, 2.3.2.2, 2.3.2.3 2.3.2.4
Separation from hazardous voltages
IS 13252 (Part 1):2010 +Amd. 1:2013 +Amd. 2:2015Cl 2.3.3
Connection of TNV circuits to other circuits
IS 13252 (Part 1):2010 +Amd. 1:2013 +Amd. 2:2015
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 140 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Cl 2.3.4Test for operating Voltages generated externally
IS 13252 (Part 1):2010 +Amd. 1:2013 +Amd. 2:2015Cl 2.3.5
7. Power adaptors, Mobile Phone, Cash Register, Point of Sale Terminal, Copying Machine, Franking Machine, Passport reader, Computer Systems, Printers Scanners, iris scanners, Keyboards, Automatic Data Processing Machine, Set top Box
Components- Thermal controls
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015, CL 1.5.3
Components- Transformers
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 1.5.4
Components- Interconnecting cables
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 1.5.5
Components- Capacitors bridging insulation
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 1.5.6
Components - Resistors bridging double insulation or reinforced insulation between the a.c.mains supply and other circuits
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,1.5.7.2
Access to energized parts IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.1.1.1
Access to ELV wiring Amd. 1:2013 +Amd.,CL 2.1.1.3Access to hazardous voltage wiring
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.1.1.4
Energy hazard IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.1.1.5
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 141 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Energy hazards-d.c. main supplies
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.1.1.8
Audio amplifiers in IT Equipment IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.1.1.9
SELV Circuits IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.2, 2.2.1-2.2.4
TNV Circuits IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.2, 2.3, 2.3.1-2.3.5
Short Circuit backup protection IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.2, 2.7.3
Number and location of protective device
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.2, 2.7.4
Safety Interlocks, Protection requirements, Inadvertent reactivation
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.8.2-2.8.8
Creepage/clearance/distance through insulation, peak working voltage
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.10, 2.10.2.3
Clearances, Measurement of transient voltages, Clearances in secondary circuits
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.10.3, 2.10.3.9.2, 2.10.3.4
Creepage distances IS 13252 (Part 1):2010 +
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 142 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Amd. 1:2013 +Amd.,CL 2.10.4Solid Insulation, non-separable thin sheet material
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.10.5-2.10.5.14
Construction of Printed Boards IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.10.6.2-2.10.6.4
Semiconductor Devices IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.10.5.4
Thermal cycling & thermal ageing IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.10.9
Electric Strength Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.10.8.3
Abrasion Resistance test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.10.8.4
Test for pollution Degree 1 environment and for insulating compound
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.10.10
Enclosed and sealed parts IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 2.10.12
Insulation of conductor, Termination of conductor
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd.,CL 3.1.4, 3.1.9
Permanently connected IS 13252 (Part 1):2010 +
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 143 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
equipment, Appliance inlets Amd. 1:2013 +Amd.,CL 3.2.3, 3.2.4Steady Force Test IS 13252 (Part 1):2010 +
Amd. 1:2013 +Amd. 2:2015 (Clause. 4.2.3,4.2.4)
Wall or ceiling mounted equipment
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 CL4.2.10
handles & manual controls IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015,CL4.3.2,4.3.3
Batteries IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015, Cl. 4.3.8
Resistance to abnormal heat IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015,CL4.5.5
Top and Side openings.Bottoms of fire enclosures.
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015,CL4.6.1,4.6.2
Evaluation measure of larger openings
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015,CL4.6.4.2
Adhesives for constructional IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015,CL4.6.5
Resistance to fire purposes IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015Cl.4.7, 4.7.1, 4.7.2, 4.7.2.1, 4.7.2.2
Materials for fire enclosures IS 13252 (Part 1):2010 +
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 144 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Amd. 1:2013 +Amd. 2:2015 (Clause. 4.7.3,4.7.3.2)
Materials used in high voltage components
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015 CL4.7.3.6
Abnormal operating and fault conditions
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015,CL5.3.2, 5.3.3, 5.3.4, 5.3.5, 5.3.6, 5.3.7, 5.3.8, 5.3.9.1, 5.3.9.2
Protection of equipment users from over voltages on telecommunication network
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015,CL6.2.1, 6.2.2,6.2.2.1,6.2.2.2
Protection of the telecommunication wiring system from overheating
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015, Cl. 6.3
Connection to cable distribution Systems
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015,CL7.2,7.3
Surge Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015,CL7.4.2
Impulse Test IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015,CL6.2,7.4.3
Motor tests under abnormal conditionsTransformers
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015,Annex C
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 145 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Component flammability IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015,Annex Q
8. Mobile Phones Language Input test & Verification IS 16333 (Part 3):2017, Cl 5
9. Radio Transmitting Equipment
Fault conditions Tests IEC 60215 (Edition 4):2016-04IS 10437:1986, (RA 2015)
Resistance To Humidity IEC 60215 (Edition 4):2016-04IS 10437:1986, (RA 2015)
Resistance to Ingress of Water IEC 60215 (Edition 4):2016-04IS 10437:1986, (RA 2015)
Protection against electric shock IEC 60215 (Edition 4):2016-04IS 10437:1986, (RA 2015)
Protection against electric shock-Opening in enclosure
IEC 60215 (Edition 4):2016-04IS 10437:1986, (RA 2015)
High Temperatures IEC 60215 (Edition 4):2016-04IS 10437:1986, (RA 2015)
Creepage and Clearance distances
IEC 60215 (Edition 4):2016-04IS 10437:1986, (RA 2015)
Ionizing radiation IEC 60215 (Edition 4):2016-04IS 10437:1986, (RA 2015)
10. Automatic Data Processing Machine, Laptop/Notebook/ Tablet, Printers,
Direct plug in equipment IS 13252 (Part 1): 2010 +Amd. 1: 2013 +Amd. 2: 2015, (Clause 4.3.6)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 146 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Plotters, Scanners, Set Top Box, Telephone Answering Machines, Visual Display Units, Videos Monitors, Wireless Keyboards, Cash Registers, Copying Machines/ Duplicators, Passport Reader, Point Of Sale Terminals, Mail Processing Machines/ Postage Machines/ Franking Machines, Power Banks For Use In Portable Applications, Smart Card Reader, Mobile Phones, Power Adaptors, CCTV Cameras/ CCTV Recorders, USB Driven Barcode Reader, Barcode Scanners/Iris Scanners/ Optical Fingerprint Scanners,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 147 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Smart Watches, Computer Systems
