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Co-sponsored by www.spie.org/ofbconf Location Rochester Riverside Convention Center Rochester, New York, USA Exhibition 15–17 October Conference and Courses 14–17 October www.spie.org/ofbconf Plan to Attend This program is current as of JUNE 2013 See latest updates online

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Page 1: Plan to Attend - SPIE · 2013. 8. 13. · Robert F. Novak, BAN Optical (USA) Paul R. Tolley, Smart System Technology & Commercialization ... CV Nanotechnology, Inc. DCM Tech, Corp

Co-sponsored by

www.spie.org/ofbconf

LocationRochester Riverside Convention CenterRochester, New York, USA

Exhibition15–17 October

Conference and Courses14–17 October

www.spie.org/ofbconf

Plan to Attend

This program is current as of JUNE 2013See latest updates online

Page 2: Plan to Attend - SPIE · 2013. 8. 13. · Robert F. Novak, BAN Optical (USA) Paul R. Tolley, Smart System Technology & Commercialization ... CV Nanotechnology, Inc. DCM Tech, Corp

About SPIESPIE is an international society advancing an interdisciplinary approach to the science and application of light. www.SPIE.org

About APOMAThe American Precision Optics Manufacturers Association represents a broad constituency of precision optics manufacturers, the supporting industry, and academic associates, whose mutual interest is the advancement and expansion of optics manufacturing and technology. www.APOMA.org

Conference Chairs Program CommitteeThomas Battley, New York Photonics Industry Association (USA)Michael J. Bechtold, OptiPro Systems (USA)Christopher T. Cotton, ASE Optics (USA)Walter C. Czajkowski, Edmund Optics, Inc. (USA)Thomas Danger, Schneider GmbH & Co. KG (Germany)Michael A. DeMarco, QED Technologies, Inc. (USA)Apostolos Deslis, JENOPTIK Optical Systems, Inc. (USA)Toshihide Dohi, OptiWorks, Inc. (Japan)Tom Godin, Satisloh North America Inc. (USA)Heidi Hofke, OptoTech Optical Machinery Inc. (USA)Jay Kumler, JENOPTIK Optical Systems, Inc. (USA)Justin J. Mahanna, Universal Photonics Inc. (USA)

Michael A. Marcus, Lumetrics (USA)Paul Meier-Wang, AccuCoat Inc. (USA)Ted Mooney, ITT Exelis (USA)Richard A. Nasca, Corning Tropel Corp. (USA)Michael N. Naselaris, Sydor Optics, Inc. (USA)John J. Nemechek, Metrology Concepts LLC (USA)Buzz Nesti, Naked Optics Corp. (USA)Robert F. Novak, BAN Optical (USA)Paul R. Tolley, Smart System Technology & Commercialization Ctr. (USA)Martin J. Valente, Arizona Optical Systems, LLC (USA)Kirk J. Warden, LaCroix Optical Co. (USA)Robert Anton Wiederhold, Optimax Systems, Inc. (USA)

Exhibition Chairs

James M. SydorSydor Optics, Inc. (USA)

Richard A. Nasca Corning Corp. (USA)

Matthias Pfaff OptoTech Optikmaschinen GmbH (Germany)

Julie Bentley Univ. of Rochester (USA)

Exhibition: 15–17 October 2013Conference and Courses: 14–17 October 2013Rochester Riverside Convention CenterRochester, New York, USA

Page 3: Plan to Attend - SPIE · 2013. 8. 13. · Robert F. Novak, BAN Optical (USA) Paul R. Tolley, Smart System Technology & Commercialization ... CV Nanotechnology, Inc. DCM Tech, Corp

Come to North America’s largest optical fabrication event this fall Technical Program—Where Research and Industry MeetAt Optifab you’ll fi nd research AND industry — a unique format that lets you gain valuable insight into the optical fabrication market by maximizing interaction between leading international researchers and manufacturers.

With a unique technical focus on classical and advanced optical manufacturing technologies, Optifab offers conference attendees an exceptional opportunity to interact with worldwide experts in the fi eld of optical fabrication.

SPIE Optifab is your essential venue for new business and competitive advantage. There is no other event in North America that provides your company the exposure of SPIE Optifab. It’s where optical fabrication business gets done and attendees fi nd solutions.

Courses Get the latest certifi ed technical training. Choose from 12 half- and full-day courses designed for the working engineer to address current challenges in optical design, engineering, manufacturing, and optomechanics.

Exhibition Optifab is the largest optical manufacturing product and supplier exhibition held in the United States. Walk the fl oor and see over 140 companies showcasing the latest in optical fabrication technologies. This is an event where you’ll see these scientifi c precision machines and interactive demos on how they are used.

Special Events Product demonstrations, poster session, and evening networking reception. Join SPIE, APOMA, and your peers to see cutting-edge optical fabrication equipment and network with your peers—it’s where optical fabrication business gets done and attendees fi nd solutions.

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Page 4: Plan to Attend - SPIE · 2013. 8. 13. · Robert F. Novak, BAN Optical (USA) Paul R. Tolley, Smart System Technology & Commercialization ... CV Nanotechnology, Inc. DCM Tech, Corp

TimeMonday

14 OctoberTuesday

15 OctoberWednesday16 October

Thursday17 October

MORNINGSESSIONS

SESSION 1Grinding and Polishing Processes I

SESSION 5 Metrology I

SESSION 9Optical Design

SESSION 11Meter Class Optics

EXHIBITION — Walk the fl oor and see the latest in optical fabrication technologies

10 am to 5 pm 10 am to 6 pm 10 am to 3 pm

SESSION 2Grinding and Polishing Processes II

SESSION 6 Plenary SessionDisruptive innovation: the story of the fi rst digital cameraSteven Sasson, Retired, Eastman Kodak Co.

SESSION 10Optical Engineering

SESSION 12Molded Optics

SC1061 Designing Optical Systems with Manufacturable Aspheres (Bentley)

SC690 Optical System Design: Layout Principles and Practice (Greivenkamp)

SC1119 Subcon-tracting Custom Optics (Orr)

SC1019 Mounting of Optical Components (Kasunic)

SC863 Introduction to Modern Optical Drawings – the ISO 10110 Standard (Aikens)

SC321 Thin Film Optical Coatings (Macleod)

SC350 Optical Manufacturing Overview (Novak)

Lunch Break

AFTERNOONSESSIONS

SESSION 3Grinding and Polishing Processes III

SESSION 7Metrology II

POSTER SESSIONAuthors will be present for discussion during the Networking Reception.

SESSION 4Optical Fabrication of Freeform Surfaces

SESSION 8Optical Materials, Cleaning, and Coating

INDUSTRY EVENTS Future of MetrologyPanel discussion on the future developments of metrology.

Getting Hired in 2013 and BeyondPanel discussion on careers in optics and photonics outside the academic world.

SC1039 Evaluat-ing Aspheres for Manufacturability (Forbes, Murphy, Dumas)

SC848 Fundamentals of Single Point Diamond Turning (Schaefer)

SC1086 Optical Materials, Fabrication and Testing for the Optical Engineer (DeGroote Nelson)

SC1011 Making Sense of Waviness and Roughness on Optics (Aikens)

SC015 Structural Adhesives for Optical Bonding (Daly)

EVENINGEVENTS

15th Annual Photonics Clambake5:30 pmHyatt Ballroom

Networking Reception and Poster Viewing4:30 to 6:00 pmAll attendees are invited to relax, socialize, and enjoy refreshments.

Daily Schedule of Events

Page 5: Plan to Attend - SPIE · 2013. 8. 13. · Robert F. Novak, BAN Optical (USA) Paul R. Tolley, Smart System Technology & Commercialization ... CV Nanotechnology, Inc. DCM Tech, Corp

Special EventsPlenary SessionTuesday 15 October · 11:00 am to 12:00 pm

Disruptive innovation:the story of the fi rst digital cameraSteven Sasson, Retired, Eastman Kodak Co. (USA)

The creation of the fi rst digital camera prototype in 1975 at the Eastman Kodak Company will be discussed as well as how the concept was demonstrated within Kodak during the following year. Subsequent technical innovations with megapixel imagers, image compression products in the mid 1980’s, and the early commercialization of professional and consumer digital still cameras in the early 1990’s will be discussed. The internal Kodak reaction to these developments will be highlighted as well as some of the learned observations about how to deal with disruptive innovation within an established corporate environment will be shared.

Steven Sasson attended Rensselaer Polytechnic Institute (RPI) in Troy N.Y. and in 1973; he graduated with a BS and a Masters degree in electrical engineering. During the summers of his college years (’68 –’73), he had several jobs that included being a “runner” on Wall Street (before Email!) After graduation Steven

joined Eastman Kodak Company as an electrical engineer working in an applied research laboratory. He engaged in a number of early digital imaging projects. Among these was the design and construction of the fi rst digital still camera and playback system in 1975. Steven continued to work throughout the 1980s in the emerging fi eld of digital photography receiving over 10 key digital imaging patents. In 1989 he led the development of the fi rst prototype mega pixel electronic digital camera utilizing DCT compression that stored images to fl ash memory cards. Steven continued his work throughout the 1990’s by developing one of the fi rst photographic quality thermal printing systems, derivatives of which are still in use in self-service imaging kiosks around the world today. Before retiring in 2009 Steven was a project manager in the Intellectual Property Transactions group at Kodak. Steven is married to Cynthia and they have two children, Michael (25) and Jennifer (22). The family lives in Hilton N.Y. Steven enjoys playing basketball and jogging, in spite of the present state of his 62 year old knees.

