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Rutherford Backscattering & Secondary Ion Mass Spectrometery

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Time-of-Flight Secondary Ion Mass Spectrometry - … ·  · 2016-11-30Time-of-Flight Secondary Ion Mass Spectrometry ... Basic principle TOF-SIMS is the mass analysis of secondary

Application of Static Secondary Ion Mass Spectrometry to ... · Application of Static Secondary Ion Mass Spectrometry to Trace Evidence Analysis Garold L. Greshama, Gary S. Groenewold"

High-Resolution Secondary Ion Mass Spectrometry Reveals the … · High-Resolution Secondary Ion Mass Spectrometry Reveals the Contrasting Subcellular Distribution of Arsenic and

Theoretical Investigations of the Role of Ion-Ion Correlations and … · 2013-04-23 · Theoretical Investigations of the Role of Ion-Ion Correlations and Ion-Specific Interactions

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SIMS: Secondary Ion Mass Spectroscopy Principle Secondary Chamber (sample loading) Primary Chamber (target) Ion source O2+, Cs+ Ion gun DeltaV=5KV Magnetic