pike catalogue 2011

WWW.PIKETECH.COM

C O M P R E H E N S I V E C A T A L O G O F

F T IR and UV-V i s Acce s so r i e s and Supp l i e s

W W W. P I K E T E C H . C O M

The PIKE Technologies team looks forward to helping you with our spectroscopy sampling accessories and thank you for your business.

6125 Cottonwood DriveMadison, WI 53719

(608) 274-2721(608) 274-0103 (FAX)

[email protected] (E-MAIL)

We are PIKE Technologies, an innovative company growing consistently over our

20 years and focused upon serving customers with their FTIR and spectroscopy

applications. We are always looking for new ways to help make your spectroscopy

sampling easier and more effective. We think you will see in our new products

introduced each year that you, our customers, have helped us to achieve this goal.

If you do not see what you need in this catalog, please contact us. Your input

may become one of our product offerings in the future. We look forward to

serving you with our products and support.

“A unique enterprise specializing in the

imaginative design and creation of excellent

spectroscopic accessories, providing high

quality solutions to all customers.”

FTIR INSTRUMENT CODE XX

ABB Bomem FTLA2000-100 (Arid Zone) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80 Michelson 100, MB Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81 MB 3000 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82

Analect/Hamilton Sundstrand Diamond 20 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60

Bruker Optics IFS™, Vector™, Equinox™ Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 Tensor™, Vertex™ with recognition (Quick-Lock) . . . . . . . . . . . . . . . . . . . . . . . . 51

Buck Scientific M500. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65

Digilab/Bio-Rad/Varian/Agilent Excalibur™, Scimitar™, FTS Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Excalibur, Scimitar with recognition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13

Horiba 7000 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35

Interspectrum Interspec 200-X . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90

Jasco 300/600 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 400 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57 4000/6000 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58 4000/6000 Series w/recognition. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59

JEOL Winspec™ Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46

Lumex INFRALUM FT-02 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67

Midac M Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

PerkinElmer 1700 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70 Spectrum™ GX, 2000. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71 Spectrum BX/RX, 1600, Paragon 1000 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73 Spectrum ONE, Spectrum 100, 400, FRONTIER . . . . . . . . . . . . . . . . . . . . . . . . . . 74 Spectrum TWO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75

Shimadzu 8300, 8400 Series, IRPrestige, IRAffinity. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 IRPrestige™-21 with recognition (QuickStart). . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

Thermo Fisher Scientific/Nicolet/Mattson Infinity, Galaxy, RS Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Genesis™, Satellite, IR 300 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Impact™ 400, Magna, Protégé™, 500/700 Series, Avatar™, Nexus™, Nicolet™ Series, Nicolet iS™10 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40

Nicolet iS™5 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 500/700 Series, Avatar, Nexus (Smart) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47

Sampling Kits – If You Don’t Know Where to Start

Products Overview .......................................................................................... 1

Standard Transmission Sampling Kit (STS)...................................................... 2

Comprehensive Transmission Sampling Kit (CTS) ........................................... 3

Educational Transmission Sampling Kit (ETS)................................................. 4

Valu-Line Kit .................................................................................................... 5

Ultima Sampling Kit ........................................................................................ 6

Pages 1 – 6

Attenuated Total Reflectance – Liquids, Solids and In-Between


MIRacle – Fast and Easy IR Sampling.............................................................. 8

GladiATR – Highest Performance Diamond ATR .............................................. 12

GladiATR Vision – Diamond ATR with Sample View ........................................ 14

Multiple Reflection HATR – Maximum Sensitivity and Highly Versatile FTIR Sampling........................ 16

ATRMax II Variable Angle Horizontal ATR Accessory – HATR for Inquisitive Minds ....................................................................... 20

VeeMAX II with ATR – Variable Angle, Single Reflection ATR for Depth Profiling Studies............. 23

Classic VATR – Variable Angle ATR for Analysis of Solids, Films and Coatings ................. 26

Theory and Applications ................................................................................. 27

Pages 7 – 30

Diffuse Reflectance – From Powders to Plastic Bumpers


EasiDiff – Workhorse Diffuse Reflectance Accessory......................................... 32

DiffusIR – Research Grade Diffuse Reflectance Accessory ................................ 33

UpIR – Upward Looking Diffuse Reflectance Accessory.................................... 35

AutoDiff – Automated Diffuse Reflectance Sampling....................................... 36

X, Y Autosampler – Transmission and Reflectance Automated Sampling in Microplate Format ................................................................. 37

Sample Preparation and Loading Kit – The Easiest Way to Work With Powder Samples ....................................... 38

Abrasion Sampling Kit..................................................................................... 38


Pages 31 – 40

TA B L E O F C O N T E N T S

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

Microsampling Products – From Microns to Millimeters


µMAX – Sample Compartment Microscope for FTIR ........................................ 68

Microsampling Tools – Compression Cells and Sample Manipulation ............ 71

Micro Diamond Cell – For Compressing and Holding Samples for Microanalysis... 72

Beam Condensers – 4X and 6X Versions for FTIR ........................................... 73

Pages 67 – 74


Polarization – For Oriented Samples and Research Applications


Polarizers – Manual and Automated Versions for Molecular Spectroscopy ..... 52


Pages 51 – 54

Integrating Spheres – Reflectance From All Perspectives


Mid-IR IntegratIR – Integrating Sphere............................................................ 56

NIR IntegratIR – Integrating Sphere ................................................................ 58

Introduction and Theory................................................................................. 60

Pages 55 – 62

Remote Sampling Accessories –Extending Your Sample Compartment


FlexIR – Hollow waveguide Accessory for Remote Infrared Sampling.............. 64

FlexIR – NIR Fiber Optic Accessory for Fast and Remote Sample Identification ...... 66

Pages 63 – 66

Specular Reflectance – Thin Films and More


VeeMAX II – The Ultimate Specular Reflectance Accessory! ............................. 42

30Spec and 45Spec – Specular Reflectance for Thick Films............................. 44

80Spec – Grazing Angle Specular Reflectance for Thin Films........................... 45

AGA – Advanced Grazing Angle Specular Reflectance for Thin Films with Precise Spot Control ............................................................................ 46

10Spec – Near-normal Sample Reflectivity Measurements .............................. 47

Absolute Reflectance Accessory – Measure Absolute Sample Reflectivity ........ 48


Pages 41 – 50

Transmission Sampling – Automated & Manual Technologies


Transmission Multi-SamplIR – Automated In-Sample Compartment Accessory .... 76

RotatIR – Automated Rotating Sample Stage................................................... 77

Automated Horizontal Transmission Accessories – For Films or Pellets......... 78

X, Y Autosampler – Transmission and Reflectance Automated Sampling in Microplate Format...... 79

Liquid Samples

Press-On Demountable Cell – For Viscous Liquids and Mulls ......................... 80

Demountable Liquid Cells – For Versatile Pathlength Liquid Sampling.......... 81

Super-Sealed Liquid Cells – For Precision, Fixed Pathlength Liquid Sampling.... 82

Long-Path Quartz Liquid Cells – For Analysis of Hydrocarbon Content and Related Measurements................ 83

Falcon Mid-IR Transmission Accessory – For Precise Temperature Control of Demountable Liquid Cells ................ 84

Falcon NIR Transmission Accessory – Quantitative and Qualitative Analysis of Liquids under Precise Temperature Control............................ 86

Solid Samples

Bolt Press & Hydraulic Die – Low-Cost Pellet Preparation .............................. 87

Hand Press – For Making Smaller Pellets ........................................................ 87

Evacuable Pellet Press – For Preparation of High Quality Pellets .................. 88

Heated Platens Accessory – For Making Thin Films of Polymeric Samples for Transmission FTIR Analysis ................................................................. 89

CrushIR – Digital Hydraulic Press .................................................................... 90

Auto-CrushIR – Programmable Hydraulic Press............................................... 91

ShakIR Sample Grinder – For Optimized Sample Mixing ................................ 92

Sample Preparation Accessories – For Solids Materials Analysis .................... 93

Optical and Sampling Components, Polishing Kits

Sample Holders – For Transmission FTIR Analysis of Pellets and Films .......... 94

Disks, Windows and Powders – For Transmission FTIR Analysis of Solid and Liquid Samples..................... 95

Crystal Polishing Kit – Extending the Life of IR Transparent Windows............ 98

Gas Samples

Short Path Gas Cells – For Samples with Higher Vapor Phase Concentration..... 99

Heated Gas Flow Cell – For Streaming Gas Analysis ........................................ 100

Long-Path Gas Cells – For Measurement of Low Concentration Vapor Components ................... 101


Pages 75 – 106

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1


Special Applications


Vertical Wafer Accessory – For Analysis of Semiconductor Wafers.................. 108

MappIR and MAP300 – For Automated Analysis of Semiconductor Wafers .... 109

TGA/FTIR Accessory – Identification and Quantification of Evolved Gases from Thermogravimetric Analyzer ............................................................ 111

External Sample Module – Extending Sampling Efficiency.............................. 113

Semiconductor Applications – FTIR Sampling Techniques Overview .............. 114

Pages 107 – 114

Standards, Software and Databases


Reference Standards – For Calibrating FTIR Spectrometers ............................ 126

PIKECalc Software – For FTIR Sampling Computations ................................... 129

ATR Spectral Databases – Optimize Search Results for ATR Spectral Data ...... 130

Transmission Spectral Databases – High Quality Spectral Data for Optimized Search Results .......................... 131

Other Useful Information

Catalog Index – Alphabetical........................................................................... 133

Catalog Index – Part Number.......................................................................... 136

Fax Order Form ............................................................................................... 144

Pages 125 – 132

UV-Vis Accessories


UV-Vis Cuvettes, Cells, Vials and Holders........................................................ 116

UV-Vis Polarizers – Manual and Automated Versions ..................................... 118

UV-Vis Spec – Slide Mounted Specular Reflectance Accessories ....................... 119

UV-VIS 85Spec – Specular Reflectance Accessory ............................................. 120

UV-Vis VeeMAX – Variable Angle Specular Reflectance Accessory.................... 121

Falcon UV-VIS – Precise Cell Temperature Control Accessory ........................... 122

Automated XY, R-Theta and Y-rotation Stages for UV-Vis Spectrophotometers ..................................................................... 123

Pages 115 – 124

Sampling KitsIf you are not sure where to start, check out these

PIKE Technologies sampling kits. You will immediately

find everything you need for the most basic FTIR

experiments, and you will be able to collect your

first spectrum in less than 30 minutes from the

time the kit arrives.

One of the goals of PIKE Technologies is to

make the life of an applications chemist easier. FTIR

spectroscopy can be confusing when it comes to

sampling techniques, sampling accessories and all

the little gadgets required to successfully prepare

the sample for analysis – especially if you want to

obtain good spectra. For this reason, the first few

pages of this catalog are fully dedicated to sampling

kits. We hope that this approach will give you a head

start and remove confusion when selecting accessories

for your applications, especially when you are a

first time user. The kits are carefully designed to

include all necessary components. They eliminate

guesswork and assure that you have everything you

need for immediate productivity.

Standard Transmission Sampling Kit Everything you need to run liquidand solid samples by transmissionIR spectroscopy

Page 2

Comprehensive Transmission Sampling Kit Complete gas, liquid and solid sampling

Page 3

Educational Transmission Sampling Kit An economical assembly of FTIR sampling tools for transmission sampling

Page 4

Valu-Line KitHigh performance set of modernFTIR accessories addressing all solid and liquid sampling needs

Page 5

Ultima Sampling Kit With the highest performance,single-reflection ATR and backupaccessories to do it all!

Page 6

Standard Transmission Sampling Kit (STS) – Everything You Needto Run Liquid and Solid Samples by Transmission IR Spectroscopy

This general purpose kit contains tools and materials for liquidand solid sampling. A demountable cell (drilled and undrilledwindows with precision Teflon spacers, plus 2" x 3" standard cellholder) is provided for measurements of liquid samples. Viscousliquids can be measured directly as a thin film between the KBrwindows. The kit includes a hand operated press for the preparationof 7 mm KBr pellets. A mortar with pestle and Nujol™/Fluorolube®are provided for mull making – another popular method forpreparation of solid samples. In addition, the kit contains a set ofthe most popular sample holders including: universal holder forpolymer films, KBr pellet holder and PIKE disposable/storagecardboard cards for pellets and polymer films. For a completeproduct listing, please refer to the table below.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

2

F E AT U R E S O F T H E S TA N D A R D

T R A N S M I S S I O N S A M P L I N G K I T

• Complete kit for transmission FTIR sampling

• Make KBr pellets and mulls for solid samples

• Run liquid samples for qualitative and quantitative analysis

O R D E R I N G I N F O R M AT I O N

P A R T N U M B E R D E S C R I P T I O N

162-1000 Standard Transmission Sampling Kit (STS) – Solids and LiquidsIncludes: Sample preparation tools, mull liquids, cells, windowsand cell holders required for preparation and analysis of solid and liquid samples

Included Parts and MaterialsP A R T N U M B E R D E S C R I P T I O N

160-8010 KBr Powder, 100 g

161-0510 Fluorolube, 1 oz

161-0500 Nujol, 1 oz

042-3035 Spatula – Spoon

042-3050 Spatula – Flat

161-5050 Mortar and Pestle, 50 mm

161-1027 PIKE Hand Press (for KBr Pellets)

161-1010 7 mm Die Set

161-1018 KBr Pellet Holder

161-6000 Finger Cots (12 pcs)

162-1100 Demountable Liquid Cell Assembly

160-1131 Window, KBr 32 x 3 mm, Drilled (6 ea.)

160-1132 Window, KBr 32 x 3 mm, Plain (6 ea.)

162-1290 Teflon® Spacers – Assortment

161-0521 Syringe, 2 mL

162-3610 Press-On Demountable Liquid Cell Holder for 32 mm Windows

162-5600 Universal Sample Holder*

162-5300 Magnetic Film Holder – for 13 mm pellets and film samples

162-5400 Film Sampling Card – 20 mm clear aperture, 10 each*

*Note: Cell holders marked “*” fit all standard slide mounts, but due to theirheight may not allow for a complete sample compartment door closure on somesmaller spectrometers. Please consult PIKE Technologies before placing an order.

Dr Tariq

Highlight

3

SA

MP

LI

NG

KI

TS

– I

FY

OU

DO

N’

TK

NO

WW

HE

RE

TO

ST

AR

T

Comprehensive Transmission Sampling Kit (CTS) – Complete Gas, Liquid and Solid Sampling

The CTS Kit includes a 100 mm long, 38 mm diameter gas cell, in addition to all the sample preparation and mounting toolsdescribed in the STS Kit on the previous page. The cell body ismade of Pyrex® glass and features straight-tube inlet and outletports with stopcocks. The gas cell comes with all necessary gaskets, two KBr windows and slide-mounted cell holder, and is designed for gas measurements at ambient temperature and normal atmospheric pressure.



162-2000 Comprehensive Transmission Sampling Kit (CTS) – Gases, Solids and LiquidsIncludes: Sample preparation tools, mull liquids, cells, windows and cell holders required for preparation and analysis of gas, solid and liquid samples


160-8010 KBr Powder, 100 g


161-0500 Nujol, 1 oz




161-1027 PIKE Hand Press (for KBr Pellets)

161-1010 7 mm Die Set

161-1018 KBr Pellet Holder

161-6000 Finger Cots (12 ea.)








162-5600 Universal Sample Holder*

162-2200 100 mm Gas Cell, 38 mm diameter

160-1320 Window, KBr 38 x 6 mm (2 ea.)


*Note: Cell holders marked “*” fit all standard slide mounts, but due to theirheight may not allow for a complete sample compartment door closure on somesmaller spectrometers. Please consult PIKE Technologies before placing an order.

F E AT U R E S O F T H E C O M P R E H E N S I V E


• Complete sampling kit for analysis of solids, liquids and gas samples by transmission

• Make KBr pellets and mulls for solid samples

• Run qualitative and quantitative analysis of liquid samples

• Identify and quantify gas samples

Educational Transmission Sampling Kit (ETS) – An Economical Assembly of Sampling Tools

The Educational Sampling Kit contains all necessary tools for the analysis of gas, liquid, and solid samples. It was designed as a low-cost alternative for busy teaching laboratories. The kit offersa smaller (100 mm x 25 mm) gas cell with straight, septa protectedtubes, Bolt Press for making KBr pellets and a 35 mm mortar and pestle. Please refer to the table below for the detailed list of all components.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

4



162-3000 Educational Transmission Sampling Kit (ETS) – Gases, Solids and LiquidsIncludes: Sample preparation tools, mull liquids, cells, windows and cell holders required for preparation and analysis of gas, solid and liquid samples


160-8010 KBr Powder, 100 g




161-0500 Nujol, 1 oz








161-2500 Bolt Press (for KBr Pellets)

162-2100 100 mm Gas Cell, 25 mm diameter

161-2511 Wrench Set for Bolt Press (2 ea.)

160-1133 Window, KBr, 25 x 4 mm (2 ea.)

161-6000 Finger Cots (12 ea.)



*Note: Cell holders marked “*” fit all standard slide mounts, but due to their

height may not allow for a complete sample compartment door closure on some

smaller spectrometers. Please consult PIKE Technologies before placing an order.

F E AT U R E S O F T H E E D U C AT I O N A L


• Basic sampling kit for transmission FTIR sampling

• Perform qualitative and quantitative analysis

• Economical analysis of solids, liquids and gases

5

SA

MP

LI

NG

KI

TS

– I

FY

OU

DO

N’

TK

NO

WW

HE

RE

TO

ST

AR

T

Valu-Line – High Performance Set of FTIR Accessories AddressingAll Solid and Liquid Sampling Needs

The number of available FTIR accessories is quite overwhelming.It is easy to be confused by multiple, often esoteric choices at typically exuberant prices. Sometimes, it is not easy to decidewhich accessory will do the job. An answer to this problem is PIKE Technologies’ Valu-Line Accessory Kit. This Kit, packaged in a durable and convenient storage case, combines the most oftenused and practical set of FTIR sampling accessories. It includesthe following components:

HATR – Horizontal ATRIs designed to analyze liquid and semi-liquid samples, pastes, gels,films, soft powders and multiple solid materials. This accessorycomes with trough and flat crystal plates to accommodate alltypes of samples. The HATR is carefully designed to provide excellent results with minimum effort. It can be easily placed in the sample compartment and locked into position on the sample compartment baseplate, or a standard slide holder.

EasiDiff – Diffuse Reflectance AccessoryIs an ideal accessory for the analysis of powders and intractablesolids. With a set of convenient tools for solid sample preparation,this compact, high performance accessory provides outstandingcollection efficiency.

30Spec – Specular Reflectance AccessoryIs a great accessory for the analysis of thin organic films depositedon reflective surfaces and a myriad of surface coatings and surfacetreatments. The 30Spec is slide-mounted and comes with a set ofthree masks which allow for the isolation of small, pre-determinedspots on larger samples, and the analysis of small samples.

Please refer to the appropriate section of this catalog for moredetail about these accessories.

F E AT U R E S O F T H E VA L U - L I N E S A M P L I N G K I T

• Combination of most widely used FTIR accessories including:– Horizontal ATR– Diffuse Reflectance – 30 Degree Specular Reflectance

• Full range of sampling options and applications

• Complete set of auxiliary sample preparation tools forimmediate productivity

• Pre-aligned, fixed-position optical designs offering reproducible, high quality data

• High performance accessories providing excellent sampling sensitivity

• Economical and logical addition to any FTIR spectrometer. Excellent starter kit for routine applications, research or teaching



050-10XX Valu-Line – FTIR Reflectance Accessories Kit Includes: HATR – combined trough and flat plate system, including 45º ZnSe crystals; trough plate, volatiles cover, powder press, flat plate and sample clampEasiDiff – Accessory with sampling tools, two micro, two macro sample cups, EasiPrep sample preparation kit, alignment mirror, pestle and mortar, KBr30Spec – Specular reflectance accessory with a set of three masks for control of the sampling spot size

Note: Select XX FTIR code from foldout on last page of this catalog. Add -GE, -KR, -SI or -AM to the part number to substitute the following HATR crystal plates:Germanium, KRS-5, Silicon or AMTIR.

Ultima Sampling Kit – With the Highest Performance, Single-reflection ATR and Backup Accessories to Do it All

In recent years, single-reflection ATR measurements have becomequite popular for at least two main reasons – they further simplifysample preparation and also reduce the complexity of traditionalFTIR measurements. This is achieved through the reduction of thesampling area (smaller sample volume/size requirement), ease ofcleaning and the introduction of more rigid, diamond-protectedsampling interfaces, capable of withstanding higher pressures andharder samples. In many cases the single-reflection ATR hasbecome capable of analyzing a wide variety of samples – includingrigid solids and hard powders – which are difficult to achieve witha multi-reflection ATR. For these reasons, the single reflection ATRhas gained the reputation of being a “universal” sampling device.

This is true 80% of the time. The other 20% (especially whendealing with poor absorbers, some powders and films) still needto be analyzed by other methods. For this reason, PIKE designedan accessory kit built around the MIRacle – Single Reflection ATR,and also included basic diffuse reflectance and specularreflectance accessories. This combination offers one of the mostcomplete range of sampling devices used in FTIR and covers awide variety of sampling needs.The Ultima Sampling Kit containsthe following accessories:

MIRacle – Single Reflection ATRDesigned to analyze a wide variety of solid and liquid samples. Itoffers a number of unique features including: a universal samplingplate which accommodates liquids, solids and powders, small (1.8 mm) sampling interface making the analysis of small and/orawkward samples easy, and interchangeable sampling plates. Allthe above options allow for the best selection of an appropriate spectral range, and a configuration which matches the optical,physical and chemical properties of analyzed samples. Thepatented optical design of the accessory offers the highest optical throughput and sensitivity. The MIRacle is equipped with apressure clamp and purge attachments.

EasiDiff – Diffuse Reflectance AccessoryIs an ideal product for the analysis of powders and intractablesolids. With a set of convenient tools for sample preparation, this compact, high performance accessory provides outstandingcollection efficiency.

30Spec – Specular Reflectance AccessoryIs a great accessory for the analysis of thin organic films depositedon reflective surfaces and a myriad of surface coatings and surfacetreatments. The 30Spec is slide-mounted and comes with a set ofthree masks which allow for the isolation of small, predeterminedspots on larger samples, and the analysis of small samples.

Please refer to the appropriate section of this catalog to reviewthe theory and detailed description of kit components.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

6

F E AT U R E S O F T H E U LT I M A S A M P L I N G K I T

• Complete kit for ATR, diffuse reflectance, and specularreflectance

• High-performance accessories eliminate tedious pellet making

• Analysis of liquids, solids, powders, polymers, and thin film samples



050-20XX Ultima Sampling Kit with: MIRacle – Single-reflection ATR with ZnSe Crystal, Universal Configuration for solid and liquid analysis, and High Pressure ClampEasiDiff Accessory with Sampling Tools, two each micro and macro Sample Cups, EasiPrep Sample Preparation Kit,Alignment Mirror, Pestle and Mortar, and KBr 30Spec – Specular Reflectance Accessory with a set of threemasks for control of the sampling spot size

Notes: Select XX FTIR code from foldout on last page of this catalog. Add -DI, -GE, -SI, or -AM to the part number to substitute the following MIRacle crystal plates:Diamond/ZnSe, Germanium, Si or AMTIR.

Attenuated Total ReflectanceATR products successfully replace constant path

transmission cells and salt plates used for analysis

of liquid and semi-liquid materials. Horizontal ATR

are used to analyze films, pastes, pliable solids and

fine powders. Thanks to the reproducible effective

pathlength, ATR is well suited for both qualitative

and quantitative applications. Several heating

options are available

GladiATR™ VisionDiamond ATR with sample view –monolithic diamond for easy positioning and analysis ofintractable samples

HATR Multi-Reflection ATR – highest sensitivity for minor components

Page 16

ATRMax™ Variable Angle, Multi-ReflectionATR – research grade HATR

Page 20

VeeMax™ ATRVariable Angle, Single-ReflectionATR – for depth profiling studies

Page 23

VATR™Classic Variable Angle ATR

Page 26

ATR Theory and ApplicationsPage 27

GladiATR™ Single Reflection ATR – monolithicdiamond for intractable samplesand temperature studies

Page 12

MIRacle™ Single Reflection ATR – ideal forsample identification

Page 8

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

8

MIRacle ATR – Fast and Easy IR Sampling

The PIKE MIRacle™ is a universal ATR sampling accessory foranalysis of solids, liquids, pastes, gels, and intractable materials.In its most popular configuration it is a single reflection ATRaccessory with high IR throughput which makes it ideal for sample identification and QA/QC applications. Advanced optionsinclude three reflection ATR crystal plates to optimize for lowerconcentration components. Easily changeable crystal plate designprovides analysis of a broad spectrum of sample types whileensuring constant sampling pathlength.

Single and three-reflection ATR crystals are available to optimize general qualitative analysis or quantitative analysis ofminor components.

The PIKE MIRacle provides higher throughput – saving youtime and generating higher quality spectra.

MIRacle Optical DesignIn the patented MIRacle optical design the ATR crystal both focusesthe IR beam and provides the ATR sampling interface. This technology provides much higher throughput than competitiveproducts and saves you considerable time and provides you higher quality spectra.

F E AT U R E S O F T H E M I R A C L E

• Highest IR throughput – saving you time and improving youranalysis quality

• Complete flexibility – add options to your MIRacle as yoursampling needs change

• Highest value – for today’s competitive analytical andresearch needs

• Fully configurable – ZnSe, Diamond, Ge and Si MIRacle crystal plates

• Pinned-in-place, changeable crystal plates – for fast andeasy sampling optimization

• Highest purity, type IIa Diamond crystal – will not scratchand is chemically inert to acidic or caustic materials

• Optional specular reflectance plate – for measurement ofcoatings on reflective surfaces

• Choice of pressure clamps – high-pressure, digital high-pressure and micrometric sample clamps

• Sampling options – heating, temperature control, and flowthrough plate

MIRacle – Highest IR Throughput ATR

Thick Polymer Sample, using MIRacle with AMTIR Crystal and High-Pressure Clamp – No Sample Preparation.

MIRacle – High Throughput and Efficient Optical Design

9

ATTENUATED

TOTAL

REFLECTANCE

– L

IQ

UI

DS

, SO

LI

DS

AN

DI

N-B

ET

WE

EN

MIRacle Crystal OptionsThe MIRacle ATR accessory is available with 4 different crystaltypes (ZnSe, Diamond, Ge, and Si) and with unique versions ofthese crystal materials.

Crystal plates are pinned in place and easily changeable within seconds with no alignment required. With this flexibility,you can change the crystal type to exactly match your samplingrequirements. For example, diamond is ideal for brittle samplesbecause it will not scratch, whereas, Ge is ideal for carbon filledsamples because of its high refractive index and lower depth of penetration. Three reflection crystal plates provide increasedsensitivity for minor components in liquid or non-rigid materials.

An optional liquids retainer and volatiles cover set is compatiblewith all crystal plates, eliminating the need to purchase flat andtrough crystal plates. A high-pressure clamp is required for usewith the liquids retainer and the volatiles cover.

Table 1 shows MIRacle ATR crystal characteristics includingrefractive index, spectral range cutoff, pH range and hardness forsingle reflection ATR crystal plates. Still have questions? Please callas we are pleased to discuss your sampling requirements.

MIRacle ATR Crystal Plates

“Faux” Black Pearl with MIRacle using Diamond ATR Crystal

Black Rubber Samples are best run using Ge ATR Crystal

Table 1: MIRacle Crystal Plate Specifications

Refractive Depth ofMIRacle Hardness Cutoff cm-1, Index @ Penetration pH RangeCrystal Plate Application kg/mm2 Spectral Range 1000 cm-1 @ 45°, µ of Sample

Diamond/ZnSe Ideal for hard samples, acids or alkaline 5700 525 2.4 2.00 1–14

Ge General purpose and carbon filled or rubber 550 575 4.0 0.66 1–14

Si Excellent for far-IR spectral measurement 1150 8900–1500, 475–40 3.4 0.85 1–12

ZnSe General purpose ATR crystal 120 520 2.4 2.00 5–9

MIRacle Crystal plates are covered by PIKE Technologies patent numbers 5,965,889 and 6,128,075 or are manufactured under license of 5,200,609,5,552,604 and 5,703,366.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

10

MIRacle Pressure Clamp OptionsMIRacle pressure clamps are pinned in place and easily changeablewithin seconds. A high-pressure clamp is recommended for mostapplications and is available in basic and digital configurations.The digital version includes a high-pressure clamp and the DigitalForce Adapter (DFA) that attaches directly to the clamping assembly.The DFA’s embedded load cell exhibits high linearity, reproducibility,and exceptional accuracy. The magnitude of applied force is displayed on an external easy-to-read LCD readout. The digitalclamp is ideal for applications that require controlled and repro-ducible pressure. All clamps include tips for hard, soft and pelletshaped samples. High-pressure clamps are calibrated to deliverover 10,000 psi of pressure when used with the single reflectioncrystal plates.

Ability to deliver high pressure is very important for achievingspectral quality. In the example below, we demonstrate spectraldifferences for a porous polymer sample measured with themicrometer clamp and the high-pressure clamp. Clearly the spectrum obtained using the high-pressure clamp is required for a high quality result.

MIRacle high-pressure clamps utilize a slip-clutch mechanismto prevent excessive pressure from being applied to the crystal.

MIRacle Sampling OptionsThe MIRacle can be configured with optional resistively heatedcrystal plates using a PIKE temperature control module. Digitaland digital with PC control versions are available. The PC controlmodule includes TempPRO software which provides a graphicaluser interface for temperature control and kinetic measurements.

MIRacle ATR SummaryThe MIRacle ATR accessory is a high performance FTIR samplingtool for solid, liquid, or polymer samples. Easily changeable crystalplates provide optimized spectral data for unique sample types.With options for single or three reflection crystal plates, severalpressure clamp styles and heating or cooling the MIRacle is ableto address a wide range of FTIR sampling applications.

Porous Polymer Sample Measured Using High and Low-Pressure Clamp

Max. lbs. Crystal MIRacle Clamp Pressures Pressure Diameter, mm PSI

High-Pressure Clamps 401.8 10,1416.0 913

Micrometer Pressure Clamp 81.8 2,0286.0 183

Note: All clamps except Micrometer are high-pressure

TempPRO software for graphical setup andcontrol of kinetic measurements

MIRacle with Optional HeatedCrystal Plate and PIKETemperature Control Module

MIRacle Digital ClampIdeal for ControlledPressure

MIRacle Pressure Clamps are Pinned-in-Place and Easily Upgraded

MIRacle ConfinedSpace Clamp – For instruments with limited sampling area

MIRacle High-PressureClamp – Ideal forRoutine Sampling

MIRacle MicrometerClamp – OK for LowPressure Applications

11

AT

TE

NU

AT

ED

TO

TA

LR

EF

LE

CT

AN

CE

– L

IQ

UI

DS

, SO

LI

DS

AN

DI

N-B

ET

WE

EN

MIRacle Base Optics (must select, insert spectrometer model for XX)P A R T N U M B E R D E S C R I P T I O N

025-18XX MIRacle ATR Base Optics/Platform Assembly

Notes: MIRacle Base Optics includes purge tubes, purge kit and spectrometer basemount. Please see the FTIR instrument code sheet.

MIRacle Crystal Plates (must select 1 or more)P A R T N U M B E R D E S C R I P T I O N

025-2108 Diamond/ZnSe Performance Crystal Plate

025-2107 Diamond/ZnSe/HS Performance Crystal Plate

025-2118 3 Reflection Diamond/ZnSe Performance Crystal Plate

025-2018 ZnSe Performance Crystal Plate

025-2038 3 Reflection ZnSe Performance Crystal Plate

025-2058 Ge Performance Crystal Plate

025-2098 Si Performance Crystal Plate

025-2208 Specular Reflection Performance Plate

Notes: MIRacle Crystal Plates are pre-aligned and pinned-in-place. Changing crystalplates is easy and fast to optimize sampling results. Crystal plates are manufacturedusing polished stainless steel for chemical resistance. The diamond/ZnSe crystalplate is available with optional Hastelloy (HS) metal for exceptionally caustic oracidic samples.

MIRacle Sampling OptionsP A R T N U M B E R D E S C R I P T I O N

025-4018 Heated ZnSe Performance Crystal Plate

025-4058 Heated Ge Performance Crystal Plate

025-4108 Heated Diamond/ZnSe Performance Crystal Plate (60 °C Max)

026-5012 Flow-through Attachment for Performance Plates

026-5013 Liquids Retainer and Volatiles Cover Set

026-3051 Volatiles Cover for Performance Plates

026-5010 Liquids Retainer for Performance Plates

076-1220 Digital Temperature Control Module

076-1420 Digital Temperature Control Module, PC Control

Notes: Flow through attachment, liquids retainer and volatiles cover are compatiblewith all crystal plate offerings but require High-Pressure Clamp, PN 025-3020, soldseparately. Temperature controller selection is required for heated crystal plates.Digital temperature controller with PC control includes TempPRO software.

MIRacle Pressure Clamps (must select 1 or more for solids or polymer analysis)P A R T N U M B E R D E S C R I P T I O N

025-3020 High-Pressure Clamp

076-6025 Digital Force Adapter for High-Pressure Clamp

025-3050 Micrometric, Low-Pressure Clamp

025-3035 Confined Space Clamp

Notes: The High-Pressure Clamp is recommended for general applications. Pressure clamps include a flat tip, a swivel tip and a concave tip. The Digital ForceAdapter requires High-Pressure Clamp, PN 025-3020, sold separately.

MIRacle Replacement PartsP A R T N U M B E R D E S C R I P T I O N

025-3095 Flat tip for High-Pressure Clamps

025-3093 Swivel tip for High-Pressure Clamps

025-3092 Concave tip for High-Pressure Clamps

025-3096 Sealed Pressure Tip for High-Pressure Clamp

025-3052 Flat tip for Micrometric Clamp

025-3061 Swivel tip for Micrometric Clamp

025-3054 Concave tip for Micrometric Clamp

025-3053 MIRacle Clamp Tip Assortment

025-3094 7.8 mm ATR Pressure Tip

Notes: Please contact PIKE Technologies for items not described in this list.Reconditioning service for used MIRacle crystal plates is available.


MIRACLE ACCESSORY SPEC IF ICAT IONS

ATR Crystal Choices Diamond/ZnSe, Ge, ZnSe, Si

Crystal Plate Mounting User changeable plates

Crystal Plate Mount Stainless steel

Angle of Incidence 45 degrees, nominal

Crystal Dimensions, Surface 1.8 mm

Pressure Device Rotating, continuously variable pressure;click stop at maximum

Digital Force Adapter (option) Load cell sensor for precise and reproducible pressure control. Attachesdirectly to MIRacle clamp. Digital readout.

Maximum Pressure 10,000 psi

Sample Access 55 mm, ATR crystal to pressure mount

Heating Options Ambient to 60 or 130 ºC maximum

Accuracy +/- 0.5%

Sensor Type 3 wire Pt RTD (low drift, high stability)

Temperature Control Digital or digital with PC control (up to 10 ramps, automated data collection, USB interface)

Input Voltage 90–264 VAC, auto setting, external power supply

Operating Voltage 3 A/24 VDC/30 W

Specular Reflection Option Optional, 45 degree nominal angle ofincidence

Purge Sealing Purge tubes and purge line connectorincluded

Accessory Dimensions 104 mm wide, 103 mm deep, 210 mmhigh (excludes FTIR baseplate and mount)

FTIR Compatibility Most, specify model and type

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

12

The GladiATR™ is an all new optical design from PIKE Technologiesproviding the highest energy throughput, highest available pres-sure, widest spectral range and offering optional heated or cooledcrystal plates. The GladiATR is a highly durable and rugged designto be used in environments where large numbers of samples aremeasured, where samples may be intractable solids, where youwant the best quality spectrum every time and where you needflexibility for new sample types in the future.

The GladiATR diamond crystal is a monolithic design whichwill not scratch or fracture even at extreme pressures. This designpermits analysis of hard, intractable objects such as coated metalwires, polymer pellets and geological samples without damage tothe ATR crystal. The diamond crystal is brazed into the stainlesssteel plate, which enables this ATR to be compatible with pressureup to 30,000 psi.

The energy throughput of the GladiATR is exceptional; twicethat of other monolithic diamond ATR accessories – significantlyimproving spectral quality and reducing sampling time.

The GladiATR is designed and manufactured using all reflectingoptics providing full spectral range in the mid-IR and far-IR spectralregions. An optional Ge crystal plate is available for analysis of highrefractive index samples. Crystal plates are easily changeable.

GladiATR – Highest Performance Diamond ATR

F E AT U R E S O F T H E G L A D I AT R

• Diamond crystal design – cannot scratch or fracture

• Extreme pressure application – for hard and demandingsolid samples

• Highest energy throughput design – for excellent quality FTIRspectra and minimum scan time

• All reflective optics – full spectral range for mid-IR and far-IRanalysis

• Optional Ge crystal plate – for high refractive index samples

• Heated crystal plate options – taking ATR temperature studies up to 210 °C

• 300 °C Diamond Version – for high temperature/high pressure materials studies

• Compatible with most FTIR spectrometers

ATR/FTIR spectrum of polymer pellet run on GladiATR with diamondcrystal. Spectral range in the mid-IR is 4000– 400 cm-1.

Spectrum of sulfathiazole using GladiATR with diamond crystal plateand far-IR optics in FTIR

GladiATR with heated diamond crystal plate and temperature controller

13

AT

TE

NU

AT

ED

TO

TA

LR

EF

LE

CT

AN

CE

– L

IQ

UI

DS

, SO

LI

DS

AN

DI

N-B

ET

WE

EN

Temperature controlled crystal plates are available for thermalstudy of materials. PIKE Technologies offers temperature controllerswith digital and PC programmable set points.

The GladiATR high performance diamond ATR is available inconfigurations to fit most FTIR spectrometers.

Selection of the digitalcontrol module, PCcontrol includes PIKETempPRO™ softwarefor graphical setupand automated datacollection for thermalexperiments

ATR/FTIR spectra from cure of thermoset epoxy using the heated diamondcrystal plate on the GladiATR

GL ADIATR ACCESSORY S P E C I F I C AT I O N S

ATR Crystal Choices Diamond, germanium


Crystal Type Monolithic

Diamond Mounting Brazed

Crystal Plate Mounts Stainless steel


Crystal Dimensions, Surface 2.2 x 3.0 mm

Optics All reflective

Pressure Device Rotating, continuously variable pressure; click stop at maximum

Digital Force Adapter Load cell sensor for precise and reproducible(option) pressure control. Attaches directly to

GladiATR clamp. Digital readout.



Spectral Range, Diamond 4000 to 30 cm-1 (IR optics dependent)

Heating Options Diamond, 210 or 300 ºC maximum

Accuracy +/- 0.5%


Temperature Control Digital or digital with PC control (up to 10 ramps, automated data collection, USB interface)

Input Voltage 90–264 FAC, auto setting, external power supply

Operating Voltage 3 A/24 VDC/75 W6 A/24 VDC/150 W (300 °C version)

Cooling Options Liquid jacketed crystal plates available

Specular Reflection Option Optional, 45 degree nominal angle of incidence

Purge Sealing Purge tubes and purge line connector included

Accessory Dimensions 140 mm wide, 205 mm deep, 340 mm high (excludes FTIR baseplate and mount)


GladiATR Base Optics (must select, insert spectrometer model for XX)P A R T N U M B E R D E S C R I P T I O N

026-18XX GladiATR Single Reflection ATR Base Optics, with heating capability up to 210 °C

026-17XX GladiATR 300 Single Reflection ATR Base Optics, 300 °C

Notes: All GladiATRs include purge tubes, purge kit, and selected spectrometer basemount. GladiATR 300 is configured and available only with the Diamond plate.Crystal plates for the basic model (026-18XX) must be selected from the table below.High-Pressure Clamp, Digital Force Adapter and Liquid Retainer/Volatiles Cover areoptional and need to be ordered separate, if required.

GladiATR Stainless Top (must select one or more)P A R T N U M B E R D E S C R I P T I O N

026-2001 GladiATR Standard Stainless Top

026-2002 GladiATR Heated Stainless Top

026-2003 GladiATR Liquid Jacketed Stainless Top

GladiATR Crystal Plates for GladiATR (must select one or more)P A R T N U M B E R D E S C R I P T I O N

026-2100 Diamond Crystal Plate

026-2050 Ge Crystal Plate

026-2200 Specular Reflection Plate

Notes: GladiATR Crystal Plates are pre-aligned and pinned-in-place. Changing crystalplates is easy and fast to optimize sampling results.

GladiATR Pressure Clamp, all models (must select for solid or powdered samples)P A R T N U M B E R D E S C R I P T I O N



Notes: The High-Pressure Clamp is required for analysis of solids, powders and useof liquid retainer and/or Digital Force Adapter (Digital Force Adapter cannot beused with heated crystal plates). Pressure clamp includes a flat tip, a swivel tip anda concave tip.

GladiATR Temperature Controlled Crystal PlatesP A R T N U M B E R D E S C R I P T I O N

026-4102 Heated Diamond Crystal Plate, 300 °C (GladiATR 300 only)

026-4100 Heated Diamond Crystal Plate, 210 °C

026-4050 Heated Ge Crystal Plate, 130 °C

026-4110 Liquid Jacketed Diamond Crystal Plate

026-4150 Liquid Jacketed Ge Crystal Plate

076-1220 Digital Temperature Control Module (210 °C)

076-1420 Digital Temperature Control Module, PC Control (210 °C)

076-1210 Digital Temperature Control Module (300 °C)

076-1410 Digital Temperature Control Module, PC Control (300 °C)

Notes: For heated diamond crystal plates, maximum crystal temperature is 300 or210 °C, depending on the GladiATR model selected. Ge becomes optically opaque at190 °C. Max recommended temperature for this crystal is 130 °C. Temperature controller is required for heated crystal plates. Digital temperature controller, PCcontrol includes PIKE TempPRO software. Liquid jacketed crystal plates require customer provided circulator.

GladiATR Sampling Options P A R T N U M B E R D E S C R I P T I O N

026-5012 Flow-Through Attachment




Notes: Flow-Through Attachment, Liquids Retainer and Volatiles Cover are compatiblewith all crystal offerings (require High-Pressure Clamp).


PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

14

GladiATR Vision – Diamond ATR with Sample View

F E AT U R E S O F T H E G L A D I AT R V I S I O N

• View through diamond crystal – easily find sample point

• 110X magnification – find and position small sample areas

• Optional USB image capture – document sample image

• Diamond crystal design – cannot scratch or fracture

• Highest energy throughput design – for excellent quality FTIRspectra and minimum scan time

• All reflective optics – full spectral range for mid-IR and far-IR analysis

• Optional heated, viewing crystal plate


Diamond crystal plate of the GladiATR Vision accessory. IR beam and visible illumination meet at the sample position.

ATR/FTIR spectrum of print area on paper run on GladiATR Vision withdiamond crystal. Image of the analysis area is shown in the inset.Spectral range is 4000 – 400 cm-1 with standard FTIR optics.

The GladiATR Vision™ is a novel sampling tool which couplessmall area infrared analysis with simultaneous viewing. Samplesare placed face down and positioned on the diamond crystalwhile its image is projected in real-time on the LCD screen. Findingand optimizing the sample placement for specific analysis areas iseasy and fast! Analysis of thick or non-transparent samples is noproblem because viewing is through the diamond crystal.

The GladiATR Vision accessory utilizes an innovative opticaldesign with IR beam and visible optical image converging at thesample position – ensuring that “What you see is what you sample!”The 110X magnification of the sample image enables the positioningof even relatively small samples into the center of the diamondcrystal for optimized analysis. Analysis of samples as small as 50 microns in size is doable with the GladiATR Vision accessory.Visible images from the GladiATR Vision are of highest qualitycolor rendition because its refractive optics are fully transparent.

The GladiATR Vision optical design is all reflective, preservingthe full spectral range inherent to diamond. For standard mid-IRFTIR spectrometers, the spectral range available with the GladiATRVision will be 4000 – 400 cm-1. For FTIR spectrometers equipped withfar-IR optics, the spectral range is extended to less than 50 cm-1.

The GladiATR Vision diamond ATR is available in configurationsto fit most FTIR spectrometers.

ATR / FTIR spectrum of 200 micron fiber run on GladiATR Vision with diamond crystal. Compressed fiber image is shown with the spectrum.

15

AT

TE

NU

AT

ED

TO

TA

LR

EF

LE

CT

AN

CE

– L

IQ

UI

DS

, SO

LI

DS

AN

DI

N-B

ET

WE

EN

GladiATR Vision Base Optics (must select one, insert spectrometer model for XX)P A R T N U M B E R D E S C R I P T I O N

026-19XX GladiATR Vision Base Optics

026-3510 USB Interface / Software for GladiATR Vision

Notes: GladiATR Vision Base Optics versions include purge tubes, illumination powersupply, purge kit and spectrometer base mount. Please see the FTIR instrumentcode sheet. Optional USB interface software enables image capture on your PC.

GladiATR Stainless Top (must select one or more)P A R T N U M B E R D E S C R I P T I O N

026-2004 GladiATR Vision Stainless Top

026-2005 GladiATR Vision Heated Stainless Top

026-2006 GladiATR Vision Liquid Jacketed Stainless Top

GladiATR Vision Crystal Plates (must select one or more)P A R T N U M B E R D E S C R I P T I O N

026-2102 GladiATR Vision Diamond Crystal Plate

026-2050 Ge Crystal Plate (non-viewing)

026-2200 Specular Reflection Plate (non-viewing)

Notes: GladiATR Crystal Plates are pre-aligned and pinned-in-place. Changing crystal plates is easy and fast to optimize sampling results. Only the GladiATR VisionDiamond Crystal Plate is compatible with sample viewing.

GladiATR Vision High-Pressure Clamp (must select for solid or powdered samples)P A R T N U M B E R D E S C R I P T I O N



Notes: The High-Pressure Clamp is required for analysis of solids, powders and useof liquid retainer and/or Digital Force Adapter (Digital Force Adapter cannot beused heated crystal plates). Pressure clamp includes a flat tip, a swivel tip and aconcave tip.

GladiATR Vision Temperature Controlled Crystal PlateP A R T N U M B E R D E S C R I P T I O N

026-4101 Heated Diamond Crystal Plate, 210 °C, Vision

026-4050 Heated Ge Crystal Plate, 130 °C (non-viewing)

026-4112 Liquid Jacketed Diamond Crystal Plate



Notes: Digital temperature controller, PC control includes PIKE TempPRO software.

GladiATR Vision Sampling OptionsP A R T N U M B E R D E S C R I P T I O N

026-5012 Flow-Through Attachment




Notes: Flow-Through Attachment, Liquids Retainer and Volatiles Cover are compatiblewith all crystal offerings (require High-Pressure Clamp).

O R D E R I N G I N F O R M AT I O NGL ADIATR VIS ION ACCESSORY S P E C I F I C AT I O N S

ATR Crystal Choices Diamond, germanium (non-viewing)


Crystal Type Monolithic

Diamond Mounting Brazed

Crystal Plate Mounts Stainless steel


Crystal Dimensions, Surface 2.2 x 3.0 mm


Pressure Device Rotating, continuously variable pressure;click stop at maximum

Digital Force Adapter (option) Load cell sensor for precise and reproduciblepressure control. Attaches directly toGladiATR clamp. Digital readout.



Spectral Range, Diamond 4000 to 30 cm-1 (IR optics dependent)

Viewing Optics Integrated 4" LCD

Magnification 110X magnification

View Area 770 x 590 microns

Optional Image Save USB image capture

Viewing Mode Through diamond crystal

Input Voltage 90–264 V, auto setting, external power supply

Operating Voltage, Wattage 12 V, 18 watts

Heating Options Diamond, 200 ºC maximum

Accuracy +/- 0.5%


Temperature Control Digital or digital with PC control (up to 10 ramps, automated data collection,USB interface)

Input Voltage 90–264 V, auto setting, externalpower supply

Operating Voltage 3A/24 VDC/75W

Specular Reflection Option Optional, 45 degree nominal angle of incidence

Purge Sealing Purge tubes and purge line connectorincluded

Accessory Dimensions 140 mm wide, 225 mm deep, 340 mm high(excludes FTIR baseplate and mount)


Horizontal Attenuated Total Reflectance (HATR) accessories successfully replace constant path transmission cells, salt platesand KBr pellets used in the analysis of liquid, semi-liquid materialsand a number of solids. HATRs feature a constant and reproducibleeffective pathlength and are well suited for both qualitative andquantitative applications. In general, sampling is achieved byplacing the sample onto the HATR crystal – generally eliminatingsample preparation.

PIKE Technologies HATR products are available in 2 baseoptic configurations. The HATR is an in-compartment design forsamples which fit into the FTIR sample compartment.

The PIKE Technologies HATRPlus is an out-of-compartmentdesign for samples which are larger and do not fit into the FTIRsample compartment. The sampling surface of the HATRPlusextends above the FTIR cover, thereby permitting analysis of verylarge samples. Applications examples include coatings on largemanufactured components, layered composition analysis on largeobjects, and skin analysis in the health care industry.

The PIKE Technologies HATRs are high performance accessories,carefully designed to provide excellent results with minimum effort.The accessories are easily installed in the sample compartment,locking into position on the sample compartment baseplate.

Stable alignment provides excellent analytical precision.Crystal plate changeover is rapid, allowing a wide range of samplesto be analyzed with maximum convenience. PIKE TechnologiesHATRs have been optimized for maximum optical throughput andexcellent quality spectra can be obtained from demanding samples.Several high quality crystal materials covering a full spectrum ofapplications are available. Trough crystal plates are sealed usingmetallic gaskets, eliminating premature failure and the risk ofcross-contamination associated with inferior, epoxy-bonded systems. Flat crystal plates are designed with positive surfacerelief to aid in improved sample contact.

All PIKE HATRs include a purge tube interface for the FTIRspectrometer. This provides full integration of the accessory withthe FTIR spectrometer’s purging system (sealed and desiccated orpurged) and removal of water and carbon dioxide artifacts fromthe FTIR spectra. Thanks to this, purging is very efficient and thespectrometer can be operated with the sample compartmentdoor open.

F E AT U R E S O F T H E H AT R

• Excellent energy throughput offering high signal-to-noiseratio and spectral quality

• Up to 20 internal reflections for maximum sensitivity for low concentration components

• Removable crystal plates with pinned positioning for highprecision and quick cleanup

• HATR plates with ZnSe, KRS-5, Ge, AMTIR or Si crystals with selectable face angles to optimize sampling depth

• In-compartment (HATR) and out-of-compartment (HATRPlus)versions for small and extra large sample sizes

• Several temperature controlled and flow-through crystalplate options

HATR Accessory – in-compartment HATR for liquid and solid samples

HATRPlus™ Accessory –out-of-compartment

HATR for liquid and extra large

solid samples

FTIR spectrum of fuel additive using HATR trough plate with ZnSe crystal

Multiple Reflection HATR – Maximum Sensitivity and Highly Versatile FTIR Sampling

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

16

17

AT

TE

NU

AT

ED

TO

TA

LR

EF

LE

CT

AN

CE

– L

IQ

UI

DS

, SO

LI

DS

AN

DI

N-B

ET

WE

EN

HATR Crystal Plate ChoicesPIKE Technologies HATR crystal plates are available in trough andflat plate configurations.

