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Page 1: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

Presented by:

Mark E. SimsReliability S&T Engineer

Aviation and Missile Research, Development and Engineering Center

UNCLASSIFIED

Intro Reliability GrowthIntro Reliability Growth

"Approved for public release; distribution unlimited. Review completed by the AMRDEC Public Affairs Office 11 Oct 2013; PR0073."

Page 2: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

2

Mil-HDBK-189 DefinitionMil-HDBK-189 Definition

Reliability GrowthThe positive improvement in a reliability parameter

over a period of time

due to changes in product design

or the manufacturing process.

MIL-HDBK-189 is a Department of Army Handbook for Reliability Growth Management

Page 3: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

3

J.T. Duane was an engineer at the Aerospace Electronics Department of the General Electric Company.

He published a paper in 1964 that applied a “learning curve approach” to reliability monitoring.

He observed that the cumulative MTBF versus cumulative operating time followed a straight line when plotted on log-log paper.

The learning (i.e., growing) is accomplished through a “test, analyze, and fix” (TAAF) process.

Beginnings

Design

TestFailure

Analysis

Identified Deficiencies

Page 4: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

4

log-log paper graphing

Normal graphing

1 10 100 1000 100001

10

100

1000Reliability Growth Chart

Cumulative Duane

Instantaneous Duane

Test Hours

MT

BF

0 200 400 600 800 1000 1200 1400 16000

20

40

60

80

100

120Reliability Growth Chart

Cumulative Duane

Instantaneous Duane

Test Hours

MT

BF

..

..

.

. .. .

.

Graphs

Duane Postulate:The cumulative MTBF versus cumulative operating time is a straight line on log-log paper.

Page 5: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Continuous GrowthContinuous Growth

0 500 1000 1500 2000 2500 3000 3500 4000 45000.000

0.001

0.002

0.003

0.004

0.005

0.006

0.007

0.008

0.009

Reliability Growth Chart

Test Hours

Fa

ilure

Ra

te

Continuous means time.

0 500 1000 1500 2000 2500 3000 3500 4000 45000

100

200

300

400

500

600

700

Reliability Growth Chart

Test Hours

MT

BF

You can plot failure rate or MTBF against the total test hours.

Page 6: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

6

Discrete GrowthDiscrete Growth

0 20 40 60 80 100 120 140 160 180 20060.0%

65.0%

70.0%

75.0%

80.0%

85.0%

90.0%

95.0%

Reliability Chart

Trials

Re

lia

bil

ity Discrete means trials.

Page 7: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

7

Discrete GrowthDiscrete Growth

0 20 40 60 80 100 120 140 160 180 20060.0%

65.0%

70.0%

75.0%

80.0%

85.0%

90.0%

95.0%

Reliability Chart

Trials

Re

lia

bil

ity

Reliability Growth follows a Learning Curve approach.

Note: More rapid growth occurs earlier in the process then flattens out!

Page 8: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

8

Why Reliability Growth?

Page 9: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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1 2 3 4 5 6 7 8 9 10 11 12 13 14 15

16 17 18 19 20 21 22 23 24 25 26 27 28 29 30

31 32 33 34 35 36 37 38 39 40 41 42 43 44 45

46 47 48 49 50 51 52 53 54 55 56 57 58 59 60

61 62 63 64 65 66 67 68 69 70 71 72 73 74 75

76 77 78 79 80 81 82 83 84 85 86 87 88 89 90

91 92 93 94 95 96 97 98 99 100 101 102 103 104 105

106 107 108 109 110 111 112 113 114 115 116 117 118 119 120

121 122 123 124 125 126 127 128 129 130 131 132 133 134 135

136 137 138 139 140 141 142 143 144 145 146 147 148 149 150

151 152 153 154 155 156 157 158 159 160 161 162 163 164 165

166 167 168 169 170 171 172 173 174 175 176 177

Example

A System has 18 Failures in 177 Trials

Page 10: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Example

A system has 18 failures in 177 trials. The failures are listed the tables below.

Failure Trial

1 6

2 7

3 14

4 16

5 26

6 30

7 38

8 39

9 51

Failure Trial

10 55

11 64

12 71

13 79

14 98

15 108

16 129

17 145

18 148

Page 11: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

11

Failure TrialTrials

Between Failures

1 6 6

2 7 1

3 14 7

4 16 2

5 26 10

6 30 4

7 38 8

8 39 1

9 51 12

There appears to be reliability growth.

