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Silanna Manufacturing Radiation
Hardened Integrated Circuits for Space:
The Journey
Andy Brawley – VP of Manufacturing
Presented at NSW Trade & Investment
18th June 2015
www.silanna.com
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Who are we? Silanna is a semiconductor manufacturing company using a silicon-on-sapphire (SoS) process technology for high-performance RF-CMOS applications. A vertically integrated company that can design a product, manufacture the chips on its own process line, test and qualify the product, as well as provide route to market.
Modern Building situated in the Australia Centre – Sydney Olympic Park NSW
150mm SoS CMOS wafer fab with 1100m2 Class 1-10 Cleanrooms
150mm Compound Semiconductor Fab with 550m2 Class 1 Cleanroom,
Production Shift - 24 hrs/day, 7 days/week
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New Compound Semiconductor Research Facility
A $30M Investment in New Processes and Tool Types
Deposition – Molecular Beam Epitaxy - Veeco Gen200 Dual Chamber
Etch - PlasmaTherm LLC Versaline LL ICP
Rapid Thermal Processor - Mattson 2800CS
E-Beam Evaporator - Temescal
X-ray Diffractometer - PANalytical X'Pert-PRO MRD
Photoluminescence Mapping System - Nanometrics Vertex
Hall Measurement System - Coherent Scientific
System capable of depositing nitrides such as AlN, GaN, AlGaN etc
Deep Space Probes
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The farthest man-made
object from the Earth is the
Voyager 1 spacecraft, that
has an RCA-built SoS
microprocessor on-board.
It was launched in 1977
and left our solar system in
2003. As of today it is
more than 19 billion
kilometres from earth and
still functioning
Space Environment – just a little bit nasty
In 2003 a large magnetic storm caused more than 47 satellites to malfunction, including the total loss of
a scientific satellite valued at $640m.
The largest magnetic storm ever recorded – Carrington of 1859 – If such a super-storm occurred today,
the cost could be as high as $30bn
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REF: http://www.sail-world.com/index.cfm?nid=94565
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SoS vs. Competing RF Processes
Bulk CMOS Process SoS Process
oxide gate gate contact contact
silicon layer contact
insulating sapphire substrate
p-channel FET n-channel FET
SiGe BiCMOS Process
p+ base
semi-insulating GaAs substrate
n+ GaAs subcollector
n- GaAs collector
AlGaAs
emitter
collector
contact
base
contact
emitter
contact base
contact
GaAs HBT Process
isolation
implant
npn-bipolar HBT
contact gate isolation
n+ n+ n+ p+ p+ p+
p+substrate
p-epitaxial layer
n-well
oxide gate contact contact
body
tie
n-channel FET p-channel FET
p-well
p-substrate
n+subcollector n+ n-well
p+ n-collector p+
p+
n+
n+
p-channel FET
p+
npn-bipolar
gate contact
contacts emitter SiGe
base
collector
contacts
trench
isolation oxide
p-well n+ n+ n+
contact contact
gate
n-channel FET
p-
p+
body
tie
Oxide-isolated devices
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Zero volt
Vt devices
NO field
inversion
or latchup
N-channel P-channel
SiO2 Dielectrically
isolated
transistors Sapphire
Sapphire
Gate Oxide
Fully-depleted Channel
NO back-channel effect
Source Drain
NO body effect
or major kink
Gate
NO junction
spiking
Reduced
E-fields
Ldd Ldd
SoS Radiation Basics
+++++++++++++++++++++
Zero substrate
capacitance
NO Back-bias or
thermal effects
Fully-depleted
structure solves
TID effects
Short lifetime
improves
SEE/SEU
Ultra-thin
layer ideal
for
SEE/SEU
Radiation induced
+ charge only
shifts Vt (Gauss’ Law)
How we support Space applications
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ELECTRONICS that has:
Easy integration of RF, passives, mixed signal, and
EEPROM on a single die
Radiation-hard and Cryogenic temperature operation
Optically transparent substrate for use in optical applications
Lower parasitic capacitance = Higher Speed + Lower Power
Consumption
Fully depleted transistors, improving linearity, speed, and
low voltage performance
Excellent RF performance:
o fmax typically 3X ft (60 GHz at 0.5 µm and 100 GHz at
0.25 µm)
o very high linearity transistors (+38 dBm IP3 mixers)
o high Q integrated inductors (QL > 40 at 2 GHz for 5 nH
inductor)
High isolation (>50 dB between adjacent devices)
Processed in standard CMOS facilities on large wafers with
low cost advantages
How we offer Space applications (2)
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SYSTEMS that include:
ISO 9001:2008 LRQA certification
AS9100 Rev.C LRQA accreditation
US Defence MicroElectronic Activity (DMEA) Trusted Foundry clearance to “secret” level
International Traffic in Arms Regulation (ITAR) free
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Performance Advantages
Transistor Size
Transistor
Speed
100nm 1000nm 1nm
100GHz
1000GHz
Lower Cost,
Higher Returns Silanna
IBM and Semiconductor
Industry Association
Roadmap
Cost of
building a
Wafer Fab
free $200M $4B $50B
Our customers
Peregrine Semiconductor based in San Diego CA USA.