The trough plate is designed for easy sampling, with a large,recessed crystal to accommodate the sample – generally a liquid,powder, or paste. The trough plate is ideal when samples must be cleaned from the crystal with some type of aqueous or organic solvent.

Typically, only a thin layer of the sample needs to be appliedonto the crystal surface. For fast evaporating samples, a volatilescover should be used to cover the sampling area.

Soft powders will often produce good spectra when analyzedby HATR, assuming that they can be put in intimate contact withthe crystal. A powder press option is used to achieve this. Thisdevice is placed directly on top of the sample filled trough andpressed by hand until the desired result is obtained.

The flat plate is used for the analysis of solid materials –including polymer and film samples. It is ideal for solid sampleswhich are too large to fit within the trough plate configuration.

The crystal is mounted slightly above the surface of the metalplate, which helps to achieve good crystal/sample contact whenthe flat plate press is used (the press attaches easily to the back ofthe HATR with two thumb screws).

The ZnSe 45° flat plate is available in a sealed version, which is ideal for sampling of oils and other types of low surfacetension liquids.

FTIR spectrum of coating on inner wall of food container by HATR withZnSe flat plate and pressure clamp

PIKE Technologies Crystal Plate Choices – for the HATR and HATRPlus

Flat plate HATR crystal plate – ideal for solids, polymer films and coatings

Trough plate HATR crystal plate – ideal for liquids, powders, pastes and gels HATR with Heated Trough Plate – foreground shows Heated Flow-Through Cell

PIKE TempPRO Software for Kinetic Experiments with our ResistivelyHeated Crystal Plates

All resistively heated HATR plates are controlled by PIKE temperature controllers in digital or digital PC versions. The selection of the digital PC version includes PIKE TempPRO software,which provides a graphical user interface for temperature controland kinetic measurements.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

18

A large number of temperature-controlled and flow-throughsampling plates are available for PIKE Technologies HATRs – all are pin-mounted to the HATR with no alignment required.

All temperature controlled and flow-through crystal plateoptions are compatible and interchangeable with HATR andHATRPlus products. PIKE Technologies temperature controllersprovide static or ramped temperature control.

All PIKE HATR flow cells have removable HATR crystals. Theupper and lower part of the crystal plate is removed, and thecrystal can be easily taken out of the plate. This feature enablesreplacement of the crystals and facilitates special cleaning forproteins and other “sticky” samples.

For special applications where you need to look at coatings onan HATR crystal, PIKE Technologies offers the RCPlate™ option. Thenew RCPlate is designed to enable easy removal and reinsertionof the HATR crystal. Applications include analysis of coatings,mono-molecular layers, or bio-films deposited directly upon theHATR crystal. With these new RCPlates, it is easy to collect thebackground spectrum on the clean crystal, remove the HATR crystal from the RCPlate, coat the crystal and then reposition itinto the RCPlate to collect the sample spectrum.

SummaryThe PIKE Technologies HATR accessory provides high sensitivityfor analysis of low concentration components in liquid, solid, andpolymer samples. The highly flexible accessory is available for in-compartment and out-of-compartment configurations with complete selection of crystal material, sample format, and temperature and flow-through configurations.

Do you need an HATR product or feature not shown here inour catalog? Please contact us to discuss your application.

HATR with Liquid Jacketed Flow Cell (background). Liquid Jacketed troughplate is shown in foreground.

RCPlate for HATR

Complete HATR SystemsBundled HATR Systems (must select, insert spectrometer model for XX)P A R T N U M B E R D E S C R I P T I O N

022-10XX HATR Trough Plate System with 45º ZnSe CrystalIncludes: Trough Plate, Volatiles Cover and Powder Press

022-11XX HATR Flat Plate System with 45º ZnSe CrystalIncludes: Flat Plate and HATR Pressure Clamp

022-12XX HATR Combined Trough and Flat Plate System with 45º ZnSe CrystalsIncludes: Trough Plate, Flat Plate, Volatiles Cover, Powder Press and Sample Clamp

024-11XX HATRPlus Flat Plate System with 45º ZnSe CrystalIncludes: Flat Plate and HATR Pressure Clamp

Notes: HATR and HATRPlus Systems may be purchased with crystal plates otherthan ZnSe. Just add – Ge for germanium, – KR for KRS-5, -AM for AMTIR, or –Si forSilicon. Additional plates can be added to an order for any system above. Otherconfigurations may be selected from the options below. Please see the FTIR instrument code sheet.

Configurable HATR SystemsHATR Base Optics (insert spectrometer model for XX)P A R T N U M B E R D E S C R I P T I O N

022-19XX HATR Platform Optics Assembly

024-19XX HATRPlus Platform Optics Assembly

Notes: HATR and HATRPlus Platform Optics Assemblies include volatiles cover, powder press, purge tubes, purge kit and spectrometer base mount. Please see theFTIR instrument code sheet.

HATR and HATRPlus Crystal Plates (must select 1 or more)P A R T N U M B E R D E S C R I P T I O N

022-2010-45 Trough Plate, ZnSe, 45°

022-2020-45 Flat Plate, ZnSe, 45°

022-2024-45 Sealed Flat Plate, ZnSe, 45°

022-2012-45 Trough Plate, ZnSe, 45°, 2 mm

022-2022-45 Flat Plate, ZnSe, 45°, 2 mm

022-2030-45 Trough Plate, KRS-5, 45°

022-2040-45 Flat Plate, KRS-5, 45°

022-2050-45 Trough Plate, Ge, 45°

022-2060-45 Flat Plate, Ge, 45°

022-2064-45 Sealed Flat Plate, Ge, 45°

022-2052-45 Trough Plate, Ge, 45°, 2 mm

022-2062-45 Flat Plate, Ge, 45°, 2 mm

022-2070-45 Trough Plate, AMTIR, 45°

022-2080-45 Flat Plate, AMTIR, 45°

022-2090-45 Trough Plate, Si, 45°

022-2100-45 Flat Plate, Si, 45°

Notes: HATR Crystal Plates are pre-aligned and pinned-in-place. Changing crystalplates is easy and fast to optimize sampling results. For all HATR crystal plates, 30 and 60 degree face angles are also available. Due to critical angle ZnSe, KRS-5 and AMTIR are not available in 30 degree face angle. Where not noted, crystals are 4 mm thick and generate 10 internal reflections. 2 mm crystals generate20 reflections (45° cut). If you need a crystal not listed here, please contact us.


19

AT

TE

NU

AT

ED

TO

TA

LR

EF

LE

CT

AN

CE

– L

IQ

UI

DS

, SO

LI

DS

AN

DI

N-B

ET

WE

EN


HATR and HATRPlus Pressure Clamp (must select for solids, films or powder analysis)P A R T N U M B E R D E S C R I P T I O N

022-3050 HATR (pivoting) Pressure Clamp

022-3054 HATR High-Pressure Clamp

024-3050 HATRPlus (pivoting) Pressure Clamp

024-3053 HATRPlus High-Pressure Clamp

Notes: The pressure clamp is required for solids, films, coatings and powdered samples.

HATR and HATRPlus Flow CellsP A R T N U M B E R D E S C R I P T I O N

022-4010 HATR Flow Cell, ZnSe, 45°

022-4020 HATR Flow Cell, AMTIR, 45°

022-4030 HATR Flow Cell, KRS-5, 45°

022-4040 HATR Flow Cell, Si, 45°

022-4050 HATR Flow Cell, Ge, 45°

Notes: HATR flow cells include Luer-Loc fittings for easy connection with a syringe. A set of 1/16" Swageloc fittings are included with each flow cell for connection with1/16" tubing. Flow cell volume is 500 µl.

HATR and HATRPlus Liquid Jacketed Crystal PlatesP A R T N U M B E R D E S C R I P T I O N

022-5310 HATR Liquid Jacketed Trough Plate, ZnSe, 45°

022-5320 HATR Liquid Jacketed Trough Plate, AMTIR, 45°

022-5330 HATR Liquid Jacketed Trough Plate, KRS-5, 45°

022-5340 HATR Liquid Jacketed Trough Plate, Si, 45°

022-5350 HATR Liquid Jacketed Trough Plate, Ge, 45°

Notes: Liquid jacketed crystal plates require customer provided circulating waterbath. Liquid jacketed crystal plates enable heating to 130 °C and cooling.

HATR and HATRPlus Heated Crystal PlatesP/N FORSINGLE RTD D E S C R I P T I O N

022-5110 HATR Heated Trough Plate, ZnSe, 45°

022-5120 HATR Heated Trough Plate, AMTIR, 45°

022-5130 HATR Heated Trough Plate, KRS-5, 45°

022-5140 HATR Heated Trough Plate, Si, 45°

022-5150 HATR Heated Trough Plate, Ge, 45°


022-5210 HATR Heated Flow-Through Cell, ZnSe, 45°

022-5220 HATR Heated Flow-Through Cell, AMTIR, 45°

022-5230 HATR Heated Flow-Through Cell, KRS-5, 45°

022-5240 HATR Heated Flow-Through Cell, Si, 45°

022-5250 HATR Heated Flow-Through Cell, Ge, 45°




Notes: Temperature is adjustable to 130 °C for heated trough and flow-thru plates.Resistance heated plates require selection of a PIKE Technologies TemperatureController. PC Control Module includes PIKE Technologies TempPRO software.

HATR and HATRPlus Liquid Jacketed, Flow-Through Crystal PlatesP A R T N U M B E R D E S C R I P T I O N

022-5410 HATR Liquid Jacketed Flow-Through Plate, ZnSe, 45°

022-5420 HATR Liquid Jacketed Flow-Through Plate, AMTIR, 45°

022-5430 HATR Liquid Jacketed Flow-Through Plate, KRS-5, 45°

022-5440 HATR Liquid Jacketed Flow-Through Plate, Si, 45°

022-5450 HATR Liquid Jacketed Flow-Through Plate, Ge, 45°

Notes: Liquid jacketed flow-through crystal plates require customer provided circulating water bath. Liquid jacketed flow-through crystal plates enable heatingto 130 °C and cooling. HATR flow cells include Luer-Loc fittings for easy connectionwith a syringe. A set of 1/16" Swageloc fittings are included with each flow cell forconnection with 1/16" tubing.

HATR RCPlateP A R T N U M B E R D E S C R I P T I O N

022-2300 RCPlate for HATR (for 45° crystals)

Notes: Requires a selection of HATR Crystal – see below.

HATR and HATRPlus Replacement PartsP A R T N U M B E R D E S C R I P T I O N

022-3051 HATR Volatiles Cover

022-3052 HATR Powder Press

022-3110 Crystal, 45°, Trap, 80 x 10 x 4 mm ZnSe

022-3111 Crystal, 45°, Trap, 80 x 10 x 4 mm KRS-5

022-3112 Crystal, 45°, Trap, 80 x 10 x 4 mm Ge

022-3113 Crystal, 45°, Trap, 80 x 10 x 4 mm AMTIR

022-3114 Crystal, 45°, Trap, 80 x 10 x 4 mm Si

022-3130 Crystal, 60°, Trap, 80 x 10 x 4 mm ZnSe

022-3132 Crystal, 60°, Trap, 80 x 10 x 4 mm Ge

022-3040 Viton O-Ring, HATR Flow Cell, Upper (6 ea.)

022-3045 Viton O-Ring, HATR Flow Cell, Lower (6 ea.)

022-3042 HATR Flow Cell Upper Teflon O-Ring

022-3047 HATR Flow Cell Lower Teflon O-Ring

Notes: Please contact PIKE Technologies for items not described in this list.Reconditioning service for used HATR crystal plates is available.

RES IST IVELY HEATED HATR PL ATES SPEC IF ICAT IONS

Temperature Range Ambient to 130 °C

Accuracy +/- 0.5%


Controllers

Digital +/- 0.5% of set point

Digital PC +/- 0.5% of set point, graphical setup, upto 10 ramps, USB interface


Output Voltage 24 VDC/50 W max.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

20

ATRMax II Variable Angle Horizontal ATR Accessory – HATR for Inquisitive Minds

The ATRMax II is a high throughput, variable angle horizontal ATRaccessory developed for use in FTIR spectrometers. The designemploys a unique optical layout (U.S. patent 5,105,196) whichenables samples to be analyzed over a range of incident angles(from 25 to 65 degrees). Variable angle of incidence providesexperimental control over the depth of penetration of an IRbeam into the sample and the number of beam reflections in the ATR crystal, which in turn determines the effective IR beampathlength for a given experiment. Adjustable angle of incidenceallows immediate optimization of measurements for otherwisedifficult to analyze samples. The ATRMax can be used for depthprofiling studies where spectral composition can be analyzed relative to depth of penetration as the angle of incidence is changed.

Two crystal configurations, flat plate and trough plate, areavailable for the ATRMax II. The flat plate design is used for theanalysis of coatings, films and solids. Typical applications includedepth profiling studies and optimization of ATR spectral data. A sample clamp is required to provide intimate contact betweenthe sample and crystal surface.

F E AT U R E S O F T H E AT R M A X I I

• Selectable angle of incidence – 20 to 70 degrees in onedegree increments

• 0.5 to 10 micron depth of penetration – dependent on crystalmaterial, angle of incidence, sample’s refractive index andwavelength of IR beam – ideal for depth profiling studies

• 3 to 12 reflections of IR beam – dependent upon angle of incidence – ideal for optimizing ATR sampling methods

• Flat and trough crystal plates for solids, films, powders andliquid samples – optional temperature control for all plates

• Optional, high-pressure clamp for sampling of films, coatings or powdered samples

• Motorized option with electronic control module and AutoPRO™software for automated, high-precision experiments

• Sealed and purgeable optical design to eliminate watervapor and carbon dioxide interferences

Depth profiling study of silicon release agent using ATRMax II accessory.FTIR spectra collected using Ge crystal flat plates at effective angles ofincidence from 25 to 65 degrees.

Proprietary beam path within the ATRMax II FTIR sampling accessory.

21

AT

TE

NU

AT

ED

TO

TA

LR

EF

LE

CT

AN

CE

– L

IQ

UI

DS

, SO

LI

DS

AN

DI

N-B

ET

WE

EN

The trough crystal plate is recommended for use with liquids,pastes and powdered samples. Typical applications include theanalysis of oils, detergents, and other liquid samples. A volatilescover and powder press are included with the ATRMax II for usewith this crystal mount.

The ATR crystals for the ATRMax II are of trapezoidal shapeand 56 mm long, 10 mm wide and 4 mm thick. Standard bevelangles at each end of the crystal are available in 30, 45, and 60degree versions. Coupling the variable angle of incidence of theATRMax II with the variable crystal face angles, one can selecteffective angle of incidence ranging from 25 to 65 degrees andthe range in number of reflections from 3 to 12.

The variable angle of incidence can be controlled manuallyor with an optional motorized attachment for the ATRMax II.Multiple ATR measurements at different angles of incidence canbe fully automated with the motorized version and PIKE TechnologiesAutoPRO software. Automation streamlines the collection of spectra from multiple angles of incidence. With the automatedATRMax accessory, the entire experiment can be pre-programmedand executed by the computer.

Advantages of the automated ATRMax II system include:

• Computer controlled precision, accuracy and repeatability

• Synchronization of mirror position changes with collection of sample spectra

• Full integration of the PIKE Technologies AutoPRO software withFTIR spectrometer programs

• Tailor made, predefined experiments

• “Hands-free” operation

Optimized FTIR spectrum of polymer film run with the ATRMax II at 60 degree angle of incidence.

Liquid cough syrup sample run with the ATRMax II accessory using theZnSe trough plate and a 40 degree angle of incidence.

AutoPRO Software control ofATRMax angle of incidence(automated polarizer available)for automated depth profilingstudies and ATR experimentoptimization.

Optional resistively heated crystalplates are available for the ATRMax IItrough, flat and flow cell versions.These heated crystal plates are drivenusing PIKE Technologies TemperatureControllers available in digital anddigital PC versions. The digital PC version includes PIKE TempPRO soft-ware for graphical setup and datacollection for kinetic experiments.

Ambient temperature and liquid-jacketed flow cells are available forthe ATRMax II. With the liquid-jacketedversion one can measure samples atheated or cooled temperatures usinga circulating water bath.

ATRMax II RCPlate

For special applications where you need to look at coatingson an ATR crystal, PIKE Technologies offers the RCPlate™ option.The new RCPlate is designed to enable easy removal and reinsertionof the ATR crystal. Applications include analysis of coatings,mono-molecular layers, or bio-films deposited directly upon the ATR crystal. With these new RCPlates, it is easy to collect the background spectrum on the clean crystal, remove the ATR crystalfrom the RCPlate, coat the crystal and then reposition it into theRCPlate to collect the sample spectrum.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

22

ATRMax II System ConfigurationsPA R T NU M B E R D E S C R I P T I O N

023-10XX ATRMax II Trough Plate System with 45º ZnSe CrystalIncludes: Trough Plate, Volatiles Cover and Powder Press

023-11XX ATRMax II Flat Plate System with 45º ZnSe CrystalIncludes: Flat Plate and HATR Pressure Clamp

023-12XX ATRMax II Combined Trough and Flat Plate System with 45º ZnSe CrystalsIncludes Trough Plate, Flat Plate, Volatiles Cover, Powder Press and Sample Clamp

Notes: ATRMax II Systems may be purchased with crystal plates other than ZnSe.Just add – Ge for germanium, -KR for KRS-5, -AM for AMTIR, or – Si for Silicon.Additional plates can be added to an order for any system above. Other configurationsmay be selected from the options below.

ATRMax II Base Optics (must select, insert spectrometer model for XX)PA R T NU M B E R D E S C R I P T I O N

023-19XX ATRMax II Variable Angle HATR

Notes: ATRMax II Base Optics includes volatiles cover, powder press, purge tubes,purge kit and spectrometer base mount.

ATRMax II Crystal Plates (must select 1 or more)PA R T NU M B E R D E S C R I P T I O N

023-2001 Trough Plate, ZnSe, 45°

023-2011 Flat Plate, ZnSe, 45°





023-2003 Trough Plate, Ge, 45°

023-2013 Flat Plate, Ge, 45°


023-2033 Flat Plate, Ge, 30°


023-2053 Flat Plate, Ge, 60°

023-2046 Trough Plate, AMTIR, 45°

023-2047 Flat Plate, AMTIR, 45°

023-2002 Trough Plate, KRS-5, 45°

023-2012 Flat Plate, KRS-5, 45°


023-2032 Flat Plate, KRS-5, 30°


023-2052 Flat Plate, KRS-5, 60°

023-2044 Trough Plate, Si, 45°

023-2045 Flat Plate, Si, 45°

Notes: ATRMax Crystal Plates are pre-aligned and pinned-in-place. Changing crystalplates is easy and fast to optimize sampling results. If you need a crystal plate notlisted here, please contact us.

ATRMax II Pressure ClampP A R T N U M B E R D E S C R I P T I O N

023-3050 ATRMax Pressure Clamp

Notes: The pressure clamp is required for solids, films, coatings and powdered samples.

ATRMax II Sampling OptionsPA R T NU M B E R D E S C R I P T I O N

023-2800 Motorized Upgrade for ATRMax II

023-2850 Motorized Option for ATRMax II

090-1000 Manual Polarizer, ZnSe

090-2000 Automated Polarizer, ZnSe

023-2300 RCPlate for ATRMax II

023-4000 ATRMax Flow Cell Assembly (Order crystal separately)

023-4100 ATRMax Liquid-Jacketed Flow Cell Assembly (Order crystal separately)

023-4200 ATRMax Heated Flow Cell Assembly (Order crystal separately)

023-4300 ATRMax Heated Trough Plate Assembly (Order crystal separately)

023-4400 ATRMax Heated Flat Plate Assembly (Order crystal separately)

013-4200 ATR Variable Angle Heating Conversion Plate



Notes: Motorized Option includes PIKE Technologies AutoPRO software and controller.Other polarizer options are found in the polarization section of this catalog. TheATR Variable Angle Heating Conversion Plate must be selected with temperaturecontrolled crystal plates. Resistively heated crystal plates require selection of theTemperature Control Module. Maximum crystal temperature is 130 °C.

ATRMax II CrystalsPA R T NU M B E R D E S C R I P T I O N

023-3110 Crystal, 45 deg., Trap., 56 x 10 x 4, ZnSe

023-3130 Crystal, 60 deg., Trap., 56 x 10 x 4, ZnSe

023-3120 Crystal, 30 deg., Trap., 56 x 10 x 4, Ge



023-3121 Crystal, 30 deg., Trap., 56 x 10 x 4, Si



023-3113 Crystal, 45 deg., Trap., 56 x 10 x 4, AMTIR

023-3133 Crystal, 60 deg., Trap., 56 x 10 x 4, AMTIR

Notes: Please contact PIKE Technologies for crystals not on this list.

ATRMax II Replacement PartsPA R T NU M B E R D E S C R I P T I O N

023-3051 ATRMax II Volatiles Cover

023-3052 ATRMax II Powder Press

Notes: Please contact PIKE Technologies for items not described in this list.Reconditioning service for used ATRMax crystal plates is available.


RES IST IVELY HEATED ATRMAX I I PL ATES SPEC IF ICAT IONS


Accuracy +/- 0.5%

Voltage 24 VDC


ControllerDigital +/- 0.5% of set point

Digital PC +/- 0.5% of set point, graphical setup, up to 10 ramps, USB interface


Operating Voltage 24 VDC/36 W

23

AT

TE

NU

AT

ED

TO

TA

LR

EF

LE

CT

AN

CE

– L

IQ

UI

DS

, SO

LI

DS

AN

DI

N-B

ET

WE

EN

VeeMAX II with ATR – Variable Angle, Single Reflection ATR for Depth Profiling Studies

The VeeMAX II with ATR offers continuous variable angle of incidenceand a variety of crystal plates to selectively control the depth ofpenetration of the IR beam into the sample. ATR applicationsinclude the study of layered samples, coatings, release agents,monolayers on silicon and chemical migration studies.

The VeeMAX II with ATR accessory provides exceptionally high throughput (over 50% with 45 degree ZnSe crystal) to minimizesampling time and enable detection of low concentration compo-nents in samples of complex composition. The flat plate crystalsoffered for the VeeMAX II are ideal for solid and layered samplesand are designed for use with the optional pressure clamp. The

combination of large crystal diameter (20 mm) and slip-clutchpressure clamp provides sample to crystal contact without alteringlayered sample composition. The optional liquid retainer may beadded to the crystal plate for analysis of liquid samples.

Monolayers and ultra-thin films absorbed on silicon or goldsubstrate are easily sampled using the VeeMAX II equipped with ahigh refractive index ATR crystal. Compared to specular reflectancesampling for monolayer analysis, an increase in sensitivity of upto 1-2 orders of magnitude may be realized via ATR sampling. Forthese applications, the VeeMAX II accessory is configured toinclude a high-angle Ge flat plate (60 or 65°), the VeeMAX II high-pressure clamp with a 7.8 mm pressure tip, and a polarizer.

A spectroelectrochemical cell option for the VeeMAX II is alsoavailable. The innovative design offers a polytetrafluoroethylenecup sealed to an ATR crystal, which is mounted on the VeeMAX.The crystals are interchangeable for optimizing spectral resultsand are removable to allow electrode coating on the ATR surface.The high throughput of the VeeMAX with ATR provides excellentsensitivity and reduced sampling time. Additionally, a flat IRtransparent window may be installed instead to permit specularreflectance sampling. The electrochemistry cell is equipped with aprecision micrometer for electrode positioning.

F E AT U R E S O F T H E V E E M A X I I W I T H AT R

• Continuously variable set angle of incidence – 30 to 75 degrees

• 0.4 to 46 micron depth of penetration – dependent on crystalmaterial, angle of incidence, sample’s refractive index andwavelength of IR beam – ideal for depth profiling studies

• High throughput for excellent quality spectra in a short time period

• Optional, high-pressure clamp for sampling of films, coatingsor powdered samples

• Integrated position for optional manual or automatedpolarization

• Motorized option with electronic control module and AutoPROsoftware for automated, high-precision experiments

• VeeMAX II can be used as a variable angle of incidence specular reflection accessory

• Configurable for specialized applications – monolayer studiesand spectroelectrochemistry


Depth profiling study of layered polymer film. FTIR spectra collectedusing ZnSe crystal at set angles of incidence from 43 to 65 degrees. IR absorbance band at 1591 cm-1 clearly increases relative to otherbands as we probe deeper into the sample.

Analysis of monomolecular layer on silicon – VeeMAX II with 60 degreeGe crystal, pressure clamp with 7.8 mm tip and p polarization.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

24

Motorized control of angle of incidence via personal computerfor automated data collection of depth profiling studies and ATRmeasurements is available for the accessory. The motorizedVeeMAX II is ideal for depth profiling studies as it greatly speedsand improves the precision and reproducibility of the data collection process.

Spectroelectrochemical cell with removable and interchangeable crystalsmounted on the VeeMAX

VeeMAX spectroelectrochemical cell offers maximum flexibility by itsinterchangeable and removable crystals

AutoPRO Software controlof VeeMAX II angle of incidence (automatedpolarizer available) forautomated depth profilingstudies, angle of incidenceand polarization anglecan be set independently.

VeeMAX withATR opticallayout

Heated crystal plates are availablefor the VeeMAX II for TemperatureStudies

TempPRO software forgraphical setup and controlof kinetic measurements

VEEMAX I I WITH ATR SPEC IF ICAT IONS

ATR Crystal Choice ZnSe, Ge, Si, ZnS


Crystal Plate Mounts Stainless Steel

Crystal Dimension, Surface 20 mm diameter


Pressure Device Rotating, continuous variable pressure; clickstop at maximum

Heating Options 130 °CAccuracy +/- 0.5%Sensor Type 3 wire Pt RTD (low drift, high stability)Temperature Control Digital or digital with PC control (up to 10 ramps,

automated data collection, USB interface)Input Voltage 90–264 V, auto setting, external

power supply

Operating Voltage 24 VDC/36W

Purge Sealing Purge tubes and purge barb included

Accessory Dimensions 74 mm wide, 69 mm tall, 40 mm deep(excludes clamp height and baseplate)

Spectroelectrochemical Vessel Dimensions 19 mm diameter tapering to 25 mm, 25 mm tall

Spectroelectrochemical Vessel Volume 7.5 mL

Spectroelectrochemical Vessel Material Polytetrafluoroethylene


Temperature controlled crystal plates are available for thermalstudy of materials. PIKE Technologies offers temperature controllerswith digital and PC programmable set points.

25

AT

TE

NU

AT

ED

TO

TA

LR

EF

LE

CT

AN

CE

– L

IQ

UI

DS

, SO

LI

DS

AN

DI

N-B

ET

WE

EN

VeeMAX II Pressure Clamp (must select for solids, films or powder analysis)P A R T N U M B E R D E S C R I P T I O N

013-3100 VeeMAX ATR Pressure Clamp

025-3094 7.8 mm ATR Pressure Tip

Notes: Pressure clamp supplied with 20 mm tip for polymer films. The 7.8 mm pressuretip is required for monolayers on silicon or small samples. The pressure clamp isrequired for solids, films, coatings and powdered samples.

VeeMAX II Sampling OptionsP A R T N U M B E R D E S C R I P T I O N

007-0300 PIKECalc Software

013-2850 Motorized Option for VeeMAX II

013-2800 Motorized Upgrade for VeeMAX II



Notes: PIKECalc software provides easy calculations of depth of penetration, effectiveangle of incidence and critical angle for ATR measurements. Motorized Option includesPIKE Technologies AutoPRO software and controller. Other polarizer options arefound in the polarization section of this catalog.

Spectroelectrochemical ConfigurationP A R T N U M B E R D E S C R I P T I O N

013-3200 Electrochemical Cell

013-3110 ZnSe Crystal, 45°

013-3130 ZnSe Crystal, 60°

013-3112 Ge Crystal, 45°

013-3132 Ge Crystal, 60°

013-3114 Si Crystal, 45°

013-3134 Si Crystal, 60°

013-3115 ZnS Crystal, 45°

013-3135 ZnS Crystal, 60°

160-1144 CaF2 Flat Window, 20 mm diameter

160-1304 ZnSe Flat Window, 20 mm diameter

013-3245 45° Alignment Fixture

013-3260 60° Alignment Fixture

Notes: The electrochemical configuration requires electrochemical cell and theVeeMAX II Specular Reflectance Accessory. Must select one or more crystals. Choosean alignment fixture to match the crystal angle. A CaF2 window may be used forspecular reflectance sampling. Other window types for specular reflectance meas-urements may be found in our listing of transmission windows, 20 mm x 2 mm.Either alignment fixture is applicable for mounting a flat window. Electrodes sup-plied by the end-user.

Replacement PartsP A R T N U M B E R D E S C R I P T I O N

013-4010 Mask Set for VeeMAX


VeeMAX II Base Optics (must select, insert spectrometer model for XX)P A R T N U M B E R D E S C R I P T I O N

013-10XX VeeMAX II Variable Angle Specular Reflectance Accessory

Notes: VeeMAX II includes specular reflectance masks (2", 5/8" and 3/8"), purge tubes,purge kit and spectrometer base mount. Please see the FTIR instrument code sheet.

VeeMAX II ATR Crystal Plates (must select 1 or more for ATR)P A R T N U M B E R D E S C R I P T I O N



013-4040 Flat Plate, Ge, 45°

013-4050 Flat Plate, Ge, 60°

013-4060 Flat Plate, Ge, 65°

013-4080 Flat Plate, Si, 45°

013-4070 Flat Plate, Si, 60°

013-4090 Flat Plate, ZnS, 45°

013-4095 Flat Plate, ZnS, 60°

013-3400 Liquid Retainer for VeeMAX II ATR crystals

013-3500 VeeMAX II ATR Flow Cell

Notes: VeeMAX II Crystal Plates are pre-aligned and pinned-in-place. Changing crystal plates is easy and fast to optimize sampling results. ZnS crystal plate isexcellent for deepest penetration of IR beam. Si crystal plate is excellent for Far IR ATR. If you need a crystal not listed here, please contact us. Reconditioningservice for used VeeMAX crystal plates is available.

Heated VeeMAX II ATR Crystal Plates (optional)P A R T N U M B E R D E S C R I P T I O N

013-4120 Heated Flat Plate, ZnSe, 45°

013-4130 Heated Flat Plate, ZnSe, 60°

013-4140 Heated Flat Plate, Ge, 45°



013-4170 Heated Flat Plate, Si, 60°

013-4180 Heated Flat Plate, Si, 45°

013-4190 Heated Flat Plate, ZnS, 45°

013-4195 Heated Flat Plate, ZnS, 60°

013-4200 ATR Variable Angle Heating Conversion Plate



Notes: Heated VeeMAX crystal plates may be heated to 130 °C. A temperature controller and the ATR Variable Angle Heating Conversion Plate must be selected.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

26

Classic VATR – Variable Angle ATR for Analysis of Solids, Films and Coatings

The Variable Angle ATR, is a traditional in-compartment accessorywith the ATR crystal mounted vertically with respect to the spec-trometer baseplate. Its optical layout is based on an optimizedGilby configuration and allows continuous adjustment of the incident beam angle between 30 to 60 degrees. This accessory is suitable for the analysis of solids, films and coatings, but for obvious reasons, it cannot be used for working with liquids. Aunique mirror adjustment mechanism which utilizes mirror placement and proportional pivoting allows precise and repeatablealignment. The PIKE Technologies Variable Angle ATR offers flexi-bility when the frequent replacement of ATR crystals is required.VATR is an excellent, low-cost tool for teaching the principles ofinternal reflection spectroscopy, and for basic research.

F E AT U R E S O F T H E C L A S S I C VAT R

• 30º to 60º – continuously variable angle of incidence

• Full control over the number of reflections and depth of penetration

• Unique mechanism for fine-tuning mirror positions and precise and repeatable alignment

• High energy throughput

• Stainless steel, easy to remove crystal mounts and anvils

• Economical introduction to ATR techniques – excellent R&D and teaching tool


VATR Base Optics (must select, insert spectrometer model for XX)P A R T N U M B E R D E S C R I P T I O N

021-19XX VATR Variable Angle, Vertical ATR

Notes: VATR Base Optics includes plate for mounting in FTIR spectrometer slide mount.

VATR Crystal Options (must select 1 or more)P / N 5 0 M M D E S C R I P T I O N P / N 2 5 M M

021-4000 KRS-5, 45° Parallelogram 021-4020

021-4010 KRS-5, 60° Parallelogram 021-4030

021-4040 ZnSe, 45° Parallelogram 021-4050

021-4150 ZnSe, 60° Parallelogram 021-4120

021-4130 Ge, 30° Parallelogram 021-4100



021-4160 Si, 45° Parallelogram 021-4110

Notes: VATR crystals are available in 25 mm and 50 mm lengths – all are 3 mm thick and 10 mm wide. Select crystal length and type based upon desiredsample absorbance.

VATR Crystal Holder and Clamp (must select 1 or more to hold ATR crystals)P A R T N U M B E R D E S C R I P T I O N

021-5050 50 mm VATR Crystal Holder and Clamp

021-5020 25 mm VATR Crystal Holder, Clamp and Mirror

Notes: The pressure clamp is selected for the ATR crystal length.

VATR Replacement PartsP A R T N U M B E R D E S C R I P T I O N

021-5040 25 mm VATR Crystal Holder and Clamp

021-5030 Set of 25 mm and 50 mm Pads

Notes: Please contact PIKE Technologies for items not described in this list.

27

AT

TE

NU

AT

ED

TO

TA

LR

EF

LE

CT

AN

CE

– L

IQ

UI

DS

, SO

LI

DS

AN

DI

N-B

ET

WE

EN

ATR – Theory and ApplicationsAttenuated Total Reflectance (ATR) is today the most widely usedFTIR sampling tool. ATR generally allows qualitative or quantitativeanalysis of samples with little or no sample preparation, whichgreatly speeds sample analysis. The main benefit of ATR samplingcomes from the very thin sampling pathlength and depth of penetration of the IR beam into the sample. This is in contrast totraditional FTIR sampling by transmission where the sample mustbe diluted with IR transparent salt, pressed into a pellet or pressed toa thin film, prior to analysis to prevent totally absorbing bands inthe infrared spectrum.

A comparison of transmission versus ATR sampling results fora thick polymer sample is shown below where the sample is toothick for high quality transmission analysis (shown in the lowerblue spectrum). In transmission spectroscopy, the IR beam passesthrough the sample and the effective pathlength is determined bythe thickness of the sample and its orientation to the directionalplane of the IR beam. Clearly in the example below the sample istoo thick for transmission analysis because most of the IR bandsare totally absorbing.

However, simply placing the thick sample on the ATR crystal(Diamond MIRacle) and applying pressure generates a nearly perfect result (upper red spectrum) – identified by library searchas a polybutylene terephthalate. The total analysis time for thethick polymer by ATR was less than 1 minute.

How ATR WorksWith ATR sampling we direct the IR beam into a crystal of relativelyhigher refractive index. The IR beam reflects from the internalsurface of the crystal and creates an evanescent wave, which projects orthogonally into the sample in intimate contact with the ATR crystal. Some of the energy of the evanescent wave isabsorbed by the sample and the reflected radiation (some nowabsorbed by the sample) is returned to the detector. This ATRphenomenon is shown graphically in the following representationof a single reflection ATR.

While the analysis of samples by ATR is easy, it is interestingand useful to be aware of each of the following experimental factors and how they affect the final spectrum:

• Refractive indices of the ATR crystal and the sample

• Angle of incidence of the IR beam

• Critical angle

• Depth of penetration

• Wavelength of the IR beam

• Effective pathlength

• Number of reflections

• Quality of the sample contact with ATR crystal

• ATR crystal characteristics

The refractive indices of the crystal and sample are importantconsiderations in the ATR sampling technique by virtue of the following equation,

where n2 is the refractive index of the sample, n1 is the refractiveindex of the crystal and θc is the critical angle.

When we exceed the critical angle, we will observe a purelyATR spectral result. If the critical angle is not met, we will observea combined ATR and external reflectance result. This occurs if theangle of incidence of the IR beam is too low, if the refractiveindex of the crystal is too low, if the refractive index of the sampleis too high or a combination of these 3 factors. In most cases thisproblem is not observed, however, an example of this is shown inthe following spectral data for your reference. The sample is ahigh refractive index liquid (n=1.8) run on a 45 degree accessoryusing diamond and Ge crystal plates. The spectrum run on the Ge crystal plate exhibits a normal baseline and symmetricabsorbance bands – critical angle is met. The spectrum run onthe diamond crystal plate has a baseline shifted and asymmetricabsorbance bands due to non-adherence to the critical anglerequirements for this set of analysis parameters.

Another way to correct the spectral artifacts observed (above) inthe high refractive index sample spectrum would be to increasethe angle of incidence in the ATR accessory to a value above thecritical angle. Adjustment or selection of the angle of incidence isavailable in several of the PIKE Technologies ATR accessories.

ATR and Transmission Spectra of a Thick Polymer Sample

Graphical Representation of a Single Reflection ATR

Spectra of High Refractive Index Liquid using Ge (upper red) andDiamond (lower blue) ATR Crystals

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

28

Further useful consideration for ATR analysis is the depth ofpenetration (dp) of the IR beam into the sample. Technically, thisis defined as the distance required for the electric field amplitudeto fall to e-1 of its value at the surface and is further defined by:

where λ is the wavelength of light and θ is the angle of incidenceof the IR beam relative to a perpendicular from the surface of thecrystal. Typical depth of penetration in ATR ranges from about 0.5microns up to about 5 microns depending upon these experimentalconditions. Shown in the graphical representation of the ATR phenomenon, the strength of the evanescent wave decays rapidlyas we progress from the surface of the ATR crystal. If we wish tocompare the sample absorbance of the ATR measurement withthat of a transmission measurement, we need to calculate thevolume of the evanescent wave, known as the effective penetrationof the IR beam. The effective penetration (de), is unique for parallelpolarization (deII) and perpendicular polarization (d⊥) and theseare defined by:

The effective penetration for an unpolarized IR beam is the average of the parallel and perpendicular penetration.

Generally, a single reflection ATR is ideal for qualitative analysis,“What is my sample?” When we need to look at minor componentsof a sample for qualitative or quantitative analysis, then we needto increase the effective path length (EPL) by increasing the numberof reflections (N) within the ATR crystal. The effective pathlengthin ATR is derived by the following equation:

An example of the benefit of increased number of reflectionsis shown in the following spectral data for the analysis of carbo-hydrate content in a soft drink sample. The upper red spectrum isrun using a 10 reflection HATR accessory. The lower blue spectrumis run using a single reflection ATR using an identical scaling factor. Clearly the minor carbohydrate bands are more readilyapparent in the multi-reflection ATR accessory.

For your convenience we have calculated theoretical valuesof depth of penetration, effective penetration, and effective pathlength for typical combinations of crystal materials, angles of incidence, and number of reflections shown in Table 1.

With the thin penetration of the evanescent wave into thesample, it is obvious that intimate contact of the sample be madeonto the surface of the ATR crystal. For liquid or pliable samples,quality of sample contact with the ATR crystal is generally nota problem. For rigid, irregular shaped or porous samples, high pressure sufficient to deform the sample will increase the extentof sample contact and thereby increase sample absorbance. Thisis shown in the following spectral data collected for a porousfoam polymer using a MIRacle ATR with ZnSe crystal.

Soft Drink Sample using 10 Reflection and 1 Reflection ATR

ATR Sampling ZnSe, Diamond AMTIR Ge for n2 = 1.5 n1 = 2.4 n1 = 2.5 n1 = 4.0

λ = 1000 cm-1 θc = 38.7 θc = 36.9 θc = 22.0

θ N dp de EPL dp de EPL dp de EPL

45 1 2.0 4.36 4.36 1.7 3.38 3.38 0.66 0.61 0.61

45 3 2.0 4.36 13.08 1.7 3.38 10.15 0.66 0.61 1.84

45 10 2.0 4.36 43.60 1.7 3.38 33.84 0.66 0.61 6.14

30 1 N/A N/A N/A N/A N/A N/A 1.2 1.59 1.59

30 3 N/A N/A N/A N/A N/A N/A 1.2 1.59 4.76

30 10 N/A N/A N/A N/A N/A N/A 1.2 1.59 15.85

60 1 1.11 1.53 1.53 1.02 1.30 1.30 0.51 0.32 0.32

60 3 1.11 1.53 4.59 1.02 1.30 3.91 0.51 0.32 0.97

60 10 1.11 1.53 15.32 1.02 1.30 13.03 0.51 0.32 3.23

Table 1: Pathlengths (in microns) of ATR Crystals at Various Angles of Incidence and Numbers of Reflections

29

AT

TE

NU

AT

ED

TO

TA

LR

EF

LE

CT

AN

CE

– L

IQ

UI

DS

, SO

LI

DS

AN

DI

N-B

ET

WE

EN

The lower blue spectrum was collected with low pressureapplied to the foam sample, whereas the upper red spectrum isproduced with high pressure. The ATR absorbance using highpressure is about 10 times greater than with low pressure – allother sampling factors are identical. For rigid, crystalline, or hard,irregular surface samples we recommend a single reflectionDiamond MIRacle ATR because it is relatively easy to apply highpressure onto the small crystal (1.8 mm diameter) with the high-pressure clamp, producing over 10,000 PSI.

The selection of the ATR crystal characteristics should bematched to the type of samples we run. Selection can be made tocontrol depth of penetration of the IR beam, for hardness to preventcrystal damage, for desired spectral range and for acceptable pHrange for acid or caustic samples. No individual crystal type willsolve all problems, so PIKE Technologies offers a broad range ofchoices for ATR. Table 2 will give you some guidelines for selectionof your ATR crystal.

Porous Foam Sample with High Pressure (upper red) and Low Pressure(lower blue)

dp, for n2 = 1.5 Water Solubility, Hardness,n1 λ = 1000 cm-1, 45 deg, microns g/100 g pH Range Kg/mm

AMTIR 2.5 1.70 Insoluble 1-9 170

Diamond/ZnSe 2.4 2.01 Insoluble 1-14 5,700

Germanium 4.0 0.66 Insoluble 1-14 550

KRS-5 2.37 2.13 0.05 5-8 40

Silicon 3.4 0.85 Insoluble 1-12 1,150

ZnS 2.2 3.86 Insoluble 5-9 240

ZnSe 2.4 2.01 Insoluble 5-9 120

Table 2: ATR Crystal Characteristics for FTIR Sampling

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

30

N O T E S

Diffuse Reflectance Diffuse reflectance is a highly sensitive technique

for the analysis of powdered and solid samples.

Typically, a sample is ground with KBr to a fine

powder and run without making pellets. Some

samples can be run directly without dilution

especially, if one is looking for minor components.

Diffuse reflectance sampling is ideally suited

to automation and PIKE offers configurations for

high throughput diffuse reflectance sampling.

DiffusIR™ – Research DiffuseReflectance Applications – Optional Heat Chambers

Page 33

UpIR™ – Upward Looking DiffuseReflectance – ideal for large samples and easy sample access

Page 35

AutoDiff™ Automated Diffuse ReflectanceSampling – up to 60 samples

Page 36

X, Y Autosampler Automated Diffuse Reflectance –microtiter format

Page 37

Sampling Kits Easing Diffuse Reflectance Sample Preparation

EasiDiff™Workhorse Diffuse Reflectance Accessory

Page 32

Diffuse ReflectanceTheory and Applications

Page 39

EasiDiff – Workhorse Diffuse Reflectance Accessory

The PIKE Technologies EasiDiff is an economical, high quality diffusereflectance accessory designed to analyze a wide variety of solidsamples. It is most often used in the analysis of pharmaceuticals,illicit drugs, inorganic solids and minerals, and powdered chemicals.The EasiDiff reduces the time required to produce an infraredspectrum compared to KBr pellet techniques. Typically, a smallamount of sample (about 1%) is mixed and ground with KBr powderand the spectrum is collected.

The EasiDiff employs an elegant, high performance opticaldesign for maximum energy throughput and ease of operation.Optical components critical to achieving this performance arepermanently aligned. Focusing is achieved by bringing the sample(not the collection mirror) to the optimum position with amicrometer. A dual position sample holder permits backgroundand sample collection in a simple, two-step process.

A spectrum of papaverine hydrochloride (about 1% in KBrpowder) was collected using the PIKE Technologies EasiDiff diffusereflectance accessory.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

32

F E AT U R E S O F T H E E A S I D I F F

• Pre-aligned optical components for reproducible, high quality data

• Micrometer controlled sample positioning and focusing

• High energy throughput providing nanogram sensitivity

• Precision slide for repeatable sample introduction and efficientcollection of background and sample spectra

• Unique sample preparation and loading kit with two macrocups, two micro cups, spatulas and necessary tools


A special version of the EasiDiff for NIR measurements (gold coatedoptics) is also available

EasiDiff Accessory (Must Select One)P A R T N U M B E R D E S C R I P T I O N

042-10XX EasiDiff Accessory with Sample Preparation KitIncludes: Two Micro Sample Cups, Two Macro Sample Cups,EasiPrep Sample Preparation Kit, Alignment Mirror, 35 mm Mortarwith Pestle and KBr Powder (100 g)

042-50XX EasiDiff Accessory, NIR Version with Gold Coated OpticsIncludes: Two Micro Sample Cups, Two Macro Sample Cups,EasiPrep Sample Preparation Kit, Alignment Mirror, 35 mmMortar with Pestle and KBr Powder (100 g)

Notes: Replace XX with your spectrometer model from code provided on the lastpage of this catalog.

EasiDiff Options (Optional)P A R T N U M B E R D E S C R I P T I O N

042-3010 Abrasion Sampling KitIncludes: Heavy Duty Sampling Tool and Stainless Steel Sample Support, 25 Diamond Abrasive Disks and 75 Silicon Carbide Abrasive Disks

Notes: Abrasion disks are disposable with each sample analysis – order additional disks below.

Replacement Parts and SuppliesP A R T N U M B E R D E S C R I P T I O N

042-2010 Small Sample Cup (micro: 6.0 mm diameter, 1.6 mm deep),2 per package

042-2020 Large Sample Cup (macro: 10 mm diameter, 2.3 mm deep),2 per package

042-2025 EasiDiff Sample Slide

042-3020 Silicon Carbide Abrasive Disks (Pack of 100)

042-3025 Diamond Abrasive Disks (Pack of 50)

042-3030 Sample Cup Holder and Base

042-3040 Sample Preparation Kit

042-3080 Alignment Mirror

042-3082 Alignment Mirror Gold


33

DI

FF

US

ER

EF

LE

CT

AN

CE

– F

RO

MP

OW

DE

RS

TO

PL

AS

TI

CB

UM

PE

RS

DiffusIR – Research Grade Diffuse Reflectance Accessory

The PIKE Technologies DiffusIR™ is a research grade diffusereflectance accessory with a large, efficient optical design accommodating the optional PIKE Technologies environmentalchambers. These specialized chambers can be used to study thermodynamic properties of materials, determine reactionmechanisms, perform catalytic studies and much more.

The heart of the DiffusIR is a unique monolithic ellipsoidalreflector permanentlyfixed in place – eliminating the needfor repositioning thefocus optics for sampleplacement. TheDiffusIR optical designis optimized to efficiently collect diffuse radiation generated from the sample and minimize the effects ofthe specular radiation component.

With the DiffusIR, sample introduction is performed using an integral 2 position slide – enabling background and sample spectrato be collected without loss of purge. The sample height can be optimized by using the micrometer sample focusing adjustment. In this manner the sensitivity of the accessory is maximized without

sacrificing precision. The DiffusIR comesequipped with a Sample Preparation andLoading Kit and a Sample Abrasion Kit forthe analysis of intractable samples. TheDiffusIR optics are enclosed and equippedwith purge tubes for the elimination ofatmospheric interferences.

The PIKE Technologies environmental chambers can be operated at temperatures ranging from -150 to 900 ºC and atpressures up to 1500 psi. The optional chambers are easily insertedand removed from the DiffusIR using push lock pins.

Coupling the DiffusIR and environmental chambers with thePIKE PC Controlled Temperature Module and TempPRO™ softwareprovides the ability to graphically set up the experiment with up to 10 ramps and data collection initiated at specified time ortemperature values.

Advanced temperature studies of materials in controlled environments can be done using the PIKE environmental chambers.

A special version of the DiffusIR with gold-coated optics isavailable for maximum mid-IR performance and for NIR diffusereflectance sampling. The DiffusIR and its options are compatiblewith most FTIR spectrometers.

F E AT U R E S O F T H E D I F F U S I R

• Large, highly efficient collection optics for maximum sensitivityand detection limits

• Micrometer controlled sample focus to optimize results for every sample

• Optional environmental chambers for heating, cooling, high vacuum and high pressure applications

• Quick release feature of environmental chambers for easyinsertion and removal of sealed chambers

• Digital PC controller option for macro control of data collection at user specified temperatures or times

• Sealed and purgeable optical design to eliminate watervapor and carbon dioxide interference

PIKE TechnologiesTempPRO softwareprovides a graphicalinterface for temperature control and kinetic measurements

Optical geometry of the DiffusIR accessory

Spectrum of Ottawa sand measured with the DiffusIR

Thermal transformation of hydrated inorganic compound measuredwith DiffusIR with environmental chamber. Spectra automatically collected between 80 and 160 ºC at 5 degree increments using PIKETempPRO software.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

34


DiffusIR Accessory (must select one)P A R T N U M B E R D E S C R I P T I O N

041-10XX DiffusIR AccessoryIncludes Sample Preparation Kit with 2 micro and 2 macro sample cups, sample loading tools, Abrasion Sampling Kit,SiC and Diamond Sampling Disks, Alignment Mirror, 35 mmMortar with Pestle and KBr Powder (100 g)

041-60XX DiffusIR Accessory with Gold Coated OpticsIncludes Sample Preparation Kit with 2 micro and 2 macro sample cups, sample loading tools, Abrasion Sampling Kit, SiC and Diamond Sampling Disks, Alignment Mirror, 35 mmMortar with Pestle and KBr Powder (100 g)

Notes: Please see the FTIR instrument code sheet.

DiffusIR Options (optional)P A R T N U M B E R D E S C R I P T I O N

162-4150 DiffusIR Environmental Chamber (HTV), ambient to 500 °C

162-4190 DiffusIR Environmental Chamber (HTV), ambient to 900 °C

162-4180 High Pressure Adaptation for Chambers (HTV)

162-4140 DiffusIR Environmental Chamber (LTV), -150 to 500 °C

Notes: DiffusIR Heated Chambers include front plate accommodating environmentalChamber (easily changeable with standard front plate), Pin-Loc Chamber insertionfor easy sample exchange, KBr window, ceramic sampling cups compatible withvacuum and reaction formats, ports and 2 shut-off valves for vacuum operation andports for connection of water cooling. The 500 °C and 900 °C HTV chambers maybe fitted with the high pressure adaption and are easily switchable from standardvacuum to high pressure operation. The LTV chamber is not compatible with simul-taneous pressurization and low temperature operation. Operation of the LTV at subambient temperatures requires customer supplied liquid chilling equipment or PN162-4160 Liquid Nitrogen Cooled System and Temperature Control Module. The HVTand LVT chambers require the selection of a temperature control module – below.

