CARBON FIBER MATERIALS

WAFER-BASED LAYER-SYSTEMS GLASS AND FOILS

METALS AND ALLOYS

SURAGUS GmbH | Maria-Reiche-Str. 1 | D-01109 Dresden | Germany | Phone +49 351 273 598 - 01 | Fax + 49 351 329 920 - 58 | info@suragus.com | www.suragus.com

CARBON FIBER MATERIALS

WAFER-BASED LAYER-SYSTEMS GLASS AND FOILS

METALS AND ALLOYS

The penetration of multiple plies enable separating multiaxial composite into individual layers.

APPLICATIONS

Quality assurance of Raw Carbon Fiber (RCF), Non-Crimp-Fabrics (NCF) or Carbon Fiber Reinforced Plastics (CFRP)

Determining fiber orientation or undulation in hidden layers

Detection of missing bundles or wrinkles Defect detection in multiple layers Displacement of fiber bundles

QUALITY ASSURANCE SYSTEMS

EddyCus® TF inline ex-vacuo

EddyCus® TF lab

EddyCus® TF inline in-vacuo

₊ Non-contact ₊ Coupling-media free ₊ Penetration of several layers ₊ Planar and slant structures (CF map 2,5D)

Determining Crack ( I )

Finger Failure ( II )

Inhomogeneities ( III )

I

II

IV

V

III

Deposition effects ( IV )

Impurities ( V )

APPLICATIONS

Backside-metallization Frontside electrodes

Doped layers and materials Other functional conductive

layers

APPLICATIONS

Mapping of surface conductivity Detection of surface flaws e.g. delamination, cracks,

impurities Evaluation of homogeneity and quality of coatings Topography, surface roughness

Float-glass/Architectural glass

Photovoltaic cells Touch screens and flat

monitors

OLED applications Smart-glass applications Transparent antistatic foil Deicing and heating

applications

APPLICATIONS

SHEET RESISTANCE MEASUREMENT, CONDUCTIVITY MAPPING & DEFECT IDENTIFICATION

BY EDDYCUS® TF MAP SERIES

Mapping of sheet resistance of thin-films on glass and foils

Mapping and characterization structured thin-films

Homogeneity mapping and error detection e.g. impurities and cracks

Sheet resistance measurement of conductive layers on non-conducting substrates

Sheet resistance measurement of multilayer systems on request (feasibility study)

Layer thickness measurement of conductive layers with nanometer resolution (sigma = constant)

Substrate thickness measurement of low- and high conductive foils

Characterization of other conductivity related parameter

MAPPING SHEET RESISTANCE & DETECTING DEFECTS BY

EDDYCUS® TF MAP SERIES

The eddy current sensor induces an electromagnetic field that is determined by the sensor characteristics and its parameterization. If a conductive object is positioned within this field eddy currents are induced within this sample. This eddy currents cause a field change that is quantified by the very sensitive sensors and referred to physical parameters by algorithms. This technology is highly useful for non-contact fully automated testing solutions for tasks that affect local electric and dielectric properties.

We offer advanced eddy current testing technology with a wide frequency range from 10 kHz to 100 MHz to achieve different sensitivities and penetrations depth. It is combined with different sensor concepts depending on the application and equipped with a user-friendly software for fast real-time evaluation.

COMPANY SURAGUS offers systems for quality assurance and process monitoring of structured and unstructured functional layers, carbon fiber materials and classic conductive materials. The used eddy current method utilizes local conductivity and its variation in test objects for the characterization of correlated quality characteristics such as thickness, sheet resistance, conductivity, homogeneity and purity or physical changes.

TECHNOLOGY

QUALITY MANAGEMENT

For a technology company, the continuous development and improvement of products and services is granted. This also applies to our quality management system. It meets the demands of the international standard DIN EN ISO 9001:2008.

EDDYCUS® MAPPING SOLUTION

EDDYCUS® SINGLE POINT AND LINE MONITORING SOLUTIONS

EddyCus® map Series

EddyCus® map 2.5D Series

Sheet resistance mapping of sprayed Silver Nanowires

Eddy Current Mapping (automated high resolution non-contact C-Scan)

4-Point Probe Measurement (manual in contact)

IN- AND OFFLINE SHEET RESISTANCE MONITORING BY

EDDYCUS® TF LAB AND INLINE SERIES

Magnetic field Eddy currents

Eddy current sensor

Sample

Defect

INTERNATIONAL SALES PARTNERS

www.costar.co.kr Korea

www.beijingec.com China

www.scientek.com.tw Taiwan

Singapore, www.gaiascience.com.sg Malaysia and Indonesia

PLEASE CONTACT US TO DISCUSS YOUR TESTING TASK.

CONTACT

SURAGUS GmbH – Sensors and Instruments Maria - Reiche - Strasse 1 D-01109 Dresden Germany +49 0351 - 273 598 01 info@suragus.com | www.suragus.com