15th Annual Photonics ClambakeTuesday 15 October · 5:30 pmHyatt BallroomOptifab 2013 Attendees and Exhibitors are welcome to attend. Limited space available. Reservation and payment form will be available in early September. Invitations with additional information will be sent in late August. Contact Michael Naselaris, Sydor Optics, Inc., to be added to the invitation list: [email protected]

ct Michael Naselaris, Sydor Optics, Inc., to be the invitation list: [email protected]

Networking Reception and Poster ViewingWednesday 16 October · 4:30 to 6:00pmAll attendees are invited to relax, socialize, and enjoy refreshments. Conference posters will be on display. Poster authors will be present for discussion from 4:30 to 6:00 pm. Poster authors may set up their posters on Wednesday from 10:00 am to 4:00 pm. Poster authors should check in at SPIE Registration before displaying their posters.

Future of MetrologyWednesday 16 October · 2:00 to 3:00 pmModerated by Tom Battley, New York Photonics Industry Association (USA)

Join us for a lively panel discussion on the future developments of metrology. Leaders in the industry will present and share their vision.

Getting Hired in 2013 and BeyondWednesday 16 October · 3:30 to 4:30 pmJoin us for a panel discussion on careers in optics and photonics outside the academic world. Learn about getting hired at tech-based companies and non-academic jobs directly from human resource professionals in the optics and photonics sector.

SPIE/APOMA Optifab 2013 · www.spie.org/ofbconf · +1 360 676 3290 · [email protected] · #optifab 3

Presented by:

Page 6: Plan to Attend - SPIE · 2013. 8. 13. · Robert F. Novak, BAN Optical (USA) Paul R. Tolley, Smart System Technology & Commercialization ... CV Nanotechnology, Inc. DCM Tech, Corp

Optifab ExhibitionWalk the fl oor and see over 140 companies showcasing the latest in optical fabrication technologies. This is an event where you’ll see these scientifi c precision machines and the people who use them.

ON THE EXHIBITION FLOOR: • Optical fabrication equipment• Optical components, materials, and systems• Opto-mechanical components and devices• Laser system components• Optical thin fi lm coatings• Optical metrology and testing equipment• Clean room equipment• Software, adhesives, glass, and consumables

Exhibition Hours:

Tuesday • 10:00 am to 5:00 pm

Wednesday • 10:00 am to 6:00 pm

Thursday • 10:00 am to 3:00 pm

Exhibition Chairs

James M. Sydor, Sydor Optics, Inc. (USA)

Richard A. Nasca, Corning Tropel Corp.(USA)

“See new technologies, new products, and speak with many potential suppliers without wasting time.”

–Kevin HardingGE Global Research

To learn more:Get the most up-to-date information on SPIE Optifab, including travel, accommodations, and registration at:

www.spie.org/ofbconf4 SPIE/APOMA Optifab 2013 · www.spie.org/ofbconf · +1 360 676 3290 · [email protected] · #optifab

Page 7: Plan to Attend - SPIE · 2013. 8. 13. · Robert F. Novak, BAN Optical (USA) Paul R. Tolley, Smart System Technology & Commercialization ... CV Nanotechnology, Inc. DCM Tech, Corp

4D Technology Corp.AccuCoat Inc.Advanced Abrasives Corp.Advanced Glass IndustriesAMETEK Precitech, Inc.AMETEK Taylor Hobson Inc.Andover Corp.Applied Image, Inc.Applied Surface Technologiesattocube systems Inc.Boldt Machinery, Inc.C&D Assembly, Inc.Cleaning Technologies Group,

LLCContour Fine Tooling Inc.CV Nanotechnology, Inc.DCM Tech, Corp.Diffraction International Ltd.Displays & Optical

Technologies Inc.Diverse Optics Inc.dopa diamond toolsElectro Optics MagazineEMF Corp.Eminess Technologies, Inc.Empire West, Inc.Engineering Synthesis Design,

Inc.ET Precision Optics Inc.Evatec NA inc.Ferrotec (USA) Corp.Fraunhofer-Institut für

ProduktionstechnologieFujitok Corp.Glass Fab, Inc.GTI Technologies, Inc.Heraeus Quartz America LLCHinds Instruments, Inc.II-VI Infraredilis gmbhInnolite GmbHInrad OpticsIntlvacIOP Publishing Ltd.IRD GlassIsuzu Glass, Inc.JAYCO Cleaning Technologies

JENOPTIK Optical Systems, LLC

JML Optical Industries, LLCKreischer Optics, Ltd.Kugler of America Ltd.LaCroix Optical Co.Larsen Equipment Design, Inc.Laser Focus WorldLattice Materials LLCLeybold Optics USA, Inc.Luphos GmbHMagnus Precision

Manufacturing, Inc.Mahr Federal Inc.McVac Manufacturing Co., Inc.MicroSystems GmbHMildex, Inc.Moore Nanotechnology

Systems, LLCNanophase Technologies

Corp.Newport Thin Film Lab., Inc.NGL Cleaning Technology SANiCoForm, Inc.North American Coating

LaboratoriesnPoint, Inc.Ohara Corp.Optical Perspectives Group,

LLCOptics Technology, Inc.Optikos Corp.Optimax Systems, Inc.OptiPro SystemsOptiWorks, Inc.OPTIX Co.OptoSigma Corp.OptoTech Optical Machinery

Inc.Opto-Technological Lab., Ltd.P.R. Hoffman Machine

Products, Inc.PHASICS S.A.Photon Gear, Inc.Photonics Media/Laurin

PublishingPhotonics OnlinePrecision Glass & Optics

Precision Laser TechnologyPrecision MicroDynamics, Inc.PremaTech Advanced

CeramicsQED Technologies, Inc.R. Mathews Optical Works,

Inc.Radiant Zemax, LLCReynard Corp.Salem Distributing Co.Satisloh North America Inc.Schneider Optical Machines

Inc.Shanghai Optics Inc.Sierra Precision OpticsSlicingTechSpica Technologies, Inc.Swift Glass, Inc.Sydor Optics, Inc.Synopsys, Inc.Syntec OpticsTechmetals, Inc.Technodiamant USA Inc.Technotrade International, Inc.Tecport Optics, Inc.Tempo Plastic Co.The Lindgren GroupThe Optronics Co., Ltd.TRIOPTICS GmbHTydexUnist Technologies Corp.United Lens Co., Inc.Univ. of RochesterUniversal Photonics Inc.Valtech Corp.Vermont Photonics

Technologies Corp.Volpi USAWordingham TechnologiesWrisley AbrasivesXactra TechnologiesXonox Technology GmbHZeeko Ltd.Zygo Corporation

www.spie.org/ofbconf

OptifabExhibitors

Your exhibition registration puts you face-to-face with these leading companies.

SPIE/APOMA Optifab 2013 · www.spie.org/ofbconf · +1 360 676 3290 · [email protected] · #optifab 5

Page 8: Plan to Attend - SPIE · 2013. 8. 13. · Robert F. Novak, BAN Optical (USA) Paul R. Tolley, Smart System Technology & Commercialization ... CV Nanotechnology, Inc. DCM Tech, Corp

Technical Program

Hear from industry leaders on some of the biggest challenges and most promising areas in this fi eld.

Don’t miss these technical presentations

Monday–Thursday 14–17 October 2013 • Proceedings of SPIE Vol. 8884

Optifab

Monday 14 OctoberSESSION 1 . . . . . . Mon 8:00 am to 9:40 am

Grinding and Polishing Processes ICost effective fabrication method for large sapphire sensor windows, Alan R. Gould, Kevin Bartlett, Matthew R. Brophy, Jessica DeGroote Nelson, Optimax Systems, Inc. (USA) . . . . . . . . . . . . . . [8884-1]

Effects of varying machine stiffness and contact area in UltraForm Finishing, Dennis E. Briggs, Samantha Echaves, Brendan Pidgeon, Nathan Travis, Jonathan D. Ellis, Univ. of Rochester (USA) . . . [8884-2]

Determination of a suitable parameter fi eld for the active fl uid jet polishing process, Roland Maurer, Christian Trum, Heiko Biskup, Hochschule Deggendorf (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-3]

Magnetorheological fi nishing with chemically-modifi ed fl uids for studying material removal of single crystal ZnS, Sivan Salzman, Henry J. Romanofsky, Yoem I. Clara, Garrett J. West, Luccas J. Giannechini, John C. Lambropoulos, Stephen D. Jacobs, Univ. of Rochester (USA) . . . . . . . . . . . [8884-4]

Dressing of grinding wheels for ultra precision grinding of diffractive structures in tungsten carbide molds, Thomas Bletek, Fritz Klocke, Martin Hünten, Olaf Dambon, Fraunhofer-Institut für Produktionstechnologie (Germany) . . . . . . . . . . [8884-5]

SESSION 2 . . . . Mon 10:10 am to 12:10 pm

Grinding and Polishing Processes IIThe removal of mid-spatial frequency (MSF) errors using stress-polishing, Peter C. Hill, Peter N. Blake, Carl R. Strojny, Shahram Shiri, Jason G. Budinoff, NASA Goddard Space Flight Ctr. (USA); Gregory J. Michels, Sigmadyne, Inc. (USA) . . . . . . . . . . . . [8884-6]

Effi ciency of magneto-rheological fl uid fi nishing on the elimination of defaults in fused silica optics, Rodolphe Catrin, Commissariat à l’Énergie Atomique (France) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-7]

Optical surfacing process optimization using parametric smoothing model for mid-to-high spatial frequency error control, Dae Wook Kim, College of Optical Sciences, The Univ. of Arizona (USA); Hubert M. Martin, The Univ. of Arizona (USA); James H. Burge, College of Optical Sciences, The Univ. of Arizona (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-8]

Relations between subsurface damage depth and surface roughness using the Abbott Firestone curve, Pierre Blaineau, Olivier Cahuc, Raynald Laheurte, Philippe Darnis, Univ. Bordeaux 1 (France); Jérôme Néauport, Nathalie Ferriou-Daurios, Commissariat à l’Énergie Atomique (France) . . [8884-9]

Fabrication of optical surfaces of fused silica with ultralow subsurface damage, Junlin Wang, Changchun Institute of Optics, Fine Mechanics and Physics (China) . . . . . . . . . . . . . . . . . . . . . . . . [8884-10]

