st9d3ms . ddr3 m integrated module himod
TRANSCRIPT
STACKED Technologies Incorporated www.stackedtechnologies.com 1
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance Highly Integrated Memory Module Product
ST9D364M64SBG2
DDR3 SDRAM Integrated Module [HiMOD]:
•VDD=VDDQ=1.5V±0.075V •1.5Vcenter-terminated,push/pullI/O
•Package:16mmx22mmx1.2mm,13x21matrixw/271balls
•Matrixballpitch:1.00mmSpacesavingfootprintThermallyenhanced,Impedancematched,integratedpackagingDifferential,bi-directionaldatastrobe8n-bitprefetcharchitecture 8internalbanks(perword,4wordsintegratedinpackage) Nominalanddynamicon-dietermina-tion(ODT)fordata,strobe,andmasksignals. ProgrammableCAS(READ)latency(CL):7,8,10,and11 CAS(WRITE)latency(CWL):6,7,8,
FEATURES
9,and11 Fixedburstlength(BL)of8andburstchop(BC)of4 SelectableBC4orBL8on-the-fly(OTF) Self/AutoRefreshmodes OperatingTemperatureRange(ambienttemp=TA)
•Commercial:0°Cto70°C •Industrial:-40°Cto85°C •Extended:-40°Cto105°C •Mil-Temp:-55°Cto125°C COREclockingfrequencies:400,533,667,800MHz DataTransferRates:800,1066,1333,1600MbpsWritelevelingMultipurposeregisterOutputDriverCalibration
40%spacesavingswhileprovid-ingasurfacemountfriendlypitch(1.00mm) ReducedI/Orouting(34%) 30%improvementinroutingsforyourmemoryarray Reducedtracelengthsduetothehighlyintegrated,impedancematchedpackaging Thermallyenhancedpackagingtechnologyallowsiliconintegrationwithoutperformancedegradationduetopowerdissipation(heat) HighTCEorganiclaminateinterposerforimprovedglassstabilityoverawideoperatingtemperature SuitabilityofuseinHighReliabilityapplicationsrequiringMil-temp,non-hermeticdeviceoperation
Benefits
*Note: This integrated product and/or its specifications
are subject to change without notice. The latest document
should be retrieved from STACKED Technologies prior to
your design consideration.
Order Number Speed Grade pkG FOOtpriNt i/O pitch pkG NO.
16mmx22mm 271
iMOD Part Information
BG21.00mm
ST9D364M64SBG2x125
ST9D364M64SBG2x15
ST9D364M64SBG2x187
ST9D364M64SBG2x25
DDR3-1600
DDR3-1333
DDR3-1066
DDR3-800
Sample Part Number: ST9D364M64SBG2
Word = 64MB
Speed Grade
2.5ns / 400MHz
1.875ns / 533MHz
1.5ns / 666MHz
25
187
15
125
64MST9D3
Temperature
Industrial (-40oC to 85oC)
Extended (-40oC to 105oC)
Military (-55oC to 125oC)
I
EM
Note: Not all options can be combined. Please see our Part Catalog for available offerings.
64S BG2
DDR3 HiMOD
Wordwidth x64
S = Single Channel
16 x 22mm PBGA
Code
Code
X XXX
Commercial (0oC to 70oC) C
1.25ns / 800MHz
STACKED Technologies Incorporated www.stackedtechnologies.com 2
June 6, 2015 STDS-ST9D364M64SBG2-A
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
High Performance Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
FEATURES
FiGure 1 - himOd part NumberS
Configuration
RefreshCount
ROWAddressing
BackAddressing
ColumnAddressing
[8Megx8banksx16]x4
8K
8K(A[12:0])
8(BA[2:0])
1K(A[9:0])
Parameter 64 Meg x 64
table 1: addreSSiNG
STACKED Technologies Incorporated www.stackedtechnologies.com3
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
List of Figures
Figure1:DDR3PartNumbers 2Figure2:SimplifiedStateDiagram 8Figure3:FunctionalBlockDiagram 10Figure4:SDRAM-DDR3PinoutTopView 11Figure5:MechanicalDrawing 15Figure6:InputSignal 31Figure7:OvershootSpecifications 32Figure8:UndershootSpecifications 32Figure9:VIXforDifferentialSignals 34Figure10:Single-EndedRequirementsforDifferentialSignals 34Figure11:DefinitionofDifferentialAC-SwingandtDVAC 35Figure12:NominalSlewRateDefinitionforSingle-EndedInputSignals 37Figure13:NominalDifferentialInputSlewRateDefinitionforDQS,DQS#andCK,CK# 38Figure14:ODTLevelsandI-VCharacteristics 39Figure15:ODTTimingReferenceLoad 41Figure16:tAON and tAOFDefinitions 42Figure17:tAONPDandtAOFPDDefinition 43Figure 18: tADCDefinition 43Figure19:OutputDriver 44Figure20:DQOutputSignal 49Figure21:DifferentialOutputSignal 50Figure22:ReferenceOutputLoadforACTimingandOutputSlewRate 50Figure23:NominalSlewRateDefinitionforSingle-EndedOutputSignals 51Figure24:NominalDifferentialOutputSlewRateDefinitionforDQS,DQS# 52Figure25:NominalSlewRateandtVACfortIS(CommandandAddress-Clock) 64Figure26:NominalSlewRatefortIH(CommandandAddress-Clock) 65Figure27:TangentLinefortIS(CommandandAddress-Clock) 66Figure28:TangentLinefortIH(CommandandAddress-Clock) 67Figure29:NominalSlewRateandtVACfortDS(DQ-Strobe) 70Figure30:NominalSlewRatefortDH(DQ-Strobe) 71Figure31:NominalSlewRateandtVACfortDS(DQ-Strobe) 72Figure32:NominalSlewRatefortDH(DQ-Strobe) 73Figure33:RefreshMode 77Figure34:DLLEnableModetoDLLDisableMode 79Figure35:DLLDisableModetoDLLEnableMode 80Figure36:DLLDisabletDQSCKTiming 81Figure37:ChangeFrequencyDuringPrechargePower-Down 82Figure38:WriteLevelingConcept 83Figure39:WriteLevelingSequence 85Figure40:ExitWriteLeveling 86Figure41:InitializationSequence 88Figure42:MRS-to-MRSCommandTiming(tMRD) 89Figure43:MRS-to-nonMRSCommandTiming(tMOD) 90Figure44:ModeRegister0(MR0)Definitions 91Figure45:READLatency 93Figure46:ModeRegister1(MR1)Definition 94Figure47:READLatency(AL=5,CL=6) 96Figure48:ModeRegister2(MR2)Definition 97
STACKED Technologies Incorporated www.stackedtechnologies.com4
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
Figure49:CASWriteLatency 98Figure50:ModeRegister3(MR3)Definition 99Figure51:MultipurposeRegister(MPR)BlockDiagram 103Figure52:MPRSystemReadCalibrationwithBL8-FixedBurstOrderSingleReadout 103Figure53:MPRSystemReadCalibrationwithBL8-FixedBurstOrder,Back-to-BackReadout 104Figure54:MPRSystemReadCalibrationwithBC4-LowerNibble,thenUpperNibble 105Figure55:MPRSystemReadCalibrationwithBC4-UpperNibble,thenLowerNibble 106Figure56:ZQCalibrationTiming(ZQCLandZQCS) 108Figure57:Example-MeetingtRRD(MIN)andtRCD(MIN) 109Figure58:Example-tFAW 109Figure59:READLatency 110Figure60:ConsecutiveREADBursts(BL8) 111Figure61:ConsecutiveREADBursts(BC4) 112Figure62:NonconsecutiveREADBursts 113Figure63:READ(BL8)toWRITE(BL8) 114Figure64:READ(BC4)toWRITE(BC4)OTF 115Figure65:READtoPRECHARGE(BL8) 116Figure66:READtoPRECHARGE(BC4) 117Figure67:READtoPRECHARGE(AL=5,CL=6) 118Figure68:READwithAutoPrecharge(AL=4,CL=6) 119Figure69:DataOutputTiming-tDQSQandDataValidWindow 121Figure70:DataStrobeTiming-READs 123Figure71:MethodforCalculatingtLZandtHZ 124Figure72:tRPRETiming 125Figure73:tRPSTTiming 125Figure74:tWPRETiming 126Figure75:tWPSTTiming 126Figure76:WriteBurst 128Figure77:ConsecutiveWRITE(BL8)toWRITE(BL8) 129Figure78:ConsecutiveWRITE(BC4)viaMRSorOTF 129Figure79:NonconsecutiveWRITEtoWRITE 130Figure80:WRITE(BL8)toREAD(BL8) 130Figure81:WRITEtoREAD(BC4ModeRegisterSetting) 131Figure82:WRITE(BC4OTF)toREAD(BC4OTF) 132Figure83:WRITE(BL8)toPRECHARGE 133Figure84:WRITE(BC4ModeRegisterSetting)toPRECHARGE 133Figure85:WRITE(BC4OTF)toPRECHARGE 134Figure86:DataInputTiming 134Figure87:SelfRefreshEntry/ExitTiming 136Figure88:ActivePower-DownEntryandExit 139Figure89:PrechargePower-Down(Fast-ExitMode)EntryandExit 139Figure90:PrechargePower-Down(Slow-ExitMode)EntryandExit 140Figure91:Power-DownEntryAfterREADorREADwithAutoPrecharge(RDAP) 140Figure92:Power-DownEntryAfterWRITE 141Figure93:Power-DownEntryAfterWRITEwithAutoPrecharge(WRAP) 141Figure94:REFRESHtoPower-DownEntry 142Figure95:ACTIVATEtoPower-DownEntry 142Figure96:PRECHARGEtoPower-DownEntry 143Figure97:MRSCommandtoPower-DownEntry 143Figure98:Power-DownExittoRefreshtoPower-DownEntry 144
STACKED Technologies Incorporated www.stackedtechnologies.com5
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
Figure99:RESETSequence 145Figure100:On-DieTermination 146Figure101:DynamicODT-ODTAssertedBeforeandAftertheWRITE,BC4 149Figure102:DynamicODT-WithoutWRITECommand 149Figure103:DynamicODT-ODTPinAssertedTogetherwithWRITECommandfor6ClockCycles,BL8 150Figure104:DynamicODT-ODTPinAssertedwithWRITECommandfor6ClockCycles,BC4 150Figure105:DynamicODT-ODTPinAssertedwithWRITECommandfor4Clockcycles,BC4 151Figure106:SynchronousODT 152Figure107:SynchronousODT(BC4) 153Figure108:ODTDuringREADs 153Figure109:AsynchronousODTtimingwithFastODTTransition 154Figure110:SynchronoustoAsynchronousTransitionDuringPrechargePower-Down(DLLOff)Entry 155Figure111:AsynchronoustoSynchronousTransitionDuringPrechargePower-Down(DLLOff)Exit 157Figure112:TransitionPeriodforShortCKELOWCycleswithEntryandExitPeriodOverlapping 158Figure113:TransitionPeriodforShortCKEHIGHCycleswithEntryandExitPeriodOverlapping 158
STACKED Technologies Incorporated www.stackedtechnologies.com6
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
List of Tables
Table1:Addressing 2Table2:Ball/SignalLocationandDescription 12Table3:AbsoluteMaximumRatings 16Table4:Input/OutputCapacitance 16Table5:TimingParametersforIDDMeasurements-ClockUnits 17Table6:IDD0MeasurementLoop 18Table7:IDD1MeasurementLoop 19Table8:IDDMeasurementConditionsforPower-DownCurrents 20Table9:IDD2N/IDD3NMeasurementLoop 21Table10:IDD2NTMeasurementLoop 22Table11:IDD4RMeasurementLoop 23Table12:IDD4WMeasurementLoop 24Table13:IDD5BMeasurementLoop 25Table14:IDDMeasurementLoop 26Table15:IDD7MeasurementLoop 27Table16:IDDMaximumLimits 28Table17:DCElectricalCharacteristicsandOperatingConditions 29Table18:DCElectricalCharacteristicsandInputConditions 29Table19:InputSwitchingConditions 30Table20:ControlandAddressPins 32Table21:Clock,Data,Strobe,andMaskPins 32Table22:DifferentialInputOperatingConditions(CKx,CKx\,DQSx,andDQSx\) 33Table23:DifferentialInputOperatingConditions(tDVAC)forCKx,CKx\,DQSx,andDQSx\ 35Table24:Single-EndedInputSlewRate 36Table25:DifferentialInputSlewRateDefinition 38Table26:On-DieTerminationDCElectricalCharacteristics 39Table27:RTTEffectiveImpedances 40Table28:ODTSensitivityDefinition 41Table29:ODTTemperature&VoltageSensitivity 41Table30:ODTTimingDefinitions 42Table31:ReferenceSettingsforODTTimingMeasurements 42Table32:34ΩDriverImpedanceCharacteristics 44Table33:34ΩDriverPull-UpandPull-DownImpedanceCalculations 45Table34:34ΩDriverIOH/IOLCharacteristics-VDD=VDDQ=1.5V 45Table35:34ΩDriverIOH/IOLCharacteristics-VDD=VDDQ=1.575V 45Table36:34ΩDriverIOH/IOLCharacteristics-VDD=VDDQ=1.425V 46Table37:34ΩOutputDriverSensitivityDefinition 46Table38:34ΩOutputDriverVoltageandTemperatureSensitivity 46Table39:40ΩDriverImpedanceCharacteristics 47Table40:40ΩOutputDriverSensitivityDefinition 47Table41:40ΩOutputDriverVoltageandTemperatureSensitivity 48Table42:Single-EndedOutputDriverCharacteristics 48Table43:DifferentialOutputDriverCharacteristics 49Table44:Single-EndedOutputSlewRate 51Table45:DifferentialOutputSlewrateDefinition 52Table46:SpeedBins 53Table47:ElectricalCharacteristicsandACOperatingConditions 54Table48:CommandandAddressSetupandHoldValuesReferencedat1V/ns-AC/DCBased 62
STACKED Technologies Incorporated www.stackedtechnologies.com7
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
Table49:DeratingValuesfortIS/tIH-AC175/DC100-Based 62Table50:DeratingValuesfortIS/tIH-AC150/DC100-Based 63Table51:MinimumRequiredTimetVACaboveVIH(AC)foraValidTransition 63Table52:DataSetupandHoldValuesat1V/ns(DQSx,DQSx\at2V/ns)-AC/DCbased 68Table53:DeratingValuefortDS/tDH-AC175/DC100-Based 68Table54:DeratingValuefortDS/tDH-AC150/DC100-Based 69Table55:RequiredTimetVACAboveVIH(AC)(BelowVIL[AC])ForaValidTransition 69Table56:TruthTable-Command 74Table57:TruthTable-CKE 75Table58:ReadCommandSummary 76Table59:WriteCommandSummary 76Table60:BurstOrder 92Table61:BurstOrder 101Table62:BurstOrder 102Table63:SELFREFRESHTemperatureandAUTOSELFREFRESHDescription 137Table64:SELFREFRESHModeSummary 137Table65:COMMANDtoPOWER-DOWNEntryParameters 138Table66:POWER-DOWNModes 138Table67:POWER-DOWNModes 146Table68:ODTParameter 147Table69:DynamicODTSpecificParameters 148Table70:MODEREGISTERSforRTT_NOM 148Table71:MODEREGISTERSforRTT-WR 148Table72:TIMINGDIAGRAMSforDYNAMICODT 148Table73:SYNCHRONOUSODTParameters 152Table74:ASYNCHRONOUSODTtimingParametersforAllSpeedBins 154Table75:ODTParametersforPOWER-DOWN(DLLOff)EntryandExitTransitionPeriod 155
BankActive
ReadingWriting
Activating
Refreshing
Selfrefresh
Idle
ActivePower-Down
ZQCalibration
From anystate
Powerapplied
ResetProcedure
Poweron
InitializationMRS, MPR,
writeleveling
PrehargePower-Down
Writing
AutomaticSequence
CommandSequence
Preharging
READ
READ READ
READ AP
READ AP
READ AP
PRE, PREA
PRE, PREA PRE, PREA
WRITE
WRITE
CKE L CKE L
CKE L
WRITE
WRITE AP
WRITE AP
WRITE AP
PDE
PDE
PDX
PDX
SRX
SRE
REF
MRS
ACT
RESET
ZQCL
ZQCL/ZQCS
Reading
ACT = ACTIVATE PREA=PRECHARGE ALL SRX = Self refresh exitMPR = Multipurpose register READ = RD, RDS4, RDS8 WRITE = WR, WRS4, WRS8MRS = Mode register set READ AP = RDAP, RDAPS4, RDAPS8 WRITE AP = WRAP, WRAPS4, WRAPS8PDE = Power-down entry REF = REFRESH ZQCL = ZQ LONG CALIBRATIONPDX = Power-down exit RESET = START RESET PROCEDURE ZQCS = ZQ SHORT CALIBRATIONPRE = PRECHARGE SRE = Self refresh entry
STACKED Technologies Incorporated www.stackedtechnologies.com8
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
STATE DIAGRAM
FiGure 2 - SimpliFied State diaGram
STACKED Technologies Incorporated www.stackedtechnologies.com 9
June 6, 2015 STDS-ST9D364M64SBG2-A
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
High Performance Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
ThisDDR3SDRAMModuleusesdoubledataratearchitecturetoachievehighspeedoperation.Thedoubledatarate(DDR)architectureisan8nprefetchwithaninterfacedesignedtotransfertwodatawordsperclockcycleattheI/Opins.AsingleREADorWRITEaccessfortheDRAMconsistsofasingle8n-bit-wide,one-clock-cycledatatransferattheinternalmemorycoreandeightcorre-spondingn-bit-wide,one-half-clock-cycledatatransferattheI/Opin.
The differential strobes (DQSx,DQSx\) are transmitted externally, alongwithdata,foruseindatacaptureattheDRAMinputreceiver.DQSiscen-ter-alignedwithdata forWRITEs. TheREADdata is transmittedby theDRAMandedge-alignedtothedatastrobes.
TheDRAMoperates fromadifferentialclock (CKx,CKx\). ThecrossingofCKgoingHIGHandCK\goingLOWisreferredtoasthepositiveedgeofClock(CK).Control,Command,andAddresssignalsareregisteredateverypositiveedgeofCK.InputdataisregisteredonthefirstrisingedgeofDQSaftertheWRITEpreamble,andoutputdataisreferencedonthefirstrisingedgeofDQSaftertheREADpreamble.
READandWRITEaccessesto theDRAMareburst-oriented. Accessesstartataselectedlocationandcontinueforaprogrammednumberofloca-tions in a programmed sequence. Accesses beginwith the registrationofanACTIVATEcommand,whichisthenfollowedbyaREADorWRITEcommand.TheaddressbitsregisteredcoincidentwiththeACTIVATEcom-mandareusedtoselectthebankandthestartingcolumnlocationfortheburstaccess.
DRAM devices use READ andWRITE BL8 and BC4. An AUTOPRE-CHARGE function may be enabled to provide a self-timed ROW PRE-CHARGEthatisinitiatedattheendoftheburstaccess.
AswithstandardDRAMdevices,thepipelined,multi-bankarchitectureoftheDRAMallows for concurrentoperation, therebyprovidinghighband-widthbyhidingROWPRECHARGEandACTIVATIONtime.
ASELFREFRESHmode isprovided forall temperaturegradeofferingsalongwithAUTOSELFREFRESHforIndustrialproduct,aswellas,power-saving,POWER-DOWNmode.
FUNCTIONAL DESCRIPTION iNduStrial temperature
The industrial temperature (I) device requires the ambient temperaturenotexceed-40°Cor+85°C.JEDECspecificationsrequiretheREFRESHratetodoublewhenTAexceeds+85°C;thisalsorequiresuseofthehigh-temperatureSELFREFRESHoption. Additionally,ODTresistanceandthe INPUT/OUTPUT impedancemustbederatedwhen theTA is<0°Cor>+85°C.
exteNded temperature
TheExtendedtemperature(E)devicerequirestheambienttemperaturenotexceed-40°Cor+105°C.JEDECspecificationsrequiretherefreshratetodoublewhenTAexceeds+85°C;thisalsorequiresuseofthehigh-temperatureSELFREFRESHoption. Additionally,ODTresistanceandthe INPUT/OUTPUT impedancemustbederatedwhen theTA is<0°Cor >85°C.
military, extreme OperatiNG temperature
TheMil-Temp (M)device requires theambient temperaturenotexceed-55°Cor+125°C.JEDECrequirestheREFRESHratedoublewhenTA exceeds +85°C and STACKED recommends an additional derating asspecified in thisdocumentas toproperlymaintain theDRAMcorecellchargeattemperaturesaboveTA>105°C.
D0
RST\ VSS VSSQ VDD VDDQ WE\ CKE CAS\ RAS\ CS\
A0-A12, BA0-2A, BA
CK0
CK0\
DM0
DM1
DQ 0•••
DQ 7DQ 8•••
DQ 15
DQ 0•••
DQ 7DQ 8•••
DQ 15
A, BA
D1
DQ 0•••
DQ 7DQ 8•••
DQ 15
DQ 16•••
DQ 23DQ 24
•••
DQ 31
A, BA
D2
DQ 0•••
DQ 7DQ 8•••
DQ 15
DQ 32•••
DQ 39DQ 40
•••
DQ 47
A, BA
D3
DQ 0•••
DQ 7DQ 8•••
DQ 15
DQ 48•••
DQ 55DQ 56
•••
DQ 63
CK1
CK1\
DM2
DM3
CK2
CK2\
DM4
DM5
CK3
CK3\
DM6
DM7
CS\
RAS\
CAS\
CKE
WE\
VDDQ
VDD
VSSQ
VSS
RESET\
RST\ VSS VSSQ VDD VDDQ WE\ CKE CAS\ RAS\ CS\
RST\ VSS VSSQ VDD VDDQ WE\ CKE CAS\ RAS\ CS\
RST\ VSS VSSQ VDD VDDQ WE\ CKE CAS\ RAS\ CS\
DQS0, DQS0#
DQS1, DQS1#
DQS0, DQS0#
DQS1, DQS1#
DQS2, DQS2#
DQS3, DQS3#
DQS2, DQS2#
DQS3, DQS3#
DQS4, DQS4#
DQS5, DQS5#
DQS4, DQS4#
DQS5, DQS5#
DQS6, DQS6#
DQS7, DQS7#
DQS6, DQS6#
DQS7, DQS7#
STACKED Technologies Incorporated www.stackedtechnologies.com 10
June 6, 2015 STDS-ST9D364M64SBG2-A
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
High Performance Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
FiGure 3 - FuNctiONal blOck diaGram
VrefDA
VrefCAVss
RFU
BA2 RFU
DM2
CK2
VssQ
VssQ
VssQ
DQ2
DQ1 DQ4 DQ20
DQ30 DQ14 DQ9 DQ12
DQ62
DQ59
BA1
A7
A3 A12 RFU
A1
BA0 A5
VssQ
VssQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDDQ
VDD
VDD
VDDDL
VDD
VDDVDD
VDD
VDD
VDD
VDD
VDD
VDDVDD
Vss
Vss
Vss
Vss
Vss
Vss
VssDL
Vss
Vss
Vss
Vss
Vss
VDDQ VDDQVss
Vss
Vss
Vss
A8
Vss
Vss
Vss
Vss
VDDQ
Vss
Vss
1 2 3 4 5 6 7 8 9 10 11 12 13
A VssQ VDDQ VDDQ Vss Vss VssQ Vss Vss VDDQ A
B VssQ VDD Vss B
C VssVssVssVssVDDQ C
D D
E DQ35 DQ51 E
F DQ36 F
G DM6 DM4 G
H DQ38 DQ54 H
J DM7 DQ44 J
K K
L L
M M
N
ZQ3 ZQ2
N
P DQ13 DQ29 DQ8 P
R DQS0\ DQ10 DQ26 DQ23 R
T DQ0 DQ16 T
1 2 3 4 5 6 7 8 9 10 11 12 13
AddressUNPOPULATED
Level REF
V + (I/O Power) CNTRL
GND (Core)
Data IO
VDDQ
VDD
VDDQ
Vss
Vss
Vss
VDDQ
Vss
VDDQ
VDDQ
VssQ
VssQ VssQ
Vss
VDD
Vss
U
V
W
Y
AA
U
V
W
Y
AA
VssQ
Vss
DQ52
VDD
Vss
VDD
DQS3\
DQS2\
CK0
Vss
Vss
A6 A10 A9
A0 A11
A2 A4
VDD
DQS3 DQS1
CK0\
CK1\
Vss
VDD
VDDQ
VDD
DQS2
DQ5
CK1
Vss
Vss
VDDQ
VDD
DQ33
DQ49
DQ60
DQ41
Vss
RESET\
DQ43
DQ57
DQ46
ZQ0 ZQ1
DQ15
DQ24 DQ31
DQS1\
Vss Vss Vss
Vss Vss Vss Vss Vss
Vss Vss Vss Vss
VssVss
Vss Vss Vss
Vss
Vss
Vss
Vss
Vss
Vss
Vss
Vss
Vss
Vss
Vss
Vss
VssVss
Vss
Vss
Vss
VDD VDD
VDD
VDD
VDD
VDD
VssQ VssQ
DQ63
DQ55
DQ39
DQ50
DQ34
DQ53
DQ58
DQ56
DQ47
DQ42
DQ40 DQ61 DQ45
DQ48 DQ32
DQ25 DQ28 DQ22 DQ6
DQ27 DQ11 DQ17
DQ19 DQ3
DQ7
DQ21 DQ18
DQ37
VssQ
CK3 CK3\
CK2\
DQS4 DQS6
DQS4\
DQS5\ DQS5 DQS7
DM1
ODT
DQS0
RAS\ CAS\
CS\
CKE WE\
DM5
DQS6\
DQS7\
DM3
DM0
GND (I/O)
V + (Core Power)
271BGA-1.00MM PITCH - X64, SCB
VSSDL VDDDL
STACKED Technologies Incorporated www.stackedtechnologies.com 11
June 6, 2015 STDS-ST9D364M64SBG2-A
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
High Performance Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
FiGure 4 - Sdram - ddr3 piNOut tOp View
BALL /SIGNAL LOCATION (PBGA)
STACKED Technologies Incorporated www.stackedtechnologies.com 12
June 6, 2015 STDS-ST9D364M64SBG2-A
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
High Performance Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
table 2 - ball/SiGNal lOcatiON aNd deScriptiON
Ball Assignments Symbol Type Description
L3,L10,M3,K9,M4,
M10,K3,M11,M5,K5,
K4,L4,K10
M9,L11,F6
K11,G7,F7
U2,U3,V4,V3,E12,
E11,D10,D11
U9
W6
R11,P8,R12,N12,
G3,H6,G2,
J2
V6
V7
U10
A0, A1, A2,
A3, A4, A5,
A6, A7, A8,
A9, A10 /AP,
A11, A12 /BC
BA0, BA1,
BA2
RFU
CKX, CKX\
CKE
CS\
DMx
RAS\
CAS\
WE\
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Address Inputs: ProvidetheROWaddressforACTIVATEcommands,andthecolumnaddress
andautoprechargebit(A10)forREADY/WRITEcommands,toselectonelocationoutofthe
memoryarrayintherespectivebank.A10sampledduringaPRECHARGEcommanddetermines
whetherthePRECHARGEappliestoonebank(A10LOW),bankselectedbyBA[2:0]orallbanks
(A10HIGH).Theaddressinputsalsoprovidetheop-codeduringaLOADMODEcommand.
AddressinputsarereferencedtoVrefCA.A12/BC#:whenenabledinthemoderegister(MR),A12
issampledduringREADandWRITEcommandstodeterminewhetherburstchop,LOW=BC4
burstchop).
Bank Address Inputs: BA[2:0]definethebanktowhichanACTIVATE,READ,WRITE,or
PRECHARGEcommandisbeingapplied.BA[2:0]definewhichmoderegister(MR0,MR1,MR2,or
MR3)isloadedduringtheLOADMODEcommand.BA[2:0]arereferencedtoVrefCA.
FutureAddress:A13,A14,A15
Clock: CKxandCKx\aredifferentialclockinputs,onedifferentialpairperWORD,fourWORDs
containedintheL9D3xxG64product.Allcontrolandaddressinputsignalsaresampledonthe
crossingofthepositiveedgeofCKxandthenegativeedgeofCKx\.Outputdatastrobes(UDQSx/
UDQSx\andLDQSx/LDQSx\)isreferencedtothecrossingofCKxandCKx\.
Clock Enable: CKEenablesanddisablesinternalcircuitryandclocksontheSDRAM.The
specificcircuitrythatisenabled/disabledisdependentupontheDDR3SDRAMconfigurationand
operatingmode.TakingCKELOWprovidesPRECHARGEpower-downandSELFREFRESH
operations(allbanksidle),oractivepower-down(rowactiveinanybank).CKEissynchronous
forpower-downentryandexitandforselfrefreshentry.CKEisasynchronousforselfrefresh
exit.Inputbuffers(excludingCKx,CKx\,CKE,RESET#,andODT)aredisabledduringSELF
REFRESH.CKEisreferencedtoVrefCA.
Chip Select: CS\enables(registeredLOW)anddisablesthecommanddecoder.Allcommands
aremaskedwhenCS\isregisteredHIGH.CS\providesforexternalrankselectiononsystemswith
multiple ranks.CS\isconsideredpartofthecommandcode.CS\isreferencedtoVrefCA.
Input Data Mask: DMxisthebytewidedatamaskfortherespective8-bitdatafields.Thedata
maskinput,masksWRITEdata.BytedataismaskedwhenDMxissampledHIGH.DMxpinsare
structuredasinputsonly,thepinselectricalloadingisdesignedtomatchthatoftheDQ,DQSx,
DQSx#pins.
ROW Address Strobe/Select: DefinesthecommandbeingenteredalongCAS\,WE\,andCS\.
ThisinputpinisreferencedtoVrefCA.
COLUMN Address Strobe/Select: DefinesthecommandbeingenteredalongwithRAS\,WE\,
andCS\.ThisinputpinisreferencedtoVrefCA.
WRITE Enable Input: DefinesthecommandbeingenteredalongwithCAS\,RAS\,,andCS\.This
inputpinisreferencedtoVrefCA.
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table 2 - ball/SiGNal lOcatiON aNd deScriptiON cONtiNued
Ball Assignments Symbol Type Description
R7
F5
T5,R3,T4,R2,F9,G11,
F10,G12
N4,N6,N3,N2,J10,J8,
J11,J12
T2,T10,V5,U12,T11,
U4,P12,T6
P4,N10,R4,R9,N11,
P2,N9,N5
T3,R10,U6,U11,T12,
U5,P11,R6
P5,P9,R5,R8,P10,P3,
N8,P6
F12,F4,D9,E2,F3,
E10,H2,F8
H10,J4,G10,G5,J3,
H12,J5,J9
ODT
RESET\
DQS0-7,
DQS0-7\
DQ0, DQ1,
DQ2, DQ3,
DQ4, DQ5,
DQ6, DQ7
DQ8, DQ9,
DQ10, DQ11,
DQ12, DQ13,
DQ14, DQ15
DQ16, DQ17,
DQ18, DQ19,
DQ20, DQ21,
DQ22, DQ23
DQ24, DQ25,
DQ26, DQ27,
DQ28, DQ29,
DQ30, DQ31
DQ32, DQ33,
DQ34, DQ35,
DQ36, DQ37,
DQ38, DQ39
DQ40, DQ41,
DQ42, DQ43,
DQ44, DQ45,
DQ46, DQ47
Input
Input
Input
I/O
I/O
I/O
I/O
I/O
I/O
On-Die Termination: ODTenables(whenregisteredHIGH)anddisablesterminationresistance
internaltotheDDR3SDRAM.Whenenabledinnormaloperation,ODTisonlyappliedtoeachof
thefollowingsignals:DQ[63:0],LDQXx\,UDQSx\,UDMx,andLDMx.TheODTinputisignoredif
disabledviatheLOADMODEregistercommand.ODTisreferencedtoVrefCA.
RESET: Aninputcontrolpin,activeLOWreferencedtoVss.TheRESET\inputreceiverisa
CMOSinputdefinedasarailtorailsignalwithDCHIGH≥0.8xVDDandDCLOW≤0.2xVDDQ.
RESET\assertionandde-assertionareasynchronous.
Data Strobe, Byte (per WORD): Output,edge-alignedwithREADdata.Input,center-alignedwith
WRITEdata.
Data Input/Output: LOWByte,LOWWORD(WORD1).PinreferencedtoVrefDQ.
Data Input/Output: HIGHByte,LOWWORD(WORD1).PinreferencedtoVrefDQ.
Data Input/Output: LOWByte,WORD2.PinreferencedtoVrefDQ.
Data Input/Output: HIGHByte,WORD2.PinreferencedtoVrefDQ.
Data Input/Output: LOWByte,WORD3.PinreferencedtoVrefDQ.
Data Input/Output: HIGHByte,WORD3.PinreferencedtoVrefDQ.
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F11,G4,E8,E3,F2,E9,
H3,G8
H9,H5,G9,G6,H4,
H11,J6,H8
B3,B5,B6,B8,B9,B11,
C2,C12,J7,K2,K6,K8,
K12,L5,L9,M2,M6,M8,
N7,W2,W12,Y3,Y5,
Y6,Y8,Y9,Y11,B2
A3,A4,A10,A11,C1,
C13,D1,D13,K1,K13,
M1,M13,V13,W1,W13,
AA3,AA4,AA10,AA11
B4,B7,B10,C3,C11,
D2,D12,H7,K7,L2,L6,
L8,M7,P7,V2,V12,
W3,W11,Y2,Y4,Y7,
Y10,Y12,B12,A5,A6,
A8,A9,C4,C7,C8,C9,
C10,D3,D4,D7,D8,E1,
E4,E5,E13,F1,F13,
G1,G13,H1,H13,J1,
J13,N1,N13,P1,P13,
R1,R13,T1,T7,T8,T9,
T13,U1,U7,U8,U13,
V8,V9,V10,V11,W4,
W5,W7,W8,W9,W10,
AA5,AA6,AA8,AA9,E6
A2,A7,A12,A13,B1,
B13,L1,L13,Y1,Y13,
AA1,AA2,AA7,AA12,
AA13
L12
M12
E7
L7
C5,C6,D5,D6
A1,B2
table 2 - ball/SiGNal lOcatiON aNd deScriptiON cONtiNued
Ball Assignments Symbol Type Description
DQ48, DQ49,
DQ50, DQ51,
DQ52, DQ53,
DQ54, DQ55
DQ56, DQ57,
DQ58, DQ59,
DQ60, DQ61,
DQ62, DQ63
VDD
VDDQ
Vss
VssQ
VSSDL
VDDDL
VrefCA
VrefDQ
ZQx
UNPOPULATED
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Ref.
Data Input/Output: LOWByte,HIGHWORD(WORD4).PinreferencedtoVrefDQ.
Data Input/Output: HIGHByte,HIGHWORD(WORD4).PinreferencedtoVrefDQ.
PowerSupply:1.5V±0.075V
DataI/OSupply:1.5V±0.075V
Ground
DataI/OGround:IsolatedfromCoreforimprovednoiseimmunity
GroundforDLL
SupplyforDLL
VoltageReferenceCORE:VrefCAmustbemaintainedatalltimes
VoltageReferenceI/O:VrefDQmustbemaintainedatalltimes.
ExternalReferenceforoutputdrivecalibration
Unpopulated,un-platedmatrixlocation(s)
1.00NOM1.00NOM
12.00NOM
0.6±0.1
Note:Alldimensionsinmm
1.2MAX
20.00 NOM
Ø 271x0.75NOM13121110987654321
A BCDEFGHJKLMNPRTUVWYAA
22.00±0.10
16.00±0.10
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FiGure 5 - mechaNical drawiNG
PackaGe OutliNe dimeNSiONS
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NOTES:
1.VDDandVDDQmustbewithin300mVofeachotheratalltimesandVREFmustnotbegreaterthan0.6xVDDQ.WhenVDD and VDDQarelessthan500MV,VREFmaybe≤300mV.
2.Maxoperatingambienttemperature.TAismeasuredinthecenterofthepackage.
3.DeviceFunctionalityisnotguaranteediftheDRAMdeviceexceedstheMaximumTAduringoperation.
NOTES:
1.VDD=+1.5V±0.075mV,VDDQ=VDD,VREF=Vss,f=100MHz,TA=25°C,VOUT(DC)=0.5xVDDQ,VOUT (peaktopeak)=0.1V
2.DMinputisgroupedwithI/Opins,reflectingthesignalisgroupedwithDQandthereforematchedinloading.
3.ExcludesCK,CK\
Capacitance Parameter Symbol MIN MAX MIN MAX MIN MAX MIN MAX UNITS NOTES
CKandCK\
Single-endI/O:DQ,DM
DifferentialI/O:DQS,DQS\
Inputs(RAS\,CAS\,WE\,CS\,CKE,RESET\,ADDR,/BA0-2)
table 4: iNput/Output capacitaNce
CCK
CI0
CI0
CI_Shared
0.8
1.5
1.5
3.0
1.6
3.0
3.0
5.6
1.6
3.0
3.0
5.6
0.8
1.5
1.5
3.0
1.6
2.5
2.5
5.6
pF
pF
pF
pF
2
0.8
1.5
1.5
3.0
Symbol Parameter MIN MAX UNITS NOTES VDD
VDDQ
VIN,VOUT
TAIndustrial
TAExtended
TAMiltemp
TSTG
V
V
V
°C
°C
°C
°C
1
1
1
2,3
2,3
3
2,3
table 3: abSOlute maximum ratiNGS
1.975
1.975
1.975
85
105
125
120
-0.4
-0.4
-0.4
-40
-40
-55
-55
VDDSupplyVoltagerelativetoVss
VDDSupplyVoltagerelativetoVssQ
VoltageonanypinrelativetoVss
OperatingAmbientTemperature
OperatingAmbientTemperature
OperatingCaseTemperature
StorageTemperature
0.8
1.5
1.5
3.0
1.6
2.5
2.5
5.6
DDR3-800 DDR3-1066 DDR3-1333 DDR3-1600
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tCK(MIN)IDD
CLIDD
tRCD(MIN)IDD
tRC(MIN)IDD
tRAS(MIN)IDD
tRP(MIN)IDD
tFAW
tRRD IDD
tRFC
IDD Parameter 7-7-7 8-8-8 10-10-10 11-11-11
table 5: timiNG parameterS FOr idd meaSuremeNtS - clOck uNitS
ns
CK
CK
CK
CK
CK
CK
CK
CK
1.5
10
10
34
24
10
30
5
74
1.875
8
8
28
20
8
27
6
59
DDR3-800
-25
DDR3-1066
-19
DDR3-1333
-15
x64
x64
64Mx16(4X)
2.5
7
21
15
6
20
4
44
DDR3-1600
-12
1.25
11
11
39
28
11
32
6
90
CK, CK\
CKE
Sub-Loop
CS\
RAS\
CAS\
WE\
ODT
BA [2:0]
A [15:11]
A [10]
A [9:7]
A [6:3]
A [2:0]0
01
10
00
00
00
10
00
00
00
00
01
00
00
00
00
00
11
11
00
00
00
01
11
10
00
00
00
00
10
00
00
00
0
00
11
00
00
0F
01
00
00
00
00
F0
10
00
00
00
0F
01
11
10
00
00
F0
11
11
00
00
0F
0
00
10
00
00
0F
0
1 2 3 4 5 6 7R
epea
t sub
-loop
0, u
se B
A [2
:0] =
6R
epea
t sub
-loop
0, u
se B
A [2
:0] =
7
-- - - - - - -
Rep
eat c
ycle
s n
RC
+1
thro
ugh n
RC
+4
until
2 x
RC
- 1,
trun
cate
if n
eede
dR
epea
t sub
-loop
0, u
se B
A [2
:0] =
1R
epea
t sub
-loop
0, u
se B
A [2
:0] =
2R
epea
t sub
-loop
0, u
se B
A [2
:0] =
3R
epea
t sub
-loop
0, u
se B
A [2
:0] =
4R
epea
t sub
-loop
0, u
se B
A [2
:0] =
5
D\
D\
PR
E
Rep
eat c
ycle
s 1
thro
ugh
4 un
til n
RA
S -
1, tr
unca
te if
nee
ded
Rep
eat c
ycle
s 1
thro
ugh
4 un
til n
RC
- 1,
trun
cate
if n
eede
d
Rep
eat c
ycle
s n
RC
+1
thro
ugh n
RC
+4
until
nR
C -
1 + n
RA
S -
1, tr
unca
te if
nee
ded
- - - -
D\
D\
PR
E
AC
TD D
4 x n
RC
6 x n
RC
8 x n
RC
10 x
nR
C12
x n
RC
14 x
nR
C
nR
C +
3n
RC
+ 4
-n
RC
+ n
RA
S-
2 x
nRC
-n
RA
S-
nR
Cn
RC
+ 1
nR
C +
2
Cycle Number
Command
0
Data
1 2
AC
TD D
3 4
0
Static HIGH
Toggling
Not
es: 1
. Onl
y se
lect
ed b
ank
activ
e
2. D
Q, D
QS,
DQ
S# a
re a
t VD
D/2
3.
DM
is lo
w
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table 6: idd0 meaSuremeNt lOOp
CK, CK\
CKE
Sub-Loop
CS\
RAS\
CAS\
WE\
ODT
BA [2:0]
A [15:11]
A [10]
A [9:7]
A [6:3]
A [2:0]
00
11
00
00
00
01
00
00
00
00
00
10
00
00
00
00
01
11
10
00
00
00
11
11
00
00
00
0
01
01
00
00
00
0
00
10
00
00
00
0
00
11
00
00
0F
01
00
00
00
00
F0
10
00
00
00
0F
01
11
10
00
00
F0
11
11
00
00
0F
0
01
01
00
00
0F
0
00
10
00
00
0F
0
1 2 3 4 5 6 7
Cycle Number
Command
Data
0 1 2
AC
TD D
-
3 4 -n
RC
D-
nR
AS
-n
RC
n
RC
+1
nRC
+2
nR
C +
3n
RC
+4
-n
RC
+ n
RC
D-
nR
C +
nR
AS
2 x n
RC
2 x n
RC
2 x n
RC
2 x n
RC
2 x n
RC
2 x n
RC
2 x n
RC
D\
D\
RD
PR
E
AC
TD D D\
D\
RD
PR
E
Rep
eat s
ub-lo
op 0
, use
BA
[2:0
] = 1
-
0011
0011
-
Rep
eat s
ub-lo
op 0
, use
BA
[2:0
] = 2
R
epea
t sub
-loop
0, u
se B
A [2
:0] =
3
Rep
eat s
ub-lo
op 0
, use
BA
[2:0
] = 4
R
epea
t sub
-loop
0, u
se B
A [2
:0] =
5
Rep
eat s
ub-lo
op 0
, use
BA
[2:0
] = 6
R
epea
t sub
-loop
0, u
se B
A [2
:0] =
7
Rep
eat c
ycle
s 1
thro
ugh
4 un
til n
RC
D -
1, tr
unca
te if
nee
ded
Rep
eat c
ycle
s 1
thro
ugh
4 un
til n
RA
S -
1, tr
unca
te if
nee
ded
Rep
eat c
ycle
s 1
thro
ugh
4 un
til n
RC
- 1,
trun
cate
if n
eede
d
Rep
eat c
ycle
s nR
C +
1 th
roug
h nR
C +
4 u
ntil
nRC
+ n
RC
D -
1, tr
unca
te if
nee
ded
Rep
eat c
ycle
s nR
C +
1 th
roug
h nR
C +
4 u
ntil
nRC
+ n
RA
S -
1, tr
unca
te if
nee
ded
- - - -- - - -
0000
0000
-
Toggling
Static HIGH
0
Rep
eat c
ycle
nR
C +
1 th
roug
h nR
C +
4 u
ntil
2 x
nRC
- 1,
trun
cate
if n
eede
d
Not
es: 1
. DM
is lo
w
2. O
nly
sele
cted
ban
k is
act
ive
3.
