seek mosaic core performance analysis report
TRANSCRIPT
© 2021
Technical Reports
©PISEO 2021 | www.piseo.fr | Seek Thermal S309SP Analysis Report
Seek Thermal S309SP Camera
Core Performance
Analysis
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INTRODUCTION
• Thanks to multiple drivers, the market for infra-red thermal imaging cameras and modules isexpanding rapidly with a multiplicity of products on offer. There is, therefore, a need for users,integrators, and sensor manufacturers to be able to discriminate between available productsbased on accurate and independent assessments of their performance and features.
• This report is the third of a kind that will help thermal imaging camera and module marketactors to better understand the characteristics of such products, enabling better strategic decisionmaking.
• More reports will follow soon, which will allow fair comparisons of product featuresand performance.
• The following cameras and modules have either already been analyzed or are planned:InfiRay T3S camera module : published
Flir Boson 640 Pro camera (USA): published
Seek thermal module QVGA 12µm (USA): published
InfiRay Micro 3 (China): available Q4 2021
Hikvision camera QQVGA 17µm (China): planned
Teledyne Dalsa GXF (Canada): planned
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OBJECTIVES OF THE REPORT
• This report aims at providing a comprehensive and independent analysis of the mainfeatures, performance, and imaging system architecture of the Seek Thermal S309SPCamera Core.
• The analysis has been based on physical measurements, calculations, simulations, andobservations realized in PISEO’s lab compared to data provided in the datasheet.
• The report presents :
• An analysis of the user functions of the camera.
• An analysis of the measured performance parameters of the embedded microbolometric sensor.
• An analysis of the measured thermometric performance and optical architecture of the camera.
• An analysis of the sensor correction functions and algorithms.
• An analysis of the image processing flow from sensor to image as well as an assessment of imagequality.
• Our opinion of the camera’s features and performance.
• A fair comparison of the performance against other marketed products.
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AUTHORS OF THE REPORT
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Dr Olivier Andrieu – Innovation Leader and System Architect - Piséo
Olivier ANDRIEU is in charge of technical expertise and innovation projects at Piséo. He has a degree in engineeringand a Ph.D. in physics from the INPG Graduate School. His career has allowed him to carry out various responsibilitiesin innovation in the automotive sector in connection with sensors and battery management systems as well as withinPhilips Lighting, where he acted as a system architect. He has supervised the design of numerous photonic systems fordifferent sectors which have been commercialized. He has also performed many technical analyses of photonic systemsand published several reports in collaboration with Yole Développement’s teams.
Grégory Duchêne - Sr Optical Designer, illumination, detection and imaging systems - PiséoGrégory Duchêne is in charge of advanced optical systems studies and analyzes at Piséo. He has an engineering degreefrom the Institut d’Optique Graduate School (IOGS). He has successfully designed the optics of many innovativephotonic systems for Piséo’s’ customers. In addition to his strong optical design skills, he has in-depth know-how of
optical metrology of illumination and imaging systems. Grégory Duchêne is our Zemax expert and also teaches opticalsystem design at IOGS.
Lionel Artinyan – Photonic Systems Test Engineer - Piséo
Lionel Artinyan has an engineering degree from the ENSSAT Graduate School and has a strong background in photoniccomponent and system characterization. At Piséo, Lionel is in charge of custom test bench engineering and testrealization. He has participated in the design of many different test benches that include optical devices and controlprograms. Lionel has successfully tested many systems that integrate pulsed light sources such as xenon lamps, LEDs,and laser diodes, as well as imaging sensors.
