×
Log in
Upload File
Most Popular
Study
Business
Design
Technology
Travel
Explore all categories
The top documents tagged [siliconoxide interface]
Effect of mesh grid structure in reducing hot carrier effect of nmos device simulation
97 views
IRPS Slides_KAJ4
126 views
Comprehensive Radiation Damage Modeling of Silicon Detectors
35 views
Trento, Feb.28, 2005 Workshop on p-type detectors 1 Comprehensive Radiation Damage Modeling of Silicon Detectors Petasecca M. 1,3, Moscatelli F. 1,2,3,
220 views