DQ
, DQ
S, D
QS#
are
at V
DD
/2 u
nles
s dr
ived
by
Read
com
man
d
4. B
urst
seq
uenc
e is
driv
en o
n ea
ch D
Q s
igna
l by
Read
com
man
d
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table 7: idd1 meaSuremeNt lOOp
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table 8: idd meaSuremeNt cONditiONS FOr pOwer-dOwN curreNtS
Name
TimingPattern
CKE
ExternalClock
tCK
tRC
tRAS
tRCD
tRRD
tRC
CL
AL
CS\
CommandInputs
ROW/COLUMNAddr
BankAddress
DM
DataI/O
OutputBufferDQ,DQS
ODT
BurstLength
ACTIVEBank(s)
IDLEBank(s)
SpecialNotes
n/a
LOW
Toggling
tCK(MIN)IDD
n\a
n\a
n\a
n\a
n\a
n\a
n\a
HIGH
LOW
LOW
LOW
LOW
Mid-level
Enabled
Enabled,OFF
8
None
All
n\a
n/a
LOW
Toggling
tCK(MIN)IDD
n\a
n\a
n\a
n\a
n\a
n\a
n\a
HIGH
LOW
LOW
LOW
LOW
Mid-level
Enabled
Enabled,OFF
8
None
All
n\a
n/a
HIGH
Toggling
tCK(MIN)IDD
n\a
n\a
n\a
n\a
n\a
n\a
n\a
HIGH
LOW
LOW
LOW
LOW
Mid-level
Enabled
Enabled,OFF
8
None
All
n\a
n/a
LOW
Toggling
tCK(MIN)IDD
n\a
n\a
n\a
n\a
n\a
n\a
n\a
HIGH
LOW
LOW
LOW
LOW
Mid-level
Enabled
Enabled,OFF
8
None
All
n\a
IDD2P0
Precharge Power-
Down Current
(Slow Exit)
IDD2P1
Precharge Power-
Down Current
(Fast Exit)
IDD2Q
Precharge Quiet
Standby Current
IDD3P
Active Power-
Down Current
NOTES:
1.“Enabled,off”=MRbitsenablesbysingalislow
2.MR[12]=1:Fastexit
3.MR[12]=0:Slowexit
CK, CK\
CKE
Sub-Loop
CS\
RAS\
CAS\
WE\
ODT
BA [2:0]
A [15:11]
A [10]
A [9:7]
A [6:3]
A [2:0]
10
00
00
00
00
01
00
00
00
00
00
11
11
00
00
0F
01
11
10
00
00
F0
1 2 3 4 5 6 7
Cycle Number
Command
Data
010
D D2
D\
3D
\
Rep
eat s
ub-lo
op 0
, use
BA
[2:0
] = 7
- - - -4-
78-
11R
epea
t sub
-loop
0, u
se B
A [2
:0] =
1R
epea
t sub
-loop
0, u
se B
A [2
:0] =
2R
epea
t sub
-loop
0, u
se B
A [2
:0] =
3R
epea
t sub
-loop
0, u
se B
A [2
:0] =
4R
epea
t sub
-loop
0, u
se B
A [2
:0] =
5R
epea
t sub
-loop
0, u
se B
A [2
:0] =
6
Static HIGH
Toggling
12-1
516
-19
20-2
324
-27
28-3
1
Not
es: 1
. All
bank
s cl
osed
dur
ing
IDD
2N
2.
All
bank
s op
en d
urin
g ID
D3N
3.
DM
is lo
w
4. D
Q, D
QS,
DQ
S# a
t mid
leve
l
STACKED Technologies Incorporated www.stackedtechnologies.com21
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table 9: idd2N / idd3N meaSuremeNt lOOp
CK, CK\
CKE
Sub-Loop
CS\
RAS\
CAS\
WE\
ODT
BA [2:0]
A [15:11]
A [10]
A [9:7]
A [6:3]
A [2:0]1
00
00
00
00
00
10
00
00
00
00
01
11
10
00
00
F0
11
11
00
00
0F
01 2 3 4 5 6 7
Cycle Number
Command
Data
Toggling
Static HIGH
0
0 3
12-1
5
28-3
1
D-
1D
-2
D\
-D
\-
4-7
Rep
eat s
ub-lo
op 0
, use
BA
[2:0
] = 1
; OD
T =
08-
11R
epea
t sub
-loop
0, u
se B
A [2
:0] =
2; O
DT
= 1
Rep
eat s
ub-lo
op 0
, use
BA
[2:0
] = 3
; OD
T =
116
-19
Rep
eat s
ub-lo
op 0
, use
BA
[2:0
] = 4
; OD
T =
020
-23
Rep
eat s
ub-lo
op 0
, use
BA
[2:0
] = 5
; OD
T =
024
-27
Rep
eat s
ub-lo
op 0
, use
BA
[2:0
] = 6
; OD
T =
1R
epea
t sub
-loop
0, u
se B
A [2
:0] =
7; O
DT
= 1
Not
es: 1
. All
bank
s op
en
2. D
M is
low
3.
DQ
, DQ
S, D
QS#
at m
id le
vel w
hen
not d
riven
4.
Bur
st d
riven
on
each
DQ
by
Read
Com
man
d
STACKED Technologies Incorporated www.stackedtechnologies.com22
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
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table 10: idd2Nt meaSuremeNt lOOp
CK, CK\
CKE
Sub-Loop
CS\
RAS\
CAS\
WE\
ODT
BA [2:0]
A [15:11]
A [10]
A [9:7]
A [6:3]
A [2:0]
01
01
00
00
00
01
00
00
00
00
00
11
11
00
00
00
01
11
10
00
00
00
01
01
00
00
0F
01
00
00
00
00
F0
11
11
00
00
0F
01
11
10
00
00
F0
1 2 3 4 5 6 7
Data
0
Static HIGH
Toggling
56-6
3
0 1 2 5 8-15Cycle
Number
Command RD D D\
D\
RD
3 4-
D D\
D\
6 7
32-3
9
16-2
324
-31
40-4
748
-55
0000
0000
- - -00
1100
11
Rep
eat s
ub-lo
op 0
, use
BA
[2:0
] = 7
- -R
epea
t sub
-loop
0, u
se B
A [2
:0] =
1R
epea
t sub
-loop
0, u
se B
A [2
:0] =
2R
epea
t sub
-loop
0, u
se B
A [2
:0] =
3R
epea
t sub
-loop
0, u
se B
A [2
:0] =
4R
epea
t sub
-loop
0, u
se B
A [2
:0] =
5R
epea
t sub
-loop
0, u
se B
A [2
:0] =
6
Not
es: 1
. All
bank
s op
en
2. D
M is
low
3.
DQ
, DQ
S, D
QS#
at m
id le
vel w
hen
not d
riven
4.
Bur
st d
riven
on
each
DQ
by
Read
Com
man
d
STACKED Technologies Incorporated www.stackedtechnologies.com23
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
table 11: idd4r meaSuremeNt lOOp
CK, CK\
CKE
Sub-Loop
CS\
RAS\
CAS\
WE\
ODT
BA [2:0]
A [15:11]
A [10]
A [9:7]
A [6:3]
A [2:0]
01
00
10
00
00
01
00
01
00
00
00
11
11
10
00
00
01
11
11
00
00
00
01
00
10
00
0F
01
00
01
00
00
F0
11
11
10
00
0F
01
11
11
00
00
F0
1 2 3 4 5 6 7
Data
1D
-W
R
Toggling
Stac HIGH
0
0 3 62D\
-
0000
0000
Cycle Number
Command D\-
4W
R00
1100
115
D-
D\-
7D\
-8-
15Re
peat
sub-
loop
0, u
se B
A [2
:0] =
116
-23
Repe
at su
b-lo
op 0
, use
BA
[2:0
] = 2
24-3
1Re
peat
sub-
loop
0, u
se B
A [2
:0] =
332
-39
Repe
at su
b-lo
op 0
, use
BA
[2:0
] = 4
40-4
7Re
peat
sub-
loop
0, u
se B
A [2
:0] =
548
-55
Repe
at su
b-lo
op 0
, use
BA
[2:0
] = 6
56-6
3Re
peat
sub-
loop
0, u
se B
A [2
:0] =
7
Not
es: 1
. All
bank
s op
en
2. D
M is
low
3.
DQ
, DQ
S, D
QS#
at m
id le
vel w
hen
not d
riven
4.
Bur
st d
riven
on
each
DQ
by
Read
Com
man
d
STACKED Technologies Incorporated www.stackedtechnologies.com24
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
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STACKEDTECHNOLOGIES INC
table 12: idd4w meaSuremeNt lOOp
CK, CK\
CKE
Sub-Loop
CS\
RAS\
CAS\
WE\
ODT
BA [2:0]
A [15:11]
A [10]
A [9:7]
A [6:3]
A [2:0]0 1b 1c 1d 1e 1f 1g 1h 2
9-12
13-1
6Cycle Number
Command
Data
10
17-2
021
-24
25-2
829
-32
33-n
RFC
-1
Rep
eat s
ub-lo
op 1
a, u
se B
A [2
:0] =
1R
epea
t sub
-loop
1a,
use
BA
[2:0
] = 2
1a2 3 4 5-8
Static HIGH
Toggling
RE
FD D D\
D\
Rep
eat s
ub-lo
op 1
a, u
se B
A [2
:0] =
4R
epea
t sub
-loop
1a,
use
BA
[2:0
] = 5
Rep
eat s
ub-lo
op 1
a, u
se B
A [2
:0] =
6
Rep
eat s
ub-lo
op 1
a, u
se B
A [2
:0] =
3
Rep
eat s
ub-lo
op 1
a, u
se B
A [2
:0] =
7R
epea
t sub
-loop
1a
thro
ugh
1h u
ntil nR
FC -
1, tr
unca
te if
nee
ded
Not
es: 1
. DM
is lo
w
2. D
Q, D
QS,
DQ
S# a
t mid
leve
l
STACKED Technologies Incorporated www.stackedtechnologies.com25
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
table 13: idd5b meaSuremeNt lOOp
PackaGe OutliNe dimeNSiONS
STACKED Technologies Incorporated www.stackedtechnologies.com26
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
table 14: idd meaSuremeNt lOOp
IDD Test IDD8: ResetIDD6E/M: Self Refresh
CurrentIDD6: Self Refresh
Current
ExtendedorMilTemperatureRange,TA=-40°Cto85°Cor-55°Cto125°C
IndustrialRangeTA=-40°Cto85°C
CKE
ExternalClock
tCK
tRC
tRAS
tRCD
tRRD
tRC
CL
AL
CS\
CommandInputs
ROW/COLMUNaddresses
BANKaddresses
DataI/O
OutputbufferDQ,DQS
ODT
BurstLength
ActiveBANKS
IDLEBANKS
SRT
ASR
LOW
Off,CKandCK\=LOW
n\a
n\a
n\a
n\a
n\a
n\a
n\a
n\a
Mid-level
Mid-level
Mid-level
Mid-level
Mid-level
Enabled
Enabled,Mid-level
n\a
n\a
n\a
Disabled(normal)
Disabled
LOW
Off,CKandCK\=LOW
n\a
n\a
n\a
n\a
n\a
n\a
n\a
n\a
Mid-level
Mid-level
Mid-level
Mid-level
Mid-level
Enabled
Enabled,Mid-level
n\a
n\a
n\a
Enabled(extended)
Disabled
Mid-level
Mid-level
n\a
n\a
n\a
n\a
n\a
n\a
n\a
n\a
Mid-level
Mid-level
Mid-level
Mid-level
Mid-level
Mid-level
Mid-level
n\a
None
All
n\a
n\a
1. Power must be stable and RESET low for at least 1ms at first power-on2. RESET mus be low for at least 200ns +trfc on “warm” RESET 3. “Enabled, mid-level” = MR command enabled, signal; at mid level
CK, CK\
CKE
Sub-Loop
CS\
RAS\
CAS\
WE\
ODT
BA [2:0]
A [15:11]
A [10]
A [9:7]
A [6:3]
A [2:0]
00
11
00
00
00
00
10
10
00
10
00
10
00
00
00
00
0
00
11
01
00
0F
00
10
10
10
10
F0
10
00
01
00
0F
0
2 31
00
00
30
00
F0
5 6 7 81
00
00
70
00
F0
00
11
00
00
0F
00
10
10
00
10
F0
10
00
00
00
0F
0
00
11
01
00
00
00
10
10
10
10
00
10
00
01
00
00
0
12 131
00
00
30
00
00
15 16 17 181
00
00
70
00
00
Cycle Number
Command
Data
10 2
-00
0000
00-
3n
RR
Dn
RR
D +
1n
RR
D +
2n
RR
D +
32
x n
RR
D3x
nR
RD
4 x n
RR
D4
x n
RR
D +
1n
FAW
nFA
W +
nR
RD
nFA
W +
2xn
RR
Dn
FAW
+ 3
xnR
RD
nFA
W +
4xn
RR
Dn
FAW
+ 4
xnR
RD
+12
x n
FAW
2
x n
FAW
+ 1
2 x n
FAW
+ 2
3 x
nFA
W +
nR
RD
3 x
nFA
W +
2x
nRR
D
2 x n
FAW
+ 3
2 x n
FAW
+ n
RR
D2
x n
FAW
+ n
RR
D+1
2 x n
FAW
+ n
RR
D+2
2 x n
FAW
+ n
RR
D+3
2 x
nFA
W +
2x n
RR
D
1 4 9 10 11 14
Static HIGH
Toggling
AC
TR
DA
D AC
T
3 x
nFA
W +
3x
nRR
D3
x nF
AW
+ 4
x nR
RD
3 x
nFA
W +
4x
nRR
D +
1
0
D AC
TR
DA
-R
epea
t cyc
le 2
x n
FAW
+ 2
unt
il 2
x n
FAW
+ n
RR
D -
1
19
2 x n
FAW
+ 3
x n
RR
D2
x n
FAW
+ 4
x n
RR
D2
x n
FAW
+4x n
RR
D+1
3 x
nFA
W
Rep
eat s
ub-lo
op 1
1, u
se B
A[2
:0] =
3
- - -
Rep
eat s
ub-lo
op 1
, use
BA
[2:0
] = 5
Rep
eat s
ub-lo
op 0
, use
BA
[2:0
] = 6
Rep
eat s
ub-lo
op 1
, use
BA
[2:0
] = 7
Rep
eat c
ycle
nFA
W +
4 x
nR
RD
unt
il 2
x n
FAW
- 1,
if n
eede
d
RD
A
D-
D
Rep
eat c
ycle
2 u
ntil n
RR
D -
1
Rep
eat c
ycle
nR
RD
+ 2
unt
il 2
x n
RR
D -
1R
epea
t sub
-loop
0, u
se B
A[2
:0] =
2R
epea
t sub
-loop
0, u
se B
A[2
:0] =
3
Rep
eat c
ycle
4 x
nR
RD
unt
il n
FAW
- 1,
if n
eede
d
0011
0011
Rep
eat s
ub-lo
op 1
0, u
se B
A[2
:0] =
2
- -
RD
AD
-
0011
0011
Rep
eat s
ub-lo
op 0
, use
BA
[2:0
] = 4
D AC
T
D
Rep
eat c
ycle
2 x
nFA
W +
nR
RD
+ 2
unt
il 2
x n
FAW
+ 2
x n
RR
D -
1
0000
0000
-
Rep
eat c
ycle
3 x
nFA
W +
4 x
nR
RD
unt
il 4
x n
FAW
- 1,
if n
eede
d
Rep
eat c
ycle
2 x
nFA
W +
4 x
nR
RD
unt
il 3
x n
FAW
- 1,
if n
eede
dR
epea
t sub
-loop
10,
use
BA
[2:0
] = 4
Rep
eat s
ub-lo
op 1
1, u
se B
A[2
:0] =
5R
epea
t sub
-loop
10,
use
BA
[2:0
] = 6
Rep
eat s
ub-lo
op 1
1, u
se B
A[2
:0] =
7D
Not
es: 1
. AL=
AC-1
2.
DM
= L
ow
3. D
M, D
QS,
DQ
S# a
t mid
leve
l unl
ess
driv
en b
y RE
AD
Com
man
d
4. B
urst
seq
uenc
e dr
iver
on
each
DQ
by
Read
Com
man
d
STACKED Technologies Incorporated www.stackedtechnologies.com27
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
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table 15: idd7 meaSuremeNt lOOp
STACKED Technologies Incorporated www.stackedtechnologies.com28
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
NOTES:TA=0°Cto≤ 85°C;SRTandASRaredisabled,enablingASRcouldincreaseIDDxbyuptoanadditional2mA.
IDD DDR3-800 DDR3-1066 DDR3-1333 DDR3-1600 UNITS
IDD0
IDD1
IDD2P0
IDD2P1
IDD2Q
IDD2N
IDD3P
IDD3N
IDD4R
IDD4W
IDD5B
IDD6
IDD7
IDD8
Speed Bin
360
440
36
120
184
200
120
200
960
960
800
24
1400
IDD2P+2mA
IDD2P+2.1mA
IDD2P+2.4mA
400
520
36
140
212
220
140
220
1040
1160
880
24
1520
IDD2P+2mA
IDD2P+2.1mA
IDD2P+2.1mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
table 16: idd maximum limitS
440
600
36
160
240
260
160
240
1200
1420
960
24
1680
IDD2P+2mA
IDD2P+2mA
IDD2P+2mA
IND
EXT
MIL-TEMP
480
680
36
180
268
280
180
260
1400
1720
1040
24
18400
IDD2P+2mA
IDD2P+2mA
IDD2P+2mA
PackaGe OutliNe dimeNSiONS
PackaGe OutliNe dimeNSiONS
STACKED Technologies Incorporated www.stackedtechnologies.com29
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
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NOTES:
1. VDDandVDDQmusttrackoneanother,VDDQmustbelessthanorequal
toVDD,Vss=VssQ.
2. VDDandVDDQmayincludeACnoiseof±50mV(250kHzto20MHz)in
additiontotheDC(0Hzto250kHz)specifications,VDDandVDDQmust
beatthesamelevelforvalidACtimingparameters.
3. VREF(seeTable19).
4. Theminimum limit requirement is for testingpurposes. The leakage
currentontheVREFpinshouldbeminimal.
NOTES:
1. VREFCA(DC)isexpectedtobeapproximately0.5xVDDandtotrackvari-
ationsintheDClevel.Externallygeneratedpeaknoise(noncommon
mode)onVREFCAmaynotexceed±1%xVDDaroundtheVREFCA(DC)
value.Peak-to-peakACnoiseonVREFCAshouldnotexceed±2%of
VREFCA(DC).
2. DCvaluesaredeterminedtobelessthan20MHzinfrequency.DRAM
must meet specifications if the DRAM induces additional AC noise
greaterthan20MHzinfrequency.
3. VREFDQ(DC) is expected to be approximately 0.5 xVDD and to track
variationsintheDClevel.Externallygeneratedpeaknoise(noncom-
mon mode) on VREFDQ may not exceed ± 1% x VDD around the
VREFDQ(DC)value.Peak-to-peakACnoiseonVREFDQshouldnot
exceed±2%ofVREFDQ(DC).
4. VREFDQ(DC)may transition toVREFDQ(SR)andback toVREFDQ(DC)
when in SELF zREFRESH, within restrictions outlined in the SELF
REFRESHsection.
5. VTT isnotapplieddirectly to thedevice. VTT isasystemsupply for
signalterminationresistors.MINandMAXvaluesaresystem-depen-
dent.
Parameter/Condition Symbol MIN TYP MAX Supply Voltage
I/O Supply Voltage
Input Leakage Current:
Anyinput0V≤VIN≤VDD,VREFpin0V≤VIN≤1.1V
Allotherpinsnotundertest=0V
VREF Supply Leakage Current:
VREFDQ=VDD/2orVREFCA=VDD/2
Allotherpinsnotundertest=0V
V
V
µA
µA
1,2
1,2
3,4
table 17: dc electrical characteriSticS aNd OperatiNG cONditiONS
1.575
1.575
8
4
1.5
1.5
-
-
1.425
1.425
-8
-4
AllVoltagesarereferencedtoVss
VDD
VDDQ
II
IVREF
Parameter/Condition Symbol MIN TYP MAX VIN low; DC/commands/address busses
VIN high; DC/commands/address busses
Input reference voltage command/address bus
I/O reference voltage DQ bus
I/O reference voltage DQ bus in SELF REFRESH
Command/address termination voltage (systemlevel,not
directDRAMinput)
V
V
V
V
V
V
1,2
2,3
4
5
table 18: dc electrical characteriSticS aNd iNput cONditiONS
SeeTable17
VDD
0.51xVDD
0.51xVDD
VDD
-
n/a
n/a
0.5xVDD
0.5xVDD
0.5xVDD
0.5xVDDQ
Vss
SeeTable17
0.49xVDD
0.49xVDD
Vss
-
AllVoltagesarereferencedtoVss
VIL
VIH
VREFCA(DC)
VREFDQ(DC)
VREFDQ(SR)
VTT
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Input high AC voltage: Logic 1
Input high AC voltage: Logic 1
Input high DC voltage: Logic 1
Input high DC voltage: Logic 0
Input high AC voltage: Logic 0
Input high AC voltage: Logic 0
Input high AC voltage: Logic 1
Input high AC voltage: Logic 1
Input high DC voltage: Logic 1
Input high DC voltage: Logic 0
Input high AC voltage: Logic 0
Input high AC voltage: Logic 0
+175
+150
+100
-100
-150
-175
-
+150
+100
-100
-150
-
+175
+150
+100
-100
-150
-175
+175
+150
+100
-100
-150
-175
VIH(AC175)MIN
VIH(AC150)MIN
VIH(DC100)MIN
VIL(DC100)MAX
VIL(AC150)MAX
VIL(AC175)MAX
VIH(AC175)MIN
VIH(AC150)MIN
VIH(DC100)MIN
VIL(DC100)MAX
VIL(AC150)MAX
VIL(AC175)MAX
NOTES:
1. AllvoltagesarereferencedtoVREF,VREF isVREFCAforcontrol,com-
mand,andaddress.Allslewratesandsetup/holdtimesarespecifiedat
theDRAMball.VREFisVREFDQforDQandDMinputs.
2. Inputsetuptimingparameters(tIS and tDS)arereferencedatVIL(AC)/
VIH(AC),notVREF(DC).
3. Inputholdtimingparameters(tIH and tDH)arereferencedatVIL(DC)/
VIH(DC),notVREF(AC).
4. Single-ended input slew rate = 1V/ns;maximum input voltage swing
undertestis900mV(peak-to-peak).
Parameter/Condition Symbol DDR3-800
CommandandAddress
table 19: iNput SwitchiNG cONditiONS
DQ and DM
DDR3-1066 DDR3-1333
mV
mV
mV
mV
mV
mV
mV
mV
mV
mV
mV
mV
Notes: 1. Numbers in diagrams reflect nominal values.
Minimum VIL and VIH levels
0.925V
0.850V
0.780V0.765V0.750V0.735V0.720V
0.650V
0.575V
VIH (AC)
VIH (DC)
VIL (DC)
VIL (AC)
VIL and VIH levels with ringback
1.90V
1.50V
0.925V
0.850V
0.780V0.765V0.750V0.735V0.720V
0.650V
0.575V
0.0V
-0.40V
VDDQ + 0.4V narrow pulse width
VDDQ
VIH (AC)
VIH (DC)
VREF + AC noiseVREF + DC errorVREF + DC errorVREF + AC noise
VIL (DQ)
VIL (AC)
VSS
VSS 0.4V narrow pulse width
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OPERATING CONDITIONS
FiGure 6 - iNput SiGNalS
FiGure 7 & 8: OVerShOOt/uNderShOOt SpeciFicatiONS
Maximum amplitude Overshoot area
VDD/VDDQ
Time (ns)
Volts (V)
Maximum amplitudeUndershoot area
Time (ns)VSS/VSSQ
Volts (V)
Figure 7: Overshoot
Figure 8: Undershoot
AC OVERSHOOT/UNDERSHOOT SPECIFICATION
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PackaGe OutliNe dimeNSiONS
PackaGe OutliNe dimeNSiONS
Parameter DDR3-800 DDR3-1066 DDR3-1333 Maximum peak amplitude allowed for overshoot area
(seeFigure7)
Maximum peak amplitude allowed for underrshoot area
(seeFigure8)
Maximum overshoot area above VDD (seeFigure7)
Maximum undershoot area below Vss (seeFigure8)
table 20: cONtrOl aNd addreSS piNS
0.4V
0.4V
0.4Vns
0.4Vns
0.4V
0.4V
0.67Vns
0.67Vns
0.4V
0.4V
0.5Vns
0.5Vns
Parameter DDR3-800 DDR3-1066 DDR3-1333 DDR3-Maximum peak amplitude allowed for overshoot area
(seeFigure7)
Maximum peak amplitude allowed for undershoot area
(seeFigure8)
Maximum overshoot area above VDD/ VDDQ
(seeFigure7)
Maximum undershoot area below Vss/ VssQ
(seeFigure8)
table 21: clOck, data, StrObe, aNd maSk piNS
0.4V
0.4V
0.15Vns
0.15Vns
0.4V
0.4V
0.25Vns
0.25Vns
0.4V
0.4V
0.19Vns
0.19Vns
0.4V
0.4V
0.3Vns
0.3Vns
0.4V
0.4V
0.15Vns
0.15Vns
PackaGe OutliNe dimeNSiONS
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Parameter/Condition Symbol MIN MAX Differential input voltage, logic high - slew
Differential input voltage, logic low - slew
Differential input voltage, logic high
Differential input voltage, logic low
Differential input crossing voltage relative to VDD/2
for DQS, DQS\, CK, CK\
Differential input crossing voltage relative to VDD/2
for CK, CK\
Single-ended high level for strobes
Single-ended high level for CK, CK\
Single-ended low level for strobes
Single-ended low level for CK, CK\
mV
mV
mV
mV
mV
mV
mV
mV
4
4
5
6
7
7,8
5
6
table 22: diFFereNtial iNput OperatiNG cONditiONS (ckx, ckx\, dQSx, aNd dQSx\)
n/a
-200
VDD/VDDQ
2x(VREF-VIL(AC))
VREF(DC)+150
VREF(DC)+175
VDDQ
VDD
VDDQ/2-VIL(AC)
VDD/2-VIL(AC)
+200
n/a
2x(VIH(AC)-VREF)
Vss/VssQ
VREF(DC)-150
VREF(DC)-175
VDDQ/2+VIH(AC)
VDD/2+VIH(AC
VssQ
Vss
VIH DIFF(AC)slew
VILDIFF(AC)slew
VIH DIFF(AC)
VILDIFF(AC)
VIX
VIX(175)
VSHE
VSEL
NOTES:
1. Clock is referenced toVDDD andVss. Data strobe is referenced to
VDDQandVssQ.
2. ReferenceisVREFCA(DC)forclockandforVREFDQ(DC)forstrobe.
3. Differentialinputslewrate=2V/ms.
4. Definesslewratereferencepointsrelativetoinputcrossingvoltages.
5. MAX limit is relative tosingle-endedsignals, theovershootspecifica-
tionsareapplicable.
6. MINlimitisrelativetosingle-endedsignals,theundershootspecifica-
tionsareapplicable.
7. ThetypicalvalueofVIX(AC)isexpectedtobeabout0.5xVDDofthe
transmittingdeviceandVIX(AC)isexpectedtotrackvariationsinVDD.
VIX(AC) indicates the voltageatwhichdifferential input signalsmust
cross.
8. TheVIXextendedrange(±175mV)isallowedonlyfortheclockandthis
VIXextendedrangeisonlyallowedwhenthefollowingconditionsare
met: Thesingle-ended inputsignalsaremonotonic,havethesingle-
endedswingVSEL,VSEHofatleastVDD/2±250mV,andthedifferential
slewrateofCK,CK\isgreaterthan3V/ns.
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OVERSHOOT/UNDERSHOOT SPECIFICATIONS
FiGure 9 - Vix FOr diFFereNtial SiGNalS
VIX
X
X
X
X
VDD, VDDQ VDD, VDDQ
CK#, DQS# CK#, DQS#
VIX
VIX
VIX
CK, DQS CK, DQS
VSS, VSSQ VSS, VSSQ
VDD/2, VDDQ/2 VDD/2, VDDQ/2
FiGure 10 - SiNGle-eNded reQuiremeNtS FOr diFFereNtial SiGNalS
VSS or VSS Q
VDD or VDD Q
VSEL (MAX)
VSEH (MIN)
VSEH
VSEL
VDD /2 or VDD Q/2
CK or DQS
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OVERSHOOT/UNDERSHOOT SPECIFICATIONS
FiGure 11 - deFiNitiON OF diFFereNtial ac-SwiNG aNd tdVac
V IHDIFF (A C) MIN
V IHDIFF (DC) MIN
0.0
V ILDIFF (DC) MAX
V ILDIFF (MAX)
tDVAC
V IHDIFF (MIN)
V ILDIFF (A C) MAX
half cycle tDVAC
CK - CK#DQ S - DQS #
PackaGe OutliNe dimeNSiONS
Slew Rate (V/ns) 350mV 300mV-4.0
4.0
3.0
2.0
1.9
1.6
1.4
1.2
1.0
<1.0
table 23: diFFereNtial iNput OperatiNG cONditiONS (tdVac) FOr ckx, ckx\, dQSx, aNd dQSx\
175
170
167
163
162
161
159
155
150
150
75
57
50
38
34
29
22
13
0
0
BelowVIL(AC)
tDVAC (ps) at [VIHDIFF(AC) to VILDiff(AC)]
PackaGe OutliNe dimeNSiONS
Input Edge From To Calculation
Setup
Hold
table 24: SiNGle-eNded iNput Slew rate
Input Slew Rate (Linear Signals)
Rising
Falling
Rising
Falling
Measured
VREF
VREF
VIL(DC)Max
VIH(DC)MIN
VIH(AC)MIN
VIL(AC)MAX
VREF
VREF
VIH(AC)MIN-VREF
∆TFS
VREF-VIL(AC)MAX
∆TFS
VREF-VIL(DC)MAX
∆TFH
VIH(DC)MIN-VREF
∆TRSH
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SLEW RATE DEFINITIONS FOR SINGLE-ENDED INPUT SIGNALS
Setup (tIS and tDS)nominalslew rate fora risingsignal isdefinedas theslew-ratebetween the lastcrossingofVREFand thefirstcrossingVIH(AC)MIN. Setup (tIS and tDS)nominal slew rate for a falling signal is definedas theslewratebetweenthe lastcrossingofVREFan thefirstcrossingofVIL(AC)MAX.
Hold(tIH and tDH)nominalslewrateforarisingsignalisdefinedastheslewratebetweenthelastcrossingofVIL(DC)MAXandthefirstcrossingofVREF. Hold(tIH and tDH)nominalslewrateforafallingsignalisdefinedastheslewratebetweenthelastcrossingofVIH(DC)MINandthefirstcrossingofVREF.
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SLEW RATE DEFINITIONS FOR SINGLE-ENDED INPUT SIGNALS
FiGure 12 - NOmiNal Slew rate deFiNitiON FOr SiNGle-eNded iNput SiGNalS
ΔTRS
ΔTFS
ΔTRH
ΔTFH
VREFDQ orVREFCA
VIH(AC) MIN
VIH(DC) MIN
VIL(AC) MAX
VIL(DC) MAX
VREFDQ or VREFCA
VIH(AC) MIN
VIH(DC) MIN
VIL(AC) MAX
VIL(DC) MAX
Setup
Hold
Sin
gle-
ende
d in
put v
olta
ge (D
Q,
CM
D,
AD
DR
)S
ingl
e-en
ded
inpu
t vol
tage
(DQ
, CM
D,
AD
DR
)
PackaGe OutliNe dimeNSiONS
Input Edge From To Calculation
CK and DQS
Reference
table 25: diFFereNtial iNput Slew rate deFiNitiON
Input Slew Rate (Linear Signals)
Rising
Falling
Measured
VREF
VREF
VIH(AC)MIN
VIL(AC)MAX
VIH(DIFF)MIN-VIL(DIFF)MAX
∆TR(DIFF)
VIH(DIFF)MIN- VIL(DIFF)MAX
∆TF(DIFF)
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SLEW RATE DEFINITIONS FOR DIFFERENTIAL INPUT SIGNALS
Inputslewratefordifferentialsignals(CKx,CKx\,UDQSx,UDQSx\,LDQSxandLDQSx\)aredefinedandmeasuredasshowninTable25.ThenominalslewrateforarisingsignalisdefinedastheslewratebetweenVIL(DIFF)MAXandVIH(DIFF)MIN.ThenominalslewrateforafallingsignalisdefinedastheslewratebetweenVIH(DIFF)MINandVIL(DIFF)MAX.
FiGure 13 - NOmiNal diFFereNtial iNput Slew rate deFiNitiON FOr dQS, dQS# aNd ck, ck#
ΔTRDIFF
ΔTFDIFF
VIH(DIFF) MIN
VIL(DIFF) MAX
0
Diff
eren
tial i
nput
vol
tage
(DQ
S, D
QS
#; C
K, C
K#)
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ODT CHARACTERISTICS
RTTPU
RTTPD
ODT
Chip in termination mode
VDDQ
DQ
VSSQ
IOUT = IPD - IPU
IPU
IPD
IOUT
VOUT
Toothercircuitrysuch as RCV, . . .
ODT’seffectiveresistanceRTTisdefinedbyMR1[9,6and2].ODTisappliedtotheDQx,andDQSx,DQSx\.TheODTtargetvaluesarelistedinTable29.
Parameter/Condition Symbol MIN TYP MAX RTTeffectiveimpedance
DeviationofVMwithrespecttoVDDQ/2 %
1,2,4
1,2,3,4
table 26: ON-die termiNatiON dc electrical characteriSticS
5
RTT_EFF
∆VM -5
SeeTable27
NOTES:
1. Tolerance limits are applicable after a proper ZQ calibration has been
performedatastabletemperatureandvoltage(VDDQ=VDD,VssQ-Vss).
Referto“ODTSensitivity”onpage36ifeitherthetemperatureorvoltage
changesaftercalibration.
2. MeasurementdefinitionforRTT: ApplyVIH(AC)toapinundertestand
measurethecurrentI[VIH(AC)],thenapplyVIL(AC)topinundertestand
measurecurrentI[VIL(AC)]:
VIL(AC)-VIL(AC)
I[VIH(AC))-I(VIL(AC))]
3. Measurevoltage(VM)atthetestedpinwithnoload:
4. Forextendedtemperaturedevices,theminimumvaluesarederatedby6%
whenthedeviceisbetween-40°Cand0°C(TA).
RTT =
2xVM
VDDQ∆VM= -1x100
FiGure 14 - Odt leVelS aNd i-V characteriSticS
PackaGe OutliNe dimeNSiONS
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MR1 [9,6,2]
0, 1, 0
0, 0, 1
0, 1, 1
1, 0, 1
1, 0, 0
table 27: rtt eFFectiVe impedaNceS
0.2xVDDQ
0.5xVDDQ
0.8xVDDQ
0.2xVDDQ
0.5xVDDQ
0.8xVDDQ
VIL(AC)toVIH(AC)
0.2xVDDQ
0.5xVDDQ
0.8xVDDQ
0.2xVDDQ
0.5xVDDQ
0.8xVDDQ
VIL(AC)toVIH(AC)
0.2xVDDQ
0.5xVDDQ
0.8xVDDQ
0.2xVDDQ
0.5xVDDQ
0.8xVDDQ
VIL(AC)toVIH(AC)
0.2xVDDQ
0.5xVDDQ
0.8xVDDQ
0.2xVDDQ
0.5xVDDQ
0.8xVDDQ
VIL(AC)toVIH(AC)
0.2xVDDQ
0.5xVDDQ
0.8xVDDQ
0.2xVDDQ
0.5xVDDQ
0.8xVDDQ
VIL(AC)toVIH(AC)
RTT Resistor VOUT MIN TYP MAX
120Ω
60Ω
40Ω
30Ω
20Ω
0.6
0.9
0.9
0.9
0.9
0.9
0.9
0.6
0.9
0.9
0.9
0.9
0.9
0.9
0.6
0.9
0.9
0.9
0.9
0.9
0.9
0.6
0.9
0.9
0.9
0.9
0.9
0.9
0.6
0.9
0.9
0.9
0.9
0.9
0.9
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.1
1.1
1.4
1.4
1.1
1.1
1.6
1.1
1.1
1.4
1.4
1.1
1.1
1.6
1.1
1.1
1.4
1.4
1.1
1.1
1.6
1.1
1.1
1.4
1.4
1.1
1.1
1.6
1.1
1.1
1.4
1.4
1.1
1.1
1.6
RZQ/1
RZQ/1
RZQ/1
RZQ/1
RZQ/1
RZQ/1
RZQ/2
RZQ/2
RZQ/2
RZQ/2
RZQ/2
RZQ/2
RZQ/2
RZQ/4
RZQ/3
RZQ/3
RZQ/3
RZQ/3
RZQ/3
RZQ/3
RZQ/6
RZQ/4
RZQ/4
RZQ/4
RZQ/4
RZQ/4
RZQ/4
RZQ/8
RZQ/6
RZQ/6
RZQ/6
RZQ/6
RZQ/6
RZQ/6
RZQ/12
RTT120PD240
RTT120PU240
RTT60PD120
RTT60PU240
RTT40PD80
RTT40PU80
RTT30PD60
RTT30PU60
RTT20PD40
RTT20PU40
120Ω
60Ω
40Ω
30Ω
20Ω
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ODT SENSITIVITY
IfeitherthetemperatureorvoltagechangesafterI/Ocalibration,thetolerancelimitslistedinTable26canbeexpectedtowidenaccordingtoTables28and29.
Symbol MIN MAX RTT RZQ/(2,4,6,8,12)
table 28: Odt SeNSitiVity deFiNitiON
1.6+dRTTdTx[DT]+dRTTdVx[DV]0.9-dRTTdTxdRTTdVx[DV]
table 29 - Odt temperature & VOltaGe SeNSitiVity
Change MIN MAX UNITS dRTTdT
dRTTdV
0
0
1.5
0.15
%/°C
%/°C
ODTloadingdiffersfromthatusedinACtimingmeasurements.Twoparam-etersdefinewhenODTturnsonoroffsynchronously,twodefinewhenODTturnsonoroffAsynchronouslyand,anotherdefineswhenODTturnsonoroffdynamically.Table30outlinesandprovidesdefinitionandmeasurementreferencesettingsforeachparameter.
ODT turn-on timebeginswhen theoutput leavesHIGH-ZandODTresis-tancebeginstoturnon.ODTturn-offtimebeginswhentheoutputleavesLOW-ZandODTresistancebeginstoturn-off.
ODT TIMING DEFINITIONS
Timing reference point
DQ, DMDQS, DQS#
DUT VREF
VTT = VSSQ
VDDQ/2
ZQRZQ = 240Ω
VSSQ
RTT = 25ΩCK, CK#
All RZQs are embedded in module
FiGure 15 - Odt timiNG reFereNce lOad
PDF: 09005aef826aa906/Source: 09005aef82a357c3 Micron Technology, Inc., reserves the right to change products or specifications without notice.DDR3_D3.fm - Rev G 2/09 EN 55 ©2006 Micron Technology, Inc. All rights reserved.
CK
CK#
tAON
VSSQ
DQ, DM
DQS, DQS#
Begin point: Rising edge of CK - CK#defined by the end point of ODTL on
VSW1
End point: Extrapolated point at VSSQ
TSW1
TSW2
CK
CK#
VDDQ/2
tAOF
End point: Extrapolated point at VRTT_NOM
VRTT_NOM
VSSQ
tAON tAOF
VSW2 VSW2
VSW1
TSW1
TSW1
Begin point: Rising edge of CK - CK#defined by the end point of ODTL off
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PackaGe OutliNe dimeNSiONS
Symbol Begin Point Definition End Point Definition
tAON
tAOF
tAONPD
tAOFPD
tADC
table 30: Odt timiNG deFiNitiONS
Figure25
Figure25
Figure26
Figure26
Figure27
ExtrapolatedpointatVssQ
ExtrapolatedpointatVRTT_NORM
ExtrapolatedpointatVssQ
ExtrapolatedpointatVRTT_NOM
ExtrapolatedpointsatVRTT_WRandVRTT_NOM
RisingedgeofCK-CK\definedbytheendpointofODTLon
RisingedgeofCK-CK\definedbytheendpointofODTLoff
RisingedgeofCK-CK\withODTfirstbeingregisteredHIGH
RisingedgeofCK-CK\withODTfirstbeingregisteredLOW
RisingedgeofCK-CK\definedbytheendpointofODTLCNW,
ODTLCWN4,orODTLCWN8
PackaGe OutliNe dimeNSiONS
Parameter RTT_NORM Setting RTT_WR_Setting VSW1
tAON
tAOF
tAONPD
tAOFPD
tADC
table 31: reFereNce SettiNGS FOr Odt timiNG meaSuremeNtS
100mV
200mV
100mV
200mV
100mV
200mV
100mV
200mV
300mV
50mV
100mV
50mV
100mV
50mV
100mV
50mV
100mV
200mV
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a
RZQ/2(120Ω)
RZQ/4(60Ω)
RZQ/12(20Ω)
RZQ/4(60Ω)
RZQ/12(20Ω)
RZQ/4(60Ω)
RZQ/12(20Ω)
RZQ/4(60Ω)
RZQ/12(20Ω)
RZQ/12(20Ω)
Measured
FiGure 16 - taON aNd taOF deFiNitiONS
ODT TIMING DEFINITIONS
CK
CK#
tAONPD
VSSQDQ, DMDQS, DQS#
Begin point: Rising edge of CK - CK#with ODT first registered HIGH
VSW1
End point: Extrapolated point at VSSQ
TSW2
CK
CK#
VDD Q/2
tAOFPD
End point: Extrapolated point at VRTT_NOM
VRTT_NOM
VSSQ
tAONPD tAOFPD
TSW1TSW2
TSW1VSW2 VSW2
VSW1
Begin point: Rising edge of CK - CK#with ODT first registered LOW
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ODT CHARACTERISTICS
FiGure 17 - taONpd aNd taOFpd deFiNitiON
FiGure 18 - tadc deFiNitiON
CK
CK#
tADC
DQ, DMDQS, DQS#
End point:Extrapolatedpoint at VRTT_NOM
TSW21
tADC
End point: Extrapolated point at VRTT_WR
VDDQ/2
VSSQ
VRTT_NOM
VRTT_WR
VRTT_NOM
TSW11
VSW1
VSW2
TSW12
TSW22
Begin point: Rising edge of CK - CK#defined by the end point of ODTLCNW
Begin point: Rising edge of CK - CK#defined by the end point of ODTLCNW4 or ODTLCNW8
RONPU
RONPD
Output driver
Toothercircuitrysuch asRCV, . . .
