template manual abb ret 670 v1.1 enu tu2.22 v1.000

8/10/2019 Template Manual Abb Ret 670 v1.1 Enu Tu2.22 v1.000

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OMICRON PTL RET 670 Transformer Differential Protection Test Template User Manual

OMICRON electronics GmbH 1/18

OMICRON PTL

Protection Test Template PTT

Transformer Differential Protection

ABB RET 670 V1.1 A32

User Manual

V1.000


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Contents

1 General Information ............................................. .................................................. ...................................3 2 Minimum Hardware Requirements..........................................................................................................4 3 Quick Start Information ....................................... .................................................. ...................................4 4 Using the Template .............................................. .................................................. ...................................5

4.1 Test Object .............................................. .................................................. ...........................................5 4.2 Hardware Configuration .................................................. .................................................. ...................5

5 Required Test Modules and Test Universe Version..............................................................................9 6 Functional Range......................................................................................................................................9 7 Not Supported Functions.......................................................................................................................10 8 OMICRON Test Strategy.........................................................................................................................10 9 Template Structure .............................................. .................................................. .................................11

9.1 Wiring Test .............................................. .................................................. .........................................11 9.2 Initial Test ................................................ .................................................. .........................................12 9.3 87 Configuration Test Primary............................................................................................................12 9.4 87 Configuration Test Secondary.......................................................................................................12 9.5 87 Diff Pickup and Drop-off Test Primary...........................................................................................13 9.6 87 Diff Pickup and Drop-off Test Secondary......................................................................................14 9.7 87 Diff Characteristic Test Primary.....................................................................................................14 9.8 87 Diff Harmonics Blocking Test ............................................... ................................................ .........15 9.9 50/51 (50N/51N) Overcurrent Pickup Tests.............................................. .........................................16 9.10 50/51 (50N/51N) Trip Times Test.....................................................................................................16 9.11 Thermal Overload Trip Time and Thermal Overload Warning Signal Test ......................................17 9.12 CB Test.............................................................................................................................................17 9.13 Reset of Trip Command Test ................................................ .................................................. .........17 9.14 Tertiary Side Tests ................................................ .................................................. .........................18 9.15 Using the RET 670 Transformer Differential Template for Two Winding Tests...............................18


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1 General InformationThe RET 670 transformer differential template is used for testing the current differential, overcurrent andthermal overload protection functions of the RET 670 relays. This template comprehends differentmodules for testing the main protection functions and the most important backup protection functions. Thetemplate is used for testing 3-winding or 2-winding transformer differential protection function. It isdesigned and configured for use with the ABB RET 670 V1.1 XRIO converter which is included in thistemplate. For more information about the converter, see the ABB RET 670 XRIO Converter User Manual.

Note: The template is designed and built for use with the Test Universe 2.22 SR2 software.

The template is tested on the following relay:Manufacturer: ABBSerial no: T0802056Firmware Version: V 1.1

Notes: The OMICRON PTTs are designed for an experienced OMICRON user. The user should be

familiar with the Test Universe software and the XRIO technology (seehttp://www.omicron.at/products/training/ for training information).


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2 Minimum Hardware RequirementsFor working with this template, you need a CMC test set with six current outputs for the differentialprotection tests. To use the template with 5A relays, a CMC356 or a CMC 256 together with a CMA 156current amplifier may be required. The development tests were performed with a CMC256plus.

3 Quick Start InformationTo test with the RET 670 transformer differential template:

1. Double click the file RET 670.occ to start the template-based procedure.2. Open the test object.3. Load (Import) the latest XRIO converter version for the RET 670.4. Enter your relay settings in the Relay Parameter Section, Additional Information General

Information Hardware Configuration Analog modules Transformer Configuration Side1(Side2 and Side3), and then click OK.

