results on 198 tec-moduleshep.fi.infn.it/cms/moduletest/tkwdec04/hermanns.pdfaachen – iii b thomas...

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Aachen – III B Thomas Hermanns CMS Week December 07 th 2004 Results on 198 TEC-Modules Module Test Meeting CMS Week 07 th December 2004 G. Flügge, T. Franke, Th. Hermanns, J. Mnich, O. Pooth, M. Pöttgens III. Physikalisches Institut B RWTH Aachen

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Page 1: Results on 198 TEC-Moduleshep.fi.infn.it/CMS/moduletest/tkwdec04/hermanns.pdfAachen – III B Thomas Hermanns CMS Week December 07 th 2004 Results on 198 TEC-Modules Module Test Meeting

Aachen – III B Thomas Hermanns CMS Week December 07th 2004

Results on 198 TEC-Modules

Module Test Meeting CMS Week

07th December 2004

G. Flügge, T. Franke, Th. Hermanns,J. Mnich, O. Pooth, M. Pöttgens

III. Physikalisches Institut BRWTH Aachen

Page 2: Results on 198 TEC-Moduleshep.fi.infn.it/CMS/moduletest/tkwdec04/hermanns.pdfAachen – III B Thomas Hermanns CMS Week December 07 th 2004 Results on 198 TEC-Modules Module Test Meeting

Aachen – III B Thomas Hermanns CMS Week December 07th 2004

Overview

in total since July 2004:253 modules ARC-tested215 modules LT-tested

presentation of some results of 198 modulesdata of normal modulesdata of repaired modules(e.g. modules pitch-adapter–sensor overlap)

no data of current repair centre modules

some results on LT-test

Page 3: Results on 198 TEC-Moduleshep.fi.infn.it/CMS/moduletest/tkwdec04/hermanns.pdfAachen – III B Thomas Hermanns CMS Week December 07 th 2004 Results on 198 TEC-Modules Module Test Meeting

Aachen – III B Thomas Hermanns CMS Week December 07th 2004

Summary of the results

total: 0.73 % bad channels

abs. % abs. % abs. % abs. % abs. % abs. % abs. % abs. % abs. % abs. %total per problem

opens 0 0,00 2 0,01 4 0,09 2 0,03 2 0,03 4 0,03 69 0,27 2 0,05 85shorts 11 0,05 0 0,00 0 0,00 0 0,00 0 0,00 0 0,00 2 0,01 7 0,17 20

pinholes 0 0,00 0 0,00 0 0,00 0 0,00 0 0,00 0 0,00 4 0,02 13 0,32 17saturated 9 0,04 10 0,03 0 0,00 0 0,00 0 0,00 2 0,01 0 0,00 0 0,00 21

noisy 58 0,27 205 0,51 1 0,02 5 0,08 23 0,30 383 2,41 73 0,29 14 0,34 762unidentified 0 0,00 1 0,00 1 0,02 0 0,00 0 0,00 1 0,01 3 0,01 7 0,17 13total per type 78 0,36 218 0,55 6 0,13 7 0,11 25 0,33 390 2,46 151 0,59 43 1,05

0

NO DATA NO DATA

Ring 68

Ring 5s Ring 7500

Ring 3 Ring 4 Ring 5nRing 2n Ring 2s15 316 8

Ring 1n Ring 1s28 52

Grade A 158Grade B 26Grade C 14

800

Ring 2n28 52 6

Ring 2s Ring 3 Ring 4 Ring 5n Ring 5s Ring 6 Ring 7 total0 50 88 15 31 0

2

600

473

Ring 1n Ring 1s

2710

620

1500

71212

NO DATA NO DATA4280

Grading:

aspects to discuss: - noisy channels at Ring 4- Ring 6 modules

evaluation with cuts defined in ..._testsettings0.2.xml+ pinhole-max-cut = 10 (identification of saturated channels)

Page 4: Results on 198 TEC-Moduleshep.fi.infn.it/CMS/moduletest/tkwdec04/hermanns.pdfAachen – III B Thomas Hermanns CMS Week December 07 th 2004 Results on 198 TEC-Modules Module Test Meeting