Temperature Control ModulesP A R T N U M B E R D E S C R I P T I O N

076-2420 PC Controlled Temperature Module, HTV ChambersIncludes: Digital Temperature Selection, TempPRO Softwarewith Integrated Data Collection

076-2220 Digital Temperature Control Module, HTV Chambers

162-4160 Liquid Nitrogen Cooled System and Temperature ControlModule DiffusIR Environmental Chamber (LTV) -150 to 500 °C

Notes: PC Controlled Temperature Module with TempPRO software provides agraphical user interface for setting experiment parameters and data collection.Please contact PIKE for PC compatibility. The Temperature Control Modules for theHTV and LTV chambers are not interchangeable.

Replacement Parts and SuppliesP A R T N U M B E R D E S C R I P T I O N





042-3030 Sample Cup Holder and Base

042-3040 Sample Preparation Kit

042-3010 Abrasion Sampling Kit


160-1132 32 x 3 mm KBr Disk

160-1113 32 x 3 mm ZnSe Disk

160-5049 32 x 3 mm SiO2 Disk

Replacement Parts and Supplies (cont.)P A R T N U M B E R D E S C R I P T I O N

160-1159 32 x 3 mm Si Disk

162-4210 O-Ring, DiffusIR Chamber, (Pack of 10)

162-4215 O-Ring, DiffusIR Chamber Cooling Line, (Pack of 10)

162-4251 Ceramic Cup, DiffusIR Chamber, porous

162-4270 Alignment Mirror, DiffusIR Chamber



DIFFUSIR SPEC IF ICAT IONS

Optical Design 3X ellipsoidal


DiffusIR Dimensions 180 mm wide, 230 mm deep, 130 mm high(excluding purge tubes and base plate)

Sample Focus Micrometer

Sample Positions 2 positions, slide stops for background and sample with no purge loss

Sample Cups Macro: 10 x 2.3 mm deepMicro: 6 x 1.6 mm deep

Purge Standard purge tubes and purge connection

DIFFUSIR ENVIRONMENTAL CHAMBER SPEC IF ICAT IONS

Temperature Range HTV Ambient to 500 or 900 °C

Temperature Range LTV -150 to 500 °C

Accuracy +/- 0.5%



Temperature Control Digital or Digital PC

Heating Rate, Maximum 120 °C/minute

Kinetic Setup • Up to 10 temperature ramps(requires Digital • Individual ramp rate and hold PC Controller, time settingsincludes PIKE • Graphical display of experiment settingsTempPRO software) • Trigger data collection at specified times

or temperatures• USB interface

Sensor K Type (for HTV)RTD Type, Pt100 (for LTV)

Vacuum Achievable 1 x 10-6 Torr (13 x 10-4 Pa)

Window Size 32 x 3 mm disk (vacuum)32 mm ZnSe dome (pressure)

Leaking Volume < 6.0 x 10-11 Pa m3/sec

Pressure Maximum • 1500 psi, with HP adaption (HTV versions only)

• 14.7 psi (1 atmosphere) without High Pressure Adaptation

Sample Cup Size 6.0 mm OD, 4.0 mm height4.7 mm ID, 2.0 mm depth

Sample Cup Design Ceramic, porous compatible with powdersand gas flow

Cooling Ports Quick-Fit, 6 mm ID

Gas/Vacuum Ports 1/8" Swage Lock

UpIR – Upward Looking Diffuse Reflectance Accessory

The UpIR is an innovative FTIR accessory developed to support awide range of diffuse reflectance applications. The UpIR isdesigned as a tall structured sampling accessory and is used by simply placing large, solid samples face down onto the top plateof the accessory. In the case of powdered or small solids, they canbe placed into a suitable sampling cup at the top of the UpIR.This design is uniquely suitable for mid-IR analysis of coatings onmetallic surfaces of large or small samples. For this application,analysis is rapid and easy because no sample preparation orcleanup is required. Since the sampling area of the UpIR is abovethe plane of the FTIR instrument, even large samples that do notfit into the sample compartment can be analyzed with this accessory.

In the NIR spectral region the UpIR is ideal for the QC analysis of powdered and tablet samples when the gold coated optics version is selected.

The accessory is equipped with an upward-looking, high-per-formance ellipsoidal mirror which minimizes the effect of specularradiation. The sampling stage provides a sampling port with insertsfor diffuse reflectance or specular reflectance measurements.

All mirrors, including the ellipsoidal collection mirror, are per-manently mounted. The position of the sampling stage is controlledwith the adjustable micrometer to achieve the best possible through-put. Spectral analysis involves collecting a background spectrum withthe reference mirror in the sampling position. After this step, thesample is simply placed face down onto the sampling port and datacollection is initiated.

The gold coated optics version of the UpIR provides highestthroughput in the mid-IR spectral region and is recommended forNIR sampling. The UpIR accessory includes a solids sampling plate forflat samples, and a ZnSe windowed sampling cup for powdered orsmall solids analysis. The accessory is equipped with purge tubes forelimination of CO2 and water interferences from infrared spectra.

For NIR sampling of solids, powders or tablet samples, thesapphire windowed sampling cup is recommended. In the NIRspectral region samples can be analyzed while contained in a glassvial. For this measurement, the optional 21 mm glass vial holder isrecommended.

35

DI

FF

US

ER

EF

LE

CT

AN

CE

– F

RO

MP

OW

DE

RS

TO

PL

AS

TI

CB

UM

PE

RS

F E AT U R E S O F T H E U P I R

• Upward looking optics providing fast and easy analysis ofsamples placed face down on the UpIR sample port

• Out-of-compartment design for analysis of large samples

• High optical throughput and exceptional signal-to-noise ratio

• Analysis of powders, ground solid samples and coatings on metallic surfaces

• Pre-aligned, fixed-position optical components for reproducible,high quality data

• Micrometer controlled sample stage positioning and focusing

• Optional gold-coated optics version for highest performance mid-IR and NIR applications

Analysis of a large painted metal panel using the UpIR accessory

Optical geometry for the UpIR



044-10XX UpIR – Out-of-compartment Diffuse Reflectance AccessoryIncludes solids sampling insert, powders sampling insertwith ZnSe window, gold mirror, purge tubes, purge kit and spectrometer base mount.

044-60XX UpIR – Out-of-compartment Diffuse Reflectance Accessorywith Gold-Coated Optics Includes solids sampling insert, powders sampling insert with ZnSe window, gold mirror,purge tubes, purge kit and spectrometer base mount.

Notes: Replace XX in part number with code for your spectrometer model found onthe last page of this catalog.

UpIR OptionsP A R T N U M B E R D E S C R I P T I O N

044-3030 Solids Sampling Insert

044-3040 Powders Sampling Insert

044-3010 21 mm Glass Vial Holder

044-3020 Sample Vials with Threaded Caps, 21 mm x 70 mm, (200 per package)

160-1155 25 x 2 mm ZnSe Window

160-1307 25 x 2 mm Ge Window

160-1201 25 x 2 mm AMTIR Window

160-5000 25 x 2 mm Sapphire Window

Notes: Solids and Powders Sampling Inserts do not include a window – please makea selection from the list above.

The AutoDiff is a high performance, automated diffuse reflectanceaccessory developed to analyze multiple samples with minimaluser intervention. Typical applications include powdered pharma-ceutical samples, high throughput forensic sampling, kidney stoneanalysis, soils analysis and analysis of many other powderedsamples where speed and efficiency are important. The designemploys an automated R-theta sampling stage with positions forup to 60 samples, providing diffuse reflectance analysis withgreatly reduced operator intervention and increased samplethroughput.

The optical design of the AutoDiff utilizes a high efficiencyfixed ellipsoidal reflector to collect the maximum amount of diffusely reflected energy from the sample. Other optical compo-nents important to achieving this high performance are alignedand permanently located. The accessory is baseplate mounted inthe FTIR spectrometer sample compartment and can be purgedindependently or it can use the spectrometer’s purge.

Spectral quality and reproducibility are excellent with theAutoDiff. By programming the collection of spectra at precisetime periods and alternating sample and background collection,any effects of atmosphere are greatly reduced.

The PIKE AutoDiff fully automates diffuse reflectance FTIRspectroscopy. The sample holder contains positions for sixty samples,plus a center position for a background sample, which usuallyconsists of pure KBr powder.

The sample plate is marked intosix areas, labeled from A to F. Eacharea has ten sample positions markedfrom 1 through 10. This sample position numbering scheme is alsoused within the software for describingand positioning the samples.

The AutoDiff is controlled by PIKEAutoPRO software which incorporatesmulti-operator sample submission. Thesystem is extremely flexible and thegraphical user interface is intuitiveand simple. Multiple operators may independently log samplesonto the system. The AutoPRO software integrates easily withmost commercially available FTIR software packages.

The AutoDiff is also available with gold-coated optics forhighest performance mid-IR analysis and for automated NIR diffuse reflectance sampling.

AutoDiff – Automated Diffuse Reflectance Sampling

Spectra of pharmaceuticals using the AutoDiff accessory

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

36

F E AT U R E S O F T H E A U T O D I F F

• Complete automated diffuse reflectance accessory and softwarepackage for unattended analysis of up to 60 samples

• High-performance optical design-collecting maximumamount of diffusely reflected energy and providing highquality spectra in a short time period

• Flexible sample sequencing and background collection toprovide maximum sampling efficiency and greatly minimizeatmospheric contributions to sample spectra

• Easily programmable AutoPRO software providing automatedsample collection and storage

• Easily removable sample tray to speed sample loading and unloading



043-28XX AutoDiff – Automated Diffuse Reflectance SystemIncludes: Motion Control Unit (85/265 VAC), AutoPROSoftware, 60 Position Sample Mounting Tray, 60 Macro Sample Cups and Sample Preparation Kit

043-78XX AutoDiff – Automated Diffuse Reflectance System, Gold-Coated Optics System Includes: Motion Control Unit (85/265 VAC), AutoPROSoftware, 60 Position Sample Mounting Tray, 60 MacroSample Cups and Sample Preparation Kit

Notes: Replace XX code in part number with your spectrometer model – see lastpage of this catalog.

Replacement Parts and OptionsP A R T N U M B E R D E S C R I P T I O N

043-3090 AutoDiff Set of 60 Sampling Cups (macro)

043-0900 AutoDiff, 60 Position Sampling Tray



042-3010 Abrasion Sampling Kit





X, Y Autosampler – Transmission and Reflectance AutomatedSampling in Microplate Format

The PIKE Technologies X, Y Autosampler is designed around standard24, 48 or 96 well microplate architectures – ideal for high efficiencysample loading and FTIR analysis. Applications include highthroughput analysis of liquid residues and chemical reactions,powdered samples, and automated diffuse reflectance analysis.The X, Y Autosampler is available in standard all reflecting opticsand with gold-coated optics for highest performance mid-IR andoptimized NIR sampling.

The autosampler features an X, Y stage with both axes drivenby high precision stepper motors for speed and reproducibility.Programming and control of the X, Y Autosampler is donethrough PIKE Technologies AutoPRO software, and is compatiblewith current FTIR systems.

The optical designis based upon a precisionellipsoidal reflector andthe size of the spot illuminated at the sample is approximately2 mm – ideal for up to96 well configurations.

PIKE Technologies have developed a special silicon well plateexcellent for transmission analysis. This unique 96 well plate provides full mid-IR transmission spectra and is sufficientlydurable for extended usage. For diffuse reflection measurementsa cavity style plate with standard format placement of samples isavailable. Please contact us for other configurations.

37

DI

FF

US

ER

EF

LE

CT

AN

CE

– F

RO

MP

OW

DE

RS

TO

PL

AS

TI

CB

UM

PE

RS

F E AT U R E S O F T H E X , Y A U T O S A M P L E R

• Complete hardware and software package for automatedanalysis of industry standard 24, 48, or 96 well plates.Special plate configurations are available.

• Diffuse reflectance of powdered samples or specularreflectance sampling for reaction residues

• Gold coated optics version for highest performance mid-IRand NIR sampling

• Optional transmission sampling with integrated InGaAs orDLaTGS detector and transmission sampling plates

• In-compartment location, purgeable optical path

The quality of FTIR spectra collected on the X, Y Autosampler is excellent – shown in the spectra above for solvent residue samples



047-20XX X, Y Autosampler – Diffuse Reflectance ConfigurationIncludes: Motion Control Unit (85-265 VAC), AutoPRO Software and 96 Well Diffuse Reflectance Sampling Plate

047-60XX X, Y Autosampler – Diffuse Reflectance Configuration withGold-Coated Optics Includes: Motion Control Unit (85-265 VAC), AutoPRO Softwareand 96 Well Diffuse Reflectance Sampling Plate

073-90XX X, Y Autosampler – Diffuse Reflectance/Transmission ConfigurationIncludes: Motion Control Unit (85-265 VAC), AutoPRO Software, integrated DLaTGS detector for transmission analysis, 96 Well Diffuse Reflectance Sampling Plate and 96 Well Transmission Sampling Plate

073-60XX X, Y Autosampler – Diffuse Reflectance/Transmission Configuration with Gold-Coated OpticsIncludes: Motion Control Unit (85-265 VAC), AutoPRO Software, integrated InGaAs detector for transmission analysis, 96 Well Diffuse Reflectance Sampling Plate and 96 Well Transmission Sampling Plate

Notes: Replace XX in part number with code for your spectrometer model found onthe last page of this catalog. For other options please contact us. Your spectrometermust be capable of interfacing with an external detector.

OptionsP A R T N U M B E R D E S C R I P T I O N

073-9110 96 Well Diffuse Reflectance Sampling Plate

073-9130 96 Well Transmission Sampling Plate

X, Y AUTOSAMPLER SPEC IF ICAT IONS

Optics Elliptical – 3X Beam Demagnification

Resolution 13 microns per step

Accuracy 25 micrometers per cm

Backlash < 75 micrometers

Sample Preparation and Loading Kit – The Easiest Way to Work With Powder Samples

Abrasion Sampling Kit – The Plastic Bumper Sampler

The Sample Preparation Kit makes the handling of powder samples for diffuse reflectance sampling easy. It includes a roundmounting base and a matching tray with an opening whichaccommodates sampling cups. The cup is placed in the assemblyand overfilled with sample, and then excess powder is leveled-offwith a spatula. The overflow is retained on the tray and can beeasily returned to the sample container or disposed.

Two standard sampling cups offer 0.18 and 0.03 cubic centimeter capacities (10 mm diameter/2.3 mm depth and 6.0 mmdiameter/1.6 mm depth). The required approximate weight of thesample/KBr mixture is 450 mg for the large cup and 80 mg forthe small one.

Please note, the Sample Preparation and Loading Kit isincluded with PIKE Technologies EasiDiff and DiffusIR diffusereflectance accessories.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

38

The Abrasion Sampling Kit consists of an abrasion disk holder and a set of silicone carbide (SiC) and diamond disks. Sampling isperformed by abrading the surface of the investigated substancewith a selected disk. The disk is placed in the accessory and a diffuse reflectance spectrum of the material is collected. Thismethod is particularly useful for the analysis of large painted surfaces (e.g. car panels) and other awkward objects.

• Convenient set of tools for collection of difficult solid samples

• Rigid construction, diamond and silicon carbide disks



042-3040 Sample Preparation KitIncludes: two Micro and Macro cups, Alignment Mirror,Sampling Cup Holder and Base, Two Spatulas, Brush


042-2020 Large Sample Cup (macro: 10 mm diameter, 2.3 mm deep), 2 per package

042-3030 Delrin® Sampling Cup Holder and Base

042-3080 Alignment Mirror (Aluminum)


042-3070 Camel Hair Brush

042-3035 Spatula (Spoon)

160-8010 KBr Powder (100 g)

042-3050 Spatula (Flat)



042-3010 Abrasion Sampling KitIncludes: Heavy Duty Sampling Tool and Stainless Steel Disk Support, 75 SiC Disks and 25 Diamond Abrasive Disks



042-3060 Abrasion Kit Disk Support Post

39

DI

FF

US

ER

EF

LE

CT

AN

CE

– F

RO

MP

OW

DE

RS

TO

PL

AS

TI

CB

UM

PE

RS

Diffuse Reflectance – Theory and ApplicationsDiffuse Reflectance – Ideal for Powdered Samples and Intractable SolidsDiffuse reflectance is an excellent sampling tool for powdered orcrystalline materials in the mid-IR and NIR spectral ranges. It canalso be used for analysis of intractable solid samples. As withtransmission analysis, samples to be run by diffuse reflectance aregenerally ground and mixed with an IR transparent salt such aspotassium bromide (KBr) prior to sampling. Diffuse reflectance isan excellent sampling technique as it eliminates the time-consumingprocess of pressing pellets for transmission measurements. Diffusereflectance can also be used to study the effects of temperatureand catalysis by configuring the accessory with a heating chamber.

Perhaps one of the greatest additional benefits of diffusereflectance sampling is that it is ideally amenable to automation.Methods can be developed with a manual version diffuse reflectionaccessory and then moved to automation to increase samplethroughput. PIKE Technologies offers several diffuse reflectanceaccessory configurations – basic, advanced with heat chambercapabilities, upward directed IR beam for easy sampling access,and fully automated for maximum sampling efficiency.

How Diffuse Reflectance WorksDiffuse reflectance relies upon the focused projection of the spectrometer beam into the sample where it is reflected, scat-tered and transmitted through the sample material (shown onthe right). The back reflected, diffusely scattered light (some of which is absorbed by thesample) is then collected by theaccessory and directed to thedetector optics.

Only the part of the beamthat is scattered within a sampleand returned to the surface is considered to be diffuse reflection.

Some powders may be analyzed by diffuse reflectance asneat samples (coal samples, soil samples, diffuse coatings on areflective base). Usually, the sample must be ground and mixedwith a non-absorbing matrix such as KBr. The sample to matrixratio should be between 1 to 5% (by weight). Diluting ensures adeeper penetration of the incident beam into the sample whichincreases the contribution of the scattered component in thespectrum and minimizes the specular reflection component.

The specular reflectance component in diffuse reflectancespectra causes changes in band shapes, their relative intensity,and, in some cases, it is responsible for complete band inversions(Restrahlen bands). Dilution of the sample with a non-absorbingmatrix minimizes these effects (particle size and sample loadingmechanics also play an important role).

This is shown below in the spectral data for caffeine, wherethe upper spectrum is diluted to about 2% by weight in KBr anddemonstrates very high quality with sharp, well-definedabsorbance bands. The lower spectrum is of undiluted caffeinemeasured by diffuse reflectance and shows derivative shapedbands in the 1700 cm-1 and 1500 cm-1 region of the data. Theupper spectrum of diluted caffeine is clearly of higher spectralquality than that of the undiluted caffeine.

Other factors related to high spectral quality for diffusereflectance sampling are listed below;

• Particle Size – reducing the size of the sample particles reducesthe contribution of reflection from the surface. Smaller particlesimprove the quality of spectra (narrow bandwidths and betterrelative intensity). The recommended size of the sample/matrixparticles is 50 micrometers or less (comparable to the consistencyof the finely ground flour). This fine powder is easily achievedby using a ShakIR mixer.

• Refractive Index – effects result in specular reflectance contri-butions (spectra of highly reflecting samples will be more distorted by the specular reflectance component). This effectcan be significantly reduced by sample dilution.

• Homogeneity – samples prepared for diffuse reflectance measurements should be uniformly and well mixed. Non-homogenous samples will lack reproducibility and will be difficult to quantify. An ideal way to mix samples for diffusereflectance is by using a ShakIR.

• Packing – the required sample depth is governed by the amountof sample scattering. The minimum necessary depth is about1.5 mm. The sample should be loosely but evenly packed in the cup to maximize IR beam penetration and minimize spectral distortions.

Diffuse reflective spectra showing greatly improved results from sample dilution

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

40

Even with all these sample preparation practices, the raw diffuse reflectance spectra will appear different from its transmissionequivalent (stronger than expected absorption from weak IR bands).A Kubelka-Munk conversion can be applied to a diffuse reflectancespectrum to compensate for these differences. This conversion isavailable in most FTIR software packages.

The Kubelka-Munk equation is expressed as follows:

Where:R is the absolute reflectance of the sampled layer, k is the

molar absorption coefficient and s is the scattering coefficient.The spectra shown above demonstrate this spectral conversion

for ibuprofen collected by diffuse reflectance. The sample wasdiluted to about 1% by weight in KBr and mixed using the ShakIR.The Kubelka-Munk converted spectrum for ibuprofen showsexcellent comparison with the transmission spectrum and is easilyidentified using library search of a transmission spectral data base.

The Kubelka-Munk equation creates a linear relationship forspectral intensity relative to sample concentration (it assumesinfinite sample dilution in a non-absorbing matrix, a constantscattering coefficient and an “infinitely thick” sample layer). These conditions can be achieved for highly diluted, small particle samples (the scattering coefficient is a function of sample sizeand packing) and a sample layer of at least 1.5 mm. With propersample preparation diffuse, reflectance spectroscopy can provideppm sensitivity and high quality results.

Plastic Bumpers and Tough SamplesSometimes it is necessary to analyze a sample which simply doesnot fit in a spectrometer’s sample compartment – the analysis ofpolymer-based automotive components or painted panels aretypical examples.

A special diffuse reflectance technique allows quick and simpleanalysis of such samples in a relatively non-destructive manner. A small amount of the sample can be collected by abrasion on a diamond or silicon carbide (SiC) abrasion disk and analyzedimmediately with the help of a diffuse reflectance accessory.

The figure above shows the diffuse reflectance spectrum of aautomotive body component. The PIKE Abrasion Kit with diamondsampling disk was rubbed across the large automotive componentwhich collects some of the polymer material into the web of thesampling disk. Spectra were co-added for a 1 minute time periodand ratioed to the diamond disk background spectrum. Theresulting spectrum is of excellent quality and is identified as apolypropylene copolymer.

Diffuse reflectance can also be used for the analysis of liquidsamples. In this application a small amount of the sample is dispensed directly onto the KBr powder and analyzed.

For the analysis of powders the following procedure is recommended;

• Place about 200-400 mg of KBr into the ShakIR vial and shakefor 30 seconds

• Fill the background diffuse cup with this KBr

• Remove excess KBr with a flat edge – the KBr should be loosely packed

• Add 1 to 5 mg of the sample to the remaining KBr in theShakIR vial and shake for 30 seconds

• Fill the sample diffuse cup with this mixed sample/KBr

• Remove excess sample with a flat edge – the sample should be loosely packed

• Place the background and sample diffuse cups into the sample holder

• Slide the sample holder into the accessory

• Position the KBr cup in the beam and collect a background

• Move the holder to the sample position and collect a samplespectrum (the ratio of these two spectra will produce a spectrum of the sample)

• Convert the raw diffuse reflectance spectrum to Kubelka-Munk

Under ideal conditions the transmission of the strongestband in the spectrum should be in the 50% range. If the resultingbands are too intense or distorted, further dilute the sample andmake sure that all other measurement affecting factors (particlesize, homogeneity and packing) are within required limits.

SummaryDiffuse reflectance accessories make the analysis of a wide rangeof solid samples easier, faster and more efficient. Advanced optionsfor diffuse reflectance provide the ability to heat the sample and monitor a reaction process. Automation versions of diffusereflectance accessories provide the ability to greatly increase sample throughput.

Diffuse reflectance spectra of ibuprofen with and without Kubelka-Monk conversion

Diffuse reflectance spectrum using SiC abrasion disk

Specular Reflectance Specular reflectance is an excellent sampling

technique for measurement of thin films on

reflective substrates and for non-invasive analysis

of samples. The specular reflectance spectrum may

be used for sample identification, for quality control

of coated materials, for analysis of monolayers and

for film thickness measurement.

PIKE Technologies offers several versions of

specular reflectance accessories to address

applications from research to quality control.

VeeMAX™Research Grade SpecularReflectance Accessory – with variable angle of incidence

Page 42

30Spec™Fixed angle Specular Reflectance –for relatively thick films

Page 44

80Spec™Analysis of monolayers and other relatively thin films

Page 45

AGA™80 degree Specular Reflectancewith precise control of sampling size

Page 46

10Spec™Fixed 10 degree specular forE1585-93 reflectance method

Page 47

Specular ReflectanceTheory and Applications

Page 49

Absolute Reflectance AccessorySpecular Reflection Accessory – to measure sample reflectivity

VeeMAX II – The Ultimate Specular Reflectance Accessory!

The PIKE Technologies VeeMAX II is a high performance and highlyversatile specular reflectance accessory designed to analyze awide range of samples. From monolayers to relatively thick films,the VeeMAX II with variable angle of incidence can be optimizedfor all specular applications. The unique optical design of thisproduct (U.S. Patent No. 5,106,196) enables the accessory to be inalignment for all angles of incidence. The angle may be variedcontinuously from thirty to eighty degrees by the rotation of asingle control. The sample is placed face down on the samplingsurface. Because of the unrestricted access to the sampling area,large samples may be readily analyzed. To suit different samplinggeometries, masks with 2", 5/8" and 3/8" apertures are provided.Thanks to the optical design of this accessory, excellent throughputis available even at high angles of incidence. The VeeMAX II has abuilt-in polarizer mount to permit selection of polarization anglewithout disturbing purge.

An optional motorized version of the accessory is available. Itfeatures a stepper motor with complementary electronics, MotionControl Unit, and PIKE Technologies AutoPRO software. In thiscombination, operation of the VeeMAX II can be integrated withthe spectrometer software, which allows the operator to preciselyand reliably control a wide range of angles of incidence and datacollection simultaneously from the computer keyboard.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

42

F E AT U R E S O F T H E V E E M A X I I

• Selectable angle of incidence – from 30 to 80 degrees in onedegree increments

• Measurement of thin films and monolayers to relativelythick films

• Optimize specular reflectance results with selectable angle of incidence

• Integrated position for IR polarization – essential for monolayer analysis and study of sample orientation

• Optional single reflection ATR crystals – see ATR section

• Motorized version option with electronic control module andAutoPRO software for automated, high-precision experiments


Proprietary beam path within the VeeMax II Specular Reflectance accessory

Optimization of the analysis of a multi-layered coating on metal substrate using the VeeMAX II

Changing the angle of incidence with the VeeMAX II is veryeasy. With this research grade specular reflectance accessory, onecan measure film thickness ranging from relatively thick to relativelythin, including monolayers, by selecting the optimal angle of incidence for the measurement.

The variable angle of incidence can be controlled manuallyor with an optional motorized attachment for the VeeMax II.Multiple specular measurements at different angles of incidencecan be fully automated with the motorized version and PIKETechnologies AutoPRO software. Automation streamlines the collection of spectra from multiple angles of incidence. With theautomated VeeMax II accessory, the entire experiment can be pre-programmed and executed by the computer.

Advantages of the automated VeeMax II system include:

• Computer controlled precision, accuracy and repeatability

• Synchronization of mirror position changes with collection ofsample spectra

• Full integration of the PIKE Technologies AutoPRO software withFTIR spectrometer programs

• Tailor made, predefined experiments

• “Hands-free” operation

43

SP

EC

UL

AR

RE

FL

EC

TA

NC

E–

TH

IN

FI

LM

SA

ND

MO

RE

AutoPRO Software control of VeeMax IIangle of incidence for automatedspecular reflectance studies – automated polarizer available


VeeMAX II AccessoryP A R T N U M B E R D E S C R I P T I O N

013-10XX VeeMAX II – Variable Angle Specular Reflectance AccessoryIncludes sample masks (2", 5/8" & 3/8"), gold substratealignment mirror, FTIR base mount, and purge tubes.

Notes: Select FTIR XX code from the last page of this catalog.

VeeMax II Sampling OptionsP A R T N U M B E R D E S C R I P T I O N

013-2850 Motorized Option for VeeMAX II

013-2800 Motorized Upgrade for VeeMax II



Notes: Motorized Option includes PIKE Technologies AutoPRO software and controller.Other polarizer options are found in the polarizer section of this catalog.Modification of the VeeMAX is required for fit of the automated polarizer.

VeeMax II Replacement PartsP A R T N U M B E R D E S C R I P T I O N

013-4010 VeeMax II Sample Masks (2", 5/8" & 3/8")

300-0002 Gold Substrate Alignment Mirror (1.25" x 3.0")


FTIR spectrum of thiol monolayer measured using the VeeMAX II specularreflectance accessory set at 80 degrees angle of incidence, ZnSe polarizerand MCT detector.

VEEMAX I I S P E C I F I C AT I O N S


Angle of Incidence Range 30° to 80°

Sample Masks 2", 5/8" and 3/8"

Purge Sealing Purge tubes and purge barb included

Accessory Dimensions 74 mm wide, 69 mm tall, 40 mm deep(excludes baseplate)


30Spec and 45Spec – Specular Reflectance for Thick Films

The PIKE Technologies 30Spec is ideal for the measurement of relatively thick films by specular reflectance. Samples are simplylaid across the top of the accessory and the spectrum of the filmis measured within a short time period. The 30Spec includes samplemasks of 3/8", 1/4" and 3/16" to define specific sampling areas.The 30Spec provides high quality FTIR spectra for identification ofcoatings and can also be used to measure coating thickness.

IR throughput is high using the 30Spec due to the relativelysimple optical design of the product.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

44

F E AT U R E S O F T H E 3 0 S P E C

• Measurement of thick films

• Measurement of film thickness by specular reflectance

• Fixed 30 degree angle of incidence

• Special version – 45Spec for fixed 45 degree angle of incidence

• Sample masks to define sampling area

• Slide mount design for easy installation of accessory – fits all FTIR spectrometers

Optical geometry for the 30Spec


30Spec and 45Spec AccessoryP A R T N U M B E R D E S C R I P T I O N

011-1000 30Spec – Specular Reflectance Accessory (30 degree)Includes sample masks (3/8", 1/4", and 3/16"), alignmentmirror and slide mount.

011-4500 45Spec – Specular Reflectance Accessory (45 degree)Includes sample masks (3/8", 1/4", and 3/16"), alignmentmirror and slide mount.

Notes: The 30Spec and 45Spec are slide mount accessories.

30Spec and 45Spec Sampling OptionsP A R T N U M B E R D E S C R I P T I O N

011-2010 Sample Masks (3/8", 1/4", and 3/16")


Notes: Sample masks and alignment mirror fit 30Spec and 45Spec.

FTIR spectrum of polymer coating on a food container run with thePIKE 30Spec

80Spec – Grazing Angle Specular Reflectance for Thin Films

The PIKE Technologies 80Spec is ideal for the measurement of relatively thin films and mono-molecular layers by specularreflectance. Samples are simply laid face down across the top ofthe accessory and the spectrum of the film is measured. Generallythe measurement of ultra-thin film samples, especially monolay-ers, is significantly enhanced by using P-polarized light, with theelectric field vector perpendicular to the sample surface. The80Spec includes polarizer mounts on both incoming and outgoingbeams for positioning optional manual or automated IR polarizersfrom PIKE Technologies.

The 80Spec is available in two versions. The basic configurationfeatures a flat sampling surface with fixed sampling port. This version is ideal for analysis of larger, uniform samples. The secondversion includes 3 sample masks to define smaller areas on asample. This version is recommended for smaller samples or formeasurement of variations in thin film coatings.

45

SP

EC

UL

AR

RE

FL

EC

TA

NC

E–

TH

IN

FI

LM

SA

ND

MO

RE

F E AT U R E S O F T H E 8 0 S P E C

• Measurement of thin films and mono-molecular layers


• Gold-coated reflective optics for highest throughput grazing angle analysis

• Dual polarizer mounts for incoming and outgoing IR beam

• Optional sample masks version to define unique sampling areas

• Baseplate mount design for stable operation and collectionof high quality spectra – fits all FTIR spectrometers

Beam path within the 80Spec – Specular Reflectance accessory


80Spec AccessoryP A R T N U M B E R D E S C R I P T I O N

012-10XX 80Spec – Specular Reflectance AccessoryIncludes a gold substrate alignment mirror, dual polarizer mount and FTIR base mount

012-11XX 80Spec – Specular Reflectance Accessory with Sample Masks (3/8", 5/8" and 2")Includes a gold substrate alignment mirror, dual polarizer mount and FTIR base mount


80Spec Replacement Parts and OptionsP A R T N U M B E R D E S C R I P T I O N

010-3010 80Spec Sample Masks (3/8", 5/8" and 2")



090-1200 Manual Polarizer, KRS-5

Notes: For other polarizer options see PIKE Technologies polarizer section of this catalog.

FTIR spectrum of an ultra-thin film on a reflective substrate using P-polarized IR beam

AGA – Advanced Grazing Angle Specular Reflectance for Thin Films with Precise Spot Control

The PIKE Technologies AGA – Advanced Grazing Angle specularreflectance accessory is a novel instrument designed for quantitativemeasurement of spatially defined areas of thin films on reflectivesubstrates. Traditional grazing angle accessories produce a sampling area which is elliptical in shape and non-uniformly illuminates the sample area. This large asymmetrical samplingarea causes problems when quantitative analysis are to be performed on small sample areas.

The Advanced Grazing Angle (AGA) accessory has beendesigned to overcome this deficiency. The size and shape of theilluminated spot on the sample is defined by the optics containedin the accessory. The AGA optical design uses primary imagingfrom one of 5 user defined, slide-mounted pin mirrors selectablefrom 1/8" to 1/2".

The beam from the spectrometer is focused onto the pin mirror. The angle of incidence is equal to 80 degrees. The portionof the beam that is reflected from this mirror is imaged at unitmagnification onto the sample, striking it at the same 80 degrees.Thus, the beam at the sample position is uniform and circular indimension – providing excellent quantitative results for thedefined sample area.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

46

F E AT U R E S O F T H E A G A

• Quantitative measurement of small areas of thin films andmono-molecular layers


• Measurement of lubricants on hard disks

• Sampling dimensions selectable from 1/8", 3/16", 1/4", 3/8" and 1/2" sizes

• Polarizer mount for optional polarizer


Beam path within the AGA – Grazing Angle Specular Reflectance accessory


AGA AccessoryP A R T N U M B E R D E S C R I P T I O N

015-10XX AGA – Grazing Angle Specular Reflectance AccessoryIncludes: 5 selectable spot sizes of (1/8", 3/16" 1/4", 3/8" and 1/2"), gold substrate alignment mirror, polarizer mount and FTIR base mount.


AGA Replacement Parts and Sampling OptionsP A R T N U M B E R D E S C R I P T I O N




Notes: For other polarizer options see PIKE Technologies polarizer section of this catalog.

Sampling image on a hard disk surface produced by (A) the spatiallyresolved AGA and (B) a traditional grazing angle accessory

FTIR spectrum of an 18 angstrom thick lubricant on hard disk measuredin 15 seconds using a MCT detector

10Spec – Near-normal Sample Reflectivity Measurements

The PIKE Technologies 10Spec is an optimized specular reflectanceaccessory designed to make high performance measurements ofsample reflectivity. The 10Spec produces a collimated beam toilluminate the sample area such that the reflectivity measurementis uniformly 10 degrees and not an average of angles producedby a focused beam accessory design.

The 10Spec specular reflectance accessory is recommendedto measure the reflectivity of glass per ASTM Standard E1585-93.The 10Spec may also be used to measure near-normal reflectivityof a wide variety of surfaces including military devices, reflectingoptics, anti-reflective (AR) coated surfaces, and other reflectingand non-reflecting materials.

47

SP

EC

UL

AR

RE

FL

EC

TA

NC

E–

THIN

FILMS

ANDMORE

F E AT U R E S O F TH E 10SP E C

• Measure sample reflectance• Fixed 10 degree angle of incidence• Measure glass reflectivity per ASTM Standard E1585-93• Sample illumination using collimated beam precisely fixed at 10 degrees

• Sampling mask sizes of 3/8", 5/8" and 2"• Purge covers and purge tubes for removal of atmosphericinterferences


Beam path within the 10Spec – Specular Reflectance accessory

OR D E R I N G IN F O R M AT I O N

10Spec AccessoryPA R T N U M B E R D E S C R I P T I O N

010-10XX 10Spec – 10 Degree Specular Reflectance AccessoryIncludes: 3 sample masks (3/8", 5/8" and 2"), gold substrate alignment mirror and FTIR base mount.


10Spec Replacement Parts and Sampling OptionsPA R T N U M B E R D E S C R I P T I O N

010-3010 10Spec Sample Masks (3/8", 5/8" and 2")


FTIR spectrum measuring the reflectively of glass with the 10Spec

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

48

Absolute Reflectance Accessory – Measure Absolute Sample Reflectance

Sample reflectance is usually measured in comparison to a highreflectance diffuse gold or a high reflectance gold mirror. Thesample reflectance is measured and calculated against these standards that have 94-99% reflectance in the infrared region.

Absolute reflectance measurement has to be even more accurate than measured by other accessories. Unfortunately, nostandards exist today that have guaranteed 100% reflectance,against which unknown samples could be compared. PIKETechnologies have developed a Absolute Reflectance accessorywhich does not require reflectance standards due to its unique V / W optical arrangement. The beam in the V position reflectsfrom the reference mirror. In the W position it is reflecting fromthe sample twice and the same reference mirror at 12°. Theabsolute reflectance of a sample is then the square root of themeasured value at a given wavenumber or wavelength. The twoconfigurations are easily selected by rotating the sample holder180 degrees with its pinned-in-place mount and the sample isheld by a quick-release mount.

F E AT U R E S O F T H E A B S O L U T E

R E F L E C TA N C E A C C E S S O R Y

• For the measurement of absolute reflectance of optical surfaces,windows and metallic surfaces

• Performance evaluation of optical elements

• Evaluation of test plates in medical, industrial and military applications


Spectrum of a Silicon Plate Measured in the PIKE Absolute ReflectanceAccessory

Beam Path for V and W Positions for PIKE Absolute ReflectanceAccessory 12° Angle of Incidence


Absolute Reflectance AccessoryP A R T N U M B E R D E S C R I P T I O N

014-10XX Absolute Reflectance AccessoryIncludes: V / W sample holder, gold substrate alignmentmirror and FTIR base mount


Absolute Reflectance Parts and Sampling OptionsP A R T N U M B E R D E S C R I P T I O N


162-5460 Specular Reflectance Standard

Specular Reflectance – Theory and ApplicationsSpecular reflectance sampling in FTIR represents a very importanttechnique useful for measurement of thin films on reflective substrates, analysis of bulk materials and measurement of mono-molecular layers on a substrate material. Often the specularreflectance technique provides a means of sample analysis withno sample preparation – keeping the sample intact for othermeasurements.

The basics of the sampling technique involve measurementof the reflected energy from a sample surface at a given angle ofincidence. The electromagnetic and physical phenomena whichoccur at and near the surface are dependent upon the angle ofincidence of the illuminating beam, refractive index and thicknessof the sample and other sample and experimental conditions. Adiscussion of all of the physical parameters and considerationssurrounding the specular reflectance sampling technique isbeyond the scope of this overview. We will present the specularreflectance sampling technique from an applications orientedperspective.

Types of specular reflectance experiments

• Reflection-Absorption of relatively thin films on reflective substrates measured at near normal angle of incidence

• Specular Reflectance measurements of relatively thick samplesmeasured at near normal angle of incidence

• Grazing Angle Reflection-Absorption of ultra-thin films or mono-layers deposited on surfaces measured at high angle of incidence

In the case of a relatively thin film on a reflective substrate,the specular reflectance experiment may be thought of as similarto a “double-pass transmission” measurement and can be represented as shown in the following illustration;

The incident FTIR beam represented by I0 illuminates the thinfilm of a given refractive index, n2 and at an angle of incidence, θ1.Some of the incident beam is reflected from the sample surface,represented by IR at the incident angle, θ1 and is also known asthe specular component. Some of the incident beam is transmittedinto the sample represented by IT at an angle of θ2 – calculatedfrom Snell’s Law.

n1sinθ1 = n2sinθ2

At the reflective substrate, the beam reflects back to the surface of the thin film. When the beam exits the thin film it hasgeometrically passed through the film twice and is now representedas IA. Infrared energy is absorbed at characteristic wavelengths asthis beam passes through the thin film and its spectrum is recorded.The specular reflectance spectra produced from relatively thinfilms on reflective substrates measured at near-normal angle ofincidence are typically of high quality and very similar to spectraobtained from a transmission measurement. This result is expectedas the intensity of IA is high relative to the specular component, IR.

For relatively thick samples, the specular reflectance experimentproduces results which require additional considerations as thespecular component of the total reflected radiation is relatively high.

Again, the incident FTIR beam represented by I0 illuminatesthe sample of a given refractive index, n2 and at an angle of incidence, θ1. Some of the incident beam is reflected from thesample surface, represented by IR at the incident angle, θ1. Someof the incident beam is transmitted into the sample representedby IT at an angle of θ2. As predicted by Fresnel equations, the percent of reflected vs. transmitted light increases with higherangles of incidence of the illuminating beam. Furthermore, therefractive index of the sample, surface roughness and sampleabsorption coefficient at a given wavelength all contribute to theintensity of the reflected beam.

49

SP

EC

UL

AR

RE

FL

EC

TA

NC

E–

TH

IN

FI

LM

SA

ND

MO

RE

Spectrum of thin film coating on a metal surface measured at 30 degreesangle of incidence using the VeeMAX II specular reflectance accessory

Beam path for a relatively thick sample measured by Specular Reflection

Beam path for Reflection-Absorption of a relatively thin film measuredby Specular Reflectance

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4 2

72

1

50

At wavelengths where the sample exhibits a strong IR absorption,the reflectivity of the sample increases. The superposition of theextinction coefficient spectrum with the refractive index dispersionresults in a spectrum with derivative shaped bands. This specularreflection spectrum can be transformed using a Kramers-Kronigconversion to a transmission-like spectrum as shown in the example below.

Our third application of specular reflectance is the measure-ment of relatively thin films and mono-molecular layers at grazingangle of incidence. At high angles of incidence, between 60 and85 degrees, the electromagnetic field in the plane of the incidentand reflected radiation is greatly increased relative to a near normalangle of incidence. The perpendicular component of the electro-magnetic field of the reflecting radiation is not enhanced.

Because of the orientation of the electro-magnetic field atthe surface for grazing angle measurements, the use of an IRpolarizer greatly improves the sampling result. By collecting thespectrum at grazing angle of incidence with P-polarization, weonly examine the enhanced portion of the electromagnetic fieldat the sample surface, thereby producing a stronger absorbancespectrum.

Specular reflectance is a valuable FTIR sampling techniquefor the analysis of thin films on reflective substrates, for theanalysis of relatively thick films on reflective materials and foranalysis of bulk materials where no sample preparation is preferred. PIKE Technologies offers a complete line of specularreflectance accessories and options to do these analysis and perform these experiments.

Spectrum (upper – original) of a relatively thick polymer sample measuredat 30 degrees angle of incidence using the VeeMAX II. The lower spectrumhas been transformed using the Kramers-Kronig software algorithm andis very similar to a transmission spectrum of the polymer – polyethylene.

Grazing angle specular reflection analysis produces a strong electro-magnetic field oriented in the plane of the incident and reflected radiation

Grazing angle specular reflection analysis of a thiol mono-molecular layerdeposited on a gold surfaced mirror using the PIKE VeeMAX II at 80 degreesand P-polarization. The FTIR was equipped with an MCT detector.

PolarizationPolarizers may be used to detect oriented samples

and for measurement of thin films on reflective

substrates. PIKE Technologies offers several crystal

forms of polarizers and automated versions for

transmission, reflection and ATR sampling.

Manual Polarizers6 different offerings for mid-IR,NIR, and far-IR spectroscopy

Page 52

Automated Polarizers6 different automated versions formid-IR, NIR, and far-IR spectroscopy

Page 52

Infrared PolarizersTheory and Applications

Page 53

PIKE Technologies offers polarizers for a wide variety of spectroscopyapplications which are available in manual or automated versions.The polarizers are mounted in a standard 2" x 3" slide mount andare compatible with all FTIR spectrometers. Polarizer elements are25 mm in diameter and, with mount, have a 20 mm clear aperture.

The polarizers are also compatible with many PIKE Technologiesaccessories including the 80Spec, VeeMAX, and AGA specularreflectance accessories. If you would like to add mounting to anyof our accessories, please contact us.

PIKE Technologies automatedpolarizers provide specificationsidentical to our manual versions,plus they are fully computer con-trolled, making many previouslylabor-intensive applications feasible.With the automated polarizer ananalysis program can be set upthrough AutoPRO software to automatically collect all spectra.

There are two manual polarizer types available. The short formwith the 5 degree scale resolution and the long form with themore precise, 1 degree scale. The short and long versions of theautomated polarizer are also available to address various samplecompartment and accessory configurations. The automated polar-izers offer the added benefit of increased setting reproducibilitywith accuracy of +/- 0.5 degree.

Polarizers – Manual and Automated Versions for Molecular Spectroscopy

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

52


Manual Polarizers (select based upon spectral range and performance requirements)P A R T N U M B E R D E S C R I P T I O N



090-1500 Manual Polarizer, Ge

090-1400 Manual Polarizer, BaF2

090-1600 Manual Polarizer, Polyethylene

090-1300 Manual Polarizer, CaF2

090-3000 Precision Manual Polarizer, ZnSe

090-3200 Precision Manual Polarizer, KRS-5

090-3500 Precision Manual Polarizer, Ge

090-3400 Precision Manual Polarizer, BaF2

090-3600 Precision Manual Polarizer, Polyethylene

090-3300 Precision Manual Polarizer, CaF2

Notes: All manual polarizers are mounted into a 2" x 3" plate for mounting intothe FTIR spectrometer slide sample holder or the appropriate sampling accessory.

Automated Polarizers (select based upon spectral range and performance requirements)P A R T N U M B E R D E S C R I P T I O N


090-2200 Automated Polarizer, KRS-5

090-2500 Automated Polarizer, Ge

090-2400 Automated Polarizer, BaF2

090-2600 Automated Polarizer, Polyethylene

090-2300 Automated Polarizer, CaF2

090-4000 Precision Automated Polarizer, ZnSe

090-4200 Precision Automated Polarizer, KRS-5

090-4500 Precision Automated Polarizer, Ge

090-4400 Precision Automated Polarizer, BaF2

090-4600 Precision Automated Polarizer, Polyethylene

090-4300 Precision Automated Polarizer, CaF2

Notes: All automated polarizers are mounted into a 2" x 3" plate for mounting intothe FTIR spectrometer slide sample holder or the appropriate sampling accessory.The automated polarizers include the PIKE Technologies Motion Control Unit andAutoPRO software for fully automated operation.

F E AT U R E S O F P O L A R I Z E R S

• Convenient, slide-mount design for all FTIR spectrometers

• Also compatible with many PIKE Technologies accessories

• Available in manual and automated versions

• Available for mid-IR, NIR and far-IR applications

Manual Polarizers

Automated Polarizers

Polarizers are valuable tools used for spectroscopic analysis ofsample orientation and for measuring thin films on reflective surfaces. This overview presents basic polarization theory andhighlights some useful polarization applications.

For the purposes of discussing polarizers, light is consideredan electric field with a magnitude oscillating in time. Light propagating along the z axis can be described as a combinationof electric vectors in x and y axis. Linearly polarized light may bethought of as consisting of an x and a y component with differentrelative magnitudes. For example, if the y component is close tozero, the light is considered fully polarized in the x direction.

Polarizers are devices that split unpolarized light into twoorthogonal components; one of the linearly polarized componentsis transmitted, the other is reflected, redirected or absorbed. Themost important features of a good polarizer are brightness, contrast and durability. Brightness and contrast can be describedby two main parameters; K1 and K2.

K1 = Transmission efficiency for normally incident polarizedlight whose electric field vector is perpendicular to thewire direction.

K2 = Transmission efficiency for normally incident polarizedlight whose electric field vector is parallel to the wiredirection.

For a ‘perfect polarizer’ K1 = 1, which means full transmissionof polarized light whose electric field vector is in the preferreddirection and K2 = 0, which means complete blockage of a beamof polarized light whose electric vector is perpendicular to the former. Other measures of performance deduced from K1 and K2 are

Degree of polarization =

Extinction Ratio =

Principal transmittance ratio or contrast =

Polarizers may be made from very fine conducting parallelelements or grid placed upon a suitable transparent base material.When the grid spacing is much smaller than the wavelength oflight, the light with the electric vector parallel with the grid willbe reflected and only the component with perpendicular electricvector will be transmitted (shown graphically on the right).

The overall transmission characteristic of the polarizerdepends upon the substrate, but the polarization efficiencydepends upon the period, line width and other design parametersof the polarizer.

In the mid-infrared range, the most practical and commonlyused polarizers are ruled or holographic wire grid structures. Thepolarization effect comes from the same principle as the freestanding wire grid, except the fine wires are formed on the surface of an infrared transmitting optical window material.

Polarization efficiency depends on smaller grid spacing than thewavelength and on the conductivity of the wires. In the case of aruled polarizer, the surface of the optical element is created by a diamond needle to form very fine parallel lines, such as 1200lines/mm, on the surface. The optical element is then placed into avacuum chamber and this pattern is partially coated with aluminumor other evaporated metallic layer. The spacing between theevaporated thin lines has to be very small, typically a fraction ofthe wavelength. Ruled polarizers have good performance and aredurable at high laser powers, but can only be made on hard,non-granular materials that can be ruled, such as ZnSe.

Holography is another method used to form the fine metallicwire pattern on the surface of the polarizer element. Two coherentlaser beams are directed onto the surface of the optical elementwhich is coated with a very thin layer of photo resist. The interference pattern formed at the intersection of the two beamsis allowed to expose the photo resist. The lines in between theexposed photo resist are removed and then coated in a vacuumchamber similar to the ruled grating type. The advantage of holographic polarizers is that a wider variety of materials can beused such as the softer KRS-5. As mentioned earlier, the efficiencyof the polarizer depends on the grid spacing formed among thewires. Holographic techniques allow more uniform grid patternsbecause the spacing is produced optically. Light scatter due toimperfections of ruled grooves are also reduced. If the grid spacingis smaller, the polarizer is more efficient. The spacing errors havealso much less effect on the efficiency if the grid is much smallerthan the wavelength. The trade-off with tighter grid is the reductionof the optical throughput. These parameters are carefully optimizedin the design of the polarizer elements and the right polarizercan be selected for specific experimental conditions.

Specifications and performance characteristics of polarizersoffered by PIKE Technologies are shown in Table 1.

Infrared Polarizers – Theory and Applications

53

PO

LA

RI

ZA

TI

ON

– F

OR

OR

IE

NT

ED

SA

MP

LE

SA

ND

RE

SE

AR

CH

AP

PL

IC

AT

IO

NS

Cutoff, cm-1 Transmission Undesired Degree of Polarization,Polarizer Type Application Spectral Range Efficiency, K1 Transmission, K2 (K1-K2)/(K1+K2)

ZnSe Mid-IR, General Purpose 460 70% 1% 97%

KRS-5 Mid-IR, Wide-range 200 75% 0.25% 99%

Ge Mid-IR, Highest Efficiency 5500 – 570 90% 0.25% 99%

Polyethylene Far-IR, Widest Range 500 – 10 80% 4% 93%

CaF2 NIR Applications 800 85% 1% 98%

BaF2 Mid-IR 840 70% 0.1% 99%

Notes: Efficiency values reported at 1000 cm-1 for mid-IR, at 3300 cm-1 for NIR and 100 cm-1 for far-IR. All polarizers are holographic, wire grid for maximum performance.