Chip in drive mode
VDDQ
VSSQ
IPU
IPD
IOUT
VOUT
DQ
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OUTPUT DRIVER IMPEDANCE
FiGure 19 - Output driVer 34 Ohm Output driVer impedaNce
The34Ωdriver(MR1[5,1]=01)isthedefaultdriver.Unlessotherwisestated,alltimingsandspecificationslistedhereinapplytothe34Ωdriveronly.ItsimpedanceRON is definedby the valueof the external reference resistorRZQasfollows:RON34=RZQ/7(withnominalRZQ=240Ω±1%)andisactu-ally34.3Ω±1%.The34ΩoutputdriverimpedancecharacteristicsarelistedinTable32.
PackaGe OutliNe dimeNSiONS
MR1[5,1] RON RESISTOR VOUT MIN TYP MAX UNITS
0, 1
table 32: 34Ω driVer impedaNce characteriSticS
RZQ/7
RZQ/7
RZQ/7
RZQ/7
RZQ/7
RZQ/7
%
1
1
1
1
1
1
1,2
0.2/VDDQ
0.5/VDDQ
0.8/VDDQ
0.2/VDDQ
0.5/VDDQ
0.8/VDDQ
0.5/VDDQ
34.3Ω
RON34PD
RON34PU
0.6
0.9
0.9
0.9
0.9
0.6
-10
1.0
1.0
1.0
1.0
1.0
1.0
n/a
1.1
1.1
1.4
1.4
1.1
1.1
10Pull-Up/Pull-Down mismatch (MMPUPD)
NOTES:
1. TolerancelimitsassumeRZQof240Ω(±1%)andareapplicableafterproperZQcalibrationhasbeenperformedatastabletemperatureandvoltage
(VDDQ=VDD,VssQ=Vss).Referto“34Ohmdrivesensitivity”ifeitherthetemperatureorthevoltagechangesaftercalibration
2. Measurementdefinitionformismatchbetweenpull-upandpull-down(MMPUPD).MearurebothRONPU and RONPDat0.5xVDDQ:
MMPUD =
RONNOM
RONPU-RONPD
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34 Ohm OUTPUT DRIVER IMPEDANCE
34 Ohm driVer
The34Ωdriver’scurrentrangehasbeencalculatedandsummarizedinTable34forVDD=1.5V,Table35forVDD=1.575VandTable36forVDD=1.425V.Theindividualpull-upandpull-downresistors(RON34PDandRON34PU)aredefinedasfollowswiththeImpedanceCalculationslistedinTable36.
•RON34PD=(VOUT)/[IOUT]:RON34PUisturnedoff
•RON34PU=(VDDQ-VOUT)/[IOUT]:RON34PDisturnedoff
PackaGe OutliNe dimeNSiONS
MR1[5,1] RON RESISTOR VOUT MIN TYP
0, 1
table 33: 34Ω driVer pull-up aNd pull-dOwN impedaNce calculatiONS
Ω
Ω
Ω
Ω
Ω
Ω
0.2/VDDQ
0.5/VDDQ
0.8/VDDQ
0.2/VDDQ
0.5/VDDQ
0.8/VDDQ
34.3Ω
RON34PD
RON34PU
2.04
30.5
30.5
30.5
30.5
20.4
34.3
34.3
34.3
34.3
34.3
34.3
38.1
38.1
48.5
48.5
38.1
38.1
242.4
34.6
240
34.3
237.6
33.9
Ω
Ω
RON MIN TYP RZQ = 240Ω±1%
RZQ = (240Ω±1%)/7
PackaGe OutliNe dimeNSiONS
MR1[5,1] RON RESISTOR VOUT MIN TYP
0, 1
mA
mA
mA
mA
mA
mA
34.3Ω
RON34PD
RON34PU
15.5
25.8
41.2
41.2
25.8
15.5
9.2
23
36.8
36.8
23
9.2
8.3
20.7
26
26
20.7
8.3
table 35: 34Ω driVer iOh/iOl characteriSticS: Vdd=VddQ=1.575V
PackaGe OutliNe dimeNSiONS
MR1[5,1] RON RESISTOR VOUT MIN TYP
0, 1
mA
mA
mA
mA
mA
mA
34.3Ω
RON34PD
RON34PU
14.7
24.6
39.3
39.3
24.6
14.7
8.8
21.9
35
35
21.9
8.8
7.9
19.7
24.8
24.8
19.7
7.9
table 34: 34Ω driVer iOh/iOl characteriSticS: Vdd = VddQ = 1.5V
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34 Ohm OUTPUT DRIVER IMPEDANCE
PackaGe OutliNe dimeNSiONS
MR1[5,1] RON RESISTOR VOUT MIN TYP
0, 1
mA
mA
mA
mA
mA
mA
34.3Ω
RON34PD
RON34PU
14
23.3
37.3
37.3
23.3
14
8.3
20.8
33.3
33.3
20.8
8.3
7.5
18.7
23.5
23.5
18.7
7.5
table 36: 34Ω driVer iOh/iOl characteriSticS: Vdd=VddQ=1.425V
34Ω OUTPUT DRIVER SENSITIVITY
IfeitherthetemperatureorvoltagechangesafterZQcalibration,thetolerancelimitslistedinTable32canbeexpectedtowidenaccordingtoTable37and38.
Symbol MIN MAX
RON(PD) @ 0.2 x
VDDQ
RON(PD) @ 0.5 x
VDDQ
RON(PD) @ 0.8 x
VDDQ
RZQ/7
RZQ/7
RZQ/7
RZQ/7
RZQ/7
RZQ/7
table 37: 34Ω Output driVer SeNSitiVity deFiNitiON
1.1+dRONdTLx[∆T]+dRONdVLx[∆V]
1.1+dRONdTMx[∆T]+dRONdVMx[∆V]
1.4+dRONdTHx[∆T]+dRONdVHx[∆V]
1.4+dRONdTLx[∆T]+dRONdVLx[∆V]
1.1+dRONdTMx[∆T]+dRONdVMx[∆V]
1.1+dRONdTHx[∆T]+dRONdVHx[∆V]
0.6-dRONdTLx[∆T]-dRONdVLx[∆V]
0.9-dRONdTMx[∆T]-dRONdVMx[∆V]
0.9-dRONdTHx[∆T]-dRONdVHx[∆V]
0.9-dRONdTLx[∆T]-dRONdVLx[∆V]
0.9-dRONdTMx[∆T]-dRONdVMx[∆V]
0.6-dRONdTHx[∆T]-dRONdVHx[∆V]
Change MIN MAX
dRONdTM
dRONdVM
dRONdTL
dRONdVL
dRONdTH
dRONdVH
%/°C
%/mV
%/°C
%/mV
%/°C
%/mV
table 38: 34Ω Output driVer VOltaGe aNd temperature SeNSitiVity
1.5
0.13
1.5
0.13
1.5
0.13
0
0
0
0
0
0
1. Note: ∆T=T-T(@calibration),∆V=VDDQ-VDDQ(@calibration),VDD=VDDQ
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ALTERNATIVE 40 OHM DRIVER
PackaGe OutliNe dimeNSiONS
MR1[5,1] RON RESISTOR VOUT MIN TYP MAX UNITS NOTES
0, 1
table 39 - 40Ω driVer impedaNce characteriSticS
RZQ/6
RZQ/6
RZQ/6
RZQ/6
RZQ/6
RZQ/6
%
1
1
1
1
1
1
1,2
0.2/VDDQ
0.5/VDDQ
0.8/VDDQ
0.2/VDDQ
0.5/VDDQ
0.8/VDDQ
0.5/VDDQ
40.0Ω
RON40PD
RON40PU
0.6
0.9
0.9
0.9
0.9
0.6
-10
1.0
1.0
1.0
1.0
1.0
1.0
n/a
1.1
1.1
1.4
1.4
1.1
1.1
10Pull-Up/Pull-Down mismatch (MMPUPD)
NOTES:
1. TolerancelimitsassumeRZQof240Ω(±1%)andareapplicableafterproperZQcalibrationhasbeenperformedatastabletemperatureandvoltage
(VDDQ=VDD,VssQ=Vss).Referto“40Ohmdrivesensitivity”ifeitherthetemperatureorthevoltagechangesaftercalibration
2. Measurementdefinitionformismatchbetweenpull-upandpull-down(MMPUPD).MearurebothRONPUandRONPDat0.5xVDDQ:
MMPUPD =
RONNOM
RONPU-RONPD x100
40Ω OUTPUT DRIVER SENSITIVITY
IfeitherthetemperatureorvoltagechangesafterI/Ocalibration,thetolerancelimitslistedinTable39canbeexpectedtowidenaccordingtoTable40and41.
table 40: 40Ω Output driVer SeNSitiVity deFiNitiON
Symbol MIN MAX
RON(PD) @ 0.2 x
VDDQ
RON(PD) @ 0.5 x
VDDQ
RON(PD) @ 0.8 x
VDDQ
RZQ/6
RZQ/6
RZQ/6
RZQ/6
RZQ/6
RZQ/6
1.1+dRONdTLx[∆T]+dRONdVLx[∆V]
1.1+dRONdTMx[∆T]+dRONdVMx[∆V]
1.4+dRONdTHx[∆T]+dRONdVHx[∆V]
1.4+dRONdTLx[∆T]+dRONdVLx[∆V]
1.1+dRONdTMx[∆T]+dRONdVMx[∆V]
1.1+dRONdTHx[∆T]+dRONdVHx[∆V]
0.6-dRONdTLx[∆T]-dRONdVLx[∆V]
0.9-dRONdTMx[∆T]-dRONdVMx[∆V]
0.9-dRONdTHx[∆T]-dRONdVHx[∆V]
0.9-dRONdTLx[∆T]-dRONdVLx[∆V]
0.9-dRONdTMx[∆T]-dRONdVMx[∆V]
0.6-dRONdTHx[∆T]-dRONdVHx[∆V]
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ALTERNATIVE 40 OHM DRIVER
Change MIN MAX dRONdTM
dRONdVM
dRONdTL
dRONdVL
dRONdTH
dRONdVH
%/°C
%/mV
%/°C
%/mV
%/°C
%/mV
table 41: 40Ω Output driVer VOltaGe aNd temperature SeNSitiVity
1.5
0.15
1.5
0.15
1.5
0.15
0
0
0
0
0
0
OUTPUT CHARACTERISTICS AND OPERATING CONDITIONS
TheSDRAMusesbothsingle-endedanddifferentialoutputdrivers.Thesingle-endedoutputdriver issummarizedinTable42whilethedifferentialoutputdriverissummarizedinTable43.
PackaGe OutliNe dimeNSiONS
Parameter/Condition Symbol MIN MAX
Output leakage current:DQaredisabled;
0V≤VOUT≤VDDQ;ODTisdisabled;ODTisHIGH
Output slew rate:Single-ended;forrisingandfalling
edges,measurebetweenVOL(AC)=VREF-0.1xVDDQ
andVOH(AC)=VREF+0.1xVDDQ
Single-ended DC high-level output voltage
Single-ended DC mid-point level output voltage
Single-ended DC low-point level output voltage
Single-ended DC high-point level output voltage
Single-ended DC low-point level output voltage
Delta RON between pull-up and pull-down for DQ/DQS
Test load for AC timing and output slew rates
uA
V/ns
V
V
V
V
V
%
1
1,2,3,4
1,2,5
1,2,5
1,2,5
1,2,3,6
1,2,3,6
1,7
3
table 42: SiNGle-eNded Output driVer characteriSticS
5
6
10
-5
2.5
-10
IOZ
SRQSE
VOH(DC)
VOM(DC)
VOL(DC)
VOH(AC)
VOL(AC)
MMPUPD
0.8xVDDQ
0.5xVDDQ
0.2xVDDQ
VTT+0.1xVDDQ
VTT-0.1xVDDQ
OutputtoVTT(VDDQ/2)via25Ωresistor
5. SeeTable32IVcurvelinearity.DonotuseACTestload.
6. SeeTable44foroutputslewrate.
7. SeeTable32foradditionalinformation.
8. SeeFigure29foranexampleofasingle-endedoutputsignal.
NOTES:
1. RZQof240Ω(±1%)withRZQ/7enabled(default34Ωdriver)andisappli-
cableafterproperZQcalibrationhasbeenperformedatastable tem-
peratureandvoltage(VDDQ=VDD,VssQ=Vss).
2. VTT=VDDQ/2
3. SeeFigure31forthetestloadconfiguration.
4. The6V/nsmaximumisapplicableforasingleDQsignalwhenitisswitch-
ingfromeitherHIGHtoLOWorLOWtoHIGHwhiletheremainingDQ
signalsinthesamebytelanearecombinations,themaximumlimitof6V/
nsmaximumisreducedto5V/ns.
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PackaGe OutliNe dimeNSiONS
Parameter/Condition Symbol MIN MAX
Output leakage current:DQaredisabled;
0V≤VOUT≤VDDQ;ODTisHIGH
Output slew rate:Differential;forrisingandfallingedges,
measurebetweenVOLDIFF(AC)=-0.2xVDDQandVOH
(AC)=+0.2xVDDQ
Output differential cross-point voltage
Differential high-level output voltage
Differential low-level output voltage
Delta RON between pull-up and pull-down for DQ/DQS
Test load for AC timing and output slew rates
uA
V/ns
mV
V
V
%
1
1
1,2,3
1,4
1,4
1,5
3
table 43: diFFereNtial Output driVer characteriSticS
5
12
VREF+150
10
-5
5
VREF-150
-10
IOZ
SRQDIFF
VOX(AC)
VOHDIFF(AC)
VOLDIFF(AC)
MMPUPD
+0.2xVDDQ
-0.2xVDDQ
OutputtoVTT(VDDQ/2)via25Ωresistor
4. SeeTable47onpage47fortheoutputslewrate.
5. SeeTable32onpage57foradditionalinformation.
6. SeeFigure30onpage66foranexampleofadifferentialoutputsignal.
NOTES:
1. RZQof240Ω(±1%)withRZQ/7enabled(default34Ωdriver)andisappli-
cableafterproperZQcalibrationhasbeenperformedatastable tem-
peratureandvoltage(VDDQ=VDD,VssQ=Vss).
2. VREF=VDDQ/2
3. SeeFigure31onpage67forthetestloadconfiguration.
FiGure 20 - dQ Output SiGNal
VOH(AC)
MIN output
MAX output
VOL(AC)
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FiGure 21 - diFFereNtial Output SiGNal
VOH(DIFF)
MIN output
MAX output
VOL(DIFF)
VOX(AC) MAX
VOX(AC) MINX
X
X
X
OUTPUT CHARACTERISTICS AND OPERATING CONDITIONS
REFERENCE OUTPUT LOAD
Figure22representstheeffectivereferenceloadof25ΩusedindefiningtherelevantdeviceACtimingparameters(exceptODTreferencetiming)aswellastheoutputslewratemeasurements.ItisnotintendedtobeapreciserepresentationofaparticularsystemenvironmentoradepictionoftheactualloadpresentedbyanyspecificIndustrytestsystem/apparatus.SystemdesignersshoulduseIBISorothersimulationtoolstocorrelatethetimingreferenceloadpresentedorexhibitedonthesystemorsystemenvironment.
FiGure 22 - reFereNce Output lOad FOr ac timiNG aNd Output Slew rate
Timing Reference Point
DQDQS
DQS#
DUT VREF
VTT = VDDQ/2
VDDQ/2
ZQRZQ = 240Ω
VSS
RTT = 25Ω
All RZQs are embedded in module
PackaGe OutliNe dimeNSiONS
Output Edge From To Calculation
DQ
table 44: SiNGle-eNded Output Slew rate
Output Slew Rate (Linear Signals)
Rising
Falling
Measured
VOL(AC)
VOH(AC)
VOH(AC)
VOL(AC)
VOH(AC)-VOL(AC)
∆TRSE
VOH(AC)-VOL(AC)
∆TFSE
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SLEW RATE DEFINITIONS FOR SINGLE-ENDED OUTPUT SIGNALS
Thesingle-endedoutputdriverissummarizedinTable42.Withthereferenceloadfortimingmeasurements,theoutputslew-rateforfallingandrisingedgesisdefinedandmeasuredbetweenVOL(AC)andVOH(AC)forsingle-endedsignalsasindicatedinTable44andFigure23.
FiGure 23 - NOmiNal Slew rate deFiNitiON FOr SiNGle-eNded Output SiGNalS
ΔTRSE
ΔTFSE
VOH(AC)
VOL(AC)
VTT
PackaGe OutliNe dimeNSiONS
Output Edge From To Calculation
DQS, DQS\
table 45: diFFereNtial Output Slew rate deFiNitiON
Output Slew Rate (Linear Signals)
Rising
Falling
Measured
VOLDIFF(AC)
VOHDIFF(AC)
VOHDIFF(AC)
VOLDIFF(AC)
VOHDIFF(AC)-VOLDIFF(AC)
∆TRDIFF
VOHDIFF(AC)-VOLDIFF(AC)
∆TFDIFF
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SLEW RATE DEFINITIONS FOR DIFFERENTIAL OUTPUT SIGNALS
ThedifferentialoutputdriverissummarizedinTable43.Withthereferenceloadfortimingmeasurements,theoutputslewrateforfallingandrisingedgesisdefinedandmeasuredbetweenVOL(AC)andVOH(AC)fordifferentialsignals,asshowninTable45andFigure33.
FiGure 24 - NOmiNal diFFereNtial Output Slew rate deFiNitiON FOr dQS, dQS#
ΔTFDIFF
VOH(DIFF) AC
VOL(DIFF) AC
0
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PackaGe OutliNe dimeNSiONS
Parameter Symbol MIN MAX MIN MAX MIN MAX MIN MAX
ACTIVATEtointernalREADorWRITEdelaytime
PRECHARGEcommandperiod
ACTIVATE-to-ACTIVATEorREFRESHcommandperiod
ACTIVATE-to-PRECHARGEcommandperiod
CL=5
CL=6
CL=8
CL=11
SupportedCLSettings
SupportedCWLSettings
1
2
3
3
2
3
3
3
2,3
3
3
3
2,3
table 46: Speed biNS
-25(DDR3-800)-19(DDR3-1066)-15(DDR3-1333)-12(DDR3-1600)
tRCD
tRP
tRC
tRAS
tCK(AVG)
tCK(AVG)
tCK(AVG)
tCK(AVG)
tCK(AVG)
tCK(AVG)
tCK(AVG)
tCK(AVG)
tCK(AVG)
tCK(AVG)
tCK(AVG)
tCK(AVG)
15
15
52.5
37.5
3
2.5
5,65,6,85,6,8,10 5,6,8,10
-
-
-
60ms
3.3
3.3
15
15
52.5
37.5
3
2.5
1.875
-
-
-
60ms
3.3
3.3
<2.5
15
15
51
36
3
2.5
1.875
1.5
-
-
-
60ms
3.3
3.3
<2.5
<1.875
CWL=5
CWL=6
CWL=7
CWL=5
CWL=6
CWL=7
CWL=5
CWL=6
CWL=7
CWL=6
CWL=7
55,65,6,7 5,6,7
3. Reserved(filledblocks)settingsarenotallowed.
NOTES:
1. tREFIdependsontOPER
2. TheCLandCWLsetting result in tCK requirements. Whenmakinga
selectionoftCK,bothCLandCWLrequirementsettingsneedtobeful-
filled.
13.75
13.75
48.75
35
3
2.5
1.875
1.5
-
-
-
60ms
3.3
3.3
<2.5
<1.875
[CWL=2.5;6-6-6][CWL=1.875;8-8-8][CWL=1.5;10-10-10][CWL=1.25;11-11-11]
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
CK
CK
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table 47 (Sheet 1 OF 6) - electrical characteriSticS aNd ac OperatiNG cONditiONS
MIN
MAX
MIN
MAX
MIN
MAX
878
008
7800
878
008
3900
839
008
3900
829
008
2900
829
00
0.47
0.53
0.47
0.53
0.47
0.53
0.47
0.53
0.47
0.53
0.47
0.53
-100
100
-90
90-8
080
-90
90-8
080
-70
70
-147
147
-132
132
-118
118
-175
175
-157
157
-140
140
-194
194
-175
175
-155
155
-209
209
-188
188
-168
168
-222
222
-200
200
-177
177
-232
232
-209
209
-186
186
-241
241
-217
217
-193
193
-249
249
-224
224
-200
200
-257
257
-231
231
-205
205
-263
263
-237
237
-210
210
-269
269
-242
242
-215
215
Units
Note
s[C
WL=
1.5;
10-
10-1
0]Sy
mbo
lPa
ram
eter
-25
(DDR
3-80
0)-1
9 (D
DR3-
1066
)[C
WL=
2.5;
6-6
-6]
[CW
L=1.
875;
8-8
-8]
-15
(DDR
3-13
33)
11 C
ycle
s12
Cyc
les
0.43
-
0.43
-
t ERR
nPER
MIN
= (1
+0.6
8ln[
n]) x
t JIT
PER
MIN
t ERR
nPER
MAX
= (1
+0.6
8ln[
n]) x
t JIT
PER
MAX
0.43
-0.
43-
9,42
9,42
9,42
10,1
112 12 13 13 16 16 17 17 17 17 17 17 17 17 17 17 1714 15 17
180
160
140
180
160
t ERRn
PER
t JITCC
t JITCC
, LCK
t ERR6
PERR
t ERR7
PERR
t ERR8
PERR
n =
13, 1
4 …
49,
50
Cycle
s
t ERR2
PERR
t ERR3
PERR
t ERR4
PERR
t ERR5
PERR
200
t ERR9
PERR
t ERR1
0PER
Rt ER
R11P
ERR
t ERR1
2PER
R
Cum
ula
ve e
rror
acr
oss
2 Cy
cles
3 Cy
cles
4 Cy
cles
5 Cy
cles
6 Cy
cles
7 Cy
cles
8 Cy
cles
9 Cy
cles
10 C
ycle
s
Cloc
k pe
riod
JITTE
R
Cycle
-to-C
ycle
JITT
ER
DLL L
OCKE
DDL
L LOC
KING
DLL L
OCKE
DDL
L LOC
KING
Cloc
k ab
solu
te p
erio
d
Cloc
k ab
solu
te H
IGH
pusle
wid
th
Cloc
k ab
solu
te LO
W p
ulse
wid
th
t CLK
(ABS
)
t CKDL
L_DI
S
t CL (A
VG)
t CH (A
BS)
t CL (A
BS)
Cloc
k pe
riod
aver
age:
DLL
ena
ble
mod
eHI
GH p
ulse
wid
th a
vera
geLO
W p
ulse
wid
th a
vera
ge
Cloc
k pe
riod
aver
age:
DLL
di
sabl
e m
ode
TC =
85˚
C to
105
˚C
0.43
-
t JITPE
Rt JIT
PER,
LCK
t CK (A
VG)
-0.
43
ns CK CK ps ps ps ps ps ps ps ps ps ps ps ps ps ps ps ps
t CK
(AVG
)
psns
t CK
(AVG
)
MIN
=tCK
(AVG
) MIN
+tJIT
PER
MIN
; MAX
=tCK
(AVG
)MAX
+tJIT
PER
MAX
TC =
0˚C
to <
85˚C
TC =
>10
5˚C
to ≤
125˚
C
t CH (A
VG)
See
SPEE
D BI
N TA
BLE
(#49
) for
tCK
rang
e al
low
ed
[CW
L=1.
25; 1
1-11
-11]
-12
(DDR
3-16
00)
MIN
MAX
878
008
3900
829
00
0.47
0.53
0.47
0.53
-70
70-6
060
-103
103
-122
122
-136
136
-147
147
-155
155
-163
163
-169
169
-175
175
-180
180
-184
184
-188
188
0.43
-
120
140
-0.
43
STACKED Technologies Incorporated www.stackedtechnologies.com55
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
table 47 (Sheet 2 OF 6) - electrical characteriSticS aNd ac OperatiNG cONditiONS
MIN
MAX
MIN
MAX
MIN
MAX
75-
25-
--
250
-20
0-
--
125
-75
-30
-27
5-
250
-18
0-
150
-10
0-
65-
250
-20
0-
165
-60
0-
490
-40
0-
-20
0-
150
-12
5
-800
400
-600
300
-500
250
-40
0-
300
-25
0
-0.2
50.
25-0
.25
0.25
-0.2
50.
250.
450.
550.
450.
550.
450.
550.
450.
550.
450.
550.
450.
550.
2-
0.2
-0.
2-
0.2
-0.
2-
0.2
-0.
9-
0.9
-0.
9-
0.3
-0.
3-
0.3
-
-400
400
-300
300
-255
255
0.38
-0.
38-
0.4
-0.
38-
0.38
-0.
4-
-800
400
-600
300
-500
250
-40
0-
300
-25
00.
9No
te 2
40.
9No
te 2
40.
9No
te 2
40.
3No
te 2
70.
3No
te 2
70.
3No
te 2
7
Data
SET
UP
me
to D
QS,
DQ
S\t DS
AC1
50
Data
HO
LD
me
from
DQ
S,
DQS\
VREF
@ 1
V/ns
Data
SET
UP
me
to D
QS,
DQ
S\t DS
AC1
75
Base
(spe
cifica
on)
[CW
L=1.
875;
8-8
-8]
VREF
@ 1
V/ns
Base
(spe
cifica
on)
VREF
@ 1
V/ns
Base
(spe
cifica
on)
DQ H
IGH-
A m
e fro
m C
K, C
K\
DQS,
DQ
S\ D
IFFE
RENT
IAL R
EAD
post
ambl
et RP
ST
DQS,
DQ
S\ D
IFFE
RENT
IAL O
utpu
t HIG
H m
e
DQ LO
W-Z
m
e fro
m C
K, C
K\
DQ S
trob
e In
put T
imin
g
DQS,
DQ
S\ D
IFFE
RENT
IAL W
RITE
pos
tam
ble
Para
met
er
-25
(DDR
3-80
0)-1
9 (D
DR3-
1066
)-1
5 (D
DR3-
1333
)[C
WL=
2.5;
6-6
-6]
[CW
L=1.
5; 1
0-10
-10]
Sym
bol
DQS,
DQ
S\ F
ALLI
NG S
etup
to C
K, C
K\ R
ISIN
Gt DS
S
DQ O
utpu
t Tim
ing
DQS,
DQ
S\ to
DQ
SKE
W, p
er a
cces
s
DQ O
utpu
t HO
LD
me
from
DQ
S, D
QS\
t DQSS
DQS,
DQ
S\ D
IFFE
RENT
IAL I
nput
Low
pul
se w
idth
t WPS
T
DQS,
DQS\
RIS
ING
to C
K, C
K\ R
ISIN
Gt DQ
SLDQ
S, D
QS\
DIF
FERE
NTIA
L Inp
ut H
IGH
pulse
wid
tht DQ
SH
DQS,
DQ
S\ D
IFFE
RENT
IAL R
EAD
prea
mbl
et RP
RE
DQS,
DQ
S\ F
ALLI
NG H
old
from
CK,
CK\
RIS
ING
t DSH
DQS,
DQ
S\ D
IFFE
RENT
IAL W
RITE
pre
ambl
et W
PRE
DQ S
trob
e O
utpu
t Tim
ing
1
t QSH
DQS,
DQ
S\ D
IFFE
RENT
IAL O
utpu
t LO
W
me
t QSL
DQS,
DQ
S\ R
ISIN
G to
/fro
m R
ISIN
G CK
, CK\
t DQSC
K
DQS,
DQ
S\ H
IGH-
Z m
e (R
L+BL
/2)
t HZ (D
QS)
DQS,
DQ
S\ LO
W-Z
m
e (R
L-1)
t LZ (D
QS)
101
10DQ
S, D
QS\
RIS
ING
to/f
rom
RIS
ING
CK, C
K\ w
hen
DLL i
s disa
bled
t DQSK
DLL_
DIS
101
t DH A
C100
Min
imum
Dat
a Pu
lse W
idth
t DIPW
t QH
0.38
-
t DQSQ
-0.
38-
Units ps ps ps ps ps ps ps ps ps ps CK CK CK CK CK CK CK ps CK CK ps ps CK CKns
tCK
(AVG
)
18,1
919
,20
18,1
919
,20
18,1
919
,20
41 22,2
322
,23
25 25 25 23 21 21 22,2
322
,23
23,2
423
,27
Note
s
2621
t HZ (D
Q)
t LZ (D
Q)
0.38
-12
(DDR
3-16
00)
[CW
L=1.
25; 1
1-11
-11]
MIN
MAX
- - 10 160
45 145
360 -
-450 -
-0.2
70.
450.
450.
180.
18 0.9
0.3
-225 0.4
0.4
-450 - 0.9
0.310.
38
- - - - - - - 100
225
225
0.27
0.55
0.55 - - - - 225 - - 225
225
Note
24
Note
27
10-
DQ In
put T
imin
g
STACKED Technologies Incorporated www.stackedtechnologies.com56
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
table 47 (Sheet 3 OF 6) - electrical characteriSticS aNd ac OperatiNG cONditiONS
MIN
MAX
MIN
MAX
MIN
MAX
512
-51
2-
-20
0-
125
--
375
-30
0-
-35
0-
275
--
500
-42
5-
-27
5-
--
--
-90
0-
780
--
40-
37.5
-30
-50
-50
-45
-
MUL
TIPU
RPO
SE R
EGIS
TER
READ
bur
st e
nd to
mod
e re
gist
er se
t for
m
ulp
urpo
se re
gist
er e
xit
t MPR
RM
IN =
1CK
; MAX
= n
/a
MIN
= 4
CK; M
AX =
n/a
MIN
= g
reat
er o
f 12C
K or
15n
s; M
AX =
n/a
MO
DE R
EGIS
TER
SET
com
man
d cy
cle
me
t MRD
MIN
= g
reat
er o
f 4CK
or 7
.5ns
; MAX
= n
/aM
IN =
4CK
; MAX
= n
/a
Auto
pre
char
ge W
RITE
reco
very
+ P
RECH
ARGE
m
et DA
LM
IN =
WR
+ t RP
/t CK (A
VG);
MAX
= n
/a
CAS\
-to-C
AS\ c
omm
and
dela
yt CC
D
MIN
= 1
5ns;
MAX
= n
/a
Dela
y fro
m st
art o
f int
erna
l WRI
TE tr
ansa
con
to in
tern
al R
EAD
com
man
dt W
TRM
IN =
gre
ater
of 4
CK o
r 7.5
ns; M
AX =
n/a
WRI
TE re
cove
ry
me
t WR
MO
DE R
EGIS
TER
SET
com
man
d up
date
del
ayt M
OD
Four
ACT
IVAT
E w
indo
ws f
or 2
KB p
age
size
Four
ACT
IVAT
E w
indo
ws f
or 1
KB p
age
size
t FAW
READ
-to-P
RECH
ARE
me
t RTP
[CW
L=2.
5; 6
-6-6
][C
WL=
1.87
5; 8
-8-8
][C
WL=
1.5;
10-
10-1
0]Sy
mbo
lPa
ram
eter
-25
(DDR
3-80
0)-1
9 (D
DR3-
1066
)-1
5 (D
DR3-
1333
)
Com
man
d an
d Ad
dres
s Tim
ing
CTRL
, CM
D, A
DDR
setu
p to
CK,
CK
\Ba
se (s
pecifi
cao
n)VR
EF @
1V/
nsCT
RL, C
MD,
ADD
R se
tup
to C
K,
CK\
Base
(spe
cifica
on)
VREF
@ 1
V/ns
CTRL
, CM
D, A
DDR
hold
to C
K,
CK\
Base
(spe
cifica
on)
VREF
@ 1
V/ns
DLL L
ocki
ng
me
t DLLK
See
"Spe
ed B
in T
able
(#49
) for
tRCD
See
"Spe
ed B
in T
able
(#49
) for
tRP
See
"Spe
ed B
in T
able
(#49
) for
tRAS
Min
imum
CTR
L, C
MD,
ADD
R pu
lse w
idth
t IPW
ACTI
VATE
to In
tern
al R
EAD
or W
RITE
del
ayt RC
DPR
ECHA
RGE
com
man
d pe
riod
t RP
1KB
page
size
MIN
=gre
ater
of 4
CK
or 1
0ns
MIN
=gre
ater
of 4
CK
or 7
.5ns
ACTI
VATE
-to-P
RECH
ARGE
com
man
d pe
riod
t RAS
ACTI
VATE
-to-A
CTIV
ATE
com
man
d pe
riod
t RCD
See
"Spe
ed B
in T
able
(#49
) for
tRC
MIN
=gre
ater
of 4
CK
or 6
ns
CK ps ps ps ps ps ps ps ns ns ns ns ns ns CK CK CK CK CKCKCK CKUnits CKCK
28 29,3
020
,30
29,3
020
,30
29,3
020
,30
41 31 31 31,3
231 31 31
31,3
2,33
31,3
4
Note
s
3131AC
TIVA
TE-to
-ACT
IVAT
E m
inim
um co
mm
and
perio
d2K
B pa
ge si
ze
t RRD
MIN
=gre
ater
of 4
CK o
r 10n
s
MIN
MAX
[CW
L=1.
25; 1
1-11
-11]
-12
(DDR
3-16
00)
- - - - - - - -
MIN
=gre
ater
of 4
CK
or 6
ns
MIN
=gre
ater
of 4
CK o
r 7.5
ns
30-
40-
375
200
300
t IS A
C175
t IS A
C150
t IH D
C100
512
65 240
190
340
140
240
620
512
45 220
170
320
120
220
560
STACKED Technologies Incorporated www.stackedtechnologies.com57
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
table 47 (Sheet 4 OF 6) - electrical characteriSticS aNd ac OperatiNG cONditiONS
MIN
MAX
MIN
MAX
MIN
MAX
256
-25
6-
256
-64
-64
-64
-
Valid
cloc
ks a
er S
ELF
REFR
ESH
entr
y or
PO
WER
-DO
WN
entr
yt CK
SRE
MIN
= g
reat
er o
f 5CK
or 1
0ns;
MAX
= n
/a
Valid
cloc
ks b
efor
e SE
LF R
EFRE
SH e
xit,
POW
ER-D
OW
N ex
it, o
r RES
ET
exit
t CKSR
XM
IN =
gre
ater
of 5
CK o
r 10n
s; M
AX =
n/a
EXIT
SEL
F RE
FRES
H TO
com
man
ds re
quiri
ng a
lock
ed D
LLt XS
DLL
MIN
= t DL
LK (M
IN);
MAX
= n
/a
MIN
IMUM
CKE
LOW
pul
se w
idth
for S
ELF
REFR
ESH
entr
y to
SEL
F RE
FRES
H ex
it m
ing
t CKES
RM
IN =
t CKE
(MIN
) + C
K; M
AX =
n/a
SELF
REF
RESH
Tim
ing
Exit
SELF
REF
RESH
TO
com
man
ds n
ot re
quiri
ng a
lock
ed D
LLt XS
MIN
= g
reat
er o
f 5CK
or t RF
C +
10ns
; MAX
= n
/a
Max
imum
REF
RESH
pe
riod/
inte
rval
TC ≤
85˚
Ct RE
FI7.
8TC
>85
˚C ≤
105
˚C3.
9TC
>10
5˚C
≤ 12
5˚C
2.9
TC ≤
85˚
C-
TC >
105˚
C ≤
125˚
C24
TC >
85˚C
≤ 1
05˚C
Max
imum
REF
RESH
per
iod
Begi
n po
wer
supp
ly ra
mp
to p
ower
supp
lies s
tabl
et VD
DPR
MIN
= n
/a; M
AX =
200
REFR
ESH-
to-A
CTIV
ATE
or R
EFRE
SH co
mm
and
perio
dt RF
CM
IN =
110
; MAX
= 9
x t RE
FI
REFR
ESH
Tim
ing
RESE
T\ LO
W to
pow
er su
pplie
s sta
ble
t RPS
MIN
= 0
; MAX
= 2
00RE
SET\
LOW
to I/
O a
nd R
TT H
IGH-
Zt IO
ZM
IN =
n/a
; MAX
= 2
00
ZQCS
com
man
d: S
hort
Cal
ibra
on
Tim
et ZQ
CS
Exit
RESE
T fro
m C
KE H
IGH
to a
val
id co
mm
and
t XPR
MIN
= g
reat
er o
f 5CK
or t
RFC
+ 10
ns; M
AX =
n/a
Ini
aliza
on
and
RESE
T Ti
min
g
-51
2-
512
-ZQ
CL co
mm
and:
Long
Ca
libra
on
me
POW
ER-U
P an
d RE
SET
oper
aon
Norm
al o
pera
on
t ZQIN
ITt ZQ
OPER
512
35 36 36 36 36 36 36 28
Note
s[C
WL=
2.5;
6-6
-6]
[CW
L=1.
875;
8-8
-8]
[CW
L=1.
5; 1
0-10
-10]
Sym
bol
Calib
rao
n Ti
min
gPa
ram
eter
-25
(DDR
3-80
0)-1
9 (D
DR3-
1066
)-1
5 (D
DR3-
1333
)
CK CK CK ms ns ms
ms
ms
µs µs µs CK CKCK CKCKms nsCKUnits
MIN
MAX
[CW
L=1.
25; 1
1-11
-11]
-12
(DDR
3-16
00)
256
-64
-
512
-
64 (1
X)32
(2X)
STACKED Technologies Incorporated www.stackedtechnologies.com58
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
table 47 (Sheet 5 OF 6) - electrical characteriSticS aNd ac OperatiNG cONditiONS
MIN
MAX
MIN
MAX
MIN
MAX
MIN
= G
reat
er o
f 3CK
or 7
.5ns
; MAX
= n
/a
MIN
= G
reat
er o
f 10C
K or
24n
s; M
AX =
n/a
BL8
(OTF
, MRS
) BC4
OTF
t WRA
PDEN
MIN
= W
L + 4
+ W
R +
1
MIN
= W
L + 2
+ W
R +
1
BL8
(OTF
, MRS
) BC4
OTF
t WRP
DEN
t WRP
DEN
MIN
= W
L + 4
+ t W
R/t CK
(AVG
)
t WRA
PDEN
BC4M
RSM
IN =
WL +
2 +
t WR/
t CK (A
VG)
WRI
TE w
ith A
UTO
PRE
CHAR
GE
com
man
d to
PO
WER
-DO
WN
entr
yBC
4MRS
DLL o
n, a
ny v
alid
com
man
d, o
r DLL
off
to co
mm
ands
not
requ
iring
DLL
lo
cked
t XP
READ
/REA
D w
ith A
UTO
PRE
CHAR
GE co
mm
ant t
o PO
WER
-DO
WN
entr
yt RD
PDEN
MIN
= R
L + 4
+ 1
WRI
TE C
omm
and
to P
OW
ER-
DOW
N en
try
REFR
ESH
com
man
d to
PO
WER
-DO
WN
entr
yt RE
FPDE
NM
IN =
1M
RS co
mm
and
to P
OW
ER-D
OW
N en
try
t MRS
PDEN
MIN
= t M
OD (M
IN)
t ACTP
DEN
MIN
= 1
PREC
HARG
E/PR
ECHA
RGE
ALL c
omm
and
to P
OW
ER-D
OW
N en
try
t PRPD
ENM
IN =
1
Com
man
d pa
ss d
isabl
e de
lay
t CPDE
DM
IN =
1; M
AX =
n/a
POW
ER-D
OW
N en
try
to P
OW
ER-D
OW
N ex
it m
ing
t PDM
IN =
tCKE
(MIN
); M
AX =
60m
s
POW
ER-D
OW
N en
try
perio
d: O
DT e
her
sync
hron
ous o
r asy
nchr
onou
sPD
EGr
eate
r of t
ANPD
or t
RFC
- REF
RESH
com
man
d to
CKE
LOW
m
e
POW
ER-D
OW
N ex
it pe
riod:
ODT
eith
er sy
nchr
onou
s or a
sync
hron
ous
PDX
t ANPD
+ t XP
DLL
Grea
ter o
f 3CK
or
7.5n
sGr
eate
r of 3
CK o
r 5.
625n
sGr
eate
r of 3
CK o
r 5.
625n
s
Begi
n PO
WER
-DO
WN
perio
d pr
ior t
o CK
E re
gist
ered
HIG
Ht AN
PDW
L - 1
CK
POW
ER-D
OW
N Ti
min
g
POW
ER-D
OW
N En
try
MIN
IMUM
Tim
ing
POW
ER-D
OW
N Ex
it Ti
min
g
PREC
HARG
E PO
WER
-DO
WN
with
DLL
off
to co
mm
and
requ
iring
DLL
lo
cked
t XPDL
L
CKE
MIN
pul
se w
idth
t CKE
(MIN
)
ACTI
VATE
com
man
d to
PO
WER
-DO
WN
entr
y
Para
met
er
-25
(DDR
3-80
0)-1
9 (D
DR3-
1066
)-1
5 (D
DR3-
1333
)
CK CK CK CK CK CK CK CK CKCKCKCKCKCK CK CKCKUnits
37 28
Note
s[C
WL=
2.5;
6-6
-6]
[CW
L=1.
875;
8-8
-8]
[CW
L=1.
5; 1
0-10
-10]
Sym
bol
MIN
MAX
-12
(DDR
3-16
00)
[CW
L=1.
