persistent surveillance for pipeline protection and threat interdiction haibo huang rich stephens...
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![Page 1: PERSISTENT SURVEILLANCE FOR PIPELINE PROTECTION AND THREAT INTERDICTION Haibo Huang Rich Stephens Brian Vermillion Dan Goodin Bernie Kozioziemski (LLNL)](https://reader038.vdocument.in/reader038/viewer/2022102505/56649e575503460f94b4f861/html5/thumbnails/1.jpg)
PERSISTENT SURVEILLANCE FORPIPELINE PROTECTION AND THREAT INTERDICTION
Haibo HuangRich Stephens
Brian VermillionDan Goodin
Bernie Kozioziemski (LLNL)
HAPL Meeting, Livermore, California
June 20-21, 2005
Radiographic Dimension Measurement of Dry DVB Foam
Shells
IFT/P2005-072
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Summary
• IFE program uses 4.1 mm O.D. foam shells• Require dimension variations measured to
<1 m• Optical characterization requires immersion
in index-matching fluid.• X-Radiograph system already developed &
tested– Contact images on high resolution film– High precision film digitizer – Analysis algorithm to handle extreme noise
• For the first time, large dry DVB foam shells can be measured
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IFE Point Design for DVB Foam Shells
• Sufficient to measure interface radii vs angle to ±1 m
4100 ±200 m
Average Foam Wall: 289 ±20 m Non-concentricity (NC): < 1% *
* NC= (OD/ID Center Offset)/WallAverage
equivalent to WallMax-WallMin < 6 m
** OOR=(ODmax-ODmin)/RadiusAverage
equivalent to Rmax-Rmin = 10 m
CH Wall: (1-5) ±1 m Out-Of-Round (OOR): < 1% **
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Foam is difficult to characterize
• Visible light measurements require index matching fluid– Time-consuming– Potential dimension errors
• OD changes by 1-5%• Thicker CH, larger OD change
• X-radiographs are noisy due to large density fluctuations– Obscures interfaces
Radius (um)
Tra
nsm
iss
ion
(a.
u.)
Area AverageSingle line
100 m
wallinterior
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X-radiography works when digitized properly
• 12bit, 4 MB, Cooled CCD– Measure whole shell to 0.8
m• Plan APO Microscope lens
– Flat field => CCD compatible– Large N.A. => high resolution
• Type K1a film– Finest grain – Glass substrate => stable
• Software– Noise reduction and rejection– Edge analysis
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Accurate interface profiling require lens correction
-3
-2
-1
0
1
2
3
-800 -400 0 400 800Radius from Image Center (um )
Dis
tort
ion
(u
m)
• Must correct lens distortion– Calibrate with stage
micrometer– Verify with circular
standards
• Each lens calibrated separatelyDoes radius and shape
change with position?
3µm pixel error
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Foam structure causes unique analysis problems
• Traditional vision-based analysis does not work with low contrast, noisy image– Reduce noise by azimuthal averaging– Reject noise by data correlation– Limit search range
• Interface very wavy with thin overcoat– Flattening (Step 3)
• Extended interface structure– Fresnel simulation determines offset
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Capturing edge information
An
gle
Radius
1) Inspect thickness variation by 360˚ unwrapping
2) Sharpen interface with 2nd derivativeD. Bernat, R.B. Stephens, Fusion Technology, V31, P473, 1997
An
gle
Radius
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Mapping interface requires careful consideration
3) Sharp outside edge good for auto alignment
4) Reject noise by correlating peak/valley locationsReduces the image to a set of R() files
Separates wavy interfaces => narrows search range
An
gle
Radius
An
gle
Radius
visualize wall thickness variation
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Calculating interfaces and walls
Interface Marker (4X)
1200
1300
1400
1500
1600
0 100 200 300
Angle (degree)
Ra
diu
s (
um
)
OD: 3200 ± 3 m
OOR: 0.88 ± 0.04 % DVB Foam Wall (4X)
332
342
352
0 100 200 300Angle (degree)
Wa
ll T
hk
n
(um
)
Non-Concentricity: 2.7 +/- 0.2 %
5) Unflatten and record data4X lens radius measurement repeatability: <0.4 m
CH Wall (4X)
8
10
12
14
0 100 200 300
Angle (degree)
Wal
l Thk
n (u
m)
Wall Variation: 1.1 +/- 0.4 um
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Correcting Walls
6) Apply offset correction (under development) •Measured profile has width
•Relation fixed between profile and interface•Specific to shell type and lens•Described by markers (peak/valley) and offsets
•Offset understood by modeling•Affected by phase contrast, pixel size, X-ray spectrum etc.
Fresnel calculation of 15umGDP/20umBe @ 10X
0
0.5
1
975 980 985 990 995 1000 1005 1010 1015 1020 1025 1030
Radius (um)
Am
plitu
de
-0.4
-0.2
0
0.2
0.4
Transmission
2nd Derivative
Be/GDP interfaceGDP surface Be surface
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Porosity may affect interface sharpness
• Phase contrast shows as white ring at the sharp interfaces of dissimilar materials– Strong at CH/RF foam, CH/Be interfaces – but not for CH/DVB –Diffused due to pore size?
CH on DVB foamCH on RF Foam
~0.1 m pore ~1 m pore
50 m
50 m
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Estimated X-Radiography Capabilities
Lens
Image resolution (m)
Maxim OD(mm)
MinimResolvable Layer (m)
Profile Repeat-ability (m)
Wall thkn Accuracy (m) *
Method
2X 3.7 6.0 10 0.8 1 2nd Deriv.
4X 1.9 3.3 6 0.4 0.5 2nd Deriv.
10X 0.8 1.4 2 N/A 1 Transmission
20X 0.4 0.7 1 N/A 0.5 Transmission
* After applying offsets determined by Fresnel calculation
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Special concerns for DVB foam shells
• Use low mag. 2nd derivative analysis for foam– May not resolve thin CH overcoat– But get the complete foam radius profile
• Determines foam wall, shell diameter, OOR and NC
• Use high mag. transmission analysis for CH– Noise too high for 2nd derivative method– Measure local CH wall thickness
• Do NOT apply the offsets for Be/GDP shells– Offsets specific to shell type and shell size
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Future Possibilities
• Noise analysis could give quantitative opacity variation– IFE specification: <0.3% density variation over
50-100um• No characterization method yet
– Calculate sample opacity from film transmission• Film model already developed for the ICF program
• Orthogonal views allow 3D NC measurement– 90˚ Rotating device
• While sample stays in XRF holder