III. AUDIO/ VIDEO COMPONENTS AND PRODUCTS
1. House Hold Electronic Appliances-CRT TV; LCD; Plasma displays
Standby power measurement IEC 62301 (Edition 2):2011-01/IS 13384 (Part 1):1992 IS 13384 (Part 2):1997
On mode Power measurement IEC 62087 (Edition 3):2011-04IS 13384 (Part 1):1992IS 13384 (Part 2):1997
2. Power adaptor, Televisions, Optical Disc Players, Amplifier, Electronic Musical System
Normal operating conditions-Input Test
EN/IEC 60065:2014, Clause. 4.2 IS 616:2017-Rev 5, Clause. 4.1 to 4.3
Marking Legibility EN/IEC 60065:2014, Clause. 5 IS 616:2017-Rev 5, Clause. 5
Heating under normal operating conditions
EN/IEC 60065:2014, Clause. 7 IS 616:2017-Rev 5, Clause. 7
Hygroscopic materials EN/IEC 60065:2014,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 148 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Clause. 8.3 IS 616:2017-Rev 5, Clause. 8.3
Winding insulation Test EN/IEC 60065:2014, Clause. 8.8IS 616:2017-Rev 5, Clause. 8.8
External forces-windows & coversEN/IEC 60065:2014, Clause. 8.13, 8.14 IS 616:2017-Rev 5, Clause. 8.13, 8.14
Internal forces EN/IEC 60065:2014, Clause. 8.15IS 616:2017-Rev 5, Clause. 8.15
Determination of hazardous live Parts
EN/IEC 60065:2014, Clause. 9.1.1.1 IS 616:2017-Rev 5, Clause. 9.1.1.1
Protection):against electric shock-Accessibility
EN/IEC 60065:2014, Clause. 9, 9.1.1.2, 9.2 IS 616:2017-Rev 5, Clause. 9, 9.1.1.2, 9.2
Protection against electric shock-Opening in enclosure
EN/IEC 60065:2014, Clause. 9.1.3 IS 616:2017-Rev 5,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 149 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Clause. 9.1.3Protection against electric shock-Terminals
EN/IEC 60065:2014, Clause. 9.1.4 IS 616:2017-Rev 5, Clause. 9.1.4
Preset controlsEN/IEC 60065:2014, Clause. 9.1.5IS 616:2017-Rev 5, Clause. 9.1.5
Withdrawal of main plug EN/IEC 60065:2014, Clause. 9.1.6IS 616:2017-Rev 5, Clause. 9.1.6
Resistance to external forces EN/IEC 60065:2014, Clause. 9.1.7IS 616:2017-Rev 5, Clause. 9.1.7
Surge Test EN/IEC 60065:2014, Clause. 10.1IS 616:2017-Rev 5, Clause. 10.1
Humidity treatment EN/IEC 60065:2014, Clause. 10.2 IS 616:2017-Rev 5,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 150 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Clause. 10.2Insulation resistance EN/IEC 60065:2014,
Clause. 10.3IS 616:2017-Rev 5, Clause. 10.3
Dielectric strength EN/IEC 60065:2014, Clause. 10.3IS 616:2017-Rev 5, Clause. 10.3
Fault conditions Tests EN/IEC 60065:2014, Clause. 11IS 616:2017-Rev 5, Clause. 11
Mechanical strength-Bump EN/IEC 60065:2014, Clause. 12.1.1IS 616:2017-Rev 5, Clause. 12.1.1
Mechanical strength-Impact EN/IEC 60065:2014, Clause. 12.1.3
Impact Hammer:Impact steel ball:
IS 616:2017-Rev 5, Clause. 12.1.3
Drop Test EN/IEC 60065:2014, Clause. 12.1.4IS 616:2017-Rev 5, Clause. 12.1.4
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 151 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Mechanical strength-Stress relief EN/IEC 60065:2014, Clause. 12.1.5IS 616:2017-Rev 5, Clause. 12.1.5
Torque Test-Rod antenna EN/IEC 60065:2014,Clause. 12.6IS 616:2017-Rev 5, Clause. 12.6
Creepage and Clearance distances
EN/IEC 60065:2014, Clause. 13IS 616:2017-Rev 5, Clause. 13
Determination of operating voltage
EN/IEC 60065:2014, Clause. 13.2IS 616:2017-Rev 5, Clause. 13.2
Component-Resistors EN/IEC 60065:2014, Clause. 14.1IS 616:2017-Rev 5, Clause. 14.1
Provisions for protective resistance
EN/IEC 60065:2014, Clause. 15.2IS 616:2017-Rev 5, Clause. 15.2
Strain relief Test EN/IEC 60065:2014,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 152 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Clause. 16.5IS 616:2017-Rev 5, Clause. 16.5
Torque Test on screw terminals EN/IEC 60065:2014, Clause. 17.1IS 616:2017-Rev 5, Clause. 17.1
Torque Test on covers EN/IEC 60065:2014, Clause. 17.7IS 616:2017-Rev 5, Clause. 17.7
Stability TestEN/IEC 60065:2014, Clause. 19.1IS 616:2017-Rev 5, Clause. 19.1
Vertical force stability EN/IEC 60065:2014, Clause. 19.2IS 616:2017-Rev 5, Clause. 19.2
Horizontal force stabilityEN/IEC 60065:2014, Clause. 19.3IS 616:2017-Rev 5, Clause. 19.3
Wall or Ceiling or Equipment Rack Mounting Test
EN/IEC 60065:2014, Clause. 19.6
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 153 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS 616:2017-Rev 5, Clause. 19.6
Resistance to Heat, Fire and Tracking (Glow wire Test)
EN/IEC 60065:2014, Clause. 20, Annexure. GIS 616:2017-Rev 5, Clause. 20, Annexure. G
Resistance to Heat, Fire and Tracking (Needle flame)
EN/IEC 60065:2014, Clause. 20, Annexure. GIS 616:2017-Rev 5, Clause. 20, Annexure. G
Resistance to Heat, Fire and Tracking (Flame Test)
EN/IEC 60065:2014, Clause. 20, Annexure. G
3. Audio Video and Similar Electronic Apparatus-Safety Requirements-Plasma/LCD/LED TVs, Optical disc players, Amplifier, Musical Systems, Electronic Video Games, Power Adaptors for audio, Video and Similar Electronic Apparatus
Requirements for the mounting means of rack-mounted equipment
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015,Annex DD
Household and home/office document/media shredders
IS 13252 (Part 1):2010 + Amd. 1:2013 +Amd. 2:2015,Annex EE
Protection against electric shock EN/IEC 60065:2014, Clause 8.17-8.21,IS 616:2017-Rev 5, Clause 8.17-8.21
Vibration Test EN/IEC 60065:2014, Clause 12.1.3,IS 616:2017-Rev 5, Clause 12.1.3
Drawers EN/IEC 60065:2014, Clause 12.4,IS 616:2017-Rev 5, Clause 12.4
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 154 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Antenna coaxial sockets mounted on the apparatus
EN/IEC 60065:2014, Clause 12.5,IS 616:2017-Rev 5, Clause 12.5
Creepage Distances(Tracking Index test)
EN/IEC 60065:2014, Clause 13.4,IS 616:2017-Rev 5, Clause 13.4
Devices forming a part of the MAINS plug
EN/IEC 60065:2014, Clause 15.4,IS 616:2017-Rev 5, Clause 15.4
4. Audio/Video, Information and Communication Technology Equipment
Fixing Conductor EN 62368-1 (Clause 4.6)IEC 62368-1(ed 2:2014) (Clause 4.6)
Equipment for direct insertion into mains socket-outlets
EN 62368-1 (Clause 4.7)IEC 62368-1 (ed 2:2014) (Clause 4.7)
Stress relief test EN 62368-1 (Annex T.8)IEC 62368-1 (ed 2:2014) (Annex T.8)
Drop test EN 62368-1 (Annex T.7)IEC 62368-1 (ed 2:2014) (Annex T.7)
Crush test EN 62368-1 (Clause 4.8.4.6) IEC 62368-1(ed 2:2014) (Clause 4.8.4.6)
Compliance criteria(Force test)
EN 62368-1 (Clause 4.8.5)IEC 62368-1(ed 2:2014) (Clause 4.8.5)
Accessibility to electrical energy sources and safeguards
EN 62368-1 (Clause 5.3.2)IEC 62368-1(ed 2:2014) (Clause 5.3.2)
Maximum operating temperature (Temperature measurement)
EN 62368-1 (Clause 5.4.1.4)IEC 62368-1 (ed 2:2014)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 155 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Clause 5.4.1.4) RMS working voltage / Peak working voltage (working voltage)
EN 62368-1 (Clause 5.4.1.8.2 / 5.4.1.8.3)IEC 62368-1(ed 2:2014) (Clause 5.4.1.8.2 / 5.4.1.8.3)
Vicat softening test EN 62368-1 (Clause 5.4.1.10.2)IEC 62368-1 (ed 2:2014)(Clause 5.4.1.10.2)
Ball pressure test EN 62368-1 (Clause 5.4.1.10.3)IEC 62368-1(ed 2:2014)(Clause 5.4.1.10.3)
Clearance, creepage EN 62368-1 (Clause 5.4.2, 5.4.3)IEC 62368-1 (ed 2:2014)(Clause 5.4.2, 5.4.3)
