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TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005 Generating a Test Strategy with Bayesian Networks, … and Common Sense Presentation by: Jean-Jacques Gras and Rishabh Gupta Software and Systems Engineering Research Lab Motorola Labs

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TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Generating a Test Strategy with Bayesian Networks, …

and Common Sense

Presentation by:Jean-Jacques Gras and Rishabh GuptaSoftware and Systems Engineering Research LabMotorola Labs

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 2

Contents

• Introduction• Bayesian Networks• Defect Models• Defect Profile Modelling• Test Strategy Generation• Sample Results• Conclusion and Future Work

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 3

Introduction

• Problem: Software Testing is Difficult– Testing is coming late in lifecycle, means under pressure.

– Information about Software weaknesses available too late to produce effective Test Strategy.

• Solution: Anticipate with Defect Prediction Models– Need advanced decision support tool to optimise V&V activities.

– Use Predictions to drive V&V Activities

– Use Predictions to generate intelligent Test Strategy by focussing on High Risk Areas.

– Need to base models on real quality drivers: causal models

– Use Bayesian Networks based Defect Models of each Activity to predict Quality of software artefacts along lifecycle.

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 4

Bayesian Nets A graphical framework to reason about uncertainty Based on Bayes theorem: P(B|A) = P(B) * P(A|B) / P(A) Prediction: P(Effect | Cause) but also Inference: P(Cause | Effect)

A: Training

B: Knowledge

D:Quality

C: Requirements

Arcs = Influence relations

Arcs = Influence relations

P(B|A)

P(D|B,C)

P(C)

NPT =Conditional probability tables

NPT =Conditional probability tables

B =C = Good Poor Good PoorHigh 0.9 0.6 0.4 0.2Low 0.1 0.4 0.6 0.8

High Low

D =

Nodes = Uncertain variables

Nodes = Uncertain variables

P(A)A={True, False} orA={1, 2,…, n} or Continuous

A={True, False} orA={1, 2,…, n} or Continuous

HOURS

0 to 11 to 22 to 33 to 44 to 55 to 66 to 77 to 88 to 99 to 10

4.009.0015.024.020.012.06.005.003.002.00

4.1 ± 2

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 5

End-To-End Defect Prediction

Requirements

Design

Coding

Coding FTR

Design FTR

Requirements FTR

Unit Test

Integration Test

System TestBAT

BAT

BAT

BAT

BAT

BAT

BAT

BAT

BAT

X

-

X

-

X

-

X

X

X

X

-

X

-

X

-

Req Size Des Size Cod Size

-

X

- -

X

- - -

- - -

XX X

Latent Defects

XX

XX

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 6

BN Design Process

• Identify Causal Factors– Identify Factors that drive Software Quality or are indicators of it– Each factor is given a precise definition that can be understood

by end-users• Identify States and Ranges

– Identify Node Type (Discrete or Continuous)– Identify States (for Discrete) or Ranges (for Continuous)

• Establish Cause-Effect Relations– Identify relationship between nodes– Use intermediate nodes where appropriate

• Quantify Cause-Effect Relations– Establish Conditional Probability Tables– Must define each relation

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 7

Additional Model

• Working BN Models may not be available– Models may not have been yet calibrated

– Subjective data may not be available• Schedule Pressure• Process not instituted into organisation

• Need Predictions for Test Strategy. – Defect prediction for each Component/Sub-System

• Use alternative Model– to bootstrap the BN deployment

– Multiple defect models provide reinforcements and credibility.

• Defect Profile Model (DPM)

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 8

DPM Method

•Use Defect Data from past Releases to understand Profile of Defect Discovery across Lifecycle

Defect Profile (Requirements)

0.00

0.20

0.40

0.60

0.80

1.00

INIT Req Des Cod UT IT ST

Development Phase

Eff

ec

tiv

en

es

s (

Ac

cu

mu

late

d)

Req = 65%

Des = 86%

Cod = 94%

UT = 98%

Actual: Req Faults Found ≈ 40

Estimate: 40/86% Total Req Faults Inserted ≈ 47

Prediction: Req Faults Unfound ≈ 7

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 9

DPM Process

Req Des Cod TotReq 82 0 0 82Des 31 24 0 55Cod 8 51 13 72UT 5 16 8 29IT 1 5 7 13ST 1 2 4 7Sum 128 98 32 258

Ph

ase

Fo

un

d

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 10

Count Ratio Comp ActualReq 82 0.64 1.00 61Des 31 0.24 1.00 21Cod 8 0.06 1.00 11UT 5 0.04 2IT 1 0.01 1ST 1 0.01 1Sum 128Total Ratio 0.95Total Found 93Total Inserted 98.38Total Unfound 5.38

Ph

ase

Fo

un

dDPM Process

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 11

DPM Key Points

• Data availability– Defect Data is usually collected by mature organisations

• No need for any other metrics– e.g. size of project, total effort

• Based on Component/Sub-System History– Generate a Prediction per Component/Sub-System

– One DPM model for each Component/Sub-System

– Calculate average ratio across multiple releases

• Historic Projects must be mature– Need Defect Data from the Field

– More mature Projects mean better Prediction

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 12

System Test Strategy Generation

Test StrategyServices # TC Defects

Service 1 60 1Service 2 300 5Service 3 240 4Service 4 180 3Service 5 300 5Service 6 120 2Service 7 240 4Service 8 60 1