Example

Failure TimeTrials

Between Failures

10 55 4

11 64 9

12 71 7

13 79 8

14 98 19

15 108 10

16 129 21

17 145 16

18 148 3

Less trials between failures.More trials between failures.

Page 12: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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0 200 400 600 800 1000 12000

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

0.9

1

Trials

Reliability

0.9254

Example

Applying Reliability Growth Methodology, we get the following curve:

.

Page 13: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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0 200 400 600 800 1000 12000

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

0.9

1

Trials

Reliability

Note: Reliability without applying growth is1 – (18 / 177) = 0.8983

0.9254

Example

Applying Reliability Growth Methodology, we get the following curve:

.

Page 14: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

14

Why Reliability Growth?Saves Assets

Reduces Test TimeSaves $$$$$$$

Page 15: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

15

Duane ModelPower Law Formulation

for reliability growth

Page 16: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Duane PostulateDuane Postulate

During Reliability Growth,Graphing the log of time (or tests) against its corresponding log of MTBF

Will be a straight line with slope α.

MTBFCum = Cumulative Mean-Time-Between-Failure

t = Time

K = Constant for Power Law Equation

α = Growth parameter

Page 17: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Duane PostulateDuane Postulate

Slope, α

Time (or Trial), t

MT

BF

(Ln(t1), Ln(M1))

(Ln(t3), Ln(M3))

(Ln(t2), Ln(M2))

Times MTBFCum

t1 M1

t2 M2

t3 M3

Page 18: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Duane PostulateDuane Postulate

Linear relationship:y = αx + b

Has a linear log-log relationship!

Page 19: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Calculating αthe growth rate

Calculating αthe growth rate

Page 20: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Calculating α (the growth rate)

Calculating α (the growth rate)

Time (hrs)

Total Failures

First reading 500 5

Last reading 4000 20

We will determine α from these two readings.

Page 21: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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We will determine α from these two readings.

Time (hrs)

Total Failures

First reading 500 5

Last reading 4000 20

Calculating α (the growth rate)

Calculating α (the growth rate)

Page 22: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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First calculate the cumulative MTBF for each reading.

Time (hrs)

Total Failures

MTBF

First reading 500 5 100

Last reading 4000 20 200

Calculating α (the growth rate)

Calculating α (the growth rate)

Page 23: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Time (hrs)

Total Failures

MTBFLn(Time) Ln(MTBF)

First reading 500 5 100 Ln(500) Ln(100)

Last reading 4000 20 200 Ln(4000) Ln(200)

Take logs of the readings.

Calculating α (the growth rate)

Calculating α (the growth rate)

Page 24: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Slope, α

x-axis

y-a

xis

( Ln(500) , Ln(100) )

( Ln(4000) , Ln(200) )

Time (hrs)

Total Failures

MTBFLn(Time) Ln(MTBF)

First reading 500 5 100 Ln(500) Ln(100)

Last reading 4000 20 200 Ln(4000) Ln(200)

Plot the logs of the readings.

Calculating α (the growth rate)

Calculating α (the growth rate)

Page 25: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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α = 0.33

x-axis

y-a

xis

( 6.215 , 4.605 )

( 8.294 , 5.298 )

Time (hrs)

Total Failures

MTBFLn(Time) Ln(MTBF)

First reading 500 5 100 Ln(500) Ln(100)

Last reading 4000 20 200 Ln(4000) Ln(200)

Calculating α (the growth rate)

Calculating α (the growth rate)

Page 26: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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α = 0.33

x-axis

y-a

xis

Growth is indicated when 0 < α < 1

Calculating α (the growth rate)

Calculating α (the growth rate)

Page 27: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Duane ParametersDuane Parameters

α = Growth parameterTI = Initial test timeMI = Initial MTBFMF = Final MTBFTtotal = Total time

• These parameters go into the Duane equation.

• If you know 4 of the parameters, you can calculate the other.

Page 28: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Sensitivity of αSensitivity of α

α = Growth parameterTI = Initial test timeMI = Initial MTBFMF = Final MTBFTtotal = Total time

What is the Total Test time if we are given these 4 parameters?

