product/process · pcn ipd-dis/13/7887 - dated 17 jun 2013 table 1. change implementation schedule...
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PCN IPD-DIS/13/7887Dated 17 Jun 2013
ACSwitches in ISOWATT220AB package: Conversion from
dipping to tin plating
1/17
PRODUCT/PROCESSCHANGE NOTIFICATION®
PCN IPD-DIS/13/7887 - Dated 17 Jun 2013
Table 1. Change Implementation ScheduleForecasted implementation date for 10-Jun-2013 change
Forecasted availability date of samples 10-Jun-2013 for customer
Forecasted date for STMicroelectronicschange Qualification Plan results availability 10-Jun-2013
Estimated date of changed product first 16-Sep-2013 shipment
Table 2. Change IdentificationProduct Identification ACSwitches in ISOWATT220AB package (Product Family/Commercial Product)
Type of change Package assembly process change
Reason for change Equipments and processes rationalization
Description of the change ST extends its standard tin plating process to ISOWATT220ABpackage. Tin dipping generates bright aspect, while tin platinggives a mat finishing of the leads.
Change Product Identification Date code and QA number
Manufacturing Location(s)
® 2/17
PCN IPD-DIS/13/7887 - Dated 17 Jun 2013
DOCUMENT APPROVAL
Name Function
Paris, Eric Marketing Manager
Duclos, Franck Product Manager
Cazaubon, Guy Q.A. Manager
® 4/17
STMicroelectronics IPD - ASD & IPAD Division
1
BU Thyristors/Triacs and Rectifiers
(1) IPD: Industrial & Power Discretes - ASD: Application Specific Device - IPAD: Integrated Passive and Active Devices
Issue date 10-06-2013 1/2
PCN Product/Process Change Notification
ACSwitches in ISOWATT220AB package:
Conversion from dipping to tin plating
Notification number: IPD-DIS/13/7887 Issue Date 10/06/2013
Issued by Aline AUGIS
Product series affected by the change T630-800W T1620-600W T1620-600W T1620-700W T1620-700W T1620-800W T1620-800W T435-600W T435-800W T830-800W T410-600W T405-600W
Type of change Package assembly process change
Description of the change
ST extends its standard tin plating process to ISOWATT220AB package.
Tin dipping generates bright aspect, while tin plating gives a matt finishing of the leads.
DIPPING PLATING
Reason for change
The change is performed in order to optimize STMicroelectronics industrial process and material.
Former versus changed product: The changed products do not present modified electrical,
dimensional or thermal parameters, leaving unchanged the
current information published in the product datasheet
The Moisture Sensitivity Level of the part (according to the
IPC/JEDEC JSTD-020D standard) remain unchanged.
STMicroelectronics IPD - ASD & IPAD Division
1
BU Thyristors/Triacs and Rectifiers
(1) IPD: Industrial & Power Discretes - ASD: Application Specific Device - IPAD: Integrated Passive and Active Devices
Issue date 10-06-2013 2/2
The footprint recommended by ST remains the same.
There is no change in the packing modes and the standard
delivery quantities either.
The products remains in full compliance with the ST
ECOPACK®1 grade.
Disposition of former products
Deliveries of former product will continue while the conversion is brought to completion and as long as former product stocks last.
Marking and traceability
The marking of the device remains the same (no change).
Traceability is ensured by the date code and the QA number.
Qualification complete date Week 18-2013
Forecasted sample availability
Samples are available on request within 2 to 4 weeks.
Product family Sub-family Commercial part
Number Availability date
ACSwitches Triac T630-800W W26/2013
Change implementation schedule
Sales types Estimated production start Estimated first shipments
All Week 25-2013 Week 37-2013
Comments:
Customer’s feedback
Please contact your local ST sales representative or quality contact for requests concerning this change
notification.
Absence of acknowledgement of this PCN within 30 days of receipt will constitute acceptance of the change
Absence of additional response within 90 days of receipt of this PCN will constitute acceptance of the change
Qualification program and results QRP13142 attached
IPD (Industrial & Power Discretes)
Group ASD & IPAD division Quality and Reliability
May 24th, 2013 Report ID: 13142QRP
Page 1/10
External Reliability Report
AC Switches in ISOWATT220AB package: Conversion from dipping to tin plating
General Information
Product Lines AC Switches
Products Description TRIACs
Product Group IPD
Product division ASD&IPAD
Package ISOWATT220AB
Locations
Wafer fab STMicroelectronics Tours (France)
Assembly plant STMicroelectronics SHENZHEN (China)
Reliability Lab STMicroelectronics Tours (France)
DOCUMENT INFORMATION
Version Date Pages Prepared by Approved by Comment Rev. 1 May 24th 2013 10 Gilles Dutrannoy JP.Rebrasse First issue
Note: This report is a summary of the reliability trials performed in good faith by STMicroelectronics in order to evaluate the potential reliability risks during the product life using a set of defined test methods. This report does not imply for STMicroelectronics expressly or implicitly any contractual obligations other than as set forth in STMicroelectronics general terms and conditions of Sale. This report and its contents shall not be disclosed to a third party without previous written agreement from STMicroelectronics.