25; 1
1-11
-11]
MIN
= G
reat
er o
f 3CK
or 6
.0ns
; MAX
= n
/a
Grea
ter o
f 3CK
or
5ns
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table 47 (Sheet 6 OF 6) - electrical characteriSticS aNd ac OperatiNG cONditiONS
MIN
MAX
MIN
MAX
MIN
MAX
-400
400
-300
300
-250
250
0.3
0.7
0.3
0.7
0.3
0.7
0.3
0.7
0.3
0.7
0.3
0.7
40-
40-
40-
25-
25-
25-
09
09
09
02
02
02
WRI
TE Le
velin
g ou
tput
err
ort W
LOE
t WLS
t WLH
195
-
WRI
TE Le
velin
g ou
tput
del
ayt W
LO
WRI
TE Le
velin
g HO
LD fr
om ri
sing
DQS,
DQ
S\ cr
ossin
g to
risin
g CK
, CK\
cr
ossin
g32
5-
245
DQS;
DQ
S\ d
elay
t WLD
QSE
NW
RITE
Leve
ling
SETU
P fro
m ri
sing
CK, C
K\ cr
ossin
g to
risin
g DQ
S, D
QS\
cr
ossin
g32
5-
245
-19
5-
6CK
+ OD
TL O
FFRT
T dy
nam
ic ch
ange
skew
t ADC
Firs
t DQ
S, D
QS\
RIS
ING
edge
t WLM
RD
-
RTT_
NOM
-to=R
TT_W
R ch
ange
skew
ODTL
CNW
WL -
2CK
RTT_
WR-
to-R
TT_N
OM
chan
ge sk
ew -
BC4
ODTL
CNW
44C
K +
ODTL
OFF
RTT_
WR-
to-R
TT_N
OM
chan
ge sk
ew -
BC8
ODTL
CNW
8
ODT
HIG
H m
e w
ithou
t WRI
TE co
mm
and
or w
ith W
RITE
com
man
d an
d BC
8OD
T H8
MIN
= 6
; MAX
= n
/a
ODT
HIG
H m
e w
ithou
t WRI
TE co
mm
and
or w
ith W
RITE
com
man
d an
d BC
4OD
T H4
MIN
= 4
; MAX
= n
/a
Asyn
chro
nous
RTT
TUR
N-O
FF d
elay
(PO
WER
-DO
WN
with
DLL
OFF
)t AO
FPD
MIN
= 2
; MAX
= 8
.5
t AON
RTT
TURN
-OFF
from
ODT
L OFF
refe
renc
et AO
F
Asyn
chro
nous
RTT
TUR
N-O
N de
lay
(PO
WER
-DO
WN
with
DLL
OFF
)t AO
NPD
MIN
= 2
; MAX
= 8
.5
ODT
Tim
ing
Dyna
mic
ODT
Tim
ing
WRI
TE Le
velin
g Ti
min
g
RTT
sync
hron
ous T
URN-
ON
dela
yOD
TL o
nRT
T sy
nchr
onou
s TUR
N-O
FF d
elay
ODTL
off
RTT
TURN
-ON
from
ODT
L ON
refe
renc
e
Para
met
er
-25
(DDR
3-80
0)-1
9 (D
DR3-
1066
)-1
5 (D
DR3-
1333
)
CK CK ps CK CK CK CK CK CK CK ns nspspsCK CKns nsUnits
38 40 23,3
839
,40
3938 40
Note
s[C
WL=
2.5;
6-6
-6]
[CW
L=1.
875;
8-8
-8]
[CW
L=1.
5; 1
0-10
-10]
Sym
bol
MIN
MAX
-12
(DDR
3-16
00)
[CW
L=1.
25; 1
1-11
-11]
-225
225
0.3
0.7
0.3
0.7
40-
25-
07.
50
2
165
-
165
-
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NOteS
1. Parametersareapplicablewith0°C≤ TA ≤+95°CandVDD/VDDQ=+1.5V±0.075V.
2. AllvoltagesarereferencedtoVss.
3. OutputtimingsareonlyvalidforRON34outputbufferselection.
4. Unit tCK(AVG)representstheactualtCK(AVG)oftheinputclockunderoper-ation.UnitCKrepresentsoneclockcycleoftheinputclock,countingtheactualclockedges.
5. ACtimingandIDDtestsmayuseaVIL-to-VIHswingofupto900mVinthetestenvironment,butinputtimingisstillreferencedtoVREF(excepttIS,tIH,tDS,andtDHusetheAC/DCtrippointsandCK,CK\andDQS,DQS\usetheircrossingpoints).Theminimumslewratefortheinputsignalsusedtotestthedeviceis1V/nsforsingle-endedinputsand2V/nsfordifferentialinputsintherangebetweenVIL(AC)andVIH(AC).
6. Alltimingsthatusetime-basedvalues(ns,µs,ms)shouldusetCK(AVG)todeterminethecorrectnumberofclocks(Table47usesCKorCK(AVG)inter-changeably).Fornon-intergerresults,allminimumlimitsaretoberoundeduptothenearestwholeinteger.
7. TheuseofSTROBEorDQSDIFFreferstotheDQSandDQS\differentialcross-ingpointwhenDQSistherisingedge.TheuseofCLOCKorCKreferstotheCKandCK\differentialcrossingpointwhenCKisthe risingedge.
8. ThisoutputloadisusedforallACtiming(exceptODTreferencetiming)andslewrates.Theactual testloadmaybedifferent.TheoutputsignalvoltagereferencepointisVDDQ/2forsingle-endedsignalsandthecrossingpointfordifferentialsignals.
9. WhenoperatinginDLLdisablemode,STACKEDdoesnotwarrantcompliancewithnormalmodetimingsorfunctionality.
10. Theclock’stCK(AVG)istheaverageclockoverany200consecutiveclocksand tCK(AVG)MINisthesmallestclockrateallowed,withtheexceptionofadeviationduetoclockjitter.Inputclockjitter is allowed provided itdoesnotexceedvaluesspecifiedandmustbeofarandomGaussiandistribu-tion in nature.
11. Spreadspectrumisnotincludedinthejitterspecificationvalues.However,theinputclockcanaccommodatespread-spectrumatasweeprateintherangeof20-60kHzwithandadditional1%oftCK(AVG)asalong-termjittercomponent;however,thespread-spectrummaynotuseaclockratebelowtCK(AVG)MIN.
12. Theclock’stCH(AVG)andtCL(AVG)aretheaveragehalfclockperiodoverany200consecutiveclocksandisthesmallestclockhalfperiodallowed,withtheexceptionofvaluesspecifiedandmustofarandomGaussiandistributioninnature.
13. Theperiodjitter(tJITPER)isthemaximumdeviationintheclockperiodfromtheaverageornominalclock.Itisallowedineitherthepositiveornegativedirection.
14. tCH(ABS)istheabsoluteinstantaneousclockhighpulsewidthasmeasuredfromonerisingedgetothefollowingfallingedge.
15. tCL(ABS)istheabsoluteinstantaneousclocklowpulsewidthasmeasuredfromonefallingedgetothefollowingrisingedge.
16. Thecycle-to-cyclejitter(tJITCC)istheamounttheclockperiodcandeviatefromonecycletothenext.Itisimportanttokeepcycle-to-cyclejitterataminimumduringtheDLLlockingtime.
17. The cumulative jitter error (tERRnPER), where n is the number ofclocksbetween2and50,istheamountofclocktimeallowedtoaccu-mulateconsecutivelyaway from theaverageclockovernnumberofclockcycles.
18. tDS(base)andtDH(base)valuesareforasingle-ended1V/nsDQslewrateand2V/nsfordifferentialDQS,DQS\slewrate.
19. Theseparametersaremeasuredfromadatasignal(DM,DQ0,DQ1…DQnandsoforth) transitionedgeto itsrespectivedatastrobesignal(DQS,DQS\)crossing.
20. Thesetupandholdtimesarelistedconvertingthebasespecificationvalues(towhichderatingtablesapply)toVREFwhentheslewrateis1V/ns.Thesevalues,withaslewrateof1V/nsareforreferenceonly.
21. Whenthedeviceisoperatedwithinputclockjitter,thisparameterneedstobederatedbytheactualtJITPER(largeroftJITPER(MIN)ortJITPER(MAX)oftheinputclock(outputderatingsarerelativetotheSDRAMinputclock).
22. Single-endedsignalparameter.
23. Theoutputtimingisalignedtothenominaloraverageclock.Outputparametersmustbederatedbytheactualjittererrorwheninputclockjitterispresent,evenwhenwithinspecification.Thisresultsineachparameterbecominglarger.ThefollowingparametersarerequiredtobederatedbysubtractingtERRI0PER(MAX);tDQSCK(MIN),tLZ(DQS)MIN,tLZ(DQ)MAX,and tAON(MIN).ThefollowingparametersarerequiredtobederatedbysubtractingtERRI0PER(MIN);tDQSCK(MAX),tLZ(DQS)MAX,tLZ(DQ)MAX,and tAON(MAX).TheparametertRPRE(MIN)isderatedbysubtractingtJITPER (MAX),whiletRPRE(MAX)isderatedbysubtractingtJITPER(MIN).
24. ThemaximumpreambleisboundbytLZDQS(MAX).
25. Theseparametersaremeasuredfromadatastrobesignal(DQS,DQS\)crossingtoitsrespectiveclocksignal(CK,CK\)crossing.Thespeci-fication valuesarenot affectedby theamount of clock jitter applied,as theseare relative to theclocksignalcrossing. Theseparametersshouldbemetwhetherclockjitterispresentornot.
26. ThetDQSCKDLL_DISparameterbeginsCL+AL-1cyclesaftertheREADcommand.
27. ThemaximumpostambleisboundbytHZDQS(MAX).
28. Commandsrequiringa lockedDLLare:READ(andRDAP)andsyn-chronousODT commands. In addition, after any change of latencytXPDLL,timingmustbemet.
29. tIS(base)andtIH(base)valuesareforasingle-ended1V/nscontrol/command/addressslewrateand2V/nsCK,CK#differentialslewrate.
30. Theseparametersaremeasuredfromacommand/addresssignaltran-sitionedgetoitsrespectiveclock(CK,CK\)signalcrossing.Thespeci-fication values are not affected by the amount of clock jitter appliedas thesetupandhold timesare relative to theclocksignal crossingthatlatchesthecommand/address.Theseparametersshouldbemetwhetherclockjitterispresentornot.
31. Fortheseparameters,thedevicesupportstnPARAM(nCK)=RU(tPARAM[ns]/tCK[AVG][ns]),assumingallinputclockjitterspecificationsaresatisfied.Forexample,thedevicewillsupporttnRP(nCK)=RU(tRP)/tCK[AVG])ifallinputclockjitterspecificationsaremet.ThismeansforDDR2-800;6-6-6,ofwhichtRP=15ns,thedevicewillsupporttnRP=RU(tRP/tCK[AVG])=6aslongastheinputclockjitterspecificationsaremet.Thatis,thePRECHARGEcommandatT0andtheACTIVATEcommandatT0+6arevalidevenifsix
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NOteS cONtiNued
clocksarelessthan15nsduetoinputclockjitter.
32. During READs and WRITEs with AUTO PRECHARGE, the DDR3SDRAMwill holdoff the internalPRECHARGEcommanduntil tRAS (MIN)hasbeensatisfied.
33. Whenoperating inDLLdisablemode, thegreaterof4CKor15ns issatisfiedfortWR.
34. Thestartofthewriterecoverytimeisdefinedasfollows:
•ForBL8(fixedbyMRSandOTF):RisingclockedgefourclockcyclesafterWL.
•ForBC4(OTF):RisingclockedgefourclockcyclesafterWL.
•ForBC4(fixedbyMRS):RisingclockedgetwoclockcyclesafterWL.
35. RESET\shouldbeLOWassoonaspowerstartstoramptoensuretheoutputsareinHIGH-ZUntilRESET\isLOW,theoutputsareatriskofdrivingthebusandcouldresultinexcessivecurrent,dependingonthebusactivity.
36. The refreshperiod is64mswhenTA is less thanorequal to85°C.Thisequatestoanaveragerefreshrateof7.8124µs.However,nineREFRESHcommandsshouldbeassertedatleastonceevery70.3µs.WhenTAisgreaterthan85°C,therefreshperiodis32msandwhenTAisgreaterthan105°C,therefreshperiodis24ms.
37. AlthoughCKEisallowedtoberegisteredLOWafteraREFRESHcommandwhentREFPDEN(MIN)issatisfied,therearecaseswhereadditionaltimesuchastXPDLL(MIN)isrequired.
38. ODTturn-ontimeMINiswhenthedeviceleavesHIGH-ZandODTresis-
tancebeginstoturnon.ODTturn-ontimemaximumiswhentheODTresistanceisfullyon.TheODTreferenceloadisshowninFigure23.
39. Half-clockoutputparametersmustderatedbytheactualtERRI0PERandtJITDTYwheninputclockjitterispresent.Thisresultsineachparameterbecominglarger.TheparameterstADC(MIN)andtAOF(MIN)areeachrequiredtobederatedbysubtractingbothtERRI0PER(MAX)andtJITDTY (MAX).TheparameterstADC(MAX)andtAOF(MAX)arerequiredtobederatedbysubtractingbothtERRI0PER(MAX)andtJITDTY(MAX).
40. ODTturn-offtimeminimumiswhenthedevicestartstoturnoffODTresistance.ODTturn-off timemaximumiswhentheSDRAMbufferis inHIGH-Z.TheODTreferenceloadisshowninFigure24. ThisoutputloadisusedforODTtimings(seeFigure31).
41. Pulsewidth of an input signal is defined as thewidth between thefirstcrossingofVREF(DC)andtheconsecutivecrossingofVREF(DC).
42. ShouldtheclockratebelargerthantRFC(MIN),anAUTOREFRESHcommandshouldhaveat leastoneNOPcommandbetween itandanother AUTOREFRESH command. Additionally, if the clock rateisslowerthan40ns(25MHz)allREFRESHcommandsshouldbefol-lowedbyaPRECHARGEALLcommand.
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COMMAND AND ADDRESS SETUP, HOLD, AND DERATING
ThetotaltIS(setuptime)andtIH(holdtime)requirediscalculatedbyaddingthedatasheettIS(base)andtIH(base)values(Tables48)tothe∆tIS and ∆tIHderatingvalues(Table49),respectively.Set-upandholdtimesarebasedonmeasurementsatthedevice.Notethataddressandcontrolpinspresentthecapacitanceofmultipledietothesystem.Thiscapacitanceislessthantheequivalentnumberofdiscretedevicesduetothehigherlevelofdieintegration;however,itmustbeaccountedforwhendrivingthesepins.Slewratesonthesepinswillbeslowerthanpinswithonlyonedieloadunlessmeasuresaremadetoincreasethestrengthofthesignaldriverandlowerthetraceimpedanceproportionallyonsignalsconnectingtomultipleinternal die.
Althoughthetotalsetuptimeforslowslewratesmightbenegative,avalidinputsignalisstillrequiredtocompletethetransi-tionandtoreachVIH(AC)/VIL(AC)(seeFigure14forinputsignalrequirements).ForslewrateswhichfallbetweenthevalueslistedinTable49andTable50,thederatingvaluesmaybeobtainedbylinearinterpolation.
Setup(tIS)nominalslewrateforarisingsignalisdefinedastheslewratebetweenthelastcrossingofVREF(DC)andthefirstcrossingofVIH(AC)MIN.Setup(tIS)nominalslewrateforafallingsignalisdefinedastheslewratebetweenthelastcrossingofVREF(DC)andthefirstcrossingofVIL(AC)MAX.Iftheactualsignalisalwaysearlierthanthenominalslewratelinebetweentheshaded“VREF(DC)-to-ACregion”,usethenominalslewrateforderatingvalue(seeFigure25).Iftheactualsignalislaterthanthenominalslewratelineanywherebetweentheshaded“VREF(DC)-to-ACregion”,theslewrateofatangentlinetotheactualsignalfromtheACleveltotheDClevelisusedforthederatingvalue(seeFigure27).
Hold(tIH)nominalslewrateforarisingsignalisdefinedastheslewratebetweenthelastcrossingofVIL(DC)MAXandthefirstcrossingofVREF(DC).Hold(tIH)nominalslewrateforafallingsignalisdefinedastheslewratebetweenthelastcrossingof
Symbol DDR3-800 DDR3-1066 DDR3-1333 DDR3-1600 UNITS REFERENCE tIS(base) AC175
tIS(base)(AC150)
tIH(base)DC100
VIH(AC)/VIL(AC)
VIH(AC)/VIL(AC)
VIH(AC)/VIL(AC)
table 48: cOmmaNd aNd addreSS Setup aNd hOld ValueS reFereNced at 1V/NS – ac/dc baSed
65
190
140
200
350
275
125
275
200
ps
ps
ps
∆tIS ∆tIH ∆tIS ∆tIH ∆tIS ∆tIH ∆tIS ∆tIH ∆tIS ∆tIH ∆tIS ∆tIH ∆tIS ∆tIH
2.0
1.5
1.0
0.9
0.8
0.7
0.6
0.5
0.4
table 49: deratiNG ValueS FOr tiS/tih – ac175/dc100-baSed
CMD/ADDR Slew Rate V/ns
88
59
0
-2
-6
-11
-17
-35
-62
50
34
0
-4
-10
-16
-26
-40
-60
88
50
0
-2
-6
-11
-17
-35
-62
50
34
0
-4
-10
-16
-26
-40
-60
88
59
0
-2
-6
-11
-17
-35
-62
50
34
0
-4
-10
-16
-26
-40
-60
96
67
8
6
2
-3
-9
-27
-54
58
42
8
4
-2
-8
-18
-32
-52
96
67
8
6
2
-3
-9
-27
-54
66
50
16
12
6
0
-10
-24
-44
112
83
24
22
18
13
7
-11
-38
74
58
24
20
14
8
-2
-16
-36
120
91
32
30
26
21
15
-2
-30
84
68
34
30
24
18
8
-6
-26
128
99
40
38
34
29
23
5
-22
100
84
50
46
40
34
24
10
-10
4.0V/ns 3.0V/ns 2.0V/ns 1.8V/ns 1.6V/ns 1.4V/ns 1.2V/
CK, CK\ Differential Slew Rate
Shaded cells indicate slew-rate combinations not supported
∆tIS, ∆tIH Derating (ps) - AC/DC-Based, AC175 Threshold; VIH(AC) = VREF(DC) + 175mV, VIL(AC) = VREF(DC) - 175mV
45
170
120
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∆tIS ∆tIH ∆tIS ∆tIH ∆tIS ∆tIH ∆tIS ∆tIH ∆tIS ∆tIH ∆tIS ∆tIH ∆tIS
2.0
1.5
1.0
0.9
0.8
0.7
0.6
0.5
0.4
table 50: deratiNG ValueS FOr tiS/tih – ac150/dc100-baSed
CMD/ADDR Slew Rate V/ns
75
50
0
0
0
0
-1
-10
-25
50
34
0
-4
-10
-16
-26
-40
-60
75
50
0
0
0
0
-1
-10
-25
50
34
0
-4
-10
-16
-26
-40
-60
75
50
0
0
0
0
-1
-10
-25
50
34
0
-4
-10
-16
-26
-40
-60
83
58
8
8
8
8
7
-2
-17
58
42
8
4
-2
-8
-18
-32
-52
91
66
16
16
16
16
15
6
-9
66
50
16
12
6
0
-10
-24
-44
99
74
24
24
24
24
23
14
-1
74
58
24
20
14
8
-2
-16
-36
107
82
32
32
32
32
31
22
7
84
68
34
30
24
18
8
-6
-26
115
90
40
40
40
40
39
30
15
100
84
50
46
40
34
24
10
-10
4.0V/ns 3.0V/ns 2.0V/ns 1.8V/ns 1.6V/ns 1.4V/ns
CK, CK\ Differential Slew Rate
∆tIS, ∆tIH Derating (ps) - AC/DC-Based, AC150 Threshold; VIH(AC) = VREF(DC) + 150mV, VIL(AC) = VREF(DC) - 150mV
Shaded cells indicate slew-rate combinations not supported
Slew Rate (V/ns) tVAC at 175mV(ps) tVAC >2.0
2.0
1.5
1.0
0.9
0.8
0.7
0.6
0.5
<0.5
175
170
167
163
162
161
159
155
150
150
table 51: miNimum reQuired time tVac abOVe Vih(ac) FOr a Valid traNSitiON
75
57
50
38
34
29
22
13
0
0
Below VIL(AC)
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Notes: 1. Both the clock and the strobe are drawn on different time scales.
VSS
Setup slew raterising signal
Setup slew ratefalling signal
∆TF ∆TR
==
VDDQ
VIH(AC) MIN
VIH(DC) MIN
VREF(DC)
VIL(DC) MAX
VIL(DC) MAX
Nominalslew rate
VREF to ACregion
tVAC
tVAC
DQS
DQS#
CK#
CK
tIS t IH t IS t IH
Nominalslew rate
VREF to ACregion
VREF(DC) - VIL(AC) MAX
∆TF
VIH(AC) MIN - VREF(DC)
∆TR
FiGure 25 - NOmiNal Slew rate aNd tVac FOr tiS (cOmmaNd aNd addreSS – clOck)
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FiGure 26 - NOmiNal Slew rate FOr tih (cOmmaNd aNd addreSS – clOck)
Notes: 1. Both the clock and the strobe are drawn on different time scales.
VSS
Hold slew ratefalling signal
Hold slew raterising signal
∆TR ∆TF
= =
VDDQ
VIH(AC) MIN
VIH(DC) MIN
VREF(DC)
VIL(DC) MAX
VIL(AC) MAX
Nominalslew rate
DC to VREF
region
DQS
DQS#
CK#
CK
tIS t IH t IS t IH
DC to VREF
region
Nominalslew rate
VREF(DC) - VIL(DC) MAX
∆TR
VIH(DC) MIN - VREF(DC)
∆TF
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FiGure 27 - taNGeNt liNe FOr tiS (cOmmaNd aNd addreSS – clOck)
Notes: 1. Both the clock and the strobe are drawn on different time scales.
VSS
Setup slew raterising signal
Setup slew ratefalling signal
∆TF
∆TR
=
=
VDDQ
VIH(AC) MIN
VIH(DC) MIN
VREF(DC)
VIL(DC) MAX
VIL(AC) MAX
Tangentline
VREF to ACregion
Nominalline
tVAC
tVAC
DQS
DQS#
CK#
CK
tIS t IH t IS t IH
VREF to ACregion
Tangentline
Nominalline
Tangent line (VIH [DC] MIN - VREF[DC ])
∆TR
Tangent line (VREF [DC] - VIL[AC] MAX)
∆TF
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FiGure 28 - taNGeNt liNe FOr tih (cOmmaNd aNd addreSS – clOck)
Notes: 1. Both the clock and the strobe are drawn on different time scales.
VSS
Hold slew ratefalling signal
∆TR
=
VDDQ
VIH(AC) MIN
VIH(DC) MIN
VREF(DC)
VIL(DC) MAX
VIL(AC) MAX
Tangentline
DC to VREF
region
Hold slew raterising signal =
DQS
DQS#
CK#
CK
tIS t IH t IS t IH
DC to VREF
region
Tangentline
Nominalline
Nominalline
∆TR
Tangent line (VREF [DC] - VIL[DC] MAX)
∆TR
Tangent line (VIH [DC] MIN - VREF[DC])
∆TF
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DATA SETUP, HOLD AND DERATING
Thetotal tDS(setuptime)andtDH(holdtime)requirediscalculatedbyaddingthedatasheettDS(base)andtDH(base)values(seeTable52)tothe∆tDS and ∆tDHderatingvalues(seeTable53),respectively.
Althoughthetotalsetuptimeforslowslewratesmightbenegative,avalidinputsignalisstillrequiredtocompletethetransitionandtoreachVIH/VIL(AC).ForslewrateswhichfallbetweenthevalueslistedinTable54,thederatingvaluesmaybeobtainedbylinearinterpolation.
Setup(tDS)nominalslewrateforarisingsignalisdefinedastheslewratebetweenthelastcrossingofVREF(DC)andthefirstcrossingofVIH(AC)MIN.Setup(tDS)nominalslewrateforafallingsignalisdefinedastheslewratebetweenthelastcrossingofVREF(DC)andthefirstcrossingofVIL(AC)MAX.Iftheactualsignalisalwaysearlierthanthenominalslewratelinebetweentheshaded“VREF(DC)-to-ACregion”,usethenominalslewratederatingvalue(seeFigure29).Iftheactualsignalislaterthanthenominalslewratelineanywherebetweentheshaded“VREF(DC)-to-ACregion”,theslewrateofatangentlinetotheactualsignalfromtheACleveltotheDClevelisusedforthederatingvalue(seeFigure31).
Hold(tDH)nominalslewrateforarisingsignalisdefinedastheslewratebetweenthelastcrossingofVIL(DC)MAXandthefirstcrossingofVREF(DC).Hold(tDH)nominalslewrateforafallingsignalisdefinedastheslewratebetweenthelastcrossingofVIH(DC)MINandthefirstcrossingofVREF(DC).Iftheactualsignalisalwayslaterthanthenominalslewratelinebetweentheshaded“DC-to-VREF(DC)region”,usethenominalslewrateforderatingvalue(seeFigure30).Iftheactualsignalisearlierthanthenominalslewratelineanywherebetweentheshaded“DC-to-VREF(DC)region”,theslewrateofatangentlinetotheactualsignalfromthe“DC-to-VREF(DC)region”,isusedforthederatingvalue(seeFigure32).
Symbol DDR3-800 DDR3-1066 DDR3-1333 DDR3-1600 UNITS REFERENCE tDS(base)AC175
tDS(base)AC150
tDS(base)DC100
VIH(AC)/VIL(AC)
VIH(AC)/VIL(AC)
VIH(AC)/VIL(AC)
table 52: data Setup aNd hOld ValueS at 1V/NS (dQSx, dQSx\ at 2V/NS) - ac/dc baSed
-
-
65
75
125
150
25
75
100
ps
ps
ps
-
-
45
∆tDS ∆tDH ∆tDS ∆tDH ∆tDS ∆tDH ∆tDS ∆tDH ∆tDS ∆tDH ∆tDS ∆tDH ∆tDS ∆tDH
2.0
1.5
1.0
0.9
0.8
0.7
0.6
0.5
0.4
table 53: deratiNG Value FOr tdS/tdh – ac175/dc100 - baSed
DQSlew Rate V/ns
4.0V/ns 3.0V/ns 2.0V/ns 1.8V/ns 1.6V/ns 1.4V/ns
DQS, DQS# Differential Slew Rate
ΔtDS, ΔtDH Derating (ps) – AC175/D100-Based
Shaded cells indicate slew-rate combinations not supported
88
59
0
50
34
0
88
59
0
-2
50
34
0
-4
88
59
0
-2
-6
50
34
0
-4
-10
67
8
6
2
-3
42
8
4
-2
-8
16
14
10
5
-1
16
12
6
0
-10
22
18
13
7
-11
20
14
8
-2
-16
26
21
15
-2
-30
24
18
8
-6
-26
29
23
5
-22
34
24
10
-10
∆tDS ∆tDH ∆tDS ∆tDH ∆tDS ∆tDH ∆tDS ∆tDH ∆tDS ∆tDH ∆tDS ∆tDH ∆tDS
2.0
1.5
1.0
0.9
0.8
0.7
0.6
0.5
0.4
table 54: deratiNG Value FOr tdS/tdh – ac150/dc100 - baSed
DQ Slew Rate V/ns
4.0V/ns 3.0V/ns 2.0V/ns 1.8V/ns 1.6V/ns 1.4V/ns
DQS, DQS# Differential Slew Rate
ΔtDS, ΔtDH Derating (ps) – AC150/DC100-Based
Shaded cells indicate slew-rate combinations not supported
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75
50
0
50
34
0
75
50
0
0
50
34
0
-4
75
50
0
0
0
50
34
0
-4
-10
58
8
8
8
8
42
8
4
-2
-8
16
16
16
16
15
16
12
6
0
-10
24
24
24
23
14
20
14
8
-2
-16
32
32
31
22
7
24
18
8
-6
-26
40
39
30
15
34
24
10
-10
Slew Rate (V/ns) tVAC at 175mV(ps) [MIN] tVAC >2.0
2.0
1.5
1.0
0.9
0.8
0.7
0.6
0.5
<0.5
175
170
167
163
162
161
159
155
150
150
table 55: reQuired time tVac abOVe Vih(ac) (belOw Vil[ac]) FOr a Valid traNSitiON
75
57
50
38
34
29
22
13
0
0
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FiGure 29 - NOmiNal Slew rate aNd tVac FOr tdS (dQ – StrObe)
Notes: 1. Both the clock and the strobe are drawn on different time scales.
VSS
Setup slew raterising signal
Setup slew rate
∆TF ∆TR
= =
VDDQ
VIH(AC) MIN
VIH(DC) MIN
VREF(DC)
VIL(DC) MAX
VIL(AC) MAX
Nominalslew rate
VREF to AC region
tVAC
tVAC
tDHtDS
DQS
DQS#
tDHtDS
CK#
CK
VREF to AC region
Nominalslew rate
VIH(AC) MIN - VREF (DC)
∆TR
VREF(DC) - VIL(AC) MAX
∆TFrising signal
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FiGure 30 - NOmiNal Slew rate FOr tdh (dQ – StrObe)
Notes: 1. Both the clock and the strobe are drawn on different time scales.
VSS
Hold slew ratefalling signal
Hold slew raterising signal
∆TR ∆TF
==
VDDQ
VIH(AC) MIN
VIH(DC) MIN
VREF(DC)
VIL(DC) MAX
VIL(AC) MAX
Nominalslew rateDC to VREF
region
tDHtDS
DQS
DQS#
tDHtDS
CK#
CK
DC to VREF
region
Nominalslew rate
VREF(DC) - VIL(DC) MAX
∆TR
VIH(DC) MIN - VREF(DC)
∆TF
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FiGure 31 - NOmiNal Slew rate aNd tVac FOr tdS (dQ – StrObe)
Notes: 1. Both the clock and the strobe are drawn on different time scales.
VSS
Setup slew raterising signal
Setup slew ratefalling signal
∆TF
∆TR
=
=
VDDQ
VIH(AC) MIN
VIH(DC) MIN
VREF(DC)
VIL(DC) MAX
VIL(AC) MAX
Tangentline
VREF to ACregion
Nominalline
tVAC
tVAC
tDHtDS
DQS
DQS#
tDHtDS
CK#
CK
VREF to ACregion
Tangentline
Nominalline
∆TR
Tangent line (VREF[DC] - VIL[AC] MAX)
∆TF
Tangent line (V IH[AC] MIN - VREF [DC])
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FiGure 32 - NOmiNal Slew rate FOr tdh (dQ – StrObe)
Notes: 1. Both the clock and the strobe are drawn on different time scales.
VSS
Hold slew ratefalling signal
∆TF∆TR
=
VDDQ
VIH(AC) MIN
VIH(DC) MIN
VREF(DC)
VIL(DC) MAX
VIL(AC) MAX
Tangentline
DC to VREF
region
Hold slew rate=
DQS
DQS#
CK#
CK
DC to VREF
region
Tangentline
Nominalline
Nominalline
Tangent line (VIH [DC] MIN - VREF[DC])
∆TF
Tangent line (VREF[DC] - VIL[DC] MAX)
∆TR
tDS tDH tDS tDH
falling signal
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PackaGe OutliNe dimeNSiONS
Function Symbol Cycle Cycle CS\ RAS\ CAS\ WE\ BA[2:0] An A12
Mode Register Set
REFRESH
SELF REFRESH entry
SELF REFRESH exit
Single-Bank PRECHARGE
PRECHARGE all banks
Bank ACTIVATE
NO OPERATION
Device DESELECTED
POWER-DOWN entry
POWER-DOWN exit
ZQ CALIBRATION LONG
ZQ CALIBRATION SHORT
6
6,7
8
8
8
8
8
8
8
8
8
8
8
8
9
10
6
6,11
12
table 56: truth table - cOmmaNd
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
H
H
H
H
H
H
H
H
H
H
H
H
H
X
H
H
L
L
L
L
L
L
H
H
H
H
H
H
H
H
H
H
H
H
H
X
H
H
L
H
H
L
L
H
L
L
L
L
L
L
H
H
H
H
H
H
H
X
L
L
BA
V
V
V
VBA
V
BA
BA
BA
BA
BA
BA
BA
BA
BA
BA
BA
BA
BA
V
X
V
V
X
X
V
V
V
V
V
RFU
RFU
RFU
RFU
RFU
RFU
RFU
RFU
RFU
RFU
RFU
RFU
V
X
V
V
X
X
V
V
V
V
V
V
L
H
V
L
H
V
L
H
V
L
H
V
X
V
V
X
X
V
V
V
L
H
L
L
L
H
H
H
L
L
L
H
H
H
V
X
V
V
H
L
V
V
V
V
V
RA
CA
CA
CA
CA
CA
CA
CA
CA
CA
CA
CA
CA
V
X
V
V
X
X
MRS
REF
SRE
SRX
PRE
PREA
ACT
WR
WRS4
WRS8
WRAP
WRAPS4
WRAPS8
RD
RDS4
RDS8
RDAP
RDAPS4
RDAPS8
NOP
DES
PDE
PDX
ZQCL
ZQCS
H
H
H
L
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
L
H
H
H
H
L
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
H
L
H
H
H
WRITE
WRITE with AUTO
PRECHARGE
READ
READ with AUTO
PRECHARGE
BL8MRSBC4MRS
BC4OTF
BL8OTF
BL8MRSBC4MRS
BC4OTF
BL8OTF
BL8MRSBC4MRS
BC4OTF
BL8OTF
BL8MRSBC4MRS
BC4OTF
BL8OTF
HL
LHLH
VH
VH
VH
HV
HV
HV
HV
HV
HV
CKE
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8. Burst READs orWRITEs cannot be terminated or interrupted,MRS
(fixed)andOTFBL/BCaredefinedinMR0.
9. ThepurposeoftheNOPcommandistopreventtheDRAMfromregistering
anyunwantedcommands.ANOPwillnotterminateandoperationthatis
inexecution.
10. TheDESandNOPcommandsperformsimilarly.
11. ThePOWER-DOWNmode does not perform anyREFRESHopera-
tions.
12. ZQCALIBRATIONLONG isused foreitherZQINT (firstZQCLcom-
mandduringinitialization)orZQOPER(ZQCLcommandafterinitializa-
tion).
NOTES:1. CommandsaredefinedbystatesofCS\,RAS\,CAS\,WE\,andCKEat
therisingedgeof theclock. TheMSBofBA,RA,andCAaredevice-
densityandconfiguration-dependent.
2. RESET\isLOWenabledandusedonlyforasynchronousRESET.Thus,
RESET\mustbeheldHIGHduringanynormaloperation.
3. ThestateofODTdoesnotaffectthestatesdescribedinthistable.
4. Operationsapplytothebankdefinedbythebankaddress.ForMRS,BA
selectsoneoffourmoderegisters.
5. “V”means“H”or“L”(adefinedlogiclevel),and“X”means“Don’tCare”.
6. SeeTable57foradditionalinformationonCKEtransition.
7. SELFREFRESHexitisasynchronous.
COMMANDS TRUTH TABLE
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Current State 3 POWER-DOWN
SELF REFRESH
Bank(s) ACTIVE
READING
WRITING
PRECHARGING
REFRESHING
All Banks IDLE
table 57: truth table - cke
L
H
L
H
L
L
L
L
L
L
(n-1)
Previous Cycle 4 (n)
Present Cycle 4 (RAS\, CAS\, WE\, CS\)
Command 5 Action 5 NotesL
L
L
H
H
H
H
H
H
H
“Don’tCare”
DESorNOP
“Don’tCare”
DESorNOP
DESorNOP
DESorNOP
DESorNOP
DESorNOP
DESorNOP
REFRESH
MaintainPOWER-DOWN
POWER-DOWNexit
MaintainSELFREFRESH
SELFREFRESHexit
ActivePOWER-DOWNentry
POWER-DOWNentry
POWER-DOWNentry
PRECHARGEPOWER-DOWNentry
PRECHARGEPOWER-DOWNentry
SELFREFRESH
1,2
1,2
1,2
1,2
1,2
1,2
1,2
1,2
1,2,6
CKE
4. CKE(n)isthelogicstateofCKEatclockedgen,CKE(n-1)wasthe
stateofCKEatthepreviousclockedge.
5. COMMANDisthecommandregisteredat theclockedge(mustbea
legal command as defined inTable 56). Action is a result ofCOM-
MAND.ODTdoesnotaffectthestatesdescribedinthistableandis
notlisted.
6. Idlestate=allbanksareclosed,nodataburstsareinprogress,CKEis
HIGHandalltimingsfrompreviousoperationsaresatisfied.AllSELF
REFRESHexitandPOWER-DOWNexitparametersarealsosatisfied.
NOTES:
1. Allstatesandsequencesnotshownareillegalorreservedunlessexplic-
itlydescribedelsewhereinthisdocument.2. tCKE(MIN)meansCKEmustberegisteredatmultipleconsecutiveposi-
tiveclockedges.CKEmustremainatthevalidinputleveltheentiretime
ittakestoachievetherequirednumberofregistrationclocks.Thus,after
anyCKEtransition,CKEmaynottransitionfromitsvalidlevelduringthe
timeperiodoftIS+tCKE(MIN)+tIH.
3. Currentstate=ThestateoftheSDRAMimmediatelypriortoclockedge
n.
DESELECT (DES)
TheDEScommand(CS\HIGH)preventsnewcommandsfrombeingexe-cutedbytheSDRAM.Operationsalreadyinprogressarenotaffected.
NO OPERATION (NOP)
TheNOPcommand(CS\LOW)preventsunwantedcommandsfrombeingregisteredduring idleorwaitstates. Operationsalready inprogressarenotaffected.
ZQ CALIBRATION
ZQ Calibration LONG (ZQCL)
TheZQCLcommandisusedtoperformtheinitialcalibrationduringapower-upinitializationandresetsequence.Thiscommandmaybeissuedatanytimebythecontrollerdependingonthesystemenvironment.TheZQCLcommandtriggersthecalibrationengineinsidetheSDRAM.Aftercalibrationisachieved,thecalibratedvaluesaretransferredfromthecalibrationenginetotheSDRAMI/O,whicharereflectedasupdatedRONandODTvalues.
TheSDRAMisallowedatimingwindowdefinedbyeithertZQINITortZQOPERtoperformthefullcalibrationandtransferofvalues.WhenZQCLisissuedduringtheinitializationsequence,thetimingparametertZQINITmustbesatisfied.Wheninitializationiscomplete,subsequentZQCLcommandsrequirethetimingparametertZQOPERtobesatisfied.
ZQ Calibration SHORT (ZQCS)
TheZQCScommandisusedtoperformperiodiccalibrationstoaccountforsmallvoltageandtemperaturevariations.TheshortertimingwindowisprovidedtoperformthereducedcalibrationandtransferofvaluesasdefinedbytimingparametertZQCS.AZQCScommandcaneffectivelycorrectaminimumof0.5%RON and RTTimpedanceerrorswithin64clockcycles,assumingthemaximumsensitivitiesspecifiedinTable37andTable38.
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ACTIVATE
TheACTIVATEcommandisusedtoopen(orACTIVATE)arowinaparticularbankforasubsequentaccess.ThevalueontheBA[2:0]inputsselectsthebank,andtheaddressprovidedoninputsA[n:0]selectstherow.Thisrowremainsopen(orACTIVE)foraccessesuntilaPRECHARGEcommandisissuedtothatbank.
APRECHARGEcommandmustbeissuedbeforeopeningadiffer-entrowinthesamebank.
READ
TheREADcommandisusedtoinitiateaburstREADaccesstoanACTIVErow.TheaddressprovidedoninputsA[2:0]selectsthestartingcolumnaddressdependingontheburstlengthandbursttypeselected.ThevalueoninputA10determineswhetherornotautoprechargeisused.Ifautoprechargeisselected,therowbeingaccessedwillbePRECHARGEDattheendoftheREADburst.IfAUTOPRE-CHARGEisnotselected,therowwillremainopenforsubsequentaccesses.ThevalueoninputA12(ifenabledintheMODEREGIS-TER)whentheREADcommandisissued,determineswhetherBC4(chop)orBL8isused.AfteraREADcommandisissued,theREADburstmaynotbeinterrupted.AsummaryofREADcommandsisshowninTable58.
table 58: read cOmmaNd Summary
Function Symbol Cycle Cycle CS\ RAS\ CAS\ WE\ BA[2:0] An A12
L
L
L
L
L
L
H
H
H
H
H
H
L
L
L
L
L
L
H
H
H
H
H
H
BA
BA
BA
BA
BA
BA
RFU
RFU
RFU
RFU
RFU
RFU
V
L
H
V
L
H
L
L
L
H
H
H
CA
CA
CA
CA
CA
CA
RD
RDS4
RDS8
RDAP
RDAPS4
RDAPS8
H
H
H
H
H
H
CKE
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READ
READ with AUTO
PRECHARGE
BL8MRSBC4MRS
BC4OTF
BL8OTF
BL8MRSBC4MRS
BC4OTF
BL8OTF
WRITE
TheWRITEcommandisusedtoinitiateaburstWRITEaccesstoanACTIVErow.ThevalueontheBA[2:0]inputsselectsthebank.ThevalueoninputA10determineswhetherornotAUTOPRECHARGEisused.ThevalueoninputA12(ifenabledintheMODEREGISTER[MR])whentheWRITEcommandisissued,determineswhetherBC4(chop)orBL8isused.TheWRITEcommandsummaryisshowninTable62.
table 59: write cOmmaNd Summary
Function Symbol Cycle Cycle CS\ RAS\ CAS\ WE\ BA[2:0] An A12
L
L
L
L
L
L
H
H
H
H
H
H
L
L
L
L
L
L
L
L
L
L
L
L
BA
BA
BA
BA
BA
BA
RFU
RFU
RFU
RFU
RFU
RFU
V
L
H
V
L
H
L
L
L
H
H
H
CA
CA
CA
CA
CA
CA
WR
WRS4
WRS8
WRAP
WRAPS4
WRAPS8
H
H
H
H
H
H
CKE
Prev Next
WRITE
WRITE with AUTO
PRECHARGE
BL8MRSBC4MRS
BC4OTF
BL8OTF
BL8MRSBC4MRS
BC4OTF
BL8OTF
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ThePRECHARGEcommandisusedtoDEACTIVATEtheopenrowinaparticularbankorinallbanks.Thebank(s)areavailableforasub-sequentrowaccessataspecifiedtime(tRP)afterthePRECHARGEcommandisissued,exceptinthecaseofconcurrentAUTOPRE-CHARGE.AREADorWRITEcommandtoadifferentbankisallowedduringconcurrentAUTOPRECHARGEaslongasitdoesnotinterruptthedatatransferinthecurrentbankanddoesnotviolateanyothertimingparameters.InputA10determineswhetheroneorallbanksareprecharged.Inthecasewhereonlyonebankisrecharged.InputsBA[2:0]selectthebank;otherwise,BA[2:0]aretreatedas“Don’tCare”.AfterabankisPRECHARGED,itisintheidlestateandmustbeacti-vatedpriortoanyREADorWRITEcommandsbeingissuedtothatbank.APRECHARGEcommandistreatedasaNOPifthereisnoopenrowinthatbank(idlestate)orifthepreviouslyopenrowisalreadyintheprocessofprecharging.However,thePRECHARGEperiodisdeterminedbythelastPRECHARGEcommandissuedtothebank.
PRECHARGE
REFRESHisusedduringnormaloperationoftheSDRAMandisanalo-goustoCAS\-beforeRAS\(CBR)refreshorAUTOREFRESH.Thiscom-mandisnon-persistent,soitmustbeissuedeachtimeaREFRESHisrequired.TheaddressingisgeneratedbytheinternalREFRESHcom-mand.TheSDRAMrequiresREFRESHcyclesatanaverageintervalof7.8µs(maximumwhenTA≤85°Cor3.9µsMAXwhenTA≤95°C).TheREFRESHperiodbeginswhentheREFRESHcommandisregisteredandendstRFC(MIN)later.