Table 1

Graphical representation of the polarization effect

The optical material substrate used to create the polarizersdetermines the wavelength range of the polarizer – such as ZnSeor KRS-5. Table 1 shows the K1 values of PIKE Technologies polarizers.The maximum transmitted light is affected by the transmission ofthe materials and the scattering of the ruled and evaporated surfaces. Fresnel losses are determined by the refractive indexand the performance of the anti-reflection coating on the element.The maximum transmission compared to a fully depolarized openbeam is typically less than 50%. However, FTIR spectrometers produce slightly polarized beams, which in most cases are orientedin the vertical direction in the sample compartment. Thus theapparent transmission of a single polarizer oriented vertically and compared to open beam can be over 50%.

The other critical parameter of polarizers, the contrast, canbe measured by crossing two polarizers and recording thethroughput signal. For efficient polarizers in a practical spectroscopysetting, such as using a converging infrared beam in the samplecompartment of an FTIR spectrometer, it is expected that thelight level should be less than 1%. For selected high performancepolarizers it can be better than 0.5%.

Polarizers are usually mounted in a plastic disc and placed in a rotating holder with an angle scale. This way, the angle ofthe polarizer orientation can be positioned with approximately 1 degree repeatability. Motorized polarizers are available withmuch better angular accuracy and precision. The automatedpolarizers are also very useful for conducting a series of experimentswith different angle settings under complete computer control.

One of the main uses of infrared polarizers is to monitormolecular orientation in samples such as films and fibers. Duringmanufacture polymers tend to orient along the axis of themechanical stretching and this preferred orientation is retainedafter the material stops flowing. In some cases, polymers are amixture of crystalline, more polarized, and amorphous, lesspolarized, forms of the material. In order to study orientation,polarized light is directed on the film or fiber. The polarized lightelectrical vector coinciding with the dipole of the infrared activemoiety increases in absorption intensity, thereby revealing theband assignment and the orientation of the molecular group.Single crystals placed in the focus of polarized light also absorbselectively, depending on the orientation of the crystal.

Polarizers can also be used in conjunction with attenuatedtotal reflection (ATR). Even without polarizers, for any ATR thatretains the orientation relative to the incoming infrared beam,there could be spectral differences noted when an oriented sampleis placed with its direction along the optical axis or perpendicularto it. The phenomenon is related to penetration depth differencesfor the light components polarized parallel or perpendicular withthe reflective surface (see ATR Theory and Applications).

Another important application of polarizers is the enhancementof the signal measuring thin films on polished semiconductors,metallic mirrors and other reflective surfaces.

Using large angle reflectance optics, the grazing anglereflectance of the thin films can be measured. Substantial signalenhancement can be achieved by using polarized light in conjunction with a grazing angle accessory. As an example, a thin oily deposit on a gold mirror can be measured with good signal-to-noise ratio by using polarized light with a specularreflectance accessory set at 80 degrees. Background spectra foreach result were collected at the identical polarization angle asthe sample. As seen in the spectra below, the light polarized suchthat the electric vector is perpendicular to the metallic mirror surface is enhanced. The spectrum measured with the polarizationperpendicular to the surface (electric vector parallel with the surface) is not detected. The non-polarized light measurement isa combination of the two polarized measurements, showing a signal with less contrast than the red trace.

SummaryPolarizers are highly useful spectroscopy sampling tools for the measurement of samples with molecular orientation, for measuring thin films on reflective surfaces and for molecularspectroscopic research.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

54

Spectra for high density polyethylene (HDPE) with parallel and perpendicular polarization demonstrate that this sample is oriented

FTIR spectra with vertical and horizontal polarization

Integrating Spheres Integrating spheres are useful for qualitative and

quantitative measurement of sample composition

when morphology, particle size, surface roughness

or sample flatness varies from sample to sample.

PIKE Technologies offers fully integrated accessories

for mid-IR and NIR applications.

Mid-IR IntegratIR™For advanced measurements in the mid-IR spectral region

Page 56

NIR IntegratIR For qualitative and quantitativeanalysis in the NIR spectral region

Page 58

Integrating SpheresIntroduction and Theory

Page 60

Mid-IR IntegratIR™ – Integrating Sphere

The integrating sphere is very often an accessory of choice whenstudying reflectance properties of solids, analyzing light scatteringand/or highly absorbing samples and collecting spectra difficult toobtain with standard sampling techniques. PIKE Technologiesoffers two Mid-IR integrating spheres, designed for research andstandard applications that require high sensitivity and ability tocollect high quality data from difficult to analyze samples.

The PIKE IntegratIR spheres are available in the upward anddownward looking configurations and are suitable for the meas-urements of absolute and relative diffuse reflectance of solids,powders and opaque liquids. Both feature 3 inch diameter highlyreflective gold coated integrating spheres. The accessories mountin the sample compartment of the FTIR spectrophotometer, butuse a dedicated detector for maximum performance.

The upward looking Mid-IR IntegratIR features an 8 degreeillumination of the sample with an optional specular exclusionoptical path. Reflectance samples are placed directly onto thesample port located on the top portion of the sphere. This sphereis ideal for large and/or thick solid samples. For powder samples,a standard ZnSe window is available. If preferred, a KBr windowcan also be used with the sample plate to minimize the reflectionloss compared to the ZnSe.

The downward looking Mid-IR IntegratIR allows the sample tobe placed underneath the sphere. This configuration is desirablefor measurements of powders and particulate materials becausean incidence beam strikes the sample directly, without passingthrough an IR transparent window. A specular exclusion port is astandard feature on this accessory.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

56

F E AT U R E S O F T H E M I D - I R I N T E G R AT I R

• 3 inch sphere – gold coated, Lambertian scatterer for high-performance measurements

• 8 degree hemispherical diffuse reflectance measurement collecting full reflectivity from the sample

• Diffuse transmission station for measurement of highly scattering samples in transmission mode

• Integrated, high-performance detector MCT or DTGS choicefor ultimate configurability

• Upward and downward-looking optical configurations toaccommodate a wide range of sample sizes and types

• In-sample compartment design to minimize laboratory space requirements

• Configurations available for most FTIR spectrometers

Optical diagram of the upward looking IntegratIR Sphere

Downward looking IntegratIR Sphere

For both spheres, the selection of light illumination onto the sample or onto the reference surface is done via a flipper mirror. This allows the background to be collected using eitherthe substitution method or the Taylor method.

Diffuse transmittance of partially transmitting materials can bemeasured with either sphere. This is done by placing the sampleon a standard 2" x 3" sample holder and siding it in the mountlocated in front of the transmission port.

A selection of Mercuric cadmium telluride (MCT) or deuteratedtriglycine sulfate (DTGS) detectors is offered with the IntegratIRspheres. This allows the accessory to be optimized for the applicationand sample type. The wide band MCT is the commonly configureddetector while the less sensitive DTGS is an option for users whorequire the convenience of a room temperature detector. Theaccessory comes with built-in detector electronics and can beinterfaced to most FTIR spectrometers.

57

IN

TE

GR

AT

IN

GS

PH

ER

ES

– R

EF

LE

CT

AN

CE

FR

OM

AL

LP

ER

SP

EC

TI

VE

S

Absolute reflectance spectrum of painted black panel measured usingthe PIKE Mid-IR IntegratIR.

Comparison of transmission spectrum of paper collected using the integrating sphere to a spectrum collected in transmission mode withouta sphere.


IntegratIR SpheresP A R T N U M B E R D E S C R I P T I O N

048-10XX Upward Sample Positioning Mid-Infrared IntegratIR Integrating Sphere Accessory

048-11XX Downward Sample Positioning Mid-Infrared IntegratIRIntegrating Sphere Accessory

Notes: The IntegratIR spheres include the sphere, purge enclosure and tubing, one diffuse gold reference. The Upward IntegratIR also includes a sample plate with a ZnSewindow. The Downward IntegratIR includes a powder sample cup. Your FTIR spectrometermust be capable of interfacing with an external detector.

IntegratIR Detector Choice (must select one)P A R T N U M B E R D E S C R I P T I O N

048-3300 Wide-band MCT Detector

048-3200 Mid-band MCT Detector

048-3100 Narrow-band MCT Detector

048-3400 DTGS detector with CsI detector window

Notes: The detector includes the preamplifier electronics. MCT detectors require liquidnitrogen for cooling.

Replacement Parts and Sampling OptionsP A R T N U M B E R D E S C R I P T I O N

048-2010 Specular Exclusion Port for Upward Sample Positioning IntegratIR

048-0100 Sample Plate with 18 mm x 2 mm ZnSe Window

048-0200 Sample Plate with 18 mm x 2 mm KBr Window

048-3000 Diffuse Gold Reference

048-2020 Powder Sample Cup for Downward IntegratIR

048-3150 MCT Detector Reconditioning

INTEGRATIR ACCESSORY SPEC IF ICAT IONS

Optical Design Upward or downward looking sample spheres

Sphere Size and Surface 3" (76.2 mm) gold coated Lambertian surface

Sample Port Size 23.5 mm

Specular Exclusion Port, OptionalUpward Looking Sphere

Specular Exclusion Port, StandardDownward Looking Sphere

Accessory Dimensions 175 mm wide, 165 mm tall, and 195 mmdeep (excludes baseplate)

Detector Choice DTGS or MCT

Spectral Range, Wide-band: 5000 – 500 cm-1

MCT Detectors Mid-band: 5000 – 650 cm-1

Narrow-band: 5000 – 800 cm-1

Spectral Range, 5000 – 250 cm-1

Extended DTGS Detectors with CsI Window

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

58

NIR IntegratIR – Integrating Sphere

The PIKE Technologies NIR IntegratIR is a near-infrared (NIR)Integrating Sphere for quantitative and qualitative measurementsof a wide variety of solids and paste materials. The NIR IntegratIR collects reflected energy from a spherical perspective and therebycaptures complete and quantitative response from the sample.Using near-infrared chemometrics, qualitative product identificationand quantitative analysis may be performed on pharmaceutical,nutraceutical, chemical, polymer, textile, food, agricultural andother samples.

The NIR IntegratIR accessory features a 2" high reflectivitygold-coated integrating sphere and a high-speed, low-noise indium-gallium-arsenide (InGaAs) detector, transfer optics andinterface electronics. The NIR IntegratIR fits into the sample compartment of most commercial FTIR spectrometers and itselectronics interface as an internal detector of the spectrometer.A 10 mm diameter horizontal sampling port makes the placementof samples onto the accessory very easy. An optimized borosilicatewindow serves as a sampling port at the top of the integratingsphere. The window is bonded and sealed to protect the spherefrom corrosive materials and contamination.

Sampling of tablets, packaging materials and plastics is easilyaccomplished by placing the sample directly on the window ofthe upward facing sphere. Powders, creams, pastes or liquids containing reflective particles may be placed in disposable flat-bottom vials – eliminating the need for any sample cleanup. Thevials may be held in place by a sample-positioning vial holder,resulting in more repeatable measurements.

High quality spectra are produced quickly using the NIRIntegratIR – making qualitative and quantitative analysis of awide variety of sample types efficient and reliable.

For heterogeneous samples, PIKE Technologies offers a RotatingStage for the NIR IntegratIR. With this option, one obtains anaveraged result to eliminate variations in quantitative results forthe chosen sample area.

F E AT U R E S O F T H E N I R I N T E G R AT I R

• Optimized 2" gold-coated integrating sphere with high signal-to-noise ratio

• Fully integrated InGaAs detector, detector electronics and transfer optics

• Optional automated transmission analysis stage for pharmaceutical analysis

• 10 mm horizontal sampling port for easy sample placement

• Excellent qualitative and quantitative NIR analysis tool

• Economical alternative to dedicated near-infrared analyzers

• Optional Rotating Stage for averaging of heterogeneous samples

• Spectral range 12200-3850 cm-1

• In-Sample Compartment design, compatible with most commercial FTIR spectrometers Qualitative analysis of steroids using the PIKE Technologies NIR

IntegratIR. Samples are measured within glass vials.

Optical diagram of the NIR IntegratIR Sphere

59

IN

TE

GR

AT

IN

GS

PH

ER

ES

– R

EF

LE

CT

AN

CE

FR

OM

AL

LP

ER

SP

EC

TI

VE

S

The NIR IntegratIR comes complete with diffuse gold reference,sample holders and a removable general-purpose sample mountingplate. The NIR IntegratIR is configured for each specific FTIR spectrometer and includes a pre-aligned mount for your instrument.

The NIR IntegratIR is a cost-effective, high-performance sampling option for laboratories with a standard FTIR spectrometerequipped with a near-infrared light source and beam splitter.

The optional transmission tablet analysis stage for the NIRIntegratIR provides an automated tool for sampling 10 tablets ofa variety of sizes. With this option you can measure formulationreproducibility or verify pharmaceutical composition.



048-60XX NIR IntegratIR Integrating Sphere AccessoryIncludes 2" diffuse gold coated integrating sphere, InGaAsdetector, detector preamplifier, cable and baseplate for the specific model spectrometer. The accessory also includes a gold reference standard, vial holder, and 25 glass vials.

Notes: Please see the FTIR instrument code sheet. Your spectrometer must be capable of interfacing with an external detector.

Sampling Options for NIR IntegratIRP A R T N U M B E R D E S C R I P T I O N

048-2999 Glass Sample Vials (Pack of 25), 19 x 65 mm

048-3000 Diffuse Gold Reference

048-3070 NIST Traceable NIR Reference Standard

048-3071 NIST Traceable NIR Reference Standard – Recertification

044-3010 Glass Vial Holder (for 19 mm vials)

048-0150 Rotating Stage for Petri Dish (for heterogeneous samples)Includes 100 x 20 mm Petri Dish

048-0151 Rotating Stage Adapter for 500 mL beaker

048-0060 Automated Transmission Tablet Analysis Stage for NIR IntegratIR Includes 3 tablet plates for 7.5, 8.5 and 10 mm tablets

Note: Please contact us for other options. Stage rotates counterclockwise.

Quantitative measurement of active ingredient in a mixture of magnesiumstearate, lactose, Emcompress™, cellulose and CaboSil™

NIR IntegratIR with optional transmission tablet analyzer

Integrating Spheres – Introduction and TheoryMeasuring Sample ReflectanceReflectance sampling accessories rely upon a light beam comingfrom the spectrometer to be focused upon the sample. In orderto achieve the best signal-to-noise ratio (SNR), the smaller thefocus is, the easier it is to refocus the illuminated sample spotback onto the detector. In order to measure light reflected at alarger angle, optical designs will allow only a small area of thesample to be projected onto the detector. This arrangementserves well if the sample is microscopically homogeneous, butwill result in a larger sample position error. When the sample ismoved, the focused beam will see a different portion of the sampleresulting in measurement-to-measurement differences. This iscalled insertion error because the spectrum will be slightly different each time the sample is inserted.

Some industrial or natural samples are inhomogeneouseither because they are mixtures of different substances orbecause they have a particle size comparable to the probingbeam diameter. Clearly, if the probing beam could be larger andthe reflected light could all be collected, a more representativespectrum could be measured.

Some other samples develop a directional scattering. Forexample, fibers wound on a mandrel are highly oriented, not justmacroscopically as parallel, unidirectional filaments, but also inmany cases the molecules of the drawn fibers are oriented withinthe fiber itself. Such a sample, when placed in a reflectance accessory will generate different results depending on the anglefrom which the detector is “viewing” the sample. When the overallreflectance needs to be measured reproducibly, for example tomeasure the concentration of a minor ingredient in the sample,only isotropic optical systems, insensitive to such directionalitiescould be utilized.

Furthermore, in some cases, not just the reflectance in asmall solid angle but the reflectance in all angles is sought. Mostreflectance accessories measure at fixed or variable angles, nar-rower or wider collection angles, but there is a need for a devicethat uniformly collects all reflected light from a sample. In otherwords it measures the total reflectance of the sample.

Therefore the main reasons for using integrating spheres forthe measurement of sample reflectance are the following:

• Efficient measurement of combined diffuse and specularreflectance

• Uniform detection of reflectance even when sample is inhomogeneous

• Isotropic detection of reflectance even on samples that reflect in preferred directions

• Reduction of polarization effects from the illuminating beamand the sample

• Measurement of absolute reflectance (with special integrating spheres)

All of the above concerns are addressed with integratingsphere based reflectometers.

Integrating Sphere OpticsIntegrating spheres are highly reflective enclosures that areplaced in close proximity to the sample, such that the reflectedlight enters the sphere, bounces around the highly reflective diffuse surface of the sphere wall and finally impinges upon thedetector – usually part of the integrating sphere assembly. Thename, integrating sphere, refers to one of the main functions ofthe device, namely that it spatially integrates the light flux, in ourapplication the light reflected from a sample. In spite of the longhistory of engineering and development of the sphere, the appli-cations and further developments continue to this day. Advancesin the theory, detector and electronics development and most ofall, new applications, drive the progress.

As the name implies, the main part of the device is a spherewith a very highly reflecting inner surface. The surface shouldapproach the ideal Lambertian scatterer, which means that thelight falling on the surface is evenly scattered in all directions andthe scattered light intensity is proportional to the cosine of theangle of observation.

In an upward sample positioning sphere the infrared beamfrom the interferometer is directed through an entrance portonto the sample placed behind the sample port (shown above).Samples can be directly touching the sphere or separated fromthe sphere by a thin, infrared transparent window. The detector is placed close to the sphere, so that it can view the integratingsphere with a large solid angle. In order to improve the isotropy(non-directionality) of the detection, the detector is not directly inthe line of sight of the sample. A small, also highly reflective andscattering baffle is placed in the sphere such that it blocks thefirst reflection of the sample from reaching the detector.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

60

Optical geometry of an integrating sphere

Sample

ρw

SamplePort (As)

DetectorPort (Ad)

EntrancePort (Ae)

Area ofSurface (As)

Baffle

F.O.V.

61

IN

TE

GR

AT

IN

GS

PH

ER

ES

– R

EF

LE

CT

AN

CE

FR

OM

AL

LP

ER

SP

EC

TI

VE

S

A well-designed sphere has the sample close to the spheregeometry so that the sphere will collect close to the full availablehemispherical reflectance (2π steradians). A window to separatethe sphere and sample may be important in some cases, but itwill place the sample a small distance from the sphere, therebysomewhat reducing the collected high-angle reflectance. The PIKETechnologies integrating spheres are coated with the highest possible reflective surface for the desired wavelength region. Thecoating of the surface of the sphere has to be uniform and closeto being a perfect Lambertian scatterer. These characteristicsallow the light falling in the sphere to be uniformly distributedover the entire surface of the sphere. It is also important howmuch of this light is actually collected on the detector surface.

Sphere ThroughputThe throughput of the sphere is defined as the ratio of theincoming light impinging on the detector. The closer the spheresurface is to ideal reflectance, the higher the throughput. Thedetector, the sample and the illumination require that a portionof the wall of the complete sphere be removed. Smaller cutoutsfor beam input and output result in higher energy throughput.Due to other considerations, such as reduction of light scatterfrom the edges of the sphere cutouts, called ports, these have tobe optimized and cannot be too small.

The throughput can be expressed with these sphere designparameters:

Where Ad is the detector area, As is the sphere area, ρw is thesphere wall hemispherical reflectance, ρw, avg is the average spherewall reflectance.

The sphere throughput is higher if the light falling on thedetector is increased by the multiple reflections of the light.Another way of looking at the integrating sphere is that it enhancesthe detector signal by collecting the light, and if the wall surfaceis reflective enough, bounce it around until it illuminates thedetector. The factor that is used to express this gain is called thesphere multiplier (M), which is a function of the wall reflectance(ρw), the proportion of the total area of ports to the surface of thesphere (f).

The brightness of the sphere, using the same amount ofinput light flux, is dependent on the wall reflectivity, the port-to-sphere surface ratio and the size of the sphere surface.

where Φi is the input light flux and As is the area of the spherewall surface.

For the sphere the area of the sphere obviously depends onthe sphere diameter, and thus the formula shows that a smallersphere is brighter than a larger diameter one.

The sphere diameter cannot be reduced too far however,because the sample diameter will also have to be decreased proportionally when the sphere is smaller. For typical spectroscopicapplications the optimum sphere diameter is influenced by thebeam size coming from the FTIR spectrometer and the typicalsample size of 3-25 mm. Most integrating sphere modules use a2-4 inch diameter sphere to accommodate the above designparameters. In a practical design, the openings of the sphere needto be kept around 5% for optimum throughput. Wall reflectanceis usually between 95-99% and results in a sphere gain of 10-30.

Integrating Spheres for Mid-IR and NIRIntegrating spheres, although much more efficient than an opticalsystem with an equivalent detector position, still have lowerthroughput than the direct imaging optics. In the visible and NIRspectral region, where there are very good sources and excellent,high-speed detectors are readily available, the SNR is usually notlimited by the reduced light level. In the mid-IR spectral region,in order to utilize the above discussed advantages and benefits ofintegrating spheres, the reduced throughput needs to be offset bythe use of the high sensitivity, cooled detectors, such as the liquidnitrogen cooled MCT detector utilized by PIKE Technologies. Thenear-infrared and mid-infrared measurements using integratingsphere optics have different analytical and measurement goals aswell as different features. PIKE Technologies offers both mid-IRand NIR versions.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

62

N O T E S

Remote SamplingAccessoriesHollow waveguide and fiber optic sampling

accessories provide a new dimension of flexibility –

expanding the reach of the sample compartment.

The sampling probe now is flexible and may be

taken to the sample; maybe an unwieldy sample –

too large to be fit onto an accessory. PIKE

Technologies offers NIR and Mid-IR versions of

remote sampling probes.

FlexIR™ – Mid-IR Hollow WaveguideAccessory for remote and flexiblesampling in the Mid-IR spectral region

Page 64

FlexIR – NIR Fiber Optic Accessoryfor remote sampling in the NIRspectral region

Page 66

The PIKE FlexIR Hollow Waveguide Accessory is an excellent toolfor remote and specific area analysis of a wide variety of samples.Visible surface contamination, small area material identification andbulky materials too large to fit into the FTIR sample compartmentare a few of the many samples and application types for theFlexIR accessory.

The new FlexIR Hollow Waveguide Accessory is designed forhigh throughput, ruggedness and wide spectral range. The FlexIRutilizes a customized optical design with diamond turned focusoptics providing exceptional IR throughput. The new hollowwaveguides are very durable and free from the typical fractureproblems encountered with polycrystalline core fibers. The highlyreflective hollow waveguides transmit maximum energy throughthe full mid-IR spectral region – eliminating the need for multiplefibers for a complete spectrum coverage when chalcogenide orhalide probes are used.

Two FlexIR bases are available for maximum configurability.The MCT version comes with an integrated detector which offershigh sensitivity and fast data collection rates. Three detectoroptions are available to best optimize the signal-to-noise ratio(SNR) against the required spectral range and the applicationneeds. The mid-band MCT is the most versatile and commondetector offered with this version of the accessory.

A DTGS FlexIR base is available for those applications that do not require a high SNR, and benefit from the flexibility andconvenience of a room temperature detector. To optimize its performance, the DTGS detector is integrated into the probe. This probe is equipped with a short handle for ease of positioningand sampling.

The PIKE Technologies FlexIR Hollow Waveguide Accessory is built and tested for optimum performance for your FTIR spectrometer.

FlexIR – Hollow Waveguide Accessory for Remote Infrared Sampling

F E ATUR E S O F THE F L E X IR

• Fast, easy identification of solids and liquid samples outsideof the sample compartment

• 1 or 2 meter, hollow waveguide (HWG) offers exceptionaldurability and high throughput

• Full mid-IR spectral range coverage

• ATR, specular and diffuse reflectance probes for a completearray of sampling applications

• Permanent alignment of sampling probe to the hollow waveguide for consistent analysis results

• MCT or DTGS detector choice for maximum sensitivity and convenience


Coating on metal substrate – FlexIR HWG Accessory with specularreflectance probe

Visible defect on manufactured product – FlexIR HWG Accessory withATR probe

PIK

ETECHNOLOGIE

SWWW.PIK

ETECH.COM

608-2

74-2

721

64

FlexIR with DTGS Accessory

65

REMOTESAMPLINGACCESSORIES– E

XTENDING

YOUR

SAMPLE

COMPARTMENT

ORDER I NG IN FORMAT I ON

FlexIR Hollow Waveguide Base with MCT DetectorPA R T NUMB E R D E S C R I P T I O N

045-30XX FlexIR Hollow Waveguide Base with MCT Detector

Notes: The FlexIR is provided with base optics mounting for the sample compartmentof your FTIR spectrometer and an onboard MCT detector. Your FTIR spectrometermust be capable of interfacing with an external detector.

Hollow Waveguide MCT Detector Choice (select one or more)PA R T NUMB E R D E S C R I P T I O N

045-3200 Mid-band MCT Detector

045-3100 Narrow-band MCT Detector

Probe Choices for Hollow Waveguide with MCT Detector (select one or more)PA R T NUMB E R D E S C R I P T I O N

045-4100 Diamond/ZnSe ATR Probe, 1 m


045-4010 ZnSe ATR Probe, 1 m


045-4050 Ge ATR Probe, 1 m


045-4030 Specular Reflectance Probe, 1 m


045-4020 Diffuse Reflectance Probe, 1 m

Notes: Sampling probes are fixed to the Hollow Waveguides for maximum samplingreproducibility. Diffuse and specular probes are open tipped and are not suitablefor powder sampling.

FlexIR Hollow Waveguide Base with DTGS Detector PA R T NUMB E R D E S C R I P T I O N

045-35XX FlexIR Hollow Waveguide Base with DTGS Detector

Notes: The FlexIR is provided with base optics mounting for the sample compartmentof your FTIR spectrometer. Your FTIR spectrometer must be capable of interfacingwith an external detector. The DTGS detector is integrated into the probe.

Probe Choices for Hollow Waveguide with DTGS Detector (select one or more)PA R T NUMB E R D E S C R I P T I O N





Notes: Sampling probes are fixed to the Hollow Waveguides for maximum samplingreproducibility. DTGS detector integrated into the probe. Diffuse and specularprobes are open tipped and are not suitable for powder sampling.

Hollow Waveguide Probe HoldersPA R T NUMB E R D E S C R I P T I O N

045-3400 Adjustable Probe Holder

045-3410 Standard Probe Holder

Notes: Probe holders may be used with all Hollow Waveguide probes.

FLEXIR ACCESSORY SPEC IF ICAT IONS

Optical Design All reflective, diamond turned focus optics

Probe Design Hollow waveguide (HWG), full mid-IR reflective

Bend Radius, Minimum 150 mm

HWG Dimensions 1 or 2 m long, 1.6 mm OD, 1.0 mm ID

Sampling Probes Precision fixed to fibers – excellent reproducibility

ATR, Crystal Type Diamond/ZnSe composite, ZnSe, and Ge

ATR Sampling Diameter 4.4 mm diameter

Specular Reflectance Gold coated, 20 degree AOI

Diffuse Reflectance Gold coated, 2.5 mm port

Detector Choice DTGS or MCT

Spectral Range Diffuse Mid-band: 5000 – 650 cm-1

and Specular Reflectance, Narrow-band: 5000 – 800 cm-1

MCT Model

Spectral Range ATR, ZnSe: 5000 – 650 cm-1

Mid Band MCT Model Ge: 5000 – 700 cm-1

Diamond/ZnSe: 5000 – 650 cm-1

Spectral Range and 5000 – 500 cm-1

Specular Reflectance, DTGS Model (CsI window)

Spectral Range ATR, ZnSe: 5000 – 525 cm-1

DTGS Model Ge: 5000 – 600 cm-1

Diamond/ZnSe: 5000 – 525 cm-1

Accessory Dimensions, 178 mm wide, 190 mm deep, 160 mm high MCT Model (excludes FTIR baseplate and mount)

Accessory Dimensions, 110 mm wide, 90 mm deep, 120 mm high DTGS Model (excludes FTIR baseplate and mount)

Adjustable and standard Hollow Waveguide probe holders

Adjustable Probe Holder

Standard Probe Holder

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

66

The PIKE FlexIR™ near-IR (NIR) Fiber Optic Accessory is an excellenttool for remote and speedy analysis of a wide variety of materials.Powders, plastics, coatings, and liquid samples are readily measured – typically within 30 seconds. The FlexIR accessory is ideal for performing incoming QC of materials used in pharmaceutical, polymer, and chemical manufacturing.

NIR sampling is fast and efficient as it eliminates the need for sample preparation. The FlexIR accessory further speeds theanalysis since the probe tip is simply touched onto the sample,often in drums, and the spectrum is collected. Powdered samplespackaged within a plastic bag can be analyzed without removalfrom the bag and this further speeds analysis time and eliminatesanalyst exposure to chemical materials.

The PIKE Technologies FlexIR NIR Fiber Optic Accessory isdesigned for maximum throughput and performance. The fiberoptic cable is directly coupled to the integrated indium galliumarsenide (InGaAs) detector – eliminating energy loss due to additional transfer optics and beam divergence.

With the optional Liquids Sampling Tip, it is easy to identifyincoming liquids by inserting the wand tip into the liquid sampleand collecting its spectrum.

The PIKE Technologies FlexIR NIR Fiber Optic Accessory is builtand tested for optimum performance for your FTIR spectrometer.


FlexIR NIR Fiber Optic AccessoryP A R T N U M B E R D E S C R I P T I O N

045-10XX FlexIR NIR Fiber Optic Accessory

Notes: The FlexIR is provided with base optics mounting for the sample compartmentof your FTIR spectrometer and includes electronic cabling and diffuse reflectanceprobe. Your FTIR spectrometer must be configured with NIR beamsplitter and NIRsource for optimum performance of the FlexIR accessory. Your FTIR spectrometermust be capable of interfacing with an external detector. Please see the FTIR codesheet for your instrument designation.

FlexIR NIR Fiber Optic Accessory, Sampling OptionsP A R T N U M B E R D E S C R I P T I O N

045-2001 Liquids Sampling Tip for FlexIR, 1.0 mm pathlength



Notes: The Liquids Sampling Tip is screw mounted and easily exchanged with thesolids sampling tip on the FlexIR sampling wand.


045-2010 Diffuse Reflectance Tip for FlexIR NIR Probe

F E AT U R E S O F T H E F L E X I R

• Fast, easy identification of solids and liquid samples in situ

• 2 meter, low-OH fibers providing exceptional throughput andexcellent spectral data with short analysis time

• Spectral range from 1.0 to 2.5 microns (10000 to 4000 cm-1)

• Integrated, high sensitivity InGaAs detector with electronicsconnection for your FTIR spectrometer

• Standard SMA connectors providing maximum flexibilitywith fiber probes

• Standard diffuse reflectance sampling tip with inert sapphirewindow for solid samples

• Optional transflectance sampling tip for liquid samples

• Compatible with most FTIR spectrometers configured for NIR operation

Spectra of incoming pharmaceutical materials measured and verifiedwith the FlexIR NIR Fiber Optic Accessory

Spectra of incoming liquid materials measured and verified with theFlexIR NIR Fiber Optic Accessory

FlexIR – NIR Fiber Optic Accessory for Fast and Remote Sample Identification

Microsampling Microsampling accessories make an ideal addition

to an FTIR spectrometer when you need to do

analysis of samples which are considerably smaller

than the IR beam size – typically 8-10 mm.

PIKE Technologies offers microsampling accessories

which demagnify the FTIR beam to a smaller

dimension and thereby increase IR throughput

for small samples.

µMAX™ FTIR MicroscopeFor transmission, reflection andATR analysis of micro samples

Page 68

Microsampling Tools Sample handling tools for microanalysis

Page 71

4X and 6X Beam CondensersFor a wide variety of transmissionmeasurements of micro samples

Micro Diamond CellFor compressing and holdingsamples for microanalysis

Page 72

Page 73

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

68

µMAX – Sample Compartment Microscope for FTIR

The µMAX™ is an all new optical design for IR microanalysis, providing high performance sampling at low-cost with exceptionalease of use. The µMAX is designed to fit into the sample compart-ment of most FTIR spectrometers. The compact, planar opticallayout minimizes the pathlength of the IR beam and therebymaximizes IR throughput.

All operations with the µMAX are intuitive and made eveneasier with standard Dichroic Optics which provides full viewingof the sample while collecting IR spectra. With Dichroic Optics youcan view the sample area and simultaneously search for appropriateIR spectral content – greatly speeding microanalysis. The fullyvariable X, Y, θ See Thru aperture for transmission provides optimized sample dimensioning – for getting the maximum IRsignal from every sample.

The µMAX IR microscope uses 7.45X Schwartzchild objectiveand condenser to focus the IR beam onto the sample and provideexcellent sample visualization – better than 1 micron visibleimage resolution. An optional CCD camera enables video imageprojection onto the PC. With the Dichroic Optics of the µMAX andspectral preview of the FTIR software one can view changing IRspectra and sample position in real-time on the PC.

The µMAX is the first sample compartment IR microscopeaccessory capable of all microsampling modes – transmission,reflection and ATR. The µMAX fits into the sample compartment,using the spectrometers detector for convenience and samplingflexibility. For relatively larger micro samples (100 microns andgreater) the DTGS detector provides excellent performance withthe µMAX and enables full mid-IR spectral range coverage to 450 cm-1. For smaller micro samples to 20 microns in size an MCT detector is recommended.

F E AT U R E S O F T H E µ M A X

• Compact sample compartment design to save lab space

• Uses FTIR detectors – DTGS or MCT

• Available with transmission, reflection and ATR

• High throughput optical design

• Simultaneously view and collect spectrum

• Easy-to-use, robust design

• Available for most FTIR spectrometers

• Low-cost

Transmission spectra of polystyrene film at aperture sizes of 200 x 200,100 x 100, and 50 x 50 microns using the µMAX IR Microscope using theDTGS detector of the FTIR spectrometer. Spectra were collected using 4 cm-1 spectral resolution and 2 minute collection time.

Transmission spectra of polymer laminate sample using DTGSdetector. Samples held in PIKE Micro Compression Cell.

PIKE Technologies MicroCompression Cell

69

MI

CR

OS

AM

PL

IN

G–

FR

OM

MI

CR

ON

ST

OM

IL

LI

ME

TE

RS

Switching from transmission to reflection on the µMAX is easywith a thumb wheel selection. Reflection sampling area is definedby use of the aperture slide with pre-defined sizes from 40 to 1000microns. Micro reflection analysis of small areas of interest onreflective surfaces is made easy with the PIKE Technologies µMAX.Just focus and position the sampling stage, select the sample areawith the aperture slide and collect the spectrum. The backgroundspectrum is collected using the same dimension aperture usingthe gold surfaced reference slide.

ATR is an excellent sampling option for the µMAX IR microscope.The RotATR™ is a unique, rugged pivot designed germanium ATRproviding easy and precise operation and excellent micro ATR spectra.Focus and select the sample area, rotate the ATR crystal into sample position, make sample contact and collect the IR spectrum.

Micro ATR works exceptionally well with the µMAX IR microscope. The 100 micron flat-tipped micro ATR crystal makesintimate contact with the sample easily achieved, providing highspectral quality as seen in the data above.

The Micro Diamond Cell is an excellent option for use withthe µMAX IR Microscope. Tiny chips or fiber segments can be flattened to obtain excellent transmission spectra.

Micro reflection spectrum of a coating on a reflective base metal, 200 x 200 micron sampling area using DTGS detector

Micro ATR spectra of a 40 micron carpet fiber (upper – blue) and a 50 micron caffeine crystal (lower – red) using DTGS detector

Single drug crystal identified as benzocaine flattened in Micro DiamondCell. Data collected using DTGS detector

µMAX SPEC IF ICAT IONS

Sampling Modes Transmission, Reflection and ATR

Objective 7.45X Schwartzchild, N.A. 0.64, fixed for sturdy, permanent alignment

Optional Condenser 7.45X Schwartzchild, N.A. 0.64, Z-adjust to optimize sample focus

Micro ATR RotATR with 100 micron tip, pivot pinned-in-placeand easily removable for maximum sample areaaccess. Universal Ge crystal for analysis of allmicro samples.

Sample Stage Z focus including X, Y slide sample holder, with 20 x 50 mm travel

IR Collection/Sample Dichroic Optics reflect IR energy and transmit visible,Viewing providing continuous view of the sample during

data collection. Dichroic Optics eliminate the need toswitch optics from view sample to collect spectrum.

Sample Masking X, Y, θ variable Glass Aperture for transmissionsampling to view sample and surrounding sample area. Standard pinhole aperture slide forreflection sampling.

Illumination Köhler, variable intensity, 50 watt

Sample Viewing Binocular or Trinocular Viewer with 10X eyepieces.Standard eyepiece reticule for sample dimensioning,optional Video Camera with USB interface.

Visible Field of View 1600 microns

Visible Image Contrast Better than 1 micron

Station In sample compartment, fits most FTIR spectrometers. Mounted on a baseplate for theFTIR spectrometer.

Detector Uses standard detectors of the FTIR, typically DTGS and MCT

Purge Includes purge tubes and purge inlet for additional purge. Compatible with sealed and desiccated FTIR spectrometers.

Regulatory RoHS and CE Mark compliant

Please contact PIKE Technologies for additional product detail.

PIKE TechnologiesMicro Diamond Cell

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

70

Bundled µMAX PackagesP A R T N U M B E R D E S C R I P T I O N

034-21XX Complete µMAX Sample Compartment IR Microscope with Transmission, Reflection, ATR and video camera

034-22XX µMAX Sample Compartment IR Microscope withTransmission, Reflection and ATR

034-41XX Complete µMAX Sample Compartment IR Microscope for Reflection, ATR and video camera

034-42XX µMAX Sample Compartment IR Microscope with Reflection and ATR

Notes: All bundled µMAX Packages include a trinocular viewer, slide aperture forreflection, X, Y sample stage, micro sampling kit, spectrometer base mount, purgetubes and storage case. The transmission versions include the X, Y Variable See Thruaperture. Please see the FTIR instrument code sheet.

Configurable µMAX Systems

µMAX Base OpticsP A R T N U M B E R D E S C R I P T I O N

034-20XX µMAX Sample Compartment IR Microscope for Transmission and Reflection (ATR optional)

034-40XX µMAX Sample Compartment IR Microscope for Reflection (ATR optional)

Notes: The µMAX Sample Compartment IR Microscope is available in versions fortransmission and reflection sampling or refection only – both versions are also compatible with ATR sampling. RotATR µMAX ATR must be purchased separately.Both versions include the slide aperture for reflection, X, Y sample stage, micro sampling kit, spectrometer base mount, purge tubes, and storage case. The transmission version includes the X, Y Variable See Thru aperture. Please see the FTIR instrument code sheet.

Sample Viewing Options (must select 1 or more)P A R T N U M B E R D E S C R I P T I O N

034-3020 Binocular Viewer for µMAX

034-3030 Trinocular Viewer for µMAX

034-3010 Video Camera for µMAX

Notes: Trinocular Viewer is required for selection of the Video Camera option.Binocular and Trinocular Viewers include adjustable reticule to assist with sampledimensioning.

Micro ATR (optional)P A R T N U M B E R D E S C R I P T I O N

034-3040 RotATR, µMAX ATR, Ge Crystal

Notes: The RotATR micro ATR is compatible with the µMAX Sample Compartment IR Microscope.

Sampling Options, Upgrades and Replacement Parts

Micro Sampling OptionsP A R T N U M B E R D E S C R I P T I O N

034-3060 Micro Compression Cell for 13 mm IR Transparent Windows

160-1135 13 mm x 2 mm KBr Window

162-0030 Micro Plane with Carbide Blade

162-0040 Micro Plane with Diamond Blade

162-0010 Micro Diamond Cell 1.6 mm

162-0020 Micro Diamond Cell 2.0 mm

µMAX IR Microscope UpgradesP A R T N U M B E R D E S C R I P T I O N

034-0090 µMAX IR Microscope Transmission Upgrade

Notes: The Transmission Upgrade requires shipment of the accessory to PIKETechnologies. The upgrade includes the µMAX condenser, the X, Y Variable See ThruAperture, and all additional optics required for transmission, reflection and optionalATR sampling.

µMAX IR Microscope Replacement PartsP A R T N U M B E R D E S C R I P T I O N

300-0025 13 mm Gold Surfaced Disk for Reflection Analysis

034-3070 IR Microsampling Kit (3 position sample slide with gold mirror,2 KBr windows, scalpel, tweezers and probes)

162-6401 3-position Sample Slide for 13 mm Windows

300-0002 Gold Surfaced Sample Slide

034-3080 Replacement Illumination Bulb for µMAX

Notes: For options not listed here, please contact PIKE Technologies.


Microsampling Tools – Compression Cells and Sample Manipulation

71

MI

CR

OS

AM

PL

IN

G–

FR

OM

MI

CR

ON

ST

OM

IL

LI

ME

TE

RS


Microsampling ToolsP A R T N U M B E R D E S C R I P T I O N

034-3060 Micro Compression Cell (requires selection of two 13 x 2 mm windows)

160-1135 13 x 2 mm KBr Window, 1 each

160-1008 13 x 2 mm KBr Windows, 6 pack

162-0030 Micro Plane with Carbide Blade

162-0040 Micro Plane with Diamond Blade

162-6401 3-Position Sample Slide (recommended selection of window or disk)

300-0025 13 x 2 mm Gold-Surfaced Disk

Notes: For items not in this list please contact PIKE Technologies.

PIKE Technologies Micro Compression CellThe Micro Compression Cell is an excellent sampling tool for supporting small samples for transmission analysis with the PIKEµMAX IR microscope. Single crystals, flattened fibers, multi-layerpolymer micro samples are firmly supported between salt windows – typically KBr for transmission analysis. The cell uses 13 x 2 mm windows and has a clear aperture of 10 mm. Compressionof the sample is achieved by rotation of the knurled retainer.

Micro Plane with either Carbide or Diamond BladeThe Micro Plane is a useful tool for preparation of thin slices ofmulti-layered samples for transmission microanalysis. The MicroPlane is available with either carbide or diamond blade. The carbide blade is recommended for general polymer materials.The diamond blade is recommended when the multi-layeredsample has metallic content. The Micro Plane features anadjustable knife edge to control the thickness of the sample.

PIKE Technologies 3-Position Sample SlideThe PIKE 3-Position Sample Slide is designed for placement of 13 mm windows for transmission analysis or the 13 mm gold-surfaced disk for reflection analysis when using the µMAX IRMicroscope. An open port of the 3-Position Sample Slide is usedconveniently to support a flattened free-standing fiber fortransmission analysis.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

72

Small samples are easily held in place and flattened to idealthicknesses for FTIR analysis using the PIKE Technologies MicroDiamond Cell. The diamond windows in this cell are Type IIA synthetic for excellent transmission from the UV through Far-IRspectral regions. The hardness of diamond enables maximumpressure to be applied to all types of crystalline, fiber, or amor-phous materials. Typical samples include fibers, paint chips, rubbers, and plastic materials including laminates.

The large clear aperture of the PIKE Technologies MicroDiamond Cell (either 1.6 or 2.0 mm) makes it easy to place themicro sample into position while viewing under a stereomicroscope.The large thumb wheels provide easy means of tightening andflattening the samples. The thumb wheels include a hex wrenchtightening capability for application of maximum pressure.

The PIKE Technologies Micro Diamond Cell is mounted on astandard 2" x 3" plate compatible with your FTIR spectrometersample compartment. However, it performs best with a beamcondenser or IR microscope.

Micro Diamond Cell – For Compressing and Holding Samples for Microanalysis

F E AT U R E S O F T H E M I C R O D I A M O N D C E L L

• Compression and positioning for micro samples

• 1.6 or 2.0 mm clear aperture versions

• Easy thumb wheel or hex wrench mechanism for applicationof pressure

• Compatible with UV to Far-IR spectral regions

• Compatible with PIKE µMAX IR microscope and PIKE beam condensers

• 14,000 psi pressure (10 kgf/mm 2)

Human hair sample flattened in the PIKE Diamond Cell and analyzedusing the µMAX IR microscope


Micro Diamond CellP A R T N U M B E R D E S C R I P T I O N

162-0010 Micro Diamond Cell, 1.6 mm


Notes: The Micro Diamond Cell is easily laid onto the X, Y stage of the PIKE µMAX IRmicroscope. Mounting the Micro Diamond Cell into the PIKE beam condensersrequires the optional slide holder.

Basic beam condenser products have been available for many years.The PIKE Technologies Beam Condenser Accessories provide allthe functionality of these basic systems with exceptional opticaldesign and easy access to the sampling area. The unique enclosedoptics provide a purged environment.

Beam condensers offer easy transmission sampling with minimalsample preparation. The PIKE Technologies beam condensers areavailable in 4 and 6 times beam de-magnification. Each offer alarge working area to accept many types of transmission samplingaccessories, including high pressure diamond cells, liquid cells,mull cells, and miniature micro holders. The sample area usespins to ensure accurate and reproducible accessory alignmentrequiring no further adjustment.

For the most demanding applications, a precision X, Y, ZSampling Stage is available as an option, which accommodates all sampling accessories to achieve the highest possible opticalthroughput and allows a point-by-point surveying an extendedsample. The system design incorporates a layout of six mirrors,adjustable input and output mirrors and two matched 4:1 (or 6:1)ellipsoidal mirrors.

Sample Holders for the PIKE Technologies Beam Condensers.Left to right; Universal Spring Sample Holder – ideal for smallspheres and gems, Magnetic Sample Holder – ideal for 1 or 3 mmpellet die, and the Micro KBr Pellet and Mull Holder – ideal for very small volume solids, liquids and paste samples (holds 13 mm windows).

Either the 4X or 6X beam condensers are available in standardor gold-coated optics for high performance mid-IR for near-IRoperation.

Beam Condensers – 4X and 6X Versions for FTIR

73

MI

CR

OS

AM

PL

IN

G–

FR

OM

MI

CR

ON

ST

OM

IL

LI

ME

TE

RS

F E AT U R E S O F B E A M C O N D E N S E R S

• 4X and 6X versions – providing improved spectral data formicro sampling

• High optical throughput – beam condensing optics providehigher signal-to-noise ratio for small samples

• Standard pin mounting for sample holders – providing a precise, reproducible mount for samples

• Standard sample holder block and alignment pinhole (1.5 mm)

• Optional universal spring sample holder, X, Y, Z adjustablestage, micro pellet and mull holder, and magnetic sample holder

• Purge enclosed accessory – includes purge tubes and purgeinlet for additional purge.

• Compatibility with most FTIR spectrometers

Wing of fruit fly within 1 mm aperture with and without use of a beam condenser

Beam Condenser Optical Diagram

BEAM CONDENSERS SPEC IF ICAT IONS

Optics All reflective, aluminum – standardgold coated – optional

Configurations 4X and 6X de-magnifications

Sampling Options Standard sample holdersXYZ adjustable stagePressure diamond cells and micro holders

Purgeable Yes

Accessory Dimensions 140 mm wide, 100 mm or 125 mm tall, 315 mm deep


Beam CondensersP A R T N U M B E R D E S C R I P T I O N

031-40XX 4X Beam CondenserIncludes the Non-Adjustable Sample Position, 1.5 mm alignment aperture, purge tubes and mount for the FTIR of your selection.

031-60XX 6X Beam CondenserIncludes the Non-Adjustable Sample Position, 1.5 mm alignment aperture, purge tubes and mount for the FTIR of your selection.

Notes: Please select the XX code from the fold-out on the last page of this catalog.

Adjustable Sample Position (optional)P A R T N U M B E R D E S C R I P T I O N

031-2010 X, Y, Z Adjustable Sample Position

Notes: The X, Y, Z Adjustable Sample Position can be easily exchanged with theNon-Adjustable Sample Position.

Sample Holders (optional)P A R T N U M B E R D E S C R I P T I O N

031-2030 Universal Spring Sample Holder

031-2040 Magnetic Sample Holder

031-2050 Micro KBr Pellet and Mull Holder

Notes: All of these Sample Holders fit to the pin position of either the Non-Adjustable Sample Position or the X, Y, Z Adjustable Sample Position.

Micro Diamond Cell (optional)P A R T N U M B E R D E S C R I P T I O N



031-2070 Holder for Micro Diamond Cell

Notes: The Micro Diamond Cell includes the anvil pressure cell assembly, and Type IIa diamonds. Holder is required for use with beam condenser.

Beam Condenser Replacement PartsP A R T N U M B E R D E S C R I P T I O N

031-2020 Non-Adjustable Sample Position

Notes: For options not listed here, please contact PIKE Technologies.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

74


Transmission Sampling Transmission sampling techniques may be applied

to a very wide range of sample types including

liquids, solids and gases. Application of automation

technology to traditional transmission sampling

can improve sample throughput and improve

sampling precision.

Transmission Sampling TechniquesTheory and Applications

Page 103

Liquid CellsFor comprehensive liquids sampling

Page 80

Dies, Presses, Grinders and AccessoriesFor comprehensive solids analysis

Page 87

Holders, Windows and Polishing KitFor optimizing transmission sampling

Page 94

Short-Path, Long-Path, and Heated Gas CellsFor comprehensive gas sampling

Page 99

Automated Vertical AccessoriesMulti-SamplIR™ and RotatIR™

Page 76

Automated Horizontal Multi-Sample SystemHigh capacity sampling

Page 78

X, Y AutosamplerFor high throughput micro-titer format sampling

Page 79

Transmission Multi-SamplIR –Automated In-Sample Compartment Accessory

The PIKE Technologies Transmission Multi-SamplIR accessory isdesigned to speed FTIR analysis. The accessory accommodates upto 18 samples (depending on sampling plate configuration) forunattended analysis. Flexible test sequences are easily definedand automatically implemented. This Multi-SamplIR is ideal foranalyzing a wide range of materials, including films, slides, pellets,windows and large area samples like multilayer coated substrates.

Samples are conveniently mounted onto a sampling plateand held in place during the analysis. The plates can be configuredfor different sample quantities, types and geometries. The systemcan be set to perform automated mapping of the sample, producingtransmission spectra as a function of position. Sampling platesare easily mounted on the support ring with spring-loaded clips,ensuring that the plate remains precisely located and correctlyregistered. The support ring mounts on the accessory’s drive andis rotated and translated laterally through a distance of 75 mm toproduce an R-theta motion covering the entire sampling range ofthe accessory.

Each system incorporates two precision stepper motors forrotation and translation of the plate. The motors are driven bythe PIKE Motion Control Unit.

The operation is managed by PIKE Technologies AutoPROsoftware which provides full user programmability and easy tolearn “point-and-click” environment. Polar or X, Y coordinatesmay be used to define test points. AutoPRO software allows complex test sequences to be set up, stored as methods andimplemented with full flexibility. The Motion Control Unit incorporates a smart power supply and works with 85-265 VAC,47-63 Hz power lines.

The Transmission Multi-SamplIR accessory is designed to fitmost FTIR spectrometers. Please contact us for more product details.

