Upload File

The top documents tagged [fault coverage]

An Efficient Test Relaxation Technique for Synchronous Sequential Circuits Aiman El-Maleh and Khaled Al-Utaibi King Fahd University of Petroleum & Minerals
An Efficient Test Relaxation Technique for Synchronous Sequential Circuits Aiman El-Maleh and Khaled Al-Utaibi King Fahd University of Petroleum & Minerals
223 views
Nov 29th 2006MS Thesis Defense1 Minimizing N-Detect Tests for Combinational Circuits Master’s Defense Kalyana R. Kantipudi Thesis Advisor: Dr. Vishwani
Nov 29th 2006MS Thesis Defense1 Minimizing N-Detect Tests for Combinational Circuits Master’s Defense Kalyana R. Kantipudi Thesis Advisor: Dr. Vishwani
215 views
Sep. 30, 2003Agrawal: ITC'031 Fault Collapsing Via Functional Dominance Vishwani D. Agrawal Rutgers University, ECE Dept., Piscataway, NJ 08854, USA vishwani02@yahoo.com
Sep. 30, 2003Agrawal: ITC'031 Fault Collapsing Via Functional Dominance Vishwani D. Agrawal Rutgers University, ECE Dept., Piscataway, NJ 08854, USA [email protected]
224 views
CS 150 – Fall 2005 - Lec #25 – Design Methodology – 1 Digital Design Methodology (Revisited) zDesign Methodology yDesign Specification yVerification ySynthesis
CS 150 – Fall 2005 - Lec #25 – Design Methodology – 1 Digital Design Methodology (Revisited) zDesign Methodology yDesign Specification yVerification ySynthesis
218 views
1 Introduction VLSI Testing. 2 Overview First digital products (mid 1940's) Complexity:low MTTF:hours Cost:high Present day products (mid 1980's) Complexity:high
1 Introduction VLSI Testing. 2 Overview First digital products (mid 1940's) Complexity:low MTTF:hours Cost:high Present day products (mid 1980's) Complexity:high
215 views
1 EECS 150 - Components and Design Techniques for Digital Systems Lec 10 – Logic Synthesis 9-30-04 David Culler Electrical Engineering and Computer Sciences
1 EECS 150 - Components and Design Techniques for Digital Systems Lec 10 – Logic Synthesis 9-30-04 David Culler Electrical Engineering and Computer Sciences
220 views
Functional Coverage Driven Test Generation for Validation of Pipelined Processors P. Mishra and N. Dutt Proceedings of the Design, Automation and Test
Functional Coverage Driven Test Generation for Validation of Pipelined Processors P. Mishra and N. Dutt Proceedings of the Design, Automation and Test
230 views
SELF INSURANCE MANUAL AND PROGRAM OVERVIEW ADMINISTRATION Diocese of Allentown – Kelly Bruce, Director of Insurance & Real Estate Financial Responsibilities
SELF INSURANCE MANUAL AND PROGRAM OVERVIEW ADMINISTRATION Diocese of Allentown – Kelly Bruce, Director of Insurance & Real Estate Financial Responsibilities
215 views
AN EFFICIENT TEST-PATTERN RELAXATION TECHNIQUE FOR SYNCHRONOUS SEQUENTIAL CIRCUITS
AN EFFICIENT TEST-PATTERN RELAXATION TECHNIQUE FOR SYNCHRONOUS SEQUENTIAL CIRCUITS
34 views
CONFIDENTIAL1 Biased Random Simulation Guided by Observability-Based Coverage Serdar Tasiran Compaq Systems Research Center, formerly GSRC, UC Berkeley
CONFIDENTIAL1 Biased Random Simulation Guided by Observability-Based Coverage Serdar Tasiran Compaq Systems Research Center, formerly GSRC, UC Berkeley
222 views
Minimizing N -Detect Tests for Combinational Circuits Master’s Defense Kalyana R. Kantipudi
Minimizing N -Detect Tests for Combinational Circuits Master’s Defense Kalyana R. Kantipudi
30 views
Parallel Test Scheduling of 3D Stacked SoCs with Temperature and Time Constraints
Parallel Test Scheduling of 3D Stacked SoCs with Temperature and Time Constraints
217 views