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Aerospace Corp
Air Research Lab
Alcatel Alenia
Army Research Lab
Astrium
Boeing
Defence Microelectronic Activity
DSTO
General Dynamics
Honeywell
Jet Propulsion Lab
Lockheed Martin
MRC
NASA Goddard
Northrop Grumman
Oak Ridge National Lab
Rockwell Collins
Space Micro
Thales
Ultra Communications
Target Features
4 high speed (400 Mbps)
channels
2 transmit, 2 receive (Data+Strobe)
Cable-side: LVDS
Module-side: LVTTL or LVDS
LVTTL: LV049 Mode
LVDS: Repeater Mode
LVDS failsafe
Isolation voltage: 1 kVrms
SpaceWire Link Isolator
Integrated DC-to-DC isolator to power cable-side from module-side
Cable-side data lines align well with SpaceWire cable connection
LV049 Mode is functionally & signal-pin compatible w/ standard dual
LVDS transceiver devices (ie. TI/NSC DS90LV049 series)
LV049 Mode
RIN1-
RIN1+
RIN2+
RIN2-
DOUT2-
DOUT2+
DOUT1+
DOUT1-
EN
ROUT1
ROUT2
GND
VDD
DIN2
DIN1
EN-
VDD
GNDGNDI
VR
EGDC-DC DC-DC
I/O C
ON
TRO
L
VR
EG
VDDI
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CSIRO SKA Radio Telescope
Silanna Antenna
Receiver Chip
LNA chip designed by
LaTrobe University
Low Noise Applications
Integrated Wide Band Receiver
“SKA is not possible without miniaturization”
FROM THIS
TO THIS
200 Receivers
0.5 to 1.8 GHz
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ASKAP Project Leader, Dr Dave
DeBoer, with a receiver for CSIRO's
prototype phased array feed.
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90 x 900nm
SCANNING TUNNELING MICROSCOPE
SCANNING ELECTRON
MICROSCOPE OPTICAL MICROSCOPE
30μm 100μm
HUMAN EYE
Atomic-scale lithography
1 nm 2 mm
Single Atom Nanoelectronics
Fabrication of external metal
contacts aligned to buried
phosphorus doped
nanostructure
Centre for Quantum Computer Technology
Quantum Computer
Silanna voltage pulse
generator for Qubit transistor
operating at 30mK
Very Low Temperature Applications
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Optics on Sapphire (micro-displays)
Full color micro-display on UltraCMOS sapphire
• XGA, VGA, SVGA demonstrated
• RGB LED’s • No bulky optics • Standard UTSi
CMOS process
Space and Naval Warfare Systems Center (SSC) in San Diego and
Optron Systems collaborated on the fabrication of a first-generation,
monochrome microdisplay. In 1999, Radiant Images, Inc., a spinoff
from Optron Systems, was formed to commercialize the invention.
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Similar process to standard MEMS
Standard SoS process
Minor design rule changes
Designed for optical, magnetic, &
capacitive sensing
Simple, standard post-CMOS
processing
Low-loss substrate helps MMW RF
MEMS on Sapphire
Low cost prototypes
A large cost of chip development
is mask tooling and prototype
wafers
Compressed Reticle program
significantly reduces tooling
cost
Small runs of protos or
production possible
Multiple mask layers on one Reticle
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Production Flow for Space Products
Silanna Semiconductor Europe Overall Program Management
Product development & Design
Full documentation set up
Quality assurance
Mask Shop (Singapore) Mask
Foundry (Silanna Australia) Wafer processing
WAT/WLR
Backgrinding
Assembly (Europe) Wafer sawing
Assembly (Packaging and bonding)
Mechanical screening
Thermal cycles
PIND test
Leakages
Test & Screening (Europe) Wafer probe
Electrical test
DC, AC, RF and PN
Electrical screening (Burn in, Life test,…)
Qualification and Periodic Tests
Product Development
Design-Simulations-Layout
Tape Out
MaskShop
Wafer Fab
Design Validation
Characterization
Wafer Sawing
Assembly
Electrical test
Screening
Pro
gra
m M
an
ag
em
en
t
Lo
gis
tic -
Qu
alit
y M
an
ag
em
en
t
Radiation
Test
Data Package validation
& Product control - Customer CSI
Precap
Program SOW
PR
OD
. DE
V. S
pe
c
PID
& S
CC
90
00
PDR
CDR
MR
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Chip Manufacturing Services
Ideal for RF/Mixed Signal and Digital designers
Silicon-on-Sapphire
0.5 µm Single Poly Triple Metal SoS
0.25 µm Single Poly Triple Metal SoS
3 variants of each
High volume - High mix – High Flexibility
6 weeks fab cycle time – Compressed reticle
Cadence & AWR Process Design Kit (PDKs)
Wafer dicing + Prototype assembly services
“Use SoS for your advanced RFIC designs”
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No schedules – start when ready
Wafer dedicated to customer design
Potentially thousands of devices per
wafer
Can use for low volume production
Quicker re-spin times
Much lower chip cost
Easy transition to production
Compressed Reticle Compared to Multi-Project Wafers
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Laser scribe and break – sapphire and quartz
Die bonding
Wirebonding – wide range of open cavity plastic & ceramic
packages
Expertise in Assembly with 20+ years experience in IC
assembly
ESD safe Class 10K clean room
Fast turn including same day delivery of small quantities
Prototype IC Packaging
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2004 AEEMA Excellence Award for Commercialising R&D
Presented by Minister Hon. Ian Macfarlane Received by Jim Cable, Ron Reedy & Andrew Brawley
2004 Western Sydney Industry Awards
Presented by NSW Premier Bob Carr
for Innovation and Advanced Manufacturing
2005 WSIA for
Innovation and
Global Excellence
Presented by
Minister for
Western Sydney –
Diane Beamer
Excellence Awards
2006 WSIA for
Innovation Presented
by NSW Premier
Morris Iemma
2006 EDN Innovation
Award for Best
Application of RF
Design
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AEEMA 2006 Excellence Awards for Best New Product and
Commercialising R&D presented by Bob Baldwin representing
Minister Macfarlane and Angus Robinson, AEEMA CEO, accepted
by Ron Reedy Jim Cable and Andy Brawley
Manufacturing
Presented
by Senator
Helen
Coonan