Antenna Terminal Insulation EN 62368-1 (Clause 5.4.5)IEC 62368-1(ed 2:2014) (Clause 5.4.5)
Humidity conditioning EN 62368-1 (Clause 5.4.8)IEC 62368-1(ed 2:2014) (Clause 5.4.8)
Electric strength test EN 62368-1 (Clause 5.4.9)IEC 62368-1 (ed 2:2014) (Clause 5.4.9)
Impulse test EN 62368-1
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 156 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Clause 5.4.10.2.2)IEC 62368-1 (ed 2:2014)(Clause 5.4.10.2.2)
Steady-state test (electric strength test)
EN 62368-1 (Clause 5.4.10.2.3)IEC 62368-1 (ed 2:2014)(Clause 5.4.10.2.3)
Capacitor discharge EN 62368-1 (Clause 5.5.2.2)IEC 62368-1 (ed 2:2014)(Clause 5.5.2.2)
Resistance of the Protective Bonding System (Earth bond test)
EN 62368-1 (Clause 5.6.6)IEC 62368-1(ed 2:2014) (Clause 5.6.6)
Prospective touch voltage, touch current and protective conductor current
EN 62368-1 (Clause 5.7)IEC 62368-1(ed 2:2014) (Clause 5.7)
Power source circuit classification EN 62368-1 (Clause 6.2.2)IEC 62368-1 (ed 2:2014) (Clause 6.2.2)
Static stability EN 62368-1 (Clause 8.6.2)IEC 62368-1(ed 2:2014) (Clause 8.6.2)
Horizontal force test EN 62368-1 (Clause 8.6.5)IEC 62368-1 (ed 2:2014) (Clause 8.6.5)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 157 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Equipment mounted to a wall or ceiling
EN 62368-1 (Clause 8.7)IEC 62368-1(ed 2:2014) (Clause 8.7)
Handle strength EN 62368-1 (Clause 8.8)IEC 62368-1(ed 2:2014) (Clause 8.8)
Cart, stand or carrier loading test EN 62368-1 (Clause 8.10.3)IEC 62368-1 (ed 2:2014)
Input test (Clause 8.10.3)EN 62368-1 (Annex B.2.5)IEC 62368-1 (Annex B.2.5)
Simulated abnormal operating conditions / Simulated single fault conditions
EN 62368-1 (Annex B.2.5)IEC 62368-1(ed 2:2014) (Annex B.2.5)
Test for the permanence of marking
EN 62368-1 (Annex F.3.9)IEC 62368-1 (ed 2:2014) (Annex F.3.9)
Mains supply connection (Cord anchorage)
EN 62368-1 (Annex G.7)IEC 62368-1 (ed 2:2014) (Annex G.7)
Criteria for telephone ringing signals (TNV circuit test)
EN 62368-1 (Annex H)IEC 62368-1 (ed 2:2014) (Annex H)
Leakage Current EN 62368-1 (Annex M.6.2)IEC 62368-1(ed 2:2014) (Annex M.6.2)
Limited power source EN 62368-1 (Annex Q.1)IEC 62368-1(ed 2:2014) (Annex Q.1)
Steady force test EN 62368-1 (Annex T.2)IEC 62368-1(ed 2:2014) (Annex T.2)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 158 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Steady force test EN 62368-1 (Annex T.3)IEC 62368-1(ed 2:2014) (Annex T.3)
Steady force test EN 62368-1 (Annex T.4)IEC 62368-1(ed 2:2014) (Annex T.4)
Steady force test EN 62368-1 (Annex T.5)IEC 62368-1(ed 2:2014) (Annex T.5)
Enclosure impact test EN 62368-1 (Annex T.6)IEC 62368-1 (ed 2:2014) (Annex T.6)
Impact test EN 62368-1 (Annex T.9)IEC 62368-1 (ed 2:2014) (Annex T.9)
5. Audio video and similar electronic apparatus-safety requirements-Plasma/LCD/LED TVs, Optical disc players, Amplifier, Musical Systems, Electronic video games, Power adapter for audio, video and similar electronic apparatus
Non-Separable Thin Sheet Insulation Test
EN/IEC 60065:2014, (Clause 8.21)IS 616: 2017-Rev 5, (Clause 8.21)
Fixing Of Actuating Elements EN/IEC 60065:2014, (Clause 12.2)IS 616: 2017-Rev 5, (Clause 12.2)
Apparatus containing coin/button cell batteries-Crush test
EN/IEC 60065:2014, (Clause 12.7.3.6)IS 616: 2017-Rev 5, (Clause 12.7.3.6)
Test of Edges and corners EN/IEC 60065:2014, (Clause 19.5)IS 616: 2017-Rev 5, (Clause 19.5)
Apparatus to be connected to the telecommunication networks
EN/IEC 60065:2014,Annexure BIS 616: 2017-Rev 5, Annexure B
Insulated winding wires for use without interleaved insulation
EN/IEC 60065:2014, Annexure HIS 616: 2017-Rev 5, Annexure H
Alternative method for determining minimum clearances
EN/IEC 60065:2014, Annexure J, IS 616: 2017-Rev 5, Annexure J
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 159 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Impulse test generators EN/IEC 60065:2014, Annexure KIS 616: 2017-Rev 5, Annexure K
V. MEDICAL ELECTRICAL EQUIPMENT
1. Applied Electromagnetic radiation equipment; Applied Current/Energy Equipment;Ultrasound Equipment; Cardio, Vascular and Pulmonary Equipment; General Medical Equipment; Patient-monitoring Equipment
Document Review IEC 60601-1-6 (3rd Edition):2010 ENVIRONMENTAL Test conditions of transport and storage
IEC 60601-1-11 (1st Edition):2010 Sub-Clause. 4.2.1
ENVIRONMENTAL Test operation condition
IEC 60601-1-11 (1st Edition): 2010 Sub-Clause. 4.2.2
Harmful Ingress of Liquids Test
IEC 60601-1-11 (1st Edition):2010/Sub-Clause. 8.3
FREE FALL Test
IEC 60601-1-11 (1st Edition):2010 Sub Clause:10.1.3d
2. Ambulatory Electrocardiographic System
Drop Impact Test IEC 60601-2-47 (2nd Edition):2012 Sub Clause. 201.15.3.4.2
Linearity and dynamic range IEC 60601-2-47 (2nd Edition):2012 Sub Clause. 201.12.4.4.101
Input Impedance
IEC 60601-2-47 (2nd Edition):2012Sub Clause. 201.12.4.4.102
Common Mode Rejection
IEC 60601-2-47 (2nd Edition):2012
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 160 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Sub Clause. 201.12.4.4.103Gain Accuracy IEC 60601-2-47
(2nd Edition):2012Sub Clause. 201.12.4.4.104
Multichannel Crosstalk IEC 60601-2-47 (2nd Edition):2012 Sub Clause. 201.12.4.4.107
Frequency Response IEC 60601-2-47 (2nd Edition):2012Sub Clause. 201.12.4.4.108
Function In the Presence of Pacemaker Pulses
IEC 60601-2-47 (2nd Edition):2012Sub Clause. 201.12.4.4.109
Timing Accuracy IEC 60601-2-47 (2nd Edition):2012 Sub Clause. 201.12.4.4.110
GAIN Settings and Switching
IEC 60601-2-47 (2nd Edition):2012Sub Clause. 201.12.4.4.111
.3 Applied Electromagnetic radiation equipment; Applied Current/Energy Equipment;Ultrasound Equipment; Cardio, Vascular and Pulmonary Equipment; General Medical Equipment;
Power input Test UL 60601-1 (1st Edition):2003 Revision 2006IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995(Clause. 7.1)
Voltage limitation Test
UL 60601-1 (1st Edition):2003 Revision 2006IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995(Clause. 15)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 161 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Patient-monitoring Equipment
Earthing and potential equalization Test
UL 60601-1 (1st Edition):2003 Revision 2006IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995(Clause. 18 f)
Dielectric voltage withstand Test
UL 60601-1 (1st Edition): 2003 Revision 2006IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995 (Clause. 20.4)
Leakage current Test
UL 60601-1 (1st Edition): 2003 Revision 2006IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995(Clause. 19)
Temperature Test
UL 60601-1 (1st Edition):2003 Revision 2006IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995(Clause. 42)
Humidity conditioning Test
UL 60601-1 (1st Edition):2003 Revision 2006IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995(Clause. 44.5)
Abnormal operations and fault UL 60601-1 (1st Edition):2003
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 162 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
conditions Test
Revision 2006IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995(Clause. 52)
Marking durability Test
UL 60601-1 (1st Edition):2003 Revision 2006IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995(Clause. 6.1)
Enclosure mechanical strength
UL 60601-1 (1st Edition):2003 Revision 2006IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995(Clause. 21a,b)
Stability and transportability Test