Toallowforimprovedefficiencyinschedulingandswitchingbetweentasks,someflexibilityintheabsoluteREFRESHintervalisprovided.AmaximumofeightREFRESHcommandscanbepostedtoanygivenSDRAM,meaningthatthemaximumabsoluteintervalbetweenanyREFRESHcommandandthenextREFRESHcommandisninetimesthemaximumaverageintervalrefreshrate.SELFREFRESHmaybeenteredwithuptoeightREFRESHcommandsbeingposted.AfterexitingSELFREFRESH(whenenteredwithpostedREFRESHcommands)additionalpostingofREFRESHcommandsisallowedtotheextentthemaximumnumberofcumulativepostedREFRESHcommands(bothpreandpostSELFREFRESH)doesnotexceedeightREFRESHcommands.
REFRESH
FiGure 33 - reFreSh mOde
Notes: 1. NOP commands are shown for ease of illustration; other valid commands may be possible at these times. CKE must be active during the PRECHARGE, ACTIVATE, and REFRESH commands, but may be inactive at other times (see “Power-Down Mode”.
NOP1NOP1 NOP1PRE
RA
Bank(s) 3 BA
REF NOP1 REF2 NOP1 ACTNOP1
One bank
All banks
tCK tCH tCL
RA
tRFC2tRP tRFC (MIN)
T0 T1 T2 T3 T4 Ta0 Tb0Ta1 Tb1 Tb2
Don’t CareIndicates A Break in Time Scale
Valid 1 Valid 1 Valid 1
CK
CK#
Command
CKE
Address
A10
BA[2:0]
DQ4
DM4
DQS, DQS#4
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TheSELFREFRESHcommandisusedtoretaindataintheSDRAM,eveniftherestofthesystemispowereddown.WhenintheSELFREFRESHmode,theSDRAMretainsdatawithoutexternalclocking.TheSELFREFRESHmodeisalsoaconvenientmethodusedtoenable/disabletheDLLaswellastochangetheclockfrequencywithintheallowedsynchronousoperatingrange.Allpowersupplyinputs(includingVREFCAandVREFDQ)mustbemaintainedatvalidlevelsuponentry/exitandduringSELFREFRESHmodeoperation.Allpowersupplyinputs(includingVREFCAandVREFDQ)mustbemaintainedatvalidlevelsuponentry/exitandduringSELFREFRESHmodeundercertainconditions:
•Vss<VREFDQ<VDDismaintained•VREFDQisvalidandstablepriortoCKEgoingbackHIGH•ThefirstWRITEoperationmaynotoccurearlierthan512clocksafterVREFDQisvalid•AllotherSELFREFRESHmodeexittimerequirementsaremet.
SELF REFRESH
IftheDLLisdisabledbytheMODEREGISTER(MR1[0]canbeswitchedduringinitializationorlater),theSDRAMistargeted,butnotguaranteedtooperatesimilarlytotheNORMALmodewithafewimportantexceptions:
• TheSDRAMsupportsonlyonevalueofCASlatency(CL=6)andonevalueofCASWRITElatency(CWL=6).• DLLDISABLEmodeaffectstheREADdataclock-to-datastroberelationship(tDQSCK),butnottheREADdata-to-datastroberelationship(tDQSQ,tQH).SpecialattentionisneededtolinetheREADdataupwiththecontrollertimedomainwhentheDLLisdisabled.
• InNORMALoperation(DLLon),tDQSCKstartsfromtherisingclockedgeAL+CLcyclesaftertheREADcommand.InDLLDISABLEmode,tDQSCKstartsAL=CL–1cyclesaftertheREADcommand.Additionally,withtheDLLdisabled,thevalueoftDQSCKcouldbelargerthantCK.
TheODTfeatureisnotsupportedduringDLLDISABLEmode(includingdynamicODT).TheODTresistorsmustbedisabledbycontinuouslyregisteringtheODTballLOWbyprogrammingRTT_NORMMR1[9,6,2]andRTT_WRMR2[10,9]to“0”whileinDLLDISABLEmode.
SpecificstepsmustbefollowedtoswitchbetweentheDLLenableandDLLDISABLEmodesduetoagapintheallowedclockratesbetweenthetwomodes(tCK[AVG]MAXandtCK[DLLDISABLE]MIN,respectively).TheonlytimetheclockisallowedtocrossthisclockrategapisduringSELFREFRESHmode.Thus,therequiredprocedureforswitchingfromtheDLLENABLEtoDLLDISABLEmodeistochangefrequencycuringselfrefresh(seeFigure34):
1. StartingfromtheIDLEstate(allbanksarePRECHARGED,alltimingsarefulfilled,ODTisturnedoff,andRTT_NOMandRTT_
DLL DISABLE MODE
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FiGure 34 - dll eNable mOde tO dll diSable mOde
Command
T0 T1 Ta0 Ta1 Tb0 Tc0
76
Td0 Td1 Te0 Te1 Tf0
CKCK#
ODT9 Valid1
Don’t Care
Valid1
SRE3 NOPMRS2 NOP SRX4 MRS5 Valid1NOP NOP
Indicates a Break in Time Scale
tMOD tCKSRE tMODtXS
tCKESR
CKE
tCKSRX8
NOTES:
1. Anyvalidcommand.
2. DisableDLLbysettingMR1[0]to“1.”
3. WaittXS,thensetMR1[0]to“0”toenableDLL.
4. WaittMRD,thensetMR0[8]to“1”tobeginDLLRESET.
5. WaittMRD,updateregisters(CL,CWL,andwriterecoverymaybenecessary).
6. WaittMOD,anyvalidcommand.
7. Startingwiththeidlestate.
8. Changefrequency.
9. ClockmustbestableatleasttCKSRX.
10. StaticLOWincaseRTT_NOM or RTT_WRisenabled;otherwise,staticLOWorHIGH.
AsimilarprocedureisrequiredforswitchingfromtheDLLdisablemodebacktotheDLLenablemode.Thisalsorequireschangingthefre-quencyduringselfrefreshmode(seeFigure44onpage99).
1.Startingfromtheidlestate(allbanksareprecharged,alltimingsarefulfilled,ODTisturnedoff,andRTT_NOMandRTT_WRareHigh-Z),enterselfrefreshmode.
2.AftertCKSREissatisfied,changethefrequencytothenewclockrate.
3.SelfrefreshmaybeexitedwhentheclockisstablewiththenewfrequencyfortCKSRX.AftertXSissatisfied,updatethemoderegisterswiththeappropriatevalues.Ataminimum,setMR1[0]to“0”toenabletheDLL.WaittMRD,thensetMR0[8]to“1”toenableDLLRESET.
4.AfteranothertMRDdelayissatisfied,thenupdatetheremainingmoderegisterswiththeappropriatevalues.
5.TheDRAMwillbereadyforitsnextcommandintheDLLenablemodeafterthegreateroftMRD or tMODhasbeensatis-fied.However,beforeapplyinganycommandorfunctionrequiringalockedDLL,adelayoftDLLKafterDLLRESETmustbesatisfied.AZQCLcommandshouldbeissuedwiththeappropriatetimingsmetaswell.
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FiGure 35- dll diSable mOde tO dll eNable mOde
Indicates a Break in Time Scale
tC
tDLLK
CKE
T0 Ta0 Ta1 Tb0 Tc0 Tc1 Td0 Te0 Tf0 Tg0
CKCK#
ODT10
SRE1 NOPCommand NOP SRX2 MRS3 MRS4 MRS5 Valid6
Valid
Don’t Care
87 tCKSRE
Th0
tCKSRX9
ODTL off + 1 × tCK
tXS tMRD tMRD
KESR
NOTES:
1. EnterSELFREFRESH.
2. ExitSELFREFRESH.
3. WaittXS,thensetMR1[0]to“0”toenableDLL.
4. WaittMRD,thensetMR0[8]to“1”tobeginDLLRESET.
5. WaittMRD,updateregisters(CL,CWL,andwriterecoverymaybenecessary).
6. WaittMOD,anyvalidcommand.
7. Startingwiththeidlestate.
8. Changefrequency.
9. ClockmustbestableatleasttCKSRX.
10. StaticLOWincaseRTT_NOM or RTT_WRisenabled;otherwise,staticLOWorHIGH.
TheclockfrequencyrangefortheDLLdisablemodeisspecifiedbytheparametertCKDLL_DIS.Duetolatencycounterandtimingrestrictions,onlyCL=6andCWL=6aresupported.
DLLdisablemodewillaffectthereaddataclocktodatastroberelationship(tDQSCK)butnotthedatastrobetodatarelationship(tDQSQ,tQH).Specialattentionisneededtothecontrollertimedomain.
ComparedtotheDLLonmodewheretDQSCKstartsfromtherisingclockedgeAL+CLcyclesaftertheREADcommand,theDLLdisablemodetDQSCKstartsAL+CL-1cyclesaftertheREADcommand(seeFigure45onpage100).
WRITEoperationsfunctionsimilarlybetweentheDLLenableandDLLdisablemodes;however,ODTfunctionalityisnotallowedwithDLLdisablemode.
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FiGure 36 - dll diSable tdQSck timiNG
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10
Don’t CareTransitioning Data
Valid
NOPREAD NOP NOP NOP NOP NOP NOP NOP NOP NOP
CK
CK#
Command
Address
DI b + 3
DI b + 2
DI b + 1
DI b
DI b + 7
DI b + 6
DI b + 5
DI b + 4
DQ BL8 DLL on
DQS, DQS# DLL on
DQ BL8 DLL disable
DQS, DQS# DLL off
DQ BL8 DLL disable
DQS, DQS# DLL off
RL = AL + CL = 6 (CL = 6, AL = 0)
CL = 6
DI b + 3
DI b + 2
DI b + 1
DI b
DI b + 7
DI b + 6
DI b + 5
DI b + 4
DI b + 3
DI b + 2
DI b + 1
DI b
DI b + 7
DI b + 6
DI b + 5
DI b + 4
tDQSCK (DLL_DIS) MIN
tDQSCK (DLL_ DIS) MAX
RL (DLL disable) = AL + (CL - 1) = 5
WhentheDRAMisinitialized,itrequirestheclocktobestableduringmostNORMALstatesofoperation.Thismeansthataftertheclockfrequencyhasbeensettothestablestate,theclockperiodisnotallowedtodeviateexceptwhatisallowedforbytheclockjitterandspreadspectrumclocking(SSC)specifications.
Theinputclockfrequencycanbechangedfromonestableclockratetoanotherundertwoconditions:SELFREFRESHmodeandPRECHARGEpower-downmode.Outsideofthesetwomodes,itisillegaltochangetheclockfrequency.FortheSELFREFRESHmodecondition,whentheDDR3SDRAMhasbeensuccessfullyplacedintoSELFREFRESHmodeandtCKSREhasbeensatisfied,thestateoftheclockbecomesa“Don’tCare”.Whentheclockbecomesa“Don’tCare”,changingtheclockfrequencyispermissible,providedthenewclockfrequencyisstablepriorto tCKSRX.Whenenteringandexitingselfrefreshmodeforthesolepurposeofchangingtheclockfrequency,theSELFREFRESHentryandexitspecificationsmuststillbemet.
ThePRECHARGEpower-downmodeconditioniswhentheDRAMisinPRECHARGEpower-downmode(eitherfastexitmodeorslowexitmode).EitherODTmustbeatalogicLOWorRTT_NOMandRTT_WRmustbedisabledviaMR1andMR2.ThisensuresRTT_NOMandRTT_WRareinanoffstatepriortoenteringPRECHARGEpower-downmodewhilemaintainingCKEatalogicLOW.AminimumoftCKSREmustoccurafterCKEgoesLOWbeforetheclockfrequencycanchange.Theinputclockfrequencyisallowedtochangeonlywithintheminimumandmaximumoperatingfrequencyspecifiedfortheparticularspeed/temperaturegrade(tCK[AVG]MINtotCK[AVG]MAX)device.Duringtheinputclockfrequencychange,CKEmustbeheldatastableLOWlevel.Whentheinputclockfrequencyischanged,astableclockmustbeprovidedtotheDRAM,tCKSRXbeforePRECHARGEpower-downmaybeexited.AfterPRECHARGEpower-downisexitedandtXPhasbeensatisfied,theDLLmustberesetviatheMRS.Dependingonthenewclockfrequency,additionalMRScommandsmayneedtobeissued.DuringtheDLLlocktime,RTT_NOMandRTT_WRmustremaininanoffstate.AftertheDLLlocktime,theDRAMisreadytooperatewithanewclockfrequency(period).ThisprocessisdepictedinFigure37.
INPUT CLOCK FREQUENCY CHANGE
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FiGure 37- chaNGe FreQueNcy duriNG precharGe pOwer-dOwN
CK
CK#
Command NOPNOPNOP
Address
CKE
DQ
DM
DQS, DQS#
NOP
tCK
Enter prechargepower-down mode
Exit prechargepower-down mode
T0 T1 Ta0 Tc0Tb0T2
Don’t Care
tCKE
tXP
MRS
DLL RESET
Valid
Valid
NOP
tCH
tIH t IS
tCL
Tc1 Td0 Te1Td1
tCKSRE
tCHbtCLb
tCKb
tCHbtCLb
tCKb
tCHbtCLb
tCKb
tCPDED
ODT
NOP
Te0
Previous clock frequency New clock frequency
Frequencychange
Indicates a Break in Time Scale
t IH t IS
t IH
t IS
tDLLK
tAOFPD/ tAOF
tCKSRX
High-Z
High-Z
NOTES:
1. Applicableforbothslow-exitandfast-exitprechargepower-downmodes.2. tAOFPDandtAOFmustbesatisfiedandoutputsHigh-ZpriortoT1(see“On-DieTermination(ODT)”for
exactrequirements).
3. IftheRTT_NOMfeaturewasenabledinthemoderegisterpriortoenteringprechargepower-down
mode, theODTsignalmustbecontinuously registeredLOWensuringRTT is inanoffstate. If
theRTT_NOMfeaturewasdisabledinthemoderegisterpriortoenteringprechargepower-down
mode,RTTwillremainintheoffstate.TheODTsignalcanberegisteredeitherLOWorHIGHin
thiscase.
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Forbettersignalintegrity,DDR3SDRAMmemorysub-systemdesignshaveadopteduseoffly-bytopologyforthecommands,addresses,controlsignalsandclocks.WRITElevelingisaschemeforthememorycontrollertode-skewtheDQSxstrobe(DQSx,DQSx\)toCKrelationshipattheSDRAMwithasimplefeedbackfeatureprovideditbytheDDR3SDRAMitself.WRITElevelingisgenerallyusedaspartoftheinitializationprocess,ifrequired.ForNORMALSDRAMoperation,thisfeaturemustbedisabled.ThisistheonlySDRAMoperationwheretheDQSfunctionsasaninput(tocapturetheincomingclock)andtheDQsfunctionasoutputs(toreportthestatoftheclock).NotethatnonstandardODTschemesarerequired.
ThememorycontrollerusingtheWRITElevelingproceduremusthaveadjustabledelaysettingonitsDQSstrobetoaligntherisingedgeofDQStotheclockattheSDRAMpins.ThisisaccomplishedwhentheSDRAMasynchronouslyfeedsbacktheCKstatusviatheDQbusandsampleswiththerisingedgeofDQS.ThecontrollerrepeatedlydelaystheDQSstrobeuntilaCKtransitionfrom“0”to“1”isdetected.TheDQSdelayestablishedthroughthisprocedurehelpsensuretDQSS,tDSS,andtDSHspecificationsinsystemsthatuseflybytopologybyde-skewingthetracelengthmismatch.A
WRITE LEVELING
FiGure 38- write leVeliNG cONcept
CK
CK#
Source
Differential DQS
Differential DQS
Differential DQS
DQ
DQ
CK
CK#
Destination
Destination
Push DQS to capture 0–1 transition
T0 T1 T2 T3 T4 T5 T6 T7
T0 T1 T2 T3 T4 T5 T6 Tn
CK
CK# T0 T1 T2 T3 T4 T5 T6 Tn
Don’t Care
1 1
0 0
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WhenWRITElevelingisenabled,therisingedgeofDQSsamplesCKandtherimeDQoutputsthesampledCK’sstatus.TheprimeDQforeachofthe(4)wordscontainedintheHiMODisDQ0forthelowbyte,DQ8forthehighbyte.ItoutputsthestatusofCKsampledbyDQSxandDQSx.AllotherDQs(DQ[7:1],DQ[15:9]forthelowword,DQ[23:17],DQ[31:25]forthenextword,DQ[39:33],DQ[47:41]forthenextandDQ[55:49],DQ[63:57]fortheHIGHword)continuetodriveLOW.TwoprimeDQoneachofthe(4)wordscontainedintheHiMODalloweachbytelanetobeleveledindependently.
WRITE LEVELING
AmemorycontrollerinitiatestheDRAMWRITELevelingmodebysettingtheMR1[7]toa“1”,assumingtheotherprogrammablefeatures(MR0,MR1,MR2,andMR3)arefirstsetandtheDLLisfullyresetandlocked.TheDQballsentertheWRITELevelingmodegoingfroma“HIGH-Z”statetoanunde-fineddrivingstatesotheDQbusshouldnotbedriven.DuringWRITELevelingmode,onlytheNOPandDEScommandsareallowed.Thememorycontrollershouldattempttolevelonlyonerankatatime;thus,theoutputsofotherranksshouldbedisabledbysettingMR1[12]toa“1”.ThememorycontrollermayassertODTafteratMODdelayastheSDRAMwillbereadytoprocesstheODTLondelay(WL-2tCK),provideditdoesnotviolatetheaforementionedtMODdelayrequirement.
ThememorycontrollermaydriveDQSx,LOWandDQSx\,HIGHaftertWLDQSENhasbeensatisfied.ThecontrollermaybegintotoggleDQSx,DQSxaftertWLMRD(oneDQSstoggleisDQSstransitioningfromaLOWstatetoaHIGHstatewithDQSx\transitioningfromaHIGHstatetoaLOWstate,thenbothtransitionbacktotheiroriginalstates).Ataminimum,ODTLonandtAONmustbesatisfiedatleastoneclockpriortoDQStoggling.
AftertWLMRDandDQSLOWpreamble(tWPRE)havebeensatisfied,thememorycontrollermayprovideeitherasingleDQSxtoggleormultipleDQSxtogglestosampleCKforagivenDQSxtoCKskew.EachDQStogglemustnotviolatetDQSL(MIN)andtDQSH(MIN)specifications.tDQSL(MAX)andtDQSH(MAX)specificationsarenotapplicableduringWRITElevelingmode.TheDQSxmustbeabletodistinguishtheCK’srisingedgewithintWLSand tWLH.TheprimeDQwilloutputtheCK’sstatusasynchronouslyfromtheassociatedDQSxrisingedgeCKcapturewithintWLO.TheremainingDQsthatalwaysdriveLOWwhenDQSistogglingmustbeLOWwithintWLOEafterthefirsttWLOissatisfied(theprimeDQsgoingLOW).Aspreviouslynoted,DQSxisaninputandnotanoutputduringthisprocess.Figure39depictsthebasictimingparametersfortheoverallwritelevelingprocedure.
ThememorycontrollerwilllikelysampleeachapplicableprimeDQstateanddeterminewhethertoincrementordecrementitDQSdelaysetting.AfterthememorycontrollerperformsenoughDQSxtogglestodetecttheCK’s“0-1”transition,thememorycontrollershouldlocktheDQSdelayset-
WRITE LEVELING PROCEDURE
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FiGure 39- write leVeliNG SeQueNce
CK CK#
Command
T1 T2
Early remaining DQ
Late remaining DQ
tWLOE
NOP2 NOP MRS1 NOP NOP
tWLStWLH
Don’t CareUndefined Driving ModeIndicates a Break in Time Scale
Prime DQ5
Differential DQS4
ODT
tMOD
tDQSL3 tDQSH3 tDQSH3
tWLO tWLMRD
tWLDQSEN
tWLO
tWLO
tWLO
tDQSL3
NOP NOP NOP NOP NOP NOP NOP
NOTES:
1. MRS:LoadMR1toenterwritelevelingmode.
2. NOP:NOPorDES.
3. DQS,DQS#needstofulfillminimumpulsewidthrequirementstDQSH(MIN)andtDQSL(MIN)as
definedforregularwrites.Themaximumpulsewidthissystem-dependent.
4. DifferentialDQSisthedifferentialdatastrobe(DQS,DQS#).Timingreferencepointsarethezero
crossings.ThesolidlinerepresentsDQS;thedottedlinerepresentsDQS#.
5. DRAMdriveslevelingfeedbackonaprimeDQ(DQ0forx4andx8).TheremainingDQaredriven
LOWandremaininthisstatethroughoutthelevelingprocedure.
AfterthedevicehasbeenWRITEleveled,thecontrollermustexitfromWRITELevelingmodebeforetheNORMALmodecanbeused.Figure40depictsageneralprocedureinexitingWRITELeveling.AfterthelastrisingDQS(capturinga“1”atT0),thememorycontrollershouldstopdrivingtheDQSsignalsaftertWLO(MAX)delayplusenoughdelaytoenablethememorycontrollertocapturetheapplicableprimeDQstate(at–Tb0).TheDQballsbecomeundefinedwhenDQSnolongerremainsLOWandtheyremainundefineduntiltMODaftertheMRScommand(atTe1).
TheODTinputshouldbedeassertedLOWsuchthatODTLoff(MIN)expiresaftertheDQSxisnolongerdrivingLOW.WhenODTLOWsatisfiestIS,ODTmustbekeptLOW(at–Tb0)untiltheSDRAMisreadyforeitheranotherranktobeleveledoruntiltheNORMALmodecanbeused.AfterDQSterminationisswitchedoff,WRITElevelmodeshouldbedisabledviatheMRScommand(atTA2).AftertMODissatisfied(atTe1),anyvalidcommandmayberegisteredbytheSDRAM.SomeMRScommandsmaybeissuedaftertMRD(atTd1).
WRITE LEVELING EXIT MODE
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FiGure 40- exit write leVeliNG
Notes: 1. The DQ result, “= 1,” between Ta0 and Tc0, is a result of the DQS, DQS# signals capturing CK HIGH just after the T0 state.
NOP
CK
T0 T1 T2 Ta0 Tb0 Tc0 Tc1 Tc2 Td0 Td1 Te0 Te1CK#
Command
ODT
RTT_DQ
NOP RMPONPONPONPONPON S NOP NOP
Address MR1
Valid Valid
Valid Valid
Don’t CareTransitioning
RTT DQS, RTT DQS R# TT_NOM
Undefined Driving Mode
tAOF (MAX)
tMRD
Indicates a Break in Time Scale
DQS, DQS#
CK = 1DQ
tIS
tAOF (MIN)
tMOD
tWLO + tWLOE
ODTL off
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Initialization
Thefollowingsequenceisrequiredforpowerupandinitialization,asshowninFigure41.
1. Applypower.RESET\isrecommendedtobebelow0.2xVDDQduringpowerramptoensuretheoutputsremaindisabled(HIGH-Z)andODToff(RTTisalsoHIGH-Z).Allotherinputs,includingODTmaybeundefined.
Duringpowerup,eitherofthefollowingconditionsmayexistandmustbemet:
•Condition A:
•VDDandVDDQaredrivenfromasinglepowersourceandarerampedwithamaximumdeltavoltagebetweenthemof∆V≤300mV.Slopereversalofanypowersupplysignalisallowed.ThevoltagelevelsonallballsotherthanVDD,VDDQ,VssandVssQmustbelessthanorequaltoVDDQandVDDononesideandmustbegreaterthanorequaltoVssQandVssontheotherside.•BothVDDandVDDQpowersuppliesramptoVDD(MIN)andVDDQ(MIN)withintVDDPR=200ms.•BothVDDandVDDQpowersuppliesramptoVDD(MIN)andVDDQ(MIN)withintVDDPR=200ms.•VREFDQtracksVDDx0.5,VREFCAtracksVDDx0.5.•VTTislimitedto0.95Vwhenthepowerrampiscompleteandisnotapplieddirectlytothedevice;however,tVTDshouldbe greaterthanorequaltozerotoavoiddevicelatchup.
•ConditionB: •VDDmaybeappliedbeforeoratthesametimeasVDDQ.•VDDQmaybeappliedbeforeoratthesametimeasVTT,VREFDQandVREFCA.•Noslopereversalsareallowedinthepowersupplyrampforthiscondition.
2. Untilstablepower,maintainRESET\LOWtoensuretheoutputsremaindisabled(HIGH-Z).Afterthepowerisstable,RESET\mustbeLOWforatleast200µstobegintheinitializationprocess.ODTwillremainintheHIGH-ZstatewhileRESET\isLOWanduntilCKEisregisteredHIGH.
3. CKEmustbeLOW10nspriortoRESET\transitioningHIGH.
4. AfterRESET\transitionsHIGH,wait500µs(minusoneclock)withCKELOW.
5. AfterthisCKELOWtime,CKEmaybebroughtHIGH(synchronously)andonlyNOPorDEScommandsmaybeissued.Theclockmustbepresentandvalidforatleast10ns(andaminimumoffiveclocks)andODTmustbedrivenLOWatleasttISpriortoCKEbeingreg-isteredHIGH.WhenCKEisregisteredHIGH,itmustbecontinuouslyregisteredHIGHuntilthefullinitializationprocessiscomplete.
6. AfterCKEisregisteredHIGHandaftertXPRhasbeensatisfied,MRScommandsmaybeissued.IssueanMRS(LOADMODE)com-mandtoMR2withtheapplicablesettings(provideLOWtoBA2andBA0andHIGHtoBA1).
7. IssueanMRScommandtoMR3withtheapplicablesettings.
8. IssueanMRScommandtoMR1withtheapplicablesettings,includingenablingtheDLLandconfiguringODT.
9. IssueandMRScommandtoMR0withtheapplicablesettings,includingaDLLRESETcommand.tDLLK(512)cyclesofclockinputarerequiredtolocktheDLL.
OPERATIONS
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FiGure 41- iNitializatiON SeQueNce
CKE
RTT
BA[2:0]
All voltagesupplies validand stable
T = 200µs (MIN)
DM
DQS
Address
A10
CK
CK#
tCL
Command NOP
T0 Ta0
Don’t Care
tCL
t IS
tCK
ODT
DQ
Tb0
tDLLK
MR1 withDLL enable
MR0 withDLL reset
tMRD tMOD
MRSMRS
BA0 = HBA1 = LBA2 = L
BA0 = LBA1 = LBA2 = L
Code Code
Code Code
Valid
Valid
Valid
Valid
Normaloperation
MR2 MR3
tMRD tMRD
MRSMRS
BA0 = LBA1 = HBA2 = L
BA0 = HBA1 = HBA2 = L
Code Code
Code Code
Tc0 Td0
VTT
VREF
VDDQ
VDD
RESET#
T = 500µs (MIN)
tCKSRX
Stable andvalid clock
Valid
Power-upramp
T (MAX) = 200ms
DRAM ready for external commands
T1
tZQ INIT
ZQ calibration
A10 = H
ZQCL
t IS
See power-upconditions
in the initialization
sequence text, set up 1
tXPR
Valid
= 20nst IOz
Indicates a Break in Time Scale
T (MIN) = 10ns
tVTD
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Moderegisters(MR0-MR3)areusedtodefinevariousmodesofprogrammableoperationoftheDRAM.AmoderegisterisprogrammedviatheMODEREGISTERSET(MRS)commandduringinitializationanditretainsthestoredinformation(exceptforMR0[8]whichisself-clearing)untilitiseitherreprogrammed,RESET\goesLOW,oruntilthedevicelosespower.
Contentsofamoderegistercanbealteredbyre-executingtheMRScommand.Iftheuserchoosestomodifyonlyasubsetofthemoderegister’svariables,allvariablesmustbeprogrammedwhentheMRScommandisissued.Reprogrammingthemoderegisterwillnotalterthecontentsofthememoryarray,provideditisperformedcorrectly.
TheMRScommandcanonlybeissued(orre-issued)whenallbanksareidleandinthePRECHARGEDstate(tRPissatisfiedandnodataburstsareinprogress).AfteranMRScommandhasbeenissued,twoparametersmustbesatisfied:tMRD and tMOD.
ThecontrollermustwaittMRDbeforeinitiatinganysubsequentMRScommands(seeFigure42).
MODE REGISTERS
FiGure 42- mrS-tO-mrS cOmmaNd timiNG (tmrd)
Valid Valid
MRS1 MRS2NOP NOP NOP NOP
T0 T1 T2 Ta0 Ta1 Ta2CK#
CK
Command
Address
CKE3
Don’t CareIndicates a Break in Time Scale
tMRD
NOTES:
1. PriortoissuingtheMRScommand,allbanksmustbeidleandprecharged,tRP(MIN)mustbesatisfied,
andnodataburstscanbeinprogress.thelevelingprocedure.2. tMRDspecifiestheMRS-to-MRScommandminimumcycletime.
3. CKEmust be registeredHIGH from theMRS command until tMRSPDEN (MIN) (see “Power-Down
Mode”onpage153).
4. ForaCASlatencychange,tXPDLLtimingmustbemetbeforeanynonMRScommand.
ThecontrollermustalsowaittMODbeforeinitiatinganynonMRScommands(excludingNOPandDES),asshowninFigure52onpage110.TheDRAMrequirestMODinordertoupdatetherequestedfeatures,withtheexceptionofDLLRESET,whichrequiresadditionaltime.UntiltMODhasbeensatis-fied,theupdatedfeaturesaretobeassumedunavailable.
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FiGure 43- mrS-tO-NONmrS cOmmaNd timiNG (tmOd)
CK CK#
Command
T1 T2
Early remaining DQ
Late remaining DQ
tWLOE
NOP2 NOP MRS1 NOP NOP
tWLStWLH
Don’t CareUndefined Driving ModeIndicates a Break in Time Scale
Prime DQ5
Differential DQS4
ODT
tMOD
tDQSL3 tDQSH3 tDQSH3
tWLO tWLMRD
tWLDQSEN
tWLO
tWLO
tWLO
tDQSL3
NOP NOP NOP NOP NOP NOP NOP
NOTES:
1. PriortoissuingtheMRScommand,allbanksmustbeidle(theymustbeprecharged,tRPmustbe
satisfied,andnodataburstscanbeinprogress).
2. PriortoTa2whentMOD(MIN)isbeingsatisfied,nocommands(exceptNOP/DES)maybeissued.
3. IfRTTwaspreviouslyenabled,ODTmustberegisteredLOWatT0sothatODTLissatisfiedprior
toTa1.ODTmustalsoberegisteredLOWateachrisingCKedgefromT0until tMOD(MIN)is
satisfiedatTa2.
4. CKEmustbe registeredHIGH from theMRScommanduntil tMRSPDEN(MIN),atwhich time
power-downmayoccur(see“Power-DownMode”onpage132).
MODE REGISTER 0 (MR0)
Thebaseregister,MR0isusedtodefinevariousDDR3iMODmodesofoperation.Thesedefinitionsincludetheselectionofaburstlength,bursttype,CASlatency,operatingmode,DLLRESET,WRITErecoveryandPRECHARGEpower-downmode,asshowninFigure44.
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MODE REGISTER 0 (MR0)
Accesseswithinagivenburstmaybeprogrammedtoeitherasequen-tialoraninterleavedorder.ThebursttypeisselectedviaMR0[3],asshowninFigure44.Theorderingofaccesseswithinaburstisdeter-minedbytheburstlength,thebursttypeandthestartingcolumnaddress,asshowninTable60.DDR3onlysupports4-bitburstchopand8-bitburstaccessmodes.Fullinterleavedaddressorderingissup-portedforREADs,whileWRITEsarerestrictedtonibble(BC4)orword(BL8)boundaries.
BURST TYPE BURST LENGTH
BurstlengthisdefinedbyMR0[1:0](seeFigure44).READandWRITEaccessestotheDDR3SDRAMiMODareburst-oriented,withtheburstlengthbeingprogrammableto“4”(chopmode).“8”(fixedburst),orselectableusingA12duringaREAD/WRITEcommand(onthefly).Theburstlengthdeterminesthemaximumnumberofcolumnloca-tionsthatcanbeaccessedforagivenREADorWRITEcommand.WhenMR0[1:0]issetto“01”duringaREAD/WRITEcommand,ifA12=0,thenBC4(chop)modeisselected.IfA12=1,thenBL8modeisselected.Specifictimingdiagrams,andturnaroundbetweenREAD/WRITEareshownintheREAD/WRITEsectionsofthisdocument.
WhenaREADorWRITEcommandisissued,ablockofcolumnsequaltotheburstlengthiseffectivelyselected.Allaccessesforthatbursttakeplacewithinthisblock,meaningthattheburstwillwrapwithintheblockifaboundaryisreached.TheblockisuniquelyselectedbyA[i:2]whentheburstlengthissetto“4”andbyA[i:3]whentheburstlengthissetto“8”(whereAiisthemostsignificantcolumnaddressbitforagivenstartinglocationwithintheblock.TheprogrammedburstlengthappliestobothREADandWRITEbursts.
FiGure 44- mOde reGiSter 0 (mr0) deFiNitiONS
Notes: 1. MR0[16, 13, 7, 2] are reserved for future use and must be programmed to “0.”
01 BLCAS# latency BTPD
A9 A7 A6 A5 A4 A3A8 A2 A1 A0
Mode register 0 (MR0)
Address bus
9 7 6 5 4 3 28 1 0
A10A12 A111AB 0AB
31 21 11 01
M3 01
READ Burst Type Sequential (nibble)
Interleaved
CAS LatencyReserved
567891011
M401010101
M500110011
M600001111
15DLL
Write RecoveryReserved
5678
1012
Reserved
WR00
M1201
Precharge PDDLL off (slow exit)DLL on (fast exit)
BA2
1601
Burst LengthFixed BL8
4 or 8 (on-the-fly via A12)Fixed BC4 (chop)
Reserved
M00101
M10011
M901010101
M1000110011
M1100001111
M14 0101
M150011
Mode Register Mode register 0 (MR0)Mode register 1 (MR1)Mode register 2 (MR2)Mode register 3 (MR3)
A13
1401 01
M801
DLL ResetNoYes
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Burst Length Read/Write Address (A[2,1,0]) Type = Sequential Type = Interleaved
4CHOP
8
0,1,2,3,Z,Z,Z,Z
1,0,3,2,Z,Z,Z,Z
2,3,0,1,Z,Z,Z,Z
3,2,1,0,Z,Z,Z,Z
4,5,6,7,Z,Z,Z,Z
5,4,7,6,Z,Z,Z,Z
6,7,4,5,Z,Z,Z,Z
7,6,5,4,Z,Z,Z,Z
0,1,2,3,X,X,X,X
4,5,6,7,X,X,X,X
0,1,2,3,4,5,6,7
1,0,3,2,5,4,7,6
2,3,0,1,6,7,4,5
3,2,1,0,7,6,5,4
4,5,6,7,0,1,2,3
5,4,7,6,1,0,3,2
6,7,4,5,2,3,0,1
7,6,5,4,3,2,1,0
0,1,2,3,4,5,6,7
table 60: burSt Order
Notes1,2
1,2
1,2
1,2
1,2
1,2
1,2
1,2
1,3,4
1,3,4
1
1
1
1
1
1
1
1
1,3
Burst Type (Decimal)
0,1,2,3,Z,Z,Z,Z
1,2,3,0,Z,Z,Z,Z
2,3,0,1,Z,Z,Z,Z
3,0,1,2,Z,Z,Z,Z
4,5,6,7,Z,Z,Z,Z
5,6,7,4,Z,Z,Z,Z
6,7,4,5,Z,Z,Z,Z
7,4,5,6,Z,Z,Z,Z
0,1,2,3,X,X,X,X
4,5,6,7,X,X,X,X
0,1,2,3,4,5,6,7
1,2.3,0,5,6,7,4
2,3,0,1,6,7,4,5
3,0,1,2,7,4,5,6
4,5,6,7,0,1,2,3
5,6,7,4,1,2,3,0
6,7,4,5,2,3,0,1
7,4,5,6,3,0,1,2
0,1,2,3,4,5,6,7
000
001
010
011
100
101
110
1 1 1
0VV
1VV
000
001
010
011
100
101
110
1 1 1
VVV
READ
WRITE
READ
WRITE
Starting Column
2. Z=DataandStrobeoutputdriversintri-state.
3. X=”Don’tCare”
NOTES:1. InternalREADandWRITEoperationsstartatthesamepointintimefor
BC4astheydoforBL8.
DLLRESETisdefinedbyMR0[8](seeFigure44).ProgrammingMR0[8]to“1”activatestheDLLRESETfunction.MR0[8]isself-clearing,mean-ingitreturnstoavalueof“0”aftertheDLLRESETfunctionhasbeeninitiated.
AnytimetheDLLRESETfunctionhasbeeninitiated,CKEmustbeHIGHandtheclockheldstablefor512(tDLLK)clockcyclesbeforeaREADcommandcanbeissued.Thisistoallowtimefortheinternalclocktobesynchronizedwiththeexternalclock.Failingtowaitforsynchronizationtooccurmayresultininvalidoutputtimingspecifi-cationssuchastDQSCKtimings.
DLL RESET
WRITERECOVERYtimeisdefinedbyMR0[11:9](seeFigure44).WRITERECOVERYvaluesof5,6,7,8,10or12maybeusedbyprogrammingMR0[11:9].TheuserisrequiredtoprogramthecorrectvalueofWRITERECOVERYandiscalculatedbydividingtWR(ns)bytCK(ns)andround-ingupanon-integervaluetothenextinteger:WR(cycles)=roundup(tWR[ns]/tCK[ns]).
WRITE RECOVERY
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ThePRECHARGEPDbitappliesonlywhenPRECHARGEpower-downmodeisbeingused.WhenMR0[12]issetto“0”,theDLLisoffduringPRECHARGEpower-downprovidingalowerstandbycurrentmode;however,tXPDLLmustbesatisfiedwhenexiting.WhenMR0[12]issetto“1”,theDLLcontinuestorunduringPRECHARGEpower-downmodetoenableafasterexitofPRECHARGEpower-downmode;how-ever,tXPmustbesatisfiedwhenexiting(seePower-Downmode).
PRECHARGE POWER-DOWN (PRECHARGE PD)
TheCLisdefinedbyMR0[6:4],asshowninFigure44.CASlatencyisthedelay,asmeasuredinclockcycles,betweentheinternalREADcom-mandandtheavailabilityofthefirstbitofvalidoutputdata.TheCLcanbesetto5,6,8,or10.DDR3SDRAMiMODsdonotsupporthalf-clocklatencies.
ExamplesofCL=6andCL=8areshowninFigure45(below).Ifaninter-nalREADcommandisregisteredatclockedgen,andtheCASlatencyismclocks,thedatawillbeavailablenominallycoincidentwithclockedgen+m.Table46indicatestheCLssupportedatavailableoperatingfrequencies.
CAS Latency (CL)
FiGure 45- read lateNcy
READ NOP NOP NOP NOP NOP NOPNOP
CK
CK#
Command
DQ
DQS, DQS#
DQS, DQS#
T0 T1 T2 T3 T4 T5 T6 T7 T8
Don’t Care
CK
CK#
Command
DQ
READ NOP NOP NOP NOP NOP NOPNOP
T0 T1 T2 T3 T4 T5 T6 T7 T8
DI n + 3
DI n + 1
DI n + 2
DI n + 4
DIn
DIn
NOP
NOP
AL = 0, CL = 8
AL = 0, CL = 6
Transitioning Data
NOTES:
1. Forillustrationpurposes,onlyCL=6andCL=8areshown.OtherCLvaluesare
possible.
2. ShownwithnominaltDQSCKandnominaltDSDQ.
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TheMODEREGISTER1(MR1)controlsadditionalfunctionsandfeaturesnotavailableintheothermoderegisters;QOFF(OUTPUTDISABLE),DLLENABLE/DLLDISABLE,RTT_NOMvalue(ODT),WRITELEVELING,POSTEDCASADDITIVElatency,andOUTPUTDRIVESTRENGTH.ThesefunctionsarecontrolledviathebitsshowninFigure46below.TheMR1registerisprogrammedviatheMR5commandandretainsthestoredinformationuntilitisreprogrammed,untilRESET\goesLOW(true),oruntilthedevicelosespower.ReprogrammingtheMR1registerwillnotalterthecontentsofthememoryarray,providedtheoperationisperformedcorrectly.
TheMR1registermustbeloadedwhenallbanksareidleandnoburstsareinprogress.ThecontrollermustsatisfythespecifiedtimingparameterstMRD and tMODbeforeinitiatingasubsequentoperation.
MODE REGISTER 1 (MR1)
FiGure 46- mOde reGiSter 1 (mr1) deFiNitiON
AL RTTQ Off
A9 A7 A6 A5 A4 A3 2A 8A A1 A0
Mode register 1 (MR1)
Address bus
9 7 6 5 4 3 2 8 1 0
A10 A12 A11 1AB 0AB
31 21 11 01
M001
DLL EnableEnable (normal)
Disable
M50011
Output Drive StrengthRZQ/6 (40Ω [NOM])RZQ/7 (34Ω [NOM])
ReservedReserved
14WL 1 SDO 0 DLL RTTTDQS
M12
0
1
Q Off
Enabled
Disabled
BA2
1501
M701
Write LevelizationDisable (normal)
Enable
Additive Latency (AL)Disabled (AL = 0)
AL = CL - 1AL = CL - 2Reserved
M30101
M40011
RTT ODS
M10101
A13
1601
M11
0
1
TDQS
Disabled
Enabled
01 01
RTT_NOM (ODT)2
Non-WritesRTT_NOM disabled
RZQ/4 (60Ω [NOM])RZQ/2 (120Ω [NOM])RZQ/6 (40Ω [NOM])RZQ/12 (20Ω [NOM])RZQ/8 (30Ω [NOM])
ReservedReserved
RTT_NOM (ODT)3
WritesRTT_NOM disabled
RZQ/4 (60Ω [NOM])RZQ/2 (120Ω [NOM])RZQ/6 (40Ω [NOM])
n/an/a
ReservedReserved
M201010101
M600110011
M900001111
Mode Register Mode register set 0 (MR0)Mode register set 1 (MR1)Mode register set 2 (MR2)Mode register set 3 (MR3)
M14 0101
M150011
NOTES:
1. MR1[16,13,10,8]arereservedforfutureuseandmustbeprogrammedto“0.”
2. Duringwrite leveling, ifMR1[7]andMR1[12]are“1” thenallRTT_NOMvaluesareavailable
foruse.
3. Duringwriteleveling,ifMR1[7]isa“1,”butMR1[12]isa“0,”thenonlyRTT_NOMwritevalues
areavailableforuse.
