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The top documents tagged [bad chips slide]
Spring 08, Mar 13 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 VLSI Test Principles Vishwani D. Agrawal James
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Testing 1. 2 Problems of Ideal Tests n Ideal tests detect all defects produced in the manufacturing process. n Ideal tests pass all functionally good
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