Multiwavelength digital holography for polishing tool shape measurement, Vit Ledl, Institute of Plasma Physics of the ASCR, v.v.i. (Czech Republic); Pavel Psota, Technical Univ. of Liberec (Czech Republic); Jan Vaclavik, Institute of Plasma Physics of the ASCR, v.v.i. (Czech Republic); Roman Dolecek, Technical Univ. of Liberec (Czech Republic); Petr Vojtisek, Institute of Plasma Physics of the ASCR, v.v.i. (Czech Republic) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-11]

Lunch Break . . . . . . . . . . . . .Mon 12:10 pm to 1:10 pm

Conference Chairs

Matthias Pfaff, OptoTech Optikmaschinen GmbH (Germany)

Julie Bentley, Univ. of Rochester (USA)

Program Committee: Thomas Battley, New York Photonics Industry Association (USA); Michael J. Bechtold, OptiPro Systems (USA); Christopher T. Cotton, ASE Optics (USA); Walter C. Czajkowski, Edmund Optics, Inc. (USA); Thomas Danger, Schneider GmbH & Co. KG (Germany); Michael A. DeMarco, QED Technologies, Inc. (USA); Apostolos Deslis, JENOPTIK Optical Systems, Inc. (USA); Toshihide Dohi, OptiWorks, Inc. (Japan); Tom Godin, Satisloh North America Inc. (USA); Heidi Hofke, OptoTech Optical Machinery Inc. (USA); Jay Kumler, JENOPTIK Optical Systems, Inc. (USA); Justin J. Mahanna, Universal Photonics Inc. (USA); Michael A. Marcus, Lumetrics (USA); Paul Meier-Wang, AccuCoat Inc. (USA); Ted Mooney, ITT Exelis (USA); Richard A. Nasca, Corning Tropel Corp. (USA); Michael N. Naselaris, Sydor Optics, Inc. (USA); John J. Nemechek, Metrology Concepts LLC (USA); Buzz Nesti, Naked Optics Corp. (USA); Robert F. Novak, BAN Optical (USA); Paul R. Tolley, Smart System Technology & Commercialization Ctr. (USA); Martin J. Valente, Arizona Optical Systems, LLC (USA); Kirk J. Warden, LaCroix Optical Co. (USA); Robert Anton Wiederhold, Optimax Systems, Inc. (USA)

6 SPIE/APOMA Optifab 2013 · www.spie.org/ofbconf · +1 360 676 3290 · [email protected] · #optifab

Page 9: Plan to Attend - SPIE · 2013. 8. 13. · Robert F. Novak, BAN Optical (USA) Paul R. Tolley, Smart System Technology & Commercialization ... CV Nanotechnology, Inc. DCM Tech, Corp

SESSION 3 . . . . . . Mon 1:10 pm to 3:10 pm

Grinding and Polishing Processes IIIInnovations within the process chain for ultraprecise optics fabrication, Sebastian Stoebenau, Sebastian Stahringer, Roland Mandler, Matthias Pfaff, OptoTech Optikmaschinen GmbH (Germany) [8884-12]

Deterministic polishing process for aspheric lenses in a production environment, Gerd Stach, Satisloh GmbH (Germany). . . . . . . . . . . . . . . . . . . . . . . [8884-13]

Determinisitc fi nishing of aspheric optical components, Teddy J. Lambropoulos, OptiPro Systems (USA) . . . . . . . . . . . . . . . . . . . . . . . . . [8884-14]

Effi cient grinding and polishing processes for asphere manufacturing, Markus Hinn, Schneider GmbH & Co. KG (Germany); Alex Pisarski, Schneider Optical Machines Inc. (USA) . . . . . . . . . . . . . . [8884-15]

Getting the most out of your cerium oxide glass polishing slurry: reducing risk and improving performance with plasma produced particles, Patrick G. Murray, Abigail Hooper, Nanophase Technologies Corp. (USA); Jason Keleher, Jordan Kaiser, Meghan Nichol, Lewis Univ. (USA) . . . [8884-16]

New developments in fi xed abrasive grinding and their potential for the production of optical components, Marcel Patraschkov, dopa diamond tools (Germany) . . . . . . . . . . . . . . . . . . . . . . . . [8884-17]

SESSION 4 . . . . . . Mon 3:40 pm to 6:00 pm

Optical Fabrication of Freeform Surfaces

Developments in precision optical grinding technology, Edward M. Fess, Michael J. Bechtold, Franciscus Wolfs, Rob Bechtold, OptiPro Systems (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-18]

Additive manufacturing of tools for lapping glass, Wesley B. Williams, The Univ. of North Carolina at Charlotte (USA) . . . . . . . . . . . . . . . . . . . . . . . . [8884-19]

Freeform polishing with UltraForm fi nishing, Franciscus Wolfs, Edward M. Fess, Scott DeFisher, OptiPro Systems (USA) . . . . . . . . . . . . . . . . . . [8884-20]

Fabrication of freeform multispectral-ZnS corrector lenses, Matthew R. Brophy, Jessica DeGroote Nelson, Nathan Smith, Alan R. Gould, Thomas J. Hordin, Mark Walters, Optimax Systems, Inc. (USA) . . . . . . [8884-21]

Effi cient machining of ultra precise steel moulds with free form surfaces, Benjamin Bulla, son-x Gmbh (Germany); David J. Robertson, Durham Univ. (United Kingdom); Olaf Dambon, Fritz Klocke, Fraunhofer-Institut für Produktionstechnologie (Germany) [8884-22]

Integrated manufacturing of complex freeform surfaces, Frank Niehaus, Stephan Huttenhuis, Schneider GmbH & Co. KG (Germany) . . . . . . [8884-23]

Conformal window manufacturing process development and demonstration for polycrystalline materials, Nathan Smith, Alan R. Gould, Thomas J. Hordin, Kate Medicus, Mark Walters, Matthew R. Brophy, Jessica DeGroote Nelson, Optimax Systems, Inc. (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-24]

Travel Grants and Student AwardsATTENTION FACULTY AND STUDENTS

The American Precision Optics Manufacturing Association will sponsor the following awards:

Travel Grants: Multiple $250 travel grants will be awarded to students presently enrolled in North American schools who are presenting papers (either oral or poster) at the meeting.

Best Oral or Poster Student Paper Awards: A panel of APOMA industry representatives will award $1,000 for Exceptional Student Paper (1st place), $750 for Outstanding Student Paper (2nd place), and $500 for Outstanding Student Paper (3rd place).

Sponsored by:

Applications Due by 16 August 2013

More information and how to apply:

www.spie.org/ofbconf

SPIE/APOMA Optifab 2013 · www.spie.org/ofbconf · +1 360 676 3290 · [email protected] · #optifab 7

Page 10: Plan to Attend - SPIE · 2013. 8. 13. · Robert F. Novak, BAN Optical (USA) Paul R. Tolley, Smart System Technology & Commercialization ... CV Nanotechnology, Inc. DCM Tech, Corp

SESSION 5 . . . . . . Tue 8:00 am to 10:40 am

Metrology IComparison of alignment errors in asphere metrology between an interferometric null-test measurement and a non-null measurement with the tilted-wave-interferometer, Goran B. Baer, Johannes Schindler, Christof Pruss, Wolfgang Osten, Univ. Stuttgart (Germany) . . . . . . . . . . . . . . . . . . . . . [8884-25]

Comparison of contact and non-contact asphere surface metrology devices, Scott DeFisher, OptiPro Systems (USA) . . . . . . . . . . . . . . . . . . . . . . . . . [8884-26]

Non-contact metrology of aspheric surfaces based on MWLI technology, Gernot Berger, Juergen Petter, Luphos GmbH (Germany) . . . . . . . . . . . . . . . . [8884-27]

Vertical interferometer workstation for testing large spherical optics, Bruce E. Truax, Zygo Corporation (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-28]

Re-trace error: interferometry’s dark little secret, Cody B. Kreischer, Kreischer Optics, Ltd. (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-29]

Round-robin measurements of toroidal window, Kate Medicus, Optimax Systems, Inc. (USA); Scott DeFisher, OptiPro Systems (USA); Marcin Bauza, Carl Zeiss Industrial Metrology LLC (USA); Paul Dumas, QED Technologies, Inc. (USA); Mikhail A. Gutin, Applied Science Innovations, Inc. (USA) . . . . . [8884-30]

Improved averaging for non-null interferometry, Jon F. Fleig, Paul E. Murphy, QED Technologies, Inc. (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-31]

Development of a high-speed nanoprofi ler using normal vector tracing method for high accuracy mirrors, Kohei Okuda, Kenya Okita, Takao Kitayama, Koji Usuki, Takuya Kojima, Junichi Uchikoshi, Motohiro Nakano, Osaka Univ. (Japan); Yasuo Higashi, High Energy Accelerator Research Organization (Japan); Katsuyoshi Endo, Osaka Univ. (Japan) . . . . . . [8884-32]

Tuesday 15 OctoberSESSION 6 . . . . . Tue 11:00 am to 12:00 pm

PLENARY SESSION

Disruptive innovation:the story of the fi rst digital camera

Steven Sasson, Retired, Eastman Kodak Co. (USA)

The creation of the fi rst digital camera prototype in 1975 at the Eastman Kodak Company will be discussed as well as how the concept was demonstrated within Kodak during the following year. Subsequent technical innovations with megapixel imagers, image compression products in the mid 1980’s, and the early commercialization of professional and consumer digital still cameras in the early 1990’s will be discussed. The internal Kodak reaction to these developments will be highlighted as well as some of the learned observations about how to deal with disruptive innovation within an established corporate environment will be shared.