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TheDLLmaybeenabledordisabledbyprogrammingMR1[0]duringtheLOADMODEcommand,asshowninFigure46(previouspage).TheDLLmustbeenabledforNORMALoperation.DLLENABLEisrequiredduringpower-upinitializationanduponreturningtoNORMALoperationafterhavingDISABLEDtheDLLforthepurposeofdebuggingorevaluation.ENABLINGtheDLLshouldalwaysbefollowedbyresettingtheDLLusingtheappropriateLOADMODEcommand.
IftheDLLisenabledpriortoenteringSELFREFRESHmode,theDLLisautomaticallyDISABLEDwhenenteringSELFREFRESHoperationandisautomaticallyRE-ENABLEDandRESETuponexitofSELFREFRESH.IftheDLLisDISABLEDpriortoenteringSELFREFRESH,theDLLremainsDIS-ABLEDevenuponexitoftheSELFREFRESHoperationuntilithasbeenRE-ENABLEDandRESET.
TheDRAMisnottestedforcompliancewithNORMALmodetimingsorfunctionalitywhentheDLLisdisabled.AnattempthasbeenmadefortheDRAMtooperateintheNORMALmodewheneverpossiblewhentheDLLisdisabled;however,byindustrystandards,thefollowingexceptionshavebeenobserved,definedandlisted:
1. ODTisNOTALLOWEDtobeused2.TheOUTPUTDATAisnolongeredge-alignedtotheclock3. CLandCWLcanonlybesixclocks
WhentheDLLisDISABLED,timingandfunctionalitycanvaryfromtheNORMALoperationalspecificationswhentheDLLisenabled.DISABLINGtheDLLalsoimpliestheneedtochangetheclockfrequency.
DLL ENABLE/DLL DISABLE
ODTresistanceRTT_NOMisdefinedbyMR1[9,6,2](seeFigure46).TheRTTterminationvalueappliestotheDQx,DMx,DQSxandQSx\.TheDDR3devicearchitecturesupportsmultipleRTTterminationvaluesbasedonRZQ/nwherencanbe3,4,6,8or12andRZQis240Ω.
UnlikeDDR2,DDR3ODTmustbeturnedoffpriortoREADINGdataoutandmustremainoffduringREADburst.RTT_NOMterminationisallowedanytimeaftertheDRAMisinitialized,calibrated,andnotperformingREADaccesses,orinSELFREFRESHmode.Additionally,WRITEaccesseswithdynamicODTenabled(RTT_WR)temporarilyreplacesRTT_NOMwithRTT_WR.
Theactualeffectivetermination,RTT_EFF,maybedifferentfromtheRTTtargetedvalueduetonon-linearityofthetermination.ForRTT_EFFvaluesandcalculations,seetheON-DIETERMINATION(ODT)descriptionlaterinthisDS.
TheODTfeatureisdesignedtoimprovesignalintegrityofthememorydevicebyenablingtheDDR3SDRAMcontrollertoindependentlyturnON/OFFODTforanyoralldevicesintheenddesignsarray.TheODTinputcontrolpinisusedtodeterminewhenRTTisturnedon(ODTLon)andoff(ODTLoff),assumingODThasbeenENABLEDviaMR1[9,6,2].
TimingsforODTaredetailedinthe“ON-DIETermination(ODT)”description
ON-DIE TERMINATION (ODT)
TheDRAMusesaprogrammableimpedanceoutputbuffer.ThedrivestrengthmoderegistersettingisdefinedbyMR1[5:1],RZQ/7(34Ω[NOM])istheprimaryoutputdriverimpedancesettingforthedevice.Tocali-bratetheoutputdriverimpedance,andexternalprecisionresistor(RZQ)isconnectedbetweentheZQballandVssQ.Thevalueoftheresistoris240Ω±1%.
Theoutputimpedanceissetduringinitialization.Additionalimpedancecalibrationupdatesdonotaffectdeviceoperationandalldatasheettim-ingsandcurrentspecificationsaremetduringanupdate.
Tomeetthe34Ωspecification,theoutputdrivestrengthmustbesetto34Ωduringinitialization.Toobtainacalibratedoutputdriverimpedanceafterpower-up,thedeviceneedsacalibrationcommandthatispartoftheinitializationandresetprocedure.
OUTPUT DRIVE STRENGTH
TheOUTPUTENABLEfunctionisdefinedbyMR1[12],asshowninFigure46.Whenenabled(MR1[12]=0),alloutputs(DQx,DQSx,DQSx\)aretri-stated.TheoutputDISABLEfeatureisintendedtobeusedduringIDDcharacterizationoftheREADcurrentandduringtDQSSWRITELEVELINGonly.
OUTPUT ENABLE/DISABLE
TheWRITELEVELINGfunctionisenabledbyMR1[7],asshowninFigure46,WRITELEVELINGisused(duringinitialization)tode-skewtheDQSxstrobetoclockoffsetforfly-bytopologydesigns.Forsignalintegrity,someendusedesignsofmultipledevicesadoptedfly-bytopologyforthecom-mands,addresses,controlsignalsandclocks.
Thefly-bytopologybenefitsfromareducednumberofstubsandtheirlengths,however,fly-bytopologyinducesflighttimeskewbetweentheclockandDQSxstrobe(andDQx)ateachdeviceinthearray.ControllerswillhaveadifficulttimemaintainingtDQSS,tDSS and tDSHspecificationswithoutsupportingWRITELEVELINGinsystemswhichusefly-bytopologybaseddesigns.WRITELEVELINGtiminganddetailedoperationinforma-tionisprovidedin“WRITELEVELING.
WRITE LEVELING
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ALissupportedtomakethecommandanddatabusefficientforsustainablebandwidthsinDDR3SRAMs.MR1[4,3]definethevalueofAL(seeFigure46).MR1[4,3]enablestheusertoprogramtheDDR3SDRAMwithanAL=0,CL-1,orCL-2.
Withthisfeature,theDDR3SDRAMenablesaREADorWRITEcommandtobeissuedaftertheACTIVATEcommandforthatbankpriortotRCD(MIN).TheonlyrestrictionisACTIVATEtoREADorWRITE+AL≥ tRCD(MIN)mustbesatisfied.AssumingtRCD(MIN)=CL,atypicalapplicationusingthisfeature,setsAL=CL–1tCK=tRCD(MIN-1tCK.TheREADorWRITEcommandisheldforthetimeoftheALbeforeitisreleasedinternallytotheDDR3SDRAMiMODdevice.READlatency(RL)iscontrolledbythesumoftheALandCASlatency(CL),RL=AL+CL,WRITElatency(WL)isthesumofCASWRITElatencyandAL,WL=AL+CWL(see“MODEREGISTER2(MR2))”.ExamplesofREADandWRITElatenciesareshowninFigure47andFigure49.
POSTED CAS ADDITIVE LATENCY (AL)
FiGure 47- read lateNcy (al = 5, cl = 6)
CK
CK#
Command
DQ
DQS, DQS#
ACTIVE n
T0 T1
Don’t Care
NOP NOP
T6 T12
NOPREAD n
T13
NOP
DO n + 3
DO n + 2
DO n + 1
RL = AL + CL = 11
T14
NOP
DO n
tRCD (MIN)
AL = 5 CL = 6
T11
BC4
Indicates a Break in Time Scale
Transitioning Data
T2
NOP
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FiGure 48- mOde reGiSter 2 (mr2) deFiNitiON
Notes: 1. MR2[16, 13:11, 8, and 2:0] are reserved for future use and must all be programmed to “0.”
M14 0101
M150011
Mode RegisterMode register set 0 (MR0)Mode register set 1 (MR1)Mode register set 2 (MR2)Mode register set 3 (MR3)
A9 A7 A 6 A5 A4 A3A8 A2 A1 A0
Mode Register 2 (MR2)
Address bus
9 7 6 5 4 38 2 1 0
A10A12 A111AB 0AB
101 1121314151 CWL010
BA2
ASR16
01
A13
01 01 01 01 0101 SRTRTT_WR
M601
Auto Self Refresh(Optional)
Disabled: Manual Enabled: Automatic
M701
Self Refresh TemperatureNormal (0° C to 85° C)
Extended (0°C to 95° C)
CAS Write Latency (CWL)5 CK (tCK ≥ 2.5ns)
6 CK (2.5ns > tCK ≥ 1.875ns)7 CK (1.875ns > tCK ≥ 1.5ns)8 CK (1.5ns > tCK ≥ 1.25ns)
ReservedReservedReservedReserved
M301010101
M400110011
M500001111
M90101
M100011
Dynamic ODT ( RTT_WR )
RTT_WR disabledRZQ/4RZQ/2
Reserved
TheMODEREGISTER2(MR2)controlsadditionalfunctionsandfeaturesnotavailableintheothermoderegisters.TheseadditionalfunctionsareCASWRITElatency(CWL),AUTOSELFREFRESH(ASR),SELFREFRESHTEMPERATURE(SRT)andDYNAMICODT(RTT_WR).ThesefunctionsarecontrolledviathebitsshowninFigure48.TheMR2isprogrammedviatheMRScommandandwillretainthestoredinformationuntilitisprogrammedagainoruntilthedevicelosespower.ReprogrammingtheMR2registerwillnotalterthecontentsofthememoryarray,providedthattheoperationhasbeenperformedcorrectly.TheMR2registermustbeloadedwhenallbanksareidleandnodataburstsareinprogressandthememorycontrollermustwaitforthespecifiedtimetMRD and tMODbeforeinitiatingasubsequentoperation.
MODE REGISTER 2 (MR2)
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FiGure 49- caS write lateNcy
CK
CK#
Command
DQ
DQS, DQS#
ACTIVE n
BC4
T0 T1
Don’t Care
NOP NOP
T6 T12
NOPWRITE n
T13
NOP
DI n + 3
DI n + 2
DI n + 1
T14
NOP
DI n
tRCD (MIN)
NOP
AL = 5
T11
Indicates A Break in Time Scale
WL = AL + CWL = 11
Transitioning Data
T2
CWL = 6
CWLisdefinedbyMR2[5:3]andisthedelay,inclockcycles,fromthereleasingoftheinternalWRITEtothelatchingofthefirstdatain.CWLmustbecorrectlysettothecorrespondingoperatingclockfrequency(seeFigure48).TheoverallWRITELATENCY(WL)isequaltoCWL+AL(seeFigure46).
CAS WRITE LATENCY (CWL)
ModeregisterMR2[6]isusedtoDISABLE/ENABLEtheASRfunction.
WhenASRisDISABLED,theSELFREFRESHmode’sREFRESHrateisassumedtobeatthenormal85°Climit(commonlyreferredtoasthe1XREFRESHrate).IntheDISABLEDmode,ASRrequirestheusertoensuretheSDRAMneverexceedsaTAof85°CwhileinSELFREFRESHunlesstheuserenablestheSRTfeaturelistedbelow,supportinganelevatedtempupto+95°CwhileinSELFREFRESH.
ThestandardSELFREFRESHcurrenttestspecifiestestconditionstonormalambienttemperature(85°C)only,meaningifASRisenabled,thestandardSELFREFRESHcurrentspecificationdoesnotapply(seethe“EXTENDEDTEMPERATUREUSAGE”descriptionlaterinthisDS).
AUTO SELF REFRESH (ASR)REFRESHmode.ThestandardSELFREFRESHcurrenttestspecifiestestconditionstonormalambienttemperature(85°C)only,meaningifSRTisenabled,thestandardSELFREFRESHcurrentspecificationsdonotapply.
SRT vs. ASR
ModeregisterMR2[7]isusedtoDISABLE/ENABLEtheSRTfunc-tion.WhenSRTisDisabled,theSELFREFRESHmode’srefreshrateisassumedtobeatthenormal85°Climit.IntheDISABLEDmode,SRTrequirestheusertoensuretheSDRAMneverexceedstheTAlimitof85°CwhileinSELFREFRESHmodeunlesstheuserenablesASR.
WhenSRTisenabled,theSDRAMSELFREFRESHischangedinter-nallyfrom1Xto2X,regardlessoftheambienttemperature(TA).ThisenablestheusertooperatetheSDRAMbeyondthestandard85°Climituptotheoptionalextendedtemperaturerangeof+95°CwhileinSELF
SELF REFRESH TEMPERATURE (SRT)
Ifthenormalambienttemperaturelimitof85°Cisnotexceeded,thenneitherSRTnorASRisrequired,andbothcanbeDISABLEDthrough-outoperation.Iftheextendedtemperatureoptionisused,theuserisrequiredtoprovidea2Xrefreshrateduring(manual)refreshforExtendedtempdevicesor3XrefreshrateforMil-tempdevices.SRTandASRshouldbeenabledforautomaticREFRESHservicesonalldevicesusedintemperatureenvironments≤95°C
SRTforcestheSDRAMtoswitchtheinternalSELFREFRESHratefrom1Xto2X.SELFREFRESHisperformedat2XregardlessofTA.
ASRautomaticallyswitchestheSDRAM’sinternalSELFREFRESHratefrom1Xto2X,however,whileinSELFREFRESHmode,ASRenablestheREFRESHrateautomaticallyadjustbetween1Xand2XREFRESHrateoverthesupportedtemperaturerange.OneotherdisadvantagewithASRistheSDRAMcannotalwaysswitchfroma1Xtoa2XrefreshrateatanexactambientTemperatureof85°C.AlthoughtheSDRAMwillsupportdataintegritywhenitswitchesfroma1Xto2Xrate,itmayswitchatalowertemperaturethan85°C.
Sinceonlyonemodeisnecessaryatoneinstantintime,SRTandASRcannotbesimultaneouslyenabled.
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DYNAMIC ODT
Themoderegister3(MR3)controlsadditionalfunctionsandfeaturesnotavailableviaMR0,MR1orMR2.CurrentlydefinedastheMULTIPURPOSEREGISTER(MPR).ThisfunctioniscontrolledviathebitsshowninFigure50.TheMR3isprogrammedviatheLOADMODEcommandandretainsthestoredinformationuntilitisprogrammedagainoruntilthedevicelosespower.ReprogrammingtheMR3registerwillnotalterthecontentsofthememoryarray,providedtheprogrammingoftheMR3hasbeenperformedcorrectly.TheMR3registermustbeloadedwhenallbanksareidleandnodataburstsareinprogressandthememorycontrollermustwaitthespecifiedtimetMRD and tMODbeforeinitiatingasubsequentoperation.
MODE REGISTER (MR3)
ThedynamicODT(RTT_WR)featureisdefinedbyMR2[10,9].DynamicODTisenabledwhenavalueisselected.ThisnewDDR3featureenablestheODTterminationvaluetochangewithoutissuinganMRScommand,essentiallychangingtheODTtermination“on-the-fly”.
WithdynamicODT(RTT_WR)whenbeginningaWRITEburstandsubsequentlyswitchesbacktoODT(RTT_WR)isenabled:ODTLCNW,ODTLCNW4,ODTLCNW*ODTH4,ODTH8andtADC.
DynamicODTisonlyapplicableduringWRITEcycles,IfODT(RTT_NOM)isdisabled,dynamicODT(RTT_WR)isstillpermitted.RTT_NOMandRTT_WRcanbeusedindependentofoneanother.DynamicODTisnotavailableduringWRITELEVELINGmode,regardlessofthestateofODT(RTT_NOM).FordetailsonODToperation,refertothe“On-Die-Termination(ODT)”section.
FiGure 50 - mOde reGiSter 3 (mr3) deFiNitiON
A9 A7 A 6 A5 A4 A3A8 A2 A1 A0
Mode register 3 (MR3)
Address bus
9 7 6 5 4 38 2 1 0
A10A12 A111AB 0AB
101 112131415
A13
1 01 01 01 01 01 01 01 MPR 1
BA2
1601 01 01 01 01
M201
MPR EnableNormal DRAM operations 2
Dataflow from MPR
MPR_RF
M140101
M150011
Mode RegisterMo de register set (MR0)Mode register set 1 (MR1)Mode register set 2 (MR2)Mode register set 3 (MR3)
MPR READ FunctionPredefined pattern 3
ReservedReservedReserved
M00101
M10011
NOTES:
1. MR3[16and13:4]arereservedforfutureuseandmustallbeprogrammedto“0.”
2. WhenMPRcontrolissetfornormalDRAMoperation,MR3[1,0]willbeignored.
3. IntendedtobeusedforREADsynchronization.
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MULTIPURPOSE REGISTER (MPR)
TheMULTIPURPOSEREGISTERfunctionisusedtooutputapredefinedsystemtimingcalibrationbitsequence.Bit2isthemasterbitthatenablesordisablesaccesstotheMPRregisterandbits1and0determinewhichmodetheMPRisplacedin.ThebasicconceptofthemultipurposeregisterisshowninFigure51.
IfMR3[2]isa“0”,thentheMPRaccessisdisabledandtheSDRAMoperatesinnormalmode.However,ifMR3[2]isa“1”,thenSDRAMnolongeroutputsnormalreaddatabutoutputsMPRdataasdefinedbyMR3[0,1].IfMR3[0,1]isequalto“00”,thenapredefinedreadpatternforsystemcalibrationisselected.
ToenabletheMPR,theMRScommandisissuedtoMR3andMR3[2]=1(seeTable61).PriortoissuingtheMRScommand,allbanksmustbeintheidlestate(allbanksareprecharged,andtRPismet).WhentheMPRisenabled,anysubsequentREADorRDAPcommandsareredirectedtothemultipur-poseregister.TheresultingoperationwheneitheraREADoraRDAPcommandisissuedisdefinedbyMR3[1:0]whenMPRisenabled(seeTable62).WhentheMPRisenabled,onlyREADorRDAPcommandsarealloweduntilasubsequentMRScommandisissuedwiththeMPRdisabled(MR3[2]=0).POWER-DOWN,SELFREFRESHandanyotherNONREADorRDAPcommandisnotallowed.TheRESETfunctionissupportedduringMPRenablemode.
FiGure 51 - multipurpOSe reGiSter (mpr) blOck diaGram
Memory core
MR3[2] = 0 (MPR off)
DQ, DM, DQS, DQS#
Multipurpose registerpredefined data for READs
MR3[2] = 1 (MPR on)
NOTES:
1. ApredefineddatapatterncanbereadoutoftheMPRwithanexternalREADcommand.
2. MR3[2]defineswhetherthedataflowcomesfromthememorycoreortheMPR.Whenthedata
flow isdefined, theMPRcontentscanbe readoutcontinuouslywitha regularREADorRDAP
command.
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MPR MPR READ Function Function0
1
NormalOperation,noMPRtransaction.AllsubsequentREADscomefrom
theSDRAMmemoryarray.AllsubsequentWRITEsgototheSDRAM
memoryarray.
EnableMPRmode,subsequentREAD/RDAPcommandsdefinedbybits1
and2.
table 61: burSt Order
“Don’tCare”
A[1:0](SeeTable67)
MR3[2] MR3[1:0]
MPR FUNCTIONAL DESCRIPTION
TheMPRJEDECdefinitionallowsforeitheraprimeDQ0forlowerbyteandDQ8fortheupperbyteofeachofthe(4)wordscontainedintheLDIiMOD,tooutputtheMPRdatawiththeremainingDQsdrivenLOW,orforallDQstooutputtheMPRdata.TheMPRreadoutsupportsfixedREADburstandREADburstchop(MRSandOTFviaA12/BC#)withregularREADlatenciesandACtimingsapplicable.ThisprovidingtheDLLislockedasrequired.
MPRaddressingforavalidMPRREADisasfollows:•A[1:0]mustbesetto“00”astheburstorderisfixedpernibble•A2selectstheburstorder
•BL8,A2issetto“0”,andtheburstorderisfixedto0,1,2,3,4,5,6,7•Forburstchop4cases,theburstorderisswitchedonthenibblebaseand:
•A2=0:burstorder=0,1,2,3•A2=1:burstorder=4,5,6,7
•Burstorderbit0(thefirstbit)isassignedtoLSB,andburstorderbit7(thelastbit)isassignedtoMSB•A[9:3]area“Don’tCare”•A10isa“Don’tCare”•A11isa“Don’tCare”•A12:Selectsburstchopmodeon-the-fly,ifenabledwithinMR0
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MPR REGISTER ADDRESS DEFINITIONS and BURSTING ORDER
TheMPRcurrentlysupportsasingledataformat.ThisdataformatisapredefinedREADpatternforsystemcalibration.Thepredefinedpatternisalwaysarepeating0-1bitpattern.
ExamplesofthedifferenttypeofpredefinedREADpatternburstsareshowninFigures52,53,and54.
MR3[2] MR3[1:0] Function Length A[2:0] Burst Order and Data Pattern1
1
1
1
BurstOrder:0,1,2,3,4,5,6,7
Predefinedpattern:0,1,0,1,0,1,0,1
BurstOrder:0,1,2,3
Predefinedpattern:0,1,0,1
BurstOrder:4,5,6,7
Predefinedpattern:0,1,0,1
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a
table 62: burSt Order
READpredefinedpatternfor
systemcalibration
RFU
RFU
RFU
BL8
BC4
BC4
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a
000
000
100
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a
00
01
10
11
Burst Read
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Not
es:
1.R
EAD
with
BL8
eith
er b
y M
RS
or O
TF.
2.M
emor
y co
ntro
ller m
ust d
rive
0 on
A[2
:0].
T0Ta
0Tb
0Tb
1Tc
0Tc
1Tc
2Tc
3Tc
4Tc
5Tc
6Tc
7Tc
8Tc
9Tc
10
CKCK#
MRS
PREA
READ
1NO
PNO
PNO
PNO
PNO
PNO
PNO
PNO
PM
RSN
OP
NO
PVa
lidC
omm
and
t MP
RR
Don
’t Ca
reIn
dica
tes
a B
reak
in
Tim
e S
cale
DQS,
DQ
S#
Bank
add
ress
3Va
lid3
0A[
1:0]
Valid
02
1A2
020
00A[
9:3]
Valid
00
01
A10/
APVa
lid0
0ilaV
11Ad
0
0A1
2/BC
#Va
lid1
0
0ilaV
]31:51[Ad
0
DQ
t MO
Dt R
Pt M
OD
RL
Figure 52 - MPR System Read Calibration with BL8: Fixed Burst Order Single Readout
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Not
es:
1.R
EAD
with
BL8
eith
er b
y M
RS
or O
TF.
2.M
emor
y co
ntro
ller m
ust d
rive
0 on
A[2
:0].
T0Ta
TbTc
0Tc
1Tc
2Tc
3Tc
4Tc
5Tc
6Tc
7Tc
8Tc
9Tc
10Td
CK
CK#
t MP
RR
Don
’t Ca
reIn
dica
tes
a B
reak
in
Tim
e S
cale
RL
3Va
lid3
Bank
add
ress
Valid
A[1:
0]Va
lid02
020
A212
021
0
0A[
15:1
3]Va
lidVa
lid0
A[9:
3]Va
lidVa
lid00
00
A11
Valid
Valid
00
A12/
BC#
Valid
10
0
A10/
APVa
lidVa
lid0
01
RL
PREA
READ
1NO
PNO
PNO
PNO
NO
PNO
PNO
PM
RSVa
lidC
omm
and
READ
1M
RS
DQ
Valid
DQS,
DQ
S#
t RP
t MO
Dt C
CDt M
OD
NOP
NOP
Figure 53 - MPR System Read Calibration with BL8: Fixed Burst Order, Back-to-Back Readout
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Not
es:
1.R
EA
D w
ith B
C4
eith
er b
y M
RS
or O
TF.
2.M
emor
y co
ntro
ller m
ust d
rive
0 on
A[1
:0].
3.A
2 =
0 se
lect
s lo
wer
4 n
ibbl
e bi
ts 0
. . .
3.
4.A
2 =
1 se
lect
s up
per 4
nib
ble
bits
4 .
. . 7
.
T0Ta
Tb
CK
CK# DQ
DQS,
DQ
S#
t MO
Dt M
PR
R
Don
’t Ca
re
Tc0
Tc1
Tc2
Tc3
Tc4
Tc5
Tc6
Tc7
Tc8
Tc9
Tc10
Td
NOP
NOP
NOP
NOP
Valid
Com
man
dM
RSPR
EARE
AD1
READ
1NO
PNO
P
Indi
cate
s a
Bre
ak in
Ti
me
Sca
le
Bank
add
ress
3Va
lid3
Valid
0A[
1:0]
Valid
0202
1A2
1403
0
00ilaV
]3:9[Ad
Valid
00
01
ilaVPA/01A
dVa
lid0
0ilaV
11Ad
Valid
0
0A1
2/BC
#Va
lid1
Valid
10
0A[
15:1
3]Va
lidVa
lid0
RL
RL
t RF
t MO
Dt C
CD
NOP
NOP
MRS
NOP
Figure 54 - MPR System Read Calibration with BC4: Lower Nibble, Then Upper Nibble
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Not
es:
1.R
EA
D w
ith B
C4
eith
er b
y M
RS
or O
TF.
2.M
emor
y co
ntro
ller m
ust d
rive
0 on
A[1
:0].
3.A
2 =
1 se
lect
s up
per 4
nib
ble
bits
4 .
. . 7
.4.
A2
= 0
sele
cts
low
er 4
nib
ble
bits
0 .
. . 3
.
T0Ta
Tb
01
ilaVPA/01A
dVa
lid0
CK
CK#
MRS
PREA
READ
1RE
AD1
NOP
NOP
NOP
SNO
PNO
PVa
lidC
omm
and
004
131
A2
t MO
Dt M
PR
R
3Va
lid3
Bank
add
ress
Valid 02
020
A[1:
0]Va
lid 00
ilaV]31:51[A
dVa
lid
00
ilaV11A
dVa
lid
0000
ilaV]3:9[A
dVa
lid
Don
’t Ca
re
Tc0
Tc1
Tc2
Tc3
Tc4
Tc5
Tc6
Tc7
Tc8
Tc9
Tc10
Td
Indi
cate
s a
Bre
ak in
Ti
me
Sca
le
RL
DQ
DQS,
DQ
S#
0A1
2/BC
#Va
lid1
Valid
10
RL
t RF
t MO
Dt C
CD
MR
NOP
NOP
NOP
NOP
Figure 55 - MPR System Read Calibration with BC4: Upper Nibble, Then Lower Nibble
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MPR READ PREDEFINED PATTERN
ThepredeterminedREADcalibrationpatternisafixedpatternof0,1,0,1,0,1,0,1.ThefollowingisanexampleofusingtheREADoutpredeterminedREADcalibrationpattern.TheexampleistoperformmultipleREADSfromtheMULTIPURPOSEREGISTER(MPR)inordertodosystemlevelREADtimingcalibrationbasedonthepredeterminedandstandardizedpattern.
ThefollowingprotocoloutlinesthestepsusedtoperformtheREADcalibration:•Prechargeallbanks•AftertRPissatisfied,setMRS,MR3[2]=1andMR3[1:0]=00.ThisredirectsallsubsequentREADsandLoadsthepredefinedpatternintotheMPR.AssoonastMRD and tMODaresatisfied,theMPRisavailable.•DataWRITEoperationsarenotalloweduntiltheMPRreturnstothenormalSDRAMstate•IssueaREADwithburstorderinformation(allotheraddresspinsare“Don’tCare”):
•A[1:0]=00(databurstorderisfixedstartingatnibble)•A2=0(forBL8,burstorderisfixedas0,1,2,3,4,5,6,7)•A12=1(useBL8)
•AfterRL=AL+CL,theSDRAMburstsoutthepredefinedREADcalibrationpattern(0,1,0,1,0,1,0,1)•ThememorycontrollerrepeatsthecalibrationREADsuntilREADdatacaptureatthememorycontrollerisoptimized•AfterthelastMPRREADburstandaftertMPRRhasbeensatisfied,issueMRS,MR3[2]=0andMR3[1:0]=“Don’tCare”tothenormalSDRAMstate.AllsubsequentREADandWRITEaccesseswillberegularREADSandWRITESfrom/totheSDRAMarray•WhentMRD and tMODaresatisfiedfromthelastMRS,theregularSDRAMcommands(suchasACTIVATEaMemorybankforregularREADorWRITEaccess)arepermitted
MODE REGISTER SET (MRS)
ThemoderegistersareloadedviainputsBA[2:0],A[13:0].BA[2:0]determineswhichmoderegisterisprogrammed:
•BA2=0,BA1=0,BA0=0forMR0•BA2=0,BA1=0,BA0=1forMR1•BA2=0,BA1=1,BA0=0forMR2•BA2=0,BA1=1,BA0=1forMR3
TheMRScommandcanonlybeissued(orreissued)whenallbanksareidleandintheprechargedstate(tRPissatisfiedandnodataburstsareinprogress).ThecontrollermustwaitthespecifiedtimetMRDbeforeinitiatingasubsequentoperationsuchasanACTIVATEcommand.ThereisalsoarestrictionafterissuinganMRScommandwithregardtowhentheupdatedfunctionsbecomeavailable.ThisparameterisspecifiedbytMOD.BothtMRD and tMODparametersareshowninFigure42and43.Violatingeitheroftheserequirementswillresultinunspecifiedoperation.
ZQ CALIBRATION
TheZQCALIBRATIONcommandisusedtocalibratetheDRAMoutputdrivers(RON)andODTvalues(RTT)overprocess,voltage,andtemperature,providedadedicated240Ω(±1%)externalresistorisconnectedfromtheSDRAM’sZQballtoVssQ.
SDRAMsneedalongertimetocalibrateRONandODTatpowerupINITIALIZATIONandSELFREFRESHexitandarelativelyshortertimetoperformperiodiccalibrations.TheDRAMdefinestwoZQCALIBRATIONcommands:ZQCALIBRATIONLONG(ZQCL)andZQCALIBRATIONSHORT(ZQCS).AnexampleofZQCALIBRATIONtimingisshowninFigure56.
AllbanksmustbePRECHARGEDandtRPmustbemetbeforeZQCLorZQCScommandscanbeissuedtotheSDRAM.Nootheractivities(otherthananotherZQCLorZQCScommandmaybeissuedtotheSDRAM)canbeperformedontheSDRAMarraybythecontrollerforthedurationoftZQINITortZQOPER.ThequiettimeontheSDRAMarrayhelpsaccuratelycalibrateRONandODT.AfterDRAMcalibrationisachieved,theSDRAMshoulddisabletheZQball’scurrentconsumptionpathtoreduceoverallpowerusage.
ZQCALIBRATIONcommandscanbeissuedinparalleltoDLLRESETandlockingtime.UponSELFREFRESHexit,anexplicitZQCLisrequiredifZQCALIBRATIONisdesired.
IndualranksystemdesignsthatsharetheZQresistorbetweendevices,thecontrollermustnotallowoverlapoftZQINT,tZQOPERortZQCSbetweenranks.
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FiGure 56 - zQ calibratiON timiNG (zQcl aNd zQcS)
NOPZQCL NOP NOP Valid Valid ZQCS NOP NOP NOP ValidCommand
Indicates a Break in Time Scale
T0 T1 Ta0 Ta1 Ta2 Ta3 Tb0 Tb1 Tc0 Tc1 Tc2
Address Valid ValidValid
A10 Valid ValidValid
CK
CK#
Don’t Care
DQ High-Z High-Z3A3 ctivities Activ-ities
Valid ValidODT 2 2 Valid
1CKE 1 Valid Valid Valid
tZQCStZQINIT or tZQOPER
NOTES:
1. CKEmustbecontinuouslyregisteredHIGHduringthecalibrationprocedure.
2. ODTmustbedisabledviatheODTsignalortheMRSduringthecalibrationprocedure.
3. AlldevicesconnectedtotheDQbusshouldbeHigh-Zduringcalibration.
ACTIVATE
BeforeanyREADorWRITEcommandscanbeissuedtoabankwithintheDRAM,aROWinthatbankmustbeopened(ACTIVATED).Thisisaccom-plishedviatheACTIVATEcommand,whichselectsboththeBANKandtheROWtobeACTIVATED.
AfteraROWisopenedwithanACTIVATEcommand,aREADorWRITEcommandmaybeissuedtothatROW,subjecttothetRCDspecification.How-ever,iftheadditivelatencyisprogrammedcorrectly,aREADorWRITEcommandmaybeissuedpriortotRCD(MIN).Inthisoperation,theSDRAMenablesaREADorWRITEcommandtobeissuedaftertheACTIVATEcommandforthatbank,butpriortotRCD(MIN)(see“POSTEDCASADDITIVELATENCY(AL)).tRCD(MIN)shouldbedividedbytheclockperiodandroundeduptothenextwholenumbertodeterminetheearliestclockedgeaftertheACTIVATEcommandonwhichtheREADorWRITEcommandcanbeentered.Thesameprocedureisusedtoconvertotherspecificationlimitsfromtimeunitstoclockcycles.
Whenatleastonebankisopen,anyREAD-to-READcommanddelayorWRITE-to-WRITEcommanddelayisrestrictedtotCCD(MIN).
AsubsequentACTIVATEcommandtoadifferentROWinthesameBANKcanonlybeissuedafterthepreviousACTIVEROWhasbeenclosed(PRE-CHARGED).TheminimumtimeintervalbetweensuccessiveACTIVATEcommandstothesameBANKisdefinedbytRC.
AsubsequentACTIVATEcommandtoanotherBANKcanbeissuedwhilethefirstBANKisbeingaccessed,whichresultsinareductionoftotalROW-ACCESSoverhead.TheminimumtimeintervalbetweensuccessiveACTIVATEcommandsmaybeissuedinagiventFAW(MIN)period,andthetRRD
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FiGure 57 - example: meetiNG trrd (miN) aNd trcd (miN)
Command
Don’t Care
T1T0 T2 T3 T4 T5 T8 T9
tRRD
Row Row Col
Bank x Bank y Bank y
NOPACT NOP NOPACT NOP NOP RD/WR
tRCD
BA[2:0]
CK#
Address
CK
T10 T11
NOP NOP
Indicates a Break in Time Scale
FiGure 58 - example: tFaw
Command
Don’t Care
T1T0 T4 T5 T8 T9 T10 T11
tRRD
Row Row
Bank a Bank b
Row
Bank c
Row
Bank d Bank y
Row
Bank y
NOPACT NOPAC AT CT NOP NOP
tFAW
BA[2:0]
CK#
Address
CK
T19 T20
NOPAC AT CT
Bank e
Indicates a Break in Time Scale
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FiGure 59 - read lateNcy
Notes: 1. DO n = data-out from column n.2. Subsequent elements of data-out appear in the programmed order following DO n..
CK
CK#
Command READ NOP NOP NOP NOP NOP NOP NOP
AddressBank a,Col n
CL = 8, AL = 0
DQ
DQS, DQS#
DOn
T0 T7 T8 T9 T10 T11
Don’t CareTransitioning Data
T12 T12
Indicates a Break in Time Scale
READ
READburstsareinitiatedwithaREADcommand.ThestartingCOLUMNandBANKaddressesareprovidedwiththeREADcommandandAUTOPRE-CHARGEiseitherenabledordisabledforthatburstaccess.IfAUTOPRECHARGEisenabled,theROWbeingaccessedisautomaticallyPRECHARGEDatthecompletionoftheburstsequence.IfAUTOPRECHARGEisdisabled,theROWwillbeleftopenafterthecompletionoftheburst.
DuringREADbursts,thevaliddataoutelementfromthestartingcolumnaddressisavailableatREADLATENCY(RL)clockslater.RLisdefinedasthesumofPOSTEDCASADDITIVELATENCY(AL)andCASLATENCY(CL)(RL=AL+CL).ThevalueofALandCLisprogrammableinthemoderegisterviatheMRScommand.Eachsubsequentdata-outelementwillbevalidnominallyatthenextpositiveornegativeclockedge(thatis,atthenextcrossingofCKandCK\).Figure59showsanexampleofRLbasedonaCLsettingof8aswellasAL=0.
AREADburstmaybefollowedbyaPRECHARGEcommandtothesamebankprovidedAUTOPRECHARGEisnotACTIVATED.TheminimumREAD-to-PRECHARGEcommandspacingtothesamebankisfourclocksandmustalsosatisfyaminimumanalogtimefromtheREADcommand.ThistimeiscalledtRTP(READ-to-PRECHARGE).tRTPstartsALcycleslaterthantheREADcommand.ExamplesforBL8areshowninFigure65andBC4inFigure66.FollowingthePRECHARGEcommand,asubsequentcom-mandtothesamebankcannotbeissueduntiltRPismet.ThePRECHARGEcommandfollowedbyanotherPRECHARGEcommandtothesamebankisallowed.However,theprechargeperiodwillbedeterminedbythelastPRECHARGEcommandissuedtothebank.
IfA10isHIGHwhenaREADcommandisissued,theREADwithAUTOPRE-CHARGEfunctionisengaged.TheSDRAMstartsanAUTOPRECHARGEoperationontherisingedgewhichisAL+tRTPcyclesaftertheREADcommand.TheDRAMsupportsatRASlockoutfeature(seeFigure68).IftRAS(MIN)isnotsatisfiedattheedge,thestartingpointoftheAUTOPRECHARGEoperationwillbedelayeduntiltRAS(MIN)issatisfied.IncasetheinternalPRECHARGEoperationispushedoutbytRTP,tRPstartsatthepointatwhichtheinternalPRECHARGEhappens.ThetimefromREADwithAUTOPRECHARGEtothenextACTIVATEcommandthesamebankisAL+(tRTP+tRP)*,where“*”meansroundeduptothenextinteger.Inanyevent,internalRECHARGEdoesnotstartearlierthanfourclocksafterthelast8n-bitprefetch.
DQSxandDQSx\isdrivenbytheDRAMalongwiththeoutputdata.TheinitialLOWstateonDQSxandHIGHstateonDQSx\,isknownastheREADpreamble(tRPRE).TheLOWstateonDQSxandtheHIGHstateonDQSx\,coincidentwiththelastdata-outelement,isknownastheREADpostam-ble(tRPST).Uponcompletionofaburst,assumingnoothercommandshavebeeninitiated,theDQwillgoHIGH-Z.AdetailedexplanationoftDQSQ(validdata-outskew),tQH(data-outwindowhold),andthevaliddatawindowaredepictedinFigure71.AdetailedexplanationoftDQSCK(DQStransitionskewtoCK)isalsodepictedinFigure71.
DatafromanyREADburstmaybeconcatenatedwithdatafromasubse-quentREADcommandtoprovideacontinuousflowofdata.Thefirstdataelementfromthenewburstfollowsthelastelementofacompletedburst.ThenewREADcommandshouldbeissuedtCCDcyclesafterthefirstREADcommand.ThisisshownforBL8inFigure60.IfBC4isenabled,tCCDmuststillbemetwhichwillcauseagapinthedataoutput,asshowninFigure61.NonconsecutiveREADdataisreflectedinFigure62.DDR3SDRAMsdonotallowinterruptingortruncatinganyREADburst.
DatafromanyREADburstmustbecompletedbeforeasubsequentWRITEburstisallowed.AnexampleofaREADburstfollowedbyaWRITEburstforBL8isshowninFigure63.ToensuretheREADdataiscompletedbeforetheWRITEdataisonthebus,theminimumREAD-to-WRITEtimingisRL+tCCD–WL+2tCK.
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Not
es:
1.N
OP
com
man
ds a
re s
how
n fo
r eas
e of
illu
stra
tion;
oth
er c
omm
ands
may
be
valid
at t
hese
tim
es.
2.
The
BL8
set
ting
is a
ctiv
ated
by
eith
er M
R0[
1:0]
= 0
0 or
MR
0[1:
0] =
01
and
A12
= 1
dur
ing
RE
AD
com
man
d at
T0
and
T4.
3.D
O n
(or
b) =
dat
a-ou
t fro
m c
olum
n n (o
r col
umn
b).
4.B
L8, R
L =
5 (C
L =
5, A
L =
0).
T0T1
T2T3
T4T5
T6T7
T8T9
T10
T11
Don
’t Ca
reTr
ansi
tioni
ng D
ata
T12
T13
T14
t RPS
T
NOP
DAERDAER
PON
PON
PON
PON
PON
PON
PON
PON
PON
PON
PON
PON
CK
CK#
Com
man
d1
DQ3
DQS,
DQ
S#
Bank
,Co
l nBa
nk,
Col b
Addr
ess2
RL
= 5
t RPR
E
t CC
D
RL
= 5DO n
+ 3
DO n+
2DO n +
1DO n
DO n+
7DO n +
6DO n +
5DO
n
+ 4
DO b +
3DO b +
2DO b
+ 1
DO bDO b +
7DO b +
6DO b +
5DO b
+ 4
Figure 60 - Consecutive READ Bursts (BL8)
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Not
es:
1.N
OP
com
man
ds a
re s
how
n fo
r eas
e of
illu
stra
tion;
oth
er c
omm
ands
may
be
valid
at t
hese
tim
es.
2.Th
e B
C4
setti
ng is
act
ivat
ed b
y ei
ther
MR
0[1:
0] =
10
or M
R0[
1:0]
= 0
1 an
d A
12 =
0 d
urin
g R
EA
D c
omm
and
at T
0 an
d T4
.3.
DO
n (o
r b)
= d
ata-
out f
rom
col
umn n
(or c
olum
n b)
.4.
BC
4, R
L =
5 (C
L =
5, A
L =
0).
NOP
CK
CK#
Com
man
d1
DQ3
DQS,
DQ
S#
T0T1
T2T3
T4T5
T6T7
T8T9
Addr
ess2
T10
T11
Don
’t Ca
reTr
ansi
tioni
ng D
ata
T12
T13
T14
READ
READ
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
Bank
,Co
l nBa
nk,
Col b
t RPS
Tt R
PRE
t RPS
Tt R
PRE
RL
= 5
DO n+
3DO n +
2DO n +
1DO n
DO b+
3DO b
+ 2
DO b+
1DO b
RL
= 5
t CC
D
Figure 61 - Consecutive READ Bursts (BC4)
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Not
es:
1.A
L =
0, R
L =
8.2.
DO
n (o
r b)
= d
ata-
out f
rom
col
umn
n (o
r col
umn
b).
3.S
even
sub
sequ
ent e
lem
ents
of d
ata-
out a
ppea
r in
the
prog
ram
med
ord
er fo
llow
ing
DO
n.
4.S
even
sub
sequ
ent e
lem
ents
of d
ata-
out a
ppea
r in
the
prog
ram
med
ord
er fo
llow
ing
DO
b.
Don
’t Ca
reTr
ansi
tioni
ng D
ata
T0T1
T2T3
T4T5
T6T7
T8T9
T10
T11
T12
T13
T14
T15
T16
T17
DQS,
DQ
S#
Com
man
dNO
PNO
PNO
PNO
PNO
PNO
PNO
PNO
PNO
PNO
PNO
PNO
PNO
PNO
PNO
PRE
ADNO
PRE
AD
Addr
ess
Bank
a,
Col n
Bank
a,
Col b
CKCK#
DQD
O nD
O b
CL
= 8
CL
= 8
Figure 62 - Nonconsecutive READ Bursts
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STACKEDTECHNOLOGIES INC
Not
es:
1.N
OP
com
man
ds a
re s
how
n fo
r eas
e of
illu
stra
tion;
oth
er c
omm
ands
may
be
valid
at t
hese
tim
es.
