standard reference materials for 5g and microwave
TRANSCRIPT
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iNEMI 5G/mmWave Tech Topic Series (May 6, 2021)
Standard Reference Materials for 5G
and Microwave Materials at NISTNate Orloff
Listen to the recorded webinar: https://youtu.be/Q40zKFWdEgU
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Today’s talk is going to tell you how we do this…
The other talks inspired me to take new data and show you something new
JGS2 Fused Silica to 325 GHz
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“fixing the standards of weights and measures
throughout the United States”
Articles of Confederation
“The Congress shall...fix the standard of weights and
measures…“
US Constitution
“Uniformity in the currency, weights, and measures of
the United States is an object of great importance…”
G. Washington
"Weights and measures may be ranked among the
necessities of life to every individual of human society"
J. Q. Adams
National Institute of Standards and Technology?
NIST fixes weights and measures
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Where is NIST? What do you do?
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Promote U.S. innovation and industrial competitiveness by advancing measurement science, standards, and
technology in ways that enhance economic security and improve our quality of life.
~300 scientists
Boulder, CO
~1500 scientists
Gaithersburg, MD
Develop standards, measurements, and technology
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NIST defines axes and how well we know them
Traceability means everyone’s axes are the same and …
NIST measures from 10 Hz to 1.1 THz
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Did we need traceability for 4G? Why is 5G different?
It’s easy to take this pyramid for granted
2870 SRM
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(Some) 5G handsets overheat due to energy efficiency
Pros: Super fast.
Cons: You’ll need an ice cooler
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Why are some phones overheating?
*Figures here are for illustration of
the idea and are not used in phones
or the reason deployed phones
overheat
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One potential problem could be the material models
?
Vendor measures here 5G works here
1 GHz 30 GHz
Loss ta
ng
en
t
Model
Actual
This is a random phone
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Even if you measure at mmWaves it still could be wrong
2G, 3G, 4G, 4G LTE products
Company test and measurement
In-house standards
Factory calibrations
NMI
SI
5G mm-wave products
Company test and measurement
In-house standards
SI
Permittivity traceability
for current technology
Permittivity traceability
for 5G mmWave
Traceability
gap
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How can we fill the mmWave traceability gap?
Don’t worry we are going to break down all these steps
mmWave
traceability
gap1 Measure
S-parameters
Map to
permittivity3 We are done right?4Get
dimensions2
Cavity
Sample
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The first step is to measure the resonators
Goodness of fit estimates uncertainties in resonance frequency and losses
Measure
S-parameters1
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*This is specific to this cavity and not general
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After fitting, we get ‘fit’ source of uncertainty
We also need the dimensional uncertainty
Fit
uncertainty
Dimensional
Uncertainty ?
Measure
S-parameters1
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How can we get ‘dimensional’ sources of uncertainty?
NIST’s coordinate measurement machine service can measure the cavity
2 Dimension
Cavity
Cavity
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We need a CMM because the dimensions are small…
2 Dimension
cavity
Cavity
Cross section of a 10 GHz
We think we can get down to a couple nm’s with NIST’s CMM techniques
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We need the sample dimensions too!
We think we can get down to a few nm’s with either of these techniques
1 Dimension
sample
Sample
Optical laser interferometer
Stylus profilometer
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The next step is to understand the theory
Red = From dimensional metrology and Blue = From fitting S-parameters
Map to
permittivity3 𝜔𝑐 − 𝜔𝑐𝑠
𝜔𝑐=𝑉𝑠
ത𝐸𝑐 ⋅ ഥ𝐷𝑠 − ത𝐸𝑠 ⋅ ഥ𝐷𝑐 − ഥ𝐻𝑐 ⋅ ത𝐵𝑠 − ഥ𝐻𝑠 ⋅ ത𝐵𝑐 𝑑𝑉
𝑉𝑐ത𝐸𝑐 ⋅ ഥ𝐷𝑐 − ഥ𝐻𝑐 ⋅ ത𝐵𝑐 𝑑𝑉
𝜖𝑠,𝑟 ≈1
2
𝑉𝑐𝑉𝑠
Δ𝜔
𝜔𝑐+ 1 𝜖𝑠,𝑖 ≈
1
4
𝑉𝑐𝑉𝑠
𝑄𝑐 − 𝑄𝑠𝑄𝑐𝑄𝑠
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*This is specific to this cavity and not general
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Next, we perform a full uncertainty analysis
Dimensional uncertainty is the dominant source of uncertainty for our case
Fit
uncertainty
Dimensional
Uncertainty
Are we
done yet?4
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Finally, we have the SRM? Now what?