Figure 1: Relay settings in the XRIO converter

5. Open the Hardware Configuration .6. Enter all necessary information for:

General Analog Outputs Binary / Analog Inputs Binary Outputs DC Analog Inputs

7. Click OK.8. Follow the wiring instructions.9. Start testing.10. Evaluate and archive the results.


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4 Using the TemplateThe RET 670 transformer differential template is divided into three object groups: the test object, thehardware configuration and the list of OMICRON test modules used for testing the relay's protectionfunctions. The OMICRON test mosules are classified in different main groups, which are set in a treestructure to create a better overview. The following test parts are available to test the RET 670 protectionfunctions:

Pre-test structure with wiring and initial tests Primary-Secondary Side structure This group contains all necessary sub-groups to test the

transformer differential main- and back-up protection functions and the CB functionality at the twosides of a 2-winding transformer or the fault side primary to secondary for a 3-windingtransformer. The CB Test in the Primary-Secondary Side structure is deactivated, if a 3-windingtransformer is used.

Primary-Tertiary Side structure: This group contains all necessary sub-groups to test thetransformer differential main- and back-up protection functions and the CB functionality at the faultside primary to tertiary for a 3-winding transformer. This part is deactivated, if a 2-windingtransformer is used.

The template can be used for testing the following protection functions: 87 Current differential protection 50, 50N, 51, 51N Definite time and instantaneous phase overcurrent 49 Thermal overload protection CB auxiliary contacts

4.1 Test Object

The test object already contains the RET 670 XRIO converter which includes all setting parameters of themodeled RET 670 protection functions. The setting parameters are built as an image of thePCM 600 software. For more information, see the ABB RET 670 XRIO Converter User Manual.

4.2 Hardware Configuration

The global hardware configuration offers different configuration options for voltage and current outputs.For testing the RET 670 relay with the RET 670 differential test template, the standard configurationshown in the following figure is required.


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Figure 2: Configuration of the voltage and current outputs

Note: If higher currents are needed for testing (e.g. relays with Inom = 5 A), the current outputconfiguration can be adapted (e.g. set to 3x25A).

The following pictures show the connection of the CMC 256 to the relay. Figure 3 shows the connectiondiagram for primary to secondary tests and Figure 14 shows the connection for primary to tertiary tests.


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Figure 3: Connection diagram for primary to secondary tests


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In the Analog Outputs dialog box, the current outputs have to be routed to the name variables. Figure 4shows the Analog Output configuration.

Figure 4: Analog Output configuration

In the Binary / Analog Inputs dialog box, configure the signals as follows: 1 trigger signal set to Relay TRIP W1 1 trigger signal set to Relay TRIP W2 1 trigger signal set to Relay TRIP W3 1 trigger signal set to Start 1 trigger signal set to Thermal Overload Warning 1 signals for the circuit breaker auxiliary contacts set to CB aux. W1 (52a) 1 signals for the circuit breaker auxiliary contacts set to CB aux. W2 (52a)

1 signals for the circuit breaker auxiliary contacts set to CB aux. W3 (52a)The following figure shows the Binary / Analog Inputs configuration.

Note: The binary inputs are preset to potential free. Change these predefined settings to the valuesneeded at the test site.

Figure 5: Binary / Analogue Inputs configuration


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The necessary signals, trip signal, starting signal and circuit breaker auxiliary contacts (CB aux.), have tobe routed to the following binary inputs:

Relay TRIP W1 to: binary input 1 Relay TRIP W2 to: binary input 2 Relay TRIP W3 to: binary input 3 Relay Start General to: binary input 5 Thermal Overload Warning to: binary input 6 CB aux. W1 to: binary input 7 CB aux. W2 to: binary input 8 CB aux. W3 to: binary input 9

Note: The circuit breaker auxiliary contact is required for the trip test with the circuit breaker. If the circuitbreaker auxiliary contact cannot be connected to the binary inputs, the trip test with the circuit breakercannot be performed.