76

F E AT U R E S O F T H E M U LT I - S A M P L I R

• In-compartment automated transmission sampling

• Selectable number of samples, size, configuration and placement

• Multiple point analysis on single sample

• Custom sampling plates and blanks

• Fully automated and manual versions available


Transmission Multi-SamplIR (select one)P A R T N U M B E R D E S C R I P T I O N

074-26XX Automated Transmission Multi-SamplIR for FTIRIncludes: AutoPRO Software and a Motion Control Unit (85-265 VAC), and a Standard Sampling Plate for 13 mm pellets (18 positions)

Notes: This accessory requires a minimum FTIR beam height of 3.5". Insert FTIRcode found on fold-out on last page of this catalog.

Transmission Multi-SamplIR OptionsP A R T N U M B E R D E S C R I P T I O N

074-3661 Additional Standard Sampling Plate

Notes: If you need options not described here, please contact us.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

RotatIR – Automated Rotating Sample Stage

The PIKE Technologies RotatIR is designed for automated selectionof the angle of transmission of the sample relative to the IR beamin the FTIR sample compartment. Applications include the studyof sample thickness and sample reflectivity. Selection of the angle of transmission is automated through the use of PIKE TechnologiesAutoPRO software, the Motor Control Unit and the integratedstepper motor. A full set of spectra may be collected automaticallyby pre-defining the angles from AutoPRO software.

The RotatIR features a standard 2" x 3" slide mount for easypositioning of different types of transmission sample holders.

AutoPRO software is written in Visual BASIC and allows complextest sequences to be setup, stored as methods and implementedwith full flexibility. The Motion Control Unit incorporates a smartpower supply and works with 85-265 VAC, 47-63 Hz power lines.

The PIKE RotatIR accessory is designed to fit most FTIR spectrometers. Please contact us for more product details.

77

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

S

F E AT U R E S O F T H E R O TAT I R

• Automated selection of angle of sample transmission

• Programmable from 0 to 360 degrees with resolution of 0.2 degrees

• Automated collection of spectra at the defined angle of transmission via AutoPRO software

• Compatible with most FTIR systems

AutoPRO software provides interface for automated collection of spectral data


RotatIR Automated Rotating Sample StageP A R T N U M B E R D E S C R I P T I O N

091-20XX RotatIR Automated Rotating Sample StageIncludes: AutoPRO Software and a Motion Control Unit (85-265 VAC)

Notes: Insert FTIR XX code found on the fold-out on the last page of this catalog.

RotatIR OptionsP A R T N U M B E R D E S C R I P T I O N

162-5400 Film Sampling Card – 20 mm clear aperture, 10 each

Notes: If you need options not described here, please contact us.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

78

Automated Horizontal Transmission Accessories – For Films or Pellets

PIKE Technologies offers Automated Horizontal TransmissionAccessories for increasing sample throughput for analysis of filmsand pellet samples.

The Automated Horizontal Transmission Accessories are available in an 8" or a 12" version depending upon sample loadingrequirements. The 8" version will accommodate up to 37–25 mmdiameter samples. The 12" version will accommodate up to 83–25 mm diameter samples. PIKE Technologies custom manufacturessampling plates to meet your exact sampling needs. Please contactus for other configurations.

Both the 8" and 12" versions of the Automated HorizontalTransmission Autosamplers also can do specular reflection analysisif your applications require.

PIKE Technologies Automated Horizontal TransmissionAccessories are compatible with most FTIR spectrometers.

F E AT U R E S O F T H E A U T O M AT E D H O R I Z O N TA L

T R A N S M I S S I O N A C C E S S O R Y

• Fully automated transmission analysis of polymer films,pellets or other transmission samples for FTIR

• Standard specular reflectance sampling

• Sampling capacity of up to 114 samples, depending upon size

• Continuous operation with multiple plates

• Purgeable optical design for high quality FTIR spectra

The PIKE Autosamplers are controlledby AutoPRO software, with a point-and-click user environment to definesampling positions



075-28XX Automated 8" Horizontal Transmission AccessoryIncludes: Motion Control Unit (85-265 VAC), AutoPRO Software and one 83 Position Sampling Plate

076-28XX Automated 12" Horizontal Transmission AccessoryIncludes: Motion Control Unit (85-265 VAC), AutoPRO Software and one 91 Position Sampling Plate

Notes: Please select XX code from the fold-out on the last page of this catalog.

OptionsP A R T N U M B E R D E S C R I P T I O N

075-3881 Additional Sampling Plate for 8" Automated Horizontal Transmission Accessory

076-3881 Additional Sampling Plate for 12" Automated HorizontalTransmission Accessory

Notes: For options not shown here, please contact PIKE Technologies.

79

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

S

X, Y Autosampler – Transmission and Reflectance Automated Sampling in Microplate Format

The PIKE Technologies X, Y Autosampler is designed around standard24, 48 or 96 well microplate architectures – ideal for high efficiencysample loading and FTIR analysis. Applications include highthroughput analysis of liquid residues and chemical reactions,powdered samples and automated diffuse reflectance analysis.The X, Y Autosampler is available in standard all reflecting opticsand with gold-coated optics for highest performance mid-IR andoptimized NIR sampling.

The autosampler features anX, Y stage with both axes drivenby high precision stepper motorsfor speed and reproducibility.Programming and control of theX, Y Autosampler is done throughPIKE Technologies AutoPRO soft-ware, and is compatible with current FTIR systems.

The optical design is basedupon a precision ellipsoidalreflector and the size of the spot illuminated at the sample isapproximately 2 mm – ideal for up to 96 well configurations.

PIKE Technologies has developed a special silicon well plateexcellent for transmission analysis. This unique 96 well plate provides full mid-IR transmission spectra and is sufficientlydurable for extended usage. For diffuse reflection measurements,a cavity style plate with standard format placement of samples isavailable. Please contact us for other configurations.

The quality of FTIR spectra collected on the X, Y Autosampleris excellent – shown in the spectra below for solvent residue samples.

F E AT U R E S O F T H E X , Y A U T O S A M P L E R

• Complete hardware and software package for automatedanalysis of industry standard 24, 48, or 96 well plates.Special plate configurations are available.

• Diffuse reflectance of powdered samples or specularreflectance sampling for reaction residues

• Gold-coated optics version for highest performance mid-IRand NIR sampling

• Optional transmission sampling with integrated detector andtransmission sampling plates

• In-compartment location, purgeable optical path

Automated analysis of solvent residues in the transmission sampling mode



047-20XX X, Y Autosampler – Diffuse Reflectance ConfigurationIncludes: Motion Control Unit (85-265 VAC), AutoPRO Software and 96 Well Diffuse Reflectance Sampling Plate

047-60XX X, Y Autosampler – Diffuse Reflectance Configuration with Gold-Coated OpticsIncludes: Motion Control Unit (85-265 VAC), AutoPRO Softwareand 96 Well Diffuse Reflectance Sampling Plate

073-90XX X, Y Autosampler – Diffuse Reflectance/Transmission ConfigurationIncludes: Motion Control Unit (85-265 VAC), AutoPRO Software, integrated DLaTGS detector for transmissionanalysis, 96 Well Diffuse Reflectance Sampling Plate and 96 Well Transmission Sampling Plate

073-60XX X, Y Autosampler – Diffuse Reflectance/TransmissionConfiguration with Gold-Coated OpticsIncludes: Motion Control Unit (85-265 VAC), AutoPRO Software,integrated InGaAs detector for transmission analysis, 96 WellDiffuse Reflectance Sampling Plate and 96 Well TransmissionSampling Plate

Notes: Replace XX in part number with code for your spectrometer model found onthe last page of this catalog. An InGaAs detector is an option for 073 versions of theAutosampler. Your FTIR spectrometer must be capable of interfacing with an externaldetector. For other options for reflection or transmission well plates, please contact us.

X,Y Autosampler OptionsP A R T N U M B E R D E S C R I P T I O N

073-9110 96 Well Diffuse Reflectance Sampling Plate

073-9130 96 Well Transmission Sampling Plate

X, Y AUTOSAMPLER SPEC IF ICAT IONS

Optics Elliptical – 3X Beam Demagnification

Resolution 13 microns per step

Accuracy 25 micrometers per cm

Backlash < 75 micrometers

Press-On Demountable Cell – For Viscous Liquids and Mulls

The PIKE Technologies Press-On Demountable Liquid Cell is recommended for fast and convenient qualitative analysis of viscous liquids and mull samples. Simply spot the sample onto the middle of the transparent IR window and slip the second window over the top. The windows are conveniently held in placeby the friction fit of the Demountable Cell Holder. The Press-OnDemountable Cell is available in 2 sizes – 25 mm and 32 mm andhas optional Teflon spacers to assist with sampling pathlength. Awide variety of window types and spacer pathlengths are availableto cover mid-IR, NIR, and far-IR spectral regions and sample composition from organic to aqueous.

The PIKE Technologies Press-On Demountable Liquid Cell isdesigned with a standard 2" x 3" plate for use with all FTIR spectrometers.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

80

FEATURES OF THE PRESS-ON DEMOUNTABLE CELL

• Flexible window selection for optimizing spectral range and sample compatibility

• Demountable cell design for optimal cleaning of difficult samples

• Compatible with all FTIR spectrometers


Press-On Demountable Liquid Cell HoldersP A R T N U M B E R D E S C R I P T I O N

162-3600 Press-On Demountable Liquid Cell Holder for 25 mm WindowsIncludes: cell holder, and o-ring

162-3610 Press-On Demountable Liquid Cell Holder for 32 mm WindowsIncludes: cell holder, and o-ring

Press-On Demountable Liquid Cell Windows (select minimum of 2)P A R T N U M B E R

D E S C R I P T I O N 2 5 X 4 M M 3 2 X 3 M M

BaF2 160-1217 160-1147

CaF2 160-1211 160-1143

Ge 160-1138 160-1137

KBr 160-1133 160-1132

KRS-5 160-1127 160-1126

NaCl 160-1124 160-1122

Polyethylene 160-5214 160-5216

Si 160-1116 160-1159

ZnSe 160-1114 160-1113

Notes: For window compatibility please consult the Materials Properties informationon page 105 of this catalog. For additional window selections please see the windowspage of this catalog.

Press-On Demountable Liquid Cell Spacers (Optional)P A R T N U M B E R

P A T H L E N G T H ( M M ) 2 5 M M 3 2 M M

0.015 162-1110 162-1210

0.025 162-1120 162-1220

0.050 162-1130 162-1230

0.100 162-1140 162-1240

0.200 162-1150 162-1250

0.500 162-1160 162-1260

1.000 162-1170 162-1270

Assortment 162-1190 162-1290

Notes: Spacer pathlength packages above include 12 each of the spacers. The assortment package includes 2 each of the different pathlengths.

Press-On Demountable Liquid Cell Replacement PartsP A R T N U M B E R D E S C R I P T I O N

162-3621 Viton® O-Rings, 25 mm (12 each)

162-1330 Viton O-Rings, 32 mm (12 each)

Notes: For other options for the Press-On Demountable Liquid Cell, please contactPIKE Technologies.

Demountable Liquid Cells – For Versatile Pathlength Liquid Sampling

The PIKE Technologies Demountable Liquid Cell is ideal for qualitativeand quantitative analysis of liquid samples where it is desirableto optimize the pathlength for varying samples. Furthermore theDemountable Liquid Cell is well suited for samples where it isuseful to disassemble the cell for cleaning. A wide variety of window types and spacer pathlengths are available. Window typesare available to cover mid-IR, NIR, and far-IR spectral regions andsample composition from organic to aqueous.

The PIKE Technologies Demountable Liquid Cell is designedwith a standard 2" x 3" plate for use with all FTIR spectrometers.The needle plate includes Luer-Lok™ fittings for easy syringe filling of the sample. The window size is 32 x 3 mm and the clear aperture of the cell is 13 mm.

81

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

S

FEATURES OF THE DEMOUNTABLE LIQUID CELL


• Flexible pathlength to optimize sample absorbance



• Heated version available (see page 84)

Demountable liquid cell assembly layout


Demountable Liquid Cell Holder P A R T N U M B E R D E S C R I P T I O N

162-1100 Demountable Liquid Cell HolderIncludes: cell holder, gaskets, and one complete set of spacers – select windows below

Notes: Requires selection of windows – below. Please select 2 syringes below for filling the demountable liquid cell.

Demountable Liquid Cell Windows (must select minimum of 1 Plain and 1 Drilled)

P A R T N U M B E R

D E S C R I P T I O N P L A I N D R I L L E D

BaF2 160-1147 160-1146

CaF2 160-1143 160-1142

Ge 160-1137 160-1136

KBr 160-1132 160-1131

KRS-5 160-1126 160-1125

NaCl 160-1122 160-1121

Polyethylene 160-5216 160-5215

Si 160-1159 160-1158

ZnSe 160-1113 160-1112

Notes: Above windows are 32 x 3 mm disks. For window compatibility please consultthe Materials Properties information on page 105 of this catalog. For additional window selections please see page 96.

Demountable Liquid Cell Spacers (Optional)P A T H L E N G T H ( M M ) P A R T N U M B E R

0.015 162-1210

0.025 162-1220

0.050 162-1230

0.100 162-1240

0.200 162-1250

0.500 162-1260

1.000 162-1270

Assortment 162-1290

Notes: Spacer pathlength packages above include 12 each of the spacers. Theassortment package includes 2 each of the different pathlengths.

Demountable Liquid Cell Replacement PartsP A R T N U M B E R D E S C R I P T I O N

162-1104 Demountable Liquid Cell Needle Plate

162-1300 Teflon Stoppers for Needle Plate (12 each)

162-1310 Teflon Gaskets (12 each)

162-1320 Teflon O-Rings (12 each)

161-0520 Glass Syringe, 1 mL



Notes: For other options for the Demountable Liquid Cell, please contact PIKETechnologies.

Super-Sealed Liquid Cells – For Precision, Fixed Pathlength Liquid Sampling

The PIKE Technologies Super-Sealed Liquid Cells are ideal forquantitative analysis of liquid samples, especially where precise,reproducible pathlength is required.

The PIKE Technologies Super-Sealed Liquid Cells are designedto be leak-proof for long-lasting sampling and cost efficiency. TheSuper-Sealed Liquid Cells are amalgamated, further sealed withepoxy, and held firmly within the standard 2" x 3" slide mount cardcompatible with all FTIR spectrometers. The PIKE TechnologiesSuper-Sealed Liquid Cells include Luer-Lok fittings for easy syringefilling of the sample. The clear aperture of the assembled cell is 13 mm.

The PIKE Technologies Super-Sealed Cells are available in awide variety of window materials and sampling pathlengths.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

82


Super-Sealed Liquid Cells – Window Options (select 1 or more)

FEATURES OF THE SUPER-SEALED LIQUID CELL

• Permanently mounted cell with fixed pathlength to provide maximum reproducibility of sample absorbance


• Full range of cell pathlengths for optimized quantitative measurements


Path (mm) 0.015 0.025 0.050 0.10 0.15 0.20 0.50 1.0 5.0 10.0

Volume (mL) 0.054 0.090 0.18 0.36 0.54 0.72 1.8 3.6 18 36

BaF2 162-1640 162-1641 162-1642 162-1643 162-1649 162-1644 162-1645 162-1646 162-1647 162-1648

CaF2 162-1630 162-1631 162-1632 162-1634 162-1635 162-1636 162-1633 162-1637 162-1638 162-1639

CsI 162-1680 162-1681 162-1682 162-1683 162-1689 162-1684 162-1685 162-1686 162-1687 162-1688

KBr 162-1620 162-1621 162-1622 162-1623 162-1624 162-1625 162-1626 162-1627 162-1628 162-1629

KRS-5 162-1660 162-1661 162-1662 162-1663 162-1669 162-1664 162-1665 162-1666 162-1667 162-1668

NaCl 162-1610 162-1611 162-1612 162-1613 162-1614 162-1615 162-1616 162-1617 162-1618 162-1619

SiO2 162-1609 162-1601 162-1602 162-1603 162-1609 162-1604 162-1605 162-1606 162-1607 162-1608

ZnSe 162-1650 162-1651 162-1652 162-1653 162-1659 162-1654 162-1655 162-1656 162-1657 162-1658

ZnS 162-1670 162-1671 162-1672 162-1673 162-1679 162-1674 162-1675 162-1676 162-1677 162-1678

Notes: All PIKE Technologies Super-Sealed Cells include Teflon stoppers. Please select 2 syringes (below) for filling the Super- Sealed Cell.

Super-Sealed Liquid Cell Replacement PartsP A R T N U M B E R D E S C R I P T I O N

162-1300 Teflon Stoppers (12 each)




Notes: For other options please contact PIKE Technologies.

The PIKE Technologies Long-Path Quartz Liquid Cells are ideal forthe quantitative analysis of hydrocarbons in water and soil samplesor for the analysis of additive content in polymers after extraction.Sample extracts are easily transferred to the quartz cells forinfrared analysis. Pathlengths ranging from 10 mm to 100 mmare available for optimization of the sample absorbance. The cells are manufactured of special grade IR quartz which is fullytransparent in the hydrocarbon absorbance region. The quartzcells are compatible with organic and aqueous solvents and aresuitable for use with new D7066-04 ASTM method. A 2" x 3" slidemount holder is available for the cells.

83

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

S

Spectrum of 10 mm Long-Path Quartz Cell


Long-Path Quartz Liquid CellsP A R T N U M B E R D E S C R I P T I O N

162-1801 Long-Path Quartz Cell, 10 mm




Notes: Cells include Teflon stoppers. Select slide sample holder below.

Long-Path Quartz Liquid Cell Parts and Sampling OptionsP A R T N U M B E R D E S C R I P T I O N

161-2530 Slide Sample Holder, Quartz Cell, 10 – 20 mm

161-2540 Slide Sample Holder, Quartz Cell, 50 mm

161-2550 Slide Sample Holder, Quartz Cell, 100 mm

Notes: Please contact PIKE Technologies for replacement Teflon stoppers and itemsnot described on this list.

Long-Path Quartz Liquid Cells – For Analysis of Hydrocarbon Content and Related Measurements

F E AT U R E S O F T H E L O N G - PAT H Q U A R T Z

L I Q U I D C E L L S

• For the analysis of hydrocarbon content of water, soil, andother environmental samples

• For analysis of polymer additives after extraction

• Highest quality quartz cells for clear infrared spectral transmission and optimized result

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

84

The PIKE Technologies mid-IR Falcon accessory is recommendedfor qualitative and quantitative analysis of liquids where it is necessary to control the temperature of the sample. Temperaturerange of the accessory is 5 °C to 105 °C with +/- 0.5% accuracy.Heating and cooling is controlled by a built-in Peltier device providing for reproducible ramping and for reaching target temperatures quickly and reliably. The system is driven by aDigital Temperature Controller – directly, or via PC.

A wide variety of window types and spacer pathlengths areavailable for this product. Windows offered cover mid-IR, NIR, andfar-IR spectral regions and sample compositions from organic toaqueous. A complete heatable transmission cell set-up for usewith the mid-IR Falcon accessory consists of two 32 mm x 3 mmsize windows (drilled and undrilled), a spacer, the needle platewith Luer-Lok fittings, two gaskets and a proprietary cell mount.

The full Falcon configuration requires the accessory base withcell holder, user selected windows, and one of the available temperature controllers. The Falcon accessory is compatible withmost brands of FTIR spectrometers.

FEATURES OF THE FALCON MID-IR ACCESSORY

• Peltier temperature control from 5 °C to 105 °C

• Wide selection of windows for optimizing spectral range andsample compatibility

• Flexible pathlength to control sample absorbance


• Available for most FTIR spectrometersO R D E R I N G I N F O R M AT I O N

Falcon Mid-IR Transmission AccessoryP A R T N U M B E R D E S C R I P T I O N

111-40XX Mid-IR Falcon Base with Cell HolderIncludes: Temperature controlled base, demountable cell, gaskets, and one complete set of spacers. Select windowsand the Digital Temperature Controller from the tables on the next page for complete system.

Notes: Please insert XX code found on the fold-out on the last page of this catalog.Please select 2 syringes (next page) for filling the demountable liquid.

Temperature ControllersP A R T N U M B E R D E S C R I P T I O N

076-1230 Digital Temperature Control Module for Falcon Accessory

076-1430 Digital Temperature Control Module, PC Control for Falcon Accessory

Notes: Digital Temperature Control Module is required to control temperature viaPC and includes PIKE TempPRO software.

Falcon Mid-IR Transmission Accessory – For Precise Temperature Control of Demountable Liquid Cells

FALCON MID- IR TRANSMISS ION ACCESSORY SPEC IF ICAT IONS

Temperature Control Peltier (cooling and heating)

Temperature Range 5 °C to 105 °C

Accuracy +/- 0.5%


Temperature Controllers




Output Voltage Variable 3–15 VDC/50 W max.

Dimensions width 120 mm, depth 175 mm, height 90 mm (without FTIR baseplate and mount)

Notes: Peltier device must be water cooled for proper operation – this is achievedby running cold tap water through the water jacket integrated into the accessoryshell, or by the use of an external liquid circulator.

85

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

S

Demountable Liquid Cell Windows (must select minimum of 1 Plain and 1 Drilled)

P A R T N U M B E R

D E S C R I P T I O N P L A I N D R I L L E D

BaF2 160-1147 160-1146

CaF2 160-1143 160-1142

Ge 160-1137 160-1136

KBr 160-1132 160-1131

KRS-5 160-1126 160-1125

NaCl 160-1122 160-1121

Si 160-1159 160-1158

ZnSe 160-1113 160-1112

Notes: Above windows are 32 x 3 mm disks. For window compatibility please consult the Materials Properties information on page 105 of this catalog. For additional window selections please see the windows page of this catalog.

Demountable Liquid Cell Spacers (Optional)D E S C R I P T I O N P A R T N U M B E R

0.015 mm 162-1210

0.025 mm 162-1220

0.050 mm 162-1230

0.100 mm 162-1240

0.200 mm 162-1250

0.500 mm 162-1260

1.000 mm 162-1270

Assortment 162-1290

Notes: Spacer pathlength packages above include 12 spacers. The assortment packageincludes 2 each of the different pathlengths.

Demountable Liquid Cell Replacement PartsP A R T N U M B E R D E S C R I P T I O N

162-1600 Demountable Liquid Cell for the mid-IR Falcon Accessory

162-1104 Demountable Liquid Cell Needle Plate

162-1300 Teflon Stoppers for Needle Plate (12 each)

162-1310 Teflon Gaskets (12 each)

162-1320 Teflon O-Rings (12 each)




Notes: For other options for the Demountable Liquid Cell, please contact PIKE Technologies.


PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

86

Falcon NIR Transmission Accessory – Quantitative and QualitativeAnalysis of Liquids under Precise Temperature Control

The PIKE Technologies NIR Transmission Accessory is an excellentchoice for quantitative and qualitative analysis of liquid samplesin the NIR spectral region. Temperature range of the accessory is5 °C to 105 °C with +/- 0.5% accuracy. Heating and cooling is controlled by a built-in Peltier device. The Peltier element providesfor reproducible ramping and for reaching target temperaturesquickly and reliably. The system is driven by a Digital TemperatureController – directly, or via PC.

Individual sample holders are designed to accommodatestandard 5 mm, 8 mm and 12 mm glass vials and 1 cm cuvettes.Sample Holders are pin positioned to ensure maximum reproducibility.

The complete NIR Falcon configuration requires the accessorybase, cell holder, and one of the available temperature controllers.The Falcon accessory is compatible with most brands of FTIRspectrometers.

F E AT U R E S O F T H E FA L C O N N I R A C C E S S O R Y

• Fast, easy quantitative and qualitative analysis of samplesunder precise Peltier temperature control

• Choice of cuvette and vial adapters

• Compatible with disposable 5 mm vials

• Excellent thermal accuracy and precision

• Available for most FTIR spectrometers


Heated NIR Transmission Accessory P A R T N U M B E R D E S C R I P T I O N

110-60XX NIR Falcon Base Includes: Temperature controlled base. Digital Temperature Controller and sample holder need to be selected from the tables below for complete system.

Notes: Please insert XX code found on the fold-out on the last page of this catalog.



076-1430 Digital Temperature Control Module PC Control

Notes: Digital Temperature Control Module is required to control temperature viaPC and includes PIKE TempPRO software.

Sample Holders (must select one)P A R T N U M B E R D E S C R I P T I O N

111-3610 5 mm Vial Holder



111-3640 1 cm Cuvette Holder

Falcon NIR Accessory OptionsP A R T N U M B E R D E S C R I P T I O N

162-0205 5 mm Disposable Glass Vials, 6 mm x 50 mm (200/pk)

162-0208 8 mm Glass Vials (200/pk)


162-0255 Falcon 1 cm Quartz Cuvette

Notes: Please see more cuvette options on page 116.

NIR transmission spectra of cooking oils in 8 mm glass vials measuredat 32 °C with the Falcon NIR Transmission Accessory

FALCON NIR TRANSMISS ION ACCESSORY SPEC IF ICAT IONS



Accuracy +/- 0.5%






Output Voltage Variable 3–15 VDC/50 W max.

Dimensions width 120 mm, depth 175 mm, height 90 mm (without FTIR baseplate and mount)


The PIKE Technologies Bolt Press and Hydraulic Die are low-costtools for making KBr pellets for transmission FTIR analysis.

The press and die consist of a stainless steel barrel with twohardened and polished 13 mm rams. The barrels are equippedwith a fitting which allows evacuation of air while the pellet isformed. For the Bolt Press, the pressure is applied to the sampleby tightening the bolts against each other with standard 15/16"wrenches – included. For the Hydraulic Die the pressure isapplied to the sample by placing in a hydraulic press – up to10,000 psi. Once a clear pellet is formed, the rams are removedand the sample is analyzed while still in the barrel (barrel is placeddirectly in the beam using the Press Holder with a standard 2" x 3" slide mount). Both accessories form a 13 mm pellet.

The PIKE Technologies Bolt Press and Hydraulic Die are bothequipped with a holder for your FTIR sample compartment.

87

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

S

Bolt Press & Hydraulic Die – Low-Cost Pellet Preparation


Pellet PressP A R T N U M B E R D E S C R I P T I O N

161-2500 Bolt Press for 13 mm pellets

161-3500 Hydraulic Die for 13 mm pellets

Notes: The Bolt Press includes evacuable barrel, 2 anvil bolts, 2 15/16" wrenches,and Bolt Press Holder. The Hydraulic Die includes evacuable barrel, 2 rams andHydraulic Die Holder. The maximum force limit 5 ton.

Pellet Press Options and Replacement PartsP A R T N U M B E R D E S C R I P T I O N

160-8010 KBr Powder, 100 g

161-5050 Agate Mortar and Pestle, 50 mm

161-2511 Wrench Set for Bolt Press (2 ea.)

161-2520 Bolt Press Holder

Notes: For other options for the Pellet Presses, please contact PIKE Technologies.

Hand Press – For Making Smaller Pellets

The PIKE Technologies Hand Press is an ideal solution for labora-tories that require only occasional preparation of KBr pellets andcannot justify the expense of a hydraulic press.

The Hand Press is an efficient, reliable and inexpensive toolwhich simplifies making small pellets. It consists of a long stainlesssteel barrel and movable stage controlled by a lever capable ofapplying high pressure to the KBr/powder mixture. The HandPress comes complete with three standard die sets (7, 3 and 1 mm).The pellet preparation involves loading of the powdered sampleinto the die chamber, placement of the upper anvil in the press andapplication of hand pressure to the lever (this is sufficient to provideclear, high quality KBr disks). The Die Collar with the formed pelletis removed from the press and in most cases it can be placeddirectly in the beam of the spectrometer for analysis. The HandPress is equipped with a platen position dial for adjustment ofthe force applied to the die and reproducible sample preparation.


Hand Press P A R T N U M B E R D E S C R I P T I O N

161-1100 Hand Press for 7 mm, 3 mm, and 1 mm pelletsIncludes: 7 mm, 3 mm, and 1 mm die sets, anvils, die collars, anvil ejectors and Dual Pellet Holder

Hand Press Options and Replacement PartsP A R T N U M B E R D E S C R I P T I O N

161-5700 Dual Pellet Holder for 7 mm, 3 mm, and 1 mm pellets

161-1018 Single Pellet Holder for 7 mm pellets

160-8010 KBr Powder, 100 g


161-1027 Hand Press Body

161-1028 1 mm die set

161-1024 3 mm die set

161-1010 7 mm die set

Notes: For other options for the Hand Press, please contact PIKE Technologies.

Evacuable Pellet Press – For Preparation of High Quality Pellets

The PIKE Technologies Evacuable Pellet Press is the preferredaccessory for making pellets for FTIR analysis. Preparation of KBr pellets with a 13 mm die and a hydraulic press is the mostpopular method used for generation of samples for transmissionmeasurements. It is also required by a number of standardizedprocedures, including some USLP and ASTM methods. The advantagesof this approach include the generation of high quality pellets,reproducibility, and the ability to deal with relatively difficult samples, thanks to a wide range of pressures available. The PIKEEvacuable KBr Die Kit features the following components: a stainlesssteel base with vacuum outlet, the main die block with a 13 mmcylinder, two anvils and a plunger. All components are made ofhardened stainless steel and surfaces that come in contact withthe sample are highly polished. Two O-rings are used to seal thebase/die assembly and the plunger.

Pellet preparation involves placement of the anvil in the diechamber and covering it up with the pre-measured amount ofKBr/sample mix.

The sample is covered with the second anvil and theplunger is inserted into thechamber. The entire assemblyis placed in a hydraulic pressand compressed (a vacuumline can be connected to thebase to remove moisture fromthe sample). For analysis, theformed pellet is ejected fromthe die with an extractor andmounted onto a standard 2" x 3" sample holder.

The PIKE TechnologiesEvacuable Pellet Press comescomplete with anvils and vacuum connector.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

88

F E AT U R E S O F T H E E VA C U A B L E P E L L E T P R E S S

• Ideal for making high-quality KBr pellets

• Apply up to 20,000 lbs. (9,071 kg) of pressure

• Evacuable to prevent cloudy pellets

• Requires hydraulic press

Evacuable pellet press assembly layout


Evacuable Pellet PressP A R T N U M B E R D E S C R I P T I O N

161-1900 Evacuable Pellet Press for 13 mm pelletsIncludes: Die Block, Anvils and pellet extracting tool.

Evacuable Pellet Press Options and Replacement PartsP A R T N U M B E R D E S C R I P T I O N

160-8010 KBr Powder, 100 g



162-5410 Sample Card – for 13 mm pellets (10 each)

161-1908 Pellet Extracting Tool

161-1903 Anvils (2 each) for PIKE Evacuable Pellet Press

161-1906 Piston O-Rings (2 each)

161-1907 Base O-Rings (2 each)

430-1110 Vacuum Pump, 110V


Notes: For other options for the Evacuable Pellet Press, please contact PIKE Technologies.

89

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

S

Heated Platens Accessory – For Making Thin Films of PolymericSamples for Transmission FTIR Analysis

The PIKE Heated Platens Accessory is designed to efficiently make thin films of polymer materials for infrared transmissionspectroscopy. Thin films are easily made from pellets or otherplastic sample forms.

Typically a 2-5 milligram portion of polymer is cut from thepellet or other plastic sample and placed between aluminumdisks within the heated base of the platens. The temperature ofthe platens is chosen to match the melting point of the polymermaterial. The top plate of the heated platens accessory is placedover the assembly and the unit is placed into the hydraulic press.A low force (2 tons) is generally applied to the sample in the heatedplatens accessory to make excellent films.

The PIKE Heated Platens Accessory includes insulating disksto maintain the desired temperature set point when making thinpolymer films. The insulating disks improve the quality of thinfilms, by making them more IR transmissive and thereby improving

the quality of the spectra produced from the pressed films. This isachieved by holding the temperature at the melting point of thepolymer during the film making process. Flattening the polymerbelow its melting point produces a cloudy film. Pressing the polymer film when it is above its melting point may cause polymer degradation.

The PIKE Heated Platens Accessory is compatible with the PIKECrushIR™ Hydraulic Press and other hydraulic presses (please inquire).


PIKE Heated Platens AccessoryP A R T N U M B E R D E S C R I P T I O N

181-2000 PIKE Heated Platens Accessory

Notes: The heated platens accessory includes spacer set, thermal insulating disks,cooling chamber, aluminum disks and magnetic film holder. Requires selection oftemperature controller below.

Temperature Controller for Heated Platens (must select) P A R T N U M B E R D E S C R I P T I O N


Notes: The digital temperature controller is required for operation of the HeatedPlatens Accessory.

Options and Replacement Parts (optional) P A R T N U M B E R D E S C R I P T I O N

181-3000 Spacer Set (15, 25, 50, 100, 250, 500 microns)

181-3020 Aluminum Disks, 50 each

181-3010 Spacer, 15 micron







F E AT U R E S O F T H E H E AT E D P L AT E N S A C C E S S O R Y

• Fast, efficient means of making thin films for transmissionspectroscopy

• Temperature range – ambient to 300 ºC

• Standard stainless steel spacer set (15, 25, 50, 100, 250 and500 microns all with 25 mm ID) included with accessory

• Integral design for easy insertion and removal of heatedplatens into the hydraulic press

• Included insulating disks to minimize heat loss during film pressing

• Standard cooling chamber included with accessory

Transmission Spectrum of Thin Film of high-density polyethylene (HDPE)produced from PIKE Heated Platens Accessory

HEATED PL ATENS ACCESSORY SPEC IF ICAT IONS

Composition Stainless steel platens, mirrored surfaces

Temperature Range Ambient to 300 ºC

Temperature Stability Insulated, < 3 ºC loss at 125 ºC set pointduring press of film




Heating Time Ambient to 100 ºC, less than 7 minutes

Cooling Chamber Standard, conduction via liquid circulation (not supplied)

Pressing Height 3.3 cm

Spacer Thickness 15, 25, 50, 100, 250 and 500 microns

Spacer ID 25 mm

Dimensions 26.4 cm long, 6.4 cm wide, 5.2 cm high

Maximum Force 10 US tons

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

90

CrushIR – Digital Hydraulic Press

PIKE Technologies introduces a new and advanced hydraulic pressfor making excellent quality KBr pellets for transmission FTIRanalysis. The CrushIR™ provides excellent reproducibility with itscombination of digital pressure reading and adjustable maximumpressure setting thus preventing damage to the pellet die.

The new PIKE CrushIR includes a transparent protective shieldmaking it safe for operation in a busy laboratory environment.Access for vacuum hose and other utilities is made through a portin the rear of the press.

The adjustable top screw provides flexibility for die designs ofshort and longer dimensions yielding an open stand range from2" to 4.5" (5 to 11.5 cm). The efficient sized ram stroke of 0.45"(12 mm) and adjustment screw speeds pellet making by minimizingthe time required to achieve the desired force.

The PIKE Evacuable Pellet Press and 13 mm pellet holder arean excellent addition to the PIKE CrushIR. A packaged version ofthese 3 products is available in the list below.

All mechanical components of the press are enclosed in asafety metal cabinet. The access area is protected by a high-impactpolymer shield.


Hydraulic Press (select one)P A R T N U M B E R D E S C R I P T I O N

181-1100 PIKE CrushIR Hydraulic Press

181-1110 PIKE CrushIR Hydraulic Press, Evacuable Pellet Press and Magnetic Holder

181-1120 PIKE CrushIR Heated Platens Package

Notes: The PIKE CrushIR Hydraulic Press includes an integrated safety shield.Please specify voltage and country destination.

Hydraulic Press Options and Replacement Parts (optional) P A R T N U M B E R D E S C R I P T I O N

161-1900 Evacuable Pellet Press for 13 mm pellets

160-8010 KBr Powder, 100 g






F E AT U R E S O F T H E P I K E C R U S H I R

• Up to 15 ton of force

• Digital force readout for exceptional reproducibility

• Adjustable maximum force

• Small footprint

• Transparent safety shield

FTIR spectrum of caffeine in KBr pellet made using the PIKE CrushIRHydraulic Press and Evacuable Pellet Press

PIKE CRUSHIR SPEC IF ICAT IONS

Metric English

Clamp Force (max) 13.6 metric ton 15 US ton

Platen Size (round) 100 mm 3.94"

Ram Stroke 12 mm 0.45"

Range Die Size 5 – 11.5 mm 2" – 4.5"

Size (w x d x h) 30.5 x 24.9 x 34.3 cm 12 x 9.8 x 13.5"

Weight 44 kg 98 lbs.


Output Voltage 9 VDC/18 W

91

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

S

Auto-CrushIR – Programmable Hydraulic Press

The PIKE Auto-CrushIR microprocessor controlled automatedhydraulic press, introduces an element of consistency into hydraulicpress applications such as pellet and thin film making. Pressure andcorresponding hold time are easily entered through its integratedtouch-screen control panel. Up to five pressure hold time rampsmay be programmed and performed within a run. During operationthe force measurement is shown on the bright color display. The pressure is released automatically after the prescribed time.This level of control enhances the uniformity and quality of transmission samples.

The Auto-CrushIR hydraulic press is equipped with a transparentprotective safety shield. Vacuum and other utilities can be conve-niently connected to the panel located in the back of the unit.

The adjustable screw at the top of the press provides flexibilityfor short and tall die designs, yielding an open stand range from2 to 4.5" (5 to 11.5 cm). The optimal ram stroke of 0.45" (12 mm)and easy top screw adjustment speed-up pellet making by reducingtime required to achieve the desired force.

PIKE offers several products that may accompany the Auto-CrushIRincluding a pellet press and heated platens.


Auto-CrushIR Automated Programmable Hydraulic Press (select one)P A R T N U M B E R D E S C R I P T I O N

181-1300 PIKE Auto-CrushIR Hydraulic Press (110V)

181-1302 PIKE Auto-CrushIR Hydraulic Press (220V)

181-1310 PIKE Auto-CrushIR, with Evacuable Pellet Press, and Magnetic Holder (110V)

181-1312 PIKE Auto-CrushIR, with Evacuable Pellet Press, and Magnetic Holder (220V)

Hydraulic Press Options and Replacement Parts (optional) P A R T N U M B E R D E S C R I P T I O N

161-1900 Evacuable Pellet Press for 13 mm pellets

160-8010 KBr Powder, 100 g




181-2000 Heated Platen Accessory including 15, 25, 50, 100, 250, and 500 micron spacers

F E AT U R E S O F T H E P I K E A U T O - C R U S H I R

• Variable force from 1 to 15 US tons

• Microprocessor controlled, consistent and reproducible forceapplication for quality pellet making

• Easy to use touch-screen programming

• Small footprint

• Transparent safety shield

FTIR Spectrum of cocaine in KBr pellet made with PIKE Auto CrushIRProgrammable Hydraulic Press and Evacuable Pellet Press

PIKE AUTO-CRUSHIR SPEC IF ICAT IONS

Metric English

Clamp Force (max) 13.6 ton 15 US ton

Platen Size (round) 100 mm 3.94"

Ram Stroke 12 mm 0.45"

Range Die Size 5 – 11.5 mm 2" – 4.5"

Size (w x d x h) 35.6 x 29.2 x 34.3 cm 14.0 x 11.5 x 13.5”

Weight 36.3 kg 80 lbs.

Voltage 110 or 220 V, 110 or 220 V, 50-60 Hz 50-60 Hz

ShakIR Sample Grinder –For Optimized Sample Mixing

The ShakIR accessory provides a fast, simple and inexpensivemethod of mixing and grinding samples for diffuse reflectancesampling and in preparation for making KBr pellets. A smallamount of sample and the IR transparent diluent (typically KBr)are simply scooped into a vial with mixing ball. The ShakIRthoroughly mixes and pulverizes the sample within seconds. Thereciprocating motion of the vial holder follows a figure “8” path.The vial is swung through a 5° arc at high RPM, causing the ballto strike the end of the vial, which is sufficient to grind mostmaterials into a powder.

The accessory provides electronic control for precise andreproducible setting of grinding time up to 95 seconds. The protective shield provides security to grinder operation. The ShakIRconstruction and weight offer long-term, reliable operation, minimized vibration and noise.

The ShakIR offers a small footprint. The base is 14.4 cm x17.2 cm with a height of 27.3 cm.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

92

F E AT U R E S O F T H E S H A K I R S A M P L E G R I N D E R

• Produces finely powdered mix of sample and diluent – idealfor clear pellets and excellent diffuse reflectance spectra

• Minimizes exposure of sample to atmospheric moisture – a chief cause of cloudy pellets


Sample GrinderP A R T N U M B E R D E S C R I P T I O N

161-1070 ShakIR, Heavy Duty Sample Grinder, 110/220VIncludes mount for 1" vials

Sample Grinder Vials (required)P A R T N U M B E R D E S C R I P T I O N

161-1035 Stainless Steel Vial with Ball, 1" long x 0.5"

Options and Replacement Parts for Sample GrindersP A R T N U M B E R D E S C R I P T I O N

161-1037 Spare Stainless Steel Ball

160-8010 KBr Powder, 100 g

Sample Preparation Accessories – For Solids Materials Analysis (powders, mull agents, grinding tools and more)

Preparation of samples for FTIR analysis by diffuse reflection ortransmission analysis requires a number of tools and accessoriesfor convenient and high quality results. PIKE Technologies hasassembled these tools to make your FTIR sampling easier.

IR transparent powders and chunks, manual sample grindingtools with a complete selection of Agate Mortar and Pestle selectionand mulling agents are in stock and ready for immediate delivery.

93

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

S

FEATURES OF SAMPLE PREPARATION ACCESSORIES

• Accessories for analysis of solids by transmission and diffuse reflectance

• Materials for pellets and mulls


IR Transparent PowdersP A R T N U M B E R D E S C R I P T I O N

160-8010 KBr Powder, 100 g

IR Transparent ChunksP A R T N U M B E R D E S C R I P T I O N

160-8015 KBr Chunks, 100 g

Agate Mortar and PestlesP A R T N U M B E R D E S C R I P T I O N

161-5035 35 mm Agate Mortar and Pestle






Notes: The 50 mm Agate Mortar and Pestle is our most popular size and recommended for most applications.

Solids and Mulls SpatulasP A R T N U M B E R D E S C R I P T I O N

042-3035 Spatula – Spoon Style

042-3050 Spatula – Flat Style

Mulling AgentsP A R T N U M B E R D E S C R I P T I O N

161-0500 Nujol

161-0510 Fluorolube

Notes: For other options for Sample Preparation Tools, please contact PIKETechnologies.

Sample Holders – For Transmission FTIR Analysis of Pellets and Films

All PIKE Technologies transmission holders are constructed ofhigh quality materials and feature a 2" x 3" standard slide mountcompatible with all FTIR spectrometers.

The Universal Sample Holders feature a spring-loaded mechanism which conveniently keeps in place films, salt plates,KBr pellets and other materials. The clear aperture of the holderare 20 mm and 10 mm. This universal holder offers great samplemounting flexibility.

Heavy-Duty Magnetic Film Holder is designed to hold thickpolymer materials and other transmission samples. The holderfeatures a large size magnet and steel plate with a 20 mm aperture.

The Magnetic Film/Pellet Holder is used to mount KBr pellets and thin polymer films. Its components include a steel plateand flexible magnetic strip. The holder is designed to support 13 mm KBr pellets and films less than 0.5 mm thick.

The PIKE Technologies Sampling Cards are inexpensive sampleholders for analysis of films, polymers, 13 mm KBr pellets andother materials. Self-adhesive treated sides make sample preparationeasy. The cards also offer compact and convenient means of sample storage.

A Dual Pellet Holder for 1, 3 and 7 mm KBr pellets is available. The holder features semi- circular mounts with slotsaccommodating specified size pellets as made using the PIKETechnologies Hand Press.

The Single Pellet Holder for 7 mm KBr pellets is designedfor use with the PIKE Technologies Hand Press. If you just make 7 mm pellets, this version is more convenient than the DualPellet Holder.

Bolt Press and Gas Cell Holders – three different sizes areavailable. Each holder has detachable support rods for differentsized accessories. The holders can also be used for placing saltplates and other large samples.

Press-On Demountable Cell Holders are used for the analysisof smears and mulls. Available in 25 mm and 38 mm versions,both include mounting plates and pressure cups. Windows andspacers must be ordered separately.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

94



162-5600 Universal Sample Holder, 20 mm aperture*

162-5610 Universal Sample Holder, 10 mm aperture*

162-5500 Heavy-Duty Magnetic Film Holder



162-5410 Sample Card for 13 mm pellets (10 each)*

161-5700 Dual Pellet Holder*

161-1018 Single Pellet Holder

161-2520 Bolt Press Holder

162-2105 25 mm x 100 mm Gas Cell Holder




162-3600 Press-On Demountable Cell Holders for 25 mm windows

162-3610 Press-On Demountable Cell Holders for 32 mm windows

Notes: For other options for Sample Holders, please contact PIKE Technologies. Cellholders marked “*” fit all standard 2" x 3" slide mounts, but due to their heightmay not allow for a complete sample compartment door closure on some smallerspectrometers. Please consult PIKE Technologies before placing an order.


162-5611 25 mm O-Rings for Universal Sample Holder (6 each)

162-5612 10 mm O-Rings for Universal Sample Holder (6 each)

Universal Sample Holder Heavy-Duty Magnetic Film Holder

Magnetic Film/Pellet Holder Sampling Cards

Dual Pellet Holder Single Pellet Holder

Bolt Press and Gas Cell Holders Press-On Demountable Cell Holders

Disks, Windows and Powders – For Transmission FTIR Analysis of Solid and Liquid Samples

PIKE Technologies offer Premier Stock window and crystal materials – a carefully selected range of IR transparent materialsmost often used by IR spectroscopists. They fit PIKE accessoriesand cell holders available from other vendors. All windows, crystals and powders are made from the best quality material.The optical components are individually packaged and silica gel is included with those materials which are affected by humidity.The products highlighted in Red are in stock and available forimmediate delivery. Please refer to the next pages for full rangeof IR optical materials, windows and crystals. Note, save on priceand shipping cost by selecting 6 pack versions of popular crystals.

95

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

S

PowdersP A R T N U M B E R D E S C R I P T I O N

160-8010 KBr Powder, 100 g

ChunksP A R T N U M B E R D E S C R I P T I O N

160-8015 KBr Chunks, 100 g

Disks, 13 mm Diameter

1 mm ThicknessP A R T N U M B E R D E S C R I P T I O N

160-5003 13 x 1 mm KBr

160-5004 13 x 1 mm NaCl


160-1301 13 x 2 mm AMTIR

160-1218 13 x 2 mm BaF2

160-1213 13 x 2 mm CaF2

160-1198 13 x 2 mm CsI

160-1191 13 x 2 mm Ge

160-1135 13 x 2 mm KBr

160-1008 13 x 2 mm KBr (6 pack)

160-1173 13 x 2 mm KRS-5

160-1170 13 x 2 mm NaCl

160-1005 13 x 2 mm NaCl (6 pack)

160-5201 13 x 2 mm SiO2

160-1160 13 x 2 mm Si

160-1241 13 x 2 mm ZnS

160-1115 13 x 2 mm ZnSe

160-1001 13 x 2 mm ZnSe (6 pack)



160-1148 20 x 2 mm BaF2

160-1144 20 x 2 mm CaF2

160-1197 20 x 2 mm CsI

160-1139 20 x 2 mm Ge

160-1134 20 x 2 mm KBr

160-1128 20 x 2 mm KRS-5

160-1169 20 x 2 mm NaCl

160-5211 20 x 2 mm Polyethylene

160-5119 20 x 2 mm SiO2

160-1118 20 x 2 mm Si

160-5118 20 x 2 mm ZnS

160-1304 20 x 2 mm ZnSe


Note: The products highlighted in Red are in stockand available for immediate delivery.