IPD (Industrial & Power Discretes)
Group ASD & IPAD division Quality and Reliability
May 24th, 2013 Report ID: 13142QRP
Page 2/10
TABLE OF CONTENTS 1 APPLICABLE AND REFERENCE DOCUMENTS ................ ............................................................................ 3
2 GLOSSARY .......................................... ............................................................................................................. 3
3 RELIABILITY EVALUATION OVERVIEW ................... ..................................................................................... 4
3.1 OBJECTIVES ............................................................................................................................................... 4
3.2 CONCLUSION ............................................................................................................................................. 4
DEVICE CHARACTERISTICS ................................................................................................................................... 5
3.3 DEVICE DESCRIPTION ................................................................................................................................. 5
4 TEST RESULT SUMMARY ............................... ................................................................................................ 6
4.1 TEST VEHICLE ............................................................................................................................................ 6
4.2 TEST PLAN AND RESULT SUMMARY .............................................................................................................. 7
5 ANNEXES .......................................................................................................................................................... 8
5.1 DEVICE DETAILS ......................................................................................................................................... 8
5.2 TEST DESCRIPTION .................................................................................................................................... 9
6 APPENDIX ....................................................................................................................................................... 10
IPD (Industrial & Power Discretes)
Group ASD & IPAD division Quality and Reliability
May 24th, 2013 Report ID: 13142QRP
Page 3/10
1 APPLICABLE AND REFERENCE DOCUMENTS
Document reference Short description JESD 47 Stress-Test-Driven Qualification of Integrated Circuits
MIL-STD-750C Test method for semiconductor devices SOP 2614 Reliability requirements for product qualification (ST internal document) SOP 267 Product maturity levels (ST internal document) 0061692 Reliability tests and criteria for qualifications (ST internal document)
PCN reference IPD-DIS/13/7887
2 GLOSSARY
BOM Bill Of Materials DUT Device Under Test F/G Finished Good
HTRB High Temperature Reverse Bias PCT Pressure Cooker Test P/N Part Number RH Relative Humidity SS Sample Size
TCT Temperature Cycling Test THB Temperature Humidity Bias HTS High Temperature Storage
IPD (Industrial & Power Discretes)
Group ASD & IPAD division Quality and Reliability
May 24th, 2013 Report ID: 13142QRP
Page 4/10
3 RELIABILITY EVALUATION OVERVIEW
3.1 Objectives Qualification of the conversion from dipping to tin plating on ISOW ATT220AB products at ST China (Shenzhen).
3.2 Conclusion Qualification plan requirements have been fulfilled without any exception. Reliability tests have shown that the devices behave correctly against environmental tests (no failure). Moreover, the electrical parameter stability during the accelerated tests demonstrates the product robustness which is consequently expected during their lifetime. .
IPD (Industrial & Power Discretes)
Group ASD & IPAD division Quality and Reliability
May 24th, 2013 Report ID: 13142QRP
Page 5/10
Device Characteristics
3.3 Device description
TBXXXXX (25A – 600V)
Package Code Label ISO220T
Product Family TRIAC
fab site label TOURS
Assembly site label SHENZHEN B/E
passivation/glassivation Glass
T1620-800W/7 (16A – 800V)
Package Code Label ISO220T
Product Family TRIAC
fab site label TOURS
Assembly site label SHENZHEN B/E
passivation/glassivation Glass
IPD (Industrial & Power Discretes)
Group ASD & IPAD division Quality and Reliability
May 24th, 2013 Report ID: 13142QRP
Page 6/10
4 TEST RESULT SUMMARY
4.1 Test vehicle TBxxxxx (25A 600V)
Lot # Process/ Package Comments LOT 1 ISOWATT22AB Qualification lot
T1620-800W/7 (16A 800V)
Lot # Process/ Package Comments LOT 2 ISOWATT220AB Qualification lot
IPD (Industrial & Power Discretes)
Group ASD & IPAD division Quality and Reliability
May 24th, 2013 Report ID: 13142QRP
Page 7/10
4.2 Test plan and result summary
Table of results from lots 1 &2
Test Std ref. Conditions SS Step
Failure/SS
LOT 1 LOT 2
Solderability J STD-002 Dry aging 2 baths
SnPb / SnAgCu 245°C 40 8 hours 0/20 0/20
Solderability J STD-002 Steam aging
2 baths SnPb / SnAgCu 245°C
40 8 hours 0/20 0/20
IPD (Industrial & Power Discretes)
Group ASD & IPAD division Quality and Reliability
May 24th, 2013 Report ID: 13142QRP
Page 8/10
5 ANNEXES
5.1 Device details
5.1.1 Pin connection
5.1.2 Package outline/Mechanical data
IPD (Industrial & Power Discretes)
Group ASD & IPAD division Quality and Reliability
May 24th, 2013 Report ID: 13142QRP
Page 9/10
5.2 Test Description
Test name Description Purpose Package -oriented test
Solderability
Test done under environmental stress conditions: Dry then Steam aging tests +
dipping in 2 baths SnPb / SnAgCu 245°C
To evaluate the lead solderability.
IPD (Industrial & Power Discretes)
Group ASD & IPAD division Quality and Reliability
May 24th, 2013 Report ID: 13142QRP
Page 10/10
6 APPENDIX List of involved products: T630-800W T1620-600W T1620-700W T1620-800W T435-600W T435-800W T830-800W T410-600W T405-600W T820-800W
Public Products List®
PCN Title : ACSwitches in ISOWATT220AB package: Conversion from dipping to tin plating PCN Reference : IPD-DIS/13/7887 PCN Created on : 17-JUN-2013
Subject : Public Products List
Dear Customer,
Please find below the Standard Public Products List impacted by the change:
ST COMMERCIAL PRODUCT
T1620-600W T405-600W T410-600W T435-600W T435-800W T630-800W T830-800W
1/1
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