Steven Sasson attended Rensselaer Polytechnic Institute (RPI) in Troy N.Y. and in 1973; he graduated with a BS and a Masters degree in electrical engineering. During the summers of his college years (’68 –’73), he had several jobs that

included being a “runner” on Wall Street (before Email!) After graduation Steven joined Eastman Kodak Company as an electrical engineer working in an applied research laboratory. He engaged in a number of early digital imaging projects. Among these was the design and construction of the fi rst digital still camera and playback system in 1975. Steven continued to work throughout the 1980s in the emerging fi eld of digital photography receiving over 10 key digital imaging patents. In 1989 he led the development of the fi rst prototype mega pixel electronic digital camera utilizing DCT compression that stored images to fl ash memory cards. Steven continued his work throughout the 1990’s by developing one of the fi rst photographic quality thermal printing systems, derivatives of which are still in use in self-service imaging kiosks around the world today. Before retiring in 2009 Steven was a project manager in the Intellectual Property Transactions group at Kodak. Steven is married to Cynthia and they have two children, Michael (25) and Jennifer (22). The family lives in Hilton N.Y. Steven enjoys playing basketball and jogging, in spite of the present state of his 62 year old knees.

Lunch/Exhibition Break . . . . . Tue 12:00 pm to 1:30 pm

To learn more:Get the most up-to-date information on SPIE Optifab, including travel, accommodations, and registration at:

www.spie.org/ofbconf

8 SPIE/APOMA Optifab 2013 · www.spie.org/ofbconf · +1 360 676 3290 · [email protected] · #optifab

Page 11: Plan to Attend - SPIE · 2013. 8. 13. · Robert F. Novak, BAN Optical (USA) Paul R. Tolley, Smart System Technology & Commercialization ... CV Nanotechnology, Inc. DCM Tech, Corp

SESSION 7 . . . . . . . Tue 1:30 pm to 3:10 pm

Metrology IIHigh-performance metrology techniques used in conjunction with world-class fabrication methods at Zygo Corporation to manufacture optical components for the most demanding applications, James B. Taylor, Richard J. Boland, Edward Gowac, Matthew White, Marc Tricard, Zygo Corporation (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-33]

Fabrication and metrology of high-precision freeform surfaces, Paul Dumas, QED Technologies, Inc. (USA); Jessica D. DeGroote Nelson, Brandon B. Light, Alan R. Gould, Nathan Smith, Optimax Systems, Inc. (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-34]

A simple procedure to include a free-form measurement capability to standard coordinate measurement machines, Florian Schneider, Hochschule Deggendorf (Germany) . . . . . . . . [8884-35]

3D-form metrology of arbitrary optical surfaces by absorption in fl uids, Juan Carlos Martinez-Anton, Juan Manuel Plaza Ortega, Jose Alonso Fernandez, Univ. Complutense de Madrid (Spain) . . . . . . [8884-36]

Worthwhile optical test for free-form mirrors qualifi cation, Giorgia Sironi, Rodolfo Canestrari, INAF - Osservatorio Astronomico di Brera (Italy); Giorgio Toso, INAF - IASF Milano (Italy); Giovanni Pareschi, INAF - Osservatorio Astronomico di Brera (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-37]

SESSION 8 . . . . . . . Tue 3:40 pm to 5:40 pm

Optical Materials, Cleaning, and CoatingCharacterization of structural relaxation in As2Se3 for analysis of lens shape change in glass press mold cooling and post-process annealing, Erick Koontz, Peter Wachtel, J. David Musgraves, Kathleen Richardson, Univ. of Central Florida (USA) and Clemson Univ. (USA) . . . . . . . . . . . . . . . . . . . . [8884-38]

Compositional-tailoring of optical properties in IR transparent chalcogenide glasses for precision glass molding, Benn H. Gleason, J. David Musgraves, Peter Wachtel, Clemson Univ. (USA); Kathleen Richardson, Clemson Univ. (USA) and CREOL, The College of Optics and Photonics, Univ. of Central Florida (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-39]

Aqueous cleaning of precision optics parts, Henry P. Ederle, Borer Chemie AG (Switzerland). . . . . . [8884-40]

Satisloh SP-100: a the fast and reliable machine for coating application in precision optics, Gianni G. Monaco, Satisloh Italy S.p.A. (Italy) . . . . . . . . . [8884-41]

Development of a high specifi cation coating, Peter E. MacKay, Gooch & Housego Plc (United Kingdom) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-42]

Refractive index of thin fi lms realized by Satisloh SP reactive sputtering system, Gianni G. Monaco, Satisloh Italy S.p.A. (Italy) . . . . . . . . . . . . . . . . [8884-43]

15th Annual Photonics Clambake

Tuesday 15 October · 5:30 pmHyatt Ballroom

Optifab 2013 Attendees and Exhibitors are welcome to attend.

Limited space available. Reservation and payment form will be available in early September.

Invitations with additional information will be sent in late August.

Contact Michael Naselaris, Sydor Optics, Inc., to be added to the invitation list: [email protected]

SPIE/APOMA Optifab 2013 · www.spie.org/ofbconf · +1 360 676 3290 · [email protected] · #optifab 9

Presented by:

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Wednesday 16 October

SESSION 9 . . . . . Wed 8:00 am to 10:00 am

Optical DesignOptical design with orthogonal surface descriptions, Gregory W. Forbes, QED Technologies, Inc. (USA); Christoph Menke, Carl Zeiss AG (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-44]

Design of systems involving easily measurable aspheres, Paul E. Murphy, QED Technologies, Inc. (USA); Dave Stephenson, JENOPTIK Optical Systems, LLC (USA); Andrew E. W. Jones, QED Technologies, Inc. (USA); Gregory W. Forbes, QED Technologies, Inc. (Australia) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-45]

Using Excel as a pre-processor for CODE V optimization of air spaces when building camera lenses, Dave Stephenson, JENOPTIK Optical Systems, LLC (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-46]

Integration of measurement data in the comprehensive modelling approach, Ingo Sieber, Karlsruher Institut für Technologie (Germany); Olaf Ruebenach, INGENERIC GmbH (Germany) . . [8884-47]

Rapid design of LED optical elements with two free-form surfaces generating uniformly illuminated rectangular area, Mikhail A. Moiseev, Leonid L. Doskolovich, Sergey V. Kravchenko, Image Processing Systems Institute (Russian Federation) . . . . . . [8884-48]

Design of freeform optical elements generating a line-shaped directivity diagram, Leonid L. Doskolovich, Anton Y. Dmitriev, Mikhail A. Moiseev, Image Processing Systems Institute (Russian Federation) . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-49]

SESSION 10 . . . Wed 10:30 am to 12:10 pm

Optical EngineeringOptical characterization of window materials for aerospace applications, Ken K. Tedjojuwono, Natalie Clark, William M. Humphreys Jr., NASA Langley Research Ctr. (USA) . . . . . . . . . . . . . . . . . . . . [8884-50]

Development of a calibration standard for spherical aberration (SA), David C. Compertore, Filipp V. Ignatovich, Michael A. Marcus, Lumetrics, Inc. (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-51]

Metrology for multilayer Laue lenses, Nathalie Bouet, Raymond Conley Jr., Juan Zhou, Hanfei Yan, Xiaojing Huang, Yong S. Chu, Brookhaven National Lab. (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-52]

Precision interferometric measurements of refractive index of polymers in air and liquid, Michael A. Marcus, Filipp V. Ignatovich, Kyle Hadcock, Don Gibson, Lumetrics, Inc. (USA) . . . . . . . . . [8884-53]

Optical test bench for high precision metrology and alignment of zoom sub-assembly components, Benoit F. Wattellier, PHASICS S.A. (France); Francois Lepretre, Eric Levillain, Thales Angénieux S.A. (France); Pascal Delage, Antoine Gascon, Djamel Brahmi, PHASICS S.A. (France) . . . . . . . . . . . . . . . . . . [8884-54]

Industry EventsFuture of Metrology

Wednesday 16 October · 2:00 to 3:00 pm

Moderated by Tom Battley, New York Photonics Industry Association (USA)

Join us for a lively panel discussion on the future developments of metrology. Leaders in the industry will present and share their vision.

Getting Hired in 2013 and Beyond

Wednesday 16 October · 3:30 to 4:30 pm

Join us for a panel discussion on careers in optics and photonics outside the academic world. Learn about getting hired at tech-based companies and non-academic jobs directly from human resource professionals in the optics and photonics sector.

Complete descriptions online: www.spie.org/ofbconf

10 SPIE/APOMA Optifab 2013 · www.spie.org/ofbconf · +1 360 676 3290 · [email protected] · #optifab

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Poster Session · Wed. 4:30 to 6:00 pmPoster authors may set up their posters on Wednesday from 10:00 am to 4:00 pm.

Poster authors should check in at SPIE Registration prior to displaying their posters.

Authors will be present for discussion during the Networking Reception from 4:30 to 6:00 pm.