2.Th
e B
L8 s
ettin
g is
act
ivat
ed b
y ei
ther
MR
0[1:
0] =
00
or M
R0[
1:0]
= 0
1 an
d A
12 =
1 d
urin
g th
e R
EA
D c
omm
and
at T
0, a
nd
the
WR
ITE
com
man
d at
T6.
3.D
O n
= d
ata-
out f
rom
col
umn,
DI b
= d
ata-
in fo
r col
umn
b.4.
BL8
, RL
= 5
(AL
= 0,
CL
= 5)
, WL
= 5
(AL
= 0,
CW
L =
5).
Don
’t Ca
reTr
ansi
tioni
ng D
ata
T0T1
T2T3
T4T5
T6T7
T8T9
T10
T11
T12
T13
T14
T15
CK
CK#
Com
man
d1NO
PNO
PNO
PNO
PNO
PW
RITE
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
t WPS
Tt R
PR
Et W
PR
Et R
PST
DQS,
DQ
S#
DQ3
WL
= 5
t WR
t WTR
READ
DO n
DO n +
1DO n +
2DO n +
3DO n +
4DO n +
5DO n +
6DO n +
7D
I nDI n +
1DI n +
2DI
n +
3DI n +
4DI n +
5DI n +
6DI n +
7
RE
AD
-to-W
RIT
E co
mm
and
del
ay =
RL
+ t C
CD
+ 2
t CK
- W
Lt B
L =
4 clo
cks
Addr
ess2
Bank
,Co
l bBa
nk,
Col n
RL
= 5
Figure 63 - READ (BL8) to WRITE (BL8)
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Not
es:
1.N
OP
com
man
ds a
re s
how
n fo
r eas
e of
illu
stra
tion;
oth
er c
omm
ands
may
be
valid
at t
hese
tim
es.
2.Th
e B
C4
OTF
set
ting
is a
ctiv
ated
by
MR
0[1:
0] a
nd A
12 =
0 d
urin
g R
EA
D c
omm
and
at T
0 an
d W
RIT
E c
omm
and
at T
4.3.
DO
n =
dat
a-ou
t fro
m c
olum
n n;
DI n
= d
ata-
in fr
om c
olum
n b.
4.B
C4,
RL
= 5
(AL
- 0, C
L = 5
), W
L =
5 (A
L =
0, C
WL
= 5)
.
Don
’t Ca
reTr
ansi
tioni
ng D
ata
T0T1
T2T3
T4T5
T6T7
T8T9
T10
T11
T12
T13
T14
T15
CK
CK#
Addr
ess2
Bank
,Co
l nBa
nk,
Col b
Com
man
d1RE
ADNO
PNO
PNO
PW
RITE
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
t WPS
Tt W
PR
Et R
PST
DQS,
DQ
S#
DQ3
WL
= 5
RE
AD
-to-W
RIT
E co
mm
and
del
ay =
RL
+ t C
CD
/2 +
2t C
K -
WL
t WR
t WTR
t BL
= 4
clo
cks
t RP
RE
RL
= 5
DO n
DO
n+ 1
DO n+
2DO n +
3D
I nD
I n
+ 1
DI n +
2DI n+
3
Figure 64 - READ (BC4) to WRITE (BC4) OTF
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STACKEDTECHNOLOGIES INC
Not
es:
1.N
OP
com
man
ds a
re s
how
n fo
r eas
e of
illu
stra
tion;
oth
er c
omm
ands
may
be
valid
at t
hese
tim
es.
2.Th
e B
L8 s
ettin
g is
act
ivat
ed b
y ei
ther
MR
0[1:
0] =
00
or M
R0[
1:0]
= 0
1 an
d A
12 =
1 d
urin
g th
e R
EA
D c
omm
and
at T
0, a
nd
the
WR
ITE
com
man
d at
T6.
3.D
O n
= d
ata-
out f
rom
col
umn,
DI b
= d
ata-
in fo
r col
umn
b.4.
BL8
, RL
= 5
(AL
= 0,
CL
= 5)
, WL
= 5
(AL
= 0,
CW
L =
5).
Don
’t Ca
reTr
ansi
tioni
ng D
ata
T0T1
T2T3
T4T5
T6T7
T8T9
T10
T11
T12
T13
T14
T15
CK
CK#
Com
man
d1NO
PNO
PNO
PNO
PNO
PW
RITE
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
t WPS
Tt R
PR
Et W
PR
Et R
PST
DQS,
DQ
S#
DQ3
WL
= 5
t WR
t WTR
READ
DO n
DO n +
1DO n +
2DO n +
3DO n +
4DO n +
5DO n +
6DO n +
7D
I nDI n +
1DI n +
2DI
n +
3DI n +
4DI n +
5DI n +
6DI n +
7
RE
AD
-to-W
RIT
E co
mm
and
del
ay =
RL
+ t C
CD
+ 2
t CK
- W
Lt B
L =
4 clo
cks
Addr
ess2
Bank
,Co
l bBa
nk,
Col n
RL
= 5
Figure 65 - READ to PRECHARGE (BL8)
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CK
CK#
Don
’t Ca
reTr
ansi
tioni
ng D
ata
T0T1
T2T3
T4T5
T6T7
T8T9
T10
T11
T12
T13
T14
T15
T16
T17
Com
man
dNO
PNO
PNO
PNO
PNO
PNO
PNO
PNO
PNO
PAC
TNO
PNO
PNO
PNO
PNO
PRE
ADNO
PPR
E
Addr
ess
Bank
a,
Col n
Bank
a,
(or a
ll)Ba
nk a
,Ro
w b
t RP
t RTP
DQS,
DQ
S#
DQD
O nD
On
+ 1
DO
n+
2D
On
+ 3
t RAS
Figure 66 - READ to PRECHARGE (BC4)
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CKCK#
Com
man
d
DQ
DQS,
DQ
S#
ACTI
VE n
T0T1
Don
’t C
are
NOP
NOP
T6T1
2
NOP
READ
n
T13
NOP
DO n+
3DO n +
2DO n +
1
RL
= AL
+ C
L =
11
T14
NOP
DO n
t RC
D (M
IN)
AL =
5C
L =
6T11
BC4
Indi
cate
s a
Brea
k in
Ti
me
Scal
eTr
ansi
tioni
ng D
ata
T2
NOP
Figure 67 - READ to PRECHARGE (AL = 5, CL = 6)
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CKCK#
Com
man
dNO
PNO
PNO
PNO
P
Addr
ess
DQ
DQS,
DQ
S#
Don
’t Ca
reTr
ansi
tioni
ng D
ata
NOP
NOP
NOP
NOP
NOP
T0T1
T2T3
T4T5
T6T7
T8T9
T10
T11
T12
T13
Ta0
t RTP
(MIN
)
NOP
READ
NOP
AL
= 4
NOP
NOP
CL =
6
NOP
t RAS
(MIN
)
ACT
Indi
cate
s A
Bre
ak in
Ti
me
Sca
le
t RP
Bank
a,
Col n
Bank
a,
Row
b
DO n
DO
n+
1D
On
+ 2
DO
n+
3
Figure 68 - READ with Auto Precharge (AL = 4, CL = 6)
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ADQSxtoDQoutputtimingisshowninFigure69.TheDQtransitionsbetweenvaliddataoutputsmustbewithintDQSQofthecrossingpointofDQSxandDQSx\.DQSmustalsomaintainaminimumHIGHandLOWtimeoftQSH and tQSL.PriortotheREADpreamble,theDQballswilleitherbefloatingorterminateddependingonthestatusoftheODTsignal.
Figure70showsthestrobe-to-clocktimingduringaREAD.ThecrossingpointDQSx,DQSx\musttransitionwith±tDQSCKoftheclockcrossingpoint.Thedataouthasnotimingrelationshiptoclock,onlytoDQS,asshowninFigure70.
Figure70alsoshowstheREADpreambleandpostamble.Normally,bothDQSxandDQSx\areHIGH-Ztosavepower(VDDQ).PriortodataoutputfromtheSDRAM,DQSxisdrivenLOWandDQSx\drivenHIGHfortRPRE.ThisisknownastheREADpreamble.
TheREADpostamble,tRPST,isonehalfclockfromthelastL[U]DQSx,L[U]DQSx\transition.DuringtheREADpostamble,DQSxisdrivenLOWandDQSx\drivenHIGH.Whencomplete,theDQwilleitherbedisabledorwillcontinueterminatingdependingonthestateoftheODTsignal.Figure75demonstrateshowtomeasuretRPST.
READ
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Not
es:
1.N
OP
com
man
ds a
re s
how
n fo
r eas
e of
illu
stra
tion;
oth
er c
omm
ands
may
be
valid
at t
hese
tim
es.
2.Th
e B
L8 s
ettin
g is
act
ivat
ed b
y ei
ther
MR
0[1,
0] =
0, 0
or M
R0[
0, 1
] = 0
, 1 a
nd A
12 =
1 d
urin
g R
EA
D c
omm
and
at T
0.3.
DO
n =
dat
a-ou
t fro
m c
olum
n n.
4.B
L8, R
L =
5 (A
L =
0, C
L =
5).
5.O
utpu
t tim
ings
are
refe
renc
ed to
VC
CQ
/2 a
nd D
LL o
n an
d lo
cked
.6.
t DQ
SQ
def
ines
the
skew
bet
wee
n D
QS
, DQ
S#
to d
ata
and
does
not
def
ine
DQ
S, D
QS
# to
clo
ck.
7.E
arly
dat
a tra
nsiti
ons
may
not
alw
ays
happ
en a
t the
sam
e D
Q. D
ata
trans
ition
s of
a D
Q c
an v
ary
(eith
er e
arly
or l
ate)
w
ithin
a b
urst
.
T0T1
T2T3
T4T5
T6T7
T8T9
T10
Bank
,Co
l n
t RPS
T
NOP
READ
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
CK
CK#
Com
man
d1
Addr
ess 2
t DQ
SQ (M
AX)
DQS,
DQ
S#
DQ3
(last
dat
a va
lid)
DQ3
(firs
t da
ta n
o lo
nge
r val
id)
All D
Q c
olle
ctive
ly
DO nDO n+
3DO n +
2DO n+
1DO n+
7DO n+
6DO n+
5DO n+
4DO n +
2DO n+
1DO n+
7DO n +
6DO n+
5DO n+
4
DO n+
3DO n
+ 2
DO n+
1DO n
DO n+
7DO n
+ 6
DO n+
5
DO nDO n +
3
t RP
RE
Don
’t Ca
reTr
ansi
tioni
ng D
ata
Dat
a va
lidD
ata
valid
t QH
t QH
t HZ
(DQ
) MAX
DO
n+
4
RL
= A
L +
CL
t DQ
SQ (M
AX)
t LZ
(DQ
) MIN
Figure 69 - Data Output Timing – tDQSQ and Data Valid Window
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tHZandtLZtransitionsoccurinthesameaccesstimeasvaliddatatransitions.Theseparametersarereferencedtoaspecificvoltagelevelwhichspeci-fieswhenthedeviceoutputisnolongerdrivingtHZ(DQS)andtHZ(DQ)orbeginsdrivingtLZ(DQS).tLZ(DQ),Figure71showsamethodtocalculatethepointwhenthedeviceisnotlongerdrivingtHZ(DQS)andtHZ(DQ)orbeginsdrivingtLZ(DQS),tLZ(DQ)bymeasuringthesignalattwodifferentvoltages.Theactualvoltagemeasurementpointsarenotcriticalaslongasthecalculationisconsistent.TheparameterstLZ(DQS),tLZ(DQ),tHZ(DQS)andtHZ(DQ)aredefinedassingle-ended.
OUTPUT TIMING
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RL
mea
sure
dto
this
poi
nt
DQS,
DQ
S#ea
rly s
trobeCK
t DQ
SCK (
MIN
)
t LZ
(DQ
S) M
IN
t HZ
(DQ
S) M
IN
DQS,
DQ
S#la
te s
trobe
t DQ
SCK (
MAX
)t L
Z (D
QS)
MAX
t HZ
(DQ
S) M
AX
t DQ
SCK (
MIN
)t D
QSC
K (M
IN)
t DQ
SCK (
MAX
)t D
QSC
K (M
AX)
t DQ
SCK (
MAX
)
t DQ
SCK (
MIN
)
CK#
t RPR
E
t QSH
t QSL
t QSL
t QSL
t QSL
t QSH
t QSH
t QSH
Bit 0
Bit 1
Bit 2
Bit
7
t RPR
E
Bit 0
Bit 1
Bit 2
Bit
7Bi
t 6Bi
t 3Bi
t 4Bi
t 5Bit 6
Bit 4
Bit 3
Bit 5
t RPS
T
t RPS
T
T0T1
T2T3
T4T5
T6
Figure 70 - Data Strobe Timing – READs
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Notes: 1. Within a burst, the rising strobe edge is not necessarily fixed at tDQSCK (MIN) or tDQSCK (MAX). Instead, the rising strobe edge can vary between tDQSCK (MIN) and tDQSCK (MAX).
2. The DQS high pulse width is defined by tQSH, and the DQS low pulse width is defined by tQSL. Likewise, tLZ (DQS) MIN and tHZ (DQS) MIN are not tied to tDQSCK (MIN) (early strobe case) and tLZ (DQS) MAX and tHZ (DQS) MAX are not tied to tDQSCK (MAX) (late strobe case); however, they tend to track one another.
3. The minimum pulse width of the READ preamble is defined by tRPRE (MIN). The minimum pulse width of the READ postamble is defined by tRPST (MIN).
tHZ (DQS), tHZ (DQ)
tHZ (DQS), tHZ (DQ) end point = 2 × T1 - T2
VOH - xmV
VTT - xmV
VOL + xmV
VTT + xmVVOH - 2xmV
VTT - 2xmV
VOL + 2xmV
VTT + 2xmV
tLZ (DQS), tLZ (DQ)
tLZ (DQS), tLZ (DQ) begin point = 2 × T1 - T2
T1
T1T2
T2
Figure 71 - Method for Calculating tLZ and tHZ
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FiGure 72 - trpre timiNG
tRPREDQS - DQS#
DQS
DQS#
T1tRPRE begins
T2tRPRE ends
CK
CK#
VTT
Resulting differential signal relevant for tRPRE specification
tC
tA tB
tD
0V
VTT
VTT
Single-ended signal, providedas background information
Single-ended signal, providedas background information
FiGure 73 - trpSt timiNG
tRPSTDQS - DQS#
DQS
DQS#
T1tRPST begins
T2tRPST ends
Resulting differential signal relevant for tRPST specification
CK
CK#
VTT
tC
tA
tB
tD
Single-ended signal, providedas background information
0V
VTT
VTT
Single-ended signal, providedas background information
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FiGure 74 - twpre timiNG
DQS - DQS#
T1 tWPRE begins
T2 tWPRE ends
tWPRE Resulting differential
signal relevant for tWPRE specification
0V
CK
CK#
VTT
FiGure 75 - twpSt timiNG
tWPSTDQS - DQS#
T1tWPST begins
T2tWPST ends
Resulting differential signal relevant for tWPST specification
0V
CK
CK#
VTT
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WRITE
WRITEburstsareinitiatedwithaWRITEcommand.ThestartingCOLUMNandBANKaddressesareprovidedwiththeWRITEcommand,andAUTOPRECHARGEisselected,theROWbeingaccessedwillbePRECHARGEDattheendofWRITEburst.IfAUTOPRECHARGEisnotselected,theROWwillremainopenforsubsequentaccesses.AfteraWRITEcommandhasbeenissued,theWRITEburstmaynotbeinterrupted.ForthegenericWRITEcom-mandsusedinFigure76thoughFigure84,AUTOPRECHARGEisdisabled.
DuringWRITEbursts,thefirstvaliddata-inelementisregisteredonarisingedgeofDQSxfollowingtheWRITELATENCY(WL)clockslaterandsubse-quentdataelementswillberegisteredonsuccessiveedgesofDQSx.WRITELATENCY(WL)isdefinedasthesumofPOSTEDCASADDITIVELATENCY(AL)andCASWRITELATENCY(CWL):WL=AL+CWL.ThevaluesofALandCWLareprogrammedintheMR-andMR2registers,respectively.PriortothefirstvalidDQSxedge,afullcycleisneeded(includingadummycrossoverofDQSx,DQSx\)andspecifiedastheWRITEpreambleshowninFigure76.ThehalfcycleonDQSxfollowingthelastdata-inelementisknownastheWRITEpostamble.
ThetimebetweentheWRITEcommandandthefirstvalidedgeofDQSxisWLclocks±tDQSS.Figure77throughFigure84showthenominalcasewheretDQSS=0ns;however,Figure76includestDQSS(MIN)andtDQSS(MAX)cases.
DatamaybemaskedfromcompletingaWRITEusingdatamask.ThemaskoccursontheDMballalignedtotheWRITEdata.IfDMisLOW,theWRITEcompletesnormally.IfDMisHIGH,thatbitofdataismasked.
Uponcompletionofaburst,assumingnoothercommandshavebeeninitiated,theDQwillremainHIGH-Zandanyadditionalinputdatawillbeignored.
DataforanyWRITEburstmaybeconcatenatedwithasubsequentWRITEcommandtoprovideacontinuousflowofinputdata.ThenewWRITEcom-mandcanbetCCDclocksfollowingthepreviousWRITEcommand.Thefirstdataelementfromthenewburstisappliedafterthelastelementofacompletedburst.Figures77and78showconcatenatedbursts.AnexampleofnonconsecutiveWRITESisshowninFigure79.
DataforanyWRITEburstmaybefollowedbyasubsequentREADcommandaftertWTRhasbeenmet(seeFigures80,81and82).
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FiGure 76 - write burSt
Notes: 1. NOP commands are shown for ease of illustration; other commands may be valid at these times.
2. The BL8 setting is activated by either MR0[1:0] = 00 or MR0[1:0] = 01 and A12 = 1 during the WRITE command at T0.
3. DI n = data-in for column n.4. BL8, WL = 5 (AL = 0, CWL = 5).5. tDQSS must be met at each rising clock edge.6. tWPST is usually depicted as ending at the crossing of DQS, DQS#; however, tWPST actually
ends when DQS no longer drives LOW and DQS# no longer drives HIGH.
DI n + 3
DI n + 2
DI n + 1
DI n
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10
Don’t CareTransitioning Data
DI n + 7
DI n + 6
DI n + 5
DIn + 4
Bank,Col n
NOPWRITE NOPNOP NOP NOP NOP NOP NOP NOP NOP
CK
CK#
Command1
DQ3
DQS, DQS#
Address2
tWPST
tWPRE tWPST
tDQSL
DQ3
DQ3
tWPST
DQS, DQS#
DQS, DQS#
tDQSL
tWPRE
tDQSS
tDQSS tDSH tDSH tDSH tDSH
tDSS tDSS tDSS tDSS tDSS
tDSS tDSS tDSS tDSS tDSS
tDSH tDSH tDSH tDSH
tDQSLtDQSH tDQSLtDQSH tDQSLtDQSH tDQSH tDQSL
tDQSL
tDQSL
tDQSLtDQSHtDQSH
tDQSH
tDQSH
tDQSLtDQSH tDQSLtDQSH tDQSH
tDQSLtDQSH tDQSLtDQSH tDQSLtDQSH tDQSH
WL = AL + CWL
tDQSS (MIN)
tDQSS (NOM)
tDQSS (MAX)
tDQSL
tWPRE
DI n + 3
DI n + 2
DI n + 1
DI n
DI n + 7
DI n + 6
DI n + 5
DIn + 4
DI n + 3
DI n + 2
DI n + 1
DI n
DI n + 7
DI n + 6
DI n + 5
DIn + 4
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FiGure 77 - cONSecutiVe write (bl8) tO write (bl8)
Notes: 1. NOP commands are shown for ease of illustration; other commands may be valid at these times.2. The BL8 setting is activated by either MR0[1:0] = 00 or MR0[1:0] = 01 and A12 = 1 during the WRITE commands at
T0 and T4.3. DI n (or b) = data-in for column n (or column b).4. BL8, WL = 5 (AL = 0, CWL = 5).
WL = 5
WL = 5
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
tCCD
tWPRE
T10 T11
Don’t CareTransitioning Data
T12 T13 T14
ValidValid
NOPWRITE WRITENOP NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP
CK
CK#
Command1
DQ3
DQS, DQS#
Address2
tWPST
tWRtWTR
tBL = 4 clocks
DI n + 3
DI n + 2
DI n + 1
DI n
DI n + 7
DI n + 6
DIn + 5
DIn + 4
DI b + 3
DI b + 2
DI b + 1
DI b
DI b + 7
DI b + 6
DI b + 5
DIb + 4
FiGure 78 - cONSecutiVe write (bc4) tO write (bc4) Via mrS Or OtF
Notes: 1. NOP commands are shown for ease of illustration; other commands may be valid at these times.2. BC4, WL = 5 (AL = 0, CWL = 5).3. DI n (or b) = data-in for column n (or column b).4. The BC4 setting is activated by MR0[1:0] = 01 and A12 = 0 during the WRITE command at T0 and T4.
WL = 5
WL = 5
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
tCCD
tWPRE
T10 T11
Don’t CareTransitioning Data
T12 T13 T14
Valid Valid
NOPWRITE WRITENOP NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP
CK
CK#
Command1
DQ3
DQS, DQS#
Address2
tWPST
tWRtWTR
tWPST tWPRE
DI n + 3
DI n + 2
DI n + 1
DIn
DI b + 3
DI b + 2
DI b + 1
DI b
tBL = 4 clocks
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FiGure 79 - NONcONSecutiVe write tO write
Notes: 1. DI n (or b) = data-in for column n (or column b).2. Seven subsequent elements of data-in are applied in the programmed order following DO n.3. Each WRITE command may be to any bank.4. Shown for WL = 7 (CWL = 7, AL = 0).
CK
CK#
Command NOP NOP NOP
Address
DQ
DM
DQS, DQS#
Transitioning Data
NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17
NOPWRITE NOP WRITE
ValidValid
NOP
DIn
DIn + 1
DIn + 2
DIn + 3
DIn + 4
DIn + 5
DIn + 6
Don't Care
DIn + 7
DIb
DIb + 1
DIb + 2
DIb + 3
DIb + 4
DIb + 5
DIb + 6
DIb + 7
WL = CWL + AL = 7WL = CWL + AL = 7
FiGure 80 - write (bl8) tO read (bl8)
Notes: 1. NOP commands are shown for ease of illustration; other commands may be valid at these times.2. tWTR controls the WRITE-to-READ delay to the same device and starts with the first rising clock edge after the last write
data shown at T9.3. The BL8 setting is activated by either MR0[1:0] = 00 or MR0[1:0] = 01 and MR0[12] = 1 during the WRITE command at T0.
The READ command at Ta0 can be either BC4 or BL8, depending on MR0[1:0] and the A12 status at Ta0.4. DI n = data-in for column n.5. RL = 5 (AL = 0, CL = 5), WL = 5 (AL = 0, CWL = 5).
WL = 5
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
tWPRE
T10 T11
Don’t CareTransitioning Data
Ta0
NOPWRITE READ
ValidValid
NOP NOP NOP NOP NOP NOP NOP NOPNOP NOP
CK
CK#
Command1
DQ4
DQS, DQS#
Address3
tWPST
tWTR 2
Indicates a Break in Time Scale
DIn + 3
DIn + 2
DIn + 1
DIn
DIn + 7
DIn + 6
DIn + 5
DIn + 4
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FiGure 81 - write tO read (bc4 mOde reGiSter SettiNG)
Not
es:
1.N
OP
com
man
ds a
re s
how
n fo
r eas
e of
illu
stra
tion;
oth
er c
omm
ands
may
be
valid
at t
hese
tim
es.
2.t W
TR c
ontro
ls th
e W
RIT
E-to
-RE
AD
del
ay to
the
sam
e de
vice
and
sta
rts w
ith th
e fir
st ri
sing
clo
ck e
dge
afte
r the
last
writ
e da
ta s
how
n at
T7.
3.Th
e fix
ed B
C4
setti
ng is
act
ivat
ed b
y M
R0[
1:0]
= 1
0 du
ring
the
WR
ITE
com
man
d at
T0
and
the
RE
AD
com
man
d at
Ta0
.4.
DI n
= d
ata-
in fo
r col
umn
n.5.
BC
4 (fi
xed)
, WL
= 5
(AL
= 0,
CW
L =
5), R
L =
5 (A
L =
0, C
L =
5).
WL
= 5
T0T1
T2T3
T4T5
T6T7
T8T9
Ta0
Don
’t Ca
reTr
ansi
tioni
ng D
ata
NOP
WRI
TE
Valid
READ
Valid
PON
PON
PON
PON
PON
PON
PON
NOP
CK
CK#
Com
man
d1
DQ4
DQS,
DQ
S#
Addr
ess3
t WPS
T
t WTR
2
t WP
RE
Indi
cate
s a
Bre
ak in
Ti
me
Sca
le
DI n +
3DI n +
2DI n +
1DI n
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FiGure 82 - write (bc4 OtF) tO read (bc4 OtF)
Not
es:
1.N
OP
com
man
ds a
re s
how
n fo
r eas
e of
illu
stra
tion;
oth
er c
omm
ands
may
be
valid
at t
hese
tim
es.
2.t W
TR c
ontro
ls th
e W
RIT
E-to
-RE
AD
del
ay to
the
sam
e de
vice
and
sta
rts a
fter t B
L.3.
The
BC4
OTF
set
ting
is a
ctiv
ated
by
MR
0[1:
0] =
01
and
A12
= 0
dur
ing
the
WR
ITE
com
man
d at
T0
and
the
RE
AD
com
man
d at
Tn.
4.D
I n =
dat
a-in
for c
olum
n n.
5.B
C4,
RL
= 5
(AL
= 0,
CL
= 5)
, WL
= 5
(AL
= 0,
CW
L =
5).
WL
= 5
RL
= 5
T0T1
T2T3
T4T5
T6T7
T8T9
t WP
RE
T10
T11
Don
’t Ca
reTr
ansi
tioni
ng D
ata
Tn
NOP
WRI
TERE
AD
Valid
Valid
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
NOP
CK
CK#
Com
man
d1
DQ4
DQS,
DQ
S#
Addr
ess3
t WPS
T
t BL
= 4
clock
s
NOP
t WTR
2
Indi
cate
s a
Bre
ak in
Ti
me
Sca
le
DI n
+ 3
DI n
+ 2
DI n
+ 1
DI n
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FiGure 83 - write (bl8) tO precharGe
Notes: 1. DI n = data-in from column n.2. Seven subsequent elements of data-in are applied in the programmed order following
DO n.3. Shown for WL = 7 (AL = 0, CWL = 7).
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 Ta0 Ta1
DIn + 3
DIn + 2
DIn + 1
DIn
DIn + 6
DIn + 7
DIn + 5
DIn + 4
NOPWRITE
Valid
NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP PRE
CK
CK#
Command
DQ BL8
DQS, DQS#
Address
Don’t CareTransitioning DataIndicates a Break in Time Scale
tWRWL = AL + CWL
Valid
FiGure 84 - write (bc4 mOde reGiSter SettiNG) tO precharGe
Notes: 1. NOP commands are shown for ease of illustration; other commands may be valid at these times.
2. The write recovery time ( tWR) is referenced from the first rising clock edge after the last write data is shown at T7. tWR specifies the last burst WRITE cycle until the PRECHARGE command can be issued to the same bank.
3. The fixed BC4 setting is activated by MR0[1:0] = 10 during the WRITE command at T0.4. DI n = data-in for column n.5. BC4 (fixed), WL = 5, RL = 5.
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 Ta0 Ta1
DIn + 3
DIn + 2
DIn + 1
DIn
NOPWRITE
Valid
NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP PRE
CK
CK#
Comman d
DQ BC4
DQS, DQS#
Address
Don’t CareTransitioning DataIndicates a Break in Time Scale
tWRWL = AL + CWL
Valid
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FiGure 85 - write (bc4 OtF) tO precharGe
Notes: 1. NOP commands are shown for ease of illustration; other commands may be valid at these times.
2. The write recovery time ( tWR) is referenced from the rising clock edge at T9. tWR specifies the last burst WRITE cycle until the PRECHARGE command can be issued to the same bank.
3. The BC4 setting is activated by MR0[1:0] = 01 and A12 = 0 during the WRITE command at T0.4. DI n = data-in for column n.5. BC4 (OTF), WL = 5, RL = 5.
WL = 5
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 Tn
Don’t Care Transitioning Data
Bank, Col n
NOP WRITE PRENOP NOP NOP NOP NOP NOP NOP NOP
CK
CK#
Command1
DQ4
DQS, DQS #
Address3
tWPST tWPRE
Indicates a Break In Time Scale
DI n + 3
DI n + 2
DI n + 1
DI n
tWR2
Valid
DQ INPUT TIMING
FiGure 86 - data iNput timiNG
tDHtDS
DM
DQ DIb
DQ S, DQS#
Don ’t CareTransitioning Data
tDQSH tDQSLtWPRE tWPST
bythememorycontrollerafterthelastdataiswrittentotheSDRAMduringtheWRITEpostamble,tWPST.
DatasetupandholdtimesareshowninFigure86.AllsetupandholdtimesaremeasuredfromthecrossingpointsofDQSxandDQSx\.Thesesetupandholdvaluespertaintodatainputanddatamaskinput.
Additionally,thehalfperiodofthedatainputstrobeisspecifiedbytDQSH and tDQSL.
Figure76showsthestrobetoclocktimingduringaWRITE.DQSx,DQSx\musttransitionwithin0.25tCKoftheclocktransitionsaslimitedbytDQSS.Alldataanddatamasksetupandholdtimingsaremea-suredrelativetotheDQSx,DQSx\crossings,nottheclockcrossing.
TheWRITEpreambleandpostamblearealsoshown.OneclockpriortodatainputtotheSDRAM,DQSxmustbeHIGHandDQSx\mustbeLOW.Thenforahalfclock,DQSxisdrivenLOW(DQSx\isdrivenHIGH)duringtheWRITEpreamble.tWPRE,likewise,DQSxmustbekeptLOW
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PRECHARGE
InputA10determineswhetheronebankorallbanksaretobePRECHARGEDandinthecasewhereonlyonebankistobeprecharged,inputsBA[2:0]selectthearrayBANK.
WhenallbanksaretobePRECHARGED,inputsBA[2:0]aretreatedas“Don’tCare”.AfterabankisPRECHARGED,itisintheIDLEStateandmustbeACTIVATEDpriortoanyREADorWRITEcommandsbeingissued.
SELF REFRESH
TheSELFREFRESHcommandisinitiatedlikeaREFRESHcommandexceptCKEisLOW.TheDLLisautomaticallydisableduponenteringSELFREFRESHandisautomaticallyenabledandresetuponexitingSELFREFRESH.Allpowersupplyinputs(includingVREFCAandVREFDQ)mustbemaintainedatvalidlevelsuponentry/exitandduringSELFREFRESHmodeoperation.VREFDQmayfloatornotdriveVDDQ/2whileintheSELFREFRESHmodeundercertainconditions:
•Vss<VREFDQ<VDDismaintained•VREFDQisvalidandstablepriortoCKEgoingbackHIGH•ThefirstWRITEoperationmaynotoccurearlierthan512clocksafterVREFDQisvalid•AllotherSELFREFRESHmodeexittimingrequirementsaremet
TheSDRAMmustbeidlewithallBANKSinthePRECHARGEstate(tRPissatisfiedandnoburstsareinprogress)beforeaSELFREFRESHentrycommandcanbeissued.ODTmustalsobeturnedoffbeforeSELFREFRESHentrybyregisteringtheODTballLOWpriortotheSELFREFRESHentrycommand(see“On-DieTermination(ODT)fortimingrequirements).IfRTT_NOMandRTT_WRaredisabledinthemoderegisters,ODTcanbea“Don’tCare”.AftertheSELFREFRESHentrycommandisregistered,CKEmustbeheldLOWtokeeptheSDRAMinSELFREFRESHmode.
AftertheSDRAMhasenteredSELFREFRESHmode,allexternalcontrolsignals,exceptCKEandRESET\,become“Don’tCare”.TheSDRAMinitiatesaminimumofoneREFRESHcommandinternallywithinthetCKEperiodwhenitentersSELFREFRESHmode.
TherequirementsforenteringandexitingSELFREFRESHmodedependonthestateoftheclockduringSELFREFRESHmode.Firstandforemost,theclockmustbestable(meetingtCKspecifications)whenSELFREFRESHmodeisentered.IftheclockremainsstableandthefrequencyinnotalteredwhileinSELFREFRESHmode,thentheSDRAMisallowedtoexitSELFREFRESHaftertCKESRissatisfied(CKEisallowedtotransitionHIGHtCKESRlaterthanwhenCKEwasregisteredLOW).SincetheclockremainsstableinSELFREFRESHmode(nofrequencychange),tCKSREandtCKSRXarenotrequired.However,iftheclockisalteredduringSELFREFRESHmode,thentCKSREandtCKSRXmustbesatisfied.WhenenteringSELFREFRESH,tCKSREmustbesatisfiedpriortoalteringtheclock’sfrequency.PriortoexitingSELFREFRESH,tCKSRXmustbesatisfiedpriortoregisteringCKEHIGH.
WhenCKEisHIGHduringSELFREFRESHexit,NOPorDESmustbeissuedfortXStime.tXSisrequiredforthecompletionofanyinternalREFRESHthatisalreadyinprogressandmustbesatisfiedbeforeavalidcommandnotrequiringalockedDLLcanbeissuedtothedevice.tXSisalsotheearliesttimethataSELFREFRESHre-entrymayoccur(seeFigure87).BeforeacommandrequiringalockedDLLcanbeapplied,aZQCLcommandmustbeissued.
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FiGure 87 - SelF reFreSh eNtry/exit timiNG
Notes: 1. The clock must be valid and stable meeting tCK specifications at least tCKSRE after entering self refresh mode, and at least tCKSRX prior to exiting self refresh mode, if the clock is stopped or altered between states Ta0 and Tb0. If the clock remains valid and unchanged from entry and during self refresh mode, then tCKSRE and tCKSRX do not apply; however, tCKESR must be satisfied prior to exiting at SRX.
2. ODT must be disabled and RTT off prior to entering self re fresh at state T1. If both RTT_NOM and RTT_WR are disabled in the mode registers, ODT can be a “Don’t Care.”
3. Self refresh entry (SRE) is synchronous via a REFRESH command with CKE LOW.4. A NOP or DES command is required at T2 after the SRE command is issued prior to the
inputs becoming “Don’t Care.”5. NOP or DES commands are required prior to exiting self refresh mode until state Te0.6. tXS is required before any commands not requiring a locked DLL.7. tXSDLL is required before any commands requiring a locked DLL.8. The device must be in the all banks idle state prior to entering self refresh mode. For exam-
ple, all banks must be precharged, tRP must be met, and no data bursts can be in progress.9. Self refresh exit is asynchronous; however, tXS and tXSDLL timings start at the first rising
clock edge where CKE HIGH satisfies t ISXR at Tc1. tCKSRX timing is also measured so that t ISXR is satisfied at Tc1.
CK
CK#
Command NOP NOP4SRE(REF)3
Address
CKE
ODT2
RESET#2
Valid
Valid6SRX (NOP) NOP5
tRP 8 tXS 6 , 9
tXSDLL7, 9
ODTL
t IStCPDEDtIS
t IS
Enter self refresh mode(synchronous)
Exit self refresh mode(asynchronous)
T0 T1 T2 Tc0 Tc1 Td0Tb0
Don’t Care
Te0
Valid
Valid7
Valid
Valid Valid
t IH
Ta0 Tf0
Indicates a Break in Time Scale
tCKSRX1tCKSRE1
tCKESR (MIN)1
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SelfRefreshTemperature(SRT)
EXTENDED TEMPERATURE USAGE
Themodulesupportstheoptionalextendedtemperaturerangeupto≤95°CwhilesupportingSELFREFRESH/AUTOREFRESHandsupportTAtem-peratures>95°C≤125°CwithMANUALREFRESHonly.WhenusingSELFREFRESH/AUTOREFRESHandtheambienttemperatureis>85°C,SRTandASRoptionsmustbeused.
TheextendedrangetemperaturerangeDRAMmustbeREFRESHEDexternallyat2Xanytimetheambienttemperatureis>85°C.TheexternalREFRESH-INGrequirementisaccomplishedbyreducingtheREFRESHPERIODfrom64msto32ms.SELFREFRESHmoderequirestheuseofASRorSRTtosupporttheextendedtemperature.
Field MR2 Bits Description
SRT
ASR
table 63: SelF reFreSh temperature aNd autO SelF reFreSh deScriptiON
IfASRisdisabled(MR2[6]=0),SRTmustbeprogrammedtoindicatetOPERduringSELFREFRESH;
*MR2[7]=0:Normaloperatingtemperaturerange(0°Cto≤ 85°C)
*MR2[7]=1:Extendedoperatingtemperaturerange(>85°Cto≤105°C)
IfASRisenabled(MR2[7]=1),SRTmustbesetto0,eveniftheextendedtemperaturerangeissupported.
*MR2[7]=0:SRTisdisabled.
WhenASRisenabled,theSDRAMautomaticallyprovidesSELFREFRESHpowermanagementfunctions,(refreshrate
forallsupportedoperatingtemperaturevalues)
*MR2[6]=1:ASRisenabled(M7must=0)
WhenASRisnotenabled,theSRTbitmustbeprogrammedtoindicatetOPERduringSELFREFRESHoperation.
*MR2[6]=0:ASRisdisabled,mustusemanualSELFREFRESH(SRT)
7
6
AutoSelfRefresh(ASR)
SELF REFRESH Operation0
0
1
1
table 64: SelF reFreSh mOde Summary
SELFREFRESHModeissupportedinthenormaltemperaturerange.
SELFREFRESHModeissupportedinnormalandextended(≤ 95°CMAX)
temperatureranges;WhenSRTisenabled,itincreasesselfrefreshpower
consumption.
Selfrefreshmodeissupportedinnormalandextendedtemperatureranges;
Selfrefreshpowerconsumptionmaybetemperature-dependent.
Illegal.
0
1
0
1
Permitted Operating TemperatureRange for Self Refresh Mode
MR2[7](SRT)
MR2[6](ASR)
Normal(0°Cto85°C)
Normalandextended(0°Cto95°C)
Normalandextended(0°Cto95°C)
POWER-DOWN MODE
Power-downissynchronouslyenteredwhenCKEisregisteredLOWcoincidentwithaNOPorDEScommand.CKEisnotallowedtogoLOWwhileeitheranMRS,MPR,ZQCAL,READorWRITEoperationisinprogress.CKEisallowedtogoLOWwhileanyoftheotherlegaloperationsareinprogress.However,thePOWER-DOWNIDDspecificationsarenotapplicableuntilsuchoperationshavebeencompleted.DependingonthepreviousSDRAMstateandthecommandissuedpriortoCKEgoingLOW,certaintimingconstraintsmustbesatisfied(asnotedinTable65).TimingdiagramsdetailingthedifferentPOWER-DOWNmodeentryandexitsareshowninFigure88throughFigure97.
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Idle or Active
Idle or Active
Active
Active
Active
Active
Active
Idle
POWER-DOWN
Idle
table 65: cOmmaNd tO pOwer-dOwN eNtry parameterS
tACTPDENtPRPDENtRDPDENtWRPDEN
tWRAPDEN
tREFPDENtXPDLL
tMRSPDEN
ACTIVATE
PRECHARGE
READorREADAP
WRITE:BL8OTF,BL8MRS,BC4OTF
WRITE:BC4MRS
WRITEAP:BL8OTF,BL8MRS,BC4OTF
WRITEAP:BC4MRS
REFRESH
REFRESH
MODEREGISTERSET
Last Command prior to CKE Low 1
1tCK
1tCK
RL+4tCK+1tCK
WL+4tCK+tWR/tCK
WL+2tCK+tWR/tCK
WL+4tCK+WR+1tCK
WL+2tCK+WR+1tCK
1tCK
Greaterof10tCKor24nstMOD
Figure 95
Figure96
Figure 91
Figure92
Figure92
Figure 93
Figure 93
Figure94
Figure 98
Figure97
SDRAM Status Parameter (MIN) Parameter Value Figure
EnteringPOWER-DOWNmodedisablestheinputandoutputbuffers,excludingCK,CK\,ODT,CKEandRESET\.NOPorDEScommandsarerequireduntil tCPDEDhasbeensatisfied,atwhichtimeallspecifiedinput/outputbufferswillbedisabled.TheDLLshouldbeinalockedstatewhenPOWER-DOWNisenteredforthefastestmodetiming.IftheDLLisnotlockedduringthePOWER-DOWNentry,theDLLmustberesetafterexitingPOWER-DOWNforproperREADoperationaswellassynchronousODToperation.
DuringPOWER-DOWNentry,ifanybankremainsopenafterallin-progresscommandsarecomplete,theSDRAMwillbeinACTIVEPOWER-DOWN.Ifallbanksareclosedafterallin-progresscommandsarecomplete,theSDRAMwillbeinPRECHARGEPOWER-DOWNmodeorfastEXITmode.WhenenteringPRECHARGEPOWER-DOWN,theDLListurnedoffinslowexitmodeorkeptoninfastEXITmode.
TheDLLremainsonwhenenteringACTIVEPOWER-DOWNaswell.ODThasspecialtimingconstraintswhenslowEXITmode,PRECHARGEPOWER-DOWNisenabledandentered.Referto“AsynchronousODTMode”fordetailedODTusagerequirementsinslowEXITmodePRECHARGEPOWER-DOWN.AsummaryofthetwoPOWER-DOWNmodesislistedinTable66.
WhileineitherPOWER-DOWNstate,CKEisheldLOW,RESET\isheldHIGH,andastableclocksignalmustbemaintained.ODTmustbeinavalidstatebutallotherinputsignalsarea“Don’tCare”.IfRESET\goesLOWduringPOWER-DOWN,theSDRAMwillswitchoutofPOWER-DOWNandgointotheRESETstate.AfterCKEisregisteredLOW,CKEmustremainLOWuntiltPD(MIN)hasbeensatisfied.ThemaximumtimeallowedforPOWER-DOWNdurationistPD(MAX)(9xtREFI).
ThePOWER-DOWNstatesaresynchronouslyexitedwhenCKEisregisteredHIGH(witharequiredNOPorDEScommand).CKEmustbemaintainedHIGHuntiltCKEhasbeensatisfied.Avalid,executablecommandmaybeappliedafterPOWER-DOWNEXITLATENCY,tXP,tXPDLLhavebeensatisfied.AsummaryofthePOWER-DOWNmodesislistedinTable66.
DLL State ACTIVE(anybankopen)
PRECHARGE(allbanksPRECHARGED)
table 66: pOwer-dOwN mOdeS
ON
ON
OFF
Relevant ParametersMR1[12]tXPtoanyothervalidCOMMANDtXPtoanyothervalidCOMMANDtXDLLtoCOMMANDSthatrequiretheDLL
tobelocked(READ,RDAP,ODTON).tXPtoanyothervalidCOMMAND.