UL 60601-1 (1st Edition):2003 Revision 2006IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995(Clause. 24)
Ball pressure Test
UL 60601-1 (1st Edition):2003 Revision 2006IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995 (Clause. 59.2)
Legibility of Markings IEC 60601-1 (3rd Edition):2005
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 163 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Amd 1:2012, Clause. 7.1.2IS 13450 (Part 1):2008, Clause. 7.1.2
Voltage mismatch
IEC 60601-1 (3rd Edition): 2005, Amd. 1:2012, Clause. 7.2.6IS 13450 (Part 1):2008, Clause. 7.2.6
Shorting one MOP
IEC 60601-1 (3rd Edition): 2005, Amd. 1:2012, Clause. 8.1bIS 13450 (Part 1):2008, Clause. 8.1b
Incorrect Polarity
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, IS 13450 (Part 1):2008, Clause. 8.2.2
Patient Lead Connection
IEC 60601-1 (3rd Edition):2005 Amd. 1:2012, Clause. 8.5.2.3IS 13450 (Part 1):2008, Clause. 8.5.2.3
Working Voltage Measurement
IEC 60601-1 (3rd Edition): 2005, Amd. 1:2012, Clause. 8.5.4IS 13450 (Part 1):2008, Clause. 8.5.4
Thermal Cycling for spaces filled with insulating material,
IEC 60601-1 (3rd Edition): 2005, Amd. 1:2012, Clause. 8.9.5IS 13450 (Part 1):2008, Clause. 8.9.5
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 164 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Temperature and Overload Control Device
IEC 60601-1 (3rd Edition):2005Amd. 1:2012,Clause. 15.4.2.1IS 13450 (Part 1):2008, Clause. 15.4.2.1
Reverse Battery Connection/Overcharging by inspection
IEC 60601-1 (3rd Edition):2005 Amd. 1:2012, Clause. 15.4.3 IS 13450 (Part 1):2008, Clause. 15.4.3
Transformer Short Circuit
IEC 60601-1 (3rd Edition):2005 Amd. 1:2012, Clause. 15. 5.1.2IS 13450 (Part 1):2008, Clause. 15. 5.1.2
Amd. 1:2012, Clause. 15.5.1.3IS 13450 (Part 1):2008, Clause. 15.5.1.3
Transformer Dielectric Voltage Withstand
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 15.5.2IS 13450 (Part 1):2008, Clause. 15.5.2
ME System Leakage Current
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 16.6.1
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 165 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS 13450 (Part 1):2008, Clause. 16.6.1
Limitation of Voltage, Current or Power
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 8.4.2IS 13450 (Part 1):2008, Clause. 8.4.2
Defib-Proof Applied Parts- Common mode test
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 8.5.5 IS 13450 (Part 1): 2008
Defib-Proof Applied Parts- Differential mode test
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 8.5.5 IS 13450 (Part 1):2008
Defib-Proof Applied Parts- Energy Reduction
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 8.5.5.2IS 13450 (Part 1):2008, Clause. 8.5.5.2
Stability and transportability Test IEC 60601-1 (3rd Edition):2005 Amd. 1:2012, Clause. 9.4.2 IS 13450 (Part 1):2008
Cord Anchorage IEC 60601-1 (3rd Edition):2005 Amd. 1:2012, Cl. 8.11.3.5
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 166 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS 13450 (Part 1):2008, Clause. 8.11.3.5
Cord Bending
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 8.11.3.6IS 13450 (Part 1):2008, Clause. 8.11.3.6
Measurement of Gaps(Trapping Zones)
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 9.2.2.2IS 13450 (Part 1):2008, Clause. 9.2.2.2
Mobile Equipment Force for Propulsion
IEC 60601-1 (3rd Edition): 2005/Amd. 1:2012, Clause. 9.4.2.4.2IS 13450 (Part 1):2008
Mobile Equipment Over a Threshold
IEC 60601-1 (3rd Edition):2005 Amd. 1:2012, Clause. 9.4.2.4.3IS 13450 (Part 1):2008, Cl. 9.4.2.4.3
Instability from Unwanted Lateral Movement(Including Sliding),
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 9.4.3.1IS 13450 (Part 1):2008, Clause. 9.4.3.1
Handle Loading,
IEC 60601-1 (3rd Edition):2005 Amd 1:2012, Cl. 9.4.4
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 167 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IS 13450 (Part 1):2008, Clause. 9.4.4Mechanical Strength-Patient Support System
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 9.8.3.1IS 13450 (Part 1):2008, Clause. 9.8.3.1
Mechanical Strength-Foot Rest
IEC 60601-1 (3rd Edition):2005 Amd. 1:2012, Clause. 9.8.3.2IS 13450 (Part 1):2008, Clause. 9.8.3.2
Mechanical Strength-Dynamic Forces
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 9.8.3.3IS 13450 (Part 1):2008, Clause. 9.8.3.3
Suspension system w/Safety Devices Loading
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 9.8.4IS 13450 (Part 1):2008, Clause. 9.8.4
Harmful Ingress IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 11.6.5IS 13450 (Part 1):2008, Clause. 11.6.5
Cleaning and Disinfection of ME Equipment’s and ME Systems
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 11.6.6IS 13450 (Part 1):2008, Clause. 11.6.6
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 168 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Actuating Parts of Control of ME Equipment
IEC 60601-1 (3rd Edition): 2005/Amd. 1:2012, Clause. 15.4.6IS 13450 (Part 1):2008, Clause. 15.4.6
Cord-Connected Foot Operated Control Devices
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 15.4.7.1IS 13450 (Part 1):2008, Clause. 15.4.7.1
Short Circuiting in Lieu of Spacing
IEC 60601-1 (3rd Edition):2005 Amd. 1:2012, Clause. 8.9.2IS 13450 (Part 1):2008, 8.9.2
Overflow
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 11.6.2IS 13450 (Part 1):2008, Clause. 11.6.2
Spillage
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 11.6.3IS 13450 (Part 1):2008, Clause. 11.6.3
Leakage
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 11.6.4IS 13450 (Part 1):2008, Clause. 11.6.4
Acoustic Energy Measurement
IEC 60601-1 (3rd Edition):2005Amd. 1:2012, Clause. 9.6.2.1IS 13450 (Part 1):2008, Clause. 9.6.2.1
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 169 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Power input Test
IEC 60601-1 (3rd Edition):2005IS 13450 (Part 1):1994IS 13450 (Part 1):2008 (Clause. 4.11)
Voltage or Charge Limitation
IEC 60601-1 (3rd Edition):2005IS13450 (Part 1):2008(Clause. 8.4.3)
Impedance and Current Carrying Capability
IEC 60601-1 (3rd Edition):2005IS13450 (Part 1):2008(Clause. 8.6.4a)
Dielectric voltage withstand Test
IEC 60601-1 (3rd Edition):2005IS13450 (Part 1):2008(Clause. 8.8)
Leakage current Test
IEC 60601-1 (3rd Edition):2005IS13450 (Part 1):2008(Clause. 8.7)
Temperature Test
IEC 60601-1 (3rd Edition): 2005/IS13450 (Part 1):2008(Clause. 11)
Marking durability Test
IEC 60601-1 (3rd Edition):2005IS13450 (Part 1):2008(Clause. 7.1.3)
Humidity conditioning Test
IEC 60601-1 (3rd Edition):2005IS13450 (Part 1):2008(Clause. 5.7)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 170 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Interruption power supply Test
IEC 60601-1 (3rd Edition):2005IS13450 (Part 1):2008(Clause. 11.8)
Abnormal operations and fault conditions Test
IEC 60601-1 (3rd Edition): 2005/IS13450 (Part 1):2008(Clause. 13)
Enclosure mechanical strength
IEC 60601-1 (3rd Edition):2005IS 13450 (Part 1):2008 (Clause. 15.3)
Instability Hazards
IEC 60601-1 (3rd Edition):2005IS 13450 (Part 1):2008 (Clause. 9.4.3)
Ball pressure Test
IEC 60601-1 (3rd Edition):2005IS 13450 (Part 1):2008 (Clause. 8.8.4.1)
Defibrillation-Proof Applied Parts
IS 13450 (Part 1):1994, Clause. 17IEC 60601-1 (2nd Edition): 1988 AM 1:1991, AM 2:1995, Clause. 17UL 60601-1 (1st Edition): 2003 Revision 2006, Clause. 17
Handle Loading Test
IS 13450 (Part 1):1994, Clause. 21IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 21UL 60601-1 (1st Edition):2003Revision 2006,Clause. 21