160-1201 25 x 2 mm AMTIR

160-1306 25 x 2 mm BaF2

160-1212 25 x 2 mm CaF2

160-1002 25 x 2 mm CaF2 (6 pack)

160-1308 25 x 2 mm CsI

160-1307 25 x 2 mm Ge

160-1305 25 x 2 mm KBr

160-1172 25 x 2 mm KRS-5

160-1168 25 x 2 mm NaCl

160-1004 25 x 2 mm NaCl (6 pack)


160-5086 25 x 2 mm SiO2

160-1117 25 x 2 mm Si

160-5084 25 x 2 mm ZnS

160-1155 25 x 2 mm ZnSe

160-1007 25 x 2 mm ZnSe (6 pack)


160-1217 25 x 4 mm BaF2

160-1211 25 x 4 mm CaF2

160-1196 25 x 4 mm CsI

160-1138 25 x 4 mm Ge

160-1133 25 x 4 mm KBr

160-1009 25 x 4 mm KBr (6 pack)

160-1127 25 x 4 mm KRS-5

160-1124 25 x 4 mm NaCl

160-1012 25 x 4 mm NaCl (6 pack)


160-5089 25 x 4 mm SiO2

160-1116 25 x 4 mm Si

160-5087 25 x 4 mm ZnS

160-1114 25 x 4 mm ZnSe



160-1311 25 x 5 mm BaF2

160-1210 25 x 5 mm CaF2

160-1316 25 x 5 mm CsI

160-1313 25 x 5 mm Ge

160-1189 25 x 5 mm KBr

160-1003 25 x 5 mm KBr (6 pack)

160-1312 25 x 5 mm KRS-5

160-1123 25 x 5 mm NaCl

160-1011 25 x 5 mm NaCl (6 pack)

160-5100 25 x 5 mm SiO2

160-5090 25 x 5 mm ZnS

160-1154 25 x 5 mm ZnSe



160-1200 32 x 3 mm AMTIR

160-1199 32 x 3 mm AMTIR, drilled

160-1147 32 x 3 mm BaF2

160-1146 32 x 3 mm BaF2, drilled

160-1143 32 x 3 mm CaF2

160-1142 32 x 3 mm CaF2, drilled

160-1195 32 x 3 mm CsI

160-1194 32 x 3 mm CsI, drilled

160-1137 32 x 3 mm Ge

160-1136 32 x 3 mm Ge, drilled

160-1132 32 x 3 mm KBr

160-1010 32 x 3 mm KBr (6 pack)

160-1131 32 x 3 mm KBr, drilled

160-1015 32 x 3 mm KBr, drilled (6 pack)

160-1126 32 x 3 mm KRS-5

160-1125 32 x 3 mm KRS-5, drilled

160-1122 32 x 3 mm NaCl

160-1013 32 x 3 mm NaCl (6 pack)

Disks, 32 mm Diameter (continued)


160-1121 32 x 3 mm NaCl, drilled

160-1014 32 x 3 mm NaCl, drilled (6 pack)


160-5215 32 x 3 mm Polyethylene, drilled

160-5049 32 x 3 mm SiO2

160-5052 32 x 3 mm SiO2, drilled

160-1159 32 x 3 mm Si

160-1158 32 x 3 mm Si, drilled

160-5047 32 x 3 mm ZnS

160-5048 32 x 3 mm ZnS, drilled

160-1113 32 x 3 mm ZnSe

160-1112 32 x 3 mm ZnSe, drilled



160-1349 38 x 3 mm BaF2

160-1350 38 x 3 mm Ge

160-5220 38 x 3 mm KBr

160-1344 38 x 3 mm KRS-5


160-1233 38 x 3 mm SiO2

160-1353 38 x 3 mm Si

160-1315 38 x 3 mm ZnS

160-5025 38 x 3 mm ZnSe


160-1357 38 x 6 mm AMTIR

160-1322 38 x 6 mm BaF2

160-1342 38 x 6 mm CaF2

160-1326 38 x 6 mm CsI

160-1323 38 x 6 mm Ge

160-1320 38 x 6 mm KBr

160-1343 38 x 6 mm KRS-5

160-1321 38 x 6 mm NaCl


160-1355 38 x 6 mm SiO2

160-1324 38 x 6 mm Si

160-1329 38 x 6 mm ZnSe

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

96





160-1216 41 x 3 mm BaF2

160-1209 41 x 3 mm CaF2

160-1188 41 x 3 mm KBr

160-1167 41 x 3 mm NaCl


160-5157 41 x 3 mm ZnS

160-1341 41 x 3 mm ZnSe



160-5161 49 x 3 mm ZnS

160-1153 49 x 3 mm ZnSe


160-5027 49 x 6 mm BaF2

160-5206 49 x 6 mm CaF2

160-5029 49 x 6 mm CsI

160-1187 49 x 6 mm KBr

160-5205 49 x 6 mm KRS-5

160-1166 49 x 6 mm NaCl

160-5164 49 x 6 mm SiO2



160-5030 50 x 3 mm BaF2

160-1208 50 x 3 mm CaF2

160-5173 50 x 3 mm CsI

160-1186 50 x 3 mm KBr

160-1171 50 x 3 mm KRS-5

160-1165 50 x 3 mm NaCl

160-5177 50 x 3 mm ZnS

160-1152 50 x 3 mm ZnSe

Windows, 29 mm x 14 mm


160-1215 29 x 14 x 4 mm BaF2

160-5010 29 x 14 x 4 mm BaF2, drilled

160-1207 29 x 14 x 4 mm CaF2

160-5011 29 x 14 x 4 mm CaF2, drilled

160-5007 29 x 14 x 4 mm Ge

160-5012 29 x 14 x 4 mm Ge, drilled

160-1185 29 x 14 x 4 mm KBr

160-1184 29 x 14 x 4 mm KBr, drilled

160-5009 29 x 14 x 4 mm KRS-5

160-5014 29 x 14 x 4 mm KRS-5, drilled

160-1164 29 x 14 x 4 mm NaCl

160-1163 29 x 14 x 4 mm NaCl, drilled



160-1269 38 x 19 x 2 mm AMTIR

160-1270 38 x 19 x 2 mm AMTIR, drilled

160-1157 38 x 19 x 2 mm Si

160-1156 38 x 19 x 2 mm Si, drilled

160-1275 38 x 19 x 2 mm ZnS

160-1276 38 x 19 x 2 mm ZnS, drilled

160-1151 38 x 19 x 2 mm ZnSe

160-1150 38 x 19 x 2 mm ZnSe, drilled


160-1214 38 x 19 x 4 mm BaF2

160-1145 38 x 19 x 4 mm BaF2, drilled

160-1141 38 x 19 x 4 mm CaF2

160-1140 38 x 19 x 4 mm CaF2, drilled

160-1193 38 x 19 x 4 mm CsI

160-1192 38 x 19 x 4 mm CsI, drilled

160-1190 38 x 19 x 4 mm Ge

160-5032 38 x 19 x 4 mm Ge, drilled

160-1130 38 x 19 x 4 mm KBr

160-1129 38 x 19 x 4 mm KBr, drilled

160-5031 38 x 19 x 4 mm KRS-5

160-5016 38 x 19 x 4 mm KRS-5, drilled

160-1162 38 x 19 x 4 mm NaCl

160-1006 38 x 19 x 4 mm NaCl (6 pack)


160-1292 38 x 19 x 4 mm SiO2

160-1293 38 x 19 x 4 mm SiO2, drilled



160-1277 41 x 23 x 3 mm ZnS

160-1279 41 x 23 x 3 mm ZnS, drilled

160-1111 41 x 23 x 3 mm ZnSe

160-1280 41 x 23 x 3 mm ZnSe, drilled


160-5146 41 x 23 x 6 mm BaF2

160-5152 41 x 23 x 6 mm BaF2, drilled

160-5147 41 x 23 x 6 mm CaF2

160-5153 41 x 23 x 6 mm CaF2, drilled

160-1183 41 x 23 x 6 mm KBr

160-1182 41 x 23 x 6 mm KBr, drilled

160-1120 41 x 23 x 6 mm NaCl


Notes: For disk and window sizes other than shownhere, please contact PIKE Technologies.

97

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

SO R D E R I N G I N F O R M AT I O N


Crystal Polishing Kit – Extending the Life of IR Transparent Windows

Scratched and fogged windows diminish the quality of transmissionFTIR spectra. Their continuous replacement can be impracticaland quite expensive. A number of standard infrared windows canbe quickly restored to perfect condition with the Pike TechnologiesCrystal Polishing Kit. The Kit includes all the necessary componentsto re-polish KBr, NaCl and CsI windows quickly and effectively.

Note: We do not recommend polishing KRS-5 windows withoutexceptional safety precautions and for this reason do not includematerials for polishing KRS-5 windows.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

98

F E AT U R E S O F T H E C R Y S TA L P O L I S H I N G K I T

• Complete kit for polishing IR transparent windows

• Reduces cost of transmission analysis by extending KBr, NaCl and CsI window lifetime



162-4000 Crystal Polishing KitIncludes: Wooden base, glass plates, polishing pads, brushes and Polishing Compounds

Crystal Polishing Kit Replacement PartsP A R T N U M B E R D E S C R I P T I O N

162-4010 Glass Plate

162-4011 Polishing Pads (6 each)

162-4015 Brushes (6 each)

162-4012 Grinding Compound (400 grit)

162-4013 Grinding Compound (600 grit)

162-4014 Polishing Compound

Notes: For other options for window polishing, please contact PIKE Technologies.

Short Path Gas Cells –For Samples with Higher Vapor Phase Concentration

PIKE Technologies offers several choices for analysis of gas sampleswith component concentrations generally above 1% by weight.Our Short-Path HT Gas Cells provide high throughput by virtue oftheir greater inside diameter providing more energy at the FTIRdetector. The Short Path HT Gas Cells also include glass stopcocksfor flow input of the gas sample and sealing.

The PIKE Technologies Short-Path EC Gas Cells are recommendedfor use with occasional gas sampling and offer an economical choicewith standard septum-styled sealing of the vapor phase sample.

Both our Short Path HT and EC Gas Cells are available in 50 mm and 100 mm versions. The complete gas cell requires yourselection of the appropriate IR transparent windows. Both HT andEC Gas Cells are slide mount accessories, compatible with all FTIRspectrometers.

99

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

S

F E AT U R E S O F T H E S H O R T PAT H G A S C E L L S

• Gas cells for measuring higher vapor phase concentration

• High throughput and economy versions

• 100 mm and 50 mm pathlength versions

• Fits all FTIR spectrometers

Short-Path Gas Cell P A R T N U M B E R D E S C R I P T I O N

162-2200 Short-Path HT Gas Cell, 100 mm pathlength

162-2250 Short-Path HT Gas Cell, 50 mm pathlength

162-2100 Short-Path EC Gas Cell, 100 mm pathlength

162-2150 Short-Path EC Gas Cell, 50 mm pathlength

Notes: The Short-Path Gas Cells include the glass body, o-rings and cell holder. The HT Gas Cells require selection of 38 mm x 6 mm windows. The EC Gas Cellsrequire selection of 25 mm x 4 mm windows.

Short-Path Gas Cell Windows (must select minimum of 2)P A R T N U M B E R

D E S C R I P T I O N 3 8 X 6 M M 2 5 X 4 M M

BaF2 160-1322 160-1217

CaF2 160-1342 160-1211

KBr 160-1320 160-1133

NaCl 160-1321 160-1124

ZnSe 160-1329 160-1114

Notes: For window compatibility please consult the Materials Properties informationon page 105 of this catalog. For additional window selections please see the windows page of this catalog.

Short-Path Gas Cell Replacement Parts P A R T N U M B E R

D E S C R I P T I O N H T G A S C E L L E C G A S C E L L

Viton O-Rings (2 each) 162-2209 162-2109

Cell Window Cap 162-2202 162-2102

Gas Cell Holder 162-2205 162-2105

Glass Body for 100 mm Cell 162-2201 162-2101

Glass Body for 50 mm Cell 162-2255 162-2155

Septa (12 each) NA 162-2106

Notes: For options not shown here, please contact PIKE Technologies.


Short PathHT Cell

Short PathEC Gas Cell

Heated Gas Flow Cell – For Streaming Gas Analysis

The PIKE Technologies Heated Gas Flow Cell is recommended forhigh-performance FTIR sampling of flowing gas samples. Thebeam-conforming design of the Heated Gas Flow Cell provides for minimum cell volume (38.5 mL) and a 100 mm pathlength,compatible with most FTIR spectrometers. This beam-conformingdesign also provides maximum IR throughput with no vignette ofthe IR beam. The gas cell may be heated up to 300 °C to preventcondensation of higher molecular weight gas species. The PIKETechnologies Heated Gas Flow Cell includes standard Swageloc fittings for connection to 1/8" tubing and its stainless steel com-position is compatible with pressurized applications up to 100 psi.

Temperature control is provided by either digital or digital PCcontrollers from PIKE Technologies. Complete specification of the Heated Gas Flow Cell requires selection of your choice of IR transparent windows – 38 mm x 6 mm.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

100

F E AT U R E S O F T H E H E AT E D G A S F L O W C E L L

• High IR throughput, minimum cell volume ideal for preservingflowing gas composition

• Temperature control to 300 °C

• Your choice of IR transparent windows – user changeable


Optical geometry for PIKE Technologies Heated Gas Flow Cell

Heated Gas Flow Cell P A R T N U M B E R D E S C R I P T I O N

162-20XX Heated Gas Flow CellIncludes: Cell, Viton O-Rings, and FTIR mounting plate

Notes: Please select the XX code for your FTIR – found on the fold out on the lastpage of this catalog.

Temperature Controllers (must select one)P A R T N U M B E R D E S C R I P T I O N



Notes: Digital Temperature Control Module, PC Control includes PIKE TempPROsoftware.

IR Transparent Windows for Heated Gas Flow Cell (select minimum of 2)D E S C R I P T I O N 3 8 X 6 M M P A R T N U M B E R

BaF2 160-1322

KBr 160-1320

KRS-5 160-1343

ZnSe 160-1329


Heated Gas Flow Cell Replacement PartsP A R T N U M B E R D E S C R I P T I O N

162-2009 Viton O-Rings, (2 each), max temp. 200 ºC

162-2309 High Temperature O-Rings, (1 each), max temp. 325 ºC

Notes: For other options for the Heated Gas Flow Cell, please contact PIKE Technologies.Gas Cell requires 4 O-rings.


HEATED GAS FLOW CELL SPEC IF ICAT IONS


Accuracy +/- 0.5%

Voltage 24 VAC


Controllers

Input Voltage 110/220 V, switchable

Output Voltage 10 A/24 VAC

Long-Path Gas Cells – For Measurement of Low Concentration Vapor Components

PIKE Technologies offers several Long-Path Gas Cells for analysisof trace components in gas samples – typical concentrations mayrange from the percent to ppb levels. The long-path cells featurea folded path design providing an extended pathlength within acompact dimension. The FTIR beam enters the cell through an IRtransparent window and reflects a number of times between theaccessory mirrors before exiting to the detector. The number ofreflections is determined by the optical configuration of the celland may be selected as a permanently aligned version oradjustable by the user (variable path cells). Typical applications of the long-path gas cells include air pollution studies, gas puritydeterminations, monitoring of industrial processes, exhaust gasanalysis and many others.

All long-path gas cells offered by PIKE Technologies are manufactured by Infrared Analysis, Inc., pioneers in the development of gas analysis technology.

Permanently aligned long-path gas cells. All cell assembliesinclude a heavy wall borosilicate glass tube mounted on a corrosion-resistant anodized aluminum base. The base includes spectrometer-specific transfer optics allowing placement of the accessory in thesample compartment of the FTIR. Infrared transparent windowsserve as beam entry and exit ports (windows are easily replaceableand different window materials are available). The top of the cellis enclosed by the valve/gauge assembly with all the valves madeof stainless steel. The accessory mirrors are mounted permanentlywith chemically inert cement at the bottom of the cell and thefacing part of the top enclosure. The gold coated mirrors haveprotected surfaces and the gas cells can be cleaned with detergentand water without loss of cell throughput or alignment.

Variable-Path gas cells. The construction and main componentsof the variable-path gas cells are identical with those describedabove, with an exception of the internal mirror assembly. The cellhas two adjustable mirrors located at the top of the enclosure(controlled with a calibrated dial) and one stationary mirrorcemented to the cell base. Adjustments to mirror positions allowselection of different pathlengths supported by the cell.

Some gas measurement applications require temperaturecontrol for higher precision or to prevent condensation of specificcomponents. PIKE Technologies offer heated versions of our fixedand variable path gas cells.

101

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

S

F E AT U R E S O F T H E L O N G - PAT H G A S C E L L S

• Long-path gas cells for measurements of vapor species toppb levels

• Fixed and variable pathlength versions

• Heated versions available

• For most FTIR spectrometers

2.4 m 10.0 m 22.0 m 33.0 m 1-16 m Fixed Fixed Fixed Fixed Variable

Base Path 5" 10" 22" 22" 10"

Body Material Glass Glass Glass Glass Glass

Optics Coatings Gold Gold Gold Gold Gold

Window Material KCI KCI KCI KCI KCI

Window 37.5 x 4 mm 25 x 4 mm 25 x 4 mm 25 x 4 mm 25 x 4 mmDimension

# Window 1 2 2 2 2

Cell Volume 0.1 liter 2.3 liter 8.5 liter 8.5 liter 2.3 liter

Specifications for Long-Path Gas Cells from PIKE Technologies

2.4 Meter Gas Cell

Long-Path Gas Cells

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

102

Long-Path Gas Cells (select one or more)P A R T N U M B E R D E S C R I P T I O N

162-2510 2.4 Meter Long-Path Gas Cell

162-26XX 10.0 Meter Long-Path Gas Cell



162-31XX 1-16 Meter Variable Long-Path Gas Cell

Notes: The Long-Path Gas cells include windows as specified in the table on page 101.Please select the baseplate mount for your FTIR spectrometer model. Additionalwindow materials can be ordered from the table in the next column.

Heated Long-Path Gas Cells (select one or more)P A R T N U M B E R D E S C R I P T I O N

162-2504 Heated 2.4 Meter Long-Path Gas Cell

162-32XX Heated 10.0 Meter Long-Path Gas Cell



162-35XX Heated 1-16 Meter Variable Long-Path Gas Cell

Notes: The Heated Long-Path Gas cells include windows as specified in the table onpage 101. Please select the baseplate mount for your FTIR spectrometer model.Additional window materials can be ordered from the table in the next column. The Heated Long-Path Gas Cells include a digital temperature controller and heatingjacket. The Heated Long-Path Gas Cells may be heated to 200 ºC.

Replacement Windows for Long-Path Gas CellsP A R T N U M B E R

D E S C R I P T I O N 2 5 X 4 M M 3 7 . 5 X 4 M M

BaF2 160-1217 –

CaF2 160-1211 160-1287

KBr 160-1133 160-1288

KCl 160-1289 160-1178

KRS-5 160-1127 –

NaCl 160-1124 160-1290

ZnSe 160-1114 160-1291


Replacement Parts for Long-Path Gas CellsP A R T N U M B E R D E S C R I P T I O N

162-2511 O-Rings and Gaskets for 2.4 Meter Gas Cell

162-2601 O-Rings and Gaskets for 10 Meter and 16V Gas Cells

162-2801 O-Rings and Gaskets for 22 Meter and 33 Meter Gas Cells

162-2509 Digital Temperature Controller for Heated Long-Path Gas Cells

162-2505 Heating Jacket for 2.4 Meter Long-Path Gas Cell

162-3700 Heating Jacket for 10.0 Meter Long-Path Gas Cell

162-3800 Heating Jacket for 22.0 and 33.0 Meter Long-Path Gas Cell

162-3900 Heating Jacket for 1-16 Meter Variable Long-Path Gas Cell


HEATED LONG PATH GAS CELLS SPEC IF ICAT IONS


Accuracy +/- 0.5%

Voltage 115 or 230 VAC

Sensor Type K type

Controllers

Digital +/- 0.1 °C

Input Voltage 115 or 230 V, specify

Output Voltage 115 or 230 VAC/10A, specify

Transmission Sampling Techniques – Theory and ApplicationsFTIR sampling by transmission is a very popular method for collection of infrared spectra. Its use is easy to explain – themethods are intuitive and do not require sophisticated samplingaccessories. In many cases, the sample can be placed directly intothe path of the infrared beam (with the help of sample holder) andscanned. Further benefits of transmission sampling techniquesinclude compatibility with automated sampling and microsamplingtechniques such as IR Microscopy.

Transmission techniques are well documented and have beensuccessfully used for many years. A large number of spectrallibraries contain transmission spectra and are often used as references for the purpose of qualitative analysis. Transmissiontechniques offer many advantages and should be used wheneverpossible, unless reliable sample preparation becomes too difficult,too time consuming or impossible. Transmission is also widelyused for quantitative applications, as significant numbers of basicmeasurements adhere to the Beer-Lambert law. The law providesa mathematical relationship between the infrared radiationabsorbed by the sample and the sample concentration:

A = a • b • c

Where: A = absorbance a = absorptivity b = pathlength c = sample concentration

The Beer-Lambert law states that absorbance is linearly proportional to sample concentration (with sample pathlengthand absorptivity constant). The actual measurements are generatedin percent transmittance (which is not a linear function of con-centration), however, they can be converted in real time toabsorbance by all modern FTIR instrumentation. As mentionedbefore, transmission measurements are intuitive and simple.However, the majority of samples are too thick to be measureddirectly and they have to be processed in some way before meaningful data can be collected. Some of the sample preparationtechniques are time consuming and can be destructive. Liquidsand pastes are generally the easiest samples to run. A large number of liquid cells and windows are available for liquid meas-urements. Solid samples (with the exception of thin films) requiresample preparation – making a pellet (typically potassium bromide –KBr) or a mull. Gas samples require a suitable gas cell with apathlength sufficient to detect the desired component.

Sample Preparation and Analysis

LiquidsMost liquids and dissolved solids are easy to measure by transmission.Viscous liquids or pastes can be simply pressed between 2 IRtransparent windows and measured by FTIR.

Thin liquids or samples in solvent may be best run by using ademountable liquid cell or a sealed cell, consisting of two windowswith a precision spacer in-between. One of the windows has twodrilled holes for the introduction and evacuation of the sample. A large number of cell options are available – these include permanently sealed cells and demountable cells with different window materials and a wide selection of spacers.

The pathlength of liquid cells can be easily measured withyour FTIR spectrometer. Just place the empty cell into the FTIRand collect its spectrum. The frequency of the sine wave spectrum(produced by back reflection within the cell) provides the pathlength using the following equation;

P = (10 • N) / (2 • Δ cm-1)

Where:

P = pathlength of cell in mmN = number of fringes within Δ cm-1

Δ cm-1 = wavenumber range of fringe count

It is very important to select compatible IR transparent windowsfor your liquid samples. Please refer to the chart on the last pageof this note to select your windows. If you still have questions,please call us.

103

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

S

FTIR Spectrum of 1 drop of Extra Virgin Olive Oil pressed between 25 mm KBr windows and held in the IR beam using the PIKE UniversalSample Holder.

SolidsThe easiest to analyze are film and polymer samples less than200 micrometers thick (ideal thickness for the major componentof a polymer film is about 20 microns). These samples can besimply placed into a sample holder and immediately scanned.

The thickness of the polymer film can be calculated from thefringe pattern in the spectrum using the following equation;

T = (10000 • N) / (2 • n • Δ cm-1)

Where:

T = thickness of polymer film in micronsN = number of fringes within Δ cm-1

Δ cm-1 = wavenumber range of fringe countn = refractive index of polymer

The same procedure can be used for samples which can besliced and pressed to an appropriate thickness – especially for IRmicrosampling.

For IR microsampling, one can place a small sliced sampleinto a sample compression cell and apply pressure to hold thesample and to thin it to a useable thickness – as shown in the following spectral data.

However, the majority of solid materials must be preparedbefore their infrared spectra can be collected. In many cases sample preparation involves grinding of the sample and mixing itwith an IR transparent material such as KBr and then pressing apellet. While this method of solids analysis is time consuming, itproduces an excellent result.

Solid Sample Preparation TipsThe best method for preparation of solid samples involves mixingthe sample (about 5% by weight) with an IR transparent material(typically KBr) and pressing a pellet. The mixing is best done withthe ShakIR accessory which produces a fully mixed and pulverizedsample in about 30 seconds. The mixing can also be done with amortar and pestle – but not as well. Generation of a pellet involvespressing the prepared mixture with a hydraulic or hand press intoa hard disk. The pellet, ideally 0.5 to 1 mm thick is then placed ina transmission holder and scanned. Typically, the pellet techniqueprovides good quality spectra with a wide spectral range and nointerfering absorbance bands.

Samples which do not grind well and/or are affected by solvents and mulling agents can be analyzed with high pressuretechniques. Typical samples include fibers and paint chips. Theaccessory used for such applications utilizes two diamond anvils.Difficult samples are placed between the diamonds and crushed,compressed and flattened to the thickness necessary to obtaingood quality FTIR spectra. Diamond cells are transparent to IRradiation except in the region of 2400 cm-1 to 1700 cm-1. The highpressure diamond cells require the use of a beam condenser oran infrared microscope.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

104

Polymer Film from Product Packaging Material – held in place with the PIKE Universal Sample Holder. Polymer is identified as AtacticPolypropylene and the film is determined to be 27.1 microns thick.

Micro Spectrum of a Layered Polymer using a PIKE µMAX IR Microscopeand Compression Cell with KBr windows.

FTIR Spectrum of Caffeine prepared as a 13 mm KBr Pellet and held inposition with the PIKE Sampling Card.

FTIR Spectrum of Methanol Vapor measured with the PIKE 100 mm gascell using 0.50 cm-1 spectral resolution.

An alternate method for analysis of solid materials involvesmaking a mull. Mulls are sample suspensions in Nujol (refinedmineral oil) or Fluorolube (perfluorohydrocarbon). The process is based upon mixing 1 to 2 drops of the mulling agent with aground sample until a uniform paste is formed. The paste istransferred onto a KBr or other IR transparent disk, placed in the sample compartment of the spectrometer and scanned. Theadvantage of this technique is that it is a relatively quick and simple procedure; disadvantages include interference frommulling agent absorption bands. (Both Nujol and Fluorolube havecharacteristic spectral features and in most cases have to be usedas a pair in order to generate a complete mid IR spectrum. Nujolis used below 1330 cm-1, Fluorolube above 1330 cm-1).

GasesAnalysis of gas samples is a unique form of transmission samplingby FTIR as the identified sample does not need to be of purecomposition. At high spectral resolution, most gas mixtures canbe identified and quantified since absorbance bands can beselected within the spectrum, which are resolved and distinctfrom other components within the sample.

Simple demountable cells (50 mm to 100 mm) are recom-mended for samples in a 1 – 10% by weight concentration range.

For highly dilute samples (ppm to ppb concentrations), long-path cells are required. The long-path cell reflects the IR beamseveral times through the sample using a set of mirrors positionedon the opposite ends of the cell, producing a pathlength to 10 to30 meters – or more. It is important to select window materialscompatible with the investigated sample. Gas sampling accessoriescan be fitted with different windows to accommodate the physicaland chemical characteristics of the measured gas. Special designsfor high pressure and temperature controlled experiments arealso available.

SummaryTransmission sampling by FTIR provides an excellent means forsample identification and quantification of sample components.Most samples measured by transmission techniques require some sample preparation, however, the quality of the results and amenability to automation and microsampling offer significant advantages.

105

TR

AN

SM

IS

SI

ON

SA

MP

LI

NG

– A

UT

OM

AT

ED

AN

DM

AN

UA

LT

EC

HN

OL

OG

IE

S

Properties of Select Infrared Transmitting Materials For Transmission SpectroscopyMaterial Comments SWL cm-1 LWL cm-1 RI Solubility g/100 g Hardness kg/mm2 MP °C pH Range

AMTIR GeAsSe glass, brittle 11000 593 2.50 0.00 170 370 1 – 9

BaF2 Barium Fluoride 66600 691 1.45 0.17 82 1280 5 – 8

CaF2 Calcium Fluoride 79500 896 1.40 0.0017 158 1360 5 – 8

CsI Cesium Iodide, very hygroscopic, 42000 172 1.73 44 20 621 NASomewhat Toxic

Diamond Type IIa, strong IR absorbance 30000 <2 2.40 0.00 5700 550 1 – 14between 2700-1800 cm-1, costly flash point

Ge Germanium, brittle, becomes 5500 432 4.00 0.00 780 936 1 – 14opaque at elevated temperatures

KBr Potassium Bromide, most widely 48800 345 1.52 53 6 730 NAused for mid-IR applications

KRS-5 Thallium Bromide/Thallium 17900 204 2.37 0.05 40 414 5 – 8Iodide, Extremely Toxic!

NaCl Sodium Chloride 52600 457 1.49 36 18 801 NA

Polyethylene For Far-IR, swells with 625 <4 1.52 0.00 110 1.5 – 14some organic solvents

SiO2 Silicon Dioxide 50000 2315 1.53 0.00 460 1713 1 – 14

Si Silicon, strong IR absorbance 8900 624, 30 3.41 0.00 1150 1420 1 – 12between 624-590 cm-1

ZnS Zinc Sulfide 17000 690 2.20 0.00 240 1830 5 – 9

ZnSe Zinc Selenide 15000 461 2.40 0.00 120 1526 5 – 9

Notes: The above table is meant to be a general guide – brief and concise. For more information about these materials, consult appropriate reference books and Material Safety Data Sheets (MSDS).

SWL – Shortest wavelength for transmission, 1 mm, 50% transmission

LWL – Longest wavelength for transmission, 1 mm, 50% transmission

RI – Refractive Index, at relevant wavelength

MP – Melting point

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

106

N O T E S

Special Applications PIKE Technologies offers several FTIR accessories

specially designed for use in a dedicated sampling

environment. Our semiconductor sampling accessories

highlight our dedication to providing tools to ease

and streamline FTIR sampling technology. If you

have special sampling needs not shown in our

catalog, please contact us – we may be able to help.

MappIR™For Fully Automated Analysis of 200 mm Semiconductor Wafers

Page 109

MAP300™For Fully Automated Analysis of 300 mm Semiconductor Wafers

Page 109

Page 111

Semiconductor Applications FTIR Sampling Techniques Overview

External Sample ModuleAuxiliary Sample Compartment for Added Flexibility and CustomApplications

Page 113

TGA/FTIR AccessoryIdentification and Qualification of Evolved Gases fromThermogravimetric Analyzer

Vertical Wafer AccessoryFor Analysis of Semiconductor Wafers

Page 108

Vertical Wafer Accessory – For Analysis of Semiconductor Wafers

PIKE Technologies offers the Vertical Wafer Accessory for analysisof semiconductor wafers. The Vertical Wafer Accessory is an in-compartment tool for transmission analysis of semiconductorwafers for Carbon, Oxygen and BPSG. The accessory accommodateswafers up to 6 inches (150 mm) in diameter. Wafers are located ina demountable ring. Dimensional tolerances conform to SEMIstandards. Delrin (hard polymer) mounting clips eliminate contactbetween the wafer and metal surfaces during the analysis. The clipmechanism facilitates convenient and repeatable wafer placement.

The wafer support ring may be rotated through 360° andtranslated laterally through a distance of over 3" (75 mm) to produce an R-theta motion covering the entire surface of thewafer. The ring may be rotated and translated manually or auto-matically under stepper motor control using PIKE TechnologiesAutoPRO software. A scale is provided for each motion, providingverification of sample position.

The automated system incorporates two precision steppermotors for rotation and translation of the plate. The motors aredriven by the Motion Control Unit connected to a PC. The operationis managed by PIKE AutoPRO software which provides full userprogrammability and an easy to learn “point-and-click” environ-ment. Polar or Cartesian (X, Y) coordinates may also be used todefine test points. The AutoPRO software is written in VisualBASIC and allows complex test sequences to be setup, stored as methods and implemented with full flexibility. The MotionControl Unit features a smart power supply and operates at 85-265 VAC, 47-63 Hz.

The PIKE Technologies Vertical Wafer Accessory requires minimum 3.5" beam height FTIR spectrometers. Please contact usfor more product details.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

108

FEATURES OF THE VERTICAL WAFER ACCESSORY

• Transmission analysis of semiconductor wafers for Carbon,Oxygen and BPSG

• Manual and/or fully-automated operation

• R-theta (rotation/translation) motion control providing complete wafer analysis

• Contamination-free wafer mount

• 6", 5", 4", 3" and 2" wafer sizes and custom mounts and blanks


Vertical Wafer Accessory P A R T N U M B E R D E S C R I P T I O N

073-16XX Vertical Wafer Accessory, Manual VersionIncludes mount for your FTIR

073-26XX Vertical Wafer Accessory, Automated VersionIncludes the Motion Control Unit and AutoPRO software

Notes: Please insert FTIR XX code found on the fold-out on the last page of this catalog.Requires 3.5" beam height or greater in FTIR.

Options for Vertical Wafer AccessoryP A R T N U M B E R D E S C R I P T I O N

073-3600 6" Wafer Mount, Blank

073-3660 Additional Wafer Mount

073-3650 Insert to Support 5" Wafer




Notes: For options not describe here, please contact PIKE Technologies.

MappIR and MAP300 – For Automated Analysis of Semiconductor Wafers

PIKE Technologies offers fully automated accessories for the analysisof semiconductor wafers. Our MappIR and MAP300 accessoriesprovide for analysis of EPI, BPSG, Oxygen and Carbon in wafersizes ranging from 2 to 12 inches (50 to 300 mm).

The MappIR and MAP300 have been developed to providethe semiconductor industry with reasonably priced, automatedtools for research and quality control of silicon wafers. TheMappIR was developed for the analysis of 8 inch (200 mm) andsmaller semiconductor wafers.

The MAP300 is a larger version of this original design and it iscapable of handling the newer 12 inch (300 mm) wafer formats. Theoperation, electronics and software are identical for both systems.

The MappIR and MAP300 accessories mount in the samplecompartment of the FTIR spectrometer. Semiconductor wafers areheld in place by spring-loaded Delrin retaining clips and are neverin contact with the aluminum stage of the accessory. A standardsize slot for a vacuum or mechanical wand is provided for ease ofwafer handling. Individual wafers are rotated and/or translatedby stepper motors in a sequence pre-programmed by the systemoperator. A sample purge box is optional.

To minimize interferences of water vapor and carbon dioxidewith infrared measurements, the optical path of the accessoriesare equipped with purging lines and can be purged with dry airor nitrogen.

The accessories are controlled by AutoPRO software whichprovides a simple user interface for multiple point wafer analysis(mapping). Up to 320 points with 8 mm beam and 5 mm edgeexclusion can be measured on a 12 inch wafer. The software provides ample flexibility in setting up various experiments.

The following are advantages of the AutoPRO package:

• Graphical and intelligent user interface for setting-up mapping patterns

• Selection of wafer size, IR beam diameter, and edge exclusion

• Operator selectable or pre-defined multiple point maps

• Polar and/or Cartesian coordinates options

• Real-time display of the experiment status

• Ability to save and recall various experimental patterns

• Flexible, COM enabled interface

• KLA and CSV file importer

Data collection and processing is provided by the spectrometersoftware. A number of FTIR manufacturers offer dedicated packageswhich fully integrate the accessory with the spectrometer. If suchan option is not available, AutoPRO can be controlled by thespectrometer’s program viamacros. AutoPRO is Windowscompliant and when run sep-arately, it allows configuration,programming and control of the accessory.

The automated wafertesting systems are compatiblewith most commercial FTIRspectrometers and softwarepackages.

109

SP

EC

IA

LA

PP

LI

CA

TI

ON

S

PIKE TechnologiesMappIR Accessory

F E AT U R E S O F M A P P I R A N D M A P 3 0 0

• Complete hardware and software package for automated,multi-position measurements and mapping of semiconductor wafers

• 8 inch (200 mm) and 12 inch (300 mm) semiconductor waferhandling. Optional inserts for wafer sizes from 2 to 12 inches

• EPI, BPSG, Oxygen and Carbon determination

• Specular reflectance and transmission sampling – standard

• Purgeable accessory for removal of atmospheric interferences

PIKE TechnologiesMAP300 Accessory

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

110

MappIR and MAP300 Automated Semiconductor Wafer Accessories P A R T N U M B E R D E S C R I P T I O N

016-28XX MappIR Automated Semiconductor Wafer Accessory for 8" WafersIncludes: Wafer mount, Motion Control Unit, AutoPRO software and mount for your FTIR.

017-28XX MAP300 Automated Semiconductor Wafer Accessory for 12" WafersIncludes: Wafer mount, Motion Control Unit, AutoPRO software and mount for your FTIR. Insert to support 8" wafersis also included.

Notes: Please insert FTIR XX code found on the fold-out on the last page of this catalog.

Options for the MappIR and MAP300 AccessoriesP A R T N U M B E R D E S C R I P T I O N

073-3880 Additional 8" Wafer Mount (MappIR only)

073-3800 Blank Support – for custom wafers (MappIR only)

017-3912 Additional 12" Wafer Mount (MAP300 only)

017-3980 Insert to Support 8" Wafer (MAP300 only)






Notes: For options not described here, please contact PIKE Technologies.


MAP300 MappIR

12"

8"

6"

5"

4"

3"

2"

111

SP

EC

IA

LA

PP

LI

CA

TI

ON

S

TGA/FTIR Accessory – Identification and Quantification of Evolved Gases from Thermogravimetric Analyzer

The PIKE Technologies TGA/FTIR Accessory is designed to be aninterface for evolved gas analysis from a thermogravimetric analyzer(TGA) to your FTIR spectrometer. Evolved gases from the TGA passthrough a heated transfer line into the beam conforming flow cellin the FTIR sample compartment. As these evolved gases travelthrough the flow cell, FTIR spectra are collected and stored forfurther processing. Qualitative and quantitative measurementsare doable from sample masses – typically in the low milligramrange. The PIKE TGA/FTIR Accessory is compatible with most FTIRspectrometers and most TGA instruments.

During the TGA analysis sample mass is lost through a combination of volatilization and degradation of the samplematerial. The heated TGA/FTIR system maintains the vapor stateof the evolved gases throughout the FTIR analysis.

The FTIR spectrometer is set to collect spectra at 10 secondintervals during the evolved gas analysis using the kinetics software package for your FTIR. With this software you can generatereconstructions of total IR response vs. time or temperature(Gram-Schmidt) or specific IR band reconstructions to isolatepoints of unique component evolutions. FTIR spectra are extractedfrom the data set and an identification is made by comparingthese unknown spectra to vapor phase spectral libraries.

F E AT U R E S O F T H E TG A / F T I R A C C E S S O R Y

• IR beam conforming flow cell design – maximizes IRthroughput

• 100 mm IR beam pathlength for maximized FTIR sensitivity

• Baseplate mounted in your FTIR for flexible sampling

• Temperature control settable up to 300 °C for flow cell and transfer line

• User changeable IR transparent windows to minimize cost of operation

• Heated, glass lined stainless steel transfer line for inert transfer of TGA effluent

• Purge tubes provide stable purge environment for the FTIR system

TGA/FTIR Data for Cured Rubber Sample. Upper trace is the Gram-SchmidtReconstruct of the TGA evolved gases. Lower trace is a carbonyl recon-struction and a FTIR spectrum from this data set.

IR Beam Conforming Optical Design of PIKE Technologies TGA/FTIR Accessory

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

112

TGA/FTIR Accessory Flow CellP A R T N U M B E R D E S C R I P T I O N

162-24XX TGA/FTIR Accessory Flow Cell

Notes: Please see the FTIR instrument code sheet. TGA/FTIR Accessory includesmount for your FTIR, exhaust line and purge tubes. Complete accessory requiresselection of IR transparent windows, heated transfer line and temperature controller.The TGA/FTIR accessory requires installation by a trained service representative –please consult with your FTIR manufacturer.

IR Transparent Windows for TGA/FTIR Accessory (must select 2 or more)


160-1320 KBr window, 38 x 6 mm

160-1329 ZnSe window, 38 x 6 mm

Notes: For window compatibility please consult our Materials Properties information.

TGA/FTIR Accessory Heated Transfer Line (must select one)P A R T N U M B E R D E S C R I P T I O N

115-0001 Heated Transfer Line for Shimadzu TGAIncludes take-off valve modifications

115-0005 Heated Transfer Line for Mettler 851 TGA

115-0006 Heated Transfer Line for Mettler TGA

115-0007 Heated Transfer Line for TA Instruments TGA

115-0008 Heated Transfer Line for TA Instruments Q5000R TGA

115-0009 Heated Transfer Line for TA Instruments Q50/Q500 TGA

115-0010 Heated Transfer Line for TA Instruments 2050 TGA

115-0011 Heated Transfer Line for Netzsch TGA

115-0012 Heated Transfer Line for /PESTA6/4000 110V TGA

115-0013 Heated Transfer Line for SETARAM

115-0014 Heated Transfer Line for PESTA6/4000 220VTGA

Notes: We will need to know the make and model number of your TGA. Please consult your TGA supplier to ensure compatibility with evolved gas analysis. Pleasecontact us about interface to other TGA instruments.

TGA/FTIR Accessory Temperature Controllers (must select one)P A R T N U M B E R D E S C R I P T I O N

076-1120 Dual Digital Temperature Control Module

076-1130 4 Zone Digital Temperature Control Module for Shimadzu TGA

Notes: These temperature controllers provide setting for the heated gas cell and theheated transfer line.

TGA/FTIR Accessory Replacement PartsP A R T N U M B E R D E S C R I P T I O N

162-2309 High Temperature O-Rings, (1 each), max temp, 325 °C

Notes: 4 o-rings are required for the gas cell.


TGA/FTIR ACCESSORY SPEC IF ICAT IONS


Accuracy +/- 0.5%

Voltage 24 VAC


Controllers

Input Voltage 110/220 V, switchable

Output Voltage 10 A/24 VAC

113

SP

EC

IA

LA

PP

LI

CA

TI

ON

S

External Sample Module – Extending Sampling Efficiency

The External Sample Module (ESM) from PIKE Technologies is aversatile sampling station for FTIR spectrometers. It provides an additional sample compartment to keep the main samplecompartment of the FTIR free for routine sampling and also provides a location for a more complex sampling setup. Examplesof experiments ideally suited to using the External SampleModule include a long-path gas cell, PIKE TGA/FTIR accessory,MappIR™ and the AutoDiff™ (PIKE’s automated diffuse reflectanceaccessory). The sample compartment of the ESM is full sized, andcompatible with all PIKE Technologies accessories.

In addition to being a traditional sample compartment, theESM has a screw-hole grid for customized optical layouts withremovable inner and outer walls.

The External Sample Module is compatible with either sealedand desiccated or purged FTIR spectrometers. The PIKE ESM maybe paired with most FTIR spectrometers with an external beam.

External Sample Module (must select, insert spectrometer model for XX)P A R T N U M B E R D E S C R I P T I O N

155-10XXR External Sample Module, Right Side

155-10XXL External Sample Module, Left Side

Notes: External Sample Module includes optics, mounting hardware, electricalcabling for FTIR and purge tubing and fittings to connect to purge air supply. Please see the FTIR instrument code sheet for XX.

Detector for External Sample Module (must select one or more)P A R T N U M B E R D E S C R I P T I O N

155-2010 DLaTGS Detector for External Sample Module

155-2020 MCT Detector (mid band) for External Sample Module

Notes: Detectors for the External Sample Module may be exchanged by the customerand are pin-mounted for easy exchange without alignment. Please ask us aboutother detector options.

F E AT U R E S O F T H E

E X T E R N A L S A M P L E M O D U L E ( E S M )

• Utilizes external beam of FTIR – keeps main sample compartment free for general sampling

• Right and left side external beam versions

• Full sized dimensions – for all sample compartment accessories

• Choice of integrated detector

• Ideal accessory for heated applications or a difficult experi-mental setup – saving time and improving reproducibility

• Customizable configuration – removable sample compartmentwalls for specific optical layouts

• Vibration isolated design – providing highest spectral quality


• Requires installation by your FTIR spectrometer provider

Optical geometry for right side ESM


EXTERNAL SAMPLE MODULE S P E C I F I C AT I O N S

Dimensions (W x D x H) 615 mm x 490 mm x 205 mm

Weight 19 kg

FTIR Placement Right or Left Side

Beam Height Specific for FTIR

Sample Compartment Size (W x D x H) 190 mm x 265 mm x 155 mm

Detector Options DTGS, MCT, others inquire

Screw Hole Grid 1" OC, 1/4-20, sealed

Sample Compartment EFL 6"

Purge Purgeable

Inner, Outer Walls Removable

FTIR Compatibility Most

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

114

Semiconductor Applications – FTIR Sampling Techniques OverviewFTIR spectroscopy has established itself as a method of choice inseveral areas of industrial manufacturing. One of them is the qualitycontrol of semiconductor wafers. Here, the FTIR spectrometersare commonly used to measure Phosphosilicate glass (PSG) andBorophosphosilicate glass (BPSG) films, epitaxial film (EPI) thicknessand interstitial oxygen and substitution carbon content.

Addition of boron and phosphorus to silicate glass duringmanufacturing improves the final product uniformity and reducesglass forming temperatures. Borophosphosilicate glass (BPSG)melts 100 degrees lower than Phosphosilicate glass (PSG) andoffers better flow characteristics. To maintain and optimize pro-duction processes, evaluation and verification of doping levels isrequired. FTIR allows simultaneous measurements of boron andphosphorus as well as the thickness of the glass in a quick andnondestructive procedure. The measurements are based on theinterpretation of transmission spectra and quantification of boron,phosphorus and Si-O bands. K-matrix or Partial Least Squares(PLS) methods are used for concentration/thickness calculations.

The epitaxial film (EPI) is a grown crystal layer having thesame crystallographic orientation as the substrate crystal wafer.The epitaxial film differs from the substrate base as it is modifiedwith various additives. Accurate, fast and precise determination ofthe EPI film thickness is important in the manufacturing processsince film thickness and uniformity play a critical role in etchingtime and device yield across the wafer surface. Specularreflectance is used in FTIR measurements of the epitaxial layerthickness. The infrared beam enters the EPI layer, reflects off thesubstrate surface and makes another pass through the film whenexiting. The film thickness calculations are based on one of thefollowing methods:

• Interference measurements – also called Constant AngleReflection Interference Spectroscopy or CARIS. This method uses the interference fringe pattern obtained in the specularreflectance experiment.

• Interferogram subtraction – based on the measurement of the primary and secondary interferogram of the sample andsubtraction of this signal from that of the reference material.

• Second Fourier Transform of spectral response data (CEPSTRUM).This method takes the difference of two spectral response curvesand performs a second Fourier transform which provides signalintensity vs. sample thickness information.

Oxygen and carbon may be introduced to the molten siliconduring the manufacturing process. These impurities can be trappedin the crystal lattice and affect final product characteristics. Forthese reasons, both need to be monitored and quantified. FTIRspectroscopy (transmission measurements) provides excellentmeans to perform this analysis. The application uses the absorptionbands of Si-C and Si-O-Si to calculate concentration levels of substitution carbon and interstitial oxygen. Beer’s law is typicallyused to determine their concentrations.

FTIR spectrum of BPSG on silicon wafer – transmission sampling mode

UV-Vis Accessories This is the most recent addition to the PIKE accessory catalog addressing the growing need formore sophisticated UV-Vis accessories. It includesresearch-style specular reflectance, polarizers, and automated sampling stages. To simplify yourshopping experience, we also include a selection ofmost used UV-Vis cuvettes and cuvette holders. It isour intention to significantly increase this UV-Visoffering in the near future – therefore, please contactus if you do not find an accessory you need, or aresearching for a customized product or solution. Inmost likelihood, we will be able to assist you withyour special requests.

UV-Vis VeeMAX™Variable Angle SpecularReflectance Accessory

Page 121

Falcon™ UV-VisPrecise Cell TemperatureControlled Accessory

Automated XY, R-Theta and Y-rotation Stages for UV-VisSpectrophotometers

Page 123

UV-Vis PolarizersManual and Automated Versions

Page 118

UV-Vis Spec Slide Mounted SpecularReflectance Accessories

Page 119

UV-Vis Cuvettes, Cells, Vials and Holders

Page 116

UV-Vis 85Spec™ Specular Reflectance Accessory

Page 120

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

116

UV-Vis Cuvettes, Cells, Vials and Holders

PIKE Technologies offers a selection of most popular cuvettes, vialsand cell holders used in the field of UV-Vis spectrophotometry.The cuvettes are manufactured using a heat fusing method whichensures that they are fused into a single homogeneous unit.Cuvettes are carefully annealed to remove any residual strain for maximum cell integrity and physical strength.

The cells can be used with most solvents and acidic solutions.Hydrofluoric acid (HF) and strong bases (pH >9) will negativelyaffect the cell surfaces.

UV-VIS CUVET TES SPECIFICATIONS

Window Thickness 1.25 mm

Beam Height (Z-dimension) 8.5 mm and 11 mm

Optical Glass Spectral Range 334 to 2500 nm

Far UV Quartz Spectral Range 170 to 2700 nm

NIR Quartz Spectral Range 220 to 3800 nm

Standard Rectangular Cuvettes

PATHLENGTH VOLUME OPTICAL GLASS (334-2500 nm) FAR UV QUARTZ (170-2700 nm) NIR QUARTZ (220-3800 nm)mm mL WITH PTFE COVER P/N WITH PTFE STOPPER P/N WITH PTFE COVER P/N WITH PTFE STOPPER P/N WITH PTFE COVER P/N WITH PTFE STOPPER P/N

1 0.40 162-0220 162-0228 162-0236 162-0244 162-0252 162-0260

2 0.70 162-0221 162-0229 162-0237 162-0245 162-0253 162-0261

5 1.70 162-0222 162-0230 162-0238 162-0246 162-0254 162-0262

10 3.50 162-0223 162-0231 162-0239 162-0247 162-0255 162-0263

20 7.00 162-0224 162-0232 162-0240 162-0248 162-0256 162-0264

40 14.00 162-0225 162-0233 162-0241 162-0249 162-0257 162-0265

50 17.50 162-0226 162-0234 162-0242 162-0250 162-0258 162-0266

100 35.00 162-0227 162-0235 162-0243 162-0251 162-0259 162-0267

Semi-micro Rectangular Cuvettes – 4 mm Opening

PATHLENGTH VOLUME WITH PTFE COVER/CLEAR WITH PTFE COVER/BLACK WALLED WITH PTFE STOPPER/CLEAR WITH PTFE STOPPER/BLACK WALLEDmm mL PART NUMBER PART NUMBER PART NUMBER PART NUMBER

OPTICAL GLASS (320-2500 nm)

5 0.70 162-0268 162-0273 162-0278 162-0283

10 1.40 162-0269 162-0274 162-0279 162-0284

20 2.80 162-0270 162-0275 162-0280 162-0285

40 5.60 162-0271 162-0276 162-0281 162-0286

50 7.00 162-0272 162-0277 162-0282 162-0287

FAR UV QUARTZ (170-2700 nm)

5 0.70 162-0288 162-0293 162-0298 162-0303

10 1.40 162-0289 162-0294 162-0299 162-0304

20 2.80 162-0290 162-0295 162-0300 162-0305

40 5.60 162-0291 162-0296 162-0301 162-0306

50 7.00 162-0292 162-0297 162-0302 162-0307

Micro Rectangular Cuvettes – 2 mm Opening

PATHLENGTH VOLUME WITH PTFE COVER/CLEAR WITH PTFE COVER/BLACK WALLED WITH PTFE STOPPER/CLEAR WITH PTFE STOPPER/BLACK WALLEDmm mL PART NUMBER PART NUMBER PART NUMBER PART NUMBER

OPTICAL GLASS (320-2500 nm)

5 0.35 162-0308 162-0313 162-0318 162-0323

10 0.70 162-0309 162-0314 162-0319 162-0324

20 1.40 162-0310 162-0315 162-0320 162-0325

40 2.80 162-0311 162-0316 162-0321 162-0326

50 3.50 162-0312 162-0317 162-0322 162-0327

FAR UV QUARTZ (170-2700 nm)

5 0.35 162-0328 162-0333 162-0338 162-0343

10 0.70 162-0329 162-0334 162-0339 162-0344

20 1.40 162-0330 162-0335 162-0340 162-0345

40 2.80 162-0331 162-0336 162-0341 162-0346

50 3.50 162-0332 162-0337 162-0342 162-0347


117

UV

-VI

SA

CC

ES

SO

RI

ES

Vials and Disposable CuvettesPART NUMBER DESCRIPTION

162-0205 5 mm Disposable Glass Vials, 6 mm x 50 mm (200/pk)



162-0348 Polystyrene, Disposable Cuvettes, 10 mm pathlength, 4.5 mL (100/pk)

162-0349 Polystyrene, Semi-micro Disposable Cuvettes, 10 mm pathlength, 1.5 mL (100/pk)


Cell Holders, Spacers and Stoppers PART NUMBER DESCRIPTION

111-3650 Cuvette Holder, 10 mm

111-3660 Adjustable Cuvette Holder 10-100 mm

161-2530 Slide Sample Holder, Cylindrical Cell, 10 – 20 mm

161-2540 Slide Sample Holder, Cylindrical Cell, 50 mm

161-2550 Slide Sample Holder, Cylindrical Cell, 100 mm

162-1201 Spacer for 1 mm Pathlength Cuvette



Notes: Please contact PIKE Technologies for replacement Teflon stoppers, covers,and for items not described on this list.

10 mm Cuvette Holder Adjustable Cuvette Holder

Cylindrical Cell Holder Spacers for 1, 2 and 5 mm cells

Cylindrical Cells with Teflon Stoppers – 22 mm Diameter

PATHLENGTH VOLUME OPTICAL GLASS FAR UV QUARTZ NIR QUARTZmm mL 320-2500 nm 170-2700 nm 220-3800 nm

10 2.80 162-1831 162-1841 162-1801

20 5.60 162-1832 162-1842 162-1802

50 14.10 162-1835 162-1845 162-1805

100 28.20 162-1840 162-1850 162-1810

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

118

UV-Vis Polarizers – Manual and Automated Versions

The sample material and sampling configuration dictate theneed for a UV-Vis polarizer. Typical materials that may require apolarizer during sampling are often crystals, films, paints, beamsplitters, coated glass, and anti-reflective, and anti-glare coatings.Additionally, we recommend using a polarizer for specularreflectance sampling at an angle of incidence greater than 15 degrees where the reflectivity becomes polarization dependent.

FEATURES OF THE UV-VIS POLARIZERS

• Glan-Taylor and UV Glan-Thompson designs

• High grade calcite

• High extinction ratio

• Manual versions – 1 degree settable scaling

• Automated version – 0.1 degree scaling resolution

• Fits in a standard 2 inch x 3 inch mount

Glan-Taylor field of view

UV Glan-Thompson field of view


UV-Vis Polarizers AccessoriesP A R T N U M B E R D E S C R I P T I O N

198-1623 Manual Glan-Taylor

198-1624 Manual UV Glan-Thompson

198-1625 Automated Glan-Taylor

198-1626 Automated UV Glan-Thompson

Note: Polarizers may not fit in the sample compartments of some smaller spectrophotometers. Please consult PIKE Technologies before placing an order.

