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The top documents tagged [localized defect states]
Imaging and modeling diffusion to defects in GaAs
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Imaging and modeling diffusion to isolated defects in a GaAs/GaInP heterostructure
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Using the model and algorithm shown to the right, we obtain the theoretical images above. These images, with A=4.2*10 7 cm 3 /s (defect pixel) and A=8.2*10
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Defect-related recombination and free-carrier diffusion near an isolated defect in GaAs
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Overview of Semiconductor Device Noise Research
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Overview of Semiconductor Device Noise Research Gijs Bosman Noise Research Laboratory NEB 585 Electrical and Computer Engineering Department, University
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