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 171 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Mechanical Strength-Patient Support System
IS13450 (Part 1):1994, Clause. 21.3IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 21.3UL 60601-1(1st Edition):2003 Revision 2006, Clause. 21.3
Mechanical Strength-Foot Rests/Chairs
IS 13450 (Part 1):1994, Clause. 21.3IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 21.3UL 60601-1 (1st Edition):2003 Revision 2006,Clause. 21.3
Drop Impact Test
IS 13450 (Part 1):1994, Clause. 21.5IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 21.5UL 60601-1 (1st Edition):2003Revision 2006,Clause. 21.5
Rough Handling-Drop Test
IS13450 (Part 1):1994, Clause. 21.6IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 21.6UL 60601-1 (1st Edition):2003Revision 2006,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 172 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Clause. 21.6Rough Handling-Roll Off Step Test
IS 13450 (Part 1):1994, Clause. 21.6IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 21.6UL 60601-1 (1st Edition):2003Revision 2006,Clause. 21.6
Suspension System With Safety Devices Loading Test
IS 13450 (Part 1):1994, Clause. 28.3IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 28.3UL 60601-1 (1st Edition):2003Revision 2006,Clause. 28.3
Suspension Systems without Safety Device Loading Test
IS 13450 (Part 1):1994, Clause. 28.4IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 28.4UL 60601-1 (1st Edition):2003Revision 2006,Clause. 28.4
Harmful Ingress of Liquids Test
IS13450 (Part 1):1994, Clause. 44.6IEC 60601-1 (2nd Ed.) 1988 AM 1:1991, AM 2:1995, Clause. 44.6
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 173 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
UL 60601-1 (1st Ed ):2003 Revision 2006,Clause. 44.6
Overflow, Spillage, Leakage, Cleaning, Disinfection, Harmful Ingress Of Liquids,
IS13450 (Part 1):1994, Clause. 44IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 44UL 60601-1 (1st Edition):2003 Revision 2006,Cl. 44
Actuating Parts of Controls
UL 60601-1 (1st Edition):2003Revision 2006, Clause. 56.10IS 13450 (Part 1):1994, Clause. 56.10IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 56.10
Cord Connected Foot Switch Test
UL 60601-1 (1st Edition):2003 Revision 2006, Clause. 56.11IS13450 (Part 1):1994, Cl. 56.11IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 56.11
Cord Anchorages,
UL 60601-1 (1st Edition):2003 Revision 2006,Clause. 57.4IS 13450 (Part 1):1994, Clause. 57.4
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 174 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 57.4
Cord Bending
UL 60601-1 (1st Edition):2003 Revision 2006,Clause. 57.4IS 13450 (Part 1):1994, Clause. 57.4IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 57.4
Transformer Overload and Short-Circuit Tests,
UL 60601-1 (1st Edition):2003 Revision 2006,Clause. 57.9.1IS 13450 (Part 1) Clause. 57.9.1IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 57.9.1
Transformer Dielectric Voltage Withstand
UL 60601-1 (1st Edition):2003 Revision 2006, Clause. 57.9.4IS 13450 (Part 1):1994, Clause. 57.9.4IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 57.9.4
Interruption of Power Supply
UL 60601-1 (1st Edition):2003 Revision 2006, Clause. 56.7IS 13450 (Part 1):1994, Clause. 49IEC 60601-1 (2nd Edition):1988 AM
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 175 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
1:1991, AM 2:1995, Clause. 49Reversed Battery Connection by inspection
UL 60601-1 (1st Edition):2003 Revision 2006, Clause. 56.7IS13450 (Part 1):1994, Clause. 56.7IEC 60601-1 (2nd Edition):1988 AM 1:1991, AM 2:1995, Clause. 56.7
5. Pulse oximeter Equipment
Additional requirements for ingress of water or (Particulate matter into ME equipment or ME system)
DS/EN ISO 80601-2-61(1st Edition):2011 Clause. 201.11.6.5.101
Settings and data storage following short interruptions or automatic switchover
DS/EN ISO 80601-2-61(1st Edition):2011 Clause. 201.11.8.101.2
Detection of pulse oximeter probe faults and probe cable extender faults
DS/EN ISO 80601-2-61 (1st Edition):2011 Clause. 201.13.101
6. Electrocardiographic Monitoring Equipment
Defibrillation protection-common mode Test
IEC 60601-2-27 (3rd Edition): 2011Clause. 201.8.5.5.1
Differential mode Test IEC 60601-2-27 (3rd Edition):2011, Clause. 201.8.5.5.1
Ingress of water or (Particulate matter into ME Equipment and ME System)
IEC 60601-2-27 (3rd Edition):2011 Clause. 201.11.6.5
Interruption):of the power supply / IEC 60601-2-27 (3rd Edition):2011,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 176 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
supply mains to ME Equipment Clause. 201.11.8Accuracy of signal reproduction IEC 60601-2-27 (3rd Edition): 2011,
Clause. 201.12.1.101.1Input dynamic range and differential offset voltage
IEC 60601-2-27 (3rd Edition): 2011,Clause. 201.12.1.101.2
Input impedance
IEC 60601-2-27 (3rd Edition):2011,Clause. 201.12.1.101.3
Input Noise
IEC 60601-2-27 (3rd Edition):2011,Clause. 201.12.1.101.4
Multichannel crosstalk
IEC 60601-2-27 (3rd Edition):2011,Clause. 201.12.1.101.5
GAIN control and stability
IEC 60601-2-27 (3rd Edition):2011,Clause. 201.12.1.101.6
Sweep speed
IEC 60601-2-27 (3rd Edition):2011,Clause. 201.12.1.101.7
Frequency and impulse response IEC 60601-2-27 (3rd Edition):2011, Clause. 2 01.12.1.101.8
Gain Indicator IEC 60601-2-27 (3rd Edition):2011, Clause2 01.12.1.101.9
Common mode rejection IEC 60601-2-27 (3rd Edition):2011, Clause. 201.12.1.101.10
Baseline reset IEC 60601-2-27 (3rd Edition):2011, Clause. 201.12.1.101.11
Rejection of pacemaker pulses IEC 60601-2-27 (3rd Edition):2011,
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 177 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Clause. 201.12.1.101.137. Electrocardiographic
monitoring EquipmentSynchronizing pulse for cardio version
IEC 60601-2-27 (3rd Edition):2011, Clause. 201.12.1.101.14
Heart rate range, accuracy, and QRS detection range
IEC 60601-2-27 (3rd Edition):2011, Clause. 201.12.1.101.15
Channel height and aspect ratio
IEC 60601-2-27 (3rd Edition):2011,Cl. 201.12.1.101.16
Tall T-wave rejection capability
IEC 60601-2-27 (3rd Edition):2011,Clause. 201.12.1.101.17
Electrodes and Patient Cables
IEC 60601-2-27 (3rd Edition):2011,Clause. 201.15.3.4.101
Time to alarm for heart rate alarm conditions
IEC 60601-2-27 (3rd Edition):2011, Clause. 208.6.6.2.103
Technical alarm condition indicating inoperable ME equipment
IEC 60601-2-27 (3rd Edition):2011, Clause. 208.6.6.2.104
8. Multifunction patient monitor Equipment
Part Leakage Current IEC 60601-2-49 (2nd Edition):2011-02 Clause. 201.8.7.1.101
Ingress of water or (Particulate matter into Medical Equipment and Medical Systems
IEC 60601-2-49 (2nd Edition):2011-02 Clause. 201.11.6.5
9. Electro-cardiograph Equipment
Interruption):of the power supply / Supply Mains to Medical Equipment
IEC 60601-2-49 (2nd Edition):2011-02 Clause. 201.11.8
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 178 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Defibrillation protection
IEC 60601-2-25 (2nd Edition):2011Clause. 201.8.5.5.1
Requirements for amplitude measurements
IEC 60601-2-25 (2nd Edition):2011 Clause. 201.12.1.101.2
Requirements for absolute interval and wave duration measurements
IEC 60601-2-25 (2nd Edition):2011 Clause. 201.12.1.101.3.1
Requirements for interval measurements on biological ECG
IEC 60601-2-25 (2nd Edition):2011Clause. 201.12.1.101.3.2
Indication of inoperable Electrocardiograph
