×
Log in
Upload File
Most Popular
Study
Business
Design
Technology
Travel
Explore all categories
The top documents tagged [pixel implant n window]
SIMS: Secondary Ion Mass Spectroscopy Principle Secondary Chamber (sample loading) Primary Chamber (target) Ion source O2+, Cs+ Ion gun DeltaV=5KV Magnetic
220 views
SIMS: Secondary Ion Mass Spectroscopy
39 views