Aachen – III B Thomas Hermanns CMS Week December 07th 2004

Number of Faults per Module

modules with 4 APVs? noisy Ring 4 data? ST-Sensors

modules with 6 APVs? good quality

A B

A B

Page 5: Results on 198 TEC-Moduleshep.fi.infn.it/CMS/moduletest/tkwdec04/hermanns.pdfAachen – III B Thomas Hermanns CMS Week December 07 th 2004 Results on 198 TEC-Modules Module Test Meeting

Aachen – III B Thomas Hermanns CMS Week December 07th 2004

Details on Noisy Channels

no correlation between data and testboxesno low baseline (tests with VPSP=35)

Ring 4 modules:slight modification of noise cut by 0.05 ADC counts (old values in parentheses)

? reduction of noisy channels to 134 (383)? 119 of them are APV-edge channels

(additionally: 9 neighbouring the APV-edge channels)

re-gradingA: 21 (7), B: 10 (12), C: 0 (12)

twotestboxes

Page 6: Results on 198 TEC-Moduleshep.fi.infn.it/CMS/moduletest/tkwdec04/hermanns.pdfAachen – III B Thomas Hermanns CMS Week December 07 th 2004 Results on 198 TEC-Modules Module Test Meeting

Aachen – III B Thomas Hermanns CMS Week December 07th 2004

Ring 6 CM-Subtracted Noise

36 HPK-modules14 ST-modules

HPK: mainly noisy channels ? modification of noise cutST: mainly opens (unbonded pinholes)

mean leakage current at 450 V: 0.6 ± 0.1µA , 1.9 ± 0.7µA

Page 7: Results on 198 TEC-Moduleshep.fi.infn.it/CMS/moduletest/tkwdec04/hermanns.pdfAachen – III B Thomas Hermanns CMS Week December 07 th 2004 Results on 198 TEC-Modules Module Test Meeting

Aachen – III B Thomas Hermanns CMS Week December 07th 2004

Longterm-Tests

10 modules per LT-TestLT-Test = 10 Cycles between 15°C and –20°Cregulation-software ACDCTCP/IP to ARCS

sequentially read out by ARCS (15°C, 3?-20°C, 15°C)

193 of 198 modules LT-tested (including modules with PA-sensor overlap)

Page 8: Results on 198 TEC-Moduleshep.fi.infn.it/CMS/moduletest/tkwdec04/hermanns.pdfAachen – III B Thomas Hermanns CMS Week December 07 th 2004 Results on 198 TEC-Modules Module Test Meeting

Aachen – III B Thomas Hermanns CMS Week December 07th 2004

Cold Box Noise Performance(Ring 6 data)

comparison: testbox and cold box at room temperature

testboxcold box

comparison:cold box at 15°C and –20°C

cold box at 15°Ccold box at –20°C

Page 9: Results on 198 TEC-Moduleshep.fi.infn.it/CMS/moduletest/tkwdec04/hermanns.pdfAachen – III B Thomas Hermanns CMS Week December 07 th 2004 Results on 198 TEC-Modules Module Test Meeting

Aachen – III B Thomas Hermanns CMS Week December 07th 2004

Longterm-Tests II

comparison between CM Subtracted Noise, Peak Time and Gain Slope before and after cooling (module-evaluation related quantities)

example of a prepared modulePeakInvOn: Difference CM Subtracted Noise PeakInvOn: Difference Peak Time

En

trie

s

En

trie

s

Difference Peak Time [ns]Difference CM Subtracted Noise [FADC counts]

Separation of opensSeparation of opens

by type

NO LT-TEST INDUCED DEFECTS DETECTED!

Page 10: Results on 198 TEC-Moduleshep.fi.infn.it/CMS/moduletest/tkwdec04/hermanns.pdfAachen – III B Thomas Hermanns CMS Week December 07 th 2004 Results on 198 TEC-Modules Module Test Meeting

Aachen – III B Thomas Hermanns CMS Week December 07th 2004

Plans for X-Mas and New Year

send LT-data to DB (creation by defect analyser)

further LT-Tests of modules that are re-set valid by repair centre

Very LT-test of 10 modulestime: some weeks, constant temperature: -15°CHV and LV permanently switched onmonitor leakage currents, noise behaviour,...(some software modifications to be done)

our proposal:10 modules of good quality2nd VLT-Test with modules showing problems(mainly modules with suspicious hybrids)