IEC 60601-2-25 (2nd Edition):2011 Clause. 201.12.4.101
Goldberger and Wilson Leads
IEC 60601-2-25 (2nd Edition):2011Cl. 201.12.4.102.3.2
Recovery time
IEC 60601-2-25 (2nd Edition):2011Clause. 201.12.4.102.4
Input impedance
IEC 60601-2-25 (2nd Edition):2011Clause. 201.12.4.103
Common Mode Rejection
IEC 60601-2-25 (2nd Edition):2011Clause. 201.12.4.105.1
Overload tolerance IEC 60601-2-25 (2nd Edition):2011Clause. 201.12.4.105.2
Noise Level
IEC 60601-2-25 (2nd Edition):2011Clause. 201.12.4.106.1
Channel crosstalk IEC 60601-2-25 (2nd Edition):2011
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 179 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Clause. 201.12.4.106.2Low frequency (impulse) response
IEC 60601-2-25 (2nd Edition):2011Cl. 201.12.4.107.1.1.2
Test with calibration ECGS
IEC 60601-2-25 (2nd Edition):2011Cl. 201.12.4.107.1.2
Linearity and dynamic range IEC 60601-2-25 (2nd Edition):2011Cl. 201.12.4.107.2
Recording speed
IEC 60601-2-25 (2nd Edition):2011Cl. 201.12.4.108.3.2
Use with cardiac pacemakers
IEC 60601-2-25 (2nd Edition):2011Clause. 201.12.4.109
VI. MISCELLANEOUS PRODUCTS: PHOTOVOLTAIC EQUIPMENT
1. Thin-Film Terrestrial Photovoltaic (PV) Modules- Design Qualification and Type Approval
Measurement of nominal operating cell temperature (NOCT)
IEC 61646 (2nd Edition): 2008-05. (Clause. 10.5)IS 16077 : 2013, (Clause 10.5) (Primary Method)
Outdoor exposure Test IEC 61646 (2nd Edition): 2008-05. Clause. 10.8IS 16077:2013, Clause 10.8
2. Crystalline Silicon Terrestrial Photovoltaic (PV) Modules- Design
Measurement of nominal operating cell temperature (NOCT)
IEC 61215 (2nd Edition): 2005-04 (Clause. 10.5)IS 14286:2010, (Clause 10.5)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 180 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Qualification and Type Approval
(Primary Method)Outdoor exposure Test IEC 61215 (2nd Edition): 2005-04
(Clause 10.8)IS 14286 : 2010, (Clause 10.8)
VII. SAFETY TESTING FACILITY
1. Automatic Data Processing Machine, Laptop/Notebook/Tablet, Printers, Plotters, Scanners, Set Top Box, Telephone Answering Machines, Visual Display Units, Videos Monitors, Wireless Keyboards, Cash Registers, Copying Machines/Duplicators, Passport Reader, Point Of Sale Terminals, Mail Processing Machines/Postage Machines/Franking
Impact EN 62368-1 Clause 4.8.4.5IEC 62368-1 (ed2:2014)Clause 4.8.4.5
Thermal cycling EN 62368-1 Clause 5.4.1.5.3IEC 62368-1 (ed2:2014)Clause 5.4.1.5.3
Determining the adequacy of a clearance using an electric strength test
EN 62368-1 Clause 5.4.2.4IEC 62368-1 (ed2:2014)Clause 5.4.2.4
Standard test procedure for non-separable thin sheet material
EN 62368-1 Clause 5.4.4.6.4IEC 62368-1 (ed2:2014)Clause 5.4.4.6.4
Mandrel test EN 62368-1 Clause 5.4.4.6.5IEC 62368-1 (ed2:2014)Clause 5.4.4.6.5
Tests for semiconductor components and for cemented
EN 62368-1 Clause 5.4.7IEC 62368-1 (ed2:2014)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 181 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Machines, Power Banks For Use In Portable Applications, Smart Card Reader, Mobile Phones, Power Adaptors, CCTV Cameras/ CCTV Recorders, USB Driven Barcode Reader, Barcode Scanners/Iris Scanners/ Optical Fingerprint Scanners, Smart Watches, Computer Systems. Plasma/LCD/LED TVs, Optical disc players, Amplifier, Musical Systems, Electronic video games, Power adapter for audio, video and similar electronic apparatus
joints Clause 5.4.7Test method and compliance criteria
EN 62368-1 Clause 5.4.11.3IEC 62368-1 (ed2:2014)Clause 5.4.11.3
Top openings and top opening properties
EN 62368-1 Clause 6.4.8.3.3IEC 62368-1 (ed2:2014)Clause 6.4.8.3.3
Test method EN 62368-1 Clause 8.5.4.2.4IEC 62368-1 (ed2:2014)Clause 8.5.4.2.4
High pressure lamps EN 62368-1 Clause 8.5..5IEC 62368-1 (ed2:2014)Clause 8.5..5
Static stability test EN 62368-1 Clause 8.6.2.2IEC 62368-1 (ed2:2014)Clause 8.6.2.2
Downward force test EN 62368-1 Clause 8.6.2.3IEC 62368-1 (ed2:2014)Clause 8.6.2.3
Relocation stability test EN 62368-1 Clause 8.6.3IEC 62368-1 (ed2:2014)Clause 8.6.3
Glass slide test EN 62368-1 Clause 8.6.4IEC 62368-1 (ed2:2014)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 182 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Clause 8.6.4Wheels or casters attachment requirement
EN 62368-1 Clause 8.9 (8.9.1 & 8.9.2)IEC 62368-1 (ed2:2014)Clause 8.9 (8.9.1 & 8.9.2)
Mounting means for rack mounted equipment
EN 62368-1 Clause 8.11 ( 8.11.1 to 8.11.5)IEC 62368-1 (ed2:2014)Clause 8.11 ( 8.11.1 to 8.11.5)
ELECTRONICS TESTING
LOCATION 3
I. SAFETY TESTING FACILITY
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 183 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
1. SAR Testing : Electrical Equipment, Electronic Instrument, Electronic Component,Electronic Subassemblies
SAR – Wireless Devices used in close proximity to Head
IEC 62209-1: Edition 2.0 2016-07EN 62209-1: Edition 2.0 2016-11IEC 62479 : Edition 1.0, 2010-06EN 62479 : 2010-09/EN 50360: 2017TEC/GR/SAR/001/01.MAR-09
SAR – Wireless Devices used in close proximity to Human Body
IEC 62209-2 : Edition 1.1 /AMD 1: 2019 -05IEC 62209-2: Edition 1.0 2010-03EN 62209-2: 2010-06EN 62479 : 2010-09EN 50360: 2017EN 50566: 2017-10TEC/GR/RS/SAR-002/01/JUL 17
SAR – Wireless Devices used in close proximity to Head
IEEE 1528 – 2013-06
MPE (Maximum Permissible Emission)
IEC 62311: Edition 1.0 2007-08 IEC 62311: Edition 2.0 2019-04 KDB-447498 DO 01:2015
ELECTRONICS ESTING
MOBILE TESTING FACILITY
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 184 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
I. MISCELLANEOUS PRODUCTS: PHOTOVOLTAIC EQUIPMENT
1. Crystalline Terrestrial PV Module
Visual Examination IEC 61215, 2005-04 (Cl ause 10.1 )IS 14286: 2010 (Cl ause 10.1)IEC 61215-2:2016 (Cl ause 4.1) (MQT01)
Maximum Power Determination IEC 61215:2005-04 (Cl ause 10.2)IEC 61215-2:2016 (Cl ause 4.2) (MQT 02)IS 14286: 2010 (Cl ause 10.2)
Performance Measurement at Low Irradiation
IEC 61215:2005 (Cl ause 10.7)IEC 61215-2:2016 (Cl ause 4.7) (MQT 07)IS 14286: 2010 (Cl ause 10.7)
Insulation Test IEC 61215 (2nd Edition):2005-04 (Clause 10.3)IS 14286: 2010 (Clasue 10.3)
2. Thin Film PV Module (Cd Te, CIS, a-Si)
Visual Examination IEC 61646:2008-05 (Clause 10.1)IS 16077: 2013 (Clause 10.1)
Maximum Power Determination IEC 61646:2008-05 (Clause 10.2)IS 16077: 2013 (Clause 10.2)
Performance Measurement at IEC 61646:2008-05 (Clause 10.7)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 185 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Low Irradiation IS 16077: 2013 (Clause 10.7)Insulation Test IEC 61646:2008-05 (Clause 10.3)
IS 16077: 2013 (Clause 10.3)3. PV Module Electroluminescence imaging Laboratory Test Method-12-LO-S0884
MECHANICAL TESTING
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 186 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
LOCATION 1
I. PLASTICS & POLYMER (PAPER & PAPER PRODUCTS)
1. Plastics & PolymerFiber Reinforced Plastic Products
Tensile Strength ISO 527-4 (Type 2 and Type 3 specimens), ISO 527-5 / ASTM D 3039
Tensile E Modulus ISO 527-4, ISO 527-5 / ASTM D 3039 Compressive Strength ASTM D 3410, ASTM D 6641 Compressive Modulus ASTM D 3410, ASTM D 6641 Flexural Strength ASTM D 7264 Apparent interlaminar shear strength by short-beam method
ASTM D 2344
Shear Properties of composite material by V Notch rail shear
ASTM 7078
Shear Modulus of Elasticity ASTM D 7078 Density/Specific Gravity ASTM D 792/ ISO 1183-1
(Method A)Performance Testing ISO 11607-1, 2006 + Amd 1:2014,
ISTA 2A:20112. Plastics & Polymer
Packaging and Containers.Plastic films.