5 Required Test Modules and Test Universe VersionTo use this template, you must have a valid test license for the OMICRON Test Universe 2.22 SR2 orhigher and the following test modules:

Control Center Ramping State Sequencer Advanced Differential (Diff Configuration, Diff Operating and Diff Trip Time Charactreistic) Overcurrent

6 Functional RangeThe test modules are grouped according to the protection function to be tested. The template includes testmodules for the following protection functions:

Diff Configuration primary (87) Diff Configuration secondary (87)

Diff pickup and drop-off primary (87) Diff pickup and drop-off secondary (87) Diff Operating Characteristic primary to secondary (87) Diff Trip Time Characteristic primary to secondary (87) 5 th Harmonic blocking Overcurrent primary (50, 50N, 51, ,51N) Overcurrent secondary (50, 50N, 51, 51N) Thermal overload warning primary (49) Thermal overload trip primary (49) Thermal overload warning secondary (49) Thermal overload trip secondary (49) Diff Configuration tertiary (87) Diff pickup and drop-off tertiary (87) Diff Operating Characteristic primary to tertiary (87) Diff Trip Time Characteristic primary to tertiary (87) Overcurrent tertiary (50, 50N, 51, 51N) Thermal overload warning tertiary (49) Thermal overload trip tertiary (49) Trip time with circuit breaker contacts Reset of trip command

The test modules are activated and deactivated automatically according to the corresponding protectionfunction status in the test object.


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9 Template StructureThe structure of the RET 670 differential test template is shown below.

Figure 6: RET 670 differential test template

Note If you want to use the RET 670 transformer differential template for testing the two-windingtransformers with a relay similar to the RET 670 relay, connect the "Relay Trip W3" signal to the "Relay

Trip W1" signal. This ensures that all trip signals routed in the test modules are available.

9.1 Wiring Test

The wiring test is used to check the connections between the CMC test set and the relay. Therefore theOMICRON Diff Configuration test module is used to simulate a through fault condition with I Fault = 1 Iref.If the test set and the relay are connected correctly, the relay will not trip during this test. Check the outputvalues with the values measured by the relay. If both values match, the relay and the test set are wiredcorrectly and the test can be manually assigned as passed.


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9.2 Initial Test

The initial test is used to check whether the relay trips when a standard fault condition occurs. TheOMICRON Diff Trip Time Characteristic test module is used for the initial test. A three-phase fault issimulated with I diff = 2 Iref which has to be switched off by the differential protection function of the relay.

9.3 87 Configuration Test Primary

The configuration test is used to check the correct behaviour of the relay in a through fault condition, whenthe fault occurring on the primary side gets supplied from the secondary side of the protected object.Therefore the OMICRON Diff Configuration test module is used. The configuration test is executed forphase-phase faults and for phase-ground faults, in order to check the correct removal of the zerosequence components. The test is passed when no trip occurs and should be manually assigned.

Figure 7: Configuration test primary

9.4 87 Configuration Test Secondary

The configuration test secondary is similar to the configuration test primary described above, but the faultlocation is on the secondary side of the protected object. The supply side is the primary side of theprotected object.


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9.6 87 Diff Pickup and Drop-off Test Secondary

This test is similar to the pickup test realized for the primary side. In this case, a ramp module is used toinject a three phase current only on the secondary side.

9.7 87 Diff Characteristic Test Primary

The diff characteristic test primary is designed for testing the relay's behaviour to internal fault conditions.Therefore the OMICRON Diff Operating Characteristics and the Diff Trip Time Characteristic test modulesare used. The operating characteristic is tested with several search lines from 0.5 Iref to 4 Iref. Thepredefined search lines can be modified by the user.

Figure 10: Diff operating characteristic test

Note: The predefined search lines are limited to 4 Iref due to the high currents needed for this test point,as high currents may damage the relay's current inputs.

Note The diff operating characteristic is based on Iref values of the relay. It is not based on I nom as shownin the test module.


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The diff trip time characteristic is tested with a single test shot at I diff = 2 Iref.

Figure 11: Diff trip time characteristic test

Note: The test point can be modified by the user. If the test current is too low, remove it and set a newtest point.

9.8 87 Diff Harmonics Blocking Test

The blocking of the differential protection function by 5 th harmonics is tested with OMICRON Diff HarmonicRestraint test module. A search line is placed at Idiff = 1.5 Iref. Additional search lines can be added bythe user.

Figure 12: Diff harmonics blocking test

Note: The 2 nd harmonic test for RET 670 is not supported.