Position determination of disturbance along a modifi ed saganac interferometer, Pang Bian, Yuan Wu, Qian Xiao, Bo Jia, Fudan Univ. (China) . . [8884-67]

An effi cient angle-independent mid-infrared plasmonic polarizer, Mohammed N. Abbas, Univ. of Baghdad (Iraq) . . . . . . . . . . . . . . . . . . . . . . . . . [8884-68]

Properties of Kummer beams in the structure of metamaterials, Marco Marin, Univ. EAFIT (Colombia) . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-69]

Dewar-level integrated MWIR wavefront sensor for high sensitivity optical quality control, Benoit F. Wattellier, Sabrina Velghe, William Boucher, PHASICS S.A. (France); Nicolas Guérineau, ONERA (France); Serge Magli, SOFRADIR (France); Gilles Aubry, HGH Systèmes Infrarouges (France); Sylvain Rommeluère, Julien Jaeck, ONERA (France) . . . . . . . . . . . . [8884-70]

Simulations and fi rst manufacturing steps of a full integrated WDM-element in the visible spectrum, Matthias Haupt, Ulrich H. P. Fischer, Mladen Joncic, Hochschule Harz (Germany) . . . . . . . . . . . . . . [8884-71]

Off-axis mirror fabrication from spherical surfaces under mechanical stress, Rafael Izazaga-Pérez, María-Elizabeth Percino-Zacarías, Fermin-Salomon Granados-Agustín, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico) . . . . . . . . . . . . . [8884-72]

Current status of the prototype development of the fast steering mirror for Giant Magellan Telescope, Young-Soo Kim, Ju Heon Koh, Hwa Kyoung Jung, Ho June Jung, Korea Astronomy and Space Science Institute (Korea, Republic of); Myung K. Cho, National Optical Astronomy Observatory (USA); Ho-Soon Yang, Korea Research Institute of Standards and Science (Korea, Republic of); Ho-Sang Kim, Kyoung-Don Lee, Institute for Advanced Engineering (Korea, Republic of); Hyo-Sung Ahn, Gwangju Institute of Science and Technology (Korea, Republic of); Won Hyun Park, College of Optical Sciences, The Univ. of Arizona (USA); Sug-Whan Kim, Yonsei Univ. (Korea, Republic of); Yoon-Kyung Seo, In-Soo Yuk, Byeong-Gon Park, Korea Astronomy and Space Science Institute (Korea, Republic of) . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-73]

Actuators delay analysis of active lap manufacturing, Hongshen Zhao, Bin Fan, Xiaojin Li, Zhige Zeng, Institute of Optics and Electronics (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-74]

Metrology of arbitrary optical surfaces by TOPAF, Juan Carlos Martínez-Anton, Juan Manuel Plaza Ortega, Jose Alonso Fernandez, Univ. Complutense de Madrid (Spain) . . . . . . . . . . . . . . . . . . . . . . . . . [8884-75]

High-effi ciency relief-phase diffractive microstructures made on curvilinear substrates, Gregory I. Greisukh, Penza State Univ. of Architecture and Construction (Russian Federation) . . . . . . [8884-76]

4D phase profi le of a thin fl ame using a single-shot polarizing phase shifting interferometry technique, Noel Ivan Toto Arellano, Univ. Tecnológica de Tulancingo (Mexico); David Ignacio Serrano-Garcia, Ctr. de Investigaciones en Óptica, A.C. (Mexico); Geliztle Alejandra Parra-Escamilla, Luis Castelan-Olvera, Jonathan Martinez-Lozano, Univ. Tecnológica de Tulancingo (Mexico) . . . . . . . . . . . . . . . . . . [8884-77]

Experience of testing spherical optics with the use of a point-diffraction interferometer, Nikolay B. Voznesenskiy, Mariia Voznesenskaia, Natalia Petrova, VTT-NTM OÜ (Estonia); Artur Abels, SmartStuff OU (Estonia) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-78]

The plastic lens molding injection warpage and aberration by optomechanical analysis, Ming-Ying Hsu, Instrument Technology Research Ctr. (Taiwan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-79]

Wavefront measurements through optical diffraction interpretation, Stéphane Bouillet, Commissariat à l’Énergie Atomique (France) . [8884-80]

Absolute testing of freeform lens, Xin Jia, Tingwen Xing, Institute of Optics and Electronics (China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-81]

Optical resolution measurement system for small lens by using slanted-slit method, Chou-Min Chia, Kuang-Yuh Huang, National Taiwan Univ. (Taiwan) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-82]

The infl uence of calculating compensation force based on different response functions, Hongqiao Wang, Bin Fan, Yongqian Wu, Institute of Optics and Electronics (China) . . . . . . . . . . . . . . . . . . . . . . [8884-83]

Fabrication of a solid immersion lens applied to Infrared microscopy to improve the spatial resolution over its diffraction limit, Hayeong Sung, Myung Sang Huh, Gil Jae Lee, Kyesung Lee, Korea Basic Science Institute (Korea, Republic of); Sun Choel Yang, Osong Medical Innovation Foundation (Korea, Republic of); Ky Joo Lee, Chungnam National Univ. (Korea, Republic of); Geonhee Kim II, Korea Basic Science Institute (Korea, Republic of) . . . . . . . [8884-84]

Slope-sensitive optical probe for freeform optics metrology, Andrew D. Keene, Jonathan D. Ellis, Univ. of Rochester (USA); Scott DeFisher, Edward M. Fess, OptiPro Systems (USA) . . . . . . . . . . . . . . . . . . [8884-85]

Rotary ultrasonic machining, Yusuf Venjara, Tongtai Seiki USA Inc. (USA) . . . . . . . . . . . . . . . . . . . . [8884-86]

Crosstalk-immune of wavelength-division-multiple of fi ber optic sensor for disturbance detection and location , Yuan Wu, Pang Bian, Bo Jia, Qian Xiao, Fudan Univ. (China) . . . . . . . . . . . . . . . . . . . . . [8884-87]

Smart and precise alignment of optical systems, Patrik Langehanenberg, Josef Heinisch, Daniel Stickler, TRIOPTICS GmbH (Germany) . . . . . . . . . . . . . [8884-88]

OptiCentric lathe centering machine, Christian Buss, Josef Heinisch, TRIOPTICS GmbH (Germany) [8884-89]

Interaction of N-FK5 and L-BAL35 optical glass with various carbide and other precision glass mold tooling, Erick Koontz, Clemson Univ. (USA) and CREOL, Univ. of Central Florida (USA); Peter Wachtel, J. David Musgraves, Clemson Univ. (USA); Kathleen Richardson, CREOL, The College of Optics and Photonics, Univ. of Central Florida (USA); Safer Mourad, Michael Huber, Andreas M. Kunz, Martin Forrer, FISBA OPTIK AG (Switzerland) . . . . . . [8884-90]

Networking ReceptionWednesday 16 October · 4:30 to 6:00 pm

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Thursday 17 OctoberSESSION 11 . . . . . Thu 8:00 am to 10:00 am

Meter Class OpticsLow weight mirror substrates, Peter E. MacKay, Gooch & Housego Plc (United Kingdom); Nicola L. Beveridge, Univ. of Glasgow (United Kingdom); Trevor Wood, Surrey Satellite Technology Ltd. (United Kingdom) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-55]

New processing equipment for ASTRO optics, Roland Mandler, Jochen Franz, Matthias Pfaff, OptoTech Optikmaschinen GmbH (Germany) [8884-56]

Model-based polishing of meter size optics, Marcel Achtsnick, Jan-Claas Tiedemann, Elisabeth Becker, Berliner Glas KGaA Herbert Kubatz GmbH & Co. (Germany) . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-57]

Hot slumpig technique for the manufacturing of a representative x-ray grazing incidence mirror module for future space missions, Mauro Ghigo, Stefano Basso, Oberto Citterio, Marta M. Civitani, Giovanni Pareschi, Laura Proserpio, Bianca Salmaso, Giorgia Sironi, Daniele Spiga, Giampiero Tagliaferri, Alberto Zambra, INAF - Osservatorio Astronomico di Brera (Italy); Giancarlo Parodi, Francesco Martelli, BCV Progetti S.r.l. (Italy); Daniele Gallieni, Matteo Tintori, A.D.S. International S.r.l. (Italy); Marcos Bavdaz, Eric Wille, European Space Research and Technology Ctr. (Netherlands); Ivan Ferrario, Gabriele Vecchi, INAF - Osservatorio Astronomico di Brera (Italy) . . . . [8884-58]

Thin monolithich glass shells for future high angular resolution and large collecting area x-ray telescope, Marta M. Civitani, Mauro Ghigo, Oberto Citterio, Giovanni Pareschi, INAF - Osservatorio Astronomico di Brera (Italy) . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-59]

Effect of polishing plane vibration on large-size optical workpieces in continuous polishing, Haiyang Shan, Chaoyang Wei, Xueke Xu, Hongbo He, Shijie Liu, Yingfeng Li, Kui Yi, Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China). . . . . . . . . [8884-60]

SESSION 12 . . . . Thu 10:30 am to 12:30 pm

Molded OpticsNanoscale optical features via hot-stamping of As2Se3 glass, Sylvain Danto, Erick Koontz, Univ. of Central Florida (USA) and Clemson Univ. (USA); Yi Zou, Okechukwu Ogbuu, Univ. of Delaware (USA); Benn H. Gleason, Peter Wachtel, J. David Musgraves, Univ. of Central Florida (USA) and Clemson Univ. (USA); Hu Juejun, Univ. of Delaware (USA); Kathleen Richardson, Univ. of Central Florida (USA) and Clemson Univ. (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-61]

Chalcogenide: mold interactions during Precision Glass Molding (PGM), Benn H. Gleason, Clemson Univ. (USA); Ralf Steinkopf, Ramona Eberhardt, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany); Kathleen Richardson, Clemson Univ. (USA) . . . . . . . . . . . . . . . . . . . . [8884-62]

Next generation optics: Asphero-Diffractive glass lenses, Marius Doetz, Fritz Klocke, Olaf Dambon, Katharina Schulz, Fraunhofer-Institut für Produktionstechnologie (Germany) . . . . . . . . . [8884-63]

Novel testing facility for investigating wear on PGM sample tools, Frank Bernhardt, Fraunhofer-Institut für Produktionstechnologie (Germany) . . . . . . . . . [8884-64]

Melt spun aluminium alloys for moulding optics, Guido Gubbels, RSP Technology (Netherlands); Louis Tegelaers, Oerlikon Balzers Coating Benelux N.V. (Belgium); Roger Senden, RSP Technology (Netherlands) . . . . . . . . . . . . . . . . . . . . . . . . . . [8884-65]

Shaping of thin glass foils for the fabrication of mirrors with pronounced asphericity, Rodolfo Canestrari, Giovanni Pareschi, Giorgia Sironi, INAF - Osservatorio Astronomico di Brera (Italy); Giorgio Toso, INAF - IASF Milano (Italy) . . . . . . . . . . . . . . . . [8884-66]

The paper you present will live far beyond the conference roomAll proceedings from this event will be published in the SPIE Digital Library, promoting breakthrough results, ideas, and organizations to millions of key researchers from around the world.

www.SPIEDigitalLibrary.org

Helping engineers

and scientists stay

current and competitive

12 SPIE/APOMA Optifab 2013 · www.spie.org/ofbconf · +1 360 676 3290 · [email protected] · #optifab

Page 15: Plan to Attend - SPIE · 2013. 8. 13. · Robert F. Novak, BAN Optical (USA) Paul R. Tolley, Smart System Technology & Commercialization ... CV Nanotechnology, Inc. DCM Tech, Corp

Courses Improve your skills and make new connections Top training developed with input from local industry leaders, courses range from optical fundamentals to current approaches in engineering and manufacturing, including aspheric optics, metrology, GD&T and manufacturing standards, thin fi lms, and optomechanics.