α .40

TI 100

MI 50

MF 150

TTotal ?

Page 29: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Sensitivity of αSensitivity of α

α = Growth parameterTI = Initial test timeMI = Initial MTBFMF = Final MTBFTtotal = Total time

How does changing the growth parameter α affect the total test time?

α .40

TI 100

MI 50

MF 150

Ttotal 435

Page 30: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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α .40 .27 .46 .64

TI 100 100 100 100

MI 50 50 50 50

MF 150 150 150 150

Ttotal 435

Sensitivity of αSensitivity of α

α = Growth parameterTI = Initial test timeMI = Initial MTBFMF = Final MTBFTtotal = Total time

How does changing the growth parameter α affect the total test time?

Page 31: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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α .40 .27 .46 .64

TI 100 100 100 100

MI 50 50 50 50

MF 150 150 150 150

Ttotal 435 1823 285 113

Sensitivity of αSensitivity of α

α = Growth parameterTI = Initial test timeMI = Initial MTBFMF = Final MTBFTtotal = Total time

The α is very sensitive to the Total Time!

How does changing the growth parameter α affect the total test time?

Page 32: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Instantaneousvs

Cumulative

Instantaneousvs

Cumulative

Duane MTBF Equation

Finding the true estimate of a system’s MTBF using reliability growth.

Page 33: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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FailureNumber

Failure Time

1 10

2 40

3 90

4 160

5 250

Inst vs. Cum MTBF

What is the true estimate of the MTBF at 250 hours?

Page 34: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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FailureNumber

Failure Time

MTBFCum

1 10 10

2 40 20

3 90 30

4 160 40

5 250 50

Inst vs. Cum MTBF

Is the MTBF 50 at time 250?

Page 35: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

35

FailureNumber

Failure Time

MTBFCum

Time Between Failures

1 10 10 10

2 40 20 30

3 90 30 50

4 160 40 70

5 250 50 90

Inst vs. Cum MTBF

Or would you say the MTBF is 90 at 250 hours?

Page 36: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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FailureNumber

Failure Time

MTBFCum

Time Between Failures

MTBFInst

1 10 10 10 31

2 40 20 30 43

3 90 30 50 52

4 160 40 70 59

5 250 50 90 66

Inst vs. Cum MTBF

Applying a Reliability Growth Tracking Model from AMSAA or ReliaSoft’s RGA software tool will give these numbers.

Page 37: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

37

FailureNumber

Failure Time

MTBFCum

Time Between Failures

MTBFInst

1 10 10 10 31

2 40 20 30 43

3 90 30 50 52

4 160 40 70 59

5 250 50 90 66

Inst vs. Cum MTBF

Applying a Reliability Growth Tracking Model from AMSAA or ReliaSoft’s RGA software tool to get these numbers.

So, 66 is the true MTBF at 250 operating hours, if reliability growth is occurring.

Page 38: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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MTBFInst

MTBFCum

MT

BF

Time (or Test), t

On Log-Log Graph Paper

10 100 1000 10,000

10

100

Inst vs. Cum MTBF

Page 39: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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This is how the graphs lookIn standard Cartesian coordinate

MTBFInst

MTBFCum

MT

BF

Time (or Test), t

300

100

500 1000 1500 2000

200

Inst vs. Cum MTBF

Page 40: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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ExerciseExercise

10 system failures occurred after 500 hours of reliability growth testing, with a calculated growth parameter of 0.40.

What is the system’s instantaneous MTBF?

Page 41: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

41

10 system failures occurred after 500 hours of reliability growth testing, with a calculated growth parameter of 0.40.

What is the system’s instantaneous MTBF?

ExerciseExercise

Page 42: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

42

10 system failures occurred after 500 hours of reliability growth testing, with a calculated growth parameter of 0.40.

What is the system’s instantaneous MTBF?

ExerciseExercise

Page 43: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Reliability Growth FormulasReliability Growth Formulas

Failure Rate

MTBF

Reliability

Page 44: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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M(t) = 1 / r(t)

MTBF is the reciprocal of the failure rate.