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9.9 50/51 (50N/51N) Overcurrent Pickup Tests

These test modules are used to test the pickup signal of the 50/51 (50N/51N) overcurrent protectionfunction of each winding. These tests are repeated for each transformer winding and will not be describedagain, as the other two tests are copies of the first one with different pickup values according to thetransformer sides. The OMICRON Ramping test module is used for the overcurrent pickup tests. Thecurrent in the respective phase is increased until the 50/51 (50N/51N) pickup value is reached and therelay starts. The drop-off value is measured until the start signal is reseted. The reset ratio is calculatedfor each value.

Note: The differential function has to be blocked before testing the overcurrent functionality.

Note: The Overcurrent parameters InMult, INnMult and StVaIMult can be activated in AdditionalInformation -> Relay Information -> Configurations -> Overcurrent

9.10 50/51 (50N/51N) Trip Times Test

The 50/51 (50N/51N) overcurrent trip times are tested with OMICRON Overcurrent test module. Themodules are defined to test all the involved phases. The test shots are set at 1.15xI>, 0.9xI>>,

1.1xI>>, 0.9xI>>> and 1.1xI>>>. The trip time for each test point is measured and evaluated. Eachphase is tested separately. This test is repeated for each transformer winding as described here.

Figure 13: 50/51 trip times test

Note: The Overcurrent parameters InMult, INnMult and StVaIMult can be activated in AdditionalInformation -> Relay Information -> Configurations -> Overcurrent


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9.11 Thermal Overload Trip Time and Thermal Overload Warning Signal Test

The thermal overload warning and trip times signal of the relay is tested with the OMICRON Overcurrent test modules by simulating a three-phase fault.

Generally the thermal overload warning and trip times tests start with the simulation of a cold start -resetting the thermal overload memory, i.e. the fault begins without pre-fault state. The test shot for bothtests is set to 1.15 IN.

The only difference between the thermal overload warning and trip times test is the monitored binaryinput. The trip times test is routed to the trip signal, while the warning input of the relay is triggerd in thetest of the thermal overload warning.

Note: The memory of the relay's thermal overload model has to be reset prior each thermal overload test.

For testing the thermal overload functionality behind the IHighTau threshold the OMICRON StateSequencer test module is used by simulating a three-phase fault. For more information see the relaymanual.

Note: The thermal overload warning can only be tested if the warning signal of the thermal overloadfunction is routed to one of the relay's outputs.

Note: The Thermal Overload parameters ENMULTTTRn and FORCED COOL TTRn can be activated inAdditional Information -> Relay Information -> Configurations -> Thermal Overload. Also the side of TTRncan be set there.

9.12 CB Test

For testing the trip time with circuit breaker contacts test, an OMICRON State Sequencer test module isused. This test is divided into three sequencer states: pre-fault, fault and post-fault. The fault is a three-pole fault with I diff = 2 I nom . The time elapse between the trip command and the circuit breaker open isevaluated.

9.13 Reset of Trip Command Test

The reset of the trip command is tested with an OMICRON State Sequencer test module. A sequence ofthree states is used, beginning with a pre-fault state with nominal voltage and current. A fault with 2 I diff>is created, forcing the relay to trip. The t ime between the trip command and the reset of the trip commandis evaluated.


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9.14 Tertiary Side Tests

For testing the three-winding transformers, the connection between the CMC test set and the relay has tobe adapted as shown below.

Figure 14: Wiring information for primary to tertiary tests

After the wiring has been adapted, the primary to tertiary tests can be executed. The tertiary tests aresimilar to the primary to secondary tests descrtibed above. For more information on the tests, see thecorresponding primary to secondary test description.

9.15 Using the RET 670 Transformer Differential Template for Two Winding Tests

If you want to use the RET 670 transformer differential template for testing two-winding transformers witha relay similar to the RET 670 relay, connect the "Relay Trip W3" signal to the "Relay Trip W1" signal.This ensures that all trip signals routed in the test modules are available.

template manual abb ret 670 v1.1 enu tu2.22 v1.000

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