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SuperSpeed USB 3.0 Technology Overview and Industry Update Dan Fredal Jeff Schuch Senior Digital Applications Engineers Electro Rent Corp

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Page 1: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

SuperSpeed USB 3.0

Technology Overview and

Industry Update

Dan Fredal

Jeff Schuch

Senior Digital

Applications Engineers

Electro Rent Corp

Page 2: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Agenda

USB Overview

Traces from protocol to electrical

Demo

Transmitter testing

Demo

Receiver testing

Demo

Agilent solutions

Agilent Digital Standards

Questions

Page 2

Page 3: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

USB Implementers Forum, inc (USB-IF)

USBIF Board Members

Intel, NEC, HP, Microsoft, ST-Ericsson, LSI

Agilent Active

Membership

Marketing

WG

Device

WG

CabCon

WG

Compliance

Committee

USB

Test

Specs

USB2/USB 3

Tools and

Test

Procedures

Test

House

Approval

ow

ne

r

resp

on

sib

le

owner

influences

Interop.

Workshop

Testing

influences

OTG

WG

Compliance

Review Board Test Spec

WG

Training and equipment

Page 4: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

USB Overview

Page 5: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Worldwide shipment of USB-enabled Devices

Source: In-Stat, May 2011

USB installed base is 10+

billion units and growing at

3+ billion units a year

Page 5

Page 6: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Product Development

Initial Deployment

Broad Deployment

SuperSpeed USB Timeline

2011

Compliance Program/Industry Enabling Development

USB 3.0 Electrical Compliance Test Specification

0.9RC

Wksp:

HI

Jan

1.0 Test

Spec – Pending ECN updates

Wksp:

OR

April

Wksp:

OR

Jul

Wksp:

TPE

Sept

#78 #79 #77 #76

2012

#80 #81

Wksp:

OR

Nov

Wksp:

HI

Feb 6-10

#82 #83 #84 #85

(TBD)

Oregon

April

(TBD)

Taipei

Sept

Test Lab

Qualification –

Pending

resolution of USB

3.0 Gold Tree

(TBD)

Oregon

Nov

(TBD)

Oregon

July

SSIC spec

Work started

Page 6

Page 7: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

What is different for USB 3.0

USB 2.0 High-Speed

480Mbps

NRZI, Half Duplex

4 signals

Dp, Dm, VCC, GND

Cable Lmax= 5meter

IconfigLP/FP = 100mA/500mA

Isuspend = 500uA

No SSC

TX SQ at Near End

No Host RX testing

USB 3.0 SuperSpeed

5 Gbps

8B/10B PRBS, Full Simplex

8 signals

4 USB2 , 4 SS Signals

Cable Lmax= 3 meters

IconfigLP/FP = 150mA/900mA

Isuspend = 2.5mA

SSC

TX at End of Channel (Far end)

RX Jitter tolerance

RX

Half Duplex TX

RX

TX

RX

Full Simplex

TX RX

TX

Page 7

Page 8: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Analyzing USB 2.0 and 3.0

Mass Storage traffic

Requires simultaneous capture

simultaneous USB 2.0 and 3.0

traffic to diagnose fallback

issues.

USB 3.0 cables are two completely

independent cables in one shielded

shell

The USB analyzer can capture all

traffic from device communication.

Page 8

Page 9: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Agilent USB Protocol Analyzer

Page 10: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

• Find & Fix the most complex problems

– Most advanced triggering on the market

– Deepest trace buffers on the market by far

– The only USB Jammer on the market!

• See your DUT, not the instrument

– Auto-detect instruments on LAN

– Quick first-screen display

– Fastest processing of “whole trace,” too

• E.g. histogram view of 18GB trace in 16 seconds

– Clean, intuitive GUI, with multiple viewing

options to ease migration

• Drill down into packet details, with “data sheet”

graphical views of bit fields, etc.

Synchronizing the USB analysis traces from

Protocol to Electrical

Agilent USB 3.0/2.0 Protocol Analyzer & Jammer

KEY SPECS

Simul. USB 3.0 & 2.0 capture

Up to 18GB trace buffer

4 sequencers, 16 states each

- 4 timers, 4 counters

Host I/F: GbE, PCIe X4

Cascadable with SAS/SATA

Configurable from $7k - $31k

Page 10

Page 11: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Flexible Trace Views, from High-Level to Detailed

Transaction

view Packet

Detail

view

Histogram

view

Page 11

Page 12: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

High-Performance Histogram New Use Models

Histograms are

processed in under

1s/GB, allowing them

to be used more

frequently and in new

ways.