Atmospheric Preconditioning-Temperature and Humidity
Sequence 1
Atmospheric Conditioning-Controlled Temperature and
Sequence 2 (ASTM D 4332:2014)
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 187 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Plastic sheets.
Paper and Paper ProductsPaper.Paper Board
HumidityCompression Test-Machine Apply and Hold method
Sequence 3 (ASTM D 642:2015)
Vibration Test-Random method Sequence 4 and 6(ASTM D 4728:2012)
Drop Test-Free fall method Sequence 5(ASTM D 5276:2009)
Performance Testing ISO 11607-1, 2006 + Amd 1:2014, ASTM D 4169-2016
Low Pressure (High Altitude) Hazard
Schedule I-Upto Altitude 14,000 feet (ASTM D 6653/ D 6653M:2017)
Concentrated Impact-Guided free fall
Schedule J-Upto 1 meter(ASTM D 6344:2017)
3. Plastics and PolymersPackaging and Containers.Plastic films.Plastic sheets.
Paper and Paper ProductsPaper.Paper BoardSterile Barrier and
Stability Testing ISO 11607-1, 2006 + Amd 1:2014 and ISO 11607-2
Thermal test-Accelerated Aging test
ASTM F 1980:2016
Integrity Testing ISO 11607-1, 2006 + Amd 1:2014 Visual Inspection ASTM F 1886:2016Seal Strength ASTM F 88A:2015-Technique A and
EN 868-5-Annex D)Resistance of Impermeable Materials (Air Permeance)
Annex C(ISO 11607-1)
Internal Pressure (Bubble Test) ASTM F 2096:2002
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 188 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Package Systems of Medical Devices
Seal Strength(Burst Test)
ASTM F 1140:2013-Test Method A and ASTM F 2054:2013-Closed Package
Integrity-Dye Penetration ASTM F 1929:2015-Technique ADetermination of peel characteristics of paper/ plastic laminate products (Hand peel)
EN 868-5-Annex E
Linear Measurement of seal width ASTM F 2203
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 189 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
RADIOLOGICAL TESTING
I. RADIATION SOURCES
1. X-Ray Equipment
(Three Phase Voltage: Upto 600V AC, 120A, 50/60HzSingle Phase Voltage: Upto 300V AC, 100A, 50/60Hz)
Measurement of first HALF-VALUE LAYER
IEC 60601-1-3 (2nd Edition): 2008 Amd.1: 2013/Clause. 7.1AIS 13450 (Part 1/ Sec 3): 2014Clause. 7.1A
Measurement of the thickness of aluminum resulting in the same first HALF-VALUE LAYER in accordance with Table 3
IEC 60601-1-3 (2nd Edition): 2008 Amd. 1: 2013 Clause. 7.5IS 13450 (Part 1/ Sec 3): 2014Clause. 7.5
Measurement of first HALF-VALUE LAYER under NARROW BEAM CONDITIONS with X-RAY EQUIPMENT operating at X-RAY TUBE VOLTAGES in Table 3 at Corresponding LOADING FACTORS in NORMAL USE
IEC 60601-1-3 (2nd Edition): 2008 Amd. 1: 2013 Clause. 7.6IS 13450 (Part 1/ Sec 3): 2014Clause. 7.6
Measurement of Focal Spot To Image Receptor Distance In Selected Configurations And Settings Of Equipment
IEC 60601-1-3 (2nd Edition): 2008 Amd. 1: 2013 Clause. 8.5.2IS 13450 (Part 1/ Sec 3): 2014Clause. 8.5.2
Measurement of LEAKAGE IEC 60601-1-3 (2nd Edition): 2008
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 190 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
RADIATION in the LOADING STATE
Amd. 1: 2013 Clause. 12.4IS 13450 (Part 1/ Sec 3): 2014Clause. 12.4
Measurement of LEAKAGE RADIATION when not in the LOADING STATE
IEC 60601-1-3 (2nd Edition): 2008 Amd. 1: 2013 Clause. 12.5IS 13450 (Part 1/ Sec 3): 2014Clause. 12.5
STRAY RADIATION of X-RAY EQUIPMENT
IEC 60601-1-3 (2nd Edition): 2008 Amd. 1: 2013 Clause. 13.6AIS 13450 (Part 1/ Sec 3): 2014Clause. 13.6A
2. Computed tomography Equipment
(Three Phase Voltage: Upto 600V AC, 120A, 50/60HzSingle Phase Voltage: Upto 300V AC, 100A, 50/60Hz)
LEAKAGE CURRENTS and PATIENT AUXILIARY CURRENTS
IEC 60601-2-44 (3rd Edition): 2009 Corr. 1: 2009 Amd. 2: 2016Clause. 201.8.7IS 13450 (Part2/Sec44): 2007
Test for HALF-VALUE LAYER IEC 60601-2-44 (3rd Edition): 2009 Corr. 1: 2009 Amd. 2: 2016 Clause. 203.7.6 IS 13450 (Part2/Sec44): 2007
Protection against RESIDUAL RADIATION
IEC 60601-2-44 (3rd Edition): 2009 Corr. 1: 2009 Amd. 2: 2016 Clause. 203.11 IS 13450 (Part2/Sec44): 2007
3. X-ray equipment for interventional procedures
Reproducibility of the RADIATION output
IEC60601-2-43 (2nd edition): 2010 + Amd.1: 2017 Clause 203.6.3.2IS 13450 (Part2/Sec 43):2008
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 191 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Three Phase Voltage: Upto 600V AC, 120A, 50/60HzSingle Phase Voltage: Upto 300V AC, 100A, 50/60Hz)
Indication of LOADING FACTORS and MODES OF OPERATION
IEC60601-2-43(2nd edition)2010 + Amd.1: 2017 Clause203.6.4.3IS 13450 (Part2/Sec 43):2008
4. X-ray Equipment for Radiography and Radioscopy
(Three Phase Voltage: Upto 600V AC, 120A, 50/60HzSingle Phase Voltage: Upto 300V AC, 100A, 50/60Hz)
LEAKAGE CURRENTS and PATIENT AUXILIARY CURRENTS
IEC 60601-2-54 (1st Edition): 2009 + Amd. 1: 2015 + Amd. 2: 2018 Clause. 201.8.7IS 13450 (Part 2/Sec 54): 2016 Clause. 201.8.7
Reproducibility of Radiation Output in Radiography
IEC 60601-2-54 (1st Edition): 2009 + Amd. 1: 2015 + Amd. 2: 2018 Clause. 203.6.3.2.101IS 13450 (Part 2/Sec 54): 2016Clause. 203.6.3.2.101
Linearity and Constancy in Radiography
IEC 60601-2-54, (1st Edition): 2009 + Amd. 1: 2015 + Amd. 2: 2018 Clause. 203.6.3.2.102IS 13450 (Part 2/Sec 54): 2016Cl. 203.6.3.2.102
Accuracy of X-RAY TUBE VOLTAGE
