×
Log in
Upload File
Most Popular
Study
Business
Design
Technology
Travel
Explore all categories
The top documents tagged [work of lind]
ToF-SIMS – Time of Flight-Secondary Ion Mass Spectroscopy A surface analytical technique
229 views
Lecture 13. TOF-SIMS Mass Spectroscopy. Routine analytical technique Detailed chemical structure information High sensitivity New primary ion sources
218 views