Quickly zoom in and

pan out of the trace.

Click on histogram

activity to immediately

sync to the other trace

views to gain additional

insight (transaction

view, spreadsheet,

protocol, etc.)

Page 12

Page 13: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Page 13

Page 14: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

• Can be used to create a variety of errors in a real OS environment that cannot necessarily be created by a generator

• Standalone unit (does not require analyzer)

• Example error types, events, packet modification, etc.

– LGOOD_n / LCRD_a out of order

– Corrupted ordered sets, LMPs, etc.

– CRC-5/16/32 errors

– LBA out of range

– Link connect / disconnect

– Power up / down (bus powered devices only)

– Missing or corrupt frames

– BOT or UAS Sense IU / Response IU errors

• The jammer can inject errors, modify or delete packets, or even turn off Vbus and turn it back on again

USB 3.0 Jammer

Page 14

Page 15: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

USB Transmitter Testing

Page 16: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

SuperSpeed Measurement Requirements

Transmitter Compliance Testing:

Compliance will be measured at the end of the “compliance channel”

SMA termination for TX signals, phase matched SMA cable

Terminate link under test with high speed oscilloscope

Measure transmitted waveform with high speed oscilloscope

Use compliance pattern

1M UI of data

Compute:

eye diagram,

Rj from CP1

Dj, Tj@10^-12 BER from CP0

average data rate,

rise/fall time,

Test requirement for SSC Slew Rate

Test LFPS signaling

Page 17: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Economy Scopes

InfiniiVision Series

Infiniium Series

Handheld

U1600A

Series

USB

U2700

Series

DSO 1000

Series

InfiniiVision

DSO 5000

Series

InfiniiVision

MSO/DSO

6000 Series

InfiniiVision

MSO/DSO

7000 Series

Infiniium

MSO/DSO

9000 Series

Infiniium

90000

Series

Infiniium

86100D

DCA-X

Series

Infiniium

90000-X

Series

5.2%12.8%

0.0%2.0%4.0%

6.0%

8.0%10.0%12.0%14.0%

Oscilloscope market

Agilent Technologies

Oscilloscope Market Growth5 Year CAGR

Source: PRIME DATA (2003-2008)

Fastest growing

oscilloscope

manufacturer

Page 17

Agilent Scope Portfolio

Infiniium

90000-Q

Series

Page 18: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

U7243A USB 3.0 TX Compliance Application

Page 18

Page 19: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Transmitter Tests

TX tests:

•LFPS (Near end)

•SSC (Near end)

•TX (Far End: TP1)

•Eye Pattern

•Tj, Rj, Dj

•Amplitude

“Embedded channel”

automatically tested

using Agilent U7243A

compliance software

Page 19

Page 20: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

PING LFPS

Toggles CMM

CP0

Dj

CP1

Rj

TX Testing Requirements: Polling.LFPS to

compliance mode

Page 20

Page 21: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Toggling USB 3.0 TX test modes

•Connect Aux Out to

DUT SSRX+ to toggle

test modes

Page 21

Page 22: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Page 22

Transmitter test requirements

(TX Far End)

Page 23: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Tx testing emulated through s-parameters

Page 23

Embed Channel File

“DEVICE_3MCABLE.s4p”

Validation with InfiniiSim of

DSA91304A

Page 24: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Page 24

Transmitter testing uses

embedded compliance

channel

Page 25: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Page 25

USB 3.0 Technical Review

. 2009

USB 3.0 Test fixture

Key Features:

– Industries first and most feature complete

– SMA edge launch terminations

– SS A and SS B for host, device or cross hub testing

– Connect power supply or USB 2.0 port to pass through section to provide power to bus

powered USB 3.0 products for ease of testing

– SMA breakouts for cross talk measurements of USB 2.0 to USB 3.0 or vice versa

– RX connections through JBert ISI board allows compliance channel emulation for pre-

testing

– Accurate fixture de-embed and compliance channel embedding is performed with VNA s-

parameter characterization and Agilent InfiniiSim toolset.