UV-VIS POL ARIZERS S P E C I F I C AT I O N S

Glan-Taylor UV Glan-Thompson

Material Calcite Calcite

Spectral Range 250 – 2300 nm 250 – 2300 nm

Clear Aperture 12 mm 14 mm

Extinction Ratio 5 x 10-5 1 x 10-4

Manual Polarizer DimensionsWidth 29 mm 49 mmDepth 50 mm 50 mmHeight 146 mm 146 mm

Automated Polarizer DimensionsWidth 56 mm 56 mmDepth 50 mm 50 mmHeight 146 mm 146 mm

Angular Resolution, Manual 1° 1°

Angular Resolution, Automated 0.1° 0.1°

PIKE Technologies offers Glan-Taylor and Glan-Thompson UV-Vispolarizers. These take advantage of the birefringent properties of UV-quality calcite. An air interface is assembled between tworight angle calcite prisms in the Glan-Taylor polarizer whereas a UV-transparent cement separates the calcite prisms in the Glan-Thompson polarizer. In both styles, the polarized extraordi-nary ray passes through both prisms and the ordinary ray is inter-nally reflected and absorbed. The spectral range of these polariz-ers is 250 nm – 2300 nm. Due to the natural origin of calcite theachievable minimum wavelength fluctuates from polarizer topolarizer. However, at 250 nm the transmission throughput is no less than 25%.

Wavelength (nm) 2 5 0 3 0 0 4 0 0 > 5 0 0

Minimum Transmission (%) 2 5 4 0 6 5 8 5

Each polarizer type has a different field of view where theUV-Vis beam is polarized. The UV Glan-Thompson field of view iswider compared to the Glan-Taylor as shown in the figure.

Enhanced angular resolution of 0.1° is gained with the auto-mated version of the PIKE UV-Vis polarizer. This automated featureis advantageous where highly precise angular settings are requiredand for increasing the measurement simplicity for determining thepolarized orientation of a sample. By evaluating the transmission orreflectance of a sample as a function of the automated polarizerangle at a given wavelength, parallel and perpendicular orientationof the sample relative to the polarizer degree setting may bedetermined. The automated version includes integrated data collection with some commercial UV-Vis spectrophotometer software packages.

119

UV

-VI

SA

CC

ES

SO

RI

ES

UV-Vis Spec – Slide Mounted Specular Reflectance Accessories

PIKE Technologies relative fixed angle specular reflectance accessories for UV-Vis spectrophotometers span from near normalto grazing angle. This product sheet highlights our specularreflectance accessories featuring slide mount design. These covermid-range angles of incidence, between 15 – 60°, and may bealigned to maximize throughput.

In specular reflectance sampling, the light source is directed tocontact the sample at a given angle of incidence. Measured lightis collected from the equivalent angle. Typical samples includesemiconductors, anti-reflective coatings, color filters, semi-trans-parent and highly reflective mirrors, optical materials, reflectionfilters, multiple layers, solar mirrors, and solar controlling filmson glass. Measured parameters of interest include film thickness,material reflectivity, and coating uniformity and homogeneity.

F E AT U R E S A N D A P P L I C AT I O N S O F F I X E D A N G L E

S P E C U L A R R E F L E C TA N C E A C C E S S O R I E S

• Fixed angle reflectance accessories including 15, 20, 30, 45, and 60 degrees

• Slide mount design for easy installation

• Optical and anti-reflective coatings testing

• Gloss measurements

• Determining reflectivity of mirrors

• Film thickness calculations

Optical geometry schematic for mid-range fixed anglespecular reflectance accessory

Anti-reflective optics coating spectrum collected using the PIKE UV-Vis 60Spec

SPECUL AR REFLECTANCE ACCESSORY S P E C I F I C AT I O N S

Mounting Method Slide mount

Accessory Dimensions

Slide Mount 2" x 3"Length 3.75"

Mask Aperture 4 mm x 7 mm

Optical Mirrors UV optimized aluminum


Fixed Angle Specular Reflectance AccessoriesP A R T N U M B E R D E S C R I P T I O N

121-1500 UV-Vis 15Spec





300-0300 UV Aluminum Mirror (25.4 mm x 25.4 mm)

121-0500 Aperture Mask (4 mm x 7 mm)

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

120

UV-VIS 85Spec – Specular Reflectance Accessory

FEATURES OF THE UV-VIS 85SPEC

• Small footprint, compact design


• Baseplate mount for stable operation and collection of high quality spectra

• Thin films and coatings measurements

AR coated ZnSe crystal measured using the 85Spec Specular Reflectance Accessory.

UV-VIS 85SPEC S P E C I F I C AT I O N S

Mounting Method Baseplate

Accessory DimensionsWidth 105 mmHeight 76 mmDepth 84 mm

Mask Aperture 35 mm x 3 mm


Optical diagram of the UV-Vis 85Spec Specular Reflectance Accessory.

The 85Spec is an 85 degree specular reflectance accessory developed for UV-Vis applications. The accessory is used to analyzemirror-like planar surfaces and thin films on planar surfaces. The grazing angle (85°) measurements give the longest possiblepathlength through coated samples.

Pre-mounted on a baseplate specific to your UV-Vis spectrophotometer, the 85Spec is an easy-to-use accessory. The mounting allows the 85Spec to be inserted and removedfrom the sample compartment without alignment.


UV-Vis Specular Reflectance AccessoryP A R T N U M B E R D E S C R I P T I O N

121-85XXX UV-Vis 85Spec – Specular Reflectance AccessoryIncludes an Al substrate alignment mirror and sample mask

Note: XXX are instrument codes listed in the table below.

UV-Vis 85Spec Replacement PartsP A R T N U M B E R D E S C R I P T I O N


121-0501 Aperture Mask (35 mm x 3 mm)

XXX Spectrophotometer CodesC O D E S P E C T R O P H O T O M E T E R

100 Agilent/Varian – Cary 50

110 Agilent/Varian – Cary 100, 300

120 Agilent/Varian – Cary 4000, 5000, 6000i

600 Jasco – 600 series

700 PerkinElmer Lambda 650, 750, 850, 950 and 1050

730 PerkinElmer – Lambda 25, 35, 45

200 Shimadzu – 1600 and 1700

210 Shimadzu – 1800 Series

400 Thermo Fisher Scientific – Evolution 300/600

410 Thermo Fisher Scientific – Evolution 200

Note: Contact PIKE Technologies if you do not find your spectrophotometer code listed.

121

UV

-VI

SA

CC

ES

SO

RI

ES

UV-Vis VeeMAX – Variable Angle Specular Reflectance Accessory

FEATURES AND APPLICATIONS OF THE UV-VIS VEEMAXVARIABLE ANGLE SPECULAR REFLECTANCE ACCESSORY

• Selectable angle of incidence – from 30 to 80 degrees in onedegree increments

• Film and coating thickness measurements at optimized angleof incidence

• Grazing angle measurements for the longest path through anultra-thin films

• Characterization of variable reflectivity materials

Optical geometry schematic for UV-Vis VeeMAX variable angle specular reflectance accessory

Specular reflectance collected at two different angles of incidence (AOI)for an anti-reflective coating

UV-VIS VEEMAX S P E C I F I C AT I O N S

Mounting Method Baseplate

Nominal Accessory Dimensions (w, h, d vary with spectrophotometer type)Width 145 mmHeight 158 mmDepth 135 mm

Minimum Beam Height 50 mm

Mask Aperture 7 mm x 4 mm13 mm x 4 mm25 mm x 4mm



UV-Vis VeeMAX AccessoryP A R T N U M B E R D E S C R I P T I O N

013-10XXX UV- Vis VeeMAX Variable Angle Specular Reflectance Accessory

Note: Contact PIKE for the XXX spectrophotometer code.

UV-Vis VeeMAX Replacement PartsP A R T N U M B E R D E S C R I P T I O N


013-4015 Aperture Mask Set (7 mm, 13 mm, and 25 mm x 4 mm)








200 Shimadzu – 1600 and 1700





In specular reflectance sampling, the light source is directed tocontact the sample at a given angle of incidence. Measured lightis collected from the equivalent angle. Typical samples includesemiconductors, anti-reflective coatings, spectral wavelength filters,semi-transparent and highly reflective mirrors, optical materials,reflection filters, multiple layers, solar mirrors, and solar controllingfilms on glass. Measured parameters of interest include film thickness,material reflectivity, and coating uniformity and homogeneity.

With the UV-Vis VeeMAX™ accessory find versatility for specularreflectance measurements. The angle of incidence from 30 to 80°is easily changed by turning the angle setting dial. This flexibilityallows for optimization of spectra quality for film and coatingmeasurements. In other applications where it is desirable to study the effect of incident angle upon reflected radiation, the UV-Vis VeeMAX offers a sampling solution. Typical sample materials

are reflectors, bandpass filters, and hot and cold mirrors. The UV-VisVeeMAX makes an ideal accessory used to replicate real-world situations such as the effect of a rising and setting sun on absorbanceefficiency of solar collectors and architectural glass performance.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

122

Falcon UV-VIS – Precise Cell Temperature Control Accessory

FEATURES OF THE FALCON UV-VIS

• Fast and easy analysis of samples under precise Peltier temperature control

• Choice of cuvette and vial adapters

• Compatible with 1 mm to 10 mm pathlength cuvettes anddisposable 5 mm to 12 mm vials

• Excellent thermal accuracy and precision

• Available for selected UV-Vis spectrophotometers

The PIKE Technologies UV-Vis Cell Temperature Control Accessoryis an excellent choice for analysis of liquid samples that requireprecise temperature control. The accessory is well suited for pharmaceutical, life science and general industrial applications.Temperature range of the accessory is 5 °C to 105 °C with +/- 0.5%accuracy. Heating and cooling is controlled by a built-in Peltierdevice. The Peltier element provides for reproducible rampingand for reaching target temperatures quickly and reliably. Thesystem is driven by a Digital Temperature Controller – directly, orvia PC. Individual sample holders are designed to accommodatestandard 1 mm to 10 mm cuvettes (1, 2 and 5 mm cuvettes requireuse of spacers) and 5 mm, 8 mm and 12 mm glass vials. Sampleholders are pin positioned to ensure maximum reproducibility.

The complete Falcon UV-VIS configuration requires the accessorybase, cell holder, and one of the available temperature controllers.The Falcon accessory is compatible with a selected range of UV-Vis spectrophotometers.

FALCON UV-VIS S P E C I F I C AT I O N S



Accuracy +/- 0.5%

Voltage 15 VDC



Digital +/- 0.5% of set pointDigital PC +/- 0.5% of set point, graphical setup,

up to 10 ramps, USB interface


Output Voltage variable 3–12 VDC/50 W max.

Dimensions

Width 120 mm, Depth 175 mm, Height 90 mm (without the spectrophotometer

baseplate and mount)


Heated UV-Vis Transmission AccessoryP A R T N U M B E R D E S C R I P T I O N

110-60XXX UV-Vis Falcon BaseIncludes: Temperature controlled base. Digital TemperatureController and sample holder need to be selected from thetables below for complete system.

Note: Please insert XXX code found at the spectrophotometer table at the bottom ofthis page.



076-1430 Digital Temperature Control Module PC Control (USB)

Sample Holders and SpacersP A R T N U M B E R D E S C R I P T I O N




111-3640 1 cm Cuvette Holder

162-1201 Spacer for 1 mm Cuvette



Notes: Spacers for short pathlength cuvettes are designed to work only with 1 cmCuvette Holder.

Please refer to pages 116 –117 of this catalog for the selection of cuvettes and vials available for this accessory.








200 Shimadzu – 1600 and 1700






123

UV

-VI

SA

CC

ES

SO

RI

ES

Automated XY, R-Theta and Y-rotation Stages for UV-Vis Spectrophotometers

PIKE Technologies offers a wide range of computer controlledaccessories for translating and rotating samples in the spectro -photometer beam. These tools enable mapping of sample surfacesand generating spectroscopy data as a function of sample position.Suitable for determination of film and coating thickness, multilayerfilm analysis, reflectivity studies, and characterization of opticalmaterials. Applications include transmittance and specular reflectancemeasurements at normal and variable incident light angles. XY control for microplate type configurations (in-sample compartment and with optical fibers) is also available.

Vertical and Horizontal R-Theta, Translation/Rotation These accessories are suitable for analyzing small and large sizesamples including coated and uncoated glass, optical filters, solarpanels and similar materials. The support ring mounts on theaccessory’s drive and is rotated and translated laterally to producean R-theta motion covering the entire sampling range of theaccessory. Each system incorporates two precision stepper motors for rotation and translation of the plate.

Vertical XY Sampling StageDesigned for research type UV spectrophotometers and typicallyused for precision mapping of large, flat samples. Suitable forthin coating studies and material quality control. Uses similar to R-Theta accessory sample mount, but samples are translatedvertically and horizontally by precision stepper motors.

Horizontal XY Stage – In Sample Compartment or FiberOptic ConfigurationsThe XY stage is designed to work with standard 24, 48 or 96 wellmicroplates but can be also modified to accommodate other sampleshapes. The unit features a horizontal XY stage with both axes drivenby high precision stepper motors for speed and reproducibility.

RotatIR, for %T/A Measurements at Various Beam ofIncidence AnglesThis accessory is designed for automated selection of the trans-mission angle of the UV-Vis beam that enters the sample. This isachieved by mounting and rotating the sample in the adjustableangle holder. A full set of spectral data may be collected by pre-defining the required measurement angles from the software. TheRotatIR features a standard 2" x 3" slide mount for easy positioningof different types of transmission samples and sample holders.

All motorized accessories are driven by the PIKE Motion ControlUnit. The operation is managed by the AutoPRO™ software whichprovides full user programmability and easy to learn “point-and-click” environment. Polar or X and Y coordinates may be used todefine test points. The AutoPRO software allows complex testsequences to be set up, stored as methods and implemented for full flexibility. The Motion Control Unit offers RS 232 or USBinterfaces, and incorporates a smart power supply and works with 85-265 VAC, 47-63 Hz power lines.

Each automated accessory is tailored to meet specific sampling needs. This includes adjustments for sample shape/size,and the type of spectroscopic data required. Please contact PIKE Technologies to verify that the selected stage can be integrated into your spectrophotometer’s sample compartmentand produce desired information.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

124

N O T E S

Standards, Software and Databases We strive to provide you with useful sampling

tools for spectroscopy and offer these additional

products and information to serve your laboratory

requirements. If you have not found the exact

sampling tool or information within our catalog,

please contact us. Your spectroscopy sampling

requirements may become one of our product

offerings of the future.

Spectral Databases ATR and Transmission Versions for Your FTIR

Page 130

PIKECalc™ SoftwareFor FTIR sampling computations

Page 129

Reference Standards For Calibrating Your Spectrometers

Page 126

Reference Standards – For Calibrating FTIR Spectrometers

FTIR spectrometers are highly accurate and reliable measurementtools. Their internal referencing laser (Connes advantage) is agreat leap forward in wavenumber accuracy and repeatability.Still it is often required by regulatory agencies and operating procedures, to calibrate the spectrometer. PIKE Technologiesoffers several new products to assist in this task.

PIKE Technologies offers several versions of polystyrene reference materials for FTIR spectrometer calibration. The 1.5 miland 55 micron thick polystyrene are generally specified for cali-brating wavenumber accuracy. PIKE also offers a NIST traceablepolystyrene version of these products which includes the referencematerial, calibration result for the material and its traceabilitydocumentation. The 3.0 mil polystyrene reference is generallyused to calibrate the FTIR zeroes – or linearity.

The Specular Reflectance Standard is a unique material for calibration of your reflectance measurement system. The standard isa specially treated germanium element which only allows reflectionfrom its front surface – thereby providing a reflection value whichcan be calculated relative to Fresnel equations. The SpecularReflectance Standard includes documentation to trace the specularreflectance to published refractive index data.

The Specular Reflectance Standard is compatible with the following PIKE Technologies products; VeeMAX II, 30Spec, 45Specand 10Spec.

126

F E AT U R E S O F R E F E R E N C E S TA N D A R D S

• Mid-IR and NIR spectral regions products

• Transmission, reflection and ATR versions

• Traceable versions available

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

126

Polystyrene Reference Standards – for calibrating FTIR wavenumber accuracy

Specular Reflectance Standard – for calibrating reflectance measurement system

Comparison of measured and calculated reflectance for the SpecularReflectance Standard using the PIKE 10Spec accessory

Polystyrene Reference StandardsP A R T N U M B E R D E S C R I P T I O N

162-5420 1.5 mil Polystyrene Reference Standard

162-5430 3.0 mil Polystyrene Reference Standard

162-5440 55 micron Polystyrene Reference Standard

162-5450 NIST Traceable Polystyrene Reference Standard

Notes: Polystyrene reference standards are mounted in a 2" x 3" card and are compatible with all FTIR spectrometers.

Specular Reflectance StandardP A R T N U M B E R D E S C R I P T I O N

162-5460 Specular Reflectance Standard

Notes: Compatible with 10Spec, 30Spec, 45Spec and VeeMAX II.


127

ST

AN

DA

RD

S, S

OF

TW

AR

EA

ND

DA

TA

BA

SE

S

For diffuse reflectance measurements in the NIR and UV-Visiblespectral region, it is often desirable to measure against the highestpossible reflectance material. The NIR and UV-Vis DiffuseReflectance Standards are available in highly reflective diffusegold and PTFE. Each standard is certified against a NationalResearch Council of Canada traceable plaque standard.

Diffuse reflectance sampling in the mid-infrared region isused to measure the reflectance of powders, films, painted panels,and other samples. Exhibiting sharp peaks throughout the mid-IRspectral region, the Mid-IR Diffuse Reflectance WavelengthStandard is used to verify and calibrate for wavelength accuracyfor diffuse reflectance measurements. This standard is NIST traceable to NIST 1921b and an analysis certificate is included.

Diffuse Gold Reference Standard

Measured reflectivity of Diffuse Gold Reference standard

Mid-IR Diffuse Reflectance Wavelength Standard

Mid-IR Diffuse Reflectance Standard spectrum

NIR and UV-Vis Diffuse Reflectance StandardsP A R T N U M B E R D E S C R I P T I O N

162-5480 Diffuse PTFE Reference (1" optical area)

162-5481 Diffuse Gold Reference (1" optical area)

162-5482 Diffuse Gold Reference (1.7" optical area)

Mid-IR Diffuse Reflectance StandardsP A R T N U M B E R D E S C R I P T I O N

162-5485 Mid-IR Diffuse Reflectance Wavelength Standard (1.65" optical area)

162-5486 Mid-IR Diffuse Reflectance Wavelength, recertification


PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

128

ATR spectra are somewhat different than those produced bytransmission sampling techniques – both in relative intensity ofthe absorbance bands and also the position of the bands.

To assist with calibrating your ATR/FTIR system, PIKETechnologies offers a new ATR Reference Standard. The ATRReference Standard is available as a standard material and also ina version which includes a recommended validation procedurefor your ATR/FTIR system.

In the near infrared (NIR) spectral region, PIKE Technologiesoffers its NIR Wavelength Standard for calibrating a NIR spec-trometer. The NIR Wavelength Standard meets USP wavelengthrequirements, provides calibration beyond 2.0 µm and is NISTtraceable. This standard is compatible with NIR analysis in the diffuse reflectance sampling mode. The NIR Wavelength Standardincludes analysis certificate and traceability documentation.

ATR Reference Standard

ATR Reference Standard Spectrum

NIR Wavelength Standard

NIR Wavelength Standard Spectral Data. (Upper green spectrum) PIKENIR Wavelength Standard. (Lower red spectrum) NIR standard fromanother supplier.

ATR Reference StandardP A R T N U M B E R D E S C R I P T I O N

162-5470 ATR Reference Standard

162-5475 ATR Reference Standard with Recommended ValidationProcedure and Validation Certificate

162-5476 ATR Reference Standard, recertification

Notes: Compatible with MIRacle, GladiATR and VeeMAX II with ATR.

NIR Wavelength StandardP A R T N U M B E R D E S C R I P T I O N

048-3070 Traceable NIR Reference Standard

048-3071 Traceable NIR Reference Standard, recertification

Notes: Includes traceability measurement documentation.


129

ST

AN

DA

RD

S, S

OF

TW

AR

EA

ND

DA

TA

BA

SE

S

PIKECalc software is easy-to-use – just select the type of computation,enter values from your spectral data and click on the calculatebutton. An instant calculation is performed.

PIKECalc eliminates the need to search through literature references to find the correct conversions and formulae and givesyou immediate results. All formulae and equations are documentedin the software, if you wish to reference our mathematics. Helpand how to use PIKECalc is included within the software.

PIKECalc is compatible with current versions of Microsoftoperating systems and is a free-standing program which can beused with all FTIR spectral data.

Please ask us about other FTIR spectroscopy calculations youmay need.

PIKECalc Software – For FTIR Sampling Computations

F E AT U R E S O F P I K E C A L C

• Convert from wavelength (microns and nanometer) to wavenumber

• Calculate depth of penetration, critical angle, effective pathlength, effective angle of incidence and number ofreflections for ATR

• Calculate cell pathlength, thickness of free-standing film and thickness of coating



007-0300 PIKECalc Software

Notes: PIKECalc is loaded on a CD disk for upload to your PC and operates withcurrent versions of Microsoft operating systems.

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

130

Spectral search is greatly improved when using databases collectedusing the same sampling mode – especially when the samplingmode is ATR. PIKE Technologies offers a large selection of ATRspectral databases.

The Aldrich ATR Spectral Database contains 18,513 spectra produced by the Aldrich Chemical Company. The collection includesorganic and inorganic compounds and also includes polymersand industrial chemicals. Spectral range is 4000 – 650 cm-1.

The IChem ATR Spectral Database contains 13,557 spectra produced by Fine Chemical manufacturers in Japan. This collec-tion includes organic and inorganic compounds, basic polymersand industrial chemicals. Spectral range is 4000 – 650 cm-1.

The Aldrich-IChem ATR Spectral Database Package includes36,639 spectra, a combination of all ATR spectra from both databases – with no duplicate entries.

A wide variety of applications spectral Database packages areformed from the Aldrich ATR and the IChem ATR databases.

All spectral databases are supplied on a CD and operate withWindows® 2000 and Windows XP.

These spectral databases are compatible with ABB-HorizonMBTM, ACD/Labs, Bruker Opus, Jasco-Spectra Manager Suite,Lumex-Spectralum, PerkinElmer Spectrum, Mattson WinFirst,Shimadzu IRSolution and HyperIR, LabControl Spectacle, ThermoOMNIC, Varian Resolutions, Grams 32 and SpectralID softwarepackages. A USB port is required on your PC where a dongle isinstalled for copy protection.

ATR Spectral Databases – Optimize Search Results for ATR Spectral Data


ATR Spectral DatabasesP A R T N U M B E R D E S C R I P T I O N

008-1000 Aldrich ATR Spectral Database (18,513 spectra)

008-2000 IChem ATR Spectral Database (13,557 spectra)

008-3000 Aldrich-IChem ATR Spectral Database Package (36,639 spectra)

Notes: The spectral databases include a USB based device – dongle for copy protection. Please designate either 2 cm-1 or 4 cm-1 spectral data format.

ATR Application Specific Spectral DatabasesP A R T N U M B E R D E S C R I P T I O N

008-3002 ATR Applications – Polymers and Polymer Additives (4,520 spectra)

008-3003 ATR Applications – Food Additives and Food Packaging(2,762 spectra)

008-3004 ATR Applications – Solvents (667 spectra)

008-3005 ATR Applications – Organometallics and Inorganics (2,149 spectra)

008-3006 ATR Applications – Biochemicals (5,343 spectra)

008-3007 ATR Applications – Aldehydes and Ketones (3,482 spectra)

008-3008 ATR Applications – Alcohols and Phenols (2,671 spectra)

008-3009 ATR Applications – Esters and Lactones (4,170 spectra)

008-3010 ATR Applications – Hydrocarbons (1,175 spectra)

008-3011 ATR Applications – Flavors, Fragrances and Cosmetic Ingredients (2,716 spectra)

008-3012 ATR Applications – Pesticides (1,820 spectra)

008-3013 ATR Applications – Semiconductor Chemicals (919 spectra)

008-3014 ATR Applications – Forensic (3,579 spectra)

008-3015 ATR Applications – Dyes, Pigments and Stains (2,857 spectra)

008-3016 ATR Applications – Sulfur and Phosphorus Compounds (5,336 spectra)

008-3017 ATR Applications – Hazardous Chemicals (3,730 spectra)

008-3018 ATR Applications – Hazardous and Toxic Chemicals (8,136 spectra)

008-3020 ATR Applications – Pharmaceuticals, Drugs and Antibiotics(2,715 spectra)

008-3021 ATR Applications – High Production Volume (HPV) Chemicals(1,315 spectra)

008-3025 ATR Applications – Coatings (1,809 spectra)

008-3026 ATR Applications – Paints (2,507 spectra)

Notes: The spectral databases include a USB based device – dongle for copy protection. Please designate either 2 cm-1 or 4 cm-1 spectral data format. Specifyyour FTIR software for correct format.

F E AT U R E S O F AT R S P E C T R A L D ATA B A S E

• Select from databases with over 32,100 ATR spectra

• All spectra collected using FTIR spectrometers and a singlereflection ATR

• Complete collections and applications databases available

• Compatible with most FTIR software

131

ST

AN

DA

RD

S, S

OF

TW

AR

EA

ND

DA

TA

BA

SE

S

PIKE Technologies offers a large collection of high quality, spec-tral databases collected in the transmission sampling mode.

The SDBS Transmission Spectral Databases include over50,000 spectra produced by Fine Chemical manufacturers in Japan.All spectra were collected at the Japanese National Laboratoriesunder highly controlled conditions with secondary verification ofthe materials by NMR and MS. Data is measured using severalsample preparation methods. Spectral range is 4000 – 400 cm-1.

The SDBS Transmission by KBr Pellet Spectral Database contains 22,995 spectra. This collection includes organic and inorganic compounds, basic polymers and industrial chemicals.

The SDBS Transmission by Liquid Film Spectral Database contains 7,018 spectra. This collection includes organic compoundsand industrial chemicals.

The SDBS Transmission by Nujol Mull Spectral Database contains 21,127 spectra. This collection includes organic and inorganic compounds and industrial chemicals.

A wide variety of applications spectral Database packages areformed from the KBr Pellet and Liquid Film Spectral databases.

All spectral databases are supplied on a CD and operate withWindows® 2000 and Windows XP.

These spectral databases are compatible with ABB-HorizonMBTM, ACD/Labs, Bruker Opus, Jasco-Spectra Manager Suite,Lumex-Spectralum, PerkinElmer Spectrum, Mattson WinFirst,Shimadzu IRSolution and HyperIR, LabControl Spectacle, ThermoOMNIC, Varian Resolutions, Grams 32 and SpectralID softwarepackages. A USB port is required on your PC where a dongle isinstalled for copy protection.


Transmission Spectral DatabasesP A R T N U M B E R D E S C R I P T I O N

008-4001 SDBS Transmission by KBr Pellet Spectral Database (22,995 spectra)

008-4004 SDBS Transmission by Liquid Film Spectral Database (7,018 spectra)

008-4005 SDBS Transmission by Nujol Mull Spectral Database (21,127 spectra)

Notes: The spectral databases include a USB based device – dongle for copy protection. Please designate either 2 cm-1 or 4 cm-1 spectral data format.

Application Based Spectral DatabasesP A R T N U M B E R D E S C R I P T I O N

008-5002 Transmission Applications – Polymers and Polymer Additives (1,273 spectra)

008-5003 Transmission Applications – Food Additives and FoodPackaging (1,684 spectra)

008-5004 Transmission Applications – Solvents (668 spectra)

008-5005 Transmission Applications – Organometallics and Inorganics(1,445 spectra)

008-5006 Transmission Applications – Biochemicals (4,590 spectra)

008-5007 Transmission Applications – Aldehydes and Ketones (4,226 spectra)

008-5008 Transmission Applications – Alcohols and Phenols (2,744 spectra)

008-5009 Transmission Applications – Esters and Lactones (4,335 spectra)

008-5010 Transmission Applications – Hydrocarbons (1,417 spectra)

008-5011 Transmission Applications – Flavors, Fragrances andCosmetic Ingredients (1,912 spectra)

008-5012 Transmission Applications – Pesticides (958 spectra)

008-5013 Transmission Applications – Semiconductor Chemicals(664 spectra)

008-5014 Transmission Applications – Forensic (1,555 spectra)

008-5015 Transmission Applications – Dyes, Pigments and Stains(1,473 spectra)

008-5016 Transmission Applications – Sulfur and Phosphorus Compounds (5,025 spectra)

008-5017 Transmission Applications – Hazardous Chemicals (2,664 spectra)

008-5018 Transmission Applications – Hazardous and Toxic Chemicals (6,604 spectra)

008-5020 Transmission Applications – Pharmaceuticals, Drugs andAntibiotics (2,806 spectra)

008-5021 Transmission Applications – High Production Volume (HPV) Chemicals (1,123 spectra)

Notes: The spectral databases include a USB based device – dongle for copy protection. Please designate either 2 cm-1 or 4 cm-1 spectral data format. Specifyyour FTIR software for correct format.

Transmission Spectral Databases – High Quality Spectral Data for Optimized Search Results

FE AT U R E S OF TR A N S M I S S I O N SP E C T R A L DATA B A S E

• Select from databases with over 50,000 transmission spectra

• All spectra collected using FTIR spectrometers and transmissionsampling mode

• Complete collections and applications databases available

• Compatible with most FTIR software

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

132

N O T E S

133

IN

DE

X

Alphabetical Index

A

10Spec, specular reflectance 47



4X Beam Condenser 74

6X Beam Condenser 74


85Spec, UV-Vis 120

Abrasion Sampling Kit 32

Abrasion Sampling Disks, SiC 32, 36

Abrasion Sampling Disks, Diamond 32, 36

Absolute reflectance accessory 48

AGA, specular reflectance 46

Alignment mirror, 10Spec, 30Spec 44, 47

Alignment mirror, 80Spec 45

Alignment mirror, VeeMAX II 43

Alignment mirror, diffuse reflectance

32, 34, 36, 38

AMTIR crystal plate, ATRMAX 22

AMTIR crystal plate, HATR 18

AMTIR crystal plate, MIRacle 11

AMTIR, properties 105

Analysis of powders, diffuse reflectance 39

Angle of incidence 49

Anvils for Die Kit 87, 88

Applications, semiconductor wafers 108, 109, 114

ATR, cooled 13, 15, 19, 21, 22

ATR crystal properties 28, 29

ATR crystals, refractive index 28, 29

ATR crystals, spectral range 9, 28, 29

ATR, GladiATR 12

ATR, GladiATR Vision 14

ATR, heated 13, 15, 22

ATR, products 7

ATR, single reflection 8, 12

ATR, Theory and Applications 27

ATR, variable angle 26

ATRMax II, ATR accessory 20

ATRMax II, motorized 22

ATRMax II, variable angle ATR 22

ATR, MIRacle 8

ATR, VeeMAX 23

Auto-CrushIR hydraulic press 91

AutoDiff, automated diffuse reflectance 36

Automated diffuse reflectance 36

Automated transmission 58, 76, 78

Automated specular reflectance 43

Automated Wafer Analysis 109

AutoPRO software 20, 21, 23, 25, 36, 37, 42,

43, 52, 76, 77, 78, 79, 108, 109, 110

B

BaF2, disks, windows

80, 81, 82, 85, 95, 96, 97, 99, 100, 102

BaF2, properties 105

Beam condensers 73

Beer-Lambert Law 103

Bolt Press 4, 87, 94

Boron 114

BPSG 108, 109, 114

C

CaF2, disks, windows

25, 80, 82, 85, 95, 96, 97, 102

CaF2, properties 105

Carbide blade, Micro Plane 70,71

Card, sample holder 94

Catalytic heat chambers 33

Cell holders 4, 80, 94, 116, 117

Cells, long-path, quartz 101

Chunks, KBr 93, 95

Comprehensive Transmission Kit 3

Compression cells 71

Compression cells, diamond 72

Constant path cells 82

Critical angle 27

CrushIR 90, 91

Crystal polishing kit 98

Crystals, properties 28, 29, 105

CsI, disks, windows 82, 95, 96, 97

CsI, properties 105

D

Delivery terms 145

Degree of polarization 28, 53, 54

Demountable liquid cell 2, 3, 4, 80, 81, 84, 85

Depth of penetration 20, 23, 26, 27, 28

Diamond blade, Micro Plane 70, 71

Diamond compression cell 72

Diamond crystal plate, MIRacle 9, 11

Diamond, properties 105

Diffuse reflectance, heating 33

Diffuse reflectance, products 31

Diffuse reflectance, automated 36

Diffuse reflectance, theory and applications 39

Dilution, KBr 105

Disks, IR materials 95, 96, 97

E

EasiDiff, diffuse reflectance 5, 6, 32

Educational Sampling Kit 4

Effective pathlength 27

EPI 109, 114

Evanescent wave 27, 28

External sample module 113

Extinction ratio, polarizers 53, 118

F

Falcon Mid-IR transmission accessory 84

Falcon NIR transmission accessory 86

Falcon UV-Vis temperature control 122

FAX order form 144

Fiber optic accessories 66

Film thickness 27, 42, 44, 45, 46, 49, 50, 53

Flat plate, ATRMAX 21, 22

Flat plate, HATR 17, 18

FlexIR, Mid-IR fiber optic accessory 64

FlexIR, NIR fiber optic accessory 66

Flow-through plate, HATR 19

Flow-through plate, MIRacle 11

Fluorolube 2, 3, 4, 93, 105

Fringe pattern 104, 114

FTIR model codes Fold out flap

G

Gas analysis 100, 101, 111

Gas cells, flow through 99, 101, 102

Gas cells, heated 100

Gas cell, holders 94, 99

Gas cells, long path 101

Gas cells, short path 99

Ge, crystal plate, HATR 19

Ge, crystal plate, MIRacle 11

Ge crystal plate GladiATR 13

Ge, disks, windows 95, 96, 97

Ge, properties 105

GladiATR 12, 13

Grazing angle, specular reflectance

45, 46, 49, 50, 54

Grazing angle, applications 49

Grinder, SkakIR sample 92

Grinding, samples 92, 93, 104

Guarantee 145

H

Hand Press 87, 104

HATR 16, 17, 18, 19

HATRPlus 16, 17, 18

HATR, out-of-compartment 16

Heated, ATR 21

Heated, diffuse reflectance 33

Heated platens accessory 89

High pressure clamps 10, 11

Holders, sample, cell 73, 74, 77, 86, 94

Holder, universal 74, 94

Holder, pellets 94

Holder, sample cards 94

Horizontal ATR (HATR) 16, 17, 18, 19, 20

How to order 145

Hydraulic die 87

Hydraulic presses 90, 91

I

Index of refraction 39, 49

Infrared reference materials 105

Inserts for auto samplers 108, 110

Inserts for wafer holders 108, 110

Integrating sphere, products 55

Integrating sphere, mid-IR 56

Integrating sphere, NIR 58

International distribution 145

IR disks, windows 85, 95, 96, 97

K

KBr, chunks, powder 2, 3, 4, 5, 6, 32, 34,

38, 87, 88, 90, 91, 92, 93, 95

KBr, dilution ratio 105

KBr, disks, windows 57, 70, 71, 74, 80,

81, 82, 85, 99, 100, 102, 112

KBr, pellet 74, 87, 88, 90, 91, 131

KBr, properties 105

Kit, abrasion 32, 34, 36, 38

Kit, crystal polishing 98

Kit, sample preparation 5, 6, 32, 34, 36, 38

Kit, reflectance sampling 5

Kit, transmission sampling 2, 3, 4

Kramers-Kronig transform 50

KRS-5, disks, windows 95, 96, 97

KRS-5, ATRMAX plates 22

KRS-5, HATR plates 18, 19

KRS-5, VATR crystal 26

Kubelka-Munk conversion 40

Kubelka-Munk equation 40

L

Lambertian scatterer 56, 57, 60, 61

Library spectra 130, 131

Liquid cells 80, 81, 82, 83, 85

Liquid cells, demountable 80, 81, 85

Liquid cells, holder 80, 81, 83, 84

Liquid cells, sealed 82

Liquids plate, MIRacle 11

Liquid sampling, transmission 80, 81, 82, 83

Long path gas cells 101

Long-path quartz liquid cells 83

M

Magnetic film holder 2, 3, 4, 89, 94

MAP300, wafer analysis 109

MAP300 inserts 110

MappIR, wafer analysis 109

MappIR inserts 110

Masks, 10Spec 47

Masks, 30Spec 5, 6, 44

Masks, 80Spec 45

Masks, VeeMAX 43

Materials, IR properties 105

Micro ATR 68, 69, 70

Micro Compression Cell 71

Micro Diamond Cell 72

µMAX, IR microscope 68, 69, 70

Micro Plane 71

Microscope, IR 68

Microscope, µMAX 68, 69, 70

Microtiter plates 37

Mid-IR, Falcon 84

MIRacle, ATR accessory 8, 11

MIRacle, crystal plates 9, 11

MIRacle, flow through options 11

MIRacle, heating options 11

MIRacle, pressure clamps 11

Mirror, alignment, 10Spec, 30Spec 44, 47

Mirror, alignment, 80Spec 45

Mirror, alignment, AGA 46

Mirror, alignment, VeeMAX 43

Monolayer analysis 23, 42, 43, 45, 49

Mortar and pestle 2, 3, 4, 5, 6, 32, 34,

87, 88, 90, 91, 93, 104

Motorized VeeMAX 43

Mull cell 80

Mull cell, holders 74, 80

Mull cell, spacers 80

Mull cell, windows 80

Mull agents 93

Multi-reflection ATR 16

Multi-SamplIR, transmission 76

N

NaCl disks and windows

80, 81, 82, 85, 95, 96, 97, 99, 102

NaCl properties 105

Needle plate 81, 85

NIR, AutoDiff 36

NIR, Heated Transmission 33

NIR, diffuse reflectance 39

NIR, Falcon 86

NIR, X,Y Autosampler 37

NIST Traceable NIR Standard 59

NIST Traceable Polystyrene 126

Nujol 2, 3, 4, 93, 131

Number of reflections 27

O

Optical materials 95, 96, 97, 98

Order form 144, 145

O-rings die kit 88

O-rings, liquid cells 80, 81, 94

O-rings mull cells 80, 81, 94

Out-of-compartment ATR 16

P

Pads, crystal polishing kit 98

Payment terms 145

Pellet preparation 87, 88

Pellet press 88, 90, 91

Pestle 2, 3, 4, 5, 6, 32, 34, 87,

88, 90, 91, 93, 104

PIKECalc Software 129

Polarization, thin films 53

Polarizers 51

Polarizers, automated 52

Polarizers, manual 52

Polarizers, UV-Vis 118

Polyethylene, disks and windows

80, 81, 95, 96, 97

Polyethylene, properties 105

Powder, KBr 2, 3, 4, 5, 6, 32, 34, 38,

87, 88, 90, 91, 92, 93, 95

P-polarization 50

Press tips, MIRacle 11

Press, hydraulic 90, 91

Press-On mull cell holders 2, 3, 4, 80

Pressure clamp, ATRMax 22

Pressure clamp, GladiATR 13, 15

Pressure clamps, HATR 19

Pressure clamps, MIRacle 10, 11

Pressure clamps, VeeMAX 25

Properties, IR materials 105

Q

Quantitative analysis

27, 28, 46, 58, 81, 82, 83, 84, 86, 103, 111

Quartz liquid cells, long-path 83

R

Reference materials, for FTIR 126

Reference standards 126

Reflectance sampling 49

Reflection-absorption 49

Returns, product 145

Rotating Stage, IntegratIR 59

RotatIR 77

RotATR 69, 70

S

Sample cup, diffuse 32 ,34, 36, 38

Sample grinder 92

Sample holders, transmission 94

Sample preparation kit 32, 34, 38

Sample preparation, diffuse 38, 104

Sample preparation, transmission 93

Sample vials, UpIR 35

Sample cards 77, 94

Sample cup holder, diffuse 38

Sample cups, diffuse 32, 34, 36, 38

Sample module, external 113

Sampling kits 1

Sealed liquid cells 82

Semiconductor applications 114

Semiconductor wafers 108, 109, 110

Septa for gas cells 99

ShakIR sample grinder 92

Si, disks, windows 80, 81, 85, 95, 96, 97

Si crystal plate for ATRMAX 22

Si crystal plate for HATR 18

Si crystal plate for MIRacle 9, 11

Si, properties 105

Single reflection ATR 8, 12

Single reflection ATR, GladiATR 12

Single reflection ATR, MIRacle 8

Single reflection ATR, VeeMAX 23

SiO2, disks, windows 82, 95, 96, 97

SiO2, properties 105

Snell’s Law 49

Software, AutoPRO 20, 21, 23, 24, 36, 37, 42,

43, 52, 76, 77, 78, 79, 108, 109, 110, 123

Solid sampling, ATR 26, 27

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

134

135

Solid sampling, diffuse 39

Solid sampling, transmission 103

Spacers, demountable cells 80, 81, 85

Spacers, mull cells 80

Special applications 107

Spectral data bases 125

Specular reflectance, absolute 48

Specular reflectance, 10Spec 47



Specular reflectance, 85Spec, UV-Vis 120

Specular reflectance, automated 42

Specular reflectance, theory, applications 49

Specular reflectance, VeeMAX 42

S-polarization 50

Standard Transmission Kit 2

T

Teflon gaskets, demountable cell 81, 85

Teflon gaskets, liquid cell 81, 85

Teflon o-rings, demountable cell 81, 85

Teflon o-rings, liquid cell 81, 85

Temperature control, diffuse 81, 85

Temperature control, HATR 19

Temperature control, MIRacle 11

Temperature control, transmission 84, 86

Terms and conditions 145

TGA/FTIR accessory 111

Theory, ATR 27

Theory, diffuse reflectance 39

Theory, polarization 53

Theory, specular reflectance 49

Theory, transmission 103

Thin film sampling 89

Trademarks 145

Transmission auto samplers 70

Transmission cells 80, 99

Transmission cells, heated 99

Transmission cells, NIR 86

Transmission efficiency, polarizers 53

Transmission sampling products 75

Transmission sampling kits 2, 3, 4

Transmission sampling, gas 99

Transmission, theory and applications 103

Trough plate, ATRMAX 22

Trough plate, HATR 18

U

Ultima Sampling Kit 6

Universal sample holder 74, 94

UpIR, diffuse reflectance 35

UV-Vis Accessories 115

UV-Vis cuvettes, cells, vials, and holders 116

UV-Vis polarizers 118

UV-Vis Spec 119

UV-Vis 85Spec 120

UV-Vis VeeMAX 121

Valu-Line Reflectance Sampling Kit 5

Variable angle ATR 20, 23, 26

VATR 26

VeeMAX, ATR 23

VeeMAX, motorized 24, 25

VeeMAX, UV-Vis 121

VeeMAX, variable angle specular 23

Vial holder, UpIR 35

Vials, UpIR 35

Viewer Pressure Clamp, MIRacle 10

Volatiles cover, ATRMAX 22

Volatiles cover, HATR 18

Volatiles cover, MIRacle 11

W

Wafer holders 108, 110

Website, PIKE Technologies 145

Windows, drilled 2, 3, 4, 81, 85, 96, 97

Windows, gas cells 99, 100, 101, 102

Windows, liquid cells 81, 82, 83, 85

Windows, mull cells 80

Windows, transmission 94

Windows, UpIR 35

Wire-grid polarizers 51

X

X, Y Autosampler 37, 79

X, Y Autosampler, diffuse 37

X, Y Autosampler, transmission 79

X,Y,R-Theta,and Y Autosampler for UV-Vis 123

Z

ZnS, disks, windows 82, 95, 96, 97

ZnS, properties 105

ZnSe, disks, windows

80, 81, 82, 85, 95, 96, 97, 99, 102

ZnSe, ATRMAX crystal plates 22

ZnSe, HATR crystal plates 18

ZnSe, MIRacle crystal plate 11

ZnSe, properties 105

ZnSe, VeeMAX, ATR crystal 25

N O T E S

IN

DE

X

007-0300 PIKECalc Software 25, 129

008-1000 to ATR Spectral Data Bases 130008-3026

008-4001 to Transmission Spectral Data Bases 131008-5021

010-10XX 10Spec – 10 Degree Specular Reflectance Accessory 47

010-3010 Sample Masks (3/8", 5/8" and 2") 45, 47

011-1000 30Spec – Specular Reflectance Accessory (30 degree) 44

011-2010 Sample Masks (3/8", 1/4", and 3/16") 44

011-4500 45Spec – Specular Reflectance Accessory (45 degree) 44

012-10XX 80Spec – Specular Reflectance Accessory 45

012-11XX 80Spec – Specular Reflectance Acc. with Sample Masks (3/8", 5/8" & 2") 45