Structural Adhesives for Optical Bonding

SC015Course Level: Intermediate · CEU: 0.35 $285 Members · $335 Non-Members USD Wednesday 1:30 pm to 5:30 pm

Optomechanical systems require secure mount-ing of optical elements. Adhesives are commonly used, but rarely addressed in the literature. This course has compiled an overview of these adhe-sives, their properties, and how to test them. How to use them is addressed in detail with guidelines and examples provided. A summary of com-mon adhesives is presented with justifi cation for their use. Consideration and analysis of adhesive strength, reliability, and stability are included. Dif-ferent design approaches to optimize the applica-tion are presented and discussed. Many examples are described as well as lessons learned from past experience. Discussions are encouraged to ad-dress current problems of course attendees.

LEARNING OUTCOMESThis course will enable you to:• describe and classify adhesives and how they

work (epoxy, urethane, silicone, acrylic, RTV, VU-cure, etc.)

• obtain guidance in: adhesive selection, surface preparation, application, and curing

• develop a basis for analysis of stress and thermal effects

• recognize contamination/outgassing and how to avoid it

• review design options• create and use an adhesive check list

INTENDED AUDIENCEThis course is for engineers, managers, and tech-nicians. This course provides a foundation for the correct design for successful optical mounting; an understanding of the best options to employ for each application, and the selection and ap-proach conducive to production. A bound course outline (that is a good reference text) is provided, including summaries of popular adhesives and their properties.

INSTRUCTORJohn G. Daly has 35 years of experience in la-sers and optomechanics. Over this period, he has worked optical bonding problems since his thesis projects, as an employee of several major corporations, and now as a consultant. His aca-demic background in mechanical engineering and applied physics compliments this discipline. His work experience has been diverse covering areas such as: military lasers, medical lasers, spectroscopy, point and standoff detection, and E-O systems. His roles over these years have included analysis, design, development, and production. He is a SPIE member, with numerous publications, and is a committee member of the SPIE Optomechanical Engineering Program.

SPIE/APOMA Optifab 2013 · www.spie.org/ofbconf · +1 360 676 3290 · [email protected] · #optifab 13

Page 16: Plan to Attend - SPIE · 2013. 8. 13. · Robert F. Novak, BAN Optical (USA) Paul R. Tolley, Smart System Technology & Commercialization ... CV Nanotechnology, Inc. DCM Tech, Corp

Making Sense of Waviness and Roughness on Optics

SC1011Course Level: Intermediate · CEU: 0.35 $385 Members · $435 Non-Members USD Monday 1:30 pm to 5:30 pm

The surface texture of a polished optical surface is an important, if misunderstood, surface prop-erty. This course is designed to bring photonics personnel up to an immediate working knowledge on surface texture specifi cations and the impact surface roughness and waviness can have on an optical system. Surface roughness causes scatter and system transmission loss, while waviness and mid-spatial frequency ripple can cause loss of res-olution, image quality, veiling glare, beam modula-tion and a host of other issues. Until recently, surface texture could be safely described by a single number, RMS roughness, following MIL-STD-10A, since most polished opti-cal surfaces were manufactured using the same slurry-pitch process that had existed for decades. In the past 30 years, however, new manufactur-ing technologies have evolved using molding, dia-mond turning, synthetic lap polishing and deter-ministic fi guring which have dramatically altered the surface fi nish of optics. In order to control the resultant surface texture errors, new specifi ca-tions like gradients, correlation values, PSDs and MSF ripple specifi cations have been introduced. Most users do not completely understand these new notations however, and the meaning of even a simple RMS roughness specifi cation has become obscure, or even meaningless. The course begins with the origins and evolu-tion of surface texture specifi cations in optics, and defi nes the terms and parameters used to control surface texture in the modern optical manufacturing world. The potential performance impact of surface texture errors will be covered, and some specifi c case studies will be used to show the impact of various amplitudes of these errors on precision optical instrument perfor-mance. The national and international standards are introduced, and the derivation of meaningful specifi cation for texture and waviness for com-mon applications is discussed. Finally, the iden-tifi cation, measurement and reduction of these manufacturing errors is treated.

LEARNING OUTCOMESThis course will enable you to:• describe the surface texture of a polished

optical surface• identify the sources of surface texture errors

in modern manufacturing processes• comprehend the meaning of a Power Spectral

Density plot• quantify the requirements for surface texture

using PSD and gradient notations• predict the impact of mid-spatial frequency

ripple and roughness on system performance• compose a meaningful surface texture

specifi cation using ASME and ISO standards• identify these surface errors in measurement data

INTENDED AUDIENCEThis course is intended for optical design, manu-facturing and quality control and assurance en-gineers and managers. Some understanding of algebra is benefi cial.

INSTRUCTORDavid Aikens has been writing on the subject of surface texture and ripple for more than 20 years

and is one of the foremost experts on optics mid-spatial frequency ripple today. Dave is President and founder of Savvy Optics Corp., is the head of the American delegation to ISO TC 172 SC1, and is Executive Director of the Optics and Electro-Optics Standards Council. He also served as the project manager for the current ISO surface tex-ture notation standards for optics.

COURSE PRICE INCLUDES the ISO 10110 Part 8 Standards (surface texture notations for op-tics). Separate purchase of the ASME surface texture standard B46.1-2002 is recommended, although not required for the course.

Mounting of Optical Components

SC1019Course Level: Introductory · CEU: 0.65 $580 Members · $670 Non-Members USD Thursday 8:30 am to 5:30 pm

This course introduces the principles and stan-dard practices for mounting of optical compo-nents such as lenses, mirrors, windows, prisms, and fi lters. Particular case studies are used to show how mount design is driven by a combi-nation of the environmental and performance requirements. Common mounting techniques are explained such as:• Mounting of lenses into barrels using

adhesives or retaining rings• Mounting of prisms and small mirrors using

adhesives• Mounting of assemblies using fl exures• Mounting and sealing of windows Engineering analysis is performed for each type of mount to predict stress, survivability, and per-formance.

LEARNING OUTCOMESThis course will enable you to:• appreciate the effects of the environment on

optics• identify critical aspects of the optic-to-mount

interface• compare alternate mounting techniques for

common types of elements• design mounting interfaces that balance

performance, survivability, and cost• estimate survivability for shock and thermal

loading• estimate tolerances for optical assemblies

built up using standard designs

INTENDED AUDIENCEParticipation in this course will help optical and mechanical technicians, engineers, designers, scientists, and program managers understand how optical components can best be integrated into instruments. It will provide these attendees with basic techniques for analyzing optomechan-ical designs.

INSTRUCTORKeith Kasunic has more than 25 years of experi-ence developing optical, electro-optical, infrared, and laser systems. He holds a Ph.D. in Optical Sciences from the University of Arizona, an MS in Mechanical Engineering from Stanford Univer-sity, and a BS in Mechanical Engineering from MIT. He has worked for or been a consultant to a number of organizations, including Lockheed Martin, Ball Aerospace, Sandia National Labs, Nortel Networks, and Bookham. He is currently

14 SPIE/APOMA Optifab 2013 · www.spie.org/ofbconf · +1 360 676 3290 · [email protected] · #optifab

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the Technical Director of Optical Systems Group, LLC. He is also an Adjunct Professor at Univ. of Central Florida’s CREOL – The College of Optics and Photonics, as well as an Affi liate Instructor with Georgia Tech’s SENSIAC, and an Instructor for the Optical Engineering Certifi cate Program at Univ. of California Irvine.

COURSE PRICE INCLUDES the text Mounting Optics in Optical Instruments, 2nd edition (SPIE Press, 2008), by Paul R. Yoder, Jr.

Evaluating Aspheres for Manufacturability

SC1039Course Level: Introductory · CEU: 0.35 $285 Members · $335 Non-Members USD Monday 1:30 pm to 5:30 pm

This course provides an overview of how aspher-ic surfaces are designed, manufactured, and measured. The primary goal of this course is to teach how to determine whether a particular aspheric surface design will be diffi cult to make and/or test. This will facilitate cost/performance trade off discussions between designers, fabri-cators, and metrologists. We will begin with a discussion of what an asphere is and how they benefi t optical designs. Next we will explain various asphere geometry characteristics, especially how to evaluate local curvature plots. We will also review fl aws of the standard polynomial representation, and how the Forbes polynomials can simplify asphere analysis. Then we will discuss how various spec-ifi cations (such as fi gure error and local slope) can infl uence the diffi culty of manufacturing an asphere. Optical assembly tolerances, however, are beyond the scope of this course - we will fo-cus on individual elements (lenses / mirrors). The latter half of the course will focus on the more common technologies used to generate, polish, and/or measure aspheric surfaces (e.g. dia-mond turning, glass molding, pad polishing, inter-ferometry). We’ll give an overview of a few generic manufacturing processes (e.g. generate-polish-measure). Then we’ll review the main strengths and weaknesses of each technology in the context of cost-effective asphere manufacturing.