Page 45: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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rI = Initial failure rate

tI = Initial time corresponding to rI

α = Growth rate parameter

Failure Rate FormulaFailure Rate Formula

Initial Conditions

Page 46: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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MI = Initial MTBF

tI = Initial time corresponding to MI

α = Growth rate parameter

MTBF FormulaMTBF Formula

Initial Conditions

Page 47: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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RI = Initial Reliability

NI = Initial number of trials corresponding to RI

α = Growth rate parameter

Reliability (Discrete)Reliability (Discrete)

Initial Conditions

Page 48: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Deriving r(t) FormulaDeriving r(t) Formula

r(t) is sometimes called the Hazard Rate.

Page 49: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Deriving r(t) FormulaDeriving r(t) Formula

K = Constant for Power Law Equation

First, start with the Duane Postulate.

Page 50: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Insert initial conditions MI at TI , and solve for K.

Deriving r(t) FormulaDeriving r(t) Formula

tI is the Initial Test Time.MI is the Initial MTBF at time tI.

Page 51: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Now substitute for K.

Deriving r(t) FormulaDeriving r(t) Formula

Page 52: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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The failure rate, r, is the inverse of the MTBF, so r(t) = 1 / M(t).

Deriving r(t) FormulaDeriving r(t) Formula

Page 53: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Deriving r(t) FormulaDeriving r(t) Formula

Now we will simplify and take the derivative.

Page 54: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Deriving r(t) FormulaDeriving r(t) Formula

Now we will simplify and take the derivative.

Page 55: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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MI = Initial MTBF

tI = Initial time corresponding to MI

α = Growth rate parameter

Deriving M(t) FormulaDeriving M(t) Formula

Page 56: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Deriving M(t) FormulaDeriving M(t) Formula

Recall MTBF = 1/r, so take the inverse of r(t).

Page 57: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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The Sensitivity of Duane’s Initial Conditions TI and MI on the Total Test Time.

Page 58: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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TI 100 150 200 250

α .40 .40 .40 .40

MI 50 50 50 50

MF 150 150 150 150

Ttotal 435 ??? ??? ???

α = Growth parameterTI = Initial test timeMI = Initial MTBFMF = Final MTBFTtotal = Total time

What if we increase the initial time for a planning curve?

Sensitivity of Initial TimeSensitivity of Initial Time

Page 59: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Sensitivity of Initial TimeSensitivity of Initial Time

What if we increase the initial time for a planning curve?

A higher initial time significantly increases Ttotal!

TI 100 150 200 250

α .40 .40 .40 .40

MI 50 50 50 50

MF 150 150 150 150

Ttotal 435 652 869 1087

Why?

Page 60: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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250 500 750 1000

50

100

150

TI 100 250

α .40 .40

MI 50 50

MF 150 150

Ttotal 435 1087

Sensitivity of Initial Time

Time

MT

BF

TI

Page 61: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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250 500 750 1000

50

100

150

TI 100 250

α .40 .40

MI 50 50

MF 150 150

Ttotal 435 1087

Growth is more rapid the smaller TI is!

Sensitivity of Initial TimeM

TB

F

Time

TI

Page 62: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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MI 50 25 70 85

α .40 .40 .40 .40

TI 100 100 100 100

MF 150 150 150 150

Ttotal 435 ??? ??? ???

α = Growth parameterTI = Initial test timeMI = Initial MTBFMF = Final MTBFTtotal = Total time

What if we change the initial MTBF for a planning curve?

Sensitivity of Initial MTBF

Page 63: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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What if we change the initial MTBF for a planning curve?

A higher initial MTBF significantly decreases Ttotal!

MI 50 25 70 85

α .40 .40 .40 .40

TI 100 100 100 100

MF 150 150 150 150

Ttotal 435 2459 187 115

Sensitivity of Initial MTBF

Page 64: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

64

RI = Initial Reliability

NI = Initial number of trials corresponding to RI

α = Growth rate parameter

Deriving Reliability FormulaDeriving Reliability Formula

Page 65: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Deriving Reliability FormulaDeriving Reliability Formula

Rcum = Cumulative Reliability

F = Number of Failures

N = Number of Trials

r is the failure rate.

Page 66: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

66

Deriving Reliability FormulaDeriving Reliability Formula

Recall failure rate formula.

