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The top documents tagged [ellipsometry slide]
Optical methods for semiconductor characterization Guillaume von Gastrow
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Lecture 21 QCM and Ellipsometry. Quartz Crystal Microbalance The Quartz Crystal Microbalance (QCM) is an extremely sensitive mass sensor, capable of measuring
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Ellipsometry and X-ray Reflectivity (XRR). Learning objectives To roughly understand the principles of ellipsometry and XRR To be able to point out what
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1 Abstract: The widely employed approach to self-assembly of fullerene derivatives on gold can be complicated due to multilayer formations and head-to-tail
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