LEARNING OUTCOMESThis course will enable you to:• answer the question “Can these aspheres be

made within my budget?”• interpret an aspheric prescription from an

optical component print• describe how Forbes polynomials can simplify

asphere interpretation• know how aspheres are manufactured and tested• evaluate key characteristics of an aspheric

surface to determine whether an asphere will be diffi cult to manufacture and/or test

INTENDED AUDIENCEThis material is intended for engineers, optical designers, and managers who want an overview of the benefi ts and challenges associated with manufacturing aspheric surfaces for use in opti-cal systems. It will be of benefi t for specialists in a particular area (e.g. design, manufacturing, or testing), as it will give a broad overview in all three of those areas with a focus on aspheric surfaces. It is intended to facilitate communica-tion between designers, fabricators, and testers of aspheric surfaces.

INSTRUCTORGregory Forbes is Senior Scientist at QED and has developed the mathematical core of the soft-ware that controls QED’s machines for optical fi nishing and metrology. Dr. Forbes has recently published a series of papers discussing better ways to specify aspheric shapes by using tai-lored orthogonal polynomials, and they will also be discussed in this course.

Paul Murphy is a Senior Optical Engineer at QED Technologies International, where he has devel-oped advanced products and processes for aspheric optical manufacturing and metrology. He received his Ph.D. in interferometric non-null asphere testing from The Institute of Optics at the University of Rochester.

Paul Dumas is one of the founding members of QED Technologies, where he has developed software and processes for aspheric optical manufacturing, and managed various engineer-ing groups throughout the company’s history. He received his B.S. and M.S. in Optics from The Institute of Optics at the University of Rochester.

Designing Optical Systems with Manufacturable Aspheres

SC1061Course Level: Introductory · CEU: 0.35 $285 Members · $335 Non-Members USD Monday 8:30 am to 12:30 pm

Have you ever wondered if adding an asphere to your optical system will make it better? Are you interested in learning techniques to incorporate manufacturable aspheres into your optical de-signs? Would you like a better understanding of where to put an asphere (e.g. location or material) or if you should you use more than one asphere in the your design? Have you always wanted to know what’s the best way to specify and toler-ance an asphere or even how to constrain the asphere during optimization so that it is manu-facturable. If your answer to any of these ques-tions is yes, this course is for you! This course will provide attendees with a broad and useful understanding of how to design with aspheric surfaces and components. Aspheric sur-faces in a lens or mirror system can bring signifi -cant benefi ts to the optical performance. This is not without the liabilities of added cost, delivery time, and even producibility. The course will begin with a discussion of how and when to incorpo-rate aspherics into a variety of lens design forms. We present what aspherics will do for a design, and also what they will not do. We will then focus on understanding the differences between the standard polynomial representation and the new Forbes’ polynomials for specifying, optimizing, and tolerancing aspheres. Methods to constrain the aspheric profi le during optimization to main-tain manufacturability will be introduced. The fi nal part of the course will briefl y review methods for manufacturing and testing aspheres. This course is a continuation of the long-running course SPIE SC552 - Aspheric Optics, which was established and taught by Robert E. Fischer.

LEARNING OUTCOMESThis course will enable you to:• determine if adding an asphere to optical

design makes sense• identify where to add an asphere to a lens or

mirror design to improve performance• interpret an aspheric prescription from an

optical component print

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• assess the difference between the standard polynomial representation and Forbes’ polynomials for both specifi cation and optimization

• optimize an optical design using aspheres and constrain the aspheric profi le during optimization to maintain manufacturability

• specify and tolerance an asphere to predict as-built performance

• describe how aspherics are manufactured and tested

INTENDED AUDIENCEThis course is intended for engineers, optical designers, and managers who want an overview of the benefi ts and challenges associated with designing optical systems with aspheric surfac-es. It will be of value to those who either design their own optics or those who work directly or indirectly with optical designers, as you will now understand what is really going on with aspheric surfaces and how to ask the right questions of your designers or fabricators to make them man-ufacturable.

INSTRUCT Julie Bentley is an Associate Professor at The Institute of Optics, University of Rochester and has been teaching undergraduate and graduate level courses in geometrical optics, optical design, and product design for more than 15 years. She received her B.S., M.S., and PhD in Optics from the The Institute of Optics, University of Rochester. After graduating she spent two years at Hughes Aircraft Co. in California designing optical systems for the defense industry and then twelve years at Corning Tropel Corporation in Fairport, New York designing and manufacturing precision optical assemblies such as microlithographic inspection systems. She has experience designing a wide variety of optical systems from the UV to the IR, re-fractive and refl ective confi gurations, for both the commercial and military markets.

Optical Materials, Fabrication and Testing for the Optical Engineer

SC1086Course Level: Introductory · CEU: 0.35 $285 Members · $335 Non-Members USD Wednesday 1:30 pm to 5:30 pm

This course is designed to give the optical en-gineer or lens designer an introduction to the technologies and techniques of optical materials, fabrication and testing. This knowledge will help the optical engineer understand how the choice of optical specifi cations and tolerances can ei-ther lead to more cost effective optical compo-nents, or can excessively drive the price up. Top-ics covered include optical materials, traditional, CNC and novel optical fabrication technologies, surface testing and fabrication tolerances.

LEARNING OUTCOMESThis course will enable you to:• identify key mechanical, chemical and thermal

properties of optical materials (glass, crystals and ceramics) and how they affect the optical system performance and cost of optical components

• describe the basic processes of optical fabrication

• defi ne meaningful surface and dimensional tolerances

• communicate effectively with optical fabricators

• design optical components that are able to be manufactured and measured using state of the art optical fabrication technologies

• choose the optimum specifi cations and tolerances for your next project

INTENDED AUDIENCEOptical engineers, lens designers, or managers who wish to learn more about how optical ma-terials, fabrication and testing affect the optical designer. Undergraduate training in engineering or science is assumed.

INSTRUCTORJessica DeGroote Nelson is the R&D manager and scientist at Optimax Systems, Inc. She spe-cializes in optical materials and fabrication pro-cesses. She is an adjunct faculty member at The Institute of Optics at the University of Rochester teaching an undergraduate course on Optical Fabrication and Testing, and has given several guest lectures on optical metrology methods. She earned a Ph.D. in Optics at The Institute of Optics at the University of Rochester. Dr. Nelson is a member of both OSA and SPIE.

Subcontracting Custom Optics

SC1119Course Level: Introductory · CEU: 0.35 $285 Members · $335 Non-Members USD Wednesday 8:30 am to 12:30 pm

This course is designed to enable engineers, sub-contract managers, program managers, and procurement professionals to maximize the value they receive from optics manufacturers. Topics will range from how to design for manufacturabil-ity, good ideas for questions to ask that will help you understand proposals, and common terms used in the industry. Some fi nancial topics and negotiation tips will be included as well. If you are involved with buying custom optics, this course is for you.

LEARNING OUTCOMESThis course will enable you to:• compare opportunities and risks associated

with specifying system requirements vs. component requirements

• defi ne clear acceptance tests to ensure you are getting what you really want

• analyze opportunities for using your vendor’s capabilities to reduce costs

• learn common industry terms and how they work in the procurement process

• explain the need for First Article Inspection in developing new products

• predict and negotiate reasonable prices based on economies of scale

• compare proposals and select a subcontractor

INTENDED AUDIENCEScientists, engineers, sub-contract managers, program managers, and procurement profession-als who design, specify, or procure custom optics

INSTRUCTORMichael Orr has been buying and selling opti-cal systems and using them in environmental and military sensing applications for nearly a decade, fi rst at The University of Arizona, later at BAE Systems and currently at Corning Incorporated. Recognition for his work in this fi eld includes membership in the Corning Incorporated Presi-dent’s Sales Club. He earned a M.S. and B.S. in Optical Sciences at the University of Arizona.

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Thin Film Optical Coatings

SC321Course Level: Intermediate · CEU: 0.65 $495 Members · $585 Non-Members USD Wednesday 8:30 am to 5:30 pm

Virtually no modern optical system could oper-ate without optical coatings. Much of any optical system consists of a series of coated and shaped surfaces. The shape determines the power of the surface but it is the coating that determines the specular properties, the amount of light transmit-ted or refl ected, the phase change, the emittance, the color, the polarization, the retardation, includ-ing even the mechanical properties. Optical coat-ings consist of assemblies of thin fi lms of materials where interference properties combine with the intrinsic properties of the materials to yield the de-sired optical performance. They act to reduce the refl ectance losses of lenses, increase the refl ec-tance of mirrors, reduce glare and electromagnetic emission from display systems, improve the ther-mal insulation of buildings, protect eyes from laser radiation, analyze gases, act as anticounterfeiting devices on banknotes, multiplex or demultiplex communication signals, separate or combine color channels in display projectors, and these are just a few of their roles. This course emphasizes under-standing and takes students from fundamentals to techniques for design and manufacture.

LEARNING OUTCOMESThis course will enable you to:• understand the basic principles of optical

interference coatings• perform many rapid design calculations and

assessments without needing a computer• speak knowledgeably about the parameters

that characterize optical coatings• design simple coatings given a suitably

equipped computer• know the advantages and disadvantages of

the basic processes for the production of these fi lters

• understand the infl uence of errors in monitoring and estimate tolerances in production

INTENDED AUDIENCEAnyone who is or wishes to become involved in the manufacture or use of optical coatings or who wants to know more about this rapidly grow-ing and important fi eld. The level is appropriate for someone who has completed high school mathematics and/or science.

INSTRUCTORH. Angus Macleod is President of Thin Film Cen-ter, a software, training and consulting company in optical coatings, and is Professor Emeritus of Optical Sciences at the University of Arizona. He has been deeply involved in optical coatings for over forty years.

Optical Manufacturing Overview

SC350Course Level: Introductory · CEU: 0.65 $495 Members · $585 Non-Members USD Monday 8:30 am to 5:30 pm

This course provides a basic understanding of the methodology and processes used in the fab-rication of precision optical elements. Emphasis is placed on the selection and use of tooling, ma-terials and equipment used in the manufacturing process with specifi c examples.