SDRAM State“Don’tCare”
1
0
FAST
FAST
SLOW
POWER-DOWN exit
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FiGure 88 - actiVe pOwer-dOwN eNtry aNd exit
CK
CK#
Command NOP NOP NOP NOP
Address
CKE
tCK tCH tCL
Enter power-downmode
Exit power-downmode
Don’t Care
ValidValid
Valid
tCPDED
Valid
t IS
t IH
t IH
t IS
T0 T1 T2 Ta0 Ta1 Ta2 Ta3 Ta4
NOP
tXP
tCKE (MIN)
Indicates a Break in Time Scale
tPD
FiGure 89 - precharGe pOwer-dOwN (FaSt-exit mOde) eNtry aNd exit
tCKEmin
tCKEmin
CK
CK#
PONPONPONPONdnammoC
CKE
tCK tCH tCL
Enter power-downmode
Exit power-downmode
tPD
Valid
tCPDED
tIS
t IHt IS
T0 T1 T2 T3 T4 T5 Ta0 Ta1
NOP
Don’t CareIndicates a Break in Time Scale
tCKE (MIN)
tXP
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FiGure 90 - precharGe pOwer-dOwN (SlOw-exit mOde) eNtry aNd exit
Notes: 1. Any valid command not requiring a locked DLL.2. Any valid command requiring a locked DLL.
CK
CK#
Command PON PON PON
CKE
tCK tCH tCL
Enter power-down mode
Exit power-down mode
tPD
Valid 2Valid 1PRE
tXPDLL
tCPDED
t IS
t IH t IS
T0 T1 T2 T3 T4 Ta Ta1 Tb
NOP
Don’t Care Indicates a Break in Time Scale
tXP
tCKE (MIN)
FiGure 91 - pOwer-dOwN eNtry aFter read Or read with autO precharGe (rdap)
T0 T1 Ta0 Ta1 Ta2 Ta3 Ta4 Ta5 Ta6 Ta7 Ta8 Ta9
Don’t CareTransitioning Data
Ta10 Ta11 Ta12
NOP
Valid
READ/RDAP NOP NOP NOP NOP NOP NOP NOP NOP NOP
CK
CK#
Command
DQ BL8
DQ BC4
DQS, DQS#
Address
CKE
tCPDEDtIS
tPD
Power-down orself refresh entry
Indicates a break inTime Scale
tRDPDEN
DIn + 3
DIn + 1
DIn + 2
DIn
RL = AL + CL
DI n + 3
DI n + 2
DI n + 1
DIn
DI n + 6
DI n + 7
DI n+ 5
DI n + 4
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FiGure 92 - pOwer-dOwN eNtry aFter write
Notes: 1. CKE can go LOW 2tCK earlier if BC4MRS.
T0 T1 Ta0 Ta1 Ta2 Ta3 Ta4 Ta5 Ta6 Ta7 Tb0 Tb1 Tb2 Tb3 Tb4
NOPWRITE
Valid
NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP
CK
CK#
Command
DQ BL8
DQ BC4
DQS, DQS#
Address
CKE
tCPDED
Power-down orself refresh entry 1
Don’t CareTransitioning Data
tWRPDEN
DIn + 3
DIn + 1
DIn + 2
DIn
tPD
Indicates A Break in Time Scale
DI n + 3
DI n + 2
DI n + 1
DI n
DI n + 6
DI n + 7DI
n + 5DI
n + 4
t IS
WL = AL + CWL tWR
FiGure 93 - pOwer-dOwN eNtry aFter write with autO precharGe (wrap)
Notes: 1. tWR is programmed through MR0[11:9] and represents tWR (MIN)ns/ tCK rounded up to the next integer tCK.
2. CKE can go LOW 2tCK earlier if BC4MRS.
T0 T1 Ta0 Ta1 Ta2 Ta3 Ta4 Ta5 Ta6 Ta7 Tb0 Tb1
Don’t CareTransitioning Data
Tb2 Tb3 Tb4
NOPWRAP
Valid
NOP NOP NOP
CK
CK#
Command
DQ BL8
DQ BC4
DQS, DQS#
Address
A10
CKE
tPD
tWRAPDEN
Power-down orself refresh entry 2
Start internalprecharge
tCPDEDtIS
Indicates a Break in Time Scale
DI n + 3
DI n + 2
DI n + 1
DIn
DI n + 6
DI n + 7DI
n + 5DI
n + 4
DI n + 3
DI n + 2
DI n + 1
DI n
WR1WL = AL + CWL
NOP NOP NOP NOP NOP NOP NOP NOP
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FiGure 94 - reFreSh tO pOwer-dOwN eNtry
Notes: 1. After CKE goes HIGH during tRFC, CKE must remain HIGH until tRFC is satisfied.
CK
CK#
Command REFRESH NOP NOP NOP NOP Valid
CKE
tCK tCH tCL
tCPDED
tREFPDEN
tIS
T0 T1 T2 T3 Ta0 Ta1 Ta2 Tb0
tXP (MIN)
tRFC (MIN)1
Don’t CareIndicates a Break In Time Scale
tCKE (MIN)
tPD
FiGure 95 - actiVate tO pOwer-dOwN eNtry
tCKE
CK
CK#
Command
Address
ACTIVE NOP NOP
CKE
tCK tCH tCL
Don’t Care
tCPDED
tACTPDEN
Valid
tIS
T0 T1 T2 T3 T4 T5 T6 T7
tPD
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FiGure 96 - precharGe tO pOwer-dOwN eNtry
CK
CK#
Command
Address
CKE
tCK tCH tCL
Don’t Care
tCPDED
tPREPDEN
tIS
T0 T1 T2 T3 T4 T5 T6 T7
tPD
All/singlebank
PRE NOP NOP
FiGure 97 - mrS cOmmaNd tO pOwer-dOwN eNtry
CK
CK#
CKE
tCK tCH tCL tCPDED
Address
t IS
T0 T1 T2 Ta0 Ta1 Ta2 Ta3 Ta4
tPD
Don’t CareIndicates a Break in Time Scale
Valid
Command MRS NOPNOP NOP NOP NOP
tMRSPDEN
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FiGure 98 - pOwer-dOwN exit tO reFreSh tO pOwer-dOwN eNtry
Notes: 1. tXP must be satisfied before issuing the command.2. tXPDLL must be satisfied (referenced to the registration of power-down exit) before the
next power-down can be entered.
CK
CK#
CKE
tCK tCH tCL
Enter power-downmode
Enter power-downmode
Exit power-downmode
tPD
tCPDED
tIS
t IHt IS
T0 T1 T2 T3 T4 Ta0 Ta1 Tb0
Don’t CareIndicates a Break in Time Scale
Command NOP NOP NOP NOPREFRESH NOPNOP
tXP1
tXPDLL2
RESET
TheRESETsignal(RESET\)isanasynchronoussignalthattriggersanytimeitdropsLOW.TherearenorestrictionsaboutwhenitcangoLOW.AfterRESET\isdrivenLOW,itmustremainLOWfor100ns.Duringthistime,theoutputsaredisabled,ODT(RTT)turnsoff(HIGH-Z)andtheDDR3SDRAMresetsitself.CKEshouldbebroughtLOWpriortoRESET\beingdrivenHIGH.AfterRESET\goesHIGH,theSDRAMmustbere-initializedasthoughanormalpowerupwereexecuted(seeFigure99).AllrefreshcountersontheSDRAMareRESETanddatastoredintheSDRAMisassumedunknownafterRESET\hasbeendrivenLOW.
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FiGure 99 - reSet SeQueNce
CKE
RTT
BA[2:0]
All voltage supplies valid and stable
High-Z
DM
DQS High-Z
Address
A10
CK
CK#
tCL
Command NOP
T0 Ta0
Don’t Care
tCL
t IS
ODT
DQ High-Z
Tb0
tDLLK
MR1 with DLL ENABLE
MRS MRS
BA0 = H BA1 = L BA2 = L
BA0 = L BA1 = L BA2 = L
Code Code
Code Code
Valid
Valid
Valid
Valid
Normal operation
MR2 MR3
MRS MRS
BA0 = L BA1 = H BA2 = L
BA0 = H BA1 = H BA2 = L
Code Code
Code Code
Tc0 Td0
RESET#
Stable and valid clock
Valid Valid
DRAM ready for external commands
T1
tZQINIT
A10 = H
ZQCL
t IS
t IOZ
Valid
Valid
Valid
System RESET(warm boot)
ZQ CAL MR0 with DLL RESET
T=10ns (MIN)
T = 100ns (MIN)
Indicates a Break in Time Scale
T = 500µs (MIN) tXPR tMRD tMRD tMRD tMOD
T (MIN) = MAX (10ns, 5 tCK)
tCK
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ON-die termiNatiON (Odt)
ODTisafeaturethatenablestheSDRAMtoenable/disableon-dieter-minationresistanceforeachDQ,DQSx,DQSx\,DQSx,DQSx\andDMxforthefourwordscontainedinLDI’sDDR3iMOD.
TheODTfeatureisdesignedtoimprovesignalintegrityofthememoryarray/sub-systembyallowingthememorycontrollertoindependentlyturnonorofftheDRAMSinternalterminationresistanceforanygroup-ingofDRAMdevices.TheODTfeatureisnotsupportedduringDLLdisablemode.AsimplefunctionalrepresentationoftheODTfeatureisshowninFigure100.TheswitchisenabledbytheinternalODTcontrollogic,whichusestheexternalODTballandothercontrolinformation.
FuNctiONal repreSeNtatiON OF Odt
ThevalueofRTT(ODTterminationvalue)isdeterminedbythesettingsofseveralmoderegisterbits(seeTable70).TheODTballisignoredwhileinSELFREFRESHmode(mustbeturnedoffpriortoSELFREFRESHentry)orifmoderegistersMR1andMR2areprogrammedtodisableODT.ODTiscomprisedofnominalODTanddynamicODTmodesandeitherofthesecanfunctioninsynchronousorasynchronousmodes(whentheDLLisoffduringPRECHARGEPOWER-DOWNorwhentheDLLissynchronizing).NominalODTisthebaseterminationandisusedinanyallowableODTstate.DynamicODTisappliedonlyduringWRITEsandprovidesOTFswitchingfromnoRTTorRTT_NOMtoRTT_WR.
Theactualeffectivetermination,RTT_EFFmaybedifferentfromtheRTTtargetedduetononlinearityofthetermination.ForRTT_EFFvaluesandcalculations,see“ODTCharacteristics”.
ODTVDDQ/2
RTT
SwitchDQ, DQS, DQS#,
To othercircuitrysuch asRCV, . . .
DM
FiGure 100 - ON-die termiNatiON NOmiNal Odt
ODT(NOM)isthebaseterminationresistanceforeachapplicableball,enabledordisabledviaMR1[9,6,2](seeFigure46),anditisturnedonoroffviatheODTball.
table 67: pOwer-dOwN mOdeS
MR1[9,6,2] ODT Pin SDRAM Termination State SDRAM State Notes
RTT_NOMdisabled,ODTOFF
RTT_NOMdisabled,ODTON
RTT_NOMenabled,ODTOFF
RTT_NOMenabled,ODTON
RTT_NOMreserved,ODTONorOFF
Anyvalid
AnyvalidexceptSELFREFRESH,READ
Anyvalid
AnyvalidexceptSELFREFRESH,READ
Illegal
1,2
1,3
1,2
1,3
000
000
000-101
000-101
110and111
0
1
0
1
X
3. ODTmustbedisabledduringREADs.TheRTT_NOMvalueisrestricted
duringWRITES.DynamicODTisapplicableifenabled.
NOTES:
1. AssumesdynamicODTisdisabled.
2. ODTisenabledandactiveduringmostWRITESforpropertermination,
butitisnotillegaltohaveitoffduringWRITES.
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NominalODTresistanceRTT_NOMisdefinedbyMR1[9,6,2],asshowninFigure46.TheRTT_NOMterminationvalueappliestotheoutputpinspreviouslymentioned.DDR3SDRAMiMODssupportmultipleRTT_NOMvaluesbasedonRZQ/nwherencanbe2,4,6,8or12andRZQis240Ω±1%.RTT_NOMterminationisallowedanytimeaftertheSDRAMisinitialized,calibratedandnotperformingREADaccessesorwhenitisnotinSELFREFRESHmode.
WRITEaccessusesRTT_NOMiddynamicODT(RTT_WR)isdisabled.IfRTT_NOMisusedduringWRITEs,onlyRZQ/2,RZQ/4andRZQ/6areallowed(seeTable66).ODTtimingsaresummarizedinTable68,aswellas,listedinTable47.
table 68: Odt parameter
Symbol Description Begins at Defined to Units
ODTregisteredHIGH
ODTregisteredHIGH
ODTregisteredHIGH
ODTregisteredHIGH
ODTregisteredHIGHorWRITE
registrationwithODTHIGH
WRITEregistrationwithODTHIGH
CompletionofODTLon
CompletionofODTLoff
ODTLON
ODTLOFF
tAONPD
tAOFFPD
ODTH4
ODTH8
tAON
tAOF
ODTsynchronousturnondelay
ODTsynchronousturnoffdelay
ODTasynchronousondelay
ODTasynchronousondelay
ODTminimumHIGHtimeafterODTassertion
orWRITE(BC4)
ODTminimumHIGHtimeafterWRITE(BL8)
ODTturn-onrelativetoODTLoncompletion
ODTturn-offrelativetoODTLoffcompletion
RTT_ON±tAON
RTT_ON±tAOF
RTT_ON
RTT_OFF
ODTregisteredLOW
ODTregisteredLOW
RTT_ON
RTT_OFF
CWL+AL-2
CWL+AL-2
1-9
1-9
4tCK
6tCK
SeeTable47
0.5tCK±0.2tCK
tCK
tCK
ns
ns
tCK
tCK
ps
tCK
Definition for
All DDR3 bins
DYNAMIC ODT
Incertainapplications,tofurtherenhancesignalintegrityonthedatabus,itisdesirablethattheterminationstrength,bechangedwithoutissuinganMRScommand,essentiallychangingtheODTterminationresistanceon-the-fly.WithdynamicODT(RTT_WR)enabled,theSDRAMswitchesfromnominalODT(RTT_NOM)todynamicODTwhenbeginningaWRITEburstandsubsequentlyswitchesbacktonominalODTatthecompletionoftheWRITEburstsequence.ThisrequirementandthesupportingDYNAMICODTfeatureoftheDDR3SDRAMmakesitfeasibleandisdescribedinfurtherdetailbelow:
dyNamic Odt FuNctiONal deScriptiON:
ThedynamicODTmodeisenabledifeitherMR2[9]ormR2[10]issetto“1”.DynamicODTisnotsupportedduringDLLdisablemode,soRTT_WRmustbedisabled.ThedynamicODTfunctionisdescribed,asfollows:
•TwoRTTvaluesareavailable–RTT_NOMandRTT_WR:•ThevalueofRTT_NOMispreselectedviaMR1[9,6,2]•ThevalueforRTT_WRispreselectedviaMR2[10,9]
•DuringSDRAMoperationswithoutREADorWRITEcommands,theterminationiscontrolledasfollows:•TerminationON/OFFtimingiscontrolledviatheODTballandLATENCIESODTlonandODTLoff•NominalterminationstrengthRTT_NOMisused
•WhenaWRITEcommand(WR,WRAP,WRS4,WRS8,WRAPS4,WRAPS8)isregisteredandifdynamicODTisenabled,theODTtermi-nationiscontrolledasfollows:•AlatencyofODTLCNWaftertheWRITEcommand:terminationstrengthRTT_NOMswitchestoRTT_WR•ALatencyofODTLCWN8(forBL8,fixedorOTF)orODTLCWN4(forBC4,fixedorOTF)aftertheWRITEcommand:terminationstrengthRTT_WRswitchesbacktoRTT_NOM•ON/OFFterminationtimingiscontrolledviatheODTballanddeterminedbyODTLon,ODTLoff,ODTH4andODTH8.•DuringthetADCtransitionwindow,thevalueofRTTisundefined
ODTisconstrainedduringWRITEsandwhendynamicODTisenabled(seeTable69).
NOmiNal Odt
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table 69: dyNamic Odt SpeciFic parameterS
Symbol Description Begins at Defined to
WRITEregistration
WRITEregistration
WRITEregistration
ODTLCNW
ODTLCNW
ODTLCWN4
ODTLCWN8tADC
ChangefromRTT_NOM to RTT_WR
ChangefromRTT_WRtoRTT_NOM(BC4)
ChangefromRTT_WRtoRTT_NOM(BL8)
RTTchangeskew
RTTswitchedfromRTT_NOM to RTT_WR
RTTswitchedfromRTT_WRtoRTT_NOM
RTTswitchedfromRTT_WRtoRTT_NOM
RTTtranscomplete
WL-2
4tCK+ODTLOFF
6tCK+ODTLOFF
0.5tCK±0.2tCK
tCK
tCK
tCK
tCK
Definition for
All DDR3 bins
table 70: mOde reGiSterS FOr rtt_NOm M9 M6 M2 RTT_NOM (RZQ) RTT_NOM(Ohms)
0
0
0
0
1
1
1
1
Off
RZQ/4
RZQ/2
RZQ/6
RZQ/12
RZQ/8
Reserved
Reserved
n/a
SELFREFRESH
SELFREFRESH,WRITE
n/a
n/a
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
Off
60
120
40
20
30
Reserved
Reserved
MR1(RTT_NOM)
table 71: mOde reGiSterS FOr rtt_wr M10 M2 RTT_NOM (RZQ) RTT_
0
0
1
1
n/a
n/a
n/a
n/a
RZQ/4
RZQ/2
Reserved
n/a
n/a
n/a
n/a
0
1
0
1
n/a
n/a
n/a
n/a
60
120
Reserved
n/a
n/a
n/a
n/a
MR1(RTT_NOM)
Dynamic ODT OFF: WRITE does not affect RTT_NOM
table 72: timiNG diaGramS FOr dyNamic Odt Figure Title
Figure101
Figure102
Figure103
Figure104
Figure105
DynamicODT:ODTassertedbeforeandaftertheWRITE,BC4
DynamicODT:WithoutWRITEcommand
DynamicODT:ODTpinassertedtogetherwithWRITEcommandfor6CKcycles,BL8
DynamicODT:ODTpinassertedwithWRITEcommandfor6CKcycles,BC4
DynamicODT:ODTpinassertedwithWRITEcommandfor4CKcycles,BC4
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FiGure 101 - dyNamic Odt: Odt aSSerted beFOre aNd aFter the write, bc4
Notes: 1. Via MRS or OTF. AL = 0, CWL = 5. RTT_NOM and RTT_WR are enabled.2. ODTH4 applies to first registering ODT HIGH and then to the registration of the WRITE command. In this example,
ODTH4 is satisfied if ODT goes LOW at T8 (four clocks after the WRITE command).
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
ODTL on ODTLCWN4
ODTLCNW
WL
ODTL off
T10 T11 T12 T13 T14 T15 T17T16
CKCK#
Command
Address
RTT
ODT
DQ
DQS, DQS#
Valid
WRS4 PONPONPONPONPON NOP NOP
Don’t CareTransitioning
RTT_WRRTT_NOM RTT_NOM
DIn + 3
DIn + 2
DIn + 1
DIn
NOP NOP NOP NOP NOP NOP NOP NOPNOP NOP
ODTH4ODTH4
tAON (MIN) tADC (MIN) tADC (MIN) tAOF (MIN)
tAON (MAX) tADC (MAX) tADC (MAX) tAOF (MAX)
FiGure 102 - dyNamic Odt: withOut write cOmmaNd
Notes: 1. AL = 0, CWL = 5. RTT_NOM is enabled and R TT_WR is either enabled or disabled.2. ODTH4 is defined from ODT registered HIGH to ODT registered LOW; in this example,
ODTH4 is satisfied. ODT registered LOW at T5 is also legal.
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
ODTL off
T10 T11
CKCK#
RTT
Don’t CareTransitioning
Command Vali d Vali d Vali d Vali d Vali d Vali d Vali d Vali d Vali d Vali d Vali d Vali d
Address
DQS, DQS#
DQ
ODTH4ODTL on
tAON (MAX)
tAON (MIN)
tAOF (MIN)
tAOF (MAX)
ODT
RTT_NOM
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FiGure 103 - dyNamic Odt: Odt piN aSSerted tOGether with write cOmmaNd FOr 6 clOck cycleS, bl8
Notes: 1. Via MRS or OTF; AL = 0, CWL = 5. If RTT_NOM can be either enabled or disabled, ODT can be HIGH. RTT_WR is enabled.2. In this example, ODTH8 = 6 is satisfied exactly.
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
ODTLCWN8
ODTLON
ODTLCNW
WL
tAOF (MAX)
T10 T11
CK
CK#
Address
RTT
ODT
DQ
DQS, DQS#
DI b + 3
DI b + 2
DI b + 1
DI b
DI b + 7
DI b + 6
DI b + 5
DI b + 4
Valid
Don’t CareTransitioning
Command WRS8NOP NOPNOP NOP NOP NOP NOP NOP NOP NOP NOP
RTT_WR
ODTH8 ODTLOFF
tADC (MAX)
tAON (MIN)
tAOF (MIN)
FiGure 104 - dyNamic Odt: Odt piN aSSerted with write cOmmaNd FOr 6 clOck cycleS, bc4
Notes: 1. Via MRS or OTF. AL = 0, CWL = 5. RTT_NOM and RTT_WR are enabled.2. ODTH4 is defined from ODT registered HIGH to ODT registered LOW, so in this example,
ODTH4 is satisfied. ODT registered LOW at T5 is also legal.
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
ODTL on
ODTLCNW
WL
T10 T11
CKCK#
ODTLCWN4
DQS, DQS#
Address Valid
Don’t CareTransitioning
ODTL off
Command WRS4NOP NOPNOP NOP NOP NOP NOP NOP
DQ DIn + 3
DIn + 2
DIn + 1
DIn
tADC (MIN) tAOF (MIN)
tAOF (MAX)tADC (MAX)
tADC (MAX)
tAON (MIN)
ODTH4
ODT
RTT RTT_WR RTT_NOM
NOP NOP NOP
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FiGure 105 - dyNamic Odt: Odt piN aSSerted with write cOmmaNd FOr 4 clOck cycleS, bc4
Notes: 1. Via MRS or OTF. AL = 0, CWL = 5. RTT_NOM can be either enabled or disabled. If disabled, ODT can remain HIGH. RTT_WR is enabled.
2. In this example ODTH4 = 4 is satisfied exactly.
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
ODTL on
ODTLCNW
WL
T10 T11
CKCK#
ODTLCWN4
DQS, DQS#
Address Valid
RTT_WR
Command WRS4NOP NOPNOP NOP NOP NOP NOP NOP NOP
Don’t CareTransitioning
DQ DIn
DIn + 3
DIn + 2
DIn + 1
ODTH4
tADC (MAX)
tAON (MIN)
tAOF (MIN)
tAOF (MAX)
ODTL off
RTT RTT_WR
ODT
NOP NOP
SyNchrONOuS Odt mOde
SynchronousODTisselectedwhenevertheDLListurnedonandlockedwhileRTT_NOMorRTT_WRisenabled.BasedonthePOWER-DOWNdefinition,thesemodesare:
•AnybankACTIVEwithCKEHIGH•REFRESHmodewithCKEHIGH•DLEmodewithCKEHIGH•ACTIVEPOWER-DOWNmode(regardlessofMR0[12])•PRECHARGEPOWER-DOWNmodeifDLLisenabledduringPRECHARGEPOWER-DOWNbyMR0[12]
Odt lateNcy aNd pOSted Odt
InsynchronousODTmode,RTTturnsonODTLonclockcyclesafterODTissampledHIGHbyarisingclockedgeandturnsoffODTLoffclockcyclesafterODTisregisteredLOWbyarisingclockedge.Theactualon/offtimesvariesbytAON and tAOFaroundeachclockedge(seeTable73).TheODTLATENCYistiedtotheWRITELATENCY(WL)byODTLon=WL-2andODTLoff=WL-2.
SinceWRITELATENCYismadeupofCASWRITELATENCY(CWL)andADDITIVELATENCY(AL),theALvalueprogrammedintothemoderegisterMR1[4,3],alsoappliestotheODTsignal.TheSDRAM’sinter-nalODTsignalisdelayedanumberofclockcyclesdefinedbytheALrelativetotheexternalODTsignal.Thus,ODTLon=CWL+AL–2andODTLoff=CWL+AL–2.
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SyNchrONOuS Odt timiNG parameterS
SynchronousODTmodeusesthefollowingtimingparameters:ODTLon,ODTLoff,ODTH4,ODTH8,tAON and tAOF(seeTable73andFigure106).TheminimumRTTturn-ontime(tAON[MIN])isthepointatwhichthedeviceleavesHIGH-AandODTresistancebeginstoturnon.MaximumRTTturn-ontime(tAON[MAX])isthepointatwhichODTresistanceisfullyon.BotharemeasuredrelativetoODTLon.TheminimumRTTturn-offtime(tAOF[min])isthepointatwhichthedevicestartstoturn-offODTresistance.MaximumRTTturn-offtime(tAOF[MAX])isthepointatwhichODThasreachedHIGH-Z.BotharemeasuredfromODTLoff.
WhenODTisasserted,itmustremainHIGHuntilODTH4issatisfied.IfaWRITEcommandisregisteredbytheSDRAMwithODTHIGH,thenODTmustremainHIGHuntilODTH4(BC4)orODTH8(BL8)aftertheWRITEcommand(seeFigure107).ODTH4andODTH8aremeasuredfromODTregisteredHIGHtoODTregisteredLOWorfromtheregistrationofaWRITEcommanduntilODTisregisteredLOW.
table 73: SyNchrONOuS Odt parameterS
Symbol Description Begins at Defined to Units
ODTregisteredHIGH
ODTregisteredHIGH
ODTregisteredHIGH,orWRITE
registrationwithODTHIGH
WRITEregistrationwithODTHIGH
CompletionofODTLon
CompletionofODTLoff
ODTLON
ODTLOFF
ODTH4
ODTH8
tAON
tAOF
ODTsynchronousTURN-ONdelay
ODTsynchronousTURN-OFFdelay
ODTMinimumHIGHtimeafterODT
assertionorWRITE(BC4)
ODTMinimumHIGHtimeafter
WRITE(BL8)
ODTTURN-ONrelativetoODTLon
completion
ODTTURN-OFFrelativetoODTLoff
completion
RTT_ON±tAON
RTT_OFF±tAOF
ODTregisteredLOW
ODTregisteredLOW
RTT_ON
RTT_OFF
CWL+AL-2
CWL+AL-2
4tcK
6tcK
SeeTable47
0.5tcK±0.2tcK
tCK
tCK
tCK
tCK
ps
tCK
Definition for
All DDR3 bins
FiGure 106 - SyNchrONOuS Odt
Notes: 1. AL = 3; CWL = 5; ODTL on = WL = 6.0; ODTL off = WL - 2 = 6. RTT_NOM is enabled.
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
CWL - 2AL = 3AL = 3
tAON (MAX) tAOF (MAX)
T10 T11 T12 T13 T14 T15
CKCK#
RTT
ODT
Don’t CareTransitioning
RTT_NOM
CKE
tAOF (MIN)
ODTL off = CWL + AL - 2
ODTL on = CWL + AL - 2
ODTH4 (MIN)
tAON (MIN)
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FiGure 107 - SyNchrONOuS Odt (bc4)
Notes: 1. WL = 7. RTT_NOM is enabled. RTT_WR is disabled.2. ODT must be held HIGH for at least ODTH4 after assertion (T1).3. ODT must be kept HIGH ODTH4 (BC4) or ODTH8 (BL8) after the WRITE command (T7).4. ODTH is measured from ODT first registered HIGH to ODT first registered LOW or from the registration of the WRITE
command with ODT HIGH to ODT registered LOW.5. Although ODTH4 is satisfied from ODT registered HIGH at T6, ODT must not go LOW before T11 as ODTH4 must also be
satisfied from the registration of the WRITE command at T7.
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
tAOF (MAX)
tAOF (MIN)
tAON (MAX) tAOF (MAX)
T10 T11 T12 T13 T14 T15 T17T16
CKCK#
RTT
CKE
NOP WRS4NOP NOPNOP NOP NOP NOPCommand
Don’t CareTransitioning
tAON (MIN)
RTT_NOM
ODTLoff = WL - 2
ODTH4 (MIN)
ODTH4
ODTL off = WL - 2
ODTL on = WL - 2
tAON (MIN) tAON (MAX)
ODTH4
ODTL on = WL - 2
tAOF (MIN)
ODT
RTT_NOM
NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP
Odt OFF duriNG readS
AstheDDR3SDRAMcannotterminateanddriveatthesametime,RTTmustbedisabledatleastone-halfclockcyclebeforetheREADpreamblebydrivingtheODTballLOW.RTTmaynotbeenableduntiltheendofthepostambleasshowninFigure108.
FiGure 108 - Odt duriNG readS
Notes: 1. ODT must be disabled externally during READs by driving ODT LOW. For example, CL = 6; AL = CL - 1 = 5; RL = AL + CL = 11; CWL = 5; ODTL on = CWL + AL - 2 = 8; ODTL off = CWL + AL - 2 = 8. RTT_NOM is enabled. RTT_WR is a “Don’t Care.”
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T17T16
CKCK#
ValidAddress
DIb + 3
DIb + 2
DIb + 1
DIb
DIb + 7
DIb + 6
DIb + 5
DIb + 4
DQ
DQS, DQS#
Don’t CareTransitioning
Command NOP NOP NOP NOP NOP NOP NOPNOP NOP NOP NOP NOP NOP NOP NOP NOPNOPREAD
ODTL on = CWL + AL - 2
ODT
tAON (MAX)RL = AL + CL
ODTL off = CWL + AL - 2
tAOF (MIN)RTT RTT_NOMRTT_NOM
tAOF (MAX)
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aSyNchrONOuS Odt mOde
AsynchronousODTmodeisavailablewhentheSDRAMrunsinDLLONmodeandwheneitherRTT_NOMorRTT_WRisenabled;however,theDLListemporarilyturnedoffinPRECHARGEDPOWER-DOWNstandbyviaMR0[12].Additionally,ODToperatesasynchronouslywhentheDLLissynchroniz-ingafterbeingRESET.See“POWER-DOWNMODE”fordefinitionandguidanceoverPOWER-DOWNdetails.
InasynchronousODTtimingmode,theinternalODTcommandisnotdelayedbyALrelativetotheexternalODTcommand.InasynchronousODTmode,ODTcontrolsRTTbyanalogtime.ThetimingparameterstAONPDandtAOFPD(seeTable74)replaceODTLon/tAONandODTLoff/tAOF respectively,whenODToperatesasynchronously(seeFigure109).
TheminimumRTTturn-ontime(tAONPD[MIN])isthepointatwhichthedeviceterminationcircuitleavesHIGH-ZandODTresistancebeginstoturn-on.MaximumRTTturn-ontime(tAONPD[MAX])isthepointatwhichODTresistanceisfullyon.tAONPD(MIN)andtAONPD(MAX)aremeasuredfromODTbeingsampledHIGH.
TheminimumRTTturn-offtime(tAOFPD[MIN])isthepointatwhichthedeviceterminationcircuitstartstoturnoffODTresistance.MaximumRTTturn-offtime(tAOFPD[MAX])isthepointatwhichODThasreachedHIGH-Z.tAOFPD(MIN)andtAOFPD(MAX)aremeasuredfromODTbeingsampledLOW.
table 74: aSyNchrONOuS Odt timiNG parameterS FOr all Speed biNS
Symbol Description MIN MAX Units
tAONPDtAOFPD
AsynchronousRTTTURN-ONdelay(POWER-DOWNwithDLLoff)
AsynchronousRTTTURN-OFFdelay(POWER-DOWNwithDLLoff)
2
2
8.5
8.5
ns
ns
FiGure 109 - aSyNchrONOuS Odt timiNG with FaSt Odt traNSitiON
Notes: 1. AL is ignored.
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
tAONPD (MAX) tAOFPD (MAX)
T10 T11 T12 T13 T14 T15 T17T16
CKCK#
RTT
ODT
RTT_NOM
Don’t CareTransitioning
CKEt IH t IS t IH t IS
tAOFPD (MIN)tAONPD (MIN)
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4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
table 75: Odt parameterS FOr pOwer-dOwN (dll OFF) eNtry aNd exit traNSitiON periOd
Description MIN MAX
POWER-DOWNentrytransitionperiod(POWER-DOWNentry)
POWER-DOWNentrytransition(POWER-DOWNexit)
ODT to RTTTURN-ONdelay(ODTLon=WL-2)
ODT to RTT TURN-OFFdelay(ODTLoff=WL-2)
tANPD
Greaterof:tANPD or tRFC-REFRESHtoCKELOW
tANPD+tXPDLL
WL-1(GreaterofODTLoff+1orODTLon+1)
Lesserof:tANPD(MIN)[1ns]or
ODLonxtCK+tAON(MIN)
Lesserof:tAOFPD(MIN)[1ns]or
ODLoffxtCK+tAOF(MIN)
Lesserof:tANPD(MIN)[1ns]or
ODLonxtCK+tAON(MIN)
Lesserof:tAOFPD(MIN)[1ns]or
ODLoffxtCK+tAOF(MIN)
SYNCHRONOUS TO ASYNCHRONOUS ODT MODE TRANSITION (POWER-DOWN ENTRY)
ThereisatransitionperiodaroundPOWER-DOWNENTRY(PDE)wheretheSDRAM’sODTmayexhibiteithersynchronousorasynchronousbehavior.ThistransitionperiodoccursiftheDLLisselectedtobeoffwheninPRECHARGEPOWER-DOWNmodebythesettingofMR0[12]=0.POWER-DOWNentrybeginstANPDpriortoCKEfirstbeingregisteredLOWanditendswhenCLEisfirstregisteredLOW.tANPDisequaltothegreaterofODTLoff+1tCKorODTLon+1tCK.IfaREFRESHcommandhasbeenissued,anditisinprogresswhenCKEgoesLOW,POWER-DOWNentrywillendtRFCaftertheREFRESHcommandratherthanwhenCKEisfirstregisteredLOW.POWER-DOWNENTRYwillthenbecomethegreateroftANPDandtRFC–REFRESHcommandtoCKEregisteredLOW.
ODTassertionduringPOWER-DOWNENTRYresultsinanRTTchangeasearlyasthelesseroftAONPD(MIN)andODTLonxtCK+tAON(MIN)oraslateasthegreateroftAONPD(MAX)andODTLonxtCK+tAON(MAX).ODTde-assertionduringPOWER-DOWNENTRYmayresultinanRTTchangeasearlyasthelesseroftAOFPD(MIN)andODTLoffxtCK+tAOF(MIN)oraslateasthegreateroftAOFPD(MAX)andODTLoffxtCK+tAOF(MAX).Table75summarizestheseparameters.
IftheALhasalargevalue,theuncertaintyofthestateofRTTbecomesquitelarge.ThisisbecauseODTLonandODTLoffarederivedfromtheWLandWLisequaltoCWL+AL.Figure110showsthreedifferentcases;
•ODT_A:SynchronousbehaviorbeforetANPD•ODT_B:ODTstatechangesduringthetransitionperiodwithtAONPD(MIN)lessthanODTLonxtCK+tAON(MIN)andtAONPD(MAX)greaterthanODTLonxtCK+tAON(MAX)•ODT_C:ODTstatechangesafterthetransitionperiodwithasynchronousbehavior
STACKED Technologies Incorporated www.stackedtechnologies.com156
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
ASYNCHRONOUS TO SYNCHRONOUS ODT MODE TRANSITION (POWER-DOWN EXIT)
TheSDRAM’sODTmayexhibiteitherasynchronousorsynchronousbehaviorduringPOWER-DOWNEXIT(PDX).ThistransitionperiodoccursiftheDLLisselectedtobeoffwheninPRECHARGEPOWER-DOWNmodebysettingMR0[12]to“0”.POWER-DOWNexitbeginstANPDpriortoCKEfirstbeingregisteredHIGHanditendstXPDLLafterCKEisfirstregisteredHIGH.tANPDisequaltothegreaterofODTLoff+1tCKorODTLon+1tCK.ThetransitionperiodistANPDplustXPDLL.
ODTassertionduringPOWER-DOWNexitresultsinanRTTchangeasearlyasthelesseroftAONPD(MIN)andODTLonxtCK+tAON(MIN)oraslateasthegreateroftAONPD(MAX)andODTLonxtCK+tAON(MAX).ODTde-assertionduringPOWER-DOWNEXITmayresultinanRTTchangeasearlyasthelesseroftAOFPD(MIN)andOFTLoffxtCK+tAOF(MIN)oraslateasthegreateroftAOFPD(MAX)andODTLoffxtCK+tAOF(MAX).Table75summarizestheseparameters.
IftheALhasalargevalue,theuncertaintyoftheRTTstatebecomesquitelarge.ThisisbecauseODTLonandODTLoffarederivedfromtheWL,andtheWLisequaltoCWL+AL.Figure111showsthreedifferentcases.
•ODTC:AsynchronousbehaviorbeforetANPD•ODTB:ODTstatechangesduringthetransitionperiodwithtAOFPD(MIN)lessthanODTLoffxtCK+tAOF(MIN)andODTLoffxtCK+tAOF(MAX)greaterthantAOFPD(MAX)•ODTA:ODTstatechangesafterthetransitionperiodwithsynchronousresponse
FiGure 110 - SyNchrONOuS tO aSyNchrONOuS traNSitiON duriNG precharGe pOwer-dOwN (dll OFF) eNtry
Notes: 1. AL = 0; CWL = 5; ODTL off = WL - 2 = 3.
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
tAOFPD (MAX)
ODTL off
T10 T11 T12 T13 Ta0 Ta1 Ta3Ta2
CKCK#
DRAM RTT B asynchronous
or synchronousRTT_NOM
DRAM RTT Casynchronous
RTT_NOM
Don’t CareTransitioning
CKE
NOP NOP NOPNOP NOPCommand NOPREF NOP NOP NOP NOPNOP NOP NOP NOPNOP NOP NOP
PDE transition period
Indicates a Break In Time Scale
ODTL off + tAOFPD (MIN)
tAOFPD (MAX)
tAOFPD (MIN)
ODTL off + tAOFPD (MAX)
tAOFPD (MIN)
tANPD
tAOF (MIN)
tAOF (MAX)
DRAM RTT A synchronous RTT_NOM
ODT A synchronous
ODT C asynchronous
ODT B asynchronous
or synchronous
tRFC (MIN)
STACKED Technologies Incorporated www.stackedtechnologies.com157
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
FiGure 111 - aSyNchrONOuS tO SyNchrONOuS traNSitiON duriNG precharGe pOwer-dOwN (dll OFF) exit
Not
es:
1.C
L =
6; A
L =
CL
- 1; C
WL
= 5;
OD
TL o
ff =
WL
- 2 =
8.
T0
T1
T2
Ta0
Ta1
Ta2
Ta3
Ta4
Ta5
Ta6
Tb0
Tb
1 Tb
2 Tc
0 Tc
1 Td
0 Td
1 Tc
2
CK
CK#
Don
’t Ca
re
Tran
sitio
ning
ODT
C
sync
hron
ous
PON
PON
NOP
COM
MAN
D NO
P NO
P NO
P NO
P
RTT B
as
ynch
rono
us
or s
ynch
rono
us
DRAM
RTT
A
asyn
chro
nous
DRAM
RTT
C
sync
hron
ous
RTT_
NOM
NOP
NOP
ODT
B
asyn
chro
nous
or
syn
chro
nous
CKE
t AO
F (M
IN)
R TT_
NOM
Indi
cate
s A
Bre
ak in
Ti
me
Sca
le
OD
TL o
ff +
t AO
F (M
IN)
t AO
FPD
(MA
X)
OD
TL o
ff +
t AO
F (M
AX
)
t XP
DLL
t AO
F (M
AX
) O
DTL
off
ODT
A
asyn
chro
nous
PD
X tr
ansi
tion
perio
d
t AO
FPD
(MIN
)
t AO
FPD
(MA
X) t A
NP
D
t AO
FPD
(MIN
)
RTT_
NOM
NOP
NOP
NOP
NOP
NOP
STACKED Technologies Incorporated www.stackedtechnologies.com158
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
ASYNCHRONOUS TO SYNCHRONOUS ODT MODE TRANSITION (SHORT CKE PULSE)
IfthetimeinthePRECHARGEPOWERDOWNorIDLEstatesisveryshort(shortCKELOWpules),thePOWER-DOWNENTRYandPOWER-DOWNEXITtransitionperiodswilloverlap.Whenoverlapoccurs,theresponseoftheSDRAM’sRTTtoachangeintheODTstatemaybesynchronousorasynchro-nousfromthestartofthePOWER-DOWNENTRYtransitionperiodtotheendofthePOWER-DOWNEXITtransitionperiodeveniftheENTRYperiodendslaterthantheEXITperiod.(seeFigure112).
Ifthetimeintheidlestateisveryshort(shortCKEHIGHpulse),thePOWER-DOWNEXITandPOWER-DOWNENTRYtransitionperiodsoverlap.Whenthisoverlapoccurs,theresponseoftheSDRAM’sRTTtoachangeintheODTstatemaybesynchronousorasynchronousfromthestartofthePOWER-DOWNEXITtransitionperiodtotheendofthePOWER-DOWNENTRYtransitionperiod(seeFigure113).
FiGure 112 - traNSitiON periOd FOr ShOrt cke lOw cycleS with eNtry aNd exit periOd OVerlappiNG
Notes: 1. AL = 0, WL = 5, tANPD = 4.
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 Ta0 Ta1 Ta2 Ta3 Ta4
CKCK#
CKE
Command
Don’t Care Transitioning
tXPDLL
tRFC (MIN)
NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP REF PON PONNOP NOP
PDE transition period
PDX transition period
Indicates a Break in Time Scale
tANPD
Short CKE LOW transition period (RTT change asynchronous or syn chronous)
tANPD
FiGure 113 - traNSitiON periOd FOr ShOrt cke hiGh cycleS with eNtry aNd exit periOd OVerlappiNG
Notes: 1. AL = 0, WL = 5, tANPD = 4.
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
CK CK#
Command
Don’t Care Transitioning
NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP NOP PON PON NOP NOP NOP
tANPD tXPDLL
Indicates A Break in Time Scale
Ta0 Ta1 Ta2 Ta3 Ta4
CKE
Short CKE HIGH transition period (RTT change asynchronous or synchonous)
tANPD
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STACKED Technologies Incorporated www.stackedtechnologies.com159
4.0 Gb, DDR3, 64M x 64 Integrated Module (HiMOD)
ST9D364M64SBG2
June 6, 2015 STDS-ST9D364M64SBG2-AHigh Performance, Highly Integrated Memory Module Product
STACKEDTECHNOLOGIES INC
reViSiON hiStOry
Revision By Issue Date Description Of Change
A 06.06.2015 INITIATEBV