25

Page 26: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

TX Compliance Pitfalls

Page 26

•SSC modulation

•SSC deviation

•High Rj

(flicker Jitter)

•Poor de-emphasis

•Cause eye

failure at end of

channel

Page 27: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Page 27

Page 28: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

USB Receiver Testing

Page 29: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Page 30

Turn on loopback by sending LFPS and required training sequences

The receiver stress pattern is BDAT with SKPs inserted as described in the

standard.

The pattern checker receives the looped stress pattern BDAT and

recognizes bit errors

After sufficient test time the error counter of the pattern checker is read

Pattern Generator: J-BERT, ParBERT

…stress pattern…training sequences…LFPS

stress pattern…

.

Pattern Generator

1. 2.

Pattern Checker

3. Error

Counter

Receiver Test Procedure External Error Counter

Pattern Checker: USB Protocol Analyzer; Ellisys USB

Explorer and NOW JBERTB SER

Page 30: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Typical SuperSpeed Link Turn-on Sequence

Page 31

Page 31: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Page 32

RX Compliance Pitfalls

•Loopback issues • Dut needs custom sequence

• DUT drops out easily

•Calibration issues • Inconsistent

• Poor Sj/Rj mod

• Automation of Cal

•SSC deviation

•invalid de-emphasis • Great impact on TJ

• Jitter tolerance failures • 10MHz, 20MHz, 33MHz

Compliant SJ

Poor/wrong SJ

Compliant SSC Profile

Intentional SSC Stress

Non-deterministic noisy SSC

Compliant De-emphasis

Non-compliant Overshoot

Page 32: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Automated instrument

control for:

• Setup calibration

• Compliance test

• Characterization test

• Support for debugging

Operator guidance

Sophisticated test

reports

Supports full product characterization including transmitter measurements

N5990A Test Automation Software

Page 33

Page 33: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Page 34

Page 34: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Receiver Test Transmitter Test

Interconnect

Test

DSOX90000A

Infiniium

real time scope

Agilent’s USB 3.0 – Total Solution

SW

HW

Fixture

DUT

N4903B J-BERT

High-Perf

Serial BERT

N5990A Automatic

SW for USB

compliance

E5071C Option TDR

ENA Network Analyzer

U7242A

Test Fixture

U7243A USB

Compliance Test

Software

U7242A

USB 3.0

Test Fixture

N8805A USB3.0

Protocol decode &

triggering SW

DSO91304A

Infiniium

real time scope

or

Bit-USB-

CBL-0001

from BitifEye

Tx Rx

Tx

De-emph

N4916A or

N4916B or

N4903B-002

with

USB3ET

from

USB-IF Tx

Rx Cable

Signal

Condi-

tioning

Protocol

Test (link/transaction

layers)

U4611A/B

USB 3\2\1.1

Analyzer

U4612A

Jammer

Rx

Tx

Rx

Tx

Page 35

Page 35: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Same Setup Supports Multiple Standards

J-BERT, oscilloscope and test automation software also

cover

• PCI Express 1.1, 2.0

• SATA 1.5, 3, and 6Gb/s

• DisplayPort 1.1

Note: Additional applications may require additional instruments and

accessories

Page 37

Page 36: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Agilent Digital Standards

Page 37: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Page 39

Agilent Digital Standards Program

• Our solutions are driven and supported by Agilent experts

involved in international standards committees: • Joint Electronic Devices Engineering Council (JEDEC)

• PCI Special Interest Group (PCI-SIG®)

• Video Electronics Standards Association (VESA)

• Serial ATA International Organization (SATA-IO)

• USB-Implementers Forum (USB-IF)

• Mobile Industry Processor Interface (MIPI) Alliance

• And many others

• We’re active in standards meetings, workshops, plugfests,

and seminars

.

• We get involved so you benefit with the right solutions when

you need them

Page 39

SuperSpeed USB

Page 38: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

We understand your future requirements,

because we help shape them

Jim Choate

USB-IF Compliance Committee

USB 3.0 Electrical Test Spec WG

Rick Eads

PCI-Sig Board

Member

Brian Fetz

DisplayPort Phy CTS Editor

VESA Board Member

Min-Jie Chong

SATA 6G / PHY / LOGO Contributor

SATA-IO Gold Suite Lead

The Agilent Infiniium Scopes team maintains

engagement in the top high tech standards

organizations

Perry Keller

JEDEC Board Member

Page 39: SuperSpeed USB 3 - Keysight · Key Features: –Industries first and most feature complete –SMA edge launch terminations –SS A and SS B for host, device or cross hub testing –Connect

Questions?