LEARNING OUTCOMESThis course will enable you to:• describe the normal process fl ow in

the manufacturing of spherical optical components

• explain blank preparation, curve generating, grinding, polishing, and centering processes

• classify the metrology needed for each step in the manufacturing process cycles

• select the proper tooling for the part in the manufacturing sequence

• compare various optical fabrication techniques and equipment

INTENDED AUDIENCEEngineers, technicians and buyers who require an awareness of current optical fabrication meth-odology as well as “lead times” associated with low volume production.

INSTRUCTORRobert Novak is the president and CEO of BAN Optical, and has been designing and delivering courses in optical engineering for over 37 years. He is professor emeritus of optics at Monroe Community College where he was chairman of Optical Systems Technology for over 30 years. He is currently the Secretary of APOMA (Ameri-can Precision Optics Manufacturing Associa-tion), a position he has held for over 20 years, and is an Honorary Member of the Rochester Section of the OSA.

Optical System Design: Layout Principles and Practice

SC690Course Level: Introductory · CEU: 0.65 $615 Members · $705 Non-Members USD Tuesday 8:30 am to 5:30 pm

This course provides the background and princi-ples necessary to understand how optical imag-ing systems function, allowing you to produce a system layout which will satisfy the performance requirements of your application. This course teaches the methods and tech-niques of arriving at the fi rst-order layout of an optical system by a process which determines the required components and their locations. This process will produce an image of the right size and in the right location. A special emphasis is placed on understanding the practical aspects of the design of optical systems. Optical system imagery can readily be calcu-lated using the Gaussian cardinal points or by paraxial ray tracing. These principles are extend-ed to the layout and analysis of multi-component systems. This course includes topics such as imaging with thin lenses and systems of thin lenses, stops and pupils, and afocal systems. The course starts by providing the necessary background and theory of fi rst-order optical de-sign followed by numerous examples of optical systems illustrating the design process.

LEARNING OUTCOMESThis course will enable you to:• specify the requirements of an optical system

for your application including magnifi cation, object-to-image distance, and focal length

• diagram ray paths and do simple ray tracing• describe the performance limits imposed on

optical systems by diffraction and the human eye• predict the imaging characteristics of multi-

component systems

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• determine the required element diameters• apply the layout principles to a variety of

optical instruments including telescopes, microscopes, magnifi ers, fi eld and relay lenses, zoom lenses, and afocal systems

• adapt a known confi guration to suit your application

• grasp the process of the design and layout of an optical system

INTENDED AUDIENCEThis course is intended for engineers, scientists, managers, technicians and students who need to use or design optical systems and want to understand the principles of image formation by optical systems. No previous knowledge of op-tics is assumed in the material development, and only basic math is used (algebra, geometry and trigonometry). By the end of the course, these techniques will allow the design and analysis of relatively sophisticated optical systems.

INSTRUCTORJohn Greivenkamp is a professor at the College of Optical Sciences of The University of Arizona where he teaches geometrical optics and opti-cal system design to undergraduate and gradu-ate students. John is the editor of the SPIE Field Guides and is the author of the Field Guide to Geometrical Optics (SPIE Press, 2004).

COURSE PRICE INCLUDES the texts Modern Optical Engineering, 4th edition (SPIE Press, 2008) by Warren J. Smith and the Field Guide to Geometrical Optics (SPIE Press, 2004) by John E. Greivenkamp.

SPECIAL NOTE: This course is a continuation of Warren Smith’s long-standing SPIE course SC001, Optical System Design: Layout Principles and Practice and incorporates many of the same approaches and material used for that course.

Introduction to Modern Optical Drawings – the ISO 10110 Standard

SC863Course Level: Introductory · CEU: 0.35 $285 Members · $335 Non-Members USD Monday 8:30 am to 12:30 pm

Since the late 1990’s, the optics community has gradually been converting optics drawings from a free-form, notes-based method to a standard-ized, international pictographic method. In 2013, the United States will join the international com-munity by adopting a version of ISO 10110 as the American National Standard for optics drawings. This new method is a great boon for an industry in need of standardization, but can be very con-fusing to the uninitiated. This course provides attendees with an intro-duction to ISO-10110, the international standard for optics drawing notations. The course con-centrates on the fundamentals of the drawing layout and how to read the notations required for typical optics, such as glass parameters, radius, wave-front, surface imperfections and rough-ness. Attendees are also informed about how the American version is going to differ from the cur-rent international standard. Practical and useful examples are included throughout.

LEARNING OUTCOMES• read and interpret an optical drawing

prepared to ISO 10110

• identify the meaning of the symbology and specifi cations of ISO 10110 for materials imperfections, surface form, wedge, surface imperfections, and surface texture

• describe which symbol corresponds to each of the fundamental optical parameters

• compose and interpret an ISO 10110-compliant optical element drawing

INTENDED AUDIENCEThis material is intended for anyone who has a basic understanding of optics, and encounters or generates optical drawings in the course of their work. Those who either design their own optics, work with optical designers, work with optical suppliers, or manufacture optics will fi nd this course valuable.

INSTRUCTORDavid Aikens is President and founder of Savvy Optics Corp., and has been involved in optics drawings and specifi cations for over 20 years. He is the head of the American delegation to ISO TC 172 SC1, and is the Executive Director of the Optics and Electro-Optics Standards Council. He is also chairman of the project to adopt ISO 10110 as the American National Standard for op-tics drawings.

Fundamentals of Single Point Diamond Turning

SC848Course Level: Introductory · CEU: 0.35 $285 Members · $335 Non-Members USD Tuesday 1:30 pm to 5:30 pm

This course provides attendees with a basic working knowledge of single point diamond turn-ing of optical components. The course covers a wide range of topics and should provide the attendee with an understanding of the process capabilities of this technology. Key subject mat-ter includes; equipment, processes, cutting me-chanics, material selection, fi xturing, metrology, applications, component design, optical toler-ancing, and producibility.

LEARNING OUTCOMESThis course will enable you to:• gain valuable insight into process capabilities• make informed decisions with regards to

material selections and part geometries• properly specify and tolerance component

drawings • identify cost and producibility drivers • understand the current state-of-the-art in

diamond turning technology

INTENDED AUDIENCEThis material is intended for anyone who designs, fabricates, or procures, single-point diamond turned components and wishes to gain valuable insight into the overall fabrication process for the purpose of making better decisions.

INSTRUCTORJohn Schaefer is an Engineering Fellow for Raytheon EO Innovations, and has more than 25 years of hands-on experience in single point diamond turning. He has extensive experience in process development, concurrent engineer-ing, productionization, interferometry, asphere metrology, and equipment specifi cation and pro-curement.

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To learn more:www.spie.org/ofbconf

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SPIE/APOMA Optifab 2013 · www.spie.org/ofbconf · +1 360 676 3290 · [email protected] · #optifab 19

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20 SPIE/APOMA Optifab 2013 · www.spie.org/ofbconf · +1 360 676 3290 · [email protected] · #optifab

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Laser Pointer Safety Information/PolicySPIE supplies tested and safety-approved laser pointers for all conference meeting rooms. For safety reasons, SPIE requests that presenters use provided laser pointers. Use of a personal laser pointer represents user’s acceptance of liability for use of a non-SPIE-supplied laser pointer. If you choose to use your own laser pointer, it must be tested to ensure <5 mW power output. Laser pointers in Class II and IIIa (<5 mW) are eye safe if power output is correct, but output must be verifi ed because manufacturer labeling may not match actual output. Come to Speaker Check-In and test your laser pointer on our power meter. You are required to sign a waiver releasing SPIE of any liability for use of potentially non-safe, per-sonal laser pointers. Misuse of any laser pointer can lead to eye damage.

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Unauthorized Solicitation PolicyUnauthorized solicitation in the Exhibition Hall is prohibited. Any nonexhibiting manufacturer or supplier observed to be distributing information or soliciting business in the aisles, or in another company’s booth, will be asked to leave imme-diately.

Unsecured Items PolicyPersonal belongings should not be left unattend-ed in meeting rooms or public areas. Unattended items are subject to removal by security. SPIE is not responsible for items left unattended.

Wireless Internet Service Policy At SPIE events where wireless is included with your registration, SPIE provides wireless access for attendees during the conference and exhibi-tion but cannot guarantee full coverage in all lo-cations, all of the time. Please be respectful of your time and usage so that all attendees are able to access the internet. Excessive usage (e.g., streaming video, gam-ing, multiple devices) reduces bandwidth and increases cost for all attendees. No routers may be attached to the network. Properly secure your computer before accessing the public wireless network. Failure to do so may allow unauthorized access to your laptop as well as potentially intro-duce viruses to your computer and/or presenta-tion. SPIE is not responsible for computer viruses or other computer damage.

Mobile Phones and Related Devices PolicyMobile phones, tablets, laptops, pagers, and any similar electronic devices should be silenced during conference sessions. Please exit the con-ference room before answering or beginning a phone conversation.

SmokingFor the health and consideration of all attendees, smoking is not permitted at any event elements, such as but not limited to: plenaries, conferenc-es, workshops, courses, poster sessions, hosted meal functions, receptions, and in the exhibit hall. Most facilities also prohibit smoking in all or specifi c areas. Attendees should obey any signs preventing or authorizing smoking in specifi ed locations.

Hold HarmlessAttendee agrees to release and hold harmless SPIE from any and all claims, demands, and causes of action arising out of or relating to your participation in the event you are registering to participate in and use of any associated facilities or hotels.

Event CancellationIf for some unforeseen reason SPIE should have to cancel the event, registration fees processed will be refunded to registrants. Registrants will be responsible for cancellation of travel arrange-ments or housing reservations and the applica-ble fees.

SPIE/APOMA Optifab 2013 · www.spie.org/ofbconf · +1 360 676 3290 · [email protected] · #optifab 21

Page 24: Plan to Attend - SPIE · 2013. 8. 13. · Robert F. Novak, BAN Optical (USA) Paul R. Tolley, Smart System Technology & Commercialization ... CV Nanotechnology, Inc. DCM Tech, Corp

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