This on-wafer kit makes your measurements traceable and so much more
1 cm
On-wafer traceability
for 5G mmWave
2G, 3G, 4G, 4G LTE products
Company test and measurement
In-house standards
Factory calibrations
NMI
SI
Permittivity traceability
for 5G mmWaves
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This kit can let you calibrate those pesky ICs and…
On-wafer traceability
for 5G mmWave
1
2JGS2 Fused Silica to 325 GHz
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Finally, here’s where I walk through the new stuff
1 cm
Get R and L
from simulation2 Finite-element
simulations4 Map to dielectric
constant5
GOAL!
Get 𝛾 from
mTRL1 Get C and G
from 𝛾3
𝑅𝑠𝑖𝑚
𝐿𝑠𝑖𝑚
𝐶𝐺
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1 cm
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We use a probe station to measure each device
Our devices make a ‘calibration kit’ that produces the propagation constant
Cable Cable
Vector
network
analyzer
On-wafer measurement1
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We measure all these coplanar waveguide devices
Get the
capacitance1.31.1
Make a
guess1.2
Multiline
TRL
Check the
calibration1.5
Model the
resistor1.4
NIST software can run through these checks as we take data
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Our device of choice is a coplanar waveguide
Substrate
Signal
Ground
Ground
ℓ
𝑅 𝐿
𝐺𝐶
Δ𝑥
These circuit parameters describe how a wave propagates
1 cm
Get 𝛾 from
mTRL1
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The 𝐶 is related to the electric field
105
102
103
104
V/m
1 cm
Get 𝛾 from
mTRL1
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multiline TRL produces the propagation constant
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𝛾 = (𝑅 + 𝑖𝜔𝐿)(𝐺 + 𝑖𝜔𝐶) = 𝛼 + 𝑖𝛽
𝛼 = attenuation constant 𝛽 = phase constant
The black line is a prediction from the simulation
Data
Simulation
Data
Simulation
Get 𝛾 from
mTRL1
Grey region is
the uncertainty There is grey
here too!
Fused Silica Fused Silica
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The simulation also lets us compute 𝑅 and 𝐿
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We only need the dc resistivity and the geometry of the CPW
Simulation with 𝜌𝑑𝑐Data with constant C
Simulation with 𝜌𝑑𝑐Data with constant C
Get R and L
from simulation2
𝑅 ≈ ℜ𝛾2
𝑖𝜔𝐶
𝐿 ≈1
𝜔ℑ
𝛾2
𝑖𝜔𝐶
Grey region is
the uncertainty
Grey region is
the uncertainty
Fused Silica Fused Silica
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Use the simulated 𝑅 and 𝐿 and measured 𝛾
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Now we can compute 𝐶 and 𝐺
Get C and G
from 𝛾3
𝐺 + 𝑖𝜔𝐶 =𝛾𝑚𝑇𝑅𝐿2
𝑅𝑠𝑖𝑚 + 𝑖𝜔𝐿𝑠𝑖𝑚
𝛾𝑚𝑇𝑅𝐿 𝑅𝑠𝑖𝑚, 𝐿𝑠𝑖𝑚Fused Silica Fused Silica
Fused Silica Fused Silica
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The 𝐶 and 𝐺 from our ac and dc measurements
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Get C and G
from 𝛾3
Measured C
Measured C from a resistor
Measured G
Assumption from a resistorGrey region is
the uncertainty
Our last is to compute the permittivity
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Let’s talk about a parallel plate capacitor
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𝐶 relates to 𝜖 through geometric factors that we can compute!
𝐶 = 𝜖𝐴
𝑑
Permittivity
Capacitance
slope =𝐴
𝑑
Finite-element
simulations4
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We can do this exact thing in simulation
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𝜖 = 3.78
Finite-element
simulations4
𝜖 = 3.95
All we need to do is a linear fit to map from 𝐶 to 𝜖
Grey region is
the uncertainty!
Fused Silica
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And here is the result for our JGS2 fused silicaMap to dielectric
constant5
JGS2 Fused Silica to 325 GHz
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Map to dielectric
constant5 We did the same thing for the loss
In this case, the loss is so low (tan𝛿 < 0.0001) we just get nonsense
Measured 𝜖𝑟Measured 𝜖𝑟 from a resistor
Measured 𝜖𝑖Measured 𝜖𝑖 from a resistor
JGS2 Fused Silica to 325 GHz JGS2 Fused Silica to 325 GHz
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How are we going to get this technology to you?
We are working to develop these kits this year
This is a 4” FS wafer
NIST Calkit
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Take home messages for this talk
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Industry needs a 5G mmWave SRM
We will use a resonator and dimensional
metrology with some fitting
On-wafer techniques can get you
permittivity to very high frequencies
You can correct your axes and your ICs
5G mmWave SRM’s will have test
coupons and companion on-wafer kits
You can correct your axes and your ICs+