Page 67: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

67

Deriving Reliability FormulaDeriving Reliability Formula

Subtract from 1.

Page 68: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

68

Deriving Reliability FormulaDeriving Reliability Formula

Make substitutions.

Page 69: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Initially, System A has 3 failures after 100 firings.

If you expect a growth rate of 0.25, what would be the expected reliability after 1000 flight tests?

Exercise

Page 70: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Initially, System A has 3 failures after 100 firings.

If you expect a growth rate of 0.25, what would be the expected reliability after 1000 flight tests?

Exercise

Page 71: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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Inst / Cum Conversions

Page 72: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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AMSAA-Crow ModelProjection Method

for reliability growth planning

Page 73: Presented by: Mark E. Sims Reliability S&T Engineer Aviation and Missile Research, Development and Engineering Center UNCLASSIFIED Intro Reliability Growth

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- 50 100 150 200 250 300

0.84

0.86

0.88

0.90

0.92

0.94

0.96

0.98

1.00

RG PotentialRGP = 0.9747

TL

CAP4

CAP3

CAP2

CAP1

RG = 0.9639

RLUT = 0.9568

RDT3 = 0.9455

RDT2 = 0.9260

RDT1 = 0.8987

PM2-Discrete Reliability Growth Planning Curve

Idealized Curve DT1 DT2 DT3 LUT IOT Requirement

Trials

Rel

iab

ilit

y

RR = 0.9200

Discrete PM2 Growth Plan Example

041712-Sims-Reliability Growth (TE Class)

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Continuous PM2 Growth Plan Example

-

500

1,0

00

1,5

00

2,0

00

2,5

00

3,0

00

3,5

00

4,0

00

4,5

00

0

100

200

300

400

500

600

700

CAP10CAP9CAP8CAP7CAP6CAP5

CAP4

CAP4

CAP3

CAP3

CAP2

CAP2

CAP1

CAP10

PM2 Continuous Reliability Growth Planning Curve

Idealized Curve Series3 Series5 Series7 Series9

Series11 Series12 Series13 Series14 Series15

Series16 Hypothetical Last Step IOT Series22 Requirement

Test Time (hours)

MT

BF

322

DT1

DT2

DT3

MG,DT = 581

LUTMG,0T = 523

MI = 190

500

MR = 200

MGP = 782

415

041712-Sims-Reliability Growth (TE Class)

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Continuous Curve EquationContinuous Curve Equation

Continuous curve is plotted using this equation.

MTBF(T) = System Mean-Time-Between-Failures at time T

MTBFI = Initial MTBF

MS = Management Strategy

µ = Average Fix Effectiveness Factor (FEF)

β = Shape parameter

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R(N) = System Reliability at trial N.

RA = The portion of the system reliability not impacted by the correction action effort

RB = The portion of the system reliability addressed by the correction action effort

MS = Management Strategy

µ = Average Fix Effectiveness Factor (FEF)

n = Shape parameter of the beta distribution representing pseudo trials

Discrete Curve EquationDiscrete Curve Equation

Discrete curve is plotted using this equation.

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Management Strategy Factor

Management Strategy (MS) is the fraction of the overall system failure rate to be address by the corrective action plan.

λ = Failure rate.

For various reasons (prohibitive cost, improbability of reoccurrence), some failure modes will not have a corrective action.

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Management Strategy Factor

A-Mode: Failures that are not fixed.B-Mode: Failures that will have a fix.

Failure Rates

A-ModeB-Mode

A “fix” means a reliability improvement corrective action, not just a remove and replace of the same component.

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Management Strategy Factor

λA = Failure rate of A-modesλB = Failure rate of B-modesλA + λB = Overall system failure rate

Failure Rates

A-ModeB-Mode

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Management Strategy Factor

Failure Rates

A-ModeB-Mode

Example: What is the MS here?

Failure mode

Failure mode rate

Mode Type

1 0.027 B

2 0.015 B

3 0.033 B

4 0.001 A

5 0.013 B

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Management Strategy Factor

Failure Rates

A-ModeB-Mode

Example: What is the MS here?