013-10XX VeeMAX II Variable Angle Specular Reflectance Accessory 25, 43

013-10XXX UV-Vis VeeMAX Variable Angle Specular Reflectance Accessory 121

013-2800 Motorized Upgrade for VeeMAX II 25, 43

013-2850 Motorized Option for VeeMAX II 25, 43

013-3100 VeeMAX ATR Pressure Clamp 25

013-3110 ZnSe Crystal, 45° 25

013-3112 Ge Crystal, 45° 25

013-3114 Si Crystal, 45° 25

013-3115 ZnS Crystal, 45° 25

013-3130 ZnSe Crystal, 60° 25

013-3132 Ge Crystal, 60° 25

013-3134 Si Crystal, 60° 25

013-3135 ZnS Crystal, 45° 25

013-3200 Electrochemical Cell 25

013-3245 45° Alignment Fixture 25

013-3260 60° Alignment Fixture 25

013-3400 Liquid Retainer for VeeMAX II ATR crystals 25

013-3500 VeeMAX II ATR Flow Cell 25

013-4010 Mask Set for VeeMAX 25

013-4010 VeeMAX II Sample Masks (2", 5/8" & 3/8") 43

013-4015 Aperture Mask Set (7 mm, 13 mm, and 25 mm x 4 mm) 121

013-4020 Flat Plate, ZnSe, 45° 25

013-4030 Flat Plate, ZnSe, 60° 25

013-4040 Flat Plate, Ge, 45° 25

013-4050 Flat Plate, Ge, 60° 25

013-4060 Flat Plate, Ge, 65° 25

013-4070 Flat Plate, Si, 60° 25

013-4080 Flat Plate, Si, 45° 25

013-4090 Flat Plate, ZnS, 45° 25

013-4095 Flat Plate, ZnS, 60° 25

013-4120 Heated Flat Plate, ZnSe, 45° 25

013-4130 Heated Flat Plate, ZnSe, 60° 25

013-4140 Heated Flat Plate, Ge, 45° 25



013-4170 Heated Flat Plate, Si, 60° 25

013-4180 Heated Flat Plate, Si, 45° 25

013-4190 Heated Flat Plate, ZnS, 45° 25

013-4195 Heated Flat Plate, ZnS, 60° 25

013-4200 ATR Variable Angle Heating Conversion Plate 22, 25

014-10XX Absolute Reflectance Accessory 48

015-10XX AGA – Grazing Angle Specular Reflectance Accessory 46

016-28XX MappIR Automated Semiconductor Wafer Accessory for 8" Wafers 110

017-28XX MAP300 Automated Semiconductor Wafer Accessory for 12" Wafers 110

017-3912 Additional 12" Wafer Mount (MAP300 only) 110

017-3980 Insert to Support 8" Wafer (MAP300 only) 110

021-19XX VATR Variable Angle, Vertical ATR 26

021-4000 KRS-5, 45° Parallelogram, 50 mm 26




021-4040 ZnSe, 45° Parallelogram, 50 mm 26


021-4060 Ge, 45° Parallelogram, 50 mm 26





021-4110 Si, 45° Parallelogram, 25 mm 26




021-4160 Si, 45° Parallelogram, 50 mm 26

021-5020 25 mm VATR Crystal Holder, Clamp and Mirror 26

021-5030 Set of 25 mm and 50 mm Pads 26

021-5040 25 mm VATR Crystal Holder and Clamp 26

021-5050 50 mm VATR Crystal Holder and Clamp 26

022-10XX HATR Trough Plate System, with 45º ZnSe Crystal 18

022-11XX HATR Flat Plate System, with 45º ZnSe Crystal 18

022-12XX HATR Combined Trough and Flat Plate System with 45º ZnSe Crystals 18

022-19XX HATR Platform Optics Assembly 18

022-2010-45 Trough Plate, ZnSe, 45º 18

022-2012-45 Trough Plate, ZnSe, 45°, 2 mm 18

022-2020-45 Flat Plate, ZnSe, 45º 18

022-2022-45 Flat Plate, ZnSe, 45°, 2 mm 18

022-2024-45 Sealed Flat Plate, ZnSe, 45° 18

022-2030-45 Trough Plate, KRS-5, 45º 18

022-2040-45 Flat Plate, KRS-5, 45º 18

022-2050-45 Trough Plate, Ge, 45º 18

022-2052-45 Trough Plate, Ge, 45°, 2 mm 18

022-2060-45 Flat Plate, Ge, 45º 18

022-2062-45 Flat Plate, Ge, 45°, 2 mm 18

022-2064-45 Sealed Flat Plate, Ge, 45° 18

022-2070-45 Trough Plate, AMTIR, 45º 18

022-2080-45 Flat Plate, AMTIR, 45º 18

022-2090-45 Trough Plate, Si, 45º 18

022-2100-45 Flat Plate, Si, 45º 18

022-2300 RCPlate for HATR (for 45° crystals) 19

022-3040 Viton O-ring, HATR Flow Cell, Upper (6 ea.) 19

022-3042 HATR Flow Cell Upper Teflon O-Ring 19

022-3045 Viton O-ring, HATR Flow Cell, Lower (6 ea.) 19

022-3047 HATR Flow Cell Lower Teflon O-Ring 19

022-3050 HATR (pivoting) Pressure Clamp 19

022-3051 HATR Volatiles Cover 19

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

136

Part Number Index

137

IN

DE

X022-3052 HATR Powder Press 19

022-3054 HATR High-Pressure Clamp 19

022-3110 Crystal, 45°, Trap, 80 x 10 x 4 mm ZnSe 19

022-3111 Crystal, 45°, Trap, 80 x 10 x 4 mm KRS-5 19

022-3112 Crystal, 45°, Trap, 80 x 10 x 4 mm Ge 19

022-3113 Crystal, 45°, Trap, 80 x 10 x 4 mm AMTIR 19

022-3114 Crystal, 45°, Trap, 80 x 10 x 4 mm Si 19

022-3130 Crystal, 60°, Trap, 80 x 10 x 4 mm ZnSe 19

022-3132 Crystal, 60°, Trap, 80 x 10 x 4 mm Ge 19

022-4010 HATR Flow Cell, ZnSe, 45° 19

022-4020 HATR Flow Cell, AMTIR, 45° 19

022-4030 HATR Flow Cell, KRS-5, 45° 19

022-4040 HATR Flow Cell, Si, 45° 19

022-4050 HATR Flow Cell, Ge, 45° 19

022-5110 HATR Heated Trough Plate, ZnSe, 45° 19

022-5120 HATR Heated Trough Plate, AMTIR, 45° 19

022-5130 HATR Heated Trough Plate, KRS-5, 45° 19

022-5140 HATR Heated Trough Plate, Si, 45° 19

022-5150 HATR Heated Trough Plate, Ge, 45° 19

022-5210 HATR Heated Flow-Through Cell, ZnSe, 45° 19

022-5220 HATR Heated Flow-Through Cell, AMTIR, 45° 19

022-5230 HATR Heated Flow-Through Cell, KRS-5, 45° 19

022-5240 HATR Heated Flow-Through Cell, Si, 45° 19

022-5250 HATR Heated Flow-Through Cell, Ge, 45° 19

022-5310 HATR Liquid Jacketed Trough Plate, ZnSe, 45° 19

022-5320 HATR Liquid Jacketed Trough Plate, AMTIR, 45° 19

022-5330 HATR Liquid Jacketed Trough Plate, KRS-5, 45° 19

022-5340 HATR Liquid Jacketed Trough Plate, Si, 45° 19

022-5350 HATR Liquid Jacketed Trough Plate, Ge, 45° 19

022-5410 HATR Liquid Jacketed Flow-Through Plate, ZnSe, 45° 19

022-5420 HATR Liquid Jacketed Flow-Through Plate, AMTIR, 45° 19

022-5430 HATR Liquid Jacketed Flow-Through Plate, KRS-5, 45° 19

022-5440 HATR Liquid Jacketed Flow-Through Plate, Si, 45° 19

022-5450 HATR Liquid Jacketed Flow-Through Plate, Ge, 45° 19

023-10XX ATRMax II Trough Plate System with 45º ZnSe Crystal 22

023-11XX ATRMax II Flat Plate System with 45º ZnSe Crystal 22

023-12XX ATRMax II Combined Trough & Flat Plate System with 45º ZnSe Crystals 22

023-19XX ATRMax II Variable Angle HATR 22

023-2001 Trough Plate, ZnSe, 45° 22

023-2002 Trough Plate, KRS-5, 45° 22

023-2003 Trough Plate, Ge, 45° 22

023-2011 Flat Plate, ZnSe, 45° 22

023-2012 Flat Plate, KRS-5, 45° 22

023-2013 Flat Plate, Ge, 45° 22


023-2022 Trough Plate, KRS-5, 30° 22

023-2023 Trough Plate, Ge, 30° 22

023-2031 Flat Plate, ZnSe, 30° 22

023-2032 Flat Plate, KRS-5, 30° 22

023-2033 Flat Plate, Ge, 30° 22


023-2042 Trough Plate, KRS-5, 60° 22

023-2043 Trough Plate, Ge, 60° 22

023-2044 Trough Plate, Si, 45° 22

023-2045 Flat Plate, Si, 45° 22

023-2046 Trough Plate, AMTIR, 45° 22

023-2047 Flat Plate, AMTIR, 45° 22

023-2051 Flat Plate, ZnSe, 60° 22

023-2052 Flat Plate, KRS-5, 60° 22

023-2053 Flat Plate, Ge, 60° 22

023-2300 RCPlate for ATRMax II 22

023-2800 Motorized Upgrade for ATRMax II 22

023-2850 Motorized Option for ATRMax II 22

023-3050 ATRMax Pressure Clamp 22

023-3051 ATRMax II Volatiles Cover 22

023-3052 ATRMax II Powder Press 22

023-3110 Crystal, 45 deg., Trap., 56 x 10 x 4, ZnSe 22

023-3112 Crystal, 45 deg., Trap., 56 x 10 x 4, Ge 22

023-3113 Crystal, 45 deg., Trap., 56 x 10 x 4, AMTIR 22

023-3114 Crystal, 45 deg., Trap., 56 x 10 x 4, Si 22



023-3130 Crystal, 60 deg., Trap., 56 x 10 x 4, ZnSe 22


023-3133 Crystal, 60 deg., Trap., 56 x 10 x 4, AMTIR 22


023-4000 ATRMax Flow Cell Assembly (Order crystal separately) 22

023-4100 ATRMax Liquid-Jacketed Flow Cell Assembly (Order crystal separately) 22

023-4200 ATRMax Heated Flow Cell Assembly (Order crystal separately) 22

023-4300 ATRMax Heated Trough Plate Assembly (Order crystal separately) 22

023-4400 ATRMax Heated Flat Plate Assembly (Order crystal separately) 22

024-11XX HATRPlus Flat Plate System, with 45º ZnSe Crystal 18

024-19XX HATRPlus Platform Optics Assembly 18

024-3050 HATRPlus (pivoting) Pressure Clamp 19

024-3053 HATRPlus High-Pressure Clamp 19

025-18XX MIRacle ATR Base Optics/Platform Assembly 11

025-2018 ZnSe Performance Crystal Plate 11

025-2038 3 Reflection ZnSe Performance Crystal Plate 11

025-2058 Ge Performance Crystal Plate 11

025-2098 Si Performance Crystal Plate 11

025-2107 Diamond/ZnSe/HS Performance Crystal Plate 11

025-2108 Diamond/ZnSe Performance Crystal Plate 11

025-2118 3 Reflection Diamond/ZnSe Crystal Plate 11

025-2208 Specular Reflection Performance Plate 11

025-3020 High-Pressure Clamp 11

025-3035 Confined Space Clamp 11

025-3050 Micrometric, Low-Pressure Clamp 11

025-3052 Flat Tip for Micrometric Clamp 11

025-3053 MIRacle Clamp Tip Assortment 11

025-3054 Concave Tip for Micrometric Clamp 11

025-3061 Swivel Tip for Micrometric Clamp 11

025-3092 Concave Tip for High-Pressure Clamps 11

025-3093 Swivel Tip for High-Pressure Clamps 11

025-3094 7.8 mm ATR Pressure Tip 11, 25

025-3095 Flat Tip for High-Pressure Clamps 11

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

138

025-3096 Sealed Pressure Tip for High-Pressure Clamp 11

025-4018 Heated ZnSe Performance Crystal Plate 11

025-4058 Heated Ge Performance Crystal Plate 11

025-4108 Heated Diamond/ZnSe Performance Crystal Plate (60 °C Max) 11

026-17XX GladiATR 300 Single Reflection ATR Base Optics 13

026-18XX GladiATR Single Reflection ATR Base Optics 13

026-19XX GladiATR Vision Base Optics 15

026-2001 GladiATR Standard Stainless Top 13

026-2002 GladiATR Heated Stainless Top 13

026-2003 GladiATR Liquid Jacketed Stainless Top 13

026-2004 GladiATR Vision Stainless Top 15

026-2005 GladiATR Vision Heated Stainless Top 15

026-2006 GladiATR Vision Liquid Jacketed Stainless Top 15

026-2050 Ge Crystal Plate (non-viewing) 13, 15

026-2100 Diamond Crystal Plate 13

026-2102 GladiATR Vision Diamond Crystal Plate 15

026-2200 Specular Reflection Plate (non-viewing) 13, 15

026-3020 High-Pressure Clamp 13, 15

026-3051 Volatiles Cover for Performance Plates 11, 13, 15

026-3510 USB Interface / Software for GladiATR Vision 15

026-4050 Heated Ge Crystal Plate, 130 °C (non-viewing) 13, 15

026-4100 Heated Diamond Crystal Plate, 210 °C 13

026-4101 Heated Diamond Crystal Plate, 210 °C, Vision 15

026-4102 Heated Diamond Crystal Plate, 300 °C 13

026-4110 Liquid Jacketed Diamond Crystal Plate 13

026-4112 Liquid Jacketed Diamond Crystal Plate 15

026-4150 Liquid Jacketed Ge Crystal Plate 13

026-5010 Liquids Retainer for Performance Plates 11, 13, 15

026-5012 Flow-Through Attachment 11, 13, 15

026-5013 Liquids Retainer and Volatiles Cover Set 11, 13, 15

031-2010 X, Y, Z Adjustable Sample Position 74

031-2020 Non-Adjustable Sample Position 74

031-2030 Universal Spring Sample Holder 74

031-2040 Magnetic Sample Holder 74

031-2050 Micro KBr Pellet and Mull Holder 74

031-2070 Holder for Micro Diamond Cell 74

031-40XX 4X Beam Condenser 74

031-60XX 6X Beam Condenser 74

034-0090 µMAX IR Microscope Transmission Upgrade 70

034-20XX µMAX Sample Compartment IR Microscope for Transmission and Reflection (ATR optional) 70

034-21XX Complete µMAX Sample Compartment IR Microscope with Transmission, Reflection, ATR and video camera 70

034-22XX µMAX Sample Compartment IR Microscope with Transmission, Reflection and ATR 70

034-3010 Video Camera for µMAX 70

034-3020 Binocular Viewer for µMAX 70

034-3030 Trinocular Viewer for µMAX 70

034-3040 RotATR, µMAX ATR, Ge Crystal 70

034-3060 Micro Compression Cell for 13 mm IR Transparent Windows 70, 71

034-3070 IR Microsampling Kit (3 position sample slide with gold mirror, 2 KBr windows, scalpel, tweezers and probes) 70

034-3080 Replacement Illumination Bulb for µMAX 70

034-40XX µMAX Sample Compartment IR Microscope for Reflection (ATR optional) 70

034-41XX Complete µMAX Sample Compartment IR Microscope for Reflection, ATR and video camera 70

034-42XX µMAX Sample Compartment IR Microscope with Reflection and ATR 70

041-10XX DiffusIR Accessory 34

041-60XX DiffusIR Accessory with Gold Coated Optics 34

042-10XX EasiDiff Accessory with Sample Preparation Kit 32

042-2010 Small Sample Cup (micro: 6.0 mm diam., 1.6 mm deep), 2 per package 32, 34, 36, 38

042-2020 Large Sample Cup (macro: 10 mm diam., 2.3 mm deep), 2 per package 32, 34, 36, 38

042-2025 EasiDiff Sample Slide 32

042-3010 Abrasion Sampling Kit 32, 34, 36, 38

042-3020 Silicon Carbide Abrasive Disks (Pack of 100) 32, 34, 36, 38

042-3025 Diamond Abrasive Disks (Pack of 50) 32, 34, 36, 38

042-3030 Sample Cup Holder and Base 32, 34, 38

042-3035 Spatula – Spoon Style 2, 3, 4, 38, 93

042-3040 Sample Preparation Kit 32, 34, 38

042-3050 Spatula – Flat Style 2, 3, 4, 38, 93

042-3060 Abrasion Kit Disk Support Post 38

042-3070 Camel Hair Brush 38

042-3080 Alignment Mirror 32, 34, 36, 38

042-3082 Alignment Mirror Gold 32, 34, 36, 38

042-50XX EasiDiff Accessory, NIR Version with Gold Coated Optics 32

043-0900 AutoDiff, 60 Position Sampling Tray 36

043-28XX AutoDiff – Automated Diffuse Reflectance System 36

043-3090 AutoDiff Set of 60 Sampling Cups (macro) 36

043-78XX AutoDiff – Automated Diffuse Reflectance System, Gold-Coated Optics System 36

044-10XX UpIR – Out-of-compartment Diffuse Reflectance Accessory 35

044-3010 Glass Vial Holder 35, 59

044-3020 Sample Vials with Threaded Caps, 21 mm x 70 mm, (200 per pkg.) 35

044-3030 Solids Sampling Insert 35

044-3040 Powders Sampling Insert 35

044-60XX UpIR – Out-of-compartment Diffuse Reflectance Accessory withGold-Coated Optics 35

045-10XX FlexIR NIR Fiber Optic Accessory 66

045-2000 Liquids Sampling Tip for FlexIR, 1.5 mm pathlength 66



045-2010 Diffuse Reflectance Tip for FlexIR NIR Probe 66

045-30XX FlexIR Hollow Waveguide Accessory for MCT Detector 65

045-3100 Narrow-band MCT Detector 65

045-3200 Mid-band MCT Detector 65

045-3300 Wide-band MCT Detector 65

045-3400 Adjustable Probe Holder 65

045-3410 Standard Probe Holder 65

045-35XX FlexIR Hollow Waveguide Accessory for DTGS Probes 65

045-4010 ZnSe ATR Probe, 1 m 65


045-4020 Diffuse Reflectance Probe, 1 m 65

045-4030 Specular Reflectance Probe, 1 m 65


045-4050 Ge ATR Probe, 1 m 65

045-4052 Ge ATR Probe, 2 m 65

045-4100 Diamond/ZnSe ATR Probe, 1 m 65




045-5050 Ge ATR Probe, 1 m 65


047-20XX X, Y Autosampler – Diffuse Reflectance Configuration 37, 79

139

IN

DE

X047-60XX X, Y Autosampler – Diffuse Reflectance Configuration with

Gold-Coated Optics 37, 79

048-0060 Automated Transmission Tablet Analysis Stage for NIR IntegratIR 59

048-0100 Sample Plate with 18 mm x 2 mm ZnSe Window 57

048-0150 Rotating Stage for Petri Dish (for heterogeneous samples) 59

048-0151 Rotating Stage Adapter for 500 mL beaker 59

048-0200 Sample Plate with 18 mm x 2 mm KBr Window 57

048-10XX Upward Sample Positioning Mid-Infrared IntegratIR Integrating Sphere Accessory (complete) 57

048-11XX Downward Sample Positioning Mid-Infrared IntegratIR Integrating Sphere Accessory 57

048-2010 Specular Exclusion Port for Upward Sample Positioning IntegratIR 57

048-2020 Powder Sample Cup for Downward IntegratIR 57

048-2999 Glass Sample Vials (Pack of 25), 19 x 65 mm 59

048-3000 Diffuse Gold Reference 57, 59

048-3070 NIST Traceable NIR Reference Standard 59, 128

048-3071 NIST Traceable NIR Reference Standard – Recertification 59, 128

048-3100 Narrow-band MCT Detector 57

048-3150 MCT Detector Reconditioning 57

048-3200 Mid-band MCT Detector 57

048-3300 Wide-band MCT Detector 57

048-3400 DTGS Detector with CsI Detector Window 57

048-60XX NIR IntegratIR Integrating Sphere Accessory 59

050-10XX Valu-Line – FTIR Reflectance Accessories Kit 5

050-20XX Ultima Sampling Kit 6

073-16XX Vertical Wafer Accessory, Manual Version 108

073-26XX Vertical Wafer Accessory, Automated Version 108

073-3600 6" Wafer Mount, Blank 108

073-3620 Insert to Support 2" Wafer 108




073-3660 Additional Wafer Mount 108

073-3800 Blank Support – for custom wafers (MappIR only) 110






073-3880 Additional 8" Wafer Mount (MappIR only) 110

073-60XX X, Y Autosampler – Diffuse Reflectance/Transmission Configuration with Gold-Coated Optics 37, 79

073-90XX X, Y Autosampler – Diffuse Reflectance/Transmission Config. 37, 79

073-9110 96 Well Diffuse Reflectance Sampling Plate 37, 79

073-9130 96 Well Transmission Sampling Plate 37, 79

074-26XX Automated Transmission Multi-SamplIR for FTIR 76

074-3661 Additional Standard Sampling Plate 76

075-28XX Automated 8" Horizontal Transmission Accessory 78

075-3881 Additional Sampling Plate for 8" Automated HorizontalTransmission Accessory 78

076-1120 Dual Digital Temperature Control Module 112

076-1130 4 Zone Digital Temperature Control Module for Shimadzu TGA 112

076-1210 Digital Temperature Control Module (300 °C) 13, 100

076-1220 Digital Temperature Control Module 11, 13, 15, 19, 22, 25, 89

076-1230 Digital Temperature Control Module for Falcon Accessory 84,86,122

076-1410 Digital Temperature Control Module, PC Control (300 °C) 13,100

076-1420 Digital Temperature Control Module, PC Control 11, 13, 15, 19, 22, 25

076-1430 Digital Temperature Control Module, PC Control for Falcon Accessory 84, 86, 122

076-2220 Digital Temperature Control Module, HTV Chambers 34

076-2420 PC Controlled Temperature Module, HTV Chambers 34

076-28XX Automated 12" Horizontal Transmission Accessory 78

076-3881 Additional Sampling Plate for 12" Automated HorizontalTransmission Accessory 78

076-6025 Digital Force Adapter for High-Pressure Clamp 11, 13, 15

090-1000 Manual Polarizer, ZnSe 22, 43, 45, 46, 52

090-1200 Manual Polarizer, KRS-5 45, 46, 52

090-1300 Manual Polarizer, CaF2 52

090-1400 Manual Polarizer, BaF2 52

090-1500 Manual Polarizer, Ge 52

090-1600 Manual Polarizer, Polyethylene 52

090-2000 Automated Polarizer, ZnSe 22, 25, 43, 52

090-2200 Automated Polarizer, KRS-5 52

090-2300 Automated Polarizer, CaF2 52

090-2400 Automated Polarizer, BaF2 52

090-2500 Automated Polarizer, Ge 52

090-2600 Automated Polarizer, Polyethylene 52

090-3000 Precision Manual Polarizer, ZnSe 52

090-3200 Precision Manual Polarizer, KRS-5 52

090-3300 Precision Manual Polarizer, CaF2 52

090-3400 Precision Manual Polarizer, BaF2 52

090-3500 Precision Manual Polarizer, Ge 52

090-3600 Precision Manual Polarizer, Polyethylene 52

090-4000 Precision Manual Polarizer, ZnSe 52

090-4200 Precision Manual Polarizer, KRS-5 52

090-4300 Precision Manual Polarizer, CaF2 52

090-4400 Precision Manual Polarizer, BaF2 52

090-4500 Precision Manual Polarizer, Ge 52

090-4600 Precision Manual Polarizer, Polyethylene 52

091-20XX RotatIR Automated Rotating Sample Stage 77

110-60XX NIR Falcon Base 86

110-60XXX UV-Vis Falcon Base 122

111-3610 5 mm Vial Holder 86, 122

111-3620 8 mm Vial Holder 86, 122

111-3630 12 mm Vial Holder 86, 122

111-3640 1 cm Cuvette Holder 86, 122

111-3650 Cuvette Holder, 10 mm 117

111-3660 Adjustable Cuvette Holder 10-100 mm 117

111-40XX Mid-IR Falcon Base with Cell Holder 84

115-0001 Heated Transfer Line for Shimadzu TGA 112

115-0005 Heated Transfer Line for Mettler 851 TGA 112

115-0006 Heated Transfer Line for Mettler TGA 112

115-0007 Heated Transfer Line for TA Instruments TGA 112

115-0008 Heated Transfer Line for TA Instruments Q5000R TGA 112

115-0009 Heated Transfer Line for TA Instruments Q50/Q500 TGA 112

115-0010 Heated Transfer Line for TA Instruments 2050 TGA 112

115-0011 Heated Transfer Line for Netzsch TGA 112

115-0012 Heated Transfer Line for /PESTA6/4000 110V TGA 112

115-0013 Heated Transfer Line for SETARAM 112

115-0014 Heated Transfer Line for PESTA6/4000 220VTGA 112

121-0500 Aperture Mask (4 mm x 7 mm) 119

121-0501 Aperture Mask (35 mm x 3 mm) 120

121-1500 UV-Vis 15Spec 119

121-2000 UV-Vis 20Spec 119

121-3000 UV-Vis 30Spec 119

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

140

121-4500 UV-Vis 45Spec 119

121-6000 UV-Vis 60Spec 119

121-85XXX UV-Vis 85Spec – Specular Reflectance Accessory 120

155-10XXL External Sample Module, Left Side 113

155-10XXR External Sample Module, Right Side 113

155-2010 DLaTGS Detector for External Sample Module 113

155-2020 MCT Detector (mid band) for External Sample Module 113

160-1001 13 x 2 mm ZnSe (6 pack) 95

160-1002 25 x 2 mm CaF2 (6 pack) 96

160-1003 25 x 5 mm KBr (6 pack) 96

160-1004 25 x 2 mm NaCl (6 pack) 96

160-1005 13 x 2 mm NaCl (6 pack) 95

160-1006 38 x 19 x 4 mm NaCl (6 pack) 97

160-1007 25 x 2 mm ZnSe (6 pack) 96

160-1008 13 x 2 mm KBr Windows(6 pack) 71, 95

160-1009 25 x 4 mm KBr (6 pack) 96

160-1010 32 x 3 mm KBr (6 pack) 96

160-1011 25 x 5 mm NaCl (6 pack) 96

160-1012 25 x 4 mm NaCl (6 pack) 96

160-1013 32 x 3 mm NaCl (6 pack) 96

160-1014 32 x 3 mm NaCl, Drilled (6 pack) 96

160-1015 32 x 3 mm KBr, Drilled (6 pack) 96

160-1111 41 x 23 x 3 mm ZnSe 97

160-1112 Demountable Liquid Cell Windows ZnSe, Drilled 81, 85, 96

160-1113 32 x 3 mm ZnSe Disk 34, 80, 81, 85, 96

160-1114 Short-Path Gas Cell Windows ZnSe (25 X 4 mm) 80, 96, 99, 102

160-1115 13 x 2 mm ZnSe 95

160-1116 Press-On Demountable Liquid Cell Windows Si (25 X 4 mm) 80, 96

160-1117 25 x 2 mm Si 96

160-1118 20 x 2 mm Si 95

160-1119 41 x 23 x 6 mm NaCl, Drilled 97

160-1120 41 x 23 x 6 mm NaCl 97

160-1121 32 x 3 mm NaCl, Drilled 81, 85, 96

160-1122 Demountable Liquid Cell Windows NaCl, Plain 80, 81, 85, 96

160-1123 25 x 5 mm NaCl 96

160-1124 25 x 4 mm NaCl 80, 96, 99, 102

160-1125 Demountable Liquid Cell Windows KRS-5, Drilled 81, 85, 96

160-1126 Demountable Liquid Cell Windows KRS-5, Plain 80, 81, 85, 96

160-1127 25 x 4 mm KRS-5 80, 96, 102

160-1128 20 x 2 mm KRS-5 95

160-1129 38 x 19 x 4 mm KBr, drilled 97

160-1130 38 x 19 x 4 mm KBr 97

160-1131 Window, KBr, 32 x 3 mm, Drilled, (6 ea.) 2, 3, 4, 81, 85, 96

160-1132 Window, KBr, 32 x 3 mm, Plain (6 ea.) 2, 3, 4, 34, 80, 81, 85, 96

160-1133 Window, KBr, 25 x 4 mm (2 ea.) 4, 80, 96, 99, 102

160-1134 20 x 2 mm KBr 95

160-1135 13 x 2 mm KBr Window (1 ea.) 70, 71, 95

160-1136 Demountable Liquid Cell Windows Ge, Drilled 81, 85, 96

160-1137 Demountable Liquid Cell Windows Ge, Plain 80, 81, 85, 96

160-1138 Press-On Demountable Liquid Cell Windows Ge (25 X 4 mm) 80, 96

160-1139 20 x 2 mm Ge 95

160-1140 38 x 19 x 4 mm CaF2, drilled 97

160-1141 38 x 19 x 4 mm CaF2 97

160-1142 Demountable Liquid Cell Windows CaF2, Drilled 81, 85, 96

160-1143 Demountable Liquid Cell Windows CaF2, Plain 80, 81, 85, 96

160-1144 CaF2 Flat Window, 20 mm diameter 25, 95

160-1145 38 x 19 x 4 mm BaF2, drilled 97

160-1146 Demountable Liquid Cell Windows BaF2, Drilled 81, 85, 96

160-1147 Demountable Liquid Cell Windows BaF2, Plain 80, 81, 85, 96

160-1148 20 x 2 mm BaF2 95

160-1150 38 x 19 x 2 mm ZnSe, Drilled 97

160-1151 38 x 19 x 2 mm ZnSe 97

160-1152 50 x 3 mm ZnSe 97

160-1153 49 x 3 mm ZnSe 97

160-1154 25 x 5 mm ZnSe 96

160-1155 25 x 2 mm ZnSe Window 35, 96

160-1156 38 x 19 x 2 mm Si, Drilled 97

160-1157 38 x 19 x 2 mm Si 97

160-1158 Demountable Liquid Cell Windows Si, Drilled 81, 85, 96

160-1159 32 x 3 mm Si Disk 34, 80, 81, 85, 96

160-1160 13 x 2 mm Si 95


160-1162 38 x 19 x 4 mm NaCl 97


160-1164 29 x 14 x 4 mm NaCl 97

160-1165 50 x 3 mm NaCl 97

160-1166 49 x 6 mm NaCl 97

160-1167 41 x 3 mm NaCl 97

160-1168 25 x 2 mm NaCl 96

160-1169 20 x 2 mm NaCl 95

160-1170 13 x 2 mm NaCl 95

160-1171 50 x 3 mm KRS-5 97

160-1172 25 x 2 mm KRS-5 96

160-1173 13 x 2 mm KRS-5 95

160-1178 37.5 x 4 mm KCl 102

160-1182 41 x 23 x 6 mm KBr, Drilled 97

160-1183 41 x 23 x 6 mm KBr 97

160-1184 29 x 14 x 4 mm KBr, Drilled 97

160-1185 29 x 14 x 4 mm KBr 97

160-1186 50 x 3 mm KBr 97

160-1187 49 x 6 mm KBr 97

160-1188 41 x 3 mm KBr 97

160-1189 25 x 5 mm KBr 96

160-1190 38 x 19 x 4 mm Ge 97

160-1191 13 x 2 mm Ge 95

160-1192 38 x 19 x 4 mm CsI, Drilled 97

160-1193 38 x 19 x 4 mm CsI 97

160-1194 32 x 3 mm CsI, Drilled 96

160-1195 32 x 3 mm CsI 96

160-1196 25 x 4 mm CsI 96

160-1197 20 x 2 mm CsI 95

160-1198 13 x 2 mm CsI 95

160-1199 32 x 3 mm AMTIR, Drilled 96

160-1200 32 x 3 mm AMTIR 96

160-1201 25 x 2 mm AMTIR Window 35, 96

160-1207 29 x 14 x 4 mm CaF2 97

160-1208 50 x 3 mm CaF2 97

160-1209 41 x 3 mm CaF2 97

160-1210 25 x 5 mm CaF2 96

160-1211 25 x 4 mm CaF2 80, 96, 99, 102

160-1212 25 x 2 mm CaF2 96

160-1213 13 x 2 mm CaF2 95

160-1214 38 x 19 x 4 mm BaF2 97

160-1215 29 x 14 x 4 mm BaF2 97

141

IN

DE

X160-1216 41 x 3 mm BaF2 97

160-1217 25 x 4 mm BaF2 80, 96, 99, 102

160-1218 13 x 2 mm BaF2 95

160-1233 38 x 3 mm SiO2 96

160-1241 13 x 2 mm ZnS 95

160-1269 38 x 19 x 2 mm AMTIR 97

160-1270 38 x 19 x 2 mm AMTIR, Drilled 97

160-1275 38 x 19 x 2 mm ZnS 97

160-1276 38 x 19 x 2 mm ZnS, Drilled 97

160-1277 41 x 23 x 3 mm ZnS 97

160-1279 41 x 23 x 3 mm ZnS, Drilled 97

160-1280 41 x 23 x 3 mm ZnSe, Drilled 97

160-1287 37.5 x 4 mm CaF2 102

160-1288 37.5 x 4 mm KBr 102

160-1289 25 x 4 mm KCl 102

160-1290 37.5 x 4 mm NaCl 102

160-1291 37.5 x 4 mm ZnSe 102

160-1292 38 x 19 x 4 mm SiO2 97

160-1293 38 x 19 x 4 mm SiO2, Drilled 97

160-1301 13 x 2 mm AMTIR 95

160-1304 ZnSe Flat Window, 20 mm diameter 25, 95

160-1305 25 x 2 mm KBr 96

160-1306 25 x 2 mm BaF2 96

160-1307 25 x 2 mm Ge Window 35, 96

160-1308 25 x 2 mm CsI 96

160-1311 25 x 5 mm BaF2 96

160-1312 25 x 5 mm KRS-5 96

160-1313 25 x 5 mm Ge 96

160-1315 38 x 3 mm ZnS 96

160-1316 25 x 5 mm CsI 96

160-1320 Window, KBr 38 x 6 mm (2 ea.) 3, 96, 99, 100, 112

160-1321 38 x 6 mm NaCl 96, 99

160-1322 38 x 6 mm BaF2 96, 99, 100

160-1323 38 x 6 mm Ge 96

160-1324 38 x 6 mm Si 96

160-1326 38 x 6 mm CsI 96

160-1329 38 x 6 mm ZnSe 96, 99, 100, 112

160-1341 41 x 3 mm ZnSe 97

160-1342 38 x 6 mm CaF2 96, 99

160-1343 38 x 6 mm KRS-5 96, 100

160-1344 38 x 3 mm KRS-5 96

160-1349 38 x 3 mm BaF2 96

160-1350 38 x 3 mm Ge 96

160-1353 38 x 3 mm Si 96

160-1355 38 x 6 mm SiO2 96

160-1357 38 x 6 mm AMTIR 96

160-5000 25 x 2 mm Sapphire Window 35

160-5003 13 x 1 mm KBr 95

160-5004 13 x 1 mm NaCl 95

160-5007 29 x 14 x 4 mm Ge 97

160-5009 29 x 14 x 4 mm KRS-5 97

160-5010 29 x 14 x 4 mm BaF2, Drilled 97

160-5011 29 x 14 x 4 mm CaF2, Drilled 97

160-5012 29 x 14 x 4 mm Ge, Drilled 97

160-5014 29 x 14 x 4 mm KRS-5, Drilled 97

160-5016 38 x 19 x 4 mm KRS-5, Drilled 97

160-5025 38 x 3 mm ZnSe 96

160-5027 49 x 6 mm BaF2 97

160-5029 49 x 6 mm CsI 97

160-5030 50 x 3 mm BaF2 97

160-5031 38 x 19 x 4 mm KRS-5 97

160-5032 38 x 19 x 4 mm Ge, Drilled 97

160-5047 32 x 3 mm ZnS 96

160-5048 32 x 3 mm ZnS, Drilled 96

160-5049 32 x 3 mm SiO2 Disk 34, 96

160-5052 32 x 3 mm SiO2, Drilled 96

160-5084 25 x 2 mm ZnS 96

160-5086 25 x 2 mm SiO2 96

160-5087 25 x 4 mm ZnS 96

160-5089 25 x 4 mm SiO2 96

160-5090 25 x 5 mm ZnS 96

160-5100 25 x 5 mm SiO2 96

160-5118 20 x 2 mm ZnS 95

160-5119 20 x 2 mm SiO2 95

160-5146 41 x 23 x 6 mm BaF2 97

160-5147 41 x 23 x 6 mm CaF2 97

160-5152 41 x 23 x 6 mm BaF2, Drilled 97

160-5153 41 x 23 x 6 mm CaF2, Drilled 97

160-5157 41 x 3 mm ZnS 97

160-5161 49 x 3 mm ZnS 97

160-5164 49 x 6 mm SiO2 97

160-5173 50 x 3 mm CsI 97

160-5177 50 x 3 mm ZnS 97

160-5201 13 x 2 mm SiO2 95

160-5205 49 x 6 mm KRS-5 97

160-5206 49 x 6 mm CaF2 97

160-5211 20 x 2 mm Polyethylene 95


160-5214 25 x 4 mm Polyethylene 80, 96

160-5215 32 x 3 mm Polyethylene, Drilled 81 ,96

160-5216 32 x 3 mm Polyethylene 80, 81, 96




160-5220 38 x 3 mm KBr 96

160-8010 KBr Powder, 100 g 2, 3, 4, 38, 87, 88, 90, 91, 92, 93, 95

160-8015 KBr Chunks, 100 g 93, 95

161-0500 Nujol, 1 0z. 2, 3, 4, 93

161-0510 Fluorolube, 1 0z. 2, 3, 4, 93

161-0520 Glass Syringe, 1 mL 81, 82

161-0521 Glass Syringe, 2 mL 2, 3, 4, 81, 82

161-0522 Glass Syringe, 5 mL 82, 82

161-1010 7 mm Die Set 2, 3, 87

161-1018 KBr Single Pellet Holder 2, 3, 87, 94

161-1024 3 mm Die Set 87

161-1027 PIKE Hand Press Body 2, 3, 87

161-1028 1 mm die set 87

161-1035 Stainless Steel Vial with Ball, 1" long x 0.5" 92

161-1037 Spare Stainless Steel Ball 92

161-1070 ShakIR, Heavy Duty Sample Grinder, 110/220V 92

161-1100 Hand Press for 7 mm, 3 mm, and 1 mm pellets 87

161-1900 Evacuable Pellet Press for 13 mm pellets 88, 90, 91

161-1903 Anvils (2 each) for PIKE Evacuable Pellet Press 88

161-1906 Piston O-Rings (2 each) 88

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

142

161-1907 Base O-Rings (2 each) 88

161-1908 Pellet Extracting Tool 88

161-2500 Bolt Press (for KBr pellets) 4, 87

161-2511 Wrench Set for Bolt Press (2 ea.) 4, 87

161-2520 Bolt Press Holder 87, 94

161-2530 Slide Sample Holder, Quartz/Cylindrical Cell, 10 – 20 mm 83, 117

161-2540 Slide Sample Holder, Quartz/Cylindrical Cell, 50 mm 83, 117

161-2550 Slide Sample Holder, Quartz/Cylindrical Cell, 100 mm 83, 117

161-3500 Hydraulic Die for 13 mm pellets 87

161-5035 35 mm Agate Mortar and Pestle 4, 93

161-5040 40 mm Agate Mortar and Pestle 93

161-5050 50 mm Agate Mortar and Pestle 2, 3, 87, 88, 90, 91, 93




161-5700 Dual Pellet Holder for 7 mm, 3 mm, and 1 mm pellets 87, 94

161-6000 Finger Cots (12 ea.) 2, 3, 4

162-0010 Micro Diamond Cell, 1.6 mm 70, 72, 74

162-0020 Micro Diamond Cell, 2.0 mm 70, 72, 74

162-0030 Micro Plane with Carbide Blade 70, 71

162-0040 Micro Plane with Diamond Blade 70 ,71

162-0205 5 mm Disposable Glass Vials, 6 mm x 50 mm (200/pk) 86, 117

162-0208 8 mm Glass Vials (200/pk) 86, 117

162-0212 12 mm Glass Vials (200/pk) 86, 117

162-0220 to Standard Rectangular Cuvettes 116162-0267

162-0268 to Semi-micro Rectangular Cuvettes – 4 mm Opening 116162-0307

162-0308 to Micro Rectangular Cuvettes – 2 mm Opening 116162-0347

162-0348 Polystyrene, Disposable Cuvettes, 10 mm pathlength, 4.5 mL (100/pk) 117

162-0349 Polystyrene, Semi-micro Disposable Cuvettes, 10 mm pathlength, 1.5 mL (100/pk) 117

162-1000 Standard Transmission Sampling Kit (STS) – Solids and Liquids 2

162-1100 Demountable Liquid Cell Assembly/Holder 2, 3, 4, 81

162-1104 Demountable Liquid Cell Needle Plate 81

162-1110 Press-On Demountable Liquid Cell Spacers 0.015 (25 mm) 80







162-1190 Press-On Demountable Liquid Cell Spacers Assortment (25 mm) 80

162-1201 Spacer for 1 mm Pathlength Cuvette 117, 122



162-1210 Demountable Liquid Cell Spacers 0.015 (32 mm) 80, 81, 85







162-1290 Teflon Spacers – Assortment 2, 3, 4, 80, 81, 85

162-1300 Teflon Stoppers for Needle Plate (12 each) 81, 82

162-1310 Teflon Gaskets (12 each) 81

162-1320 Teflon O-Rings (12 each) 81

162-1330 Viton O-Rings, 32 mm (12 each) 80

162-1600 Demountable Liquid Cell for the mid-IR Falcon Accessory 85

162-1601 to Super-Sealed Liquid Cells 82162-1689

162-1801 Long-Path Quartz Cell, 10 mm 83, 117




162-1831 Cylindrical Cells with Teflon Stoppers, Optical Glass, 10 mm 117




162-1841 Cylindrical Cells with Teflon Stoppers, Far UV Quartz, 10 mm 117




162-2000 Comprehensive Transmission Sampling Kit (CTS) – Gases, Solids and Liquids 3

162-2009 Viton O-Rings, (2 each), max temp, 200 ºC 100

162-20XX Heated Gas Flow Cell 100

162-2100 Short-Path EC Gas Cell, 100 mm pathlength 4, 99

162-2101 EC Gas Cell Glass Body for 100 mm Cell 99

162-2102 EC Gas Cell Window Cap 99

162-2105 EC Gas Cell Holder, 25 mm x 100 mm 94, 99

162-2106 Septa (12 each) 99

162-2109 EC Viton O-Rings (2 each) 99

162-2115 Gas Cell Holder, 25 mm x 50 mm 94

162-2150 Short-Path EC Gas Cell, 50 mm pathlength 99

162-2155 EC Gas Cell Glass Body for 50 mm Cell 99

162-2200 HT Gas Cell, 100 mm Gas Cell, 38 mm diameter 3, 99

162-2201 HT Glass Body for 100 mm Cell 99

162-2202 HT Cell Window Cap 99

162-2205 HT Gas Cell Holder, 38 mm x 100 mm 94, 99

162-2209 HT Viton O-Rings (2 each) 99

162-2215 Gas Cell Holder,38 mm x 50 mm 94

162-2250 Short-Path HT Gas Cell, 50 mm pathlength 99

162-2255 Glass Body for 50 mm Cell 99

162-2309 High Temperature O-Rings, (1 each), max temp, 325 ºC 100, 112

162-24XX TGA/FTIR Accessory Flow Cell 112

162-2504 Heated 2.4 Meter Long-Path Gas Cell 102

162-2505 Heating Jacket for 2.4 Meter Long-Path Gas Cell 102

162-2509 Digital Temperature Controller for Heated Long-Path Gas Cells 102

162-2510 2.4 Meter Long-Path Gas Cell 102

162-2511 O-Rings & Gaskets for 2.4 M Gas Cell 102

162-2601 O-Rings & Gaskets for 10 M & 16V Gas Cells 102

162-26XX 10.0 Meter Long-Path Gas Cell 102

162-2801 O-Rings & Gaskets for 22 M & 33 M Gas Cells 102



162-3000 Educational Transmission Sampling Kit (ETS) – Gases, Solids and Liquids 4

162-31XX 1-16 Meter Variable Long-Path Gas Cell 102

162-32XX Heated 10.0 Meter Long-Path Gas Cell 102



162-35XX Heated 1-16 Meter Variable Long-Path Gas Cell 102

162-3600 Press-On Demountable Liquid Cell Holder for 25 mm Windows 80, 94

143

IN

DE

X162-3610 Press-On Demountable Liquid Cell Holder for

32 mm Windows 2, 3, 4, 80, 94

162-3621 Viton® O-Rings, 25 mm (12 each) 80

162-3700 Heating Jacket for 10.0 Meter Long-Path Gas Cell 102

162-3800 Heating Jacket for 22.0 and 33.0 Meter Long-Path Gas Cell 102

162-3900 Heating Jacket for 1-16 Meter Variable Long-Path Gas Cell 102

162-4000 Crystal Polishing Kit 98

162-4010 Glass Plate 98

162-4011 Polishing Pads (6 each) 98

162-4012 Grinding Compound (400 grit) 98

162-4013 Grinding Compound (600 grit) 98

162-4014 Polishing Compound 98

162-4015 Brushes (6 each) 98

162-4140 DiffusIR Environmental Chamber (LTV), -150 to 500 °C 34

162-4150 DiffusIR Environmental Chamber (HTV), ambient to 500 °C 34

162-4160 Liquid Nitrogen Cooled System and Temperature Control Module DiffusIR Environmental Chamber (LTV) -150 to 500 °C 34

162-4180 High Pressure Adaptation for Heated Chambers (HTV) 34

162-4190 DiffusIR Environmental Chamber (HTV), ambient to 900 °C 34

162-4210 O-Ring, DiffusIR Chamber, 10 ea. 34

162-4215 O-Ring, DiffusIR Chamber Cooling Line, 10 ea. 34

162-4251 Ceramic Cup, DiffusIR Chamber, Porous 34

162-4270 Alignment Mirror, DiffusIR Chamber 34

162-5300 Magnetic Film Holder – for 13 mm pellets and film samples 2, 3, 4, 88, 89, 90, 91, 94

162-5400 Film Sampling Card – 20 mm clear aperture, 10 each 2, 3,4, 77, 94

162-5410 Sample Card – for 13 mm pellets (10 each) 88, 90, 91, 94

162-5420 1.5 mil Polystyrene Reference Standard 126

162-5430 3.0 mil Polystyrene Reference Standard 126

162-5440 55 micron Polystyrene Reference Standard 126

162-5450 NIST Traceable Polystyrene Reference Standard 126

162-5460 Specular Reflectance Standard 48, 126

162-5470 ATR Reference Standard 128

162-5475 ATR Reference Standard with Recommended Validation Procedure 128

162-5476 ATR Reference Standard, recertification 128

162-5480 Diffuse PTFE Reference (1" optical area) 127

162-5481 Diffuse Gold Reference (1" optical area) 127

162-5482 Diffuse Gold Reference (1.7" optical area) 127

162-5485 MidIR Diffuse Reflectance Wavelength Standard (1.65" optical area) 127

162-5486 MidIR Diffuse Reflectance Wavelength, recertification 127

162-5500 Heavy-Duty Magnetic Film Holder 94

162-5600 Universal Sample Holder, 20 mm aperture 2, 3, 94

162-5610 Universal Sample Holder, 10 mm aperture 94

162-5611 25 mm O-Rings for Universal Sample Holder (6 each) 94

162-5612 10 mm O-Rings for Universal Sample Holder (6 each) 94

162-6401 3-position Sample Slide for 13 mm Windows 70, 71

181-1100 PIKE CrushIR Hydraulic Press 90

181-1110 PIKE CrushIR Hydraulic Press, Evacuable Pellet Pressand Magnetic Holder 90

181-1120 PIKE CrushIR Heated Platens Package 90

181-1300 PIKE Auto-CrushIR Hydraulic Press (110V) 91

181-1302 PIKE Auto-CrushIR Hydraulic Press (220V) 91

181-1310 PIKE Auto-CrushIR, with Evacuable Pellet Press, and Magnetic Holder (110V) 91

181-1312 PIKE Auto-CrushIR, with Evacuable Pellet Press, and Magnetic Holder (220V) 91

181-2000 PIKE Heated Platens Accessory 89, 91

181-3000 Spacer Set (15, 25, 50, 100, 250, 500 microns) 89

181-3020 Aluminum Disks, 50 each 89

181-3010 Spacer, 15 micron 89






198-1623 Manual Glan-Taylor 118

198-1624 Manual UV Glan-Thompson 118

198-1625 Automated Glan-Taylor 118

198-1626 Automated UV Glan-Thompson 118

300-0002 Gold Substrate Alignment Mirror (1.25" x 3.0")43, 45, 46, 47, 48, 70

300-0025 13 mm Gold Surfaced Disk for Reflection Analysis 70, 71

300-0039 Alignment Mirror 44

300-0300 UV Aluminum Mirror (25.4 mm x 25.4 mm) 119

300-0301 UV Aluminum Mirror (38.1 mm x 38.1 mm) 120

430-1110 Vacuum Pump, 110V 88, 90

430-1120 Vacuum Pump, 220V 88, 90

FA X O R D E R F O R M

Date ____________________________________________________

Name ___________________________________________________

Telephone Number ________________________________________

E-mail ___________________________________________________

Fax Number ______________________________________________

PIK

ET

EC

HN

OL

OG

IES

WW

W.

PIK

ET

EC

H.

CO

M6

08

-27

4-2

72

1

144

S H I P P I N G A D D R E S S

Company Name___________________________________________

Address __________________________________________________

City _____________________________________________________

State _______________________________ Zip Code ____________

Attention ________________________________________________

B I L L I N G A D D R E S S

Company Name___________________________________________

Address __________________________________________________

City _____________________________________________________

State _______________________________ Zip Code ____________

Attention ________________________________________________

� Same as Shipping Address

S P E C I A L R E Q U I R E M E N T S / C O M M E N T S

Fax to: 608-274-0103

� P.O. � MasterCard � Visa

P.O. Number______________________________________________

Card Number _____________________________________________

Card Security Number______________________________________

Issued to _________________________________________________

Expiration Date ___________________________________________

Terms: Payment net 30 days; Ship FOB: Madison, WI (typically UPS Blue) unless specified otherwise.

PA R T N U M B E R D E S C R I P T I O N Q U A N T I T Y

ORDERING TERMS, CONTACT INFORMATION AND GUARANTEE

Part Numbers and PriceThe PIKE price list includes accessories that may be used with a variety of makes and models of spectrometers. Please specifythe part number and description when ordering, includingyour instrument type and model number. The table listed onthe last page fold-out of this catalog summarizes instrumentcodes for most FTIR manufacturers. These codes are substitutedfor the final two digits (XX) in the accessory part number. PIKE Technologies is continually extending the accessory product range. If you are unable to find a required item, pleasecontact us to discuss your needs. We will be glad to assist.

Payment TermsPurchase Order Number, C.O.D, Letter of Credit, Cash in advance, MasterCard and Visa are acceptable. Payment is net 30 days, and shipments are FOB Madison, WI USA. Freightcharges are prepaid and added to your invoice. If you wish topay freight charges, please specify this on your order.

International Handling FeeFor orders placed from outside the United States or Canada, a handling fee of $40 will apply per order to cover the costs associated with the additional documentation and bankcharges required for international shipments.

Ways to OrderPlease include the following information for all orders: yourname, phone number, product part number, quantity, ship toaddress, bill to address, purchase order number or credit cardnumber with expiration date and name as they appear on thecard, and spectrometer model on which the accessory will beused. You can place your orders via mail, phone, fax, e-mail orinternet. For your convenience, an order form is printed on the previous page. A copy of this form can be used for mailand fax orders. An electronic order form is available on ourweb page (for P.O. Numbers only – do not use this form forcredit card orders). There is no minimum order requirement.

Please use the following addresses and phone/fax numbers when placing your orders:

PIKE Technologies, Inc. 6125 Cottonwood Drive Madison, WI 53719

(608) 274-2721 (608) 274-0103 (FAX)


www.piketech.com

DeliveryMost items are available ex-stock, and can be shipped to youwithout delay. PIKE will notify you if the required item is temporarily out of stock. The delivery/shipment date is confirmed upon receipt of an order.

Special requirements and custom accessories are subjectto different lead times. Please contact us for price quotes anddelivery information on these products.

GuaranteeAll PIKE products are guaranteed to be free from defects inmaterial and workmanship for a period of 12 months from the date of shipment. Should you be dissatisfied, or have anyqueries, please contact us immediately and we will promptlyrepair or replace the product at no charge.

Product ReturnsPlease contact PIKE to receive your Return Material Authorization(RMA) number if you wish to return any of our products. Customers are responsible for shipping charges for all returnedproducts. For products under warranty, back to customer shipping charges will be covered by PIKE. Please do not return any products without obtaining the RMA number first.

Technical AssistancePIKE Technologies offers comprehensive technical assistance.Please contact us via mail, phone, fax or e-mail with your questions.

International DistributionPIKE Products are available worldwide. Call or send us an e-mail and we will provide you with an address of the sales office closest to your location. All exports are handled in accordance with the US Export Administration Regulations.

PIKE Technologies on the WebVisit our web site to find out more information about newproducts, up-to-date PIKE news, pricing, and to see the latestcopy of the PIKE Reflections Newsletter!

www.piketech.com • [email protected]

Customer satisfaction is very important to all of us here at PIKE Technologies, Inc. We have hopefully made the orderingprocess very fast and simple for you. If you have any questionsor concerns about our products or services, please don’t hesitate to contact us. We will be happy to make adjustmentsto fit your needs.

Products and prices are subject to change without notification.

©2011 PIKE Technologies, Inc.

Spectrum™ belongs to PerkinElmer, Inc.; IRPrestige™ belongs to Shimadzu Corporation; Winspec™ belongs JOEL; Luer-Lok™ belongs to Becton Dickenson; Equinox™, IFS™, Quick-Lock™, Tensor™, Vector and Vertex™ belongs to Bruker Optics Inc.; Cabosil™ belongs to Cabot Corporation; Pyrex® belongs to Corning Glass Works; Delrin®, Kalrez®, Teflon®, and Viton® belong to E.I. du Pont de Nemours and Company; Emcompress™ belongs to JRSPharma; Visual BASIC™ belongs to Microsoft Corporation; Fluorolube® belongs to OxyChem Corporation; Nujol™ belongs to Schering-Plough; Avatar™,Genesis™, Impact™, iS™5, iS™10, Nexus™, Nicolet™, and Protégé™ belong to Thermo Fisher Scientific; Excalibur™ and Scimitar™ belong to Varian, Inc;INFRALUM belongs to Lumex Ltd; Interspec belongs to Interspectrum OU. All other trademarks are the property of PIKE Technologies.

FTIR INSTRUMENT CODE XX

ABB Bomem FTLA2000-100 (Arid Zone) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80 Michelson 100, MB Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81 MB 3000 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82

Analect/Hamilton Sundstrand Diamond 20 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60

Bruker Optics IFS™, Vector™, Equinox™ Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 Tensor™, Vertex™ with recognition (Quick-Lock) . . . . . . . . . . . . . . . . . . . . . . . . 51

Buck Scientific M500. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65

Digilab/Bio-Rad/Varian/Agilent Excalibur™, Scimitar™, FTS, 600-IR Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Excalibur, Scimitar, 600-IR with recognition . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13

Horiba 7000 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35

Interspectrum Interspec 200-X . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90

Jasco 300/600 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 400 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57 4000/6000 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58 4000/6000 Series w/recognition. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59

JEOL Winspec™ Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46

Lumex INFRALUM FT-02, FT-08 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67

Midac M Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

PerkinElmer 1700 Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70 Spectrum™ GX, 2000. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71 Spectrum BX/RX, 1600, Paragon 1000 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73 Spectrum ONE, Spectrum 100, 400, FRONTIER . . . . . . . . . . . . . . . . . . . . . . . . . . 74 Spectrum TWO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75

Shimadzu 8300, 8400 Series, IRPrestige, IRAffinity. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 IRPrestige™-21 with recognition (QuickStart). . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

Thermo Fisher Scientific/Nicolet/Mattson Infinity, Galaxy, RS Series . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Genesis™, Satellite, IR 300 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Impact™ 400, Magna, Protégé™, 500/700 Series, Avatar™, Nexus™, Nicolet™ Series, Nicolet iS™10 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 Nicolet iS™5 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 500/700 Series, Avatar, Nexus (Smart) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47

6125 Cottonwood DriveMadison, WI 53719

(608) 274-2721(608) 274-0103 (FAX)


W W W. P I K E T E C H . C O M

pike catalogue 2011

Documents

nicolet series

series wrecognition

fts series

rs series

e t e ch

r i e s

i e swww

ultima sampling kit