×
Log in
Upload File
Most Popular
Study
Business
Design
Technology
Travel
Explore all categories
The top documents tagged [krivanek nion]
Atom-by-Atom Imaging and Analysis Ondrej L. Krivanek Nion Co., in collaboration with Niklas Dellby, Neil Bacon, George Corbin, Petr Hrncirik,
216 views
Direct imaging and parallel-beam diffraction in an aberration-corrected STEM
36 views