ServiceBN

ServiceBN

ServicesService Box A Box B Box C

Service 1 10% 55% 90%

Service 2 0% 17% 60%

Service 3 30% 20% 70%

Service 4 70% 50% 80%

Service 5 20% 50% 30%

Service 6 60% 50% 70%

Service 7 10% 20% 10%

Mapping components influence

Ranked Services: Defects exposed + Suggested # Test Cases

Service (FA) Models: Defect exposure calculation

Component latent defects

ComponentModels

TESTINGBBN

Test Eff % Defects

Latent Defects

TEST

INSPECTIONBBN

Insp. Eff % Faults FoundINSP

CODINGBBN

Fault Density Code Faults

Code Size

NC

SL

COD

REQUIREMENTSBBN

Quality %

REQ

Core

TESTINGBBN

Test Eff % Defects

Latent Defects

TEST

INSPECTIONBBN

Insp. Eff % Faults FoundINSP

CODINGBBN

Fault Density Code Faults

Code Size

NC

SL

COD

REQUIREMENTSBBN

Quality %

REQ

Core

Latent defects ->

ComponentModels

TESTINGBBN

Test Eff % Defects

Latent Defects

TEST

INSPECTIONBBN

Insp. Eff % Faults FoundINSP

CODINGBBN

Fault Density Code Faults

Code Size

NC

SL

COD

REQUIREMENTSBBN

Quality %

REQ

Core

TESTINGBBN

Test Eff % Defects

Latent Defects

TEST

INSPECTIONBBN

Insp. Eff % Faults FoundINSP

CODINGBBN

Fault Density Code Faults

Code Size

NC

SL

COD

REQUIREMENTSBBN

Quality %

REQ

Core

Latent defects ->

ComponentModels

TESTINGBBN

Test Eff % Defects

Latent Defects

TEST

INSPECTIONBBN

Insp. Eff % Faults FoundINSP

CODINGBBN

Fault Density Code Faults

Code Size

NC

SL

COD

REQUIREMENTSBBN

Quality %

REQ

Core

TESTINGBBN

Test Eff % Defects

Latent Defects

TEST

INSPECTIONBBN

Insp. Eff % Faults FoundINSP

CODINGBBN

Fault Density Code Faults

Code Size

NC

SL

COD

REQUIREMENTSBBN

Quality %

REQ

Core

Latent defects ->

Development Survey

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 13

Test Strategy – “Exposure” Matrix

• Method– Defect “Exposure” weight based on System Design information– Test Strategy = ranked services (per Test Area)

• Benefit– Identifies weakest services– Determines number of test cases to write for each Service

SubSys 1 SubSys 2 SubSys 3

0% 20% 80%

80% 60% 20%

100% 80% 0%

* * *+ +

+ +

+ +

(Exposed Faults)

= 47

Faults left

Strategy

35 15 75

= 63

… … … …

= 52

“Exposure” weights from experts

Service 4.1

Service 4.2

Service 4.3

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 14

Suite 2

DevelopmentDevelopment

Applying BTA to Drive Testing

System TestPre-test

Development

System TestNew Feature Test

TCs

BTA Outputs

Suite 1

ComponentDefects

Test Selection

Test Selection

PreliminaryTest Strategy

Updated Test Strategy

Updated data

Preliminary data

Create Test Cases

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 15

End-to-End Defect Prediction Results

Pilot Type Sample Size Accuracy

A Development Faults 16 components +/- 25% to actuals,

88% of the time

B System Test Effectiveness 15 areas +/- 25% to actuals,

80% of the time

C Test Case Selection 8 components

19 services

48% more faults detected than random selection = 5 yr. expert

D Third-Party Faults 5 vendors +/- 25% to actuals,

80% of the time

E Development Faults 5 component +/- 16.4%,

100% of the time

7% effort reduction

F Test Strategy 1 system release

67 test categories

1/3 number of test cases

2X functional areas

Success Criteria: Prediction accuracy of +/- 25% to actuals, 75% of the time

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 16

• Defects Found– BTA Test Strategy would have found all the Defects

Found by the original Test Strategy

• Test Cases– BTA Test Strategy recommends 1/3 the number of

Test Cases as the original Test Strategy

Test Strategy Impact

0.00

0.50

1.00

1.50

2.00

2.50

# T

es

t C

as

es

BTA

Orig

0

0.5

1

1.5

2

2.5

# F

un

cti

on

al

Are

as

BTA

Orig

0

0.5

1

1.5

2

2.5

# D

efe

cts

Fo

un

d

BTA

Orig

• Functional Areas– BTA Test Strategy recommends 2x the number of

Functional Areas as the original Test Strategy

Test Cases Functional Areas Defects Found

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 17

Test Strategy Optimization

0

100

200

300

400

500

600

700

1 6 11 16 21 26 31 36 41 46 51 56 61 66 71 76 81 86 91 96 101 106 111 116 121 126 131 136 141

Services Tested

Def

ects

Rem

ain

ing

Original

Optimised

Original unoptimised Test Strategy Execution

Time to remove all Defects

Optimised Test Strategy Execution

Time to remove all Defects Reduced

Savings

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 18

Future Work & Conclusion

• BN Defect Models– Better calibration techniques – machine learning– Simpler “Lightweight” model

• DPM– A “2D” version to allow earlier predictions with less information– Integration BN models with DPM approach leverage strength of

each• Test Strategy

– More detailed exposure information• Include type or category of Defect• Exposure per Defect Type, not just Component

– Automatic extraction of Exposure information, • e.g. through UML / MSC Models

TAIC-PART - Cumberland Lodge, UK – 29 Aug 2006 MOTOROLA and the Stylized M Logo are registered in the US Patent & Trademark Office. All other product or service names are the property of their respective owners. © Motorola, Inc. 2005

Slide 19

Q & A

Thank You

[email protected]

[email protected]