Failure mode

Failure mode rate

Mode Type

1 0.027 B

2 0.015 B

3 0.033 B

4 0.001 A

5 0.013 B

Total B-modes 0.088

Total System 0.089

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μ, Fix Effectiveness Factor

Mil-HDBK-189 Definition:

Fix Effectiveness Factor, μ = A fraction representing the reduction in an individual initial mode failure rate due to implementation of a corrective action.

Essentially Fix Effectiveness Factors discount failures. A couple examples will follow.

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Number of tests = 20

Successful tests = 18

Hardware Failure

Software Failure

What is the reliability?

X

X

μ, Fix Effectiveness Factor

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Number of tests = 20

Successful tests = 18

X

X

Software Failure

Hardware Failure

μ, Fix Effectiveness Factor

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Number of tests = 20

Successful tests = 18

X

X

What is the updated reliability?

μ1 = 100%

μ2 = 75%

Software Failure

Hardware Failure

μ, Fix Effectiveness Factor

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Number of tests = 20

Successful tests = 18

Hardware

Software

X

X100% Fix

75% Fix

μ, Fix Effectiveness Factor

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Failure mode

Failure mode rate

Mode Type

1 0.027 B

2 0.015 B

3 0.033 B

4 0.001 A

5 0.013 B

μ, Fix Effectiveness Factor

Another Example: Say the average μ is 0.75 (or 75%). What is the updated System Failure Rate?

λA = 0.001λB = 0.088λSystem = 0.089

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Failure mode

Failure mode rate

Mode Type

1 0.027 B

2 0.015 B

3 0.033 B

4 0.001 A

5 0.013 B

μ, Fix Effectiveness Factor

Another Example: Say the average μ is 0.75 (or 75%). What is the updated System Failure Rate?

OriginalλA = 0.001λB = 0.088λSystem = 0.089

UpdatedλA = 0.001λB = 0.088 * (1- 0.75) = 0.022λSystem = 0.023

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Shape Parameter, βShape Parameter, β

β = Shape parameter

TT = Total Test Time

MG = MTBF Goal

MGP = MTBF Growth Potential

MI = Initial MTBF

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η = Shape parameter of the beta distribution representing pseudo trials

NT = Total Number of Trials

RG = Reliability Goal

RGP = Reliability Growth Potential

RI = Initial Reliability

Shape Parameter, βShape Parameter, β

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Growth PotentialGrowth Potential

MGP = MTBF Growth PotentialThe theoretical upper limit on MTBF

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Growth PotentialGrowth Potential

MGP = MTBF Growth PotentialThe theoretical upper limit on MTBF

For example:MS = 0.95μ = 0.80MI = 190

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RA = The portion of the system reliability not impacted by the correction action effort

PM2 Curve EquationPM2 Curve Equation

MS = Management Strategy. Fraction of failures to be addressed by corrective action.

Medium Risk Range 0.90 – 0.96.

RI = Initial Reliability

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RB = The portion of the system reliability addressed by the correction action effort

PM2 Curve EquationPM2 Curve Equation

MS = Management Strategy. Fraction of failures to be addressed by corrective action.

Medium Risk Range 0.90 – 0.96.

RI = Initial Reliability

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Management Strategy FactorManagement Strategy Factor

A-Mode: Failures that are not fixed.B-Mode: Failures that will have a fix.

λ = Failure rate.

Fraction of failures to be addressed by the corrective action plan.

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n = Shape parameter of the beta distribution representing pseudo trials

PM2 Growth PlanPM2 Growth Plan

RGP = Reliability Growth PotentialRG = Reliability Goal (to meet requirement)NT = Total trials before going into IOT phase

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Reliability Growth PotentialReliability Growth Potential

RGP = Reliability Growth PotentialThe theoretical upper limit on system reliability

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Reliability Growth PotentialReliability Growth Potential

RGP = Reliability Growth PotentialThe theoretical upper limit on system reliability

For example:MS = 0.95μ = 0.80MI = 190

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Summary

• Reliability Growth applies a “Learning Curve” Approach

• System must undergo Test-Analyze-And-Fix for reliability to grow.

• Initial Conditions are sensitive to a growth plan.

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ASMSA-Crow/Duane EquationsASMSA-Crow/Duane Equations

1. Single Shot Systems Expected Failures:

NNR

NEF

1

)(1)(

2. Continuously Operating Systems Expected Failures:

TTM

TEF

1

)(1

)(