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GLOSSARY
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• ACE Adaptative Contrast Enhancement
• AGC Automatic Gain Correction
• BiCMOS Bipolar CMOS
• CMOS Complementary Metal Oxide Semiconductor
• DN Digital Number
• DDE Digital Detail Enhancement
• FFC Flat Field Correction
• FOV Field-Of-View
• FPA Focal Plane Area
• FPGA Field Programmable Gate Array
• GUI General User Interface
• IBE Information-Based Equalizer
• INU Image Non-Uniformity
• MRTD Minimum Resolvable Temperature Difference
• MTF Modulation Transfer Function
• NETD Noise Equivalent Temperature Difference
• NUC Non-Uniformity Correction
• NVFFC Non-Volatile Flat Field Correction
• PSF Point Spread Function
• RFPN Residual Fixed Pattern Noise
• ROI Region of Interest
• ROIC Read-out Integrated Circuit
• SCNR Spatial Column Noise Reduction
• SDK Software Development Kit
• SEM Scanning Electron Microscopy
• SFFC Supplemental Flat Field Correction
• SRNR Spatial Row Noise Reduction
• SSN Silent Shutterless NUC
• USB Universal Serial Bus
• UVC USB Video Class
• VOx Vanadium Oxide
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Table of ContentsPart 1/2
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• Introduction 02
• PISEO’s Opinion on the Seek Thermal S309SP 03
• Seek Thermal S309SP IR camera vs others 04
• Objective of the report 05
• About Piséo 06
• Authors of the report 07
• Glossary 08
• Table of contents 09
• Thermal Camera Market Overview 11
• Seek Thermal Company Profile 15
• Camera Presentation, Functionalities and Use 21
o Mosaic core portfolio presentation
o Microbolometric sensor
o Available resources
o Technical characteristics
o Kit description
o Camera Tested
• Seek Thermal SDK and SeekViewer software 36
o Overview
o Information menus
o Temperature Units
o Shutter and Timestamp Control
o Frame Info
o “Filters” menu
o Smoothing
o Sharpening
o Color maps
o Histogram settings
• Image sensor standard characterization methodology 49
o Image sensor characterization
o Blackbody Setup
o MTF measurement
o Responsivity and NETD
o Bad pixel detection and operability
o Non-uniformity correction and RFPN
o Thermographic function
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Table of Contents
Part 2/2
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• Sensor performances characterization 61
o Raw image definition and quality
o Responsivity / NETD / Scene dynamic
o Operability
o Complete temperature range
o Dependence on ambient temperature
o Residual Fixed Pattern Noise
o Thermographic response
o Temperature measurement accuracy
o Modulation transfer function (MTF)
o Rolling Shutter
• Image processing 80
o Image production and characterization
o Image settings
o AGC types
o Histogram Equalization
o Linear Min/Max correction
o Legacy Histogram Equalization
o AGC algorithm comparison
o Shutter functions
o Transient Correction
o Smoothing
o Sharpening
• Conclusion 102
• Comparison of S309P the with other cameras 105
• Piséo Corporate Presentation 108
• Piséo related reports 114
• Contact us 115
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MOSAIC CORE PORTFOLIO PRESENTATION
Portfolio
• The S309SP is a member of the Mosaic Core product line.
• The camera integrates a 12µm pitch Vanadium Oxide uncooled detector available in 2 resolutions: 200x150 px and320x240 px.
• The module includes image processing and standard communication interfaces.
• It is targeted at integrators for security cameras, test and measurement, public safety, outdoor recreation and much more.
• Each module is equipped with a lens with a specific FOV and depth-of-field. The variety of lenses (8 options) coversFOVs between 15° and 105°.
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Source: Seek Thermal
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• The main technical information is presented on a one-page datasheet, subdivided into major items :
• Global specifications related to sensor properties : technology, sensor resolution, pixel pitch, sensor sensitivity or NETD, frame rate, etc.
• Optical & Mechanical, which details the various possible configurations.
• Thermography.
• Environmental.
• This kind of information is standard amongst uncooled thermal sensor manufacturers. However, we noted that the operability is not specified on the datasheet.
TECHNICAL CHARACTERISTICS
Overview
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• The camera tested by PISEO comes in a kit which consists of:
• Mosaic Core.
• Coprocessor board.
• Baseboard PCB.
• 2 flex ribbon cables to connect the pieces.
• A cushion and a bracket to hold the camera to the baseboard PCB.
• A micro-USB to USB cable.
• However, it is possible to only buy the Mosaic Core and use it with custom electronics. The customer must then design the system around one of the coprocessor options detailed on the next slide.
• Here the baseboard appears as an interface board, not to be confused with the coprocessor.
• Buying only the core can be a cheaper and more modular option when working with integration constraints in complex systems.
KIT DESCRIPTION
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(LxWxH) 114mm x 42mm x 42mm
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• Activating the sharpening filter enhances contrast and the edges of objects.
• Horizontal and vertical lines are more visible as well.
• The images seem noisier.
• This is typical of a sharpening or high-pass filter that is quite sensitive to shutter noise.
• A more detailed technical description is given in the “Image Processing” chapter.
SEEKVIEWER FUNCTIONALITIES
Sharpening
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Sharpening OFF – Normal resolution (l) and zoomed (r)
Sharpening ON – Normal resolution (l) and zoomed (r)
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• Using the SDK documentation, PISEO createdmultiple functions in order to characterize the sensor.
• Calling these functions would return stacks of imageswith flexibility for many settings:
• Stack size.
• Frame rate.
• All Mosaic Core corrections available.
• These functions were then included in our ownacquisition and processing software.
• For the characterization, stacks of 100 images atmaximum frame rate and with deactivated filterswere extracted. This was done at differenttemperatures for different controlled scenes.
IMAGE SENSOR CHARACTERIZATION
Procedure used to retrieve images during image processing
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Methodology
Function creation on Visual Studio
PISEO’s software acquiring and processing data
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• AGC stands for “Automatic Gain Control”. It is a regulating circuit widely used in audio and video systems in order to maintain a suitable signal amplitude.
