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The top documents tagged [tipsurface separation]
Introduction to Atomic Force Microscopy. AFM Background Invented by Binnig, Quate, and Gerber in 1986 Measures the interaction forces between the tip
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Scanning Tunneling Microscopy
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Scanning Tunneling Microscopy
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Scanning Tunneling Microscopy By Jingpeng Wang CHEM*7530 Feb 21. 2006
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