IEC 60601-2-54, (1st Edition): 2009 + Amd. 1: 2015 + Amd. 2: 2018 Clause. 203.6.4.3.104.30IS 13450 (Part 2/Sec 54): 2016
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 192 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Cl. 203.6.4.3.104.30Accuracy of X-RAY TUBE CURRENT
IEC 60601-2-54 (1st Edition): 2009 + Amd. 1: 2015 + Amd. 2: 2018 Clause. 203.6.4.3.104.4 IS 13450 (Part 2/Sec54): 2016Clause. 203.6.4.3.104.4
Accuracy of LOADING TIME IEC 60601-2-54 (1st Edition): 2009 + Amd. 1: 2015 + Amd. 2: 2018 Clause. 203.6.4.3.104.5IS 13450 (Part 2/Sec 54): 2016Clause. 203.6.4.3.104.5
Accuracy of CURRENT TIME PRODUCT
IEC 60601-2-54, (1st Edition): 2009 + Amd. 1: 2015 + Amd. 2: 2018 Clause. 203.6.4.3.104.6IS 13450 (Part 2/Sec 54): 2016Clause. 203.6.4.3.104.6
Dosimetric Indication IEC 60601-2-54, (1st Edition): 2009 + Amd. 1: 2015 + Amd. 2: 2018 Clause. 203.6.4.5 IS 13450 (Part 2/Sec 54): 2016Clause. 203.6.4.5
5. Dental intra-oral X-ray Equipment
(Three Phase Voltage:
LEAKAGE CURRENTS and PATIENT AUXILIARY CURRENTS
IEC 60601-2-65, (1st Edition): 2012 + Amd. 1: 2017 Clause. 201.8.7IS 13450 (Part 2/Sec 65): 2016Clause. 201.8.7
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 193 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Upto 600V AC, 120A, 50/60HzSingle Phase Voltage: Upto 300V AC, 100A, 50/60Hz)
Protection against excessive temperatures of X-RAY MONOBLOCK ASSEMBLIES
IEC 60601-2-65, (1st Edition): 2012 + Amd. 1: 2017 Clause. 201.11.101IS 13450 (Part 2/Sec 65): 2016Clause. 201.11.101
Adjustment of RADIATION dose and RADIATION quality
IEC 60601-2-65, (1st Edition): 2012 + Amd. 1: 2017 Clause. 203.6.3.1IS 13450 (Part 2/Sec 65): 2016Clause. 203.6.3.1
Linearity of AIR KERMA IEC 60601-2-65, (1st Edition): 2012 + Amd. 1: 2017 Clause. 203.6.3.1.101IS 13450 (Part 2/Sec 65): 2016Clause. 203.6.3.1.101
Coefficient of variation of the AIR KERMA
IEC 60601-2-65, (1st Edition): 2012 + Amd. 1: 2017 Clause. 203.6.3.2.101IS 13450 (Part 2/Sec 65): 2016Clause. 203.6.3.2.101
Accuracy of X-RAY TUBE VOLTAGE
IEC 60601-2-65, (1st Edition): 2012 + Amd. 1: 2017 Cl. 203.6.4.3.102.2IS 13450 (Part 2/Sec 65): 2016Cl. 203.6.4.3.102.2
Accuracy of X-RAY TUBE CURRENT
IEC 60601-2-65, (1st Edition): 2012 + Amd. 1: 2017 Clause. 203.6.4.3.102.3IS 13450 (Part 2/Sec 65): 2016Cl. 203.6.4.3.102.3
Accuracy of IRRADIATION TIME IEC 60601-2-65, (1st Edition): 2012 +
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 194 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
Amd. 1: 2017 Cl. 203.6.4.3.102.4IS 13450 (Part 2/Sec 65): 2016Cl. 203.6.4.3.102.4
HALF-VALUE LAYERS and TOTAL FILTRATION in X-RAY EQUIPMENT
IEC 60601-2-65(1st Edition): 2012 + Amd. 1: 2017 Clause. 203.7.1IS 13450 (Part 2/Sec 65): 2016Clause. 203.7.1
LEAKAGE RADIATION in the LOADING STATE
IEC 60601-2-65, (1st Edition): 2012 + Amd. 1: 2017Clause. 203.12.4IS 13450 (Part 2/Sec 65): 2016Clause. 203.12.4
Positioning of the PATIENT and restriction of the irradiated area
IEC 60601-2-65, (1st Edition): 2012 Clause. 203.8.5.4IS 13450 (Part 2/Sec 65): 2016Clause. 203.8.5.4
6. X-ray tube assemblies for medical diagnosis(Three Phase Voltage: Upto 600V AC, 120A, 50/60HzSingle Phase Voltage: Upto 300V AC, 100A, 50/60Hz)
Maximum temperature during NORMAL USE
IEC 60601-2-28 (3rd Edition): 2017Clause. 201.11.1.1
7. Dental extra-oral X-ray Equipment
Adjustment of RADIATION dose and RADIATION quality
IEC 60601-2-63, (1st Edition): 2012 + Amd. 1: 2017 Clause. 203.6.3.1
Prince GargConvenor
Venugopal CProgram Manager
Laboratory UL India Lab, UL India Pvt. Ltd., Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, Karnataka
Location 1: Laboratory Building, Kalyani Platina Campus, Sy. No. 129/4, EPIP Zone, Phase-II, Whitefield, Bangalore, KarnatakaLocation 2: OAK Building, Kalyani Platina Campus, Sy. No 129/4, EPIP Zone, Phase-II , Whitefield, Bangalore, KarnatakaLocation 3: 30/A, I Stage Vishveshwarya Industrial Estate, Doddanekkundi Industrial Area, Bangalore, Karnataka
Accreditation Standard ISO/IEC 17025: 2017
Certificate Number TC-6168 Page 195 of 195
Validity 04.10.2019 to 04.08.2020 Last Amended on --
S. No. Materials or Products tested
Component, parameter or characteristic tested/ Specific Test Performed/ Tests or type of tests performed
Test Method Specification against which tests are performed and/or the techniques/ equipment used
(Three Phase Voltage: Upto 600V AC, 120A, 50/60HzSingle Phase Voltage: Upto 300V AC, 100A, 50/60Hz)
IS 13450 (Part 2/Sec 63): 2016Clause. 203.6.3.1
Linearity of AIR KERMA IEC 60601-2-63, (1st Edition): 2012 + Amd. 1: 2017 Clause. 203.6.3.1.101IS 13450 (Part 2/Sec 63): 2016Clause. 203.6.3.1.101
Coefficient of variation of the AIR KERMA
IEC 60601-2-63, (1st Edition): 2012 + Amd. 1: 2017 Clause. 203.6.3.2.101IS 13450 (Part 2/Sec 63): 2016Clause. 203.6.3.2.101
Accuracy of X-RAY TUBE VOLTAGE
IEC 60601-2-63, (1st Edition): 2012 + Amd. 1: 2017 Cl. 203.6.4.3.102.2IS 13450 (Part 2/Sec 63): 2016Cl. 203.6.4.3.102.2
Accuracy of X-RAY TUBE CURRENT
IEC 60601-2-63, (1st Edition): 2012 + Amd. 1: 2017 Clause. 203.6.4.3.102.3IS 13450 (Part 2/Sec 63): 2016Cl. 203.6.4.3.102.3
Accuracy of IRRADIATION TIME IEC 60601-2-63, (1st Edition): 2012 + Amd. 1: 2017 Cl. 203.6.4.3.102.4IS 13450 (Part 2/Sec 63): 2016
Prince GargConvenor
Venugopal CProgram Manager