• The software offers 3 AGC modes for the Mosaic Cores:
• Legacy_HistEQ
• Linear
• HistEQ
• The “Linear AGC Controls” section is only usable when the AGC is set to Linear mode.
• Details of the AGC modes are thoroughly discussed in the image processing chapter.
SEEKVIEWER FUNCTIONALITIES
Histogram settings
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• A controlled-temperature scene is placed in thefield of view of the camera.
• Represented by a blackbody (HGH)regulated temperature surface;
• Possible to control the surface temperaturefrom -15°C to +150°C;
• Accurate control of the scene temperature:< +/-0.03 °C;
• Temperature uniformity across the surface:0.01 °C @25°C, 0.3°C @ 50°C;
• Stability 0.5mK.
• Climate chamber for ambient temperaturecontrol:
• 0°C to 50°C.
BLACKBODY SETUP
Uniform and controlled temperature with a blackbody
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Typical IR Camera test set-up @PISEO’s lab
Methodology
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1 2 3 4
NETD
(m
K)
Stack #
NETD vs stack number (100 images per stack)
• The NETD measured immediately after power on issignificantly different than the NETD measured afterstabilization. When applying PISEO’s protocol, the stackof images are recorded after power on, giving a highvalue of NETD. After waiting roughly 20 seconds, theNETD drops to 60mK which is closer to the publishedvalues.
• During the same time interval, from power on to lateruse, the responsivity remains stable. The time sensitivityof the NETD is the consequence of the temporal noise ofthe pixels in the first seconds. Images on the left showpixel responsivity and NETD at power on and after 20seconds of stabilization.
• In an interview by Piséo, Seek Thermal has confirmedthis phenomenon and mentioned their procedure includesa warm-up time before measuring the NETD.
NETD DEPENDENCE ON STARTING TIME
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(Time)
(11s) (22s) (33s) (44s)
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RESPONSIVITY / NETD / SCENE DYNAMIC
Complete temperature range -20°C to +100°C
• The responsivity increases when the measuredtemperature increase. The temporal DN noise remainsstable, thus the NETD is lowered at high scenetemperature.
• The increase in the responsivity limits the scenedynamic for high measured temperature.
• This behavior is typical from the technology and hasbeen observed on other thermal imaging sensors.
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-20 0 20 40 60 80 100 120
NETD
(m
K)
Responsiv
ity (
counts
/K)
Median scenic temperature (°C)
Responsivity over temperature range
Resp (counts/K)NETD (mK)
-20 30 80 130
Scene d
ynam
ic (
K)
Median scene temperature (°C)
Scene dynamic
T1 (°C) -15 0 20 40 60 80 100T2 (°C) 0 20 40 60 80 100 120
T NETD (°C) 25 25 25 25 25 25 25
Resp (counts/K) 80.8 97.7 120.9 144.6 169.6 194.2 211.7NETD (mK) 555.6 475.8 377.5 321.7 286.3 260.7 219.9Scene dynamic (K) 809 669 541 452 386 337 309
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IMAGE PROCESSING ANALYSIS
Image settings
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Pixel matrix
ROIC,Non-uniformity
correction, Bad pixel correction
Micro-USB Data bus
Shutter
SDK functions (Temperature conversions, AGC, Filters…)
16-bit filtered pre-AGC image
32-bit floating point temperature data
32-bit colorized ARGB data
• The filtered pre-AGC format is available for imaging and supportsactivation by the user of many image settings. These settings aredescribed and analyzed in the following pages :
• Smoothing.
• Sharpening.
• Transient correction.
• Three AGC modes : HistEQ, Linear min/max, LegacyHistEQ.
• Automatic/manual shutter activation.
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AUTOMATIC GAIN CONTROL
Histogram Equalization – Trim (left and right)
• Setting this parameter helps to prevent situations where a small number of outlier pixels negatively affect thescene’s contrast.
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Cold object (0°C)
• On the left, the presence of a cold object makes the rest of the scene blurrier since it is taking a big part ofthe histogram by itself. On the right, we focus the histogram on relatively hot objects (left trim = 0.49) inorder to restore some dynamic and detail to the people in the scene.
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ABOUT PISÉO
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• An Independent Innovation Center specializing in the integration of advanced photonics technologies.
• Supports companies in all sectors of activity in the analysis, design and characterization of innovativeillumination, detection and visualization systems.
• Experience gained from large industrial groups.
• Created in November 2011 as part of the French State Call for Projects for shared innovation platforms.
• 8 industrial shareholders including Yole Développement, GIL-Syndicat du luminaire, Syndicat de l’éclairage,Serma Group, Cluster Lumière.
• Based in Lyon, France.
• 150+ clients (Large groups, ETI, SMEs, Start-ups)
• CIR, CII, and EASYTECH approved.
• Accredited lab (scope @ www.cofrac.fr ).
• 16 people.
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OUR MARKETS
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AutomotiveAeronautics
Railway
SecurityDefense
Health CareWell-being
ImagingGeneral Lighting
TelecomProcesses
Watchmaking
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OUR SERVICES AT COMPONENT AND SYSTEM LEVEL
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System design and
realization
✓ Application requirements of photonic
systems (UV, VIS, IR)
✓ Concept generation
✓ Feasibility studies
✓ Optical, mechanical, electronic and
software design
✓ Simulations
✓ Thermal management
✓ System integration
✓ Prototyping, assembly, pre-series and
small volume production with partners
✓ Redesign to cost, to quality
✓ Design for reliability
Characterization and test
laboratory
✓ Photometric and colorimetric measurements
(accredited)
✓ Spectral and radiometric measurements (UV,
VIS, IR)
✓ Photobiological and laser risk assessment
(accredited)
✓ Luminance and color maps of displays, light
panels, etc.…
✓ Electrical measurements
✓ Temperature measurements
✓ Characterization of cameras, modules and
imaging sensors (VIS, IR): NUC, NETD,
responsiveness, MTF ...
✓ Materials : reflectance, transmittance,
spectral analysis, BRDF…
Application and technical
analyses
✓ Reverse engineering
✓ Performance analysis
✓ Application and technical reports
✓ Benchmarking of component and system
performance and construction
✓ Regulatory and normative intelligence
✓ Technology intelligence
✓ Patent intelligence
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OUR TECHNICAL PLATFORMS
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Design and analysis tools
➢ Patent pulse
➢ Proprietary physical models
➢ Zemax Optics Studio 20 & Premium (2x)
➢ LightTools 9 (3x)
➢ Radiant Imaging Prosource
➢ Rhino 3D
➢ Solidworks
➢ Python, C ++, Arduino, Labview programming
➢ Algorithmics
➢ 3 computing stations 24 cores, 3.1 GHz
➢ Network of partners in electronics, mechanics, integration and assembly
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OUR TECHNICAL PLATFORMS
Testing Laboratory
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➢ Goniophotometer LMT C-Type GO 2000
➢ Integrating spheres Instrument Systems 2m & GL Optik 50cm
➢ Instrument Systems Spectroradiometers CAS 120 (VIS), CAS140CT (VIS), CAS 140D (300nm-1100nm)
➢ BTS256-EF Gigahertz Optik Spectrophotometer-Colorimeter
➢ Westboro Photonics PF 501A 5Mpx video luminance meter
➢ Radiometric bench Everfine OST 300 (200nm-1600nm)
➢ Power probes and integrating sphere (200nm-1100nm)
➢ Infratek Variocam thermal camera
➢ Blackbody HGH DCN 1000H4
➢ YOKOGAWA WT 3000 power meters
➢ Stabilized and central power supplies: Chroma, TTi, Keithley ...
➢ Partner network (Serma Technologies, labs, etc.)
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WHAT CHARACTERIZES US
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• 250+ customer projects and 5000+ tests carried out.
• Unique combination of expertise and high-level technical means in the design andcharacterization of illumination, detection and imaging systems.
• Very diverse industrial experience.
• Applied and multi-physics approach of integrated systems.
• Network of leading partners.
• Agility.
• Independence and impartiality.
Contact ourSales Team for more information
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iRAY T3S Thermal Camera Performance Analysis
FLIR Boson Thermal Camera Performance Analysis
Guide Infrared’s 17μm Microbolometer Module by System Plus Consulting
RELATED REPORTS
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Thermal Imagers and Detectors 2020 by Yole Développement
iRay Technology 12μm and 17μm Thermal Sensors by System Plus
Consulting
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Western US & Canada
Steve Laferriere - [email protected]
+ 1 310 600 8267
Eastern US & Canada
Chris Youman - [email protected]
+1 919 607 9839
Europe and Rest of the World
Lizzie Levenez - [email protected]
+49 15 123 544 182
Benelux, UK & Scandinavia
Marine Wybranietz - [email protected]
+49 69 96 21 76 78
India and Rest of Asia
Takashi Onozawa - [email protected]
+81 80 4371 4887
Greater China
Mavis Wang - [email protected]
+886 979 336 809 +86 136 6156 6824
Korea
Peter Ok - [email protected]
+82 10 4089 0233
Japan
Miho Ohtake - [email protected]
+81 34 4059 204
Japan and Singapore
Itsuyo Oshiba - [email protected]
+81 80 3577 3042
Japan
Toru Hosaka – [email protected]
+81 90 1775 3866
GENERAL
› Joël Thomé, General Manager
[email protected] - +33 (0) 6 68 62 49 06
› Marie-Eve Fraisse, Sales
[email protected] - +33 (0) 4 26 83 02 25
› General inquiries: [email protected] - +33 4 72 83 01 80
CONTACT US